JP2009025294A - Thermocouple and its temperature measuring contact formation method - Google Patents
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Abstract
【課題】2本の熱電対素線を溶融接合した測温部を、溶融部が団子状に肥大化していない熱電対とその製造方法を提供する。
【解決手段】熱電対測温部は、2本の熱電対素線が相互に接触した部分がハンダフリーに溶融されて一体化され、当該溶融箇所の大きさが素線の太さと同等か2倍未満であることを特徴とする。
【選択図】図4A thermocouple in which two thermocouple wires are melt-bonded and a thermocouple in which the melted portion is not enlarged in a dumpling shape and a method for manufacturing the same are provided.
A thermocouple temperature measuring unit is a method in which a portion where two thermocouple wires are in contact with each other is fused and integrated in a solder-free manner, and the size of the melted portion is equal to the thickness of the wire. It is characterized by being less than double.
[Selection] Figure 4
Description
本発明は、2本の熱電対素線を溶融接合してなる測温部を有する熱電対とその測温接点形成方法に関する。 The present invention relates to a thermocouple having a temperature measuring part formed by melting and joining two thermocouple wires, and a method for forming a temperature measuring contact.
熱電対は、構成する2本の熱電対素線を溶融接合した測温部を有しているが、この測温部は図12に示すように、溶融部が団子状に肥大化している。一方、感度を敏感にするには、素線の直径を細くするとともに測温部の体積を小さくするのが良いとされているが、溶融部の肥大化のため、感度を上げるには限界があった。
また、直径が100ミクロン以下の微小な測温部を形成するのは、従来は、ハンダ付けを行わざるを得ないので、そのハンダによる影響を受けて、高温での測定は、ハンダの溶融温度までとされていた。
The thermocouple has a temperature measuring section in which two thermocouple wires constituting the thermocouple are melt-bonded. As shown in FIG. 12, the temperature measuring section is enlarged in a dumped form. On the other hand, in order to make the sensitivity sensitive, it is said that it is better to reduce the diameter of the wire and reduce the volume of the temperature measuring part, but there is a limit to increase the sensitivity because of the enlargement of the melting part. there were.
In addition, forming a small temperature measuring part having a diameter of 100 microns or less conventionally requires soldering. Due to the influence of the solder, the measurement at a high temperature is performed by the melting temperature of the solder. It was supposed to be up to.
本発明は、このような実情に鑑み、溶融部が団子状に肥大化していない熱電対とその製造方法を提供するととともに、ハンダフリーの微小測温部を提供することを目的とする。 In view of such a situation, the present invention aims to provide a thermocouple in which a molten part is not enlarged in a dumpling form and a manufacturing method thereof, and a solder-free micro-temperature measuring part.
発明1の熱電対は、前記測温部は、二本の熱電対素線が相互に接触した部分が溶融されて一体化され、当該溶融箇所の大きさ(直径)が素線太さの2倍未満であることを特徴とする。 In the thermocouple of the invention 1, in the temperature measuring unit, the portions where the two thermocouple wires are in contact with each other are melted and integrated, and the size (diameter) of the melted portion is 2 of the wire thickness. It is characterized by being less than double.
発明2は、発明1の熱電対において、前記熱電対素線の線径が100μm以下であることを特徴とする。
発明3は、発明1又は2の熱電対において、前記測温部は、ハンダフリーであることを特徴とする。
Invention 2 is the thermocouple of Invention 1, characterized in that the wire diameter of the thermocouple wire is 100 μm or less.
A third aspect of the present invention is the thermocouple of the first or second aspect, wherein the temperature measuring unit is solder-free.
発明4は、発明1から3のいずれかの熱電対の測温接点形成方法であって、2本の熱電対素線の溶融接合を、次の(式1)に示すKが0.2以上であるようにして、不活性ガス中にてパルス状の高電圧マイクロ放電により行うことを特徴とする。
(式1)
発明5は、発明4の熱電対の測温接点形成方法であって、前記(式1)に示すKが1.5以上にして、前記高電圧マイクロ放電を一回のみで2本の熱電対素線の溶融接合を行うことを特徴とする。
発明6は、発明4の熱電対の測温接点形成方法であって、前記(式1)に示すKが0.3以上にして、前記高電圧マイクロ放電と非放電による冷却を多数飼い繰り返して2本の熱電対素線の溶融接合することを特徴とする。
Invention 4 is a method for forming a temperature measuring contact of a thermocouple according to any one of Inventions 1 to 3, wherein the K shown in the following (Equation 1) is 0.2 or more in fusion joining of two thermocouple wires. As described above, it is characterized by performing pulsed high-voltage microdischarge in an inert gas.
