JP2008290150A - Tin / silver / copper / indium quaternary lead-free solder composition - Google Patents
Tin / silver / copper / indium quaternary lead-free solder composition Download PDFInfo
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- JP2008290150A JP2008290150A JP2008104956A JP2008104956A JP2008290150A JP 2008290150 A JP2008290150 A JP 2008290150A JP 2008104956 A JP2008104956 A JP 2008104956A JP 2008104956 A JP2008104956 A JP 2008104956A JP 2008290150 A JP2008290150 A JP 2008290150A
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- 239000000203 mixture Substances 0.000 title claims abstract description 125
- 229910000679 solder Inorganic materials 0.000 title claims abstract description 83
- 229910052738 indium Inorganic materials 0.000 title claims abstract description 37
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 title claims abstract description 36
- 239000010949 copper Substances 0.000 title claims abstract description 28
- 229910052709 silver Inorganic materials 0.000 title claims abstract description 25
- 239000004332 silver Substances 0.000 title claims abstract description 25
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 17
- 229910052802 copper Inorganic materials 0.000 title claims abstract description 17
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 title claims abstract description 13
- 229910052718 tin Inorganic materials 0.000 title claims abstract description 13
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 24
- 239000011135 tin Substances 0.000 claims abstract description 16
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 8
- 238000002844 melting Methods 0.000 claims description 8
- 230000008018 melting Effects 0.000 claims description 8
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 7
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 7
- 239000011133 lead Substances 0.000 claims description 6
- 239000011651 chromium Substances 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 5
- 239000011572 manganese Substances 0.000 claims description 5
- 239000010955 niobium Substances 0.000 claims description 5
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 5
- 150000002910 rare earth metals Chemical class 0.000 claims description 5
- 239000010936 titanium Substances 0.000 claims description 5
- 239000011777 magnesium Substances 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- 229910052787 antimony Inorganic materials 0.000 claims description 3
- 229910052793 cadmium Inorganic materials 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 229910052733 gallium Inorganic materials 0.000 claims description 3
- 229910052732 germanium Inorganic materials 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 238000010406 interfacial reaction Methods 0.000 claims description 3
- 229910052748 manganese Inorganic materials 0.000 claims description 3
- 150000002739 metals Chemical class 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 229910052758 niobium Inorganic materials 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 claims description 3
- 238000007254 oxidation reaction Methods 0.000 claims description 3
- 229910052763 palladium Inorganic materials 0.000 claims description 3
- 229910052698 phosphorus Inorganic materials 0.000 claims description 3
- 229910052697 platinum Inorganic materials 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 229910052719 titanium Inorganic materials 0.000 claims description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 2
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 2
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 2
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 claims description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 2
- 229910052785 arsenic Inorganic materials 0.000 claims description 2
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 2
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims description 2
- 229910017052 cobalt Inorganic materials 0.000 claims description 2
- 239000010941 cobalt Substances 0.000 claims description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 229910052749 magnesium Inorganic materials 0.000 claims description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 claims description 2
- 239000011574 phosphorus Substances 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 229910052715 tantalum Inorganic materials 0.000 claims description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 2
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 claims description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims description 2
- 230000007423 decrease Effects 0.000 abstract description 17
- 239000000463 material Substances 0.000 abstract description 7
- 238000005382 thermal cycling Methods 0.000 abstract description 6
- 230000035939 shock Effects 0.000 abstract description 5
- 238000009736 wetting Methods 0.000 description 22
- 238000005476 soldering Methods 0.000 description 16
- 238000007792 addition Methods 0.000 description 14
- 229910045601 alloy Inorganic materials 0.000 description 13
- 239000000956 alloy Substances 0.000 description 13
- 230000008859 change Effects 0.000 description 11
- 239000007788 liquid Substances 0.000 description 8
- 238000009864 tensile test Methods 0.000 description 8
- 238000012360 testing method Methods 0.000 description 8
- 230000006872 improvement Effects 0.000 description 6
- 230000009467 reduction Effects 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 230000003247 decreasing effect Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 229910017944 Ag—Cu Inorganic materials 0.000 description 2
- 229910017482 Cu 6 Sn 5 Inorganic materials 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000007711 solidification Methods 0.000 description 2
- 230000008023 solidification Effects 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- -1 and in particular Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004100 electronic packaging Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
- 238000004781 supercooling Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/30—Selection of soldering or welding materials proper with the principal constituent melting at less than 1550 degrees C
- B23K35/3006—Ag as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/30—Selection of soldering or welding materials proper with the principal constituent melting at less than 1550 degrees C
- B23K35/302—Cu as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/30—Selection of soldering or welding materials proper with the principal constituent melting at less than 1550 degrees C
- B23K35/3033—Ni as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/30—Selection of soldering or welding materials proper with the principal constituent melting at less than 1550 degrees C
- B23K35/3046—Co as the principal constituent
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
- C22C13/02—Alloys based on tin with antimony or bismuth as the next major constituent
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
【課題】Ag含量の減少による濡れ性の低下を抑制し、熱サイクル及び機械的衝撃に対する耐性を向上させ得るように、適正量のインジウム(In)を添加するとともに、銀(Ag)の含量を最適化して鉛フリー半田組成物の原価上昇を抑制し、半田材料としての工程性及び機械的特性を十分に確保できるようにする錫・銀・銅・インジウムの4元系鉛フリー半田組成物を提供すること。
【解決手段】0.3wt%以上2.5wt%未満の銀(Ag)と、0.2wt%以上2.0wt%未満の銅(Cu)と、0.2wt%以上1.0wt%未満のインジウム(In)と、その他の錫(Sn)とからなることを特徴とする。
【選択図】図8A suitable amount of indium (In) is added and the content of silver (Ag) is controlled so as to suppress a decrease in wettability due to a decrease in Ag content and to improve resistance to thermal cycling and mechanical shock. A quaternary lead-free solder composition of tin, silver, copper, and indium that optimizes and suppresses the cost rise of the lead-free solder composition and ensures sufficient processability and mechanical properties as a solder material. To provide.
SOLUTION: Silver (Ag) of 0.3 wt% or more and less than 2.5 wt%, Copper (Cu) of 0.2 wt% or more and less than 2.0 wt%, and Indium of 0.2 wt% or more and less than 1.0 wt%. It consists of (In) and other tin (Sn).
[Selection] Figure 8
Description
本発明は、鉛フリー半田(Pb−free)組成物に関し、特に、インジウムの使用により銀の使用量を減少させた錫(Sn)・銀(Ag)・銅(Cu)・インジウム(In)の4元系鉛フリー半田組成物に関する。 The present invention relates to a lead-free solder (Pb-free) composition, and in particular, tin (Sn) / silver (Ag) / copper (Cu) / indium (In) in which the amount of silver used is reduced by using indium. The present invention relates to a quaternary lead-free solder composition.
