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JP2008070274A - Spectrophotometer - Google Patents

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JP2008070274A
JP2008070274A JP2006250167A JP2006250167A JP2008070274A JP 2008070274 A JP2008070274 A JP 2008070274A JP 2006250167 A JP2006250167 A JP 2006250167A JP 2006250167 A JP2006250167 A JP 2006250167A JP 2008070274 A JP2008070274 A JP 2008070274A
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light receiving
light
receiving element
wavelength band
charge accumulation
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Takeshi Fujita
健 藤田
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2006250167A priority Critical patent/JP2008070274A/en
Priority to US11/819,043 priority patent/US7511255B2/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/10Arrangements of light sources specially adapted for spectrometry or colorimetry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/027Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/30Measuring the intensity of spectral lines directly on the spectrum itself
    • G01J3/36Investigating two or more bands of a spectrum by separate detectors

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To prevent saturation of light receiving elements which is apt to saturate by reducing the accumulated charge amount without reducing the signal strength of the light receiving elements compatible with an unnecessarily large wavelength range. <P>SOLUTION: The light emission spectrum of a light source 2 is measured (step S1). A threshold exceeded only by a projecting wavelength band of the spectrum intensity is set based on the light emission spectrum of the light source 2 (step S2). The ratio between the peak value of the wavelength band exceeding the threshold and the set threshold is determined (step S3). The charge accumulation time of the light receiving elements corresponding to the wavelength band not higher than the threshold is set as the longest charge accumulation time among charge accumulation times at which saturation does not occur in any light receiving element (step S4). Based on the ratio between the peak value of the wavelength band exceeding the threshold and the threshold, the charge accumulation time of the light receiving elements corresponding to the wavelength band exceeding the threshold is set (step S5). <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、測定光を分光する光学系と、分光された光を受光して光電変換を行なう複数の受光素子が分光光に対応して配列されたフォトダイオードアレイと、測定光の光路上に配置された試料室と、フォトダイオードアレイの各受光素子に蓄積された電荷を読み出す信号読出し部とを備えた分光光度計に関するものである。   The present invention relates to an optical system that splits measurement light, a photodiode array in which a plurality of light receiving elements that receive the dispersed light and perform photoelectric conversion are arranged corresponding to the spectral light, and an optical path of the measurement light The present invention relates to a spectrophotometer including an arranged sample chamber and a signal reading unit for reading out electric charges accumulated in each light receiving element of a photodiode array.

複数の受光素子(フォトダイオード)が分光方向に配列されたフォトダイオードアレイを用いた分光光度計では、測定光が分光素子によって波長帯域ごとに分光されて受光素子に入射する。受光素子では光電変換によって受光量に応じた電荷が生成されて蓄積される。読出し時は、それぞれのフォトダイオードに蓄積された電荷を吸い出して検出することで、各受光素子への入射量を測定することができる。   In a spectrophotometer that uses a photodiode array in which a plurality of light receiving elements (photodiodes) are arranged in the spectral direction, the measurement light is split by the spectral element for each wavelength band and is incident on the light receiving element. In the light receiving element, charges corresponding to the amount of received light are generated and stored by photoelectric conversion. At the time of reading, the amount of incident light on each light receiving element can be measured by sucking and detecting the charge accumulated in each photodiode.

しかし、フォトダイオードは一定量の電荷を蓄積すると飽和し、それ以上の電荷は蓄積できないため、全ての受光素子で飽和しないように最もスペクトル強度の強い受光素子に合わせて電荷蓄積時間を設定する必要があった。最もスペクトル強度の強い受光素子に合わせて電荷蓄積時間を設定すると、スペクトル強度の弱い波長帯域の受光素子に蓄積される電荷量が極めて少なくなり、その波長領域の信号強度が弱くなる。
信号読出し時の読出しノイズは電荷蓄積量に関係なく一定である。信号強度が弱いとノイズの割合が高くなるため、測定誤差が大きくなる。したがって、ノイズの相対的割合を低下させて測定誤差を小さくするために、受光素子の飽和レベルぎりぎりまで電荷を蓄積させて信号強度を強めることが好ましい。
However, photodiodes saturate when a certain amount of charge is accumulated and cannot accumulate more charge, so it is necessary to set the charge accumulation time according to the light receiving element with the strongest spectral intensity so as not to saturate in all light receiving elements. was there. When the charge accumulation time is set in accordance with the light receiving element having the strongest spectral intensity, the amount of charge accumulated in the light receiving element in the wavelength band having the weak spectral intensity is extremely small, and the signal intensity in the wavelength region is weakened.
The readout noise during signal readout is constant regardless of the charge accumulation amount. If the signal intensity is weak, the noise ratio increases, and the measurement error increases. Therefore, in order to reduce the relative ratio of noise and reduce the measurement error, it is preferable to increase the signal intensity by accumulating charges up to the limit of the saturation level of the light receiving element.

