JP2008151954A - Display device manufacturing method and display device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To easily and reliably detect a positional deviation between a terminal and a probe. <P>SOLUTION: A method of manufacturing a display device includes steps for manufacture, electric contact, contact judgement and inspection. In the step for manufacture, the breadth in the arrangement direction of a first terminal 13(1) and an N-th terminal 13(N) which position on both ends of terminal arrangement is formed in at least one pitch P of the terminal arrangement of remaining (N-2) pieces, and inner wire connection is performed so as to have at most a predetermined resistance value which permits the first terminal 13(1) and N-th terminal 13(N) to be regarded as the same potential. In the step for contact judgement, the resistance value is measured between the first probe 2(1) corresponding to the first terminal 13(1) and the N-th probe 2(N) corresponding to the N-th terminal 13(N) and it is determined whether proper probing is performed based on the measurement result or not. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a method for manufacturing a display device having a plurality of N terminals arranged in one direction apart from each other, and the display device.

  Generally, a display device (hereinafter referred to as a display panel) such as an LCD (liquid crystal display) or an organic LED display has an effective pixel region in which a large number of pixels for displaying each dot are regularly arranged in a two-dimensional plane. . Each pixel in the effective pixel region has a pixel circuit including an active element (such as a transistor) and a passive element (such as a capacitor). The pixel circuits are respectively determined for a plurality of pixels arranged in a row direction called “horizontal direction” or a plurality of pixels arranged in a column direction called “vertical direction”. They are connected to each other by a common line. In general, the common line in the row direction is called a “scan line”, and the common line in the column direction is called a “data line (or signal line or source line)”.

  Each pixel constituting the effective display area of the display panel is displayed with timing and luminance based on the video signal supplied from the data line driving circuit by the data line and the scanning signal supplied from the scanning line driving circuit by the scanning line. I do. Therefore, if the data line or scanning line has a defect such as an open or short circuit, all pixels connected to the defective data line or scanning line become display defects.

  Drive circuits such as the data line drive circuit and the scan line drive circuit may be formed in a peripheral region of the effective pixel region in the display panel. However, in this case, since the thin film transistor is used as the active element, the circuit performance variation is large.

For the improvement of circuit performance and other reasons, a display device is known in which a drive circuit is provided as an IC separately from a display panel, and both are connected by an FPC (Flexible Printed Circuit (or Cable)) or the like.
The display panel is provided with a plurality of terminals electrically connected to the plurality of scanning lines, the plurality of data lines, and the other voltage supply lines.
The plurality of terminals are arranged at an equal pitch and an equal width on one side of the display panel having a quadrangular shape or on the edge of the display panel along each side of the plurality of sides. Here, the terminal width is the terminal size in the arrangement direction.

  Thus, in the form in which the display panel and the driving IC (and also the control IC) are connected by FPC or the like and assembled, in order to prevent waste of materials due to assembling defective parts, the relevant part is not in the stage before assembling. It is necessary to check the quality of parts. Especially for display panels, if the data lines or scanning lines have defects such as open or short, the entire display panel will be treated as defective, and the display panel is expensive as a part. An inspection to light up is performed.

  In recent years, display panels have been increased in size and definition in television receiver applications, but on the other hand, small display panels have also been increasing in definition. For example, a display panel mounted on a mobile phone or other portable electronic device has an increased number of pixels in an effective display area with respect to size. Therefore, in the terminal group arranged on one side of the rectangular display panel, the narrowing of the pitch and the reduction of the terminal width are more advanced than before.

Therefore, for example, in an LCD, it is known to previously form an inspection circuit for detecting a defect and a plurality of terminals for inputting / outputting inspection signals to / from the inspection circuit on a driving substrate on which a pixel circuit is formed (for example, (See Patent Documents 1, 2, and 3).
In the inspection using the inspection circuit, before attaching the counter substrate to the driving substrate, a probe is set up at the inspection signal input / output terminal to inspect the open or short of the data line or the scanning line. At this time, since the probe has a certain thickness, there is a limit to the arrangement pitch of the probe, and if the terminal pitch is smaller than the arrangement pitch of the probe, the inspection is difficult. As described in Patent Document 3, for example, one terminal is provided for every six pixels, and as a test circuit, a pixel range to be inspected by the terminal is limited by a control line and a switch, and the range is sequentially switched. Possible configurations are known. Further, Patent Document 2 discloses a terminal arrangement and an inspection method in which a probe is moved in contact with a plurality of terminal portions having different lengths (shapes) every other position and inspected.

Japanese Patent Laying-Open No. 2003-271067 (see FIG. 2) Japanese Patent Laid-Open No. 11-295755 (see FIGS. 2 and 4) Japanese Patent Laying-Open No. 2006-162701 (see FIG. 4)

In the method described in the background art that provides the inspection circuit, the area penalty due to the inspection circuit is large, and the cost of the display panel increases.
Therefore, there are cases where it is desired to reduce the cost of the display panel by enabling inspection without providing an inspection circuit as much as possible. The terminal pitch required for recent small display panels is extremely small, from several tens [μm] to several tens [mm], and it is necessary to use a probe that can be arranged at a pitch corresponding to the terminal pitch. Further, when the probes cannot be arranged at a pitch corresponding to the terminal pitch, it is necessary to devise the arrangement of the terminals and probes, such as shifting the probe in position as described in Patent Document 2.

