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JP2010069217A - Imaging apparatus for electronic endoscope and electronic endoscope - Google Patents

Imaging apparatus for electronic endoscope and electronic endoscope Download PDF

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JP2010069217A
JP2010069217A JP2008242592A JP2008242592A JP2010069217A JP 2010069217 A JP2010069217 A JP 2010069217A JP 2008242592 A JP2008242592 A JP 2008242592A JP 2008242592 A JP2008242592 A JP 2008242592A JP 2010069217 A JP2010069217 A JP 2010069217A
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imaging device
signal processing
solid
processing circuit
lens barrel
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Takashi Kido
孝 木戸
Kazuhiro Nishida
和弘 西田
Koichi Takahashi
孝一 高橋
Hiroyuki Hasegawa
博之 長谷川
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Fujifilm Corp
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Fujifilm Corp
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Abstract

【課題】電子部品の駆動熱に起因する内視鏡画像の画質劣化を効率的且つ確実に防止する。
【解決手段】電子内視鏡10に内蔵される撮像装置40は、対物光学系36を保持する鏡筒37と、固体撮像素子38と、信号処理回路49とを備える。信号処理回路49は、鏡筒37の周面に対向する位置に配置されている。鏡筒37と信号処理回路49とは、放熱兼接続回路基板44および熱伝導性接着剤54で相互に接続されている。放熱兼接続回路基板44は、固体撮像素子38がフリップチップ実装される実装部45と、鏡筒37と信号処理回路49とを繋ぐ放熱部46とを有する。信号処理回路49の駆動熱は、放熱兼接続回路基板44の放熱部46および熱伝導性接着剤54を伝って、鏡筒37、ひいては対物光学系36を速やかに温める。信号処理回路49の放熱冷却、対物光学系36等の結露防止を同時に達成することができる。
【選択図】図4
An image quality deterioration of an endoscope image due to driving heat of an electronic component is efficiently and reliably prevented.
An imaging apparatus built in an electronic endoscope includes a lens barrel that holds an objective optical system, a solid-state imaging device, and a signal processing circuit. The signal processing circuit 49 is disposed at a position facing the peripheral surface of the lens barrel 37. The lens barrel 37 and the signal processing circuit 49 are connected to each other by a heat radiation / connection circuit board 44 and a heat conductive adhesive 54. The heat dissipation / connection circuit board 44 includes a mounting portion 45 on which the solid-state imaging device 38 is flip-chip mounted, and a heat dissipation portion 46 that connects the lens barrel 37 and the signal processing circuit 49. The driving heat of the signal processing circuit 49 travels through the heat radiating portion 46 and the heat conductive adhesive 54 of the heat radiation / connection circuit board 44 to quickly warm the lens barrel 37 and consequently the objective optical system 36. The heat radiation cooling of the signal processing circuit 49 and the prevention of condensation of the objective optical system 36 and the like can be achieved at the same time.
[Selection] Figure 4

Description

本発明は、電子内視鏡用撮像装置、および電子内視鏡に関する。   The present invention relates to an imaging apparatus for an electronic endoscope and an electronic endoscope.

医療分野や工業分野で利用される電子内視鏡は、周知の撮像装置を内蔵している。撮像装置は、CCDイメージセンサ等の固体撮像素子と、電子内視鏡の挿入部先端に設けられた観察窓から入射する被検体内の被観察部位の像光を取り込むための対物光学系とを有している。固体撮像素子の受光部の面上には、カラーフィルタやマイクロレンズを配設するための空隙(エアーギャップ)を空けてカバーガラスが配されている。   Electronic endoscopes used in the medical field and the industrial field incorporate a well-known imaging device. The imaging apparatus includes a solid-state imaging device such as a CCD image sensor and an objective optical system for capturing image light of an observation site in the subject that is incident from an observation window provided at the distal end of the insertion portion of the electronic endoscope. Have. A cover glass is disposed on the surface of the light-receiving portion of the solid-state imaging device with a gap (air gap) for arranging color filters and microlenses.

医療用の電子内視鏡の挿入部先端は、被検体である体腔内と同程度の温度(〜37℃)となる。これに対して、挿入部内の温度は、固体撮像素子や信号処理回路等の電子部品の駆動熱によって、時には40℃以上と体温よりも高温になる。電子部品の性能には温度依存性があるため、この駆動熱による性能低下、ひいては内視鏡画像の画質劣化が問題となっていた。   The distal end of the insertion part of the medical electronic endoscope has a temperature (˜37 ° C.) that is the same as that in the body cavity that is the subject. On the other hand, the temperature in the insertion portion sometimes becomes 40 ° C. or higher and higher than the body temperature due to driving heat of electronic components such as a solid-state imaging device and a signal processing circuit. Since the performance of electronic components has temperature dependence, there has been a problem of performance degradation due to this driving heat, and consequently, image quality degradation of the endoscope image.

加えて、挿入部先端には、観察窓が汚れた場合に洗浄水やエアーが噴射されることがあり、挿入部先端表面と内部とに温度差が生じる。このため、挿入部内に湿気が含まれていると、対物光学系やカバーガラスに結露が生じることがあった。また、保管してあった電子内視鏡を使用するにあたり、プロセッサ装置に接続して電源をオンすると、その直後に固体撮像素子や信号処理回路等の電子部品の温度はすぐに上昇するのに対して、対物光学系やカバーガラスといった部材は、電子部品の熱を得て徐々に温度が上昇することになる。このため、電源をオンした直後には、電子部品と対物光学系やカバーガラスといった部材との温度差が大きく、結露が生じやすい。   In addition, when the observation window becomes dirty, cleaning water or air may be sprayed on the distal end of the insertion portion, causing a temperature difference between the surface of the insertion portion distal end and the inside. For this reason, when moisture is contained in the insertion portion, condensation may occur in the objective optical system and the cover glass. Also, when using the stored electronic endoscope, the temperature of the electronic components such as the solid-state imaging device and the signal processing circuit immediately rises immediately after being connected to the processor device and turned on. On the other hand, the members such as the objective optical system and the cover glass gradually increase in temperature due to the heat of the electronic components. For this reason, immediately after turning on the power, there is a large temperature difference between the electronic component and a member such as an objective optical system or a cover glass, and condensation tends to occur.

対物光学系やカバーガラスの内面に結露が生じると、画像に水滴が視認できる程著しく画質が劣化することがあり、観察が困難になってしまう。   If dew condensation occurs on the inner surface of the objective optical system or the cover glass, the image quality may be remarkably deteriorated so that water droplets can be visually recognized in the image, making observation difficult.

上記のような諸問題を防止するために、特許文献1では、固体撮像素子の近傍(裏面)または能動素子の近傍に、熱伝導性の高い放熱部材を設けている。放熱部材を固体撮像素子枠に固定し、延出部を介して対物レンズ枠に繋げている。固体撮像素子等から発生した駆動熱は、放熱部材を介して対物レンズ枠へ放熱される。   In order to prevent the above problems, in Patent Document 1, a heat radiating member having high thermal conductivity is provided in the vicinity (rear surface) of the solid-state imaging element or in the vicinity of the active element. The heat radiating member is fixed to the solid-state image sensor frame, and is connected to the objective lens frame via the extending portion. The driving heat generated from the solid-state imaging device or the like is radiated to the objective lens frame via the heat radiating member.

特許文献2では、ライトガイドの出射端に遮光板を設け、遮光板で照明光を遮光して、これによる光熱で観察窓を温めている。
特開2002−291693号公報 特開2005−319101号公報
In Patent Document 2, a light shielding plate is provided at the exit end of the light guide, the illumination light is shielded by the light shielding plate, and the observation window is warmed by the light heat generated thereby.
JP 2002-291893 A JP-A-2005-319101

特許文献1に記載の発明は、熱源である固体撮像素子、能動素子と対物レンズ枠とは、熱伝導性樹脂、放熱部材、延出部を介して繋がれていて距離が離れているため、熱の利用効率が非常に悪いという問題があった。そのうえ、対物レンズ枠を温めるまでに時間が掛かり、急激な温度変化に対応することができないという問題があった。   In the invention described in Patent Document 1, since the solid-state imaging device, which is a heat source, the active device, and the objective lens frame are connected via a thermally conductive resin, a heat radiating member, and an extending portion, the distance is long. There was a problem that the utilization efficiency of heat was very bad. In addition, it takes time to warm the objective lens frame, and there is a problem that it cannot cope with a rapid temperature change.

特許文献2に記載の発明は、遮光板とこれを移動させるためのアクチュエータ等の機構が必要となるため、コスト面、省スペース化の観点からすると不利である。また、電子部品の駆動熱を放熱している訳ではないため、駆動熱による電子部品の性能低下の問題は依然として残る。   The invention described in Patent Document 2 is disadvantageous from the viewpoint of cost and space saving because it requires a mechanism such as a light shielding plate and an actuator for moving the light shielding plate. In addition, since the driving heat of the electronic component is not radiated, the problem of the performance deterioration of the electronic component due to the driving heat still remains.

