JP2010021302A - Printed wiring board - Google Patents
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- JP2010021302A JP2010021302A JP2008179688A JP2008179688A JP2010021302A JP 2010021302 A JP2010021302 A JP 2010021302A JP 2008179688 A JP2008179688 A JP 2008179688A JP 2008179688 A JP2008179688 A JP 2008179688A JP 2010021302 A JP2010021302 A JP 2010021302A
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- Prior art keywords
- electroless plating
- deposited
- thickness
- wiring board
- printed wiring
- Prior art date
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- Pending
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- 238000007772 electroless plating Methods 0.000 claims abstract description 138
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- 239000010949 copper Substances 0.000 description 40
- 238000007747 plating Methods 0.000 description 40
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- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 1
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Landscapes
- Structure Of Printed Boards (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
プリント配線板に関する。 The present invention relates to a printed wiring board.
近年、電子機器の高性能化、高機能化、小型化が急速に進んでおり、これに伴って電子機器に用いられる電子部品に対しても小型化、軽量化の要請が高まっている。上記要請を受け、半導体素子パッケージ方法やそれらを実装する配線板にも、より高密度、高機能、かつ高性能なものが求められるようになっている。 2. Description of the Related Art In recent years, electronic devices have been rapidly improved in performance, function, and size, and accordingly, there is an increasing demand for downsizing and weight reduction of electronic components used in electronic devices. In response to the above requirements, semiconductor device packaging methods and wiring boards on which they are mounted are required to have higher density, higher functionality, and higher performance.
プリント配線板を得る方法として、フルアディティブプリント配線板を挙げることができる。 As a method for obtaining a printed wiring board, a full additive printed wiring board can be exemplified.
従来のフルアディティブプリント配線板の製造方法としては、無電解めっき触媒を含有するガラスエポキシ基板上に無電解めっき触媒を含有した接着剤層を塗布形成し、積層体を得る。次いで、該積層体に選択的にスルーホールを形成する。 次いで、デスミア除去を行い、その後スルーホール内に無電解銅めっき触媒を付与し、スクリーン印刷法により永久レジスト層を塗布形成する。次いで、該永久レジストを露光、現像等の方法によりパターニングを施し、さらに無電解めっきを施すことにより、所望の箇所に配線を得る、という方法を挙げることができる(例えば、特許文献1参照)。尚、無電解めっきのみにより厚膜の配線層を形成する手法がフルアディティブ工法と呼ばれており、サブトラクティブ工法、セミアディティブ工法、と区別される。 As a conventional method for producing a full additive printed wiring board, an adhesive layer containing an electroless plating catalyst is applied and formed on a glass epoxy substrate containing an electroless plating catalyst to obtain a laminate. Next, through holes are selectively formed in the laminate. Next, desmear removal is performed, after which an electroless copper plating catalyst is applied in the through hole, and a permanent resist layer is applied and formed by a screen printing method. Next, there is a method in which the permanent resist is patterned by a method such as exposure and development, and further electroless plating is performed to obtain a wiring at a desired location (see, for example, Patent Document 1). A method of forming a thick wiring layer only by electroless plating is called a full additive method, and is distinguished from a subtractive method and a semi-additive method.
しかしながら、上記の製造方法においては、活性を保持した無電解めっき触媒が絶縁樹脂全面に含有されているという理由から、特に微細配線においては、無電解めっき触媒が存在する箇所での異常析出により配線同士が導通してしまい、絶縁信頼性が低下するという問題が生じていた。
本発明は、上記の課題に鑑みてなされたものであって、その目的は、層内のみならず、層間の絶縁信頼性が高いプリント配線板を提供することにある。 The present invention has been made in view of the above problems, and an object of the present invention is to provide a printed wiring board having high insulation reliability between layers as well as within the layers.
本発明者は、上記の課題に鑑み鋭意検討した結果、配線間には実質的に無電解めっき触媒を存在させず、且つ配線厚みXと絶縁層厚みYとの厚みの比X/Yを特定範囲にすることで課題解決できることを見出し、本発明を完成させるに至った。 As a result of intensive investigations in view of the above problems, the present inventors have determined that the ratio X / Y of the thickness between the wiring thickness X and the insulating layer thickness Y is substantially absent between the wirings and the wiring thickness X and the insulating layer thickness Y are specified. The inventors have found that the problem can be solved by making the range, and have completed the present invention.
即ち、本発明は、配線及び絶縁材料を含むプリント配線板であり、該プリント配線板の配線間には実質的に無電解めっき触媒が存在せず、且つ配線厚みXと絶縁層厚みYとの厚みの比X/Yが0.01〜0.5の範囲であることを特徴とするプリント配線板に関する。また、前記プリント配線板は、絶縁層に溝を形成し、形成した溝の内部に無電解めっきを析出せしめることにより配線形成する工程を少なくとも含む製造方法により製造されることが好ましい。また、絶縁層の少なくとも一部に、硫黄を有する化合物、クロムを有する化合物及びオキシム構造を有する化合物からなる群から選択される少なくとも一つの化合物を含有することが好ましい。 That is, the present invention is a printed wiring board containing wiring and an insulating material, and there is substantially no electroless plating catalyst between the wirings of the printed wiring board, and the wiring thickness X and insulating layer thickness Y The present invention relates to a printed wiring board having a thickness ratio X / Y in the range of 0.01 to 0.5. The printed wiring board is preferably manufactured by a manufacturing method including at least a step of forming a wiring by forming a groove in an insulating layer and depositing electroless plating inside the formed groove. Further, it is preferable that at least a part of the insulating layer contains at least one compound selected from the group consisting of a compound having sulfur, a compound having chromium, and a compound having an oxime structure.
本発明に係るプリント配線板は、微細配線形成性、内のみならず、層間の絶縁信頼性に優れる。 The printed wiring board according to the present invention is excellent not only in the fine wiring formability but also in the insulation reliability between layers.
本発明の実施の形態について、以下に説明する。 Embodiments of the present invention will be described below.
(プリント配線板)
本発明のプリント配線板は、配線及び絶縁材料を含むプリント配線板であり、該プリント配線板の配線間には実質的に無電解めっき触媒が存在せず、且つ配線厚みXと絶縁層厚みYとの厚みの比X/Yが0.01〜0.5の範囲であることを特徴とする。配線間に無電解めっき触媒が存在しないため、層内の絶縁信頼性が高い。また、配線厚みよりも十分に厚い絶縁層を形成することにより、層間の絶縁信頼性にも優れるという利点を有する。
このようなプリント配線板は、絶縁層に溝を形成し、形成した溝の内部に無電解めっきを析出せしめることにより配線形成する工程を少なくとも含む製造方法により製造されることが好ましい。この場合の無電解めっきはフルアディティブタイプの無電解めっきが用いられることになる。
(Printed wiring board)
The printed wiring board of the present invention is a printed wiring board containing wiring and an insulating material. There is substantially no electroless plating catalyst between the wirings of the printed wiring board, and the wiring thickness X and the insulating layer thickness Y. The thickness ratio X / Y is in the range of 0.01 to 0.5. Since there is no electroless plating catalyst between the wires, the insulation reliability within the layer is high. In addition, by forming an insulating layer sufficiently thicker than the wiring thickness, there is an advantage that insulation reliability between layers is excellent.
Such a printed wiring board is preferably manufactured by a manufacturing method including at least a step of forming a wiring by forming a groove in the insulating layer and depositing electroless plating inside the formed groove. In this case, a full additive type electroless plating is used for the electroless plating.
また、絶縁層には、溝を形成した箇所には無電解めっきが析出し、それ以外の箇所には無電解めっきが析出しない特徴を有することが好ましい。 Moreover, it is preferable that the insulating layer has a characteristic that electroless plating is deposited at the locations where the grooves are formed, and electroless plating is not deposited at other locations.
ここで、本発明でいうプリント配線板は、絶縁層上に導電性の配線パターンを形成した板のことを言い、少なくとも配線と絶縁層とから構成されてなる。 Here, the printed wiring board referred to in the present invention refers to a board in which a conductive wiring pattern is formed on an insulating layer, and is composed of at least wiring and an insulating layer.