現在、鉛フリー半田組成の場合、Sn−Ag−Cu系が最も一般的に用いられており、代表的な組成としては、Sn−3.0Ag−0.5Cu組成が挙げられる。また、このような組成の耐酸化性を向上させるために、P、Ge、Ga、Al、Siなどが、それぞれ数十ppm〜数千ppmの範囲で更に添加されることもあり、機械的特性及び界面反応特性などの向上のために、Ni、Co、Fe、Bi、Au、Pt、Pb、Mn、V、Ti、Cr、Nb、Pd、Sb、Mg、Ta、Cd、及び希土類(Rare Earth)金属などが、それぞれ数十ppm〜数千ppmの範囲で更に添加されることもある。 At present, in the case of a lead-free solder composition, the Sn—Ag—Cu system is most commonly used, and a representative composition includes a Sn—3.0Ag—0.5Cu composition. In addition, in order to improve the oxidation resistance of such a composition, P, Ge, Ga, Al, Si, etc. may be further added in the range of several tens of ppm to several thousand ppm, respectively. And Ni, Co, Fe, Bi, Au, Pt, Pb, Mn, V, Ti, Cr, Nb, Pd, Sb, Mg, Ta, Cd, and rare earths (rare earth) ) Metals and the like may be further added in the range of several tens of ppm to several thousand ppm.
しかし、近年、電子パッケージ分野を中心として、原価低減への努力が段々と拡大するにつれて、添加元素のうち、一番高価なAg元素の量を減らす研究が試みられているが、その例として、Sn−2.5Ag−0.5Cu組成及びSn−1.0Ag−0.5Cu組成が適用されたり、最近では、Sn−0.3Ag−0.5Cu組成に対する特性評価までもなされている実情である。 However, in recent years, as efforts for cost reduction have been expanded mainly in the field of electronic packaging, research to reduce the amount of the most expensive Ag element among additive elements has been attempted. The Sn-2.5Ag-0.5Cu composition and the Sn-1.0Ag-0.5Cu composition are applied, and recently, the characteristics of the Sn-0.3Ag-0.5Cu composition have been evaluated. .
Sn−Ag−Cu系半田において、Ag量による金属学的、機械的特性の変化を要約すると、次のとおりである。 In Sn-Ag-Cu series solder, changes in metallographic and mechanical properties depending on the amount of Ag are summarized as follows.
1)Ag添加量が減少するほど、液相線温度と固相線温度との差が大きくなり、固液共存領域(pasty range又はmush zone)が増加する。
2)Ag添加量が減少するほど、1)の結果などにより濡れ性(wettability)が減少する。
3)Ag添加量が減少するほど、合金の強度及び耐クリープ特性が減少する。
4)Ag添加量が減少するほど、3)の結果などに応じて、熱サイクル実験による半田ジョイントの破断速度が増加する。
5)Ag添加量が減少するほど、合金の延伸率が増加し、かつ、機械的衝撃実験による半田ジョイントの破断速度が減少する。
1) As the added amount of Ag decreases, the difference between the liquidus temperature and the solidus temperature increases, and the solid-liquid coexistence region (passy range or mush zone) increases.
2) As the amount of Ag added decreases, wettability decreases depending on the result of 1).
3) The strength and creep resistance of the alloy decrease as the Ag addition amount decreases.
4) As the Ag addition amount decreases, the fracture rate of the solder joint by the thermal cycle experiment increases according to the result of 3).
5) As the amount of Ag added decreases, the stretch ratio of the alloy increases and the breaking speed of the solder joint by the mechanical impact experiment decreases.
したがって、前記1)の場合は、半田内のAg含量による金属学的特性変化の現象に該当するため、Ag含量を減少させる場合は、適切なAg量を設定する一方、従来のSn−3.0Ag−0.5Cu組成に近接する濡れ性を確保してこそ初めて、半田材料としての適用が円滑になり、Ag含量の低減による究極的な原価低減が可能になる。
また、前記4)及び5)の場合は、半田のAg含量の減少によって互いに相反する特性を見せているといえるため、適切なAg量を設定する一方、合金元素の添加などによって機械的特性の向上を補完してこそ初めて、熱サイクル及び機械的衝撃に対する耐性を同時に確保することが可能な理想的な半田組成の設計がなされ、更に、Ag含量の低減による原価低減まで確保可能になる。
Therefore, since the case 1) corresponds to the phenomenon of metallurgical property change due to the Ag content in the solder, when the Ag content is decreased, an appropriate Ag amount is set, while the conventional Sn-3. Only when the wettability close to the 0Ag-0.5Cu composition is ensured, the application as a solder material becomes smooth, and the ultimate cost can be reduced by reducing the Ag content.
In the case of the above 4) and 5), it can be said that the opposite characteristics are exhibited due to the decrease in the Ag content of the solder. Only when the improvement is complemented can an ideal solder composition be designed that can simultaneously ensure resistance to thermal cycling and mechanical shock, and further to reduce costs by reducing Ag content.
しかし、前記のような条件を満たす鉛フリー半田の組成は、いまだ開発されていないのが実情である。 However, the actual situation is that a lead-free solder composition satisfying the above conditions has not yet been developed.
本発明は、上記した従来の技術の問題を解決するために提案されたものであって、その目的は、Ag含量の減少による濡れ性の低下を抑制し、熱サイクル及び機械的衝撃に対する耐性を向上させ得るように、適正量のインジウム(In)を添加するとともに、銀(Ag)の含量を最適化することによって鉛フリー半田組成物の原価上昇を抑制し、半田材料としての工程性と機械的特性とを十分に確保できるようにする錫・銀・銅・インジウムの4元系鉛フリー半田組成物を提供することにある。 The present invention has been proposed to solve the above-described problems of the prior art, and its purpose is to suppress a decrease in wettability due to a decrease in Ag content, and to improve resistance to thermal cycling and mechanical shock. In order to be able to improve, by adding an appropriate amount of indium (In) and optimizing the content of silver (Ag), the cost increase of the lead-free solder composition is suppressed, and the processability and machine as a solder material It is an object of the present invention to provide a ternary lead-free solder composition of tin, silver, copper, and indium that can sufficiently ensure the desired characteristics.
