JP2012158645A - Epoxy resin composition for printed wiring board, prepreg, metal-clad laminate, resin sheet, printed wiring board, and semiconductor device - Google Patents
Epoxy resin composition for printed wiring board, prepreg, metal-clad laminate, resin sheet, printed wiring board, and semiconductor device Download PDFInfo
- Publication number
- JP2012158645A JP2012158645A JP2011017697A JP2011017697A JP2012158645A JP 2012158645 A JP2012158645 A JP 2012158645A JP 2011017697 A JP2011017697 A JP 2011017697A JP 2011017697 A JP2011017697 A JP 2011017697A JP 2012158645 A JP2012158645 A JP 2012158645A
- Authority
- JP
- Japan
- Prior art keywords
- printed wiring
- epoxy resin
- wiring board
- resin
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 229920005989 resin Polymers 0.000 title claims abstract description 126
- 239000011347 resin Substances 0.000 title claims abstract description 126
- 239000003822 epoxy resin Substances 0.000 title claims abstract description 114
- 229920000647 polyepoxide Polymers 0.000 title claims abstract description 114
- 239000004065 semiconductor Substances 0.000 title claims abstract description 31
- 239000000203 mixture Substances 0.000 title claims description 57
- DHKHKXVYLBGOIT-UHFFFAOYSA-N 1,1-Diethoxyethane Chemical compound CCOC(C)OCC DHKHKXVYLBGOIT-UHFFFAOYSA-N 0.000 claims abstract description 19
- 239000011354 acetal resin Substances 0.000 claims abstract description 19
- 239000002245 particle Substances 0.000 claims abstract description 19
- 229920006324 polyoxymethylene Polymers 0.000 claims abstract description 19
- 229920002554 vinyl polymer Polymers 0.000 claims abstract description 19
- 239000010419 fine particle Substances 0.000 claims abstract description 13
- 229910052751 metal Inorganic materials 0.000 claims description 50
- 239000002184 metal Substances 0.000 claims description 50
- 239000011888 foil Substances 0.000 claims description 42
- 239000000463 material Substances 0.000 claims description 28
- XLJMAIOERFSOGZ-UHFFFAOYSA-M cyanate Chemical compound [O-]C#N XLJMAIOERFSOGZ-UHFFFAOYSA-M 0.000 claims description 23
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 10
- 238000010030 laminating Methods 0.000 claims description 7
- 238000007747 plating Methods 0.000 abstract description 42
- 239000011342 resin composition Substances 0.000 abstract description 16
- 239000010410 layer Substances 0.000 description 103
- 238000000034 method Methods 0.000 description 34
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 32
- 239000002966 varnish Substances 0.000 description 30
- 238000004519 manufacturing process Methods 0.000 description 26
- 239000011889 copper foil Substances 0.000 description 22
- 239000011521 glass Substances 0.000 description 22
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 20
- 229910000679 solder Inorganic materials 0.000 description 18
- -1 methoxynaphthalene modified cresol Chemical class 0.000 description 15
- 229920003986 novolac Polymers 0.000 description 15
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 14
- 229920006254 polymer film Polymers 0.000 description 13
- 239000000758 substrate Substances 0.000 description 13
- 239000004020 conductor Substances 0.000 description 12
- 238000001723 curing Methods 0.000 description 12
- 239000010931 gold Substances 0.000 description 12
- 238000005470 impregnation Methods 0.000 description 12
- 239000002904 solvent Substances 0.000 description 12
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 11
- 229910052737 gold Inorganic materials 0.000 description 11
- 238000010438 heat treatment Methods 0.000 description 11
- 229910052802 copper Inorganic materials 0.000 description 10
- 239000010949 copper Substances 0.000 description 10
- 229910045601 alloy Inorganic materials 0.000 description 9
- 239000000956 alloy Substances 0.000 description 9
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 9
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 9
- 239000011256 inorganic filler Substances 0.000 description 9
- 229910003475 inorganic filler Inorganic materials 0.000 description 9
- 239000000377 silicon dioxide Substances 0.000 description 9
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 8
- 230000005856 abnormality Effects 0.000 description 8
- 239000007822 coupling agent Substances 0.000 description 8
- 239000007788 liquid Substances 0.000 description 8
- 230000003746 surface roughness Effects 0.000 description 8
- PEEHTFAAVSWFBL-UHFFFAOYSA-N Maleimide Chemical compound O=C1NC(=O)C=C1 PEEHTFAAVSWFBL-UHFFFAOYSA-N 0.000 description 7
- 239000003795 chemical substances by application Substances 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 7
- 238000001035 drying Methods 0.000 description 7
- 238000005530 etching Methods 0.000 description 7
- 238000011156 evaluation Methods 0.000 description 7
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 7
- 238000000465 moulding Methods 0.000 description 7
- 229910052759 nickel Inorganic materials 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 238000007788 roughening Methods 0.000 description 7
- 239000007787 solid Substances 0.000 description 7
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 6
- 239000003365 glass fiber Substances 0.000 description 6
- 238000003825 pressing Methods 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- 238000012360 testing method Methods 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- 239000004305 biphenyl Substances 0.000 description 5
- 235000010290 biphenyl Nutrition 0.000 description 5
- 239000005011 phenolic resin Substances 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 239000002759 woven fabric Substances 0.000 description 5
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 4
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 4
- 239000006087 Silane Coupling Agent Substances 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 4
- 239000000835 fiber Substances 0.000 description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 4
- 239000004745 nonwoven fabric Substances 0.000 description 4
- 229910052763 palladium Inorganic materials 0.000 description 4
- 229920003192 poly(bis maleimide) Polymers 0.000 description 4
- 238000007789 sealing Methods 0.000 description 4
- 239000011135 tin Substances 0.000 description 4
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 3
- YBRVSVVVWCFQMG-UHFFFAOYSA-N 4,4'-diaminodiphenylmethane Chemical compound C1=CC(N)=CC=C1CC1=CC=C(N)C=C1 YBRVSVVVWCFQMG-UHFFFAOYSA-N 0.000 description 3
- 229920001342 Bakelite® Polymers 0.000 description 3
- 229930185605 Bisphenol Natural products 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 3
- 239000003054 catalyst Substances 0.000 description 3
- 229930003836 cresol Natural products 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 3
- 238000007602 hot air drying Methods 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 239000011133 lead Substances 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- JMANVNJQNLATNU-UHFFFAOYSA-N oxalonitrile Chemical compound N#CC#N JMANVNJQNLATNU-UHFFFAOYSA-N 0.000 description 3
- 229920000139 polyethylene terephthalate Polymers 0.000 description 3
- 239000005020 polyethylene terephthalate Substances 0.000 description 3
- 229920001721 polyimide Polymers 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 238000005507 spraying Methods 0.000 description 3
- 230000008961 swelling Effects 0.000 description 3
- NQMUGNMMFTYOHK-UHFFFAOYSA-N 1-Methoxynaphthalene Natural products C1=CC=C2C(OC)=CC=CC2=C1 NQMUGNMMFTYOHK-UHFFFAOYSA-N 0.000 description 2
- XQUPVDVFXZDTLT-UHFFFAOYSA-N 1-[4-[[4-(2,5-dioxopyrrol-1-yl)phenyl]methyl]phenyl]pyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C(C=C1)=CC=C1CC1=CC=C(N2C(C=CC2=O)=O)C=C1 XQUPVDVFXZDTLT-UHFFFAOYSA-N 0.000 description 2
- FVCSARBUZVPSQF-UHFFFAOYSA-N 5-(2,4-dioxooxolan-3-yl)-7-methyl-3a,4,5,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C(C(OC2=O)=O)C2C(C)=CC1C1C(=O)COC1=O FVCSARBUZVPSQF-UHFFFAOYSA-N 0.000 description 2
- DLFVBJFMPXGRIB-UHFFFAOYSA-N Acetamide Chemical compound CC(N)=O DLFVBJFMPXGRIB-UHFFFAOYSA-N 0.000 description 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- ORILYTVJVMAKLC-UHFFFAOYSA-N adamantane Chemical compound C1C(C2)CC3CC1CC2C3 ORILYTVJVMAKLC-UHFFFAOYSA-N 0.000 description 2
- 238000004220 aggregation Methods 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- ROOXNKNUYICQNP-UHFFFAOYSA-N ammonium persulfate Chemical compound [NH4+].[NH4+].[O-]S(=O)(=O)OOS([O-])(=O)=O ROOXNKNUYICQNP-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- OSGAYBCDTDRGGQ-UHFFFAOYSA-L calcium sulfate Chemical compound [Ca+2].[O-]S([O-])(=O)=O OSGAYBCDTDRGGQ-UHFFFAOYSA-L 0.000 description 2
- 235000010261 calcium sulphite Nutrition 0.000 description 2
- 239000004927 clay Substances 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- SOCTUWSJJQCPFX-UHFFFAOYSA-N dichromate(2-) Chemical compound [O-][Cr](=O)(=O)O[Cr]([O-])(=O)=O SOCTUWSJJQCPFX-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 125000003700 epoxy group Chemical group 0.000 description 2
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- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 2
- 239000005350 fused silica glass Substances 0.000 description 2
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- 238000005227 gel permeation chromatography Methods 0.000 description 2
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- 238000006386 neutralization reaction Methods 0.000 description 2
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- 150000002989 phenols Chemical class 0.000 description 2
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- 239000011701 zinc Substances 0.000 description 2
- YDCUTCGACVVRIQ-UHFFFAOYSA-N (3,6-dicyanatonaphthalen-1-yl) cyanate Chemical compound N#COC1=CC(OC#N)=CC2=CC(OC#N)=CC=C21 YDCUTCGACVVRIQ-UHFFFAOYSA-N 0.000 description 1
- DEABFUINOSGCMK-UHFFFAOYSA-N (4-ethylphenyl) cyanate Chemical compound CCC1=CC=C(OC#N)C=C1 DEABFUINOSGCMK-UHFFFAOYSA-N 0.000 description 1
- OFIWROJVVHYHLQ-UHFFFAOYSA-N (7-cyanatonaphthalen-2-yl) cyanate Chemical compound C1=CC(OC#N)=CC2=CC(OC#N)=CC=C21 OFIWROJVVHYHLQ-UHFFFAOYSA-N 0.000 description 1
- HCNHNBLSNVSJTJ-UHFFFAOYSA-N 1,1-Bis(4-hydroxyphenyl)ethane Chemical compound C=1C=C(O)C=CC=1C(C)C1=CC=C(O)C=C1 HCNHNBLSNVSJTJ-UHFFFAOYSA-N 0.000 description 1
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- CNUHQZDDTLOZRY-UHFFFAOYSA-N [4-(4-cyanatophenyl)sulfanylphenyl] cyanate Chemical compound C1=CC(OC#N)=CC=C1SC1=CC=C(OC#N)C=C1 CNUHQZDDTLOZRY-UHFFFAOYSA-N 0.000 description 1
- BUPOATPDNYBPMR-UHFFFAOYSA-N [4-(4-cyanatophenyl)sulfonylphenyl] cyanate Chemical compound C=1C=C(OC#N)C=CC=1S(=O)(=O)C1=CC=C(OC#N)C=C1 BUPOATPDNYBPMR-UHFFFAOYSA-N 0.000 description 1
- YYKCHLPXFWGIMU-UHFFFAOYSA-N [4-(6-propan-2-ylidenecyclohexa-2,4-dien-1-yl)phenyl] cyanate Chemical compound CC(C)=C1C=CC=CC1C1=CC=C(OC#N)C=C1 YYKCHLPXFWGIMU-UHFFFAOYSA-N 0.000 description 1
- AHZMUXQJTGRNHT-UHFFFAOYSA-N [4-[2-(4-cyanatophenyl)propan-2-yl]phenyl] cyanate Chemical compound C=1C=C(OC#N)C=CC=1C(C)(C)C1=CC=C(OC#N)C=C1 AHZMUXQJTGRNHT-UHFFFAOYSA-N 0.000 description 1
- PPZSVSGWDQKBIW-UHFFFAOYSA-N [4-bis(4-cyanatophenoxy)phosphanyloxyphenyl] cyanate Chemical compound C1=CC(OC#N)=CC=C1OP(OC=1C=CC(OC#N)=CC=1)OC1=CC=C(OC#N)C=C1 PPZSVSGWDQKBIW-UHFFFAOYSA-N 0.000 description 1
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- 238000009775 high-speed stirring Methods 0.000 description 1
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- RVZRBWKZFJCCIB-UHFFFAOYSA-N perfluorotributylamine Chemical compound FC(F)(F)C(F)(F)C(F)(F)C(F)(F)N(C(F)(F)C(F)(F)C(F)(F)C(F)(F)F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F RVZRBWKZFJCCIB-UHFFFAOYSA-N 0.000 description 1
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Landscapes
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Abstract
Description
プリント配線板用エポキシ樹脂組成物、プリプレグ、金属張積層板、樹脂シート、プリント配線板及び半導体装置に関するものである。 The present invention relates to an epoxy resin composition for printed wiring boards, a prepreg, a metal-clad laminate, a resin sheet, a printed wiring board, and a semiconductor device.
近年、電子機器の高機能化等の要求に伴い、電子部品の高密度集積化、さらには高密度実装化等が進んでおり、これらに使用される高密度実装対応のプリント配線板等は、従来にも増して、小型薄型化、高密度化、及び多層化が進んでいる。従って、作業性等の基本要求を満たし、且つ、高密度で微細な導体パターンを形成できるプリント配線板が求められている。 In recent years, with the demand for higher functionality of electronic devices, etc., high-density integration of electronic components, and further high-density mounting, etc. are progressing. Compared to the prior art, miniaturization, thinning, high density, and multilayering are progressing. Accordingly, there is a need for a printed wiring board that satisfies basic requirements such as workability and can form a high-density and fine conductor pattern.
微細配線回路形成するには、樹脂組成物より形成される絶縁層表面に微細な粗化形状を形成することが必要である。
しかし、微細な粗化形状を形成した場合、導体回路と絶縁層との間の密着強度(めっきピール強度)が低下するといった問題があった。
微細な粗化形状を形成し、かつ十分めっきピール強度を得るべく絶縁層表面に接着層としてゴム粒子を含む接着補助材(例えば、特許文献1参照。)、ポリイミド樹脂を用いた樹脂組成物(例えば、特許文献2参照。)が検討されているが、絶縁表面層に微細な粗化形状を有し、かつ十分なめっきピール強度を有するものはない。
In order to form a fine wiring circuit, it is necessary to form a fine rough shape on the surface of the insulating layer formed from the resin composition.
However, when a fine roughened shape is formed, there is a problem that the adhesion strength (plating peel strength) between the conductor circuit and the insulating layer is lowered.
A resin composition (see, for example, Patent Document 1), a polyimide auxiliary resin, which forms a fine roughened shape and has rubber particles as an adhesive layer on the surface of the insulating layer in order to obtain sufficient plating peel strength. For example, see Patent Document 2.) However, there is no insulating surface layer having a fine roughened shape and sufficient plating peel strength.
