[go: up one dir, main page]

JP2010282151A - Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus - Google Patents

Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus Download PDF

Info

Publication number
JP2010282151A
JP2010282151A JP2009137585A JP2009137585A JP2010282151A JP 2010282151 A JP2010282151 A JP 2010282151A JP 2009137585 A JP2009137585 A JP 2009137585A JP 2009137585 A JP2009137585 A JP 2009137585A JP 2010282151 A JP2010282151 A JP 2010282151A
Authority
JP
Japan
Prior art keywords
optical element
eccentricity
lens
amount
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009137585A
Other languages
Japanese (ja)
Other versions
JP5222796B2 (en
Inventor
Hei Son
萍 孫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Priority to JP2009137585A priority Critical patent/JP5222796B2/en
Priority to CN201010200107.2A priority patent/CN101907758B/en
Priority to KR1020100053640A priority patent/KR101299509B1/en
Publication of JP2010282151A publication Critical patent/JP2010282151A/en
Application granted granted Critical
Publication of JP5222796B2 publication Critical patent/JP5222796B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0221Testing optical properties by determining the optical axis or position of lenses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Lens Barrels (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)

Abstract

【課題】被検光学素子組体が、複数枚の光学素子を共軸に配置したものである場合に、光学素子の偏芯量の測定、偏芯の調整および光学素子の組立てを、系全体として、高精度かつ効率的に行なうことができるようにする。
【解決手段】最も測定光入射側に位置する第1レンズのみをセットする(S1)。次に、第1レンズの偏芯量を測定し(S2)、その測定値に基づき、第1レンズの位置調整量を算出する(S3)。次に、この偏芯量が0に近づくように、第1のレンズの偏芯を調整し(S4)、再び、第1レンズの偏芯量を測定し(S5)、閾値以下となっているかを判断する(S6)。閾値より大きい場合はステップ3に戻るが、閾値以下の場合は第1レンズをレンズ鏡筒61の内部に接着保持する(S7)。この後、セットすべき次のレンズの有無を判断し(S8)、次のレンズがあれば、そのレンズについて上記ステップ1〜7の処理を繰り返す。
【選択図】図1
When a test optical element assembly is formed by coaxially arranging a plurality of optical elements, measurement of the eccentricity of the optical element, adjustment of the eccentricity, and assembly of the optical element are performed in the entire system. As a result, it can be performed with high accuracy and efficiency.
Only the first lens located closest to the measurement light incident side is set (S1). Next, the eccentric amount of the first lens is measured (S2), and the position adjustment amount of the first lens is calculated based on the measured value (S3). Next, the eccentricity of the first lens is adjusted so that the eccentricity approaches 0 (S4), and the eccentricity of the first lens is measured again (S5), and is the threshold value or less? Is determined (S6). If it is larger than the threshold value, the process returns to step 3. If it is equal to or smaller than the threshold value, the first lens is adhered and held inside the lens barrel 61 (S7). Thereafter, it is determined whether or not there is a next lens to be set (S8), and if there is a next lens, the processes of steps 1 to 7 are repeated for that lens.
[Selection] Figure 1

Description

本発明は、組レンズ等の光学素子の被検面に対し、測定光を照射して形成される指標像の座標データに基づき、被検光学素子の偏芯量を測定し、該偏芯を調整しつつ被検光学素子組体を組み立てる、光学素子の偏芯調整組立方法および偏芯調整組立装置に関する。   The present invention measures the decentering amount of the test optical element based on the coordinate data of the index image formed by irradiating the test light of the optical element such as a combined lens with the measurement light, The present invention relates to an optical element eccentricity adjustment assembly method and an eccentricity adjustment assembly apparatus for assembling a test optical element assembly while adjusting.

従来より、レンズを用いた装置を製造する工程においては、各レンズの偏芯量を測定し、この測定値に基づき偏芯を軽減するようにしてレンズをレンズ枠(レンズ鏡筒)内に保持せしめる手法が知られている。そのうち、レンズの偏芯量を測定する方法としては、オートコリメーション法と称される測定手法を適用したものが知られている(下記特許文献1〜3参照)。   Conventionally, in the process of manufacturing a device using a lens, the amount of eccentricity of each lens is measured, and the lens is held in a lens frame (lens barrel) so as to reduce the eccentricity based on the measured value. The method of damaging is known. Among them, as a method for measuring the amount of eccentricity of a lens, a method using a measurement technique called an autocollimation method is known (see Patent Documents 1 to 3 below).

これらの偏芯量測定方法では、被検光学素子を所定の軸回りに回転させながら、所定形状の指標パターンを投影する測定光を被検面に照射し、被検面からの反射光または透過光により形成される指標像を撮像面上に結像させる。この指標像は、被検面の回転位置毎に撮像されて、その像中心点の座標が回転位置毎に求められる。この回転位置毎に撮像された指標像の各像中心点は、被検面が偏芯していると、撮像面に対し設定された座標系において1つの円に沿うように分布するので、その分布状況から被検面の偏芯量を求めることができる。   In these eccentricity measurement methods, the test surface is irradiated with measurement light that projects an index pattern of a predetermined shape while rotating the test optical element about a predetermined axis, and reflected or transmitted from the test surface. An index image formed by light is formed on the imaging surface. This index image is picked up for each rotation position of the test surface, and the coordinates of the image center point are obtained for each rotation position. When the test surface is decentered, each image center point of the index image imaged at each rotational position is distributed along one circle in the coordinate system set for the imaging surface. The amount of eccentricity of the test surface can be obtained from the distribution status.

具体的には、各像中心点にフィッティングする円(以下「近似円」と称する)を求めてその中心を測定基準点として設定し、この測定基準点から任意の像中心点までの距離や近似円の半径を、被検面の偏芯量として求めることができる。   Specifically, a circle to be fitted to each image center point (hereinafter referred to as “approximate circle”) is obtained and the center is set as a measurement reference point, and the distance or approximation from this measurement reference point to any image center point is approximated. The radius of the circle can be obtained as the amount of eccentricity of the test surface.

また、被検レンズの偏芯量は、その表裏各面について求めた上記円の中心点同士の距離に基づいて算出される。
このような手法を用いて被検レンズの偏芯量を測定し、この測定値に基づき、偏芯量が0となるように、被検レンズの位置を調整する処理がなされることになる。
Further, the decentering amount of the lens to be examined is calculated based on the distance between the center points of the circle obtained for the front and back surfaces.
Using such a method, the decentering amount of the test lens is measured, and based on this measurement value, a process for adjusting the position of the test lens so that the decentering amount becomes zero is performed.

特開2005−55202号公報JP-A-2005-55202 特開2007−17431号公報JP 2007-17431 A 特開2007−327771号公報JP 2007-327771 A

ところで、上記手法では、被検レンズが単レンズとされた場合について説明したものであるが、種々のレンズ系においては、複数枚のレンズを共軸に配置した、組レンズタイプのものも知られている。しかし、これらの組レンズにおいて、各レンズ毎に、レンズの偏芯量の測定、偏芯の調整およびレンズの組立てをどのように進めていけば、高精度かつ効率的であるか、という点については、明確な手法が確立されていなかった。   By the way, in the above method, the case where the test lens is a single lens has been described. However, in various lens systems, there are also known a combination lens type in which a plurality of lenses are arranged coaxially. ing. However, in these assembled lenses, for each lens, how to proceed with the measurement of the amount of eccentricity of the lens, the adjustment of the eccentricity, and the assembly of the lens, so that it is highly accurate and efficient. No clear method has been established.

本発明は、このような事情に鑑みなされたものであり、被検光学素子が、複数枚の光学素子を共軸に配置したものである場合に、光学素子の偏芯量の測定、偏芯の調整および光学素子の組立てを、系全体として、高精度かつ効率的に行なうことができる光学素子の偏芯調整組立方法および偏芯調整組立装置を提供することを目的とする。   The present invention has been made in view of such circumstances, and in the case where the optical element to be tested is a structure in which a plurality of optical elements are arranged coaxially, the measurement of the eccentricity of the optical element, the eccentricity It is an object of the present invention to provide an optical element eccentricity adjustment assembly method and an eccentricity adjustment assembly apparatus capable of performing the above adjustment and optical element assembly as a whole system with high accuracy and efficiency.

本発明に係る光学素子の偏芯調整組立方法は、
複数個の光学素子が鏡筒内で共軸上に配列されてなる被検光学素子組体において、該光学素子各々の偏芯量を測定し、この偏芯量を調整しつつ該被検光学素子組体の組立てを行なう光学素子の偏芯調整組立方法であって、
まず、前記被検光学素子組体を構成すべき各光学素子のうち、配列方向のいずれか一方の端部に配されるべき第1の光学素子のみを、前記共軸上に配置し、この第1の光学素子における偏芯量を測定し、この測定値に基づいて該第1の光学素子における偏芯量が小さくなるように該第1の光学素子の設定位置を調整し、この調整された位置で、該第1の光学素子を鏡筒に保持せしめ、
続いて、該第1の光学素子に対し、前記測定光の入射側とは反対側に隣接して配されるべき第2の光学素子を前記共軸上に配置し、この第2の光学素子における偏芯量を測定し、この測定値に基づいてこの第2の光学素子における偏芯量が小さくなるように該第2の光学素子の設定位置を調整し、この調整された位置で、該第2の光学素子を鏡筒に保持せしめ、
以後、同様にして、前記測定光の入射側とは反対側に隣接して配されるべき光学素子に対し、順次、前記偏芯量を測定するとともに前記設定位置を調整して鏡筒に保持せしめることを特徴とするものである。
An optical element eccentricity adjustment assembly method according to the present invention includes:
In a test optical element assembly in which a plurality of optical elements are arranged on the same axis in a lens barrel, the decentering amount of each optical element is measured, and the test optical is adjusted while adjusting the decentering amount. An optical element eccentricity adjustment assembly method for assembling an element assembly,
First, among the optical elements that are to constitute the test optical element assembly, only the first optical element that is to be disposed at one end in the arrangement direction is disposed on the coaxial axis, The amount of eccentricity in the first optical element is measured, and the setting position of the first optical element is adjusted based on this measured value so that the amount of eccentricity in the first optical element is reduced. Holding the first optical element on the lens barrel at the position
Subsequently, a second optical element to be disposed adjacent to the first optical element on the side opposite to the incident side of the measurement light is disposed on the coaxial axis, and the second optical element Is measured, and the setting position of the second optical element is adjusted so that the eccentricity amount of the second optical element is reduced based on the measured value. At the adjusted position, Hold the second optical element in the lens barrel,
Thereafter, in the same manner, for the optical element to be arranged adjacent to the side opposite to the measurement light incident side, the eccentricity is sequentially measured and the set position is adjusted and held in the lens barrel. It is characterized by damaging.

