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JP2011186088A - Method for manufacturing liquid crystal display device - Google Patents

Method for manufacturing liquid crystal display device Download PDF

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JP2011186088A
JP2011186088A JP2010049881A JP2010049881A JP2011186088A JP 2011186088 A JP2011186088 A JP 2011186088A JP 2010049881 A JP2010049881 A JP 2010049881A JP 2010049881 A JP2010049881 A JP 2010049881A JP 2011186088 A JP2011186088 A JP 2011186088A
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liquid crystal
shield layer
crystal display
potential
display device
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Masao Nanbu
正夫 南部
Hideaki Usui
英明 碓井
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Seiko Instruments Inc
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Seiko Instruments Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection method for determining a connection state between a shield layer and a product GND layer in a liquid crystal display device of a lateral electric field system. <P>SOLUTION: A shield layer 9 and a GND terminal 10 are connected to a determination circuit 13 to obtain a divided voltage potential. By determining whether the divided voltage potential is within the scope between an upper limit standard and a lower limit standard set by the determination circuit 13, it is inspected whether the resistance value between the shield layer 9 and the GND terminal is within the scope of a proper connection state. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、シールド層と製品GNDが接続された横電界方式TFT液晶表示装置の製造方法に関する。   The present invention relates to a method of manufacturing a lateral electric field type TFT liquid crystal display device in which a shield layer and a product GND are connected.

液晶表示装置は、薄型テレビ、携帯電話、などの表示機能として広く使用されている。中でも特に携帯電話などは、携帯機器の軽量化、薄型化に伴い、液晶表示装置の表示面が、外部からの静電気の影響を受けやすくなってきている。   A liquid crystal display device is widely used as a display function for a flat-screen TV, a mobile phone, and the like. In particular, mobile phones and the like are becoming more susceptible to the influence of external static electricity on the display surface of liquid crystal display devices as the mobile devices become lighter and thinner.

液晶表示装置には、TFT基板側の画素電極とカラーフィルタ基板側の対向電極との間に液晶層を挟み、TFT基板とカラーフィルタ基板間の縦方向で電界を発生させるTN方式、VA方式、MVA方式などが挙げられる。TN方式、VA方式では斜めから見ると画像がネガポジ反転しやすいという欠点があり、この欠点を解決したのが、MVA方式であるが、MVA方式では画素内に、表示部として機能しない配向制御エリアを設置する必要があり、透過率、開口率が低くなるといった欠点がある。   In a liquid crystal display device, a TN method, a VA method, which generates an electric field in a vertical direction between a TFT substrate and a color filter substrate by sandwiching a liquid crystal layer between a pixel electrode on the TFT substrate side and a counter electrode on the color filter substrate side, MVA method etc. are mentioned. The TN method and VA method have the disadvantage that the image is easily negative-positive-inverted when viewed from an oblique direction. The MVA method has solved this drawback, but the MVA method does not function as a display unit in the pixel. There is a disadvantage that the transmittance and the aperture ratio become low.

これらの欠点を解決するために、水平配列された液晶に対して横方向に電界を発生させるIPS方式やFFS方式といった横電界方式TFT液晶を用いた液晶表示装置も多く実用化されている。横電界方式TFT液晶を用いた液晶表示装置は、櫛歯形状の画素電極と、この画素電極との間で電界を発生させる共通電極とが設けられた電極基板と、対向基板との間に液晶が挟持された構成となっている。   In order to solve these drawbacks, many liquid crystal display devices using a lateral electric field type TFT liquid crystal such as an IPS method or an FFS method for generating an electric field in a horizontal direction with respect to horizontally arranged liquid crystals have been put into practical use. A liquid crystal display device using a lateral electric field type TFT liquid crystal has a liquid crystal between an electrode substrate provided with a comb-like pixel electrode and a common electrode for generating an electric field between the pixel electrode and a counter substrate. Is sandwiched.

横電界方式の液晶表示装置では、電極が設けられていない対向基板に外部からの静電気等により電荷が帯電すると、電極が設けられた基板と対向基板との間に不要な電界が発生する。この不要な電界は、液晶に含まれる液晶分子の配向を乱すため、液晶表示装置は適切な表示ができなくなってしまう。   In a horizontal electric field type liquid crystal display device, when an electric charge is applied to an opposing substrate on which an electrode is not provided due to external static electricity or the like, an unnecessary electric field is generated between the substrate on which an electrode is provided and the opposing substrate. This unnecessary electric field disturbs the alignment of the liquid crystal molecules contained in the liquid crystal, so that the liquid crystal display device cannot perform proper display.