本発明は、上記実情を鑑みて成し遂げられたものであり、絶縁層を形成した際に、絶縁層表面に微細な粗化形状を有し、かつ、十分なめっきピール強度を有するプリント配線板用エポキシ樹脂組成物、および当該プリント配線板用エポキシ樹脂組成物を用いた樹脂シート、プリプレグ、金属張積層板、プリント配線板、及び半導体装置を提供するものである。 The present invention has been accomplished in view of the above circumstances, and when an insulating layer is formed, the printed wiring board has a fine roughened shape on the surface of the insulating layer and sufficient plating peel strength. An epoxy resin composition and a resin sheet, a prepreg, a metal-clad laminate, a printed wiring board, and a semiconductor device using the epoxy resin composition for a printed wiring board are provided.
上記の目的は、下記[1]〜[9]に記載の本発明により達成される。
[1](A)エポキシ樹脂、(B)ポリビニルアセタール樹脂、(C)平均粒径5〜120nmの微粒子を必須成分とすることを特徴とするプリント配線板用エポキシ樹脂組成物。
[2]前記(B)ポリビニルアセタール樹脂は、(B)ポリビニルアセタール樹脂1mol中に水酸基を、15〜30mol%有するものである[1]に記載のプリント配線板用エポキシ樹脂組成物。
[3]前記プリント配線板用エポキシ樹脂組成物は、さらに(D)シアネート樹脂は含むものである[1]または[2]に記載のプリント配線板用エポキシ樹脂組成物。
[4][1]乃至[3]のいずれか一に記載のプリント配線板用エポキシ樹脂組成物を基材に含浸してなることを特徴とするプリプレグ。
[5][4]に記載のプリプレグ、又は当該プリプレグを2枚以上重ね合わせた積層体の少なくとも片面に金属箔を有することを特徴とする金属張積層板。
[6][1]乃至[3]のいずれか一に記載のプリント配線板用エポキシ樹脂組成物からなる絶縁層をフィルム上、又は金属箔上に形成してなる樹脂シート。
[7][4]に記載のプリプレグ、または[5]に記載の金属張積層板を内層回路基板に用いてなることを特徴とするプリント配線板。
[8]内層回基板の回路上に、[4]に記載のプリプレグ、及び/または[6]に記載の樹脂シートを内層回路基板に積層してなるプリント配線板
[9][7]、または[8]に記載のプリント配線板に半導体素子を搭載してなることを特徴とする半導体装置。
The above object is achieved by the present invention described in the following [1] to [9].
[1] An epoxy resin composition for printed wiring boards, comprising (A) an epoxy resin, (B) a polyvinyl acetal resin, and (C) fine particles having an average particle diameter of 5 to 120 nm as essential components.
[2] The epoxy resin composition for a printed wiring board according to [1], wherein the (B) polyvinyl acetal resin has 15 to 30 mol% of a hydroxyl group in 1 mol of the (B) polyvinyl acetal resin.
[3] The epoxy resin composition for printed wiring boards according to [1] or [2], wherein the epoxy resin composition for printed wiring boards further contains (D) a cyanate resin.
[4] A prepreg obtained by impregnating a substrate with the epoxy resin composition for printed wiring boards according to any one of [1] to [3].
[5] A metal-clad laminate having a metal foil on at least one side of the prepreg according to [4] or a laminate in which two or more prepregs are laminated.
[6] A resin sheet formed by forming an insulating layer made of the epoxy resin composition for printed wiring boards according to any one of [1] to [3] on a film or a metal foil.
[7] A printed wiring board comprising the prepreg according to [4] or the metal-clad laminate according to [5] as an inner circuit board.
[8] Printed wiring board [9] [7] formed by laminating the prepreg according to [4] and / or the resin sheet according to [6] on the inner layer circuit board on the circuit of the inner layer circuit board, or A semiconductor device comprising a semiconductor element mounted on the printed wiring board according to [8].
本発明のプリント配線板用エポキシ樹脂組成物は、絶縁層を形成した際に、絶縁層表面に微細な粗化形状を有し、かつ、十分なめっきピール強度を有する。 The epoxy resin composition for a printed wiring board of the present invention has a fine roughened shape on the surface of the insulating layer and has a sufficient plating peel strength when the insulating layer is formed.
以下、本発明のプリント配線板用エポキシ樹脂組成物、樹脂シート、プリプレグ、金属張積層板、プリント配線板、及び半導体装置について説明する。
Hereinafter, the epoxy resin composition for printed wiring boards, the resin sheet, the prepreg, the metal-clad laminate, the printed wiring board, and the semiconductor device of the present invention will be described.
(プリント配線板用エポキシ樹脂組成物)
まず、プリント配線板用エポキシ樹脂組成物について説明する。
本発明のプリント配線板用エポキシ樹脂組成物(以下、単に「エポキシ樹脂組成物」という場合がある。)は、(A)エポキシ樹脂、(B)ポリビニルアセタール樹脂、(C)平均粒径5〜120nmの微粒子を必須成分とする。これにより、熱膨張係数が小さく耐熱性の高い樹脂組成物とすることができ、かつ、絶縁層を形成した際に、絶縁層表面に微細な粗化形状を形成することができ、かつ、導体回路と絶縁層との高い密着性(めっきピール強度)を得ることができる。
(Epoxy resin composition for printed wiring boards)
First, the epoxy resin composition for printed wiring boards will be described.
The epoxy resin composition for printed wiring boards of the present invention (hereinafter sometimes simply referred to as “epoxy resin composition”) includes (A) an epoxy resin, (B) a polyvinyl acetal resin, and (C) an average particle size of 5 to 5. A fine particle of 120 nm is an essential component. As a result, a resin composition having a small thermal expansion coefficient and high heat resistance can be obtained, and when the insulating layer is formed, a fine roughened shape can be formed on the surface of the insulating layer, and the conductor High adhesion (plating peel strength) between the circuit and the insulating layer can be obtained.
前記(A)エポキシ樹脂は、特に限定されないが、例えば、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールE型エポキシ樹脂、ビスフェノールS型エポキシ樹脂、ビスフェノールZ型エポキシ樹脂(4,4’−シクロヘキシジエンビスフェノール型エポキシ樹脂)、ビスフェノールP型エポキシ樹脂(4,4’−(1,4−フェニレンジイソプリジエン)ビスフェノール型エポキシ樹脂)、ビスフェノールM型エポキシ樹脂(4,4’−(1,3−フェニレンジイソプリジエン)ビスフェノール型エポキシ樹脂)等のビスフェノール型エポキシ樹脂、フェノールノボラック型エポキシ樹脂、クレゾールノボラック型エポキシ樹脂等のノボラック型エポキシ樹脂、ビフェニル型エポキシ樹脂、キシリレン型エポキシ樹脂、フェノールアラルキル型エポキシ樹脂、ビフェニルアラルキル型エポキシ樹脂、ビフェニルジメチレン型エポキシ樹脂、トリスフェノールメタンノボラック型エポキシ樹脂、1,1,2,2−(テトラフェノール)エタンのグリシジルエーテル類、3官能、又は4官能のグリシジルアミン類、テトラメチルビフェニル型エポキシ樹脂等のアリールアルキレン型エポキシ樹脂、ナフタレン骨格変性エポキシ樹脂、メトキシナフタレン変性クレゾールノボラック型エポキシ樹脂、メトキシナフタレンジメチレン型エポキシ樹脂等のナフタレン型エポキシ樹脂、アントラセン型エポキシ樹脂、フェノキシ型エポキシ樹脂、ジシクロペンタジエン型エポキシ樹脂、ノルボルネン型エポキシ樹脂、アダマンタン型エポキシ樹脂、フルオレン型エポキシ樹脂、上記エポキシ樹脂をハロゲン化した難燃化エポキシ樹脂等が挙げられる。これらの中の1種類を単独で用いることもできるし、異なる重量平均分子量を有する2種類以上を併用することもでき、1種類又は2種類以上と、それらのプレポリマーを併用することもできる。
これらのエポキシ樹脂の中でも特に、ビフェニルアラルキル型エポキシ樹脂、ナフタレン骨格変性エポキシ樹脂、及びクレゾールノボラック型エポキシ樹脂よりなる群から選ばれる少なくとも1種が好ましい。これにより、耐熱性及び難燃性が向上する。
The (A) epoxy resin is not particularly limited. For example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol E type epoxy resin, bisphenol S type epoxy resin, bisphenol Z type epoxy resin (4,4′- Cyclohexyldiene bisphenol type epoxy resin), bisphenol P type epoxy resin (4,4 ′-(1,4-phenylenediisopridiene) bisphenol type epoxy resin), bisphenol M type epoxy resin (4,4 ′-(1 , 3-phenylenediisopridiene) bisphenol type epoxy resin), novolak type epoxy resins such as phenol novolak type epoxy resin, cresol novolak type epoxy resin, biphenyl type epoxy resin, xylylene type epoxy resin Xy resin, phenol aralkyl type epoxy resin, biphenyl aralkyl type epoxy resin, biphenyl dimethylene type epoxy resin, trisphenol methane novolac type epoxy resin, glycidyl ethers of 1,1,2,2- (tetraphenol) ethane, trifunctional , Or tetrafunctional glycidylamines, arylalkylene type epoxy resins such as tetramethylbiphenyl type epoxy resin, naphthalene skeleton modified epoxy resin, methoxynaphthalene modified cresol novolac type epoxy resin, naphthalene type epoxy resin such as methoxynaphthalenedylene methylene type epoxy resin Resin, anthracene type epoxy resin, phenoxy type epoxy resin, dicyclopentadiene type epoxy resin, norbornene type epoxy resin, adamantane type epoxy resin, fluorene Epoxy resins, flame-retarded epoxy resin or the like halogenated epoxy resins. One of these can be used alone, two or more having different weight average molecular weights can be used in combination, and one or two or more of these prepolymers can be used in combination.
Among these epoxy resins, at least one selected from the group consisting of biphenyl aralkyl type epoxy resins, naphthalene skeleton-modified epoxy resins, and cresol novolac type epoxy resins is preferable. Thereby, heat resistance and a flame retardance improve.
前記(A)エポキシ樹脂の含有量は、特に限定されないが、エポキシ樹脂組成物全体の固形分基準で5〜50重量%とすることが好ましい。含有量が前記下限値未満であると、エポキシ樹脂の硬化性が低下したり、当該エポキシ樹脂組成物より得られるプリプレグ、又はプリント配線板の耐湿性が低下したりする場合がある。また、前記上限値を超えると、プリプレグ又はプリント配線板の線熱膨張率が大きくなったり、耐熱性が低下したりする場合がある。 Although content of the said (A) epoxy resin is not specifically limited, It is preferable to set it as 5 to 50 weight% on the solid content basis of the whole epoxy resin composition. If the content is less than the lower limit, the curability of the epoxy resin may decrease, or the prepreg obtained from the epoxy resin composition or the moisture resistance of the printed wiring board may decrease. Moreover, when the said upper limit is exceeded, the linear thermal expansion coefficient of a prepreg or a printed wiring board may become large, or heat resistance may fall.
前記(A)エポキシ樹脂の重量平均分子量は、特に限定されないが、重量平均分子量4.0×102〜1.8×104が好ましい。重量平均分子量が前記下限未満であると、ガラス転移温度が低下し、前記上限値を超えると流動性が低下し、基材に樹脂組成物を含浸できない場合がある。重量平均分子量を前記範囲内とすることにより、基材に対する樹脂組成物の含浸性に優れるものとすることができる。
前記エポキシ樹脂の重量平均分子量は、例えば、ゲル浸透クロマトグラフィー(GPC)で測定し、ポリスチレン換算の重量分子量として特定することができる。
The weight average molecular weight of the (A) epoxy resin is not particularly limited, but a weight average molecular weight of 4.0 × 10 2 to 1.8 × 10 4 is preferable. If the weight average molecular weight is less than the lower limit, the glass transition temperature is lowered, and if it exceeds the upper limit, the fluidity is lowered and the substrate may not be impregnated with the resin composition. By setting the weight average molecular weight within the above range, the impregnation property of the resin composition with respect to the substrate can be excellent.
The weight average molecular weight of the epoxy resin can be measured by gel permeation chromatography (GPC), for example, and can be specified as a weight molecular weight in terms of polystyrene.
前記(B)ポリビニルアセタール樹脂は、レーザ加工後の樹脂残渣を除去するデスミア工程において、絶縁樹脂層表面に均一な粗化形状を形成することができる。
また(B)ポリビニルアセタール樹脂の極性基の存在により、導体回路との高いめっき密着性を得ることができる。
(B)ポリビニルアセタール樹脂は、例えば、ポリビニルアルコールを塩酸や硫酸のような酸触媒の存在下でアルデヒドと反応させて、ポリビニルアルコールの水酸基の一部又は全部をアセタール化して合成することができる。
前記(B)ポリビニルアセタール樹脂は、特に限定されないが、(B)ポリビニルアセタール樹脂中に、水酸基が15〜30mol%含むことが好ましい。水酸基が前記範囲よりも小さいと十分な粗化が行われずにめっき密着性が低下する場合があり、前記範囲より大きいとデスミアで過疎化されることによりめっき不具合が生じることがある。ポリビニルアセタール樹脂として、例えば、積水化学工業社製エスレックBL−5,BL−10,BL−S,BM−S,BH−A,BH−S,KS−10,KS−1,KS−3,KS−5や、電気化学工業社製デンカブチラール#3000−1、#5000−A、#6000−Cなどが挙げられるが、これに限定されるものではない。
The polyvinyl acetal resin (B) can form a uniform roughened shape on the surface of the insulating resin layer in a desmear process for removing a resin residue after laser processing.
Moreover, (B) High plating adhesiveness with a conductor circuit can be acquired by presence of the polar group of polyvinyl acetal resin.
(B) Polyvinyl acetal resin can be synthesized by, for example, reacting polyvinyl alcohol with an aldehyde in the presence of an acid catalyst such as hydrochloric acid or sulfuric acid to acetalize part or all of the hydroxyl groups of polyvinyl alcohol.
The (B) polyvinyl acetal resin is not particularly limited, but (B) the polyvinyl acetal resin preferably contains 15 to 30 mol% of a hydroxyl group. If the hydroxyl group is smaller than the above range, sufficient roughening may not be performed and plating adhesion may be deteriorated. If the hydroxyl group is larger than the above range, plating defects may occur due to depopulation with desmear. Examples of the polyvinyl acetal resin include, for example, S-LEK BL-5, BL-10, BL-S, BM-S, BH-A, BH-S, KS-10, KS-1, KS-3, and KS manufactured by Sekisui Chemical Co., Ltd. -5, Denkabutyral # 3000-1, # 5000-A, # 6000-C manufactured by Denki Kagaku Kogyo Co., Ltd., and the like, but are not limited thereto.
前記(C)平均粒径5〜120nmの微粒子は、(B)ポリビニルアセタール樹脂との相乗効果により、絶縁層表面に従来よりも微細できめ細かな粗化形状を形成することができる。
また、プリント配線板用エポキシ樹脂組成物に他の充填材を併用した場合は、従来に比べ、より多量の無機充填材をガラス繊維基材中に均一に含浸させることができるので、プリプレグ、または金属張積層板の熱膨張係数を小さくすることができる。
The fine particles (C) having an average particle diameter of 5 to 120 nm can form a finer and finer roughened shape than the conventional fine particles on the surface of the insulating layer due to a synergistic effect with (B) the polyvinyl acetal resin.