そこで、上記の目的を達成するための本発明は、0.3wt%以上2.5wt%未満の銀(Ag)と、0.2wt%以上2.0wt%未満の銅(Cu)と、0.2wt%以上1.0wt%未満のインジウム(In)と、その他の錫(Sn)とからなることを特徴とする錫・銀・銅・インジウムの4元系鉛フリー半田組成物を備えることを特徴とする。
前記のような特徴を有する鉛フリー半田組成物は、鉛フリー半田組成物の原価を下げるために、銀の添加量を減少させることにより発生する濡れ性の低下と、熱サイクル及び機械的衝撃の信頼性の不十分な点をインジウム(In)の添加を介して補完することにより、更に低い価格で、優れた品質の鉛フリー半田組成物を提供できるようにしたものである。
Therefore, the present invention for achieving the above-described object includes a silver (Ag) of 0.3 wt% or more and less than 2.5 wt%, a copper (Cu) of 0.2 wt% or more and less than 2.0 wt%, It comprises a quaternary lead-free solder composition of tin, silver, copper, and indium, characterized by comprising indium (In) of 2 wt% or more and less than 1.0 wt% and other tin (Sn). And
In the lead-free solder composition having the above-described characteristics, in order to reduce the cost of the lead-free solder composition, a decrease in wettability caused by a decrease in the amount of silver added, a thermal cycle and a mechanical shock. By complementing the insufficient reliability through the addition of indium (In), it is possible to provide a lead-free solder composition of superior quality at a lower price.
本発明によれば、銀(Ag)の含量を減少させ、インジウム(In)を添加することによって銀(Ag)の減少による濡れ性を補完し、熱サイクル及び機械的インパクトに対する耐性を向上させて、低廉な原価で優れた品質の鉛フリー半田組成物を提供できる。 According to the present invention, the content of silver (Ag) is reduced, and the wettability due to the reduction of silver (Ag) is supplemented by adding indium (In), thereby improving the resistance to thermal cycle and mechanical impact. Therefore, it is possible to provide an excellent quality lead-free solder composition at a low cost.
以下、本発明の好ましい実施形態を介して本発明の特徴を詳細に説明すると、以下のとおりである。本発明を説明するにおいて、公知の関連機能又は構成に関する具体的な説明が、本発明の要旨を不要に濁すおそれがあると判断される場合、その詳細な説明を省略する。 Hereinafter, the features of the present invention will be described in detail through preferred embodiments of the present invention. In the description of the present invention, when it is determined that a specific description related to a known related function or configuration may unnecessarily obscure the gist of the present invention, a detailed description thereof will be omitted.
本発明の鉛フリー半田組成物において、銀(Ag)の添加割合は、0.3wt%以上2.5wt%未満である。これは、0.3wt%未満で銀(Ag)を添加する場合、液相線温度の降下はほとんど進まず、半田の融点及び実装工程温度が増加する短所があり、2.5wt%以上で銀(Ag)を添加する場合、本発明で求める原価低減を阻害するという短所がある。したがって、銀(Ag)の添加割合は、0.3wt%以上2.5wt%未満であり、望ましくは、1.2wt%である。 In the lead-free solder composition of the present invention, the addition ratio of silver (Ag) is 0.3 wt% or more and less than 2.5 wt%. This is because when silver (Ag) is added at less than 0.3 wt%, the drop in liquidus temperature hardly progresses and the melting point of the solder and the mounting process temperature increase. When (Ag) is added, there is a disadvantage that the cost reduction required by the present invention is hindered. Therefore, the addition ratio of silver (Ag) is 0.3 wt% or more and less than 2.5 wt%, and desirably 1.2 wt%.
また、本発明の鉛フリー半田組成において、銅(Cu)の添加割合は、0.2wt%以上2.0 wt%未満である。これは、0.2wt%未満で銅(Cu)を添加する場合、液相線温度の降下が微小であり、Cu6Sn5相の分率はほとんど存在せず、半田合金の強度の減少が大きすぎるという短所があり、2.0wt%以上で銅(Cu)を添加する場合、液相線温度と固相線温度との差が大きくなって固液共存領域が増加し、Cu6Sn5相の分率が増加して半田合金の機械的特性を大きく高め、界面反応層の成長速度を増加させるという短所がある。したがって、銅(Cu)の添加割合は、0.2wt%以上2.0wt%未満であり、望ましくは、0.5wt%である。 In the lead-free solder composition of the present invention, the addition ratio of copper (Cu) is 0.2 wt% or more and less than 2.0 wt%. This is because, when copper (Cu) is added at less than 0.2 wt%, the drop in liquidus temperature is small, there is almost no fraction of Cu 6 Sn 5 phase, and the strength of the solder alloy is reduced. When copper (Cu) is added at 2.0 wt% or more, the difference between the liquidus temperature and the solidus temperature increases and the solid-liquid coexistence region increases, and Cu 6 Sn 5 There are disadvantages in that the phase fraction is increased to greatly increase the mechanical properties of the solder alloy and increase the growth rate of the interface reaction layer. Therefore, the addition ratio of copper (Cu) is 0.2 wt% or more and less than 2.0 wt%, and desirably 0.5 wt%.
また、本発明の鉛フリー半田組成において、インジウム(In)の添加割合は、0.2wt%以上1.0wt%未満である。これは、0.2wt%未満でインジウム(In)を添加する場合、Inの添加による濡れ性の改善及び機械的特性の改善が微小であるという短所があり、1.0wt%以上のインジウム(In)を添加する場合、濡れ性の改善及び機械的特性の改善がインジウム(In)の添加量に比例して向上しない一方、半田合金の価格が急速に増加するという短所がある。したがって、インジウム(In)の添加割合は、0.2wt%以上1.0wt%未満であり、更に望ましくは、0.4 wt%である。
一方、前記各添加元素の好ましい添加割合によると、最も理想的な鉛フリー半田組成物は、Sn−1.2Ag−0.5Cu−0.4Inであり、本発明の最も理想的な組成であるSn−1.2Ag−0.5Cu−0.4Inと、その他の様々な研究組成と、従来の研究組成であるSn−3.0Ag−0.5Cu、Sn−1.0Ag−0.5Cu、Sn−1.2Ag−0.5Cu−0.05Ni組成とについて、同じ実験過程を通じて評価した結果を図1ないし図11に示している。
In the lead-free solder composition of the present invention, the addition ratio of indium (In) is 0.2 wt% or more and less than 1.0 wt%. This is because when indium (In) is added at less than 0.2 wt%, the improvement in wettability and the improvement in mechanical properties due to the addition of In are very small. ), The improvement of wettability and mechanical properties do not increase in proportion to the amount of indium (In) added, while the price of the solder alloy increases rapidly. Therefore, the addition ratio of indium (In) is 0.2 wt% or more and less than 1.0 wt%, and more preferably 0.4 wt%.