そこで、吸収スペクトルの測定において全波長範囲でノイズを低減するために、フォトダイオードアレイを構成する各受光素子の読出しスイッチの開閉周期を独立に制御する制御回路を設け、各受光素子の電荷蓄積時間が異なるようにして、バックグラウンドスペクトル(試料を設置しないときの光源スペクトル)強度に応じて各受光素子の電荷蓄積時間をかえることが提案されている(例えば、特許文献1参照。)。
この方法では、光源の発光スペクトルのうち、スペクトル強度の強い波長帯域に対応する受光素子の電荷蓄積時間を短くし、スペクトル強度の弱い波長帯域に対応する受光素子の電荷蓄積時間を長くすることで、全波長範囲の信号強度を一様の強度にすることができる。しかし、全ての受光素子について、光源のスペクトル強度と目標とするスペクトル強度から電荷蓄積時間を計算して設定しなければならないため、各受光素子の読出しスイッチの開閉周期を独立に制御する制御回路の構成が複雑になり、コストがかかるという問題があった。
Therefore, in order to reduce noise in the entire wavelength range in the absorption spectrum measurement, a control circuit is provided for independently controlling the open / close cycle of the readout switch of each light receiving element constituting the photodiode array, and the charge accumulation time of each light receiving element is provided. Has been proposed to change the charge accumulation time of each light receiving element in accordance with the intensity of the background spectrum (light source spectrum when no sample is placed) (see, for example, Patent Document 1).
In this method, by shortening the charge accumulation time of the light receiving element corresponding to the wavelength band where the spectrum intensity is strong in the emission spectrum of the light source, and increasing the charge accumulation time of the light receiving element corresponding to the wavelength band where the spectrum intensity is weak. The signal intensity in the entire wavelength range can be made uniform. However, since the charge accumulation time must be calculated and set from the spectral intensity of the light source and the target spectral intensity for all the light receiving elements, a control circuit that independently controls the open / close cycle of the readout switch of each light receiving element. There is a problem that the configuration becomes complicated and expensive.

紫外可視分光光度計の測定波長範囲は190nm〜1100nmである。この波長範囲を網羅するために、光源として重水素ランプ(以下、D2ランプ)とタングステンハロゲンランプ(Wランプ)を同時点灯させて用いることが一般的である。しかし、D2ランプやWランプの光源スペクトル特性は平坦ではなく、特にD2ランプの輝線波長は突出している。D2ランプとWランプを同時に点灯させると、可視側では656nm輝線が最大スペクトル強度となり、この波長帯域に対応する受光素子が最初に飽和する。この受光素子が飽和しないようにWランプのスペクトル強度を低下させる方法も考えられるが、Wランプのスペクトル強度を低下させるとD2ランプとともに同時に点灯させているメリットが小さくなってしまう。   The measurement wavelength range of the ultraviolet-visible spectrophotometer is 190 nm to 1100 nm. In order to cover this wavelength range, it is common to use a deuterium lamp (hereinafter referred to as D2 lamp) and a tungsten halogen lamp (W lamp) that are simultaneously turned on as a light source. However, the light source spectral characteristics of the D2 lamp and the W lamp are not flat, and the emission line wavelength of the D2 lamp is particularly prominent. When the D2 lamp and the W lamp are turned on at the same time, the 656 nm emission line has the maximum spectral intensity on the visible side, and the light receiving element corresponding to this wavelength band is saturated first. A method of reducing the spectral intensity of the W lamp so that the light receiving element does not saturate is also conceivable, but if the spectral intensity of the W lamp is reduced, the merit of simultaneously lighting together with the D2 lamp is reduced.

そこで、フォトダイオードアレイの受光面側に減光用フィルタを設けて、突出したスペクトル強度を示す波長帯域に対応する受光素子への入射スペクトル強度を減らす方法が提案されている(例えば、特許文献2参照。)。
この方法では、例えばD2ランプとWランプの同時点灯の場合では、光源の発光スペクトルにおいてピークとなっている、656nm付近の輝線波長帯域に対応する受光素子の受光量を減光用フィルタによって減光することで、フォトダイオードアレイのいずれかの受光素子で飽和するまでの時間を長くすることができ、減光した波長帯域以外の波長帯域の受光素子の信号強度を高めることができる。
Therefore, a method has been proposed in which a light reducing filter is provided on the light receiving surface side of the photodiode array to reduce the incident spectral intensity to the light receiving element corresponding to the wavelength band indicating the protruding spectral intensity (for example, Patent Document 2). reference.).
In this method, for example, in the case of simultaneous lighting of the D2 lamp and the W lamp, the received light amount of the light receiving element corresponding to the emission line wavelength band near 656 nm, which is a peak in the light emission spectrum of the light source, is attenuated by the light reducing filter. By doing so, it is possible to lengthen the time until it is saturated by any one of the light receiving elements of the photodiode array, and it is possible to increase the signal intensity of the light receiving elements in the wavelength band other than the dimmed wavelength band.

特開平8−15013号公報JP-A-8-15013 実開平5−79451号公報Japanese Utility Model Publication No. 5-79451

D2ランプとWランプからなる光源を用いた場合、656±4nmの波長範囲が最もスペクトル強度が強いため、この波長範囲に対応する受光素子の蓄積電荷量を低減することで、他の波長範囲に対応する受光素子の信号強度を高めることができ、それらの受光素子のノイズ割合を低減することができる。減光用フィルタを用いた方法では、加工精度、位置決め精度、調整公差等の制約があり、実際には656±20nm程度の波長範囲に対応する受光素子を覆うような幅広の減光用フィルタが用いられている。しかしこれでは、図6に示されるように、不必要に広い波長範囲において減光され、無駄にスペクトル強度を低下させてしまうという問題があった。   When a light source composed of a D2 lamp and a W lamp is used, the wavelength range of 656 ± 4 nm has the strongest spectral intensity. Therefore, by reducing the accumulated charge amount of the light receiving element corresponding to this wavelength range, The signal intensity of the corresponding light receiving elements can be increased, and the noise ratio of those light receiving elements can be reduced. In the method using the dimming filter, there are restrictions such as processing accuracy, positioning accuracy, adjustment tolerance, and the like. In practice, a wide dimming filter that covers the light receiving element corresponding to the wavelength range of about 656 ± 20 nm is used. It is used. However, in this case, as shown in FIG. 6, there is a problem that the light intensity is unnecessarily reduced in a wide wavelength range, and the spectrum intensity is unnecessarily reduced.

