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JP2008128729A - Shape measuring device - Google Patents

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JP2008128729A
JP2008128729A JP2006311772A JP2006311772A JP2008128729A JP 2008128729 A JP2008128729 A JP 2008128729A JP 2006311772 A JP2006311772 A JP 2006311772A JP 2006311772 A JP2006311772 A JP 2006311772A JP 2008128729 A JP2008128729 A JP 2008128729A
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measured
light
light projecting
imaging
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JP4924880B2 (en
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Masataka Toda
昌孝 戸田
Koshi Kuno
耕嗣 久野
Satohiko Yoshikawa
聡彦 吉川
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Aisin Corp
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Aisin Seiki Co Ltd
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Abstract

【課題】被測定物の広い面積(例えば全体またはほぼ全体)を測定するのに有利な形状測定装置を提供する。
【解決手段】形状測定装置は、被測定物8を載せる載置面20をもちレーザ光を透過可能な透過部材2を保持する透過部材保持部3と、透過部材に載せられている被測定物8にレーザ光を投光する投光部4と、投光部4から投光されたレーザ光の照射部分の反射光を撮像する撮像部5と、撮像部5で撮像された撮像データを格納する撮像データ格納部6と、透過部材の載置面20の仮想線の回りに沿って投光部4を回動させ、回動に伴い被測定物8に対して投光部4を相対移動させる第1駆動部7とを備えている。
【選択図】図1
Kind Code: A1 An object of the present invention is to provide a shape measuring apparatus advantageous for measuring a wide area (for example, the whole or almost the whole) of an object to be measured.
A shape measuring apparatus includes a transmitting member holding section 3 that holds a transmitting member 2 having a mounting surface 20 on which an object to be measured 8 is placed and is capable of transmitting laser light, and an object to be measured placed on the transmitting member. 8 stores a light projecting unit 4 that projects laser light, an image capturing unit 5 that captures reflected light of the irradiated portion of the laser light projected from the light projecting unit 4, and imaging data captured by the image capturing unit 5. The projection unit 4 is rotated along the imaginary line of the imaging data storage unit 6 and the mounting surface 20 of the transmission member, and the projection unit 4 is relatively moved with respect to the measurement object 8 along with the rotation. A first drive unit 7 to be operated.
[Selection] Figure 1

Description

本発明は、被測定物の形状を測定する形状測定装置に関する。   The present invention relates to a shape measuring apparatus that measures the shape of an object to be measured.

従来、被測定物を粘土で固定する測定台と、レーザ光源から投光されたレーザ光を被測定物に導く出射光学系と、被測定物に照射されたレーザ光のスポット光を撮像する撮像部と、スポット光を被測定物の表面で走査する走査部と、撮像部で捉えたレーザ光のスポット光の像をもとに被測定物の表面のレーザ光のスポット光の位置を演算する制御系とを備える形状測定装置が知られている(特許文献1)。このものによれば、三角測量の原理により、被測定物の形状を測定することにしている。   Conventionally, a measuring table for fixing an object to be measured with clay, an emission optical system for guiding laser light projected from a laser light source to the object to be measured, and imaging for imaging spot light of the laser light irradiated on the object to be measured The position of the spot light of the laser light on the surface of the object to be measured is calculated based on the image of the spot light of the laser light captured by the imaging unit, the scanning part that scans the spot light on the surface of the object to be measured, and the imaging part A shape measuring apparatus including a control system is known (Patent Document 1). According to this, the shape of the object to be measured is measured by the principle of triangulation.

更に、被測定物の長手方向の端部を掴んで保持する保持部と、保持部で保持されている被測定物にレーザスリット光を照射する投光部と、被測定物の形状を把握することが可能な撮像範囲を有する広域測定用撮像部と、被測定物を相対回動させる駆動部と、撮像部で撮像された撮像データから断面形状データを演算する演算部とを備えている断面形状測定装置が知られている(特許文献2)。このものにおいても、三角測量の原理により、被測定物の形状を測定することにしている。   Further, a holding unit that holds and holds the end in the longitudinal direction of the object to be measured, a light projecting unit that irradiates the object to be measured held by the holding unit with laser slit light, and a shape of the object to be measured A cross section provided with an imaging unit for wide-area measurement having an imaging range capable of driving, a drive unit that relatively rotates the object to be measured, and a calculation unit that calculates cross-sectional shape data from imaging data captured by the imaging unit A shape measuring apparatus is known (Patent Document 2). In this case, the shape of the object to be measured is measured by the principle of triangulation.

ところで、考古学の現場において、発掘された石器等の遺物の形状の測定は、人の手作業によるスケッチにより行われている。この場合、できるだけ正確なスケッチとするため、多大な工数と時間がかけられている。更に、手作業故に、人によるバラツキがあり、スケッチの信頼性の向上には限界がある。例えば、定規、ノギスを用いて、石器等の遺物の表面、裏面、右側面、左側面、上面、下面の合計6面をスケッチして実測図とするが、人の手作業によるスケッチによると、多大な工数と時間がかけられており、更に、スケッチの信頼性の向上には限界がある。
特開2004−354136号公報 特開2001−304827号公報
By the way, in the field of archeology, the measurement of the shape of relics such as excavated stone tools is performed by manual sketches. In this case, in order to make the sketch as accurate as possible, a great deal of man-hours and time are spent. Furthermore, because of manual work, there are variations among people, and there is a limit to improving the reliability of sketches. For example, using a ruler and a caliper, the surface, back, right side, left side, top, and bottom of the relics such as stone tools are sketched and made into an actual measurement. It takes a lot of man-hours and time, and there is a limit to improving the reliability of sketches.
JP 2004-354136 A JP 2001-304827 A

上記した特許文献1,2に係る技術を石器等の被測定物の形状測定に適用しようとしても、石器等の被測定物の大きな面積(例えば全体またはほぼ全体)を測定するには限界がある。   Even if the techniques according to Patent Documents 1 and 2 described above are applied to the shape measurement of an object to be measured such as a stone tool, there is a limit in measuring a large area (for example, the whole or almost the whole) of the object to be measured such as a stone tool. .

本発明は上記した実状に鑑みなされてたものであり、被測定物の大きな面積(例えば全体またはほぼ全体)を測定するのに有利な形状測定装置を提供することを課題とする。   The present invention has been made in view of the above-described actual situation, and an object thereof is to provide a shape measuring apparatus that is advantageous for measuring a large area (for example, the whole or almost the whole) of an object to be measured.

(1)様相1に係る形状測定装置は、被測定物を載せる載置面および載置面に背向する背向面をもちレーザ光を透過可能な透過部材を保持する透過部材保持部と、透過部材に載せられている被測定物にレーザ光を投光する投光部と、投光部から被測定物に投光されたレーザ光の照射部分の反射光を撮像する撮像部と、撮像部で撮像された撮像データを格納する撮像データ格納部と、撮像データ格納部の撮像データに基づいて被測定物の形状を求める演算部と、透過部材の載置面および背向面に投光部および撮像部が対向するように、透過部材の載置面上の仮想線の回りに沿って投光部と撮像部を回動させ、回動に伴い被測定物に対して投光部と撮像部を相対移動させる第1駆動部を具備することを特徴とする。   (1) A shape measuring apparatus according to aspect 1 includes a mounting surface on which an object to be measured is mounted and a transmitting member holding unit that holds a transmitting member that has a back surface facing the mounting surface and is capable of transmitting laser light; A light projecting unit that projects laser light onto the object to be measured placed on the transmission member, an image capturing unit that captures reflected light from the irradiated portion of the laser light projected from the light projecting unit to the object to be measured, and imaging An imaging data storage unit that stores imaging data captured by the imaging unit, a calculation unit that obtains the shape of the object to be measured based on the imaging data of the imaging data storage unit, and a projection surface and a back surface of the transmission member The projection unit and the imaging unit are rotated along a virtual line on the mounting surface of the transmission member so that the imaging unit and the imaging unit are opposed to each other. It has the 1st drive part which moves an imaging part relatively, It is characterized by the above-mentioned.

様相1によれば、透過部材保持部に保持されている透過部材の載置面に被測定物を載せる。この状態で、透過部材に載せられている被測定物に投光部はレーザ光を投光する。投光部から投光されたレーザ光の照射部分を撮像部は撮像する。撮像部で撮像された撮像データは撮像データ格納部に格納される。第1駆動部は、透過部材の載置面の仮想線の回りに沿って投光部と撮像部を回動させる。投光部と撮像部の回動に伴い、被測定物の回りで投光部と撮像部は相対移動する。このため投光部と撮像部を被測定物の全域またはほぼ全域で相対移動させれば、被測定物の大きな面積(例えば全域またはほぼ全域)での形状測定が可能となる。   According to aspect 1, the object to be measured is placed on the mounting surface of the transmission member held by the transmission member holding unit. In this state, the light projecting unit projects laser light onto the object to be measured placed on the transmitting member. An imaging part images the irradiation part of the laser beam projected from the light projection part. The imaging data captured by the imaging unit is stored in the imaging data storage unit. A 1st drive part rotates a light projection part and an imaging part along the surroundings of the virtual line of the mounting surface of a permeation | transmission member. As the light projecting unit and the imaging unit rotate, the light projecting unit and the image capturing unit relatively move around the object to be measured. For this reason, if the light projecting unit and the imaging unit are relatively moved over the entire area or almost the entire area of the object to be measured, the shape of the object to be measured can be measured over a large area (for example, the entire area or almost the entire area).