本発明は、上記課題に鑑みてなされたもので、その目的は、電子部品の駆動熱に起因する内視鏡画像の画質劣化を効率的且つ確実に防止することにある。   The present invention has been made in view of the above problems, and an object of the present invention is to efficiently and reliably prevent image quality deterioration of an endoscopic image due to driving heat of an electronic component.

上記目的を達成するために、本発明の電子内視鏡用撮像装置は、被検体内の被観察部位の像光を取り込むための対物光学系と、前記対物光学系を保持する鏡筒と、被観察部位の像光を撮像して撮像信号を出力する固体撮像素子と、前記固体撮像素子の信号処理回路と、熱伝導性を有する放熱部材とを備える。前記信号処理回路は、前記鏡筒の周面に対向する位置に配置される。前記放熱部材は、前記鏡筒と前記信号処理回路とを接続する。   In order to achieve the above object, an imaging apparatus for an electronic endoscope of the present invention includes an objective optical system for capturing image light of an observation site in a subject, a lens barrel that holds the objective optical system, A solid-state image pickup device that picks up image light of a site to be observed and outputs an image pickup signal; a signal processing circuit of the solid-state image pickup device; and a heat radiating member having thermal conductivity. The signal processing circuit is disposed at a position facing the peripheral surface of the lens barrel. The heat radiating member connects the lens barrel and the signal processing circuit.

前記固体撮像素子は、その受光部の面が前記対物光学系の光軸に対して垂直となるように前記鏡筒に取り付けられる。前記信号処理回路は、前記固体撮像素子に対して90°の角度をなし、前記鏡筒の周面と対向する面が前記対物光学系の光軸に対して平行となるように配置される。   The solid-state imaging device is attached to the barrel so that the surface of the light receiving portion is perpendicular to the optical axis of the objective optical system. The signal processing circuit is disposed at an angle of 90 ° with respect to the solid-state imaging device, and a surface facing the peripheral surface of the lens barrel is parallel to the optical axis of the objective optical system.

前記固体撮像素子と前記信号処理回路とを電気的に接続する接続回路基板を備えることが好ましい。   It is preferable to provide a connection circuit board that electrically connects the solid-state imaging device and the signal processing circuit.

前記接続回路基板は、前記放熱部材を兼ねる。この場合、前記接続回路基板は、熱伝導性フィラーが添加された樹脂をベースとする。   The connection circuit board also serves as the heat dissipation member. In this case, the connection circuit board is based on a resin to which a thermally conductive filler is added.

また、前記接続回路基板は、前記鏡筒の周面と対向する前記信号処理回路の面の全面を覆う放熱部を有することが好ましい。この場合、前記放熱部は、回路パターンを形成する金属箔で覆われる。   Moreover, it is preferable that the connection circuit board has a heat radiating portion that covers the entire surface of the signal processing circuit facing the peripheral surface of the lens barrel. In this case, the heat dissipation part is covered with a metal foil that forms a circuit pattern.

前記接続回路基板は、前記放熱部を外側に延出させた、前記鏡筒の周面を覆うように巻き付け固定される巻き付け部を有することが好ましい。   It is preferable that the connection circuit board has a winding part that is wound and fixed so as to cover a peripheral surface of the lens barrel, which extends the heat dissipation part to the outside.

前記接続回路基板は、前記固体撮像素子が突起電極を介してフリップチップ実装される実装部を有することが好ましい。   The connection circuit board preferably includes a mounting portion on which the solid-state imaging device is flip-chip mounted via a protruding electrode.

前記接続回路基板は、前記信号処理回路が前記固体撮像素子に対して90°の角度をなすように折り曲げられるフレキシブル回路基板である。   The connection circuit board is a flexible circuit board that is bent so that the signal processing circuit forms an angle of 90 ° with respect to the solid-state imaging device.

前記固体撮像素子または前記信号処理回路のいずれか一方には、互いに90°の角度をなすように他方を嵌め込み固定するための溝が形成されている。   In either one of the solid-state imaging device or the signal processing circuit, a groove for fitting and fixing the other is formed so as to form an angle of 90 ° with each other.

前記対物光学系に入射面が、前記固体撮像素子の受光部の面に出射面がそれぞれ対向するように配置され、前記対物光学系からの像光を受光部に導光するプリズムを備えることが好ましい。この場合、前記信号処理回路は、その後端面が前記固体撮像素子の前端面に接続され、前記鏡筒の周面と対向する面が前記対物光学系の光軸に対して平行となるように配置される。   The objective optical system includes a prism that is arranged so that an incident surface faces an output surface of the light receiving unit of the solid-state imaging device, and guides image light from the objective optical system to the light receiving unit. preferable. In this case, the signal processing circuit is disposed such that a rear end surface thereof is connected to a front end surface of the solid-state imaging device and a surface facing the peripheral surface of the lens barrel is parallel to the optical axis of the objective optical system. Is done.

前記放熱部材は、前記鏡筒と前記信号処理回路とを直接的、または間接的に接着固定するための接着剤を含む。前記接着剤は、熱伝導性フィラーが添加されたものである。   The heat dissipation member includes an adhesive for directly or indirectly bonding and fixing the lens barrel and the signal processing circuit. The adhesive is one to which a thermally conductive filler is added.

本発明の電子内視鏡は、被検体内の被観察部位の像光を取り込むための対物光学系と、前記対物光学系を保持する鏡筒と、被観察部位の像光を撮像して撮像信号を出力する固体撮像素子と、前記固体撮像素子の信号処理回路と、熱伝導性を有する放熱部材とを有する電子内視鏡用撮像装置を備える。前記信号処理回路は、前記鏡筒の周面に対向する位置に配置される。前記放熱部材は、前記鏡筒と前記信号処理回路とを接続する。   The electronic endoscope of the present invention captures and captures an objective optical system for capturing image light of an observation site in a subject, a lens barrel that holds the objective optical system, and image light of the observation site. An imaging apparatus for an electronic endoscope having a solid-state imaging device that outputs a signal, a signal processing circuit of the solid-state imaging device, and a heat radiating member having thermal conductivity is provided. The signal processing circuit is disposed at a position facing the peripheral surface of the lens barrel. The heat radiating member connects the lens barrel and the signal processing circuit.

本発明によれば、対物光学系を保持する鏡筒の周面に対向する位置に、主な熱源である固体撮像素子の信号処理回路を配置し、熱伝導性を有する放熱部材で鏡筒と信号処理回路とを接続するので、信号処理回路の駆動熱を、放熱部材を介して鏡筒にダイレクトに伝熱させることができる。したがって、電子部品の駆動熱に起因する内視鏡画像の画質劣化を効率的且つ確実に防止することができる。   According to the present invention, the signal processing circuit of the solid-state imaging device that is the main heat source is disposed at a position facing the peripheral surface of the lens barrel that holds the objective optical system, and the heat dissipation member that has thermal conductivity Since the signal processing circuit is connected, the driving heat of the signal processing circuit can be directly transferred to the lens barrel through the heat radiating member. Therefore, it is possible to efficiently and reliably prevent the image quality deterioration of the endoscopic image due to the driving heat of the electronic component.

[第一実施形態]
図1において、内視鏡システム2は、電子内視鏡10、プロセッサ装置11、および光源装置12からなる。電子内視鏡10は、周知の如く、患者の体腔内に挿入される可撓性の挿入部13と、挿入部13の先端部分に連設され、撮像装置40(図3、図4参照)が内蔵された先端部14と、挿入部13の基端部分に連設された操作部15と、プロセッサ装置11および光源装置12に接続されるコネクタ16と、操作部15、コネクタ16間を繋ぐユニバーサルコード17とを有する。
[First embodiment]
In FIG. 1, the endoscope system 2 includes an electronic endoscope 10, a processor device 11, and a light source device 12. As is well known, the electronic endoscope 10 is connected to a flexible insertion portion 13 to be inserted into a body cavity of a patient and a distal end portion of the insertion portion 13, and an imaging device 40 (see FIGS. 3 and 4). Between the operation unit 15 and the connector 16, the connector 15 connected to the processor device 11 and the light source device 12, and the operation unit 15 connected to the light source device 12. And a universal cord 17.

操作部15には、挿入部13の先端部14を上下左右方向に湾曲させるためのアングルノブ18や、挿入部13の先端からエアー、水を噴出させるための送気・送水ボタン19等が設けられている。また、操作部15の挿入部13側には、電気メス等の処置具が挿通される鉗子口20が設けられている。   The operation unit 15 is provided with an angle knob 18 for bending the distal end portion 14 of the insertion portion 13 in the vertical and horizontal directions, an air supply / water supply button 19 for ejecting air and water from the distal end of the insertion portion 13, and the like. It has been. A forceps port 20 through which a treatment tool such as an electric knife is inserted is provided on the insertion portion 13 side of the operation portion 15.

