JP2012508881A - 表面増強ラマン散乱(sers)用基板 - Google Patents
表面増強ラマン散乱(sers)用基板 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 107
- 238000004416 surface enhanced Raman spectroscopy Methods 0.000 title claims abstract description 63
- 239000002086 nanomaterial Substances 0.000 claims abstract description 111
- 229910052751 metal Inorganic materials 0.000 claims abstract description 46
- 239000002184 metal Substances 0.000 claims abstract description 46
- 238000001069 Raman spectroscopy Methods 0.000 claims description 35
- 238000000034 method Methods 0.000 claims description 25
- 238000005530 etching Methods 0.000 claims description 14
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 238000000151 deposition Methods 0.000 claims description 10
- 230000003362 replicative effect Effects 0.000 claims description 6
- 238000009623 Bosch process Methods 0.000 claims description 5
- 230000000873 masking effect Effects 0.000 claims description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
- 239000010931 gold Substances 0.000 claims description 2
- 229910052697 platinum Inorganic materials 0.000 claims description 2
- 239000000463 material Substances 0.000 description 22
- 230000010076 replication Effects 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 7
- 230000008021 deposition Effects 0.000 description 6
- 238000001465 metallisation Methods 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
- 238000004049 embossing Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000003848 UV Light-Curing Methods 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 239000011149 active material Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000005672 electromagnetic field Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 239000002103 nanocoating Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B1/00—Nanostructures formed by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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Abstract
【選択図】図1a
Description
Claims (15)
- 表面増強ラマン散乱(SERS)用の基板(100)であって、
該基板(100)の表面から突出している少なくとも1つのナノ構造体(110)と、
前記少なくとも1つのナノ構造体(110)の上のSERS活性金属(120)であって、前記少なくとも1つのナノ構造体(110)を実質的に覆い、前記少なくとも1つのナノ構造体(110)上にテクスチャ層を生成する、SERS活性金属(120)と、
を具備する基板。 - 前記少なくとも1つのナノ構造体(110)は、本質的に、実質的に円錐形、半球、角錐又は不定形からなるリストから選択される形状を有する、請求項1に記載の基板。
- 前記少なくとも1つのナノ構造体(110)は、前記基板(100)上にランダムに分布する、請求項1に記載の基板。
- 前記少なくとも1つのナノ構造体(110)は、巨視的な柄部分を有する、請求項1に記載の基板。
- 複数のナノ構造体(110)を具備し、前記複数のナノ構造体(110)は前記基板表面にわたって実質的に均一な密度を有する、請求項1に記載の基板。
- ラマン散乱は、前記基板表面にわたって実質的に均一である、請求項1に記載の基板。
- 前記SERS活性金属(120)は、本質的に、銀、金、白金及び銅からなるリストから選択される、請求項1に記載の基板。
- 表面増強ラマン散乱(SERS)用の基板(100)を製造する方法(200)であって、
前記基板(100)の表面上に少なくとも1つのナノ構造体(110)を製造すること(210)、及び
前記少なくとも1つのナノ構造体(110)の上にSERS活性金属(120)を堆積させること(220)であって、該SERS活性金属(120)は、前記少なくとも1つのナノ構造体(110)を実質的に覆い、前記少なくとも1つのナノ構造体(110)上にテクスチャ層を生成する、堆積させること(220)、
を含む方法。 - 前記製造すること(210)は、リソグラフィマスキングを必要とすることなく前記基板(100)上でボッシュプロセス(230)を用いて行われる、請求項8に記載の方法。
- 前記製造すること(210)は、1回のエッチングステップ(240)を用いて行われる、請求項8に記載の方法。
- 前記堆積させること(220)は、前記少なくとも1つのナノ構造体(110)の上に前記SERS活性金属(120)を蒸着させること(250)を含む、請求項8に記載の方法。
- 前記少なくとも1つのナノ構造体(110)は自己組織化する、請求項8に記載の方法。
- 前記製造すること(210)は、前記基板の表面上の前記少なくとも1つのナノ構造体(110)を別の基板の上に複製すること(260)を含む、請求項8に記載の方法。
- 前記複製すること(260)はエッチングプロセス(270)を必要としない、請求項13に記載の方法。
- 表面増強ラマン散乱(SERS)用の基板(100)であって、
該基板(100)の表面から突出している複数のナノ構造体(110)であって、実質的に円錐形であり、実質的に均一な密度を有すると共に、前記基板表面にわたってランダムに分布している複数のナノ構造体(110)と、
前記複数のナノ構造体(110)の上に蒸着された(250)SERS活性金属(120)であって、前記複数のナノ構造体(110)を実質的に覆い、ラマン散乱が前記基板表面にわたって実質的に均一であるように、前記複数のナノ構造体(110)の上にテクスチャ層を生成する、SERS活性金属(120)と、
