JP2009156788A5 - X-ray inspection device - Google Patents
X-ray inspection device Download PDFInfo
- Publication number
- JP2009156788A5 JP2009156788A5 JP2007337572A JP2007337572A JP2009156788A5 JP 2009156788 A5 JP2009156788 A5 JP 2009156788A5 JP 2007337572 A JP2007337572 A JP 2007337572A JP 2007337572 A JP2007337572 A JP 2007337572A JP 2009156788 A5 JP2009156788 A5 JP 2009156788A5
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- Prior art keywords
- ray
- rays
- detectors
- control means
- inspection
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- 238000007689 inspection Methods 0.000 title claims 8
- 238000001514 detection method Methods 0.000 claims 4
- 238000003384 imaging method Methods 0.000 claims 3
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 230000005855 radiation Effects 0.000 claims 1
Claims (6)
前記複数の検出面で撮像するための複数のX線検出器と、
各前記X線検出器を所定の1軸方向に沿って移動させる検出器駆動手段と、
前記検査対象領域を透過したX線が、それぞれ複数の撮像位置に移動した前記複数のX線検出器に入射するように対応させてX線を出力するX線出力手段と、
前記X線検査装置の動作の制御を行う制御手段とを備え、
前記制御手段は、
各前記X線検出器の露光タイミングと、前記検出器駆動手段とを制御する画像取得制御手段と、
前記X線出力手段を制御するためのX線出力制御手段と、
複数の前記検出面で検出した、前記検査対象領域を透過したX線の強度分布のデータに基づき、前記検査対象領域の像データを再構成する画像再構成処理手段とを含む、X線検査装置。 An X-ray inspection apparatus for executing reconstruction processing of an image of the inspection target area by receiving X-rays transmitted through the inspection target area of an object by a plurality of detection surfaces,
A plurality of x-ray detectors for imaging on the plurality of detection planes;
Detector driving means for moving each of the X-ray detectors along a predetermined axial direction;
X-ray output means for outputting X-rays in a corresponding manner so that X-rays transmitted through the region to be inspected enter the plurality of X-ray detectors which have respectively moved to a plurality of imaging positions;
Control means for controlling the operation of the X-ray examination apparatus;
The control means
An image acquisition control unit that controls the exposure timing of each of the X-ray detectors and the detector driving unit;
X-ray output control means for controlling the X-ray output means;
An X-ray examination apparatus including image reconstruction processing means for reconstructing image data of the examination area based on data of intensity distribution of X-rays transmitted through the examination area detected at a plurality of detection surfaces; .
前記複数の検出面について、前記X線が前記検査対象領域を透過して各前記検出面に対して入射するように前記X線の放射の起点位置の各々を設定する起点設定手段を含み、
前記X線出力手段は、各前記起点位置にX線源のX線焦点位置を移動させて、前記X線を発生させる、請求項1または2に記載のX線検査装置。 The X-ray output control means
Origin setting means for setting each of the origin positions of the radiation of the X-rays so that the X-rays pass through the region to be inspected and enter each of the plurality of detection surfaces;
The X-ray examination apparatus according to claim 1 or 2 , wherein the X-ray output means moves the X-ray focal position of the X-ray source to each of the origin positions to generate the X-ray.
前記X線出力手段からのX線が、前記同時に露光状態となっているX線検出器のそれぞれに対して、対応するX線焦点位置から前記検査対象領域を透過して各前記検出面に対して入射するX線は透過する一方、対応しないX線焦点位置からのX線は遮蔽する遮蔽部材とをさらに備える、請求項1記載のX線検査装置。 The X-ray output unit is configured to, from among the plurality of X-ray detectors disposed at the imaging position, the plurality of X-ray focal points corresponding respectively to the plurality of X-ray detectors in the exposure state simultaneously. Generate x-rays,
The X-rays from the X-ray output means pass through the inspection object area from the corresponding X-ray focal point position to each of the X-ray detectors in the simultaneously exposed state, and while X-rays transmitted through the incident Te, X-rays from the X-ray focal position that does not correspond further comprises a shielding member for shielding, X-rays inspection apparatus according to claim 1.
前記X線出力制御手段は、
前記同時に露光状態となっているX線検出器のそれぞれに対して、前記X線が時分割で入射するように、前記X線出力手段を制御する、請求項1に記載のX線検査装置。 The X-ray output means moves an X-ray focal position of the X-ray source by deflecting an electron beam to be irradiated onto a target surface which is a continuous surface of the X-ray source,
The X-ray output control means
For each X-ray detector the be simultaneously exposed state, the to be incident X-ray is time division, controls the X-ray output unit, X-ray inspection apparatus according to claim 1.
