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JP2009092672A - Gas chromatograph - Google Patents

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JP2009092672A
JP2009092672A JP2008326782A JP2008326782A JP2009092672A JP 2009092672 A JP2009092672 A JP 2009092672A JP 2008326782 A JP2008326782 A JP 2008326782A JP 2008326782 A JP2008326782 A JP 2008326782A JP 2009092672 A JP2009092672 A JP 2009092672A
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sample
insert
inert gas
column
gas
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JP4743270B2 (en
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Toyohito Wada
豊仁 和田
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Shimadzu Corp
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Abstract

【課題】試料気化室内のインサートを迅速に交換することが可能なガスクロマトグラフを提供する。
【解決手段】試料気化室20にキャリアガスとは別に不活性ガスを導入する不活性ガス導通路10を設けてガスクロマトグラフを構成する。
このように構成することにより、インサート3を交換する時はこの不活性ガス導通路10から試料気化室20に不活性ガスを吹き込むことで、不活性ガス雰囲気中でインサート交換作業を行うことができるので、試料気化室20やカラム22の温度を分析所定の高温に保ったままでインサート3を交換してもインサート3やカラム22の劣化を招く恐れがない。
【選択図】 図1
A gas chromatograph capable of quickly replacing an insert in a sample vaporization chamber is provided.
A gas chromatograph is configured by providing an inert gas conduction path (10) for introducing an inert gas separately from a carrier gas in a sample vaporization chamber (20).
With this configuration, when the insert 3 is replaced, the insert replacement work can be performed in an inert gas atmosphere by blowing an inert gas from the inert gas conduction path 10 into the sample vaporizing chamber 20. Therefore, even if the insert 3 is replaced while the temperature of the sample vaporizing chamber 20 or the column 22 is maintained at a predetermined high temperature, there is no possibility that the insert 3 or the column 22 is deteriorated.
[Selection] Figure 1

Description

本発明はガスクロマトグラフに関し、特にガスクロマトグラフの試料気化室に関する。   The present invention relates to a gas chromatograph, and more particularly to a sample vaporization chamber of a gas chromatograph.

図2に、一般的なガスクロマトグラフの流路構成を、試料気化室を中心に示す。
同図において、20は試料気化室であって、頂部にセプタム5で封じられた試料注入口6を有し、内部にはガラス製円筒状のインサート3がシールリング4によって支持されている。21はキャリアガスの流量制御に用いられるフローコントローラであり、22は、試料気化室20から送り込まれる気化された試料を各成分に分離するカラム、23は分離された各成分を検出し電気信号として出力する検出器である。24は試料気化室20から分岐するスプリット流路であってスプリット弁25により開閉される。
FIG. 2 shows a flow path configuration of a general gas chromatograph with a sample vaporizing chamber as a center.
In the figure, reference numeral 20 denotes a sample vaporizing chamber having a sample injection port 6 sealed with a septum 5 at the top, and a glass cylindrical insert 3 supported by a seal ring 4 inside. 21 is a flow controller used to control the flow rate of the carrier gas, 22 is a column that separates the vaporized sample fed from the sample vaporizing chamber 20 into components, and 23 is an electric signal that detects the separated components. It is a detector that outputs. Reference numeral 24 denotes a split flow path branched from the sample vaporizing chamber 20 and is opened and closed by a split valve 25.

上記のように構成されたガスクロマトグラフは以下のように動作する。
キャリアガスは、フローコントローラ21により流量制御され、キャリアガス導入流路2を通って試料気化室20の上部に供給され、その内部に設けられたインサート3内を通過し、底部に接続されたカラム22を通って検出器23へと流れる。スプリット弁25が開いているときは一定割合のキャリアガスがスプリット流路24を通って排出される。試料気化室20は図示しないヒータにより試料の気化温度以上の温度に加熱されている。
The gas chromatograph configured as described above operates as follows.
The carrier gas is flow-controlled by the flow controller 21, supplied to the upper part of the sample vaporizing chamber 20 through the carrier gas introduction channel 2, passed through the insert 3 provided therein, and connected to the bottom part of the column. 22 to the detector 23. When the split valve 25 is open, a certain percentage of the carrier gas is discharged through the split flow path 24. The sample vaporization chamber 20 is heated to a temperature equal to or higher than the vaporization temperature of the sample by a heater (not shown).