を具備する基板。
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/US2008/083827 WO2010056258A1 (en) | 2008-11-17 | 2008-11-17 | A substrate for surface enhanced raman scattering (sers) |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2012508881A true JP2012508881A (ja) | 2012-04-12 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011536300A Pending JP2012508881A (ja) | 2008-11-17 | 2008-11-17 | 表面増強ラマン散乱(sers)用基板 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8547549B2 (ja) |
| EP (1) | EP2365935B2 (ja) |
| JP (1) | JP2012508881A (ja) |
| KR (1) | KR20110097834A (ja) |
| CN (1) | CN102282094A (ja) |
| WO (1) | WO2010056258A1 (ja) |
Cited By (9)
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| JP2011128133A (ja) * | 2009-11-19 | 2011-06-30 | Seiko Epson Corp | センサーチップ、センサーカートリッジ及び分析装置 |
| JP2011141265A (ja) * | 2009-12-11 | 2011-07-21 | Seiko Epson Corp | センサーチップ、センサーカートリッジ及び分析装置 |
| JP2015052562A (ja) * | 2013-09-09 | 2015-03-19 | 大日本印刷株式会社 | 表面増強ラマン散乱測定用基板、及びその製造方法 |
| US9588048B2 (en) | 2011-05-20 | 2017-03-07 | Hewlett-Packard Development Company, L.P. | Surface enhanced raman spectroscopy sensor, system and method of sensing |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005524857A (ja) * | 2002-06-12 | 2005-08-18 | インテル・コーポレーション | 活性表面増強ラマン分光(sers)基板としての金属被覆ナノ結晶性シリコン |
| WO2006132224A1 (ja) * | 2005-06-09 | 2006-12-14 | Tokyo University Of Agriculture And Technology | 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法 |
| JP2006349463A (ja) * | 2005-06-15 | 2006-12-28 | Canon Inc | 表面増強ラマン分光分析用治具及びその製造方法 |
| WO2007011671A2 (en) * | 2005-07-14 | 2007-01-25 | 3M Innovative Properties Company | Surface-enhanced spectroscopic method, flexible structured substrate, and method of making the same |
| JP2007240361A (ja) * | 2006-03-09 | 2007-09-20 | Sekisui Chem Co Ltd | 局在プラズモン増強センサ |
| JP2008035874A (ja) * | 2006-08-01 | 2008-02-21 | Toppan Printing Co Ltd | 針状体の製造方法 |
| JP2008261752A (ja) * | 2007-04-12 | 2008-10-30 | Fujifilm Corp | 微細構造体及びその製造方法、電場増強デバイス |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19736370C2 (de) | 1997-08-21 | 2001-12-06 | Bosch Gmbh Robert | Verfahren zum anisotropen Ätzen von Silizium |
| DE19826382C2 (de) | 1998-06-12 | 2002-02-07 | Bosch Gmbh Robert | Verfahren zum anisotropen Ätzen von Silicium |
| US20040023046A1 (en) | 1998-08-04 | 2004-02-05 | Falko Schlottig | Carrier substrate for Raman spectrometric analysis |
| JP2001180920A (ja) * | 1999-12-24 | 2001-07-03 | Nec Corp | ナノチューブの加工方法及び電界放出型冷陰極の製造方法並びに表示装置の製造方法 |
| CN1183497C (zh) * | 2000-03-31 | 2005-01-05 | 松下电器产业株式会社 | 显示板及其制造方法 |
| US6989897B2 (en) | 2002-06-12 | 2006-01-24 | Intel Corporation | Metal coated nanocrystalline silicon as an active surface enhanced Raman spectroscopy (SERS) substrate |
| US7163659B2 (en) | 2002-12-03 | 2007-01-16 | Hewlett-Packard Development Company, L.P. | Free-standing nanowire sensor and method for detecting an analyte in a fluid |
| US7460224B2 (en) * | 2005-12-19 | 2008-12-02 | Opto Trace Technologies, Inc. | Arrays of nano structures for surface-enhanced Raman scattering |
| US7947450B2 (en) * | 2003-07-10 | 2011-05-24 | Universite Libre De Bruxelles | Device, kit and method for pulsing biological samples with an agent and stabilising the sample so pulsed |
| JP4163606B2 (ja) * | 2003-12-10 | 2008-10-08 | 富士フイルム株式会社 | 微細構造体、微細構造体の作製方法、ラマン分光方法および装置 |