プロセッサ装置11は、光源装置12と電気的に接続され、内視鏡システム2の動作を統括的に制御する。プロセッサ装置11は、ユニバーサルコード17や挿入部13内に挿通された伝送ケーブル51(図3参照)を介して、電子内視鏡10に給電を行い、固体撮像素子38(図3参照)の駆動を制御する。また、プロセッサ装置11は、伝送ケーブル51を介して、固体撮像素子38から出力された撮像信号を受信し、受信した撮像信号に各種処理を施して画像データを生成する。プロセッサ装置11で生成された画像データは、プロセッサ装置11にケーブル接続されたモニタ21に内視鏡画像として表示される。   The processor device 11 is electrically connected to the light source device 12 and comprehensively controls the operation of the endoscope system 2. The processor device 11 supplies power to the electronic endoscope 10 via the universal cord 17 and the transmission cable 51 (see FIG. 3) inserted into the insertion portion 13, and drives the solid-state imaging device 38 (see FIG. 3). To control. Further, the processor device 11 receives the imaging signal output from the solid-state imaging device 38 via the transmission cable 51, and performs various processes on the received imaging signal to generate image data. The image data generated by the processor device 11 is displayed as an endoscopic image on a monitor 21 connected to the processor device 11 by a cable.

図2および図3において、先端部14の端面14aには、観察窓30、照明窓31、鉗子出口32、及び送気・送水用ノズル33が設けられている。観察窓30は、端面14aの片側中央に配置されている。照明窓31は、観察窓30に関して対称な位置に二個配されている。照明窓31の背後には、光源装置12からの照明光を導くライトガイド34の出射端が配されている。照明窓31は、ライトガイド34で導かれた照明光を、体腔内の被観察部位に照射する。   2 and 3, an observation window 30, an illumination window 31, a forceps outlet 32, and an air / water supply nozzle 33 are provided on the end surface 14 a of the distal end portion 14. The observation window 30 is disposed at the center on one side of the end surface 14a. Two illumination windows 31 are arranged at symmetrical positions with respect to the observation window 30. Behind the illumination window 31, an exit end of a light guide 34 that guides illumination light from the light source device 12 is disposed. The illumination window 31 irradiates the observation site in the body cavity with the illumination light guided by the light guide 34.

鉗子出口32は、挿入部13内に配設された鉗子チャンネル35に接続され、鉗子口20に連通している。鉗子口20に挿通された処置具の先端は、鉗子出口32から露呈される。送気・送水用ノズル33は、送気・送水ボタン19の操作に応じて、光源装置12に内蔵の送気・送水装置から供給されるエアーや水を、観察窓30に向けて噴射する。   The forceps outlet 32 is connected to a forceps channel 35 disposed in the insertion portion 13 and communicates with the forceps port 20. The distal end of the treatment tool inserted through the forceps opening 20 is exposed from the forceps outlet 32. The air supply / water supply nozzle 33 injects air and water supplied from the air supply / water supply device built in the light source device 12 toward the observation window 30 according to the operation of the air supply / water supply button 19.

観察窓30の奥には、体腔内の被観察部位の像光を取り込むための対物光学系36を保持する鏡筒37が配設されている。鏡筒37は、先端部14の中心軸に対物光学系36の光軸が平行となるように取り付けられている。   In the back of the observation window 30, a lens barrel 37 is disposed that holds an objective optical system 36 for capturing image light of a site to be observed in the body cavity. The lens barrel 37 is attached so that the optical axis of the objective optical system 36 is parallel to the central axis of the distal end portion 14.

鏡筒37の後端には、固体撮像素子38が接続されている。固体撮像素子38は、例えば、CCDイメージセンサやCMOSイメージセンサからなる。固体撮像素子38には、受光部39が表面に設けられ、貫通電極を介して裏面に電極パッドが設けられたチップ、または受光部39が裏面に設けられ、表面に電極パッドが設けられたいわゆる裏面照射型のチップの表裏を引っ繰り返したものが用いられる。固体撮像素子38は、受光部39が対物光学系36と対向し、受光部39の面が対物光学系36の光軸と垂直となるように配置されている。これら対物光学系36、鏡筒37、および固体撮像素子38等によって、撮像装置40が構成される。   A solid-state image sensor 38 is connected to the rear end of the lens barrel 37. The solid-state image sensor 38 is composed of, for example, a CCD image sensor or a CMOS image sensor. The solid-state imaging device 38 has a light receiving portion 39 provided on the front surface, a chip provided with an electrode pad on the back surface through a through electrode, or a so-called light receiving portion 39 provided on the back surface and a so-called electrode pad provided on the front surface. A back-illuminated chip that is repeatedly turned is used. The solid-state imaging device 38 is disposed such that the light receiving unit 39 faces the objective optical system 36 and the surface of the light receiving unit 39 is perpendicular to the optical axis of the objective optical system 36. The objective optical system 36, the lens barrel 37, the solid-state imaging device 38, and the like constitute an imaging device 40.

撮像装置40の周辺を拡大した図4にも示すように、受光部39上には、四角枠状のスペーサ41を介して矩形板状のカバーガラス42が取り付けられている(図5も参照)。固体撮像素子38、スペーサ41、およびカバーガラス42は、接着剤で互いに接着されて組み付けられる。これにより、スペーサ41、およびカバーガラス42で囲まれた密閉空間内に受光部39が収容され、塵埃や水等の侵入から受光部39が保護される。   As shown in FIG. 4 in which the periphery of the imaging device 40 is enlarged, a rectangular plate-like cover glass 42 is attached on the light receiving unit 39 via a square frame spacer 41 (see also FIG. 5). . The solid-state image sensor 38, the spacer 41, and the cover glass 42 are assembled by being bonded to each other with an adhesive. As a result, the light receiving unit 39 is accommodated in the sealed space surrounded by the spacer 41 and the cover glass 42, and the light receiving unit 39 is protected from intrusion of dust, water, and the like.

固体撮像素子38の裏面には、複数の突起電極(バンプ)43を介して、略S字状の放熱兼接続回路基板(以下、単に基板という)44がフリップチップ実装されている。   A substantially S-shaped heat radiation / connection circuit board (hereinafter simply referred to as a board) 44 is flip-chip mounted on the back surface of the solid-state imaging element 38 via a plurality of protruding electrodes (bumps) 43.

基板44は、ポリイミド等の樹脂に酸化珪素、酸化アルミ、酸化マグネシウム等の熱伝導性フィラーを練り込んだものをベースとする、熱伝導性フレキシブル回路基板である。基板44は、固体撮像素子38が接続される実装部45、先端部14の先端側に延出された放熱部46、および後端側に延出された伝送部47を有する。放熱部46、伝送部47は、実装部45に対して反対の方向に直角に折り曲げられている。放熱部46は、鏡筒37の下部中央付近まで迫り出している。   The substrate 44 is a heat conductive flexible circuit board based on a resin obtained by kneading a heat conductive filler such as silicon oxide, aluminum oxide, or magnesium oxide in a resin such as polyimide. The substrate 44 includes a mounting part 45 to which the solid-state imaging device 38 is connected, a heat radiating part 46 extending to the front end side of the front end part 14, and a transmission part 47 extending to the rear end side. The heat radiating part 46 and the transmission part 47 are bent at a right angle in the opposite direction to the mounting part 45. The heat dissipating part 46 protrudes to the vicinity of the lower center of the lens barrel 37.

放熱部46の裏面には、複数の突起電極48を介して、信号処理回路49がフリップチップ実装されている。鏡筒37の下部中央付近まで迫り出した放熱部46の裏面に信号処理回路49を取り付けたことで、信号処理回路49は、鏡筒37の周面と対向する位置に配置される。信号処理回路49には、例えば、固体撮像素子38を駆動させるための駆動信号を伝達する回路、固体撮像素子38からの撮像信号をデジタル化する等の信号処理を施すための回路、撮像信号をプロセッサ装置に転送するための回路等が実装されている。   A signal processing circuit 49 is flip-chip mounted on the back surface of the heat radiating portion 46 via a plurality of protruding electrodes 48. Since the signal processing circuit 49 is attached to the back surface of the heat radiating portion 46 that protrudes to the vicinity of the lower center of the lens barrel 37, the signal processing circuit 49 is disposed at a position facing the peripheral surface of the lens barrel 37. The signal processing circuit 49 includes, for example, a circuit for transmitting a drive signal for driving the solid-state image sensor 38, a circuit for performing signal processing such as digitizing an image signal from the solid-state image sensor 38, and an image signal. A circuit or the like for transferring to the processor device is mounted.

伝送部47の裏面には、複数の電極パッド50が設けられており、この電極パッド50に伝送ケーブル51から引き出された伝送線52が半田付けされている。なお、伝送ケーブル51は、複数の伝送線52からなる多芯ケーブルであるが、図では煩雑化を避けるため、伝送線52は一本のみ図示している。   A plurality of electrode pads 50 are provided on the back surface of the transmission unit 47, and the transmission lines 52 drawn from the transmission cable 51 are soldered to the electrode pads 50. Note that the transmission cable 51 is a multi-core cable composed of a plurality of transmission lines 52, but only one transmission line 52 is shown in the figure to avoid complication.