On the other hand, according to the preferable addition ratio of each additive element, the most ideal lead-free solder composition is Sn-1.2Ag-0.5Cu-0.4In, which is the most ideal composition of the present invention. Sn-1.2Ag-0.5Cu-0.4In, various other research compositions, and conventional research compositions Sn-3.0Ag-0.5Cu, Sn-1.0Ag-0.5Cu, Sn The results of evaluating the -1.2Ag-0.5Cu-0.05Ni composition through the same experimental process are shown in FIGS.
図1及び図2は、加熱状態で半田組成による吸熱ピークを示した結果を見せている。図1及び図2の結果は、差動走査熱量計(DSC:Differential Scanning Calorimeter)を使用して、約8mgの半田合金を50ml/minの窒素フロー雰囲気で10℃/minの昇温速度で加熱するときに生成される吸熱ピークを測定した結果である。図1に示すように、Sn−3.0Ag−0.5Cu組成の場合は、217℃〜218℃の範囲の吸熱ピーク温度を示し、これは、この合金の融点と一致していることが分かる。これに対し、Sn−1.0Ag−0.5Cu組成の場合、218℃〜219℃の範囲の1次吸熱ピークと226℃の2次吸熱ピークとを示し、それぞれ液相線温度及び固相線温度として観察され、固液共存領域が非常に増加していることが分かる。Sn−1.2Ag−0.5Cu−0.05Ni組成の場合、219℃〜220℃の範囲の1次吸熱ピークと225℃〜226℃の範囲の2次吸熱ピークとを示し、それぞれ液相線温度及び固相線温度として観察され、やはり、固液共存領域が非常に増加していることが観察できる。 1 and 2 show the results showing an endothermic peak due to the solder composition in the heated state. The results of FIGS. 1 and 2 show that a differential scanning calorimeter (DSC) is used to heat about 8 mg of a solder alloy at a rate of temperature increase of 10 ° C./min in a nitrogen flow atmosphere of 50 ml / min. It is the result of measuring the endothermic peak generated when As shown in FIG. 1, the Sn-3.0Ag-0.5Cu composition shows an endothermic peak temperature in the range of 217 ° C. to 218 ° C., which is consistent with the melting point of this alloy. . On the other hand, in the case of Sn-1.0Ag-0.5Cu composition, a primary endothermic peak in the range of 218 ° C to 219 ° C and a secondary endothermic peak at 226 ° C are shown, and the liquidus temperature and the solidus line, respectively. Observed as temperature, it can be seen that the solid-liquid coexistence region is greatly increased. In the case of Sn-1.2Ag-0.5Cu-0.05Ni composition, a primary endothermic peak in the range of 219 ° C. to 220 ° C. and a secondary endothermic peak in the range of 225 ° C. to 226 ° C. are shown, respectively. Observed as the temperature and the solidus temperature, it can be observed that the solid-liquid coexistence region is greatly increased.
一方、図2に示すように、Sn−1.0Ag−0.5Cu−1.0In組成の場合、216℃で1次吸熱ピークを、224℃〜225℃の範囲で2次吸熱ピークを示し、それぞれ液相線温度及び固相線温度として観察され、やはり、固液共存領域が非常に増加したが、液相線温度と固相線温度とが多少全体的に低下していることが分かる。このような液相線温度と固相線温度との低温転移の結果は、低温での半田濡れ性に優れた効果を示す主な原因であることが分かる。Sn−1.0Ag−0.5Cu−0.5In組成の場合、217℃で1次吸熱ピークを、また、225℃で2次吸熱ピークを示し、それぞれ液相線温度及び固相線温度として観察され、やはり、固液共存領域が非常に増加したが、液相線温度と固相線温度とが多少全体的に低下していることが分かる。 On the other hand, as shown in FIG. 2, in the case of Sn-1.0Ag-0.5Cu-1.0In composition, a primary endothermic peak is shown at 216 ° C., and a secondary endothermic peak is shown in the range of 224 ° C. to 225 ° C. It was observed as the liquidus temperature and the solidus temperature, respectively, and the solid-liquid coexistence region was also greatly increased, but it can be seen that the liquidus temperature and the solidus temperature are somewhat lowered. It can be seen that the result of such a low-temperature transition between the liquidus temperature and the solidus temperature is the main cause of the excellent effect of solder wettability at low temperatures. In the case of Sn-1.0Ag-0.5Cu-0.5In composition, a primary endothermic peak is shown at 217 ° C., and a secondary endothermic peak is shown at 225 ° C., which are observed as liquidus temperature and solidus temperature, respectively. Again, it can be seen that the solid-liquid coexistence region has greatly increased, but the liquidus temperature and the solidus temperature are somewhat lowered as a whole.
Sn−1.2Ag−0.5Cu−0.8〜0.4In組成の場合、217℃〜218℃の範囲で1次吸熱ピークを、また、224℃〜225℃の範囲で2次吸熱ピークを示し、それぞれ液相線温度及び固相線温度として観察され、固液共存領域が非常に増加したが、やはり、液相線温度と固相線温度とが多少全体的に低下していることが分かる。しかし、Sn−1.2Ag−0.5Cu−0.2In組成の場合、219℃〜220℃の範囲で1次吸熱ピークを、また、226℃で2次吸熱ピークを示し、それぞれ液相線温度及び固相線温度として観察され、固液共存領域が非常に増加したが、Sn−1.0Ag−0.5Cu組成に比べて液相線温度と固相線温度とが低温に低下していないことが分かる。このような結果は、Sn−1.2Ag−0.5Cu−0.2In組成の場合、低温での半田濡れ性が、Sn−1.0Ag−0.5Cu組成に比べて大きく改善されていない主な原因であることが分かる。 In the case of Sn-1.2Ag-0.5Cu-0.8-0.4In composition, the primary endothermic peak is in the range of 217 ° C to 218 ° C, and the secondary endothermic peak is in the range of 224 ° C to 225 ° C. It was observed as liquidus temperature and solidus temperature, respectively, and the solid-liquid coexistence region was greatly increased, but again the liquidus temperature and the solidus temperature were somewhat lowered overall I understand. However, in the case of the Sn-1.2Ag-0.5Cu-0.2In composition, a primary endothermic peak is shown in the range of 219 ° C to 220 ° C, and a secondary endothermic peak is shown at 226 ° C. The solid-liquid coexistence region was greatly increased, but the liquidus temperature and the solidus temperature were not lowered compared to the Sn-1.0Ag-0.5Cu composition. I understand that. Such a result shows that, in the case of the Sn-1.2Ag-0.5Cu-0.2In composition, the solder wettability at a low temperature is not greatly improved as compared with the Sn-1.0Ag-0.5Cu composition. It turns out that it is a cause.
