[go: up one dir, main page]

JP2009156788A5 - X-ray inspection device - Google Patents

X-ray inspection device Download PDF

Info

Publication number
JP2009156788A5
JP2009156788A5 JP2007337572A JP2007337572A JP2009156788A5 JP 2009156788 A5 JP2009156788 A5 JP 2009156788A5 JP 2007337572 A JP2007337572 A JP 2007337572A JP 2007337572 A JP2007337572 A JP 2007337572A JP 2009156788 A5 JP2009156788 A5 JP 2009156788A5
Authority
JP
Japan
Prior art keywords
ray
rays
detectors
control means
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007337572A
Other languages
Japanese (ja)
Other versions
JP2009156788A (en
JP5167810B2 (en
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2007337572A external-priority patent/JP5167810B2/en
Priority to JP2007337572A priority Critical patent/JP5167810B2/en
Priority to KR1020107015123A priority patent/KR101207613B1/en
Priority to CN2008801276473A priority patent/CN101960296B/en
Priority to PCT/JP2008/073587 priority patent/WO2009084581A1/en
Priority to EP08868830.4A priority patent/EP2239560B1/en
Priority to US12/810,773 priority patent/US8391581B2/en
Publication of JP2009156788A publication Critical patent/JP2009156788A/en
Publication of JP2009156788A5 publication Critical patent/JP2009156788A5/en
Publication of JP5167810B2 publication Critical patent/JP5167810B2/en
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Claims (6)