固体撮像素子38の裏面と対向する実装部45の表面には、固体撮像素子38と信号処理回路49の接続回路を構成する回路パターン53(図6参照)が形成されている。また、信号処理回路49の表面と対向する放熱部46の裏面、および電極パッド50が形成された伝送部47の裏面にも、熱伝導性フィラー入りポリイミド樹脂等のベースを挟んで、同様に回路パターン53(図示せず)が形成されている。回路パターン53は、銅箔等の金属箔からなる。実装部45の表面の回路パターン53と放熱部46、伝送部47の裏面の回路パターン53とは、貫通電極(図示せず)で接続されている。   A circuit pattern 53 (see FIG. 6) that forms a connection circuit between the solid-state image sensor 38 and the signal processing circuit 49 is formed on the surface of the mounting portion 45 that faces the back surface of the solid-state image sensor 38. Similarly, a circuit such as a polyimide resin containing a heat conductive filler is sandwiched between the back surface of the heat radiating portion 46 facing the front surface of the signal processing circuit 49 and the back surface of the transmission portion 47 on which the electrode pads 50 are formed. A pattern 53 (not shown) is formed. The circuit pattern 53 is made of a metal foil such as a copper foil. The circuit pattern 53 on the front surface of the mounting portion 45 and the circuit pattern 53 on the back surface of the heat radiating portion 46 and the transmission portion 47 are connected by a through electrode (not shown).

実装部45の表面の回路パターン53、および放熱部46、伝送部47の裏面の回路パターン53を形成する金属箔のうち、伝送に寄与しない一部の金属箔は、放熱部46の表面全体、および信号処理回路49との電気的接続部以外の放熱部46の裏面全体を覆っている。   Among the metal foils that form the circuit pattern 53 on the front surface of the mounting unit 45 and the circuit pattern 53 on the back surface of the heat dissipating unit 46 and the transmission unit 47, some metal foils that do not contribute to transmission are the entire surface of the heat dissipating unit 46, The entire back surface of the heat radiating portion 46 other than the electrical connection portion with the signal processing circuit 49 is covered.

鏡筒37の下部、固体撮像素子38、スペーサ41、およびカバーガラス42の下側面、並びに信号処理回路49の表面と、基板44との間には、熱伝導性接着剤54が充填されており、相互に接着固定されている。熱伝導性接着剤54としては、例えば、絶縁性熱伝導シリコーン接着剤(RTVゴム系接着剤等)や、基板44同様の熱伝導性フィラーが練り込まれた一液硬化性エポキシ系接着剤が用いられる。なお、ここで挙げた基板44や熱伝導性接着剤54の材質は一例であり、熱伝導性を有するものであれば、上記以外の材質でも構わない。   A thermally conductive adhesive 54 is filled between the lower portion of the lens barrel 37, the lower surface of the solid-state imaging device 38, the spacer 41, and the cover glass 42, and the surface of the signal processing circuit 49 and the substrate 44. Are fixed to each other. Examples of the heat conductive adhesive 54 include an insulating heat conductive silicone adhesive (RTV rubber adhesive, etc.) and a one-part curable epoxy adhesive in which a heat conductive filler similar to the substrate 44 is kneaded. Used. In addition, the material of the board | substrate 44 and the heat conductive adhesive 54 mentioned here is an example, and a material other than the above may be used as long as it has heat conductivity.

撮像装置40を製造する際には、まず、図5に示すように、固体撮像素子38の受光部39上に、スペーサ41を介してカバーガラス42を取り付ける。   When manufacturing the imaging device 40, first, as shown in FIG. 5, a cover glass 42 is attached via a spacer 41 on the light receiving portion 39 of the solid-state imaging device 38.

カバーガラス42の取り付け後、図6に示すように、基板44の実装部45と信号処理回路49の回路パターンの電極パッドに突起電極43、48をそれぞれ形成し、固体撮像素子38および信号処理回路49と、実装部45および放熱部46とをフリップチップ実装する。その後、固体撮像素子38および信号処理回路49と基板44の間に、アンダーフィル剤として熱伝導性接着剤54を流し込み、相互を接着固定する。なお、突起電極43、48は、固体撮像素子38や放熱部46の裏面の電極パッドに形成しても構わない。   After the cover glass 42 is attached, as shown in FIG. 6, projecting electrodes 43 and 48 are formed on the mounting portions 45 of the substrate 44 and the electrode pads of the circuit pattern of the signal processing circuit 49, respectively, so that the solid-state imaging device 38 and the signal processing circuit are formed. 49, the mounting part 45, and the heat dissipation part 46 are flip-chip mounted. Thereafter, a thermally conductive adhesive 54 is poured as an underfill agent between the solid-state imaging device 38 and the signal processing circuit 49 and the substrate 44 to bond and fix each other. The protruding electrodes 43 and 48 may be formed on the electrode pads on the back surface of the solid-state imaging device 38 or the heat radiating portion 46.

次いで、基板44を略S字状に折り曲げる。そして、鏡筒37を接着剤でカバーガラス42に取り付ける。さらに図7に示すように、鏡筒37の下部、固体撮像素子38、スペーサ41、およびカバーガラス42の下側面と基板44との間に熱伝導性接着剤54を充填し、相互を接着固定する。最後に、伝送線52を電極パッド50に結線する。熱伝導性接着剤54に対する濡れ性を向上させるため、鏡筒37の下部といった熱伝導性接着剤54が接する箇所に、プラズマ処理等の表面改質処理を施してもよい。   Next, the substrate 44 is bent into a substantially S shape. Then, the lens barrel 37 is attached to the cover glass 42 with an adhesive. Further, as shown in FIG. 7, a thermal conductive adhesive 54 is filled between the lower surface of the lens barrel 37, the solid-state imaging device 38, the spacer 41, and the lower surface of the cover glass 42 and the substrate 44, thereby fixing them to each other. To do. Finally, the transmission line 52 is connected to the electrode pad 50. In order to improve the wettability with respect to the heat conductive adhesive 54, a surface modification process such as a plasma process may be performed on a portion where the heat conductive adhesive 54 contacts, such as a lower part of the lens barrel 37.

続いて、上記のように構成された内視鏡システム2の作用について説明する。電子内視鏡10で患者の体腔内を観察する際、施術者は、電子内視鏡10と各装置11、12とを繋げ、各装置11、12の電源をオンする。そして、患者に関する情報等を入力し、検査開始を指示する。   Next, the operation of the endoscope system 2 configured as described above will be described. When observing the inside of a patient's body cavity with the electronic endoscope 10, the practitioner connects the electronic endoscope 10 and the devices 11 and 12 and turns on the power of the devices 11 and 12. Then, information related to the patient is input to instruct to start the examination.

検査開始を指示した後、施術者は、挿入部13を体腔内に挿入し、光源装置12からの照明光で体腔内を照明しながら、固体撮像素子38による体腔内の内視鏡画像をモニタ21で観察する。   After instructing the start of the examination, the practitioner inserts the insertion portion 13 into the body cavity and monitors the endoscopic image in the body cavity by the solid-state imaging device 38 while illuminating the body cavity with the illumination light from the light source device 12. Observe at 21.

固体撮像素子38から出力された撮像信号は、信号処理回路49で各種処理を施された後、伝送ケーブル51を介してプロセッサ装置11に入力される。プロセッサ装置11では、入力された撮像信号に対して各種画像処理が施され、画像データが生成される。これにより、画像データがモニタ21に内視鏡画像として表示される。   The imaging signal output from the solid-state imaging device 38 is subjected to various processing by the signal processing circuit 49 and then input to the processor device 11 via the transmission cable 51. In the processor device 11, various image processes are performed on the input imaging signal, and image data is generated. Thereby, the image data is displayed on the monitor 21 as an endoscopic image.

固体撮像素子38および信号処理回路49は、駆動されると内部負荷等に起因する駆動熱を発し、時には40℃以上と体温よりも高温になる。一方、体腔内に挿入された電子内視鏡10の先端部14は、体温と同程度の温度(〜37℃)となる。   When driven, the solid-state imaging device 38 and the signal processing circuit 49 emit driving heat due to an internal load or the like, and sometimes becomes 40 ° C. or higher and higher than the body temperature. On the other hand, the distal end portion 14 of the electronic endoscope 10 inserted into the body cavity has a temperature (˜37 ° C.) that is approximately the same as the body temperature.

電子内視鏡10の電源投入直後は、固体撮像素子38および信号処理回路49の温度はすぐに上昇するのに対して、対物光学系36やカバーガラス42といった部材は、固体撮像素子38および信号処理回路49の駆動熱を得て徐々に温度が上昇する。また、送気・送水用ノズル33で観察窓30に向けてエアーや水を噴射した場合には、先端部14が30℃程度まで急激に冷却される。このため、先端部14の大凡の温度分布は、観察窓30、対物光学系36、鏡筒37、カバーガラス42、スペーサ41、固体撮像素子38、信号処理回路49の順に高温となる。   Immediately after the electronic endoscope 10 is turned on, the temperature of the solid-state imaging device 38 and the signal processing circuit 49 immediately rises, whereas members such as the objective optical system 36 and the cover glass 42 are connected to the solid-state imaging device 38 and the signal. The drive circuit heat is obtained and the temperature gradually rises. Further, when air or water is sprayed toward the observation window 30 by the air / water supply nozzle 33, the tip end portion 14 is rapidly cooled to about 30 ° C. For this reason, the approximate temperature distribution of the distal end portion 14 becomes higher in the order of the observation window 30, the objective optical system 36, the lens barrel 37, the cover glass 42, the spacer 41, the solid-state imaging device 38, and the signal processing circuit 49.