図3及び図4は、溶融後の冷却状態で半田組成による1次発熱ピークを示した結果を見せている。図3及び図4の結果も、差動走査熱量計を用いて約8mgの半田合金を50ml/minの窒素フロー雰囲気で10℃/minの速度で250℃まで加熱後に冷却するときに生成される1次吸熱ピークを測定した結果である。図3に示すように、Sn−3.0Ag−0.5Cu組成の場合は、約194℃の1次発熱ピークを示し、これは、この合金の実際の凝固温度を意味していることが分かる。金属学的に合金の溶融温度と実際凝固温度との差、すなわち、この場合でいえば、約23℃〜24℃の範囲の差をアンダークーリング(undercooling)又はスーパークーリング(supercooling)と称する。合金内のAg含量によって、このようなアンダークーリングの大きさが増加することになるが、一例として、Sn−1.0Ag−0.5Cu組成の場合、約188℃の1次発熱ピークを示し、アンダークーリングが増加していることを見せた。一方、Sn−1.2Ag−0.5Cu−0.05Ni組成の場合、約206℃〜207℃の範囲の1次発熱ピークを示し、Niの少量の添加がアンダークーリングを非常に大きく減少させることが分かる。 FIG. 3 and FIG. 4 show the results showing the primary heat generation peak due to the solder composition in the cooled state after melting. The results of FIGS. 3 and 4 are also generated when approximately 8 mg of solder alloy is heated to 250 ° C. at a rate of 10 ° C./min in a nitrogen flow atmosphere of 50 ml / min using a differential scanning calorimeter and then cooled. It is the result of measuring a primary endothermic peak. As shown in FIG. 3, the Sn-3.0Ag-0.5Cu composition shows a first exothermic peak of about 194 ° C., which indicates the actual solidification temperature of this alloy. . Metallographically, the difference between the melting temperature of the alloy and the actual solidification temperature, i.e., in this case, the difference between about 23 ° C and 24 ° C is referred to as undercooling or supercooling. Depending on the Ag content in the alloy, the magnitude of such undercooling will increase. As an example, the Sn-1.0Ag-0.5Cu composition shows a primary exothermic peak of about 188 ° C., Shown that undercooling is increasing. On the other hand, in the case of Sn-1.2Ag-0.5Cu-0.05Ni composition, a primary exothermic peak in the range of about 206 ° C to 207 ° C is exhibited, and the addition of a small amount of Ni greatly reduces the undercooling. I understand.
インジウム(In)を添加したときの結果は、図4のとおりである。Sn−1.0Ag−0.5Cu−1.0In組成の場合は、約200℃の1次発熱ピークが観察され、Sn−1.0Ag−0.5Cu−0.5In組成の場合は、約190℃〜191℃の範囲の1次発熱ピークが観察された。したがって、インジウム(In)もアンダークーリングを非常に減少させる元素として分析された。また、Sn−1.2Ag−0.5Cu−0.8In組成の場合は、約192℃〜193℃の範囲の1次発熱ピークが、Sn−1.2Ag−0.5Cu−0.6In組成の場合は、約197℃〜198℃の範囲の1次発熱ピークが、Sn−1.2Ag−0.5Cu−0.4In組成の場合は、約200℃〜201℃の範囲の1次発熱ピークが、Sn−1.2Ag−0.5Cu−0.2In組成の場合は、約202℃〜203℃の範囲の1次発熱ピークが観察された。 The result when indium (In) is added is as shown in FIG. In the case of the Sn-1.0Ag-0.5Cu-1.0In composition, a primary exothermic peak of about 200 ° C. is observed, and in the case of the Sn-1.0Ag-0.5Cu-0.5In composition, about 190 ° C. A primary exothermic peak in the range of from 0C to 191C was observed. Therefore, indium (In) was also analyzed as an element that greatly reduces undercooling. Further, in the case of the Sn-1.2Ag-0.5Cu-0.8In composition, the primary exothermic peak in the range of about 192 ° C to 193 ° C has the Sn-1.2Ag-0.5Cu-0.6In composition. In the case of the Sn-1.2Ag-0.5Cu-0.4In composition, the primary exothermic peak in the range of about 200 ° C to 201 ° C is obtained. In the case of Sn-1.2Ag-0.5Cu-0.2In composition, a primary exothermic peak in the range of about 202 ° C to 203 ° C was observed.
図5及び図6は、半田付け温度によるゼロクロスタイム値(zero cross time value)を示している。1回の濡れ性試験は、ゼロクロスタイム値、2秒後の濡れ力(wetting force at 2 seconds)、最終の濡れ力(final wetting force)などを一度に測定できるが、下記の各結果は、10回以上の試験値を平均した結果を示している。濡れ性試験に用いた試片は、3mmの幅と10mmの長さのCu片であり、センジュ社(SENJU社)の水溶性(water−soluble type)フラックスをCu片の表面に塗布した後、溶融半田内に装入させ、その装入深さは2mmであった。そして、Cu片の装入速度及び離脱速度は、各々5mm/secであった。図5に示すように、Sn−1.2Ag−0.5Cu−0.05Ni組成及びSn−1.0Ag−0.5Cu組成の場合、Sn−3.0Ag−0.5Cu組成に比べて非常に大きなゼロクロスタイム値が測定され、特に、230℃〜240℃の範囲の低温でゼロクロスタイム値が更に増加することと測定された。それに対し、図6のように、インジウム(In)を添加した場合は、ゼロクロスタイム値の顕著な減少が観察され、230℃〜240℃の範囲の低温でゼロクロスタイム値のより効果的な減少が測定された。特に、本発明に係る代表組成であるSn−1.2Ag−0.5Cu−0.4In組成の場合、Sn−3.0Ag−0.5Cu組成と類似、又は多少優れたゼロクロスタイム値を示して、半田材料として非常に優れた濡れ特性を保有していることが確認できる。 5 and 6 show zero cross time values depending on the soldering temperature. One wettability test can measure a zero cross time value, a wetting force after 2 seconds (wetting force at 2 seconds), a final wetting force (final wetting force), etc. at a time. The result of averaging the test values of the test times or more is shown. The specimen used for the wettability test is a Cu piece having a width of 3 mm and a length of 10 mm. After applying a water-soluble type flux of Senju Co., Ltd. to the surface of the Cu piece, The molten solder was charged, and the charging depth was 2 mm. The charging speed and the detaching speed of the Cu piece were 5 mm / sec, respectively. As shown in FIG. 5, in the case of Sn-1.2Ag-0.5Cu-0.05Ni composition and Sn-1.0Ag-0.5Cu composition, compared with the Sn-3.0Ag-0.5Cu composition, A large zero cross time value was measured, particularly a further increase in the zero cross time value at low temperatures in the range of 230 ° C to 240 ° C. On the other hand, when indium (In) is added as shown in FIG. 6, a significant decrease in the zero cross time value is observed, and a more effective decrease in the zero cross time value is observed at a low temperature in the range of 230 ° C. to 240 ° C. Measured. In particular, in the case of the Sn-1.2Ag-0.5Cu-0.4In composition which is a representative composition according to the present invention, a zero cross time value similar to or slightly superior to the Sn-3.0Ag-0.5Cu composition is shown. It can be confirmed that the solder material has very good wetting characteristics.