In either case, the terminal pitch is extremely small, and the probe tip is likely to be misaligned with respect to the terminal in the operation of performing contact (probing) between the terminal and the probe. Also, this positional deviation is difficult to confirm visually. For this reason, in order to perform probing with high accuracy, a method such as an enlarged display or enlarged photographing of the contact state of the probe with respect to each terminal with a camera or the like is required.
In the case of a configuration that is enlarged by a camera or the like, the entire apparatus becomes large and expensive, and the influence on the manufacturing cost of the display panel by using an expensive apparatus cannot be ignored. Further, if the position shift is determined by the image processing, it is possible to save time and labor for the operator to look at the display and confirm the presence or absence of the position shift, but the apparatus becomes more expensive.

  A problem to be solved by the present invention is to provide a display device manufacturing method including a contact determination step capable of easily and surely detecting a positional deviation between a terminal and a probe, and a display device having a configuration capable of the detection. That is.

  A first method for manufacturing a display device according to the present invention is a method for manufacturing a display device having a plurality of N terminals spaced apart from each other and arranged in one direction, and is a first device located at both ends of the terminal array. The width in the arrangement direction of the terminal and the Nth terminal is formed to be one pitch or more of the remaining (N−2) terminal arrangements, and the first terminal and the Nth terminal have a predetermined potential corresponding to the same potential. A manufacturing step of manufacturing the display device by internal connection so as to be equal to or less than a resistance value of N, N probes arranged in one direction at a pitch corresponding to the pitch of the (N-2) terminal array, and the N An electrical contact step for making electrical contact with a plurality of terminals, and between the first probe corresponding to the first terminal and the Nth probe corresponding to the Nth terminal when the electrical contact is made. Measure the first resistance with the measured value of the first resistance. And Zui includes the N number of probes, the N number of contact determination step whether a touch position displacement relative to the terminal, an inspection step for inspecting the display device, the.

  A second method for manufacturing a display device according to the present invention is a method for manufacturing a display device having a plurality of N terminals spaced apart from each other and arranged in one direction, wherein the first device is located at both ends of the terminal array. Two dummy terminals having the pitch and width of the remaining (N−2) terminal arrays are formed adjacent to the terminal and the Nth terminal, respectively, and the first terminal and the one dummy terminal are the same. Internal connection is made so that the resistance value is equal to or less than a predetermined resistance value corresponding to the potential, and internal connection is made so that the Nth terminal and the other dummy terminal are equal to or less than a predetermined resistance value corresponding to the same potential. A manufacturing step for manufacturing the display device by internal connection so as to be equal to or less than a predetermined resistance value corresponding to the same potential, N probes arranged in one direction at a pitch corresponding to the pitch of the terminal array, and the N probes Electricity that makes electrical contact with the terminals When the contact step and the electrical contact are performed, a first resistance is measured between the first probe corresponding to the first terminal and the N-th probe corresponding to the N-th terminal, and the first resistance A contact determination step for determining whether or not the N probes are in contact with the N terminals based on the measured values, and an inspection step for inspecting the display device.

  A third manufacturing method of a display device according to the present invention has a plurality of N terminals spaced apart from each other and arranged in one direction, and an odd-numbered terminal group and an even-numbered terminal group include a probe A method of manufacturing a display device in which contact portions are formed in different patterns with different levels, wherein the odd-numbered terminal group or the even-numbered terminal group is positioned at both ends in the arrangement of one terminal group. The width in the arrangement direction of the two terminals is formed to be greater than or equal to the terminal pitch of the remaining (N−2) terminal arrangements plus half the difference between the odd and odd terminal widths, and A manufacturing step for manufacturing the display device in which two terminals are connected so as to be equal to or less than a predetermined resistance value corresponding to the same potential, and the N probes arranged in one direction at the same pitch as the terminal pitch. Electricity that makes electrical contact with other terminals When the electrical contact step and the electrical contact are performed, the inter-probe resistance is measured with the first probe corresponding to the first terminal and the N-th probe corresponding to the N-th terminal, and the measurement is performed. When the inter-probe resistance is less than or equal to the predetermined resistance value, a contact confirmation step for determining that the N probes are correctly in contact with the N terminals, and contact confirmation of the N probes were obtained. An inspection step of inspecting the display device in a state.

  In the first to third manufacturing methods, the width of the two terminals at both ends and the substantial width expansion by the dummy terminals are performed so that the pitch shift can be detected by the resistance change of the terminals at both ends in the manufacturing step. Then, the quality of the electrical contact step is determined in the next contact determination step. At this time, the resistance between the terminals at both ends (the first terminal and the Nth terminal) is measured, and it is determined whether the probe contact is correctly performed based on the measured value. If the probe contact is correct, the next inspection step is performed. If the probe contact is not correct, the electrical contact is performed again.

  A first display device according to the present invention includes a display unit and a plurality of N terminals connected to a wiring connected to the display unit and arranged in one direction so as to be separated from each other. The width in the arrangement direction of the first terminal and the Nth terminal located at both ends of the arrangement is formed to be one pitch or more of the remaining (N−2) terminal arrangements, and the first terminal and the Nth terminal The terminal is internally connected so as to have a predetermined resistance value or less corresponding to the same potential.