透過部材保持部は、被測定物を載せる載置面をもつ透過部材を保持するものをいう。透過部材は無機ガラス、有機ガラスでも良く、要するにレーザ光が透過できれば良い。透過部材としては板状が好ましいが、これに限定されるものではない。被測定物としては、貝殻、石等の自然物、車両や産業機器に搭載される部品、石器等の遺物などが例示される。被測定物の材質としては特に限定されず、金属、セラミックス、樹脂、木材、天然鉱物が例示される。投光部は、透過部材に載せられている被測定物にレーザ光を投光する。投光部が被測定部に投光するレーザ光としては、測定時間の短縮等を考慮すると、ピンポイント光よりも、スリット状をなすレーザスリット光が好ましい。レーザ光としては、P偏光でも良いし、S偏光でも良い。P偏光は、光波の電場ベクトルが透過部材の入射面(載置面に垂直な面)に対して平行な光を意味する。S偏光は、光波の電場ベクトルが透過部材の入射面(載置面に垂直な面)に対して垂直な光を意味する。P偏光の反射率はS偏光の反射率よりも小さい特性を有するため、反射に起因するノイズを低減させるためには、P偏光が好ましい。撮像部は、投光部から投光されたレーザ光の照射部分を撮像する。撮像部としては、投光部を挟むように配置された2台の撮像素子を備えることが好ましい。撮像データ格納部は、撮像部で撮像された撮像データを格納するものである。演算部は、撮像データ格納部の撮像データに基づいて被測定物の形状を求めるものである。第1駆動部は、透過部材の載置面の仮想線の回りに沿って投光部と撮像部を回動させ、回動に伴い被測定物の回りで投光部と撮像部を相対移動させるものをいう。この場合、第1駆動部としては、透過部材の載置面の仮想線の回りに沿って投光部を300度以上、殊に360度回動させることが好ましい。第1駆動部は、モータ装置、シリンダ装置等を用いて形成できる。   The transmission member holding unit is a unit that holds a transmission member having a mounting surface on which the object to be measured is placed. The transmitting member may be inorganic glass or organic glass, and in short, it is sufficient that the laser beam can be transmitted. The transmission member is preferably a plate shape, but is not limited thereto. Examples of the object to be measured include natural objects such as shells and stones, parts mounted on vehicles and industrial equipment, and relics such as stone tools. It does not specifically limit as a material of a to-be-measured object, A metal, ceramics, resin, wood, a natural mineral is illustrated. The light projecting unit projects laser light onto the object to be measured placed on the transmission member. As the laser light projected by the light projecting unit to the measured part, a laser slit light having a slit shape is preferable to the pinpoint light in consideration of shortening of the measurement time. The laser light may be P-polarized light or S-polarized light. P-polarized light means light in which the electric field vector of the light wave is parallel to the incident surface (surface perpendicular to the mounting surface) of the transmissive member. S-polarized light means light in which the electric field vector of the light wave is perpendicular to the incident surface (surface perpendicular to the mounting surface) of the transmissive member. Since the reflectance of P-polarized light is smaller than that of S-polarized light, P-polarized light is preferable in order to reduce noise caused by reflection. The imaging unit images the irradiated portion of the laser light projected from the light projecting unit. As an imaging part, it is preferable to provide two imaging elements arrange | positioned so that a light projection part may be pinched | interposed. The imaging data storage unit stores imaging data captured by the imaging unit. The calculation unit obtains the shape of the device under test based on the imaging data stored in the imaging data storage unit. The first driving unit rotates the light projecting unit and the imaging unit around the imaginary line of the mounting surface of the transmission member, and relatively moves the light projecting unit and the imaging unit around the object to be measured along with the rotation. It says what you want. In this case, as the first driving unit, it is preferable to rotate the light projecting unit by 300 degrees or more, particularly 360 degrees along the imaginary line of the mounting surface of the transmission member. The first drive unit can be formed using a motor device, a cylinder device, or the like.

(2)様相2に係る形状測定装置によれば、様相1において、透過部材に載せられている被測定物を投光部に対して相対移動させる第2駆動部が設けられていることを特徴とする。この場合、第2駆動部は、透過部材に載せられている被測定物を投光部に対して相対移動させる。このため、被測定物の全域またはほぼ全域を測定するのに有利となる。第2駆動部は、透過部材に載せられている被測定物を投光部に対して相対移動させるものであれば良く、モータ装置、シリンダ装置を用いたものが例示される。   (2) According to the shape measuring apparatus according to aspect 2, in aspect 1, the second drive unit that moves the measurement object placed on the transmission member relative to the light projecting unit is provided. And In this case, the second drive unit moves the measurement object placed on the transmission member relative to the light projecting unit. For this reason, it is advantageous for measuring the entire area or almost the entire area of the object to be measured. The second driving unit may be any unit that moves the object to be measured mounted on the transmission member relative to the light projecting unit, and examples thereof include a motor device and a cylinder device.

(3)様相3に係る形状測定装置によれば、様相1または2において、X方向およびY方向を水平2次元方向とし、Z方向を高さ方向とするとき、第2駆動部は、被測定物を透過部材に載せたままX方向、Y方向、Z方向に移動させるXYZ駆動部と、被測定物を透過部材に載せたまま、X方向およびY方向で規定される面に沿って、少なくとも180度回動させる回動駆動部とを備えていることを特徴とする。この場合、XYZ駆動部は、被測定物を透過部材に載せたままX方向、Y方向、Z方向に移動させる。回動駆動部は、被測定物を透過部材に載せたまま少なくとも180度回動させる。このため、被測定物の大きな面積(例えば全域またはほぼ全域)を測定するのに有利となる。XYZ駆動部としては、被測定物を透過部材に載せたままZ方向に移動させるZ方向駆動部と、被測定物を透過部材に載せたままY方向に移動させるY方向駆動部と、被測定物を透過部材に載せたままX方向に移動させるX方向駆動部とをもつ形態が例示される。回動駆動部は、被測定物を透過部材に載せたまま少なくとも180度回動させるものであれば、何でも良い。   (3) According to the shape measuring apparatus according to the aspect 3, in the aspect 1 or 2, when the X direction and the Y direction are horizontal two-dimensional directions and the Z direction is the height direction, the second drive unit is measured An XYZ driving unit that moves the object in the X direction, the Y direction, and the Z direction while the object is placed on the transmission member; and at least along a plane defined by the X direction and the Y direction while the object to be measured is placed on the transmission member And a rotation drive unit that rotates 180 degrees. In this case, the XYZ driving unit moves the object to be measured in the X direction, the Y direction, and the Z direction while being placed on the transmission member. The rotation driving unit rotates at least 180 degrees while placing the object to be measured on the transmission member. This is advantageous for measuring a large area (for example, the entire area or almost the entire area) of the object to be measured. As the XYZ drive unit, a Z-direction drive unit that moves the object to be measured in the Z direction while being placed on the transmission member, a Y-direction drive unit that is to move the measurement object in the Y direction while being placed on the transmission member, and a measurement object A configuration having an X-direction drive unit that moves an object in the X-direction while being placed on the transmission member is exemplified. The rotation drive unit may be anything as long as the object to be measured is rotated at least 180 degrees while being placed on the transmission member.

(4)様相4に係る形状測定装置によれば、様相1〜3において、投光部が被測定部に投光するレーザ光は、P偏光またはS偏光であることを特徴とする。   (4) According to the shape measuring apparatus according to aspect 4, in aspects 1 to 3, the laser light projected by the light projecting unit to the measured part is P-polarized light or S-polarized light.

透過部材に対してレーザ光の入射角が増加するときには、P偏光の反射率がS偏光の反射率よりも小さい特性を有する。このためP偏光であれば、反射光ノイズの低減に有利である。またS偏光であれば、高い反射率を有するため、反射率の低い被測定物の反射像を撮像できるという利点が得られる。   When the incident angle of the laser beam increases with respect to the transmission member, the reflectance of P-polarized light is smaller than that of S-polarized light. For this reason, P-polarized light is advantageous in reducing reflected light noise. In addition, since S-polarized light has a high reflectance, an advantage is obtained in that a reflected image of an object to be measured having a low reflectance can be taken.

(5)様相5に係る形状測定装置によれば、様相1〜4において、投光部から投光されるレーザ光が透過部材の載置面に斜め方向から入射する位置になるように、投光部は前記透過部材に対して回動することを特徴とする。P偏光の反射率はS偏光の反射率よりも小さい特性を有する。投光部から投光されるレーザ光が透過部材の載置面に斜め方向から入射するため、レーザ光がP偏光であれば、反射光ノイズの低減に有利である。   (5) According to the shape measuring apparatus according to aspect 5, in aspects 1 to 4, the projection is performed so that the laser light projected from the light projecting unit is positioned obliquely on the mounting surface of the transmission member. The light portion rotates with respect to the transmission member. The reflectance of P-polarized light is smaller than that of S-polarized light. Since the laser light projected from the light projecting unit is incident on the mounting surface of the transmission member from an oblique direction, if the laser light is P-polarized light, it is advantageous for reducing reflected light noise.

本発明によれば、透過部材の載置面に沿った仮想線の回りに沿って投光部と撮像部を回動させ、回動に伴い被測定物に対して投光部と撮像部を相対移動させる。このため被測定物の形状の大きな面積(例えば全体またはほぼ全体)を撮像して測定するのに有利となる。   According to the present invention, the light projecting unit and the image capturing unit are rotated along the imaginary line along the mounting surface of the transmission member, and the light projecting unit and the image capturing unit are rotated with respect to the object to be measured along with the rotation. Move relative. For this reason, it becomes advantageous to image and measure a large area (for example, the whole or almost the whole) of the shape of the object to be measured.

本発明によれば、透過部材はレーザ光を透過可能である。このため透過部材のうち被測定物を載置している載置面の反対側である背向面に投光部および撮像部が対向するように投光部と撮像部を配置し、投光部から投光したレーザ光を透過部材に透過させることにより、被測定物の裏面をも撮像することができる。この意味においても、被測定物の大きな面積(例えば全体またはほぼ全体)を測定するのに有利となる。   According to the present invention, the transmitting member can transmit laser light. For this reason, the light projecting unit and the image capturing unit are arranged so that the light projecting unit and the image capturing unit face the back surface opposite to the mounting surface on which the object to be measured is placed, among the transmitting members. The back surface of the object to be measured can also be imaged by transmitting the laser light projected from the section through the transmission member. In this sense as well, it is advantageous for measuring a large area (for example, the whole or almost the whole) of the object to be measured.

(実施形態1)
本発明の実施形態1について図1〜図7を参照して説明する。図1は形状測定装置の概念を示す。図1に示すように、形状撮像装置として機能する形状測定装置は、脚1cを有する基台1と、被測定物8(被撮像物、ワーク)を載せる透過部材として機能する透過板2と、透過板2を保持する透過板保持部3と、透過板2に載せられている被測定物8にレーザ光を投光する投光部4と、投光部4から被測定物8に投光されたレーザ光の照射部分からの反射光を撮像する撮像部5と、撮像部5で撮像された撮像データを格納する撮像データ格納部として機能する画像メモリ6、透過板2の載置面20上に仮想的に規定された仮想線Mの回りに沿って投光部4を縦方向に沿って回動させる第1駆動部7とを備えている。
(Embodiment 1)
Embodiment 1 of the present invention will be described with reference to FIGS. FIG. 1 shows the concept of the shape measuring apparatus. As shown in FIG. 1, the shape measuring device functioning as a shape imaging device includes a base 1 having legs 1c, a transmission plate 2 functioning as a transmission member on which an object to be measured 8 (an object to be imaged, a workpiece) is placed, A transmission plate holding unit 3 that holds the transmission plate 2, a light projecting unit 4 that projects laser light onto the measurement object 8 placed on the transmission plate 2, and a light projection from the light projection unit 4 to the measurement object 8. The imaging unit 5 that captures the reflected light from the irradiated portion of the laser beam, the image memory 6 that functions as an imaging data storage unit that stores the imaging data captured by the imaging unit 5, and the mounting surface 20 of the transmission plate 2 A first drive unit 7 is provided for rotating the light projecting unit 4 along the vertical direction around a virtual line M virtually defined above.