固体撮像素子38および信号処理回路49から発生した駆動熱は、熱伝導性接着剤54を介して基板44に伝わる。基板44に伝わった熱は、主に放熱部46、熱伝導性接着剤54を通して、比較的温度が低い鏡筒37に伝わる。一部は伝送部47や伝送ケーブル51から、先端部14の後端側の空間に放熱される。鏡筒37に伝わった熱は、鏡筒37は勿論のこと、内部の対物光学系36や先端の観察窓30をも温める。   Driving heat generated from the solid-state imaging device 38 and the signal processing circuit 49 is transmitted to the substrate 44 via the heat conductive adhesive 54. The heat transmitted to the substrate 44 is transmitted to the lens barrel 37 having a relatively low temperature mainly through the heat radiating portion 46 and the heat conductive adhesive 54. Part of the heat is radiated from the transmission unit 47 and the transmission cable 51 to the space on the rear end side of the front end portion 14. The heat transmitted to the lens barrel 37 warms not only the lens barrel 37 but also the internal objective optical system 36 and the observation window 30 at the tip.

基板44の作用により、低温部である観察窓30、対物光学系36、鏡筒37と、高温部であるカバーガラス42、スペーサ41、固体撮像素子38、信号処理回路49の温度差が均される。言い換えれば、低温部は駆動熱によって温められ、高温部は放熱冷却されて、先端部14の温度分布が均一となる。   Due to the action of the substrate 44, the temperature difference between the observation window 30, the objective optical system 36, the lens barrel 37, which is a low-temperature part, and the cover glass 42, the spacer 41, the solid-state imaging device 38, and the signal processing circuit 49, which are high-temperature parts. The In other words, the low temperature part is warmed by driving heat, and the high temperature part is radiatively cooled, so that the temperature distribution of the tip part 14 becomes uniform.

固体撮像素子38や信号処理回路49が高温になると、これらの性能が低下して内視鏡画像の画質が劣化する。また、先端部14の各部材の温度差が大であると、観察窓30やカバーガラス42の内面に結露が生じてしまう。本例では、基板44や熱伝導性接着剤54によって、固体撮像素子38や信号処理回路49の熱が放熱され、また、先端部14の温度分布が均一となるため、固体撮像素子38や信号処理回路49の性能が低下することはないし、結露が生じることもない。したがって、固体撮像素子38や信号処理回路49の性能が低下、あるいは結露が原因で内視鏡画像の画質が劣化し、観察が困難になるといった問題も起こらない。   When the solid-state imaging device 38 and the signal processing circuit 49 become high temperature, these performances are lowered and the image quality of the endoscopic image is deteriorated. Further, if the temperature difference between the members of the distal end portion 14 is large, condensation occurs on the inner surfaces of the observation window 30 and the cover glass 42. In this example, the heat of the solid-state imaging device 38 and the signal processing circuit 49 is dissipated by the substrate 44 and the heat conductive adhesive 54, and the temperature distribution of the distal end portion 14 becomes uniform. The performance of the processing circuit 49 does not deteriorate, and no condensation occurs. Therefore, there is no problem that the performance of the solid-state imaging device 38 or the signal processing circuit 49 is deteriorated or the image quality of the endoscope image is deteriorated due to dew condensation and observation becomes difficult.

熱源である信号処理回路49を鏡筒37の下部に配置しているので、信号処理回路49の駆動熱が鏡筒37にダイレクトに伝わる。このため、信号処理回路49を鏡筒37から遠ざけた場合よりも熱効率がよく、鏡筒37を温めるまでに時間が掛からない。電子内視鏡10の電源投入直後で温度差が生じるときや、送気・送水用ノズル33で観察窓30に向けてエアーや水を噴射して急激な温度変化があったときにも対応することができる。   Since the signal processing circuit 49 that is a heat source is disposed below the lens barrel 37, the driving heat of the signal processing circuit 49 is directly transmitted to the lens barrel 37. For this reason, thermal efficiency is better than when the signal processing circuit 49 is moved away from the lens barrel 37, and it does not take time to warm the lens barrel 37. It corresponds to a case where a temperature difference occurs immediately after the electronic endoscope 10 is turned on, or a case where a sudden temperature change occurs by injecting air or water toward the observation window 30 with the air / water supply nozzle 33. be able to.

基板44は、名の通り固体撮像素子38と信号処理回路49の接続と放熱の機能を兼ねるので、部品、製造コスト削減、省スペース化に寄与することができる。   As the name implies, the substrate 44 serves both as a connection between the solid-state imaging device 38 and the signal processing circuit 49 and a function of heat dissipation, thereby contributing to the reduction of components, manufacturing costs, and space saving.

信号処理回路49を鏡筒37側に迫り出させた分、先端部14の長さを短くすることができる。先端部14は硬質な材料からなるため、先端部14が長いと、患者が嚥下するときに苦痛を与えることになるが、この苦痛を和らげることができる。また、熱伝導性接着剤54で固体撮像素子38、基板44、信号処理回路49との接続がさらに補強されるので、機械的強度を高めることができる。   The length of the tip portion 14 can be shortened by the amount that the signal processing circuit 49 is pushed toward the lens barrel 37 side. Since the distal end portion 14 is made of a hard material, if the distal end portion 14 is long, it causes pain when the patient swallows, but this pain can be relieved. Further, since the connection between the solid-state imaging device 38, the substrate 44, and the signal processing circuit 49 is further reinforced by the heat conductive adhesive 54, the mechanical strength can be increased.

第一実施形態では、実装部45、放熱部46、および伝送部47を有する基板44を用いているが、本発明はこれに限定されない。なお、以下では、第一実施形態と同一の部材については符号のみを付し、説明を省略する。   In 1st embodiment, although the board | substrate 44 which has the mounting part 45, the thermal radiation part 46, and the transmission part 47 is used, this invention is not limited to this. In addition, below, only the code | symbol is attached | subjected about the member same as 1st embodiment, and description is abbreviate | omitted.

[第二実施形態]
第二実施形態の撮像装置60を示す図8において、基板61は、第一実施形態の基板44と異なり、折れ曲がり箇所がないストレートな形状である。基板61は、基板44と同様の放熱部62、および伝送部63を有するが、実装部は有していない。実装部に該当する機能は、フレキシブル回路基板64が担う。フレキシブル回路基板64には、第一実施形態の実装部45と同様、固体撮像素子38がフリップチップ実装される。また、フレキシブル回路基板64は、放熱部62と伝送部63の境界付近で、突起電極65を介して基板61に接続されている。
[Second Embodiment]
In FIG. 8 showing the imaging device 60 of the second embodiment, the substrate 61 is a straight shape having no bent portions, unlike the substrate 44 of the first embodiment. The substrate 61 has the same heat radiation part 62 and transmission part 63 as the substrate 44, but does not have a mounting part. The function corresponding to the mounting portion is performed by the flexible circuit board 64. Similar to the mounting portion 45 of the first embodiment, the solid-state imaging device 38 is flip-chip mounted on the flexible circuit board 64. In addition, the flexible circuit board 64 is connected to the substrate 61 via the protruding electrode 65 in the vicinity of the boundary between the heat radiation part 62 and the transmission part 63.

撮像装置60を製造する際には、第一実施形態と同様に図5の工程を実施した後、フレキシブル回路基板64に固体撮像素子38をフリップチップ実装する。そして、基板61に信号処理回路49をフリップチップ実装する前または後に、フレキシブル回路基板64を基板61にフリップチップ実装する。   When manufacturing the imaging device 60, the solid-state imaging device 38 is flip-chip mounted on the flexible circuit board 64 after performing the process of FIG. 5 as in the first embodiment. The flexible circuit board 64 is flip-chip mounted on the substrate 61 before or after the signal processing circuit 49 is flip-chip mounted on the substrate 61.

その後、第一実施形態と同様に、鏡筒37を接着剤でカバーガラス42に取り付け、鏡筒37の下部、固体撮像素子38、スペーサ41、およびカバーガラス42の下側面と基板61との間に熱伝導性接着剤54を充填して相互を接着固定し、最後に、伝送線52を電極パッド50に結線する。本実施形態によれば、放熱兼接続回路基板を折り曲げる工程を省くことができる。このため、基板61は、フレキシブル回路基板である必要はない。   Thereafter, similarly to the first embodiment, the lens barrel 37 is attached to the cover glass 42 with an adhesive, and the lower surface of the lens barrel 37, the solid-state imaging device 38, the spacer 41, and the lower surface of the cover glass 42 and the substrate 61. Then, the heat conductive adhesive 54 is filled to fix the two together, and finally, the transmission line 52 is connected to the electrode pad 50. According to this embodiment, the process of bending the heat dissipation / connection circuit board can be omitted. For this reason, the board | substrate 61 does not need to be a flexible circuit board.