In addition, when other fillers are used in combination with the epoxy resin composition for printed wiring boards, a larger amount of inorganic filler can be uniformly impregnated into the glass fiber base material than in the past. The coefficient of thermal expansion of the metal-clad laminate can be reduced.
前記(C)平均粒径5〜120nmの微粒子は、特に限定されないが、例えば、タルク、焼成タルク、焼成クレー、未焼成クレー、マイカ、ガラス等のケイ酸塩、酸化チタン、アルミナ、シリカ、溶融シリカ等の酸化物、炭酸カルシウム、炭酸マグネシウム、ハイドロタルサイト等の炭酸塩、水酸化アルミニウム、水酸化マグネシウム、水酸化カルシウム等の水酸化物、硫酸バリウム、硫酸カルシウム、亜硫酸カルシウム等の硫酸塩または亜硫酸塩、ホウ酸亜鉛、メタホウ酸バリウム、ホウ酸アルミニウム、ホウ酸カルシウム、ホウ酸ナトリウム等のホウ酸塩、窒化アルミニウムニウム、窒化ホウ素、窒化ケイ素、窒化炭素等の窒化物、チタン酸ストロンチウム、チタン酸バリウム等のチタン酸塩等を挙げることができる。これらの中の1種類を単独で用いることもできるし、2種類以上を併用したりすることもできる。
この中でもシリカ、酸化チタン、硫酸バリウム等が、比較的球状で入手しやすく、また金属張積層板の線熱膨張率を下げる点で好ましい。また、分散性の観点から、シリカであることが更に好ましい。
The (C) fine particles having an average particle diameter of 5 to 120 nm are not particularly limited. For example, talc, calcined talc, calcined clay, uncalcined clay, mica, glass and other silicates, titanium oxide, alumina, silica, molten Oxides such as silica, carbonates such as calcium carbonate, magnesium carbonate and hydrotalcite, hydroxides such as aluminum hydroxide, magnesium hydroxide and calcium hydroxide, sulfates such as barium sulfate, calcium sulfate and calcium sulfite or Sulfites, zinc borate, barium metaborate, aluminum borate, calcium borate, sodium borate and other borates, aluminum nitride, boron nitride, silicon nitride, carbon nitride and other nitrides, strontium titanate, titanium Examples thereof include titanates such as barium acid. One of these can be used alone, or two or more can be used in combination.
Of these, silica, titanium oxide, barium sulfate and the like are preferable because they are relatively spherical and easily available, and lower the linear thermal expansion coefficient of the metal-clad laminate. Silica is more preferable from the viewpoint of dispersibility.
前記前記(C)平均粒径5〜120nmの微粒子の形状は、球状であることが好ましい。これにより、含浸性を向上させることができる。球状にする方法は特に限定されないが、例えば、シリカの場合は、燃焼法などの乾式の溶融シリカや沈降法やゲル法などの湿式のゾルゲルシリカなどにより球状にすることができる。 The shape of the fine particles (C) having an average particle diameter of 5 to 120 nm is preferably spherical. Thereby, the impregnation property can be improved. There are no particular limitations on the method of making the particles spherical. For example, in the case of silica, the particles can be made spherical by dry fused silica such as a combustion method or wet sol-gel silica such as a precipitation method or a gel method.
前記(C)平均粒径5〜120nmの微粒子の配合量は、特に限定されないが、プリント配線板用エポキシ樹脂組成物中に1〜30重量部が好ましい。
前記範囲であれば、微細でキメ細かな粗化形状を形成することができる。
また、他の無機充填材を含む場合は、他の無機充填材の総体積を100体積部とした場合、その100体積部に対して1〜40体積部であることが好ましい。さらに、5〜25体積部が特に好ましい。これにより無機充填材の分散性と繊維基材への含浸性、および低熱膨張性に優れる。
The blending amount of the fine particles (C) having an average particle diameter of 5 to 120 nm is not particularly limited, but is preferably 1 to 30 parts by weight in the epoxy resin composition for a printed wiring board.
If it is the said range, a fine and fine roughening shape can be formed.
Moreover, when other inorganic fillers are included, when the total volume of the other inorganic fillers is 100 parts by volume, it is preferably 1 to 40 parts by volume with respect to 100 parts by volume. Furthermore, 5-25 volume parts is especially preferable. Thereby, it is excellent in the dispersibility of an inorganic filler, the impregnation property to a fiber base material, and low thermal expansion property.
本発明のエポキシ樹脂組成物は、さらにシアネート樹脂を含むことが好ましい。これにより、難燃性をより向上させることができる。
前記シアネート樹脂は、特に限定されないが、例えば、ハロゲン化シアン化合物とフェノール類やナフトール類とを反応させ、必要に応じて加熱等の方法でプレポリマー化することにより得ることができる。また、このようにして調製された市販品を用いることもできる。
The epoxy resin composition of the present invention preferably further contains a cyanate resin. Thereby, a flame retardance can be improved more.
The cyanate resin is not particularly limited, and can be obtained, for example, by reacting a halogenated cyanide compound with phenols or naphthols, and prepolymerizing by a method such as heating as necessary. Moreover, the commercial item prepared in this way can also be used.
前記シアネート樹脂は、特に限定されないが、例えば、2,2’−ビス(4−シアナトフェニル)イソプロピリデン、1,1’−ビス(4−シアナトフェニル)エタン、ビス(4−シアナト−3,5−ジメチルフェニル)メタン、1,3−ビス(4−シアナトフェニル−1−(1−メチルエチリデン))ベンゼン、ビス(4−シアナトフェニル)チオエーテル、ビス(4−シアナトフェニル)エーテル、1,1,1−トリス(4−シアナトフェニル)エタン、トリス(4−シアナトフェニル)ホスファイト、ビス(4−シアナトフェニル)スルホン、2,2−ビス(4−シアナトフェニル)プロパン、1,3−、1,4−、1,6−、1,8−、2,6−又は2,7−ジシアナトナフタレン、1,3,6−トリシアナトナフタレン、4,4−ジシアナトビフェニル、及びフェノールノボラック型、クレゾールノボラック型、ジシクロペンタジエン型の多価フェノール類と、ハロゲン化シアンとの反応で得られるシアネート樹脂、ナフトールアラルキル型の多価ナフトール類と、ハロゲン化シアンとの反応で得られるシアネート樹脂等が挙げられる。これらの中で、フェノールノボラック型シアネート樹脂が難燃性、及び低熱膨張性に優れ、2,2−ビス(4−シアナトフェニル)イソプロピリデン、及びジシクロペンタジエン型シアネート樹脂が架橋密度の制御、及び耐湿信頼性に優れている。特に、フェノールノボラック型シアネート樹脂が低熱膨張性の点から好ましい。また、更に他のシアネート樹脂を1種類あるいは2種類以上併用したりすることもでき、特に限定されない。 The cyanate resin is not particularly limited, and examples thereof include 2,2′-bis (4-cyanatophenyl) isopropylidene, 1,1′-bis (4-cyanatophenyl) ethane, and bis (4-cyanato-3). , 5-dimethylphenyl) methane, 1,3-bis (4-cyanatophenyl-1- (1-methylethylidene)) benzene, bis (4-cyanatophenyl) thioether, bis (4-cyanatophenyl) ether 1,1,1-tris (4-cyanatophenyl) ethane, tris (4-cyanatophenyl) phosphite, bis (4-cyanatophenyl) sulfone, 2,2-bis (4-cyanatophenyl) Propane, 1,3-, 1,4-, 1,6-, 1,8-, 2,6- or 2,7-dicyanatonaphthalene, 1,3,6-tricyanatonaphthalene, 4,4- Cyanatobiphenyl, phenol novolac type, cresol novolak type, dicyclopentadiene type polyhydric phenols, cyanate resin obtained by reaction with cyanogen halide, naphthol aralkyl type polyvalent naphthols, and cyanogen halide And cyanate resin obtained by the above reaction. Among these, phenol novolac type cyanate resin is excellent in flame retardancy and low thermal expansion, and 2,2-bis (4-cyanatophenyl) isopropylidene and dicyclopentadiene type cyanate resin are used for controlling the crosslinking density, Excellent moisture resistance reliability. In particular, a phenol novolac type cyanate resin is preferred from the viewpoint of low thermal expansion. Furthermore, other cyanate resins may be used alone or in combination of two or more, and are not particularly limited.
前記シアネート樹脂は、単独で用いてもよいし、重量平均分子量の異なるシアネート樹脂を併用したり、前記シアネート樹脂とそのプレポリマーとを併用したりすることもできる。
前記プレポリマーは、通常、前記シアネート樹脂を加熱反応等により、例えば3量化することで得られるものであり、プリント配線板用エポキシ樹脂組成物の成形性、流動性を調整するために好ましく使用されるものである。
前記プレポリマーは、特に限定されないが、例えば、3量化率が20〜50重量%のプレポリマーを用いた場合、良好な成形性、流動性を発現できる。
The said cyanate resin may be used independently, can also use together cyanate resin from which a weight average molecular weight differs, or can also use together the said cyanate resin and its prepolymer.
The prepolymer is usually obtained by, for example, trimerizing the cyanate resin by a heat reaction or the like, and is preferably used for adjusting the moldability and fluidity of the epoxy resin composition for printed wiring boards. Is.
The prepolymer is not particularly limited. For example, when a prepolymer having a trimerization rate of 20 to 50% by weight is used, good moldability and fluidity can be expressed.
前記シアネート樹脂の含有量は、特に限定されないが、プリント配線板用エポキシ樹脂組成物全体の固形分基準で5〜60重量%であることが好ましく、より好ましくは10〜50重量%であり、特に好ましくは10〜40重量%である。含有量が前記範囲内であると、シアネート樹脂は、効果的に耐熱性、及び難燃性を発現させることができる。シアネート樹脂の含有量が前記下限未満であると熱膨張性が大きくなり、耐熱性が低下する場合があり、前記上限値を超えるとプリント配線板用エポキシ樹脂組成物を用いて作製したプリプレグの強度が低下する場合がある。 The content of the cyanate resin is not particularly limited, but is preferably 5 to 60% by weight, more preferably 10 to 50% by weight, based on the solid content of the entire epoxy resin composition for a printed wiring board. Preferably it is 10 to 40% by weight. When the content is within the above range, the cyanate resin can effectively exhibit heat resistance and flame retardancy. When the content of the cyanate resin is less than the lower limit, the thermal expansibility increases and the heat resistance may decrease. When the upper limit is exceeded, the strength of the prepreg produced using the epoxy resin composition for a printed wiring board May decrease.
また、本発明のプリント配線板用エポキシ樹脂組成物は、特に限定されないが、マレイミド樹脂を含むことが好ましい。これにより、耐熱性を向上させることができる。
前記マレイミド樹脂としては、特に限定されないが、N,N’−(4,4’−ジフェニルメタン)ビスマレイミド、ビス(3−エチル−5−メチル−4−マレイミドフェニル)メタン、2,2−ビス[4−(4−マレイミドフェノキシ)フェニル]プロパン等のビスマレイミド樹脂が挙げられる。また、更に他のマレイミド樹脂を1種類あるいは2種類以上併用したりすることもでき、特に限定されない。
Moreover, although the epoxy resin composition for printed wiring boards of this invention is not specifically limited, It is preferable that maleimide resin is included. Thereby, heat resistance can be improved.
The maleimide resin is not particularly limited, but N, N ′-(4,4′-diphenylmethane) bismaleimide, bis (3-ethyl-5-methyl-4-maleimidophenyl) methane, 2,2-bis [ And bismaleimide resins such as 4- (4-maleimidophenoxy) phenyl] propane. Furthermore, other maleimide resins can be used alone or in combination of two or more, and are not particularly limited.
前記マレイミド樹脂は、単独で用いてもよいし、重量平均分子量の異なるマレイミド樹脂を併用したり、前記マレイミド樹脂とそのプレポリマーとを併用したりすることもできる。 The maleimide resin may be used alone, or may be used in combination with maleimide resins having different weight average molecular weights, or may be used in combination with the maleimide resin and its prepolymer.
前記マレイミド樹脂の含有量は、特に限定されないが、プリント配線板用エポキシ樹脂組成物の固形分基準で1〜30重量%であることが好ましく、より好ましくは5〜25重量%であり、さらに好ましくは5〜20重量%である。 The content of the maleimide resin is not particularly limited, but is preferably 1 to 30% by weight, more preferably 5 to 25% by weight, and still more preferably based on the solid content of the epoxy resin composition for printed wiring boards. Is 5 to 20% by weight.
さらに、本発明のエポキシ樹脂組成物は、ポリイミド樹脂、トリアジン樹脂、フェノール樹脂、及びメラミン樹脂よりなる群から選ばれる少なくとも1種を含んでいてもよい。 Furthermore, the epoxy resin composition of the present invention may contain at least one selected from the group consisting of a polyimide resin, a triazine resin, a phenol resin, and a melamine resin.
本発明のプリント配線板用エポキシ樹脂組成物は、フェノール系硬化剤を使用することができる。フェノール系硬化剤としては、例えば、フェノールノボラック樹脂、アルキルフェノールノボラック樹脂、ビスフェノールAノボラック樹脂、ジシクロペンタジエン型フェノール樹脂、ザイロック型フェノール樹脂、テルペン変性フェノール樹脂、ポリビニルフェノール類等公知慣用のものを単独あるいは2種類以上組み合わせて使用することができる。 The epoxy resin composition for printed wiring boards of this invention can use a phenol type hardening | curing agent. As the phenolic curing agent, for example, a phenol novolak resin, an alkylphenol novolak resin, a bisphenol A novolak resin, a dicyclopentadiene type phenol resin, a zylock type phenol resin, a terpene modified phenol resin, a polyvinylphenol, or the like can be used alone or Two or more types can be used in combination.
前記フェノール系硬化剤の含有量は、特に限定されないが、(A)エポキシ樹脂との当量比(フェノール性水酸基当量/エポキシ基当量)が1.0未満、0.1以上が好ましい。これにより、未反応のフェノール系硬化剤の残留がなくなり、吸湿耐熱性が向上する。更に、厳しい吸湿耐熱性を必要とする場合は、0.2〜0.5の範囲が特に好ましい。また、フェノール樹脂は、硬化剤として作用するだけでなく、シアネート基とエポキシ基との硬化を促進することができる。 Although content of the said phenol type hardening | curing agent is not specifically limited, (A) Equivalent ratio (phenolic hydroxyl group equivalent / epoxy group equivalent) with an epoxy resin is less than 1.0 and 0.1 or more are preferable. As a result, there remains no unreacted phenolic curing agent, and the moisture absorption heat resistance is improved. Furthermore, when severe moisture absorption heat resistance is required, the range of 0.2 to 0.5 is particularly preferable. In addition, the phenol resin not only acts as a curing agent, but can promote curing of a cyanate group and an epoxy group.
