[go: up one dir, main page]

JP2013074090A - Substrate processing apparatus and substrate processing method - Google Patents

Substrate processing apparatus and substrate processing method Download PDF

Info

Publication number
JP2013074090A
JP2013074090A JP2011211889A JP2011211889A JP2013074090A JP 2013074090 A JP2013074090 A JP 2013074090A JP 2011211889 A JP2011211889 A JP 2011211889A JP 2011211889 A JP2011211889 A JP 2011211889A JP 2013074090 A JP2013074090 A JP 2013074090A
Authority
JP
Japan
Prior art keywords
substrate
sulfuric acid
supply unit
hydrogen peroxide
spm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011211889A
Other languages
Japanese (ja)
Other versions
JP5837787B2 (en
Inventor
Eri Fujita
恵理 藤田
Hirotaka Tsujikawa
裕貴 辻川
Yoshinori Fujitani
佳礼 藤谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP2011211889A priority Critical patent/JP5837787B2/en
Publication of JP2013074090A publication Critical patent/JP2013074090A/en
Application granted granted Critical
Publication of JP5837787B2 publication Critical patent/JP5837787B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Cleaning Or Drying Semiconductors (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

【課題】SPM処理の際に、基板上における処理液の温度低下を抑制する。
【解決手段】基板処理装置1では、基板回転機構5により回転する基板9の上面91に向けて処理液供給部3から液体が吐出される。処理液供給部3は、硫酸供給部31、過酸化水素水供給部32、混合液生成部33およびノズル34を備える。基板処理装置1では、硫酸供給部31により加熱された硫酸がノズル34から基板9に供給され、基板9に対する予備加熱処理が行われる。その後、硫酸供給部31からの加熱された硫酸と過酸化水素水供給部32からの過酸化水素水とが混合液生成部33にて混合されてSPM液が生成され、SPM液が基板9に供給されてSPM処理が行われる。予備加熱処理が行われることにより、SPM処理の際に、基板9上に供給された高温のSPM液の温度低下を抑制することができる。その結果、SPM処理の効率を向上することができる。
【選択図】図1
A temperature drop of a processing solution on a substrate is suppressed during an SPM process.
In a substrate processing apparatus, a liquid is discharged from a processing liquid supply unit toward an upper surface of a substrate that is rotated by a substrate rotating mechanism. The treatment liquid supply unit 3 includes a sulfuric acid supply unit 31, a hydrogen peroxide solution supply unit 32, a mixed solution generation unit 33, and a nozzle 34. In the substrate processing apparatus 1, sulfuric acid heated by the sulfuric acid supply unit 31 is supplied from the nozzle 34 to the substrate 9, and a preliminary heating process is performed on the substrate 9. Thereafter, the heated sulfuric acid from the sulfuric acid supply unit 31 and the hydrogen peroxide solution from the hydrogen peroxide solution supply unit 32 are mixed in the mixed solution generation unit 33 to generate the SPM solution, and the SPM solution is applied to the substrate 9. The supplied SPM process is performed. By performing the preheating process, it is possible to suppress the temperature drop of the high-temperature SPM liquid supplied onto the substrate 9 during the SPM process. As a result, the efficiency of SPM processing can be improved.
[Selection] Figure 1

Description

本発明は、基板を処理する技術に関する。   The present invention relates to a technique for processing a substrate.

従来より、半導体基板(以下、単に「基板」という。)の製造工程では、基板処理装置を用いて酸化膜等の絶縁膜を有する基板に対して様々な処理が施される。例えば、表面上にレジストのパターンが形成された基板に処理液を供給することにより、基板の表面に対してエッチング等の処理が行われる。また、エッチング等の終了後、基板上のレジストを除去する処理も行われる。   Conventionally, in a manufacturing process of a semiconductor substrate (hereinafter simply referred to as “substrate”), various processes are performed on a substrate having an insulating film such as an oxide film using a substrate processing apparatus. For example, a process such as etching is performed on the surface of the substrate by supplying a processing liquid to the substrate having a resist pattern formed on the surface. In addition, after the etching or the like is finished, a process for removing the resist on the substrate is also performed.

例えば、特許文献1のレジスト除去装置では、水平に回転する基板上に、硫酸と過酸化水素水の混合液であるSPM(sulfuric acid / hydrogen peroxide mixture)液がノズルから供給され、SPM液に含まれるカロ酸の強酸化力により基板上のレジストが除去される。当該レジスト除去装置では、加熱された硫酸と常温(すなわち、室温と同程度の温度)の過酸化水素水とを混合することによりSPM液が生成される。硫酸と過酸化水素水との混合時には大きな反応熱が生じるため、基板上に供給されるSPM液の温度は、加熱された硫酸の温度よりも高くなる。SPM液を用いたレジスト除去処理では、効率的にレジストを除去するために、SPM液の温度を高く維持することが好ましい。   For example, in the resist removal apparatus disclosed in Patent Document 1, an SPM (sulfuric acid / hydrogen peroxide mixture) solution, which is a mixed solution of sulfuric acid and hydrogen peroxide solution, is supplied from a nozzle onto a horizontally rotating substrate and is included in the SPM solution. The resist on the substrate is removed by the strong oxidizing power of caloic acid. In the resist removal apparatus, the SPM liquid is generated by mixing heated sulfuric acid and hydrogen peroxide solution at room temperature (that is, a temperature approximately equal to room temperature). Since large reaction heat is generated when sulfuric acid and hydrogen peroxide are mixed, the temperature of the SPM liquid supplied onto the substrate is higher than the temperature of the heated sulfuric acid. In the resist removal process using the SPM solution, it is preferable to keep the temperature of the SPM solution high in order to efficiently remove the resist.

特開2007−59816号公報JP 2007-59816 A

ところで、特許文献1のレジスト除去装置では、装置を駆動した直後は、硫酸をノズルへと導く配管等の温度も常温であるため、ノズルから供給されるSPM液の温度が所望の温度よりも低下してしまうおそれがある。また、常温の基板上に高温のSPM液が供給されるため、SPM液の温度が基板上において低下してしまい、レジスト除去の効率が低下してしまうおそれがある。さらに、基板の回転により、SPM液が基板の中央部からエッジに向かって移動する間にもSPM液の温度は低下するため、基板の中央部とエッジ近傍の部位とでレジスト除去の状態が異なり、エッジ近傍の部位でレジストの一部が除去されずに残ってしまう可能性がある。   By the way, in the resist removal apparatus of Patent Document 1, immediately after the apparatus is driven, the temperature of the pipe or the like for introducing sulfuric acid to the nozzle is also normal temperature, so the temperature of the SPM liquid supplied from the nozzle is lower than the desired temperature. There is a risk of it. Further, since the high-temperature SPM liquid is supplied onto the normal temperature substrate, the temperature of the SPM liquid is lowered on the substrate, and the resist removal efficiency may be reduced. Furthermore, since the temperature of the SPM liquid decreases while the SPM liquid moves from the central portion of the substrate toward the edge due to the rotation of the substrate, the state of resist removal differs between the central portion of the substrate and the portion near the edge. There is a possibility that a part of the resist may remain without being removed at a portion in the vicinity of the edge.

本発明は、上記課題に鑑みなされたものであり、SPM処理の際に、基板上における処理液の温度低下を抑制することを主な目的としている。   The present invention has been made in view of the above problems, and has as its main object to suppress a temperature drop of a processing solution on a substrate during SPM processing.