また、前記偏芯量の測定は、所定の指標パターンを投影する測定光を被検面に照射し、該被検面からの反射光または透過光により撮像面上に形成される指標像を、前記被検面を所定の軸回りに回転させながら、相異なる少なくとも3つの回転位置毎または互いに180度離れた2つの回転位置毎に撮像し、該回転位置毎に撮像された各指標像の像中心点の座標を、前記撮像面に対し設定された座標系においてそれぞれ特定し、この特定された各像中心点の座標データに基づき、前記被検面の偏芯量を測定することにより行われることが好ましい。   Further, the measurement of the amount of eccentricity is performed by irradiating the surface to be measured with measurement light that projects a predetermined index pattern, and an index image formed on the imaging surface by reflected light or transmitted light from the surface to be measured. While rotating the test surface around a predetermined axis, images are taken at at least three different rotational positions or two rotational positions that are 180 degrees apart from each other, and each index image is imaged at each rotational position. The coordinates of the center point are specified in the coordinate system set for the imaging surface, and the eccentricity of the test surface is measured based on the coordinate data of each specified image center point. It is preferable.

また、前記光学素子の偏芯量の測定は、前記光学素子の表裏面の各々について、前記所定の各回転角毎の前記指標の像を通る円を特定し、特定された該円の中心点の座標を求め、
この後、求められた、前記光学素子の表裏面の各々についての前記円の中心点の座標の差を算出し、この算出された値を前記光学素子の偏芯量とすることが好ましい。
Further, the measurement of the amount of eccentricity of the optical element is performed by specifying a circle that passes through the index image for each predetermined rotation angle for each of the front and back surfaces of the optical element, and the center point of the specified circle Find the coordinates of
After that, it is preferable to calculate the difference between the coordinates of the center point of the circle for each of the front and back surfaces of the optical element, and use the calculated value as the eccentric amount of the optical element.

一方、本発明に係る光学素子の偏芯調整組立装置は、
複数個の光学素子が鏡筒内で共軸上に配列されてなる被検光学素子組体において、該光学素子各々の偏芯量を測定し、この偏芯量を調整しつつ該被検光学素子組体の組立てを行なう光学素子の偏芯調整組立装置であって、
前記被検光学素子組体を構成すべき各光学素子を、前記測定光の入射側から順次、前記共軸上に配置する光学素子配置手段と、
前記共軸上に前記光学素子が配置される度に、当該配置された前記光学素子の偏芯量を前記測定光を用いて測定する偏芯量測定手段と、
この測定の結果に応じて、当該光学素子における偏芯量が小さくなるように当該光学素子の設定位置を調整する設定位置調整手段と、
この調整された位置で、当該光学素子を鏡筒に保持せしめる光学素子保持手段と、
を備えてなることを特徴とするものである。
On the other hand, an eccentricity adjustment assembly device for an optical element according to the present invention includes:
In a test optical element assembly in which a plurality of optical elements are arranged on the same axis in a lens barrel, the decentering amount of each optical element is measured, and the test optical is adjusted while adjusting the decentering amount. An optical element eccentricity adjustment assembly apparatus for assembling an element assembly,
Optical element arrangement means for arranging each optical element that should constitute the test optical element assembly on the same axis sequentially from the incident side of the measurement light;
Eccentricity measuring means for measuring the eccentricity of the optical element arranged using the measuring light every time the optical element is arranged on the coaxial axis,
In accordance with the result of this measurement, setting position adjusting means for adjusting the setting position of the optical element so that the amount of eccentricity in the optical element is small;
Optical element holding means for holding the optical element in the lens barrel at the adjusted position;
It is characterized by comprising.

また、前記光学素子配置手段は、前記光学素子の各々を搬送する光学素子吸着手段を備えていることが好ましい。   Moreover, it is preferable that the said optical element arrangement | positioning means is equipped with the optical element adsorption | suction means which conveys each of the said optical element.

また、前記光学素子配置手段は、前記光学素子の周囲に配され、この光学素子の偏芯量を調整すべく、当該光学素子の側面を微小量だけ押圧するピエゾ素子を複数個備えていることが好ましい。   Further, the optical element arranging means includes a plurality of piezoelectric elements that are arranged around the optical element and press the side surface of the optical element by a minute amount in order to adjust the eccentric amount of the optical element. Is preferred.

さらに、前記複数個のピエゾ素子が、同一の光学素子に対し、協働して調整する組をなすものであり、前記複数個の光学素子の各々について、順次、偏芯量を調整し得るように、前記ピエゾ素子を該光学素子の各々に対応した位置に移動せしめるPZT移動手段を備えており、該PZT移動手段は、前記ピエゾ素子を前記光学素子の配列方向に移動させるPZT上下方向移動手段、および前記ピエゾ素子を前記光学素子の径方向に出し入れする操作を行うPZT水平方向移動手段とを備えていることが好ましい。   Further, the plurality of piezo elements form a set for co-adjustment with respect to the same optical element, and the amount of eccentricity can be sequentially adjusted for each of the plurality of optical elements. PZT moving means for moving the piezo element to a position corresponding to each of the optical elements, and the PZT moving means moves the piezo element in the arrangement direction of the optical elements. And a PZT horizontal direction moving means for performing an operation of moving the piezoelectric element in and out of the optical element in the radial direction.

本発明に係る光学素子の偏芯調整組立方法においては、被検光学素子組体を構成すべき各光学素子のうち、光学素子配列方向のいずれか一方の端部に配されるべき第1の光学素子のみを、前記共軸上に配置し、この第1の光学素子における偏芯量を測定し、この測定値に基づいてこの第1の光学素子における偏芯量が小さくなるように該第1の光学素子の設定位置を調整し、この調整された位置で、該第1の光学素子を鏡筒に保持せしめ、続いて、該第1の光学素子に対し、前記測定光の入射側とは反対側に隣接して配されるべき第2の光学素子を前記共軸上に配置し、この第2の光学素子における偏芯量を測定し、この測定値に基づいてこの第2の光学素子における偏芯量が小さくなるように該第2の光学素子の設定位置を調整し、この調整された位置で、該第2の光学素子を鏡筒に保持せしめ、以後、同様にして、前記測定光の入射側とは反対側に隣接して配されるべき光学素子に対し、順次、前記偏芯量を測定するとともに前記設定位置を調整して鏡筒に保持せしめるようにしている。   In the optical element eccentricity adjusting and assembling method according to the present invention, the first optical element to be arranged at one end in the optical element arrangement direction among the optical elements to constitute the test optical element assembly. Only the optical element is placed on the same axis, the amount of eccentricity in the first optical element is measured, and the amount of eccentricity in the first optical element is reduced based on the measured value. The set position of the first optical element is adjusted, and at this adjusted position, the first optical element is held in the lens barrel. Subsequently, the measurement light is incident on the first optical element. Arranges the second optical element to be arranged adjacent to the opposite side on the same axis, measures the amount of eccentricity in the second optical element, and based on the measured value, the second optical element Adjust the setting position of the second optical element so that the amount of eccentricity in the element is small. Then, the second optical element is held in the lens barrel at the position, and thereafter, in the same manner, sequentially with respect to the optical elements to be arranged adjacent to the side opposite to the measurement light incident side, The eccentricity is measured and the set position is adjusted and held in the lens barrel.

したがって、各光学素子は、測定光の入射側から順に偏芯量を調整されつつ鏡筒に保持されていくことになるため、例えば、第2の光学素子における偏芯量を測定する際には、既に保持されている第1の光学素子の偏芯量を考慮せずとも良く、このときに測定された偏芯量は、第2の光学素子に起因するものとして扱うことができる。同様に、この後、偏芯量が測定される光学素子は、それまでに調整、保持された光学素子の偏芯量の影響を何ら考慮することなく、当該光学素子のみの偏芯量とすることができる。   Accordingly, each optical element is held in the lens barrel while the eccentric amount is adjusted in order from the incident side of the measurement light. For example, when measuring the eccentric amount in the second optical element, The decentering amount of the first optical element that is already held does not have to be taken into account, and the decentering amount measured at this time can be treated as being caused by the second optical element. Similarly, the optical element whose eccentricity is measured thereafter is the eccentricity of only the optical element without considering the influence of the eccentricity of the optical element that has been adjusted and held so far. be able to.

したがって、組立対象が、複数枚の光学素子を共軸に配置した被検光学素子組体である場合に、光学素子の偏芯量の測定、偏芯の調整および光学素子の組立てを、系全体として、高精度かつ効率的に行なうことができる。   Therefore, when the assembly target is a test optical element assembly in which a plurality of optical elements are coaxially arranged, the measurement of the eccentricity of the optical element, the adjustment of the eccentricity, and the assembly of the optical element are performed. Can be performed with high accuracy and efficiency.

また、本発明に係る光学素子の偏芯調整組立装置においては、被検光学素子組体を構成すべき各光学素子を、測定光の入射側から順次共軸上に配置する光学素子配置手段と、前記共軸上に前記光学素子が配置される度に、当該配置された前記光学素子の偏芯量を前記測定光を用いて測定する偏芯量測定手段と、この測定の結果に応じて、当該光学素子における偏芯量が小さくなるように当該光学素子の設定位置を調整する設定位置調整手段と、この調整された位置で、当該光学素子を鏡筒に保持せしめる光学素子保持手段と、を備えている。したがって、組立対象が、複数枚の光学素子を共軸に配置した被検光学素子組体である場合に、光学素子の偏芯量の測定、偏芯の調整および光学素子の組立てを、系全体として、高精度かつ効率的に行なうことができる。   Further, in the optical element eccentricity adjustment assembly apparatus according to the present invention, the optical element disposing means for sequentially disposing each optical element to be included in the optical element assembly to be tested on the coaxial side from the measurement light incident side; Each time the optical element is arranged on the coaxial axis, an eccentricity measuring means for measuring the eccentricity of the optical element arranged using the measuring light, and depending on the result of the measurement A setting position adjusting unit that adjusts a setting position of the optical element so that an eccentricity amount in the optical element is small; an optical element holding unit that holds the optical element in a lens barrel at the adjusted position; It has. Therefore, when the assembly target is a test optical element assembly in which a plurality of optical elements are coaxially arranged, the measurement of the eccentricity of the optical element, the adjustment of the eccentricity, and the assembly of the optical element are performed. Can be performed with high accuracy and efficiency.