本発明のプリント配線板用エポキシ樹脂組成物は、必要に応じて、上記成分以外の添加物を、特性を損なわない範囲で添加することができる。上記成分以外の成分は、例えば、エポキシシランカップリング剤、カチオニックシランカップリング剤、アミノシランカップリング剤、チタネート系カップリング剤、シリコーンオイル型カップリング剤等のカップリング剤、イミダゾール類、トリフェニルホスフィン、及び4級ホスホニウム塩等の硬化促進剤、アクリル系重合物等の表面調整剤、染料及び顔料等の着色剤等を挙げることができる。 The epoxy resin composition for printed wiring boards of this invention can add additives other than the said component as needed in the range which does not impair a characteristic. Components other than the above components include, for example, epoxy silane coupling agents, cationic silane coupling agents, aminosilane coupling agents, titanate coupling agents, coupling agents such as silicone oil type coupling agents, imidazoles, and triphenyl. Examples thereof include curing accelerators such as phosphine and quaternary phosphonium salts, surface conditioners such as acrylic polymers, and colorants such as dyes and pigments.
本発明のプリント配線板用エポキシ樹脂組成物は、プリプレグの調製の際に、溶媒に溶解させてワニスとして用いられる。前記ワニスの調製方法は、特に限定されないが、例えば、前記(C)平均粒径5〜120nmの微粒子を溶媒に分散したスラリーを調製し、当該スラリーにその他のプリント配線板用エポキシ樹脂組成物の成分を添加し、さらに前記溶媒を加えて溶解・混合させる方法等が挙げられる。(C)平均粒径5〜120nmの微粒子は、凝集し易く、樹脂組成物に配合する際に2次凝集等を形成してしまうことが多いが、予めスラリー状のものを用いることで、このような2次凝集を防止することができ、分散性が向上される。 The epoxy resin composition for a printed wiring board of the present invention is used as a varnish after being dissolved in a solvent when preparing a prepreg. The method for preparing the varnish is not particularly limited. For example, the slurry (C) in which fine particles having an average particle diameter of 5 to 120 nm are dispersed in a solvent is prepared, and other epoxy resin compositions for printed wiring boards are prepared in the slurry. Examples thereof include a method of adding components and further dissolving and mixing the solvent. (C) Fine particles having an average particle diameter of 5 to 120 nm tend to aggregate and often form secondary aggregation when blended in the resin composition. Such secondary aggregation can be prevented and dispersibility is improved.
前記溶媒としては、特に限定されないが、前記プリント配線板用エポキシ樹脂組成物に対して良好な溶解性を示す溶媒が好ましく、例えば、シアセトン、メチルエチルケトン、メチルイソブチルケトン、シクロヘキサノン、テトラヒドロフラン、ジメチルホルムアミド、ジメチルアセトアミド、ジメチルスルホキシド、エチレングリコール、セルソルブ系、カルビトール系等が挙げられる。尚、悪影響を及ぼさない範囲で貧溶媒を使用しても構わない。 The solvent is not particularly limited, but a solvent exhibiting good solubility in the epoxy resin composition for a printed wiring board is preferable. For example, cyacetone, methyl ethyl ketone, methyl isobutyl ketone, cyclohexanone, tetrahydrofuran, dimethylformamide, dimethyl Examples include acetamide, dimethyl sulfoxide, ethylene glycol, cellosolve, and carbitol. In addition, you may use a poor solvent in the range which does not exert a bad influence.
前記ワニスが含むエポキシ樹脂組成物の固形分は、特に限定されないが、10〜70重量%が好ましく、特に20〜55重量%が好ましい。これにより、プリント配線板用エポキシ樹脂組成物の基材への含浸性を向上できる。 The solid content of the epoxy resin composition contained in the varnish is not particularly limited, but is preferably 10 to 70% by weight, and particularly preferably 20 to 55% by weight. Thereby, the impregnation property to the base material of the epoxy resin composition for printed wiring boards can be improved.
(プリプレグ)
次に、プリプレグについて説明する。
本発明のプリプレグは、前記プリント配線板用エポキシ樹脂組成物を基材に含浸し、加熱乾燥してなるものである。
(Prepreg)
Next, the prepreg will be described.
The prepreg of the present invention is obtained by impregnating a substrate with the epoxy resin composition for a printed wiring board and drying by heating.
前記基材としては、特に限定されないが、例えば、ガラス織布、ガラス不織布、ガラスペーパー等のガラス繊維基材、紙、アラミド、ポリエステル、芳香族ポリエステル、フッ素樹脂等の合成繊維等からなる織布や不織布、金属繊維、カーボン繊維、鉱物繊維等からなる織布、不織布、マット類等が挙げられる。これらの基材は単独又は混合して使用してもよい。これらの中でもガラス繊維基材が好ましい。これにより、プリプレグの剛性、寸法安定性を向上することができる。このようなガラス繊維基材を構成するガラスとしては、例えば、Eガラス、Cガラス、Aガラス、Sガラス、Dガラス、NEガラス、Tガラス、Hガラス、Qガラス等が挙げられる。これらの中でも、ガラスは、Sガラス、または、Tガラスであるのが好ましい。これにより、ガラス繊維基材の熱膨張係数を比較的小さくすることができる。これらの中でも、ドリル加工性の観点から、Eガラス、Dガラス、NEガラスが好ましい。 The base material is not particularly limited. For example, glass fiber base materials such as glass woven fabric, glass nonwoven fabric, and glass paper, and woven fabric made of synthetic fibers such as paper, aramid, polyester, aromatic polyester, and fluororesin. And woven fabrics, nonwoven fabrics, mats and the like made of nonwoven fabrics, non-woven fabrics, metal fibers, carbon fibers, mineral fibers and the like. These substrates may be used alone or in combination. Among these, a glass fiber base material is preferable. Thereby, the rigidity and dimensional stability of a prepreg can be improved. As glass which comprises such a glass fiber base material, E glass, C glass, A glass, S glass, D glass, NE glass, T glass, H glass, Q glass etc. are mentioned, for example. Among these, it is preferable that glass is S glass or T glass. Thereby, the thermal expansion coefficient of a glass fiber base material can be made comparatively small. Among these, E glass, D glass, and NE glass are preferable from the viewpoint of drill workability.
前記エポキシ樹脂組成物を前記基材に含浸させる方法は、特に限定されないが、例えば基材をプリント配線板用エポキシ樹脂組成物のワニスに浸漬する方法、各種コーターにより塗布する方法、スプレーにより吹き付ける方法等が挙げられる。これらの中でも、基材をプリント配線板用エポキシ樹脂組成物のワニスに浸漬する方法が好ましい。これにより、基材に対するプリント配線板用エポキシ樹脂組成物の含浸性を向上することができる。尚、基材をプリント配線板用エポキシ樹脂組成物のワニスに浸漬する場合、通常の含浸塗布設備を使用することができる。図1に示すように、基材1を、含浸槽2の前記エポキシ樹脂ワニス3中に浸漬して、基材1にエポキシ樹脂ワニス3を含浸する。その際、含浸槽2が備えるディップロール4(図1では3本)によって基材1はエポキシ樹脂ワニス3中に浸漬される。次いで、エポキシ樹脂ワニス3を含浸した基材1を、垂直方向に引き上げて、水平方向に並設され、対向している1対のスクイズロール又は、コンマロール(図1の5はスクイズロール)の間を通して、基材1へのエポキシ樹脂ワニス3の塗布量を調整する。その後、エポキシ樹脂ワニス3が塗布された基材1を、乾燥機6で所定の温度で加熱して、塗布されたワニス中の溶剤を揮発させると共にエポキシ樹脂組成物を半硬化させてプリプレグ7を製造する。なお、図1中の上部ロール8はプリプレグ7を進行方向に移動させるために、プリプレグ7の進行方向と同方向に回転している。また、前記エポキシ樹脂ワニスの溶剤を乾燥させる条件は、温度90〜180℃、時間1〜10分で乾燥させることにより半硬化のプリプレグ7を得ることができる。 The method of impregnating the base material with the epoxy resin composition is not particularly limited. For example, the method of immersing the base material in the varnish of the epoxy resin composition for printed wiring boards, the method of applying with various coaters, and the method of spraying by spraying Etc. Among these, the method of immersing a base material in the varnish of the epoxy resin composition for printed wiring boards is preferable. Thereby, the impregnation property of the epoxy resin composition for printed wiring boards with respect to a base material can be improved. In addition, when a base material is immersed in the varnish of the epoxy resin composition for printed wiring boards, a normal impregnation coating equipment can be used. As shown in FIG. 1, the base material 1 is immersed in the epoxy resin varnish 3 of the impregnation tank 2 to impregnate the base material 1 with the epoxy resin varnish 3. In that case, the base material 1 is immersed in the epoxy resin varnish 3 by the dip roll 4 (three in FIG. 1) with which the impregnation tank 2 is equipped. Next, the base material 1 impregnated with the epoxy resin varnish 3 is pulled up in the vertical direction, and a pair of squeeze rolls or comma rolls (5 in FIG. 1 is a squeeze roll) arranged in parallel in the horizontal direction. Through the interval, the application amount of the epoxy resin varnish 3 to the substrate 1 is adjusted. Thereafter, the base material 1 to which the epoxy resin varnish 3 is applied is heated at a predetermined temperature with a dryer 6 to volatilize the solvent in the applied varnish and to semi-cur the epoxy resin composition to prepare the prepreg 7. To manufacture. Note that the upper roll 8 in FIG. 1 rotates in the same direction as the direction of travel of the prepreg 7 in order to move the prepreg 7 in the direction of travel. Moreover, the conditions which dry the solvent of the said epoxy resin varnish can obtain the semi-hardened prepreg 7 by making it dry at the temperature of 90-180 degreeC for 1 to 10 minutes of time.
(金属張積層板)
次に、金属張積層板について説明する。
本発明の金属張積層板は、基材に上記のプリント配線板用エポキシ樹脂組成物を含浸してなる樹脂含浸基材層の少なくとも片面に金属箔を有するものである。
本発明の金属張積層板は、例えば、上記のプリプレグ又は当該プリプレグを2枚以上重ね合わせた積層体の少なくとも片面に金属箔を張り付けることで製造できる。
プリプレグ1枚のときは、その上下両面もしくは片面に金属箔を重ねる。また、プリプレグを2枚以上積層することもできる。プリプレグ2枚以上積層するときは、積層したプリプレグの最も外側の上下両面もしくは片面に金属箔あるいはフィルムを重ねる。次に、プリプレグと金属箔とを重ねたものを加熱加圧成形することで金属張積層板を得ることができる。
(Metal-clad laminate)
Next, the metal-clad laminate will be described.
The metal-clad laminate of the present invention has a metal foil on at least one surface of a resin-impregnated base material layer obtained by impregnating a base material with the epoxy resin composition for printed wiring boards.
The metal-clad laminate of the present invention can be produced, for example, by attaching a metal foil to at least one surface of the prepreg or a laminate obtained by superimposing two or more prepregs.
When one prepreg is used, the metal foil is overlapped on both the upper and lower surfaces or one surface. Two or more prepregs can be laminated. When two or more prepregs are laminated, a metal foil or film is laminated on the outermost upper and lower surfaces or one surface of the laminated prepreg. Next, a metal-clad laminate can be obtained by heat-pressing a laminate of a prepreg and a metal foil.
前記加熱する温度は、特に限定されないが、120〜250℃が好ましく、特に150〜220℃が好ましい。前記加圧する圧力は、特に限定されないが、0.1〜5MPaが好ましく、特に0.5〜3MPaが好ましい。また、必要に応じて高温槽等で150〜300℃の温度で後硬化を行っても構わない。 Although the temperature to heat is not specifically limited, 120-250 degreeC is preferable and especially 150-220 degreeC is preferable. Although the pressure to pressurize is not particularly limited, 0.1 to 5 MPa is preferable, and 0.5 to 3 MPa is particularly preferable. Moreover, you may postcure at the temperature of 150-300 degreeC with a high temperature tank etc. as needed.
また、本発明の金属張積層板を製造する別の方法として 、図2に示す絶縁樹脂層付き金属箔を用いた金属張積層板の製造方法が挙げられる。まず、金属箔11に均一な絶縁樹脂層12をコーターで塗工した絶縁樹脂層付き金属箔10を準備し、ガラス繊維等の基材20の両側に、絶縁樹脂層付き金属箔10、10を絶縁樹脂層を内側にして配し(図2(a))、真空中で加熱60〜130℃、加圧0.1〜5MPaでラミネート含浸させる方法により、金属箔付きプリプレグ41を得る(図2(b))。次いで、金属箔付きプリプレグ41を直接加熱加圧成形することで、金属張積層板51を得ることができる(図2(c))。 Another method for producing the metal-clad laminate of the present invention is a method for producing a metal-clad laminate using the metal foil with an insulating resin layer shown in FIG. First, a metal foil 10 with an insulating resin layer in which a uniform insulating resin layer 12 is coated on a metal foil 11 with a coater is prepared, and the metal foils 10 and 10 with an insulating resin layer are provided on both sides of a substrate 20 such as glass fiber. A prepreg 41 with a metal foil is obtained by a method of laminating and impregnating with an insulating resin layer inside (FIG. 2 (a)) and heating in a vacuum at 60 to 130 ° C. and a pressure of 0.1 to 5 MPa (FIG. 2). (B)). Next, the metal-clad laminate 51 can be obtained by directly heat-pressing the prepreg 41 with metal foil (FIG. 2C).
さらに、本発明の金属張積層板を製造する別の方法として、 図3に示す絶縁樹脂層付き高分子フィルムシートを用いた金属張積層板の製造方法も挙げられる。まず、高分子フィルムシート31に、均一な絶縁樹脂層32をコーターで塗工した絶縁樹脂層付き高分子フィルムシート30を準備し、基材2の両側に絶縁樹脂層付き高分子フィルムシート30、30を絶縁樹脂層を内側にして配し(図3(a))、真空中で加熱60〜130℃、加圧0.1〜5MPaでラミネート含浸させる方法により、高分子フィルムシート付きプリプレグ42を得ることができる(図3(b))。次いで、高分子フィルムシート付きプリプレグ42の少なくとも片面の高分子フィルムシート31を剥離後(図2(c))、高分子フィルムシート31を剥離した面に金属箔11を配し(図3(d))、加熱加圧成形することで金属張積層板52を得ることができる(図3(e))。さらに、両面の高分子フィルムシートを剥離する場合は、前述のプリプレグ同様に、2枚以上積層することもできる。プリプレグを2枚以上積層するときは、積層したプリプレグの最も外側の上下両面もしくは片面に金属箔または高分子フィルムシートを配し、加熱加圧成形することで金属張積層板を得ることができる。
この様な製造方法で得られた金属張積層板は、厚み精度が高く、厚みが均一であり、更には表面平滑性に優れる。
また成形歪の小さい金属張積層板を得ることができるため、当該製造方法により得られた金属張積層板を用い作製したプリント配線板、および半導体装置は、反りが小さく、反りばらつきも小さい。
さらにプリント配線板、および半導体装置を、歩留り良く製造することができる。
Furthermore, as another method for producing the metal-clad laminate of the present invention, a method for producing a metal-clad laminate using the polymer film sheet with an insulating resin layer shown in FIG. First, a polymer film sheet 30 with an insulating resin layer obtained by coating a uniform insulating resin layer 32 on the polymer film sheet 31 with a coater, and the polymer film sheet 30 with an insulating resin layer on both sides of the substrate 2; 30 with an insulating resin layer inside (FIG. 3 (a)), and a prepreg 42 with a polymer film sheet is obtained by laminating and impregnating in a vacuum at 60 to 130 ° C. and under a pressure of 0.1 to 5 MPa. Can be obtained (FIG. 3B). Next, after peeling the polymer film sheet 31 on at least one side of the prepreg 42 with the polymer film sheet (FIG. 2C), the metal foil 11 is arranged on the surface from which the polymer film sheet 31 is peeled (FIG. 3D). )), A metal-clad laminate 52 can be obtained by heating and pressing (FIG. 3E). Furthermore, when peeling a double-sided polymer film sheet, two or more sheets can be laminated | stacked like the above-mentioned prepreg. When two or more prepregs are laminated, a metal-clad laminate can be obtained by placing a metal foil or a polymer film sheet on the outermost upper and lower surfaces or one surface of the laminated prepregs and heating and pressing.