請求項1に記載の発明は、基板を処理する基板処理装置であって、基板を保持する基板保持部と、加熱された硫酸を供給する硫酸供給部と過酸化水素水を供給する過酸化水素水供給部とを有する処理液供給部と、前記処理液供給部を制御することにより、過酸化水素水の供給を停止した状態で、加熱された硫酸を前記基板に供給して前記基板を所定の温度まで加熱する予備加熱処理を行った後、加熱された硫酸と過酸化水素水とを前記処理液供給部により混合しつつ前記基板の主面に供給して前記基板に対するSPM処理を行う制御部とを備える。   The invention according to claim 1 is a substrate processing apparatus for processing a substrate, wherein the substrate holding unit holds the substrate, the sulfuric acid supply unit supplies heated sulfuric acid, and the hydrogen peroxide supplies hydrogen peroxide. By controlling the treatment liquid supply unit having a water supply unit and the treatment liquid supply unit, heated sulfuric acid is supplied to the substrate in a state where supply of hydrogen peroxide solution is stopped, and the substrate is predetermined. Control for performing SPM processing on the substrate by supplying the heated sulfuric acid and the hydrogen peroxide solution to the main surface of the substrate while being mixed by the treatment liquid supply unit. A part.

請求項2に記載の発明は、請求項1に記載の基板処理装置であって、前記予備加熱処理の際に前記基板に供給された硫酸を回収し、前記硫酸供給部へと戻す回収部をさらに備える。   Invention of Claim 2 is a substrate processing apparatus of Claim 1, Comprising: The collection | recovery part which collect | recovers the sulfuric acid supplied to the said board | substrate in the case of the said preheating process, and returns to the said sulfuric acid supply part Further prepare.

請求項3に記載の発明は、請求項1または2に記載の基板処理装置であって、前記予備加熱処理時の硫酸の流量が、前記SPM処理時の硫酸の流量よりも多い。   A third aspect of the present invention is the substrate processing apparatus according to the first or second aspect, wherein the flow rate of sulfuric acid during the preheating treatment is greater than the flow rate of sulfuric acid during the SPM treatment.

請求項4に記載の発明は、請求項1ないし3のいずれかに記載の基板処理装置であって、前記処理液供給部が、前記硫酸供給部および前記過酸化水素水供給部に接続され、前記SPM処理の際に、前記硫酸供給部からの加熱された硫酸と前記過酸化水素水供給部からの過酸化水素水を混合して混合液を生成する混合液生成部をさらに備える。   Invention of Claim 4 is a substrate processing apparatus in any one of Claim 1 thru | or 3, Comprising: The said process liquid supply part is connected to the said sulfuric acid supply part and the said hydrogen peroxide solution supply part, The SPM treatment further includes a mixed solution generation unit that generates a mixed solution by mixing the heated sulfuric acid from the sulfuric acid supply unit and the hydrogen peroxide solution from the hydrogen peroxide solution supply unit.

請求項5に記載の発明は、請求項1ないし4のいずれかに記載の基板処理装置であって、前記予備加熱処理時の前記硫酸供給部における硫酸の温度が、前記SPM処理時の前記硫酸供給部における硫酸の温度に等しい。   Invention of Claim 5 is a substrate processing apparatus in any one of Claim 1 thru | or 4, Comprising: The temperature of the sulfuric acid in the said sulfuric-acid supply part at the time of the said preheating process is the said sulfuric acid at the time of the said SPM process Equal to the temperature of sulfuric acid in the supply section.

請求項6に記載の発明は、基板を処理する基板処理方法であって、a)基板に対する過酸化水素水の供給を停止した状態で、加熱された硫酸を前記基板に供給して前記基板を所定の温度まで加熱する予備加熱処理を行う工程と、b)加熱された硫酸と過酸化水素水とを混合しつつ前記予備加熱処理が行われた前記基板の主面に供給して前記基板に対するSPM処理を行う工程とを備える。   The invention according to claim 6 is a substrate processing method for processing a substrate, and a) supplying heated sulfuric acid to the substrate in a state in which the supply of hydrogen peroxide solution to the substrate is stopped. A step of performing a preheating treatment for heating to a predetermined temperature; and b) supplying the main surface of the substrate that has been subjected to the preheating treatment while mixing heated sulfuric acid and hydrogen peroxide solution to the substrate. And a step of performing SPM processing.

本発明では、SPM処理の際に、基板上における処理液の温度低下を抑制することができる。   In the present invention, the temperature drop of the processing liquid on the substrate can be suppressed during the SPM processing.

一の実施の形態に係る基板処理装置の構成を示す図である。It is a figure which shows the structure of the substrate processing apparatus which concerns on one embodiment. 基板の処理の流れを示す図である。It is a figure which shows the flow of a process of a board | substrate.

図1は、本発明の一の実施の形態に係る基板処理装置1の構成を示す図である。図1に示すように、基板処理装置1は、半導体基板9(以下、単に「基板9」という。)を1枚ずつ処理する枚葉式の装置である。基板処理装置1では、基板9にSPM(sulfuric acid / hydrogen peroxide mixture)液が供給されてSPM処理、すなわち、基板9上のレジスト膜の除去処理が行われる。   FIG. 1 is a diagram showing a configuration of a substrate processing apparatus 1 according to an embodiment of the present invention. As shown in FIG. 1, the substrate processing apparatus 1 is a single-wafer type apparatus that processes semiconductor substrates 9 (hereinafter simply referred to as “substrates 9”) one by one. In the substrate processing apparatus 1, an SPM (sulfuric acid / hydrogen peroxide mixture) solution is supplied to the substrate 9 to perform an SPM process, that is, a resist film removal process on the substrate 9.

基板処理装置1は、基板9の一方の主面91(以下、「上面91」という。)を上側に向けた状態で基板9を保持する基板保持部2、基板9の上面91に向けてSPM液等の液体を吐出する処理液供給部3、基板9および基板保持部2の周囲を囲むカップ部4、基板9を基板保持部2と共に水平に回転する基板回転機構5、カップ部4から液体を回収する回収部6、基板9の上面91にリンス液を供給するリンス液供給部7、並びに、これらの機構を制御する制御部8を備える。基板9は、基板回転機構5により、基板9の中心を通るとともに基板9の上面91に垂直な回転軸を中心として基板保持部2と共に回転する。基板処理装置1では、基板保持部2、カップ部4、基板回転機構5等が、図示省略のチャンバ内に収容される。   The substrate processing apparatus 1 includes a substrate holding unit 2 that holds the substrate 9 with one main surface 91 (hereinafter referred to as “upper surface 91”) of the substrate 9 facing upward, and an SPM toward the upper surface 91 of the substrate 9. The processing liquid supply unit 3 that discharges liquid such as liquid, the cup unit 4 that surrounds the periphery of the substrate 9 and the substrate holding unit 2, the substrate rotating mechanism 5 that rotates the substrate 9 together with the substrate holding unit 2, and the liquid from the cup unit 4 A recovery part 6 for recovering the liquid, a rinse liquid supply part 7 for supplying a rinse liquid to the upper surface 91 of the substrate 9, and a control part 8 for controlling these mechanisms. The substrate 9 is rotated by the substrate rotating mechanism 5 together with the substrate holding unit 2 about a rotation axis that passes through the center of the substrate 9 and is perpendicular to the upper surface 91 of the substrate 9. In the substrate processing apparatus 1, the substrate holding unit 2, the cup unit 4, the substrate rotating mechanism 5 and the like are accommodated in a chamber (not shown).

