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JP2004030864A - Write-once optical recording media - Google Patents

Write-once optical recording media Download PDF

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JP2004030864A
JP2004030864A JP2003008258A JP2003008258A JP2004030864A JP 2004030864 A JP2004030864 A JP 2004030864A JP 2003008258 A JP2003008258 A JP 2003008258A JP 2003008258 A JP2003008258 A JP 2003008258A JP 2004030864 A JP2004030864 A JP 2004030864A
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recording
layer
mark
reproduction signal
write
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JP4313048B2 (en
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Noboru Sasa
笹 登
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Ricoh Co Ltd
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Ricoh Co Ltd
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Abstract

【課題】単純層構成で安価に製造可能であり、記録再生波長に大きな制限がなく、記録特性の波長依存性が少なく、比較的高い反射率が得られ、表面記録、或いは高NAレンズによる記録に対応して高密度化が達成でき、更に、変形による記録再生においても、記録マーク長や記録パワーによって記録極性が変化せず一定であり、記録マーク部の再生波形が微分形状を示すことがなく、記録極性がHigh to Low記録となり易い光記録媒体の提供。
【解決手段】変形層と光吸収層を有し、該変形層と、該変形層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による光吸収層の発熱によって、変形層がレーザ光の入射方向に変形することで記録マークが形成される追記型光記録媒体。又は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層を有する光記録媒体。
【選択図】    図35
An object of the present invention is to provide a simple layer structure, which can be manufactured at low cost, does not have a large limitation on the recording / reproducing wavelength, has a small wavelength dependence of recording characteristics, can obtain a relatively high reflectance, and can perform surface recording or recording with a high NA lens. In addition, it is possible to achieve a high density, and in recording and reproduction by deformation, the recording polarity does not change due to the recording mark length and recording power and is constant, and the reproduction waveform of the recording mark part shows a differential shape. To provide an optical recording medium with high recording polarity and high recording potential.
A laser device includes a deformable layer and a light absorbing layer, and an interface between the deformable layer and an adjacent layer in contact with the deformable layer on a laser light incident side is used as a main reflection interface. A write-once optical recording medium in which a recording mark is formed by deforming a deformable layer in a laser beam incident direction. Alternatively, an optical recording medium having a recording layer having both a function of absorbing laser light and a function of causing deformation without being melted or decomposed by irradiation with laser light.
[Selection] Fig. 35

Description

【0001】
【発明の属する技術分野】
本発明は、追記型(WORM:Write Once Read Many )光記録媒体に係わり、特に350〜500nm程度の青色レーザ波長領域の光でも高密度の記録が可能な追記型光記録媒体に関する。
【0002】
【従来技術】
◎青色レーザ対応の追記型光記録媒体について
超高密度の記録が可能となる青色レーザの開発は急速に進んでおり、それに対応した追記型光記録媒体の開発が行われている。
従来の追記型光記録媒体では、有機材料からなる記録層にレーザ光を照射し、主に有機材料の分解・変質による屈折率変化を生じさせることで記録ピットを形成させており、記録層に用いられる有機材料の光学定数や分解挙動が、良好な記録ピットを形成させるための重要な要素となっている。
従って、記録層に用いる有機材料としては、青色レーザ波長に対する光学的性質や分解挙動の適切な材料を選択する必要がある。即ち、未記録時の反射率を高め、またレーザの照射によって有機材料が分解し大きな屈折率変化が生じるようにするため(これによって大きな変調度が得られる)、記録再生波長は大きな吸収帯の長波長側の裾に位置するように選択される。
何故ならば、有機材料の大きな吸収帯の長波長側の裾は、適度な吸収係数を有し且つ大きな屈折率が得られる波長領域となるためである。
【0003】
しかしながら、青色レーザ波長に対する光学的性質が従来並みの値を有する有機材料は未だ見出されていない。これは、青色レーザ波長近傍に吸収帯を持つ有機材料を得るためには、分子骨格を小さくするか又は共役系を短くする必要があるが、そうすると吸収係数の低下、即ち屈折率の低下を招くためである。
つまり、青色レーザ波長近傍に吸収帯を持つ有機材料は多数存在し、吸収係数を制御することは可能となるが、大きな屈折率を持たないため、大きな変調度を得ることができなくなる。
青色レーザ対応の有機材料としては、例えば、特開2001−181524号、特開2001−158865号、特開2000−343824号、特開2000−343825号、特開2000−335110号各公報に記載がある。
しかし、これらの公報では、実施例を見ても溶液と薄膜のスペクトルを測定しているのみで、記録再生に関する記載はない。
特開平11−221964号、特開平11−334206号、特開2000−43423号各公報では、実施例に記録の記載があるものの、記録波長は488nmであり、また記録条件や記録密度に関する記載はなく、良好な記録ピットが形成できた旨の記載があるのみである。
【0004】
特開平11−58955号公報では、実施例に記録の記載があるものの、記録波長は430nmであり、また記録条件や記録密度に関する記載はなく、良好な変調度が得られた旨の記載があるのみである。
特開2001−39034号、特開2000−149320号、特開2000−113504号、特開2000−108513号、特開2000−222772号、特開2000−218940号、特開2000−222771号、特開2000−158818号、特開2000−280621号、特開2000−280620号各公報では、実施例に記録波長430nm、NA0.65での記録例があるが、最短ピットが0.4μmという低記録密度条件(DVDと同等の記録密度)である。
特開2001−146074号公報では、記録再生波長は405〜408nmであるが、記録密度に関する具体的な記載がなく、14T−EFM信号の記録という低記録密度条件である。
【0005】
また、従来のCD、DVD系光記録媒体と異なる層構成及び記録方法に関して、以下のような技術が公開されている。
特開平7−304258号公報には、基板/可飽和吸収色素含有層/反射層という層構成で、可飽和吸収色素の消衰係数(本発明でいう吸収係数)の変化により記録を行う技術が開示されている。
特開平8−83439号公報には、基板/金属蒸着層/光吸収層/保護シートという層構成で、光吸収層によって発生した熱によって、金属蒸着層を変色又は変形させることで記録を行う技術が開示されている。
特開平8−138245号公報には、基板/誘電体層/光吸収体を含む記録層/反射層という層構成で、記録層の膜厚を変えることにより溝部の深さを変えて記録を行う技術が開示されている。
特開平8−297838号公報には、基板/光吸収体を含む記録層/金属反射層という層構成で、記録層の膜厚を10〜30%変化させることにより記録を行う技術が開示されている。
【0006】
特開平9−198714号公報には、基板/有機色素を含有する記録層/金属反射層/保護層という層構成で、基板の溝幅を未記録部に対して20〜40%広くすることにより記録を行う技術が開示されている。
特許第2506374号公報には、基板/中間層/金属薄膜という層構成で、金属薄膜が変形しバブルを形成することにより記録を行う技術が開示されている。
特許第2591939号公報には、基板/光吸収層/記録補助層/光反射層という層構成で、記録補助層を凹状に変形させると共に、記録補助層の変形に沿って光反射層を凹状に変形させることで記録を行う技術が開示されている。
特許第2591940号公報には、基板/光吸収層/多孔質な記録補助層/光反射層、或いは、基板/多孔質な記録補助層/光吸収層/光反射層という層構成で、記録補助層を凹状に変形させると共に、記録補助層の変形に沿って光反射層を凹状に変形させることで記録を行う技術が開示されている。
特許第2591941号公報には、基板/多孔質な光吸収層/光反射層という層構成で、光吸収層を凹状に変形させると共に、光吸収層の変形に沿って光反射層を凹状に変形させることで記録を行う技術が開示されている。
【0007】
特許第2982925号公報には、基板/有機色素を含む記録層/記録補助層という層構成で、記録補助層と有機色素が相溶して、有機色素の吸収スペクトルを短波長側へシフトさせることで記録を行う技術が開示されている。
特開平9−265660号公報には、基板上に反射層と記録層の機能を有する複合機能層、保護層を順次形成した層構成で、基板と複合機能層がバンプを形成することで記録を行う技術が開示されている。なお、複合機能層としては、ニッケル、クロム、チタン等の金属、又はそれらの合金との規定がある。
特開平10−134415号公報には、基板上に金属薄膜層、変形可能な緩衝層、反射層、保護層を順次形成した層構成で、基板と金属薄膜層を変形させ、同時にこの変形部での緩衝層膜厚を薄くさせることで記録を行う技術が開示されている。なお、金属薄膜層としては、ニッケル、クロム、チタン等の金属、又はそれらの合金との規定がある。また、緩衝層としては、変形し易く適当な流動性を持つ樹脂が用いられ、変形を促進させるために色素を含有させても良いとの記載がある。
【0008】
特開平11−306591号公報には、基板上に金属薄膜層、緩衝層、反射層を順次積層した層構成で、基板と金属薄膜層を変形させ、同時にこの変形部での緩衝層膜厚と光学定数とを変化させることで記録を行う技術が開示されている。なお、金属薄膜層としては、ニッケル、クロム、チタン等の金属、又はそれらの合金が好ましいとの記載がある。また、緩衝層は色素と有機高分子の混合物からなり、記録再生波長近傍に大きな吸収帯を有する色素が用いられる。
特開平10−124926号公報には、基板上に金属記録層、バッファ層、反射層を順次積層した層構成で、基板と金属記録層を変形させ、同時にこの変形部でのバッファ層膜厚と光学定数とを変化させることで記録を行う技術が開示されている。なお、金属記録層としては、ニッケル、クロム、チタン等の金属、又はそれらの合金が好ましいとの記載がある。また、バッファ層は色素と樹脂の混合物からなり、記録再生波長近傍に大きな吸収帯を有する色素が用いられる。
【0009】
以上のように、上記諸々の従来技術は、青色レーザ波長領域での追記型光記録媒体の実現を狙ったものではなく、青色レーザ波長領域で有効となる層構成や記録方法ではない。
特に現在実用化されている青色半導体レーザの発振波長の中心である405nm近傍においては、従来の追記型光記録媒体の記録層に要求される光学定数と同程度の光学定数を有する有機材料が殆んど存在しない。また、405nm近傍で記録条件を明確にし、DVDよりも高記録密度で記録された例はない。
更に、上記従来技術における実施例の多くは、従来のディスク構成(図46参照)での実験であり、また、従来のディスク構成と異なる構成も提案されてはいるが、そこに用いられる色素は従来と同じ光学特性と機能が要求されており、青色レーザ波長領域で、有機材料からなる追記型光記録媒体を容易に実現できる層構成や記録原理、記録方式についての有効な提案はない。
【0010】
また、従来の有機材料を用いた追記型光記録媒体では、変調度と反射率の確保の点から、記録再生波長に対し大きな屈折率と比較的小さな吸収係数(0.05〜0.07程度)を持つ有機材料しか使用することができない。
即ち、有機材料は記録光に対して十分な吸収能を持たないため、有機材料の膜厚を薄膜化することが不可能であり、従って、深い溝を持った基板を使用する必要があった(有機材料は通常スピンコート法によって形成されるため、有機材料を深い溝に埋めて厚膜化していた)。そのため、深い溝を有する基板の形成が非常に難しくなり、追記型光記録媒体としての品質を低下させる要因になっていた。更に、従来の有機材料を用いた追記型光記録媒体では、記録再生波長近傍に有機材料の主吸収帯が存在するため、有機材料の光学定数の波長依存性が大きくなり(波長によって光学定数が大きく変動する)、レーザの個体差や環境温度の変化等による記録再生波長の変動に対し、記録感度、変調度、ジッタ、エラー率といったような記録特性や、反射率等が大きく変化するという問題があった。
【0011】
◎追記型光記録媒体における一般的な記録原理について
一般的に、追記型の光記録媒体においては、記録層に用いられた材料の光学定数変化(記録層材料の複素屈折率実部と膜厚)による記録モードと、基板や反射層等が変形する変形モードが存在し、これらによって記録マークが形成される。例えば、特許第2710040号、特許第2840643号に追記型光記録媒体における記録原理が記載されている。
しかし、これらの公報では、記載された記録原理(記録モード)が、再生信号にどのように寄与するのかについて具体的な説明及び実験結果が記載されていない。即ち、実施例において、請求項に挙げられた記録原理が主体となって記録が行われているという実証がなされていない。
多層構造の記録媒体で、記録モードを限定(特定)することは非常に困難であるにも拘わらず、SEMやAFMの観察によって、請求項に挙げられた記録原理で記録された旨の記載があるが、これは請求項に記載された記録原理が存在する可能性があること、及びその原理が再生信号に寄与する可能性があることしか証明できていない。
【0012】
また、従来の記録原理、他の記録原理に対して、実際どのような再生信号が発生し、どのようなメリットがあるのか全く記載がない(記載があっても、その理由の根拠、裏付けがない)。
記録原理を発明とした出願において、いくつかの公報では、実施の形態という形で実施例が記載されているが、記録原理は明確なものであっても、その記録原理と再生信号の関係は明瞭でないため、記録原理と再生信号の関係を明瞭化した具体的な実施例が必要であり、単に実施の形態という形で記載できるものではない。
また、殆んど全ての公報における実施例において、記録例(記録実験)では単一周期の信号を記録しており、異なる記録マーク長の記録がどうなるのかは全く不明である。即ち、ランダム信号が記録できて、綺麗なアイパターンが得られたという結果がない。
【0013】
例えば、記録レーザのビーム径よりも十分小さいマークが記録及び再生できるのか、記録極性はどうなるのか、記録波形はどうなるのかについては、最低限記載されるべき筈のものである。
光記録媒体の再生信号は、干渉効果と共に、回折効果によって得られるものであるから、例えば記録マークの高さ、或いは記録領域の深さ(光記録媒体の厚み方向)が記録マーク長に拘わらず一定であると仮定したとしても、記録マーク長によって、レーザ光のビーム径に対する記録マーク長の関係が変わるから、再生信号がどうように変化するか一概には言えない。
単一周期の信号が記録できたとしても、ランダムパターン信号が記録できる場合というのは多くない(逆に希と言っても過言ではない)。
また、記録の結果として変調度のみを記載している例も多いが、変調度のみでは光記録媒体として使用できるものであることを裏付ける結果とはならない。
以上のことについて具体例をもって説明する。
【0014】
案内溝を有するポリカーボネート基板上に、SiCを厚さ10nm設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、基板側から6.0mWのレーザ光を照射して、ランド部(入射レーザ光側から見て、奥側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/sで3T〜14Tマークをそれぞれ単独で記録した。
この時、再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図3(a)〜(d)に示す。
図3(a)中、Unrecは未記録時の再生信号(RFレベル)、Topはマーク列を記録した時の最大再生信号レベル(即ちスペース部)、Bottomはマーク列を記録した時の最小再生信号レベル(即ちマーク部)、更にはMAは(Top−Bottom)/Topで計算される変調度を示した。
この図3(a)を見ると、変調度はやや小さいものの、CD−RやDVD−Rと同等な、再生信号(RFレベル)の記録マーク長(Mark Length)依存性を示すことが分る。
【0015】
しかし、この光記録媒体において、CD−RやDVD−Rと同様に、ランダムパターンが記録でき、マーク長に応じた再生信号が得られるかというと、そうはならない。
図3(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示し、図3(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示し、図3(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示した。
この結果、図3(b)、図3(c)では、信号の乱れは別として、CD−RやDVD−Rと同様な、マーク長に応じた再生信号が得られているが、図3(d)では、CD−RやDVD−Rと同様な、マーク長に応じた再生信号は得られていない。即ち、14T信号では、マーク中央部のRFレベルが大きく上昇し、未記録時のRFレベルを超えている。
【0016】
CD−RやDVD−Rと同様に、スライスレベルによって再生信号のマーク長を判断するという再生方式では、図3(d)の14T信号を正しく再生できないことは明らかである〔例えば、本来14Tと判断されるはずが、(5Tマーク)−(4Tスペース)−(5Tマーク)というパターンとして判断されてしまう〕。つまり、単純に記録が行えたと言っても、実際に光記録媒体として使用できるという訳ではない〔見た目では、図3(a)のようにHigh to Low(ハイ・トゥー・ロー)の信号が得られても、マーク長記録が可能ということにはならない〕。
実際、記録が行える材料、層構成は非常に沢山あるが、光記録媒体として使用できるのは、本当にごく僅かである。
従って、従来技術として挙げられる公報中でも、記録が行えたという表現のみの実験結果、巨視的な変調度という値で記録の可否を判断している実験結果、或いは単一周期の記録の実験結果しか記載されていない公報では、発明の効果が本当にあるのかどうかを判断できない。
【0017】
【発明が解決しようとする課題】
本発明は、次のような特性を有する追記型光記録媒体の提供を目的とする。
・単純層構成で、安価に製造可能である。
・記録再生波長に大きな制限がなく、記録特性の波長依存性が少ない。
・比較的高い反射率が得られる。
・変形を用いて記録再生を行う場合であっても、記録マーク長や記録パワーによって記録極性が変化せず一定である。
・変形を用いて記録再生を行う場合であっても、記録マーク部の再生波形が微分形状を示すことがない。
・変形を用いて記録再生を行う場合であっても、記録極性がHigh to Low記録となり易い。
・表面記録、或いは高NAレンズによる記録に対応でき高密度化が達成できる。
【0018】
【課題を解決するための手段】
上記課題は、次の1)〜14)の発明(以下、本発明1〜14という)によって解決される。
1) 少なくとも変形層と光吸収層を有し、該変形層と、該変形層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による光吸収層の発熱によって、変形層がレーザ光の入射方向に変形することで記録マークが形成されることを特徴とする追記型光記録媒体。
2) 変形層と、該変形層と接するレーザ光入射側の隣接層が、記録によって混合しないことを特徴とする1)記載の追記型光記録媒体。
3) 変形層と、レーザ光の入射側から見て変形層の奥側に存在する層との界面近傍に、該奥側に存在する層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする1)又は2)記載の追記型光記録媒体。
4) 変形層中に、変形層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする1)又は2)記載の追記型光記録媒体。
5) 光吸収層が有機材料からなることを特徴とする1)〜4)の何れかに記載の追記型光記録媒体。
6) 光吸収層がSi及び/又はGeを含有することを特徴とする1)〜4)の何れかに記載の追記型光記録媒体。
7) 少なくとも記録層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであることを特徴とする追記型光記録媒体。
8) 少なくとも記録層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであり、該記録層と、該記録層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による記録層の発熱によって、記録層自身がレーザ光の入射方向に変形することで記録マークが形成されることを特徴とする追記型光記録媒体。
9) 少なくとも記録層と有機材料層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであることを特徴とする追記型光記録媒体。