試料の導入法としてはいくつかの方法が知られているが、その中でも最も一般的なスプリットレス導入法では、スプリット弁25が閉じた状態で、試料注入口6からシリンジ(図示しない)等でセプタム5を刺通してインサート3内に液体試料を注入する。液体試料はここで気化してキャリアガスによりカラム22に運ばれる。インサート3の内側で試料が気化する構造であるから、試料蒸気は試料気化室20の金属内壁に接触することなくカラム22へ導入される。カラム22で分離された試料中の各成分が検出器23で検出されることによりガスクロマトグラフィ分析が行われる。試料の大部分がカラム22に移行したタイミングで図示しないタイマー装置等によりスプリット弁25を開き、試料気化室20内に残る溶媒蒸気をスプリット流路24を経て排出することにより、分析の妨害となる溶媒蒸気のテーリングを抑える。
スプリット導入法の場合は、スプリット弁25を常時開いた状態で試料を注入する。
Several methods are known as a sample introduction method. Among the most common splitless introduction methods, the split valve 25 is closed and a syringe (not shown) is used from the sample injection port 6. A liquid sample is injected into the insert 3 through the septum 5. The liquid sample is vaporized here and carried to the column 22 by the carrier gas. Since the sample is vaporized inside the insert 3, the sample vapor is introduced into the column 22 without contacting the metal inner wall of the sample vaporization chamber 20. Gas chromatography analysis is performed by detecting each component in the sample separated by the column 22 by the detector 23. The split valve 25 is opened by a timer device (not shown) at the timing when most of the sample moves to the column 22, and the solvent vapor remaining in the sample vaporizing chamber 20 is discharged through the split flow path 24, which hinders analysis. Reduces tailing of solvent vapor.
In the case of the split introduction method, the sample is injected with the split valve 25 always open.

インサート3は、上記のように試料に直接接触するものであるから、試料の気化残渣等の付着により汚れやすい。汚れたとき交換または洗浄できるようにインサート3は着脱可能に構成されている。また、インサート3は試料成分に対して吸着作用や化学作用を及ぼすものであってはならないから、一般にガラスや石英で作られるが、さらにその内面を不活性材料でコーティングを施した例もある(例えば、特許文献1及び特許文献2参照)。
特開平11−101788号公報 特開平08−262003号公報
Since the insert 3 is in direct contact with the sample as described above, the insert 3 tends to become dirty due to adhesion of a vaporization residue or the like of the sample. The insert 3 is configured to be detachable so that it can be replaced or cleaned when it becomes dirty. In addition, since the insert 3 should not have an adsorption action or a chemical action on the sample components, it is generally made of glass or quartz, but there is also an example in which the inner surface is coated with an inert material ( For example, see Patent Literature 1 and Patent Literature 2).
JP-A-11-101788 Japanese Patent Laid-Open No. 08-262003

従来、インサートを交換する場合は、試料気化室やカラムの温度を室温付近まで下げ、キャリアガスの供給を止めてから交換作業を行っていた。これはオペレータの火傷防止のためでもあるが、内面不活性化されたインサートを高温下で空気(酸素)に曝すと不活性化コーティングの劣化を招き、またカラムについても、高温下で内部に空気が混入すると固定相皮膜が酸化されカラム寿命を早めることになるからである。
しかし、試料気化室の温度を下げるには時間が掛かり、また、インサート交換後に温度を上げる前に、まず試料気化室内に入り込んだ空気を追い出す必要もあり、インサートの交換は時間と手間の掛かるものであった。
本発明はこのような事情に鑑みてなされたものであり、試料気化室内のインサートを迅速に交換することが可能なガスクロマトグラフを提供することを目的とする。
Conventionally, when exchanging the insert, the temperature of the sample vaporizing chamber or column is lowered to near room temperature, and the exchange operation is performed after the supply of the carrier gas is stopped. Although this is also to prevent burns for the operator, exposure of the inner passivated insert to air (oxygen) at high temperatures will result in degradation of the passivating coating, and the column will also be exposed to air at high temperatures. This is because the stationary phase film is oxidized and the column life is shortened by mixing.
However, it takes time to lower the temperature of the sample vaporization chamber, and it is necessary to expel the air that has entered the sample vaporization chamber before raising the temperature after replacing the insert. Met.
This invention is made | formed in view of such a situation, and it aims at providing the gas chromatograph which can replace | exchange the insert in a sample vaporization chamber rapidly.