そこで、電極が設けられていない対向基板の表面に、電気的にシールドを行う層(以降、シールド層と称す)を形成し、液晶表示パネルを不要な電界の影響から保護する方法が知られている。   Therefore, a method is known in which an electrically shielded layer (hereinafter referred to as a shield layer) is formed on the surface of the counter substrate on which no electrode is provided to protect the liquid crystal display panel from the influence of unnecessary electric fields. Yes.

横電界方式の液晶表示装置では、液晶の配合特性が乱れるためガラスから形成される基板の内面にシールド層を設けることが出来ない。そのため、基板の表面にシールド層をITOなどの材料により形成する方法が一般的に用いられている。また、このシールド層と、基板に実装された外部回路に設けられたGND端子とを電気的に接続させることで、シールド層の静電気をGNDへ放電し、液晶表示装置の表示品位を安定させる工夫がされてきている。   In a horizontal electric field type liquid crystal display device, a blending characteristic of liquid crystal is disturbed, so that a shield layer cannot be provided on the inner surface of a substrate formed of glass. Therefore, a method of forming a shield layer on the surface of the substrate with a material such as ITO is generally used. In addition, by electrically connecting the shield layer and a GND terminal provided in an external circuit mounted on the board, the static electricity of the shield layer is discharged to GND, and the display quality of the liquid crystal display device is stabilized. Has been done.

ここでシールド層とGND端子とが確実に導通しているか否かを判定するために、シールド層とGND端子の夫々にプローブを接触させ、シールド層に接触させたプローブから電流を流し、GND端子に接触させたプローブにより当該電流を検出する方法が知られている。(例えば、特許文献1参照。)   Here, in order to determine whether or not the shield layer and the GND terminal are reliably conducted, a probe is brought into contact with each of the shield layer and the GND terminal, and a current is passed from the probe brought into contact with the shield layer. A method is known in which the current is detected by a probe brought into contact with. (For example, refer to Patent Document 1.)

特開2009-20272号公報JP 2009-20272 A

しかしながら、シールド層とGND端子間に電流を流して判定する方法では、接続回路に電流が流れたかどうかのみが確認され、断線や接続不良など接続回路の接続状態については確認することができなかった。   However, in the method of judging by passing a current between the shield layer and the GND terminal, it was confirmed only whether the current flowed in the connection circuit, and the connection state of the connection circuit such as disconnection or connection failure could not be confirmed. .

そこで本発明の液晶表示装置の製造方法では、対向基板の表面に形成されたシールド層と、基板と接続する外部回路に設けられたGND端子とを、それぞれ判定回路に接続し、シールド層とGND端子間の分圧電位を求める。そして、判定回路により分圧電位の上限電位と下限電位を設定し、分圧電位がこれら上限電位と下限電位の範囲内であるかを判定する。シールド層とGND端子間の接続状況を表す抵抗値に異常がある場合は、この分圧電位にも異常が検出されるため、シールド層とGND端子間が適正に接続されているかどうか検査できる。   Therefore, in the method of manufacturing the liquid crystal display device of the present invention, the shield layer formed on the surface of the counter substrate and the GND terminal provided in the external circuit connected to the substrate are connected to the determination circuit, respectively, and the shield layer and the GND are connected. Obtain the divided potential between the terminals. Then, an upper limit potential and a lower limit potential of the divided potential are set by the determination circuit, and it is determined whether the divided potential is within the range between the upper limit potential and the lower limit potential. If there is an abnormality in the resistance value indicating the connection state between the shield layer and the GND terminal, an abnormality is also detected in this divided potential, so that it is possible to check whether the shield layer and the GND terminal are properly connected.

シールド層とGND端子間で電気的に接続が取れているか否かだけでなく、接続状態が適正であるか否かを判断する事が出来る。   It is possible to determine not only whether the shield layer and the GND terminal are electrically connected, but also whether the connection state is appropriate.

本発明の液晶表示装置の製造方法を説明する図である。It is a figure explaining the manufacturing method of the liquid crystal display device of this invention. 本発明の液晶表示装置の構造を模式的に示す断面図である。It is sectional drawing which shows the structure of the liquid crystal display device of this invention typically. 本発明の液晶表示装置の製造方法に用いる判定回路を示す図である。It is a figure which shows the determination circuit used for the manufacturing method of the liquid crystal display device of this invention.

