JP2012033298A - 荷電粒子線放射装置 - Google Patents
荷電粒子線放射装置 Download PDFInfo
- Publication number
- JP2012033298A JP2012033298A JP2010169967A JP2010169967A JP2012033298A JP 2012033298 A JP2012033298 A JP 2012033298A JP 2010169967 A JP2010169967 A JP 2010169967A JP 2010169967 A JP2010169967 A JP 2010169967A JP 2012033298 A JP2012033298 A JP 2012033298A
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- Japan
- Prior art keywords
- insulator
- conductive insulator
- electron
- accelerating tube
- electron gun
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/484—Eliminating deleterious effects due to thermal effects, electrical or magnetic fields; Preventing unwanted emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/073—Electron guns using field emission, photo emission, or secondary emission electron sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/48—Electron guns
- H01J29/488—Schematic arrangements of the electrodes for beam forming; Place and form of the elecrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
- H01J3/027—Construction of the gun or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/40—Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electrons; Arrangements for velocity or mass selection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/248—Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/03—Mounting, supporting, spacing or insulating electrodes
- H01J2237/038—Insulating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
- H01J2237/06325—Cold-cathode sources
- H01J2237/06341—Field emission
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/08—Ion sources
- H01J2237/0802—Field ionization sources
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J3/00—Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
- H01J3/02—Electron guns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
【解決手段】導電性碍子加速管の内面に円周状の溝を数段設け、溝の内部に沿って金属をメタライズする。加速管表面の特定の部分の抵抗が周囲と違う場合でも、加速管内面のメタライズ領域の電位は一定になるので、加速管内面の垂直方向電位分布を、円周方向によらずほぼ同一に保つことができる。この結果、中心軸上を通過する電子線に横方向の力が働かないとともに、電位勾配もほぼ一定に保つことができ収差を小さくすることが可能である。
【選択図】 図1
Description
V0−V2
で表される。このとき、各段間のブリーダ抵抗11が同一の場合、各段間電圧は
(V0−V2)/5
と等しくなる。よって、加速管内の電位勾配の変化が小さくなる。この結果、加速管構造をとることにより静電レンズ効果の影響を小さくしたまま、電子線を加速することができる。
2 加速管
3 引出電極
4 電子線
5 制御電極
6 絶縁体碍子
7 導電性碍子
8 金属メタライズ領域
9 導体金属
10 加速電極
11 ブリーダ抵抗
12 抵抗が大きい領域
13,14 金属部材
Claims (3)
- 電子ビームを放出するチップ部を備えた電子源と、
当該電子源の下部に設けられた接地電極と、
当該接地電極上に固定され、前記電子ビームの軌道を囲むように配置された円柱状の導電性碍子と、
前記円柱状の導電性碍子の内部に配置され、前記電子源から電子ビームを引出すための引出電圧が印加される引出電極と、
前記導電性碍子の上部に設けられ、前記引出電圧を前記引出電極に印加するための導電性部材とを備え、
前記円柱状の導電性碍子は、内壁面にメタライズ領域が形成されていることを特徴とする電子銃。 - 請求項1に記載の電子銃において、
前記導電性部材と前記円柱状の導電性碍子との間であって、前記電子ビームの軌道を囲むように配置された円柱状の絶縁性碍子と、
前記円柱状の絶縁性碍子と円柱状の導電性碍子とにより構成される空間であって、前記引出電極の下部に配置された制御電極とを備えることを特徴とする電子銃。 - 請求項1または2に記載の電子銃において、
前記メタライズ領域は、前記円柱状の導電性碍子の内壁面に形成された複数の溝であることを特徴とする電子銃。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010169967A JP5023199B2 (ja) | 2010-07-29 | 2010-07-29 | 荷電粒子線放射装置 |
| DE112011102526T DE112011102526T5 (de) | 2010-07-29 | 2011-06-15 | Strahlvorrichtung für einen Strahl geladener Teilchen |
| PCT/JP2011/003394 WO2012014370A1 (ja) | 2010-07-29 | 2011-06-15 | 荷電粒子線放射装置 |
| US13/812,700 US8803411B2 (en) | 2010-07-29 | 2011-06-15 | Charged particle beam radiation apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010169967A JP5023199B2 (ja) | 2010-07-29 | 2010-07-29 | 荷電粒子線放射装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012033298A true JP2012033298A (ja) | 2012-02-16 |
| JP5023199B2 JP5023199B2 (ja) | 2012-09-12 |
Family
ID=45529609
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010169967A Expired - Fee Related JP5023199B2 (ja) | 2010-07-29 | 2010-07-29 | 荷電粒子線放射装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8803411B2 (ja) |
| JP (1) | JP5023199B2 (ja) |
| DE (1) | DE112011102526T5 (ja) |