処理液供給部3は、硫酸を供給する硫酸供給部31、過酸化水素水を供給する過酸化水素水供給部32、硫酸供給部31および過酸化水素水供給部32に接続される混合液生成部33、基板9の上方に配置されて基板9に向けて液体を吐出するノズル34、並びに、ノズル34を回動軸351を中心として水平に回動するノズル回動機構35を備える。ノズル回動機構35は、回転軸351から水平方向に延びるとともにノズル34が取り付けられるアーム352を備える。   The treatment liquid supply unit 3 generates a mixed liquid connected to the sulfuric acid supply unit 31 that supplies sulfuric acid, the hydrogen peroxide solution supply unit 32 that supplies hydrogen peroxide solution, the sulfuric acid supply unit 31, and the hydrogen peroxide solution supply unit 32. A nozzle 33 that is disposed above the substrate 33 and that discharges liquid toward the substrate 9; and a nozzle rotation mechanism 35 that rotates the nozzle 34 horizontally about a rotation shaft 351. The nozzle rotation mechanism 35 includes an arm 352 that extends in the horizontal direction from the rotation shaft 351 and to which the nozzle 34 is attached.

硫酸供給部31は、硫酸を貯溜する硫酸貯溜部311、硫酸貯溜部311および混合液生成部33に接続される硫酸配管312、硫酸貯溜部311から硫酸配管312を介して混合液生成部33へと硫酸を供給する硫酸ポンプ313、硫酸配管312上に設けられる硫酸バルブ314、並びに、硫酸ポンプ313と硫酸バルブ314との間で硫酸配管312上に設けられて硫酸を加熱する硫酸加熱部315を備える。硫酸配管312は硫酸加熱部315と硫酸バルブ314との間で分岐して硫酸貯溜部311へと接続されており、硫酸バルブ314が閉じられている状態では、硫酸加熱部315により加熱された硫酸は、硫酸貯溜部311と硫酸加熱部315とを循環する。   The sulfuric acid supply unit 31 is connected to the sulfuric acid storage unit 311 for storing sulfuric acid, the sulfuric acid storage unit 311 and the mixed liquid generation unit 33, and the sulfuric acid storage unit 311 to the mixed liquid generation unit 33 via the sulfuric acid piping 312. And a sulfuric acid pump 313 for supplying sulfuric acid, a sulfuric acid valve 314 provided on the sulfuric acid pipe 312, and a sulfuric acid heating unit 315 provided on the sulfuric acid pipe 312 between the sulfuric acid pump 313 and the sulfuric acid valve 314 for heating sulfuric acid. Prepare. The sulfuric acid pipe 312 branches between the sulfuric acid heating unit 315 and the sulfuric acid valve 314 and is connected to the sulfuric acid storage unit 311. When the sulfuric acid valve 314 is closed, the sulfuric acid heated by the sulfuric acid heating unit 315 is connected. Circulates between the sulfuric acid storage part 311 and the sulfuric acid heating part 315.

過酸化水素水供給部32は、過酸化水素水を貯溜する過酸化水素水貯溜部321、過酸化水素水貯溜部321および混合液生成部33に接続される過酸化水素水配管322、過酸化水素水貯溜部321から過酸化水素水配管322を介して混合液生成部33へと過酸化水素水を供給する過酸化水素水ポンプ323、並びに、過酸化水素水配管322上に設けられる過酸化水素水バルブ324を備える。なお、硫酸貯溜部311および過酸化水素水貯溜部321は、基板処理装置1の外部に設けられ、硫酸供給部31および過酸化水素水供給部32がそれぞれ接続されてもよい。   The hydrogen peroxide solution supply unit 32 includes a hydrogen peroxide solution storage unit 321 for storing hydrogen peroxide solution, a hydrogen peroxide solution storage unit 321, and a hydrogen peroxide solution pipe 322 connected to the mixed solution generation unit 33. A hydrogen peroxide solution pump 323 for supplying hydrogen peroxide solution from the hydrogen water storage unit 321 to the mixed solution generating unit 33 through the hydrogen peroxide solution pipe 322, and a peroxide provided on the hydrogen peroxide solution tube 322 A hydrogen water valve 324 is provided. The sulfuric acid storage unit 311 and the hydrogen peroxide solution storage unit 321 may be provided outside the substrate processing apparatus 1, and the sulfuric acid supply unit 31 and the hydrogen peroxide solution supply unit 32 may be connected to each other.

混合液生成部33は、硫酸配管312および過酸化水素水配管322が接続されるミキシングバルブ331、ミキシングバルブ331およびノズル34に接続される吐出用配管332、並びに、吐出用配管332上に設けられる攪拌流通管333を備える。混合液生成部33では、硫酸供給部31からの加熱された硫酸と、過酸化水素水供給部32からの常温(すなわち、室温と同程度の温度)の過酸化水素水とが、ミキシングバルブ331において混合されて混合液であるSPM液(硫酸過水)が生成される。SPM液は攪拌流通管333および吐出用配管332を通過してノズル34へと送られる。攪拌流通管333では、SPM液が攪拌されることにより、硫酸と過酸化水素水との化学反応が促進される。SPM液は、ノズル34の先端の吐出口から基板9の上面91に向けて吐出される。本実施の形態では、硫酸加熱部315により約130℃〜150℃に加熱された硫酸が硫酸供給部31から混合液生成部33へと供給される。なお、硫酸供給部31から供給される硫酸の温度は適宜変更されてよい。   The mixed liquid generation unit 33 is provided on the mixing valve 331 to which the sulfuric acid pipe 312 and the hydrogen peroxide pipe 322 are connected, the discharge pipe 332 connected to the mixing valve 331 and the nozzle 34, and the discharge pipe 332. A stirring flow pipe 333 is provided. In the mixed solution generation unit 33, the heated sulfuric acid from the sulfuric acid supply unit 31 and the hydrogen peroxide solution at room temperature (that is, a temperature similar to room temperature) from the hydrogen peroxide solution supply unit 32 are mixed with each other. Is mixed to produce an SPM liquid (sulfuric acid / hydrogen peroxide) as a mixed liquid. The SPM liquid passes through the stirring flow pipe 333 and the discharge pipe 332 and is sent to the nozzle 34. In the stirring flow pipe 333, the chemical reaction between sulfuric acid and hydrogen peroxide solution is promoted by stirring the SPM liquid. The SPM liquid is discharged from the discharge port at the tip of the nozzle 34 toward the upper surface 91 of the substrate 9. In the present embodiment, sulfuric acid heated to about 130 ° C. to 150 ° C. by the sulfuric acid heating unit 315 is supplied from the sulfuric acid supply unit 31 to the mixed liquid generation unit 33. Note that the temperature of the sulfuric acid supplied from the sulfuric acid supply unit 31 may be changed as appropriate.

回収部6は、カップ部4の底部に接続される使用済液体配管61、使用済液体配管61に接続される三方バルブ62、三方バルブ62と廃液回収部63とを接続する廃液配管64、三方バルブ62と硫酸貯溜部311とを接続する硫酸回収用配管65、および、硫酸回収用配管65上に設けられ、カップ部4から回収した硫酸を硫酸貯溜部311へと送る硫酸回収ポンプ66を備える。   The recovery part 6 includes a used liquid pipe 61 connected to the bottom of the cup part 4, a three-way valve 62 connected to the used liquid pipe 61, a waste liquid pipe 64 connecting the three-way valve 62 and the waste liquid recovery part 63, three-way A sulfuric acid recovery pipe 65 that connects the valve 62 and the sulfuric acid storage part 311, and a sulfuric acid recovery pump 66 that is provided on the sulfuric acid recovery pipe 65 and sends the sulfuric acid recovered from the cup part 4 to the sulfuric acid storage part 311. .