図7及び図8は、半田付け温度による2秒後の濡れ力の変化を示している。図7に示すように、Sn−1.0Ag−0.5Cu組成及びSn−1.2Ag−0.5Cu−0.05Ni組成の場合、Sn−3.0Ag−0.5Cuに比べて2秒後の非常に小さな濡れ力が測定され、特に、230℃〜240℃の範囲の低い温度で、2秒後の濡れ力が更に顕著に低下した。それに対し、図8のように、インジウム(In)を添加した場合は、2秒後の濡れ力の顕著な増加が観察され、230℃〜240℃の範囲の低温で2秒後の濡れ力がより効果的に増加することが分かった。特に、本発明の代表組成であるSn−1.2Ag−0.5Cu−0.4In組成の場合、Sn−3.0Ag−0.5Cuに類似、又は多少優れた2秒後の濡れ力を備えていることが確認できる。 7 and 8 show changes in the wetting force after 2 seconds depending on the soldering temperature. As shown in FIG. 7, in the case of Sn-1.0Ag-0.5Cu composition and Sn-1.2Ag-0.5Cu-0.05Ni composition, 2 seconds later than Sn-3.0Ag-0.5Cu. A very small wetting force was measured, and the wetting force after 2 seconds was further significantly reduced, particularly at a low temperature in the range of 230 ° C to 240 ° C. On the other hand, when indium (In) is added as shown in FIG. 8, a remarkable increase in the wetting force after 2 seconds is observed, and the wetting force after 2 seconds at a low temperature in the range of 230 ° C. to 240 ° C. It was found to increase more effectively. In particular, in the case of the Sn-1.2Ag-0.5Cu-0.4In composition which is a representative composition of the present invention, it has a wetting force after 2 seconds which is similar to or slightly better than Sn-3.0Ag-0.5Cu. Can be confirmed.
上記のような結果をみるとき、本発明の組成は、合金価格が非常に低価であるにもかかわらず、優れた濡れ力特性を示し、半田付け材料として非常に適した特性を保有していることが分かる。したがって、本発明の鉛フリー半田組成物は、半田ペースト、半田ボール、半田バー、半田ワイヤ、半田バンプ、半田薄板、半田粉末、及び半田ペレット、半田粒子、半田リボン、半田ウォッシャ、半田リング、及び半田ディスクのような半田プリフォームの製造に適用することができる。 When looking at the results as described above, the composition of the present invention exhibits excellent wettability characteristics despite the fact that the alloy price is very low, and possesses characteristics that are very suitable as a soldering material. I understand that. Therefore, the lead-free solder composition of the present invention comprises a solder paste, solder ball, solder bar, solder wire, solder bump, solder thin plate, solder powder, solder pellet, solder particle, solder ribbon, solder washer, solder ring, and It can be applied to the manufacture of a solder preform such as a solder disk.
図9及び図10は、半田付け温度による最終の濡れ力の変化を示している。図9に示すように、Sn−1.0Ag−0.5Cu組成及びSn−1.2Ag−0.5Cu−0.05Ni組成の場合、Sn−3.0Ag−0.5Cu組成に比べて最終の濡れ力は非常に小さく、特に、230℃〜240℃の範囲の低い温度で最終の濡れ力は更に大きく低下した。それに対し、図10のように、インジウム(In)を添加した場合では、興味深い結果が観察されたが、Sn−1.2Ag−0.5Cu−xIn組成を基準にしたとき、インジウム(In)の量が0.8wt% のように多い場合は、溶融インジウム(In)の低い表面張力値によって最終の濡れ力の改善が微小であり、インジウム(In)の量が0.2wt%のように少ない場合は、濡れ力の改善が微小で、最終の濡れ力の向上もなかったが、本発明の代表組成であるSn−1.2Ag−0.5Cu−0.4In組成の場合、Sn−3.0Ag−0.5Cu組成に類似、又は多少劣悪な最終の濡れ力を備えていることが確認できる。特に、Sn−1.2Ag−0.5Cu−0.4In組成は、230℃〜240℃の範囲の低い温度での最終の濡れ力がその他の低Ag含有組成に比べて非常に優れていることが確認できる。 9 and 10 show changes in the final wetting force depending on the soldering temperature. As shown in FIG. 9, in the case of the Sn-1.0Ag-0.5Cu composition and the Sn-1.2Ag-0.5Cu-0.05Ni composition, the final composition compared to the Sn-3.0Ag-0.5Cu composition. The wettability was very small, and the final wettability was further reduced particularly at low temperatures in the range of 230 ° C to 240 ° C. On the other hand, as shown in FIG. 10, when indium (In) was added, an interesting result was observed, but when the composition of Sn-1.2Ag-0.5Cu-xIn was used as a reference, indium (In) When the amount is as large as 0.8 wt%, the final wettability improvement is small due to the low surface tension value of molten indium (In), and the amount of indium (In) is as small as 0.2 wt% In the case of the Sn-1.2Ag-0.5Cu-0.4In composition, which is a representative composition of the present invention, the improvement of the wetting force was slight and the final wetting force was not improved. It can be confirmed that the final wettability is similar to or slightly worse than the 0Ag-0.5Cu composition. In particular, the Sn-1.2Ag-0.5Cu-0.4In composition has a very good final wettability at a low temperature in the range of 230 ° C. to 240 ° C. compared to other low Ag-containing compositions. Can be confirmed.