  The second display device according to the present invention includes a display unit, a plurality of N terminals connected to the display unit and connected to the display unit, arranged in one direction apart from each other, and both ends of the terminal array. Two dummy terminals having a pitch and width of the remaining (N−2) terminal arrangements, which are adjacent to the first terminal and the Nth terminal, respectively, and one dummy with the first terminal The display unit is internally connected so that the terminal is equal to or less than a predetermined resistance value corresponding to the same potential, and the Nth terminal and the other dummy terminal are equal to or smaller than a predetermined resistance value corresponding to the same potential. The internal terminals are internally connected, and the dummy terminals are also internally connected in the display section so as to be equal to or lower than a predetermined resistance value corresponding to the same potential.

  A third display device according to the present invention includes a display unit and a plurality of N terminals connected to a wiring connected to the display unit and arranged in one direction apart from each other, The N terminals are formed with different patterns in which the odd-numbered terminal group and the even-numbered terminal group have different probe contact portions, and among the odd-numbered terminal group or the even-numbered terminal group, The width in the arrangement direction of the two terminals located at both ends in the arrangement of one terminal group is half the difference between the odd and odd terminal widths in the terminal pitch of the remaining (N−2) terminal arrangements. The two terminals are internally connected in the display section so that the two terminals have a predetermined resistance value or less equivalent to the same potential.

  According to the present invention, it is possible to easily and reliably detect the positional deviation between the terminal and the probe.

  Embodiments of the present invention will be described below with reference to the drawings.

<< First Embodiment >>
FIG. 1 shows a schematic diagram of an inspection system according to an embodiment of the present invention.
The illustrated inspection system 1 is for inspecting a display device such as an LCD (hereinafter referred to as a display panel).

A display panel 10 as a “device to be inspected” in FIG. 1 is a liquid crystal display panel. The liquid crystal display panel displays image or character information by changing the alignment state of the liquid crystal in units of pixels in the display surface. The liquid crystal display panel has a rectangular display portion in which liquid crystal is sealed inside and pixels are formed in a matrix. In the display portion, a counter substrate is superimposed on a part of a drive substrate that applies an electric field to liquid crystal, and the liquid crystal is sealed between the two substrates. At this time, a spacer is fixed to the drive substrate in advance with a sealant so that a gap is formed between the drive substrate and the peripheral edge of the counter substrate, and the sealant is applied to the counter substrate side. Then, after the two substrates are bonded to each other with the spacer interposed therebetween, the sealing agent is cured by light or heat. Thereafter, liquid crystal is sealed in a space in the display portion formed by the spacer and the two substrates.
The display panel 10 shown in FIG. 1 shows a state in which a counter substrate 12 is overlaid on a drive substrate 11 that is slightly larger (larger on one side in the figure).

2A is a top view of the display panel 10, and FIGS. 2B1 and 2B2 are partially enlarged views of FIG. 2A.
The display panel 10 has an effective image display area 10 </ b> A in an overlapping portion between the drive substrate 11 and the counter substrate 12. Although not particularly shown on the side of the driving substrate 11 in the effective image display area 10A, the data lines having the same number as the horizontal pixel number Fh and the Fh data lines, which are repeatedly formed in one direction at a predetermined interval, are orthogonal to each other. In addition, the same number of scanning lines as the number of vertical pixels Fv, which are repeatedly formed at predetermined intervals in the other direction, are formed. In the effective image display area 10A, one of the minute areas divided into the data lines and the scanning lines corresponds to one pixel.

The drive substrate 11 has a band-like region protruding by a certain width from the edge of one side (one long side in this example) of the counter substrate 12. The belt-like region of the drive substrate 11 is a plurality of N terminals 13 (1), 13 (2) along the long side of the drive substrate 11 as shown in a partially enlarged manner in FIGS. 2 (B1) and (B2). ), 13 (3),..., 13 (N-2), 13 (N-1), 13 (N) are arranged, and these terminal groups are exposed on the surface.
Each of the terminals 13 (1) to 13 (N) is electrically connected to any one of Fh data lines, Fv scanning lines, and a power supply line of the power supply voltage Vdd or the ground potential GND. It is connected. Therefore, the number N of the terminals 13 (1) to 13 (N) is N = Fh + Fv + α (α: the number of power supply lines or the like).

The inspection system 1 shown in FIG. 1 has N probes 2 (1) to 2 (N) arranged in a direction perpendicular to the paper surface. The N probes 2 (1) to 2 (N) correspond to the N terminals 13 (1) to 13 (N) on a one-to-one basis. In FIG. 1, N probes are indicated by “probe 2”.
Hereinafter, the probe at one end is referred to as a first probe 2 (1), the adjacent probe is referred to as a second probe 2 (2), and the adjacent probe is referred to as a third probe 2 (3). Similarly, the fourth and subsequent probes are defined, the third probe from the end is the (N-2) probe 2 (N-2), the second probe from the end is the (N-1) probe 2 (N- 1) The last probe is referred to as the Nth probe 2 (N).
Further, as shown in FIG. 2 (B1) and FIG. 2 (B2), the terminals corresponding to the first probe 2 (1) correspond to the first terminal 13 (1) and the second probe 2 (2). The terminal corresponding to the third probe 2 (3) is referred to as the second terminal 13 (2), and the terminal corresponding to the third probe 2 (3) is referred to as the third terminal 13 (3). Similarly, the fourth and subsequent terminals are defined, the third terminal from the last is the (N-2) th terminal 13 (N-2), and the second terminal from the last is the (N-1) th terminal 13 (N- 1) The last terminal is referred to as the Nth terminal 13 (N).

