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JP2008238196A - PRESS DIE CENTERING DEVICE AND PRESS DIE CENTERING METHOD USING THE SAME - Google Patents

PRESS DIE CENTERING DEVICE AND PRESS DIE CENTERING METHOD USING THE SAME Download PDF

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JP2008238196A
JP2008238196A JP2007080097A JP2007080097A JP2008238196A JP 2008238196 A JP2008238196 A JP 2008238196A JP 2007080097 A JP2007080097 A JP 2007080097A JP 2007080097 A JP2007080097 A JP 2007080097A JP 2008238196 A JP2008238196 A JP 2008238196A
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measurement
misalignment
substrate
reference axis
mold substrate
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JP5028696B2 (en
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Satohiro Hara
▲聡▼弘 原
Hironori Ohashi
広典 大橋
Mitsuhiko Sato
光彦 佐藤
Masatomo Watanabe
雅智 渡辺
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DAIDO AMISTAR CO Ltd
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Abstract

【課題】金型の実装時においても芯出し精度が維持されるプレス金型の芯出し装置およびそれを用いたプレス金型の芯出し方法を提供する。
【解決手段】上型基板P2に装着されて芯ずれを計測する芯ずれ計測部10と、下型基板D2に装着されて芯ずれが計測される芯ずれ被計測部20とを備え、計測部10の第1および第2計測具12,13により、第1および第2計測具12,13に対応させて被計測部20に配設された第1および第2被計測具22,23の位置ずれを計測して、下型基板D2の位置ずれを算出してその位置を修正し、下型基板D2と上型基板P2との芯出しをなす。
【選択図】図1
Provided is a press mold centering device capable of maintaining the centering accuracy even when the mold is mounted, and a press mold centering method using the same.
A measuring unit includes a misalignment measuring unit that is mounted on an upper mold substrate and measures a misalignment, and a misalignment measurement unit that is mounted on a lower mold substrate and measures misalignment. Positions of the first and second measurement tools 22 and 23 disposed in the measurement target section 20 corresponding to the first and second measurement tools 12 and 13 by the ten first and second measurement tools 12 and 13. The displacement is measured, the displacement of the lower mold substrate D2 is calculated and the position is corrected, and the lower mold substrate D2 and the upper mold substrate P2 are centered.
[Selection] Figure 1

Description

本発明はプレス金型の芯出し装置およびそれを用いたプレス金型の芯出し方法に関する。さらに詳しくは、上下金型の位置合せを精度よく、しかも簡易になし得るプレス金型の芯出し装置およびそれを用いたプレス金型の芯出し方法に関する。   The present invention relates to a press mold centering apparatus and a press mold centering method using the same. More specifically, the present invention relates to a press mold centering apparatus capable of accurately and easily aligning upper and lower molds and a press mold centering method using the same.

従来より、プレス加工においてはプレス成形品の精度を所望精度とするため、上下金型の中心線を一致させる、いわゆる芯出しがなされている。この芯出しは、一般的に、芯出しジグを用いてなされている。図7に、パンチプレスの芯出しに用いられている芯出しジグの一例を示す。   Conventionally, in press processing, so-called centering is performed in which the center lines of the upper and lower molds coincide with each other in order to obtain the desired accuracy of the press-formed product. This centering is generally performed using a centering jig. FIG. 7 shows an example of a centering jig used for centering a punch press.

芯出しジグ100は、図7に示すように、上部フレーム101のジグ用孔に装着された上部ジグ102および下部フレーム103のジグ用孔に装着された下部ジグ104を備えてなるものとされる。また、上部ジグ102の中心には、芯出し用パンチ105が所定の公差で嵌合される一方、下部ジグ104には、芯出し用ダイ106が所定の公差で嵌合される。   As shown in FIG. 7, the centering jig 100 includes an upper jig 102 mounted in the jig hole of the upper frame 101 and a lower jig 104 mounted in the jig hole of the lower frame 103. . A centering punch 105 is fitted to the center of the upper jig 102 with a predetermined tolerance, while a centering die 106 is fitted to the lower jig 104 with a predetermined tolerance.

そして、芯出しジグ100による芯出しは、下部フレーム103を適宜位置に調整して芯出し用ダイ106の軸心C2を芯出し用パンチ105の軸心C1に一致させて下部フレーム103の位置決めをなした後、上部ジグ102および下部ジグ104を、実際のプレスに使用するパンチガイドおよびダイホルダに交換することによりなされる。   The centering jig 100 performs centering by adjusting the lower frame 103 to an appropriate position so that the axis C2 of the centering die 106 coincides with the axis C1 of the centering punch 105, thereby positioning the lower frame 103. After that, the upper jig 102 and the lower jig 104 are replaced with punch guides and die holders used for actual pressing.

しかしながら、上部ジグ102および下部ジグ104は、複数種類の金型に適用できるようにされているため、個々の金型自体の公差および当該金型と、上部ジグ102および下部ジグ104との公差の組合せによって、公差が累積され実装時においてその芯出し精度が維持できないという問題がある。   However, since the upper jig 102 and the lower jig 104 can be applied to a plurality of types of molds, the tolerance of each mold itself and the tolerance between the mold and the upper jig 102 and the lower jig 104 can be reduced. Depending on the combination, there is a problem that tolerances are accumulated and the centering accuracy cannot be maintained during mounting.

なお、芯出しジグ100によらないパンチプレス金型の芯出しについては、特許文献1に提案がなされている。
特開平10−85861号公報
In addition, the centering of the punch press die not based on the centering jig 100 is proposed in Patent Document 1.
Japanese Patent Laid-Open No. 10-85861

本発明はかかる従来技術の課題に鑑みなされたものであって、金型の実装時においても芯出し精度が維持されるプレス金型の芯出し装置およびそれを用いたプレス金型の芯出し方法を提供することを目的としている。   The present invention has been made in view of the problems of the prior art, and is a press mold centering device that maintains the centering accuracy even when the mold is mounted, and a press mold centering method using the same. The purpose is to provide.