そこで本発明は、不必要に広い波長範囲に対応する受光素子の信号強度を低下させることなく、飽和しやすい受光素子の蓄積電荷量を低減して飽和しないようにすることを目的とするものである。   SUMMARY OF THE INVENTION Accordingly, the present invention aims to reduce the accumulated charge amount of a light-receiving element that is likely to be saturated without lowering the signal intensity of the light-receiving element corresponding to an unnecessarily wide wavelength range so as not to be saturated. is there.

本発明の分光光度計は、光源と、光源からの光を分光する光学系と、光学系により分光された光を受光して光電変換を行なう複数の受光素子が分光光に対応して配列されたフォトダイオードアレイ、測定光の光路上に配置された試料室及びフォトダイオードアレイの各受光素子に蓄積された電荷を読み出す信号読出し部からなる受光部と、を備えたものであって、受光部はフォトダイオードアレイの受光素子ごとに電荷蓄積時間が設定でき、各受光素子の電荷蓄積時間を制御する制御部をさらに備え、制御部は、光源の発光スペクトルにおいて予め設定されたしきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を相対的に短くすることを特徴とするものである。   In the spectrophotometer of the present invention, a light source, an optical system that separates light from the light source, and a plurality of light receiving elements that receive light dispersed by the optical system and perform photoelectric conversion are arranged corresponding to the spectral light. A photo diode array, a sample chamber arranged on the optical path of the measurement light, and a light receiving unit comprising a signal reading unit for reading out electric charges accumulated in each light receiving element of the photo diode array. Can further set a charge accumulation time for each light receiving element of the photodiode array, and further includes a control unit that controls the charge accumulation time of each light receiving element, and the control unit exceeds a preset threshold in the emission spectrum of the light source The charge accumulation time of the light receiving element corresponding to the wavelength band indicating the spectral intensity is relatively shortened.

上記制御部は、発光スペクトルにおいてしきい値を上回るスペクトル強度を示す波長帯域のピークスペクトル強度としきい値との比率に基づいて、しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を他の受光素子の電荷蓄積時間よりも一律に短く設定するようになっていることが好ましい。   Based on the ratio between the peak spectral intensity of the wavelength band showing the spectral intensity exceeding the threshold value and the threshold value in the emission spectrum, the control unit of the light receiving element corresponding to the wavelength band showing the spectral intensity exceeding the threshold value. It is preferable that the charge accumulation time is set to be uniformly shorter than the charge accumulation times of the other light receiving elements.

光源は、測定波長範囲内の発光スペクトルに輝線波長帯域がピークとして存在する光を発生させるものであってもよく、その場合のしきい値はその輝線波長帯域のみが上回るように設定されたものであることが好ましい。
そのような光源として、重水素ランプとタングステンハロゲンランプが同時点灯するものを挙げることができる。この場合の輝線波長帯域は656nmを中心とした微少範囲、例えば±4nmの波長範囲である。
The light source may generate light whose emission line wavelength band exists as a peak in the emission spectrum within the measurement wavelength range, in which case the threshold is set so that only the emission line wavelength band is exceeded. It is preferable that
An example of such a light source is one in which a deuterium lamp and a tungsten halogen lamp are turned on simultaneously. In this case, the emission line wavelength band is a very small range centered on 656 nm, for example, a wavelength range of ± 4 nm.

本発明の測定方法は、光源と、光源からの光を分光する光学系と、光学系により分光された光を受光して光電変換を行なうために分光光に対応して配列されたフォトダイオードアレイ及びフォトダイオードアレイの各受光素子に蓄積された電荷を読み出す信号読出し部からなる受光部とを備えた分光光度計を用いた測定方法であって、受光部の信号読出し部としてフォトダイオードアレイの受光素子ごとに電荷蓄積時間が設定できるものを使用し、試料が設置されていない状態で光源の発光スペクトルを測定し、その発光スペクトルに基づいてしきい値を設定し、発光スペクトルにおいて設定したしきい値を超えるスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を相対的に短く設定するようにしたことを特徴とするものである。   The measurement method of the present invention includes a light source, an optical system that splits light from the light source, and a photodiode array that is arranged corresponding to the spectroscopic light to receive light dispersed by the optical system and perform photoelectric conversion. And a measuring method using a spectrophotometer comprising a light receiving portion comprising a signal reading portion for reading out the electric charge accumulated in each light receiving element of the photodiode array, wherein the light receiving portion receives the light from the photodiode array. Use a device that can set the charge accumulation time for each device, measure the emission spectrum of the light source without a sample, set the threshold based on the emission spectrum, and set the threshold in the emission spectrum. The charge accumulation time of the light receiving element corresponding to the wavelength band showing the spectral intensity exceeding the value is set to be relatively short. That.

本発明の測定方法では、しきい値を超えるスペクトル強度を示す波長帯域のピークスペクトル強度としきい値の比率に基づいて、しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を他の電荷蓄積時間よりも一律に短く設定することが好ましい。   In the measurement method of the present invention, the charge accumulation of the light receiving element corresponding to the wavelength band showing the spectral intensity exceeding the threshold is based on the ratio of the peak spectral intensity of the wavelength band showing the spectral intensity exceeding the threshold and the threshold. It is preferable to set the time uniformly shorter than other charge accumulation times.