The metal-clad laminate obtained by such a manufacturing method has high thickness accuracy, uniform thickness, and excellent surface smoothness.
In addition, since a metal-clad laminate having a small molding strain can be obtained, a printed wiring board and a semiconductor device manufactured using the metal-clad laminate obtained by the manufacturing method have small warpage and small warpage variation.
Furthermore, a printed wiring board and a semiconductor device can be manufactured with high yield.
前記加熱加圧成形する条件としては、温度は、特に限定されないが、120〜250℃が好ましく、特に150〜220℃が好ましい。前記加圧する圧力は、特に限定されないが、0.1〜5MPaが好ましく、特に0.5〜3MPaが好ましい。
さらに必要に応じて高温槽等で150〜300℃の温度で後硬化を行ってもかまわない。
Although the temperature is not particularly limited as the conditions for the heat and pressure molding, 120 to 250 ° C is preferable, and 150 to 220 ° C is particularly preferable. Although the pressure to pressurize is not particularly limited, 0.1 to 5 MPa is preferable, and 0.5 to 3 MPa is particularly preferable.
Furthermore, if necessary, post-curing may be performed at a temperature of 150 to 300 ° C. in a high-temperature tank or the like.
図2〜3等の金属張積層板は、特に限定されないが、例えば、絶縁樹脂層付き金属箔を製造する装置及び金属張積層板を製造する装置を用いて製造される。
前記絶縁樹脂層付き金属箔を製造する装置において、金属箔は、例えば長尺のシート品を巻物形態にしたもの等を用い、これにより連続的に巻き出すことにより供給することができる。液状の絶縁樹脂は、絶縁樹脂の供給装置により、所定量が連続的に金属箔上に供給される。ここで液状の絶縁樹脂として、本発明の樹脂組成物を溶剤に溶解、分散させた塗布液が用いられる。絶縁樹脂の塗工量は、コンマロールと、当該コンマロールのバックアップロールとのクリアランスにより制御することができる。所定量の絶縁樹脂が塗工された金属箔は、横搬送型の熱風乾燥装置の内部を移送し、液状の絶縁樹脂中に含有される有機溶剤等を実質的に乾燥除去し、必要に応じて、硬化反応を途中まで進めた絶縁樹脂層付き金属箔とすることができる。絶縁樹脂層付き金属箔は、そのまま巻き取ることもできるがラミネートロールにより、絶縁樹脂層が形成された側に保護フィルムを重ね合わせ、当該保護フィルムがラミネートされた絶縁樹脂層付き金属箔を巻き取って、巻物形態の絶縁樹脂層付き金属箔を得ている。図2〜3等の製造方法を用いると、図1に示すワニスを含浸させる製造方法より、均一な樹脂量の制御、および面内厚み精度に優れるため、半導体素子を搭載した半導体装置の反りばらつきが小さく、歩留まりが向上する。
Although the metal-clad laminates of FIGS. 2 to 3 are not particularly limited, for example, the metal-clad laminate is produced using an apparatus for producing a metal foil with an insulating resin layer and an apparatus for producing a metal-clad laminate.
In the apparatus for producing the metal foil with an insulating resin layer, the metal foil can be supplied by, for example, using a long sheet product in the form of a roll, and continuously unwinding it. A predetermined amount of the liquid insulating resin is continuously supplied onto the metal foil by an insulating resin supply device. Here, as the liquid insulating resin, a coating solution in which the resin composition of the present invention is dissolved and dispersed in a solvent is used. The coating amount of the insulating resin can be controlled by the clearance between the comma roll and the backup roll of the comma roll. The metal foil coated with a predetermined amount of insulating resin is transported inside a horizontal conveying type hot-air drying device to substantially dry and remove the organic solvent contained in the liquid insulating resin. Thus, a metal foil with an insulating resin layer in which the curing reaction has been advanced halfway can be obtained. Although the metal foil with an insulating resin layer can be wound up as it is, a protective film is laminated on the side on which the insulating resin layer is formed by a laminating roll, and the metal foil with an insulating resin layer laminated with the protective film is wound up. Thus, a metal foil with an insulating resin layer in a roll form is obtained. When manufacturing methods such as FIGS. 2 to 3 are used, since the control of the uniform resin amount and the in-plane thickness accuracy are superior to the manufacturing method impregnated with the varnish shown in FIG. Is small and the yield is improved.
また、この様な製造方法により金属張積層板を得た場合、溶剤中に溶解、分散させたワニスではなく、樹脂組成物を直接繊維基材への含浸性を考慮する必要がある。 無機充填材は、(C)平均粒径5〜120nmの微粒子を用いることで、特に繊維基材への含浸性が向上するため、加熱加圧成形時に、金属張積層板内における樹脂組成物のフローを抑え、溶融樹脂の不均一な移動が抑制されるため、金属張積層板表面のスジ状のムラを防止し、且つ均一な厚みとすることができる。 Further, when a metal-clad laminate is obtained by such a production method, it is necessary to consider the impregnation property of the resin composition directly into the fiber substrate, not the varnish dissolved and dispersed in the solvent. Since the inorganic filler (C) uses fine particles having an average particle diameter of 5 to 120 nm, particularly the impregnation property to the fiber base material is improved, the resin composition in the metal-clad laminate is heated and pressed. Since the flow is suppressed and uneven movement of the molten resin is suppressed, streaky unevenness on the surface of the metal-clad laminate can be prevented and the thickness can be made uniform.
(樹脂シート)
次に、本発明の樹脂シートについて説明する。
本発明の樹脂シートは、前記プリント配線板用エポキシ樹脂組成物からなる絶縁層を金属箔上、またはフィルム上に形成してなるものである。
ここで、プリント配線板用エポキシ樹脂組成物からなる絶縁層を金属箔、またはフィルム上に形成する方法としては特に限定されないが、例えば、エポキシ樹脂組成物を溶剤などに溶解・分散させて樹脂ワニスを調製して、各種塗工装置を用いて樹脂ワニスを基材に塗工した後、これを乾燥する方法、樹脂ワニスをスプレー装置にて基材に噴霧塗工した後、これを乾燥する方法などが挙げられる。
(Resin sheet)
Next, the resin sheet of the present invention will be described.
The resin sheet of the present invention is obtained by forming an insulating layer made of the epoxy resin composition for printed wiring boards on a metal foil or a film.
Here, the method for forming the insulating layer made of the epoxy resin composition for a printed wiring board on the metal foil or film is not particularly limited. For example, the resin varnish is prepared by dissolving and dispersing the epoxy resin composition in a solvent or the like. A method of drying the resin varnish after applying the resin varnish to the substrate using various coating devices, and a method of drying the resin varnish after spray coating the substrate with a spray device Etc.
本発明の樹脂シートに用いるフィルムは、特に限定されないが、例えば、ポリエチレンテレフタレート、ポリブチレンテレフタレートなどのポリエステル樹脂、フッ素系樹脂、ポリイミド樹脂などの耐熱性を有した熱可塑性樹脂フィルムなどを用いることができる。
本発明の樹脂シートに用いる金属箔は、特に限定されないが、例えば、銅及び/又は銅系合金、アルミ及び/又はアルミ系合金、鉄及び/又は鉄系合金、銀及び/又は銀系合金、金及び金系合金、亜鉛及び亜鉛系合金、ニッケル及びニッケル系合金、錫及び錫系合金等の金属箔などを用いることができる。なお、本発明の樹脂シートを製造するにあたっては、絶縁層を積層する金属箔表面の凹凸は、表面粗さ(Rz)が2μm以下であることが好ましい。表面粗さ(Rz)が、2μm以下の金属箔表面上に、本発明の樹脂組成物からなる絶縁層を形成することにより、表面粗さが小さく、かつ、密着性(めっきピール強度)に優れるものとすることができる。
尚、金属の表面粗さ(Rz)は、10点測定を行い、その平均値とした。表面粗さは、JISB0601に基づいて測定した。
Although the film used for the resin sheet of the present invention is not particularly limited, for example, a polyester resin such as polyethylene terephthalate or polybutylene terephthalate, a thermoplastic resin film having heat resistance such as a fluorine resin, or a polyimide resin may be used. it can.
Although the metal foil used for the resin sheet of the present invention is not particularly limited, for example, copper and / or copper-based alloy, aluminum and / or aluminum-based alloy, iron and / or iron-based alloy, silver and / or silver-based alloy, Metal foils such as gold and gold-based alloys, zinc and zinc-based alloys, nickel and nickel-based alloys, tin and tin-based alloys, and the like can be used. In manufacturing the resin sheet of the present invention, the surface roughness (Rz) of the irregularities on the surface of the metal foil on which the insulating layer is laminated is preferably 2 μm or less. By forming an insulating layer made of the resin composition of the present invention on the surface of a metal foil having a surface roughness (Rz) of 2 μm or less, the surface roughness is small and adhesion (plating peel strength) is excellent. Can be.
The surface roughness (Rz) of the metal was measured at 10 points, and the average value was obtained. The surface roughness was measured based on JISB0601.
(プリント配線板)
次に、本発明のプリント配線板について説明する。
本発明のプリント配線板は、上記の金属張積層板を内層回路基板に用いてなる。また、本発明のプリント配線板は、内層回路上に、上記のプリプレグ、または樹脂シートを絶縁層に用いてなる。また、本発明のプリント配線板は、内層回路上に、上記のエポキシ樹脂組成物を絶縁層に用いてなる。
(Printed wiring board)
Next, the printed wiring board of the present invention will be described.
The printed wiring board of the present invention uses the above metal-clad laminate as an inner layer circuit board. Moreover, the printed wiring board of this invention uses said prepreg or a resin sheet for an insulating layer on an inner layer circuit. Moreover, the printed wiring board of this invention uses said epoxy resin composition for an insulating layer on an inner layer circuit.
本発明においてプリント配線板とは、絶縁層の上に金属箔等の導電体で回路を形成したものであり、片面プリント配線板(一層板)、両面プリント配線板(二層板)、及び多層プリント配線板(多層板)のいずれであってもよい。多層プリント配線板とは、メッキスルーホール法やビルドアップ法等により3層以上に重ねたプリント配線板であり、内層回路基板に絶縁層を重ね合わせて加熱加圧成形することによって得ることができる。
前記内層回路基板としては、例えば、本発明の金属張積層板の金属層に、エッチング等により所定の導体回路を形成し、導体回路部分を黒化処理したものを好適に用いることができる。
前記絶縁層としては、本発明のプリプレグ、又は本発明のプリント配線板用エポキシ樹脂組成物からなる樹脂シートを用いることができる。尚、前記絶縁層として、前記プリプレグ又は前記プリント配線板用エポキシ樹脂組成物からなる樹脂シートを用いる場合は、前記内層回路基板は本発明の金属張積層板からなるものでなくてもよい。
In the present invention, a printed wiring board is a circuit in which a circuit is formed of a conductive material such as a metal foil on an insulating layer, a single-sided printed wiring board (single-layer board), a double-sided printed wiring board (double-layer board), and a multilayer. Any of printed wiring boards (multilayer boards) may be used. A multilayer printed wiring board is a printed wiring board that is laminated in three or more layers by a plated through hole method, a build-up method, or the like, and can be obtained by heating and press-molding an insulating layer on an inner circuit board. .
As the inner layer circuit board, for example, a metal layer of the metal-clad laminate of the present invention in which a predetermined conductor circuit is formed by etching or the like and the conductor circuit portion is blackened can be suitably used.
As the insulating layer, a prepreg of the present invention or a resin sheet made of the epoxy resin composition for printed wiring boards of the present invention can be used. In addition, when using the resin sheet which consists of the said prepreg or the said epoxy resin composition for printed wiring boards as said insulating layer, the said inner layer circuit board does not need to consist of the metal-clad laminated board of this invention.
以下、本発明のプリント配線板の代表例として、まず本発明の金属張積層板を内層回路基板として用い、本発明のプリプレグを絶縁層として用いる場合の多層プリント配線板について説明する。
前記金属張積層板の片面又は両面に回路形成し、内層回路基板を作製する。場合によっては、ドリル加工、レーザー加工によりスルーホールを形成し、メッキ等で両面の電気的接続をとることもできる。この内層回路基板に前記プリプレグを重ね合わせて加熱加圧形成することで絶縁層を形成する。同様にして、エッチング等で形成した導体回路層と絶縁層とを交互に繰り返し形成することにより、多層プリント配線板を得ることができる。
Hereinafter, as a representative example of the printed wiring board of the present invention, a multilayer printed wiring board in which the metal-clad laminate of the present invention is first used as an inner circuit board and the prepreg of the present invention is used as an insulating layer will be described.
A circuit is formed on one or both sides of the metal-clad laminate to produce an inner layer circuit board. In some cases, through holes can be formed by drilling or laser processing, and electrical connection on both sides can be achieved by plating or the like. The insulating layer is formed by superposing the prepreg on the inner layer circuit board and forming it by heating and pressing. Similarly, a multilayer printed wiring board can be obtained by alternately and repeatedly forming conductive circuit layers and insulating layers formed by etching or the like.
具体的には、前記内層回路基板の両側にプリプレグを重ね、さらに両側に銅箔を重ねて、真空プレス装置などを用いて加熱加圧成形し、絶縁層を加熱硬化させる。ここで加熱加圧成形する条件としては、特に限定されないが、一例を挙げると、温度120℃〜240℃、圧力0.5〜5MPa,時間30〜180分間で実施することができる。 Specifically, a prepreg is stacked on both sides of the inner layer circuit board, and a copper foil is further stacked on both sides, and heat-press molding is performed using a vacuum press apparatus or the like, and the insulating layer is heated and cured. Although it does not specifically limit as conditions to heat-press-mold here, if an example is given, it can implement in temperature 120-240 degreeC, pressure 0.5-5 MPa, time 30-180 minutes.
尚、次工程においてレーザーを照射し、絶縁層に開口部を形成するが、その前に銅箔をエッチングなどにより剥離する必要がある。 In the next step, laser is irradiated to form an opening in the insulating layer, but before that, the copper foil must be peeled off by etching or the like.
次に、絶縁層にレーザーを照射して、開孔部を形成する。前記レーザーは、エキシマレーザー、UVレーザー及び炭酸ガスレーザー等が使用できる。 Next, the insulating layer is irradiated with laser to form an opening. As the laser, an excimer laser, a UV laser, a carbon dioxide gas laser, or the like can be used.