本発明の一実施形態に係る光学素子の偏芯調整組立方法の手順を示すフローチャートである。It is a flowchart which shows the procedure of the eccentricity adjustment assembly method of the optical element which concerns on one Embodiment of this invention. 図1に示す偏芯調整組立方法に用いられる偏芯調整組立装置を説明するための概略図である。It is the schematic for demonstrating the eccentric adjustment assembly apparatus used for the eccentric adjustment assembly method shown in FIG. 図1に示す実施形態方法において偏芯調整操作を行うための手法を説明するための概略図((A)は2点調整法、(B)は3点調整法)である。FIG. 2 is a schematic diagram for explaining a technique for performing an eccentricity adjustment operation in the method shown in FIG. 1 ((A) is a two-point adjustment method, and (B) is a three-point adjustment method). 図1に示す実施形態方法の要部を説明するための概略図(下方からの測定)である。It is the schematic (measurement from the downward direction) for demonstrating the principal part of embodiment method shown in FIG. 図1に示す実施形態方法の要部を説明するための概略図(上方からの測定)である。It is the schematic for demonstrating the principal part of embodiment method shown in FIG. 1 (measurement from upper direction). 本実施形態装置のPZT移動手段を説明するための概念図である。It is a conceptual diagram for demonstrating the PZT moving means of this embodiment apparatus. 上方からの測定を行う、偏芯調整組立装置を示す概略図である。It is the schematic which shows the eccentric adjustment assembly apparatus which performs the measurement from upper direction.

以下、本発明に係る実施形態について、図面を参照しながら詳細に説明する。図2は本発明の一実施形態に係る光学素子の偏芯調整組立方法に用いる装置の概略構成図である。   Hereinafter, embodiments according to the present invention will be described in detail with reference to the drawings. FIG. 2 is a schematic configuration diagram of an apparatus used for an optical element eccentricity adjustment assembly method according to an embodiment of the present invention.

すなわち、この偏芯調整組立装置1は、被検レンズ組体5の各被検レンズの偏芯量を測定し、その測定された偏芯量が略0となるように調整し、この状態で測定ヘッド10と、被検レンズ組体5を回転可能に保持する基台20と、偏芯量を算出するための各種演算等を行う解析演算部30と、測定ヘッド10を図中上下方向に移動可能に保持するZ軸ステージ40とを備えてなる。   That is, the decentering adjustment assembly apparatus 1 measures the decentering amount of each test lens of the test lens assembly 5 and adjusts so that the measured decentering amount becomes substantially zero. The measurement head 10, the base 20 that rotatably holds the lens assembly 5, the analysis calculation unit 30 that performs various calculations for calculating the amount of eccentricity, and the measurement head 10 in the vertical direction in the figure. And a Z-axis stage 40 that is movably held.

上記測定ヘッド10は、上記被検レンズ組体5に照射される光束を出力する光源11と、光源11から出力された光束を通過させる、例えば十字形状のスリット(以下「レチクル」と称する)を有するレチクル板12と、レチクル板12からの光束を図中上方に向けて反射するビームスプリッタ13と、入射された光束を平行光束とするコリメータレンズ14と、平行光束を光収束点Fに収束せしめる対物レンズ15と、CCDやCMOS等の撮像素子16を搭載した撮像カメラ17とを備えている。   The measuring head 10 includes a light source 11 that outputs a light beam irradiated on the lens assembly 5 and a slit (for example, a “reticle” hereinafter) that passes the light beam output from the light source 11. A reticle plate 12 having a beam splitter 13 for reflecting the light beam from the reticle plate 12 upward in the figure, a collimator lens 14 for converting the incident light beam into a parallel light beam, and converging the parallel light beam to a light convergence point F. An objective lens 15 and an imaging camera 17 equipped with an imaging element 16 such as a CCD or CMOS are provided.

一方、上記被検レンズ組体5は、2枚のレンズ51,52を鏡筒53内に保持してなり(本実施形態においては、説明の便宜のため、組体5が2枚のレンズからなる場合について説明するが、組体5が3枚以上のレンズからなる場合についても同様に処理可能である)、該レンズ51,52の各レンズ面51a,51b,52a,52bのうち、レンズ52の図中下側のレンズ面52aの焦点面(レンズ面52aの焦点(近軸の曲率中心)Cが位置する面;図示略)が、レンズ51の図中下側のレンズ面51aよりも図中下方に位置するように構成されている。 On the other hand, the lens assembly 5 has two lenses 51 and 52 held in a lens barrel 53 (in this embodiment, for convenience of explanation, the assembly 5 is made up of two lenses. However, among the lens surfaces 51 a, 51 b, 52 a, 52 b of the lenses 51, 52, the lens 52 can be processed in the same manner. the focal plane of the lower side in the figure of the lens surface 52a of (the focal point of the lens surface 52a (the surface located curvature center) C 3 paraxial; not shown), than the lens surface 51a in the figure of the lower lens 51 It is comprised so that it may be located below in the figure.

上記基台20は、上記被検レンズ組体5が載置される載置部材21と、この載置部材21を支持するXY軸ステージ22および回転ステージ23とを備えてなる。XY軸ステージ22は、載置部材21に載置された被検レンズ組体5と測定ヘッド10との位置調整を行う際に用いられるものであり、載置部材21に載置された被検レンズ組体5を、該被検レンズ組体5の光軸Lと垂直な方向に移動し得るように構成されている。また、回転ステージ23は、載置部材21に載置された被検レンズ組体5を、図示した回転軸Eを中心として回転させ得るように構成されている。また、XY軸ステージ22および回転ステージ23の各中央部には載置部材21に続く貫通孔が穿設されており、この貫通孔により測定ヘッド10と被検レンズ51、52との間の光束の入出射が可能とされている。   The base 20 includes a mounting member 21 on which the test lens assembly 5 is mounted, and an XY axis stage 22 and a rotary stage 23 that support the mounting member 21. The XY axis stage 22 is used when the position of the test lens assembly 5 placed on the placement member 21 and the measurement head 10 is adjusted, and the test placed on the placement member 21. The lens assembly 5 is configured to be movable in a direction perpendicular to the optical axis L of the lens assembly 5 to be tested. The rotation stage 23 is configured to rotate the lens assembly 5 placed on the placement member 21 around the rotation axis E shown in the figure. In addition, a through hole is formed in each central portion of the XY axis stage 22 and the rotary stage 23 following the mounting member 21, and the light flux between the measuring head 10 and the test lenses 51 and 52 is transmitted through the through hole. Can enter and exit.

また、上記解析演算部30は、測定の際に撮像された各画像の解析等を行う、コンピュータ等からなる解析装置31と、解析結果や各画像等を表示する画像表示装置32と、解析装置31に対する各種入力を行うための入力装置33とを備えてなる。   The analysis calculation unit 30 includes an analysis device 31 configured by a computer or the like for analyzing each image captured at the time of measurement, an image display device 32 for displaying an analysis result, each image, and the like, and an analysis device. And an input device 33 for performing various inputs to 31.

また、被検レンズ組体5を構成する各被検レンズ51、52は、鏡胴53内で、順次共軸上に配されるが、この各被検レンズ51、52の搬送および設置は自動装置によって行なわれるように構成することが好ましい。このような場合において、自動装置が、例えばフレキシブルな吸盤によってレンズ表面を真空吸着し得る、レンズ吸着手段を備えていることが好ましい。また、レンズ吸着手段を保持して移動させる移動アーム手段等を備えていることが好ましい。   Further, the test lenses 51 and 52 constituting the test lens assembly 5 are sequentially arranged on the same axis in the lens barrel 53, and the transport and installation of the test lenses 51 and 52 are automatically performed. It is preferred to be configured to be performed by an apparatus. In such a case, it is preferable that the automatic apparatus includes a lens suction unit that can vacuum-suck the lens surface with, for example, a flexible suction cup. In addition, it is preferable to include moving arm means for holding and moving the lens suction means.

また、被検レンズ組体5は、図3(A)や図3(B)に示す偏芯量調整手段により、上記測定された偏芯量が0に近づくように(望ましくは0となるように)、偏芯調整が行なわれる。   Further, the lens assembly 5 is adjusted so that the measured eccentricity approaches 0 (desirably 0) by the eccentricity adjusting means shown in FIGS. 3 (A) and 3 (B). ), Eccentricity adjustment is performed.

すなわち、図3(A)は、2つのPZTを用いて偏芯調整を行なう2点調整法を実施するための態様を示すものであり、各レンズ51、52を所定位置に保持してなるレンズ鏡筒61の外周面に沿って、可撓性を有する円筒状の調整治具65が配される。レンズ鏡筒61の各レンズ配設位置に対応して、その周方向90度毎に壁部を貫通する孔部66が設けられており、調整治具65には、これら孔部66と嵌合して、レンズ51、52に当接する凸部67が設けられている。なお、これら凸部67のうち隣接する2つの凸部67を押圧し得るように、押圧先端部62Aa、Baを有するPZT62A、Bが設けられている。   That is, FIG. 3A shows a mode for carrying out a two-point adjustment method in which eccentricity adjustment is performed using two PZTs, and each lens 51 and 52 is held in a predetermined position. A cylindrical adjustment jig 65 having flexibility is disposed along the outer peripheral surface of the lens barrel 61. Corresponding to each lens arrangement position of the lens barrel 61, a hole 66 is provided through the wall at every 90 degrees in the circumferential direction, and the adjustment jig 65 is fitted with these holes 66. And the convex part 67 contact | abutted to the lenses 51 and 52 is provided. In addition, PZT62A and B which have pressing front-end | tip part 62Aa and Ba are provided so that the adjacent 2 convex part 67 can be pressed among these convex parts 67. FIG.

また、図3(B)は、3つのPZTを用いて偏芯調整を行なう3点調整法を実施するための態様を示すものであり、各レンズ51、52を所定位置に保持してなるレンズ鏡筒61Aの周方向120度毎に壁部を貫通する孔部66Aが設けられており、これら孔部66Aの各々と嵌合して、レンズ51の側面に当接するPZT62C、D、Eの押圧先端部62Ca、Da、Eaが設けられている。   FIG. 3B shows a mode for carrying out a three-point adjustment method in which eccentricity adjustment is performed using three PZTs. Lenses formed by holding the lenses 51 and 52 at predetermined positions. A hole 66A that penetrates the wall portion is provided every 120 degrees in the circumferential direction of the lens barrel 61A, and presses of the PZTs 62C, D, and E that engage with each of the hole portions 66A and contact the side surface of the lens 51. Tip portions 62Ca, Da, and Ea are provided.