本発明の液晶表示装置の製造方法では、基板に接続された外部回路のGND端子と対向基板の表面に形成されたシールド層とが電気的に接続されており、シールド層とGND端子とが適正な接続状態であるかどうかが検査される。この接続状態は、シールド層とGND端子との間の抵抗値が正常な接続時の範囲にあるかどうかで確認することができるが、この抵抗値の異常は、シールド層とGND端子間の分圧電位の異常を検出することでも確認できる。そのため、本発明の製造方法では、シールド層とGND端子とを判定回路の接続端子にそれぞれ接続し、抵抗分圧によってシールド層とGND端子間の電位(以下、分圧電位と称す)を求めて検査する。   In the manufacturing method of the liquid crystal display device of the present invention, the GND terminal of the external circuit connected to the substrate and the shield layer formed on the surface of the counter substrate are electrically connected, and the shield layer and the GND terminal are appropriate. It is checked whether the connection is correct. This connection state can be confirmed by checking whether or not the resistance value between the shield layer and the GND terminal is within a normal connection range. It can also be confirmed by detecting an abnormality in the barometric potential. Therefore, in the manufacturing method of the present invention, the shield layer and the GND terminal are respectively connected to the connection terminal of the determination circuit, and a potential between the shield layer and the GND terminal (hereinafter referred to as a divided potential) is obtained by resistance voltage division. inspect.

また、判定回路では、規格となる上限電位と下限電位が設定され、分圧電位がそれぞれの規格の範囲にあるかどうかが判定される。このようにして、シールド層とGND端子の間の抵抗値が適正な接続状態の範囲内かを検査することができる。   In the determination circuit, an upper limit potential and a lower limit potential that are standards are set, and it is determined whether or not the divided potential is within the range of each standard. In this way, it can be inspected whether the resistance value between the shield layer and the GND terminal is within a proper connection state range.

また、正常な接続時におけるシールド層とGND端子との間の抵抗値は、使用されている材料などから数オームから数百キロオームまでの範囲とされる。   In addition, the resistance value between the shield layer and the GND terminal at the time of normal connection is in a range from several ohms to several hundreds of kilohms depending on materials used.

本実施例の液晶表示装置の製造方法について図を用いて説明する。
図2は本発明の液晶表示装置1を模式的に示す断面図である。まず、基板5と対向基板4の間に液晶(図示しない)が挟持された液晶表示パネルが形成される。なお、本実施例の液晶表示パネルには横電界方式のTFT液晶が用いられる。対向基板4の表面には、ITO等の透光性を備える導電性のシールド層9が、スパッタリングやスピンコートによって形成される。このとき、シールド層9は、液晶表示パネルの画素領域に形成されている。また、基板4の表面の端子部には、駆動用のIC7と、FPC等の回路基板8が実装される。駆動用のIC7は、ACFを用いてフリップチップ実装(COG実装)されてもよい。また、回路基板8は、ACFを用いてFOG実装されてもよい。
A manufacturing method of the liquid crystal display device of this embodiment will be described with reference to the drawings.
FIG. 2 is a cross-sectional view schematically showing the liquid crystal display device 1 of the present invention. First, a liquid crystal display panel in which liquid crystal (not shown) is sandwiched between the substrate 5 and the counter substrate 4 is formed. Note that a horizontal electric field type TFT liquid crystal is used for the liquid crystal display panel of this embodiment. On the surface of the counter substrate 4, a conductive shield layer 9 having translucency such as ITO is formed by sputtering or spin coating. At this time, the shield layer 9 is formed in the pixel region of the liquid crystal display panel. A driving IC 7 and a circuit board 8 such as an FPC are mounted on the terminal portion on the surface of the board 4. The driving IC 7 may be flip-chip mounted (COG mounted) using ACF. Further, the circuit board 8 may be FOG-mounted using ACF.

さらに、基板5の裏面には下偏光板6が、対向基板4の表面には、シールド層9を介して上偏光板3が形成される。ここで上偏光板3は、シールド層9よりもサイズが小さく、液晶表示パネルの表示領域に形成される。そのため、図1に示すように、液晶表示パネルの外周にシールド層9が露出している。   Further, the lower polarizing plate 6 is formed on the back surface of the substrate 5, and the upper polarizing plate 3 is formed on the surface of the counter substrate 4 via the shield layer 9. Here, the upper polarizing plate 3 is smaller than the shield layer 9 and is formed in the display area of the liquid crystal display panel. Therefore, as shown in FIG. 1, the shield layer 9 is exposed on the outer periphery of the liquid crystal display panel.