本発明のプレス金型の芯出し装置の第1形態は、上型基板に装着されて芯ずれを計測する芯ずれ計測部と、下型基板に装着されて芯ずれが計測される芯ずれ被計測部とを備え、 前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に探針の角度が調整自在に保持されるダイヤルゲージとを含み、前記被計測具は、被計測基準軸を含むことを特徴する。   The first form of the press die centering apparatus according to the present invention includes a misalignment measuring unit that is mounted on the upper mold substrate and measures misalignment, and a misalignment cover that is mounted on the lower mold substrate and measures misalignment. A measurement unit, the measurement unit includes a measurement-side substrate, and first and second measurement tools disposed at predetermined intervals on a measurement reference line of the measurement-side substrate, A measurement-side substrate, and first and second measurement tools disposed on the measurement reference line of the measurement-side substrate in correspondence with the first and second measurement tools, A measurement reference axis, a holding member rotatably attached to the measurement reference axis, and a dial gauge in which the angle of the probe is adjustable and held by the holding member. It is characterized by including a reference axis.

本発明のプレス金型の芯出し装置の第2形態は、下型基板に装着されて芯ずれを計測する芯ずれ計測部と、上型基板に装着されて芯ずれが計測される芯ずれ被計測部とを備え、 前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に探針の角度が調整自在に保持されるダイヤルゲージとを含み、前記被計測具は、被計測基準軸を含むことを特徴する。   The second form of the press die centering apparatus of the present invention includes a misalignment measuring unit that is mounted on the lower mold substrate and measures misalignment, and a misalignment cover that is mounted on the upper mold substrate and measures misalignment. A measurement unit, the measurement unit includes a measurement-side substrate, and first and second measurement tools disposed at predetermined intervals on a measurement reference line of the measurement-side substrate, A measurement-side substrate, and first and second measurement tools disposed on the measurement reference line of the measurement-side substrate in correspondence with the first and second measurement tools, A measurement reference axis, a holding member rotatably attached to the measurement reference axis, and a dial gauge in which the angle of the probe is adjustable and held by the holding member. It is characterized by including a reference axis.

本発明のプレス金型の芯出し装置の第3形態は、上型基板に装着されて芯ずれを計測する芯ずれ計測部と、下型基板に装着されて芯ずれが計測される芯ずれ被計測部と、前記芯ずれ計測部からの計測値に基づいて芯ずれを算出する演算処理装置と、該演算処理装置の算出結果を出力する出力手段とを備え、前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に保持される非接触式変位センサとを含み、前記被計測具は、被計測基準軸を含むことを特徴する。   A third form of the press die centering apparatus of the present invention includes a misalignment measuring unit that is mounted on the upper mold substrate and measures misalignment, and a misalignment cover that is mounted on the lower mold substrate and measures misalignment. A measurement unit; an arithmetic processing device that calculates a misalignment based on a measurement value from the misalignment measurement unit; and an output unit that outputs a calculation result of the arithmetic processing device. And a first measuring tool and a second measuring tool disposed at a predetermined interval on a measurement reference line of the measurement side substrate, and the measured portion includes a measurement side substrate and a measurement target substrate. First and second measurement tools arranged on a measurement reference line corresponding to the first and second measurement tools, the measurement tool being rotatable about the measurement reference axis and the measurement reference axis A holding member to be mounted; and a non-contact displacement sensor held by the holding member; To characterized in that it comprises a reference axis to be measured.

本発明のプレス金型の芯出し装置の第4形態は、下型基板に装着されて芯ずれを計測する芯ずれ計測部と、上型基板に装着されて芯ずれが計測される芯ずれ被計測部と、前記芯ずれ計測部からの計測値に基づいて芯ずれを算出する演算処理装置と、該演算処理装置の算出結果を出力する出力手段とを備え、前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に保持される非接触式変位センサとを含み、前記被計測具は、被計測基準軸を含むことを特徴する。   The fourth form of the press die centering apparatus of the present invention includes a misalignment measuring unit that is mounted on the lower mold substrate and measures misalignment, and a misalignment cover that is mounted on the upper mold substrate and measures misalignment. A measurement unit; an arithmetic processing device that calculates a misalignment based on a measurement value from the misalignment measurement unit; and an output unit that outputs a calculation result of the arithmetic processing device. And a first measuring tool and a second measuring tool disposed at a predetermined interval on a measurement reference line of the measurement side substrate, and the measured portion includes a measurement side substrate and a measurement target substrate. First and second measurement tools arranged on a measurement reference line corresponding to the first and second measurement tools, the measurement tool being rotatable about the measurement reference axis and the measurement reference axis A holding member to be mounted; and a non-contact displacement sensor held by the holding member; To characterized in that it comprises a reference axis to be measured.

本発明のプレス金型の芯出し装置においては、計測基準軸は一端部近傍に鍔を有し、該鍔を計測側基板に当接させて当該計測側基板に嵌合され、被計測基準軸は一端部近傍に鍔を有し、該鍔を被計測側基板に当接させて当該被計測側基板に嵌合されてなるのが好ましい。   In the press die centering apparatus according to the present invention, the measurement reference axis has a flange near one end, the flange is brought into contact with the measurement side substrate and fitted to the measurement side substrate, and the measurement reference axis It is preferable that each has a ridge in the vicinity of one end, and is fitted to the measurement-side substrate by bringing the ridge into contact with the measurement-side substrate.

また、本発明のプレス金型の芯出し装置においては、被計測基準軸の長さがパスラインを超えるようにされてなるのが好ましい。   In the press die centering apparatus of the present invention, it is preferable that the length of the reference axis to be measured exceeds the pass line.

本発明のプレス金型の芯出し方法の第1形態は、前記第1形態のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、芯ずれ計測部を上型基板に装着する手順と、 芯ずれ被計測部を下型基板に装着する手順と、ダイヤルゲージの探針を被計測基準軸に当接させる手順と、保持部材を一定方向に回転させながら前記ダイヤルゲージにより、被計測基準軸の計測基準軸からのずれを計測する手順と、前記計測結果から下型基板の位置修正量を算出する手順と、前記算出された位置修正量に基づいて下型基板の位置を修正し、上型基板と下型基板との芯出しをなすことを特徴とする。   A first form of the press mold centering method of the present invention is a press mold centering method using the press mold centering apparatus of the first embodiment, wherein the center misalignment measuring portion is arranged on the upper mold substrate. Mounting procedure, a procedure for mounting the misalignment measurement target part on the lower mold substrate, a procedure for bringing the probe of the dial gauge into contact with the measurement reference axis, and the dial gauge while rotating the holding member in a certain direction. To measure the deviation of the measured reference axis from the measurement reference axis, to calculate the position correction amount of the lower mold substrate from the measurement result, and based on the calculated position correction amount of the lower mold substrate The position is corrected, and the upper mold substrate and the lower mold substrate are centered.