(Formula 1)
The invention 5 is the thermocouple temperature measuring contact forming method of the invention 4, wherein the K shown in the (Equation 1) is 1.5 or more, and the high voltage micro discharge is performed only once for two thermocouples. It is characterized by performing fusion bonding of strands.
The invention 6 is the thermocouple temperature measuring contact forming method of the invention 4, wherein the K shown in the (Equation 1) is 0.3 or more, and the high voltage micro discharge and the cooling by non-discharge are repeated many times. It is characterized by melting and joining two thermocouple wires.
測温部の肥大化を抑制して熱電対素線の直径を細くすることにより、測定感度・応答性の向上が計られ、従来には望むことが出来ない極めて高感度の熱電対を提供することが出来た。
さらに、ハンダフリーの測温部を達成したので、ハンダによる影響を受けずに、高い温度の測定まで可能になった。
By suppressing the enlargement of the temperature measuring section and reducing the diameter of the thermocouple wire, measurement sensitivity and responsiveness are improved, providing an extremely sensitive thermocouple that could not be expected in the past. I was able to.
In addition, since a solder-free temperature measuring unit has been achieved, it has become possible to measure high temperatures without being affected by solder.
発明4により、従来行っていた溶接法によるものに比べ,測温接点を形成するためのエネルギー制御性を良くして溶融部を肥大化することを抑え、測温部の大きさを素線の太さの2倍未満にすることができた。
また、素線同士を溶融して一体化することで、ハンダフリーを実現できた。
Invention 4 improves the energy controllability for forming the temperature measuring contact and suppresses the enlargement of the melted part, compared with the conventional welding method, and the size of the temperature measuring part is reduced. It was possible to make it less than twice the thickness.
Moreover, solder-free was realized by melting and integrating the strands.
以下の実施例では、K熱電対(+脚:クロメル合金、−脚:アルメル合金)の測温接点を形成する方法について述べている。この方法を応用して、金やニッケル以外に、難接合材で高融点のタングステンワイヤと金属粒子を接合した例があり、R熱電対およびB熱電対等の白金系熱電対やWRe5:26型等の超高温用熱電対の素材の融点は、タングステンの融点3422°Cよりも低いので、素線径が数十μmの極細熱電対であれば、これらの熱電対の測温接点形成にも適用できる。(詳細は、[No.01-26]日本機械学会第9会機械材料・材料加工技術講演会講演論文集[2001-11.08,09、沖縄],p.89-90、未踏科学技術協会第14回インテリジェント材料/システムシンポジウムアジアワークショップ講演要旨集「2005-03.09,10、東京」,p.78-79、粉体工学会2002年度秋期研究発表会論文集[2002-11.14,15、千葉],p.144-145)
これらの公開情報および実施例では、測温接点形成の前段階として2本の素線先端部を顕微鏡で観察しながら、素線をそれぞれ手で動かして交差させている。このような方法で2本の線の先端部を精度よく交差させることは難しく、実施例1では2本の熱電対素線の先端部が少し飛び出た形で交差させている。飛び出した部分は測温接点形成後も残っており、温度測定を高精度・高感度で行う妨げになる。従って、熱電対素線の先端が飛び出さないように交差させる必要がある。そのため、リール状に巻き込んだ熱電対素線をガイドに沿って送り出す機構を設けると、素線を繰り出すだけで先端を交差させることができる。
また、このときのエネルギーは、次の(式1)に示すKが0.3以上となるように設定した。
(式1)
前記高電圧マイクロ放電を一回のみで素線同士を溶融する場合は、Kが1.5から3.0より好ましくは2.5以下とする。この場合、前記(式1)のKが、1.4以下であると、測温接点の一部が溶融するが、完全溶融して一体化することはない。
また、Kが過剰であると、エネルギーが過大に供給され、素線の溶融や測温接点の肥大化が起きてしまう可能性があると考える。
また、前記高電圧マイクロ放電と非放電による冷却とを繰り返し行う場合は、一回の放電時のエネルギーが前記(式1)のKで、0.2以上、より好ましくは。3以上1.0以下より好ましくは0.8以下とするのが好ましい。
0.2未満であると、素線同士の溶融が不充分で、測温接点としては安定して使用できなくなる。
また、1.0を超える放電を繰り返すと、素線の溶融や測温接点の肥大化が起きてしまう可能性があると考える。
In the following examples, a method for forming a temperature measuring contact of a K thermocouple (+ leg: chromel alloy,-leg: alumel alloy) is described. Applying this method, there are examples in which a high melting point tungsten wire and metal particles other than gold and nickel are bonded to each other, such as platinum thermocouples such as R thermocouples and B thermocouples, WRe5: 26 type, etc. The melting point of the ultra-high temperature thermocouple material is lower than the melting point of tungsten at 3422 ° C. Therefore, if it is an ultra-thin thermocouple with a wire diameter of several tens of μm, it can also be used to form temperature measuring contacts for these thermocouples it can. (For details, see [No.01-26] Proceedings of the 9th meeting of the Japan Society of Mechanical Engineers, Mechanical Materials and Materials Processing Technology [2001-11.08,09, Okinawa], p.89-90, Unexplored Science and Technology Association 14th. Abstracts of the 1st Intelligent Materials / Systems Symposium Asia Workshop “2005-03.09,10, Tokyo”, p.78-79, Proceedings of the 2002 Fall Meeting of the Powder Engineering Society [2002-11.14,15, Chiba], p.144-145)