ここで、露出したシールド層9の表面と対向基板5の表面にわたって、部分的に銀ペーストやカーボン等の導電性ペースト2を設ける。これにより、回路基板8に設けられたGND端子10とシールド層9とを電気的に接続することができ、シールド層9に帯電した外部からの静電気をGND端子10へ放電させることができる。   Here, a conductive paste 2 such as silver paste or carbon is partially provided over the exposed surface of the shield layer 9 and the surface of the counter substrate 5. Thereby, the GND terminal 10 provided on the circuit board 8 and the shield layer 9 can be electrically connected, and external static electricity charged in the shield layer 9 can be discharged to the GND terminal 10.

次に、シールド層9と回路基板8に設けられたGND端子10との接続状態について検査をおこなう。検査には判定回路13を用いる。   Next, the connection state between the shield layer 9 and the GND terminal 10 provided on the circuit board 8 is inspected. The determination circuit 13 is used for the inspection.

まず、図1に示すように、測定される液晶表示装置1のシールド層9に判定回路13の第2接続端子12を、GND端子10に第1接続端子11を接触させる。第1接続端子11と第2接続端子12には、プローブ針を用いることができる。そして、第1接続端子11と第2接続端子12の間で生成される、液晶表示素子10の接続端子間抵抗値RLが、正常範囲内であるかどうかを判定回路13を用いて検査する。   First, as shown in FIG. 1, the second connection terminal 12 of the determination circuit 13 is brought into contact with the shield layer 9 of the liquid crystal display device 1 to be measured, and the first connection terminal 11 is brought into contact with the GND terminal 10. Probe needles can be used for the first connection terminal 11 and the second connection terminal 12. Then, the determination circuit 13 is used to check whether or not the resistance value RL between the connection terminals of the liquid crystal display element 10 generated between the first connection terminal 11 and the second connection terminal 12 is within a normal range.

次に判定の方法について図3を用いて詳しく説明する。図3は本実施例の判定回路13の構成を示す図である。まず、基準電源14の電圧を、分圧用抵抗15の抵抗値と、第1接続端子と第2接続端子の間の抵抗値(以下、接続端子間抵抗値RLと称す)とによって抵抗分圧する。本実施例では、基準電源14は、精度的に調整され5V電圧に設定される。またGND端子10と接触させる第2接続端子12の電位は、判定回路側GND16の電位と共通とする。また、本実施例では、分圧用抵抗15の値を1MΩとする。ここで、シールド層9に接触される接続端子11に発生する分圧電位は、判定回路13の基準電源14の5V電圧と、分圧用抵抗15の1MΩと、液晶表示素子10の接続端子間抵抗値RLから5V×RLΩ/(1MΩ+RLΩ)となる。   Next, the determination method will be described in detail with reference to FIG. FIG. 3 is a diagram showing the configuration of the determination circuit 13 of this embodiment. First, the voltage of the reference power supply 14 is divided by a resistance value of the voltage dividing resistor 15 and a resistance value between the first connection terminal and the second connection terminal (hereinafter referred to as a connection terminal resistance value RL). In this embodiment, the reference power supply 14 is accurately adjusted and set to a 5V voltage. Further, the potential of the second connection terminal 12 brought into contact with the GND terminal 10 is made common with the potential of the determination circuit side GND 16. In this embodiment, the value of the voltage dividing resistor 15 is 1 MΩ. Here, the divided potential generated at the connection terminal 11 in contact with the shield layer 9 includes the 5V voltage of the reference power supply 14 of the determination circuit 13, 1 MΩ of the voltage dividing resistor 15, and the resistance between the connection terminals of the liquid crystal display element 10. From the value RL, it becomes 5V × RLΩ / (1MΩ + RLΩ).

本実施例では、シールド層9とGND端子10との接続状態が良好な場合には、接続端子間抵抗値RLは、50KΩ〜2MΩ程度であり、この値が現状の規格(正常範囲)となる。しかし、製品の配線が断線している場合や接続不良、素子不良で抵抗値に異常がある場合などは、接続端子間抵抗RLは異常値が示される。この接続端子間抵抗RLの異常は、分圧電位の異常としても検出される。そのため、分圧電位が規格の範囲内にあるかどうかを判定する。上限および下限の規格値は、接続状態が良好な場合の接続端子間抵抗値RLを用いて求めることができる。   In this embodiment, when the connection state between the shield layer 9 and the GND terminal 10 is good, the resistance value RL between the connection terminals is about 50 KΩ to 2 MΩ, and this value is the current standard (normal range). . However, when the wiring of the product is disconnected, or when the resistance value is abnormal due to connection failure or element failure, the connection terminal resistance RL shows an abnormal value. This abnormality of the connection terminal resistance RL is also detected as an abnormality of the divided potential. Therefore, it is determined whether the divided potential is within the standard range. The upper limit and the lower limit standard values can be obtained using the resistance value RL between the connection terminals when the connection state is good.