図2は、基板処理装置1における基板9の処理の流れを示す図である。基板処理装置1では、まず、基板9が搬入されて基板保持部2により保持される。続いて、制御部8により基板回転機構5が制御されることにより、基板9の回転が開始される。また、ノズル回動機構35によるノズル34の回動が開始され、ノズル34が基板9の中心部とエッジとの間で往復運動を繰り返す(ステップS11)。なお、基板処理装置1では、基板9の中心部の上方にて停止したノズル34から、後述する液体の供給が行われてもよい。   FIG. 2 is a diagram illustrating a processing flow of the substrate 9 in the substrate processing apparatus 1. In the substrate processing apparatus 1, first, the substrate 9 is loaded and held by the substrate holding unit 2. Subsequently, when the substrate rotating mechanism 5 is controlled by the control unit 8, the rotation of the substrate 9 is started. In addition, the rotation of the nozzle 34 by the nozzle rotation mechanism 35 is started, and the nozzle 34 repeats reciprocating motion between the center portion and the edge of the substrate 9 (step S11). In the substrate processing apparatus 1, a liquid to be described later may be supplied from the nozzle 34 stopped above the central portion of the substrate 9.

次に、制御部8により処理液供給部3が制御されることにより、硫酸供給部31の硫酸バルブ314が開かれ、硫酸加熱部315により約130℃〜150℃に加熱された硫酸が、硫酸配管312を介して混合液生成部33へと所定の流量にて供給される。このとき、過酸化水素水バルブ324は閉じられている。   Next, when the processing liquid supply unit 3 is controlled by the control unit 8, the sulfuric acid valve 314 of the sulfuric acid supply unit 31 is opened, and the sulfuric acid heated to about 130 ° C. to 150 ° C. by the sulfuric acid heating unit 315 is converted into sulfuric acid. It is supplied at a predetermined flow rate to the mixed liquid generation unit 33 via the pipe 312. At this time, the hydrogen peroxide solution valve 324 is closed.

加熱された硫酸は、過酸化水素水の供給が停止された状態で、混合液生成部33のミキシングバルブ331、吐出用配管332および攪拌流通管333を通過し、ノズル34から基板9の上面91へと供給される。基板9上の硫酸は、基板9の回転により基板9のエッジに向かって上面91上を移動し、これにより、基板9の上面91が全面に亘って硫酸により加熱される。基板9上を移動する硫酸は、基板9のエッジから外側へと飛散する。基板9から飛散した硫酸は、カップ部4の側壁の内面を伝わって、あるいは、直接カップ部4の底部へと移動し、カップ部4の底部に接続された回収部6により回収される。回収部6では、三方バルブ62により使用済液体配管61と硫酸回収用配管65とが接続されており、硫酸回収ポンプ66が駆動されることにより、カップ部4から回収された硫酸が、硫酸供給部31の硫酸貯溜部311へと戻される。硫酸貯溜部311へと戻された硫酸は、硫酸供給部31から混合液生成部33へと再度供給される。   The heated sulfuric acid passes through the mixing valve 331, the discharge pipe 332 and the stirring flow pipe 333 of the mixed liquid generation unit 33 in a state where the supply of the hydrogen peroxide solution is stopped, and passes from the nozzle 34 to the upper surface 91 of the substrate 9. Supplied to. The sulfuric acid on the substrate 9 moves on the upper surface 91 toward the edge of the substrate 9 by the rotation of the substrate 9, whereby the upper surface 91 of the substrate 9 is heated by the sulfuric acid over the entire surface. The sulfuric acid moving on the substrate 9 scatters from the edge of the substrate 9 to the outside. The sulfuric acid scattered from the substrate 9 travels along the inner surface of the side wall of the cup part 4 or directly moves to the bottom part of the cup part 4 and is collected by the collecting part 6 connected to the bottom part of the cup part 4. In the recovery unit 6, the used liquid pipe 61 and the sulfuric acid recovery pipe 65 are connected by a three-way valve 62, and the sulfuric acid recovered from the cup unit 4 is supplied with sulfuric acid by driving the sulfuric acid recovery pump 66. It returns to the sulfuric acid storage part 311 of the part 31. The sulfuric acid returned to the sulfuric acid storage unit 311 is supplied again from the sulfuric acid supply unit 31 to the mixed solution generation unit 33.

基板処理装置1では、基板9に対する加熱された硫酸の供給が所定時間だけ連続的に行われされ、基板9の上面91の温度を所定の温度(例えば、約130℃〜150℃)まで加熱する予備加熱処理が行われる(ステップS12)。予備加熱処理が行われている間、回収部6による硫酸の回収、および、硫酸供給部31への送出は連続的に行われる。硫酸供給部31では、加熱された硫酸が流れることにより、硫酸配管312、ミキシングバルブ331、吐出用配管332、攪拌流通管333およびノズル34も所定の温度(例えば、約130℃〜150℃)まで加熱される。   In the substrate processing apparatus 1, the heated sulfuric acid is continuously supplied to the substrate 9 for a predetermined time, and the temperature of the upper surface 91 of the substrate 9 is heated to a predetermined temperature (for example, about 130 ° C. to 150 ° C.). A preheating process is performed (step S12). During the preheating process, the recovery of the sulfuric acid by the recovery unit 6 and the delivery to the sulfuric acid supply unit 31 are continuously performed. In the sulfuric acid supply unit 31, the heated sulfuric acid flows, so that the sulfuric acid pipe 312, the mixing valve 331, the discharge pipe 332, the stirring flow pipe 333 and the nozzle 34 also reach a predetermined temperature (for example, about 130 ° C. to 150 ° C.). Heated.

予備加熱処理が終了すると、制御部8により硫酸バルブ314が調整され、硫酸供給部31から混合液生成部33に供給される硫酸の流量がSPM処理時の所定の流量に変更される。本実施の形態では、予備加熱処理時に硫酸供給部31から混合液生成部33に供給される硫酸の流量は、SPM処理時に硫酸供給部31から混合液生成部33に供給される硫酸の流量よりも多い。一方、SPM処理時の硫酸供給部31における硫酸の温度は、予備加熱処理時の硫酸供給部31における硫酸の温度におよそ等しく、約130℃〜150℃である。   When the preliminary heating process is completed, the sulfuric acid valve 314 is adjusted by the control unit 8, and the flow rate of sulfuric acid supplied from the sulfuric acid supply unit 31 to the mixed solution generation unit 33 is changed to a predetermined flow rate during the SPM process. In the present embodiment, the flow rate of sulfuric acid supplied from the sulfuric acid supply unit 31 to the mixed solution generating unit 33 during the preheating process is greater than the flow rate of sulfuric acid supplied from the sulfuric acid supply unit 31 to the mixed solution generating unit 33 during the SPM process. There are also many. On the other hand, the temperature of sulfuric acid in the sulfuric acid supply unit 31 during the SPM treatment is approximately equal to the temperature of sulfuric acid in the sulfuric acid supply unit 31 during the preheating treatment, and is approximately 130 ° C. to 150 ° C.