10) 少なくとも記録層と有機材料層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであり、該記録層と、該記録層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による記録層の発熱によって、記録層自身がレーザ光の入射方向に変形することで記録マークが形成されることを特徴とする追記型光記録媒体。
11) 記録層と、レーザ光の入射側から見て記録層の奥側に存在する層との界面近傍に、該奥側に存在する層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする7)〜10)の何れかに記載の追記型光記録媒体。
12) 記録層中に、記録層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする7)〜10)の何れかに記載の追記型光記録媒体。
13) 記録層がSi及び/又はGeを含有すること特徴とする7)〜12)の何れかに記載の追記型光記録媒体。
14) 波長350〜500nmの青色レーザ光により記録マークが形成できることを特徴とする1)〜13)の何れかに記載の追記型光記録媒体。
【0019】
以下、上記本発明について詳しく説明すると共に、本発明に係る記録再生の原理と再生信号の関係を明瞭にし、本発明の正当性と有効性を明確に示す。
本発明者は、記録極性のLow to High化、記録マーク長や記録パワーによる記録極性変化、或いは、再生信号波形の微分化が発生し易いのは、次のイ)、ロ)の場合であることを見出した。
イ) 変形する層と、変形する層のレーザ光入射側隣接層との界面に主反射界面があり、該主反射界面が入射レーザ光側(光源側)とは反対方向に変形する場合。
ロ) イ)の場合であって、特に、変形する層と、変形する層のレーザ光入射側隣接層界面近傍に、屈折率低下部、或いは空隙部が形成される場合。
即ち、変形する層と、変形が起る方向とは反対側に隣接する層の界面近傍には、互いの層の剥離、変形が起る方向とは反対側に隣接する層の体積膨張、或いは、変形が起こる方向とは反対側に隣接する層の溶融、分解・爆発等によって、空隙等の屈折率の低下部が形成され易く、これが、記録極性のLow to High化、記録マーク長や記録パワーによる記録極性変化、或いは、再生信号波形の微分化をもたらすことを見出したもので、この記録極性のLow to High化、記録マーク長や記録パワーによる記録極性変化、或いは、再生信号波形の微分化を防止するためには、レーザ光入射側から見て、主反射界面の奥側に空隙等の屈折率の低下部が発生するように主反射界面の変形方向を制御すること、或いは記録再生方向を制御することが非常に有効であることを見出した。
【0020】
従って、本発明では、変形する層(本発明で言う変形層、或いは記録層)を入射レーザ光側(光源側)に変形させる。
これにより、屈折率低下部、或いは空隙が、レーザ光入射側から見て、主反射界面(即ち変形界面)の奥側に形成されるようにすることができ、記録極性のLow to High化、記録マーク長や記録パワーによる記録極性変化、或いは再生信号波形の微分化を抑制・防止し、記録極性がHigh to Lowで統一でき、良好なマーク長記録・再生を実現させることができる。
なお、一般的にマーク長記録では、記録マークを再生した場合、図47(a)に示すような再生信号(RF信号)となるのに対し、図47(b)や(c)のように、記録マークの前後エッジ近傍や記録マークの中心近傍で変極点を持つような信号を、本発明では微分波形(微分波形化)と言う。
【0021】
本発明で言う「変形層と、該変形層と接する隣接層」とは、例えば基板上に変形層、上引層が順次設けられた光記録媒体構成の場合、基板又は上引層を指す(例えば上引層は空気層であってもよい)。
また、本発明で言う主反射界面とは、再生反射光に寄与する割合が最も高い反射界面を指す。従って、主反射界面は、最も反射係数の大きな界面となるのが一般的である。
しかし、最も大きな反射係数を有する界面であっても、その反射界面より入射光側に複数の層が存在したり、或いはその反射界面よりも入射光側にある層の吸収係数(複素屈折率の虚部)が大きい場合など、この最も大きな反射係数を有する界面にまで十分な光が透過しない場合は、この限りでない。
そこで、再生反射光に寄与する割合が最も高い反射界面を主反射界面と言うことにする。
【0022】
例えば、複素屈折率の大きな変形層が、変形層よりも複素屈折率の小さな隣接層で挟まれている場合、この変形層と、どちらかの隣接層界面が主反射界面となるが、本発明で言う主反射界面とは、ポインティングベクトルの大きな方の界面を指すことになる。なお、ここでいうポインティングベクトルとは、ポインティングベクトルの時間平均値を示し、光の強さを示す値となる。
具体例として、基板上に有機材料層(複素屈折率を2.0−i0.1、膜厚を60nmと仮定)、Si層(複素屈折率を4.3−i2.0、膜厚を20nmと仮定)が積層された光記録媒体であって、記録再生が基板側から行われる場合を考えると、主反射界面はSi層のどちらかの隣接層界面にあることになる。
最も反射係数の大きな界面はSi層と空気層の界面、次いで反射係数が大きな界面は有機材料層とSi層の界面となるが、ポインティングベクトルを計算すると、図48のようになり(横軸の0〜60が有機材料層、60〜80がSi層)、ポインティングベクトルの大きな有機材料層とSi層の界面が本発明で言う主反射界面となる。
【0023】
また、別の具体例として、基板上に有機材料層(複素屈折率を2.0−i0.1、膜厚を60nmと仮定)、Si層(複素屈折率を4.3−i2.0、膜厚を20nmと仮定)が積層された光記録媒体であって、記録再生がSi層側から行われる場合を考えると、主反射界面はSi層のどちらかの隣接層界面にあることになる。
最も反射係数の大きな界面はSi層と空気層の界面、次いで反射係数が大きな界面は有機材料層とSi層の界面となるが、ポインティングベクトルを計算すると、図49のようになり(横軸の0〜20がSi層、20〜80が有機材料層)、ポインティングベクトルの大きなSi層と空気層の界面が本発明で言う主反射界面となる。
【0024】
本発明で言う変形とは、ある任意の追記型光記録媒体構成層を単純に変形させるもので、その変形界面が明瞭である変形を指す。
例えば従来のCD−RやDVD−Rのように、基板と有機材料層の界面は変形を起すが、記録によって基板や有機材料は溶融や分解を起し、例えば有機材料の基板への拡散等が起きるため、両者はその界面近傍で混合する可能性が高く、明瞭な界面を有しなくなる。この変形界面の不明瞭化は、記録コントラスト(変調度)の低下を招き易い。
そこで本発明では、変形界面を明瞭に保持させるようにする。
そのためには、変形する層(本発明で言う変形層、或いは記録層)は記録によって隣接層と混合しないことが好ましい。
変形する層(本発明で言う変形層、或いは記録層)の変形は、変形する層とは別に設けられた光吸収層の発熱によるものであっても、変形する層自身に光吸収機能があり、変形する層自身の発熱によるものであってもよい。
【0025】
本発明では、例えば、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層に隣接して、有機材料層を設けた追記型光記録媒体を提供する。
この記録層に隣接して有機材料を設ける理由の1つは、有機材料層に、変形する層の変形量を制御する働きを持たせることができることにある。
これは例えば、基板上にレーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層を設けた追記型光記録媒体では、記録層の変形が、記録層自身の光吸収機能による変形だけでなく、この記録層で発生した熱による基板の膨張に大きな影響を受けるためである。
【0026】
従って、基板と、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層の間に有機材料層を設けることで、記録層を反基板側(記録層からみて基板と反対側)へ変形させる追記型光記録媒体の場合は、記録層の反基板側への変形に与える基板変形の影響を低下させることができる(本発明では、記録層等の変形層が主反射界面であって、この記録層等の変形層の変形特性が最も重要である)。
或いは、基板と、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層の間に有機材料層を設けることで、記録層を基板側へ変形させる追記型光記録媒体の場合は、記録層の基板側への変形を阻害する基板変形の影響を低下させることができ、良好な変形を生じさせることができる(本発明では、記録層等の変形層が主反射界面であって、この記録層等の変形層の変形特性が最も重要である)。
【0027】
また、有機材料層には、記録層等の光吸収機能を有する層による熱によって、有機材料が分解・変質等を起し、その光学定数を変化させることで、記録再生特性を向上させる働きを持たせることが可能である。
なお、ここで言う光学定数変化とは、複素屈折率実部の減少又は増加、複素屈折率虚部の減少又は増加、有機材料層膜厚の減少又は増加、或いはこれらの組み合わせを指す。
また、ここで言う記録再生特性とは、未記録時の反射率、ジッタ、変調度、トラッキング特性等を指す。
更に有機材料層は、光吸収層や、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層の光吸収機能を補う働きを持たせることも可能である。
【0028】
有機材料層に用いられる材料としては、例えば色素が好ましい。
色素としては、ポリメチン系、ナフタロシアニン系、フタロシアニン系、スクアリリウム系、クロコニウム系、ピリリウム系、ナフトキノン系、アントラキノン(インダンスレン)系、キサンテン系、トリフェニルメタン系、アズレン系、テトラヒドロコリン系、フェナンスレン系、トリフェノチアジン系各色素、及び金属錯体化合物などが挙げられる。
色素層の形成は、蒸着、スパッタリング、CVD、溶剤塗布などの通常の手段によって行なうことができる。塗布法を用いる場合には、上記色素などを有機溶剤に溶解し、スプレー、ローラーコーティング、ディッピング、スピンコーティングなどの慣用のコーティング法で塗布すればよい。
【0029】
用いられる有機溶剤としては、一般にメタノール、エタノール、イソプロパノールなどアルコール類;アセトン、メチルエチルケトン、シクロヘキサノンなどのケトン類;N,N−ジメチルアセトアミド、N,N−ジメチルホルムアミドなどのアミド類;ジメチルスルホキシドなどのスルホキシド類;テトラヒドロフラン、ジオキサン、ジエチルエーテル、エチレングリコールモノメチルエーテルなどのエーテル類;酢酸メチル、酢酸エチルなどのエステル類;クロロホルム、塩化メチレン、ジクロルエタン、四塩化炭素、トリクロルエタンなどの脂肪族ハロゲン化炭素類;ベンゼン、キシレン、モノクロルベンゼン、ジクロルベンゼンなどの芳香族類;メトキシエタノール、エトキシエタノールなどのセロソルブ類;ヘキサン、ペンタン、シクロヘキサン、メチルシクロヘキサンなどの炭化水素類などが挙げられる。
色素層の膜厚は、100Å〜10μm、好ましくは100〜2000Åが適当である。
なお、有機材料層として高分子を用いることも可能である。
【0030】
本発明で用いる変形層は、記録によって変形しさえすれば何ら制限はない。
但し、本発明では、変形層とその隣接層の界面を主反射界面とするため、隣接層との複素屈折率差の大きな材料を用いることが好ましい。
そのため、一般的に屈折率(複素屈折率実部)の小さな金属(例えば、Au、Ag、Al、Cr、Ni、Fe、Sn等)、或いは一般的に屈折率(複素屈折率実部)の大きな材料〔Si及び/又はGeを含有する材料(例えばSi、Ge、SiGe1−x、MgGe、MgSi、SiC等);Nb、Ta、Be、V等の金属、或いはこれらの金属酸化物(例えばTa、Nb等)〕;AlSb、AlGa1−xAs、CdSe、GaSb、Hg1−xCdTe、Se、Te、ZnTe、ZnS、PbS、InP、GaP等の半導体などを用いることができる。
【0031】
また、変形層と主反射界面を形成する変形層の隣接層が比較的低屈折率である場合(1.8程度以下)、例えばAl、MgO、BeO、ZrO、UO、ThOなどの単純酸化物系の酸化物;SiO、2MgO・SiO、MgO・SiO、CaO・SiO、ZrO・SiO、3Al・2SiO、2MgO・2Al・5SiO、LiO・Al・4SiOなどのケイ酸塩系の酸化物;AlTiO、MgAl、Ca10(PO(OH)、BaTiO、LiNbO、PZT、PLZT(PbTiO−PbZrO系酸化物)、フェライトなどの複酸化物系の酸化物;Si、Si6−ZAl8−Z、AlN、BN、TiNなどの窒化物系の非酸化物;SiC、BC、TiC、WCなどの炭化物系の非酸化物;LaB、TiB、ZrBなどのホウ化物系の非酸化物;CdS、MoSなどの硫化物系の非酸化物;MoSiなどのケイ化物系の非酸化物;アモルファス炭素、黒鉛、ダイアモンド等の炭素系の非酸化物、及びこれらの含有物を使用することができる。
【0032】
光吸収層としては、記録波長に対して比較的大きな吸収係数(ここで言う吸収係数は複素屈折率の虚部である。例えば0.2以上が好ましい)を有する材料であれば何ら制限はなく、Si及び/又はGeを含有する材料(例えばSi、Ge、SiGe1−x、MgGe、MgSi、SiC等);Nb、Ta、Be、V等の金属、或いはこれらの金属酸化物(例えばTa、Nb等);AlSb、AlGa1−xAs、CdSe、GaSb、Hg1−xCdTe、Se、Te、ZnTe、ZnS、PbS、InP、GaP等の半導体;Ag等に比べて熱伝導率の低いNi,Cr、Ti、Ta、Fe等の金属;Cu/Al、Ni/Fe等の合金などを用いることができる。
また、有機材料層に用いられる材料として前述した色素を利用することも可能である。
【0033】
レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層としては、Si及び/又はGeを含有する材料(例えばSi、Ge、SiGe1−x、MgGe、MgSi、SiC等);Nb、Ta、Be、V等の金属、或いはこれらの金属酸化物(例えばTa、Nb等);AlSb、AlGa1−xAs、CdSe、GaSb、Hg1−xCdTe、Se、Te、ZnTe、ZnS、PbS、InP、GaP等の半導体等;Ag等に比べて熱伝導率の低いNi、Cr、Ti、Ta、Fe等の金属;Cu/Al、Ni/Fe等の合金などを用いることができる。
【0034】
なお、本発明では「単純層構成で、安価に製造可能な追記型光記録媒体」を提供できるが、これは変形という最も単純な記録原理を用いるためである。
「記録再生波長に大きな制限がなく、記録特性の波長依存性が少ない追記型光記録媒体」を提供できる理由は、例えばレーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層を用いる場合、このような記録層の材料としては、SiC、Si、Ge等のSi及び/又はGe含有物が好ましく用いられるが、これらの材料の複素屈折率は、従来の追記型光記録媒体に用いられる有機材料のような大きな波長依存性を持たないためである。
従って、本発明の追記型光記録媒体は、350〜500nm程度の青色レーザ波長領域の光でも容易に記録が可能であり、原理的には、更に短波長の光でも記録が可能である。
【0035】
「比較的高い反射率が得られる追記型光記録媒体」を提供できる理由は、光吸収層、変形層、或いはレーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層には、SiC、Si、Ge等のSi及び/又はGe含有物が好ましく用いられ、これらの材料は青色レーザ波長領域以下で大きな複素屈折率を有するためである(この光吸収層、変形層、或いはレーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層と、これらの隣接層との界面の反射係数が高められる)。
「表面記録、或いは高NAレンズによる記録に対応でき、高密度化が達成できる追記型光記録媒体」を提供できる理由は、本発明の記録媒体の構成、及び記録原理上、記録再生方向に制限がないためである(また記録再生方向が何れであっても、それに合わせた層構成が容易に実現できる)。
【0036】
本発明の実施の形態例は、図34〜図45に示す通りである。なお、図中の矢印は記録再生光の入射方向を示すものである。
図34は、基板上に光吸収層、変形層が順次積層された例である。
図35は、図34の追記型光記録媒体であって、変形層と、該変形層の光吸収層側と反対側の隣接層との界面が主反射界面である場合の記録例(変形例)を示すものであり、光吸収層の発熱によって変形層をレーザ光の入射方向に変形させる。
この時、変形層と光吸収層の界面には、変形層材料の体積膨張による屈折率低下部や空隙、変形層と光吸収層の剥離による空隙、或いは光吸収層の体積変化による空隙や屈折率低下部等が形成される。
なお、本発明では、空隙は屈折率低下部に相当すると考えることができる。
【0037】
図36は、図34の追記型光記録媒体であって、変形層と光吸収層との界面が主反射界面である場合の記録例(変形例)を示すものであり、光吸収層の発熱によって変形層をレーザ光の入射方向に変形させる。
この時、変形層の、光吸収層とは反対側の層(反対層)との界面に、変形層材料の体積膨張による屈折率低下部や空隙、変形層と反対層の剥離による空隙、或いは反対層の体積変化による空隙や屈折率低下部等が形成される。
【0038】
図37は、基板上に変形層、光吸収層が順次積層された例である。
図38は、図37の追記型光記録媒体であって、変形層と光吸収層との界面が主反射界面である場合の記録例(変形例)を示すものであり、光吸収層の発熱によって変形層をレーザ光の入射方向に変形させる。
この時、変形層と基板の界面には、変形層材料の体積膨張による屈折率低下部や空隙、変形層と基板の剥離による空隙、或いは基板の体積変化による空隙や屈折率低下部等が形成される。
なお、図38では、変形層の変形によって、変形層とは反対側の光吸収層の隣接層界面も変形するように描かれているが、この界面は変形しなくてもよい。
【0039】
図39は、図37の追記型光記録媒体であって、変形層と基板との界面が主反射界面である場合の記録例(変形例)を示すものであり、光吸収層の発熱によって変形層をレーザ光の入射方向に変形させる。
この時、変形層と光吸収層との界面に、変形層材料の体積膨張による屈折率低下部や空隙、変形層と光吸収層の剥離による空隙、或いは光吸収層の体積変化による空隙や屈折率低下部等が形成される。
【0040】
図40は、基板上に、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層が積層された例である。
図41は、図40の追記型光記録媒体であって、記録層と、該記録層の基板側と反対側の隣接層との界面が主反射界面である場合の記録例(変形例)を示すものであり、記録層の発熱によって記録層自身をレーザ光の入射方向に変形させる。
この時、記録層と基板の界面には、記録層材料の体積膨張による屈折率低下部や空隙、記録層と基板の剥離による空隙、或いは基板の体積変化による空隙や屈折率低下部等が形成される。
【0041】
図42は、図40の追記型光記録媒体であって、記録層と基板との界面が主反射界面である場合の記録例(変形例)を示すものであり、記録層の発熱によって記録層自身をレーザ光の入射方向に変形させる。
この時、記録層の、基板とは反対側の層(反対層)との界面に、記録層材料の体積膨張による屈折率低下部や空隙、記録層と反対層の剥離による空隙、或いは反対層の体積変化による空隙や屈折率低下部等が形成される。
【0042】
図43は、基板上に有機材料層、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つ記録層が順次積層された例である。
図44は、図43の追記型光記録媒体であって、記録層と、該記録層の有機材料層側と反対側の隣接層との界面が主反射界面である場合の記録例(変形例)を示すものであり、記録層の発熱によって記録層をレーザ光の入射方向に変形させる。
この時、記録層と有機材料層の界面には、記録層材料の体積膨張による屈折率低下部や空隙、記録層と有機材料層の剥離による空隙、或いは有機材料層の体積変化による空隙や屈折率低下部等が形成される。
【0043】
図45は、図43の追記型光記録媒体であって、記録層と有機材料層との界面が主反射界面である場合の記録例(変形例)を示すものであり、記録層の発熱によって記録層をレーザ光の入射方向に変形させる。
この時、記録層の、有機材料層とは反対側の層(反対層)との界面に、記録層材料の体積膨張による屈折率低下部や空隙、記録層と反対層の剥離による空隙、或いは反対層の体積変化による空隙や屈折率低下部等が形成される。
なお、図44〜図45では、記録層の変形が生じた部分の有機材料層は光学定数変化を起していてもよい。
以上の図34〜図45では、本発明が有効となる最小限の層構成例を挙げたものであり、実際には、図34〜図45の層構成に加えて、下引層、上引層、保護層、接着層、カバー層等が設けられていてもよい。
【0044】
【実施例】
以下、実施例により本発明を具体的に説明するが、本発明はこれらの実施例により限定されるものではない。なお、図1(a)〜図8(a)及び図26(a)〜図31(a)中の、Unrecは未記録時の再生信号(RFレベル)、Topはマーク列を記録した時の最大再生信号レベル(即ちスペース部)、Bottomはマーク列を記録した時の最小再生信号レベル、MAは(Top−Bottom)/Topで計算される変調度を示す。
◎まず、参考例1〜8により、従来の記録再生方法では、変形による記録原理を主とする光記録媒体に対し、ランダムパターンを記録再生できない可能性が高いことを示す。
【0045】
参考例1
溝深さ55nmの案内溝を有するポリカーボネート基板上に、厚さ10nmのSiC(光吸収層)を設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、基板側から5.0mWのレーザ光を照射して、グルーブ部(入射レーザ光側から見て、手前側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/secで3T〜14Tマークをそれぞれ単独で記録した。
この時、再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図1(a)に示す。
図1(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図1(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図1(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図1(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3T、4T、6T、8T、14Tとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0046】
参考例2
記録パワーを6.0mWとした点以外は参考例1と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図2(a)に示す。
図2(a)の結果から、記録マーク長によって記録極性が変化、即ち、短マークではHigh to Low記録であるが、長マークではHigh to Low記録とLow to High記録が混在したような信号が発生し、マーク長記録が困難となることが分る。
また、図2(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図2(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図2(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3T、4Tは、マーク長記録が可能な再生信号波形を示すが、6T、8T、14Tはマーク中央部のRFレベルが大きく上昇した再生信号波形を示し〔6T、8Tでは、再生信号の周期が本来の再生信号の倍に見える。これは図1(c)と比べるとよく分る〕、マーク長記録が困難となることが分る。
【0047】
参考例3
6.0mWのレーザ光を照射し、ランド部(入射レーザ光側から見て奥側にある溝位置)に記録した点以外は参考例1と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図3(a)に示す。
図3(a)の結果から、記録マーク長によって記録極性が変化すること、即ち、短マークではHigh to Low記録であるが、長マークではHigh to Low記録と、僅かにLow to High記録が混在したような信号が発生する傾向が見られ、マーク長記録が困難となる可能性があることが分る。