図11は、従来のSn−3.0Ag−0.5Cu組成、Sn−1.0Ag−0.5Cu組成、及びSn−1.2Ag−0.5Cu−0.05Ni組成を引張試験片として製作して試験を行った結果を示している。引張試験片は、KS規格の13Aによる比例引張試験片であり、厚さは2mm、長さは27mmであり、引張試験温度は常温、引張試験速度は7.8mm/minであった。同図に示すように、Sn−3.0Ag−0.5Cu組成の場合、強度は大きいが、延伸率が非常に小さく、半田ジョイント材料として用いる場合、熱サイクルに対する耐性は優れているが、機械的インパクトに対する耐性は非常に劣悪な特性を表すものと予想される。それに対し、Sn−1.0Ag−0.5Cu組成の場合、延伸率は多少増加するが、強度が非常に小さくて、機械的インパクトに対する耐性はSn−3.0Ag−0.5Cu組成に比べて相対的に向上するが、熱サイクルに対する耐性は、劣悪な特性を表すものと予想される。また、Sn−1.2Ag−0.5Cu−0.05Ni組成の場合、前記で言及した2つの組成、すなわち、Sn−3.0Ag−0.5Cu及びSn−1.0Ag−0.5Cuの中間的特性を表すことを観察することができた。 FIG. 11 shows a conventional Sn-3.0Ag-0.5Cu composition, Sn-1.0Ag-0.5Cu composition, and Sn-1.2Ag-0.5Cu-0.05Ni composition as tensile test pieces. The results of testing are shown. The tensile test piece was a proportional tensile test piece according to KS standard 13A, the thickness was 2 mm, the length was 27 mm, the tensile test temperature was room temperature, and the tensile test speed was 7.8 mm / min. As shown in the figure, in the case of Sn-3.0Ag-0.5Cu composition, the strength is high, but the stretch ratio is very small, and when used as a solder joint material, the resistance to thermal cycling is excellent, Resistance to mechanical impact is expected to represent very poor properties. On the other hand, in the case of Sn-1.0Ag-0.5Cu composition, the stretch ratio increases somewhat, but the strength is very small, and the resistance to mechanical impact is higher than that of Sn-3.0Ag-0.5Cu composition. Although relatively improved, resistance to thermal cycling is expected to represent poor properties. Further, in the case of the Sn-1.2Ag-0.5Cu-0.05Ni composition, the two compositions mentioned above, that is, an intermediate between Sn-3.0Ag-0.5Cu and Sn-1.0Ag-0.5Cu It was possible to observe the expression of the mechanical characteristics.
図12は、本発明の代表組成であるSn−1.2Ag−0.5Cu−0.4In組成と、その他のSn−1.2Ag−0.5Cu−0.2In、Sn−1.2Ag−0.5Cu−0.6In、Sn−1.2Ag−0.5Cu−0.8In、Sn−1.0Ag−0.5Cu−1.0In組成とを引張試験片として製作して試験を行った結果を示している。Sn−1.2Ag−0.5Cu−0.4Inの場合、類似組成であるSn−1.0Ag−0.5Cuに比べて強度が大きく向上し、更に、延伸率も非常に向上して、全体的に合金の靭性が非常に向上したことが分かる。このような特性は、機械的インパクトに対し、最も優れた耐性を表し、かつ、熱サイクルに対する耐性も比較的優れているものと予想され、特に、機械的衝撃又は振動に露出しやすいモバイル製品、及び自動車内部のエレクトロニクスの接合材料として非常に適した半田組成として期待されている。Sn−1.2Ag−0.5Cu−0.2Inの場合は、インジウム(In)の添加による金属の強化現象が減少して強度値が低下し、Sn−1.2Ag−0.5Cu−0.6In及びSn−1.2Ag−0.5Cu−0.8Inの場合は、インジウム(In)の添加量の増加によって延伸率が次第に減少する現象を表した。Sn−1.0Ag−0.5Cu−1.0Inの場合は、インジウム(In)の添加量が多いにもかかわらず、優れた強度値を示さなかった。
また、本発明に係るSn−Ag−Cu−Inの4元系鉛フリー半田組成の他の例であるSn−0.3Ag−0.7Cu−0.2In組成と、従来のSn−3.0Ag−0.5Cu、Sn−1.0Ag−0.5Cu、Sn−0.3Ag−0.7Cu組成とについて、前述した同じ試験過程を通じて濡れ特性を評価した結果が、図13ないし図15に示されている。
FIG. 12 shows the Sn-1.2Ag-0.5Cu-0.4In composition, which is a representative composition of the present invention, and other Sn-1.2Ag-0.5Cu-0.2In and Sn-1.2Ag-0. .5Cu-0.6In, Sn-1.2Ag-0.5Cu-0.8In, Sn-1.0Ag-0.5Cu-1.0In composition as tensile test pieces and the results of testing Show. In the case of Sn-1.2Ag-0.5Cu-0.4In, the strength is greatly improved as compared with Sn-1.0Ag-0.5Cu which is a similar composition, and the stretch ratio is also greatly improved. In particular, it can be seen that the toughness of the alloy has been greatly improved. Such characteristics represent the best resistance to mechanical impact and are also expected to be relatively resistant to thermal cycling, especially mobile products that are susceptible to mechanical shock or vibration, It is expected to be a solder composition that is very suitable as a bonding material for electronics inside automobiles. In the case of Sn-1.2Ag-0.5Cu-0.2In, the strengthening phenomenon of the metal due to the addition of indium (In) is reduced and the strength value is decreased, and Sn-1.2Ag-0.5Cu-0. In the case of 6In and Sn-1.2Ag-0.5Cu-0.8In, a phenomenon in which the stretch ratio gradually decreased with an increase in the amount of indium (In) added. In the case of Sn-1.0Ag-0.5Cu-1.0In, although the amount of indium (In) added was large, an excellent strength value was not exhibited.
In addition, another example of Sn-Ag-Cu-In quaternary lead-free solder composition according to the present invention is Sn-0.3Ag-0.7Cu-0.2In composition and conventional Sn-3.0Ag. The results of evaluating the wetting characteristics through the same test process described above for the -0.5Cu, Sn-1.0Ag-0.5Cu, and Sn-0.3Ag-0.7Cu compositions are shown in FIGS. ing.
図13は、半田付け温度によるゼロクロスタイム値の変化を示し、図14は、半田付け温度による2秒後の濡れ力の変化を示し、図15は、半田付け温度による最終の濡れ力の変化を示す。図13ないし図15に示すように、インジウム(In)を少量添加したSn−0.3Ag−0.7Cu−0.2In組成の場合は、Sn−0.3Ag−0.7Cu組成に比べ、特に、240℃以上の温度で、上記の様々な濡れ特性が大きく向上し、ほぼ、Sn−1.0Ag−0.5Cu組成と類似した値を示すことが分かる。これにより、本発明に係る錫・銀・銅・インジウムの4元系鉛フリー半田組成物は、少量のインジウムを添加することにより、原価の上昇を最小化し、銀の含量の減少による濡れ性の低下の抑制が可能であることを更に確認することができる。 FIG. 13 shows the change in the zero cross time value due to the soldering temperature, FIG. 14 shows the change in the wetting force after 2 seconds due to the soldering temperature, and FIG. 15 shows the change in the final wetting force due to the soldering temperature. Show. As shown in FIGS. 13 to 15, the Sn-0.3Ag-0.7Cu-0.2In composition to which a small amount of indium (In) is added is particularly compared with the Sn-0.3Ag-0.7Cu composition. It can be seen that the above-mentioned various wettability characteristics are greatly improved at a temperature of 240 ° C. or higher, and show a value almost similar to the Sn-1.0Ag-0.5Cu composition. As a result, the quaternary lead-free solder composition of tin, silver, copper, and indium according to the present invention minimizes the increase in cost by adding a small amount of indium, and improves the wettability by reducing the silver content. It can further be confirmed that the reduction can be suppressed.