本発明の分光光度計及びその測定方法では、受光部としてフォトダイオードアレイの受光素子ごとに電荷蓄積時間が設定できるものを用い、光源の発光スペクトルにおけるスペクトル強度が予め設定されたしきい値を超えるスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を相対的に短くするようにしたので、スペクトル強度の多い波長帯域に対応する受光素子の蓄積電荷量が相対的に減少し、それらの受光素子が飽和しにくくなる。これにより、他の波長帯域に対応する受光素子の電荷蓄積時間を従来よりも長くとることができるので、その信号強度を高めることができ、ノイズ割合を低下させることができる。   In the spectrophotometer and the measuring method thereof according to the present invention, a light receiving unit that can set the charge accumulation time for each light receiving element of the photodiode array is used, and the spectrum intensity in the emission spectrum of the light source exceeds a preset threshold value. Since the charge storage time of the light receiving element corresponding to the wavelength band indicating the spectral intensity is relatively shortened, the amount of stored charge of the light receiving element corresponding to the wavelength band having a large spectral intensity is relatively reduced, The light receiving element is less likely to be saturated. As a result, the charge accumulation time of the light receiving elements corresponding to other wavelength bands can be made longer than before, so that the signal intensity can be increased and the noise ratio can be reduced.

発光スペクトルにおいてしきい値を上回るスペクトル強度を示す波長帯域のピークスペクトル強度としきい値との比率に基づいて、しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を他の受光素子の電荷蓄積時間よりも一律に短く設定するようにすれば、しきい値を上回るスペクトル強度を示す波長帯域の電荷蓄積時間を必要以上に短く設定してしまうことがなくなり、光源の発光スペクトルを最大限に利用することができる。
また、しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を一律に設定するようにすることで、受光素子ごとに電荷蓄積時間を設定するよりも構成を簡略化できる。
Based on the ratio between the peak spectral intensity of the wavelength band showing the spectral intensity exceeding the threshold in the emission spectrum and the threshold, the charge accumulation time of the light receiving element corresponding to the wavelength band showing the spectral intensity exceeding the threshold is different. If it is set to be uniformly shorter than the charge accumulation time of the light receiving element, the charge accumulation time in the wavelength band showing the spectral intensity exceeding the threshold value will not be set shorter than necessary, and the light source emits light. The spectrum can be used to the maximum.
Further, by uniformly setting the charge accumulation time of the light receiving element corresponding to the wavelength band showing the spectral intensity exceeding the threshold value, the configuration can be simplified as compared with setting the charge accumulation time for each light receiving element. .

光源として、測定波長範囲内の発光スペクトルに輝線波長帯域がピークとして存在する光を発生させるものを用い、しきい値をその輝線波長帯域のみが上回るように設定すれば、輝線波長帯域以外の波長帯域に対応する受光素子の感度を低下させることなく、突出したスペクトル強度の輝線波長帯域に対応する受光素子のみの電荷蓄積時間を相対的に短く設定して感度を低下させることができる。   If a light source that emits light with an emission line wavelength peak in the emission spectrum within the measurement wavelength range is set and the threshold is set to exceed only the emission line wavelength band, the wavelength other than the emission line wavelength band Without lowering the sensitivity of the light receiving element corresponding to the band, the sensitivity can be lowered by setting the charge storage time of only the light receiving element corresponding to the bright line wavelength band of the protruding spectral intensity relatively short.

図1は本発明の分光光度計を液体クロマトグラフに使用した一実施例を示す概略構成図である。
この実施例では、液体クロマトグラフのカラムからの溶出液が流れるフローセル(試料室)4に、D2ランプとWランプからなる光源2からの光を照射して、吸光度を測定する。フローセル4を透過した光はスリット6を経てライン状ビームとなり、その後、分光素子8により波長ごとに分光されてフォトダイオードアレイ10に入射する。フォトダイオードアレイ10はフォトダイオードからなる複数の受光素子が分光素子8からの分光光に対応するように配置されており、各受光素子が波長帯域ごとの光を受光する。フォトダイオードアレイ10の各受光素子は光を受光すると光電変換を行なって電荷を生成して、受光量に応じた電荷量を蓄積する。各受光素子に蓄積された電荷は信号読出し部12によって読み出される。フォトダイオードアレイ10及び信号読出し部12は受光部を構成している。信号読出し部12の信号読出し動作は制御部14によって制御されている。
FIG. 1 is a schematic configuration diagram showing an embodiment in which the spectrophotometer of the present invention is used in a liquid chromatograph.
In this embodiment, the flow cell (sample chamber) 4 in which the eluate from the column of the liquid chromatograph flows is irradiated with light from the light source 2 composed of a D2 lamp and a W lamp, and the absorbance is measured. The light that has passed through the flow cell 4 passes through the slit 6 to form a line beam, and then is split by the spectral element 8 for each wavelength and is incident on the photodiode array 10. In the photodiode array 10, a plurality of light receiving elements made of photodiodes are arranged so as to correspond to the spectral light from the spectral element 8, and each light receiving element receives light for each wavelength band. When each light receiving element of the photodiode array 10 receives light, it performs photoelectric conversion to generate charges, and accumulates a charge amount corresponding to the received light amount. The electric charge accumulated in each light receiving element is read by the signal reading unit 12. The photodiode array 10 and the signal readout unit 12 constitute a light receiving unit. The signal reading operation of the signal reading unit 12 is controlled by the control unit 14.