図2に示すように、投光部4は、半導体レーザ(波長:660ナノメートル)で構成された投光素子40と、投光素子40の先方(被測定物8側)に配置された透光レンズとして機能するシリンドリカルレンズ41と、シリンドリカルレンズ41の先方(被測定物8側)に設けられた1/2波長板42(光学波長板)とを備えている。1/2波長板42は、光の偏光面を回動させる機能をもつ電子工学的な複屈折板をいう。シリンドリカルレンズ41は透過面41aおよび屈折面41cをもつレンズであり、レーザ光のスポットの縦横のうち一方向を拡大でき、ポイント状のレーザ光からスリット状のレーザ光、つまり、レーザスリット光47を形成できる。屈折面41cは円筒形状の一部を形成する。レーザスリット光47は、光が進行するにつれてスリット扇状に拡開するスリット縁47a,47cを有する。   As shown in FIG. 2, the light projecting unit 4 includes a light projecting element 40 composed of a semiconductor laser (wavelength: 660 nanometers) and a light transmitting device disposed on the tip side of the light projecting element 40 (measurement object 8 side). A cylindrical lens 41 that functions as an optical lens, and a half-wave plate (optical wavelength plate) provided on the front side of the cylindrical lens 41 (on the side of the object to be measured 8) are provided. The half-wave plate 42 is an electronic birefringent plate having a function of rotating the polarization plane of light. The cylindrical lens 41 is a lens having a transmissive surface 41a and a refracting surface 41c, and can enlarge one direction in the vertical and horizontal directions of the spot of the laser beam. From the point-shaped laser beam to the slit-shaped laser beam, that is, the laser slit beam 47. Can be formed. The refracting surface 41c forms a part of a cylindrical shape. The laser slit light 47 has slit edges 47a and 47c that expand into a slit fan shape as the light travels.

半導体レーザで形成されている投光素子40は楕円発光している。レーザスリット光47を生成する場合には、通常、より広い範囲でスリット幅を細くするため、発光楕円の長軸方向を、投光部4に装備されているシリンドリカルレンズ41で広げる。この状態ではレーザスリット光47はS偏光(光波の電場ベクトルが透過板2の入射面に対して垂直な光を意味する)となる。しかしながらレーザスリット光47は1/2波長板42を透過するため、レーザスリット光47はP偏光(光波の電場ベクトルが透過板2の入射面に対して平行な光を意味する)となる。   The light projecting element 40 formed of a semiconductor laser emits an ellipse. When the laser slit light 47 is generated, the longitudinal axis direction of the light emission ellipse is usually widened by the cylindrical lens 41 provided in the light projecting unit 4 in order to narrow the slit width in a wider range. In this state, the laser slit light 47 is S-polarized light (meaning light in which the electric field vector of the light wave is perpendicular to the incident surface of the transmission plate 2). However, since the laser slit light 47 is transmitted through the half-wave plate 42, the laser slit light 47 is P-polarized light (meaning light whose electric field vector of the light wave is parallel to the incident surface of the transmission plate 2).

投光部4の投光素子40の出力(強度)はレーザ出力制御部330により制御される。特にレーザ出力制御部330は、投光素子40から投光されるレーザスリット光47の投光強度を制御する。上記したレーザスリット光47はP偏光とされている。   The output (intensity) of the light projecting element 40 of the light projecting unit 4 is controlled by the laser output control unit 330. In particular, the laser output control unit 330 controls the light projection intensity of the laser slit light 47 projected from the light projecting element 40. The laser slit light 47 described above is P-polarized light.

透過板2は透明板(厚み:5〜8ミリメートル、材質:フロートガラス)であり、外周25をもつ円板形状とされている。透過板2は投光素子40のレーザスリット光47を透過させることができる。透過板2は、上面である載置面20と、載置面20の背向する背向面22(図3参照)とを備えている。載置面20および背向面22は水平面に沿っており、平坦状をなしている。透過板2の載置面20には被測定物8が着脱可能に載せられる。透過板2は被測定物8よりも投影面積が大きいことが好ましい。載置面20は2次元的な水平面状であるため、粘土等で被測定物8を保持せずとも良く、透過板2の載置面20の適宜の位置に被測定物8を載せれば良い。なお、場合によっては、被測定物8の姿勢の安定性が悪いときには、必要に応じて、粘土等で被測定物8を透過板2の載置面20に保持しても良い。   The transmission plate 2 is a transparent plate (thickness: 5 to 8 millimeters, material: float glass), and has a disk shape with an outer periphery 25. The transmission plate 2 can transmit the laser slit light 47 of the light projecting element 40. The transmission plate 2 includes a mounting surface 20 that is an upper surface and a back surface 22 (see FIG. 3) that faces the mounting surface 20. The mounting surface 20 and the back surface 22 are along a horizontal plane and have a flat shape. An object to be measured 8 is detachably mounted on the mounting surface 20 of the transmission plate 2. The transmission plate 2 preferably has a larger projected area than the object 8 to be measured. Since the mounting surface 20 has a two-dimensional horizontal plane, it is not necessary to hold the object 8 to be measured by clay or the like, and if the object 8 is placed at an appropriate position on the mounting surface 20 of the transmission plate 2. good. In some cases, when the posture of the measurement object 8 is not stable, the measurement object 8 may be held on the mounting surface 20 of the transmission plate 2 with clay or the like as necessary.

図1において、撮像部5は、投光部4の投光素子40から投光されたレーザスリット光47の照射部分の反射光を撮像するものである。撮像部5は、被測定物8に凹凸があったとしても、被測定物8における測定死角を減らすように、投光素子40を挟む位置に配置されたCCD素子で形成された2個の撮像素子、つまり第1撮像素子51および第2撮像素子52を備えている。第1撮像素子51および第2撮像素子52の撮像方向は、透過板2上の被測定物8に向けて指向している。第1撮像素子51および第2撮像素子52の撮像信号はそれぞれ、画像メモリ6の所定のエリアに格納される。前記した投光部4および撮像部5はセンサー9のケース90に一体的に組み込まれており、一体的に同方向に同量移動することができる。センサー9のケース90は投光部4および撮像部5に共用されており、共通ケースとして機能する。   In FIG. 1, the imaging unit 5 captures the reflected light of the irradiated portion of the laser slit light 47 projected from the light projecting element 40 of the light projecting unit 4. The imaging unit 5 has two imaging elements formed by CCD elements arranged at positions sandwiching the light projecting element 40 so as to reduce the measurement blind spot in the measurement object 8 even if the measurement object 8 is uneven. Elements, that is, a first image sensor 51 and a second image sensor 52 are provided. The imaging directions of the first imaging element 51 and the second imaging element 52 are directed toward the object 8 to be measured on the transmission plate 2. The image pickup signals of the first image pickup device 51 and the second image pickup device 52 are stored in predetermined areas of the image memory 6. The light projecting unit 4 and the imaging unit 5 described above are integrally incorporated in the case 90 of the sensor 9 and can be moved by the same amount in the same direction. The case 90 of the sensor 9 is shared by the light projecting unit 4 and the imaging unit 5 and functions as a common case.

図1には、本形状測定装置の座標系におけるX方向、Y方向、Z方向が示されている。Z方向は重力方向とされている。X方向およびY方向は水平2次元方向を示す。第1駆動部7は、透過板2の載置面20上に仮想的に規定される仮想線Mの回りに沿って、センサ−9を相対移動させることにより、センサー9(投光部4および撮像素子)を透過板2および基台1に対して回動させる。   FIG. 1 shows an X direction, a Y direction, and a Z direction in the coordinate system of the shape measuring apparatus. The Z direction is a gravity direction. The X direction and the Y direction indicate a horizontal two-dimensional direction. The first drive unit 7 moves the sensor 9 relative to the sensor 9 (the light projecting unit 4 and the light projecting unit 4) along the virtual line M virtually defined on the placement surface 20 of the transmission plate 2. The imaging device is rotated with respect to the transmission plate 2 and the base 1.

図1に示すように、第1駆動部7は、センサー9を回動させるように基台1に保持された回動機構部70と、回動機構部70に設けられた水平軸芯をもつ横軸形の回動軸71と、中央域である取付域72aが回動軸71に固定された回動盤72と、回動盤72に設けられたセンサー取付部73とを備えている。センサー取付部73にはセンサー9が取り付けられている。これにより、投光部4および撮像部5を備えるセンサー9は、回動盤72の外周側に取り付けられている。回動盤72において、センサー取付部73と反対側にはバランサ74が設けられている。バランサ74は、センサー取付部73による重量のアンバランスを低減させて、回動盤72の回動を円滑にさせるものである。これにより振動ノイズなどのノイズが低減される。   As shown in FIG. 1, the first drive unit 7 has a rotation mechanism unit 70 held on the base 1 so as to rotate the sensor 9 and a horizontal axis provided on the rotation mechanism unit 70. The rotary shaft 71 has a horizontal axis, a rotation plate 72 in which a mounting region 72 a as a central region is fixed to the rotation shaft 71, and a sensor mounting portion 73 provided on the rotation plate 72. The sensor 9 is attached to the sensor attachment portion 73. Accordingly, the sensor 9 including the light projecting unit 4 and the imaging unit 5 is attached to the outer peripheral side of the rotating plate 72. A balancer 74 is provided on the rotating plate 72 on the side opposite to the sensor mounting portion 73. The balancer 74 reduces the unbalance of the weight by the sensor attachment part 73, and makes the rotation of the turntable 72 smooth. As a result, noise such as vibration noise is reduced.

回動機構部70はセンサー回動制御部320により制御される。ここで、回動機構部70が駆動すると、回動軸71がこれの軸芯PBの回りで回動し、センサー9が軸芯PBの回りで回動し、ひいては、センサー9に保持されている投光部4および撮像部5が軸芯PBの回りで回動する。この結果、透過板2の載置面20の仮想線M(横軸型)の回りに沿って投光部4および撮像部5が回動(相対移動)する。このように横軸形の軸芯PBは、センサー9に保持されている投光部4および撮像部5の回動中心となる。軸芯PBの高さ位置は、透過板2の載置面20のやや上方に設定することが好ましい。なお軸芯PBは仮想線Mと平行とされている。   The rotation mechanism unit 70 is controlled by a sensor rotation control unit 320. Here, when the rotation mechanism unit 70 is driven, the rotation shaft 71 rotates around the axis PB, the sensor 9 rotates about the axis PB, and is held by the sensor 9. The light projecting unit 4 and the imaging unit 5 are rotated around the axis PB. As a result, the light projecting unit 4 and the imaging unit 5 rotate (relatively move) along the virtual line M (horizontal axis type) of the placement surface 20 of the transmission plate 2. Thus, the horizontal axis PB serves as a rotation center of the light projecting unit 4 and the imaging unit 5 held by the sensor 9. The height position of the shaft core PB is preferably set slightly above the placement surface 20 of the transmission plate 2. The axis PB is parallel to the imaginary line M.