In these public information and examples, the strands are moved by hand and crossed while observing the tip portions of the two strands with a microscope as a pre-stage of temperature measuring contact formation. With such a method, it is difficult to cross the tip portions of the two wires with high accuracy, and in the first embodiment, the tip portions of the two thermocouple wires are crossed so as to protrude slightly. The protruding part remains even after the temperature measuring contact is formed, which hinders temperature measurement with high accuracy and high sensitivity. Therefore, it is necessary to cross so that the tip of the thermocouple wire does not jump out. Therefore, if a mechanism for feeding out the thermocouple wire wound in a reel shape along the guide is provided, the tips can be crossed only by feeding the strand.
The energy at this time was set so that K shown in the following (Expression 1) was 0.3 or more.
(Formula 1)
In the case where the strands are melted by only one high voltage micro discharge, K is set to 1.5 to 3.0, more preferably 2.5 or less. In this case, if K in (Expression 1) is 1.4 or less, a part of the temperature measuring contact is melted but is not completely melted and integrated.
Further, if K is excessive, energy is excessively supplied, and it is considered that melting of the strands and enlargement of the temperature measuring contact may occur.
In the case where the high-voltage micro discharge and the non-discharge cooling are repeatedly performed, the energy during one discharge is K in (Expression 1), more preferably 0.2 or more. It is preferably 3 or more and 1.0 or less, more preferably 0.8 or less.
If it is less than 0.2, the wires are not sufficiently melted and cannot be used stably as a temperature measuring contact.
Further, it is considered that if the discharge exceeding 1.0 is repeated, melting of the strands and enlargement of the temperature measuring contact may occur.
本発明の実施例は添付図面を参照しながら説明する。本実施例では、線径13μm、25μmと50μmの極細熱電対素線を用いたアルメル合金−クロメル合金(K)熱電対の作製例を示す。なお、K熱電対は2本の素線の融点に大きな差があり、さらに高温で酸化しやすいために接合しにくい材料である。図1、2は本発明である熱電対の測温部の形成手法の模式図を示した。図1は熱電対素線を垂直に立てる手法で、図2は熱電対素線を水平に寝かせる手法である。いずれも取り扱いを容易にするために、前記電対素線よりも相当太くて同質の基線(1)に、極細熱電対素線を継ぎ足した形状のものを用いている。図1の方法では、1対の線径0.2mmの基線(1)を垂直に立てた接地電極となる金属基板(5)に固定し、前記金属基板は作業台(12)に固定する。このとき、基線(1)と金属基板間は同電位になるようにする。 Embodiments of the present invention will be described with reference to the accompanying drawings. In this example, an example of producing an alumel alloy-chromel alloy (K) thermocouple using ultrafine thermocouple wires having wire diameters of 13 μm, 25 μm, and 50 μm is shown. Note that the K thermocouple is a material that has a large difference in the melting point of the two strands and is difficult to join because it is easily oxidized at a high temperature. 1 and 2 show schematic views of a method for forming a temperature measuring portion of a thermocouple according to the present invention. FIG. 1 is a method of standing a thermocouple wire vertically, and FIG. 2 is a method of laying a thermocouple wire horizontally. In any case, in order to facilitate the handling, the base wire (1) which is considerably thicker and the same quality as the above-mentioned wire is used and an extra fine thermocouple wire is added. In the method of FIG. 1, a pair of base lines (1) having a diameter of 0.2 mm are fixed to a metal substrate (5) serving as a ground electrode standing vertically, and the metal substrate is fixed to a work table (12). At this time, the base line (1) and the metal substrate are set to the same potential.