As shown in FIG. 1, the inspection system 1 includes a control drive unit 4. The control drive unit 4 applies a bias (power supply voltage or the like) in a predetermined order to a predetermined probe among the probes 2 (1) to 2 (N) in contact with the terminals 13 (1) to 13 (N). In addition, it has a tester function for performing an open or short check when the pixel circuit is operated. A tester portion in the control drive unit 4 is connected to the probe 2 by a cable 3. The tester has functions such as a constant current source, a constant voltage source, an ammeter, and a voltmeter. For example, the test is executed in a predetermined sequence by controlling them according to a program.
Although details will be described later, this sequence also includes a contact determination procedure that electrically detects and determines whether or not the probe contact is correctly performed before the test.

  In addition to the tester, the control drive unit 4 has a function of controlling or driving an electrical or mechanical part of the entire inspection system 1. The mechanical part of the system is not particularly shown, but in order to perform mechanical alignment of the display panel 10, for example, movement of a stage and movement of a probe header that aligns the probe 2 with respect to the display panel 10. This corresponds to the arm and the drive unit for performing the above.

As shown in FIG. 2 (B1) and FIG. 2 (B2), the terminals of this embodiment are arranged in the arrangement direction of the first terminal 13 (1) and the Nth terminal 13 (N) located at both ends of the terminal arrangement. The width is formed to be one pitch or more of the remaining (N-2) terminal arrangements. Here, (N-2) terminals from the second terminal 13 (2) to the (N-1) th terminal 13 (N-1) excluding the first terminal 13 (1) and the Nth terminal 13 (N). When one pitch of the arrangement is “P”, each of the width W1 of the first terminal 13 (1) and the width Wn of the Nth terminal 13 (N) is formed larger than the pitch P.
The first terminal 13 (1) and the Nth terminal 13 (N) having a large width are internally connected within a region where the driving substrate 11 and the counter substrate 12 shown in FIG. 2A overlap (FIG. 4A). reference). For this reason, the first terminal 13 (1) and the Nth terminal 13 (N) exhibit an inter-terminal resistance that is small enough to be regarded as equivalent to the same potential at the time of the contact determination and is equal to or less than a predetermined resistance value Rs. Although details will be described later, in this embodiment, the quality of the probe contact (presence / absence of positional deviation) is determined using the predetermined resistance value Rs as one reference.

FIG. 3 is a flowchart showing the manufacturing procedure of the display panel 10 according to the present embodiment.
The “panel manufacturing” shown in step ST1 is a normal LCD panel manufacturing procedure, and a detailed description thereof is omitted here. However, in this manufacturing, as shown in FIG. 2, the first terminal 13 (1) and the Nth terminal 13 (N) are the other (N-2) second terminals 13 (2) to (N-1). ) The inter-terminal resistance of the first terminal 13 (1) and the Nth terminal 13 (N) when the contact resistance is ignored, which is formed larger than the pitch P of the terminal 13 (N-1), that is, the first probe 2 A manufacturing pattern or manufacturing process that conforms to the condition that the internal connection in the panel is made so that the inter-probe resistance between the (1) and the Nth probe 2 (N) is equal to or less than the above-described resistance value Rs is used. It is done.
More preferably, the resistance value of the first terminal 13 (1) and the second terminal 13 (2), and the (N-1) th terminal 13 (N-1) and the Nth terminal 13 (N) Is sufficiently larger than the resistance value Rs.

  In step ST2, the probes 2 (1) to 2 (N) are brought into contact (probing) with the terminals 13 (1) to 13 (N). In step ST3, it is determined whether or not the contact is correctly performed.

The internal connection 14 in the panel is shown in the plan view of FIG.
The internal connection 14 does not indicate an actual wiring, but merely indicates electrically and symbolically that it is equivalent to the same potential. That is, the first terminal 13 (1) and the Nth terminal 13 (N) may be directly connected, but each potential is held at least indirectly corresponding to the same potential even if not directly connected. There should be a relationship. For example, the wiring to which the same signal or voltage is applied may be connected to the first terminal 13 (1) and the Nth terminal 13 (N), respectively.

FIG. 4B shows a case where there is no probe contact deviation, and FIG. 4C shows a case where the deviation exists.
As defined in FIG. 2 (B1) and FIG. 2 (B2), the pitch of (N-2) second terminals 13 (2) to (N-1) terminals 13 (N-1) other than both ends. Is “P” and the width in the arrangement direction is “W”. At this time, when the amount of deviation is gradually increased from zero and the amount of deviation reaches “P−W + W / 2 = P−W / 2”, as shown in FIG. Most of) to 2 (N) come out of the terminal that should be contacted and contact the adjacent terminal. However, the first probe 2 (1) or the Nth probe 2 (N) (Nth probe 2 (N) in the illustrated example) that is uniquely determined by the direction of displacement is the first terminal 13 (1) or the Nth terminal 13 Since the width of (N) is formed at the pitch P, it remains in contact with the same terminal as in the normal state without any deviation, and the probe (the Nth terminal 13 (N) in the illustrated example) has two probes. That is, the (N-1) th probe 2 (N-1) and the Nth probe 2 (N) are in contact with each other at the same time.