本発明のプレス金型の芯出し方法の第2形態は、前記第2形態のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、芯ずれ計測部を下型基板に装着する手順と、 芯ずれ被計測部を上型基板に装着する手順と、ダイヤルゲージの探針を被計測基準軸に当接させる手順と、保持部材を一定方向に回転させながら前記ダイヤルゲージにより、被計測基準軸の計測基準軸からのずれを計測する手順と、前記計測結果から上型基板の位置修正量を算出する手順と、前記算出された位置修正量に基づいて上型基板の位置を修正し、上型と下型との芯出しをなすことを特徴とする。   A second form of the press mold centering method of the present invention is a press mold centering method using the press mold centering apparatus of the second form, wherein the misalignment measuring unit is disposed on the lower mold substrate. Mounting procedure, a procedure for mounting the misalignment measured part on the upper mold substrate, a procedure for bringing the probe of the dial gauge into contact with the measured reference axis, and the dial gauge while rotating the holding member in a fixed direction. The procedure for measuring the deviation of the measured reference axis from the measurement reference axis, the procedure for calculating the position correction amount of the upper mold substrate from the measurement result, and the upper mold substrate based on the calculated position correction amount The position is corrected and the upper mold and the lower mold are centered.

本発明のプレス金型の芯出し方法の第3形態は、前記第3形態のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、芯ずれ計測部を上型基板に装着する手順と、 芯ずれ被計測部を下型基板に装着する手順と、保持部材を一定方向に回転させながら非接触式変位センサにより、被計測基準軸の計測基準軸からのずれを計測する手順と、前記計測結果から下型基板の位置修正量を算出する手順と、前記算出された位置修正量に基づいて下型基板の位置を修正し、上型基板と下型基板との芯出しをなすことを特徴とする。   A third form of the press mold centering method of the present invention is a press mold centering method using the press mold centering apparatus of the third embodiment, wherein the center misalignment measuring unit is disposed on the upper mold substrate. Measure the deviation of the measured reference axis from the measurement reference axis using a non-contact displacement sensor while rotating the holding member in a fixed direction. A procedure for calculating the position correction amount of the lower mold substrate from the measurement result, and correcting the position of the lower mold substrate based on the calculated position correction amount, and the core between the upper mold substrate and the lower mold substrate It is characterized by making out.

本発明のプレス金型の芯出し方法の第4形態は、前記第4形態のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、芯ずれ計測部を下型基板に装着する手順と、 芯ずれ被計測部を上型基板に装着する手順と、保持部材を一定方向に回転させながら非接触式変位センサにより、被計測基準軸の計測基準軸からのずれを計測する手順と、前記計測結果から下型基板の位置修正量を算出する手順と、前記算出された位置修正量に基づいて上型基板の位置を修正し、上型基板と下型基板との芯出しをなすことを特徴とする。   A fourth form of the press mold centering method of the present invention is a press mold centering method using the press mold centering apparatus of the fourth embodiment, wherein the center misalignment measuring unit is disposed on the lower mold substrate. Measure the deviation of the measured reference axis from the measurement reference axis using a non-contact displacement sensor while rotating the holding member in a fixed direction. A procedure for calculating a position correction amount of the lower mold substrate from the measurement result, a position of the upper mold substrate is corrected based on the calculated position correction amount, and a core between the upper mold substrate and the lower mold substrate is corrected. It is characterized by making out.

本発明のプレス金型の芯出し方法の第1および第2形態においては、探針をパスラインに位置させて計測をなすのが好ましい。   In the first and second embodiments of the press die centering method of the present invention, it is preferable to perform measurement by positioning the probe on the pass line.

本発明のプレス金型の芯出し方法の第3および第4形態においては、非接触式変位センサをパスラインに位置させて計測をなすのが好ましい。   In the third and fourth embodiments of the press die centering method of the present invention, it is preferable to perform measurement by positioning the non-contact displacement sensor on the pass line.

本発明によれば、上型基板と下型基板との芯出しを精度よくしかも簡易になし得るという優れた効果が得られる。また、上型基板と下型基板との芯出しがなされているので、上金型および下金型が交換されても、そのつど芯出しをなす必要がなくなりリードタイムを著しく短縮できるという優れた効果も得られる。   According to the present invention, it is possible to obtain an excellent effect that the centering of the upper mold substrate and the lower mold substrate can be accurately and easily performed. In addition, since the upper mold substrate and the lower mold substrate are centered, it is not necessary to center each time the upper mold and the lower mold are exchanged. An effect is also obtained.

以下、添付図面を参照しながら本発明を実施形態に基づいて説明するが、本発明はかかる実施形態のみに限定されるものではない。   Hereinafter, although the present invention is explained based on an embodiment, referring to an accompanying drawing, the present invention is not limited only to this embodiment.

実施形態1
本発明の実施形態1に係るプレス金型の芯出し装置を、図1および図2に示す。図1は正面概略図を示し、図2はその拡大側面図を示す。
Embodiment 1
1 and 2 show a press die centering apparatus according to Embodiment 1 of the present invention. FIG. 1 shows a schematic front view, and FIG. 2 shows an enlarged side view thereof.

プレス金型の芯出し装置(以下、単に芯出し装置という)Aは、図1および図2に示すように、上型ホルダP1上の上型基板P2に装着されて芯ずれを計測する芯ずれ計測部(以下、単に計測部という)10と、下型ホルダD1上の下型基板D2に装着されて芯ずれが計測される芯ずれ被計測部(以下、単に被計測部という)20とを備えてなるものとされる。   As shown in FIGS. 1 and 2, the press mold centering device A (hereinafter simply referred to as centering device) A is mounted on the upper mold substrate P2 on the upper mold holder P1 and measures misalignment. A measuring unit (hereinafter simply referred to as a measuring unit) 10 and a misalignment measured unit (hereinafter simply referred to as a measured unit) 20 that is mounted on the lower mold substrate D2 on the lower mold holder D1 and measures misalignment. It is supposed to be prepared.

計測部10は、計測側基板11と、計測側基板11の計測基準線(例えば中心線)上に所定間隔を設けて配設される同一構造とされた第1計測具12(30)および第2計測具13(30)とを備えてなるものとされる。   The measuring unit 10 includes a first measuring tool 12 (30) and a first measuring tool 12 (30) and a first measuring tool 12 (30) having the same structure disposed at a predetermined interval on a measurement reference line (for example, a center line) of the measuring side substrate 11. 2 measuring tool 13 (30).