また、それぞれの基線(1)には、極細のアルメル合金線(2)とクロメル合金線(3)がはんだ付けされている。極細の合金線の先端は、金属基板から0.5mm以上飛び出して、かつ互いに交差して接触するようにして固定している。交差部(4)の直上約1mm以下の位置に印加電極とする金属針(6)の先端がくるように、金属針を垂直に配置する。パルス方式の高電圧電源(7)の電圧印加側を金属針に、接地電位(8)側を金属基板にそれぞれ接続した。金属針上方から不活性ガス(9)を流しながら、金属針に高電圧を印加して、金属針−交差部の間で放電させる。
なお、前記式(1)での時間tは、パルス方式での電流印加時の印加時間である。
Also, an extremely fine alumel alloy wire (2) and a chromel alloy wire (3) are soldered to each base line (1). The tips of the ultrafine alloy wires are fixed so that they protrude from the metal substrate by 0.5 mm or more and cross and contact each other. The metal needle is arranged vertically so that the tip of the metal needle (6) serving as the application electrode comes to a position about 1 mm or less directly above the intersection (4). The voltage application side of the pulse type high voltage power source (7) was connected to the metal needle, and the ground potential (8) side was connected to the metal substrate. While flowing an inert gas (9) from above the metal needle, a high voltage is applied to the metal needle to cause discharge between the metal needle and the intersection.
In addition, the time t in the formula (1) is an application time when a current is applied in the pulse method.
図2の方法では極細熱電対素線をそれぞれはんだ付けした一対の線径0.2mmの基線(1)を接地電極となる金属基板(5)に固定し、装置の作業台(12)の上面に置く。交差部(4)の直上約0.1mmの位置に印加電極とする金属針(6)の先端がくるように、金属針を垂直に配置し、図1と同様に金属針上方から不活性ガス(9)を流しながら、金属針に高電圧を印加して、金属針−交差部の間で放電させる。金属針は先端半径2μm、先端角5°、軸経0.66mmのタングステン、印加電圧は2kV以上10kV以下とし、0.5−1秒印加した。なお、放電が生じると電圧が高速に復帰するコッククロフト・ウォルトン回路をもつ電源を使っており、1秒間の放電中には、実際には1mA程度の電流がパルスで流れている。不活性ガスは放電開始5秒前から放電終了5秒後まで流した。 In the method of FIG. 2, a pair of base wires (1) having a diameter of 0.2 mm, to which ultrafine thermocouple wires are soldered, are fixed to a metal substrate (5) serving as a ground electrode, and the upper surface of the work table (12) of the apparatus. Put on. The metal needle is vertically arranged so that the tip of the metal needle (6) serving as the application electrode is positioned at a position of about 0.1 mm directly above the intersection (4), and an inert gas is formed from above the metal needle as in FIG. While flowing (9), a high voltage is applied to the metal needle to cause discharge between the metal needle and the intersection. The metal needle was tungsten having a tip radius of 2 μm, a tip angle of 5 °, and an axial diameter of 0.66 mm. The applied voltage was 2 kV to 10 kV and applied for 0.5-1 second. Note that a power source having a Cockcroft-Walton circuit whose voltage is restored at a high speed when a discharge occurs is used, and a current of about 1 mA is actually flowing in pulses during the discharge for one second. The inert gas was allowed to flow from 5 seconds before the start of discharge to 5 seconds after the end of discharge.