また、図3(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図3(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図3(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3T、4T、6T、8Tは、マーク長記録が可能な再生信号波形を示すが、14Tはマーク中央部のRFレベルが大きく上昇した再生信号波形を示し、マーク長記録が困難となることが分る。
【0048】
参考例4
7.0mWのレーザ光を照射し、ランド部(入射レーザ光側から見て、奥側にある溝位置)に記録した点以外は参考例1と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図4(a)に示す。
図4(a)の結果から、記録マーク長によって記録極性が変化、即ち、短マークではHigh to Low記録であるが、長マークではHigh to Low記録とLow to High記録が混在したような信号が発生し、マーク長記録が困難となることが分る。
また、図4(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図4(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図4(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3T、4Tは、マーク長記録が可能な再生信号波形を示すが、6T、8T、14Tはマーク中央部のRFレベルが大きく上昇した再生信号波形を示し〔6Tでは、再生信号の周期が本来の再生信号の倍に見える。これは図1(c)と比べるとよく分る〕、マーク長記録が困難となることが分る。
【0049】
参考例5
溝深さ55nmの案内溝を有するポリカーボネート基板上に、厚さ20nmのSi(光吸収層)を設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、基板側から5.0mWのレーザ光を照射して、グルーブ部(入射レーザ光側から見て、手前側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/secで3T〜14Tマークをそれぞれ単独で記録した。
この時、再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図5(a)に示す。
また、図5(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図5(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図5(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3Tマークを除いて、記録マーク長によらず、Low to High記録となり、従来との極性の互換性がなくなると共に、有機材料層の複素屈折率変化でHigh to Low記録となる記録原理(例えば吸収係数の増加)と併用できないことが確認できる。
【0050】
参考例6
記録パワーを6.0mWとした点以外は参考例5と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図6(a)に示す。
また、図6(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図6(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図6(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3Tマークを除いて、記録マーク長によらず、Low to High記録となり、従来との極性の互換性がなくなると共に、有機材料層の複素屈折率変化でHigh to Low記録となる記録原理(例えば吸収係数の増加)と併用できないことが確認できる。
【0051】
参考例7
5.0mWのレーザ光を照射し、ランド部(入射レーザ光側から見て、奥側にある溝位置)に記録した点以外は参考例5と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図7(a)に示す。
また、図7(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図7(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図7(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3Tマークを除いて、記録マーク長によらず、Low to High記録となり、従来との極性の互換性がなくなると共に、有機材料層の複素屈折率変化でHigh to Low記録となる記録原理(例えば吸収係数の増加)と併用できないことが確認できる。
【0052】
参考例8
6.0mWのレーザ光を照射し、ランド部(入射レーザ光側から見て、奥側にある溝位置)に記録した点以外は参考例5と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図8(a)に示す。
また、図8(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図8(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図8(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
これらの結果から、3Tマークを除いて、記録マーク長によらず、Low to High記録となり、従来との極性の互換性がなくなると共に、有機材料層の複素屈折率変化でHigh to Low記録となる記録原理(例えば吸収係数の増加)と併用できないことが確認できる。
【0053】
以上、参考例1〜8の結果から、基板上に光吸収層を設けたような単純層構成で、従来のように基板側から記録再生する方式では、マーク長による記録再生が困難である場合が多く、また記録極性がLow to High化する場合が多いことが確かめられた。
【0054】
◎次に、実施例1において、基板上に光吸収層を設けたような単純層構成であっても、マーク長による記録再生が可能であり、記録極性がHigh to Lowとなる条件を検討する。
【0055】
実施例1
基板/光吸収層Si(厚さ20nm)という層構成で、約3T(0.7λ)と約8T(2.0λ)のマーク長を有する記録マーク(但し、3Tマークの幅は0.7λ、8Tマークの幅は0.8λ、マークの高さ方向の大きさは0.125λとした)を、次に示す記録位置、記録マーク変形方向、再生方向の条件を変えて再生した場合に、どのような再生信号が得られるかについて計算した。
・記録位置     :Land 又は Groove
・記録マーク変形方向:Bump 又は Pit
・再生方向     :基板側から=[From Sub] 又は、反基板側から=[From Air]
計算上、ここでは、Pitとはレーザ光の入射方向とは逆に変形した記録マークを、Bumpとはレーザ光の入射方向に変形した記録マークを指す(図9参照)。なお、基板溝形状は(A、B、C、D、ζ)=(0.2λ、0.8λ、1.0λ、1.8525λ、0.1375λ)とした。
【0056】
計算の結果は図10〜図17に示す通りであり、図10はランド部にPitが形成された記録部を基板側から再生した場合の結果、図11はランド部にBumpが形成された記録部を基板側から再生した場合の結果、図12はグルーブ部にPitが形成された記録部を基板側から再生した場合の結果、図13はグルーブ部にBumpが形成された記録部を基板側から再生した場合の結果、図14はランド部にPitが形成された記録部をSi側から再生した場合の結果、図15はランド部にBumpが形成された記録部をSi側から再生した場合の結果、図16はグルーブ部にPitが形成された記録部をSi側から再生した場合の結果、図17はグルーブ部にBumpが形成された記録部をSi側から再生した場合の結果である。
なお、図10〜図17の横軸は再生レーザ光の位置、縦軸は再生信号のレベルを示す(再生反射光は4分割素子で検出するが、縦軸はその4分割素子の和信号[Sum Signal]を示す)。
【0057】
この結果から、一般的には、基板からの記録ではPitが形成され、空気層側からの記録ではBumpが形成されると考えられるので、基板からの記録再生でのBump条件(図11、図13)、及び空気層側からの記録再生でのPit条件(図14、図16)での計算結果を一般的でないとして除外して考えると、基板側からの記録再生では、記録位置によって記録極性が変わるが、空気層側からの記録再生では記録極性が一定(High to Low)であることが分る。同様に、基板からの記録再生でのBump、及び空気層側からの記録再生でのPit条件での計算結果を非一般的であるとして除外して考えると、基板側からの記録再生では、ランド部への記録において微分波形化が起こることが分った(図10参照)。
【0058】
ところで、この実施例1の計算結果は、例えば図5〜図8の現象(実際の測定では、ランド部のみならず、グルーブ部でもLow to High化と微分波形化が起きている現象)を説明できない。
そこで鋭意検討の結果、記録マークの中央部で、RFレベルが上昇するような再生信号波形が観測されることは、SiCやSiの光吸収層の内部に発生する空隙等の屈折率低下部、或いはSiCやSiの光吸収層と基板の間に発生する空隙、或いは基板の膨張部に発生する空隙等の屈折率低下部に原因があると考えた。また、Low to High記録となる場合であっても、短マークはHigh to Low記録となる場合が多いことから、短マークでは、干渉効果よりも回折効果の影響が大きいと考えられる。
【0059】
従って、反射光の大部分を、変形した界面(主反射界面)で反射された反射光とし、主反射界面よりも入射レーザ光に対して手前側に空隙等の屈折率低下部を位置させないような構成にすれば、変形部の干渉効果の影響を小さくして、変形による回折効果の影響を高めることができると考えた。
そうすれば、長マークでも、変形による回折効果によって反射光の大部分が作られるため、常にマーク長記録が可能で、High to Low記録が行えると考えた。
上記のような考えを実現するために、本発明者は、例えば、基板上に光吸収層を設けた光記録媒体であって、基板と光吸収層の間に空隙が発生する可能性のある光記録媒体に対し、光吸収層側から再生することが非常に有効であることを見出した。
【0060】
◎そこで次に、基板上に光吸収層を設けた光記録媒体であって、基板と光吸収層の間に空隙が発生する可能性のある光記録媒体に対し、光吸収層側から再生することによって、マーク長記録が可能で、High to Low記録が行える可能性があることをシミュレーションによって明らかにする。
【0061】
実施例2
基板/光吸収層SiC(厚さ10nm)、又は基板/光吸収層Si(厚さ20nm)という層構成で、約8T(2.0λ)のマーク長を有する記録マーク(但し、マークの幅は0.8525λ、マークの高さ方向の大きさは0.30λとした)を、次に示す記録位置、空隙の有り無し、再生方向の条件を変えて再生した場合に、どのような再生信号が得られるかについて計算した。
・記録位置     :Land 又は Groove
・空隙の有り無し  :[No Bubble] 又は [Bubble]
・再生方向     :基板側から=[From Sub] 又は、反基板側から=[From Air]
基板溝形状は、基板側からの再生の場合(A、B、C、D、ζ)=(0.2λ、1.0525λ、1.2525λ、1.8525λ、0.1375λ)とし、反基板側からの再生の場合(A、B、C、D、ζ)=(0.2λ、0.8λ、1.0λ、1.8525λ、0.1375λ)とした。
【0062】
計算の結果は図18〜図25に示す通りで、図18〜図21は基板上にSiを設けた場合、図22〜図25は基板上にSiCを設けた場合の結果である。
図18はランド部にPitが形成された記録部を基板側から再生した場合の結果、図19はグルーブ部にPitが形成された記録部を基板側から再生した場合の結果、図20はランド部にBumpが形成された記録部をSi側から再生した場合の結果、図21はグルーブ部にBumpが形成された記録部をSi側から再生した場合の結果、図22はランド部にPitが形成された記録部を基板側から再生した場合の結果、図23はグルーブ部にPitが形成された記録部を基板側から再生した場合の結果、図24はランド部にBumpが形成された記録部をSiC側から再生した場合の結果、図25はグルーブ部にBumpが形成された記録部をSiC側から再生した場合の結果である。
なお、図18〜図25の横軸は再生レーザ光の位置、縦軸は再生信号のレベルを示す(再生反射光は4分割素子で検出するが、縦軸はその4分割素子の和信号[Sum Signal]を示す)。
【0063】
以上のシミュレーション結果から、実際に観測された再生信号が発生するためには、SiCやSiの光吸収層と基板の間に空隙(屈折率低下部)が発生する必要があることが分った。即ち、実際の記録において、SiCやSiの光吸収層と基板の間に空隙(屈折率低下部)が発生する可能性があることが裏付けられた。なお、本実施例2では、光吸収層と基板の間に空隙が発生する(剥離する)として計算を行ったが、光吸収層の内部に空隙等の屈折率低下部が発生する場合、或いは基板中に空隙等の屈折率低下部が発生する場合も同様な計算結果となる。従って、実際の記録において、SiCやSiからなる光吸収層と基板の間、光吸収層中、或いは基板中に、空隙(屈折率低下部)が発生する可能性があることが裏付けられた。
また、基板側からの再生では(図18、図19、図22、図23)、空隙の有り無しで再生信号波形が大きく変わることが分り、空隙が存在すると記録極性のLow to High化と微分波形化が起き易いが、光吸収層側からの再生では(図20、図21、図24、図25)、空隙の有り無しで再生信号波形は大きく変わらず、微分波形化がなく、記録極性がHigh to Lowの信号が得られることが分った。
【0064】
◎上記シミュレーション結果を基に、本発明の光記録媒体によれば、マーク長記録が可能で、High to Low記録が行えることを、次の実施例3〜8により実際に証明する。
【0065】
実施例3
溝深さ55nmの案内溝を有するポリカーボネート基板上に、厚さ10nmのSiCからなる光吸収層を設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、SiC側から8.0mWのレーザ光を照射し、ランド部(入射レーザ光側から見て、手前側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/secで3T〜14Tマークをそれぞれ単独で記録した。
この時、再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図26(a)に示す。
図26(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図26(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図26(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図26(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
この結果から、3T、4T、6T、8T、14Tとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0066】
実施例4
記録パワーを9.0mWとした点以外は実施例3と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図27(a)に示す。
図27(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図27(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図27(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図27(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
この結果から、3T、4T、6T、8T、14Tとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0067】
実施例5
7.0mWのレーザ光を照射して、グルーブ部(入射レーザ光側から見て、奥側にある溝位置)に記録した点以外は実施例3と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図28(a)に示す。
図28(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図28(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図28(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図28(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
この結果から、3T、4T、6T、8T、14Tとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0068】
実施例6
8.0mWのレーザ光を照射して、グルーブ部(入射レーザ光側から見て、奥側にある溝位置)に記録した点以外は実施例3と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図29(a)に示す。
図29(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図29(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
この結果から、最短及び最長マークとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0069】
実施例7
溝深さ55nmの案内溝を有するポリカーボネート基板上に、厚さ20nmのSi(光吸収層)を設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、Si側から6.0mWのレーザ光を照射し、ランド部(入射レーザ光側から見て、手前側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/secで3T〜14Tマークをそれぞれ単独で記録した。
この時、再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図30(a)に示す。
図30(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図30(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図30(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図30(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
この結果から、3T、4T、6T、8T、14Tとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0070】
実施例8
記録パワーを7.0mWとした点以外は実施例7と全く同様の実験を行った。
再生信号(RFレベル)の記録マーク長(Mark Length)依存性を測定した結果を図31(a)に示す。
図31(a)の結果から、記録マーク長によらず、High to Low記録が行えている可能性があることが確認できる。
また、図31(b)には、3Tマークを連続して記録した場合の再生信号、4Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図31(c)には、6Tマークを連続して記録した場合の再生信号、8Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを、図31(d)には、3Tマークを連続して記録した場合の再生信号、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
この結果から、3T、4T、6T、8T、14Tとも、マーク長記録が可能な再生信号波形を示すことが分る。
【0071】
以上、実施例3〜実施例8に示したように、基板上に光吸収層を設けただけの単純な光記録媒体であって、基板と光吸収層の間、或いは光吸収層自身や基板の内部に空隙が発生する可能性のある光記録媒体に対し、光吸収層側から再生することによって、マーク長記録が可能で、High to Low記録が行える可能性があることが実験によって証明された。
【0072】
◎最後に、実施例9〜10により本発明の追記型光記録媒体の特性を明確にする。
【0073】
実施例9
溝深さ55nmの案内溝を有するポリカーボネート基板上に、下記〔化1〕と〔化2〕のCo金属錯体からなる色素層を厚さ約60nm、更にその上にSiCを厚さ10nm設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、SiC側から9.0mWのレーザ光を照射して、ランド部(入射レーザ光側から見て、手前側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/secで8−16変調の信号を記録した。
その結果、変調度が約70%で、記録極性がHigh to Lowであり、図32に示すような、非常に明瞭なアイパターンが得られ、ジッタ(σ/Tw)は8.5%であった。
【0074】
【化1】

Figure 2004030864
【化2】
Figure 2004030864
【0075】
実施例10
溝深さ55nmの案内溝を有するポリカーボネート基板上に、上記〔化1〕で示される色素層を厚さ約40nm、更にその上にSiCを厚さ10nm設けた光記録媒体を作製した。
この光記録媒体に対して、パルステック工業製の光ディスク評価装置、DDU−1000(波長:405nm、NA:0.65)を用いて、SiC側からレーザ光を照射して、ランド部(入射レーザ光側から見て、手前側にある溝位置)に、記録周波数65.4MHz、記録線速度6.0m/secで8−16変調の信号を記録パワーを変化させて記録した。
その結果、記録極性がHigh to Lowであり、図33に示すような良好なジッタと変調度が得られた。
【0076】
【発明の効果】
本発明1〜14によれば、次のような特性を有する追記型光記録媒体を提供できる。
・単純層構成で、安価に製造可能である。
・記録再生波長に大きな制限がなく、記録特性の波長依存性が少ない。
・比較的高い反射率が得られる。
・変形を用いて記録再生を行う追記型光記録媒体であるが、記録マーク長や記録パワーによって記録極性が変化せず一定である。
・変形を用いて記録再生を行う追記型光記録媒体であるが、記録マーク部の再生波形が微分形状を示すことがない。
・変形を用いて記録再生を行う追記型光記録媒体であるが、記録極性がHighto Low記録となり易い。
・表面記録、或いは高NAレンズによる記録に対応でき高密度化が達成できる。
【図面の簡単な説明】
【図1】参考例1の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図2】参考例2の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図3】参考例3の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図4】参考例4の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図5】参考例5の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図6】参考例6の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図7】参考例7の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図8】参考例8の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図9】溝パラメータの説明図。