計測具30は、計測側基板11に装着される側の端部つまり上端部近傍に鍔32が形成された計測基準軸31と、計測基準軸31の他端部つまり下端部近傍に回転自在に装着された保持部材33と、保持部材33の外周部に探針34aを内側下方に向け、適宜手段を介して傾斜角調整自在に保持されたダイヤルゲージ34とを備えてなるものとされる。   The measuring tool 30 is freely rotatable near the end of the measurement side substrate 11, that is, the measurement reference shaft 31 in which the flange 32 is formed in the vicinity of the upper end, and the other end of the measurement reference shaft 31, that is, near the lower end. The mounted holding member 33 and the dial gauge 34 that is held on the outer peripheral portion of the holding member 33 with the probe 34a facing inward and downward and the tilt angle being adjustable through appropriate means are provided.

ここで、計測基準軸31の上端部の鍔32上面からの突出長さは、計測側基板11の厚みより短くされている。そのため、計測基準軸31を計測側基板11に垂設した際に、計測基準軸31の上端が計測側基板11から突出することはない。また、計測基準軸31の長さは、ダイヤルゲージ34の探針34a先端がパスラインLに位置できるに足り、かつその下端が後述する被計測軸の先端、つまり上端と干渉しないように調整されている。   Here, the protruding length of the upper end portion of the measurement reference shaft 31 from the upper surface of the flange 32 is shorter than the thickness of the measurement side substrate 11. Therefore, when the measurement reference axis 31 is suspended from the measurement side substrate 11, the upper end of the measurement reference axis 31 does not protrude from the measurement side substrate 11. The length of the measurement reference shaft 31 is adjusted so that the tip of the probe 34a of the dial gauge 34 can be positioned on the pass line L, and its lower end does not interfere with the tip of the shaft to be measured, which will be described later, that is, the upper end. ing.

また、保持部材33によるダイヤルゲージ34の保持は、例えば、ダイヤルゲージ34の後部に角度調整自在に設けられた被保持部材34bを、保持部材33の外周部に設けられた保持孔33aに嵌合させることによりなされる。   Further, the holding of the dial gauge 34 by the holding member 33 is performed, for example, by fitting a held member 34b provided at the rear portion of the dial gauge 34 so as to be adjustable in angle into a holding hole 33a provided in the outer peripheral portion of the holding member 33. It is made by letting.

なお、図中の符号35は、保持部材33を計測基準軸31の周りで回転自在とするための軸受を示す。   Reference numeral 35 in the drawing denotes a bearing for making the holding member 33 rotatable around the measurement reference axis 31.

しかして、計測基準軸31は、鍔32から突出している上端部が計測側基板11に設けられている装着孔11aに嵌合され、かつ鍔32が計測側基板11にボルト留めされて計測側基板11に垂設され、それにより計測具30が計測側基板11の基準線上に配設される。   Thus, the measurement reference shaft 31 has an upper end protruding from the flange 32 fitted in a mounting hole 11a provided in the measurement side substrate 11, and the flange 32 is bolted to the measurement side substrate 11 to be measured side. The measurement tool 30 is arranged on the reference line of the measurement side substrate 11 by being suspended from the substrate 11.

被計測部20は、被計測側基板21と、被計測側基板21の被計測基準線(例えば中心線)上に前記所定間隔を設けて配設される同一構造とされた第1被計測具22(40)および第2被計測具23(40)とを備えてなるものとされる。   The measurement target 20 is a first measurement tool having the same structure that is disposed on the measurement target substrate 21 and the measurement reference line (for example, the center line) of the measurement target substrate 21 with the predetermined interval. 22 (40) and the second measuring tool 23 (40).

被計測具40は、具体的には下端部近傍に鍔42が形成された被計測軸41とされる。   Specifically, the measuring tool 40 is a measuring shaft 41 in which a flange 42 is formed near the lower end.

ここで、被計測軸41の被計測側基板21に装着される側の端部つまり下端部の鍔42下面からの突出長さは、被計測側基板21の厚みより短くされている。そのため、被計測軸41を被計測側基板21に垂設した際に、被計測軸41の下端が被計測側基板21から突出することはない。また、被計測軸41の長さは、その上端がパスラインLを超えるよう調整されている。   Here, the protruding length of the end of the shaft 41 to be measured attached to the measurement-side substrate 21, that is, the lower end of the measurement shaft 41 from the bottom surface of the flange 42 is shorter than the thickness of the measurement-side substrate 21. Therefore, when the measured shaft 41 is suspended from the measured side substrate 21, the lower end of the measured shaft 41 does not protrude from the measured side substrate 21. Further, the length of the measured shaft 41 is adjusted so that the upper end thereof exceeds the pass line L.

しかして、被計測軸41が、鍔42から突出している下端部が被計測側基板21に設けられている装着孔21aに嵌合され、かつ鍔42が被計測側基板21にボルト留めされて被計測側基板21に垂設され、それにより被計測具40が被計測側基板21の基準軸上に配設される。   Thus, the measured shaft 41 has a lower end protruding from the flange 42 fitted into the mounting hole 21a provided in the measured-side substrate 21, and the flange 42 is bolted to the measured-side substrate 21. The measurement tool 40 is arranged on the reference axis of the measurement target board 21 by being suspended from the measurement target board 21.

次に、かかる構成とされた芯出し装置Aによる芯出しについて説明する。   Next, centering by the centering apparatus A having such a configuration will be described.

手順1:計測部10を、第1被計測具12および第2被計測具13を下方に向けて上型基板P2に装着する一方、被計測部20を第1被計測具22および第2被計測具23をそれぞれ第1計測具12および第2計測具13に対応させた状態で下型基板D2に装着する。   Procedure 1: The measuring unit 10 is mounted on the upper mold substrate P2 with the first measured device 12 and the second measured device 13 facing downward, while the measured unit 20 is mounted on the first measured device 22 and the second measured device. The measuring tool 23 is mounted on the lower mold substrate D2 in a state corresponding to the first measuring tool 12 and the second measuring tool 13, respectively.

手順2:第1計測具12および第2計測具13のそれぞれのダイヤルゲージ34の探針34aをパスラインLに位置させた状態で、第1被計測具22および第2被計測具23に当接させる。   Procedure 2: With the probe 34a of the dial gauge 34 of each of the first measurement tool 12 and the second measurement tool 13 positioned on the pass line L, the first measurement tool 22 and the second measurement tool 23 are contacted. Make contact.