分圧電位は上限規格側と下限規格側とでそれぞれ判定される。判定回路13では、任意に設けられた可変抵抗により分圧電位の規格とされる上限電位と下限電位が設定される。図示するように上限側可変抵抗17で設定された上限電位については、上限判定コンパレータ19が判定し、下限側可変抵抗18で設定された下限電位については下限判定コンパレータ20が判定する。   The divided potential is determined on the upper limit side and the lower limit side. In the determination circuit 13, an upper limit potential and a lower limit potential that are standard for the divided potential are set by a variable resistor provided arbitrarily. As shown in the drawing, the upper limit determination comparator 19 determines the upper limit potential set by the upper limit variable resistor 17, and the lower limit determination comparator 20 determines the lower limit potential set by the lower limit variable resistor 18.

このようにコンパレータ回路と接続されることにより、分圧電位が上限及び下限規格内の場合には、各コンパレータの出力はHighレベル(5V)となる。分圧電位が上限規格を超えた場合、上限判定コンパレータ19の出力はLowレベル(0V)となる。また、分圧電位が下限規格に満たなかった場合、下限判定コンパレータ20の出力はLowレベル(0V)となる。すなわち分圧電位が正常範囲なら各コンパレータ出力は共にHighとなり、統合判定用ゲート21であるANDゲートから出力される判定結果24はHighとなる。そして、LED電流制限抵抗22によって規定された電流値がLED23に流れ、LED23が点灯するため、目視判定により接続状態が良好であることがわかる。   By being connected to the comparator circuit in this way, when the divided potential is within the upper limit and lower limit standards, the output of each comparator becomes High level (5 V). When the divided potential exceeds the upper limit specification, the output of the upper limit determination comparator 19 becomes a low level (0 V). When the divided potential does not satisfy the lower limit standard, the output of the lower limit determination comparator 20 is at a low level (0 V). That is, if the divided potential is in the normal range, both comparator outputs are High, and the determination result 24 output from the AND gate that is the integrated determination gate 21 is High. And since the electric current value prescribed | regulated by LED current limiting resistance 22 flows into LED23 and LED23 lights, it turns out that a connection state is favorable by visual determination.

これに対し、分圧電位が異常値の場合、上限判定コンパレータ19または下限判定コンパレータ20のいずれか一方の出力がLowとなる。そのため統合判定用ゲート21であるANDゲートから出力される判定結果24はLowとなる。この場合、LED23は点灯せず、目視判定により接続状態が不良であることがわかる。   On the other hand, when the divided potential is an abnormal value, the output of either the upper limit determination comparator 19 or the lower limit determination comparator 20 is Low. Therefore, the determination result 24 output from the AND gate that is the integrated determination gate 21 is Low. In this case, the LED 23 is not turned on, and it can be seen from the visual determination that the connection state is poor.

また、判定結果24を別の表示検査装置などに取り込み、目視判定だけでなく自動的に不良検出してもよい。   Further, the determination result 24 may be taken into another display inspection device or the like, and not only visual determination but also automatic defect detection may be performed.

なお判定回路の接続端子にはプローブ針の代わりに導電ゴム、導電シート、ジッパーチューブを用いても良い。このような材料から構成される接続端子を用いることにより、偏光板や液晶パネル基板に傷がつくのを防ぐことができる。   Note that conductive rubber, a conductive sheet, or a zipper tube may be used instead of the probe needle for the connection terminal of the determination circuit. By using the connection terminal made of such a material, it is possible to prevent the polarizing plate and the liquid crystal panel substrate from being damaged.

また、シールド層とGND端子間は、金属またはカーボン等の導電性材料により構成されたテープにより接続されてもよい。   Further, the shield layer and the GND terminal may be connected by a tape made of a conductive material such as metal or carbon.