また、本発明において、無電解めっき触媒が実質的に存在しないとは、該当する箇所をXPS分析し、算出した原子濃度で0.2%以下であることを言う。 Further, in the present invention, the fact that the electroless plating catalyst is substantially absent means that the corresponding portion is subjected to XPS analysis and the calculated atomic concentration is 0.2% or less.
(絶縁層)
本発明のプリント配線板を構成する絶縁層について説明する。
(Insulating layer)
The insulating layer constituting the printed wiring board of the present invention will be described.
本発明のプリント配線板に好ましく適用可能な絶縁層は、溝を形成した箇所には無電解めっきが析出し、それ以外の箇所には無電解めっきが析出しない特徴を有することが好ましい。 It is preferable that the insulating layer preferably applicable to the printed wiring board of the present invention has a characteristic that electroless plating is deposited at a location where a groove is formed and electroless plating is not deposited at other locations.
上記のように溝を形成した箇所には無電解めっきが析出し、それ以外の箇所には無電解めっきが析出しない特徴を有する絶縁層の好ましい態様の一つは、無電解めっきが析出しない絶縁材料で、溝を形成した箇所のみ特異的に無電解めっきが析出する絶縁材料を用いた絶縁層である。溝を形成した箇所のみ特異的に無電解めっきを析出せしめるには、例えば、レーザー照射により溝を形成する手法を適用する場合、溝形成された箇所の樹脂表面がレーザー照射による化学的な改質、あるいは物理的な改質のいずれか、あるいは両者を利用して無電解めっきが形成されるようにすれば良い。 One of the preferred embodiments of the insulating layer having the characteristic that the electroless plating is deposited at the location where the groove is formed as described above and the electroless plating is not deposited at the other location is an insulation where the electroless plating is not deposited. It is an insulating layer using an insulating material in which electroless plating is specifically deposited only at a portion where a groove is formed. In order to deposit electroless plating specifically only at the location where the groove is formed, for example, when applying a method of forming the groove by laser irradiation, the resin surface of the groove formed portion is chemically modified by laser irradiation. Alternatively, the electroless plating may be formed by utilizing either or both of the physical modification or both.
また、別の好ましい態様の一つは、無電解めっきが析出する絶縁材料で、表面のみ無電解めっきが析出しない絶縁層である。表面のみ無電解めっきが析出せしめないためには、例えば、レーザー照射により溝を形成する手法を適用する場合、溝形成された箇所の樹脂表面がレーザー照射による化学的な改質、あるいは物理的な改質のいずれか、あるいは両者を利用して無電解めっきが形成されないようにすれば良い。 Another preferred embodiment is an insulating material on which electroless plating is deposited, and an insulating layer on which electroless plating is not deposited only on the surface. In order to prevent electroless plating from depositing only on the surface, for example, when applying a technique of forming grooves by laser irradiation, the resin surface of the groove-formed portion is chemically modified by laser irradiation or physically Any one or both of the modifications may be used so that the electroless plating is not formed.
また、絶縁層を、無電解めっきが析出しない絶縁樹脂層/無電解めっきが析出する絶縁樹脂層からなる構成にしておき、無電解めっきが析出しない絶縁樹脂層を除去し、無電解めっきが析出する層を露出させるように溝を形成すれば、溝を形成した箇所のみ無電解めっきを析出せしめることができる。 Also, the insulating layer is composed of an insulating resin layer on which electroless plating is not deposited / an insulating resin layer on which electroless plating is deposited, and the insulating resin layer on which electroless plating is not deposited is removed to deposit electroless plating. If the groove is formed so that the layer to be exposed is exposed, the electroless plating can be deposited only at the portion where the groove is formed.
ここで、無電解めっきが析出しない絶縁材料について説明する。 Here, an insulating material on which electroless plating is not deposited will be described.
本発明において、無電解めっきが析出しないとは、無電解めっきが析出する箇所に無電解めっきがaμmの厚みだけ析出するときに、a×(1/7)μm以下の厚みだけ析出すること、と定義される。例えば、無電解めっきが析出する箇所に、7μmの厚みだけ無電解めっきが析出する際に、無電解めっきが析出しない絶縁材料には1μm以下の厚みだけ無電解めっきが析出する。ここで、a×(1/7)μm以下の厚みだけ析出した無電解めっき層は、酸性水溶液でのソフトエッチング等の公知の方法により除去することができる。従って、最終的には、無電解めっきが析出しない絶縁材料上には実質的に無電解めっきは形成されていないことになり、電気絶縁性を保つことができる。勿論、無電解めっきが析出しない絶縁材料上に実質的に無電解めっきが析出していない場合は、ソフトエッチング等を行う必要はない。 In the present invention, electroless plating does not deposit means that when electroless plating is deposited to a thickness of a μm at a location where electroless plating is deposited, a thickness of a × (1/7) μm or less is deposited. Is defined. For example, when electroless plating is deposited to a thickness of 7 μm at a location where electroless plating is deposited, the electroless plating is deposited to a thickness of 1 μm or less on an insulating material on which electroless plating is not deposited. Here, the electroless plating layer deposited by a thickness of a × (1/7) μm or less can be removed by a known method such as soft etching with an acidic aqueous solution. Therefore, finally, the electroless plating is not substantially formed on the insulating material on which the electroless plating does not deposit, and the electrical insulation can be maintained. Of course, when the electroless plating is not substantially deposited on the insulating material on which the electroless plating is not deposited, it is not necessary to perform soft etching or the like.
本発明に係る無電解めっきが析出しない絶縁材料は、無電解めっき触媒が付与されないために無電解めっきが析出しない絶縁材料であってもよく、無電解めっき触媒は付与されているが、触媒活性を示さないため無電解めっきが析出しない絶縁材料であってもよく、無電解めっき触媒は付与されているが、触媒活性が低いため、電解めっきが析出する樹脂層に無電解めっきがaμmの厚みだけ析出するときに、a×(1/7)μm以下の厚みだけ析出する絶縁材料であってもよい。 The insulating material that does not deposit electroless plating according to the present invention may be an insulating material that does not deposit electroless plating because no electroless plating catalyst is applied. Insulating material that does not deposit electroless plating may be used, and an electroless plating catalyst is provided, but since the catalytic activity is low, the electroless plating has a thickness of a μm on the resin layer on which electrolytic plating is deposited. Alternatively, an insulating material that deposits only by a thickness of a × (1/7) μm or less may be used.
上記無電解めっき触媒が付与されないためには、無電解めっき触媒と無電解めっきが析出しない絶縁材料表面とが相互作用しないような状態であればよい。例えば、無電解めっき触媒がアミノ基と相互作用して吸着するという特徴を有している場合、樹脂層表面にアミノ基を導入しないようにせしめることで無電解めっき触媒の付与を阻害することができる。 In order to prevent the electroless plating catalyst from being applied, the electroless plating catalyst and the insulating material surface on which the electroless plating is not deposited may be in a state where they do not interact with each other. For example, when the electroless plating catalyst has a feature of interacting with and adsorbing amino groups, it can inhibit the application of the electroless plating catalyst by preventing the amino groups from being introduced into the resin layer surface. it can.
また、無電解めっきが析出しない絶縁材料表面の触媒濃度が、XPS分析により算出した原子濃度で0.2%以下であれば、無電解めっきが析出しない傾向にあるため好ましい。0.2%より触媒濃度が高いと、無電解めっきが析出しやすい状態となる。 Further, if the catalyst concentration on the surface of the insulating material where electroless plating does not deposit is 0.2% or less as the atomic concentration calculated by XPS analysis, electroless plating tends not to deposit, which is preferable. When the catalyst concentration is higher than 0.2%, the electroless plating is likely to be deposited.
上記無電解めっき触媒は付与されているが、触媒活性を示さないためには、無電解めっきが析出しない絶縁材料表面に、無電解めっき触媒に対して触媒毒を示す化合物を露出せしめれば良い。触媒毒を示す化合物を露出せしめるには、無電解めっきが析出しない絶縁材料に触媒毒を示す化合物を添加しておいても良いし、表面に塗布乾燥する等の方法で表層に形成しても良い。例えば、無電解めっき触媒がリン系化合物との相互作用により触媒活性を失う場合、樹脂層にリン系化合物を添加する、もしくは樹脂層表面にリン系化合物を塗布、乾燥する、等の方法により無電解めっき触媒の触媒活性を失活させることができる。 Although the above electroless plating catalyst is provided, in order not to show catalytic activity, a compound showing a catalyst poison for the electroless plating catalyst may be exposed on the surface of the insulating material where the electroless plating does not deposit. . In order to expose the compound showing the catalyst poison, the compound showing the catalyst poison may be added to the insulating material on which the electroless plating is not deposited, or it may be formed on the surface layer by a method such as coating and drying on the surface. good. For example, when the electroless plating catalyst loses catalytic activity due to the interaction with the phosphorus compound, the phosphorus compound is added to the resin layer, or the phosphorus compound is applied to the surface of the resin layer and dried. The catalytic activity of the electroplating catalyst can be deactivated.