また、図3(A)および図3(B)に示すいずれの態様においても、PZT62A、B、C、D、Eは、被検レンズ組体5を構成する各被検レンズ51、52毎に各々設けるようにしてもよいし、PZT62A、B、C、D、Eを1つの被検レンズ51、52に対応する分だけ設けるとともに、これをレンズ配列方向に移動させるPZT上下方向移動手段を備えるようにしてもよい。また、これらのPZT62A、B、C、D、Eの移動、駆動等の制御は、上記解析装置31に併設された制御部に格納されたプログラムにしたがって行なわれるようにすればよい。また、上述したように、PZT62A、B、C、D、Eをレンズ配列方向に移動させるPZT上下方向移動手段を設ける場合には、一旦、PZT62A、B、C、D、Eをレンズの径方向に出し入れする操作をPZT水平方向移動手段によって行うことが必要となるから、このようなPZT62A、B、C、D、Eの出し入れ操作に係る制御も、上記解析装置31に併設された制御部に格納されたプログラムにしたがって行なわれるように構成することが好ましい。   3A and 3B, the PZT 62A, B, C, D, and E are provided for each of the test lenses 51 and 52 constituting the test lens assembly 5. PZT 62A, B, C, D, E may be provided for each of the test lenses 51, 52, and PZT vertical movement means for moving the PZT 62A in the lens arrangement direction is provided. You may do it. Further, the movement, drive, and the like of these PZTs 62A, B, C, D, and E may be controlled according to a program stored in a control unit provided in the analysis apparatus 31. Further, as described above, when the PZT vertical movement means for moving the PZT 62A, B, C, D, E in the lens arrangement direction is provided, the PZT 62A, B, C, D, E are temporarily moved in the lens radial direction. Since it is necessary to perform the operation to move in and out by the PZT horizontal movement means, such control related to the operation of putting in and out PZT 62A, B, C, D and E is also performed in the control unit provided in the analyzer 31. It is preferable that the configuration is performed in accordance with a stored program.

以下、本実施形態に係る光学素子の偏芯調整組立方法を、図1のフローチャートを用いて説明する。   The optical element eccentricity adjustment assembly method according to the present embodiment will be described below with reference to the flowchart of FIG.

この光学素子の偏芯調整組立方法は、まず、最も測定光入射側に位置する第1のレンズのみをセットする(S1)。   In this optical element eccentricity adjustment assembly method, first, only the first lens located closest to the measurement light incident side is set (S1).

次に、図2に示す偏芯調整組立装置1を用いてこの第1のレンズの偏芯量を測定する(S2)。   Next, the eccentricity of the first lens is measured using the eccentricity adjustment assembly apparatus 1 shown in FIG. 2 (S2).

次に、上記ステップ2(S2)において測定された偏芯量に基づき、後述する式(A)、(B)等を用いて、第1のレンズの位置調整量を算出する(S3)。   Next, based on the amount of eccentricity measured in step 2 (S2), the position adjustment amount of the first lens is calculated using equations (A) and (B) described later (S3).

次に、図3(A)、(B)等に示す偏芯調整手段等を用いて、この偏芯量が0に近づくように、第1のレンズの偏芯を調整する(S4)。   Next, the eccentricity of the first lens is adjusted using the eccentricity adjusting means shown in FIGS. 3A and 3B so that the amount of eccentricity approaches 0 (S4).

次に、上記ステップ2(S2)における偏芯量の測定と同様にして、再び、第1のレンズの偏芯量を測定する(S5)。   Next, the eccentric amount of the first lens is measured again in the same manner as the measurement of the eccentric amount in step 2 (S2) (S5).

次に、上記ステップ5(S5)において測定された偏芯量が、所定のしきい値以下となっているか否か、すなわち、例えば、無視し得る程度に小さい値とされているかを判断する(S6)。   Next, it is determined whether or not the eccentricity measured in step 5 (S5) is equal to or less than a predetermined threshold value, that is, for example, a value that is small enough to be ignored (see FIG. 5). S6).

次に、上記ステップ6(S6)における判断の結果、所定のしきい値以下と判断されればステップ7(S7)にすすみ、所定のしきい値より大きいと判断されればステップ3(S3)に戻り、上記ステップ3(S3)における位置調整量の算出と同様にして、測定された偏芯量に基づき、第1のレンズの位置調整量を算出する(S3)ようにする。   Next, as a result of the determination in step 6 (S6), if it is determined that the value is equal to or smaller than the predetermined threshold value, the process proceeds to step 7 (S7). If it is determined that the value is larger than the predetermined threshold value, step 3 (S3). Returning to step S3, the position adjustment amount of the first lens is calculated based on the measured eccentricity amount (S3) in the same manner as the calculation of the position adjustment amount in step 3 (S3).

一方、上記ステップ6(S6)における判断の結果、所定のしきい値以下と判断され、ステップ7(S7)にすすむと、このステップ7(S7)においては、図4に示すようにして、第1のレンズを位置調整された状態で、レンズ鏡筒61の内部に接着保持する。   On the other hand, as a result of the determination in the above step 6 (S6), it is determined that the threshold value is equal to or less than the predetermined threshold value, and when proceeding to step 7 (S7), in step 7 (S7), as shown in FIG. The lens 1 is adhered and held inside the lens barrel 61 with its position adjusted.

この後、セットすべき次のレンズの有無を判断し、この判断の結果、次のレンズが無ければこのルーチンを終了し、一方、次のレンズがまだあれば、そのレンズについてのステップ1〜7(S1〜7)の処理を行なうようにする。   Thereafter, it is determined whether or not there is a next lens to be set. If the result of this determination is that there is no next lens, this routine is terminated. On the other hand, if there is still a next lens, steps 1 to 7 for that lens are performed. The processing of (S1-7) is performed.

この結果、被検レンズ組体5を構成する全てのレンズについて、順次、偏芯調整および鏡筒61内への接着保持がなされ、組立てが終了する。   As a result, with respect to all the lenses constituting the lens assembly 5 to be examined, the eccentricity adjustment and the adhesion holding in the lens barrel 61 are sequentially performed, and the assembly is completed.

以下、図4を用いて、各レンズ51A、B、Cの調整手順について説明する。
なお、この例においては、3枚のレンズにより、被検レンズ組体5が構成されている。
Hereinafter, the adjustment procedure of each of the lenses 51A, B, and C will be described with reference to FIG.
In this example, the test lens assembly 5 is constituted by three lenses.

この図4の概念図に示すように、下方に配された測定ヘッド10の対物レンズ15からの測定光は、レンズ51A、レンズ51B、レンズ51Cの配設位置順に進行することになる。   As shown in the conceptual diagram of FIG. 4, the measurement light from the objective lens 15 of the measurement head 10 disposed below proceeds in the order in which the lens 51A, the lens 51B, and the lens 51C are arranged.

本実施形態の方法においては、測定光が入射する順に、レンズ51A、B、Cの偏芯量測定、偏芯調整、およびレンズ51A、B、Cの鏡筒61内での接着保持という一連の処理が行われる(図4において、(A)、(B)、(C)の順)。なお、各レンズ間の処理切替はZ軸ステージ40を図中上下方向に駆動して、各レンズの測定基準となる位置に合わせ直すことによりなされる。すなわち、例えば、測定すべきレンズ面の焦点位置(例えばC)に、対物レンズ15の焦点位置Fを合わせることによりなされる。 In the method of the present embodiment, a series of steps of measuring the eccentric amounts of the lenses 51A, B, and C, adjusting the eccentricity, and maintaining the adhesion of the lenses 51A, B, and C in the lens barrel 61 in the order in which the measurement light enters. Processing is performed (in FIG. 4, the order of (A), (B), (C)). Note that the process switching between the lenses is performed by driving the Z-axis stage 40 in the vertical direction in the drawing to adjust the position to the measurement reference of each lens. That is, for example, this is done by matching the focal position F of the objective lens 15 with the focal position (for example, C 3 ) of the lens surface to be measured.

このような順番で、レンズを組み立てていくと、レンズ51Aの偏芯調整がなされた後にレンズ51Bの偏芯量測定が行われるので、このとき測定された偏芯量にはレンズ51Aの偏芯量は略含まれておらず、この測定値に基づいてレンズ51Bの偏芯調整のみを行えばよい。また、次に、レンズ51Cの偏芯量測定が行われることになるが、このとき測定された偏芯量にはレンズ51Aやレンズ51Bの偏芯量は略含まれておらず、このときの測定値に基づいてレンズ51Cの偏芯調整のみを行えばよい。なお、このように、測定ヘッド10を下方に配した場合には、図5に示すような、間隔保持用の間隔リング63を設けずともよい。   When the lenses are assembled in this order, the eccentricity of the lens 51B is measured after the eccentricity adjustment of the lens 51A is performed. Therefore, the eccentricity measured at this time includes the eccentricity of the lens 51A. The amount is not substantially included, and it is only necessary to adjust the eccentricity of the lens 51B based on this measured value. Next, the amount of eccentricity of the lens 51C is measured, but the amount of eccentricity measured at this time does not substantially include the amount of eccentricity of the lens 51A or the lens 51B. It is only necessary to adjust the eccentricity of the lens 51C based on the measurement value. In this way, when the measuring head 10 is arranged below, it is not necessary to provide the spacing ring 63 for maintaining the spacing as shown in FIG.

また、上記とは反対に、測定光が入射する順序とは逆の順序で、レンズ51A、B、Cの偏芯量測定、偏芯調整、およびレンズ51A、B、Cの鏡筒61内での接着保持を行なうようにすると、一旦偏芯調整したレンズであっても、その次のレンズの偏芯量測定の際に、偏芯を有するように測定されてしまうことになり、組レンズを構成する各レンズの偏芯調整やレンズ組立てが極めて煩雑になるので好ましくない。   Further, contrary to the above, in the order opposite to the order in which the measurement light is incident, the eccentricity measurement of the lenses 51A, B, and C, the eccentricity adjustment, and the lens barrel 61 of the lenses 51A, B, and C are included. In this case, even if the lens is once adjusted in eccentricity, it will be measured to have eccentricity when measuring the eccentricity of the next lens. It is not preferable because the eccentricity adjustment and lens assembly of each lens constituting the lens are extremely complicated.

また、上記レンズ51A、B、Cの鏡筒61A内での接着保持は、紫外線硬化型接着剤等を用いるのが好ましく、この場合には、鏡胴61の近傍に紫外線照射光源を配設し、接着固定を要するタイミングでのみ、光源が駆動されるように制御することが好ましい。なお、この場合の制御も、上記解析装置31に併設された制御部に格納されたプログラムにしたがって行なわれるように構成することが好ましい。   In addition, it is preferable to use an ultraviolet curable adhesive or the like for bonding and holding the lenses 51A, B, and C in the lens barrel 61A. In this case, an ultraviolet light source is disposed in the vicinity of the lens barrel 61. It is preferable to control so that the light source is driven only at a timing that requires adhesive fixation. The control in this case is also preferably configured to be performed according to a program stored in a control unit provided in the analysis device 31.