図3は線径25μmの熱電対素線を、図1に示すように、立てて用いた場合の放電中の様子を時間経過にしたがって示す。不活性ガスはヘリウム−10%水素の混合ガスを毎分1リットルの割合で流して、基線を含む全体を、この混合ガスで包み込んだ状態を維持し、放電炎の周辺を大気からシールドした。周辺の圧力は常圧を保っていた(以下同じ)。金属針と熱電対素線の交差部との間を400μmとし、印加電圧は5kV、定格電流は1mA、放電時間は0.5秒とした。図中の各写真は1/30秒間隔で撮影されたもので、1画面に2つの画像があるのは同じものを別方向から同時に撮影しているためである。放電は2本の素線を包み込みながら発生し、放電が開始して約0.1秒後、素線は白熱化する(図中上段右端の写真)。さらに、放電を開始して約0.4秒後に2本の素線は溶融接合して一体化した。この時、素線の先端部が高温になったために折れ曲がってしまった(図中4段目左から2枚目の写真)。図4は放電終了後の熱電対外観を示すSEM写真である。写真中央の白丸部分が溶融接合している箇所で、その大きさは素線径の約1.5倍である。写真の手前にある素線がクロメル合金脚(素線)、奥がアルメル合金脚(素線)を示す。アルメル合金はクロメル合金より低い融点にあるために、完全に溶融して交差部に集まったか、あるいは放電で一部吹き飛ばされてしまったと考えられる。折れ曲がったのはクロメル合金のみである。 FIG. 3 shows a state during discharge when a thermocouple wire having a wire diameter of 25 μm is used upright as shown in FIG. As the inert gas, a mixed gas of helium-10% hydrogen was flowed at a rate of 1 liter per minute, and the whole including the base line was maintained in a state of being enveloped by the mixed gas, and the periphery of the discharge flame was shielded from the atmosphere. The surrounding pressure was maintained at normal pressure (the same applies hereinafter). The distance between the metal needle and the thermocouple element crossing was 400 μm, the applied voltage was 5 kV, the rated current was 1 mA, and the discharge time was 0.5 seconds. Each photo in the figure was taken at 1/30 second intervals, and there are two images on one screen because the same thing is taken simultaneously from different directions. The discharge occurs while wrapping the two strands, and after about 0.1 seconds from the start of the discharge, the strands become incandescent (photo at the right end of the upper stage in the figure). Further, about 0.4 seconds after the start of discharge, the two strands were fused and integrated. At this time, the tip of the strand was bent because of high temperature (second photo from the left in the fourth row in the figure). FIG. 4 is an SEM photograph showing the appearance of the thermocouple after the end of discharge. The white circle part in the center of the photograph is melt-bonded, and the size is about 1.5 times the wire diameter. The wire in front of the photo is the chromel alloy leg (wire), and the back is the alumel alloy leg (wire). Since the alumel alloy has a melting point lower than that of the chromel alloy, it is considered that the alumel alloy is completely melted and gathered at the intersection or partly blown off by discharge. Only the chromel alloy was bent.
図5は素線径50μmの熱電対素線を垂直に立てた場合の放電中の様子を撮影した動画の1コマである。不活性ガスとして窒素を毎分1リットルの割合で流しており、放電炎の周辺は大気からシールドされ、放電は熱電対素線を包み込むように発生している。金属針と熱電対素線間は600μm離し、印加電圧は5kVとし、電圧を1秒印加しては0.5秒休止(非放電してシールドガスで冷却)するという操作を26回繰り返した。放電−休止の繰り返し回数が10回以上になると、入熱に対する熱の放散の割合が低くなり、金属針に近いアルメル合金素線の上方が蓄熱されて白熱化した。
なお、(式1)における、一回のKは、0.4であった。
FIG. 5 shows one frame of a moving image in which a state during discharge when a thermocouple strand having a strand diameter of 50 μm is vertically set is photographed. Nitrogen is flowed as an inert gas at a rate of 1 liter per minute, the periphery of the discharge flame is shielded from the atmosphere, and the discharge is generated so as to wrap the thermocouple wire. The operation of separating the metal needle from the thermocouple element by 600 μm, setting the applied voltage to 5 kV, applying the voltage for 1 second, and resting for 0.5 seconds (non-discharge and cooling with the shielding gas) was repeated 26 times. When the number of repetitions of discharge-pause was 10 times or more, the rate of heat dissipation with respect to heat input was reduced, and the upper part of the alumel alloy wire near the metal needle was accumulated and became incandescent.