(a) 変形した記録マークを説明するための図(From Sub)。
(b) 変形した記録マークを説明するための図(From Air)。
【図10】実施例1の、ランド部にPitが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図11】実施例1の、ランド部にBumpが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図12】実施例1の、グルーブ部にPitが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図13】実施例1の、グルーブ部にBumpが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図14】実施例1の、ランド部にPitが形成された記録部をSi側から再生した場合の計算結果を示す図。
【図15】実施例1の、ランド部にBumpが形成された記録部をSi側から再生した場合の計算結果を示す図。
【図16】実施例1の、グルーブ部にPitが形成された記録部をSi側から再生した場合の計算結果を示す図。
【図17】実施例1の、グルーブ部にBumpが形成された記録部をSi側から再生した場合の計算結果を示す図。
【図18】実施例2の、基板上にSiを設けた場合であって、ランド部にPitが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図19】実施例2の、基板上にSiを設けた場合であって、グルーブ部にPitが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図20】実施例2の、基板上にSiを設けた場合であって、ランド部にBumpが形成された記録部をSi側から再生した場合の計算結果を示す図。
【図21】実施例2の、基板上にSiを設けた場合であって、グルーブ部にBumpが形成された記録部をSi側から再生した場合の計算結果を示す図。
【図22】実施例2の、基板上にSiCを設けた場合であって、ランド部にPitが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図23】実施例2の、基板上にSiCを設けた場合であって、グルーブ部にPitが形成された記録部を基板側から再生した場合の計算結果を示す図。
【図24】実施例2の、基板上にSiCを設けた場合であって、ランド部にBumpが形成された記録部をSiC側から再生した場合の計算結果を示す図。
【図25】実施例2の、基板上にSiCを設けた場合であって、グルーブ部にBumpが形成された記録部をSiC側から再生した場合の計算結果を示す図。
【図26】実施例3の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図27】実施例4の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図28】実施例5の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図29】実施例6の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図30】実施例7の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図31】実施例8の記録結果を示す図。
(a) 記録マーク長と再生信号(RFレベル)及び変調度の関係を示す。
(b) 3Tマーク、4Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(c) 6Tマーク、8Tマークを連続して記録した場合の再生信号、及び、未記録時の再生信号レベルを示す。
(d) 3Tマーク、14Tマークを連続して記録した場合の再生信号、及び未記録時の再生信号レベルを示す。
【図32】実施例9のアイパターンを示す図。
【図33】実施例10のジッタと変調度を示す図。
【図34】基板上に光吸収層と変形層を有する本発明の実施の形態例を示す図。
【図35】図34の追記型光記録媒体であって、変形層と、該変形層の光吸収層側と反対側の隣接層との界面が主反射界面である場合の記録例(変形例)を示す図。
【図36】図34の追記型光記録媒体であって、変形層と光吸収層との界面が主反射界面である場合の記録例(変形例)を示す図。
【図37】基板上に変形層と光吸収層を有する本発明の実施の形態例を示す図。
【図38】図37の追記型光記録媒体であって、変形層と光吸収層との界面が主反射界面である場合の記録例(変形例)を示す図。
【図39】図37の追記型光記録媒体であって、変形層と基板との界面が主反射界面である場合の記録例(変形例)を示す図。
【図40】基板上に記録層を有する本発明の実施の形態例を示す図。
【図41】図40の追記型光記録媒体であって、記録層と、該記録層の基板側と反対側の隣接層との界面が主反射界面である場合の記録例(変形例)を示す図。
【図42】図40の追記型光記録媒体であって、記録層と基板との界面が主反射界面である場合の記録例(変形例)を示す図。
【図43】基板上に有機材料層と記録層を有する本発明の実施の形態例を示す図。
【図44】図40の追記型光記録媒体であって、記録層と、該記録層の有機材料層と反対側の隣接層との界面が主反射界面である場合の記録例(変形例)を示す図。
【図45】図40の追記型光記録媒体であって、記録層と有機材料層との界面が主反射界面である場合の記録例(変形例)を示す図。
【図46】従来のディスクの層構成を示す図。
【図47】マーク長記録の記録マークを再生した場合の再生信号の波形を説明する図。
(a) 一般的な場合
(b) 記録マークの前後エッジ近傍で変極点を持つ微分波形
(c) 記録マークの中心近傍で変極点を持つ微分波形
【図48】基板上に有機材料層、Si層が積層された光記録媒体であって、記録再生が基板側から行われる場合の、ポインティングベクトルの計算結果を示す図。
【図49】基板上に有機材料層、Si層が積層された光記録媒体であって、記録再生がSi層側から行われる場合の、ポインティングベクトルの計算結果を示す図。
【符号の説明】
Mark Length マーク長
T 基準クロック
RF Lebel(V) RF(再生信号)レベル(ボルト)
Modulated amplitude 変調度
Unrec 未記録時の再生信号(RF)レベル
Top マーク列を記録した時の最大再生信号レベル(即ちスペース部)
Bottom マーク列を記録した時の最小再生信号レベル(即ちマーク部)
MA (Top−Bottom)/Topで計算される変調度
Time0.5(μs/div) 時間(1メモリ0.5マイクロ秒)
Sum Signal 和信号(再生信号)
Beam Position(μm) ビーム位置(マーク中心からのビーム中心のズレ量(マイクロメートル)
A 基準点から隣接するランド又はグルーブの近い方の端部までの幅
B 基準点から隣接するランド又はグルーブの遠い方の端部までの幅
C 基準点から次のグルーブ又はランドの近い方の端部までの幅
D 基準点から次のグルーブ又はランドの遠い方の端部までの幅
ζ グルーブ底部からランド上面までの高さ
Pit レーザ光の入射方向とは逆に変形した記録マーク
Bump レーザ光の入射方向に変形した記録マーク
From Sub 基板側から
From Air 反基板側から
σ/Tw ジッタ
Z position 層方向の位置(有機材料層とSi層の厚さを示す)
Y ポインティングベクトル(ポインティングベクトルの時間平均値)[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a write-once read-many (WORM) optical recording medium, and more particularly to a write-once optical recording medium capable of high-density recording even with light in a blue laser wavelength region of about 350 to 500 nm.
[0002]
[Prior art]
◎ About write-once optical recording media compatible with blue laser
The development of a blue laser capable of recording at a very high density is progressing rapidly, and a write-once optical recording medium corresponding to the development is being developed.
In conventional write-once optical recording media, recording pits are formed by irradiating a laser beam to a recording layer made of an organic material and causing a change in refractive index mainly due to decomposition and alteration of the organic material. The optical constant and decomposition behavior of the organic material used are important factors for forming a good recording pit.
Therefore, it is necessary to select an appropriate material having an optical property and a decomposition behavior with respect to a blue laser wavelength as the organic material used for the recording layer. In other words, the recording / reproducing wavelength is set to a large absorption band in order to increase the reflectance at the time of non-recording and to cause the organic material to be decomposed by laser irradiation to cause a large change in the refractive index (this provides a large degree of modulation). It is selected so as to be located on the long wavelength side skirt.
This is because the bottom of the large absorption band of the organic material on the long wavelength side is a wavelength region having an appropriate absorption coefficient and obtaining a large refractive index.
[0003]
However, an organic material having optical properties with respect to the wavelength of a blue laser having a value comparable to that of a conventional blue laser has not yet been found. This means that in order to obtain an organic material having an absorption band near the blue laser wavelength, it is necessary to reduce the molecular skeleton or shorten the conjugated system, but this causes a decrease in the absorption coefficient, that is, a decrease in the refractive index. That's why.
That is, there are many organic materials having an absorption band near the blue laser wavelength, and the absorption coefficient can be controlled. However, since the organic material does not have a large refractive index, a large degree of modulation cannot be obtained.
Examples of the organic material corresponding to a blue laser include those described in JP-A-2001-181524, JP-A-2001-158865, JP-A-2000-343824, JP-A-2000-343825, and JP-A-2000-335110. is there.
However, in these publications, the examples only measure the spectra of the solution and the thin film, but do not describe recording and reproduction.
In each of JP-A-11-221964, JP-A-11-334206 and JP-A-2000-43423, recording is described in Examples, but the recording wavelength is 488 nm, and the recording condition and recording density are not described. However, there is only a statement that good recording pits were formed.
[0004]
In JP-A-11-58955, although recording is described in Examples, the recording wavelength is 430 nm, and there is no description about recording conditions or recording density, and there is a description that a good degree of modulation was obtained. Only.
JP-A-2001-39034, JP-A-2000-149320, JP-A-2000-113504, JP-A-2000-108513, JP-A-2000-222772, JP-A-2000-218940, JP-A-2000-222277, In JP-A-2000-158818, JP-A-2000-280621, and JP-A-2000-280620, there are examples of recording at a recording wavelength of 430 nm and NA of 0.65 in the examples, but low recording with the shortest pit of 0.4 μm. Density condition (recording density equivalent to DVD).
In Japanese Patent Application Laid-Open No. 2001-146074, the recording / reproducing wavelength is 405 to 408 nm, but there is no specific description about the recording density, and the recording condition is the low recording density of 14T-EFM signal recording.
[0005]
Further, regarding the layer configuration and recording method different from those of the conventional CD and DVD optical recording media, the following techniques are disclosed.
Japanese Patent Application Laid-Open No. 7-304258 discloses a technique of performing recording by changing the extinction coefficient (absorption coefficient in the present invention) of a saturable absorbing dye in a layer structure of a substrate / saturable absorbing dye-containing layer / reflective layer. It has been disclosed.
Japanese Patent Application Laid-Open No. 8-83439 discloses a technique in which recording is performed by discoloring or deforming a metal-deposited layer by heat generated by the light-absorbing layer in a layer structure of a substrate / metal-deposited layer / light-absorbing layer / protective sheet. Is disclosed.
Japanese Patent Application Laid-Open No. 8-138245 discloses that recording is performed by changing the depth of a groove portion by changing the film thickness of a recording layer in a layer structure of a substrate / dielectric layer / recording layer including a light absorber / reflection layer. The technology is disclosed.
Japanese Patent Application Laid-Open No. 8-2977838 discloses a technique of performing recording by changing the thickness of a recording layer by 10 to 30% in a layer structure of a substrate / a recording layer including a light absorber / a metal reflection layer. I have.
[0006]
Japanese Unexamined Patent Publication No. Hei 9-198714 discloses a layer structure of a substrate / a recording layer containing an organic dye / a metal reflective layer / a protective layer, in which the groove width of the substrate is increased by 20 to 40% with respect to an unrecorded portion. A technique for performing recording is disclosed.
Japanese Patent No. 2506374 discloses a technique in which recording is performed by forming a bubble by deforming a metal thin film in a layer structure of a substrate / intermediate layer / metal thin film.
Japanese Patent No. 2591939 has a layer structure of substrate / light absorbing layer / recording auxiliary layer / light reflecting layer, in which the recording auxiliary layer is deformed into a concave shape and the light reflecting layer is formed into a concave shape along with the deformation of the recording auxiliary layer. There is disclosed a technique of performing recording by deforming.
Japanese Patent No. 2591940 discloses a recording assisting device having a layer structure of substrate / light absorbing layer / porous recording auxiliary layer / light reflecting layer or substrate / porous recording auxiliary layer / light absorbing layer / light reflecting layer. There is disclosed a technique in which recording is performed by deforming a layer in a concave shape and deforming a light reflecting layer in a concave shape along with the deformation of the recording auxiliary layer.
Japanese Patent No. 2591941 discloses that a light absorbing layer is deformed in a concave shape along with a light absorbing layer and a light reflecting layer is deformed in a concave shape in accordance with the deformation of the light absorbing layer. There is disclosed a technique of performing recording by causing the recording to be performed.