処理液供給部3では、制御部8により過酸化水素水バルブ324が開かれ、常温の過酸化水素水が、過酸化水素水貯溜部321から過酸化水素水配管322を介してミキシングバルブ331へと所定の流量にて供給される。ミキシングバルブ331では、加熱された硫酸と常温の過酸化水素水とが混合されてSPM液が生成される。SPM液の温度は、硫酸と過酸化水素水との反応により、硫酸供給部31から供給される硫酸の温度よりも高く、約150℃〜195℃となる。SPM液は、吐出用配管332および攪拌流通管333を通過し、ノズル34から、予備加熱処理が行われた基板9の上面91に対して供給される。換言すれば、処理液供給部3により、加熱された硫酸と過酸化水素水とが混合されつつ基板9の上面91に供給される。   In the treatment liquid supply unit 3, the hydrogen peroxide solution valve 324 is opened by the control unit 8, and normal temperature hydrogen peroxide solution is supplied from the hydrogen peroxide solution storage unit 321 to the mixing valve 331 via the hydrogen peroxide solution pipe 322. And at a predetermined flow rate. In the mixing valve 331, the heated sulfuric acid and the hydrogen peroxide solution at room temperature are mixed to generate the SPM liquid. The temperature of the SPM liquid is higher than the temperature of sulfuric acid supplied from the sulfuric acid supply unit 31 by the reaction between sulfuric acid and hydrogen peroxide solution, and is about 150 ° C. to 195 ° C. The SPM liquid passes through the discharge pipe 332 and the stirring flow pipe 333, and is supplied from the nozzle 34 to the upper surface 91 of the substrate 9 on which the preheating treatment has been performed. In other words, heated sulfuric acid and hydrogen peroxide solution are mixed and supplied to the upper surface 91 of the substrate 9 by the processing liquid supply unit 3.

SPM液は、基板9の回転により、基板9の上面91の全面に拡がり、基板9のエッジから外側へと飛散してカップ部4により受けられる。回収部6では、三方バルブ62が切り換えられて使用済液体配管61と廃液配管64とが接続されており、廃液回収部63が駆動されることにより、カップ部4から回収されたSPM液が廃棄される。基板処理装置1では、基板9に対するSPM液の供給が所定時間だけ連続的に行われ、基板9に対するSPM処理、すなわち、SPM液に含まれるカロ酸の強酸化力による基板9上のレジスト膜の除去処理が行われる(ステップS13)。   The SPM liquid spreads over the entire upper surface 91 of the substrate 9 by the rotation of the substrate 9, scatters from the edge of the substrate 9 to the outside, and is received by the cup portion 4. In the recovery unit 6, the three-way valve 62 is switched to connect the used liquid pipe 61 and the waste liquid pipe 64, and the SPM liquid recovered from the cup unit 4 is discarded by driving the waste liquid recovery unit 63. Is done. In the substrate processing apparatus 1, the supply of the SPM liquid to the substrate 9 is continuously performed for a predetermined time, and the SPM process for the substrate 9, that is, the resist film on the substrate 9 due to the strong oxidizing power of caloic acid contained in the SPM liquid. A removal process is performed (step S13).

SPM処理が終了すると、過酸化水素水バルブ324が開かれた状態で硫酸バルブ314が閉じられ、過酸化水素水が、ミキシングバルブ331、吐出用配管332および攪拌流通管333を通過し、ノズル34から、レジスト膜が除去された基板9上に供給される(ステップS14)。当該過酸化水素水供給処理により、ミキシングバルブ331、吐出用配管332、攪拌流通管333およびノズル34内に残っているSPM液が除去される。また、基板9上に供給された過酸化水素水は、基板9の回転により、基板9の上面91の全面に拡がり、基板9上に残っているSPM液を、基板9のエッジから外側へと押し出して除去する。基板9のエッジから外側に飛散したSPM液および過酸化水素水は、上記と同様に、回収部6により廃棄される。   When the SPM processing is completed, the sulfuric acid valve 314 is closed with the hydrogen peroxide solution valve 324 opened, and the hydrogen peroxide solution passes through the mixing valve 331, the discharge pipe 332, and the stirring flow pipe 333, and the nozzle 34 To the substrate 9 from which the resist film has been removed (step S14). By the hydrogen peroxide supply process, the SPM liquid remaining in the mixing valve 331, the discharge pipe 332, the stirring flow pipe 333, and the nozzle 34 is removed. Further, the hydrogen peroxide solution supplied onto the substrate 9 spreads over the entire upper surface 91 of the substrate 9 by the rotation of the substrate 9, and the SPM liquid remaining on the substrate 9 is moved outward from the edge of the substrate 9. Extrude and remove. The SPM liquid and the hydrogen peroxide solution scattered from the edge of the substrate 9 to the outside are discarded by the recovery unit 6 as described above.

過酸化水素水供給処理が終了すると、過酸化水素水バルブ324が閉じられて過酸化水素水の供給が停止され、ノズル回動機構35により、ノズル34が基板9の外側の待機位置へと移動される(ステップS15)。次に、リンス液供給部7から基板9の上面91に、リンス液である純水(DIW:deionized water)が供給されるリンス処理が行われる(ステップS16)。リンス液は、基板9の回転により、基板9の上面91の全面に拡がる。これにより、基板9上に残っている過酸化水素水が洗い流される。リンス処理が所定時間だけ連続的に行われると、リンス液の供給が停止される。そして、基板9の回転数を増大させ、基板9の回転により基板9上に残っているリンス液を除去する乾燥処理が行われる(ステップS17)。その後、基板9の回転が停止され(ステップS18)、基板9が基板処理装置1から搬出される。   When the hydrogen peroxide solution supply process is completed, the hydrogen peroxide solution valve 324 is closed and the supply of the hydrogen peroxide solution is stopped, and the nozzle 34 is moved to the standby position outside the substrate 9 by the nozzle rotation mechanism 35. (Step S15). Next, a rinsing process is performed in which pure water (DIW: deionized water) that is a rinsing liquid is supplied from the rinsing liquid supply unit 7 to the upper surface 91 of the substrate 9 (step S16). The rinse liquid spreads over the entire upper surface 91 of the substrate 9 by the rotation of the substrate 9. Thereby, the hydrogen peroxide remaining on the substrate 9 is washed away. When the rinsing process is continuously performed for a predetermined time, the supply of the rinsing liquid is stopped. Then, the rotational speed of the substrate 9 is increased, and a drying process is performed to remove the rinse liquid remaining on the substrate 9 by the rotation of the substrate 9 (step S17). Thereafter, the rotation of the substrate 9 is stopped (step S18), and the substrate 9 is unloaded from the substrate processing apparatus 1.

以上に説明したように、基板処理装置1では、基板9に対するSPM処理が行われるよりも前に、加熱された硫酸が処理液供給部3により基板9に供給され、基板9が加熱される。このように、基板9に対する予備加熱処理が行われることにより、SPM処理の際に、基板9上に供給された高温のSPM液の温度低下を抑制することができる。その結果、SPM処理の効率を向上することができる。また、基板9の上面91上を移動する際のSPM液の温度低下も抑制することができるため、基板9の上面91全体におけるSPM処理の均一性、および、膜減りや膜成長の均一性を向上することもできる。   As described above, in the substrate processing apparatus 1, the heated sulfuric acid is supplied to the substrate 9 by the processing liquid supply unit 3 and the substrate 9 is heated before the SPM process is performed on the substrate 9. Thus, by performing the preheating process with respect to the board | substrate 9, the temperature fall of the high temperature SPM liquid supplied on the board | substrate 9 can be suppressed in the case of SPM processing. As a result, the efficiency of SPM processing can be improved. Moreover, since the temperature drop of the SPM liquid when moving on the upper surface 91 of the substrate 9 can be suppressed, the uniformity of the SPM process on the entire upper surface 91 of the substrate 9 and the uniformity of film reduction and film growth can be reduced. It can also be improved.