[第三実施形態]
図9において、第三実施形態の撮像装置70は、固体撮像素子71と信号処理回路72とを、実装部、放熱部、伝送部がない短尺の基板(フレキシブルケーブルでも可)73で接続し、さらに、熱伝導性接着剤54で鏡筒37に信号処理回路72を直接接着固定している点が第一、第二実施形態と異なる。
[Third embodiment]
In FIG. 9, an imaging device 70 of the third embodiment connects a solid-state imaging device 71 and a signal processing circuit 72 with a short board (which may be a flexible cable) 73 without a mounting part, a heat dissipation part, and a transmission part, Furthermore, the point which directly adheres and fixes the signal processing circuit 72 to the lens barrel 37 with the heat conductive adhesive 54 is different from the first and second embodiments.

固体撮像素子71は、受光部74、電極パッドの両方が表面に設けられたものである。信号処理回路72は、裏面に伝送線52が繋がる電極パッド75が設けられたもので、この電極パッド75は、信号処理回路72の表面の回路パターンの電極パッドと貫通電極(ともに図示せず)で接続されている。基板73は、突起電極76、77を介して、固体撮像素子71の電極パッドと信号処理回路72の電極パッドとを接続している。熱伝導性接着剤54は、鏡筒37の下部と信号処理回路72との間に充填されている。   The solid-state image sensor 71 has both a light receiving portion 74 and an electrode pad provided on the surface. The signal processing circuit 72 is provided with an electrode pad 75 connected to the transmission line 52 on the back surface, and this electrode pad 75 is an electrode pad of a circuit pattern on the surface of the signal processing circuit 72 and a through electrode (both not shown). Connected with. The substrate 73 connects the electrode pad of the solid-state image sensor 71 and the electrode pad of the signal processing circuit 72 via the protruding electrodes 76 and 77. The thermally conductive adhesive 54 is filled between the lower portion of the lens barrel 37 and the signal processing circuit 72.

撮像装置70を製造する際には、第一、第二実施形態と同様に図5の工程を実施した後、固体撮像素子71の電極パッドと信号処理回路72の電極パッドに、突起電極76、77を介して基板73をフリップチップ実装する。そして、基板73を軸にして固体撮像素子71と信号処理回路72を90°折り曲げる。その後の工程は第一、第二実施形態と同様である。   When manufacturing the imaging device 70, after performing the process of FIG. 5 as in the first and second embodiments, the protruding electrode 76, the electrode pad of the solid-state imaging device 71 and the electrode pad of the signal processing circuit 72, The substrate 73 is flip-chip mounted via 77. Then, the solid-state imaging device 71 and the signal processing circuit 72 are bent 90 ° with the substrate 73 as an axis. The subsequent steps are the same as those in the first and second embodiments.

本実施形態の変形例として、図10、図11を挙げることができる。図10に示す例では、表面だけでなく、信号処理回路78と対向する側面にも電極パッドを設けた固体撮像素子79を用いている。固体撮像素子79の側面の電極パッドは、信号処理回路78の電極パッドと突起電極80を介してフリップチップ実装されている。固体撮像素子79の表面の電極パッド、および信号処理回路78の電極パッドは、図9の撮像装置70と同様に、突起電極76、77を介して基板73に接続されている。   As modified examples of the present embodiment, FIG. 10 and FIG. 11 can be cited. In the example shown in FIG. 10, the solid-state imaging element 79 provided with electrode pads not only on the surface but also on the side surface facing the signal processing circuit 78 is used. The electrode pad on the side surface of the solid-state image sensor 79 is flip-chip mounted via the electrode pad of the signal processing circuit 78 and the protruding electrode 80. The electrode pads on the surface of the solid-state imaging device 79 and the electrode pads of the signal processing circuit 78 are connected to the substrate 73 via the protruding electrodes 76 and 77, as in the imaging device 70 of FIG.

また、図11に示す例では、図9と同様の固体撮像素子71を用いたうえで、信号処理回路81に、固体撮像素子71の側面部を嵌め込むための溝82を設けている。溝82は、周知のダイシング、エッチング加工技術で形成される。この場合、まず、固体撮像素子71の側面部を溝82に嵌め込んで熱伝導性接着剤54で接着固定した後、固体撮像素子71の表面の電極パッドと信号処理回路81の電極パッドとを半田83で接続する。なお、本例とは逆に、固体撮像素子に信号処理回路の後端部が嵌め込まれる溝を形成してもよい。   In the example shown in FIG. 11, the same solid-state imaging element 71 as that in FIG. 9 is used, and the signal processing circuit 81 is provided with a groove 82 for fitting the side surface portion of the solid-state imaging element 71. The groove 82 is formed by a known dicing or etching technique. In this case, first, the side surface portion of the solid-state image sensor 71 is fitted into the groove 82 and bonded and fixed with the heat conductive adhesive 54, and then the electrode pad on the surface of the solid-state image sensor 71 and the electrode pad of the signal processing circuit 81 are connected. Connect with solder 83. In contrast to this example, a groove in which the rear end portion of the signal processing circuit is fitted in the solid-state imaging device may be formed.

図9に示す例では、基板73が丁度蝶番のようになるため、撮像装置70の製造時に何度も折り曲げを繰り返すと基板73にストレスが掛かる。対して、図10、図11に示す例では、固体撮像素子と信号処理回路を90°の角をなす状態で先に固定するので、折り曲げによるストレスを考慮しなくて済む。   In the example shown in FIG. 9, since the substrate 73 is just like a hinge, stress is applied to the substrate 73 when it is bent many times during the manufacturing of the imaging device 70. On the other hand, in the example shown in FIGS. 10 and 11, since the solid-state imaging device and the signal processing circuit are fixed first in a state of forming an angle of 90 °, it is not necessary to consider the stress due to bending.

本実施形態によれば、放熱兼接続回路基板の規模を縮小、または放熱兼接続回路基板を省略することができ、部品コスト削減に寄与することができる。なお、図9、図10に示す例では、基板73は固体撮像素子と信号処理回路との熱伝導の機能のみで、鏡筒37への熱伝導は主に熱伝導性接着剤54が担うので、基板73を放熱機能がない単なるフレキシブル回路基板としてもよい。また、本実施形態は、信号処理回路を固体撮像素子に対して90°に折り曲げて、信号処理回路を鏡筒の下部に配置することが要点であるので、放熱兼接続回路基板やフレキシブル回路基板で固体撮像素子と信号処理回路を接続する必要はなく、図11に例示する半田83、あるいはボンディングワイヤで接続してもよい。   According to this embodiment, the scale of the heat dissipation / connection circuit board can be reduced, or the heat dissipation / connection circuit board can be omitted, which can contribute to a reduction in component costs. In the examples shown in FIGS. 9 and 10, the substrate 73 has only a heat conduction function between the solid-state imaging device and the signal processing circuit, and the heat conduction to the lens barrel 37 is mainly performed by the heat conductive adhesive 54. The substrate 73 may be a simple flexible circuit board having no heat dissipation function. In addition, the main point of this embodiment is that the signal processing circuit is bent at 90 ° with respect to the solid-state imaging device, and the signal processing circuit is arranged at the lower part of the lens barrel. Therefore, it is not necessary to connect the solid-state imaging device and the signal processing circuit, and the solid-state imaging device and the signal processing circuit may be connected by the solder 83 illustrated in FIG.

[第四実施形態]
図12および図13において、本実施形態の撮像装置90に用いられる基板91は、第一実施形態の基板44の放熱部46上の金属箔を幅方向に広げた巻き付け部92を有している。巻き付け部92は、鏡筒37の周面を覆うように鏡筒37に巻き付けられ、熱伝導性接着剤54を介して鏡筒37に接着固定される。
[Fourth embodiment]
12 and 13, the substrate 91 used in the imaging device 90 of the present embodiment has a winding portion 92 in which the metal foil on the heat radiation portion 46 of the substrate 44 of the first embodiment is widened in the width direction. . The winding portion 92 is wound around the lens barrel 37 so as to cover the peripheral surface of the lens barrel 37, and is bonded and fixed to the lens barrel 37 via a heat conductive adhesive 54.

本実施形態によれば、鏡筒37の下面のみを熱伝導性接着剤54で充填する他の実施形態と比較して、固体撮像素子38および信号処理回路49の駆動熱を、鏡筒37の全周に満遍なく行き渡らせることができる。したがって、熱効率をさらに高めることができる。なお、巻き付け部92は、本例のように金属箔を左右に広げたものに限らず、一方向に金属箔を延出させたものでもよいし、放熱部46自体を広げたものでもよい。   According to the present embodiment, the driving heat of the solid-state imaging device 38 and the signal processing circuit 49 is reduced as compared with the other embodiments in which only the lower surface of the lens barrel 37 is filled with the heat conductive adhesive 54. The entire circumference can be spread evenly. Therefore, thermal efficiency can be further increased. The winding portion 92 is not limited to the one in which the metal foil is spread left and right as in this example, but may be one in which the metal foil is extended in one direction or one in which the heat radiating portion 46 itself is widened.