| WO (1) | WO2012014370A1 (ja) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016117628A1 (ja) * | 2015-01-23 | 2016-07-28 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置、及び荷電粒子線装置用部材の製造方法 |
| JP2017126404A (ja) * | 2016-01-12 | 2017-07-20 | 株式会社荏原製作所 | 検査装置及び高圧基準管の製造方法 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102598195B (zh) * | 2009-09-18 | 2015-09-16 | Fei公司 | 分布式离子源加速镜筒 |
| JP5959326B2 (ja) * | 2012-06-11 | 2016-08-02 | 株式会社日立ハイテクノロジーズ | 荷電粒子ビーム発生装置、荷電粒子線装置、高電圧発生装置、および高電位装置 |
| CN103068142A (zh) * | 2012-12-26 | 2013-04-24 | 江苏达胜加速器制造有限公司 | 一种中间电极及应用该中间电极的加速管 |
| US9006689B2 (en) * | 2013-03-26 | 2015-04-14 | Ion Technology Solutions, Llc | Source bushing shielding |
| DE112014006978B4 (de) * | 2014-10-20 | 2022-01-27 | Hitachi High-Tech Corporation | Rasterelektronenmikroskop |
| DE102016214750A1 (de) * | 2016-05-19 | 2017-11-23 | Siemens Aktiengesellschaft | Verfahren zur Herstellung eines keramischen Isolators |
| DE102018200593B4 (de) * | 2018-01-15 | 2019-08-08 | Carl Zeiss Microscopy Gmbh | Steckverbindungseinheit, Teilchenstrahlerzeuger mit einer Steckverbindungseinheit sowie Teilchenstrahlgerät mit einem Teilchenstrahlerzeuger |
| JP7564357B2 (ja) | 2021-05-21 | 2024-10-08 | 株式会社日立ハイテク | 粒子加速用構造体および荷電粒子ビーム装置 |
| DE102022114212A1 (de) | 2021-06-09 | 2022-12-15 | Electronics And Telecommunications Research Institute | Hochspannungs-Ansteuervorrichtung |
| KR102689054B1 (ko) * | 2021-06-09 | 2024-07-29 | 한국전자통신연구원 | 고전압 구동 장치 |
| US11830699B2 (en) * | 2021-07-06 | 2023-11-28 | Kla Corporation | Cold-field-emitter electron gun with self-cleaning extractor using reversed e-beam current |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08222160A (ja) * | 1995-02-17 | 1996-08-30 | Kyocera Corp | 加速管 |
| JP2010015818A (ja) * | 2008-07-03 | 2010-01-21 | Hitachi High-Technologies Corp | 電子源装置及びイオン装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3631282A (en) * | 1969-01-23 | 1971-12-28 | Nat Electrostatics Corp | Accelerating tube with heating means |
| JPH0630235B2 (ja) * | 1985-06-11 | 1994-04-20 | 浜松ホトニクス株式会社 | 高時間分解電子顕微鏡装置 |
| DE60011031T2 (de) * | 2000-02-01 | 2005-06-23 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Optische Säule für Teilchenstrahlvorrichtung |
| JP4576437B2 (ja) | 2008-02-18 | 2010-11-10 | 株式会社日立ハイテクノロジーズ | 荷電粒子加速装置 |
| JP5141321B2 (ja) | 2008-03-18 | 2013-02-13 | 富士通セミコンダクター株式会社 | 半導体装置の製造方法 |
-
2010
- 2010-07-29 JP JP2010169967A patent/JP5023199B2/ja not_active Expired - Fee Related
-
2011
- 2011-06-15 DE DE112011102526T patent/DE112011102526T5/de not_active Ceased
- 2011-06-15 WO PCT/JP2011/003394 patent/WO2012014370A1/ja not_active Ceased
- 2011-06-15 US US13/812,700 patent/US8803411B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08222160A (ja) * | 1995-02-17 | 1996-08-30 | Kyocera Corp | 加速管 |
| JP2010015818A (ja) * | 2008-07-03 | 2010-01-21 | Hitachi High-Technologies Corp | 電子源装置及びイオン装置 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016117628A1 (ja) * | 2015-01-23 | 2016-07-28 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置、及び荷電粒子線装置用部材の製造方法 |
| WO2016117099A1 (ja) * | 2015-01-23 | 2016-07-28 | 株式会社 日立ハイテクノロジーズ | 荷電粒子線装置、荷電粒子線装置用光学素子、及び、荷電粒子線装置用部材の製造方法 |
| JPWO2016117628A1 (ja) * | 2015-01-23 | 2017-11-02 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置、及び荷電粒子線装置用部材の製造方法 |
| US10170273B2 (en) | 2015-01-23 | 2019-01-01 | Hitachi High-Technologies Corporation | Charged particle beam device, and method of manufacturing component for charged particle beam device |
| JP2017126404A (ja) * | 2016-01-12 | 2017-07-20 | 株式会社荏原製作所 | 検査装置及び高圧基準管の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US8803411B2 (en) | 2014-08-12 |
| US20130140977A1 (en) | 2013-06-06 |
| JP5023199B2 (ja) | 2012-09-12 |
| WO2012014370A1 (ja) | 2012-02-02 |
| DE112011102526T5 (de) | 2013-07-11 |
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