In addition, one time K in (Formula 1) was 0.4.
図6は放電終了後の交差部の外観である。実線の○印で示す領域が交差部の熱電対素線同士が接合している部分である。素線同士が一体化したというよりも、接触部で微小な接合部が多数生成している。測温部となる溶け合った部分は非常に小さく熱容量も少ないため、応答性良く、かつ高感度に温度を測定できると考えられる。
また、一点鎖線の○印で示す領域は高電圧放電によりアルメル合金線が溶融して球状になった部分で、直径は70μm(素線径の1.4倍)である。本実験では2本の熱電対素線の先端部が少し飛び出た形で交差させているが、飛び出しを最小にし、放電条件の最適化を実施することで、素線径25μmの場合のように、交差部が完全に溶融した測温部を形成することが可能で、一点鎖線で示した球状部分と同等な微小な体積の測温接点が形成できると思われる。
FIG. 6 shows the appearance of the intersection after the end of discharge. The region indicated by the solid circles is the portion where the thermocouple wires at the intersection are joined. Rather than the wires being integrated, a large number of minute joints are generated at the contact portion. The melted part that becomes the temperature measuring part is very small and has a small heat capacity. Therefore, it is considered that the temperature can be measured with high responsiveness and high sensitivity.
A region indicated by a dot-and-dash line is a portion where the alumel alloy wire is melted into a spherical shape by high-voltage discharge and has a diameter of 70 μm (1.4 times the strand diameter). In this experiment, the tips of the two thermocouple wires intersect each other in a slightly protruding shape, but by minimizing the protrusion and optimizing the discharge conditions, the wire diameter is 25 μm. It is possible to form a temperature measuring part in which the intersecting part is completely melted and to form a temperature measuring contact having a minute volume equivalent to the spherical part indicated by a one-dot chain line.
図7は作製した極細熱電対の測温接点部をエネルギー分散型蛍光X線分析装置(以下EDXと略記する)で成分分析した結果の一例である。−脚であるアルメル合金と+脚であるクロメル合金の成分であるNi、Cr、Mnの存在が明瞭に示された。表1はEDXにより計測した素線および測温接点部の組成を重量%で表示した結果で、上段は最小値、下段は最大値をそれぞれ示す。 FIG. 7 shows an example of the result of component analysis of the temperature measuring contact portion of the produced ultrafine thermocouple using an energy dispersive X-ray fluorescence analyzer (hereinafter abbreviated as EDX). The presence of Ni, Cr and Mn, which are components of the alumel alloy as the leg and the chromel alloy as the leg, was clearly shown. Table 1 shows the results of displaying the composition of the wire and the temperature measuring contact portion measured by EDX in weight%, and the upper part shows the minimum value and the lower part shows the maximum value, respectively.
試作した測温部表面のNi成分はその内側に比べ少ない。一方、Al、Cr、Si、Mnの各成分は表面側で大きく検出されている。図9の薄い被膜は高電圧放電の急激な加熱・急冷現象による析出層である。測温部断面で検出された成分は、Pb、Snの各成分が存在すること以外、市販の素線径0.5mmの熱電対素線と組成が異なるとは言えない。
There are few Ni components of the surface of the temperature measuring part made as a trial compared with the inside. On the other hand, each component of Al, Cr, Si, and Mn is largely detected on the surface side. The thin film in FIG. 9 is a deposited layer due to rapid heating / cooling phenomenon of high voltage discharge. It cannot be said that the components detected in the cross section of the temperature measuring section are different in composition from the commercially available thermocouple wires having a wire diameter of 0.5 mm, except that each component of Pb and Sn exists.
表3は、試作した熱電対と市販の熱電対を、同じ恒温器(SIBATA、STO−300)に並べて入れて、温度を段階的に上げながら測温した結果を示す。 Table 3 shows the results of measuring the temperature while raising the temperature stepwise by placing the prototype thermocouple and a commercially available thermocouple in the same thermostat (SIBATA, STO-300).