レーザー照射後の樹脂残渣等(スミア)は過マンガン酸塩、重クロム酸塩等の酸化剤等により除去する処理、すなわちデスミア処理を行うことが好ましい。デスミア処理が不十分で、デスミア耐性が十分に確保されていないと、開孔部に金属メッキ処理を行っても、スミアが原因で上層金属配線と下層金属配線との通電性が十分に確保されなくなるおそれがある。また、平滑な絶縁層の表面を同時に粗化することができ、続く金属メッキにより形成する導電配線回路の密着性を上げることができる。 It is preferable to perform a treatment for removing resin residues (smear) after laser irradiation with an oxidizing agent such as permanganate or dichromate, that is, desmear treatment. If the desmear treatment is inadequate and the desmear resistance is not sufficiently secured, even if metal plating is applied to the opening, sufficient conductivity is ensured between the upper metal wiring and the lower metal wiring due to smear. There is a risk of disappearing. Further, the surface of the smooth insulating layer can be simultaneously roughened, and the adhesion of the conductive wiring circuit formed by subsequent metal plating can be improved.
次に、外層回路を形成する。外層回路の形成方法は、金属メッキにより絶縁樹脂層間の接続を図り、エッチングにより外層回路パターン形成を行う。 Next, an outer layer circuit is formed. The outer layer circuit is formed by connecting the insulating resin layers by metal plating and forming an outer layer circuit pattern by etching.
さらに絶縁層を積層し、前記同様回路形成を行っても良いが、多層プリント配線板では、回路形成後、最外層にソルダーレジストを形成する。ソルダーレジストの形成方法は、特に限定されないが、例えば、ドライフィルムタイプのソルダーレジストを積層(ラミネート)し、露光、及び現像により形成する方法、又は液状レジストを印刷したものを露光、及び現像により形成する方法によりなされる。尚、得られた多層プリント配線板を半導体装置に用いる場合、半導体素子を実装するため接続用電極部を設ける。接続用電極部は、金メッキ、ニッケルメッキ及び半田メッキ等の金属皮膜で適宜被覆することができる。 Further, an insulating layer may be stacked and a circuit may be formed in the same manner as described above. However, in a multilayer printed wiring board, a solder resist is formed on the outermost layer after the circuit is formed. The method of forming the solder resist is not particularly limited. For example, a method of laminating (laminating) a dry film type solder resist and forming it by exposure and development, or a method of printing a liquid resist by exposure and development It is done by the method to do. In addition, when using the obtained multilayer printed wiring board for a semiconductor device, the electrode part for a connection is provided in order to mount a semiconductor element. The connection electrode portion can be appropriately coated with a metal film such as gold plating, nickel plating, or solder plating.
前記金メッキの代表的な方法の1つとして、ニッケル−パラジウム−金無電解メッキ法がある。この方法では、接続用電極部に、クリーナー等の適宜の方法により前処理を行った後、パラジウム触媒を付与し、その後さらに、無電解ニッケルメッキ処理、無電解パラジウムメッキ処理、及び無電解金メッキ処理を順次行う。
ENEPIG法は、前記ニッケル−パラジウム−金無電解メッキ法の無電解金メッキ処理段階において、置換金メッキ処理を行う方法である。下地メッキとしての無電解ニッケルメッキ皮膜と、無電解金メッキ皮膜との間に無電解パラジウムメッキ皮膜を設けることによって、接続用電極部における導体材料の拡散防止性、耐食性が向上する。下地ニッケルメッキ皮膜の拡散防止を図ることができるので、Au−Au接合の信頼性が向上し、また金によるニッケル酸化を防止することができるので、熱負荷の大きい鉛フリー半田接合の信頼性も向上する。ENEPIG法では、通常、無電解パラジウムメッキ処理を行う前に表面処理を行って、メッキ工程での導通不良の発生を防ぐ必要があり、導通不良が甚だしい場合には隣接する端子間でショートを起こす原因となる。一方、本発明のプリント配線板は、表面処理を行わなくても上記のような導通不良がなく、簡単にメッキ処理を行うことができる。
One of the typical gold plating methods is a nickel-palladium-gold electroless plating method. In this method, a pretreatment is performed on the connecting electrode portion by an appropriate method such as a cleaner, and then a palladium catalyst is applied. Thereafter, an electroless nickel plating treatment, an electroless palladium plating treatment, and an electroless gold plating treatment are further performed. Are performed sequentially.
The ENEPIG method is a method in which a substitution gold plating process is performed in the electroless gold plating process stage of the nickel-palladium-gold electroless plating process. By providing the electroless palladium plating film between the electroless nickel plating film as the base plating and the electroless gold plating film, the diffusion preventing property and the corrosion resistance of the conductor material in the connection electrode portion are improved. Since it is possible to prevent the diffusion of the underlying nickel plating film, the reliability of the Au-Au joint is improved and the nickel oxidation due to gold can be prevented. improves. In the ENEPIG method, it is usually necessary to perform surface treatment before performing electroless palladium plating to prevent the occurrence of poor conduction in the plating process. If the poor conduction is severe, a short circuit occurs between adjacent terminals. Cause. On the other hand, the printed wiring board of the present invention does not have the above-described conduction failure without performing surface treatment, and can be easily plated.
次に、本発明のプリント配線板の代表例として、本発明の樹脂シートを絶縁層として用いる場合のプリント配線板について説明する。 Next, as a representative example of the printed wiring board of the present invention, a printed wiring board when the resin sheet of the present invention is used as an insulating layer will be described.
前記本発明の樹脂シートを、内層回路基板とを合わせて、真空加圧式ラミネーター装置などを用いて真空加熱加圧成形させ、その後、熱風乾燥装置等で加熱硬化させることにより得ることができる。
ここで加熱加圧成形する条件は、特に限定されないが、一例を挙げると、温度60〜160℃、圧力0.2〜3MPaで実施することができる。また、加熱硬化させる条件も特に限定されないが、一例を挙げると、温度140〜240℃、時間30〜120分間で実施することができる。
また、他の製造方法としては、前記本発明の樹脂シートを内層回路基板に重ね合わせ、平板プレス装置などを用いて加熱加圧成形することにより得ることができる。ここで加熱加圧成形する条件としては特に限定されないが、一例を挙げると、温度140〜240℃、圧力1〜4MPaで実施することができる。
前記内層回路基板は、特に限定されないが、例えば、ドリル等によりスルーホールを形成し、メッキにより前記スルーホールを充填した後、金属張積層板の両面に、エッチング等により所定の導体回路(内層回路)を形成し、導体回路を黒化処理等の粗化処理することにより内層回路基板を作製する。前記金属張積層板は、本発明の金属張積層板を用いることが好ましい。
前記で得られた基板に、さらに、金属箔またはフィルムを剥離除去して、絶縁層表面を過マンガン酸塩、重クロム酸塩等の酸化剤などにより粗化処理した後、金属メッキにより新たな導電配線回路を形成する。本発明の樹脂組成物から形成された絶縁層は、前記粗化処理工程において、微細な凹凸形状を高い均一性で多数形成することができ、また、絶縁層表面の平滑性が高いため、微細な配線回路を精度よく形成することができるものである。
その後、前記絶縁層を加熱することにより硬化させる。硬化させる温度は、特に限定されないが、例えば、100℃〜250℃の範囲で硬化させることができる。好ましくは150℃〜200℃で硬化させることである。
次に、絶縁層に、炭酸レーザー装置を用いて開口部を設け、電解銅めっきにより絶縁層表面に外層回路形成を行い、外層回路と内層回路との導通を図る。なお、外層回路には、半導体素子を実装するための接続用電極部を設ける。
最後に、最外層にソルダーレジストを形成し、露光・現像により半導体素子が実装できるよう接続用電極部を露出させ、ニッケル金メッキ処理を施し、所定の大きさに切断し、多層プリント配線板を得ることができる。
The resin sheet of the present invention can be obtained by combining with an inner layer circuit board, vacuum heating and pressing using a vacuum pressurizing laminator apparatus, etc., and then heat curing with a hot air drying apparatus or the like.
Here, the conditions for heat and pressure molding are not particularly limited, but for example, it can be carried out at a temperature of 60 to 160 ° C. and a pressure of 0.2 to 3 MPa. Moreover, although the conditions to heat-harden are not specifically limited, For example, it can implement in temperature 140-240 degreeC and time 30-120 minutes.
Further, as another manufacturing method, the resin sheet of the present invention can be obtained by superimposing the resin sheet on the inner layer circuit board and performing heat-pressure molding using a flat plate press device or the like. Although it does not specifically limit as conditions to heat-press form here, For example, it can implement at the temperature of 140-240 degreeC, and the pressure of 1-4 MPa.
The inner layer circuit board is not particularly limited. For example, a through hole is formed by a drill or the like, and after filling the through hole by plating, a predetermined conductor circuit (inner layer circuit is formed on both surfaces of the metal-clad laminate by etching or the like. ) And roughening treatment such as blackening treatment of the conductor circuit to produce an inner layer circuit board. The metal-clad laminate is preferably the metal-clad laminate of the present invention.
Further, the metal foil or film is peeled and removed from the substrate obtained above, and the surface of the insulating layer is roughened with an oxidizing agent such as permanganate or dichromate, and then new by metal plating. A conductive wiring circuit is formed. The insulating layer formed from the resin composition of the present invention can form a large number of fine irregularities with high uniformity in the roughening treatment step, and the insulating layer surface has high smoothness. A simple wiring circuit can be formed with high accuracy.
Thereafter, the insulating layer is cured by heating. Although the temperature to harden | cure is not specifically limited, For example, it can be made to harden | cure in the range of 100 to 250 degreeC. Preferably it is made to harden | cure at 150 to 200 degreeC.
Next, an opening is provided in the insulating layer by using a carbonic acid laser device, and an outer layer circuit is formed on the surface of the insulating layer by electrolytic copper plating to achieve conduction between the outer layer circuit and the inner layer circuit. The outer layer circuit is provided with a connection electrode portion for mounting a semiconductor element.
Finally, a solder resist is formed on the outermost layer, the connection electrode part is exposed so that a semiconductor element can be mounted by exposure and development, nickel gold plating treatment is performed, and a predetermined size is obtained to obtain a multilayer printed wiring board be able to.
(半導体装置)
次に、本発明の半導体装置について説明する。
前記で得られたプリント配線板に半田バンプを有する半導体素子を実装し、半田バンブを介して、前記プリント配線板との接続を図る。そして、プリント配線板と半導体素子との間には液状封止樹脂を充填し、半導体装置を形成する。半田バンプは、錫、鉛、銀、銅、ビスマス等からなる合金で構成されることが好ましい。
(Semiconductor device)
Next, the semiconductor device of the present invention will be described.
A semiconductor element having solder bumps is mounted on the printed wiring board obtained above, and connection to the printed wiring board is attempted through the solder bump. A liquid sealing resin is filled between the printed wiring board and the semiconductor element to form a semiconductor device. The solder bump is preferably made of an alloy made of tin, lead, silver, copper, bismuth or the like.
半導体素子とプリント配線板との接続方法は、フリップチップボンダー等を用いて、基板上の接続用電極部と半導体素子の半田バンプとの位置合わせを行ったあと、IRリフロー装置、熱板、その他加熱装置を用いて半田バンプを融点以上に加熱し、プリント配線板と半田バンプとを溶融接合することにより接続する。尚、接続信頼性を良くするため、予めプリント配線板上の接続用電極部に半田ペースト等、比較的融点の低い金属の層を形成しておいてもよい。この接合工程に先んじて、半田バンプ及び/又はプリント配線板上の接続用電極部の表層にフラックスを塗布することで接続信頼性を向上させることもできる。 The connection method between the semiconductor element and the printed wiring board is to use a flip chip bonder or the like to align the connection electrode part on the substrate and the solder bump of the semiconductor element, and then to an IR reflow device, a heat plate, etc. The solder bumps are heated to a melting point or higher by using a heating device, and the printed wiring board and the solder bumps are connected by fusion bonding. In order to improve connection reliability, a metal layer having a relatively low melting point, such as solder paste, may be formed in advance on the connection electrode portion on the printed wiring board. Prior to this joining step, the connection reliability can be improved by applying a flux to the surface layer of the connection electrode portion on the solder bump and / or printed wiring board.
以下、本発明の内容を実施例により詳細に説明するが、本発明は、その要旨を越えない限り以下の例に限定されるものではない。 Hereinafter, the contents of the present invention will be described in detail by way of examples. However, the present invention is not limited to the following examples unless it exceeds the gist.
実施例、比較例及び参考例において用いた原材料は以下の通りである。
(1) エポキシ樹脂A:ナフタレン変性クレゾールノボラック型エポキシ樹脂(DIC社製EPICLON HP−5000)
(2) エポキシ樹脂B:ビフェニルアラルキル型ノボラックエポキシ樹脂(日本化薬社製NC−3000)
(3) シアネート樹脂:ノボラック型シアネート樹脂(ロンザジャパン社製プリマセットPT−30)
(4) ビスマレイミド化合物:ケイ・アイ化成工業社製BMI−70
(5) フェノキシ樹脂:ビスフェノールA型およびF型フェノキシ樹脂(三菱化学社製jER−4275)
(6) ポリビニルアセタール樹脂(I):積水化学社製KS−10(水酸基25mol%)
(7) ポリビニルアセタール樹脂(II):積水化学社製BX−L(水酸基37mol%)
(8) 硬化剤:4,4'−ジアミノジフェニルメタン
(9) 硬化触媒:1−ベンジル−2−フェニルイミダゾール(四国化成社製1B2PZ)
(10)平均粒径5〜120nmの微粒子:球状シリカ(トクヤマ社製NSS−5N,平均粒径75nm)
(11)無機充填材:球状シリカ(アドマテックス社製SO25R,平均粒径0.5μm)
(12)無機充填材:水酸化アルミニウム(昭和電工社製HP360)
(13)カップリング剤:エポキシシランカップリング剤(信越化学工業社製KBM403)
The raw materials used in Examples, Comparative Examples and Reference Examples are as follows.
(1) Epoxy resin A: Naphthalene-modified cresol novolac type epoxy resin (EPICLON HP-5000 manufactured by DIC)
(2) Epoxy resin B: biphenyl aralkyl type novolac epoxy resin (NC-3000 manufactured by Nippon Kayaku Co., Ltd.)
(3) Cyanate resin: Novolak-type cyanate resin (Primaset PT-30 manufactured by Lonza Japan)
(4) Bismaleimide compound: BMI-70 manufactured by Kay Chemical Industries
(5) Phenoxy resin: bisphenol A type and F type phenoxy resin (jER-4275 manufactured by Mitsubishi Chemical Corporation)
(6) Polyvinyl acetal resin (I): KS-10 (hydroxyl group 25 mol%) manufactured by Sekisui Chemical Co., Ltd.
(7) Polyvinyl acetal resin (II): BX-L (hydroxyl group 37 mol%) manufactured by Sekisui Chemical Co., Ltd.