[0007]
Japanese Patent No. 2982925 discloses that a recording / assisting layer and an organic dye are compatible with each other in a layer structure of a substrate / a recording layer containing an organic dye / a recording auxiliary layer, and the absorption spectrum of the organic dye is shifted to a shorter wavelength side. Discloses a technique for performing recording.
Japanese Patent Application Laid-Open No. 9-265660 discloses a layer configuration in which a composite function layer having a function of a reflective layer and a recording layer and a protective layer are sequentially formed on a substrate. Recording is performed by forming bumps between the substrate and the composite function layer. Performing techniques are disclosed. Note that the composite functional layer is defined as a metal such as nickel, chromium, or titanium, or an alloy thereof.
Japanese Patent Application Laid-Open No. Hei 10-134415 discloses a layer structure in which a metal thin film layer, a deformable buffer layer, a reflective layer, and a protective layer are sequentially formed on a substrate, and the substrate and the metal thin film layer are deformed at the same time. A technique for performing recording by reducing the thickness of the buffer layer is disclosed. The metal thin film layer is defined as a metal such as nickel, chromium, and titanium, or an alloy thereof. Further, it is described that a resin which is easily deformable and has an appropriate fluidity is used for the buffer layer, and a dye may be contained in the buffer layer to promote the deformation.
[0008]
Japanese Patent Application Laid-Open No. H11-306591 discloses a layer configuration in which a metal thin film layer, a buffer layer, and a reflective layer are sequentially laminated on a substrate, in which the substrate and the metal thin film layer are deformed. A technique for performing recording by changing an optical constant is disclosed. Note that the metal thin film layer is preferably made of a metal such as nickel, chromium, or titanium, or an alloy thereof. The buffer layer is made of a mixture of a dye and an organic polymer, and a dye having a large absorption band near the recording / reproducing wavelength is used.
Japanese Patent Application Laid-Open No. H10-124926 discloses a layer configuration in which a metal recording layer, a buffer layer, and a reflective layer are sequentially laminated on a substrate, in which the substrate and the metal recording layer are deformed. A technique for performing recording by changing an optical constant is disclosed. It is described that a metal such as nickel, chromium, and titanium, or an alloy thereof is preferable for the metal recording layer. The buffer layer is made of a mixture of a dye and a resin, and a dye having a large absorption band near the recording / reproducing wavelength is used.
[0009]
As described above, the above various prior arts do not aim at realizing a write-once optical recording medium in the blue laser wavelength region, and are not effective layer configurations and recording methods in the blue laser wavelength region.
In particular, in the vicinity of 405 nm, which is the center of the oscillation wavelength of a blue semiconductor laser currently in practical use, almost all organic materials having an optical constant similar to the optical constant required for the recording layer of the conventional write-once optical recording medium are almost used. Almost no. Further, there is no example in which recording conditions are clarified in the vicinity of 405 nm and recording is performed at a higher recording density than that of DVD.
Further, most of the embodiments in the above-mentioned conventional technology are experiments with a conventional disk configuration (see FIG. 46). Although a configuration different from the conventional disk configuration has been proposed, the dye used therein is The same optical characteristics and functions as in the past are required, and there is no effective proposal for a layer configuration, a recording principle, and a recording method that can easily realize a write-once optical recording medium made of an organic material in a blue laser wavelength region.
[0010]
In addition, in a conventional write-once optical recording medium using an organic material, a large refractive index and a relatively small absorption coefficient (approximately 0.05 to 0.07) with respect to the recording / reproducing wavelength are obtained from the viewpoint of securing the degree of modulation and reflectance. Only organic materials with a) can be used.
That is, since the organic material does not have a sufficient absorbing ability to the recording light, it is impossible to reduce the thickness of the organic material, and therefore, it is necessary to use a substrate having a deep groove. (Because the organic material is usually formed by a spin coating method, the organic material is buried in a deep groove to increase the thickness). Therefore, it is very difficult to form a substrate having a deep groove, which has been a factor of deteriorating the quality as a write-once optical recording medium. Further, in a conventional write-once optical recording medium using an organic material, the main absorption band of the organic material exists near the recording / reproducing wavelength, so that the wavelength dependence of the optical constant of the organic material increases (the optical constant depends on the wavelength). The problem is that the recording characteristics such as recording sensitivity, modulation degree, jitter, and error rate, and the reflectivity change significantly with respect to fluctuations in the recording / reproducing wavelength due to individual differences in lasers, changes in environmental temperature, etc. was there.
[0011]
◎ General recording principle of write-once optical recording media
In general, in a write-once optical recording medium, a recording mode due to a change in the optical constant of the material used for the recording layer (the real part of the complex refractive index and the film thickness of the recording layer material) and the substrate and the reflective layer are deformed. There are deformation modes, which form recording marks. For example, Japanese Patent No. 271040 and Japanese Patent No. 2840643 describe the recording principle of a write-once optical recording medium.
However, these publications do not specifically describe how the described recording principle (recording mode) contributes to a reproduced signal and do not describe experimental results. That is, in the embodiments, it has not been demonstrated that recording is performed mainly by the recording principle recited in the claims.
Although it is very difficult to limit (specify) the recording mode in a multi-layered recording medium, it is observed by SEM or AFM that the recording was made according to the recording principle recited in the claims. However, this only proves that the claimed recording principle may exist and that it may contribute to the reproduced signal.
[0012]
Also, there is no description of what kind of reproduced signal is actually generated and what merits it has with respect to the conventional recording principle and other recording principles. Absent).
In an application in which the recording principle was invented, in some publications, examples are described in the form of embodiments, but even if the recording principle is clear, the relationship between the recording principle and the reproduced signal is not Since it is not clear, a specific example in which the relationship between the recording principle and the reproduction signal is clarified is necessary, and it cannot be described simply in the form of an embodiment.
Further, in almost all of the embodiments in the publications, a signal of a single cycle is recorded in a recording example (recording experiment), and it is completely unknown what happens to recording of different recording mark lengths. That is, there is no result that a random signal can be recorded and a beautiful eye pattern is obtained.
[0013]
For example, it should be described at least as to whether a mark sufficiently smaller than the beam diameter of the recording laser can be recorded and reproduced, what the recording polarity is, and what the recording waveform will be.
Since the reproduction signal of the optical recording medium is obtained by the diffraction effect together with the interference effect, for example, the height of the recording mark or the depth of the recording area (the thickness direction of the optical recording medium) is independent of the recording mark length. Even if it is assumed to be constant, the relationship between the recording mark length and the beam diameter of the laser beam changes depending on the recording mark length, so it cannot be said unconditionally how the reproduction signal changes.
Even if a signal of a single cycle can be recorded, there are not many cases where a random pattern signal can be recorded (conversely, it is not an exaggeration to say that it is rare).
In many cases, only the degree of modulation is described as a result of recording, but using only the degree of modulation does not prove that the medium can be used as an optical recording medium.
The above will be described with a specific example.
[0014]
An optical recording medium in which SiC was provided with a thickness of 10 nm on a polycarbonate substrate having a guide groove was manufactured.
The optical recording medium was irradiated with a laser beam of 6.0 mW from the substrate side using a DDU-1000 (wavelength: 405 nm, NA: 0.65) optical disc evaluation device manufactured by Pulstec Industrial. 3T to 14T marks were individually recorded at a recording frequency of 65.4 MHz and a recording linear velocity of 6.0 m / s in the portion (groove position on the back side when viewed from the incident laser beam side).
At this time, the results of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length) are shown in FIGS. 3 (a) to 3 (d).
In FIG. 3A, Unrec is a reproduction signal (RF level) when no recording is performed, Top is a maximum reproduction signal level (that is, a space portion) when a mark string is recorded, and Bottom is a minimum reproduction when a mark string is recorded. The signal level (that is, the mark portion), and further, MA indicates the modulation degree calculated by (Top-Bottom) / Top.
Referring to FIG. 3A, it can be seen that although the degree of modulation is slightly small, the reproduction signal (RF level) has a recording mark length (Mark Length) dependency that is equivalent to that of a CD-R or DVD-R. .
[0015]
However, in this optical recording medium, a random pattern can be recorded in the same manner as a CD-R or DVD-R, and a reproduction signal corresponding to a mark length cannot be obtained.
FIG. 3B shows a reproduction signal when a 3T mark is continuously recorded, a reproduction signal when a 4T mark is continuously recorded, and a reproduction signal level when no recording is performed. FIG. 3D shows a reproduction signal when the 6T mark is continuously recorded, a reproduction signal when the 8T mark is continuously recorded, and a reproduction signal level when the recording is not performed. , The reproduction signal when the 14T mark was continuously recorded, and the reproduction signal level when no recording was performed.
As a result, in FIG. 3 (b) and FIG. 3 (c), a reproduced signal according to the mark length similar to that of a CD-R or a DVD-R is obtained apart from signal disturbance. In (d), a reproduction signal corresponding to the mark length is not obtained as in the case of the CD-R or DVD-R. That is, in the 14T signal, the RF level at the center of the mark greatly increases and exceeds the RF level at the time of no recording.
[0016]
As in the case of CD-R and DVD-R, it is clear that the 14T signal shown in FIG. 3D cannot be correctly reproduced by the reproduction method in which the mark length of the reproduction signal is determined based on the slice level [ Should be determined, but it is determined as a pattern of (5T mark)-(4T space)-(5T mark)]. In other words, simply saying that recording could be performed does not mean that it can be actually used as an optical recording medium. [At a glance, a High to Low signal is obtained as shown in FIG. This does not mean that mark length recording is possible.]
Actually, there are a great number of materials and layer configurations that can be used for recording, but only very few can be used as optical recording media.
Therefore, even in the publications cited as the prior art, only the experimental results of the expression that the recording was performed, the experimental results of judging whether or not the recording is possible by the value of the macroscopic modulation degree, or the experimental results of the recording of a single cycle are available. In the publications not described, it cannot be determined whether or not the effect of the invention is truly achieved.
[0017]
[Problems to be solved by the invention]
An object of the present invention is to provide a write-once optical recording medium having the following characteristics.
-It can be manufactured at low cost with a simple layer configuration.
-There is no great limitation on the recording / reproducing wavelength, and the wavelength dependence of the recording characteristics is small.
-A relatively high reflectance is obtained.
Even when recording / reproducing is performed using deformation, the recording polarity does not change depending on the recording mark length or recording power and is constant.
-Even when recording and reproduction are performed using deformation, the reproduction waveform of the recording mark portion does not show a differential shape.
-Even in the case where recording and reproduction are performed using deformation, the recording polarity tends to be High to Low recording.
-Surface recording or recording with a high NA lens can be performed, and high density can be achieved.
[0018]
[Means for Solving the Problems]
The above-mentioned problems are solved by the following inventions 1) to 14) (hereinafter, referred to as inventions 1 to 14).
1) At least a deformable layer and a light absorbing layer, and an interface between the deformable layer and an adjacent layer on the laser light incident side in contact with the deformable layer is set as a main reflection interface. A write-once optical recording medium, wherein a recording mark is formed by deforming a deformable layer in a laser beam incident direction.
2) The write-once optical recording medium according to 1), wherein the deformable layer and an adjacent layer on the laser beam incident side that is in contact with the deformable layer are not mixed by recording.
3) Near the interface between the deformed layer and the layer located on the back side of the deformed layer as viewed from the laser beam incident side, a reduced refractive index portion or a void portion of the material forming the layer present on the back side is formed. A write-once optical recording medium according to 1) or 2), wherein a recording mark is formed by forming the recording mark.
4) The write-once optical recording medium according to 1) or 2), wherein a recording mark is formed by forming a reduced refractive index portion or a void portion of a material constituting the deformable layer in the deformable layer. .
5) The write-once optical recording medium according to any one of 1) to 4), wherein the light absorption layer is made of an organic material.
6) The write-once optical recording medium according to any one of 1) to 4), wherein the light absorption layer contains Si and / or Ge.
7) A write-once type having at least a recording layer, wherein the recording layer has both a light absorbing function for laser light and a deformation function for causing deformation without being melted or decomposed by irradiation with laser light. Optical recording medium.
8) At least a recording layer, which has both a function of absorbing laser light and a function of causing deformation without being melted or decomposed by irradiation of laser light. The interface between the recording layer and the adjacent layer on the laser light incident side that is in contact with the recording layer is defined as the main reflection interface, and the recording layer itself is deformed in the laser light incident direction due to the heat generation of the recording layer by the irradiation of the laser light, thereby forming a recording mark. A write-once optical recording medium, comprising:
9) It has at least a recording layer and an organic material layer, and the recording layer has both a function of absorbing laser light and a function of causing deformation without being melted or decomposed by irradiation with laser light. Write-once optical recording medium.
10) It has at least a recording layer and an organic material layer, and the recording layer has both a light absorbing function for laser light and a deformation function for causing deformation without being melted or decomposed by irradiation with laser light. The interface between the layer and the adjacent layer on the laser light incident side that is in contact with the recording layer is used as the main reflection interface, and the recording layer itself is deformed in the direction of incidence of the laser light due to heat generation of the recording layer by irradiation with the laser light. A write-once optical recording medium, wherein a mark is formed.
11) In the vicinity of the interface between the recording layer and the layer existing on the back side of the recording layer when viewed from the laser beam incident side, a portion having a lower refractive index or a void portion of the material constituting the layer existing on the back side is provided. The recordable optical recording medium according to any one of 7) to 10), wherein a recording mark is formed by forming the recording mark.
12) Additional recording according to any one of 7) to 10), wherein a recording mark is formed by forming a reduced refractive index portion or a void portion of a material constituting the recording layer in the recording layer. Type optical recording medium.
13) The write-once optical recording medium according to any one of 7) to 12), wherein the recording layer contains Si and / or Ge.
14) The recordable optical recording medium according to any one of 1) to 13), wherein a recording mark can be formed by a blue laser beam having a wavelength of 350 to 500 nm.
[0019]
Hereinafter, the present invention will be described in detail, the relationship between the principle of recording and reproduction according to the present invention and the reproduced signal will be clarified, and the validity and validity of the present invention will be clearly shown.
The inventor of the present invention tends to easily change the recording polarity from low to high, change the recording polarity depending on the recording mark length or recording power, or differentiate the reproduced signal waveform in the following cases a) and b). I found that.
B) A case where there is a main reflection interface at the interface between the layer to be deformed and the layer adjacent to the laser light incident side of the layer to be deformed, and the main reflection interface is deformed in the direction opposite to the incident laser light side (light source side).
B) In the case of b), particularly, a case where a deformable layer and a refractive index lowering portion or a void portion are formed near the interface of the layer adjacent to the laser beam incident side of the deformable layer.
That is, in the vicinity of the interface between the layer to be deformed and the layer adjacent to the side opposite to the direction in which the deformation occurs, separation of the layers, the volume expansion of the layer adjacent to the side opposite to the direction in which the deformation occurs, or Due to the melting, decomposition, explosion, etc. of the layer adjacent to the side opposite to the direction in which the deformation occurs, a portion having a reduced refractive index such as a void is likely to be formed, which causes the recording polarity to become low to high, the recording mark length and the recording length. It has been found that a change in recording polarity due to power or a differentiation of a reproduction signal waveform is caused. The recording polarity is changed from low to high, a change in recording polarity due to a recording mark length or recording power, or a differentiation of a reproduction signal waveform. In order to prevent the laser beam from being deformed, the deformation direction of the main reflection interface is controlled so that a portion having a low refractive index such as a void is formed on the deep side of the main reflection interface when viewed from the laser beam incident side, or recording / reproducing. Control the direction Was found to be very effective.
[0020]
Therefore, in the present invention, the layer to be deformed (the deformed layer or the recording layer in the present invention) is deformed toward the incident laser beam side (light source side).
Thereby, the refractive index lowering portion or the air gap can be formed on the deep side of the main reflection interface (that is, the deformed interface) when viewed from the laser beam incident side, and the recording polarity is changed from Low to High. The recording polarity change due to the recording mark length and recording power or the differentiation of the reproduction signal waveform is suppressed and prevented, the recording polarity can be unified to High to Low, and good mark length recording / reproduction can be realized.
In general, in mark length recording, when a recorded mark is reproduced, a reproduced signal (RF signal) as shown in FIG. 47A is obtained, whereas a reproduced signal as shown in FIG. 47B or FIG. In the present invention, a signal having an inflection point near the leading and trailing edges of the recording mark and near the center of the recording mark is referred to as a differential waveform (differential waveform).
[0021]
The term “deformed layer and adjacent layer in contact with the deformed layer” as used in the present invention indicates, for example, a substrate or an overcoated layer in the case of an optical recording medium configuration in which a deformed layer and an overlaid layer are sequentially provided on a substrate ( For example, the overcoat layer may be an air layer).
In addition, the main reflection interface referred to in the present invention refers to a reflection interface that contributes the most to reflected reproduction light. Therefore, the main reflection interface is generally the interface having the largest reflection coefficient.
However, even at the interface having the largest reflection coefficient, there are a plurality of layers on the incident light side from the reflection interface or the absorption coefficient (complex refractive index of the layer) on the incident light side of the reflection interface. This does not apply when sufficient light does not pass through to the interface having the largest reflection coefficient, such as when the imaginary part is large.