  In the contact determination (step ST3) shown in FIG. 3, first, a probe between the first probe 2 (1) and the Nth probe 2 (N) is used to electrically detect the presence or absence of such a shift. Measure the inter-resistance. The measurement result of the resistance between the probes at both ends is referred to as “first resistance”.

  If the first resistance R1 is larger than the predetermined resistance value Rs corresponding to the internal connection 14 in FIG. 4A (R1> Rs), there is “deviation”, and if R1 ≦ Rs, “no deviation”. I can judge. That is, in the case of FIG. 4C, the N-th probe 2 (N) is in contact with the original N-th terminal 13 (N) in the case of “no deviation”, but the first probe 2 (1) is “ Unlike the original first terminal 13 (1) in the case of “no deviation”, it is in contact with the adjacent second terminal 13 (2). Therefore, the first resistance R1 between the first probe 2 (1) and the Nth probe 2 (N) shows a value sufficiently larger than the resistance value Rs (R1> Rs). Can be determined. On the other hand, if R1 ≦ Rs, the first probe 2 (1) is in contact with the first terminal 13 (1), and the Nth probe 2 (N) is considered to be in contact with the Nth terminal 13 (N). Therefore, “no deviation” can be determined.

  In addition, it is adjacent between the first probe 2 (1) and the second probe 2 (2) or between the (N-1) th probe 2 (N-1) and the Nth probe 2 (N). The direction of deviation can be determined by the value of the resistance between probes (two second resistances), which value of the second resistance is so small that it represents the same potential. In the illustrated example, the second resistance R2n between the (N-1) th probe 2 (N-1) and the Nth probe 2 (N) shows a small value corresponding to the same potential. Therefore, it can be seen that there is a deviation in the direction in which the Nth probe 2 (N) moves to the outside of the terminal array.

If the amount of deviation becomes larger than that in FIG. 4C, it can be judged from the value of the first resistor R1 that the deviation has occurred, but the (N-1) -th probe 2 (N-1) and the N-th probe 2 ( Since N) does not correspond to the same potential, the direction of deviation cannot be determined. Therefore, when the widths of the first terminal 13 (1) and the Nth terminal 13 (N) are 1 pitch P, the range of deviation direction determination is extremely narrow.
Therefore, even when the state further shifts by W from the state shown in FIG. 4C, the (N-1) -th probe 2 (N-1) and the N-th probe 2 (N) are in contact with the same N-th terminal 13 (N). It is desirable. Beyond that, the probability of actual deviation is extremely small, and the contact terminal is different from that in FIG. 4C, so the value of the second resistance changes.
As described above, in the present embodiment, the width of the first terminal 13 (1) and the Nth terminal 13 (N) is set to “1P or more, and the width W in the same arrangement direction is equal to (N−2) terminals in the 1P. It is desirable to set it to “below the added value”. However, the upper limit of this width can be made larger.

  In step ST3 shown in FIG. 3, the contact determination is performed by the above method. As a result, when the correspondence between the probe and the terminal is deviated from the original, the deviation amount is determined based on the detected deviation direction. The probe position or the display panel position is adjusted in a direction to decrease the contact, contact is made again (step ST2), and this position adjustment, contact, and contact determination are repeated until a correct contact is obtained in the contact determination (step ST3).

  When the “contact OK” determination is made in the contact determination, the non-defective product and the defective product are classified in the next step ST4, and the processing flow ends.

According to this embodiment, it is possible to electrically detect the deviation of the N probes with respect to the N terminals and determine whether the deviation is acceptable.
At this time, if the deviation amount is “PW / 2” or more, a signal (or a power supply) different from the original is applied to the terminal by executing the test, and there is a possibility that the panel is damaged or the apparatus is damaged. There is. When there is such a deviation, since the terminal width at both ends is expanded to be equal to or larger than the pitch P of the terminal arrangement, two probes on one side are connected to the same terminal. Therefore, it is possible to confirm whether or not a contact displacement of “P−W / 2” or more has occurred by confirming a short circuit in this portion (the second resistance R2 is equal to or less than the resistance corresponding to the same potential). .

<< Second Embodiment >>
FIG. 5A shows a top view of the display panel 10A according to this embodiment, and FIGS. 5B1 and 5B2 are partially enlarged views of FIG. 5A.
In the present embodiment, the terminals 13 (1) to 13 (N) formed on the drive substrate 11A have the same width W, and the dummy terminal 13d1 is disposed outside the first terminal 13 (1). Another dummy terminal 13d2 is arranged outside the Nth terminal 13 (N). The dummy terminals 13d1, 13d2 have the same pitch P as the N terminals 13 (1) to 13 (N) with respect to the adjacent first terminal 13 (1) or Nth terminal 13 (N). Yes. The widths of the dummy terminals 13d1 and 13d2 are also set to be the same as the width W of the other terminals.
The dummy terminal 13d1 and the first terminal 13 (1) are connected by an internal connection 15 (1), and the dummy terminal 13d2 and the Nth terminal 13 (N) are connected by an internal connection 15 (2). The meanings of the internal connections 15 (1) and 15 (2) are the same as those of the internal connection 14 shown in FIG. 4 (A), and include both cases where they are directly connected and indirectly regarded as equivalent to the same potential. .