この実施例の受光部は、フォトダイオードアレイ10の受光素子ごとに電荷蓄積時間が変更できるものであり、そのような受光部として、例えば浜松ホトニクス社製のCMOSリニアイメージセンサS10111〜S10114シリーズを用いることができる。   The light receiving unit of this embodiment can change the charge accumulation time for each light receiving element of the photodiode array 10, and for example, CMOS linear image sensors S10111 to S10114 series manufactured by Hamamatsu Photonics are used as such a light receiving unit. be able to.

受光部について説明する。
この実施例の受光部は、一定周期で信号読出し部12によるフォトダイオードアレイ10の全受光素子の信号読出し(スキャン)が順に行なわれる。信号読出し部12で有効データとして扱われるのは一定回数に1回のスキャンで読み出した信号のみであり、その間のスキャンで読み出されたデータは廃棄される。以下の説明では、有効データとして扱う信号を読み出すためのスキャンを有効スキャンと呼び、廃棄される信号を読み出すためのスキャンを無効スキャンと呼ぶ。信号読出し部12によるスキャン及びスキャンで読み出した信号の扱いは制御部14によって制御されている。
その一例を図4を参照して説明する。図4はフォトダイオードアレイ10の各受光素子の信号蓄積・読出し動作を示すタイムチャート図である。
The light receiving unit will be described.
In the light receiving unit of this embodiment, signal reading (scanning) of all the light receiving elements of the photodiode array 10 is sequentially performed by the signal reading unit 12 at a constant cycle. Only the signal read in one scan at a fixed number of times is handled as valid data in the signal reading unit 12, and the data read in the scan in the meantime is discarded. In the following description, a scan for reading a signal handled as valid data is called a valid scan, and a scan for reading a discarded signal is called an invalid scan. The control by the control unit 14 is controlled by the signal reading unit 12 and the handling of signals read by the scan.
One example will be described with reference to FIG. FIG. 4 is a time chart showing signal accumulation / reading operations of the respective light receiving elements of the photodiode array 10.

信号読出し部12は制御部14からのスタート信号がハイレベルになるとフォトダイオードアレイ10に対して順に、各フォトダイオードのオン・オフを制御する読出し信号を出力する。信号読出し部12による読出し信号の出力は制御部14によって制御されている。
各受光素子は信号読出し部12からの制御信号がハイレベル(High)のときはそのまま電荷を蓄積し、ローレベル(Low)のときはオンになって電荷が放出される。図4の例では、4回に1回の割合で有効スキャンが行なわれ、その他は無効スキャンであり、無効スキャンで読み出された信号は無効データとして廃棄される。
When the start signal from the control unit 14 becomes a high level, the signal readout unit 12 sequentially outputs a readout signal for controlling on / off of each photodiode to the photodiode array 10. The output of the readout signal by the signal readout unit 12 is controlled by the control unit 14.
When the control signal from the signal reading unit 12 is at a high level (High), each light receiving element accumulates charges as it is, and when the control signal is at a low level (Low), it turns on and discharges the charges. In the example of FIG. 4, the effective scan is performed once every four times, the other is the invalid scan, and the signal read in the invalid scan is discarded as invalid data.

図4(A)に示される受光素子は、信号読出し部12に入力されている制御部14からのスタート信号がハイレベルになってから最初に信号読出し部12による信号読出しが行なわれる素子である。この受光素子は、全てのスキャンにおいて読出し信号がローレベル(Low)のままであり、無効スキャン毎に電荷が放出されて廃棄される。したがって、有効スキャン時に読み出される信号は、直前の無効スキャン終了後から有効スキャンが行なわれるまでの間に蓄積された分であり、電荷蓄積時間は直前の無効スキャン終了後から有効スキャンが行なわれるまでの間となる。   The light receiving element shown in FIG. 4A is an element from which the signal reading unit 12 first reads a signal after the start signal from the control unit 14 input to the signal reading unit 12 becomes a high level. . In this light receiving element, the read signal remains at a low level (Low) in all the scans, and the charge is discharged and discarded every invalid scan. Therefore, the signal read at the time of valid scan is the amount accumulated from the end of the previous invalid scan until the valid scan is performed, and the charge accumulation time is from the end of the previous invalid scan until the valid scan is performed. Between.

(B)に示される受光素子は、(A)の受光素子の次に信号読出しが行なわれる素子である。この受光素子は、有効スキャン直前の無効スキャン時に信号読出し部12からの読出し信号がハイレベル(High)になり、有効スキャン直前の無効スキャンでは信号が読み出されない。したがって、2回目の無効スキャン終了後から有効スキャンが行なわれるまで継続して電荷が蓄積されことになり、この受光素子の電荷蓄積時間は(A)の受光素子の電荷蓄積時間の2倍になる。   The light receiving element shown in (B) is an element from which a signal is read after the light receiving element in (A). In this light receiving element, the readout signal from the signal readout unit 12 is at a high level (High) at the invalid scan immediately before the valid scan, and no signal is read out at the invalid scan just before the valid scan. Therefore, after the second invalid scan is completed, the charge is continuously accumulated until the effective scan is performed, and the charge accumulation time of this light receiving element is twice the charge accumulation time of the light receiving element in (A). .

(C)に示される受光素子は、(B)の受光素子の次に信号読出しが行なわれる素子である。この受光素子は、前回の有効スキャン直後の無効スキャン時は信号読出し部12からの読出し信号がローレベル(Low)のままであるが、その後の無効スキャン時の読出し信号がハイレベル(High)になり、有効スキャン前の2回の無効スキャンでは信号が読み出されずに蓄積される。したがって、この受光素子電荷蓄積時間は(A)の受光素子の電荷蓄積時間の3倍になる。   The light receiving element shown in (C) is an element from which a signal is read after the light receiving element in (B). In this light receiving element, the readout signal from the signal readout unit 12 remains at the low level (Low) at the invalid scan immediately after the previous valid scan, but the readout signal at the subsequent invalid scan is at the high level (High). Thus, in the two invalid scans before the valid scan, the signal is accumulated without being read out. Therefore, this light receiving element charge accumulation time is three times the charge accumulating time of the light receiving element (A).

