JP2008232778A - Contact probe - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a contact probe capable of obtaining stable and reliable electrical contact even when a contact surface of an electrode surface or a wiring part, etc. is not in a flat or uniform surface state. <P>SOLUTION: The contact probe has a plurality of rod-like contacts 3, each independently movably held on a support body by a coil spring 2. The plurality of rod-like contacts 3 are electrically connected with the support body 1, and each of them is independently held on the support body 1 by the coil spring 2. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a contact probe that is used in contact with an electrode or a wiring part when performing electrical measurement of a component or an apparatus, and more particularly to a contact probe suitable for performing stable measurement regardless of the shape of the contact part. .

  Contact probes are used in processes such as the development and manufacture of various electrical devices and components, and their shapes are optimized according to the purpose. The most common one is to obtain a piece of electrical information through the metal bar by pressing and contacting a metal bar or the like having a needle-like tip against the measurement portion with a spring or the like. Usually, different probes are contacted independently at different locations to obtain information such as the voltage, current waveform, and resistance value between the probes, but as disclosed in Patent Document 1, A contact probe provided integrally with a signal contact and capable of measuring by simultaneously contacting the ground and the signal line, and as disclosed in Patent Document 2, a plurality of contact probes are integrated and information on a large number of measurement points. There is known a contact probe capable of simultaneously measuring.

JP 2002-5959 A JP-A-5-215773

  However, if you want to obtain electrical information from an electrode surface or wiring part that has a certain area and is not flat, or if the contact surface is not a uniform surface state, measurement by contact at a single point Stability is insufficient. For example, the case where it contacts with the terminal of the battery performed by electrical inspections, such as charging / discharging of a secondary battery, corresponds to this.

  For this reason, in the above-described conventional secondary battery inspection process, a commercially available special probe having a crowned or saw-shaped tip is used. An example of the shape of the tip of the conventional special probe is shown in FIG. FIG. 3 is a cross-sectional view showing an example of a case where a conventional special probe is brought into contact with a non-planar object, and is used for the purpose of increasing contact points with non-planar electrode terminals as described above. In practice, however, the contact surface of the test object 20 often does not match the protrusion on the tip 30 of this special probe, and only one or two of the protrusions provided on the tip can be in contact with each other. Sexual contact cannot be obtained. For this reason, in the actual measurement, it is necessary to perform an operation such as performing contact several times to obtain an average value, and this causes a reduction in work efficiency.

  In such a case, the conventional contact probe having a large number of contacts can be used, but the conventional contact probe having multiple contacts separates the signals from the respective contact points and measures them independently. For this reason, the contact points of the respective contacts are largely separated spatially, and it is difficult to bring a large number of contacts into contact with one electrode as described above. In addition, since each contactor is electrically insulated, it is necessary to short-circuit their outputs, and since the structure is such that each contactor is electrically insulated, the probe structure becomes complicated. Therefore, there is a problem that the probe becomes expensive.

  Therefore, an object of the present invention is to provide a contact probe capable of obtaining stable contact with a battery used in charge / discharge of a secondary battery or electrical inspection, that is, when a contact surface such as an electrode surface or a wiring portion is not flat. Another object of the present invention is to provide a contact probe capable of obtaining stable and reliable electrical contact even when the surface state is not uniform.

  In order to solve the above problems, a contact probe according to the present invention comprises a plurality of bar-shaped contacts that are held on a single support member so as to be independently movable by a spring material. It is electrically connected to the body.

  The plurality of rod-shaped contacts may be independently held on the support by a spring material.

  As described above, in the present invention, it is possible to independently contact the tips of a plurality of rod-shaped contacts that are connected to a single support and supported by a spring with a non-planar contact object. Stable and reliable electrical contact can be obtained even when the contact surface such as the wiring portion is not flat or not uniform.

  Embodiments of the present invention will be described below with reference to the drawings.

  FIG. 1 is a sectional view showing an embodiment of a contact probe according to the present invention. In FIG. 1, a single support body 1 is composed of a plurality of bar-shaped contacts 3 held by a coil spring 2 so as to be independently movable, and the plurality of bar-shaped contact elements 3 are electrically connected to the support body 1. Conducted. The plurality of rod-shaped contacts 3 are independently held on the support 1 by coil springs 2.

  Further, in the present embodiment, as shown in FIG. 1, the support 1 has a plurality of through holes 4 for inserting and holding the contact 3, and on the side opposite to the contact end of the contact 3. Is provided with a stopper 6 for holding the coil spring 2 between the stopper 5 for preventing the support 1 from falling off and the support 1. The contact end of the contact 3 is thin like a needle. The support 1 is fixed to the probe tip 8, and the probe tip 8 is held by the probe body 9.

  Here, the probe tip 8 has a hollow shape, and the support 1 having the contact 3 attached thereto by the coil spring 2 is disposed therein. The hollow portion 10 of the probe distal end portion 8 has a structure in which an inner diameter difference is provided to determine the pushing position of the support 1. As an assembling method, for example, first, a contact 3 whose end is not processed is inserted into the support 1 together with the coil spring 2, and then a stopper 5 is formed at the end of the contact 3 by rolling or brazing. Next, the support 1 can be pushed into the step portion of the hollow portion 10 of the probe tip 8 and finally the outer periphery of the hollow portion 10 can be crimped and finished.

  As an example of the material of the contact probe of this embodiment, the probe body 9 and the probe tip 8 are phosphor bronze, the support 1 and the contact 3 are tool steel, and the coil spring is a piano wire. The probe tip 8, the support 1 and the coil spring can be plated with gold, and the contact 3 can be plated with gold or rhodium.

  As described above, since the support 1, the coil spring 2, the contact 3, the probe tip 8, and the probe main body 9 are all made of metal, the plurality of contacts 3 are all electrically connected to the probe main body 9. The distance between the contacts 3 is set to several hundreds μm to several mm so that a plurality of contacts are in contact with the area of the electrode to be inspected. 1 to several mm.

  FIG. 2 is a cross-sectional view when the contact probe of the present embodiment is brought into contact with the non-planar object 20. Since each contactor 3 is movable independently, all the contactors 3 are independently contacted with the surface of the test object 20 by the coil spring 2 and are stable and reliable without depending on the surface form of the test object 20. A certain electrical contact is obtained. It can be effectively used for a charge / discharge test and a voltage / impedance test of a Li-ion secondary battery.

  As described above, according to the present invention, it is possible to obtain a contact probe capable of obtaining stable and reliable electrical contact even when contact surfaces such as electrode surfaces and wiring portions are not flat or even in a uniform surface state.

  Needless to say, the present invention is not limited to the above-described embodiment. For example, the form of the contact, the number of the contacts, the form of the spring, and the like can be changed in design according to the purpose of use. Moreover, it is also possible to install one spring for every several units, without necessarily installing each spring individually.

Sectional drawing which shows one Embodiment of the contact probe by this invention. Sectional drawing when the contact probe of this Embodiment is made to contact the non-planar test object. The figure which shows an example of the shape of the conventional probe, and sectional drawing which shows an example at the time of making the conventional probe contact the non-planar test object.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Support body 2 Coil spring 3 Contactor 4 Through-hole 5, 6 Stopper 8 Probe tip part 9 Probe body 10 Hollow part 20 Test object 30 Probe tip

Claims (2)

  It is composed of a plurality of bar-shaped contacts that are held on a single support body so as to be independently movable by a spring material, and the plurality of bar-shaped contact elements are electrically connected to the support body. Contact probe.   The contact probe according to claim 1, wherein the plurality of rod-shaped contacts are independently held by the support member by a spring material.

Images