一方、本発明に係るSn−Ag−Cu−Inの4元系鉛フリー半田組成物の耐酸化性を向上させるために、リン(P)、ゲルマニウム(Ge)、ガリウム(Ga)、アルミニウム(Al)、及びシリコン(Si)のうちから選択された1つ又は2つ以上の元素を混合して、0.001wt%〜1wt%の範囲で更に添加することができる。
また、本発明に係るSn−Ag−Cu−Inの4元系鉛フリー半田組成物の界面反応特性の向上と融点降下などのために、亜鉛(Zn)と砒素(Bi)とのうちから選択された1つの元素又は2つの元素を混合して、0.001wt%〜2wt%の範囲で更に添加することができる。
Meanwhile, in order to improve the oxidation resistance of the Sn—Ag—Cu—In quaternary lead-free solder composition according to the present invention, phosphorus (P), germanium (Ge), gallium (Ga), aluminum (Al ) And one or more elements selected from silicon (Si) can be mixed and further added in the range of 0.001 wt% to 1 wt%.
In addition, it is selected from zinc (Zn) and arsenic (Bi) in order to improve the interfacial reaction characteristics and lower the melting point of the Sn—Ag—Cu—In quaternary lead-free solder composition according to the present invention. One element or two elements formed can be mixed and further added in the range of 0.001 wt% to 2 wt%.
なお、本発明に係るSn−Ag−Cu−Inの4元系鉛フリー半田組成物の機械的特性及び界面反応特性を向上させるために、ニッケル(Ni)、コバルト(Co)、鉄(Fe)、金(Au)、白金(Pt)、鉛(Pb)、マンガン(Mn)、バナジウム(V)、チタニウム(Ti)、クロム(Cr)、ニオブ(Nb)、パラジウム(Pd)、アンチモン(Sb)、マグネシウム(Mg)、タンタル(Ta)、カドミウム(Cd)、及び希土類(Rare Earth)金属のうちから選択された1つ又は2つ以上の元素を混合して、0.001wt%〜1wt%の範囲で更に添加することができる。
上記のような付言は、本発明に係るSn−Ag−Cu−Inの4元系鉛フリー半田組成物の特許を回避しようと、Sn−Ag−Cu−Inの4元系鉛フリー半田組成物に微量の1つ又は2つ以上の元素を添加する方法も、本発明に属する技術分野であることを伝えるためである。
In order to improve the mechanical characteristics and interfacial reaction characteristics of the Sn-Ag-Cu-In quaternary lead-free solder composition according to the present invention, nickel (Ni), cobalt (Co), iron (Fe) , Gold (Au), platinum (Pt), lead (Pb), manganese (Mn), vanadium (V), titanium (Ti), chromium (Cr), niobium (Nb), palladium (Pd), antimony (Sb) , Magnesium (Mg), tantalum (Ta), cadmium (Cd), and one or more elements selected from rare earth (Rare Earth) metals may be mixed to form 0.001 wt% to 1 wt% Further additions can be made within the range.
In order to avoid the patent of the Sn-Ag-Cu-In quaternary lead-free solder composition according to the present invention, the above-mentioned supplementary notes are Sn-Ag-Cu-In quaternary lead-free solder composition. This is to convey that the method of adding a trace amount of one or more elements to the above is also a technical field belonging to the present invention.
本発明は上述したように、銀(Ag)の含量を減少させるものであり、インジウム(In)を添加することによって銀(Ag)の減少による濡れ性を補完し、熱サイクル及び機械的インパクトに対する耐性を向上させて、低廉な原価で優れた品質の鉛フリー半田組成物を提供できるようになった。 As described above, the present invention reduces the content of silver (Ag), and supplements the wettability due to the reduction of silver (Ag) by adding indium (In), thereby preventing thermal cycle and mechanical impact. It has become possible to provide a lead-free solder composition with improved quality and excellent quality at a low cost.
本発明は、上述した特定の好ましい実施形態に限定されるのではなく、請求の範囲において請求する本発明の要旨を一脱することなく、当該発明の属する技術分野における通常の知識を有した者であれば、誰でも様々な変形実施が可能であることはもちろん、そのような変更は、請求の範囲の記載の範囲内にあることになる。 The present invention is not limited to the specific preferred embodiments described above, but has a general knowledge in the technical field to which the invention belongs without departing from the spirit of the invention claimed in the claims. Anyone can make various modifications, and such changes are within the scope of the claims.
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| JP2011031253A (en) * | 2009-07-30 | 2011-02-17 | Eishin Kogyo Kk | Lead-free solder alloy |
| WO2012127642A1 (en) * | 2011-03-23 | 2012-09-27 | 千住金属工業株式会社 | Lead-free solder alloy |
| WO2012128356A1 (en) * | 2011-03-23 | 2012-09-27 | 千住金属工業株式会社 | Lead-free solder alloy |
| JP5660199B2 (en) * | 2011-03-23 | 2015-01-28 | 千住金属工業株式会社 | Lead-free solder alloy |
| US9844837B2 (en) | 2011-03-23 | 2017-12-19 | Senju Metal Industry Co., Ltd. | Lead-free solder alloy |
| JP2013252548A (en) * | 2012-06-08 | 2013-12-19 | Nihon Almit Co Ltd | Solder paste for joining micro component |
| JPWO2015019967A1 (en) * | 2013-08-05 | 2017-03-02 | 千住金属工業株式会社 | Lead-free solder alloy |
| JP2017094368A (en) * | 2015-11-26 | 2017-06-01 | 株式会社リソー技研 | Solder for enamel-coated electric cable, and soldering method for enamel-coated electric cable |
Also Published As
| Publication number | Publication date |
|---|---|
| US20080292493A1 (en) | 2008-11-27 |
| KR100797161B1 (en) | 2008-01-23 |
| CN101569965A (en) | 2009-11-04 |
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