対象物の検査対象領域を透過したX線を複数の検出面で受光することにより、前記検査対象領域の像の再構成処理を実行するためのX線検査装置であって、
前記複数の検出面で撮像するための複数のX線検出器と、
各前記X線検出器を所定の1軸方向に沿って移動させる検出器駆動手段と、
前記検査対象領域を透過したX線が、それぞれ複数の撮像位置に移動した前記複数のX線検出器に入射するように対応させてX線を出力するX線出力手段と、
前記X線検査装置の動作の制御を行う制御手段とを備え、
前記制御手段は、
各前記X線検出器の露光タイミングと、前記検出器駆動手段とを制御する画像取得制御手段と、
前記X線出力手段を制御するためのX線出力制御手段と、
複数の前記検出面で検出した、前記検査対象領域を透過したX線の強度分布のデータに基づき、前記検査対象領域の像データを再構成する画像再構成処理手段とを含む、X線検査装置。
An X-ray inspection apparatus for executing reconstruction processing of an image of the inspection target area by receiving X-rays transmitted through the inspection target area of an object by a plurality of detection surfaces,
A plurality of x-ray detectors for imaging on the plurality of detection planes;
Detector driving means for moving each of the X-ray detectors along a predetermined axial direction;
X-ray output means for outputting X-rays in a corresponding manner so that X-rays transmitted through the region to be inspected enter the plurality of X-ray detectors which have respectively moved to a plurality of imaging positions;
Control means for controlling the operation of the X-ray examination apparatus;
The control means
An image acquisition control unit that controls the exposure timing of each of the X-ray detectors and the detector driving unit;
X-ray output control means for controlling the X-ray output means;
An X-ray examination apparatus including image reconstruction processing means for reconstructing image data of the examination area based on data of intensity distribution of X-rays transmitted through the examination area detected at a plurality of detection surfaces; .
前記検出器駆動手段は、前記複数のX線検出器を所定の平面内で平行に移動させる、請求項1記載のX線検査装置。 The X-ray inspection apparatus according to claim 1, wherein the detector driving means moves the plurality of X-ray detectors in parallel in a predetermined plane. 前記X線出力制御手段は、
前記複数の検出面について、前記X線が前記検査対象領域を透過して各前記検出面に対して入射するように前記X線の放射の起点位置の各々を設定する起点設定手段を含み、
前記X線出力手段は、各前記起点位置にX線源のX線焦点位置を移動させて、前記X線を発生させる、請求項1または2に記載のX線検査装置。
The X-ray output control means
Origin setting means for setting each of the origin positions of the radiation of the X-rays so that the X-rays pass through the region to be inspected and enter each of the plurality of detection surfaces;
The X-ray examination apparatus according to claim 1 or 2 , wherein the X-ray output means moves the X-ray focal position of the X-ray source to each of the origin positions to generate the X-ray.
前記X線出力手段は、前記撮像位置に配置されている複数のX線検出器のうち同時に露光状態となっている複数のX線検出器に対して、それぞれ対応する複数のX線焦点位置からX線を発生させ、
前記X線出力手段からのX線が、前記同時に露光状態となっているX線検出器のそれぞれに対して、対応するX線焦点位置から前記検査対象領域を透過して各前記検出面に対して入射するX線は透過する一方、対応しないX線焦点位置からのX線は遮蔽する遮蔽部材とをさらに備える、請求項記載のX線検査装置。
The X-ray output unit is configured to, from among the plurality of X-ray detectors disposed at the imaging position, the plurality of X-ray focal points corresponding respectively to the plurality of X-ray detectors in the exposure state simultaneously. Generate x-rays,
The X-rays from the X-ray output means pass through the inspection object area from the corresponding X-ray focal point position to each of the X-ray detectors in the simultaneously exposed state, and while X-rays transmitted through the incident Te, X-rays from the X-ray focal position that does not correspond further comprises a shielding member for shielding, X-rays inspection apparatus according to claim 1.
前記X線出力手段は、X線源の連続面であるターゲット面上に照射する電子ビームを偏向させることで前記X線源のX線焦点位置を移動させ、
前記X線出力制御手段は、
前記同時に露光状態となっているX線検出器のそれぞれに対して、前記X線が時分割で入射するように、前記X線出力手段を制御する、請求項に記載のX線検査装置。
The X-ray output means moves an X-ray focal position of the X-ray source by deflecting an electron beam to be irradiated onto a target surface which is a continuous surface of the X-ray source,
The X-ray output control means
For each X-ray detector the be simultaneously exposed state, the to be incident X-ray is time division, controls the X-ray output unit, X-ray inspection apparatus according to claim 1.
前記画像再構成処理手段は、反復的手法により前記検査対象領域の画像データを再構成する、請求項に記載のX線検査装置。 The X-ray examination apparatus according to claim 2 , wherein the image reconstruction processing means reconstructs the image data of the region to be examined by an iterative method.
JP2007337572A 2007-12-27 2007-12-27 X-ray inspection equipment Active JP5167810B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2007337572A JP5167810B2 (en) 2007-12-27 2007-12-27 X-ray inspection equipment
EP08868830.4A EP2239560B1 (en) 2007-12-27 2008-12-25 X-ray examining apparatus and x-ray examining method
CN2008801276473A CN101960296B (en) 2007-12-27 2008-12-25 X-ray examining apparatus and x-ray examining method
PCT/JP2008/073587 WO2009084581A1 (en) 2007-12-27 2008-12-25 X-ray examining apparatus and x-ray examining method
KR1020107015123A KR101207613B1 (en) 2007-12-27 2008-12-25 X-ray examining apparatus and x-ray examining method
US12/810,773 US8391581B2 (en) 2007-12-27 2008-12-25 X-ray inspecting apparatus and X-ray inspecting method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007337572A JP5167810B2 (en) 2007-12-27 2007-12-27 X-ray inspection equipment

Related Child Applications (3)

Application Number Title Priority Date Filing Date
JP2008065187A Division JP5167882B2 (en) 2007-12-27 2008-03-14 X-ray inspection apparatus and X-ray inspection method
JP2010057524A Division JP5263204B2 (en) 2010-03-15 2010-03-15 X-ray inspection apparatus and X-ray inspection method
JP2010057525A Division JP5115574B2 (en) 2010-03-15 2010-03-15 X-ray inspection apparatus and X-ray inspection method

Publications (3)

Publication Number Publication Date
JP2009156788A JP2009156788A (en) 2009-07-16
JP2009156788A5 true JP2009156788A5 (en) 2012-10-11
JP5167810B2 JP5167810B2 (en) 2013-03-21