さらに、SPM処理の開始前に、硫酸配管312、ミキシングバルブ331、吐出用配管332、攪拌流通管333およびノズル34も加熱されるため、ミキシングバルブ331への過酸化水素水の供給開始から、ノズル34から吐出されるSPM液の温度が所望の温度に達するまでの時間を短縮することができる。その結果、SPM処理に要する時間を短縮することができる。   Further, since the sulfuric acid pipe 312, the mixing valve 331, the discharge pipe 332, the agitation flow pipe 333 and the nozzle 34 are also heated before the start of the SPM process, the supply of hydrogen peroxide water to the mixing valve 331 is started. The time until the temperature of the SPM liquid discharged from 34 reaches a desired temperature can be shortened. As a result, the time required for the SPM process can be shortened.

基板処理装置1では、予備加熱処理の際に基板9に供給された硫酸を回収して硫酸供給部31へと戻す回収部6が設けられることにより、硫酸の使用量の増大を防止することができる。また、処理液供給部3が、硫酸供給部31からの硫酸と過酸化水素水供給部32からの過酸化水素水を混合してSPM液を生成する混合液生成部33を備えることにより、硫酸と過酸化水素水とを個別の吐出口から基板9に供給する場合に比べて、SPM処理の効率をより向上することができるとともに基板9の上面91全体におけるSPM処理の均一性をより向上することができる。   In the substrate processing apparatus 1, an increase in the amount of sulfuric acid used can be prevented by providing the recovery unit 6 that recovers the sulfuric acid supplied to the substrate 9 during the preheating process and returns it to the sulfuric acid supply unit 31. it can. In addition, the treatment liquid supply unit 3 includes a mixed liquid generation unit 33 that mixes the sulfuric acid from the sulfuric acid supply unit 31 and the hydrogen peroxide solution from the hydrogen peroxide solution supply unit 32 to generate the SPM liquid, thereby And the efficiency of SPM processing can be further improved and the uniformity of SPM processing on the entire upper surface 91 of the substrate 9 can be further improved as compared with the case where the hydrogen peroxide solution and hydrogen peroxide solution are supplied to the substrate 9 from individual discharge ports. be able to.

上述のように、基板処理装置1では、予備加熱処理時の硫酸供給部31における硫酸の流量を、SPM処理時の硫酸供給部31における硫酸の流量よりも多くすることにより、予備加熱処理に要する時間を短くすることができる。さらに、予備加熱処理時の硫酸供給部31における硫酸の温度が、SPM処理時の硫酸供給部31における硫酸の温度に等しいため、予備加熱処理からSPM処理へと移行する際に、硫酸供給部31において硫酸の温度変更を行う必要がない。その結果、基板処理装置1における上述の一連の処理に要する時間を短くすることができる。   As described above, in the substrate processing apparatus 1, the preheating treatment is required by increasing the flow rate of sulfuric acid in the sulfuric acid supply unit 31 during the preheating treatment to be higher than the flow rate of sulfuric acid in the sulfuric acid supply unit 31 during the SPM treatment. Time can be shortened. Furthermore, since the temperature of sulfuric acid in the sulfuric acid supply unit 31 during the preheating treatment is equal to the temperature of sulfuric acid in the sulfuric acid supply unit 31 during the SPM treatment, the sulfuric acid supply unit 31 is used when shifting from the preheating treatment to the SPM treatment. It is not necessary to change the temperature of sulfuric acid in As a result, the time required for the above-described series of processes in the substrate processing apparatus 1 can be shortened.

以上、本発明の実施の形態について説明してきたが、本発明は上記実施の形態に限定されるものではなく、様々な変更が可能である。   As mentioned above, although embodiment of this invention has been described, this invention is not limited to the said embodiment, A various change is possible.

予備加熱処理時の硫酸供給部31における硫酸の温度は、SPM処理時の硫酸供給部31における硫酸の温度と異なっていてもよい。例えば、予備加熱処理の際のみ作動する加熱部が硫酸配管312上に追加され、予備加熱処理時の硫酸の温度が、SPM処理時のSPM液の温度とおよそ等しくされてもよい。予備加熱処理に要する時間が十分に短いのであれば、予備加熱処理時の硫酸の流量は、例えば、SPM処理時の硫酸の流量とおよそ等しくてもよい。   The temperature of sulfuric acid in the sulfuric acid supply unit 31 during the preheating treatment may be different from the temperature of sulfuric acid in the sulfuric acid supply unit 31 during the SPM treatment. For example, a heating unit that operates only during the preheating process may be added on the sulfuric acid pipe 312 so that the temperature of the sulfuric acid during the preheating process is approximately equal to the temperature of the SPM liquid during the SPM process. If the time required for the preheating treatment is sufficiently short, the flow rate of sulfuric acid during the preheating treatment may be approximately equal to the flow rate of sulfuric acid during the SPM treatment, for example.

SPM処理の効率および均一性が許容範囲内であれば、処理液供給部3から混合液生成部33が省略され、硫酸供給部31から、加熱された硫酸が基板9に向けて吐出され、過酸化水素水供給部32から過酸化水素水が基板9に向けて吐出される。この場合も、上記実施の形態と同様に、硫酸供給部31から加熱された硫酸を基板9に供給して予備加熱処理が行われた後に、加熱された硫酸と過酸化水素水とを処理液供給部3により混合しつつ基板9の上面91に供給して基板9に対するSPM処理が行われる。これにより、基板9上に供給された処理液(すなわち、硫酸と過酸化水素水との混合液)の温度低下を抑制することができる。また、基板9の上面91全体におけるSPM処理の均一性を向上することもできる。さらに、硫酸供給部31の硫酸配管312をSPM処理前に加熱することができるため、基板9上の処理液の温度が所望の温度に達するまでの時間を短縮することができる。   If the efficiency and uniformity of the SPM process are within an allowable range, the mixed liquid generating unit 33 is omitted from the processing liquid supply unit 3, and heated sulfuric acid is discharged from the sulfuric acid supply unit 31 toward the substrate 9. Hydrogen peroxide water is discharged from the hydrogen oxide water supply unit 32 toward the substrate 9. Also in this case, similar to the above-described embodiment, after the sulfuric acid heated from the sulfuric acid supply unit 31 is supplied to the substrate 9 and the preheating treatment is performed, the heated sulfuric acid and the hydrogen peroxide solution are treated with the treatment liquid. SPM processing is performed on the substrate 9 by being supplied to the upper surface 91 of the substrate 9 while being mixed by the supply unit 3. Thereby, the temperature fall of the process liquid (namely, mixed liquid of a sulfuric acid and hydrogen peroxide solution) supplied on the board | substrate 9 can be suppressed. In addition, the uniformity of the SPM process on the entire upper surface 91 of the substrate 9 can be improved. Furthermore, since the sulfuric acid pipe 312 of the sulfuric acid supply unit 31 can be heated before the SPM process, the time until the temperature of the processing liquid on the substrate 9 reaches a desired temperature can be shortened.

上記実施の形態および各変形例における構成は、相互に矛盾しない限り適宜組み合わされてよい。   The configurations in the above-described embodiments and modifications may be combined as appropriate as long as they do not contradict each other.