本発明は、上記課題を解決するために、試料気化室にキャリアガスとは別に不活性ガスを導通する不活性ガス導通路を設けてガスクロマトグラフを構成する。
このように構成することにより、インサート交換時はこの不活性ガス導通路から試料気化室に不活性ガスを吹き込むことで、不活性ガス雰囲気中でインサート交換作業を行うことが可能となる。
In order to solve the above-described problems, the present invention configures a gas chromatograph by providing an inert gas conduction path for conducting an inert gas separately from a carrier gas in a sample vaporizing chamber.
With this configuration, when the insert is replaced, the insert replacement operation can be performed in an inert gas atmosphere by blowing the inert gas from the inert gas conduction path into the sample vaporizing chamber.

本発明は上記のように構成されているので、試料気化室やカラムの温度を分析所定の高温に保ったままでインサートを交換してもインサートやカラムの劣化を招く恐れがない。また、温度の上げ下げに要する時間も省けるので交換作業が効率化する。さらに、副次的効果として、カラムやセプタムの交換に際しても、本発明の特徴である空気の混入防止機能を有効に活用できる。   Since the present invention is configured as described above, even if the insert is replaced while the temperature of the sample vaporizing chamber or the column is maintained at a predetermined high temperature, the insert or the column is not deteriorated. In addition, since the time required for raising and lowering the temperature can be omitted, the replacement work becomes efficient. Furthermore, as a secondary effect, the function of preventing air contamination, which is a feature of the present invention, can be effectively utilized when replacing a column or septum.

本発明が提供するガスクロマトグラフの特徴は試料気化室にキャリアガスとは別に不活性ガスを導入するように構成した点である。
従って、最良の形態の基本的な構成は、試料気化室にキャリアガスとは別に不活性ガスを導入する不活性ガス導通路を備えたガスクロマトグラフである。
The gas chromatograph provided by the present invention is characterized in that an inert gas is introduced into the sample vaporizing chamber separately from the carrier gas.
Therefore, the basic configuration of the best mode is a gas chromatograph provided with an inert gas conduction path for introducing an inert gas in addition to the carrier gas into the sample vaporizing chamber.

図1に、本発明の一実施例である試料気化室20の断面図を示す。なお、図1は特に試料気化室20に的を絞って示したものであり、図1では示されていないガスクロマトグラフとしての全体的な流路構成は図2に準じるものとする。
図1において、1は試料気化室20の主要構造体である金属製の気化室本体、8はカラム22を固定するカラムナット、9はシールリング4を締め付けてインサート3を保持するためのシールナット、7はセプタム5を所定位置に固定するセプタムナットである。その他の図2と同符号を付したものは図2と同一物であるから、再度の説明は省く。
FIG. 1 shows a cross-sectional view of a sample vaporizing chamber 20 which is an embodiment of the present invention. FIG. 1 shows the sample vaporizing chamber 20 with a particular focus, and the overall flow path configuration as a gas chromatograph not shown in FIG. 1 is based on FIG.
In FIG. 1, reference numeral 1 denotes a metal vaporizing chamber main body which is a main structure of the sample vaporizing chamber 20, 8 a column nut for fixing the column 22, and 9 a seal nut for fastening the seal ring 4 to hold the insert 3. , 7 are septum nuts for fixing the septum 5 in place. Other components denoted by the same reference numerals as those in FIG. 2 are the same as those in FIG.

本発明に特徴的な構成は、気化室本体1の下部に設けられた不活性ガス導通路10である。この流路により電磁弁26で制御される不活性ガス(窒素等)を試料気化室20に吹き込むことができる。インサート3等を交換するとき以外は、電磁弁26は閉じており、試料気化室20の機能は従来と変わらず、従来同様に分析を行うことができる。不活性ガスの供給源は図示しないが、キャリアガスの供給源から分岐してもよいし、別にボンベ等の供給源を設けてもよい。   The characteristic structure of the present invention is an inert gas conduction path 10 provided at the lower part of the vaporizing chamber body 1. An inert gas (nitrogen or the like) controlled by the electromagnetic valve 26 can be blown into the sample vaporizing chamber 20 through this flow path. Except when the insert 3 or the like is replaced, the electromagnetic valve 26 is closed, and the function of the sample vaporizing chamber 20 is the same as in the prior art, and analysis can be performed as in the prior art. Although an inert gas supply source is not shown, it may be branched from the carrier gas supply source, or a supply source such as a cylinder may be provided separately.