(D)に示される受光素子は、信号読出し部12に入力されている制御部14からのスタート信号がハイレベルになってから、最後に信号読出しが行なわれる素子である。この受光素子は、全ての無効スキャン時において信号読出し部12の読出し信号がハイレベル(High)になり、前回の有効スキャン終了後から次の有効スキャンが行われる継続して電荷が蓄積される。したがって、この受光素子の電荷蓄積時間は(A)の受光素子の電荷蓄積時間の4倍になる。   The light receiving element shown in (D) is an element for which signal reading is finally performed after the start signal from the control unit 14 input to the signal reading unit 12 becomes high level. In this light receiving element, the readout signal of the signal readout unit 12 is at a high level (High) at all invalid scans, and charges are continuously accumulated after the next valid scan is completed. Therefore, the charge accumulation time of the light receiving element is four times the charge accumulation time of the light receiving element (A).

受光部におけるフォトダイオードアレイ10の各受光素子の電荷蓄積時間の設定方法について図2を参照して説明する。図2は各受光素子の電荷蓄積時間設定方法を示すフローチャート図である。
光源2の発光スペクトルを測定する(ステップS1)。このときは全フォトダイオードで飽和しないように電荷蓄積時間を設定しておく。光源2の発光スペクトルは図示されてない記憶装置等に記憶しておく。測定した光源2の発光スペクトルからスペクトル強度の突出した波長帯域のみが上回るようなしきい値を設定する(ステップS2)。しきい値を上回るスペクトル強度を示す波長帯域のピーク値と設定されたしきい値との比率を求める(ステップS3)。しきい値以下のスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を、蓄積される電荷量がいずれも飽和しないような電荷蓄積時間で最も長い電荷蓄積時間に一律に設定する(ステップS4)。しきい値を上回るスペクトル強度のピーク値としきい値との比率に基づいて、しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を設定する(ステップS5)。
A method for setting the charge accumulation time of each light receiving element of the photodiode array 10 in the light receiving unit will be described with reference to FIG. FIG. 2 is a flowchart showing a method for setting the charge accumulation time of each light receiving element.
The emission spectrum of the light source 2 is measured (step S1). At this time, the charge accumulation time is set so as not to saturate all the photodiodes. The emission spectrum of the light source 2 is stored in a storage device not shown. A threshold value is set such that only the wavelength band in which the spectral intensity protrudes exceeds the measured emission spectrum of the light source 2 (step S2). A ratio between the peak value of the wavelength band indicating the spectral intensity exceeding the threshold value and the set threshold value is obtained (step S3). The charge accumulation time of the light receiving element corresponding to the wavelength band showing the spectral intensity below the threshold is uniformly set to the longest charge accumulation time that does not saturate any accumulated charge (step) S4). Based on the ratio between the peak value of the spectral intensity exceeding the threshold value and the threshold value, the charge accumulation time of the light receiving element corresponding to the wavelength band indicating the spectral intensity exceeding the threshold value is set (step S5).

制御部14は図2のステップS3〜ステップS5までを自動的に行ない、設定した各受光素子の電荷蓄積時間に基づいて、信号読出し部12から出力される読出し信号を制御する。   The control unit 14 automatically performs steps S3 to S5 in FIG. 2 and controls the readout signal output from the signal readout unit 12 based on the set charge accumulation time of each light receiving element.

フォトダイオードアレイ10の各受光素子の電荷蓄積時間の設定方法の具体例として、光源2としてD2ランプとWランプとを同時点灯させるものを用いた場合について説明する。
図3は、光源2の発光スペクトルを示す図であり、(A)はD2ランプ(実線)とWランプ(破線)それぞれの発光スペクトルを示しており、(B)はD2ランプとWランプを同時点灯させたときの発光スペクトルを示している。この図において、縦軸はスペクトル強度、横軸は波長である。
As a specific example of the method for setting the charge accumulation time of each light receiving element of the photodiode array 10, a case where a light source 2 that simultaneously lights a D2 lamp and a W lamp will be described.
FIG. 3 is a diagram showing an emission spectrum of the light source 2, wherein (A) shows the emission spectra of the D2 lamp (solid line) and W lamp (broken line), and (B) shows the D2 lamp and W lamp simultaneously. The emission spectrum when it is lit is shown. In this figure, the vertical axis represents the spectral intensity, and the horizontal axis represents the wavelength.

190nm〜1100nmの波長範囲を網羅するためにD2ランプとWランプを同時点灯させると、D2ランプとWランプのスペクトルが合成されて、(B)に示されるようなD2ランプの輝線波長である656nmのスペクトル強度がピークとなる。この発光スペクトルでは、656nm前後がスペクトル強度が突出した輝線波長帯域となっており、この波長帯域に対応する受光素子が最初に飽和する。   When the D2 lamp and the W lamp are turned on simultaneously to cover the wavelength range of 190 nm to 1100 nm, the spectrum of the D2 lamp and the W lamp is synthesized, and the emission line wavelength of the D2 lamp as shown in (B) is 656 nm. The spectral intensity becomes a peak. In this emission spectrum, the emission line wavelength band where the spectrum intensity is prominent is around 656 nm, and the light receiving element corresponding to this wavelength band is saturated first.

そこで、図3(B)の2点鎖線で示されるように、波長656nmを中心とした微少範囲の突出した輝線波長帯域のみが上回るようなしきい値を設定する。
しきい値が設定されると、制御部14によって、しきい値を上回るスペクトル強度を示している波長656nm付近の波長帯域に対応する受光素子が特定され、特定された受光素子以外の受光素子の電荷蓄積時間について、それらの受光素子のうち最大のスペクトル強度を示している波長帯域に対応する受光素子が飽和しないような最長の電荷蓄積時間が一律に設定される。
Therefore, as indicated by a two-dot chain line in FIG. 3B, a threshold value is set such that only a protruding bright line wavelength band in a minute range centering on a wavelength of 656 nm is exceeded.
When the threshold value is set, the control unit 14 identifies the light receiving element corresponding to the wavelength band near the wavelength of 656 nm indicating the spectral intensity exceeding the threshold value, and the light receiving elements other than the identified light receiving element are identified. Regarding the charge accumulation time, the longest charge accumulation time is set uniformly such that the light receiving elements corresponding to the wavelength band showing the maximum spectral intensity among these light receiving elements are not saturated.

次に、制御部14によって、656nm付近の波長帯域に対応する受光素子の電荷蓄積時間が、しきい値と656nmのスペクトル強度の比率、及び先に設定した他の受光素子の電荷蓄積時間に基づいて設定される。すなわち、656nm付近の波長帯域に対応する受光素子の電荷蓄積時間と他の受光素子の電荷蓄積時間の比率が、656nmのスペクトル強度としきい値の比率の逆の比率又はそれに近い比率になるように設定される。これにより、656nmの波長に対応する受光素子の信号強度を飽和しないぎりぎりのレベルに設定され、光源の発光スペクトルが最大限に利用される。   Next, the control unit 14 determines the charge accumulation time of the light receiving element corresponding to the wavelength band near 656 nm based on the ratio of the threshold value to the spectral intensity of 656 nm and the charge accumulation time of other light receiving elements set in advance. Is set. That is, the ratio of the charge accumulation time of the light receiving element corresponding to the wavelength band near 656 nm and the charge accumulation time of the other light receiving elements is set to a ratio opposite to or close to the ratio of the spectral intensity of 656 nm to the threshold value. Is set. As a result, the signal intensity of the light receiving element corresponding to the wavelength of 656 nm is set to a level that does not saturate, and the emission spectrum of the light source is utilized to the maximum.

上記のように、この実施例の分光光度計では、656nmを中心とする微少範囲、例えば656±4nmの波長範囲に対応する受光素子の電荷蓄積時間が他の受光素子に比べて相対的に短く設定されるので、656nmを中心とする微少範囲以外の波長帯域に対応する受光素子の電荷蓄積時間を全体的に長くとることができ、信号強度が高められる。また、発光スペクトルに基づいて必要最小限の受光素子の電荷蓄積時間を相対的に短く設定するので、図6のような減光用フィルタを用いた場合のように、不必要に広い範囲の受光素子の信号強度を弱めることがなく、光源のもつ発光スペクトルを有効に活用することができる。   As described above, in the spectrophotometer of this embodiment, the charge accumulation time of the light receiving element corresponding to a very small range centered at 656 nm, for example, a wavelength range of 656 ± 4 nm is relatively shorter than other light receiving elements. Therefore, the charge accumulation time of the light receiving element corresponding to the wavelength band other than the minute range centered at 656 nm can be increased as a whole, and the signal intensity is increased. In addition, since the minimum charge storage time of the light receiving element is set to be relatively short based on the emission spectrum, the light reception in an unnecessarily wide range is performed as in the case of using the light reduction filter as shown in FIG. The emission spectrum of the light source can be used effectively without weakening the signal intensity of the element.

この実施例では、具体例として光源2がD2ランプとWランプからなるものである場合について説明しているが、本発明はこれに限定されるものではなく、例えばキセノンフラッシュランプなどを光源として用いた場合にも適用することができる。   In this embodiment, the case where the light source 2 is composed of a D2 lamp and a W lamp has been described as a specific example. However, the present invention is not limited to this. For example, a xenon flash lamp or the like is used as the light source. It is also possible to apply it.

分光光度計の一実施例を概略的に示すブロック図である。It is a block diagram which shows roughly one Example of a spectrophotometer. 受光部のフォトダイオードアレイの受光素子の蓄積時間の設定方法の一例を示すフローチャート図である。It is a flowchart figure which shows an example of the setting method of the accumulation time of the light receiving element of the photodiode array of a light-receiving part. D2ランプとWランプからなる光源の発光スペクトルを示す図であり、(A)ははD2ランプ(実線)とWランプ(破線)それぞれの発光スペクトルを示しており、(B)はD2ランプとWランプを同時点灯させたときの発光スペクトルを示している。It is a figure which shows the emission spectrum of the light source which consists of D2 lamp and W lamp, (A) has each shown the emission spectrum of D2 lamp (solid line) and W lamp (dashed line), (B) is D2 lamp and W The emission spectrum when the lamps are turned on simultaneously is shown. 信号読出し部による信号読出しのタイミングチャート図である。It is a timing chart figure of signal reading by a signal reading part. 蓄積時間設定後のフォトダイオードアレイにおけるエネルギー分布を示す図である。It is a figure which shows the energy distribution in the photodiode array after accumulation time setting. 従来の方法によって補正された発光スペクトルを示す図である。It is a figure which shows the emission spectrum correct | amended by the conventional method.