6A to 6D show the (N-1) th terminal 13 (N-1), the Nth terminal 13 (N), and the Nth terminal 13 when the deviation amount is gradually increased from "no deviation". It is a schematic diagram of the dummy terminal 13d2. In this figure, the vertex positions of the first probe 2 (1), the (N-1) th probe 2 (N-1) and the Nth probe 2 (N) are indicated by arrows.
FIG. 6A shows the case where the amount of deviation is zero, and FIG. 6B shows the case where the amount of deviation is small. Up to FIG. 6B, the contact relationship between the terminal and the probe is normal and allowed. On the other hand, in FIG. 6D, since the probe contacts a terminal different from the original terminal, such a shift is not acceptable because there is a risk of damage to the panel due to the execution of the test, and it must be detected. I must. Although the deviation shown in FIG. 6C cannot be tolerated, there is no risk of panel damage even if the test is executed in this state.

  6C and 6D, the first resistance R1 between the first probe 2 (1) and the Nth probe 2 (N) is in an open state that is larger than the resistance value Rs. For the first time in FIG. 6D, the second resistance R2 between two adjacent probes, that is, the (N-1) th probe 2 (N-1) and the Nth probe 2 (N) is sufficiently small corresponding to the same potential. Value. Therefore, by observing the first resistor R1 and the second resistor R2, as in the first embodiment, the state of FIG. 6D that is surely prevented can be determined, and the direction of the deviation is also the first. It can be determined according to which end of the terminal array the change of the two-resistance R2.

As described above, similarly to the first embodiment, it is possible to electrically detect the deviation of the N probes with respect to the N terminals and determine whether the deviation is acceptable.
At this time, if the deviation amount is “PW / 2” or more, a signal (or a power supply) different from the original is applied to the terminal by executing the test, and there is a possibility that the panel is damaged or the apparatus is damaged. There is. In the case where there is such a deviation, a total of two dummy terminals are provided on both ends of each of the N terminals, and the terminals adjacent to the dummy terminals are held at the same potential. Are connected on terminals of the same potential. Therefore, it is possible to confirm whether or not a contact displacement of “P−W / 2” or more has occurred by confirming a short circuit in this portion (the second resistance R2 is equal to or less than the resistance corresponding to the same potential). .

<< Third Embodiment >>
This embodiment shows an application example of the present invention in the case where probes are alternately arranged in the same manner as in Patent Document 2.
FIG. 7A shows a case where the displacement amount is zero, and FIG. 7B shows a case where the contact relationship between the terminal and the probe is not correct. If it shifts to FIG. 7B, the risk of damaging the display panel due to the execution of the test is increased as in FIG. 6D in the second embodiment, so that FIG. 7B is effectively detected. Must.

The terminals at both ends of FIG. 7 can be regarded as the first terminal 13 (1) and the Nth terminal 13 (N) as in the first embodiment, and the second is that the adjacent terminals have the same potential. It can also be regarded as a dummy terminal in the embodiment. Here, the first terminal 13 (1) and the Nth terminal 13 (N) are considered, and their widths are slightly increased.
The other second terminals 13 (2) to (N-1) th terminal 13 (N-1) have a large width W1 and a small width W2 when viewed along the line AA in FIG. Two types of patterns are alternately arranged.
The first terminal 13 (1) and the second terminal 13 (2) are connected by an internal connection 15 (1), and the (N-1) th terminal 13 (N-1) and the Nth terminal 13 (N) are They are connected by internal connection 15 (2). The meanings of the internal connections 15 (1) and 15 (2) are the same as those of the internal connection 14 shown in FIG. 4 (A), and include both cases where they are directly connected and indirectly regarded as equivalent to the same potential. .

FIG. 8 is an enlarged view for calculating the shift amount S in FIG. FIG. 9 is an enlarged view showing the limit of the contact of the (N-1) -th probe 2 (N-1) with the correct terminal, which does not deviate from that shown in FIG. 7B.
The displacement amount S in the case of FIG. 7B is that the tip of the (N-2) probe 2 (N-2) corresponding to the (N-2) terminal 13 (N-2) having the large width W1 is first. (N-1) Since this is the amount of displacement when it is displaced until it is located at the edge of the terminal 13 (N-1), S = P−W2 / 2 as shown in FIG.
On the other hand, the minimum width W3 of the Nth terminal 13 (N) for the tip of the Nth probe 2 (N) separated by 2P to contact the Nth terminal 13 (N) at this time is as shown in FIG. P + (W1-W2) / 2.
On the other hand, in the case of FIG. 9 where the shift amount is not large until FIG. 7B, the shift amount S ′ is half of the large width W1 of the terminal (S ′ = W1 / 2). If a deviation larger than this deviation amount S ′ occurs, at least a correct test cannot be performed, and such a deviation is not allowed.