また、例えば、無電解めっき触媒、特には無電解銅めっき触媒として一般的に用いられるパラジウム触媒を用いる場合は、パラジウムは硫黄を有する化合物、クロムを有する化合物により被毒されるため、これらの化合物を塗布、乾燥する、等の方法により無電解めっき触媒の触媒活性を失活させることができる。 In addition, for example, when using an electroless plating catalyst, particularly a palladium catalyst generally used as an electroless copper plating catalyst, palladium is poisoned by a compound having sulfur and a compound having chromium. The catalytic activity of the electroless plating catalyst can be deactivated by a method such as coating and drying.
また、パラジウムは、オキシム構造を有する化合物によっても被毒されることを筆者らは発見した。これは、オキシム構造を有する化合物とパラジウムとが錯体を形成するためと考えられる。オキシム構造を有する化合物としては、1,2−オクタンジオン−,1−[4−(フェニルチオ)−,2−(O−ベンゾイルオキシム)]、エタノン,1−[9−エチル−6−(2−メチルベンゾイル)−9H−カルバゾール−3−イル]−,1−(0−アセチルオキシム)、等を挙げることができる。オキシム構造を有する化合物についても上記と同様の方法により無電解めっき触媒の触媒活性を失活させることができる。 The authors also discovered that palladium is poisoned by compounds having an oxime structure. This is considered because the compound having an oxime structure and palladium form a complex. Examples of the compound having an oxime structure include 1,2-octanedione-, 1- [4- (phenylthio)-, 2- (O-benzoyloxime)], ethanone, 1- [9-ethyl-6- (2- Methylbenzoyl) -9H-carbazol-3-yl]-, 1- (0-acetyloxime), and the like. For the compound having an oxime structure, the catalytic activity of the electroless plating catalyst can be deactivated by the same method as described above.
本発明の無電解めっきが析出しない絶縁材料には、機械特性の向上や難燃性を付与する等の目的で、熱可塑性樹脂、熱硬化性樹脂、フィラー、難燃剤、等を適宜添加しても良い。 To the insulating material on which the electroless plating of the present invention is not deposited, a thermoplastic resin, a thermosetting resin, a filler, a flame retardant, etc. are appropriately added for the purpose of improving mechanical properties and imparting flame retardancy. Also good.
次に無電解めっきが析出する絶縁材料について説明する。 Next, an insulating material on which electroless plating is deposited will be described.
本発明に係る無電解めっきが析出する樹脂層は、無電解めっきが析出しさえすればいかなる絶縁材料を用いても良い。 As the resin layer on which the electroless plating according to the present invention is deposited, any insulating material may be used as long as the electroless plating is deposited.
本発明に係る無電解めっきが析出する絶縁材料に無電解めっきを析出せしめる方法としては、無電解めっきを直接析出せしめる方法、パラジウム触媒等の無電解めっき触媒を付与した後に、パラジウムを核として無電解銅めっきを析出せしめる方法、等を挙げることができるが、無電解銅めっきをまんべんなく均一に析出せしめるという観点から、パラジウム触媒等の無電解めっき触媒を付与した後に、無電解めっき触媒を核として無電解銅めっきを析出せしめる方法が好ましい。上記無電解めっき触媒を核として無電解めっきを析出せしめる方法を採用するという観点、また、得られるプリント配線板の絶縁性や耐熱性などの観点から、本発明に係る無電解めっきが析出する樹脂層には、エポキシ樹脂および/またはポリイミド樹脂を含有することが好ましく、ポリイミド樹脂を含むことがさらに好ましい。また、無電解めっきとの接着性の観点から、熱可塑性のポリイミド樹脂を含有することが特に好ましい。 As a method for depositing electroless plating on an insulating material on which electroless plating according to the present invention is deposited, a method in which electroless plating is directly deposited, an electroless plating catalyst such as a palladium catalyst is applied, and then palladium is used as a nucleus. The method of depositing the electrolytic copper plating, etc. can be mentioned, but from the viewpoint of depositing the electroless copper plating evenly and uniformly, after applying an electroless plating catalyst such as a palladium catalyst, the electroless plating catalyst is used as a core. A method of depositing electroless copper plating is preferred. Resin from which the electroless plating according to the present invention is deposited from the viewpoint of adopting a method of depositing electroless plating using the electroless plating catalyst as a core, and from the viewpoint of insulation and heat resistance of the obtained printed wiring board. The layer preferably contains an epoxy resin and / or a polyimide resin, and more preferably contains a polyimide resin. Moreover, it is especially preferable to contain a thermoplastic polyimide resin from the viewpoint of adhesiveness with electroless plating.
本発明の無電解めっきが析出する絶縁材料には、機械特性の向上や難燃性を付与する等の目的で、熱可塑性樹脂、熱硬化性樹脂、フィラー、難燃剤、等を適宜添加しても良い。 To the insulating material on which the electroless plating of the present invention is deposited, a thermoplastic resin, a thermosetting resin, a filler, a flame retardant, etc. are appropriately added for the purpose of improving mechanical properties and imparting flame retardancy. Also good.
本発明のプリント配線板においては、配線厚みXと絶縁層厚みYとの厚みの比X/Yが0.01〜0.5の範囲であることを特徴とする。本発明における配線厚みXとは、無電解めっきにより形成される配線の厚みを指す。また、絶縁層厚みYとは、絶縁層単層で作製されるプリント配線板の場合は、絶縁層の厚みそのもののことであり、絶縁材料を内層配線板に積層して作製されるプリント配線板の場合は、積層して形成した後の絶縁層の厚みのことを指す。X/Yが0.5よりも大きい場合、層間の絶縁信頼性が十分に得られない恐れがあり、X/Yが0.01よりも小さい場合、層間の絶縁信頼性は十分に得られるものの、配線厚みが薄いため、配線としての機能を果たさない恐れがある。 In the printed wiring board of the present invention, the thickness ratio X / Y between the wiring thickness X and the insulating layer thickness Y is in the range of 0.01 to 0.5. The wiring thickness X in the present invention refers to the thickness of wiring formed by electroless plating. The insulating layer thickness Y is the thickness of the insulating layer itself in the case of a printed wiring board made of a single insulating layer, and is a printed wiring board made by laminating an insulating material on an inner wiring board. In this case, it refers to the thickness of the insulating layer after being laminated. When X / Y is larger than 0.5, there is a risk that sufficient insulation reliability between layers may not be obtained. When X / Y is smaller than 0.01, insulation reliability between layers is sufficiently obtained. Since the wiring thickness is thin, the wiring function may not be achieved.
(無電解めっき)
本発明に用いられる無電解めっきとしては特に限定はなく、カーボン、パラジウム触媒、有機マンガン導電膜等を用いるダイレクトプレーティング、無電解銅めっき、無電解ニッケルめっき、無電解金めっき、無電解銀めっき、無電解錫めっき、等を挙げる事ができ本発明に使用可能である。
(Electroless plating)
The electroless plating used in the present invention is not particularly limited. Direct plating using carbon, palladium catalyst, organic manganese conductive film, etc., electroless copper plating, electroless nickel plating, electroless gold plating, electroless silver plating , Electroless tin plating and the like, and can be used in the present invention.
上記の中でも、生産性や耐マイグレーション性等の電気特性の観点より、無電解銅めっき、無電解ニッケルめっきが好ましく、無電解めっきの中でも、無電解銅めっきが特に好ましい。以下、無電解銅めっきについて説明する。 Among these, electroless copper plating and electroless nickel plating are preferable from the viewpoint of electrical characteristics such as productivity and migration resistance, and among electroless plating, electroless copper plating is particularly preferable. Hereinafter, electroless copper plating will be described.