更に、図1に示すように第2駆動部100が設けられている。第2駆動部100は、透過板2に載せられている被測定物8を投光部4に対して相対移動させ、被測定物8の全域にレーザスリット光47を照射させるものである。第2駆動部100は、被測定物8を透過板2に載せたままX方向、Y方向、Z方向に移動させるXYZ駆動部120と、被測定物8を透過板2に載せたまま、透過板2の載置面20に対して直立する法線MCの回りで少なくとも180度回動させる回動駆動部150とを備えている。   Further, as shown in FIG. 1, a second drive unit 100 is provided. The second driving unit 100 moves the object 8 placed on the transmission plate 2 relative to the light projecting unit 4 and irradiates the entire area of the object 8 with the laser slit light 47. The second drive unit 100 transmits an X-YZ drive unit 120 that moves the measurement object 8 in the X direction, the Y direction, and the Z direction while the measurement object 8 is placed on the transmission plate 2 and transmits the measurement object 8 while the measurement object 8 is placed on the transmission plate 2. A rotation drive unit 150 that rotates at least 180 degrees around a normal MC that stands upright with respect to the mounting surface 20 of the plate 2 is provided.

図1に示すように、回動駆動部150は、被測定物8を透過板2に載せたまま、透過板2の中心域の法線MC(透過板2の載置面20に対して垂直な線)の回りで360度(少なくとも180度)回動させるものである。回動駆動部150は、透過板2を回動可能に保持する透過板保持部3と、透過板保持部3を保持する筐体152と、筐体152に内蔵された回動機構(図示せず)とを備えている。当該回動機構が駆動すると、透過板2が法線MCの回りで回動する。回動駆動部150は被測定物回動制御部300により制御される。以下、更に説明を加える。   As shown in FIG. 1, the rotation drive unit 150 keeps the object 8 to be measured on the transmission plate 2, and the normal MC of the central area of the transmission plate 2 (perpendicular to the mounting surface 20 of the transmission plate 2). ) Around 360 degrees (at least 180 degrees). The rotation driving unit 150 includes a transmission plate holding unit 3 that rotatably holds the transmission plate 2, a case 152 that holds the transmission plate holding unit 3, and a rotation mechanism (not shown) built in the case 152. )). When the rotation mechanism is driven, the transmission plate 2 is rotated around the normal line MC. The rotation drive unit 150 is controlled by the measured object rotation control unit 300. Further explanation will be given below.

図1に示すように、XYZ駆動部120は、被測定物8を透過板2に載せたままZスライダ121をZ方向(重力方向)に移動させるZ方向ガイド部122をもつZ方向駆動部123と、被測定物8を透過板2に載せたままZ方向駆動部123をY方向(被測定物5の幅方向)に移動させるY方向ガイド部124をもつY方向駆動部125と、被測定物8を透過板2に載せたままY方向駆動部125をX方向(被測定物8の長さ方向)に移動させるX方向ガイド部127をもつX方向駆動部128とを備えている。XYZ駆動部120はXYZ制御部310により制御される。XYZ駆動部120が駆動すると、透過板2上の被測定物8はX方向、Y方向、Z方向に適宜移動できる。   As shown in FIG. 1, the XYZ driving unit 120 includes a Z-direction driving unit 123 having a Z-direction guide unit 122 that moves the Z slider 121 in the Z direction (gravity direction) while the DUT 8 is placed on the transmission plate 2. A Y-direction drive unit 125 having a Y-direction guide unit 124 that moves the Z-direction drive unit 123 in the Y direction (width direction of the measurement target 5) while the DUT 8 is placed on the transmission plate 2, and a DUT An X-direction drive unit 128 having an X-direction guide unit 127 that moves the Y-direction drive unit 125 in the X direction (the length direction of the measured object 8) while the object 8 is placed on the transmission plate 2 is provided. The XYZ drive unit 120 is controlled by the XYZ control unit 310. When the XYZ driving unit 120 is driven, the object to be measured 8 on the transmission plate 2 can be appropriately moved in the X direction, the Y direction, and the Z direction.

上記したXYZ制御部310、センサー回動制御部300、画像メモリ6、レーザ出力制御部330、被測定物回動制御部300により出力される信号は、演算部360(制御部)に入力される。センサー回動制御部300および被測定物回動制御部300から出力された信号により、演算部360は、被測定物8の位置を検知できる。この結果、演算部360は、撮像部5で撮像された撮像信号と、被測定物8の位置とを把握する。そして演算部360は、撮像部5で撮像された撮像信号と被測定物8の位置との関係に基づいて、被測定物8の形状データを演算で求める。また演算部360は、XYZ制御部310、センサー回動制御部300、レーザ出力制御部330、被測定物回動制御部300を制御する制御信号をそれぞれ出力する。   Signals output from the XYZ control unit 310, the sensor rotation control unit 300, the image memory 6, the laser output control unit 330, and the measured object rotation control unit 300 are input to the calculation unit 360 (control unit). . Based on the signals output from the sensor rotation control unit 300 and the measured object rotation control unit 300, the calculation unit 360 can detect the position of the measured object 8. As a result, the calculation unit 360 grasps the imaging signal imaged by the imaging unit 5 and the position of the DUT 8. The calculation unit 360 calculates the shape data of the device under test 8 based on the relationship between the image signal captured by the image capturing unit 5 and the position of the device under test 8. The calculation unit 360 outputs control signals for controlling the XYZ control unit 310, the sensor rotation control unit 300, the laser output control unit 330, and the measured object rotation control unit 300, respectively.

第1撮像素子51または第2撮像素子52により得られた撮像データに基づいて三角測量の原理により、演算部360により被測定物8の形状が測定される。ここで、三角測量法は、被測定物8と投光部4と第1撮像素子51との三角形状を利用し、投光部4から投光した光を被測定物8に照射し、その照射部分の位置を別の方向から第1撮像素子51により撮像して測定する測量法である。本実施形態では、被測定物8の面における凹凸が複雑であるため、第1撮像素子51だけであると、被測定物8における撮像の死角が発生するおそれがあるため、第1撮像素子51の他に第2撮像素子52が設けられている。   Based on the imaging data obtained by the first image sensor 51 or the second image sensor 52, the shape of the DUT 8 is measured by the arithmetic unit 360 according to the principle of triangulation. Here, the triangulation method uses the triangular shape of the object to be measured 8, the light projecting unit 4, and the first image sensor 51, and irradiates the light to be measured 8 from the light projecting unit 4. This is a surveying method in which the position of the irradiated portion is imaged and measured by the first image sensor 51 from another direction. In the present embodiment, since the unevenness on the surface of the object to be measured 8 is complicated, if only the first image sensor 51 is used, there is a possibility that a blind spot for image capturing in the object 8 to be measured may occur. In addition, a second image sensor 52 is provided.

三角測量法の基本原理を第1撮像素子51を例にとって説明する。図4において、第1撮像部素子51の観測面と投光部4とを直線的に結ぶ基線をKとする。基線Kの長さLは既知である。基線Kと投光部4のレーザ光とがなす角度をθaとする。被測定物8で反射したレーザ光が観測光学系である第1撮像素子51へ入射する角度(第1撮像素子51へ入射するレーザ光と基線Kとが交わる角度)をωとする。ここで、第1撮像素子51の観測面における座標変化Δxが測定できれば、第1撮像素子51が照射した被測定物8におけるレーザ光の照射位置が決定できる。ここで、基線Kの長さLとレーザ光とのなす角度θa(投光部4から被測定物8への射出角)を固定すれば、被測定物8の面の形状に応じて変化する観測面上における座標変化Δxから被測定物8の面の形状を決定することができる。   The basic principle of the triangulation method will be described by taking the first image sensor 51 as an example. In FIG. 4, a base line that linearly connects the observation surface of the first imaging unit element 51 and the light projecting unit 4 is defined as K. The length L of the base line K is known. An angle formed by the base line K and the laser beam of the light projecting unit 4 is defined as θa. Let ω be the angle at which the laser beam reflected by the DUT 8 is incident on the first image sensor 51 that is the observation optical system (the angle at which the laser beam incident on the first image sensor 51 and the base line K intersect). Here, if the coordinate change Δx on the observation surface of the first image sensor 51 can be measured, the irradiation position of the laser beam on the measurement object 8 irradiated by the first image sensor 51 can be determined. Here, if the angle θa formed by the length L of the base line K and the laser beam (an emission angle from the light projecting unit 4 to the object 8 to be measured) is fixed, the angle changes according to the shape of the surface of the object 8 to be measured. The shape of the surface of the DUT 8 can be determined from the coordinate change Δx on the observation surface.

使用時には、図3に示すように、透過板2の載置面20上に被測定物8を載せる。この状態で、図3に示すように、載置面20上の被測定物8の真上の位置U1にセンサ−9を回動させ、被測定物8の表面8aに投光部4からレーザスリット光47を投光させ、その反射光を第1撮像素子51および第2撮像素子52で撮像する。また、載置面20上の被測定物8の右横方の位置U2にセンサ−9を回動させ、被測定物8の右側面8bに投光部4からレーザスリット光47を投光させ、その反射光を第1撮像素子51および第2撮像素子52で撮像する。更に、図3に示すように、載置面20上の被測定物8の真下の位置U3にセンサ−9を回動させ、被測定物8の裏面8cを第1撮像素子51および第2撮像素子52で撮像する。このように被測定物8の裏面8cを撮像する場合には、被測定物8に投光されるレーザスリット光47は透過板2の背向面22から透過板2をこれの厚み方向に透過する。また、載置面20上の被測定物8の左横方の位置U4にセンサ−9を回動させ、被測定物8の左側面8dを第1撮像素子51および第2撮像素子52で撮像する。   In use, the object to be measured 8 is placed on the placement surface 20 of the transmission plate 2 as shown in FIG. In this state, as shown in FIG. 3, the sensor 9 is rotated to a position U <b> 1 just above the object 8 to be measured on the mounting surface 20, and the laser beam is projected from the light projecting unit 4 to the surface 8 a of the object 8 to be measured. The slit light 47 is projected, and the reflected light is imaged by the first image sensor 51 and the second image sensor 52. Further, the sensor 9 is rotated to a position U2 to the right of the object 8 to be measured on the mounting surface 20, and the laser slit light 47 is projected from the light projecting unit 4 to the right side surface 8b of the object 8 to be measured. The reflected light is imaged by the first image sensor 51 and the second image sensor 52. Further, as shown in FIG. 3, the sensor 9 is rotated to a position U <b> 3 just below the object 8 to be measured on the mounting surface 20, and the back surface 8 c of the object 8 is measured with the first imaging element 51 and the second imaging. An image is picked up by the element 52. Thus, when imaging the back surface 8c of the object 8 to be measured, the laser slit light 47 projected on the object 8 is transmitted from the back surface 22 of the transmission plate 2 through the transmission plate 2 in the thickness direction. To do. Further, the sensor 9 is rotated to a position U4 on the left side of the object 8 to be measured on the placement surface 20, and the first image sensor 51 and the second image sensor 52 image the left side surface 8d of the object 8 to be measured. To do.