1 基板処理装置
2 基板保持部
3 処理液供給部
6 回収部
8 制御部
9 基板
31 硫酸供給部
32 過酸化水素水供給部
33 混合液生成部
91 上面
S11〜S18 ステップ
DESCRIPTION OF SYMBOLS 1 Substrate processing apparatus 2 Substrate holding part 3 Processing liquid supply part 6 Recovery part 8 Control part 9 Substrate 31 Sulfuric acid supply part 32 Hydrogen peroxide solution supply part 33 Mixed liquid production | generation part 91 Upper surface S11-S18 Step

Claims (6)

基板を処理する基板処理装置であって、
基板を保持する基板保持部と、
加熱された硫酸を供給する硫酸供給部と過酸化水素水を供給する過酸化水素水供給部とを有する処理液供給部と、
前記処理液供給部を制御することにより、過酸化水素水の供給を停止した状態で、加熱された硫酸を前記基板に供給して前記基板を所定の温度まで加熱する予備加熱処理を行った後、加熱された硫酸と過酸化水素水とを前記処理液供給部により混合しつつ前記基板の主面に供給して前記基板に対するSPM処理を行う制御部と、
を備えることを特徴とする基板処理装置。
A substrate processing apparatus for processing a substrate,
A substrate holder for holding the substrate;
A treatment liquid supply unit having a sulfuric acid supply unit for supplying heated sulfuric acid and a hydrogen peroxide solution supply unit for supplying hydrogen peroxide solution;
After performing a preheating process for supplying heated sulfuric acid to the substrate and heating the substrate to a predetermined temperature in a state where supply of hydrogen peroxide solution is stopped by controlling the treatment liquid supply unit A controller for performing SPM processing on the substrate by supplying heated sulfuric acid and hydrogen peroxide water to the main surface of the substrate while being mixed by the treatment liquid supply unit;
A substrate processing apparatus comprising:
請求項1に記載の基板処理装置であって、
前記予備加熱処理の際に前記基板に供給された硫酸を回収し、前記硫酸供給部へと戻す回収部をさらに備えることを特徴とする基板処理装置。
The substrate processing apparatus according to claim 1,
A substrate processing apparatus, further comprising a recovery unit that recovers the sulfuric acid supplied to the substrate during the preliminary heating process and returns the sulfuric acid to the sulfuric acid supply unit.
請求項1または2に記載の基板処理装置であって、
前記予備加熱処理時の硫酸の流量が、前記SPM処理時の硫酸の流量よりも多いことを特徴とする基板処理装置。
The substrate processing apparatus according to claim 1, wherein:
The substrate processing apparatus, wherein the flow rate of sulfuric acid during the preheating treatment is larger than the flow rate of sulfuric acid during the SPM treatment.
請求項1ないし3のいずれかに記載の基板処理装置であって、
前記処理液供給部が、
前記硫酸供給部および前記過酸化水素水供給部に接続され、前記SPM処理の際に、前記硫酸供給部からの加熱された硫酸と前記過酸化水素水供給部からの過酸化水素水を混合して混合液を生成する混合液生成部をさらに備えることを特徴とする基板処理装置。
A substrate processing apparatus according to any one of claims 1 to 3,
The treatment liquid supply unit is
The sulfuric acid supply unit and the hydrogen peroxide solution supply unit are connected, and during the SPM treatment, heated sulfuric acid from the sulfuric acid supply unit and hydrogen peroxide solution from the hydrogen peroxide solution supply unit are mixed. The substrate processing apparatus further comprising a mixed liquid generating unit that generates the mixed liquid.
請求項1ないし4のいずれかに記載の基板処理装置であって、
前記予備加熱処理時の前記硫酸供給部における硫酸の温度が、前記SPM処理時の前記硫酸供給部における硫酸の温度に等しいことを特徴とする基板処理装置。
The substrate processing apparatus according to claim 1, wherein:
The substrate processing apparatus, wherein the sulfuric acid temperature in the sulfuric acid supply unit during the preheating treatment is equal to the sulfuric acid temperature in the sulfuric acid supply unit during the SPM treatment.
基板を処理する基板処理方法であって、
a)基板に対する過酸化水素水の供給を停止した状態で、加熱された硫酸を前記基板に供給して前記基板を所定の温度まで加熱する予備加熱処理を行う工程と、
b)加熱された硫酸と過酸化水素水とを混合しつつ前記予備加熱処理が行われた前記基板の主面に供給して前記基板に対するSPM処理を行う工程と、
を備えることを特徴とする基板処理方法。
A substrate processing method for processing a substrate, comprising:
a) performing a preheating process of supplying heated sulfuric acid to the substrate and heating the substrate to a predetermined temperature in a state where supply of hydrogen peroxide solution to the substrate is stopped;
b) supplying the main surface of the substrate that has been subjected to the preheating treatment while mixing heated sulfuric acid and hydrogen peroxide solution, and performing SPM treatment on the substrate;
A substrate processing method comprising:
JP2011211889A 2011-09-28 2011-09-28 Substrate processing equipment Active JP5837787B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011211889A JP5837787B2 (en) 2011-09-28 2011-09-28 Substrate processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011211889A JP5837787B2 (en) 2011-09-28 2011-09-28 Substrate processing equipment

Publications (2)

Publication Number Publication Date
JP2013074090A true JP2013074090A (en) 2013-04-22
JP5837787B2 JP5837787B2 (en) 2015-12-24

Family

ID=48478335

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011211889A Active JP5837787B2 (en) 2011-09-28 2011-09-28 Substrate processing equipment

Country Status (1)

Country Link
JP (1) JP5837787B2 (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015082650A (en) * 2013-10-24 2015-04-27 株式会社Screenホールディングス Substrate processing method and substrate processing apparatus
JP2015162659A (en) * 2014-02-28 2015-09-07 芝浦メカトロニクス株式会社 Processing apparatus and processing method
US20160093486A1 (en) * 2014-09-30 2016-03-31 Shibaura Mechatronics Corporation Substrate processing apparatus and substrate processing method
JP2016072613A (en) * 2014-09-30 2016-05-09 芝浦メカトロニクス株式会社 Substrate processing apparatus and substrate processing method
JP2017010959A (en) * 2015-06-16 2017-01-12 東京エレクトロン株式会社 Substrate processing method, substrate processing apparatus, and storage medium
KR20170007988A (en) * 2015-07-13 2017-01-23 주식회사 제우스 Substrate liquid processing apparatus and substrate liquid processing method
JP2019160905A (en) * 2018-03-09 2019-09-19 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
US10464107B2 (en) 2013-10-24 2019-11-05 SCREEN Holdings Co., Ltd. Substrate processing method and substrate processing apparatus
WO2020059280A1 (en) * 2018-09-20 2020-03-26 株式会社Screenホールディングス Substrate processing device and substrate processing method
WO2020137803A1 (en) * 2018-12-28 2020-07-02 株式会社Screenホールディングス Substrate processing device and substrate processing method
WO2024171748A1 (en) 2023-02-17 2024-08-22 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
CN119856255A (en) * 2022-09-22 2025-04-18 株式会社斯库林集团 Substrate processing apparatus and substrate processing method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010157749A (en) * 2005-11-23 2010-07-15 Fsi Internatl Inc Method of removing material from support
JP2010528459A (en) * 2007-05-18 2010-08-19 エフエスアイ インターナショナル インコーポレーテッド Substrate processing method using water vapor or steam