本発明のプリント配線板を構成する絶縁材料に無電解銅めっきを析出せしめる方法としては、無電解銅めっきを直接析出せしめる方法、パラジウム触媒等の無電解銅めっき触媒を付与した後に、無電解銅めっき触媒を核として無電解銅めっきを析出せしめる方法、等を挙げることができるが、無電解銅めっきをまんべんなく均一に析出せしめるという観点から、パラジウム触媒等の無電解銅めっき触媒を付与した後に、パラジウムを核として無電解銅めっきを析出せしめる方法が好ましい。 As a method for depositing electroless copper plating on the insulating material constituting the printed wiring board of the present invention, a method for directly depositing electroless copper plating, an electroless copper plating catalyst such as a palladium catalyst is applied, and then electroless copper plating is applied. A method of depositing electroless copper plating with a plating catalyst as a core, etc. can be mentioned, but from the viewpoint of depositing electroless copper plating uniformly, after applying an electroless copper plating catalyst such as a palladium catalyst, A method of depositing electroless copper plating using palladium as a nucleus is preferred.
ここで、本発明で言う無電解めっき触媒とは、析出させる金属を絶縁層上に選択的に形成せしめる触媒の事をいい、例えば無電解銅めっきであれば、上述のようにパラジウム触媒等に限らず、銅イオン、金属銅、等も含む。 Here, the electroless plating catalyst referred to in the present invention refers to a catalyst that selectively forms a metal to be deposited on an insulating layer. For example, in the case of electroless copper plating, a palladium catalyst or the like is used as described above. Not limited to copper ions, metallic copper, and the like.
無電解めっきの厚みとしては、特に限定はなく、所望の導体層厚みまで析出させればよいが、微細配線形成という観点からは、無電解めっき厚みは1μm〜30μmの範囲であることが好ましい。 The thickness of the electroless plating is not particularly limited and may be deposited up to a desired conductor layer thickness. However, from the viewpoint of forming fine wiring, the electroless plating thickness is preferably in the range of 1 μm to 30 μm.
また、5μm以下程度の厚みで無電解めっきを形成した後、電解めっきにより所望の導体層厚みまで析出せしめても良い。 Moreover, after forming electroless plating with a thickness of about 5 μm or less, it may be deposited up to a desired conductor layer thickness by electrolytic plating.
また、溝を形成した箇所に生じたスミアを除去する目的で、無電解銅めっきを施す前にデスミア工程を取り入れても構わない。デスミアは、湿式のデスミア、ドライデスミア、等いずれの方法を用いても構わない。 Further, a desmear process may be introduced before the electroless copper plating for the purpose of removing smear generated at the location where the groove is formed. As the desmear, any method such as wet desmear or dry desmear may be used.
湿式のデスミアの場合、用いる液は市販のデスミア薬液、工程を用いることが可能であるが、一般的には、膨潤、粗化、中和、の3工程からなり、粗化工程には過マンガン酸カリウム、過マンガン酸ナトリウムのアルカリ水溶液が用いられる。 In the case of wet desmear, it is possible to use a commercially available desmear chemical solution and process, but generally it consists of three steps of swelling, roughening, and neutralization. An alkaline aqueous solution of potassium acid or sodium permanganate is used.
ドライデスミアの場合、プラズマを用いる場合、コロナを用いる場合、等を例示することができる。いずれの場合も、常圧下、減圧下の両者を実施可能である。
(プリント配線板の製造方法)
本発明のプリント配線板の製造法の一例を示す。
本発明のプリント配線板は、絶縁材料に溝を形成し、形成した溝のみに無電解めっきを析出せしめることで製造することができる。
In the case of dry desmear, the case of using plasma, the case of using corona, etc. can be exemplified. In either case, both normal pressure and reduced pressure can be performed.
(Printed wiring board manufacturing method)
An example of the manufacturing method of the printed wiring board of this invention is shown.
The printed wiring board of the present invention can be manufactured by forming grooves in an insulating material and depositing electroless plating only in the formed grooves.
用いる絶縁材料は上述したとおりであるが、大きく分類すると、溝を形成した箇所には無電解めっきが析出し、それ以外の箇所には無電解めっきが析出しない特徴を有する絶縁材料、若しくは、無電解めっきが析出する絶縁材料で、表面のみ無電解めっきが析出しない絶縁材料である。 The insulating material to be used is as described above. However, when roughly classified, the electroless plating is deposited at the location where the groove is formed, and the insulating material having the characteristic that the electroless plating is not deposited at the other location, or This is an insulating material on which electrolytic plating is deposited, and is an insulating material on which electroless plating is not deposited only on the surface.
溝を形成する方法としては、フォト、レーザー、機械的切削、等の公知の方法を適用すれば良い。 As a method for forming the groove, a known method such as photo, laser, or mechanical cutting may be applied.
その後、必要に応じてデスミア処理を施した後、無電解銅めっきを行ない、溝を形成した箇所にのみ配線形成する。 Thereafter, desmear treatment is performed as necessary, and then electroless copper plating is performed to form a wiring only at the location where the groove is formed.
以上、本発明のプリント配線板の製造方法の一例を示したが、もちろん、これに限定されるものではない。 As mentioned above, although the example of the manufacturing method of the printed wiring board of this invention was shown, of course, it is not limited to this.
以下、実施例および比較例に基づいて本発明をより具体的に説明するが、本発明はこれらに限定されるものではない。なお、実施例および比較例における微細配線形成性は、次のようにして評価した。 EXAMPLES Hereinafter, although this invention is demonstrated more concretely based on an Example and a comparative example, this invention is not limited to these. In addition, the fine wiring formability in an Example and a comparative example was evaluated as follows.
〔微細配線形成性〕
実施例ならびに比較例で得られたプリント配線板について、配線幅/配線間隔=10μm/10μmの配線形成箇所で導通が確認されなかった場合を合格、導通が確認された場合を不合格とした。
[Fine wiring formability]
About the printed wiring board obtained by the Example and the comparative example, the case where conduction | electrical_connection was not confirmed by the wiring formation location of wiring width / wiring space | interval = 10micrometer / 10micrometer was made into pass, and the case where conduction was confirmed was made disqualified.
(合成例1;熱可塑性ポリイミド前駆体の合成)
容量2000mlのガラス製フラスコにDMF58.46g、1,3−ビス(3−アミノフェノキシ)ベンゼンを29.23g(0.1mol)を加え、窒素雰囲気下で撹拌しながら溶解させ、次いで3,3’,4,4’−ビフェニルエーテルテトラカルボン酸二無水物31.02g(0.1mol)を添加し、20℃で約3時間撹拌し、ポリアミド酸溶液1を得た。
(Synthesis Example 1; Synthesis of thermoplastic polyimide precursor)
To a glass flask having a volume of 2000 ml, 58.46 g of DMF and 29.23 g (0.1 mol) of 1,3-bis (3-aminophenoxy) benzene were added and dissolved under stirring in a nitrogen atmosphere. , 4,4′-biphenyl ether tetracarboxylic dianhydride 31.02 g (0.1 mol) was added and stirred at 20 ° C. for about 3 hours to obtain a polyamic acid solution 1.
(合成例2;熱可塑性ポリイミド樹脂の合成)
容量2000mlのガラス製フラスコに、両末端アミノ変性シリコーンオイル(信越化学工業株式会社製KF−8010)を37g(0.045mol)と、4,4’−ジアミノジフェニルエーテル21g(0.105mol)と、DMFとを投入し、撹拌しながら溶解させ、4,4´−(4,4´−イソプロピリデンジフェノキシ)ビス(無水フタル酸)78g(0.15mol)を添加、20℃で約1時間撹拌し、固形分濃度30%のポリアミド酸溶液を得た。上記ポリアミド酸溶液をフッ素コートしたバットにとり、真空オーブンで、200℃、120分、665Paで減圧加熱し、ポリイミド樹脂2を得た。
(Synthesis Example 2: Synthesis of thermoplastic polyimide resin)
In a glass flask with a volume of 2000 ml, 37 g (0.045 mol) of amino acid-modified silicone oil (KF-8010, manufactured by Shin-Etsu Chemical Co., Ltd.), 21 g (0.105 mol) of 4,4′-diaminodiphenyl ether, and DMF And dissolved with stirring, 78 g (0.15 mol) of 4,4 ′-(4,4′-isopropylidenediphenoxy) bis (phthalic anhydride) was added, and the mixture was stirred at 20 ° C. for about 1 hour. A polyamic acid solution having a solid content concentration of 30% was obtained. The polyamic acid solution was put on a fluorine-coated vat and heated under reduced pressure at 665 Pa at 200 ° C. for 120 minutes in a vacuum oven to obtain polyimide resin 2.