Therefore, the reflection interface that contributes the most to the reproduction reflection light is referred to as the main reflection interface.
[0022]
For example, when a deformed layer having a large complex refractive index is sandwiched between adjacent layers having a smaller complex refractive index than the deformed layer, the interface between the deformed layer and one of the adjacent layers is a main reflection interface. The main reflection interface referred to above indicates an interface having a larger pointing vector. Here, the pointing vector indicates a time average value of the pointing vector, and is a value indicating the light intensity.
As a specific example, an organic material layer (assuming a complex refractive index of 2.0-i0.1 and a film thickness of 60 nm) and a Si layer (a complex refractive index of 4.3-i2.0 and a film thickness of 20 nm) are provided on a substrate. Considering the case where recording and reproduction are performed from the substrate side, the main reflection interface is located at one of the adjacent layer interfaces of the Si layer.
The interface having the largest reflection coefficient is the interface between the Si layer and the air layer, and the interface having the largest reflection coefficient is the interface between the organic material layer and the Si layer. When the pointing vector is calculated, the result is as shown in FIG. The interface between the organic material layer having a large pointing vector and the Si layer is the main reflection interface in the present invention.
[0023]
As another specific example, an organic material layer (assuming a complex refractive index of 2.0-i0.1 and a film thickness of 60 nm) and a Si layer (complex refractive index of 4.3-i2.0, Considering a case where an optical recording medium having a thickness of 20 nm is stacked and recording / reproducing is performed from the Si layer side, the main reflection interface is located at one of the adjacent layer interfaces of the Si layer. .
The interface having the largest reflection coefficient is the interface between the Si layer and the air layer, and the interface having the largest reflection coefficient is the interface between the organic material layer and the Si layer. When the pointing vector is calculated, the result is as shown in FIG. The interface between the Si layer having a large pointing vector and the air layer is the main reflection interface in the present invention.
[0024]
The term "deformation" as used in the present invention refers to a deformation in which a given write-once optical recording medium constituent layer is simply deformed, and the deformation interface is clear.
For example, as in conventional CD-R and DVD-R, the interface between the substrate and the organic material layer is deformed, but the substrate and the organic material are melted or decomposed by recording, for example, the diffusion of the organic material into the substrate. Therefore, there is a high possibility that the two will mix near the interface, and the two will not have a clear interface. This obscuration of the deformed interface tends to cause a decrease in the recording contrast (modulation degree).
Therefore, in the present invention, the deformed interface is clearly maintained.
For this purpose, it is preferable that a layer that is deformed (a deformed layer or a recording layer in the present invention) is not mixed with an adjacent layer by recording.
The deformation of the deformable layer (the deformable layer or the recording layer in the present invention) is caused by the heat generated by the light absorbing layer provided separately from the deformable layer, but the deformable layer itself has a light absorbing function. Alternatively, the heat may be generated by the deformed layer itself.
[0025]
In the present invention, for example, a write-once optical recording medium provided with an organic material layer adjacent to a recording layer having both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by irradiation of laser light I will provide a.
One of the reasons for providing the organic material adjacent to the recording layer is that the organic material layer can have a function of controlling the amount of deformation of the deformable layer.
This is, for example, in a write-once optical recording medium provided with a recording layer having both a light absorbing function for laser light on a substrate and a deformation function of causing deformation without being melted or decomposed by irradiation of laser light, the recording layer is deformed. This is because not only deformation due to the light absorbing function of the recording layer itself but also expansion of the substrate due to heat generated in the recording layer is greatly affected.
[0026]
Therefore, by providing an organic material layer between the substrate and a recording layer having both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by the irradiation of the laser light, the recording layer is positioned on the side opposite to the substrate. In the case of a write-once optical recording medium that is deformed (to the side opposite to the substrate when viewed from the recording layer), the effect of the substrate deformation on the deformation of the recording layer toward the side opposite to the substrate can be reduced. Is the main reflection interface, and the deformation characteristics of the deformation layer such as the recording layer are the most important.)
Alternatively, by providing an organic material layer between a substrate and a recording layer having both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by laser light irradiation, the recording layer is moved to the substrate side. In the case of a write-once optical recording medium that is deformed, the influence of substrate deformation that hinders the deformation of the recording layer toward the substrate can be reduced, and good deformation can be caused (in the present invention, the recording layer and the like can be formed). Is the main reflection interface, and the deformation characteristics of the deformation layer such as the recording layer are the most important.)
[0027]
In addition, the organic material layer has a function of improving the recording / reproducing characteristics by causing the organic material to be decomposed or deteriorated by heat from a layer having a light absorbing function such as a recording layer and changing its optical constant. It is possible to have.
The change in the optical constant referred to here means a decrease or increase in the real part of the complex refractive index, a decrease or increase in the imaginary part of the complex refractive index, a decrease or increase in the thickness of the organic material layer, or a combination thereof.
In addition, the recording / reproducing characteristics referred to here refer to the reflectance, jitter, modulation degree, tracking characteristics, etc., when recording is not performed.
Furthermore, the organic material layer should have a function to supplement the light absorbing function of the light absorbing layer or the recording layer having both the light absorbing function for laser light and the deformation function of causing deformation without being melted or decomposed by laser light irradiation. Is also possible.
[0028]
As a material used for the organic material layer, for example, a dye is preferable.
Dyes include polymethine, naphthalocyanine, phthalocyanine, squarylium, croconium, pyrylium, naphthoquinone, anthraquinone (indanthrene), xanthene, triphenylmethane, azulene, tetrahydrocholine, phenanthrene And triphenothiazine dyes, and metal complex compounds.
The formation of the dye layer can be performed by ordinary means such as vapor deposition, sputtering, CVD, and solvent application. In the case of using a coating method, the above-mentioned coloring matter or the like may be dissolved in an organic solvent and applied by a conventional coating method such as spraying, roller coating, dipping, or spin coating.
[0029]
Examples of the organic solvent used include alcohols such as methanol, ethanol and isopropanol; ketones such as acetone, methyl ethyl ketone and cyclohexanone; amides such as N, N-dimethylacetamide and N, N-dimethylformamide; sulfoxides such as dimethylsulfoxide. Ethers such as tetrahydrofuran, dioxane, diethyl ether and ethylene glycol monomethyl ether; esters such as methyl acetate and ethyl acetate; aliphatic halogenated carbons such as chloroform, methylene chloride, dichloroethane, carbon tetrachloride, and trichloroethane; Aromatics such as benzene, xylene, monochlorobenzene and dichlorobenzene; cellosolves such as methoxyethanol and ethoxyethanol; hexane, pentane, Cyclohexane, and hydrocarbons such as methylcyclohexane.
The thickness of the dye layer is suitably from 100 to 10 μm, preferably from 100 to 2000 °.
Note that a polymer can be used as the organic material layer.
[0030]
The deformable layer used in the present invention is not limited as long as it is deformed by recording.
However, in the present invention, it is preferable to use a material having a large difference in the complex refractive index from the adjacent layer, because the interface between the deformed layer and the adjacent layer is the main reflection interface.
Therefore, in general, a metal (for example, Au, Ag, Al, Cr, Ni, Fe, Sn, or the like) having a small refractive index (complex refractive index real part) or a metal having a small refractive index (complex refractive index real part) is used. Large materials [materials containing Si and / or Ge (eg, Si, Ge, Si x Ge 1-x , Mg 2 Ge, Mg 2 Si, SiC, etc.); metals such as Nb, Ta, Be, V, or metal oxides thereof (eg, Ta) 2 O 5 , Nb 2 O 5 Etc.)]; AlSb, Al x Ga 1-x As, CdSe, GaSb, Hg 1-x Cd x Semiconductors such as Te, Se, Te, ZnTe, ZnS, PbS, InP, and GaP can be used.
[0031]
When the adjacent layer of the deformation layer forming the main reflection interface with the deformation layer has a relatively low refractive index (about 1.8 or less), for example, Al 2 O 3 , MgO, BeO, ZrO 2 , UO 2 , ThO 2 Oxides such as simple oxides; SiO 2 , 2MgO ・ SiO 2 , MgO / SiO 2 , CaO ・ SiO 2 , ZrO 2 ・ SiO 2 , 3Al 2 O 3 ・ 2SiO 2 2MgO.2Al 2 O 3 ・ 5SiO 2 , Li 2 O ・ Al 2 O 3 ・ 4SiO 2 Silicate-based oxides such as Al; 2 TiO 5 , MgAl 2 O 4 , Ca 10 (PO 4 ) 6 (OH) 2 , BaTiO 3 , LiNbO 3 , PZT, PLZT (PbTiO 3 -PbZrO 3 Oxides), oxides of multiple oxides such as ferrite; Si 3 N 4 , Si 6-Z Al Z O Z N 8-Z , AlN, BN, TiN and other nitride-based non-oxides; SiC, B 4 Carbide-based non-oxide such as C, TiC, WC; LaB 6 , TiB 2 , ZrB 2 Boride-based non-oxides such as CdS, MoS 2 Sulfide-based non-oxide such as MoSi 2 For example, silicide-based non-oxides such as amorphous carbon, graphite, diamond, and the like, and their contents can be used.
[0032]
The light absorbing layer is not limited as long as it has a material having a relatively large absorption coefficient with respect to the recording wavelength (the absorption coefficient is an imaginary part of the complex refractive index; for example, preferably 0.2 or more). , Si and / or Ge containing materials (eg Si, Ge, Si x Ge 1-x , Mg 2 Ge, Mg 2 Si, SiC, etc.); metals such as Nb, Ta, Be, V, or metal oxides thereof (eg, Ta) 2 O 5 , Nb 2 O 5 Etc.); AlSb, Al x Ga 1-x As, CdSe, GaSb, Hg 1-x Cd x Semiconductors such as Te, Se, Te, ZnTe, ZnS, PbS, InP, and GaP; metals such as Ni, Cr, Ti, Ta, and Fe having lower thermal conductivity than Ag and the like; Cu / Al, Ni / Fe, and the like Alloy or the like can be used.
It is also possible to use the above-mentioned dye as a material used for the organic material layer.
[0033]
As a recording layer having both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by laser light irradiation, a material containing Si and / or Ge (for example, Si, Ge, Si x Ge 1-x , Mg 2 Ge, Mg 2 Si, SiC, etc.); metals such as Nb, Ta, Be, V, or metal oxides thereof (eg, Ta) 2 O 5 , Nb 2 O 5 Etc.); AlSb, Al x Ga 1-x As, CdSe, GaSb, Hg 1-x Cd x Semiconductors such as Te, Se, Te, ZnTe, ZnS, PbS, InP, and GaP; metals such as Ni, Cr, Ti, Ta, and Fe having lower thermal conductivity than Ag; Cu / Al, Ni / Fe And the like can be used.
[0034]
The present invention can provide a "write-once optical recording medium having a simple layer structure and being inexpensive to manufacture" because it uses the simplest recording principle of deformation.
The reason that `` the write-once optical recording medium having no significant limitation on the recording / reproducing wavelength and the wavelength dependence of the recording characteristics is small '' can be provided, for example, a light absorption function for laser light, without melting or decomposing by irradiation of laser light. When a recording layer having a deforming function that causes deformation is used, as a material of such a recording layer, Si and / or Ge-containing materials such as SiC, Si, and Ge are preferably used. This is because they do not have such a large wavelength dependence as the organic materials used in conventional write-once optical recording media.
Therefore, the write-once optical recording medium of the present invention can easily record even light in the blue laser wavelength region of about 350 to 500 nm, and in principle, can record even light having a shorter wavelength.
[0035]
The reason that the "write-once optical recording medium with a relatively high reflectivity" can be provided is a light absorbing layer, a deformable layer, or a light absorbing function for laser light, and deformation without melting or decomposing by laser light irradiation. Si and / or Ge-containing materials such as SiC, Si, and Ge are preferably used for the recording layer having the function of causing deformation, because these materials have a large complex refractive index in a blue laser wavelength region or less. A recording layer having both a light absorbing layer, a deformable layer, or a light absorbing function for laser light and a deforming function of causing deformation without being melted or decomposed by laser light irradiation, and a reflection coefficient at an interface between these recording layers and the adjacent layer is increased. Is).
The reason for providing a “writable optical recording medium capable of achieving surface recording or recording with a high NA lens and achieving high density” can be provided because of the configuration of the recording medium of the present invention and the recording principle, the recording / reproducing direction is limited. This is because there is no layer structure (in addition to the recording / reproducing direction, a layer structure corresponding to the direction can be easily realized).
[0036]
Embodiments of the present invention are as shown in FIGS. The arrows in the drawing indicate the incident direction of the recording / reproducing light.
FIG. 34 shows an example in which a light absorption layer and a deformation layer are sequentially stacked on a substrate.
FIG. 35 is a recording example (modification example) of the write-once optical recording medium of FIG. 34 in which the interface between the deformation layer and an adjacent layer on the side opposite to the light absorption layer side of the deformation layer is a main reflection interface. ), Wherein the deformable layer is deformed in the direction of incidence of the laser beam by the heat generation of the light absorbing layer.
At this time, at the interface between the deformable layer and the light absorbing layer, a refractive index lowering portion or void due to volume expansion of the deformable layer material, a void due to separation of the deformable layer and the light absorbing layer, or a void or refraction due to a volume change of the light absorbing layer. A rate reduction portion and the like are formed.
In the present invention, the void can be considered to correspond to the refractive index lowering portion.
[0037]
FIG. 36 shows a recording example (modification) of the write-once optical recording medium of FIG. 34 in which the interface between the deformable layer and the light absorbing layer is a main reflection interface. Thereby, the deformable layer is deformed in the direction of incidence of the laser beam.
At this time, at the interface between the deformable layer and the layer on the side opposite to the light absorbing layer (opposite layer), the refractive index lowering portion or void due to the volume expansion of the deformable layer material, the void due to separation of the deformable layer and the opposite layer, A void, a refractive index lowering portion, and the like due to a change in volume of the opposite layer are formed.
[0038]
FIG. 37 shows an example in which a deformation layer and a light absorption layer are sequentially stacked on a substrate.
FIG. 38 shows a recording example (modification) of the write-once optical recording medium of FIG. 37 in which the interface between the deformable layer and the light absorbing layer is a main reflection interface. Thereby, the deformable layer is deformed in the direction of incidence of the laser beam.
At this time, at the interface between the deformable layer and the substrate, there are formed a refractive index lowering portion and a void due to the volume expansion of the deformable layer material, a void due to the separation of the deformable layer and the substrate, or a void and a lower refractive index portion due to the change in the volume of the substrate. Is done.
Although FIG. 38 illustrates that the interface of the adjacent layer of the light absorbing layer on the opposite side to the deformable layer is also deformed by the deformation of the deformable layer, this interface may not be deformed.
[0039]
FIG. 39 shows a recording example (modification) of the write-once optical recording medium of FIG. 37 in which the interface between the deformable layer and the substrate is a main reflection interface. The layer is deformed in the direction of incidence of the laser beam.
At this time, at the interface between the deformable layer and the light absorbing layer, a refractive index lowering portion or a gap due to volume expansion of the deformable layer material, a gap due to separation of the deformable layer and the light absorbing layer, or a gap or refraction due to a volume change of the light absorbing layer. A rate reduction portion and the like are formed.
[0040]
FIG. 40 illustrates an example in which a recording layer having both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by laser light irradiation is stacked over a substrate.
FIG. 41 shows a recording example (modification) of the write-once optical recording medium of FIG. 40 in which the interface between the recording layer and an adjacent layer of the recording layer opposite to the substrate is a main reflection interface. This shows that the recording layer itself is deformed in the direction of incidence of the laser beam by the heat generation of the recording layer.
At this time, at the interface between the recording layer and the substrate, there are formed a refractive index-reduced portion or void due to volume expansion of the recording layer material, a void due to the separation of the recording layer and the substrate, or a void or refractive index reduced portion due to a change in the volume of the substrate. Is done.
[0041]
FIG. 42 shows a recording example (modification) of the write-once optical recording medium of FIG. 40 in which the interface between the recording layer and the substrate is a main reflection interface. It deforms itself in the direction of incidence of the laser beam.
At this time, at the interface between the recording layer and the layer on the side opposite to the substrate (opposite layer), a refractive index-reduced portion or void due to volume expansion of the recording layer material, a void due to separation of the recording layer from the opposite layer, or an opposite layer A void, a refractive index lowering portion, and the like are formed due to the change in volume.
[0042]
FIG. 43 shows an example in which an organic material layer and a recording layer having a function of absorbing laser light and a function of deforming without being melted or decomposed by laser light irradiation are sequentially stacked on a substrate.
FIG. 44 shows a write-once optical recording medium of FIG. 43 in which the interface between the recording layer and an adjacent layer on the side opposite to the organic material layer side of the recording layer is a main reflection interface (modification example). The recording layer is deformed in the direction of incidence of the laser beam by the heat generated by the recording layer.
At this time, at the interface between the recording layer and the organic material layer, there is a gap or a refraction due to the volume expansion of the recording layer material, a gap due to separation of the recording layer and the organic material layer, or a gap or refraction due to a volume change of the organic material layer. A rate reduction portion and the like are formed.