本実施形態によれば、上記したように透過板2の被測定物8を撮像部5で撮像するにあたり、レーザスリット光47を透過板2に透過させずに被測定物8を撮像する場合(透過板2に載せられている被測定物8の表面8a、右側面8b、左側面8dを撮像する場合)と、レーザスリット光47を透過板2に透過させて被測定物8を撮像する場合(透過板2に載せられている被測定物8の裏面8cを撮像する場合)とがある。レーザスリット光47が透過板2を透過しない場合と、レーザスリット光47が透過板2をこれの厚み方向に透過する場合とでは、レーザスリット光47の透過形態が一様ではない。このため、撮像部5で撮像した実測値から形状データを求めるにあたり、補正することが好ましい。   According to the present embodiment, as described above, when the object 8 of the transmission plate 2 is imaged by the imaging unit 5, when the object 8 is imaged without transmitting the laser slit light 47 through the transmission plate 2 ( In the case of imaging the surface 8a, the right side surface 8b, and the left side surface 8d of the object 8 to be measured placed on the transmission plate 2) and in the case of imaging the object 8 to be measured by transmitting the laser slit light 47 through the transmission plate 2. (When imaging the back surface 8c of the DUT 8 placed on the transmission plate 2). The transmission form of the laser slit light 47 is not uniform between the case where the laser slit light 47 does not pass through the transmission plate 2 and the case where the laser slit light 47 passes through the transmission plate 2 in the thickness direction thereof. For this reason, it is preferable to correct the shape data from the actual measurement values captured by the imaging unit 5.

図5は画像メモリ6に格納されているマップを示す。図5(A)は、レーザスリット光47が透過板2を透過しない場合において、第1撮像素子51が撮像した撮像データの実測値(α11,α12,α13,α14……α98,α99)から形状データ(A11,A12,A13,A14……)を抽出するマップを示す。更に図5(A)は、第2撮像素子52が撮像した撮像データの実測値(β11,β12,β13,β14……)から形状データ(B11,B12,B13,B14……B98,B99)を抽出するマップを示す。   FIG. 5 shows a map stored in the image memory 6. FIG. 5A shows a shape based on measured values (α11, α12, α13, α14... Α98, α99) of imaging data captured by the first imaging element 51 when the laser slit light 47 does not pass through the transmission plate 2. The map which extracts data (A11, A12, A13, A14 ...) is shown. Further, FIG. 5A shows the shape data (B11, B12, B13, B14... B98, B99) from the actual measurement values (β11, β12, β13, β14...) Of the imaging data captured by the second image sensor 52. Indicates the map to be extracted.

また図5(B)は、レーザスリット光47が透過板2を透過する場合において、第1撮像素子51が撮像した撮像データの実測値(α11,α12,α13,α14……α98,α99)に、補正値(Δα11,Δα12,Δα13を加算して形状データA11,A12,A13,A14……)を抽出するマップを示す。また図5(B)は、第2撮像素子52が撮像した撮像データの実測値(β11,β12,β13,β14……)に、補正値(Δβ11,Δβ12,Δβ13…)を加算して形状データ(B11,B12,B13,B14……)を抽出するマップを示す。なお、上記した実測値と形状データとの関係は、形状および寸法が既知の試料にレーザスリット光を投光し、撮像することにより求められている。また、上記した実測値と補正値と形状データとの関係は、形状および寸法が既知の試料にレーザスリット光を投光し、撮像することにより求められている。   FIG. 5B shows measured values (α11, α12, α13, α14... Α98, α99) of imaged data captured by the first image sensor 51 when the laser slit light 47 is transmitted through the transmission plate 2. , A map for extracting correction values (shape data A11, A12, A13, A14... By adding Δα11, Δα12, Δα13). FIG. 5B shows shape data obtained by adding correction values (Δβ11, Δβ12, Δβ13...) To the actual measurement values (β11, β12, β13, β14...) Of the imaging data captured by the second image sensor 52. The map which extracts (B11, B12, B13, B14 ...) is shown. The relationship between the actual measurement value and the shape data is obtained by projecting a laser slit light onto a sample having a known shape and size and taking an image. Further, the relationship between the actually measured value, the correction value, and the shape data is obtained by projecting a laser slit light onto a sample having a known shape and size and imaging the sample.

上記したマップが設けられているため、レーザスリット光47を透過板2を透過させずに被測定物8を撮像する場合と、レーザスリット光47を透過板2を透過させて被測定物8を撮像する場合とに良好に対応して形状データを求めることができる。   Since the above-described map is provided, when the object to be measured 8 is imaged without transmitting the laser slit light 47 through the transmission plate 2, and the object 8 is measured by transmitting the laser slit light 47 through the transmission plate 2. Shape data can be obtained in good response to the case of imaging.

本実施形態によれば、被測定物8に投光されるレーザスリット光47として、S偏光(光波の電場ベクトルが透過板2の入射面に対して垂直な光を意味する)を使用しても良いし、あるいは、P偏光(光波の電場ベクトルが透過板2の入射面に対して平行な光を意味する)を使用しても良い。但し、P偏光を用いるときには、次のような優れた作用効果が得られる。   According to the present embodiment, as the laser slit light 47 projected on the object 8 to be measured, S-polarized light (meaning light whose electric field vector of the light wave is perpendicular to the incident surface of the transmission plate 2) is used. Alternatively, P-polarized light (which means light whose electric field vector of the light wave is parallel to the incident surface of the transmission plate 2) may be used. However, when using P-polarized light, the following excellent effects can be obtained.

図6はレーザ光を透過板2の載置面20に入射させたときにおいて、入射角θ1と透過板2の載置面20における反射率(R)と透過率(T)との関係をあらわすグラフを示す(n1=1.0、n2=1.5)。n1は空気の屈折率、載置面20を構成するガラスの屈折率を意味する。図7に示すように、入射角θ1は、透過板2の載置面20の法線とレーザ光との角度として定義される。図6において横軸は入射角θ1を示し、縦軸は反射率(R)および透過率(T)を示す。図6に示すように、反射率については、入射角θ1が小さいときにはP偏光の反射率およびS偏光の反射率共に大差はないが、入射角θ1が増加するとき、S偏光の反射率よりもP偏光の反射率は低くなる。また図6に示すように、透過率については、入射角θ1が小さいときにはP偏光の透過率およびS偏光の透過率共に大差はないが、入射角θ1が増加するとき、S偏光の透過率よりもP偏光の透過率は高くなる。図6に示す特性を考慮すると、入射角θ1としては81度以下、殊に65度以下が好ましい。   FIG. 6 shows the relationship between the incident angle θ1 and the reflectance (R) and the transmittance (T) at the placement surface 20 of the transmission plate 2 when laser light is incident on the placement surface 20 of the transmission plate 2. A graph is shown (n1 = 1.0, n2 = 1.5). n1 means the refractive index of air and the refractive index of the glass constituting the mounting surface 20. As shown in FIG. 7, the incident angle θ <b> 1 is defined as the angle between the normal line of the mounting surface 20 of the transmission plate 2 and the laser beam. In FIG. 6, the horizontal axis represents the incident angle θ1, and the vertical axis represents the reflectance (R) and the transmittance (T). As shown in FIG. 6, regarding the reflectance, when the incident angle θ1 is small, there is no large difference between the reflectance of P-polarized light and the reflectance of S-polarized light, but when the incident angle θ1 increases, the reflectance is higher than the reflectance of S-polarized light. The reflectance of P-polarized light is low. Further, as shown in FIG. 6, the transmittance does not differ greatly between the transmittance of P-polarized light and the transmittance of S-polarized light when the incident angle θ1 is small, but from the transmittance of S-polarized light when the incident angle θ1 increases. Also, the transmittance of P-polarized light is increased. Considering the characteristics shown in FIG. 6, the incident angle θ1 is preferably 81 degrees or less, particularly 65 degrees or less.

図6に示す結果を考慮すると、レーザスリット光47としてS偏光が用いられていると、透過板2の載置面20に入射されるレーザスリット光47の入射角θ1が増加する場合には、透過板2の載置面20における反射率が高くなり、反射率に起因するノイズが増加されるおそれがある。ここで、透過板2の載置面20上の被測定物8の表面、右側面、裏面、左側面を撮像するとき、投光部4の投光素子40から透過板2の載置面20に入射されるレーザスリット光47の入射角θ1が増加する傾向にある。この場合、入射角θ1が増加する場合には、入射角θ1の増加に起因するノイズが発生しやすいおそれがある。   In consideration of the result shown in FIG. 6, when S-polarized light is used as the laser slit light 47, when the incident angle θ <b> 1 of the laser slit light 47 incident on the mounting surface 20 of the transmission plate 2 increases, The reflectance on the mounting surface 20 of the transmissive plate 2 is increased, and noise due to the reflectance may be increased. Here, when imaging the front surface, the right side surface, the back surface, and the left side surface of the measurement object 8 on the mounting surface 20 of the transmission plate 2, the mounting surface 20 of the transmission plate 2 from the light projecting element 40 of the light projecting unit 4. The incident angle θ1 of the laser slit light 47 incident on the light tends to increase. In this case, when the incident angle θ1 increases, noise due to the increase in the incident angle θ1 may easily occur.

この点について本実施形態によれば、上記した図6に示す特性を考慮して、レーザスリット光47としてP偏光を被測定物8に投光させることにしている。この結果、透過板2の載置面20に入射されるレーザスリット光47の入射角θ1が増加する場合であっても、即ち、透過板2の載置面20上の被測定物8に対して、被測定物8の横方からレーザスリット光47を入射させる場合であっても、反射率の増加が抑えられる。故に、反射率の増加に起因するノイズが低減され、被測定物8の形状を測定する測定精度を向上させることができる。なお本実施形態によれば、被測定物8に投光されるレーザスリット光47をP偏光とするにあたり、図2に示すように、1/2波長板42が投光部4に付加されている。   In this regard, according to the present embodiment, in consideration of the characteristics shown in FIG. 6 described above, the P-polarized light is projected onto the object 8 as the laser slit light 47. As a result, even when the incident angle θ1 of the laser slit light 47 incident on the mounting surface 20 of the transmission plate 2 increases, that is, with respect to the object 8 to be measured on the mounting surface 20 of the transmission plate 2. Thus, even when the laser slit light 47 is incident from the side of the object 8 to be measured, an increase in reflectance is suppressed. Therefore, noise due to an increase in reflectance is reduced, and the measurement accuracy for measuring the shape of the DUT 8 can be improved. According to the present embodiment, when the laser slit light 47 projected on the object 8 to be measured is P-polarized light, the half-wave plate 42 is added to the light projecting unit 4 as shown in FIG. Yes.