(調合例1;無電解めっきが析出しない樹脂溶液の調合1)
合成例1で得たポリアミド酸1(固形分で換算)100重量部、ビスフェノールA EO変性ジ(メタ)アクリレート(ダイセルサイテック(株)製、製品名EB150)10重量部、ビスフェノールA EO変性ジ(メタ)アクリレート(日立化成工業(株)製、製品名FA321M)40重量部、オキシム構造を有する化合物である1,2−オクタンジオン−,1−[4−(フェニルチオ)−,2−(O−ベンゾイルオキシム)]、エタノン,1−[9−エチル−6−(2−メチルベンゾイル)−9H−カルバゾール−3−イル]−,1−(0−アセチルオキシム)(チバ・スペシャルティ・ケミカルズ(株)製イルガキュアOXE 01)2重量部、ビスフェノールAビス(ジフェニル)ホスフェート(大八化学(株)製、製品名CR−741)15重量部、を混合し、固形分重量%(Sc)=40%となるようにジオキソランを加えて均一に溶解させ、無電解めっきが析出しない樹脂溶液(a)を得た。
(Formulation Example 1; Preparation 1 of a resin solution in which electroless plating does not deposit)
100 parts by weight of polyamic acid 1 obtained in Synthesis Example 1 (in terms of solid content), 10 parts by weight of bisphenol A EO-modified di (meth) acrylate (manufactured by Daicel Cytec Co., Ltd., product name EB150), bisphenol A EO-modified di ( 1,4-octanedione-, 1- [4- (phenylthio)-, 2- (O--) which is a compound having an oxime structure, 40 parts by weight of (meth) acrylate (manufactured by Hitachi Chemical Co., Ltd., product name FA321M) Benzoyloxime)], ethanone, 1- [9-ethyl-6- (2-methylbenzoyl) -9H-carbazol-3-yl]-, 1- (0-acetyloxime) (Ciba Specialty Chemicals Co., Ltd.) Irgacure OXE 01) 2 parts by weight, bisphenol A bis (diphenyl) phosphate (manufactured by Daihachi Chemical Co., Ltd., product name CR-741) 15 The amount unit, were mixed, homogeneously dissolved by adding dioxolane so that the solid content weight% (Sc) = 40%, to obtain a resin solution (a) electroless plating is not deposited.
(調合例2;無電解めっきが析出しない樹脂溶液の調合2)
合成例2で得たポリイミド樹脂2を100重量部、オキシム構造を有する化合物であるエタノン,1−[9−エチル−6−(2−メチルベンゾイル)−9H−カルバゾール−3−イル]−,1−(0−アセチルオキシム)(チバ・スペシャルティ・ケミカルズ(株)製イルガキュアOXE 01)10重量部を混合し、固形分重量%(Sc)=20%となるようにジオキソランを加えて均一に溶解させ、無電解めっきが析出しない樹脂溶液(b)を得た。
(Formulation Example 2: Preparation 2 of a resin solution in which electroless plating does not deposit)
100 parts by weight of polyimide resin 2 obtained in Synthesis Example 2, etanone, 1- [9-ethyl-6- (2-methylbenzoyl) -9H-carbazol-3-yl]-, 1 which is a compound having an oxime structure -(0-acetyl oxime) (Irgacure OXE 01 manufactured by Ciba Specialty Chemicals Co., Ltd.) 10 parts by weight is mixed, and dioxolane is added and uniformly dissolved so that the solid content weight% (Sc) = 20%. A resin solution (b) in which electroless plating does not precipitate was obtained.
(調合例3;無電解めっきが析出する樹脂層溶液の調合1)
合成例2で得たポリイミド樹脂2をジオキソランで希釈し、固形分重量%(Sc)=20%の無電解めっきが析出する樹脂溶液(c)を得た。
(Formulation example 3; Preparation 1 of resin layer solution in which electroless plating is deposited)
The polyimide resin 2 obtained in Synthesis Example 2 was diluted with dioxolane to obtain a resin solution (c) in which electroless plating with a solid content of% by weight (Sc) = 20% is deposited.
(調合例4;接着剤溶液の調合)
容量2000mlのガラス製フラスコに、1,3−ビスー(3−アミノフェノキシ)ベンゼン87.7g(0.30mol)と、DMFを投入し、撹拌しながら溶解させ、4,4´−(4,4´−イソプロピリデンジフェノキシ)ビス(無水フタル酸)78g(0.15mol)を添加、20℃で約1時間撹拌し、固形分濃度30%ポリアミド酸のDMF溶液を得た。上記ポリアミド酸溶液をフッ素コートしたバットにとり、真空オーブンで、180℃、120分、665Paで減圧加熱し、イミドオリゴマーを得た。
ジオキソランを12g、上記イミドオリゴマー4を23g量りとり、60℃で加熱溶解した。トルエンを5.2g加えた後、撹拌しながら冷却し、エポキシ樹脂(JER152、ジャパンエポキシレジン(株)製)を15g加え、撹拌混合して、X液とした。
ジオキソランを18g、ポリイミド樹脂(ULTEM−1000−1000、GEプラスチック社製)を2g量りとり、60℃で撹拌しながら加熱溶解した。冷却した後、フィラー(SFP−130MCのフェニルアミノシラン処理品、電気化学工業(株)製、平均粒径0.53μm)を6g投入し、さらにトルエンを7.7g投入して、ミル分散し、Y液とした。
X液5.52gとY液8.77gとを量りとり、撹拌混合した後、40μm径のフィルターを用いてろ過を実施し、接着剤溶液(d)を得た。
(Formulation Example 4: Preparation of adhesive solution)
Into a glass flask having a capacity of 2000 ml, 87.7 g (0.30 mol) of 1,3-bis (3-aminophenoxy) benzene and DMF were added and dissolved while stirring, and 4,4 ′-(4,4 78 g (0.15 mol) of '-isopropylidenediphenoxy) bis (phthalic anhydride) was added and stirred at 20 ° C. for about 1 hour to obtain a DMF solution of polyamic acid having a solid content concentration of 30%. The polyamic acid solution was placed on a fluorine-coated vat and heated under reduced pressure at 180 ° C. for 120 minutes at 665 Pa in a vacuum oven to obtain an imide oligomer.
12 g of dioxolane and 23 g of the imide oligomer 4 were weighed and dissolved by heating at 60 ° C. After adding 5.2 g of toluene, the mixture was cooled while stirring, 15 g of epoxy resin (JER152, manufactured by Japan Epoxy Resin Co., Ltd.) was added, and the mixture was stirred and mixed to obtain a solution X.
18 g of dioxolane and 2 g of polyimide resin (ULTEM-1000-1000, manufactured by GE Plastics) were weighed and dissolved by heating at 60 ° C. with stirring. After cooling, 6 g of filler (SFP-130MC phenylaminosilane-treated product, manufactured by Denki Kagaku Kogyo Co., Ltd., average particle size 0.53 μm) was added, and 7.7 g of toluene was further added, followed by mill dispersion. Liquid.
5.52 g of the X solution and 8.77 g of the Y solution were weighed and mixed with stirring, followed by filtration using a 40 μm diameter filter to obtain an adhesive solution (d).