Because of the above configuration, for example, the following method is used to electrically detect the deviation of the N probes with respect to the N terminals in the same manner as in the first and second embodiments. Judgment is possible.
First, resistance is measured between the (N-1) th probe 2 (N-1) and the Nth probe 2 (N) in order to determine whether or not the shift amount is larger than the above S '(FIG. 9). . If the resistance at this time is larger than the resistance value corresponding to the same potential, it is detected that the (N-1) probe 2 (N-1) is not in contact with the (N-1) terminal 13 (N-1). can do.

Next, in order to determine whether or not the deviation amount is large until the above S (FIG. 8), the difference between the (N-2) probe 2 (N-2) and the Nth probe 2 (N). Measure resistance. If the resistance at this time is less than or equal to the same potential, the (N-1) probe 2 (N-1) is not the (N-2) terminal 13 (N-2) to be contacted, but the adjacent It is possible to detect contact with the (N-1) th terminal 13 (N-1). This is because the (N-1) th terminal 13 (N-1) and the Nth terminal 13 (N) are connected by an internal connection 15 (2), and the resistance between the terminals is equivalent to the same potential.
At this time, as shown in FIG. 8, the deviation amount is “P−W2 / 2” or more, and if a signal (or power supply) different from the original is applied to the terminal by the execution of the test, the panel damage or device Damage may occur.

  In the present embodiment, the width of the terminals at both ends of the N terminals is expanded (or two dummy terminals are provided on each of the both ends), and the terminals adjacent to the terminals at the both ends (the dummy terminals) are By maintaining the same potential, the two probes on one side are connected on the same potential terminal. Therefore, by confirming that the resistance between the first and second probes counted from the outside is larger than the resistance corresponding to the same potential, it is confirmed whether or not the contact deviation of “W1 / 2” or more has occurred. Further, by confirming whether the resistance between the first and third probes from the outside is equal to or less than the same potential, it is possible to confirm whether or not a contact shift of “P−W2 / 2” or more has occurred.

  As described above, in this embodiment, even if dummy terminals are provided or not provided, the width of the terminals at both ends is increased, and by simply connecting the outside and the outside terminals at each of both ends, a correct test can be performed. If this is not possible, the contact displacement of the probe can be easily detected when there is a possibility of panel damage.

In the above first to third embodiments, the resistance corresponding to the same potential is used as a reference. However, if the variation in contact resistance is taken into consideration, the determination criterion is between the resistance value corresponding to the same potential and the resistance value corresponding to the open. It is desirable to provide.
In the above three embodiments, an LCD display panel is assumed. However, for example, an organic LED panel may be used. In addition, various modifications can be made without departing from the scope of the present invention.
In addition, when a shift that damages the display panel is detected, the test itself can be prohibited so that the test is not erroneously executed.

It is a mimetic diagram of an inspection system concerning an embodiment of the present invention. (A) is a top view of the display panel according to the first embodiment, and (B1) and (B2) are partially enlarged views of (A). It is a flowchart which shows the manufacture procedure of the display panel in connection with embodiment. (A) is a figure which shows the internal connection of the display panel in connection with 1st Embodiment, (B) and (C) are figures which show the contact relationship of a probe and a terminal. (A) is a top view of a display panel according to the second embodiment, and (B1) and (B2) are partially enlarged views of (A). (A)-(D) are figures which show the contact relationship of a probe and a terminal in 2nd Embodiment. (A) And (B) is a figure which shows the terminal arrangement | positioning and internal connection of the display panel of 3rd Embodiment. It is an enlarged view of three terminals at one end of the terminal array. It is another enlarged view of three terminals at one end of the terminal array.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Inspection system, 2, 2 (1)-2 (N) ... Probe, 3 ... Cable, 4 ... Control drive part, 10, 10A, 10B ... Display panel, 11, 11A, 11B ... Drive board, 12 ... Opposite Board, 13 (1) to 13 (N) ... terminal, 13d1, 13d2 ... dummy terminal, 14, 15 (1), 15 (2) ... internal connection

Claims (11)