手順3:第1計測具12および第2計測具13のそれぞれのダイヤルゲージ34の探針34aを第1被計測具22および第2被計測具23に当接させた状態で、保持部材33,33を一定方向、例えば時計回り方向に回転させて第1被計測具22および第2被計測具23のそれぞれの芯ずれを数点計測する。例えば、90度あるいは120度間隔で計測する。   Procedure 3: With the probe 34a of the dial gauge 34 of each of the first measuring tool 12 and the second measuring tool 13 in contact with the first measured tool 22 and the second measured tool 23, the holding member 33, 33 is rotated in a certain direction, for example, clockwise, and the misalignment of each of the first device to be measured 22 and the second device to be measured 23 is measured at several points. For example, measurement is performed at intervals of 90 degrees or 120 degrees.

手順4:計測結果から、例えば第1被計測軸41の第1計測基準軸31からの位置ずれ、および被計測基準線の計測基準線からのずれを算出する。これらの算出は、公知の演算処理方法により簡単になされる。   Procedure 4: From the measurement result, for example, the positional deviation of the first measured axis 41 from the first measurement reference axis 31 and the deviation of the measured reference line from the measurement reference line are calculated. These calculations are easily performed by a known arithmetic processing method.

手順5:第1被計測軸41の第1計測基準軸31からの位置ずれ、および被計測基準線の計測基準線からのずれに基づいて、下型基板D2の位置修正量を算出する。この算出も公知の演算処理方法により簡単になされる。   Procedure 5: The position correction amount of the lower mold substrate D2 is calculated based on the positional deviation of the first measured axis 41 from the first measurement reference axis 31 and the deviation of the measured reference line from the measurement reference line. This calculation is also easily performed by a known arithmetic processing method.

手順6:前記位置修正量に基づいて、下型基板D2の位置を修正する。つまり、上型基板P2と下型基板D2との芯出しをなす。   Procedure 6: The position of the lower mold substrate D2 is corrected based on the position correction amount. That is, the upper mold substrate P2 and the lower mold substrate D2 are centered.

このように、この実施形態1においては、上金型つまりパンチが実装される上型基板P2と、下金型つまりダイが実装される下型基板D2との芯出しがなされているので、上金型および下金型が交換されても、そのつど芯出しをなす必要がなくなりリードタイムを著しく短縮できる。   Thus, in the first embodiment, since the upper mold P2 on which the upper mold, that is, the punch is mounted, and the lower mold D2, on which the lower mold, that is, the die is mounted, are aligned. Even if the mold and the lower mold are exchanged, it is not necessary to center each time, and the lead time can be remarkably shortened.

実施形態2
本発明の実施形態2に係るプレス金型の芯出し装置を、図3〜図5に示す。図3は概略図を示し、図4は計測部の拡大側面図を示し、図5にブロック図で示す。なお、図3〜図5において、図1および図2と同一の符号は、同一または類似の構成要素を示す。
Embodiment 2
A press die centering device according to Embodiment 2 of the present invention is shown in FIGS. FIG. 3 shows a schematic view, FIG. 4 shows an enlarged side view of the measuring unit, and FIG. 5 shows a block diagram. 3 to 5, the same reference numerals as those in FIGS. 1 and 2 denote the same or similar components.

プレス金型の芯出し装置(以下、単に芯出し装置という)A1は、図3〜図5に示すように、上型ホルダP1上の上型基板P2に装着されて芯ずれを計測する芯ずれ計測部(以下、単に計測部という)10Aと、下型ホルダD1上の下型基板D2に装着されて芯ずれが計測される芯ずれ被計測部(以下、単に被計測部という)20と、計測部10Aからの計測値を演算処理して芯ずれを算出する演算処理装置50と、演算処理装置50からの算出値を出力する出力装置60とを備えてなるものとされる。   A press mold centering device (hereinafter simply referred to as a centering device) A1, as shown in FIGS. 3 to 5, is mounted on an upper mold substrate P2 on an upper mold holder P1 and measures misalignment. A measurement unit (hereinafter simply referred to as a measurement unit) 10A, a misalignment measurement unit (hereinafter simply referred to as a measurement target unit) 20 that is mounted on the lower mold substrate D2 on the lower mold holder D1 and measures the misalignment; The calculation processing device 50 that calculates the misalignment by calculating the measurement value from the measurement unit 10A and the output device 60 that outputs the calculation value from the calculation processing device 50 are provided.

計測部10Aは、計測側基板11と、計測側基板11の計測基準線(例えば中心線)上に所定間隔を設けて配設される同一構造とされた第1計測具16(70)および第2計測具17(70)とを備えてなるものとされる。   The measurement unit 10A includes the first measurement tool 16 (70) and the first measurement tool 11 (70) and the first structure 16 and the same structure arranged with a predetermined interval on the measurement reference line (for example, the center line) of the measurement side substrate 11. 2 measuring instrument 17 (70).

計測具70は、計測側基板11に装着される側の端部つまり上端部近傍に鍔72が形成された計測基準軸71と、計測基準軸71の他端部つまり下端部近傍に回転自在に装着された保持部材73と、保持部材73の外周部に適宜手段を介して傾斜角調整自在に保持された非接触式変位センサ74とを備えてなるものとされる。   The measuring tool 70 is rotatable around the measurement reference shaft 71 in which a flange 72 is formed in the vicinity of the end portion, that is, the upper end portion of the measurement side substrate 11, and in the vicinity of the other end portion, that is, the lower end portion of the measurement reference shaft 71. The mounted holding member 73 and a non-contact type displacement sensor 74 that is held on the outer periphery of the holding member 73 through an appropriate means so that the inclination angle can be adjusted are provided.

ここで、計測基準軸71の上端部の鍔72上面からの突出長さは、計測側基板11の厚みより短くされている。そのため、計測基準軸71を計測側基板11に垂設した際に、計測基準軸71の上端が計測側基板11から突出することはない。また、計測基準軸71の長さは、非接触式変位センサ74がパスラインLに位置できるに足り、かつその下端が後述する被計測軸の先端、つまり上端と干渉しないように調整されている。   Here, the protruding length of the upper end portion of the measurement reference shaft 71 from the upper surface of the flange 72 is made shorter than the thickness of the measurement side substrate 11. Therefore, when the measurement reference axis 71 is suspended from the measurement side substrate 11, the upper end of the measurement reference axis 71 does not protrude from the measurement side substrate 11. The length of the measurement reference shaft 71 is adjusted so that the non-contact type displacement sensor 74 can be positioned on the pass line L, and its lower end does not interfere with the tip of the shaft to be measured which will be described later, that is, the upper end. .