Family

ID=40960953

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007337572A Active JP5167810B2 (en) 2007-12-27 2007-12-27 X-ray inspection equipment

Country Status (1)

Country Link
JP (1) JP5167810B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI394490B (en) 2008-09-10 2013-04-21 Omron Tateisi Electronics Co X-ray inspecting device and method for inspecting x ray
JP5466458B2 (en) * 2009-08-31 2014-04-09 日立Geニュークリア・エナジー株式会社 Piping tomography apparatus and control method thereof
JP5832200B2 (en) * 2011-08-29 2015-12-16 マイクロクラフト株式会社 Apparatus and method for acquiring defect analysis image of wiring board using X-ray
JP6780309B2 (en) 2016-06-10 2020-11-04 オムロン株式会社 Inspection equipment
JP6973536B2 (en) * 2020-03-11 2021-12-01 オムロン株式会社 X-ray inspection equipment and X-ray inspection method
JP7739757B2 (en) * 2021-05-20 2025-09-17 オムロン株式会社 Control system, control method, and program

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56138268A (en) * 1980-03-31 1981-10-28 Shimadzu Corp Radial fault photographing equipment for positron
JP2000046760A (en) * 1998-05-29 2000-02-18 Shimadzu Corp X-ray tomographic plane inspection system
JP4654551B2 (en) * 2001-08-27 2011-03-23 株式会社島津製作所 CT equipment
JP3940579B2 (en) * 2001-10-18 2007-07-04 株式会社東芝 X-ray computed tomography system
US7103138B2 (en) * 2004-08-24 2006-09-05 The Board Of Trustees Of The Leland Stanford Junior University Sampling in volumetric computed tomography
DE102004051172A1 (en) * 2004-10-20 2006-04-27 Siemens Ag Detector for a computed tomography device and computed tomography device with such a detector
JP2006162335A (en) * 2004-12-03 2006-06-22 Nagoya Electric Works Co Ltd X-ray inspection apparatus, X-ray inspection method, and X-ray inspection program
US7302033B2 (en) * 2005-06-29 2007-11-27 Accuray Incorporated Imaging geometry for image-guided radiosurgery
JP4936687B2 (en) * 2005-06-30 2012-05-23 株式会社東芝 Multi-tube CT system

Similar Documents

Publication Publication Date Title
JP2019144177A (en) X-ray imaging system
JP4488885B2 (en) CT equipment
JP2000321221A (en) Method and system for producing projection data by ct system
WO2011013164A1 (en) Radiographic apparatus
CN104487868B (en) Radiological image acquisition device
JP2009156788A5 (en) X-ray inspection device
KR102405926B1 (en) HIGH-RESOLUTION COMPUTED TOMOGRAPHY USING EDGE-ON DETECTORS WITH TEMPORALLY OFFSET DEPTH-SEGMENTS
US9341583B2 (en) Correction information generation method and correction information generation apparatus
CN105842267A (en) Non-synchrotron radiation micro-X-ray fluorescence CT imaging system and method
JP2011083499A5 (en)
JPWO2010074031A1 (en) X-ray inspection method and X-ray inspection apparatus
US12203876B2 (en) Industrial x-ray workpiece measuring system and method for operating same
KR101680602B1 (en) System, apparatus and method for reconstructing three dimensional internal image and non-transitory computer-readable recording medium
US20190025231A1 (en) A method of detection of defects in materials with internal directional structure and a device for performance of the method
JP5487519B2 (en) Industrial X-ray CT apparatus and imaging method
JP6506629B2 (en) X-ray receiving apparatus and X-ray inspection apparatus provided with the same
Nachtrab et al. Development of a Timepix based detector for the NanoXCT project
JP6789591B2 (en) Radiation phase imager
JP2009047440A (en) Nondestructive inspection apparatus and nondestructive inspection method
JP2013205267A (en) X-ray tomographic method and x-ray tomographic apparatus
JP4881796B2 (en) X-ray CT system
JP2010133982A5 (en)
JP4763655B2 (en) X-ray imaging device
JP2008256587A (en) X-ray inspection apparatus and X-ray inspection method
JP7460197B2 (en) Sample imaging method