あるいは、レーザスリット光47をP偏光とするにあたり、上記した1/2波長板42に限らず、レーザスリット光47の偏光方向をスリット長手方向としてシリンドリカルレンズ41で広げてレーザスリット光47を生成させることにより、レーザスリット光47をS偏光からP偏光に変えることにしても良い。   Alternatively, when the laser slit light 47 is changed to P-polarized light, the laser slit light 47 is generated by spreading the laser slit light 47 with the cylindrical lens 41 with the polarization direction of the laser slit light 47 as the slit longitudinal direction. Accordingly, the laser slit light 47 may be changed from S-polarized light to P-polarized light.

以上説明したように本実施形態によれば、透過板2の載置面20に被測定物8を載せて摩擦力で透過板2上に保持することにしている。更に、透過板2の載置面20上に載置面20に沿って規定される仮想的な仮想線Mの回りに投光部4および撮像部5を回動させることにしている。このため透過板2の載置面20に載せられている被測定物8の表面8a(被測定物8のうち透過板2の載置面20に背向している面)、被測定物8の右側面8bおよび左側面8dばかりか、被測定物8の裏面8c(被測定物8のうち透過板2の載置面20に直接対面している面)までも撮像することができる。その理由としては、第1に、透明な透過板2にレーザスリット光47が透過できるため、第2に、投光部4および撮像部5を備えるセンサ−9が透過板2に対して相対移動可能であるためである。この結果、被測定物8の全域またはほぼ全域の形状を測定することができる。   As described above, according to the present embodiment, the DUT 8 is placed on the mounting surface 20 of the transmission plate 2 and is held on the transmission plate 2 by frictional force. Further, the light projecting unit 4 and the imaging unit 5 are rotated around a virtual imaginary line M defined along the mounting surface 20 on the mounting surface 20 of the transmission plate 2. Therefore, the surface 8a of the measurement object 8 placed on the placement surface 20 of the transmission plate 2 (the surface of the measurement object 8 facing away from the placement surface 20 of the transmission plate 2), the measurement object 8 In addition to the right side surface 8b and the left side surface 8d, the back surface 8c of the object to be measured 8 (the surface of the object to be measured 8 directly facing the mounting surface 20 of the transmission plate 2) can be imaged. The reason is that, firstly, the laser slit light 47 can be transmitted through the transparent transmission plate 2, and secondly, the sensor 9 including the light projecting unit 4 and the imaging unit 5 moves relative to the transmission plate 2. This is because it is possible. As a result, the shape of the entire area of the object to be measured 8 or almost the entire area can be measured.

更に本実施形態によれば、透過板2の載置面20は2次元的に広がっている平坦状である。このため、粘土で被測定物8を透過板2の載置面20に保持せずとも、被測定物8の姿勢を透過板2の載置面20に安定的に保持することができる。但し、場合によっては、被測定物8の形状がかなり異形であり、被測定物8の姿勢維持が困難であるときには、少量の粘土であれば用いても良い。粘土は撮像されるおそれがあるが、粘土の有無を理解できれば、別段の支障がない。更に本実施形態によれば、被測定物8のサイズがセンサー9の測定範囲よりも大きい場合には、透過板2上の被測定物8をXYZ駆動部120により適宜移動させれば、被測定物8の全域またはほぼ全域の形状を測定することができる。   Furthermore, according to this embodiment, the mounting surface 20 of the transmission plate 2 is a flat shape spreading two-dimensionally. For this reason, the posture of the measurement object 8 can be stably held on the placement surface 20 of the transmission plate 2 without holding the measurement target 8 on the placement surface 20 of the transmission plate 2 with clay. However, in some cases, when the shape of the object 8 to be measured is considerably irregular and it is difficult to maintain the posture of the object 8 to be measured, a small amount of clay may be used. Although there is a possibility that the image of the clay is taken, if there is an understanding of the presence or absence of the clay, there is no problem. Furthermore, according to this embodiment, when the size of the measurement object 8 is larger than the measurement range of the sensor 9, the measurement object 8 on the transmission plate 2 can be appropriately moved by the XYZ driving unit 120 to be measured. The shape of the entire area of the object 8 or almost the entire area can be measured.

(実施形態2)
次に、本発明の実施形態2について図8〜図11を参照して説明する。図8〜図10は本実施形態に係る形状測定装置の使用状態の概念を示す。本実施形態は実施形態1と基本的に同様の構成を有するため、構成説明は省略する。同一機能を有する部位には同一の符号を付する。但し、回動盤72は腕状とされている。センサー9を取り付けるセンサー取付部73はL字形状をなしている。センサー取付部73は図8(A)に示されているが、他の図では省略されている。
(Embodiment 2)
Next, Embodiment 2 of the present invention will be described with reference to FIGS. 8 to 10 show the concept of the usage state of the shape measuring apparatus according to the present embodiment. Since this embodiment has basically the same configuration as that of the first embodiment, description of the configuration is omitted. Parts having the same function are denoted by the same reference numerals. However, the turntable 72 has an arm shape. The sensor attachment portion 73 for attaching the sensor 9 has an L shape. The sensor mounting portion 73 is shown in FIG. 8A, but is omitted in other drawings.

以下、本実施形態の形状測定装置の使用方法にについて説明を加える。   Hereinafter, description is added about the usage method of the shape measuring apparatus of this embodiment.

(1)被測定物8の表面8a(上面)の測定
図8(A)に示すように、被測定物8を透過板2の載置面20のほぼ中央付近に載せる。センサー9(投光部4および撮像部5)は、透過板2の載置面20と平行になるように、透過板2の載置面20上の被測定物8の真上に配置されている。本例では、センサー9が透過板2の真上にある状態を、センサー9の回動位相は0度とする。この状態では、図8(A)に示すように、センサー9に保持されている投光部4、撮像部5は被測定物8の真上に配置されている。この場合、図8(A)に示すように、上方から下方向に向かうにつれて、センサー9→被測定物8→透過板2の順に配置されている。
(1) Measurement of the surface 8a (upper surface) of the object 8 to be measured As shown in FIG. 8A, the object 8 to be measured is placed near the center of the mounting surface 20 of the transmission plate 2. The sensor 9 (the light projecting unit 4 and the imaging unit 5) is disposed directly above the object 8 to be measured on the mounting surface 20 of the transmission plate 2 so as to be parallel to the mounting surface 20 of the transmission plate 2. Yes. In this example, when the sensor 9 is directly above the transmission plate 2, the rotation phase of the sensor 9 is 0 degree. In this state, as shown in FIG. 8A, the light projecting unit 4 and the imaging unit 5 held by the sensor 9 are arranged directly above the object to be measured 8. In this case, as shown in FIG. 8A, the sensor 9 → the object to be measured 8 → the transmission plate 2 are arranged in this order from the top to the bottom.

投光部4の投光素子40からレーザスリット光47を、透過板2上の被測定物8に向けて投光する。被測定物8の表面8aから反射された反射光をセンサー9の第1撮像素子51および第2撮像素子52で撮像する。得られた撮像データから演算部360は形状データを求める。なおX方向駆動部128を駆動させることにより、透過板2上の被測定物8をX方向(被測定物8の長手方向)に沿って所定のピッチで移動させながら、被測定物8の形状を測定し、被測定物8の表面8aの形状データとする。   Laser slit light 47 is projected from the light projecting element 40 of the light projecting unit 4 toward the object 8 to be measured on the transmission plate 2. The reflected light reflected from the surface 8 a of the object to be measured 8 is imaged by the first image sensor 51 and the second image sensor 52 of the sensor 9. The calculation unit 360 obtains shape data from the obtained imaging data. By driving the X-direction drive unit 128, the shape of the object 8 to be measured is moved while moving the object 8 to be measured on the transmission plate 2 along the X direction (longitudinal direction of the object 8). Is measured and used as the shape data of the surface 8a of the object 8 to be measured.

(2)被測定物8の右側面8bの測定
次に図8(B)に示すように、矢印S方向(回動方向)にセンサー9を90度回動させて被測定物8の横方に配置させ、センサー9の回動位相を90度とする。この状態では、センサー9に保持されている投光部4、撮像部5は被測定物8の右側面8b側(右横方)に配置されている。投光部4の投光素子40からレーザスリット光47を、透過板2上の被測定物8に向けて投光する。被測定物8の右側面8bから反射された反射光をセンサー9の第1撮像素子51および第2撮像素子52で撮像する。得られた撮像データから演算部360は形状データを求める。なおX方向駆動部128を駆動させることにより、被測定物8をX方向(被測定物8の長手方向)に所定のピッチで移動させながら、被測定物8の断面形状を測定し、被測定物8の右側面8bの形状データとする。
(2) Measurement of the right side surface 8b of the object 8 to be measured Next, as shown in FIG. 8B, the sensor 9 is rotated 90 degrees in the arrow S direction (rotation direction), and the side of the object 8 to be measured is And the rotation phase of the sensor 9 is 90 degrees. In this state, the light projecting unit 4 and the imaging unit 5 held by the sensor 9 are disposed on the right side 8b side (right side) of the object 8 to be measured. Laser slit light 47 is projected from the light projecting element 40 of the light projecting unit 4 toward the object 8 to be measured on the transmission plate 2. The reflected light reflected from the right side surface 8 b of the DUT 8 is imaged by the first image sensor 51 and the second image sensor 52 of the sensor 9. The calculation unit 360 obtains shape data from the obtained imaging data. In addition, by driving the X-direction drive unit 128, the cross-sectional shape of the measurement object 8 is measured while moving the measurement object 8 in the X direction (longitudinal direction of the measurement object 8) at a predetermined pitch, and the measurement object is measured. The shape data of the right side surface 8b of the object 8 is used.

(3)被測定物8の裏面8cの測定
次に図9(A)に示すように、矢印S方向(回動方向)にセンサー9を更に90度回動させて被測定物8、透過板2の真下に配置させ、センサー9の回動位相を180度とする。この状態では、センサー9に保持されている投光部4、撮像部5は、透過板2を介して、被測定物8の真下に配置されている。この場合、図9(A)に示すように、上方から下方向に向かうにつれて、被測定物8→透過板2→センサー9の順に配置されている。
(3) Measurement of Back Surface 8c of Measured Object 8 Next, as shown in FIG. 9A, the sensor 9 is further rotated 90 degrees in the arrow S direction (rotation direction) to measure the measured object 8 and the transmission plate. The rotation phase of the sensor 9 is 180 degrees. In this state, the light projecting unit 4 and the imaging unit 5 held by the sensor 9 are disposed directly below the object 8 to be measured via the transmission plate 2. In this case, as shown in FIG. 9A, the measurement object 8 → the transmission plate 2 → the sensor 9 are arranged in this order from the top to the bottom.