上記各実施形態では、受光部の面が対物光学系の光軸と垂直となるように固体撮像素子を配置する例を挙げているが、本発明はこれに限定されない。   In each of the above embodiments, an example is given in which the solid-state imaging device is arranged so that the surface of the light receiving unit is perpendicular to the optical axis of the objective optical system, but the present invention is not limited to this.

[第五実施形態]
図14において、本実施形態の撮像装置100は、図9の固体撮像素子71、信号処理回路72を用いたうえで、鏡筒37とカバーガラス42の間にプリズム101を設けている。プリズム101は、その入射面101aが鏡筒37に、出射面101bがカバーガラス42にそれぞれ接続されている。これにより、対物光学系36の光軸と固体撮像素子71の受光部74の面とが平行となるように配置される。
[Fifth embodiment]
In FIG. 14, the imaging apparatus 100 of the present embodiment uses the solid-state imaging device 71 and the signal processing circuit 72 of FIG. 9, and a prism 101 is provided between the lens barrel 37 and the cover glass 42. The prism 101 has an incident surface 101 a connected to the lens barrel 37 and an output surface 101 b connected to the cover glass 42. Thereby, the optical axis of the objective optical system 36 and the surface of the light receiving unit 74 of the solid-state imaging device 71 are arranged in parallel.

固体撮像素子71と信号処理回路72とは、その前端面と後端面とが突き合わせて接着されている。信号処理回路72は、固体撮像素子71の前端面に接着されることで、鏡筒37の下部に配置される。信号処理回路72と鏡筒37の下部には、熱伝導性接着剤54が充填されている。   The solid-state imaging device 71 and the signal processing circuit 72 are bonded such that the front end surface and the rear end surface are in contact with each other. The signal processing circuit 72 is disposed below the lens barrel 37 by being adhered to the front end surface of the solid-state image sensor 71. The lower part of the signal processing circuit 72 and the lens barrel 37 is filled with a heat conductive adhesive 54.

固体撮像素子71の前端と信号処理回路72の後端の表面には、電極パッドが形成されており、これらはボンディングワイヤ等で電気的に接続される。プリズム101等の屈曲光学系を用いた撮像装置100についても、本発明を適用することができる。   Electrode pads are formed on the surface of the front end of the solid-state image sensor 71 and the rear end of the signal processing circuit 72, and these are electrically connected by bonding wires or the like. The present invention can also be applied to the imaging device 100 using a bending optical system such as the prism 101.

以上、第一〜第五実施形態を挙げて本発明の種々の態様を説明してきたが、要するに、熱源である信号処理回路を鏡筒の周面に対向する位置に配置し、信号処理回路と鏡筒とを熱伝導性部材で接続するという本発明の主旨を逸脱しなければ、如何様にも変更することが可能である。   As described above, various aspects of the present invention have been described with reference to the first to fifth embodiments. In short, the signal processing circuit as a heat source is arranged at a position facing the peripheral surface of the lens barrel, and the signal processing circuit and Any change can be made without departing from the gist of the present invention in which the lens barrel is connected by a heat conductive member.

なお、図15、図16に示す態様を採用してもよい。図15に示す撮像装置110は、固体撮像素子71と信号処理回路72の接続形態を図14の例と同一とし、プリズム101をなくして、第一〜第四実施形態と同様に受光部74の面が対物光学系36の光軸と垂直となるように固体撮像素子71を配置している。そして、90°に折り曲げた熱伝導性の放熱板111と熱伝導性接着剤54で、信号処理回路72とスペーサ41、カバーガラス42の下側面、および鏡筒37の下部とを接続している。放熱板111は、基板44のベースと同様の素材からなる。   In addition, you may employ | adopt the aspect shown in FIG. 15, FIG. The imaging device 110 shown in FIG. 15 has the same connection form between the solid-state imaging device 71 and the signal processing circuit 72 as in the example of FIG. 14, omits the prism 101, and is similar to the first to fourth embodiments. The solid-state image sensor 71 is arranged so that the surface is perpendicular to the optical axis of the objective optical system 36. The signal processing circuit 72, the spacer 41, the lower surface of the cover glass 42, and the lower part of the lens barrel 37 are connected by a heat conductive heat sink 111 bent by 90 ° and a heat conductive adhesive 54. . The heat sink 111 is made of the same material as the base of the substrate 44.

図16に示す撮像装置120は、固体撮像素子38の裏面に突起電極43を介して信号処理回路121をフリップチップ実装している。そして、放熱板111と同様の材質の放熱板122と熱伝導性接着剤54で、信号処理回路121の下側面と、固体撮像素子38、スペーサ41、カバーガラス42、および鏡筒37の下部を接続している。なお、符号123は、伝送線52が半田接続される電極パッドである。固体撮像素子38の裏面に信号処理回路121をフリップチップ実装しているため、図15の例と比べて、先端部14の径方向のサイズを小さくすることができる。図15、図16に示す例では、信号処理回路と鏡筒が離れている分、上記各実施形態と比べて熱効率の点では若干劣る。   In the imaging device 120 illustrated in FIG. 16, the signal processing circuit 121 is flip-chip mounted on the back surface of the solid-state imaging device 38 via the protruding electrode 43. Then, the lower surface of the signal processing circuit 121 and the lower part of the solid-state imaging device 38, the spacer 41, the cover glass 42, and the lens barrel 37 are formed with the heat radiating plate 122 and the heat conductive adhesive 54 made of the same material as the heat radiating plate 111. Connected. Reference numeral 123 denotes an electrode pad to which the transmission line 52 is soldered. Since the signal processing circuit 121 is flip-chip mounted on the back surface of the solid-state imaging device 38, the size of the distal end portion 14 in the radial direction can be reduced as compared with the example of FIG. In the examples shown in FIGS. 15 and 16, the signal processing circuit and the lens barrel are separated from each other, so that the thermal efficiency is slightly inferior to the above embodiments.

放熱板111、122としては、銅やアルミ等の熱伝導性のよい金属を用いてもよい。金属を用いた場合は、固体撮像素子と信号処理回路の接続を補強することができる。また、図16に示す例では、固体撮像素子や信号処理回路と鉗子チャンネルとの間に放熱板が配されるので、鉗子チャンネルに挿通される高周波電気メス等による電磁ノイズの影響を遮断することができる。   As the heat sinks 111 and 122, a metal having good thermal conductivity such as copper or aluminum may be used. When metal is used, the connection between the solid-state imaging device and the signal processing circuit can be reinforced. In the example shown in FIG. 16, since the heat sink is arranged between the solid-state imaging device or signal processing circuit and the forceps channel, the influence of electromagnetic noise due to a high-frequency electric knife or the like inserted through the forceps channel is blocked. Can do.

上記各実施形態では、熱伝導性接着剤を各部材の全面に充填しているが、熱伝導性が十分であれば局所的に充填しても構わない。   In each of the above embodiments, the heat conductive adhesive is filled on the entire surface of each member, but may be locally filled as long as the heat conductivity is sufficient.

上記各実施形態では、電子内視鏡を例示して説明しているが、撮像装置に加えて超音波トランスデューサが内蔵された超音波内視鏡についても、本発明を適用することが可能である。また、医療用電子内視鏡だけでなく、工業分野で利用される電子内視鏡に適用しても可である。   In each of the above embodiments, the electronic endoscope is described as an example. However, the present invention can be applied to an ultrasonic endoscope in which an ultrasonic transducer is built in addition to the imaging apparatus. . Further, the present invention can be applied not only to medical electronic endoscopes but also to electronic endoscopes used in the industrial field.

内視鏡システムの構成図である。It is a block diagram of an endoscope system. 電子内視鏡の先端部の端面を示す図である。It is a figure which shows the end surface of the front-end | tip part of an electronic endoscope. 電子内視鏡の先端部の内部構造を示す断面図である。It is sectional drawing which shows the internal structure of the front-end | tip part of an electronic endoscope. 第一実施形態の撮像装置の周辺を拡大した断面図である。It is sectional drawing to which the periphery of the imaging device of 1st embodiment was expanded. スペーサを介してカバーガラスを固体撮像素子に取り付ける工程の説明図である。It is explanatory drawing of the process of attaching a cover glass to a solid-state image sensor through a spacer. 放熱兼接続回路基板に固体撮像素子および信号処理回路をフリップチップ実装する工程の説明図である。It is explanatory drawing of the process of flip-chip mounting a solid-state image sensor and a signal processing circuit on a heat dissipation and connection circuit board. 放熱兼接続回路基板を折り曲げて、熱伝導性接着剤を介して鏡筒等に接着固定する工程の説明図である。It is explanatory drawing of the process of bend | folding a heat dissipation and connection circuit board, and adhere-fixing to a lens-barrel etc. via a heat conductive adhesive agent. 第二実施形態の撮像装置を示す断面図である。It is sectional drawing which shows the imaging device of 2nd embodiment. 第三実施形態の撮像装置を示す断面図である。It is sectional drawing which shows the imaging device of 3rd embodiment. 第三実施形態の変形例を示す図である。It is a figure which shows the modification of 3rd embodiment. 第三実施形態の変形例を示す図である。It is a figure which shows the modification of 3rd embodiment. 第四実施形態の撮像装置に用いられる放熱兼接続回路基板を示す斜視図である。It is a perspective view which shows the thermal radiation and connection circuit board used for the imaging device of 4th embodiment. 第四実施形態の撮像装置を示す斜視図である。It is a perspective view which shows the imaging device of 4th embodiment. 第五実施形態の撮像装置を示す断面図である。It is sectional drawing which shows the imaging device of 5th embodiment. 撮像装置の他の例を示す断面図である。It is sectional drawing which shows the other example of an imaging device. 撮像装置のさらに他の例を示す断面図である。It is sectional drawing which shows the further another example of an imaging device.