(実施例1)
支持体(商品名:ルミラーT−60、東レ(株)製;38μm)上に、無電解めっきが析出しない樹脂溶液(a)を該樹脂層の最終厚みが10μmとなるように塗布、100℃で10分間加熱して、無電解めっきが析出しない樹脂層(A)/支持体からなる絶縁材料を得た。続いて、無電解めっきが析出する樹脂溶液(c)を、該樹脂層の最終厚みが2μmとなるように塗布、60℃で1分間加熱乾燥し、無電解めっきが析出する樹脂層(C)/無電解めっきが析出しない樹脂層(A)/支持体からなる絶縁樹脂材料を得た。続いて、接着剤溶液(d)を無電解めっきが析出する樹脂層(C)上に最終厚みが38μmとなるように塗布、50℃、70℃、90℃、100℃で各34秒加熱乾燥させ、接着剤層(D)/無電解めっきが析出する樹脂層(C)/無電解めっきが析出しない樹脂層(A)/支持体からなる絶縁材料を得た。該絶縁材料の接着剤層(D)と両面銅箔付きのガラスエポキシ基板(商品番号:CS−3665D、利昌工業(株)製;銅厚み18μm)とを対向させ、1段目、温度90℃、真空引き30秒、大気開放、加圧時間30秒、及び2段目、温度110℃、圧力1MPa、加圧時間60秒なる条件にて真空ラミネートを行った後、支持体を引き剥がして、ガラスエポキシ基板/接着剤層(D)/無電解めっきが析出する樹脂層(C)/無電解めっきが析出しない樹脂層(A)からなる積層体を得た。
Example 1
On a support (trade name: Lumirror T-60, manufactured by Toray Industries, Inc .; 38 μm), a resin solution (a) in which electroless plating does not precipitate is applied so that the final thickness of the resin layer is 10 μm, 100 ° C. Was heated for 10 minutes to obtain an insulating material composed of resin layer (A) / support on which electroless plating did not deposit. Subsequently, the resin solution (c) in which electroless plating is deposited is applied so that the final thickness of the resin layer is 2 μm, and is dried by heating at 60 ° C. for 1 minute, and the resin layer (C) in which electroless plating is deposited / An insulating resin material comprising a resin layer (A) / support that does not deposit electroless plating was obtained. Subsequently, the adhesive solution (d) was applied onto the resin layer (C) on which the electroless plating was deposited so that the final thickness was 38 μm, and dried by heating at 50 ° C., 70 ° C., 90 ° C., and 100 ° C. for 34 seconds each Thus, an insulating material consisting of adhesive layer (D) / resin layer (C) on which electroless plating is deposited / resin layer (A) on which electroless plating is not deposited / support is obtained. Adhesive layer (D) of the insulating material and a glass epoxy board (product number: CS-3665D, manufactured by Risho Kogyo Co., Ltd .; copper thickness 18 μm) with double-sided copper foil are opposed to each other, the first stage, temperature 90 ° C. After vacuum lamination under the conditions of vacuum drawing 30 seconds, release to the atmosphere, pressurization time 30 seconds, and the second stage, temperature 110 ° C., pressure 1 MPa, pressurization time 60 seconds, the support is peeled off, A laminate comprising glass epoxy substrate / adhesive layer (D) / resin layer (C) on which electroless plating was deposited / resin layer (A) on which electroless plating was not deposited was obtained.
該積層体の無電解めっきが析出しない樹脂層(A)上に配線幅/配線間隔=10μm/10μmを有するマスクパターンを載せ、波長405nmの光を300mJ/cm2だけ露光した。続いて、スプレー現像機(サンハヤト(株)製エッチングマシーンES−655D)を用いて、1重量%の炭酸ナトリウム水溶液(液温40℃)を使用して、スプレー現像処理を行い、部分的に無電解めっきが析出する樹脂層(C)を露出させた。続いて、180℃で2時間加熱乾燥して、硬化させた。続いて、パラジウム触媒を付与し、無電解銅めっき(ロームアンドハース社製CUPOSIT厚付けタイプ)を施すことにより、厚みが10μmの配線を形成し、プリント配線板を得た。配線厚みXと絶縁層厚みYとの厚みの比X/Yは0.2であった。このプリント配線板の微細配線形成性を評価した結果を表1に示す。 A mask pattern having wiring width / wiring interval = 10 μm / 10 μm was placed on the resin layer (A) on which the electroless plating of the laminate was not deposited, and light having a wavelength of 405 nm was exposed by 300 mJ / cm 2 . Subsequently, using a spray developing machine (etching machine ES-655D manufactured by Sanhayato Co., Ltd.), a 1% by weight sodium carbonate aqueous solution (liquid temperature: 40 ° C.) was used to carry out a spray development process, which was partially not applied. The resin layer (C) on which electrolytic plating is deposited was exposed. Subsequently, it was dried by heating at 180 ° C. for 2 hours to be cured. Subsequently, a palladium catalyst was applied, and electroless copper plating (CUPOSIT thickening type manufactured by Rohm and Haas) was applied to form a wiring having a thickness of 10 μm to obtain a printed wiring board. The thickness ratio X / Y between the wiring thickness X and the insulating layer thickness Y was 0.2. The results of evaluating the fine wiring formability of this printed wiring board are shown in Table 1.
(実施例2)
支持体(商品名:ルミラーT−60、東レ(株)製;38μm)上に、無電解めっきが析出しない樹脂溶液(b)を該樹脂層の最終厚みが2μmとなるように塗布、60℃で2分間加熱して、無電解めっきが析出しない樹脂層(B)/支持体からなる絶縁材料を得た。続いて、無電解めっきが析出する樹脂溶液(c)を、該樹脂層の最終厚みが10μmとなるように塗布、60℃で5分間加熱乾燥し、無電解めっきが析出する樹脂層(C)/無電解めっきが析出しない樹脂層(B)/支持体からなる絶縁樹脂材料を得た。続いて、接着剤溶液(d)を無電解めっきが析出する樹脂層(C)上に最終厚みが38μmとなるように塗布、50℃、70℃、90℃、100℃で各34秒加熱乾燥させ、接着剤層(D)/無電解めっきが析出する樹脂層(C)/無電解めっきが析出しない樹脂層(B)/支持体からなる絶縁材料を得た。該絶縁材料の接着剤層(D)と両面銅箔付きのガラスエポキシ基板(商品番号:CS−3665D、利昌工業(株)製;銅厚み18μm)とを対向させ、1段目、温度90℃、真空引き30秒、大気開放、加圧時間30秒、及び2段目、温度110℃、圧力1MPa、加圧時間60秒なる条件にて真空ラミネートを行った後、支持体を引き剥がして、180℃で1時間加熱乾燥して硬化させ、ガラスエポキシ基板/接着剤層(D)/無電解めっきが析出する樹脂層(C)/無電解めっきが析出しない樹脂層(B)からなる積層体を得た。
(Example 2)
On a support (trade name: Lumirror T-60, manufactured by Toray Industries, Inc .; 38 μm), a resin solution (b) in which electroless plating does not precipitate is applied so that the final thickness of the resin layer is 2 μm, 60 ° C. Was heated for 2 minutes to obtain an insulating material composed of a resin layer (B) / support on which electroless plating did not deposit. Subsequently, the resin solution (c) in which electroless plating is deposited is applied so that the final thickness of the resin layer is 10 μm, and is dried by heating at 60 ° C. for 5 minutes, and the resin layer (C) in which electroless plating is deposited / An insulating resin material comprising a resin layer (B) / support that does not deposit electroless plating was obtained. Subsequently, the adhesive solution (d) was applied onto the resin layer (C) on which the electroless plating was deposited so that the final thickness was 38 μm, and dried by heating at 50 ° C., 70 ° C., 90 ° C., and 100 ° C. for 34 seconds each Thus, an insulating material comprising an adhesive layer (D) / a resin layer (C) on which electroless plating was deposited / a resin layer (B) on which electroless plating was not deposited / a support was obtained. Adhesive layer (D) of the insulating material and a glass epoxy board (product number: CS-3665D, manufactured by Risho Kogyo Co., Ltd .; copper thickness 18 μm) with double-sided copper foil are opposed to each other, the first stage, temperature 90 ° C. After vacuum lamination under the conditions of vacuum drawing 30 seconds, release to the atmosphere, pressurization time 30 seconds, and the second stage, temperature 110 ° C., pressure 1 MPa, pressurization time 60 seconds, the support is peeled off, Laminated body composed of glass epoxy substrate / adhesive layer (D) / resin layer (C) on which electroless plating is deposited / resin layer (B) on which electroless plating is not deposited Got.
該積層体の無電解めっきが析出しない樹脂層(B)上から、UVレーザーにてライン/スペースが10μm/10μm、厚みが5μmになるように加工した。 From the resin layer (B) on which the electroless plating of the laminate was not deposited, it was processed with a UV laser so that the line / space was 10 μm / 10 μm and the thickness was 5 μm.