[0043]
FIG. 45 shows a recording example (modification) of the write-once optical recording medium of FIG. 43 in which the interface between the recording layer and the organic material layer is a main reflection interface. The recording layer is deformed in the direction of incidence of the laser beam.
At this time, at the interface between the recording layer and the layer on the side opposite to the organic material layer (opposite layer), a refractive index-reduced portion or a gap due to volume expansion of the recording layer material, a gap due to separation of the recording layer and the opposite layer, or A void, a refractive index lowering portion, and the like due to a change in volume of the opposite layer are formed.
Note that in FIGS. 44 to 45, the organic material layer in the portion where the recording layer is deformed may have a change in optical constant.
FIGS. 34 to 45 described above are examples of the minimum layer configuration in which the present invention is effective. In fact, in addition to the layer configurations of FIGS. A layer, a protective layer, an adhesive layer, a cover layer, and the like may be provided.
[0044]
【Example】
Hereinafter, the present invention will be specifically described with reference to examples, but the present invention is not limited to these examples. In FIGS. 1 (a) to 8 (a) and FIGS. 26 (a) to 31 (a), Unrec is a reproduction signal (RF level) at the time of no recording, and Top is a signal at the time of recording a mark row. The maximum reproduction signal level (that is, the space portion), Bottom is the minimum reproduction signal level when a mark string is recorded, and MA is the modulation degree calculated by (Top-Bottom) / Top.
First, Reference Examples 1 to 8 show that the conventional recording / reproducing method has a high possibility that a random pattern cannot be recorded / reproduced on an optical recording medium mainly based on a recording principle based on deformation.
[0045]
Reference Example 1
An optical recording medium having a 10 nm-thick SiC (light absorbing layer) provided on a polycarbonate substrate having a guide groove with a groove depth of 55 nm was manufactured.
The optical recording medium was irradiated with a 5.0 mW laser beam from the substrate side using a DDU-1000 (wavelength: 405 nm, NA: 0.65) optical disk evaluation device manufactured by Pulstec Industrial to produce grooves. 3T to 14T marks were independently recorded at the recording frequency of 65.4 MHz and the recording linear velocity of 6.0 m / sec in the portion (the groove position on the near side when viewed from the incident laser beam side).
At this time, FIG. 1A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the results of FIG. 1A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 1B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when it is not recorded in FIG. ) Shows the reproduced signal level when the 6T mark is continuously recorded, the reproduced signal when the 8T mark is continuously recorded, and the reproduced signal level when the recording is not performed, and FIG. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, it can be seen that all of the 3T, 4T, 6T, 8T, and 14T show a reproduction signal waveform that allows mark length recording.
[0046]
Reference Example 2
The same experiment as in Reference Example 1 was performed except that the recording power was set to 6.0 mW.
FIG. 2A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 2A, a signal in which the recording polarity changes depending on the recording mark length, that is, a short mark is High to Low recording, but a long mark is a signal in which High to Low recording and Low to High recording are mixed. As a result, it is found that recording of the mark length becomes difficult.
FIG. 2B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when it is not recorded in FIG. ) Shows the reproduction signal when the 6T mark is recorded continuously, the reproduction signal when the 8T mark is recorded continuously, and the reproduction signal level when the recording is not performed, and FIG. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, 3T and 4T indicate reproduction signal waveforms that allow recording of mark length, while 6T, 8T, and 14T indicate reproduction signal waveforms in which the RF level at the center of the mark has greatly increased. The period of the reproduced signal looks twice as long as the original reproduced signal. This is well understood in comparison with FIG. 1 (c)]. It can be seen that mark length recording becomes difficult.
[0047]
Reference Example 3
An experiment was performed in exactly the same manner as in Reference Example 1 except that a laser beam of 6.0 mW was irradiated and recording was performed on a land portion (groove position on the back side as viewed from the incident laser beam side).
FIG. 3A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 3A, it can be seen that the recording polarity changes according to the recording mark length, that is, high-to-low recording is performed for a short mark, but high-to-low recording and slightly low-to-high recording are mixed for a long mark. Such a signal tends to be generated, indicating that there is a possibility that the mark length recording becomes difficult.
FIG. 3B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when it is not recorded in FIG. 3) shows the reproduction signal when the 6T mark is continuously recorded, the reproduction signal when the 8T mark is continuously recorded, and the reproduction signal level when the recording is not performed, and FIG. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, 3T, 4T, 6T, and 8T indicate reproduction signal waveforms that allow recording of mark length, but 14T indicate reproduction signal waveforms in which the RF level at the center of the mark has greatly increased, making it difficult to record mark length. It turns out that it becomes.
[0048]
Reference example 4
The same experiment as in Reference Example 1 was performed except that a 7.0 mW laser beam was irradiated and recording was performed on a land portion (a groove position on the back side when viewed from the incident laser beam side).
FIG. 4A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 4A, a signal in which the recording polarity changes depending on the recording mark length, that is, a short mark is High to Low recording, but a long mark is a signal in which High to Low recording and Low to High recording are mixed. As a result, it is found that recording of the mark length becomes difficult.
FIG. 4B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when the recording is not performed. 4) shows the reproduction signal level when the 6T mark is continuously recorded, the reproduction signal level when the 8T mark is continuously recorded, and the reproduction signal level when the recording is not performed. FIG. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, 3T and 4T indicate reproduction signal waveforms that allow recording of mark length, while 6T, 8T, and 14T indicate reproduction signal waveforms in which the RF level at the center of the mark has greatly increased. Appears twice as long as the original reproduced signal. This is well understood in comparison with FIG. 1 (c)]. It can be seen that mark length recording becomes difficult.
[0049]
Reference example 5
An optical recording medium in which a 20-nm-thick Si (light-absorbing layer) was provided on a polycarbonate substrate having a guide groove with a groove depth of 55 nm was prepared.
The optical recording medium was irradiated with a 5.0 mW laser beam from the substrate side using a DDU-1000 (wavelength: 405 nm, NA: 0.65) optical disk evaluation device manufactured by Pulstec Industrial to produce grooves. 3T to 14T marks were independently recorded at the recording frequency of 65.4 MHz and the recording linear velocity of 6.0 m / sec in the portion (the groove position on the near side when viewed from the incident laser beam side).
At this time, FIG. 5A shows the result of measuring the dependency of the reproduction signal (RF level) on the recording mark length (Mark Length).
FIG. 5B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when it is not recorded in FIG. ) Shows the reproduced signal level when the 6T mark is recorded continuously, the reproduced signal when the 8T mark is recorded continuously, and the reproduced signal level when not recorded. FIG. 5D shows the 3T mark. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, except for the 3T mark, low-to-high recording is obtained irrespective of the recording mark length, the polarity compatibility with the conventional one is lost, and high-to-low recording is caused by a change in the complex refractive index of the organic material layer. It can be confirmed that it cannot be used together with the recording principle (for example, increase of the absorption coefficient).
[0050]
Reference Example 6
The same experiment as in Reference Example 5 was performed except that the recording power was changed to 6.0 mW.
FIG. 6A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
FIG. 6B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when the recording is not performed. ) Shows the reproduction signal when the 6T mark is continuously recorded, the reproduction signal when the 8T mark is continuously recorded, and the reproduction signal level when not recorded, and FIG. 6D shows the 3T mark. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, except for the 3T mark, low-to-high recording is obtained irrespective of the recording mark length, the polarity compatibility with the conventional one is lost, and high-to-low recording is caused by a change in the complex refractive index of the organic material layer. It can be confirmed that it cannot be used together with the recording principle (for example, increase of the absorption coefficient).
[0051]
Reference Example 7
An experiment was performed in exactly the same manner as in Reference Example 5, except that a laser beam of 5.0 mW was irradiated and recording was performed on a land portion (groove position on the back side when viewed from the incident laser beam side).
FIG. 7A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
FIG. 7B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when it is not recorded in FIG. 7) shows the reproduction signal when the 6T mark is continuously recorded, the reproduction signal when the 8T mark is continuously recorded, and the reproduction signal level when the recording is not performed, and FIG. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, except for the 3T mark, low-to-high recording is obtained irrespective of the recording mark length, the polarity compatibility with the conventional one is lost, and high-to-low recording is caused by a change in the complex refractive index of the organic material layer. It can be confirmed that it cannot be used together with the recording principle (for example, increase of the absorption coefficient).
[0052]
Reference Example 8
An experiment was performed in exactly the same manner as in Reference Example 5, except that a laser beam of 6.0 mW was irradiated and recording was performed on a land portion (groove position on the back side when viewed from the incident laser beam side).
FIG. 8A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
FIG. 8B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when it is not recorded in FIG. 8) shows the reproduction signal when the 6T mark is continuously recorded, the reproduction signal when the 8T mark is continuously recorded, and the reproduction signal level when the recording is not performed. FIG. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From these results, except for the 3T mark, low-to-high recording is obtained irrespective of the recording mark length, the polarity compatibility with the conventional one is lost, and high-to-low recording is caused by a change in the complex refractive index of the organic material layer. It can be confirmed that it cannot be used together with the recording principle (for example, increase of the absorption coefficient).
[0053]
As described above, from the results of Reference Examples 1 to 8, it is difficult to perform recording / reproducing by the mark length in the conventional method of recording / reproducing from the substrate side with a simple layer configuration in which the light absorbing layer is provided on the substrate. It was confirmed that the recording polarity was often changed from Low to High.
[0054]
Next, in Example 1, even under a simple layer configuration in which a light absorbing layer is provided on a substrate, recording / reproducing can be performed by the mark length, and conditions under which the recording polarity becomes High to Low will be examined. .
[0055]
Example 1
A recording mark having a mark length of about 3T (0.7λ) and about 8T (2.0λ) with a layer structure of substrate / light absorbing layer Si (thickness: 20 nm) (however, the width of the 3T mark is 0.7λ, When the width of the 8T mark is 0.8λ and the size of the mark in the height direction is 0.125λ), when the recording position, the recording mark deformation direction, and the reproducing direction are changed as shown below, It was calculated whether such a reproduced signal could be obtained.
・ Recording position: Land or Groove
・ Record mark deformation direction: Bump or Pit
-Reproduction direction: From the substrate side = [From Sub] or from the opposite substrate side = [From Air]
In calculation, here, Pit indicates a recording mark deformed in the opposite direction to the laser light incident direction, and Bump indicates a recording mark deformed in the laser light incident direction (see FIG. 9). The substrate groove shape was (A, B, C, D, ζ) = (0.2λ, 0.8λ, 1.0λ, 1.8525λ, 0.1375λ).
[0056]
The calculation results are as shown in FIGS. 10 to 17. FIG. 10 shows the result when the recording portion having the pit formed on the land is reproduced from the substrate side, and FIG. 11 shows the recording when the bump was formed on the land. FIG. 12 shows a result of reproducing a recording portion in which Pit is formed in the groove portion from the substrate side, and FIG. 13 shows a recording portion in which Bump is formed in the groove portion. FIG. 14 shows a case where a recording portion having a pit formed on a land portion is reproduced from the Si side, and FIG. 15 shows a case where a recording portion having a bump formed on the land portion is reproduced from the Si side. As a result, FIG. 16 shows the result when the recording portion in which the Pit is formed in the groove portion is reproduced from the Si side, and FIG. 17 shows the result when the recording portion in which the Bump is formed in the groove portion is reproduced from the Si side. .
10 to 17, the horizontal axis indicates the position of the reproduction laser beam, and the vertical axis indicates the level of the reproduction signal (the reproduction reflected light is detected by the four-split element, while the vertical axis is the sum signal of the four-split element [ Sum Signal]).
[0057]
From this result, it is generally considered that Pit is formed when recording is performed from the substrate, and Bump is formed when recording is performed from the air layer side. Therefore, the Bump condition (see FIG. 11 and FIG. 13) and the calculation results under the Pit conditions (FIGS. 14 and 16) in recording and reproduction from the air layer side are considered as unusual, and in recording and reproduction from the substrate side, the recording polarity depends on the recording position. However, it can be seen that the recording polarity is constant (High to Low) in recording and reproduction from the air layer side. Similarly, if the calculation results under the Bump conditions for recording / reproducing from the substrate and the Pit conditions for recording / reproducing from the air layer side are excluded as being unusual, the recording / reproducing from the substrate side will have a land It was found that a differential waveform was generated in recording in the section (see FIG. 10).
[0058]
The calculation result of the first embodiment describes, for example, the phenomena shown in FIGS. 5 to 8 (in actual measurement, phenomena in which low-to-high and differential waveforms occur not only in the land but also in the groove). Can not.
Therefore, as a result of intensive studies, the observation of a reproduced signal waveform in which the RF level rises at the center of the recording mark is due to a decrease in the refractive index such as a void generated inside the light absorption layer of SiC or Si. Alternatively, it was considered that the cause was caused by a gap generated between the light absorbing layer of SiC or Si and the substrate, or a refractive index reduced portion such as a gap generated in an expanded portion of the substrate. Even in the case of low-to-high recording, short marks often have high-to-low recording. Therefore, it is considered that the short mark has a greater effect of the diffraction effect than the interference effect.
[0059]
Accordingly, most of the reflected light is reflected light at the deformed interface (main reflection interface), and a refractive index lowering portion such as a void is not located closer to the incident laser light than the main reflection interface. With such a configuration, it is considered that the influence of the interference effect of the deformed portion can be reduced and the effect of the diffraction effect due to the deformation can be increased.
By doing so, it was considered that most of the reflected light is produced even by a long mark due to a diffraction effect due to deformation, so that mark length recording is always possible and High to Low recording can be performed.
In order to realize the above idea, the present inventor, for example, in an optical recording medium provided with a light absorbing layer on the substrate, there is a possibility that a gap is generated between the substrate and the light absorbing layer It has been found that it is very effective to reproduce information from an optical recording medium from the light absorbing layer side.
[0060]
◎ Therefore, next, an optical recording medium having a light-absorbing layer provided on a substrate, in which a gap may be generated between the substrate and the light-absorbing layer, is reproduced from the light-absorbing layer side. Thus, it is clarified by simulation that mark length recording is possible and High to Low recording may be performed.
[0061]
Example 2
A recording mark having a mark length of about 8T (2.0λ) in a layer configuration of substrate / light absorbing layer SiC (thickness 10 nm) or substrate / light absorbing layer Si (thickness 20 nm) (however, the mark width is 0.8525λ, and the size of the mark in the height direction was 0.30λ), when the following recording position, the presence or absence of a gap, and the reproduction direction were changed, what kind of reproduction signal was It was calculated whether it could be obtained.
・ Recording position: Land or Groove
・ With or without air gap: [No Bubble] or [Bubble]
-Reproduction direction: From the substrate side = [From Sub] or from the opposite substrate side = [From Air]
The substrate groove shape is (A, B, C, D, ζ) = (0.2λ, 1.0525λ, 1.2525λ, 1.8525λ, 0.1375λ) in the case of reproduction from the substrate side. (A, B, C, D, ζ) = (0.2λ, 0.8λ, 1.0λ, 1.8525λ, 0.1375λ).
[0062]
The calculation results are as shown in FIGS. 18 to 25. FIGS. 18 to 21 show the results when Si is provided on the substrate, and FIGS. 22 to 25 show the results when SiC is provided on the substrate.
FIG. 18 shows the result when the recording portion having the pit formed in the land portion is reproduced from the substrate side, FIG. 19 shows the result when the recording portion having the pit formed in the groove portion is reproduced from the substrate side, and FIG. FIG. 21 shows a result of reproducing a recording portion having a bump formed in a groove portion from the Si side, FIG. 22 shows a result of reproducing a recording portion having a bump formed in a groove portion from the Si side, and FIG. FIG. 23 shows the result when the formed recording portion was reproduced from the substrate side, FIG. 23 shows the result when the recording portion having the Pit formed in the groove portion was reproduced from the substrate side, and FIG. 24 shows the recording when the Bump was formed in the land portion. FIG. 25 shows the result when the recording portion where the bump is formed in the groove portion is reproduced from the SiC side as a result when the portion is reproduced from the SiC side.
18 to 25, the horizontal axis indicates the position of the reproduction laser beam, and the vertical axis indicates the level of the reproduction signal (the reproduction reflection light is detected by the four-split element, and the vertical axis is the sum signal of the four-split element [ Sum Signal]).
[0063]
From the above simulation results, it was found that in order to generate a reproduced signal actually observed, it is necessary to generate a gap (a portion having a low refractive index) between the light absorbing layer of SiC or Si and the substrate. . In other words, it was confirmed that there is a possibility that a gap (a portion having a low refractive index) may be generated between the substrate and the light absorbing layer of SiC or Si in actual recording. In the second embodiment, the calculation is performed on the assumption that a gap is generated (peeled) between the light absorbing layer and the substrate. However, when a refractive index lowering portion such as a gap is generated inside the light absorbing layer, or Similar calculation results are obtained when a refractive index lowering portion such as a void occurs in the substrate. Therefore, it was confirmed that voids (refraction-reduced portions) may be generated between the light absorbing layer made of SiC or Si and the substrate, in the light absorbing layer, or in the substrate in actual recording.