*印は図4の測温部表面を示す結果、***印は市販品表面の結果である。
なお、極細熱電対の測温接点形成方法において、熱電対の固定法、金属針と熱電対までの距離や印加電圧、印加時間、不活性ガス種等の作製条件はここで示した値に限定されない。
* Indicates the result of the surface of the temperature measuring unit in FIG. 4, and *** indicates the result of the surface of a commercial product.
In addition, in the method of forming the temperature measuring contact of the ultrafine thermocouple, the thermocouple fixing method, the distance between the metal needle and the thermocouple, the applied voltage, the application time, the inert gas species, etc. are limited to the values shown here. Not.
図10は装置の概略説明図である。この装置は顕微鏡像を観察・記録しながら、直径20μm以上の熱電対素線同士を溶融接合し、熱電対の測温接点を形成することを可能とするパルス方式高電圧接合装置である。この装置は作業台(12)に取り付けた金属基板(5)を所定の位置に移動させるための電動ステージ(10)、パルス方式高電圧電源(7)、金属針(6)、不活性ガスの供給部(13)、熱電対の接合を観察するための顕微鏡(11)を主要な構成要素とする。 FIG. 10 is a schematic explanatory diagram of the apparatus. This apparatus is a pulse-type high-voltage bonding apparatus that enables thermocouple wires having a diameter of 20 μm or more to be melt-bonded to form a temperature measuring contact of a thermocouple while observing and recording a microscopic image. This apparatus includes an electric stage (10) for moving a metal substrate (5) attached to a workbench (12) to a predetermined position, a pulse-type high voltage power source (7), a metal needle (6), an inert gas A supply part (13) and a microscope (11) for observing the joining of the thermocouple are the main components.
以下図10を用いて本発明の装置の概要について説明する。対象とする熱電対の素線径が20μm以上であるため、電動ステージの分解能および繰り返し位置精度は1μm程度以下のものが望ましい。パルス方式高電圧電源は瞬間的に低電圧領域から高電圧領域に昇圧でき、電流値の少ないコッククロフト・ウォルトン型とした。顕微鏡は加工対象領域の観察、および金属針と対象物の初期位置設定を行うために用い、低倍率から高倍率までの観察ができ、作業空間を確保するため、長焦点対物レンズを採用した実体顕微鏡とした。不活性ガスは対象部位を大気からシールドし、安定した放電炎を発生させるためと溶融接合部に生ずる酸化物の生成を抑えるために用いる。本発明では不活性ガスとして窒素ガスや水素を含むヘリウム混合ガスを用いたが、その他の不活性ガスも用いることは可能である。 The outline of the apparatus of the present invention will be described below with reference to FIG. Since the wire diameter of the target thermocouple is 20 μm or more, the resolution and repeat position accuracy of the electric stage are preferably about 1 μm or less. The pulse-type high-voltage power supply is a Cockcroft-Walton type that can instantaneously boost the voltage from the low-voltage region to the high-voltage region and has a small current value. The microscope is used to observe the region to be processed and to set the initial position of the metal needle and object. It can observe from low magnification to high magnification, and an entity that uses a long focus objective lens to secure a working space. A microscope was used. The inert gas is used to shield the target portion from the atmosphere, to generate a stable discharge flame, and to suppress the generation of oxides generated at the melt joint. In the present invention, a helium mixed gas containing nitrogen gas or hydrogen is used as the inert gas, but other inert gases can also be used.
図11は、線径25μmの素線を用いた比較例で、電圧を0.5秒印加して0.5秒休止という、放電−休止のサイクルを繰り返して得られた溶融部のSEM写真である。写真中央の球状部分が溶融接合している箇所で、その大きさは写真上の計測で素線径の5倍以上あり、測温接点となる部分は肥大化している。この比較例では定格電流は図4に示した結果と同じであるが、放電動作を1回だけでなく数回加えたために、接合部が肥大化している。 FIG. 11 is a comparative example using a strand having a wire diameter of 25 μm, and is an SEM photograph of a melted portion obtained by repeating a discharge-pause cycle of applying a voltage for 0.5 seconds and resting for 0.5 seconds. is there. The spherical part in the center of the photograph is melt-joined, and its size is more than five times the wire diameter measured on the photograph, and the part that becomes the temperature measuring contact is enlarged. In this comparative example, the rated current is the same as the result shown in FIG. 4, but the junction is enlarged because the discharge operation was applied several times instead of once.