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007337572A JP5167810B2 (en) | 2007-12-27 | 2007-12-27 | X-ray inspection equipment |
| EP08868830.4A EP2239560B1 (en) | 2007-12-27 | 2008-12-25 | X-ray examining apparatus and x-ray examining method |
| CN2008801276473A CN101960296B (en) | 2007-12-27 | 2008-12-25 | X-ray examining apparatus and x-ray examining method |
| PCT/JP2008/073587 WO2009084581A1 (en) | 2007-12-27 | 2008-12-25 | X-ray examining apparatus and x-ray examining method |
| KR1020107015123A KR101207613B1 (en) | 2007-12-27 | 2008-12-25 | X-ray examining apparatus and x-ray examining method |
| US12/810,773 US8391581B2 (en) | 2007-12-27 | 2008-12-25 | X-ray inspecting apparatus and X-ray inspecting method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007337572A JP5167810B2 (en) | 2007-12-27 | 2007-12-27 | X-ray inspection equipment |
Related Child Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008065187A Division JP5167882B2 (en) | 2007-12-27 | 2008-03-14 | X-ray inspection apparatus and X-ray inspection method |
| JP2010057524A Division JP5263204B2 (en) | 2010-03-15 | 2010-03-15 | X-ray inspection apparatus and X-ray inspection method |
| JP2010057525A Division JP5115574B2 (en) | 2010-03-15 | 2010-03-15 | X-ray inspection apparatus and X-ray inspection method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009156788A JP2009156788A (en) | 2009-07-16 |
| JP2009156788A5 true JP2009156788A5 (en) | 2012-10-11 |
| JP5167810B2 JP5167810B2 (en) | 2013-03-21 |
Family
ID=40960953
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007337572A Active JP5167810B2 (en) | 2007-12-27 | 2007-12-27 | X-ray inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5167810B2 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI394490B (en) | 2008-09-10 | 2013-04-21 | Omron Tateisi Electronics Co | X-ray inspecting device and method for inspecting x ray |
| JP5466458B2 (en) * | 2009-08-31 | 2014-04-09 | 日立Geニュークリア・エナジー株式会社 | Piping tomography apparatus and control method thereof |
| JP5832200B2 (en) * | 2011-08-29 | 2015-12-16 | マイクロクラフト株式会社 | Apparatus and method for acquiring defect analysis image of wiring board using X-ray |
| JP6780309B2 (en) | 2016-06-10 | 2020-11-04 | オムロン株式会社 | Inspection equipment |
| JP6973536B2 (en) * | 2020-03-11 | 2021-12-01 | オムロン株式会社 | X-ray inspection equipment and X-ray inspection method |
| JP7739757B2 (en) * | 2021-05-20 | 2025-09-17 | オムロン株式会社 | Control system, control method, and program |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56138268A (en) * | 1980-03-31 | 1981-10-28 | Shimadzu Corp | Radial fault photographing equipment for positron |
| JP2000046760A (en) * | 1998-05-29 | 2000-02-18 | Shimadzu Corp | X-ray tomographic plane inspection system |
| JP4654551B2 (en) * | 2001-08-27 | 2011-03-23 | 株式会社島津製作所 | CT equipment |
| JP3940579B2 (en) * | 2001-10-18 | 2007-07-04 | 株式会社東芝 | X-ray computed tomography system |
| US7103138B2 (en) * | 2004-08-24 | 2006-09-05 | The Board Of Trustees Of The Leland Stanford Junior University | Sampling in volumetric computed tomography |
| DE102004051172A1 (en) * | 2004-10-20 | 2006-04-27 | Siemens Ag | Detector for a computed tomography device and computed tomography device with such a detector |
| JP2006162335A (en) * | 2004-12-03 | 2006-06-22 | Nagoya Electric Works Co Ltd | X-ray inspection apparatus, X-ray inspection method, and X-ray inspection program |
| US7302033B2 (en) * | 2005-06-29 | 2007-11-27 | Accuray Incorporated | Imaging geometry for image-guided radiosurgery |
| JP4936687B2 (en) * | 2005-06-30 | 2012-05-23 | 株式会社東芝 | Multi-tube CT system |
-
2007
- 2007-12-27 JP JP2007337572A patent/JP5167810B2/en active Active
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