1 液晶表示装置
2 導電性ペースト
3 上偏光板
4 対向基板
5 基板
6 下偏光版
7 IC
8 回路基板
9 シールド層
10 GND端子
11 第1接続端子
12 第2接続端子
13 判定回路
14 基準電源
15 分圧用抵抗
16 判定回路側GND
17 上限側可変抵抗
18 下限側可変抵抗
19 上限判定コンパレータ
20 下限判定コンパレータ
21 統合判定用ゲート
22 LED電流制限抵抗
23 LED
24 判定結果
DESCRIPTION OF SYMBOLS 1 Liquid crystal display device 2 Conductive paste 3 Upper polarizing plate 4 Opposite substrate 5 Substrate 6 Lower polarizing plate 7 IC
8 Circuit board 9 Shield layer 10 GND terminal 11 First connection terminal 12 Second connection terminal 13 Judgment circuit 14 Reference power supply 15 Resistance for voltage division 16 Judgment circuit side GND
17 Upper Limit Variable Resistor 18 Lower Limit Variable Resistor 19 Upper Limit Determination Comparator 20 Lower Limit Determination Comparator 21 Integrated Determination Gate 22 LED Current Limiting Resistor 23 LED
24 judgment results

Claims (3)

基板に接続された外部回路のGND端子と、対向基板の表面に形成されたシールド層とが電気的に接続された横電界方式の液晶表示装置の製造方法において、
前記シールド層と前記GND端子とを判定回路に接続し、前記シールド層と前記GND端子間の分圧電位が規格範囲内か否かを判定することにより、前記シールド層と前記GND端子の接続状態を検査する液晶表示装置の製造方法。
In a method of manufacturing a lateral electric field type liquid crystal display device in which a GND terminal of an external circuit connected to a substrate and a shield layer formed on the surface of a counter substrate are electrically connected.
A connection state between the shield layer and the GND terminal by connecting the shield layer and the GND terminal to a determination circuit and determining whether a divided potential between the shield layer and the GND terminal is within a standard range. Of manufacturing a liquid crystal display device.
前記シールド層が前記判定回路の第1接続端子に、前記GND端子が前記判定回路の第2接続端子に接続され、
前記第2接続端子の電位は、前記判定回路のGNDの電位と共通であるとともに、
前記分圧電位が、前記判定回路の基準電源の電圧を分圧用抵抗と、前記第1接続端子と前記第2接続端子の間の抵抗で抵抗分圧した電位であることを特徴とする請求項1に記載の液晶表示装置の製造方法。
The shield layer is connected to a first connection terminal of the determination circuit, and the GND terminal is connected to a second connection terminal of the determination circuit;
The potential of the second connection terminal is common to the GND potential of the determination circuit, and
The divided voltage potential is a voltage obtained by dividing a voltage of a reference power source of the determination circuit with a voltage dividing resistor and a resistance between the first connection terminal and the second connection terminal. 2. A method for producing a liquid crystal display device according to 1.
前記判定回路では可変抵抗により上限電位と下限電位が設定され、
前記分圧電位が、前記上限電位と前記下限電位の範囲か否かを判定されることを特徴とする請求項1または2に記載の液晶表示装置の製造方法。
In the determination circuit, an upper limit potential and a lower limit potential are set by a variable resistor,
3. The method of manufacturing a liquid crystal display device according to claim 1, wherein it is determined whether the divided potential is in a range between the upper limit potential and the lower limit potential.
JP2010049881A 2010-03-05 2010-03-05 Method for manufacturing liquid crystal display device Pending JP2011186088A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010049881A JP2011186088A (en) 2010-03-05 2010-03-05 Method for manufacturing liquid crystal display device

Publications (1)

Publication Number Publication Date
JP2011186088A true JP2011186088A (en) 2011-09-22

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Country Link
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014240934A (en) * 2013-06-12 2014-12-25 三菱電機株式会社 Liquid crystal display device and inspection method of liquid crystal display device
US9823527B2 (en) 2014-02-27 2017-11-21 Mitsubishi Electric Corporation Liquid crystal display
CN108700787A (en) * 2016-03-01 2018-10-23 夏普株式会社 The inspection method of display device and display device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014240934A (en) * 2013-06-12 2014-12-25 三菱電機株式会社 Liquid crystal display device and inspection method of liquid crystal display device
US9823527B2 (en) 2014-02-27 2017-11-21 Mitsubishi Electric Corporation Liquid crystal display
CN108700787A (en) * 2016-03-01 2018-10-23 夏普株式会社 The inspection method of display device and display device

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