保持部材73による非接触式変位センサ74の保持は、例えば、非接触式変位センサ74の後部に角度調整自在に設けられた被保持部材74bを、保持部材73の外周部に設けられた保持孔73aに嵌合させることによりなされる。   The non-contact type displacement sensor 74 is held by the holding member 73 by, for example, holding a member 74 b provided at the rear part of the non-contact type displacement sensor 74 so that the angle can be adjusted, and a holding hole provided in the outer peripheral portion of the holding member 73. This is done by fitting to 73a.

非接触式変位センサ74は、検出値をレーザ信号として出力する機能を有するものとされる。   The non-contact displacement sensor 74 has a function of outputting a detection value as a laser signal.

ここで、図中の符号76は、保持部材73を計測基準軸71の周りで回転自在とするための軸受を示す。   Here, reference numeral 76 in the drawing denotes a bearing for making the holding member 73 rotatable around the measurement reference axis 71.

しかして、計測基準軸71は、鍔72から突出している上端部が計測側基板11に設けられている装着孔11aに嵌合され、かつ鍔72が計測側基板11にボルト留めされて計測側基板11に垂設され、それにより計測具70が計測側基板11の基準線上に配設される。   Thus, the measurement reference shaft 71 has an upper end projecting from the flange 72 fitted in a mounting hole 11a provided in the measurement-side substrate 11, and the flange 72 is bolted to the measurement-side substrate 11 so as to be measured. The measurement tool 70 is disposed on the reference line of the measurement side substrate 11 by being suspended from the substrate 11.

演算処理装置50は、図6に示すように、非接触式変位センサ74からのレーザ信号をデジタル信号に変換するデータデジタル変換器51と、データデジタル変換器51からの信号を増幅して収集するデータ収集器52と、データ収集器52により収集されたデータを演算処理する演算処理器53とを備え、芯ずれ量およびその方向などを算出するものとされる。なお、かかる機能を有する演算処理装置50は、具体的には、パソコンを中心に構成される。   As shown in FIG. 6, the arithmetic processing unit 50 amplifies and collects the data digital converter 51 that converts the laser signal from the non-contact type displacement sensor 74 into a digital signal, and the signal from the data digital converter 51. A data collector 52 and an arithmetic processor 53 that performs arithmetic processing on the data collected by the data collector 52 are provided, and the misalignment amount and its direction are calculated. Specifically, the arithmetic processing unit 50 having such a function is configured mainly with a personal computer.

出力装置60は、例えば液晶表示装置やプリンタなどとされ、演算処理装置50により算出された芯ずれ量およびその方向を画像表示したり、プリントアウトしたりするものとされる。   The output device 60 is, for example, a liquid crystal display device or a printer, and displays the image of the misalignment amount and the direction calculated by the arithmetic processing device 50 and prints it out.

しかして、この実施形態2の芯出し装置A1による芯出しは、実施形態1の芯出し装置Aと同様にしてなされるが、計測部10Aの計測と同時に芯ずれ量およびそのずれ方向が算出されるので、実施形態1に比して芯出しが迅速になされる。   Thus, the centering by the centering device A1 of the second embodiment is performed in the same manner as the centering device A of the first embodiment, but the misalignment amount and the misalignment direction are calculated simultaneously with the measurement by the measuring unit 10A. Therefore, centering is performed more quickly than in the first embodiment.

以上、本発明を実施形態に基づいて説明してきたが、本発明はかかる実施形態のみに限定されるものではなく、種々改変が可能である。例えば、実施形態では、計測部が上型基板に装着され、被計測部が下型基板に装着されているが、その逆に、計測部が下型基板に装着され、被計測部が上型基板に装着されてもよい。   As mentioned above, although this invention has been demonstrated based on embodiment, this invention is not limited only to this embodiment, A various change is possible. For example, in the embodiment, the measurement unit is mounted on the upper mold substrate and the measurement target is mounted on the lower mold substrate. Conversely, the measurement unit is mounted on the lower mold substrate, and the measurement target is the upper mold. It may be mounted on a substrate.

本発明は、プレス金型の芯出しに適用できる。   The present invention can be applied to centering a press die.

本発明の実施形態1に係る芯出し装置の正面概略図である。It is a front schematic diagram of the centering device concerning Embodiment 1 of the present invention. 同装置の拡大側面図である。It is an enlarged side view of the same apparatus. 本発明の実施形態2に係る芯出し装置の概略図である。It is the schematic of the centering apparatus which concerns on Embodiment 2 of this invention. 同芯出し装置の拡大側面図である。It is an enlarged side view of the centering device. 同芯出し装置のブロック図である。It is a block diagram of the same centering apparatus. 同芯出し装置の演算処理装置のブロック図である。It is a block diagram of the arithmetic processing unit of the centering device. 従来の芯出しジグの一例の断面図である。It is sectional drawing of an example of the conventional centering jig.

符号の説明Explanation of symbols

10 芯ずれ計測部
11 計測側基板
12,16 第1計測具
13,17 第2計測具
20 芯ずれ被計測部
21 被計測側基板
22 第1被計測具
23 第2被計測具
30,70 計測具
31,71 計測基準軸
33,73 保持部材
34 ダイヤルゲージ
40 被計測具
41 被計測軸
50 演算処理装置
51 データデジタル変換器
52 データ収集器
53 演算処理器
60 出力装置
74 非接触式変位センサ
A 芯出し装置
L パスライン
DESCRIPTION OF SYMBOLS 10 Misalignment measurement part 11 Measurement side board | substrate 12,16 1st measurement tool 13,17 2nd measurement tool 20 Misalignment measurement part 21 Measurement side board | substrate 22 1st measurement tool 23 2nd measurement tool 30,70 Measurement Tool 31, 71 Measuring reference axis 33, 73 Holding member 34 Dial gauge 40 Measuring tool 41 Measuring axis 50 Arithmetic processor 51 Data digital converter 52 Data collector 53 Arithmetic processor 60 Output device 74 Non-contact displacement sensor A Centering device L Pass line

Claims (12)