| JP2005195441A (ja) * | 2004-01-07 | 2005-07-21 | Fuji Photo Film Co Ltd | ラマン分光方法および装置並びにラマン分光用デバイス |
| US7560285B2 (en) | 2004-03-04 | 2009-07-14 | Intel Corporation | Micelle-controlled nanoparticle synthesis for SERS |
| US7597814B2 (en) | 2004-03-23 | 2009-10-06 | Hewlett Packard Development Company, L.P. | Structure formed with template having nanoscale features |
| JP4806411B2 (ja) * | 2004-05-19 | 2011-11-02 | ブィピー ホールディング、エルエルシー | 可視光レーザ励起ビーム及びラマン分光検出器と共に使用する光センサ、及び分析物の化学基を検出する方法 |
| US7158219B2 (en) * | 2004-09-16 | 2007-01-02 | Hewlett-Packard Development Company, L.P. | SERS-active structures including nanowires |
| US7656525B2 (en) * | 2004-10-21 | 2010-02-02 | University Of Georgia Research Foundation, Inc. | Fiber optic SERS sensor systems and SERS probes |
| EP1817571B1 (en) | 2004-11-04 | 2011-09-07 | Renishaw Diagnostics Limited | Metal nano-void photonic crystal for enhanced raman spectroscopy |
| US7236242B2 (en) * | 2005-01-27 | 2007-06-26 | Hewlett-Packard Development Company, L.P. | Nano-enhanced Raman spectroscopy-active nanostructures including elongated components and methods of making the same |
| US7476787B2 (en) * | 2005-02-23 | 2009-01-13 | Stc.Unm | Addressable field enhancement microscopy |
| EP1863932A4 (en) | 2005-03-14 | 2010-06-09 | Univ California | METALLIC NANOSTRUCTURES ADJUSTED TO ELECTROMAGNETIC FIELD GAIN |
| US20060225162A1 (en) | 2005-03-30 | 2006-10-05 | Sungsoo Yi | Method of making a substrate structure with enhanced surface area |
| CN101198847A (zh) * | 2005-04-14 | 2008-06-11 | 化学影像公司 | 增强来自生物对象的光学信号并将其成像的方法和应用 |
| US7586601B2 (en) * | 2005-06-14 | 2009-09-08 | Ebstein Steven M | Applications of laser-processed substrate for molecular diagnostics |
| US7426025B2 (en) * | 2005-09-23 | 2008-09-16 | Hewlett-Packard Development Company, L.P. | Nanostructures, systems, and methods including nanolasers for enhanced Raman spectroscopy |
| US7342656B2 (en) * | 2005-10-17 | 2008-03-11 | Hewlett-Packard Development Company, L.P. | Dynamically variable separation among nanoparticles for nano-enhanced Raman spectroscopy (NERS) molecular sensing |
| US7872318B2 (en) * | 2006-09-29 | 2011-01-18 | Hewlett-Packard Development Company, L.P. | Sensing devices and methods for forming the same |
| US7388661B2 (en) * | 2006-10-20 | 2008-06-17 | Hewlett-Packard Development Company, L.P. | Nanoscale structures, systems, and methods for use in nano-enhanced raman spectroscopy (NERS) |
| US20100208237A1 (en) * | 2007-01-23 | 2010-08-19 | President & Fellows Of Harvard College | Polymeric substrates for raman spectroscopy |
| US8294891B2 (en) * | 2007-01-23 | 2012-10-23 | President And Fellows Of Harvard College | Non-invasive optical analysis using surface enhanced raman spectroscopy |
| JP4871787B2 (ja) * | 2007-05-14 | 2012-02-08 | キヤノン株式会社 | 表面増強振動分光分析を行うための分析試料用保持部材の製造方法 |
| JP4818197B2 (ja) * | 2007-05-14 | 2011-11-16 | キヤノン株式会社 | 表面増強振動分光分析用プローブおよびその製造方法 |
| KR20110097834A (ko) | 2008-11-17 | 2011-08-31 | 휴렛-팩커드 디벨롭먼트 컴퍼니, 엘.피. | 표면 증강 라만 산란을 위한 기판 |
| US7965388B2 (en) * | 2009-04-01 | 2011-06-21 | Hewlett-Packard Development Company, L.P. | Structure for surface enhanced raman spectroscopy |
| US8223331B2 (en) * | 2009-06-19 | 2012-07-17 | Hewlett-Packard Development Company, L.P. | Signal-amplification device for surface enhanced raman spectroscopy |