図9(A)に示すように、投光部4の投光素子40からレーザスリット光47を、透過板2上の被測定物8に向けて、つまり上方に向けて投光する。この場合、レーザスリット光47は透過板2を透過して被測定物8に裏面8cに到達する。被測定物8の裏面8cで反射された反射光をセンサー9の撮像部5で撮像する。得られた撮像データから演算部360は形状データを求める。なおX方向駆動部128を駆動させることにより、被測定物8をX方向(被測定物8の長手方向)に所定のピッチで移動させながら、被測定物8の断面形状を測定し、被測定物8の裏面8cの形状データとする。   As shown in FIG. 9A, the laser slit light 47 is projected from the light projecting element 40 of the light projecting unit 4 toward the object 8 to be measured on the transmission plate 2, that is, upward. In this case, the laser slit light 47 passes through the transmission plate 2 and reaches the measured object 8 to the back surface 8c. The reflected light reflected by the back surface 8 c of the object to be measured 8 is imaged by the imaging unit 5 of the sensor 9. The calculation unit 360 obtains shape data from the obtained imaging data. In addition, by driving the X-direction drive unit 128, the cross-sectional shape of the measurement object 8 is measured while moving the measurement object 8 in the X direction (longitudinal direction of the measurement object 8) at a predetermined pitch, and the measurement object is measured. The shape data of the back surface 8c of the object 8 is used.

(4)被測定物8の左側面8dの測定
次に図9(B)に示すように、矢印S方向(回動方向)にセンサー9を更に90度回動させて被測定物8の左側面8d側(左側方)に配置させ、センサー9の回動位相を270度とする。この状態では、センサー9に保持されている投光部4、撮像素子51,52は被測定物8の左横方に配置されている。
(4) Measurement of the left side surface 8d of the measurement object 8 Next, as shown in FIG. 9B, the sensor 9 is further rotated 90 degrees in the arrow S direction (rotation direction) to the left side of the measurement object 8. It arrange | positions at the surface 8d side (left side), and makes the rotation phase of the sensor 9 be 270 degree | times. In this state, the light projecting unit 4 and the image sensors 51 and 52 held by the sensor 9 are arranged on the left side of the object 8 to be measured.

投光部4の投光素子40からレーザスリット光47を、透過板2上の被測定物8に向けて投光する。被測定物8の左側面で反射された反射光をセンサー9の撮像部5で撮像する。得られた撮像データから演算部360は形状データを求める。なお、X方向駆動部128を駆動させることにより、被測定物8をX方向(被測定物8の長手方向)に所定のピッチで移動させながら、被測定物8の断面形状を測定し、被測定物8の左側面8dの形状データとする。   Laser slit light 47 is projected from the light projecting element 40 of the light projecting unit 4 toward the object 8 to be measured on the transmission plate 2. The reflected light reflected by the left side surface of the measurement object 8 is imaged by the imaging unit 5 of the sensor 9. The calculation unit 360 obtains shape data from the obtained imaging data. In addition, by driving the X-direction drive unit 128, the cross-sectional shape of the DUT 8 is measured while moving the DUT 8 in the X direction (longitudinal direction of the DUT 8) at a predetermined pitch. The shape data of the left side surface 8d of the measurement object 8 is used.

(5)被測定物8の上面8e(被測定物8の長手方向の一端側)の測定
次に図10(A)に示すように、センサー9を一度、回転位相0度に戻し、矢印S方向(回動方向)にセンサー9を90度回動させて被測定物8の右方に配置させ、センサー9の回動位相を90度とする。更に、矢印E1方向に透過板2および被測定物8を90度回動させて被測定物8の上面8e(被測定物8の長手方向の一端側)をセンサー9に対面させる。そして、投光部4の投光素子40からレーザスリット光47を、透過板2上の被測定物8に向けて投光する。被測定物8の上面8eから反射された反射光をセンサー9の撮像素子51,52で撮像する。得られた撮像データから演算部360は形状データを求める。なお、X方向駆動部128を駆動させることにより、被測定物8をX方向(被測定物8の長手方向)に所定のピッチで移動させながら、被測定物8の断面形状を測定し、被測定物8の上面8eの形状データとすることができる。
(5) Measurement of the upper surface 8e of the measurement object 8 (one end side in the longitudinal direction of the measurement object 8) Next, as shown in FIG. The sensor 9 is rotated 90 degrees in the direction (rotation direction) and arranged to the right of the object 8 to be measured, and the rotation phase of the sensor 9 is set to 90 degrees. Further, the transmission plate 2 and the device under test 8 are rotated 90 degrees in the direction of the arrow E1 so that the upper surface 8e of the device under test 8 (one end side in the longitudinal direction of the device under test 8) faces the sensor 9. Then, the laser slit light 47 is projected from the light projecting element 40 of the light projecting unit 4 toward the object 8 to be measured on the transmission plate 2. The reflected light reflected from the upper surface 8 e of the object to be measured 8 is imaged by the imaging elements 51 and 52 of the sensor 9. The calculation unit 360 obtains shape data from the obtained imaging data. In addition, by driving the X-direction drive unit 128, the cross-sectional shape of the DUT 8 is measured while moving the DUT 8 in the X direction (longitudinal direction of the DUT 8) at a predetermined pitch. The shape data of the upper surface 8e of the measurement object 8 can be used.

(6)被測定物8の下面8f(被測定物8の長手方向の他端側)の測定
次に図10(B)に示すように、矢印S方向(回動方向)にセンサー9を更に180度回動させて被測定物8の右方に配置させ、センサー9の回動位相を270度とする。これにより被測定物8の長手方向の他端側、つまり、被測定物8の下面8fをセンサー9に対面させる。そして、投光部4の投光素子40からレーザスリット光47を、透過板2上の被測定物8の下面8fに向けて投光する。被測定物8の裏面から反射された反射光をセンサー9の第1撮像素子51および第2撮像素子52で撮像する。得られた撮像データから演算部360は形状データを測定する。なお、X方向駆動部128を駆動させることにより、被測定物8をX方向(被測定物8の長手方向)に所定のピッチで移動させながら、被測定物8の断面形状を測定し、被測定物8の下面8fの形状データとすることができる。
(6) Measurement of the lower surface 8f of the device under test 8 (the other end in the longitudinal direction of the device under test 8) Next, as shown in FIG. 10 (B), the sensor 9 is further moved in the arrow S direction (rotation direction). The sensor 9 is rotated 180 degrees and arranged on the right side of the object 8 to be measured, and the rotation phase of the sensor 9 is set to 270 degrees. As a result, the other end side in the longitudinal direction of the DUT 8, that is, the lower surface 8 f of the DUT 8 is made to face the sensor 9. Then, the laser slit light 47 is projected from the light projecting element 40 of the light projecting unit 4 toward the lower surface 8 f of the object 8 to be measured on the transmission plate 2. The reflected light reflected from the back surface of the device under test 8 is imaged by the first image sensor 51 and the second image sensor 52 of the sensor 9. The calculation unit 360 measures shape data from the obtained imaging data. In addition, by driving the X-direction drive unit 128, the cross-sectional shape of the DUT 8 is measured while moving the DUT 8 in the X direction (longitudinal direction of the DUT 8) at a predetermined pitch. The shape data of the lower surface 8f of the measurement object 8 can be used.

以上説明したように本実施形態においても、透過板2の載置面20に被測定物8を載せて摩擦で透過板2上に保持することにしている。このため透過板2の載置面20に載せられている被測定物8の全域またはほぼ全域の形状を測定することができる。透過板2の載置面20は2次元的に広がっているため、粘土で被測定物8を透過板2の載置面20に保持せずとも、被測定物8の姿勢を透過板2の載置面20に安定的に保持することができる。但し、場合によっては、被測定物8の形状がかなり異形であり、被測定物8の姿勢維持が困難であるときには、少量の粘土であれば用いても良い。粘土は撮像されるおそれがあるが、粘土の有無を理解できれば、別段の支障がない。   As described above, also in this embodiment, the measurement object 8 is placed on the placement surface 20 of the transmission plate 2 and is held on the transmission plate 2 by friction. For this reason, it is possible to measure the shape of the entire area of the object to be measured 8 placed on the placement surface 20 of the transmission plate 2 or almost the whole area. Since the mounting surface 20 of the transmission plate 2 spreads two-dimensionally, the posture of the measurement target 8 can be changed to that of the transmission plate 2 without holding the measurement target 8 on the mounting surface 20 of the transmission plate 2 with clay. It can be stably held on the mounting surface 20. However, in some cases, when the shape of the object 8 to be measured is considerably irregular and it is difficult to maintain the posture of the object 8 to be measured, a small amount of clay may be used. Although there is a possibility that the image of the clay is taken, if there is an understanding of the presence or absence of the clay, there is no problem.

更に本実施形態によれば、被測定物8のサイズがセンサー9の測定範囲よりも大きい場合には、透過板2上の被測定物8をXYZ駆動部120により適宜移動させれば、被測定物8の全域またはほぼ全域の形状を測定することができる。   Furthermore, according to this embodiment, when the size of the measurement object 8 is larger than the measurement range of the sensor 9, the measurement object 8 on the transmission plate 2 can be appropriately moved by the XYZ driving unit 120 to be measured. The shape of the entire area of the object 8 or almost the entire area can be measured.

(実施形態3)
実施形態3は実施形態1,2と基本的には共通の構成および共通の作用効果を有する。従って、図1、図3〜図10を準用できる。但し、レーザスリット光47としてS偏光を被測定物8に投光させることにしている。
(Embodiment 3)
The third embodiment basically has the same configuration and the same function and effect as the first and second embodiments. Therefore, FIGS. 1 and 3 to 10 can be applied mutatis mutandis. However, S-polarized light is projected onto the object 8 as the laser slit light 47.

(その他)
上記した実施形態1,2では、投光部4は、1/2波長板42を備えており、P偏光を形成しているが、1/4波長板を2枚直列に配置しても良い。上記した実施形態1,2では、被測定物8の上面8eおよび下面8fの形状を測定するにあたり、透過板2上の被測定物8を基台1に対して相対移動させることにしているが、これに限らず、透過板2上の被測定物8を固定したままとしておき、センサー9を被測定物8の回りで回動させることにより、被測定物8の上面8eおよび下面8fの形状を測定することにしても良い。被測定物8の表面8a、右側面8b、裏面8c、左側面8d等についての撮像順序としては、特に限定されない。被測定物8としては、石器に限られるものではなく、石器以外の遺物でも良く、貝殻、石等の自然物、車両や産業機器に搭載される部品(例えばボルト、ナット、ワッシャを含む)、石器等の遺物などが例示される。被測定物8の材質としては特に限定されず、金属、セラミックス、樹脂、木材、天然鉱物が例示される。
(Other)
In the first and second embodiments described above, the light projecting unit 4 includes the half-wave plate 42 and forms P-polarized light. However, two quarter-wave plates may be arranged in series. . In the first and second embodiments described above, the measurement object 8 on the transmission plate 2 is moved relative to the base 1 in measuring the shapes of the upper surface 8e and the lower surface 8f of the measurement object 8. The shape of the upper surface 8e and the lower surface 8f of the measured object 8 is not limited to this, and the measured object 8 on the transmission plate 2 is fixed and the sensor 9 is rotated around the measured object 8. May be measured. The imaging order of the front surface 8a, the right side surface 8b, the back surface 8c, the left side surface 8d, etc. of the device under test 8 is not particularly limited. The object to be measured 8 is not limited to stone tools, but may be relics other than stone tools, natural objects such as shells and stones, parts mounted on vehicles and industrial equipment (including bolts, nuts, washers, etc.), stone tools Examples of such relics. It does not specifically limit as a material of the to-be-measured object 8, A metal, ceramics, resin, wood, a natural mineral is illustrated.