このようにして得られた積層体に減圧プラズマ処理にてデスミア処理を施し、続いて、パラジウム触媒を付与し、無電解銅めっき(ロームアンドハース社製CUPOSIT厚付けタイプ)を施すことにより、ライン/スペースが10μm/10μm、厚みが5μmの銅配線を形成し、プリント配線板を得た。配線厚みXと絶縁層厚みYとの厚みの比X/Yは0.1であった。このプリント配線板の微細配線形成性を評価した結果を表1に示す。 The laminated body thus obtained is subjected to a desmear treatment by a reduced pressure plasma treatment, followed by a palladium catalyst and electroless copper plating (CUPOSIT thickening type manufactured by Rohm and Haas) A copper wiring having a / space of 10 μm / 10 μm and a thickness of 5 μm was formed to obtain a printed wiring board. The thickness ratio X / Y between the wiring thickness X and the insulating layer thickness Y was 0.1. The results of evaluating the fine wiring formability of this printed wiring board are shown in Table 1.
(実施例3)
支持体(商品名:ルミラーT−60、東レ(株)製;38μm)上に、ソルダーレジストインキ(商品名フォトファイナーPSR−4000 AUS703/CA−40 AUS703;太陽インキ製造(株)製)を最終厚みが10μmとなるように塗布、80℃で20分乾燥して、ソルダーレジスト層/支持体からなる絶縁材料を得た。続いて、無電解めっきが析出する樹脂層としてエポキシ樹脂系シート(商品名:ABF−GX−13、味の素ファインテクノ(株)製)の保護フィルムを剥がして、ソルダーレジスト層/支持体からなる絶縁材料のソルダーレジスト層と接するように重ねて、温度50℃、圧力0.5MPa、速度1m/分なる条件にてラミネートを行い、エポキシ樹脂系シート/ソルダーレジスト層/支持体からなる絶縁材料を得た。尚、エポキシ樹脂系シートとソルダーレジストの厚みは、あわせて50μmであった。
(Example 3)
Solder resist ink (trade name Photofiner PSR-4000 AUS703 / CA-40 AUS703; Taiyo Ink Mfg. Co., Ltd.) is finally formed on a support (trade name: Lumirror T-60, manufactured by Toray Industries, Inc .; 38 μm). The coating was applied to a thickness of 10 μm and dried at 80 ° C. for 20 minutes to obtain an insulating material composed of a solder resist layer / support. Subsequently, the protective film of the epoxy resin sheet (trade name: ABF-GX-13, manufactured by Ajinomoto Fine-Techno Co., Ltd.) is peeled off as the resin layer on which the electroless plating is deposited, and the insulation composed of the solder resist layer / support. Lamination is performed under the conditions of a temperature of 50 ° C., a pressure of 0.5 MPa, and a speed of 1 m / min, so as to be in contact with the solder resist layer of the material, and an insulating material composed of an epoxy resin sheet / solder resist layer / support is obtained. It was. The total thickness of the epoxy resin sheet and the solder resist was 50 μm.
上記エポキシ樹脂系シートと両面銅箔付きのガラスエポキシ基板(商品番号:CS−3665D、利昌工業(株)製;銅厚み18μm)とを対向させ、1段目、温度90℃、真空引き30秒、大気開放、加圧時間30秒、及び2段目、温度110℃、圧力1MPa、加圧時間60秒なる条件にて真空ラミネートを行った後、支持体を引き剥がして、ガラスエポキシ基板/エポキシ樹脂系シート/ソルダーレジスト層からなる積層体を得た。 The above epoxy resin sheet and a glass epoxy substrate (product number: CS-3665D, manufactured by Risho Kogyo Co., Ltd .; copper thickness: 18 μm) with double-sided copper foil are opposed to each other, the first stage, the temperature is 90 ° C., and the vacuum is drawn for 30 seconds. , Air lamination, pressurization time 30 seconds, and second stage, temperature 110 ° C., pressure 1 MPa, pressurization time 60 seconds, after vacuum lamination, peel off the support, glass epoxy substrate / epoxy A laminate comprising a resin sheet / solder resist layer was obtained.
該積層体のソルダーレジスト上に配線幅/配線間隔=10μm/10μmを有するマスクパターンを載せ、波長405nmの光を300mJ/cm2だけ露光した。続いて、スプレー現像機(サンハヤト(株)製エッチングマシーンES−655D)を用いて、1重量%の炭酸ナトリウム水溶液(液温40℃)を使用して、スプレー現像処理を行い、部分的にエポキシ樹脂系シートを露出させた。続いて、180℃で1時間加熱乾燥して、硬化させた。続いて、パラジウム触媒を付与し、無電解銅めっき(ロームアンドハース社製CUPOSIT厚付けタイプ)を施すことにより、厚みが10μmの配線を形成し、プリント配線板を得た。配線厚みXと絶縁層厚みYとの厚みの比X/Yは0.2であった。このプリント配線板の微細配線形成性を評価した結果を表1に示す。 A mask pattern having a wiring width / wiring interval = 10 μm / 10 μm was placed on the solder resist of the laminate, and light having a wavelength of 405 nm was exposed by 300 mJ / cm 2 . Subsequently, using a spray developing machine (etching machine ES-655D manufactured by Sanhayato Co., Ltd.), a 1% by weight sodium carbonate aqueous solution (liquid temperature: 40 ° C.) was used to perform a spray development process, and partially epoxy. The resin sheet was exposed. Subsequently, it was dried by heating at 180 ° C. for 1 hour to be cured. Subsequently, a palladium catalyst was applied, and electroless copper plating (CUPOSIT thickening type manufactured by Rohm and Haas) was applied to form a wiring having a thickness of 10 μm to obtain a printed wiring board. The thickness ratio X / Y between the wiring thickness X and the insulating layer thickness Y was 0.2. The results of evaluating the fine wiring formability of this printed wiring board are shown in Table 1.
(実施例4)
支持体(商品名:ルミラーT−60、東レ(株)製;38μm)上に、無電解めっきが析出しない樹脂溶液(b)を該樹脂層の最終厚みが2μmとなるように塗布、60℃で2分間加熱して、無電解めっきが析出しない樹脂層(B)/支持体からなる絶縁材料を得た。続いて、無電解めっきが析出する樹脂層としてエポキシ樹脂系シート(商品名:ABF−GX−13、味の素ファインテクノ(株)製)の保護フィルムを剥がして、無電解めっきが析出しない樹脂層(B)/支持体からなる絶縁材料の電解めっきが析出しない樹脂層(B)と接するように重ねて、温度50℃、圧力0.5MPa、速度1m/分なる条件にてラミネートを行い、エポキシ樹脂系シート/無電解めっきが析出しない樹脂層(B)/支持体からなる絶縁材料を得た。尚、エポキシ樹脂系シートと無電解めっきが析出しない樹脂層(B)の厚みは、あわせて42μmであった。
Example 4
On a support (trade name: Lumirror T-60, manufactured by Toray Industries, Inc .; 38 μm), a resin solution (b) in which electroless plating does not precipitate is applied so that the final thickness of the resin layer is 2 μm, 60 ° C. Was heated for 2 minutes to obtain an insulating material composed of a resin layer (B) / support on which electroless plating did not deposit. Subsequently, as a resin layer on which electroless plating is deposited, a protective film of an epoxy resin sheet (trade name: ABF-GX-13, manufactured by Ajinomoto Fine-Techno Co., Ltd.) is peeled off, and a resin layer on which electroless plating is not deposited ( B) / Laminated so as to be in contact with the resin layer (B) where the electroplating of the insulating material made of the support is not deposited, and laminated under the conditions of temperature 50 ° C., pressure 0.5 MPa, speed 1 m / min, and epoxy resin An insulating material composed of a base sheet / resin layer (B) on which electroless plating was not deposited / support was obtained. The total thickness of the resin layer (B) on which the epoxy resin sheet and the electroless plating were not deposited was 42 μm.