上記のように構成された本実施例においてインサート3を交換する手順を次に説明する。
(1)キャリアガスの供給を止め、電磁弁26を開いて不活性ガス導通路10から圧力10kPa程度に制御された不活性ガスを導入する。
(2)シールナット9を緩めて取りはずし、インサート3を抜き取り、新たにインサート3を挿入する。この間、不活性ガスでパージされているので、空気の混入は起こらないか、或いは混入しても僅かである。
(3)次にシールナット9を締めるが、完全に締める前に、暫時シールナット9の隙間から不活性ガスを漏らすことにより、混入した可能性のある空気を追い出す。
(4)最後にシールナット9を完全に締め、電磁弁26を閉じ、所定のキャリアガスを流して分析可能な状態に復旧する。
Next, a procedure for replacing the insert 3 in the present embodiment configured as described above will be described.
(1) The supply of the carrier gas is stopped, the electromagnetic valve 26 is opened, and the inert gas controlled to a pressure of about 10 kPa is introduced from the inert gas conduction path 10.
(2) Loosen and remove the seal nut 9, pull out the insert 3, and insert a new insert 3. During this time, since it is purged with an inert gas, air mixing does not occur or even if it is mixed.
(3) Next, the seal nut 9 is tightened. Before completely tightening, the inert gas is leaked from the gap of the seal nut 9 for a while, thereby expelling air that may have been mixed.
(4) Finally, the seal nut 9 is completely tightened, the solenoid valve 26 is closed, and a predetermined carrier gas is supplied to restore the state in which analysis is possible.

本発明はインサート3のみでなく、セプタム5やカラム22の交換にも有効に機能する。交換の手順は上記に準じ、セプタム5を交換する場合は、セプタムナット7を緩めて行えばよく、また、カラム22を交換する場合は、カラムナット8を緩めて行えばよい。   The present invention functions effectively not only for the insert 3 but also for the replacement of the septum 5 and the column 22. The replacement procedure is the same as described above. When the septum 5 is replaced, the septum nut 7 may be loosened, and when the column 22 is replaced, the column nut 8 may be loosened.

なお、不活性ガスを制御するには、図1に示す電磁弁26に限らず、他の制御手段、例えば電子制御式の流量制御装置を用いてもよい。   In addition, in order to control an inert gas, you may use not only the solenoid valve 26 shown in FIG. 1, but another control means, for example, an electronically controlled flow control device.

本発明はガスクロマトグラフに利用できる。   The present invention can be used for a gas chromatograph.

本発明の一実施例を示す図である。It is a figure which shows one Example of this invention. 従来の構成を示す図である。It is a figure which shows the conventional structure.

符号の説明Explanation of symbols

1 気化室本体
2 キャリアガス導入流路
3 インサート
4 シールリング
5 セプタム
6 試料注入口
7 セプタムナット
8 カラムナット
9 シールナット
10 不活性ガス導通路
20 試料気化室
21 フローコントローラ
22 カラム
23 検出器
24 スプリット流路
25 スプリット弁
26 電磁弁
DESCRIPTION OF SYMBOLS 1 Gasification chamber main body 2 Carrier gas introduction flow path 3 Insert 4 Seal ring 5 Septum 6 Sample inlet 7 Septum nut 8 Column nut 9 Seal nut 10 Inert gas conduction path 20 Sample vaporization chamber 21 Flow controller 22 Column 23 Detector 24 Split Flow path 25 Split valve 26 Solenoid valve

Claims (1)

着脱可能なインサートに試料を注入して気化する試料気化室を有し、キャリアガスが前記試料気化室を貫流してカラムへ流れるように流路が構成されたガスクロマトグラフであって、前記試料気化室に前記キャリアガスとは別に不活性ガスを導通する不活性ガス導通路を設けたことを特徴とするガスクロマトグラフ。 A gas chromatograph having a sample vaporizing chamber for injecting and vaporizing a sample into a detachable insert and having a flow path configured to allow a carrier gas to flow through the sample vaporizing chamber and flow to a column, the sample vaporizing A gas chromatograph characterized in that an inert gas conduction path for conducting an inert gas is provided in the chamber separately from the carrier gas.
JP2008326782A 2008-12-24 2008-12-24 Gas chromatograph Expired - Lifetime JP4743270B2 (en)

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