本実施形態方法によれば、レンズの偏芯量の測定、偏芯の調整およびレンズの接着保持という一連の処理が行なわれるレンズの順序を測定光の入射側からとしたことにより、簡易かつ効率的に被検レンズの偏芯調整および接着保持を行なうことができる。   According to the method of the present embodiment, the order of the lenses in which a series of processes of measuring the amount of eccentricity of the lens, adjusting the eccentricity, and maintaining the adhesion of the lens is performed from the incident side of the measurement light. Thus, it is possible to adjust the eccentricity of the lens to be tested and to maintain the adhesion.

なお、本発明方法は、図4に示すように測定ヘッド10を下方に配した場合に限られるものではなく、例えば図5に示すように測定ヘッド10を上方に配し、この測定ヘッド10の対物レンズ15から出射された測定光を用いても行なうことができ、略同様の作用効果を奏することができる。なお、この場合には、各レンズ51A、B、Cの間に、間隔保持用の周知の間隔リングを配置することが肝要である。   Note that the method of the present invention is not limited to the case where the measurement head 10 is arranged downward as shown in FIG. 4. For example, the measurement head 10 is arranged upward as shown in FIG. This can also be performed using measurement light emitted from the objective lens 15, and substantially the same operational effects can be achieved. In this case, it is important to arrange a well-known spacing ring for spacing between the lenses 51A, B, C.

また、上記の場合には、測定光が入射する順、すなわち、レンズ51A、レンズ51B、レンズ51Cというように、図中上方側から順に、偏芯量測定、偏芯調整、およびレンズ51の鏡筒61内での接着保持の各処理が行われる(図5において、(A)、(B)、(C)の順)。   In the above case, in the order in which the measurement light enters, that is, the lens 51A, the lens 51B, and the lens 51C, the eccentricity measurement, the eccentricity adjustment, and the mirror of the lens 51 are sequentially performed from the upper side in the figure. Each process of adhesion holding in the cylinder 61 is performed (in order of (A), (B), and (C) in FIG. 5).

また、図6に示すように、本実施形態装置は、PZT移動手段として、PZT62A、B、C、D、Eをレンズ配列方向に移動させるPZT上下方向移動手段41BおよびPZT62A、B、C、D、Eをレンズの径方向に出し入れする操作を行うPZT水平方向移動手段41Aとを備えている。図6はこれらの手段における具体的な動作態様を説明するための概略図である。なお、実際には、レンズ51A、B、Cの周囲の3方向から、図3(B)に示すようにPZT62C、D、Eを各レンズ51A、B、Cに対して作用させるものであるが、図6では説明の便宜のため、主としてPZT62Cの操作に着目して説明する。   Further, as shown in FIG. 6, the apparatus according to the present embodiment has PZT vertical movement means 41B and PZT 62A, B, C, D for moving PZT 62A, B, C, D, E in the lens arrangement direction as PZT movement means. , And a PZT horizontal direction moving means 41A for performing an operation for moving E in and out of the lens in the radial direction. FIG. 6 is a schematic diagram for explaining specific operation modes of these means. In practice, PZT 62C, D, and E are applied to the lenses 51A, B, and C from three directions around the lenses 51A, B, and C as shown in FIG. 3B. For convenience of explanation, FIG. 6 will be described mainly focusing on the operation of PZT62C.

すなわち、図6(A)に示すように、レンズ鏡筒61Aの最下段に位置するレンズ51Aの側面に対向するPZT62Cの押圧先端部(ヘッド)62Caが、レンズ鏡筒61Aの孔部66Aに挿入され、この押圧先端部62Caのレンズ51Aに対する押圧位置調整操作は、このレンズ51Aが正規の位置に高精度に設定されるように、上述した解析装置31に併設された制御部に格納されたプログラムにしたがって押圧先端部62Caを微小量だけ操作せしめることにより行われる。なお、PZT62D、E(図3(B)を参照)の押圧先端部(ヘッド)62Da、Eaについても押圧先端部62Caと同様の操作がなされることになるので、結局、押圧先端部62Ca、62Da、Eaを用いてレンズ51Aをその周囲の3方向から位置調整することになる。   That is, as shown in FIG. 6A, the pressing tip portion (head) 62Ca of the PZT 62C facing the side surface of the lens 51A located at the lowermost stage of the lens barrel 61A is inserted into the hole 66A of the lens barrel 61A. The pressing position adjusting operation of the pressing tip 62Ca with respect to the lens 51A is a program stored in the control unit provided in the analysis apparatus 31 described above so that the lens 51A is accurately set to a normal position. Accordingly, the pressing tip 62Ca is operated by a minute amount. In addition, since the same operation as that of the pressing tip portion 62Ca is performed on the pressing tip portions (heads) 62Da and Ea of the PZTs 62D and E (see FIG. 3B), the pressing tip portions 62Ca and 62Da are eventually obtained. , Ea is used to adjust the position of the lens 51A from the three directions around it.

このようにしてレンズ51Aの押圧位置調整操作が終了すると、続いてレンズ51B、レンズ51Cにおける同様の押圧位置調整操作が順次行なわれる。図6(B)は、レンズ51Bの押圧位置調整操作が行われる際の様子を示すものであり、この押圧位置調整操作自体は上記レンズ51Aの押圧位置調整操作と同様に行なわれるが、図6(A)の状態から図6(B)の状態へのPZT62Cの移動操作において、PZT62Cを水平方向(例えばX方向)へ移動させることなくそのままの状態で上方向(図面Z方向)に移動させることはできないことから、PZT62Cを水平方向に移動させるPZT水平方向移動手段41Aを備えている。すなわち、図6(A)に示す状態から、PZT水平方向移動手段41AがPZT62Cを水平方向(図中左方向)へ移動させることにより、PZT62Cの押圧先端部62Caが、レンズ鏡筒61Aの孔部66Aから抜去される。この状態で、PZT上下方向移動手段41BがPZT62Cを上方向(Z方向)へ、予め定められた所定距離だけ移動させることにより、PZT62Cの押圧先端部62Caがレンズ51Bに対応する孔部66Aに対向する位置まで移動する。続いて、PZT水平方向移動手段41AがPZT62Cをレンズ51Bに近づく方向へ移動させることにより、PZT62Cの押圧先端部62Caが、レンズ51Bに対応する孔部66Aに挿入され、図6(B)の状態に設定されることになる。   When the operation for adjusting the pressing position of the lens 51A is thus completed, the same operation for adjusting the pressing position on the lens 51B and the lens 51C is successively performed. FIG. 6B shows a state when the pressing position adjustment operation of the lens 51B is performed. This pressing position adjustment operation itself is performed in the same manner as the pressing position adjustment operation of the lens 51A. In the movement operation of the PZT 62C from the state of (A) to the state of FIG. 6 (B), the PZT 62C is moved upward (Z direction in the drawing) without moving in the horizontal direction (for example, the X direction). Therefore, PZT horizontal direction moving means 41A for moving the PZT 62C in the horizontal direction is provided. That is, from the state shown in FIG. 6A, the PZT horizontal movement means 41A moves the PZT 62C in the horizontal direction (left direction in the figure), so that the pressing tip 62Ca of the PZT 62C becomes the hole of the lens barrel 61A. 66A is removed. In this state, the PZT vertical movement means 41B moves the PZT 62C upward (Z direction) by a predetermined distance, so that the pressing tip 62Ca of the PZT 62C faces the hole 66A corresponding to the lens 51B. Move to the position you want. Subsequently, when the PZT horizontal moving means 41A moves the PZT 62C in a direction approaching the lens 51B, the pressing tip 62Ca of the PZT 62C is inserted into the hole 66A corresponding to the lens 51B, and the state shown in FIG. 6B. Will be set to.

このように、本実施形態装置においては、PZT62C、D、Eをレンズの径方向に出し入れする操作を行うPZT水平方向移動手段41Aと、PZT62C、D、Eをレンズ配列方向に移動させるPZT上下方向移動手段41Bとを備えているので、1つのレンズ位置調整手段によって、複数枚のレンズの調整を簡易かつスムーズに行なうことができる。   As described above, in the apparatus according to the present embodiment, the PZT horizontal direction moving means 41A that performs an operation of moving the PZT 62C, D, and E in and out of the lens radial direction, and the PZT vertical direction that moves the PZT 62C, D, and E in the lens arrangement direction. Since the moving means 41B is provided, the adjustment of a plurality of lenses can be performed easily and smoothly by one lens position adjusting means.

なお、この後、レンズ51Cの位置調整を行なう位置までPZT62Cを移動させることになるが、この場合のレンズ位置調整手段の移動操作も上記操作と同様にして行なうことができる。また、図3(A)に示す態様においても、各PZT62A、B(各押圧先端部62Aa、Ba)についてPZT水平方向移動手段41Aと、PZT上下方向移動手段41Bとにより移動させることにより、同様に移動操作を行うことができる。また、図3(A)に示す態様の如く、各レンズ51A、B、Cに当接する凸部67が設けられているような場合、あるいは、上述した押圧先端部62Ca、Da、Eaの一部に相当する棒状ヘッド部材が独立して、各レンズ51A、B、Cに対応した孔部66内に各々既に挿入されているような場合は、上記凸部67や上記棒状ヘッド部材の外方端部をPZT62A、B、C、D、Eにより外方から押圧してやればよいので、そのような場合には、上述したPZT水平方向移動手段41Aは必ずしも必要とされず、PZTA、B、C、D、Eのストロークによっては、PZT上下方向移動手段41BのみによってPZT移動手段を構成することも可能である。   After this, the PZT 62C is moved to the position where the position of the lens 51C is adjusted. In this case, the moving operation of the lens position adjusting means can be performed in the same manner as the above operation. Also in the embodiment shown in FIG. 3A, each PZT 62A, B (each pressing tip 62Aa, Ba) is moved similarly by the PZT horizontal direction moving means 41A and the PZT vertical direction moving means 41B. Move operation can be performed. Further, as in the embodiment shown in FIG. 3A, when a convex portion 67 that abuts on each of the lenses 51A, B, and C is provided, or a part of the pressing tip portions 62Ca, Da, and Ea described above. When the rod-shaped head member corresponding to the above is already inserted into the hole 66 corresponding to each of the lenses 51A, 51B, and 51C, the convex portion 67 and the outer end of the rod-shaped head member. In this case, the PZT horizontal direction moving means 41A is not necessarily required, and PZTA, B, C, D, and PZT62A, B, C, D, and E may be used. Depending on the stroke of E, the PZT moving means can be constituted only by the PZT vertical direction moving means 41B.