(8) Curing agent: 4,4′-diaminodiphenylmethane (9) Curing catalyst: 1-benzyl-2-phenylimidazole (1B2PZ manufactured by Shikoku Chemicals)
(10) Fine particles having an average particle diameter of 5 to 120 nm: spherical silica (NSS-5N manufactured by Tokuyama Corporation, average particle diameter of 75 nm)
(11) Inorganic filler: Spherical silica (SO25R manufactured by Admatechs, average particle size 0.5 μm)
(12) Inorganic filler: Aluminum hydroxide (HP360 manufactured by Showa Denko KK)
(13) Coupling agent: Epoxysilane coupling agent (KBM403 manufactured by Shin-Etsu Chemical Co., Ltd.)
(実施例1)
(1)樹脂ワニス(1)の調製
(A)エポキシ樹脂としてメトキシナフタレンアラルキル型エポキシ樹脂(DIC社製、EPICLON HP−5000)35重量部、(B)ポリビニルアセタール樹脂(積水化学社製、エスレックKS−10;水酸基25mol%)13重量部、(D)シアネート樹脂としてフェノールノボラック型シアネート樹脂(LONZA社製、Primaset PT−30)35重量部、硬化触媒としてイミダゾール(四国化成社製、キュアゾール1B2PZ)1重量部をジメチルアセトアミド溶媒で30分攪拌し、溶解させた。さらに、カップリング剤としてエポキシシランカップリング剤(信越化学工業社製 KBM403)1重量部と(C)無機充填材として球状溶融シリカ(トクヤマ社製、NSS−5N、平均粒径75nm)15重量部を添加して、高速攪拌装置を用いて10分攪拌し、固形分35%の樹脂ワニスを調製した。
Example 1
(1) Preparation of resin varnish (1) (A) 35 parts by weight of methoxynaphthalene aralkyl epoxy resin (DIC Corporation, EPICLON HP-5000) as an epoxy resin, (B) polyvinyl acetal resin (manufactured by Sekisui Chemical Co., Ltd., ESREC KS) -10; hydroxyl group 25 mol%) 13 parts by weight, (D) 35 parts by weight of phenol novolac cyanate resin (manufactured by LONZA, Primaset PT-30) as cyanate resin, and imidazole (manufactured by Shikoku Kasei Co., Ltd., Curazole 1B2PZ) 1 A part by weight was stirred for 30 minutes with a dimethylacetamide solvent and dissolved. Furthermore, 1 part by weight of an epoxy silane coupling agent (KBE403, manufactured by Shin-Etsu Chemical Co., Ltd.) as a coupling agent and 15 parts by weight of spherical fused silica (NSS-5N, manufactured by Tokuyama Co., Ltd., average particle size 75 nm) as an inorganic filler (C) And stirred for 10 minutes using a high-speed stirrer to prepare a resin varnish having a solid content of 35%.
(2)樹脂シートの作製
前記ワニスを厚さ36μmのPET(ポリエチレンテレフタレート)フィルムの片面に、コンマコーター装置を用いて乾燥後の厚さが40μmとなるように塗工し、これを160℃の乾燥装置で3分間乾燥し、樹脂シートを形成した。
(2) Production of resin sheet The varnish was applied to one side of a 36 μm thick PET (polyethylene terephthalate) film using a comma coater so that the thickness after drying would be 40 μm. It dried for 3 minutes with the drying apparatus, and formed the resin sheet.
(3)プリプレグの作製
前記ワニスをガラス織布(厚さ87μm、日東紡績製Eガラス織布、WEA−116E)に含浸し、180℃の加熱炉で2分間乾燥して、プリプレグ中のエポキシ樹脂組成物が固形分基準で約50重量%のプリプレグを得た。
(3) Preparation of prepreg The varnish was impregnated into a glass woven fabric (thickness 87 μm, Nittobo E glass woven fabric, WEA-116E), dried in a heating furnace at 180 ° C. for 2 minutes, and epoxy resin in the prepreg A prepreg having a composition based on solid content of about 50% by weight was obtained.
(4)金属張積層板の作製
前記プリプレグを4枚重ね、その両面に12μmの銅箔(三井金属鉱業社製、3EC−VLP箔)を重ねて、圧力3MPa、温度220℃で2時間加熱加圧成形し、両面に銅箔を有する金属張積層板を得た。
(4) Fabrication of metal-clad laminate Four layers of the prepreg are stacked, and 12 μm copper foil (3EC-VLP foil manufactured by Mitsui Kinzoku Mining Co., Ltd.) is stacked on both sides, and heated at a pressure of 3 MPa and a temperature of 220 ° C. for 2 hours. A metal-clad laminate having copper foil on both sides was obtained by pressure forming.
(5)プリント配線板の製造
両面に銅箔を有する前記金属張積層板を、ドリル機で開孔し、スルーホールを形成後、無電解メッキで上下銅箔間の導通を図り、両面の銅箔をエッチングすることにより内層回路を両面に形成した。
次に、内層回路に過酸化水素水と硫酸を主成分とする薬液(旭電化工業(株)製、テックSO−G)をスプレー吹き付けすることにより、粗化処理による凹凸形成を行った。
内層回路基板の表裏に、前記で得られた樹脂シートの絶縁層面を内側にして重ね合わせ、これを、真空加圧式ラミネーター装置を用いて、温度100℃、圧力1MPaで真空加熱加圧成形し、その後、熱風乾燥装置にて170℃で60分間加熱硬化を行い、多層プリント配線板を製造した。
前記で得られた多層プリント配線板から基材を剥離し、炭酸レーザー装置を用いてφ60μmの開口部(ブラインド・ビアホール)を形成した。
その後、樹脂残渣(スミア)を除去するため、80℃の膨潤液(アトテックジャパン株式会社製、スウェリングディップ セキュリガント P)に10分間浸漬し、さらに80℃の過マンガン酸カリウム水溶液(アトテックジャパン株式会社製、コンセントレート コンパクト CP)に20分浸漬後、中和して粗化処理を行った。
これを脱脂、触媒付与、活性化の工程を経た後、無電解銅メッキ皮膜を約1μmの給電層を形成した。この給電層表面に、厚さ25μmの紫外線感光性ドライフィルム(旭化成社製、AQ−2558)をホットロールラミネーターにより貼り合わせ、最小線幅/線間が20/20μmのパターンが描画されたクロム蒸着マスク(トウワプロセス社製)を使用して、位置を合わせ、露光装置(ウシオ電機社製UX−1100SM−AJN01)にて露光、炭酸ソーダ水溶液にて現像し、めっきレジストを形成した。
次に、給電層を電極として電解銅めっき(奥野製薬社製81−HL)を3A/dm2、30分間行って、厚さ約25μmの銅配線を形成した。ここで2段階剥離機を用いて、前記めっきレジストを剥離した。各薬液は、1段階目のアルカリ水溶液層にはモノエタノールアミン溶液(三菱ガス化学社製R−100)、2段階目の酸化性樹脂エッチング剤には過マンガン酸カリウムと水酸化ナトリウムを主成分とする水溶液(日本マクダーミッド社製、マキュダイザー9275、9276)、中和には酸性アミン水溶液(日本マクダーミッド社製マキュダイザー9279)をそれぞれ用いた。
そして、給電層を過硫酸アンモニウム水溶液(メルテックス(株)製、AD−485)に浸漬処理することで、エッチング除去し、配線間の絶縁を確保した。次に、絶縁層を温度200℃、時間60分で最終硬化させ、最後に回路表面にソルダーレジスト(太陽インキ社製、PSR4000/AUS308)を形成し、プリント配線板を得た。
(5) Manufacture of printed wiring board The metal-clad laminate having copper foil on both sides is opened with a drill machine, through holes are formed, and then conduction between the upper and lower copper foils is achieved by electroless plating. Inner layer circuits were formed on both sides by etching the foil.
Next, the chemical | medical solution (Asahi Denka Kogyo Co., Ltd. make, Tech SO-G) which has hydrogen peroxide water and a sulfuric acid as a main component was spray-sprayed to the inner layer circuit, and the unevenness | corrugation formation by a roughening process was performed.
On the front and back of the inner layer circuit board, the insulating layer surface of the resin sheet obtained above is overlapped, and this is vacuum-heated and pressure-molded at a temperature of 100 ° C. and a pressure of 1 MPa using a vacuum-pressure laminator device, After that, heat curing was performed at 170 ° C. for 60 minutes with a hot air drying device to produce a multilayer printed wiring board.
The base material was peeled from the multilayer printed wiring board obtained above, and an opening (blind via hole) having a diameter of 60 μm was formed using a carbonic acid laser device.
Then, in order to remove the resin residue (smear), it is immersed for 10 minutes in a swelling solution (Swelling Dip Securigant P, manufactured by Atotech Japan Co., Ltd.) at 80 ° C., and further a potassium permanganate aqueous solution (Atotech Japan Co., Ltd.) at 80 ° C. After immersion for 20 minutes in the company Concentrate Compact CP), neutralization and roughening treatment were performed.
This was subjected to degreasing, catalyst application, and activation steps, and an electroless copper plating film was formed with a power supply layer of about 1 μm. Chromium vapor deposition in which a 25 μm thick UV photosensitive dry film (AQ-2558, manufactured by Asahi Kasei Co., Ltd.) is pasted on the surface of the power feeding layer with a hot roll laminator, and a pattern with a minimum line width / line spacing of 20/20 μm is drawn. The position was adjusted using a mask (manufactured by Towa Process Co., Ltd.), exposure was performed with an exposure apparatus (UX-1100SM-AJN01 manufactured by Ushio Electric Co., Ltd.), and development was performed with an aqueous sodium carbonate solution to form a plating resist.
Next, electrolytic copper plating (81-HL manufactured by Okuno Pharmaceutical Co., Ltd.) was performed at 3 A / dm 2 for 30 minutes using the power feeding layer as an electrode to form a copper wiring having a thickness of about 25 μm. Here, the plating resist was peeled off using a two-stage peeling machine. Each chemical solution is mainly composed of monoethanolamine solution (R-100 manufactured by Mitsubishi Gas Chemical Co., Ltd.) in the first stage alkaline aqueous solution layer, and potassium permanganate and sodium hydroxide as the main ingredients in the second stage oxidizing resin etchant. An aqueous solution of acidic amine (Mc. Dicer 9279, manufactured by Nihon Mcder Mid Co., Ltd.) was used for neutralization.
Then, the power feeding layer was immersed in an ammonium persulfate aqueous solution (AD-485 manufactured by Meltex Co., Ltd.) to remove the etching, and ensure insulation between the wirings. Next, the insulating layer was finally cured at a temperature of 200 ° C. for 60 minutes, and finally a solder resist (manufactured by Taiyo Ink Co., PSR4000 / AUS308) was formed on the circuit surface to obtain a printed wiring board.
(6)半導体装置の製造
半導体装置は、前記前記半導体装置用のプリント配線板上に半田バンプを有する半導体素子(TEGチップ、サイズ15mm×15mm、厚み0.8mm)を、フリップチップボンダー装置により、加熱圧着により搭載し、次に、IRリフロー炉で半田バンプを溶融接合した後、液状封止樹脂(住友ベークライト社製、CRP−4152S)を充填し、液状封止樹脂を硬化させることで得た。尚、液状封止樹脂は、温度150℃、120分の条件で硬化させた。
尚、前記半導体素子の半田バンプは、Sn/Pb組成の共晶で形成されたものを用いた。
(6) Manufacturing of Semiconductor Device A semiconductor device is a semiconductor device (TEG chip, size 15 mm × 15 mm, thickness 0.8 mm) having solder bumps on the printed wiring board for the semiconductor device, using a flip chip bonder device. Obtained by mounting by thermocompression bonding, and then melt-bonding solder bumps in an IR reflow furnace, filling liquid sealing resin (CRP-4152S, manufactured by Sumitomo Bakelite Co., Ltd.), and curing the liquid sealing resin. . The liquid sealing resin was cured at a temperature of 150 ° C. for 120 minutes.
In addition, the solder bump of the said semiconductor element used what was formed with the eutectic of Sn / Pb composition.
(実施例2〜4、比較例1〜2)
表1に示した配合量で実施例1と同様に樹脂ワニス、樹脂シート、プリプレグ、金属張積層板、プリント配線板、半導体装置を得た。
(Examples 2-4, Comparative Examples 1-2)
Resin varnishes, resin sheets, prepregs, metal-clad laminates, printed wiring boards, and semiconductor devices were obtained in the same amounts as in Example 1 with the blending amounts shown in Table 1.
実施例、および比較例を用い得られた結果を表1に示す。なお上記評価項目の内容を以下に示すとおりである。
(1)熱膨張係数
熱膨張係数は、TMA(熱機械的分析)装置(TAインスツルメント社製、Q400)を用いて行った。
上記金属張積層板の金属箔部をエッチング後、裁断し、4mm×20mmの試験片を作製した。
測定は、温度範囲30〜300℃、10℃/分、荷重5gの条件で2サイクル目の50〜100℃における線膨張係数(CTE)を測定した。
各符号は下記の通りである。
◎:15ppm/℃未満
○:15ppm/℃以上20ppm/℃未満
×:20ppm/℃以上
The results obtained using Examples and Comparative Examples are shown in Table 1. The contents of the evaluation items are as shown below.
(1) Thermal expansion coefficient The thermal expansion coefficient was measured using a TMA (thermomechanical analysis) apparatus (TA Instruments, Q400).
The metal foil part of the metal-clad laminate was etched and then cut to prepare a 4 mm × 20 mm test piece.
The measurement was performed by measuring the linear expansion coefficient (CTE) at 50 to 100 ° C. in the second cycle under conditions of a temperature range of 30 to 300 ° C., 10 ° C./min, and a load of 5 g.
Each code is as follows.
◎: Less than 15 ppm / ° C ○: 15 ppm / ° C or more and less than 20 ppm / ° C ×: 20 ppm / ° C or more
・ 表面粗さ
実施例および比較例のプリント配線板製造において、レーザ加工後に樹脂残渣(スミア)除去を行った後の積層体を準備し、樹脂表面を、レーザー顕微鏡(KEYENCE社製、VK−8510、条件;PITCH0.02μm、RUNmodeカラー超深度)にて表面粗さ(Ra)を測定した。
Raは、10点測定し、10点の平均値とした。
各符号は下記の通りである。
◎:Ra0.6μm未満
○:Ra0.6μm以上0.9μm未満
×:Ra0.9μm以上
-Surface roughness In the production of printed wiring boards of Examples and Comparative Examples, a laminate after removing resin residue (smear) after laser processing was prepared, and the resin surface was subjected to laser microscope (manufactured by KEYENCE, VK-8510). Surface roughness (Ra) was measured under the following conditions: PITCH 0.02 μm, RUNmode color ultra-depth.
Ra was measured at 10 points, and an average value of 10 points was obtained.
Each code is as follows.
A: Ra less than 0.6 μm O: Ra 0.6 μm or more and less than 0.9 μm X: Ra 0.9 μm or more
・ めっきピール強度
実施例および比較例のプリント配線板製造において、回路形成するために、めっき銅を形成した後、そのメッキ銅の引き剥がし強度をJIS C-6481に基づいて測定した。
各符号は下記の通りである。
◎:ピール強度0.6kN/m以上
○:ピール強度0.4kN/m以上0.6kN/m未満
×:ピール強度0.4kN/m未満
-Plating peel strength In the printed wiring board manufacture of an Example and a comparative example, in order to form a circuit, after forming plated copper, the peeling strength of the plated copper was measured based on JIS C-6481.