図12は一般に使用されている線径0.3mmの熱電対の先端部である。測温部はほぼ球形で,その直径は約1.5mmと、素線径の約5倍程度になっている。 FIG. 12 shows a tip portion of a thermocouple having a wire diameter of 0.3 mm that is generally used. The temperature measuring part is almost spherical, and its diameter is about 1.5 mm, which is about 5 times the wire diameter.
表5は上記各実施例及び比較例をまとめたものであり、前記式1が正しいことを明らかにするものである。なお、評価欄の○と×は、SEM写真から目視により判断した。 Table 5 summarizes the above examples and comparative examples, and clarifies that the formula 1 is correct. In addition, (circle) and x of the evaluation column were judged visually from the SEM photograph.
本発明による熱電対は、従来では不可能であった高速・高感度での測定が可能であり、そのような特徴を持つ熱電対は以下の分野で有用であると考える。電子部品:フィードバック制御のための、マイクロプロセッサーやその他の集積回路部品の表面温度測定。マイクロタス分野:微細加工技術を駆使して、チップ上にポンプやバルブ、流路等を作製し、高速で生体分子の解析、微量血液による診断,医薬の効果測定、化学物質の合成・分析、環境モニタリングをオンチップで行う技術が研究されている。チップ上での操作のうち、温度測定・制御に使用可能である。一般家庭:電子体温計、調理温度計や調理器具への組み込み。その他プラントでの温度測定および熱に関する研究一般:直接の温度測定および温度シミュレーションの確認。 The thermocouple according to the present invention can measure at high speed and high sensitivity, which was impossible in the past, and the thermocouple having such characteristics is considered useful in the following fields. Electronic components: Surface temperature measurement of microprocessors and other integrated circuit components for feedback control. Microtus field: Making full use of microfabrication technology, pumps, valves, flow paths, etc. are produced on the chip, analyzing biomolecules at high speed, diagnosis with trace blood, measuring drug effects, synthesis and analysis of chemical substances, Technology to perform on-chip environmental monitoring is being researched. Of the operations on the chip, it can be used for temperature measurement and control. General household: Built-in electronic thermometer, cooking thermometer and cooking utensils. Other plant temperature measurement and heat research in general: direct temperature measurement and confirmation of temperature simulation.
(1)1対の基線
(2)極細熱電対素線
(3)極細熱電対素線
(4)熱電対素線の交差部
(5)金属基板
(6)金属針
(7)電源
(8)接地電位
(9)不活性ガス
(10)電動ステージ
(11)光学顕微鏡
(12)作業台
(13)不活性ガス供給器
(14)ガス供給源
(15)画像表示・記録
(1) One pair of base lines (2) Extra fine thermocouple element (3) Extra fine thermocouple element (4) Intersection of thermocouple element (5) Metal substrate (6) Metal needle (7) Power source (8) Ground potential (9) Inert gas (10) Motorized stage (11) Optical microscope (12) Worktable (13) Inert gas supplier (14) Gas supply source (15) Image display / recording
Claims (6)
(式1)
The thermocouple temperature measuring contact forming method according to any one of claims 1 to 3, wherein two thermocouple wires are melt-bonded and K shown in the following (Equation 1) is 0.2 or more. A method for forming a temperature measuring contact of a thermocouple, characterized in that it is performed by pulsed high-voltage microdischarge in an inert gas.
(Formula 1)
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010146890A1 (en) * | 2009-06-17 | 2010-12-23 | 独立行政法人物質・材料研究機構 | A thermocouple and a thermoscope utilizing the same |
| JP2011002319A (en) * | 2009-06-18 | 2011-01-06 | Nec Toshiba Space Systems Ltd | Method and apparatus for measuring temperature of solar battery cell and solar cell module |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010146890A1 (en) * | 2009-06-17 | 2010-12-23 | 独立行政法人物質・材料研究機構 | A thermocouple and a thermoscope utilizing the same |
| JP2011002286A (en) * | 2009-06-17 | 2011-01-06 | National Institute For Materials Science | Thermocouple and thermoscope utilizing the same |
| JP2011002319A (en) * | 2009-06-18 | 2011-01-06 | Nec Toshiba Space Systems Ltd | Method and apparatus for measuring temperature of solar battery cell and solar cell module |
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