なお、図6に示す実施形態においては、レンズの調整を下方のレンズから順次行うようにしているが、レンズの調整を上方のレンズから順次行うようにすることも勿論可能である。   In the embodiment shown in FIG. 6, the lens adjustment is sequentially performed from the lower lens. However, it is of course possible to perform the lens adjustment sequentially from the upper lens.

また、図7は、図5に示すような、上方側から測定光を照射する測定ヘッド210を備えた偏芯調整組立装置201を示すものである。なお、図2に示す部材に対応する部材には、図2に示す符号に200を加えた符号にて表すものとし、それら個々の部材についての詳細な説明は省略する。   FIG. 7 shows an eccentricity adjustment assembly apparatus 201 provided with a measurement head 210 that emits measurement light from above as shown in FIG. In addition, the member corresponding to the member shown in FIG. 2 shall be represented by the code | symbol which added 200 to the code | symbol shown in FIG. 2, and detailed description about these individual members is abbreviate | omitted.

ここで、図2に示す装置1を用いて行なわれる各レンズの偏芯量の測定について、一例を挙げて補足説明をしておく。   Here, the measurement of the eccentricity of each lens performed using the apparatus 1 shown in FIG.

また、以下では、上記被検レンズ組体5の各レンズ面51a,51b,52a,52bのうち、レンズ面52aを被検面としてその偏芯量を測定する場合を例にとって説明する。この場合、測定準備として、測定ヘッド10の光収束点Fがレンズ面52aの焦点面に位置するように、Z軸ステージ40を用いて測定ヘッド10の高さ調整が行われる。この調整完了後の被検レンズ組体5の位置を初期位置とする。   In the following, description will be given by taking as an example a case where the lens surface 52a of the lens surfaces 51a, 51b, 52a, 52b of the test lens assembly 5 is used as a test surface and the amount of eccentricity is measured. In this case, as a measurement preparation, the height adjustment of the measurement head 10 is performed using the Z-axis stage 40 so that the light convergence point F of the measurement head 10 is located on the focal plane of the lens surface 52a. The position of the test lens assembly 5 after completion of this adjustment is taken as the initial position.

〈1〉まず、測定点数N(Nは3以上の任意の整数。例えばN=18)を設定する。   <1> First, the number N of measurement points (N is an arbitrary integer of 3 or more, for example, N = 18) is set.

〈2〉次に、測定ヘッド10から被検レンズ組体5に対し、所定の指標パターン(レチクルによる十字形状のパターン)を投影する測定光束を照射して最初の画像を撮像し、撮像後に、回転ステージ23を用いて、被検レンズ組体5(レンズ面52a)を回転軸Eの回りに360/N度(N=18の場合は20度)だけ回転させる。   <2> Next, a measurement light beam for projecting a predetermined index pattern (cross-shaped pattern using a reticle) is irradiated from the measurement head 10 to the lens assembly 5 to be imaged, and after the imaging, Using the rotation stage 23, the lens assembly 5 (lens surface 52a) is rotated around the rotation axis E by 360 / N degrees (when N = 18, 20 degrees).

〈3〉次いで、撮像された指標像の像中心点の座標を、撮像素子16の撮像面に対し設定された座標系(直交座標系や極座標系など適宜に設定可能)において求める。この像中心点の座標の求め方(十字線の中心点の座標の特定方法)は、例えば、前述の特許文献3に記載されたものと同様とすればよい。   <3> Next, the coordinates of the image center point of the imaged index image are obtained in a coordinate system set on the imaging surface of the image sensor 16 (an orthogonal coordinate system or a polar coordinate system can be set as appropriate). The method for obtaining the coordinates of the image center point (the method for specifying the coordinates of the center point of the crosshairs) may be the same as that described in Patent Document 3, for example.

〈4〉被検面(レンズ面52a)が、初期位置から回転軸Eの回りに計360度回転したか否かを判定し、否と判定されれば、上記手順〈1〉〜〈3〉を繰り返し、回転位置毎に撮像された指標像の像中心点の座標を求める。なお、各像中心点の座標を求めるために必要となる画像処理や演算処理は解析装置31において行われ、求められた各像中心点の座標は解析装置31の記憶部に順次記憶される。   <4> It is determined whether or not the test surface (lens surface 52a) has rotated a total of 360 degrees around the rotation axis E from the initial position. If it is determined as NO, the above procedures <1> to <3> are performed. Is repeated to obtain the coordinates of the image center point of the index image captured at each rotational position. Note that image processing and calculation processing necessary for obtaining the coordinates of each image center point are performed in the analysis device 31, and the obtained coordinates of each image center point are sequentially stored in the storage unit of the analysis device 31.

この後、各像中心点にフィッティングする近似円を求めてその中心を測定基準点として設定し、この測定基準点から任意の像中心点までの距離や近似円の半径を、被検面の偏芯量として求める。なお、この場合の演算処理も解析装置31において行われる。   After that, an approximate circle to be fitted to each image center point is obtained, the center is set as a measurement reference point, and the distance from this measurement reference point to an arbitrary image center point and the radius of the approximate circle are determined based on the deviation of the test surface. Calculate as the core amount. Note that the arithmetic processing in this case is also performed in the analysis device 31.

次に、前述した図3(A)、(B)を用いて、偏芯を調整する場合の、各々の計算手法について補足説明を加える。   Next, supplementary explanation will be given for each calculation method in the case of adjusting the eccentricity with reference to FIGS. 3 (A) and 3 (B) described above.

すなわち、図3(A)に示すように、2本のPZT(ピエゾ素子)を用いた調整治具で、X方向およびY方向の偏芯を調整することができるが、この場合の偏芯調整量は数式を用いて算出される。   That is, as shown in FIG. 3 (A), the eccentricity in the X direction and the Y direction can be adjusted with an adjusting jig using two PZTs (piezo elements). The quantity is calculated using a mathematical formula.

すなわち、偏芯測定値を(ex, ey)とすると、互いに90度の角度で設置した2つのPZT62A、Bの偏芯調整量LP1、LP2は、例えば、以下の式(A)によって算出される(P1はY方向に一致する方向を表し、P2はX方向に一致する方向を表す)。 That is, assuming that the eccentricity measurement value is (e x , e y ), the eccentricity adjustment amounts L P1 and L P2 of the two PZTs 62A and B installed at an angle of 90 degrees are, for example, the following formula (A) (P1 represents a direction matching the Y direction, and P2 represents a direction matching the X direction).

Figure 2010282151
Figure 2010282151

また、図3(B)に示すように、3本のPZTを用い、X方向およびY方向の偏芯を調整することができるが、この場合の偏芯調整量も数式を用いて算出される。   In addition, as shown in FIG. 3B, the eccentricity in the X direction and the Y direction can be adjusted using three PZTs. In this case, the eccentricity adjustment amount is also calculated using a mathematical expression. .

すなわち、偏芯測定値を(ex, ey)とすると、互いに120度の角度で設置した3つのPZT62A、B、Cの偏芯調整量LP1、LP2、LP3は、例えば、以下の式(B)によって算出される(P1はY方向に一致する方向を表し、P2はY方向から反時計回りに120度回転した方向を表し、P3はY方向から反時計回りに240度回転した方向を表す)。 That is, assuming that the eccentricity measurement value is (e x , e y ), the eccentricity adjustment amounts L P1 , L P2 , and L P3 of the three PZTs 62A, B, and C installed at an angle of 120 degrees are, for example, (P1 represents a direction coinciding with the Y direction, P2 represents a direction rotated 120 degrees counterclockwise from the Y direction, and P3 rotates 240 degrees counterclockwise from the Y direction. Direction).

Figure 2010282151
Figure 2010282151

以上、本発明の光学素子の偏芯調整組立方法の実施形態について説明したが、本発明は上記実施形態のものに態様が限られるものではなく、種々の態様のものを実施形態とすることが可能である。例えば、上記実施形態のものでは、被検面からの反射光により撮像面上に形成される指標像を、前記被検面を所定の軸回りに回転させながら、相異なる少なくとも3つの回転位置毎(例えば120度離れた回転位置毎)に撮像し、該回転位置毎に撮像された各指標像の像中心点の座標に基づいて測定基準点(各像中心点が作る近似円の中心点)を求めるようにしているが、本発明方法においては、これに替えて、被検面からの反射光により撮像面上に形成される指標像を、互いに180度離れた2つの回転位置毎に撮像し、撮像された各指標像の像中心点の座標の平均を求めることにより上記測定基準点を求めるようにしてもよい。
また、1つのレンズを調整するピエゾ素子を4つ以上設けるようにしてもよい。
As mentioned above, although embodiment of the eccentricity adjustment assembly method of the optical element of this invention was described, this invention is not limited to the thing of the said embodiment, The thing of a various aspect is made into embodiment. Is possible. For example, in the above embodiment, the index image formed on the imaging surface by the reflected light from the test surface is rotated at least three different rotational positions while rotating the test surface around a predetermined axis. The image is taken at each rotation position (for example, every 120 degrees apart), and the measurement reference point (the center point of the approximate circle created by each image center point) is based on the coordinates of the image center point of each index image imaged at each rotation position. However, in the method of the present invention, instead of this, an index image formed on the imaging surface by the reflected light from the test surface is captured at every two rotational positions 180 degrees apart from each other. Then, the measurement reference point may be obtained by obtaining the average of the coordinates of the image center point of each captured index image.
Further, four or more piezoelectric elements for adjusting one lens may be provided.

また、上記載置部材21としては、その上方端面縁部において被検レンズ組体5を支持する円筒形状のものを用いてもよいが、前述した特許文献3の図3に示すような、Vブロックと回転円板よりなるチャック機構を用いてもよい。   Moreover, as the above-described mounting member 21, a cylindrical member that supports the lens assembly 5 to be tested may be used at the edge portion of the upper end surface thereof. However, as shown in FIG. A chuck mechanism including a block and a rotating disk may be used.

また、上記実施形態のものでは、被検光学素子として被検レンズをあげているが、複数枚が共軸上に配列される種々の光学素子(例えば、フィルタやプリズム等)の組体に対して適用可能である。   In the above-described embodiment, the test lens is used as the test optical element. However, with respect to an assembly of various optical elements (for example, filters, prisms, and the like) in which a plurality of optical elements are arranged on the same axis. It is applicable.

また、上記実施形態においては、指標パターンを投影するために十字形状のレチクルを用いているが、これに替えて、ピンホール等の他の形状のものを、指標パターンを投影するために用いることも可能である。   In the above embodiment, a cross-shaped reticle is used for projecting the index pattern. Instead, another shape such as a pinhole is used for projecting the index pattern. Is also possible.