上記した記載から次の技術的思想も把握できる。
[付記項1]被撮像物を載せる載置面および前記載置面に背向する背向面をもちレーザ光を透過可能な透過部材を保持する透過部材保持部と、前記透過部材に載せられている前記被撮像物にレーザ光を投光する投光部と、前記投光部から前記被撮像物に投光された前記レーザ光の照射部分の反射光を撮像する撮像部と、前記撮像部で撮像された撮像データを格納する撮像データ格納部と、前記透過部材の前記載置面および前記背向面に前記投光部および前記撮像部が対向するように、前記透過部材の前記載置面上の仮想線の回りに沿って前記投光部を回動させ、回動に伴い前記被撮像物に対して前記投光部と前記撮像部を相対移動させる第1駆動部を具備することを特徴とする形状撮像装置。透過部材の載置面に沿った仮想線の回りに沿って投光部と撮像部を回動させ、回動に伴い被測定物に対して投光部と撮像部を相対移動させる。このため被測定物の形状の大きな面積(例えば全体またたはほぼ全体)を撮像するのに有利となる。
[付記項2]付記項1において、前記透過部材に載せられている前記被撮像物を前記投光部に対して相対移動させる第2駆動部が設けられていることを特徴とする形状撮像装置。
The following technical idea can also be grasped from the above description.
[Additional Item 1] A transmissive member holding portion for holding a transmissive member that has a placement surface on which an object to be imaged is placed and a back surface that faces away from the placement surface, and is capable of transmitting laser light, and the transmissive member. A light projecting unit that projects laser light onto the object to be imaged, an image capturing unit that captures reflected light of a portion irradiated with the laser light projected from the light projecting unit onto the imaged object, and the imaging An imaging data storage unit that stores imaging data captured by the imaging unit, and the above description of the transmission member such that the light projecting unit and the imaging unit face the placement surface and the back surface of the transmission member. A first driving unit configured to rotate the light projecting unit along a virtual line on the placement surface and move the light projecting unit and the image capturing unit relative to the object to be imaged with the rotation; A shape imaging apparatus. The light projecting unit and the imaging unit are rotated along an imaginary line along the mounting surface of the transmission member, and the light projecting unit and the imaging unit are moved relative to the object to be measured along with the rotation. This is advantageous for imaging a large area (for example, the whole or almost the whole) of the shape of the object to be measured.
[Additional Item 2] The shape imaging apparatus according to Additional Item 1, further comprising a second drive unit that moves the object to be imaged mounted on the transmission member relative to the light projecting unit. .

本発明は石器、貝殻等の遺物(発掘品)、車両部品、産業部品等の被測定物(被撮像物)の形状を撮像する形状測定装置が挙げられる。   Examples of the present invention include a shape measuring device that images the shape of an object to be measured (an object to be imaged) such as a relic such as a stone tool or a shell (excavated article), a vehicle part, or an industrial part.

実施形態1に係り、形状測定装置の概念を模式的に示す構成図である。1 is a configuration diagram schematically showing a concept of a shape measuring apparatus according to Embodiment 1. FIG. 実施形態1に係り、投光部を模式的に示す構成図である。FIG. 3 is a configuration diagram schematically illustrating a light projecting unit according to the first embodiment. 実施形態1に係り、使用形態を模式的に示す構成図である。FIG. 4 is a configuration diagram schematically showing a usage pattern according to the first embodiment. 三角測量法の原理を示す図である。It is a figure which shows the principle of a triangulation method. 実施形態1に係り、実測値と補正値とが画像メモリのエリアに格納されているマップを示す図である。FIG. 4 is a diagram illustrating a map in which measured values and correction values are stored in an area of an image memory according to the first embodiment. レーザ光を透過板の載置面に入射させたときにおいて、入射角θ1と透過板の載置面における反射率(R)と透過率(T)との関係をあらわすグラフである。It is a graph showing the relationship between the incident angle θ1 and the reflectance (R) and the transmittance (T) on the mounting surface of the transmission plate when laser light is incident on the mounting surface of the transmission plate. 入射角θ1の定義を示す構成図である。It is a block diagram which shows the definition of incident angle (theta) 1. FIG. 実施形態2に係り、(A)は形状測定装置で被測定物の表面を測定している状態を模式的に示す構成図であり、(B)は形状測定装置で被測定物の右側面を測定している状態を模式的に示す構成図である。FIG. 9A is a configuration diagram schematically illustrating a state in which the surface of the object to be measured is measured by the shape measuring device according to the second embodiment, and FIG. It is a block diagram which shows the state currently measured typically. 実施形態2に係り、(A)は形状測定装置で被測定物の裏面を測定している状態を模式的に示す構成図であり、(B)は形状測定装置で被測定物の左側面を測定している状態を模式的に示す構成図である。FIG. 5A is a configuration diagram schematically showing a state in which the back surface of the object to be measured is measured by the shape measuring device according to the second embodiment, and (B) is a diagram illustrating the left side surface of the object to be measured by the shape measuring device. It is a block diagram which shows the state currently measured typically. 実施形態2に係り、(A)は形状測定装置で被測定物の上面を測定している状態を模式的に示す構成図であり、(B)は形状測定装置で被測定物の下面を測定している状態を模式的に示す構成図である。FIG. 9A is a configuration diagram schematically illustrating a state in which the upper surface of the object to be measured is measured by the shape measuring device according to the second embodiment, and FIG. 9B is a diagram illustrating the lower surface of the object to be measured by the shape measuring device. It is a block diagram which shows typically the state which is carrying out. 実施形態2に係り、被測定物として石器の表面、右側面、左側面、裏面、上面および下面を撮像した図である。FIG. 6 is a diagram according to the second embodiment, in which the surface, the right side, the left side, the back, the top, and the bottom of a stone tool are imaged as the measurement object.

符号の説明Explanation of symbols

1は基台、2は透過板(透過部材)、20は載置面、22は背向面、3は透過板保持部(透過部材保持部)、4は投光部、40は投光素子、41はシリンドリカルレンズ、42は1/2波長板、5は撮像部、6は画像メモリ(撮像データ格納部)、7は第1駆動部、8は被測定物、9はセンサー、100は第2駆動部、120はXYZ駆動部、150は回動駆動部を示す。   1 is a base, 2 is a transmission plate (transmission member), 20 is a placement surface, 22 is a back surface, 3 is a transmission plate holding portion (transmission member holding portion), 4 is a light projecting portion, and 40 is a light projecting element. , 41 is a cylindrical lens, 42 is a half-wave plate, 5 is an imaging unit, 6 is an image memory (imaging data storage unit), 7 is a first drive unit, 8 is an object to be measured, 9 is a sensor, and 100 is a first sensor. Reference numeral 2 denotes a drive unit, 120 denotes an XYZ drive unit, and 150 denotes a rotation drive unit.

Claims (5)

被測定物を載せる載置面および前記載置面に背向する背向面をもちレーザ光を透過可能な透過部材を保持する透過部材保持部と、
前記透過部材に載せられている前記被測定物にレーザ光を投光する投光部と、
前記投光部から前記被測定物に投光された前記レーザ光の照射部分の反射光を撮像する撮像部と、
前記撮像部で撮像された撮像データを格納する撮像データ格納部と、
前記撮像データ格納部の前記撮像データに基づいて前記被測定物の形状を求める演算部と、
前記透過部材の前記載置面および前記背向面に前記投光部および前記撮像部が対向するように、前記透過部材の前記載置面上の仮想線の回りに沿って前記投光部を回動させ、回動に伴い前記被測定物に対して前記投光部と前記撮像部を相対移動させる第1駆動部とを具備することを特徴とする形状測定装置。
A transmissive member holding portion for holding a transmissive member having a placement surface on which the object to be measured is placed and a back surface facing away from the placement surface, and capable of transmitting laser light;
A light projecting unit that projects laser light onto the object to be measured placed on the transmission member;
An imaging unit that images reflected light of the irradiated portion of the laser light projected from the light projecting unit to the object to be measured;
An imaging data storage unit for storing imaging data captured by the imaging unit;
A calculation unit for obtaining the shape of the object to be measured based on the imaging data in the imaging data storage unit;
The light projecting unit is arranged along an imaginary line on the mounting surface of the transmitting member so that the light projecting unit and the imaging unit face the mounting surface and the back surface of the transmitting member. A shape measuring apparatus comprising: a first drive unit that is rotated and moves the light projecting unit and the imaging unit relative to the object to be measured along with the rotation.
請求項1において、前記透過部材に載せられている前記被測定物を前記投光部に対して相対移動させる第2駆動部が設けられていることを特徴とする形状測定装置。   The shape measuring apparatus according to claim 1, further comprising a second driving unit that moves the measurement object placed on the transmission member relative to the light projecting unit. 請求項1または2において、X方向およびY方向を水平2次元方向とし、Z方向を高さ方向とするとき、前記第2駆動部は、前記被測定物を前記透過部材の前記載置面に載せたままX方向、Y方向、Z方向に移動させるXYZ駆動部と、前記被測定物を前記透過部材に載せたまま、X方向およびY方向で規定される面に沿って少なくとも180度回動させる回動駆動部とを備えていることを特徴とする形状測定装置。   In Claim 1 or 2, when the X direction and the Y direction are horizontal two-dimensional directions and the Z direction is the height direction, the second drive unit places the measured object on the mounting surface of the transmission member. XYZ driving unit that moves in the X direction, Y direction, and Z direction while being mounted, and rotates at least 180 degrees along a plane defined by the X direction and the Y direction while the object to be measured is mounted on the transmission member A shape measuring device comprising: a rotation driving unit for causing the shape measuring device. 請求項1〜3のうちの一項において、前記投光部が前記被測定部に投光する前記レーザ光は、P偏光またはS偏光であることを特徴とする形状測定装置。   4. The shape measuring apparatus according to claim 1, wherein the laser beam projected from the light projecting unit to the measured unit is P-polarized light or S-polarized light. 請求項1〜4のうちの一項において、前記投光部から投光される前記レーザ光が前記透過部材の前記載置面または前記背向面に斜め方向から入射する位置になるように、前記投光部は前記透過部材に対して回動することを特徴とする形状測定装置。   In any one of Claims 1-4, so that the said laser beam projected from the said light projection part may be in the position which injects into the said mounting surface or the said back surface of the said transmissive member from an oblique direction, The shape measuring device, wherein the light projecting portion rotates with respect to the transmitting member.
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CN107478163A (en) * 2017-08-01 2017-12-15 兰州兰石集团有限公司 Corrugated cardboard sheet quality detection device based on rotary mode

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