A method of manufacturing a display device having a plurality of N terminals arranged in one direction apart from each other,
The width in the arrangement direction of the first terminal and the Nth terminal located at both ends of the terminal arrangement is formed to be one pitch or more of the remaining (N−2) terminal arrangements, and the first terminal and the first terminal A manufacturing step of manufacturing the display device by internal connection so that the N terminal is equal to or less than a predetermined resistance value corresponding to the same potential;
An electrical contact step of making electrical contact between the N probes arranged in one direction at a pitch corresponding to the pitch of the (N-2) terminal array and the N terminals;
When the electrical contact is made, a first resistance is measured between the first probe corresponding to the first terminal and the N probe corresponding to the N terminal, and the measured value of the first resistance is obtained. A contact determination step for determining whether or not the N probes have contact position deviations with respect to the N terminals;
An inspection step of inspecting the display device;
A method for manufacturing a display device. In the manufacturing step, the width in the arrangement direction of the first terminal and the Nth terminal is set to one pitch or more of the remaining (N-2) terminal arrangements, and the (N-2) pieces in the one pitch. The manufacturing method of the display device according to claim 1, wherein the terminal width is equal to or less than a value obtained by adding terminal widths in the same arrangement direction. The display device manufacturing method according to claim 1, wherein in the contact determination step, it is determined that the contact is not correct when the first resistance is greater than a predetermined resistance value corresponding to the same potential. In the contact determination step, a second resistance is measured between the first probe or the Nth probe and another probe adjacent to the probe, and the first resistance is determined based on a predetermined resistance value corresponding to the same potential. The display device manufacturing method according to claim 1, wherein execution of the inspection step is prohibited when the second resistance is equal to or smaller than a predetermined resistance value corresponding to the same potential. A method of manufacturing a display device having a plurality of N terminals arranged in one direction apart from each other,
Two dummy terminals having the pitch and width of the remaining (N−2) terminal arrays are formed adjacent to the first terminal and the Nth terminal located at both ends of the terminal array, respectively, and the first terminal Internal connection is made so that the terminal and one dummy terminal are equal to or less than a predetermined resistance value corresponding to the same potential, and the Nth terminal and the other dummy terminal are internally equal to or less than a predetermined resistance value corresponding to the same potential. Further, a manufacturing step of manufacturing the display device by internally connecting the dummy terminals so that the dummy terminals have a predetermined resistance value or less corresponding to the same potential, and
An electrical contact step for performing electrical contact between the N probes arranged in one direction at a pitch corresponding to the pitch of the terminal arrangement and the N terminals;
When the electrical contact is made, a first resistance is measured between the first probe corresponding to the first terminal and the N probe corresponding to the N terminal, and the measured value of the first resistance is obtained. A contact determination step for determining whether or not the N probes have contact position deviations with respect to the N terminals;
An inspection step of inspecting the display device;
A method for manufacturing a display device. The method for manufacturing a display device according to claim 5, wherein in the contact determination step, it is determined that the contact is not correct when the first resistance is greater than a predetermined resistance value corresponding to the same potential. In the contact determination step, a second resistance is measured between the first probe or the Nth probe and another probe adjacent to the probe, and the first resistance is determined based on a predetermined resistance value corresponding to the same potential. The method for manufacturing a display device according to claim 5, wherein execution of the inspection step is prohibited when the second resistance is equal to or smaller than a predetermined resistance value corresponding to the same potential. It has a plurality of N terminals that are spaced apart from each other and arranged in one direction, and the odd-numbered terminal groups and the even-numbered terminal groups are formed in different patterns in which the probe contact portions are stepped. A display device manufacturing method comprising:
Of the odd-numbered terminal group or the even-numbered terminal group, the width in the arrangement direction of two terminals located at both ends in the arrangement of one terminal group is set to the remaining (N−2) terminal arrangements. The display that is formed to be equal to or greater than the terminal pitch plus half of the difference between the odd and odd terminal widths, and is internally connected so that the two terminals have a predetermined resistance value or less equivalent to the same potential Manufacturing steps for manufacturing the device;
An electrical contact step of making electrical contact with the N terminals with N probes arranged in one direction at the same pitch as the terminal pitch;
When the electrical contact is made, the interprobe resistance is measured with the first probe corresponding to the first terminal and the Nth probe corresponding to the Nth terminal, and the measured interprobe resistance is A contact confirmation step of determining that the N probes are correctly in contact with the N terminals when the resistance value is equal to or less than a predetermined resistance value;
An inspection step of inspecting the display device in a state in which the contact confirmation of the N probes is taken;
A method for manufacturing a display device. A display unit;
A plurality of N terminals connected to the wiring connected to the display unit and arranged in one direction apart from each other;
Have
The width in the arrangement direction of the first terminal and the Nth terminal located at both ends of the terminal arrangement is formed to be one pitch or more of the remaining (N−2) terminal arrangements, and the first terminal and the first terminal A display device that is internally connected in the display section such that the N terminal is equal to or less than a predetermined resistance value corresponding to the same potential. A display unit;
A plurality of N terminals connected to the wiring connected to the display unit and arranged in one direction apart from each other;
Two dummy terminals adjacent to the first terminal and the Nth terminal located at both ends of the terminal array, respectively, and having the pitch and width of the remaining (N-2) terminal arrays;
Have
The first terminal and one dummy terminal are internally connected in the display section so as to be equal to or less than a predetermined resistance value corresponding to the same potential, and the Nth terminal and another dummy terminal are predetermined resistance corresponding to the same potential. A display device that is internally connected in the display unit so as to be less than or equal to a value, and further, that dummy terminals are also internally connected in the display unit so as to be less than or equal to a predetermined resistance value corresponding to the same potential. A display unit;
A plurality of N terminals connected to the wiring connected to the display unit and arranged in one direction apart from each other;
Have
The N terminals are formed in different patterns in which the odd-numbered terminal group and the even-numbered terminal group have different probe contact portions,
Of the odd-numbered terminal group or the even-numbered terminal group, the width in the arrangement direction of two terminals located at both ends in the arrangement of one terminal group is the remaining (N−2) terminal arrangements. Internal connection within the display unit is formed so that the terminal pitch is equal to or greater than half of the difference between the odd and odd terminal widths, and the two terminals are equal to or less than a predetermined resistance value corresponding to the same potential. Display device.

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