上型基板に装着されて芯ずれを計測する芯ずれ計測部と、下型基板に装着されて芯ずれが計測される芯ずれ被計測部とを備え、
前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、
前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、
前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に探針の角度が調整自在に保持されるダイヤルゲージとを含み、
前記被計測具は、被計測基準軸を含む
ことを特徴するプレス金型の芯出し装置。
A misalignment measuring unit that is mounted on the upper mold substrate and measures misalignment, and a misalignment measurement unit that is mounted on the lower mold substrate and measures misalignment,
The measurement unit includes a measurement-side substrate, and first and second measurement tools disposed at predetermined intervals on a measurement reference line of the measurement-side substrate,
The measurement target section includes a measurement target substrate, and first and second measurement tools arranged on the measurement reference line of the measurement target substrate in correspondence with the first and second measurement tools. ,
The measurement tool includes a measurement reference axis, a holding member that is rotatably mounted on the measurement reference axis, and a dial gauge that is held by the holding member so that the angle of the probe is adjustable.
The press tool centering apparatus, wherein the measuring tool includes a measuring reference axis.
下型基板に装着されて芯ずれを計測する芯ずれ計測部と、上型基板に装着されて芯ずれが計測される芯ずれ被計測部とを備え、
前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、
前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、
前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に探針の角度が調整自在に保持されるダイヤルゲージとを含み、
前記被計測具は、被計測基準軸を含む
ことを特徴するプレス金型の芯出し装置。
A center misalignment measurement unit that is mounted on the lower mold substrate and measures misalignment, and a center misalignment measurement unit that is mounted on the upper mold substrate and measures misalignment;
The measurement unit includes a measurement-side substrate, and first and second measurement tools disposed at predetermined intervals on a measurement reference line of the measurement-side substrate,
The measurement target section includes a measurement target substrate, and first and second measurement tools arranged on the measurement reference line of the measurement target substrate in correspondence with the first and second measurement tools. ,
The measurement tool includes a measurement reference axis, a holding member that is rotatably mounted on the measurement reference axis, and a dial gauge that is held by the holding member so that the angle of the probe is adjustable.
The press tool centering apparatus, wherein the measuring tool includes a measuring reference axis.
上型基板に装着されて芯ずれを計測する芯ずれ計測部と、下型基板に装着されて芯ずれが計測される芯ずれ被計測部と、前記芯ずれ計測部からの計測値に基づいて芯ずれを算出する演算処理装置と、該演算処理装置の算出結果を出力する出力手段とを備え、
前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、
前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、
前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に保持される非接触式変位センサとを含み、
前記被計測具は、被計測基準軸を含む
ことを特徴するプレス金型の芯出し装置。
Based on the measured values from the misalignment measurement unit that is mounted on the upper mold substrate and measures misalignment, the misalignment measurement unit that is mounted on the lower mold substrate and measures misalignment, and the misalignment measurement unit An arithmetic processing unit that calculates misalignment, and an output unit that outputs a calculation result of the arithmetic processing unit,
The measurement unit includes a measurement-side substrate, and first and second measurement tools disposed at predetermined intervals on a measurement reference line of the measurement-side substrate,
The measurement target section includes a measurement target substrate, and first and second measurement tools arranged on the measurement reference line of the measurement target substrate in correspondence with the first and second measurement tools. ,
The measuring tool includes a measurement reference axis, a holding member rotatably attached to the measurement reference axis, and a non-contact displacement sensor held by the holding member,
The press tool centering apparatus, wherein the measuring tool includes a measuring reference axis.
下型基板に装着されて芯ずれを計測する芯ずれ計測部と、上型基板に装着されて芯ずれが計測される芯ずれ被計測部と、前記芯ずれ計測部からの計測値に基づいて芯ずれを算出する演算処理装置と、該演算処理装置の算出結果を出力する出力手段とを備え、
前記計測部は、計測側基板と、該計測側基板の計測基準線上に所定間隔を設けて配設される第1および第2計測具とを備え、
前記被計測部は、被計測側基板と、該被計測側基板の被計測基準線上に前記第1および第2計測具に対応させて配設される第1および第2被計測具とを備え、
前記計測具は、計測基準軸と、該計測基準軸に回転自在に装着される保持部材と、該保持部材に保持される非接触式変位センサとを含み、
前記被計測具は、被計測基準軸を含む
ことを特徴するプレス金型の芯出し装置。
Based on the measured values from the misalignment measurement unit that is mounted on the lower mold substrate and measures misalignment, the misalignment measurement unit that is mounted on the upper mold substrate and measures misalignment, and the misalignment measurement unit An arithmetic processing unit that calculates misalignment, and an output unit that outputs a calculation result of the arithmetic processing unit,
The measurement unit includes a measurement-side substrate, and first and second measurement tools disposed at predetermined intervals on a measurement reference line of the measurement-side substrate,
The measurement target section includes a measurement target substrate, and first and second measurement tools arranged on the measurement reference line of the measurement target substrate in correspondence with the first and second measurement tools. ,
The measuring tool includes a measurement reference axis, a holding member rotatably attached to the measurement reference axis, and a non-contact displacement sensor held by the holding member,
The press tool centering apparatus, wherein the measuring tool includes a measuring reference axis.
計測基準軸は一端部近傍に鍔を有し、該鍔を計測側基板に当接させて当該計測側基板に嵌合され、
被計測基準軸は一端部近傍に鍔を有し、該鍔を被計測側基板に当接させて当該被計測側基板に嵌合されてなる
ことを特徴とする請求項1、2、3または4記載のプレス金型の芯出し装置。
The measurement reference axis has a flange near one end, and the flange is brought into contact with the measurement side board and fitted to the measurement side board.
The measured reference shaft has a flange near one end, and is fitted to the measurement-side substrate by bringing the flange into contact with the measurement-side substrate. 4. A press die centering apparatus according to 4.
被計測基準軸の長さがパスラインを超えるようにされてなることを特徴とする請求項1、2、3、4または5記載のプレス金型の芯出し装置。   6. The press die centering device according to claim 1, wherein the length of the reference axis to be measured exceeds the pass line. 請求項1、5または6に記載のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、
芯ずれ計測部を上型基板に装着する手順と、