上記エポキシ樹脂系シートと両面銅箔付きのガラスエポキシ基板(商品番号:CS−3665D、利昌工業(株)製;銅厚み18μm)とを対向させ、1段目、温度90℃、真空引き30秒、大気開放、加圧時間30秒、及び2段目、温度110℃、圧力1MPa、加圧時間60秒なる条件にて真空ラミネートを行った後、支持体を引き剥がして、180℃で1時間加熱乾燥して硬化させ、ガラスエポキシ基板/エポキシ樹脂系シート/無電解めっきが析出しない樹脂層(B)からなる積層体を得た。 The above epoxy resin sheet and a glass epoxy substrate (product number: CS-3665D, manufactured by Risho Kogyo Co., Ltd .; copper thickness: 18 μm) with double-sided copper foil are opposed to each other, the first stage, the temperature is 90 ° C., and the vacuum is drawn for 30 seconds. , Air lamination, pressurization time 30 seconds and second stage, temperature 110 ° C., pressure 1 MPa, pressurization time 60 seconds, vacuum lamination was performed, and then the support was peeled off and 180 ° C. for 1 hour. It was cured by heating and drying to obtain a laminate composed of a resin layer (B) in which glass epoxy substrate / epoxy resin sheet / electroless plating did not precipitate.
該積層体の無電解めっきが析出しない樹脂層(B)上から、UVレーザーにてライン/スペースが10μm/10μm、厚みが5μmになるように加工した。 From the resin layer (B) on which the electroless plating of the laminate was not deposited, it was processed with a UV laser so that the line / space was 10 μm / 10 μm and the thickness was 5 μm.
このようにして得られた積層体に減圧プラズマ処理にてデスミア処理を施し、続いて、パラジウム触媒を付与し、無電解銅めっき(ロームアンドハース社製CUPOSIT厚付けタイプ)を施すことにより、ライン/スペースが10μm/10μm、厚みが5μmの銅配線を形成し、プリント配線板を得た。配線厚みXと絶縁層厚みYとの厚みの比X/Yは0.12であった。このプリント配線板の微細配線形成性を評価した結果を表1に示す。 The laminated body thus obtained is subjected to a desmear treatment by a reduced pressure plasma treatment, followed by a palladium catalyst and electroless copper plating (CUPOSIT thickening type manufactured by Rohm and Haas) A copper wiring having a / space of 10 μm / 10 μm and a thickness of 5 μm was formed to obtain a printed wiring board. The thickness ratio X / Y between the wiring thickness X and the insulating layer thickness Y was 0.12. The results of evaluating the fine wiring formability of this printed wiring board are shown in Table 1.
(比較例1)
無電解銅めっき触媒を含有するガラスエポキシ基板(F)(日立化成工業製、商品名:ACL3−E−168,1.44t)の片面上に、感光性永久レジスト層(G)(日立化成工業製商品名:ネガ型の感光性フィルムフォテックSR−3000)を、温度110℃,2m毎分速度でラミネートして積層体を得た。尚、感光性永久レジスト層の厚みは10μmであった。該積層体の感光性永久レジスト層上に配線幅/配線間隔=10μm/10μmを有するマスクパターンを載せ、波長365nmの光を300mJ/cm2だけ露光した。続いて、スプレー現像機(サンハヤト(株)製エッチングマシーンES−655D)を用いて、現像液(ジエチレングリコール、モノブチルエーテル:200ml/L,水:800ml/L,ホウ砂:8/L)にて、液温40℃でスプレー現像処理を行い、部分的に、無電解銅めっき触媒を含有するガラスエポキシ基板を露出させた。続いて、無電解銅めっき(ロームアンドハース社製CUPOSIT厚付けタイプ)を施すことにより、厚みが10μmの配線を形成し、プリント配線板を得た。ここで、本比較例において、無電解銅めっき触媒を含有するガラスエポキシ基板(F)を絶縁材料と見なさない場合は、配線厚みXと絶縁層厚みYとの厚みの比X/Yは1.0であった。このプリント配線板の微細配線形成性を評価した結果を表1に示す。
(Comparative Example 1)
A photosensitive permanent resist layer (G) (Hitachi Chemical Industries, Ltd.) on one side of a glass epoxy substrate (F) (trade name: ACL3-E-168, 1.44t, manufactured by Hitachi Chemical Co., Ltd.) containing an electroless copper plating catalyst. Product name: negative photosensitive film FOTECH SR-3000) was laminated at a temperature of 110 ° C. at a rate of 2 m / min to obtain a laminate. The photosensitive permanent resist layer had a thickness of 10 μm. A mask pattern having wiring width / wiring interval = 10 μm / 10 μm was placed on the photosensitive permanent resist layer of the laminate, and light with a wavelength of 365 nm was exposed by 300 mJ / cm 2 . Subsequently, using a spray developing machine (etching machine ES-655D manufactured by Sunhayato Co., Ltd.), with a developer (diethylene glycol, monobutyl ether: 200 ml / L, water: 800 ml / L, borax: 8 / L), A spray development treatment was performed at a liquid temperature of 40 ° C. to partially expose a glass epoxy substrate containing an electroless copper plating catalyst. Subsequently, electroless copper plating (CUPOSIT thickening type manufactured by Rohm and Haas) was applied to form a wiring having a thickness of 10 μm, thereby obtaining a printed wiring board. Here, in this comparative example, when the glass epoxy substrate (F) containing the electroless copper plating catalyst is not regarded as an insulating material, the thickness ratio X / Y of the wiring thickness X and the insulating layer thickness Y is 1. 0. The results of evaluating the fine wiring formability of this printed wiring board are shown in Table 1.
比較例に示すように、不必要な箇所(ガラスエポキシ基板の全面)に無電解銅めっき触媒が存在するため、無電解銅めっき時に、永久レジスト層とガラスエポキシ基板との界面に無電解銅めっきが異常析出するため、微細配線箇所で導通してしまうという結果となった。また、厚み方向においても、無電解銅めっき触媒を含有するガラスエポキシ基板(F)を絶縁材料と見なさない場合は、配線の間に存在する絶縁層がないため絶縁信頼性に劣る。 As shown in the comparative example, the electroless copper plating catalyst is present in unnecessary places (the entire surface of the glass epoxy substrate), so the electroless copper plating is applied to the interface between the permanent resist layer and the glass epoxy substrate during electroless copper plating. As a result, abnormal precipitation occurs, resulting in electrical conduction at the fine wiring locations. Also in the thickness direction, when the glass epoxy substrate (F) containing the electroless copper plating catalyst is not regarded as an insulating material, the insulating reliability is inferior because there is no insulating layer between the wirings.
これに対し、実施例では、無電解めっきが析出しない樹脂層と無電解めっきが析出する樹脂層との界面に無電解めっき触媒が存在しないため、無電解銅めっきの異常析出は見られず、微細配線箇所でも良好な絶縁信頼性を示した。 On the other hand, in the examples, since there is no electroless plating catalyst at the interface between the resin layer where the electroless plating does not deposit and the resin layer where the electroless plating precipitates, abnormal deposition of the electroless copper plating is not seen, Good insulation reliability was exhibited even at fine wiring locations.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102316668A (en) * | 2010-06-22 | 2012-01-11 | 住友电木株式会社 | Substrate with fine metal pattern, print circuit board and semiconductor device, and production method of substrate with fine metal pattern, print circuit board and semiconductor device |
| JP2012025733A (en) * | 2010-06-02 | 2012-02-09 | Air Products & Chemicals Inc | Organoaminosilane precursor and method for depositing film comprising the same |
| JP2013058728A (en) * | 2011-08-17 | 2013-03-28 | Daisho Denshi Co Ltd | Printed wiring board and method for manufacturing the same |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012025733A (en) * | 2010-06-02 | 2012-02-09 | Air Products & Chemicals Inc | Organoaminosilane precursor and method for depositing film comprising the same |
| CN102316668A (en) * | 2010-06-22 | 2012-01-11 | 住友电木株式会社 | Substrate with fine metal pattern, print circuit board and semiconductor device, and production method of substrate with fine metal pattern, print circuit board and semiconductor device |
| JP2012009510A (en) * | 2010-06-22 | 2012-01-12 | Sumitomo Bakelite Co Ltd | Base material with metal fine pattern, printed wiring board, and semiconductor device, and method of manufacturing base material with metal fine pattern and printed wiring board |
| JP2013058728A (en) * | 2011-08-17 | 2013-03-28 | Daisho Denshi Co Ltd | Printed wiring board and method for manufacturing the same |
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