また、上記実施形態で使用する偏芯量を測定する装置は、被検面からの反射光により形成される指標像を観察する光反射タイプのものであるが、被検面からの透過光により形成される指標像を観察する光透過タイプのものを使用して偏芯量を測定する場合にも、本発明を適用することが可能である。   The apparatus for measuring the amount of eccentricity used in the above embodiment is of a light reflection type for observing an index image formed by reflected light from the test surface, but is transmitted by light transmitted from the test surface. The present invention can also be applied to the case where the eccentricity is measured using a light transmission type that observes the formed index image.

1、201 偏芯調整組立装置
5、5A、5B、205 被検レンズ組体
10、210 測定ヘッド
11、211 光源
12、212 レチクル板
13、213 ビームスプリッタ
14、214 コリメータレンズ
15、215 対物レンズ
16、216 撮像素子
17、217 撮像カメラ
20、220 基台
21、221 載置部材
22、222 XY軸ステージ
23、223 回転ステージ
30、230 解析演算部
31、231 解析装置
32、232 画像表示装置
33、233 入力装置
40、240 Z軸ステージ
41、241 支持部
41A 水平方向移動手段
41B 上下方向移動手段
42、242 ガイド部
43、243 可動部
51,51A〜C、52、251、252 レンズ
51a,51b,52a,52b、251a,251b,252a,252b
レンズ面
53、61A、61B、253 レンズ鏡筒(レンズ枠)
62A〜E PZT(ピエゾ素子)
62Aa〜Ea 押圧先端部
63 間隔リング
F 光収束点
Z,L 光軸
E 回転軸
1, 201 Eccentricity adjustment assembly device 5, 5A, 5B, 205 Test lens assembly 10, 210 Measuring head 11, 211 Light source 12, 212 Reticle plate 13, 213 Beam splitter 14, 214 Collimator lens 15, 215 Objective lens 16 216 Imaging element 17, 217 Imaging camera 20, 220 Base 21, 221 Mounting member 22, 222 XY axis stage 23, 223 Rotating stage 30, 230 Analysis operation unit 31, 231 Analyzing device 32, 232 Image display device 33, 233 Input device 40, 240 Z-axis stage 41, 241 Support part 41A Horizontal direction moving means 41B Vertical direction moving means 42, 242 Guide part 43, 243 Movable parts 51, 51A-C, 52, 251, 252 Lens 51a, 51b, 52a, 52b, 251a, 251b 252a, 252b
Lens surface 53, 61A, 61B, 253 Lens barrel (lens frame)
62A-E PZT (piezo element)
62Aa to Ea Pressing tip 63 Spacing ring F Light convergence point Z, L Optical axis E Rotating axis

Claims (7)

複数個の光学素子が鏡筒内で共軸上に配列されてなる被検光学素子組体において、該光学素子各々の偏芯量を測定し、この偏芯量を調整しつつ該被検光学素子組体の組立てを行なう光学素子の偏芯調整組立方法であって、
まず、前記被検光学素子組体を構成すべき各光学素子のうち、配列方向のいずれか一方の端部に配されるべき第1の光学素子のみを、前記共軸上に配置し、この第1の光学素子における偏芯量を測定し、この測定値に基づいて該第1の光学素子における偏芯量が小さくなるように該第1の光学素子の設定位置を調整し、この調整された位置で、該第1の光学素子を鏡筒に保持せしめ、
続いて、該第1の光学素子に対し、前記測定光の入射側とは反対側に隣接して配されるべき第2の光学素子を前記共軸上に配置し、この第2の光学素子における偏芯量を測定し、この測定値に基づいてこの第2の光学素子における偏芯量が小さくなるように該第2の光学素子の設定位置を調整し、この調整された位置で、該第2の光学素子を鏡筒に保持せしめ、
以後、同様にして、前記測定光の入射側とは反対側に隣接して配されるべき光学素子に対し、順次、前記偏芯量を測定するとともに前記設定位置を調整して鏡筒に保持せしめることを特徴とする光学素子の偏芯調整組立方法。
In a test optical element assembly in which a plurality of optical elements are arranged on the same axis in a lens barrel, the decentering amount of each optical element is measured, and the test optical is adjusted while adjusting the decentering amount. An optical element eccentricity adjustment assembly method for assembling an element assembly,
First, among the optical elements that should constitute the test optical element assembly, only the first optical element that should be arranged at one end in the arrangement direction is arranged on the coaxial axis, The amount of eccentricity in the first optical element is measured, and the setting position of the first optical element is adjusted based on this measured value so that the amount of eccentricity in the first optical element is reduced. Holding the first optical element on the lens barrel at the position
Subsequently, a second optical element to be disposed adjacent to the first optical element on the side opposite to the incident side of the measurement light is disposed on the coaxial axis, and the second optical element Is measured, and the setting position of the second optical element is adjusted so that the eccentricity amount in the second optical element is reduced based on the measured value. Hold the second optical element in the lens barrel,
Thereafter, in the same manner, for the optical element to be arranged adjacent to the side opposite to the measurement light incident side, the eccentricity is sequentially measured and the set position is adjusted and held in the lens barrel. A decentering adjustment assembly method for an optical element, characterized by comprising:
前記偏芯量の測定は、所定の指標パターンを投影する測定光を被検面に照射し、該被検面からの反射光または透過光により撮像面上に形成される指標像を、前記被検面を所定の軸回りに回転させながら、相異なる少なくとも3つの回転位置毎または互いに180度離れた2つの回転位置毎に撮像し、該回転位置毎に撮像された各指標像の像中心点の座標を、前記撮像面に対し設定された座標系においてそれぞれ特定し、この特定された各像中心点の座標データに基づき、前記被検面の偏芯量を測定することにより行われることを特徴とする請求項1記載の光学素子の偏芯調整組立方法。   The amount of eccentricity is measured by irradiating the surface to be measured with measurement light that projects a predetermined index pattern, and generating an index image formed on the imaging surface by reflected or transmitted light from the surface to be measured. While rotating the inspection surface around a predetermined axis, images are taken at each of at least three different rotational positions or two rotational positions that are 180 degrees apart from each other, and the image center point of each index image captured at each rotational position Is determined in the coordinate system set for the imaging surface, and the eccentricity of the test surface is measured based on the coordinate data of each specified image center point. The method for assembling and decentering an optical element according to claim 1. 前記光学素子の偏芯量の測定は、前記光学素子の表裏面の各々について、前記所定の各回転角毎の前記指標の像を通る円を特定し、特定された該円の中心点の座標を求め、
この後、求められた、前記光学素子の表裏面の各々についての前記円の中心点の座標の差を算出し、この算出された値を前記光学素子の偏芯量とすることを特徴とする請求項1または2記載の光学素子の偏芯調整組立方法。
The measurement of the eccentricity of the optical element is performed by specifying a circle passing through the image of the index for each predetermined rotation angle for each of the front and back surfaces of the optical element, and the coordinates of the specified center point of the circle Seeking
Thereafter, the difference between the obtained coordinates of the center point of the circle for each of the front and back surfaces of the optical element is calculated, and the calculated value is used as the eccentric amount of the optical element. The method of assembling and decentering an optical element according to claim 1 or 2.
複数個の光学素子が鏡筒内で共軸上に配列されてなる被検光学素子組体において、該光学素子各々の偏芯量を測定し、この偏芯量を調整しつつ該被検光学素子組体の組立てを行なう光学素子の偏芯調整組立装置であって、
前記被検光学素子組体を構成すべき各光学素子を、前記測定光の入射側から順次、前記共軸上に配置する光学素子配置手段と、
前記共軸上に前記光学素子が配置される度に、当該配置された前記光学素子の偏芯量を前記測定光を用いて測定する偏芯量測定手段と、
この測定の結果に応じて、当該光学素子における偏芯量が小さくなるように当該光学素子の設定位置を調整する設定位置調整手段と、
この調整された位置で、当該光学素子を鏡筒に保持せしめる光学素子保持手段と、
を備えてなることを特徴とする光学素子の偏芯調整組立装置。
In a test optical element assembly in which a plurality of optical elements are arranged on the same axis in a lens barrel, the decentering amount of each optical element is measured, and the test optical is adjusted while adjusting the decentering amount. An optical element eccentricity adjustment assembly apparatus for assembling an element assembly,
Optical element arrangement means for arranging each optical element that should constitute the test optical element assembly on the same axis sequentially from the incident side of the measurement light;
Eccentricity measuring means for measuring the eccentricity of the optical element arranged using the measuring light every time the optical element is arranged on the coaxial axis,
In accordance with the result of this measurement, setting position adjusting means for adjusting the setting position of the optical element so that the amount of eccentricity in the optical element is small;
Optical element holding means for holding the optical element in the lens barrel at the adjusted position;
An optical element eccentricity adjusting and assembling apparatus comprising:
前記光学素子配置手段は、前記光学素子の各々を搬送する光学素子吸着手段を備えていることを特徴とする請求項4記載の光学素子の偏芯調整組立装置。   5. The optical element eccentricity adjusting / assembling apparatus according to claim 4, wherein the optical element arranging means includes optical element suction means for conveying each of the optical elements. 前記光学素子配置手段は、前記光学素子の周囲に配され、この光学素子の偏芯量を調整すべく、当該光学素子の側面を微小量だけ押圧するピエゾ素子を複数個備えていることを特徴とする請求項4または5記載の光学素子の偏芯調整組立装置。   The optical element arranging means includes a plurality of piezo elements arranged around the optical element and pressing a side surface of the optical element by a minute amount in order to adjust an eccentric amount of the optical element. An optical element eccentricity adjustment assembly apparatus according to claim 4 or 5. 前記複数個のピエゾ素子が、同一の光学素子に対し、協働して調整する組をなすものであり、
前記複数個の光学素子の各々について、順次、偏芯量を調整し得るように、前記ピエゾ素子を該光学素子の各々に対応した位置に移動せしめるPZT移動手段を備えており、
該PZT移動手段は、前記ピエゾ素子を前記光学素子の配列方向に移動させるPZT上下方向移動手段、および前記ピエゾ素子を前記光学素子の径方向に出し入れする操作を行うPZT水平方向移動手段とを備えていることを特徴とする請求項6記載の光学素子の偏芯調整組立装置。
The plurality of piezo elements form a set that adjusts in cooperation with the same optical element,
PZT moving means for moving the piezo element to a position corresponding to each of the optical elements so that the amount of eccentricity can be sequentially adjusted for each of the plurality of optical elements,
The PZT moving means includes PZT vertical direction moving means for moving the piezo elements in the arrangement direction of the optical elements, and PZT horizontal direction moving means for performing operations for moving the piezo elements in and out of the radial directions of the optical elements. The decentering / assembling apparatus for an optical element according to claim 6.
JP2009137585A 2009-06-08 2009-06-08 Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus Expired - Fee Related JP5222796B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009137585A JP5222796B2 (en) 2009-06-08 2009-06-08 Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus
CN201010200107.2A CN101907758B (en) 2009-06-08 2010-06-08 Eccentricity adjusting and assembling method, and eccentricity adjusting and assembling device of optical element
KR1020100053640A KR101299509B1 (en) 2009-06-08 2010-06-08 Eccentricity adjusting and assembling method, and eccentricity adjusting and assembling device of optical element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009137585A JP5222796B2 (en) 2009-06-08 2009-06-08 Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus

Publications (2)

Publication Number Publication Date
JP2010282151A true JP2010282151A (en) 2010-12-16
JP5222796B2 JP5222796B2 (en) 2013-06-26

Family

ID=43263261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009137585A Expired - Fee Related JP5222796B2 (en) 2009-06-08 2009-06-08 Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus

Country Status (3)

Country Link
JP (1) JP5222796B2 (en)
KR (1) KR101299509B1 (en)
CN (1) CN101907758B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114001931A (en) * 2021-11-02 2022-02-01 Oppo广东移动通信有限公司 Test device and test method of imaging component
CN114967024A (en) * 2022-06-24 2022-08-30 江西弘耀光学水晶有限公司 High-precision optical lens eccentricity adjusting structure and method

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102879882B (en) * 2012-09-21 2015-01-07 长春理工大学 Apparatus for assembling and correcting lens group based on coaxiality conversion
CN104406547B (en) * 2014-12-09 2017-11-07 上海新跃仪表厂 The eccentric measuring device and its measuring method of a kind of optical element
EP3037800B1 (en) * 2014-12-24 2018-04-04 Trioptics GmbH Measurement of the positions of curvature midpoints of optical areas of a single or multi-lens optical system
CN105445888B (en) 2015-12-21 2020-04-03 宁波舜宇光电信息有限公司 Adjustable optical lens and camera module and calibration method thereof
CN105445885B (en) * 2015-10-30 2019-06-18 宁波舜宇光电信息有限公司 Adjustable optical lens and camera module and manufacturing method thereof
US12105350B2 (en) 2015-10-30 2024-10-01 Ningbo Sunny Opotech Co., Ltd. Adjustable optical lens and camera module and manufacturing method and applications thereof
CN105445889B (en) * 2015-12-02 2019-01-01 宁波舜宇光电信息有限公司 Camera module using split lens and assembling method thereof
US10732376B2 (en) 2015-12-02 2020-08-04 Ningbo Sunny Opotech Co., Ltd. Camera lens module and manufacturing method thereof
TWI636291B (en) * 2017-02-03 2018-09-21 國立虎尾科技大學 Lens installation device
CN107577027A (en) * 2017-10-13 2018-01-12 南京工业职业技术学院 Camera lens and circuit board automatic focusing mechanism
CN109702467B (en) * 2018-12-07 2023-11-03 上海蔚来汽车有限公司 Automatic wheel mounting method and automatic wheel mounting device
JP7446714B2 (en) * 2019-02-01 2024-03-11 株式会社荏原製作所 Substrate processing equipment and substrate processing method
CN109916299A (en) * 2019-03-11 2019-06-21 东莞市凯融光学科技有限公司 Method for measuring eccentricity of free-form surface structure product in contact mode
JP2021009102A (en) * 2019-07-02 2021-01-28 パナソニックIpマネジメント株式会社 Holder and measuring jig
CN113064264A (en) * 2019-12-31 2021-07-02 长春长光华大智造测序设备有限公司 Image quality compensation method and device for microscopic optical system
CN113093399A (en) * 2020-01-08 2021-07-09 三营超精密光电(晋城)有限公司 Lens assembling device and lens assembling method
CN111142212A (en) * 2020-01-20 2020-05-12 浙江水晶光电科技股份有限公司 Lens eccentric debugging device
CN112114424B (en) * 2020-10-19 2024-05-28 中国科学院苏州生物医学工程技术研究所 Microscopic imaging system for microscope objective adjustment and detection
CN112484609A (en) * 2020-11-16 2021-03-12 凌卫岚 Ratio piezoelectric type rotating shaft eccentricity detection early warning device
CN116381886B (en) * 2022-10-21 2025-07-15 北京空间机电研究所 A suspended bonding transmission lens automatic assembly and adjustment platform and method

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58200126A (en) * 1982-05-18 1983-11-21 Canon Inc How to measure the eccentricity of a lens system
JPS5963316U (en) * 1982-10-22 1984-04-26 株式会社リコー lens mirror frame
JPS60150016A (en) * 1984-01-17 1985-08-07 Ricoh Co Ltd Lens system adjustment and assembly device
JPH03155512A (en) * 1989-11-14 1991-07-03 Topcon Corp Manufacture of lens
JP2000121902A (en) * 1998-10-19 2000-04-28 Canon Inc Lens system optical axis adjustment method and lens system optical axis adjustment device
JP2002333563A (en) * 2001-05-08 2002-11-22 Ricoh Co Ltd Imaging lens, optical unit, image reading device, and image forming device
JP2003039292A (en) * 2001-07-23 2003-02-12 Olympus Optical Co Ltd Lens centering device
JP2003225852A (en) * 2001-11-28 2003-08-12 Olympus Optical Co Ltd Method and device for sticking lens
JP2007327771A (en) * 2006-06-06 2007-12-20 Fujinon Corp Method of measuring amount of eccentricity
JP2008298739A (en) * 2007-06-04 2008-12-11 Fujinon Corp Eccentricity amount measuring device
JP2008304200A (en) * 2007-06-05 2008-12-18 Fujinon Corp Method for adjusting height position of eccentricity measuring head

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2031931U (en) * 1988-01-26 1989-02-01 中国科学院长春光机所 Photoelectric automatic centering device for optical lenses
JP2005055202A (en) * 2003-08-06 2005-03-03 Mitsutoyo Corp Eccentricity measuring device, lens mounting method, and eccentricity measuring method for lens
CN100588934C (en) * 2005-06-07 2010-02-10 富士能株式会社 Eccentricity measurement method
JP2007049873A (en) * 2005-08-12 2007-02-22 Fujinon Corp Actuator
JP2008096197A (en) * 2006-10-10 2008-04-24 Olympus Corp Device for measuring eccentricity
KR100930169B1 (en) * 2007-09-28 2009-12-07 삼성전기주식회사 Lens assembly
CN101387761B (en) * 2008-10-08 2011-10-12 上海微电子装备有限公司 Center aligning assembling and regulating apparatus and method for optical system

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58200126A (en) * 1982-05-18 1983-11-21 Canon Inc How to measure the eccentricity of a lens system
JPS5963316U (en) * 1982-10-22 1984-04-26 株式会社リコー lens mirror frame
JPS60150016A (en) * 1984-01-17 1985-08-07 Ricoh Co Ltd Lens system adjustment and assembly device
JPH03155512A (en) * 1989-11-14 1991-07-03 Topcon Corp Manufacture of lens
JP2000121902A (en) * 1998-10-19 2000-04-28 Canon Inc Lens system optical axis adjustment method and lens system optical axis adjustment device
JP2002333563A (en) * 2001-05-08 2002-11-22 Ricoh Co Ltd Imaging lens, optical unit, image reading device, and image forming device
JP2003039292A (en) * 2001-07-23 2003-02-12 Olympus Optical Co Ltd Lens centering device
JP2003225852A (en) * 2001-11-28 2003-08-12 Olympus Optical Co Ltd Method and device for sticking lens
JP2007327771A (en) * 2006-06-06 2007-12-20 Fujinon Corp Method of measuring amount of eccentricity
JP2008298739A (en) * 2007-06-04 2008-12-11 Fujinon Corp Eccentricity amount measuring device
JP2008304200A (en) * 2007-06-05 2008-12-18 Fujinon Corp Method for adjusting height position of eccentricity measuring head

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114001931A (en) * 2021-11-02 2022-02-01 Oppo广东移动通信有限公司 Test device and test method of imaging component
CN114001931B (en) * 2021-11-02 2024-04-30 Oppo广东移动通信有限公司 Imaging component testing device and testing method
CN114967024A (en) * 2022-06-24 2022-08-30 江西弘耀光学水晶有限公司 High-precision optical lens eccentricity adjusting structure and method
CN114967024B (en) * 2022-06-24 2024-04-12 江西弘耀光学水晶有限公司 High-precision optical lens eccentric adjustment structure and method

Also Published As

Publication number Publication date
CN101907758A (en) 2010-12-08
CN101907758B (en) 2013-11-06
KR20100131945A (en) 2010-12-16
KR101299509B1 (en) 2013-08-29
JP5222796B2 (en) 2013-06-26

Similar Documents

Publication Publication Date Title
JP5222796B2 (en) Optical element eccentricity adjustment assembly method and eccentricity adjustment assembly apparatus
JP4943946B2 (en) Eccentricity measuring device
US11977212B2 (en) Stand for an optical observation unit, optical observation apparatus, method for calibrating an optical observation apparatus, and computer program
KR101808388B1 (en) Probe apparatus and probe method
EP2177870A1 (en) Optical wave interference measuring apparatus
CN110174240B (en) Device and method for measuring at least one optically effective object
JP2012078330A (en) Method for adjusting movement of camera unit in lens inspection apparatus and focus check tool
JP2008528141A (en) Apparatus and method for measuring aberration in eye to be examined
CN1932432B (en) light wave interference device
US20110134417A1 (en) Instrument and method for characterising an optical system
US9595094B2 (en) Measuring form changes of a substrate
CN114089594A (en) A method and device for moving a target along the optical axis of a camera
CN101210857A (en) Lens eccentricity detection system and method
JP2000121902A (en) Lens system optical axis adjustment method and lens system optical axis adjustment device
JP2010096516A (en) Eccentricity measuring device and method of measuring eccentricity
JP3410896B2 (en) Method and apparatus for measuring eccentricity of aspherical lens
JP2012242085A (en) Measured object holding position correction method of curvature radius measuring instrument and curvature radius measuring instrument
JP2008304200A (en) Method for adjusting height position of eccentricity measuring head
CN115460399A (en) Test equipment and test method for camera module
JP5317619B2 (en) Eccentricity measurement method
WO2013051147A1 (en) Image acquisition apparatus adjustment method, image acquisition apparatus, and image acquisition apparatus manufacturing method
JP2009300569A (en) Method and device for adjusting optical axis of lens unit
JP4709642B2 (en) Wavefront aberration measuring device
JP2009294353A (en) Lens unit optical axis adjusting method and lens unit optical axis adjusting device
JPH11211611A (en) Eccentricity measuring apparatus

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20111209

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20121031

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20121114

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121227

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130213

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130311

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160315

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 5222796

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees