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JP2006032436A - Electronic device manufacturing method, soldering method, and heat shielding jig - Google Patents

Electronic device manufacturing method, soldering method, and heat shielding jig Download PDF

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JP2006032436A
JP2006032436A JP2004205227A JP2004205227A JP2006032436A JP 2006032436 A JP2006032436 A JP 2006032436A JP 2004205227 A JP2004205227 A JP 2004205227A JP 2004205227 A JP2004205227 A JP 2004205227A JP 2006032436 A JP2006032436 A JP 2006032436A
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heat
soldering
component
solder
jig
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Tetsuya Nakatsuka
哲也 中塚
Koji Serizawa
弘二 芹沢
Shosaku Ishihara
昌作 石原
Toshio Saeki
敏男 佐伯
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Hitachi Ltd
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Priority to PCT/JP2004/011980 priority patent/WO2006006253A1/en
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3494Heating methods for reflowing of solder
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621Components characterised by their electrical contacts
    • H05K2201/10734Ball grid array [BGA]; Bump grid array
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/11Treatments characterised by their effect, e.g. heating, cooling, roughening
    • H05K2203/1121Cooling, e.g. specific areas of a PCB being cooled during reflow soldering
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/30Details of processes not otherwise provided for in H05K2203/01 - H05K2203/17
    • H05K2203/304Protecting a component during manufacturing

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

【課題】リフロー温度の高いはんだを用いても、耐熱温度220℃程度の低耐熱性部品を実装できる。
【解決手段】表面実装部品12上に、熱吸収部材11を備える熱遮蔽治具20を、熱吸収部材11が表面実装部品12に接触する状態で積載して加熱することによりはんだ付けを行う。
【選択図】 図3
A low heat-resistant component having a heat resistant temperature of about 220 ° C. can be mounted even using solder having a high reflow temperature.
A heat shielding jig 20 including a heat absorbing member 11 is mounted on the surface mounting component 12 and soldered by loading and heating in a state where the heat absorbing member 11 is in contact with the surface mounting component 12.
[Selection] Figure 3

Description

本発明は、混載実装、特に、毒性の少ないPbフリーはんだ合金を用いたはんだ付けに好適なはんだ付け方法と、それに用いられる熱遮蔽治具と、それを用いる電子装置の製造方法法とに関する。   The present invention relates to a soldering method suitable for mixed mounting, particularly soldering using a Pb-free solder alloy with low toxicity, a heat shielding jig used therefor, and a method for manufacturing an electronic device using the same.

有機基板等の回路基板へのはんだ付けに従来より用いられている方法としては、大別して、回路基板に熱風を吹き付け、電極に印刷されたはんだペーストを溶融させて表面実装部品のはんだ付けを行うリフローはんだ付け工程と、溶融したはんだの噴流を回路基板に接触させて挿入実装部品やチップ部品などの一部の表面実装部品のはんだ付けを行うフローはんだ付け工程とがある。これらのはんだ付け方法のことを混載実装方法と称する。   Conventional methods for soldering to circuit boards such as organic substrates are broadly classified as follows: hot air is blown onto the circuit board, and solder paste printed on the electrodes is melted to solder the surface mount components. There are a reflow soldering process and a flow soldering process in which a molten solder jet is brought into contact with a circuit board to solder part of surface mount components such as insertion mounted components and chip components. These soldering methods are referred to as a mixed mounting method.

近年、この混載実装方法において用いられるはんだ(リフローはんだ付け工程でははんだペースト、フローはんだ付け工程にでは溶融したはんだの噴流)には、毒性の少ないPbフリーはんだ合金を使用するという要求が生じてきている。このPbフリーはんだ合金は、有機基板等の回路基板への電子部品の接続に適用でき、220℃付近でのはんだ付けに用いられているSn−37Pbはんだ(単位:質量%)の代替品である。   In recent years, there has been a demand for using a Pb-free solder alloy with low toxicity for the solder used in this mixed mounting method (a solder paste in the reflow soldering process and a molten solder jet in the flow soldering process). Yes. This Pb-free solder alloy is applicable to the connection of electronic components to circuit boards such as organic substrates, and is an alternative to Sn-37Pb solder (unit: mass%) used for soldering at around 220 ° C. .

Pbフリーはんだを用いた実装方法に関する従来技術としては、特開平10−166178号公報(従来技術1)、特開平11−179586号公報(従来技術2)、特開平11−221694号公報(従来技術3)、特開平11−354919号公報(従来技術4)、特開2001−168519号公報(従来技術5)、特開2001−36233号公報(従来技術6)などが知られている。   As conventional techniques related to a mounting method using Pb-free solder, Japanese Patent Laid-Open Nos. 10-166178 (prior art 1), Japanese Patent Laid-Open No. 11-179586 (prior art 2), Japanese Patent Laid-Open No. 11-221694 (prior art). 3), JP-A No. 11-354919 (prior art 4), JP-A No. 2001-168519 (prior art 5), JP-A No. 2001-36233 (prior art 6), and the like are known.

従来技術1には、Pbフリーはんだとして、Sn−Ag−Bi系はんだ、或いはSn−Ag−Bi−Cu系はんだ合金が記載されている。従来技術2には、Pbフリーはんだとして有力なSn−Ag−Bi系はんだを、表面にSn−Bi系層を施した電極と接続することが記載されている。従来技術3には、電子部品を、有機基板の第1面及び第2面からなる両面の各々に、Snを主成分とし、Biを0〜65質量%、Agを0.5〜4.0質量%、Cu若しくは/及びInを合計0〜3.0質量%含有するPbフリーはんだによってリフローはんだ付けすることが記載されている。   Prior art 1 describes Sn—Ag—Bi solder or Sn—Ag—Bi—Cu solder alloy as Pb-free solder. Prior art 2 describes connecting Sn-Ag-Bi solder, which is effective as Pb-free solder, to an electrode having a Sn-Bi layer on its surface. In Prior Art 3, the electronic component is composed of Sn as a main component on each of the first surface and the second surface of the organic substrate, Bi is 0 to 65 mass%, and Ag is 0.5 to 4.0. It is described that reflow soldering is performed with Pb-free solder containing 0 to 3.0% by mass of Cu, and / or In by mass%.

従来技術4には、Biを含有するPbフリーはんだを用いて電子部品と回路基板とを接続する方法において、はんだを約10〜20℃/sの冷却速度で冷却することが記載されている。従来技術5には、基板のA面でリフローはんだ付けによって電子部品を表面接続実装し、ついで基板のB面でフローはんだ付けにより、A面側から挿入した電子部品のリードを電極にフローはんだ付けして接続実装する方法において、A面側でリフローはんだ付けに用いるはんだを、Sn−(1.5〜3.5wt%)Ag−(0.2〜0.8wt%)Cu−(0〜4wt%)In−(0〜2wt%)Biの組成で構成されるPbフリーはんだであり、B面側でフローはんだ付けに用いるはんだを、Sn−(0〜3.5wt%)Ag−(0.2〜0.8wt%)Cuの組成で構成されるPbフリーはんだであることが記載されている。   Prior art 4 describes that in a method of connecting an electronic component and a circuit board using Pb-free solder containing Bi, the solder is cooled at a cooling rate of about 10 to 20 ° C./s. In the prior art 5, electronic parts are surface-mounted by reflow soldering on the A side of the board, and then the solder of the electronic parts inserted from the A side is flow soldered to the electrodes by flow soldering on the B side of the board. In the connection mounting method, the solder used for reflow soldering on the A side is Sn- (1.5 to 3.5 wt%) Ag- (0.2 to 0.8 wt%) Cu- (0 to 4 wt. %) In- (0 to 2 wt%) Bi, which is a Pb-free solder having a composition of Sn- (0 to 3.5 wt%) Ag- (0. 2 to 0.8 wt%) Pb-free solder composed of Cu.

従来技術6には、フローはんだ付けを従来のSn−37Pbよりも高融点の共晶組成のPbフリーはんだを用いて行う際、部品本体と基板との間に熱伝導材料を設けることにより、はんだ付け後の基板冷却時に有機基板と電子部品本体との間の温度差が大きくならないようにすることが記載されている。   In prior art 6, when performing flow soldering using a Pb-free solder having a eutectic composition having a melting point higher than that of conventional Sn-37Pb, a heat conductive material is provided between the component main body and the substrate to provide solder. It is described that the temperature difference between the organic substrate and the electronic component main body is not increased when the substrate is cooled after being attached.

特開平10−166178号公報JP-A-10-166178 特開平11−179586号公報JP 11-179586 A 特開平11−221694号公報JP-A-11-221694 特開平11−354919号公報Japanese Patent Laid-Open No. 11-354919 特開2001−168519号公報JP 2001-168519 A 特開2001−36233号公報JP 2001-36233 A

これらPbフリーはんだとしてよく用いられるSn−Ag−Cu−In系はんだは、表1に示すように、Inの含有量が多いほど、低い温度でリフローすることができるため表面実装部品の温度上昇を抑えることができる。   As shown in Table 1, Sn-Ag-Cu-In solder often used as Pb-free solder can be reflowed at a lower temperature as the In content increases. Can be suppressed.

Figure 2006032436
その反面、Sn−Ag−Cu−In系はんだはInの含有量に応じて温度サイクル寿命が短くなる傾向にあり、−55℃〜125℃、1サイクル/時間の条件の温度サイクル試験における1500サイクル程度の温度サイクル寿命といった高い接続信頼性を実現するためには、Inの含有量を5%程度を限度として低く抑える必要がある(Inを含まないSn−3Ag−0.5Cuの温度サイクル寿命は1800サイクル程度)。
Figure 2006032436
On the other hand, Sn-Ag-Cu-In solders tend to have a short temperature cycle life depending on the In content, and 1500 cycles in a temperature cycle test at -55 ° C to 125 ° C and 1 cycle / hour. In order to realize high connection reliability such as a temperature cycle life of about, it is necessary to keep the In content as low as about 5% (the temperature cycle life of Sn-3Ag-0.5Cu not containing In is About 1800 cycles).

そこで本発明は、Inを含まないSn−3Ag−0.5CuはんだやIn含有量の低いSn−Ag−Cu−In系はんだのようにリフロー温度の高いはんだを用いても、低耐熱性部品を実装することのできる実装部品のはんだ付け方法及び熱遮蔽治具と、それらを用いた電子装置の製造方法とを提供することを目的とする。   Therefore, the present invention provides a low heat-resistant component even when a solder having a high reflow temperature such as a Sn-3Ag-0.5Cu solder not containing In or a Sn-Ag-Cu-In solder having a low In content is used. It is an object of the present invention to provide a mounting component soldering method and a heat shielding jig that can be mounted, and an electronic device manufacturing method using them.

上記目的を達成するため、本発明では、表面実装部品上に、熱吸収部材を備える熱遮蔽治具を、熱吸収部材が該表面実装部品に接触する状態で積載して加熱することによりはんだ付けを行うことはんだ付け方法が提供される。本発明で用いられる熱遮蔽治具は、熱吸収部材の表面実装部品に接触する面に設けられた高さ規定治具をさらに備えることが望ましい。なお、はんだ付けした後のはんだバンプ高さは、熱遮蔽治具を積載せずにはんだ付けした後のはんだバンプ高さの65%以上95%以下であることが望ましい。   In order to achieve the above object, in the present invention, a heat shielding jig provided with a heat absorbing member is mounted on a surface mount component and soldered by loading and heating in a state where the heat absorption member is in contact with the surface mount component. A soldering method is provided. It is desirable that the heat shielding jig used in the present invention further includes a height defining jig provided on the surface of the heat absorbing member that contacts the surface-mounted component. The solder bump height after soldering is desirably 65% or more and 95% or less of the solder bump height after soldering without mounting the heat shielding jig.

さらに本発明では、熱吸収部材と、該熱吸収部材の表裏一方の面に設けられた高さ規定治具とを備えるはんだ付け用熱遮蔽治具が提供される。本発明で用いられる熱吸収部材は、アルミニウム又はアルミニウム合金からなることが望ましい。   Furthermore, in this invention, the heat shielding jig for soldering provided with a heat absorption member and the height prescription | regulation jig | tool provided in one surface of the front and back of this heat absorption member is provided. The heat absorbing member used in the present invention is preferably made of aluminum or an aluminum alloy.

また本発明では、表面実装部品を回路基板に搭載する部品搭載工程を備え、該部品搭載工程が、上述した本発明のはんだ付け方法を用いて表面実装部品を回路基板にはんだ付けする工程を備える電子装置の製造方法が提供される。部品搭載工程以外の工程については、特に制限されるものではなく、通常の工程をそのまま適用することができる。   The present invention further includes a component mounting step of mounting the surface mount component on the circuit board, and the component mounting step includes a step of soldering the surface mount component to the circuit substrate using the soldering method of the present invention described above. A method for manufacturing an electronic device is provided. Processes other than the component mounting process are not particularly limited, and normal processes can be applied as they are.

本発明によれば、リフロー温度の高いはんだを用いても、耐熱温度220℃程度の低耐熱性部品を実装することができる。   According to the present invention, it is possible to mount a low heat resistant component having a heat resistant temperature of about 220 ° C. even when using a solder having a high reflow temperature.

本発明では、例えば、バンプ接続を行う低耐熱部品(耐熱温度220℃)を含む表面実装部品12を回路基板15上にはんだペースト14を用いてはんだ付けを行うリフローはんだ付け工程において、図1(a)のようにバンプ接続を行う表面実装部品12のパッケージ上面に大熱容量のバルク材である熱吸収部材11を積載し、表面実装部品12と接触させて、表面実装部品12の外部接続端子13を基板15にリフローはんだ付けすることにより、図1(b)に示すようにリフローはんだ付けした後の表面実装部品12のはんだバンプ16の高さが、バルク材を積載せずリフローはんだ付けした後の平均はんだバンプ高さの65%〜95%となるようにする。   In the present invention, for example, in a reflow soldering process in which a surface mount component 12 including a low heat resistance component (heat resistant temperature 220 ° C.) for bump connection is soldered on a circuit board 15 using a solder paste 14, FIG. As shown in a), the heat-absorbing member 11 that is a bulk material having a large heat capacity is placed on the upper surface of the package of the surface-mounted component 12 to be bump-connected, and brought into contact with the surface-mounted component 12, so that the external connection terminals 13 of the surface-mounted component 12 are connected. After the reflow soldering is performed on the substrate 15, the height of the solder bumps 16 of the surface mount component 12 after the reflow soldering as shown in FIG. The average solder bump height is 65% to 95%.

なお、65%未満の場合、バンプが過度にパッケージに押しつぶされた状態となり、バンプが基板と低耐熱部品のパッケージの間に生ずるひずみの緩和が困難となるため、温度サイクル試験をしたときの接続部破断寿命面が著しく低下することがある。   If it is less than 65%, the bumps are excessively crushed by the package, and it becomes difficult to relieve the strain that the bumps cause between the substrate and the package of the low heat resistant parts. The partial fracture life may be significantly reduced.

また、95%を越える場合には、載置した熱吸収部材11が軽すぎる(すなわちバルク材の熱容量が小さすぎる)ため、リフローはんだ付け中バルク材の温度が急速に上昇してしまい十分な熱遮蔽ができなくなることが多い。また、高さ規定治具を用いるなどして十分な熱容量の熱吸収部材11を用いている場合であっても、このようにバンプの沈み込みが少ない場合は、リフローはんだ付け中にバンプ高さが局所的に一定でなくなる際、最もバンプ高さが低くなる場所でバルク材とパッケージが離れてしまう瞬間があるため、パッケージの熱をバルク材が十分に吸収しきれず、熱遮蔽が不十分となる場合がある。   On the other hand, if it exceeds 95%, the mounted heat absorbing member 11 is too light (that is, the heat capacity of the bulk material is too small), so that the temperature of the bulk material rises rapidly during reflow soldering and sufficient heat is generated. It is often impossible to shield. Even when the heat absorbing member 11 having a sufficient heat capacity is used by using a height regulating jig or the like, if the sinking of the bump is small as described above, the bump height during reflow soldering is used. When there is no local constant, there is a moment when the bulk material is separated from the package at the place where the bump height is the lowest, so the bulk material cannot fully absorb the heat of the package and the heat shielding is insufficient. There is a case.

この熱吸収部材11を用いない場合の65%〜95%というバンプ高さを実現するため、本発明では、図2に示す熱遮蔽治具20を用いることができる。この治具20を図3(a)に示すように表面実装部品12上に載置してはんだリフローを行うことで、リフローはんだ付けした後の表面実装部品12のはんだバンプ16の高さが所定の値(バルク材11を積載せずにリフローはんだ付けした後の平均はんだバンプ高さの65%〜95%程度が望ましい)に達すると、図3(b)に示すように治具20に設けられた高さ規定部材21の端部が基板15に接触することでパッケージの沈みこみが抑えられる。これにより、本発明では、バンプ高さ及び実装部品の上面の高さを一定に保つことができるとともに、実装部品が傾くことも回避できる。   In order to realize a bump height of 65% to 95% when this heat absorbing member 11 is not used, the heat shielding jig 20 shown in FIG. 2 can be used in the present invention. The jig 20 is placed on the surface mount component 12 as shown in FIG. 3A and solder reflow is performed, so that the height of the solder bumps 16 of the surface mount component 12 after reflow soldering is predetermined. 3 (preferably about 65% to 95% of the average solder bump height after reflow soldering without loading the bulk material 11) is provided in the jig 20 as shown in FIG. The sinking of the package is suppressed by the end of the height regulating member 21 being in contact with the substrate 15. Accordingly, in the present invention, the bump height and the height of the upper surface of the mounting component can be kept constant, and the mounting component can be prevented from being inclined.

このような高さ規定部材21を備える治具20を用いる場合には、バンプ高さが用いない場合の95%を越える場合でも、載置した熱吸収部材11が軽すぎる(すなわちバルク材の熱容量が小さすぎる)わけではないため熱容量の点では問題とならない。   When using the jig 20 provided with such a height regulating member 21, even when the bump height exceeds 95% of the case where the bump height is not used, the mounted heat absorbing member 11 is too light (that is, the heat capacity of the bulk material). Is not too small), so there is no problem in terms of heat capacity.

なお、熱遮蔽治具20の熱吸収部材11には、熱容量の点からアルミニウム又はアルミニウム系合金を用いることが望ましい。アルミニウム又はアルミニウム系合金は、金属材料の中で比較的比熱が大きく低耐熱部品から多くの熱を吸収できるためである。また、一般的なリフロー炉は赤外線ヒーターと熱風の併用により基板や部品の加熱がなされるが、アルミニウム又はアルミニウム系合金は赤外線反射率が金や銀と同様に大きく、さらに材料の表面に不導態の形成がなされるため表面の状態が変化しにくい上、低コストであることが利点として挙げられる。   The heat absorbing member 11 of the heat shielding jig 20 is desirably made of aluminum or an aluminum-based alloy from the viewpoint of heat capacity. This is because aluminum or an aluminum-based alloy has a relatively large specific heat among metal materials and can absorb a lot of heat from a low heat-resistant component. In general reflow furnaces, substrates and parts are heated by using both an infrared heater and hot air, but aluminum or aluminum-based alloys have a high infrared reflectance similar to gold and silver, and are not conductive to the surface of the material. Since the state is formed, the state of the surface is hardly changed, and the cost is mentioned as an advantage.

また、耐熱温度220℃程度の低耐熱部品は熱容量の小さい小型のものが多く、多くの場合リフローはんだ付けする際に基板内で最高温度となるため、板材の積載では部品から十分な熱を吸収できない場合がある。このため、熱吸収部材11はある程度の高さ及び体積を有するバルク材とすることが望ましい。さらに、バンプ接続を行う表面実装部品12と基板15との間を流れるリフロー炉の熱風を妨げないよう、熱吸収部材は部品12の上面(基板とは反対側の面)に載置することが望ましい。   In addition, many heat-resistant parts with a heat-resistant temperature of around 220 ° C are small and have a small heat capacity. In many cases, the maximum temperature is reached in the circuit board when reflow soldering is performed. There are cases where it is not possible. For this reason, it is desirable that the heat absorbing member 11 be a bulk material having a certain height and volume. Further, the heat absorbing member may be placed on the upper surface of the component 12 (the surface opposite to the substrate) so as not to hinder the hot air of the reflow furnace flowing between the surface-mounted component 12 and the substrate 15 that perform bump connection. desirable.

以下、本発明の実施の形態について、具体例を用いて詳細に説明するが、本発明はこれに限定されるものではない。また、ここでははんだリフローによるはんだ付けを例にとって説明したが、本発明はこれに限定されるものではなく、フローはんだ付けなど他の混載実装方法を用いる場合にも適用可能である。   Hereinafter, although an embodiment of the present invention is described in detail using a specific example, the present invention is not limited to this. In addition, here, soldering by solder reflow has been described as an example, but the present invention is not limited to this, and can also be applied to the case of using other mixed mounting methods such as flow soldering.

低耐熱部品であるフルグリッドBGA(耐熱温度:220℃、部品サイズ:17mm×17mm、バンプピッチ:1mm、バンプ数:256、バンプはんだ組成:Sn−37Pb)パッケージ12を、はんだペースト(組成:Sn−3Ag−0.5Cu−5In、供給厚:0.15mm)14を印刷した回路基板15に載置し、このフルグリッドBGAのパッケージ部上に熱遮断治具20としてアルミニウム製のバルク材11(サイズ:17mm×17mm、厚み:4mm)を積載してリフローはんだ付けをした。リフローの条件は、Sn−3Ag−0.5Cuはんだペーストでリフローできる条件とした。このフルグリッドBGA上にバルク材11を搭載しない状態でリフローすると平均バンプ高さは0.75mmとなることがわかっている。   Full grid BGA (heat resistant temperature: 220 ° C., component size: 17 mm × 17 mm, bump pitch: 1 mm, bump number: 256, bump solder composition: Sn-37Pb), which is a low heat resistant component, is packaged with solder paste (composition: Sn -3Ag-0.5Cu-5In, supply thickness: 0.15 mm) 14 is placed on a printed circuit board 15, and an aluminum bulk material 11 (as a heat shielding jig 20) is placed on the package portion of the full grid BGA. (Size: 17 mm × 17 mm, thickness: 4 mm) and reflow soldering. The reflow conditions were such that reflow was possible with Sn-3Ag-0.5Cu solder paste. It is known that the average bump height is 0.75 mm when reflow is performed without mounting the bulk material 11 on the full grid BGA.

また、比較のため(1)フルグリッドBGA全体を完全に覆いBGAには非接触の厚さ1mmのアルミニウム製のカバー型熱遮蔽治具を用いる場合、(2)熱遮蔽治具を用いない場合についても、リフローはんだ付けを行った。   For comparison, (1) when the full grid BGA is completely covered and a non-contact aluminum cover type heat shield jig with a thickness of 1 mm is used for the BGA, and (2) when no heat shield jig is used. Also, reflow soldering was performed.

はんだ付けに際しては、低耐熱部品(フルグリッドBGA)12のパッケージ部が耐熱温度の220℃を超えないようにはんだ付けを行う前に温度プロファイルの調整を行った。リフローはんだ付けの際の、部品周辺の各部の温度を表2に示す。   During soldering, the temperature profile was adjusted before soldering so that the package portion of the low heat resistant component (full grid BGA) 12 did not exceed the heat resistant temperature of 220 ° C. Table 2 shows the temperature of each part around the part during reflow soldering.

Figure 2006032436
これによれば、カバー型熱遮蔽治具の使用は、低耐熱部品(フルグリッドBGA)のバンプ部の温度をできるだけ低下させずにパッケージ部の温度を低下させる効果が殆ど無く、治具を使用しない場合と殆ど差がないことがわかった。
Figure 2006032436
According to this, the use of a cover-type heat shield jig has little effect on lowering the temperature of the package part without reducing the temperature of the bump part of the low heat-resistant component (full grid BGA) as much as possible, and the jig is used. It was found that there was almost no difference from the case of not doing.

従って、治具不使用の場合や、カバー型熱遮蔽治具の使用の場合は、パッケージ部の温度を218℃乃至219℃の耐熱温度以下でリフローはんだ付けする場合、はんだ付けが行われるバンプ部は、216℃乃至217℃にしか到達せず、Sn−3Ag−0.5Cu−5Inがはんだ付けできる最低温度である215℃に対して1℃乃至2℃のマージンしか確保できないことになる(表1)。   Therefore, when the jig is not used or when the cover type heat shield jig is used, when reflow soldering is performed at a temperature of the package portion below the heat resistant temperature of 218 ° C. to 219 ° C., the bump portion to be soldered is performed. Can reach only 216 ° C. to 217 ° C., and only a margin of 1 ° C. to 2 ° C. can be secured with respect to 215 ° C. which is the lowest temperature at which Sn-3Ag-0.5Cu-5In can be soldered (Table 1).

一方、バルク状熱遮蔽治具20を使用する場合、はんだ付けが行われるバンプ部は、222℃乃至223℃に到達し、7℃乃至8℃のマージンが得られる。   On the other hand, when the bulk heat shielding jig 20 is used, the bump portion to be soldered reaches 222 ° C. to 223 ° C., and a margin of 7 ° C. to 8 ° C. is obtained.

また、バルク状熱遮蔽治具20を使用する場合、リフローはんだ付けした後の表面実装部品のはんだバンプ高さが、バルク材を積載せずリフローはんだ付けした後の平均はんだバンプ高さの70%となり、著しい接続信頼性の低下を引き起こさない通常の接続部形状が得られることも確認した。   When the bulk heat shielding jig 20 is used, the solder bump height of the surface mount component after reflow soldering is 70% of the average solder bump height after reflow soldering without loading the bulk material. Thus, it was also confirmed that a normal connection shape that does not cause a significant decrease in connection reliability can be obtained.

用いる熱遮蔽治具の形状が異なる以外は実施例1と同様にしてフルグリッドBGAのリフローはんだ付けを行った。本実施例で用いた熱遮蔽治具20は、図2に示すように、熱吸収部材11の下面四隅に円柱状の高さ規定部材21を4本備える。なお、図2(a)は上面すなわち積載時に上になる面の側から見た斜視図であり、図2(b)は下面すなわち積載時に実装部品に接触する面の側から見た斜視図である。   Full grid BGA reflow soldering was performed in the same manner as in Example 1 except that the shape of the heat shielding jig used was different. As shown in FIG. 2, the heat shielding jig 20 used in the present embodiment includes four columnar height regulating members 21 at the four corners of the lower surface of the heat absorbing member 11. 2A is a perspective view seen from the side of the upper surface, that is, the surface that becomes upper when loaded, and FIG. 2B is a perspective view seen from the side of the lower surface, that is, the surface that contacts the mounted component when loaded. is there.

本実施例においても、実施例1と同様、フルグリッドBGAのパッケージ部が上に積載されたバルク状熱吸収部材11によって熱遮蔽される。また、本実施例では、実施例1の場合と異なり、熱遮蔽部材20が高さ規定部材21を備えているため、リフローはんだ付けした後の表面実装部品のはんだバンプ高さが、バルク材を積載せずリフローはんだ付けした後の平均はんだバンプ高さの90%に達すると、治具21の端部が基板15に接触することによりパッケージの沈みこみが抑えられる。   Also in the present embodiment, as in the first embodiment, the package portion of the full grid BGA is thermally shielded by the bulk heat absorbing member 11 loaded thereon. Further, in the present embodiment, unlike the case of the first embodiment, since the heat shielding member 20 includes the height defining member 21, the solder bump height of the surface-mounted component after the reflow soldering is determined based on the bulk material. When the height reaches 90% of the average solder bump height after reflow soldering without being stacked, the end of the jig 21 comes into contact with the substrate 15 to suppress the sinking of the package.

本実施例では、第1の実施の形態で得られた結果との比較のために、低耐熱部品(フルグリッドBGA)12のパッケージ部が耐熱温度の218℃になるように、はんだ付けを行う前に温度プロファイルの調整を行った。本実施例におけるリフローはんだ付けの際の、部品周辺の各部の温度を表3に示す。   In this example, for comparison with the result obtained in the first embodiment, soldering is performed so that the package portion of the low heat resistant component (full grid BGA) 12 has a heat resistant temperature of 218 ° C. The temperature profile was adjusted before. Table 3 shows the temperature of each part around the component during reflow soldering in this example.

Figure 2006032436
この表からわかるように、実施例1で得られた結果と同様、本実施例の高さ規定部材21を備える熱遮蔽治具20を使用しても、はんだ付けが行われるバンプ部は223℃に到達し、Sn−3Ag−0.5Cu−5Inはんだ付け可能最低温度に対して、8℃のマージンが得られる。
Figure 2006032436
As can be seen from this table, similarly to the result obtained in Example 1, even when the heat shielding jig 20 including the height regulating member 21 of this example is used, the bump portion to be soldered is 223 ° C. And a margin of 8 ° C. is obtained for the lowest solderable temperature of Sn-3Ag-0.5Cu-5In.

また、本実施例の熱遮蔽治具20を使用する場合、リフローはんだ付けした後の表面実装部品のはんだバンプ高さが、バルク材を積載せずリフローはんだ付けした後の平均はんだバンプ高さの90%となり、著しい接続信頼性の低下を引き起こさない通常の接続部形状が得られることも確認された。   Moreover, when using the heat shielding jig 20 of the present embodiment, the solder bump height of the surface mount component after reflow soldering is equal to the average solder bump height after reflow soldering without loading the bulk material. It was also confirmed that a normal connection portion shape that does not cause a significant decrease in connection reliability was obtained.

実施例1における表面実装部品の実装方法を示す説明図である。It is explanatory drawing which shows the mounting method of the surface mounting components in Example 1. FIG. 実施例2における熱遮蔽治具の外観を示す斜視図である。It is a perspective view which shows the external appearance of the heat shielding jig | tool in Example 2. FIG. 実施例2における表面実装部品の実装例を示す説明図である。FIG. 10 is an explanatory diagram illustrating an example of mounting surface-mounted components in Example 2.

符号の説明Explanation of symbols

11…熱吸収部材、12…表面実装部品、13…外部接続端子(はんだバンプ)、14…はんだペースト、15…回路基板、16…はんだバンプ、20…熱遮蔽治具、21…高さ規定部材。   DESCRIPTION OF SYMBOLS 11 ... Heat absorption member, 12 ... Surface mount component, 13 ... External connection terminal (solder bump), 14 ... Solder paste, 15 ... Circuit board, 16 ... Solder bump, 20 ... Heat shielding jig, 21 ... Height-defining member .

Claims (7)

表面実装部品上に、熱吸収部材を備える熱遮蔽治具を、熱吸収部材が該表面実装部品に接触する状態で積載して加熱することによりはんだ付けを行うことを特徴とするはんだ付け方法。   A soldering method, comprising: mounting a heat shielding jig including a heat absorption member on a surface mount component in a state in which the heat absorption member is in contact with the surface mount component and heating. 上記熱遮蔽治具は、
上記熱吸収部材の上記表面実装部品に接触する面に設けられた高さ規定治具をさらに備えることを特徴とする請求項1記載のはんだ付け方法。
The heat shielding jig is
The soldering method according to claim 1, further comprising a height defining jig provided on a surface of the heat absorbing member that contacts the surface-mounted component.
上記熱吸収部材は、アルミニウム又はアルミニウム合金からなることを特徴とする請求項1又は2記載のはんだ付け方法。   The soldering method according to claim 1 or 2, wherein the heat absorbing member is made of aluminum or an aluminum alloy. はんだ付けした後のはんだバンプ高さが、上記熱遮蔽治具を積載せずにはんだ付けした後のはんだバンプ高さの65%以上95%以下であることを特徴とする請求項1〜3のいずれかに記載のはんだ付け方法。   The solder bump height after soldering is 65% or more and 95% or less of the solder bump height after soldering without mounting the heat shielding jig. The soldering method as described in any one. 熱吸収部材と、
上記熱吸収部材の表裏一方の面に設けられた高さ規定治具とを備えることを特徴とするはんだ付け用熱遮蔽治具。
A heat absorbing member;
A heat shielding jig for soldering, comprising: a height defining jig provided on one of the front and back surfaces of the heat absorbing member.
上記熱吸収部材は、アルミニウム又はアルミニウム合金からなることを特徴とする請求項5記載のはんだ付け用熱遮蔽治具。   6. The heat shielding jig for soldering according to claim 5, wherein the heat absorbing member is made of aluminum or an aluminum alloy. 表面実装部品を回路基板に搭載する部品搭載工程を備え、
上記部品搭載工程は、
請求項1〜4のいずれかに記載のはんだ付け方法を用いて上記表面実装部品を上記回路基板にはんだ付けする工程を備えることを特徴とする電子装置の製造方法。
It has a component mounting process for mounting surface mount components on a circuit board.
The component mounting process
A method for manufacturing an electronic device, comprising the step of soldering the surface-mounted component to the circuit board using the soldering method according to claim 1.
JP2004205227A 2004-07-12 2004-07-12 Electronic device manufacturing method, soldering method, and heat shielding jig Pending JP2006032436A (en)

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