JP2007036202A - 高解像度cmosイメージセンサのためのスタック型ピクセル - Google Patents
高解像度cmosイメージセンサのためのスタック型ピクセル Download PDFInfo
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
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- H10F39/12—Image sensors
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- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
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- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
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- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
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- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
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- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/80—Constructional details of image sensors
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Abstract
【解決手段】ピクセルは、シリコンバルクからフォトダイオードと隣接したシリコン表面に位置した分離された電荷貯蔵構造まで光−発生電荷を転換するように標準フォトサイト下に特殊電位バリアを含む。したがって、本発明のピクセルはその上部に所定の光吸収カラーフィルタなくても2個のカラー−コーディングされる信号を検出する能力を有する。このようなスタックフォトサイトを利用して構成されたイメージセンサは、高いピクセル密度、より高解像度及びより高感度を有する。また、本発明は相違した深くに位置になった電位バリアを有するピクセルをアレイで統合することによって、所定のカラーフィルタない高解像度CMOSカラーイメージセンサを形成することが可能である。
【選択図】図2
Description
Claims (14)
- ピクセルアレイを含むイメージセンサにおいて、
前記ピクセルアレイの少なくともいずれか1つのピクセルは、
半導体基板の表面下部の第1領域に形成され、光−発生された電荷(photo-generated carriers)を捕集する標準光感知/電荷貯蔵領域と、
前記標準光感知/電荷貯蔵領域と分離され、前記半導体基板の表面に近接した領域に形成されて分離された電荷貯蔵領域と、
前記半導体基板の内部の前記第1領域下部の第2領域で光−発生された電荷を前記分離された電荷貯蔵領域に転換(diverting)するために、前記第1領域と第2領域との間の前記半導体基板の内部に形成された電位バリアと
を含むことを特徴とするイメージセンサ。 - 前記分離された電荷貯蔵領域は、フローティング拡散であることを特徴とする請求項1に記載のイメージセンサ。
- 前記分離された電荷貯蔵領域は、前記半導体基板の表面でゲート電極下に生成された電位ウェルであることを特徴とする請求項1に記載のイメージセンサ。
- 前記標準光感知/電荷貯蔵領域と前記分離された電荷貯蔵領域とは、共通電荷検出ノードとインターフェスすることを特徴とする請求項3に記載のイメージセンサ。
- 前記ピクセルアレイは、チェッカーボード方式でアライメントされ、マゼンタフィルタを有するピクセルとシアンフィルタを有するピクセルとから構成されることを特徴とする請求項1ないし請求項4のいずれか一項に記載のイメージセンサ。
- 前記ピクセルアレイは、チェッカーボード方式でアライメントされ、シアンフィルタを有するピクセルとカラーフィルタがないピクセルとから構成されることを特徴とする請求項1ないし請求項4のいずれか一項に記載のイメージセンサ。
- 前記ピクセルアレイは、カラーフィルタなしに前記半導体基板の表面から相互に異なる深さで前記電位バリアが形成されたピクセルがチェッカーボード方式でアライメントされて構成されることを特徴とする請求項1ないし請求項4のいずれか一項に記載のイメージセンサ。
- 前記シアンフィルタを有するピクセルとカラーフィルタがないピクセルとは、相互に異なる変換ゲインファクターを有することを特徴とする請求項6に記載のイメージセンサ。
- 前記相互に異なる深さで前記電位バリアが形成されたピクセルは、相互に異なる変換ゲインファクターを有することを特徴とする請求項7に記載のイメージセンサ。
- 前記標準光感知/電荷貯蔵領域は、ピンドフォトダイオードであることを特徴とする請求項1ないし請求項4のいずれか一項に記載のイメージセンサ。
- ピクセルアレイを含むイメージセンサにおいて、
前記ピクセルアレイは、第1カラーフィルタを有するピクセルと第2カラーフィルタを有するピクセルとがチェックボード方式でアライメントされ、
前記第1カラーフィルタを有するピクセルは、標準のフォトサイトを有し、
前記第2カラーフィルタを有するピクセルは、スタックフォトサイトを有することを特徴とするイメージセンサ。 - 相互隣接した前記第1カラーフィルタを有するピクセルと前記第2カラーフィルタを有するピクセルとは、共有されたピクセル信号読み出し回路を有することを特徴とする請求項11に記載のイメージセンサ。
- 前記第1カラーフィルタは、グリーンカラーフィルタであり、前記第2カラーフィルタは、マゼンタカラーフィルタであることを特徴とする請求項11または請求項12に記載のイメージセンサ。
- 前記第1カラーフィルタは、レッドカラーフィルタであり、前記第2カラーフィルタは、シアンカラーフィルタであることを特徴とする請求項11または請求項12に記載のイメージセンサ。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2005-0068469 | 2005-07-27 | ||
| KR1020050068469A KR100760142B1 (ko) | 2005-07-27 | 2005-07-27 | 고해상도 cmos 이미지 센서를 위한 스택형 픽셀 |
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| JP2013033449A Division JP2013153174A (ja) | 2005-07-27 | 2013-02-22 | 高解像度cmosイメージセンサのためのスタック型ピクセル |
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| JP2007036202A true JP2007036202A (ja) | 2007-02-08 |
| JP5252783B2 JP5252783B2 (ja) | 2013-07-31 |
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| JP2013033449A Pending JP2013153174A (ja) | 2005-07-27 | 2013-02-22 | 高解像度cmosイメージセンサのためのスタック型ピクセル |
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| US (2) | US7737475B2 (ja) |
| JP (2) | JP5252783B2 (ja) |
| KR (1) | KR100760142B1 (ja) |
| CN (2) | CN101866939B (ja) |
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- 2006-05-15 TW TW095117065A patent/TWI306286B/zh active
- 2006-06-06 JP JP2006157213A patent/JP5252783B2/ja active Active
- 2006-06-27 CN CN2010101979497A patent/CN101866939B/zh active Active
- 2006-06-27 CN CN2006100905485A patent/CN1905202B/zh active Active
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| WO2009019813A1 (ja) * | 2007-08-09 | 2009-02-12 | Panasonic Corporation | 固体撮像装置 |
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Also Published As
| Publication number | Publication date |
|---|---|
| KR100760142B1 (ko) | 2007-09-18 |
| CN1905202B (zh) | 2010-07-28 |
| KR20070013832A (ko) | 2007-01-31 |
| US20100224947A1 (en) | 2010-09-09 |
| US7737475B2 (en) | 2010-06-15 |
| JP5252783B2 (ja) | 2013-07-31 |
| US20070023801A1 (en) | 2007-02-01 |
| TW200705609A (en) | 2007-02-01 |
| TWI306286B (en) | 2009-02-11 |
| CN1905202A (zh) | 2007-01-31 |
| US8686479B2 (en) | 2014-04-01 |
| CN101866939A (zh) | 2010-10-20 |
| JP2013153174A (ja) | 2013-08-08 |
| CN101866939B (zh) | 2012-11-28 |
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