符号の説明Explanation of symbols

2 内視鏡システム
10 電子内視鏡
36 対物光学系
37 鏡筒
38、71、79 固体撮像素子
39、74 受光部
40、60、70、90、100、110、120 撮像装置
43、76 突起電極
44、61、73、91 放熱兼接続回路基板(基板)
45 実装部
46、62 放熱部
49、72、78、81、121 信号処理回路
53 回路パターン
54 熱伝導性接着剤
64 フレキシブル回路基板
82 溝
92 巻き付け部
101 プリズム
111、122 放熱板
DESCRIPTION OF SYMBOLS 2 Endoscope system 10 Electronic endoscope 36 Objective optical system 37 Lens barrel 38, 71, 79 Solid-state image sensor 39, 74 Light-receiving part 40, 60, 70, 90, 100, 110, 120 Imaging device 43, 76 Projection electrode 44, 61, 73, 91 Heat dissipation and connection circuit board (board)
45 mounting part 46, 62 heat radiation part 49, 72, 78, 81, 121 signal processing circuit 53 circuit pattern 54 heat conductive adhesive 64 flexible circuit board 82 groove 92 winding part 101 prism 111, 122 heat radiation plate

Claims (15)

被検体内の被観察部位の像光を取り込むための対物光学系と、
前記対物光学系を保持する鏡筒と、
被観察部位の像光を撮像して撮像信号を出力する固体撮像素子と、
前記鏡筒の周面に対向する位置に配置された前記固体撮像素子の信号処理回路と、
前記鏡筒と前記信号処理回路とを接続する、熱伝導性を有する放熱部材とを備えることを特徴とする電子内視鏡用撮像装置。
An objective optical system for capturing image light of an observation site in the subject;
A lens barrel holding the objective optical system;
A solid-state imaging device that captures image light of an observed site and outputs an imaging signal;
A signal processing circuit of the solid-state imaging device disposed at a position facing the peripheral surface of the lens barrel;
An imaging apparatus for an electronic endoscope, comprising: a heat-dissipating member having thermal conductivity for connecting the lens barrel and the signal processing circuit.
前記固体撮像素子は、その受光部の面が前記対物光学系の光軸に対して垂直となるように前記鏡筒に取り付けられており、
前記信号処理回路は、前記固体撮像素子に対して90°の角度をなし、前記鏡筒の周面と対向する面が前記対物光学系の光軸に対して平行となるように配置されることを特徴とする請求項1に記載の電子内視鏡用撮像装置。
The solid-state imaging device is attached to the barrel so that the surface of the light receiving portion is perpendicular to the optical axis of the objective optical system,
The signal processing circuit is disposed at an angle of 90 ° with respect to the solid-state imaging device, and a surface facing the peripheral surface of the lens barrel is parallel to the optical axis of the objective optical system. The imaging device for an electronic endoscope according to claim 1.
前記固体撮像素子と前記信号処理回路とを電気的に接続する接続回路基板を備えることを特徴とする請求項1または2に記載の電子内視鏡用撮像装置。   The imaging apparatus for an electronic endoscope according to claim 1, further comprising a connection circuit board that electrically connects the solid-state imaging device and the signal processing circuit. 前記接続回路基板は、前記放熱部材を兼ねることを特徴とする請求項3に記載の電子内視鏡用撮像装置。   The imaging device for an electronic endoscope according to claim 3, wherein the connection circuit board also serves as the heat dissipation member. 前記接続回路基板は、熱伝導性フィラーが添加された樹脂をベースとすることを特徴とする請求項4に記載の電子内視鏡用撮像装置。   The imaging device for an electronic endoscope according to claim 4, wherein the connection circuit board is based on a resin to which a thermally conductive filler is added. 前記接続回路基板は、前記鏡筒の周面と対向する前記信号処理回路の面の全面を覆う放熱部を有することを特徴とする請求項4または5に記載の電子内視鏡用撮像装置。   6. The electronic endoscope imaging apparatus according to claim 4, wherein the connection circuit board includes a heat radiating portion that covers the entire surface of the signal processing circuit facing the peripheral surface of the lens barrel. 前記放熱部は、回路パターンを形成する金属箔で覆われることを特徴とする請求項6に記載の電子内視鏡用撮像装置。   The imaging device for an electronic endoscope according to claim 6, wherein the heat radiating portion is covered with a metal foil that forms a circuit pattern. 前記接続回路基板は、前記放熱部を外側に延出させた、前記鏡筒の周面を覆うように巻き付け固定される巻き付け部を有することを特徴とする請求項6または7に記載の電子内視鏡用撮像装置。   The electronic circuit according to claim 6, wherein the connection circuit board includes a winding part that is wound and fixed so as to cover a peripheral surface of the lens barrel, the outside extending the heat radiating part. Imaging device for endoscope. 前記接続回路基板は、前記固体撮像素子が突起電極を介してフリップチップ実装される実装部を有することを特徴とする請求項3ないし8のいずれかに記載の電子内視鏡用撮像装置。   9. The electronic endoscope imaging apparatus according to claim 3, wherein the connection circuit board has a mounting portion on which the solid-state imaging device is flip-chip mounted via a protruding electrode. 前記接続回路基板は、前記信号処理回路が前記固体撮像素子に対して90°の角度をなすように折り曲げられるフレキシブル回路基板であることを特徴とする請求項3ないし9のいずれかに記載の電子内視鏡用撮像装置。   10. The electronic circuit according to claim 3, wherein the connection circuit board is a flexible circuit board that is bent so that the signal processing circuit forms an angle of 90 degrees with respect to the solid-state imaging device. Endoscopic imaging device. 前記固体撮像素子または前記信号処理回路のいずれか一方には、互いに90°の角度をなすように他方を嵌め込み固定するための溝が形成されていることを特徴とする請求項2に記載の電子内視鏡用撮像装置。   3. The electron according to claim 2, wherein either one of the solid-state imaging device or the signal processing circuit is formed with a groove for fitting and fixing the other so as to form an angle of 90 ° with each other. Endoscopic imaging device. 前記対物光学系に入射面が、前記固体撮像素子の受光部の面に出射面がそれぞれ対向するように配置され、前記対物光学系からの像光を受光部に導光するプリズムを備え、
前記信号処理回路は、その後端面が前記固体撮像素子の前端面に接続され、前記鏡筒の周面と対向する面が前記対物光学系の光軸に対して平行となるように配置されることを特徴とする請求項1に記載の電子内視鏡用撮像装置。
An incident surface on the objective optical system, and a prism that guides image light from the objective optical system to the light receiving unit, the light emitting unit being disposed so that the exit surface faces the surface of the light receiving unit of the solid-state imaging device,
The signal processing circuit is disposed such that a rear end surface thereof is connected to a front end surface of the solid-state imaging device and a surface facing the peripheral surface of the lens barrel is parallel to the optical axis of the objective optical system. The imaging device for an electronic endoscope according to claim 1.
前記放熱部材は、前記鏡筒と前記信号処理回路とを直接的、または間接的に接着固定するための接着剤を含むことを特徴とする請求項1ないし12のいずれかに記載の電子内視鏡用撮像装置。   13. The electronic endoscope according to claim 1, wherein the heat radiating member includes an adhesive for directly or indirectly bonding and fixing the lens barrel and the signal processing circuit. Mirror imaging device. 前記接着剤は、熱伝導性フィラーが添加されたものであることを特徴とする請求項13に記載の電子内視鏡用撮像装置。   The imaging apparatus for an electronic endoscope according to claim 13, wherein the adhesive is one to which a heat conductive filler is added. 被検体内の被観察部位の像光を取り込むための対物光学系と、
前記対物光学系を保持する鏡筒と、
被観察部位の像光を撮像して撮像信号を出力する固体撮像素子と、
前記鏡筒の周面に対向する位置に配置された前記固体撮像素子の信号処理回路と、
前記鏡筒と前記信号処理回路とを接続する、熱伝導性を有する放熱部材とを有する電子内視鏡用撮像装置を備えることを特徴とする電子内視鏡。
An objective optical system for capturing image light of an observation site in the subject;
A lens barrel holding the objective optical system;
A solid-state imaging device that captures image light of an observed site and outputs an imaging signal;
A signal processing circuit of the solid-state imaging device disposed at a position facing the peripheral surface of the lens barrel;
An electronic endoscope comprising: an electronic endoscope imaging device having a thermal conductive heat radiating member that connects the lens barrel and the signal processing circuit.
JP2008242592A 2008-09-22 2008-09-22 Imaging apparatus for electronic endoscope and electronic endoscope Pending JP2010069217A (en)

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