| EP2459988A1 (en) * | 2009-07-30 | 2012-06-06 | Hewlett-Packard Development Company, L.P. | Nanowire light concentrators for performing raman spectroscopy |
| US8687186B2 (en) * | 2009-07-30 | 2014-04-01 | Hewlett-Packard Development Company, L.P. | Nanowire-based systems for performing raman spectroscopy |
-
2008
- 2008-11-17 KR KR1020117013589A patent/KR20110097834A/ko not_active Withdrawn
- 2008-11-17 EP EP08878191.9A patent/EP2365935B2/en not_active Not-in-force
- 2008-11-17 US US13/129,571 patent/US8547549B2/en not_active Expired - Fee Related
- 2008-11-17 CN CN2008801326720A patent/CN102282094A/zh active Pending
- 2008-11-17 WO PCT/US2008/083827 patent/WO2010056258A1/en not_active Ceased
- 2008-11-17 JP JP2011536300A patent/JP2012508881A/ja active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005524857A (ja) * | 2002-06-12 | 2005-08-18 | インテル・コーポレーション | 活性表面増強ラマン分光(sers)基板としての金属被覆ナノ結晶性シリコン |
| WO2006132224A1 (ja) * | 2005-06-09 | 2006-12-14 | Tokyo University Of Agriculture And Technology | 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法 |
| JP2006349463A (ja) * | 2005-06-15 | 2006-12-28 | Canon Inc | 表面増強ラマン分光分析用治具及びその製造方法 |
| WO2007011671A2 (en) * | 2005-07-14 | 2007-01-25 | 3M Innovative Properties Company | Surface-enhanced spectroscopic method, flexible structured substrate, and method of making the same |
| JP2009501904A (ja) * | 2005-07-14 | 2009-01-22 | スリーエム イノベイティブ プロパティズ カンパニー | 表面増強分光法、可撓性構造化基材及びそれを作製する方法 |
| JP2007240361A (ja) * | 2006-03-09 | 2007-09-20 | Sekisui Chem Co Ltd | 局在プラズモン増強センサ |
| JP2008035874A (ja) * | 2006-08-01 | 2008-02-21 | Toppan Printing Co Ltd | 針状体の製造方法 |
| JP2008261752A (ja) * | 2007-04-12 | 2008-10-30 | Fujifilm Corp | 微細構造体及びその製造方法、電場増強デバイス |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011128133A (ja) * | 2009-11-19 | 2011-06-30 | Seiko Epson Corp | センサーチップ、センサーカートリッジ及び分析装置 |
| JP2011128135A (ja) * | 2009-11-19 | 2011-06-30 | Seiko Epson Corp | センサーチップ、センサーカートリッジ及び分析装置 |
| JP2011141265A (ja) * | 2009-12-11 | 2011-07-21 | Seiko Epson Corp | センサーチップ、センサーカートリッジ及び分析装置 |
| JP2011141264A (ja) * | 2009-12-11 | 2011-07-21 | Seiko Epson Corp | センサーチップ、センサーカートリッジ及び分析装置 |
| US9594022B2 (en) | 2010-10-20 | 2017-03-14 | Hewlett-Packard Development Company, L.P. | Chemical-analysis device integrated with metallic-nanofinger device for chemical sensing |
| US9588048B2 (en) | 2011-05-20 | 2017-03-07 | Hewlett-Packard Development Company, L.P. | Surface enhanced raman spectroscopy sensor, system and method of sensing |
| US9863884B2 (en) | 2012-08-10 | 2018-01-09 | Hamamatsu Photonics K.K. | Surface-enhanced Raman scattering element, and method for producing same |
| US9863883B2 (en) | 2012-08-10 | 2018-01-09 | Hamamatsu Photonics K.K. | Surface-enhanced raman scattering element |
| US10408761B2 (en) | 2012-08-10 | 2019-09-10 | Hamamatsu Photonics K.K. | Surface-enhanced Raman scattering element |
| JP2015052562A (ja) * | 2013-09-09 | 2015-03-19 | 大日本印刷株式会社 | 表面増強ラマン散乱測定用基板、及びその製造方法 |
| JP2017072604A (ja) * | 2016-12-02 | 2017-04-13 | 浜松ホトニクス株式会社 | 表面増強ラマン散乱ユニット |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2010056258A1 (en) | 2010-05-20 |
| EP2365935B1 (en) | 2019-06-12 |
| US20110228266A1 (en) | 2011-09-22 |
| KR20110097834A (ko) | 2011-08-31 |
| EP2365935A4 (en) | 2016-08-03 |
| CN102282094A (zh) | 2011-12-14 |
| EP2365935A1 (en) | 2011-09-21 |
| EP2365935B2 (en) | 2022-09-21 |
| US8547549B2 (en) | 2013-10-01 |
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