符号の説明Explanation of symbols

2 光源
4 フローセル
6 スリット
8 分光素子
10 フォトダイオードアレイ
12 信号読出し部
14 制御部
2 Light source 4 Flow cell 6 Slit 8 Spectroscopic element 10 Photodiode array 12 Signal reading unit 14 Control unit

Claims (6)

光源と、前記光源からの光を分光する光学系と、前記光学系により分光された光を受光して光電変換を行なう複数の受光素子が分光光に対応して配列されたフォトダイオードアレイ、測定光の光路上に配置された試料室及び前記フォトダイオードアレイの各受光素子に蓄積された電荷を読み出す信号読出し部からなる受光部と、を備えた分光光度計において、
前記受光部は前記フォトダイオードアレイの受光素子ごとに電荷蓄積時間が設定できるものであって、
前記フォトダイオードアレイの各受光素子の電荷蓄積時間を制御する制御部をさらに備え、
前記制御部は、前記光源の発光スペクトルにおいて予め設定されたしきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を相対的に短くすることを特徴とする分光光度計。
Photodiode array in which a light source, an optical system that splits light from the light source, and a plurality of light-receiving elements that receive light dispersed by the optical system and perform photoelectric conversion are arranged corresponding to the spectral light, measurement In a spectrophotometer comprising: a sample chamber arranged on the optical path of light; and a light receiving portion comprising a signal reading portion for reading out charges accumulated in each light receiving element of the photodiode array.
The light receiving unit can set a charge accumulation time for each light receiving element of the photodiode array,
A control unit for controlling the charge accumulation time of each light receiving element of the photodiode array;
The control unit relatively shortens a charge accumulation time of a light receiving element corresponding to a wavelength band showing a spectral intensity exceeding a preset threshold in an emission spectrum of the light source.
前記制御部は、前記発光スペクトルにおいて前記しきい値を上回るスペクトル強度を示す波長帯域のピークスペクトル強度と前記しきい値との比率に基づいて、前記しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間をその他の受光素子の電荷蓄積時間よりも一律に短く設定するようになっている請求項1に記載の分光光度計。 The control unit sets the wavelength band indicating the spectral intensity exceeding the threshold based on the ratio of the peak spectral intensity of the wavelength band indicating the spectral intensity exceeding the threshold in the emission spectrum to the threshold. 2. The spectrophotometer according to claim 1, wherein the charge accumulation time of the corresponding light receiving element is set to be uniformly shorter than the charge accumulation time of the other light receiving elements. 前記光源は、測定波長範囲内の発光スペクトルに輝線波長帯域がピークとして存在する光を発生させるものであり、
前記しきい値は前記輝線波長帯域のみが上回るように設定されたものである請求項1又は2に記載の分光光度計。
The light source generates light having an emission line wavelength band as a peak in an emission spectrum within a measurement wavelength range,
The spectrophotometer according to claim 1 or 2, wherein the threshold is set so that only the emission line wavelength band is exceeded.
前記光源は重水素ランプとタングステンハロゲンランプが同時点灯するものであって、
前記輝線波長帯域は656nmを中心とした波長帯域である請求項3に記載の分光光度計。
The light source is one in which a deuterium lamp and a tungsten halogen lamp are turned on simultaneously,
The spectrophotometer according to claim 3, wherein the bright line wavelength band is a wavelength band centered at 656 nm.
光源と、前記光源からの光を分光する光学系と、前記光学系により分光された光を受光して光電変換を行なうために分光光に対応して配列されたフォトダイオードアレイ及び前記フォトダイオードアレイの各受光素子に蓄積された電荷を読み出す信号読出し部からなる受光部とを備えた分光光度計を用いた測定方法において、
前記受光部の信号読出し部として前記フォトダイオードアレイの受光素子ごとに電荷蓄積時間が設定できるようになっているものを使用し、
試料が設置されていない状態で前記光源の発光スペクトルを測定し、その発光スペクトルに基づいてしきい値を設定し、前記発光スペクトルにおいて設定したしきい値を超えるスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を相対的に短く設定するようにしたことを特徴とする測定方法。
A light source, an optical system that splits light from the light source, a photodiode array that is arranged corresponding to the spectral light to receive light dispersed by the optical system and perform photoelectric conversion, and the photodiode array In a measuring method using a spectrophotometer provided with a light receiving unit consisting of a signal reading unit for reading out the electric charge accumulated in each light receiving element,
Use the one that can set the charge accumulation time for each light receiving element of the photodiode array as the signal reading unit of the light receiving unit,
Measure the emission spectrum of the light source without a sample installed, set a threshold based on the emission spectrum, and correspond to the wavelength band indicating the spectral intensity exceeding the threshold set in the emission spectrum A measurement method characterized in that the charge accumulation time of the light receiving element is set to be relatively short.
前記しきい値を超えるスペクトル強度を示す波長帯域のピークスペクトル強度と前記しきい値との比率に基づいて、前記しきい値を上回るスペクトル強度を示す波長帯域に対応する受光素子の電荷蓄積時間を他の受光素子の電荷蓄積時間よりも一律に短く設定する請求項5に記載の測定方法。 Based on the ratio between the peak spectral intensity of the wavelength band showing the spectral intensity exceeding the threshold and the threshold, the charge accumulation time of the light receiving element corresponding to the wavelength band showing the spectral intensity exceeding the threshold is calculated. The measurement method according to claim 5, wherein the measurement is set to be uniformly shorter than the charge accumulation time of the other light receiving elements.
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