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010157749A (en) * 2005-11-23 2010-07-15 Fsi Internatl Inc Method of removing material from support
JP2010528459A (en) * 2007-05-18 2010-08-19 エフエスアイ インターナショナル インコーポレーテッド Substrate processing method using water vapor or steam

Cited By (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015082650A (en) * 2013-10-24 2015-04-27 株式会社Screenホールディングス Substrate processing method and substrate processing apparatus
US10464107B2 (en) 2013-10-24 2019-11-05 SCREEN Holdings Co., Ltd. Substrate processing method and substrate processing apparatus
JP2015162659A (en) * 2014-02-28 2015-09-07 芝浦メカトロニクス株式会社 Processing apparatus and processing method
KR101930210B1 (en) * 2014-09-30 2018-12-17 시바우라 메카트로닉스 가부시끼가이샤 Substrate treatment device and substrate treatment method
JP2016072613A (en) * 2014-09-30 2016-05-09 芝浦メカトロニクス株式会社 Substrate processing apparatus and substrate processing method
CN108461427B (en) * 2014-09-30 2022-02-22 芝浦机械电子株式会社 Substrate processing apparatus and substrate processing method
JP2019220695A (en) * 2014-09-30 2019-12-26 芝浦メカトロニクス株式会社 Substrate processing device and substrate processing method
KR101780862B1 (en) * 2014-09-30 2017-10-10 시바우라 메카트로닉스 가부시끼가이샤 Substrate treatment device and substrate treatment method
US9966282B2 (en) * 2014-09-30 2018-05-08 Shibaura Mechatronics Corporation Substrate processing apparatus and substrate processing method
KR101879994B1 (en) * 2014-09-30 2018-07-18 시바우라 메카트로닉스 가부시끼가이샤 Substrate treatment device and substrate treatment method
US20160093486A1 (en) * 2014-09-30 2016-03-31 Shibaura Mechatronics Corporation Substrate processing apparatus and substrate processing method
CN108461427A (en) * 2014-09-30 2018-08-28 芝浦机械电子株式会社 Substrate board treatment and substrate processing method using same
JP2020181993A (en) * 2014-09-30 2020-11-05 芝浦メカトロニクス株式会社 Substrate processing device and substrate processing method
JP2017010959A (en) * 2015-06-16 2017-01-12 東京エレクトロン株式会社 Substrate processing method, substrate processing apparatus, and storage medium
KR101880232B1 (en) * 2015-07-13 2018-07-19 주식회사 제우스 Substrate liquid processing apparatus and substrate liquid processing method
CN107078083A (en) * 2015-07-13 2017-08-18 杰宜斯科技有限公司 substrate liquid processing apparatus and substrate liquid processing method
KR20170007988A (en) * 2015-07-13 2017-01-23 주식회사 제우스 Substrate liquid processing apparatus and substrate liquid processing method
JP7170404B2 (en) 2018-03-09 2022-11-14 株式会社Screenホールディングス SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
US11961744B2 (en) 2018-03-09 2024-04-16 SCREEN Holdings Co., Ltd. Substrate processing apparatus and substrate processing method
CN111771261B (en) * 2018-03-09 2024-08-20 株式会社斯库林集团 Substrate processing apparatus and substrate processing method
CN111771261A (en) * 2018-03-09 2020-10-13 株式会社斯库林集团 Substrate processing apparatus and substrate processing method
JP7407262B2 (en) 2018-03-09 2023-12-28 株式会社Screenホールディングス Substrate processing equipment and substrate processing method
JP2023009105A (en) * 2018-03-09 2023-01-19 株式会社Screenホールディングス SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
JP2019160905A (en) * 2018-03-09 2019-09-19 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
WO2020059280A1 (en) * 2018-09-20 2020-03-26 株式会社Screenホールディングス Substrate processing device and substrate processing method
US11318504B2 (en) 2018-09-20 2022-05-03 SCREEN Holdings Co., Ltd. Substrate processing device and substrate processing method
US12311414B2 (en) 2018-09-20 2025-05-27 SCREEN Holdings Co., Ltd. Substrate processing device and substrate processing method
US11883858B2 (en) 2018-09-20 2024-01-30 SCREEN Holdings Co., Ltd. Substrate processing device and substrate processing method
JP2020047857A (en) * 2018-09-20 2020-03-26 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
JP7220537B2 (en) 2018-09-20 2023-02-10 株式会社Screenホールディングス SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
KR102570394B1 (en) * 2018-12-28 2023-08-24 가부시키가이샤 스크린 홀딩스 Substrate processing apparatus and substrate processing method
KR20210095194A (en) * 2018-12-28 2021-07-30 가부시키가이샤 스크린 홀딩스 Substrate processing apparatus and substrate processing method
TWI747094B (en) * 2018-12-28 2021-11-21 日商斯庫林集團股份有限公司 Substrate processing apparatus and substrate processing method
WO2020137803A1 (en) * 2018-12-28 2020-07-02 株式会社Screenホールディングス Substrate processing device and substrate processing method
JP2020107779A (en) * 2018-12-28 2020-07-09 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
JP7148393B2 (en) 2018-12-28 2022-10-05 株式会社Screenホールディングス SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
CN119856255A (en) * 2022-09-22 2025-04-18 株式会社斯库林集团 Substrate processing apparatus and substrate processing method
WO2024171748A1 (en) 2023-02-17 2024-08-22 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method
KR20250134101A (en) 2023-02-17 2025-09-09 가부시키가이샤 스크린 홀딩스 Substrate processing device and substrate processing method

Also Published As

Publication number Publication date
JP5837787B2 (en) 2015-12-24

Similar Documents

Publication Publication Date Title
JP5837787B2 (en) Substrate processing equipment
TWI553888B (en) Substrate processing apparatus and substrate processing method
CN101512725B (en) Substrate processing apparatus and substrate processing method
JP5615650B2 (en) Substrate processing method and substrate processing apparatus
CN1920673B (en) Resist removing method and resist removing apparatus
JP5715981B2 (en) Substrate processing method and substrate processing apparatus
JP2014036101A (en) Substrate processing apparatus and substrate processing method
TWI594316B (en) Semiconductor substrate cleaning method and cleaning system
JP5112946B2 (en) Substrate processing equipment
JP2008235342A (en) Substrate processing apparatus and substrate processing method
CN105390418A (en) Substrate liquid processing device and substrate liquid processing method
JP6002262B2 (en) Substrate processing method and substrate processing apparatus
JP2005268308A (en) Resist stripping method and resist stripping apparatus
JP2006344907A (en) Method and apparatus for processing substrate
JPWO2006051585A1 (en) Single wafer processing system
JP2013207207A (en) Substrate liquid processing apparatus and substrate liquid processing method
JP2008034428A (en) Equipment and method for processing substrate
JP6032878B2 (en) Substrate processing apparatus and substrate processing method
JP5743939B2 (en) Substrate liquid processing apparatus and substrate liquid processing method
JP3974465B2 (en) Polymer removal method
JP6454608B2 (en) Substrate processing method, substrate processing apparatus, and storage medium
JP6290338B2 (en) Substrate processing method and substrate processing apparatus
JP2004303967A (en) Substrate treatment apparatus and method therefor
TWI889199B (en) Substrate processing apparatus and substrate processing method
JP2008130951A (en) Substrate treatment apparatus and substrate treatment method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140625

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150818

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150819

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151007

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20151026

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20151106

R150 Certificate of patent or registration of utility model

Ref document number: 5837787

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250