Each code is as follows.
A: Peel strength 0.6 kN / m or more B: Peel strength 0.4 kN / m or more and less than 0.6 kN / m X: Peel strength 0.4 kN / m or less
(4)熱衝撃試験
前記で得られた半導体装置をフロリナート中で−55℃30分、125℃30分を1サイクルとして、1000サイクル処理し、基板又は半導体素子等にクラックが発生していないか確認した。尚、各符号は以下のとおりである。
◎:1000サイクル以上で異常なしの場合
○:500サイクル以上1000サイクル未満でクラック等の異常が発生した場合
△:300サイクル以上、500サイクル未満にクラック等の異常が発生した場合
×:300サイクル未満で等の異常が発生した場合
(4) Thermal shock test The semiconductor device obtained above was processed in Fluorinert for 1000 cycles with -55 ° C for 30 minutes and 125 ° C for 30 minutes as one cycle. confirmed. In addition, each code | symbol is as follows.
◎: When there is no abnormality at 1000 cycles or more ○: When abnormality such as a crack occurs at 500 cycles or more and less than 1000 cycles Δ: When an abnormality such as a crack occurs at 300 cycles or more and less than 500 cycles ×: Less than 300 cycles When an abnormality such as
表1に記載されている評価結果からわかるように、実施例1〜3では各評価項目において良好な結果が得られた。
めっきピール強度についても、実施例は、いずれも高い値が得ら、また実施例は、いずれも表面粗さが小さいことから、細線の導体回路加工に必要な低粗度高密着な材料となっている。また材料の低い熱膨張係数が得られた。
比較例1はポリビニルアセタール樹脂を用いない例であるが、めっきピールが低い結果となった。
比較例2はシリカの粒径が大きい例であるが、粗化処理後の表面粗さが大きくなる結果となった。
As can be seen from the evaluation results described in Table 1, in Examples 1 to 3, good results were obtained for each evaluation item.
As for the plating peel strength, all of the examples obtained high values, and all of the examples had a low surface roughness, and thus became a low-roughness and high-adhesion material necessary for the processing of thin wire conductor circuits. ing. Also, a low coefficient of thermal expansion of the material was obtained.
Although the comparative example 1 is an example which does not use a polyvinyl acetal resin, it resulted in a low plating peel.
Comparative Example 2 is an example in which the particle size of silica is large, but the surface roughness after the roughening treatment was increased.
以下に、本発明の樹脂組成物を用いた作製した樹脂付き銅箔の参考例を示す。 Below, the reference example of the copper foil with resin produced using the resin composition of this invention is shown.
(参考例1)
(1)樹脂付き銅箔の作製
実施例1で用いたワニスを厚さ3μm、キャリア箔18μmの銅箔(日本電解社製YSNAP−3PF)に、コンマコーター装置を用いて乾燥後の厚さが5μmとなるように塗工し、これを160℃の乾燥装置で3分間乾燥し、樹脂付き銅箔を形成した。(2)金属張積層板の作製
プリプレグとして厚さ100μmのEI−6785TS−F(住友ベークライト社製)を4枚重ね、その両面に前記樹脂付き銅箔を重ねて、圧力3MPa、温度220℃で2時間加熱加圧成形し、両面に銅箔を有する金属張積層板を得た。
(3)プリント配線板の作製
前記金属張積層板および実施例1で作製した樹脂シートを用いて、実施例1と同様にプリント配線板を作製した。
(Reference Example 1)
(1) Production of copper foil with resin
The varnish used in Example 1 was applied to a copper foil (YSNAP-3PF manufactured by Nippon Electrolytic Co., Ltd.) having a thickness of 3 μm and a carrier foil of 18 μm using a comma coater so that the thickness after drying would be 5 μm. This was dried for 3 minutes with a drying device at 160 ° C. to form a copper foil with resin. (2) Production of metal-clad laminate 4 layers of EI-6785TS-F (manufactured by Sumitomo Bakelite Co., Ltd.) having a thickness of 100 μm are stacked as a prepreg, and the copper foil with resin is stacked on both sides thereof at a pressure of 3 MPa and a temperature of 220 ° C. Heat-press molding was performed for 2 hours to obtain a metal-clad laminate having copper foil on both sides.
(3) Production of Printed Wiring Board Using the metal-clad laminate and the resin sheet produced in Example 1, a printed wiring board was produced in the same manner as in Example 1.
(参考例2)
プリプレグとして100μm厚みのEI−6785GS(住友ベークライト社製)を用いた以外は参考例1と同様にワニス、プライマー付き銅箔、樹脂シート、金属張積層板、プリント配線板、半導体装置を作製した。
(Reference Example 2)
A varnish, a primer-attached copper foil, a resin sheet, a metal-clad laminate, a printed wiring board, and a semiconductor device were prepared in the same manner as in Reference Example 1 except that EI-6785GS (manufactured by Sumitomo Bakelite Co., Ltd.) having a thickness of 100 μm was used as the prepreg.
(参考例3)
(1)プリプレグの作製
(A)エポキシ樹脂としてエポキシ樹脂B:ビフェニルアラルキル型ノボラックエポキシ樹脂(日本化薬社製NC−3000)11重量部、ビスマレイミド化合物(ケイ・アイ化成工業社製BMI−70)20重量部、硬化剤として4,4'−ジアミノジフェニルメタンを3.5重量部、無機充填材として水酸化アルミニウム(昭和電工社製HP360)65重量部をジメチルアセトアミドとメチルエチルケトンの混合溶媒で30分攪拌し、溶解させた。さらに、カップリング剤としてエポキシシランカップリング剤(越化学工業社製KBM403)0.5重量部添加して、高速攪拌装置を用いて10分攪拌し、固形分35%の樹脂ワニスを調製した。
次に得られた樹脂ワニスを実施例1同様にしてプリプレグを得た。
(2)金属張積層板、プリント配線板の作製
前記で得られたプリプレグを用いた以外は、参考例1と同様にして金属張積層板、およびプリント配線板を得た。
(Reference Example 3)
(1) Preparation of prepreg (A) Epoxy resin B as an epoxy resin: 11 parts by weight of biphenylaralkyl type novolac epoxy resin (NC-3000 manufactured by Nippon Kayaku Co., Ltd.), bismaleimide compound (BMI-70 manufactured by Kay Kasei Kogyo Co., Ltd.) ) 20 parts by weight, 3.5 parts by weight of 4,4′-diaminodiphenylmethane as a curing agent, and 65 parts by weight of aluminum hydroxide (HP360 manufactured by Showa Denko KK) as an inorganic filler in a mixed solvent of dimethylacetamide and methyl ethyl ketone for 30 minutes Stir and dissolve. Furthermore, 0.5 part by weight of an epoxy silane coupling agent (KBM403 manufactured by Koshi Chemical Industry Co., Ltd.) was added as a coupling agent, and the mixture was stirred for 10 minutes using a high-speed stirring device to prepare a resin varnish having a solid content of 35%.
Next, the obtained resin varnish was obtained in the same manner as in Example 1 to obtain a prepreg.
(2) Production of metal-clad laminate and printed wiring board A metal-clad laminate and a printed wiring board were obtained in the same manner as in Reference Example 1 except that the prepreg obtained above was used.
(参考例4)
銅はくとして、厚さ3μmの銅箔(日本電解社製、YSNAP−3B)を用いた以外は参考例1と金属張積層板、プリント配線板を作製した。
(Reference Example 4)
Reference Example 1, a metal-clad laminate, and a printed wiring board were prepared except that a copper foil having a thickness of 3 μm (manufactured by Nippon Electrolytic Co., Ltd., YSNAP-3B) was used as the copper foil.
(参考例5)
銅はくとして、厚さ3μmの銅箔(日本電解社製、YSNAP−3B)を用いた以外は参考例2と同様に金属張積層板、プリント配線板、半導体装置を作製した。
(Reference Example 5)
A metal-clad laminate, a printed wiring board, and a semiconductor device were produced in the same manner as in Reference Example 2 except that a 3 μm thick copper foil (manufactured by Nippon Electrolytic Co., Ltd., YSNAP-3B) was used as the copper foil.
上記で得られた参考例1〜5の金属張積層板、プリント配線板を用いて、以下の評価を行った。 The following evaluation was performed using the metal-clad laminates and printed wiring boards of Reference Examples 1 to 5 obtained above.
(評価1)熱膨張係数
熱膨張係数は、TMA(熱機械的分析)装置(TAインスツルメント社製、Q400)を用いておこなった。
前記参考例1〜5で得られ金属張積層板の金属箔部をエッチング後、裁断し、4mm×20mmの試験片を作製した。
測定は、温度範囲30〜300℃、10℃/分、荷重5gの条件で2サイクル目の50〜100℃における線膨張係数(CTE)を測定した。
各符号は下記の通りである。
A:7ppm/℃未満
B:7ppm/℃以上
(Evaluation 1) Thermal expansion coefficient The thermal expansion coefficient was measured using a TMA (thermomechanical analysis) device (TA Instruments, Q400).
The metal foil part of the metal-clad laminate obtained in Reference Examples 1 to 5 was etched and then cut to prepare a 4 mm × 20 mm test piece.
The measurement was performed by measuring the linear expansion coefficient (CTE) at 50 to 100 ° C. in the second cycle under conditions of a temperature range of 30 to 300 ° C., 10 ° C./min, and a load of 5 g.
Each code is as follows.
A: Less than 7 ppm / ° C. B: 7 ppm / ° C. or more
(評価2)耐熱性試験
耐熱性試験は、前記参考例1〜5で得られたプリント配線板を用い行った。
前記プリント配線板を、JEDEC J−STD−020Bに準拠し、鉛フローのリフロー条件にてリフロー処理を30回行った。
各符号は以下のとおりである。
◎:30回実施後膨れ等の異常が無かった場合
○:15回実施後膨れ等の異常が無かった場合
△:3回実施後膨れ等の異常が無かった場合
×:3回以内に膨れ等の異常があった場合
(Evaluation 2) Heat resistance test The heat resistance test was performed using the printed wiring boards obtained in Reference Examples 1 to 5.
The printed wiring board was subjected to reflow treatment 30 times under the reflow conditions of lead flow in accordance with JEDEC J-STD-020B.
Each code | symbol is as follows.
◎: When there is no abnormality such as bulge after 30 times ○: When there is no abnormality such as bulge after 15 times △: When there is no abnormality such as bulge after 3 times ×: Bulge within 3 times If there is an abnormality
上記参考例1〜5の評価結果を表2に示す。 The evaluation results of Reference Examples 1 to 5 are shown in Table 2.
参考例1〜3は樹脂付き銅箔の樹脂に本発明の樹脂組成物を用いた例であるが、いずれも耐熱性に優れる結果が得られた。参考例4および参考例5は樹脂付き銅箔を用いず銅箔を用いる例であるが、金属張積層板の樹脂と内層銅箔との密着が低下したために耐熱試験において膨れが生じる結果となった。
特に参考例4のような、導体回路である銅やソルダーレジストと比較して、熱膨張係数の低い金属張積層板を用いた場合において、樹脂付き銅箔を用いることで密着性が向上し、また加工時に発生する応力が緩和するため、大きな耐熱性向上効果が得られたと推察する。
Reference Examples 1 to 3 are examples in which the resin composition of the present invention was used for the resin-coated copper foil resin, and all of the results were excellent in heat resistance. Reference Example 4 and Reference Example 5 are examples in which a copper foil is used instead of a resin-coated copper foil, but the adhesion between the resin of the metal-clad laminate and the inner layer copper foil is reduced, resulting in swelling in the heat resistance test. It was.
Especially when using a metal-clad laminate with a low thermal expansion coefficient compared to copper or solder resist, which is a conductor circuit, as in Reference Example 4, the adhesion is improved by using a copper foil with resin, In addition, since the stress generated during processing is relaxed, it is assumed that a large heat resistance improvement effect was obtained.
1…基材
2…含浸槽
3…樹脂ワニス
4…ディップロール
5…スクイズロール
6…乾燥機
7…プリプレグ
8…上部ロール
10…絶縁樹脂層付き金属箔
11…金属箔
12…絶縁樹脂層
20…基材
30…絶縁樹脂層付き高分子フィルムシート
31…高分子フィルムシート
32…絶縁樹脂層
40…プリプレグ
41…金属箔付きプリプレグ
42…高分子フィルムシート付きプリプレグ
51…金属張積層板
52…金属張積層板
DESCRIPTION OF SYMBOLS 1 ... Base material 2 ... Impregnation tank 3 ... Resin varnish 4 ... Dip roll 5 ... Squeeze roll 6 ... Dryer 7 ... Prepreg 8 ... Upper roll 10 ... Metal foil with an insulating resin layer 11 ... Metal foil 12 ... Insulating resin layer 20 ... Base material 30 ... polymer film sheet with insulating resin layer 31 ... polymer film sheet 32 ... insulating resin layer 40 ... prepreg 41 ... prepreg with metal foil 42 ... prepreg with polymer film sheet 51 ... metal-clad laminate 52 ... metal-clad Laminated board
Claims (9)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011017697A JP2012158645A (en) | 2011-01-31 | 2011-01-31 | Epoxy resin composition for printed wiring board, prepreg, metal-clad laminate, resin sheet, printed wiring board, and semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011017697A JP2012158645A (en) | 2011-01-31 | 2011-01-31 | Epoxy resin composition for printed wiring board, prepreg, metal-clad laminate, resin sheet, printed wiring board, and semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2012158645A true JP2012158645A (en) | 2012-08-23 |
Family
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011017697A Pending JP2012158645A (en) | 2011-01-31 | 2011-01-31 | Epoxy resin composition for printed wiring board, prepreg, metal-clad laminate, resin sheet, printed wiring board, and semiconductor device |
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| Country | Link |
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| JP (1) | JP2012158645A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11453940B2 (en) | 2015-07-17 | 2022-09-27 | Toppan Printing Co., Ltd. | Metal mask substrate for vapor deposition, metal mask for vapor deposition, production method for metal mask substrate for vapor deposition, and production method for metal mask for vapor deposition |
| US11706968B2 (en) | 2015-07-17 | 2023-07-18 | Toppan Printing Co., Ltd. | Metal mask base, metal mask and method for producing metal mask |
| US11746423B2 (en) | 2015-07-17 | 2023-09-05 | Toppan Printing Co., Ltd. | Method for producing base for metal masks, method for producing metal mask for vapor deposition, base for metal masks, and metal mask for vapor deposition |
-
2011
- 2011-01-31 JP JP2011017697A patent/JP2012158645A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11453940B2 (en) | 2015-07-17 | 2022-09-27 | Toppan Printing Co., Ltd. | Metal mask substrate for vapor deposition, metal mask for vapor deposition, production method for metal mask substrate for vapor deposition, and production method for metal mask for vapor deposition |
| US11706968B2 (en) | 2015-07-17 | 2023-07-18 | Toppan Printing Co., Ltd. | Metal mask base, metal mask and method for producing metal mask |
| US11746423B2 (en) | 2015-07-17 | 2023-09-05 | Toppan Printing Co., Ltd. | Method for producing base for metal masks, method for producing metal mask for vapor deposition, base for metal masks, and metal mask for vapor deposition |
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