芯ずれ被計測部を下型基板に装着する手順と、
ダイヤルゲージの探針を被計測基準軸に当接させる手順と、
保持部材を一定方向に回転させながら前記ダイヤルゲージにより、被計測基準軸の計測基準軸からのずれを計測する手順と、
前記計測結果から下型基板の位置修正量を算出する手順と、
前記算出された位置修正量に基づいて下型基板の位置を修正し、上型基板と下型基板との芯出しをなす
ことを特徴とするプレス金型の芯出し方法。
A press die centering method using the press die centering device according to claim 1, 5 or 6,
A procedure for mounting the misalignment measuring unit on the upper mold substrate,
A procedure for mounting the misalignment measured part on the lower mold substrate,
A procedure for bringing the dial gauge probe into contact with the reference axis to be measured;
A procedure for measuring the deviation of the measured reference axis from the measurement reference axis with the dial gauge while rotating the holding member in a certain direction;
A procedure for calculating the position correction amount of the lower mold substrate from the measurement result;
A press die centering method, wherein the position of the lower mold substrate is corrected based on the calculated position correction amount, and the upper mold substrate and the lower mold substrate are aligned.
請求項2、5または6に記載のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、
芯ずれ計測部を下型基板に装着する手順と、
芯ずれ被計測部を上型基板に装着する手順と、
ダイヤルゲージの探針を被計測基準軸に当接させる手順と、
保持部材を一定方向に回転させながら前記ダイヤルゲージにより、被計測基準軸の計測基準軸からのずれを計測する手順と、
前記計測結果から上型基板の位置修正量を算出する手順と、
前記算出された位置修正量に基づいて上型基板の位置を修正し、上型と下型との芯出しをなす
ことを特徴とするプレス金型の芯出し方法。
A press die centering method using the press die centering device according to claim 2, 5 or 6,
A procedure for mounting the misalignment measuring unit on the lower mold substrate,
A procedure for mounting the misalignment measured part on the upper mold substrate,
A procedure for bringing the dial gauge probe into contact with the reference axis to be measured;
A procedure for measuring the deviation of the measured reference axis from the measurement reference axis with the dial gauge while rotating the holding member in a certain direction;
A procedure for calculating the position correction amount of the upper mold substrate from the measurement result;
A press die centering method, wherein the position of the upper die substrate is corrected based on the calculated position correction amount to center the upper die and the lower die.
請求項3、5または6に記載のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、
芯ずれ計測部を上型基板に装着する手順と、
芯ずれ被計測部を下型基板に装着する手順と、
保持部材を一定方向に回転させながら非接触式変位センサにより、被計測基準軸の計測基準軸からのずれを計測する手順と、
前記計測結果から下型基板の位置修正量を算出する手順と、
前記算出された位置修正量に基づいて下型基板の位置を修正し、上型基板と下型基板との芯出しをなす
ことを特徴とするプレス金型の芯出し方法。
A press die centering method using the press die centering device according to claim 3, 5 or 6,
A procedure for mounting the misalignment measuring unit on the upper mold substrate,
A procedure for mounting the misalignment measured part on the lower mold substrate,
A procedure for measuring the deviation of the measured reference axis from the measurement reference axis with a non-contact displacement sensor while rotating the holding member in a certain direction;
A procedure for calculating the position correction amount of the lower mold substrate from the measurement result;
A press die centering method, wherein the position of the lower mold substrate is corrected based on the calculated position correction amount, and the upper mold substrate and the lower mold substrate are aligned.
請求項4、5または6に記載のプレス金型の芯出し装置を用いたプレス金型の芯出し方法であって、
芯ずれ計測部を下型基板に装着する手順と、
芯ずれ被計測部を上型基板に装着する手順と、
保持部材を一定方向に回転させながら非接触式変位センサにより、被計測基準軸の計測基準軸からのずれを計測する手順と、
前記計測結果から下型基板の位置修正量を算出する手順と、
前記算出された位置修正量に基づいて上型基板の位置を修正し、上型基板と下型基板との芯出しをなす
ことを特徴とするプレス金型の芯出し方法。
A press die centering method using the press die centering device according to claim 4, 5 or 6,
A procedure for mounting the misalignment measuring unit on the lower mold substrate,
A procedure for mounting the misalignment measured part on the upper mold substrate,
A procedure for measuring the deviation of the measured reference axis from the measurement reference axis with a non-contact displacement sensor while rotating the holding member in a certain direction;
A procedure for calculating the position correction amount of the lower mold substrate from the measurement result;
A press die centering method, wherein the position of the upper mold substrate is corrected based on the calculated position correction amount, and the upper mold substrate and the lower mold substrate are aligned.
探針をパスラインに位置させて計測をなすことを特徴する請求項7または8記載のプレス金型の芯出し方法。   9. The press die centering method according to claim 7, wherein the probe is positioned on a pass line and measurement is performed. 非接触式変位センサをパスラインに位置させて計測をなすことを特徴する請求項9または10記載のプレス金型の芯出し方法。
The centering method of a press die according to claim 9 or 10, wherein measurement is performed by positioning a non-contact type displacement sensor on a pass line.
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JP2012153080A (en) * 2011-01-28 2012-08-16 Toshiba Mach Co Ltd Molding device for molding material and molding method of molding material
CN104307966A (en) * 2014-10-31 2015-01-28 巢湖广丰金属制品有限公司 Angle cutting die convenient to adjust
CN107064779A (en) * 2017-05-26 2017-08-18 深圳市赛伦北斗科技有限责任公司 A kind of circuit board detection method, apparatus and system
KR20220042689A (en) * 2020-09-28 2022-04-05 한재형 Method for monitoring the state of carrying in/out of press material using laser sensor and its monitoring system

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JPS63123662A (en) * 1986-11-13 1988-05-27 Toyota Motor Corp Profiling process model centering jig
JPH01299721A (en) * 1988-05-25 1989-12-04 Matsushita Electric Works Ltd Method and device for positioning punching die

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012153080A (en) * 2011-01-28 2012-08-16 Toshiba Mach Co Ltd Molding device for molding material and molding method of molding material
CN104307966A (en) * 2014-10-31 2015-01-28 巢湖广丰金属制品有限公司 Angle cutting die convenient to adjust
CN107064779A (en) * 2017-05-26 2017-08-18 深圳市赛伦北斗科技有限责任公司 A kind of circuit board detection method, apparatus and system
CN107064779B (en) * 2017-05-26 2023-10-31 深圳市赛伦北斗科技有限责任公司 A circuit board testing method, device and system
KR20220042689A (en) * 2020-09-28 2022-04-05 한재형 Method for monitoring the state of carrying in/out of press material using laser sensor and its monitoring system
KR102447716B1 (en) * 2020-09-28 2022-09-27 한재형 Method of monitoring the state of loading and unloading of press materials using laser sensor and monitoring system therefor

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