Also, in the reproduction from the substrate side (FIGS. 18, 19, 22, and 23), it can be seen that the reproduced signal waveform greatly changes depending on the presence or absence of the gap, and if the gap exists, the recording polarity is changed from low to high and differentiated. Although waveform formation is likely to occur, in reproduction from the light absorbing layer side (FIGS. 20, 21, 24, and 25), the reproduced signal waveform does not change significantly due to the presence or absence of a gap, does not have a differential waveform, and has a recording polarity. It was found that a signal of High to Low was obtained.
[0064]
Based on the above simulation results, the following Examples 3 to 8 demonstrate that the optical recording medium of the present invention enables mark length recording and high-to-low recording.
[0065]
Example 3
An optical recording medium in which a 10 nm-thick SiC light absorbing layer was provided on a polycarbonate substrate having a guide groove with a groove depth of 55 nm was prepared.
The optical recording medium was irradiated with 8.0 mW of laser light from the SiC side using an optical disk evaluation device DDU-1000 (wavelength: 405 nm, NA: 0.65) manufactured by Pulstec Industrial. 3T to 14T marks were independently recorded at a recording frequency of 65.4 MHz and a recording linear velocity of 6.0 m / sec (at the groove position on the near side when viewed from the incident laser beam side).
At this time, FIG. 26A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 26A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 26B shows a reproduction signal when the 3T mark is continuously recorded and a reproduction signal when the 4T mark is continuously recorded and a reproduction signal level when the recording is not performed, as shown in FIG. ) Shows the reproduction signal when the 6T mark is recorded continuously, the reproduction signal when the 8T mark is recorded continuously, and the reproduction signal level when it is not recorded, and FIG. 26 (d) shows the 3T mark. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From this result, it can be seen that 3T, 4T, 6T, 8T, and 14T all show a reproduction signal waveform that allows mark length recording.
[0066]
Example 4
The same experiment as in Example 3 was performed except that the recording power was set to 9.0 mW.
FIG. 27A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the results of FIG. 27A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 27B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when the recording is not performed. ) Shows the reproduced signal level when the 6T mark is recorded continuously, the reproduced signal when the 8T mark is recorded continuously, and the reproduced signal level when not recorded. FIG. 27D shows the 3T mark. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From this result, it can be seen that 3T, 4T, 6T, 8T, and 14T all show a reproduction signal waveform that allows mark length recording.
[0067]
Example 5
The same experiment as in Example 3 was performed except that the laser light of 7.0 mW was applied and recording was performed in a groove portion (groove position on the back side when viewed from the incident laser light side).
FIG. 28A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 28A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 28B shows a reproduction signal when the 3T mark is continuously recorded and a reproduction signal when the 4T mark is continuously recorded and a reproduction signal level when the recording is not performed. ) Shows the reproduced signal level when the 6T mark is continuously recorded, the reproduced signal when the 8T mark is continuously recorded, and the reproduced signal level when not recorded. FIG. 28 (d) shows the 3T mark. , A reproduction signal when the 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From this result, it can be seen that 3T, 4T, 6T, 8T, and 14T all show a reproduction signal waveform that allows mark length recording.
[0068]
Example 6
The same experiment as in Example 3 was performed, except that a laser beam of 8.0 mW was irradiated, and recording was performed in a groove portion (groove position on the back side when viewed from the incident laser beam side).
FIG. 29A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 29A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 29D shows a reproduced signal when a 3T mark is continuously recorded, a reproduced signal when a 14T mark is continuously recorded, and a reproduced signal level when not recorded.
From this result, it can be seen that both the shortest and longest marks show a reproduction signal waveform that allows recording of mark length.
[0069]
Example 7
An optical recording medium in which a 20-nm-thick Si (light-absorbing layer) was provided on a polycarbonate substrate having a guide groove with a groove depth of 55 nm was prepared.
The optical recording medium was irradiated with 6.0 mW of laser light from the Si side using a DDU-1000 (wavelength: 405 nm, NA: 0.65) optical disk evaluation device manufactured by Pulstec Industrial. 3T to 14T marks were independently recorded at a recording frequency of 65.4 MHz and a recording linear velocity of 6.0 m / sec (at the groove position on the near side when viewed from the incident laser beam side).
At this time, FIG. 30A shows the result of measuring the recording mark length (Mark Length) dependency of the reproduction signal (RF level).
From the result of FIG. 30A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 30B shows a reproduction signal when the 3T mark is continuously recorded and a reproduction signal when the 4T mark is continuously recorded and a reproduction signal level when the recording is not performed. ) Shows the reproduction signal when the 6T mark is continuously recorded, the reproduction signal when the 8T mark is continuously recorded, and the reproduction signal level when the recording is not performed, and FIG. , A reproduction signal when the 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From this result, it can be seen that 3T, 4T, 6T, 8T, and 14T all show a reproduction signal waveform that allows mark length recording.
[0070]
Example 8
The same experiment as in Example 7 was performed except that the recording power was set to 7.0 mW.
FIG. 31A shows the result of measuring the dependence of the reproduction signal (RF level) on the recording mark length (Mark Length).
From the result of FIG. 31A, it can be confirmed that High to Low recording may be performed regardless of the recording mark length.
FIG. 31B shows the reproduction signal when the 3T mark is continuously recorded and the reproduction signal when the 4T mark is continuously recorded and the reproduction signal level when the recording is not performed, as shown in FIG. ) Shows the reproduced signal level when the 6T mark is recorded continuously, the reproduced signal when the 8T mark is recorded continuously, and the reproduced signal level when not recorded. FIG. 31 (d) shows the 3T mark. , A reproduction signal when a 14T mark is continuously recorded, and a reproduction signal level when no recording is performed.
From this result, it can be seen that 3T, 4T, 6T, 8T, and 14T all show a reproduction signal waveform that allows mark length recording.
[0071]
As described above, as shown in Examples 3 to 8, a simple optical recording medium in which a light absorbing layer is simply provided on a substrate, between the substrate and the light absorbing layer, or between the light absorbing layer itself and the substrate. It has been proved by an experiment that the mark length can be recorded and the high-to-low recording can be performed by reproducing from the light absorbing layer side with respect to the optical recording medium in which a void may be generated inside the recording medium. Was.
[0072]
* Finally, the characteristics of the write-once optical recording medium of the present invention are clarified by Examples 9 to 10.
[0073]
Example 9
On a polycarbonate substrate having a guide groove with a groove depth of 55 nm, a dye layer comprising a Co metal complex represented by the following [Chemical Formula 1] and [Chemical Formula 2] having a thickness of about 60 nm, and further having an SiC thickness of 10 nm provided thereon. A recording medium was manufactured.
The optical recording medium was irradiated with 9.0 mW laser light from the SiC side using an optical disk evaluation device DDU-1000 (wavelength: 405 nm, NA: 0.65) manufactured by Pulstec Industrial. A signal of 8-16 modulation was recorded at a recording frequency of 65.4 MHz and a recording linear velocity of 6.0 m / sec in the portion (groove position on the near side when viewed from the incident laser beam side).
As a result, the degree of modulation was about 70%, the recording polarity was High to Low, a very clear eye pattern as shown in FIG. 32 was obtained, and the jitter (σ / Tw) was 8.5%. Was.
[0074]
Embedded image
Figure 2004030864
Embedded image
Figure 2004030864
[0075]
Example 10
On a polycarbonate substrate having a guide groove having a groove depth of 55 nm, an optical recording medium was prepared in which the dye layer represented by the above [Chemical Formula 1] was provided with a thickness of about 40 nm and SiC was further provided thereon with a thickness of 10 nm.
The optical recording medium is irradiated with laser light from the SiC side using an optical disk evaluation device manufactured by Pulstec Industrial Co., Ltd., DDU-1000 (wavelength: 405 nm, NA: 0.65). At a recording position of 65.4 MHz and a recording linear velocity of 6.0 m / sec, an 8-16 modulation signal was recorded in a groove position on the near side as viewed from the light side by changing the recording power.
As a result, the recording polarity was High to Low, and good jitter and modulation as shown in FIG. 33 were obtained.
[0076]
【The invention's effect】
According to the inventions 1 to 14, a write-once optical recording medium having the following characteristics can be provided.
-It can be manufactured at low cost with a simple layer configuration.
-There is no great limitation on the recording / reproducing wavelength, and the wavelength dependence of the recording characteristics is small.
-A relatively high reflectance is obtained.
A write-once optical recording medium that performs recording and reproduction using deformation, but the recording polarity does not change depending on the recording mark length or recording power and is constant.
-Although it is a write-once optical recording medium that performs recording and reproduction using deformation, the reproduction waveform of the recording mark does not show a differential shape.
-Although it is a write-once optical recording medium that performs recording and reproduction using deformation, the recording polarity tends to be Highto Low recording.
-Surface recording or recording with a high NA lens can be performed, and high density can be achieved.
[Brief description of the drawings]
FIG. 1 is a diagram showing a recording result of Reference Example 1.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 2 is a diagram showing a recording result of Reference Example 2.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 3 is a view showing a recording result of Reference Example 3;
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 4 is a diagram showing a recording result of Reference Example 4.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 5 is a diagram showing a recording result of Reference Example 5.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 6 is a diagram showing a recording result of Reference Example 6.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 7 is a view showing a recording result of Reference Example 7;
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 8 is a view showing a recording result of Reference Example 8.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 9 is an explanatory diagram of groove parameters.
(A) A diagram for explaining a deformed recording mark (From Sub).
(B) A diagram for explaining a deformed recording mark (From Air).
FIG. 10 is a diagram illustrating a calculation result in a case where a recording unit in which a pit is formed on a land is reproduced from the substrate side according to the first embodiment.
FIG. 11 is a diagram showing a calculation result in a case where a recording portion having a bump formed in a land portion is reproduced from the substrate side in the first embodiment.
FIG. 12 is a diagram illustrating a calculation result in a case where a recording unit in which a Pit is formed in a groove portion is reproduced from the substrate side according to the first embodiment.
FIG. 13 is a diagram showing a calculation result in the case where the recording portion in which the bump is formed in the groove portion is reproduced from the substrate side in the first embodiment.
FIG. 14 is a diagram illustrating a calculation result in a case where a recording portion in which a Pit is formed in a land portion is reproduced from the Si side according to the first embodiment.
FIG. 15 is a diagram showing a calculation result in the case where a recording portion in which a bump is formed in a land portion is reproduced from the Si side in the first embodiment.
FIG. 16 is a diagram showing a calculation result in a case where a recording portion in which a Pit is formed in a groove portion is reproduced from the Si side according to the first embodiment.
FIG. 17 is a diagram showing a calculation result in the case where the recording portion in which the bump is formed in the groove portion is reproduced from the Si side in the first embodiment.
FIG. 18 is a diagram illustrating a calculation result in a case where Si is provided on a substrate and a recording portion having a Pit formed in a land portion is reproduced from the substrate side in the second embodiment.
FIG. 19 is a diagram illustrating a calculation result in the case where Si is provided on the substrate and the recording portion in which the Pit is formed in the groove portion is reproduced from the substrate side in the second embodiment.
FIG. 20 is a diagram illustrating a calculation result in the case where Si is provided on the substrate and the recording portion in which the bump is formed in the land portion is reproduced from the Si side in the second embodiment.
FIG. 21 is a diagram showing a calculation result in a case where Si is provided on a substrate and a recording portion in which a bump is formed in a groove portion is reproduced from the Si side in the second embodiment.
FIG. 22 is a diagram illustrating a calculation result in a case where SiC is provided on a substrate and a recording portion in which a Pit is formed in a land portion is reproduced from the substrate side in the second embodiment.
FIG. 23 is a diagram illustrating a calculation result in the case where SiC is provided on the substrate and the recording portion in which the Pit is formed in the groove portion is reproduced from the substrate side in Example 2;
FIG. 24 is a diagram illustrating a calculation result in a case where SiC is provided on a substrate and a recording portion in which a bump is formed in a land portion is reproduced from the SiC side in the second embodiment.
FIG. 25 is a diagram illustrating a calculation result in the case where SiC is provided on the substrate and the recording portion in which the bump is formed in the groove portion is reproduced from the SiC side in the second embodiment.
FIG. 26 is a diagram showing a recording result of Example 3.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 27 is a view showing a recording result of Example 4.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 28 is a view showing a recording result of Example 5.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 29 is a view showing a recording result of Example 6.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 30 is a view showing a recording result of Example 7.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 31 is a view showing a recording result of Example 8.
(A) The relationship between the recording mark length, the reproduction signal (RF level), and the degree of modulation is shown.
(B) The reproduction signal level when the 3T mark and the 4T mark are continuously recorded, and the reproduction signal level when not recorded.
(C) The reproduction signal level when the 6T mark and the 8T mark are continuously recorded and the reproduction signal level when the recording is not performed are shown.
(D) A reproduction signal level when a 3T mark and a 14T mark are continuously recorded, and a reproduction signal level when no recording is performed.
FIG. 32 is a diagram showing an eye pattern according to a ninth embodiment.
FIG. 33 is a diagram illustrating a jitter and a modulation factor according to the tenth embodiment.
FIG. 34 is a diagram showing an embodiment of the present invention having a light absorbing layer and a deformable layer on a substrate.
FIG. 35 is a recording example (modification example) of the write-once optical recording medium of FIG. 34, in which the interface between the deformation layer and an adjacent layer on the side opposite to the light absorption layer side of the deformation layer is a main reflection interface; FIG.
FIG. 36 is a diagram showing a recording example (modification) of the write-once optical recording medium of FIG. 34, in which the interface between the deformation layer and the light absorption layer is a main reflection interface.
FIG. 37 is a diagram showing an embodiment of the present invention having a deformation layer and a light absorption layer on a substrate.
FIG. 38 is a diagram showing a recording example (modification) of the write-once optical recording medium of FIG. 37 in which the interface between the deformation layer and the light absorption layer is a main reflection interface.
39 is a diagram showing a recording example (modification) of the write-once optical recording medium of FIG. 37, in which the interface between the deformation layer and the substrate is a main reflection interface.
FIG. 40 is a diagram showing an embodiment of the present invention having a recording layer on a substrate.
41 is a recording example (modification) of the write-once optical recording medium of FIG. 40, in which the interface between the recording layer and an adjacent layer of the recording layer opposite to the substrate is a main reflection interface. FIG.
FIG. 42 is a diagram showing a recording example (modification) of the write-once optical recording medium of FIG. 40 in which the interface between the recording layer and the substrate is a main reflection interface.
FIG. 43 is a diagram showing an embodiment of the present invention having an organic material layer and a recording layer on a substrate.
FIG. 44 is a recording example (modification) of the write-once optical recording medium of FIG. 40 in which the interface between the recording layer and an adjacent layer of the recording layer opposite to the organic material layer is a main reflection interface. FIG.
FIG. 45 is a diagram showing a recording example (modification) of the write-once optical recording medium of FIG. 40 in which the interface between the recording layer and the organic material layer is a main reflection interface.
FIG. 46 is a view showing a layer structure of a conventional disk.
FIG. 47 is a view for explaining a waveform of a reproduction signal when a recording mark of mark length recording is reproduced.
(A) General case
(B) Differential waveform with inflection points near the leading and trailing edges of the recording mark
(C) Differential waveform with inflection point near the center of the recording mark
FIG. 48 is a diagram showing a calculation result of a pointing vector in an optical recording medium in which an organic material layer and a Si layer are stacked on a substrate, and recording and reproduction are performed from the substrate side.
FIG. 49 is a diagram showing a calculation result of a pointing vector in an optical recording medium in which an organic material layer and a Si layer are laminated on a substrate, and recording and reproduction are performed from the Si layer side.
[Explanation of symbols]
Mark Length Mark length
T reference clock
RF Level (V) RF (reproduction signal) level (volt)
Modulated amplitude modulation degree
Unrec Reproduction signal (RF) level when not recording
Top Reproduced signal level when recording a mark sequence (that is, space part)
Bottom Minimum reproduction signal level when a mark sequence is recorded (that is, mark portion)
Modulation degree calculated by MA (Top-Bottom) / Top
Time 0.5 (μs / div) Time (1 memory 0.5 microsecond)
Sum Signal Sum signal (reproduction signal)
Beam Position (μm) Beam position (deviation of beam center from mark center (micrometer)
A Width from the reference point to the near end of the adjacent land or groove
B Width from reference point to far end of adjacent land or groove
C Width from the reference point to the near end of the next groove or land
D Width from reference point to far end of next groove or land
高 Height from groove bottom to land top
Pit Recording mark deformed in the opposite direction of the laser beam incidence
Bump Recording mark deformed in the direction of laser beam incidence
From Sub Substrate side
From Air from opposite side of substrate
σ / Tw jitter
Position in Z position layer direction (indicating the thickness of organic material layer and Si layer)
Y pointing vector (time average of pointing vector)

Claims (14)

少なくとも変形層と光吸収層を有し、該変形層と、該変形層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による光吸収層の発熱によって、変形層がレーザ光の入射方向に変形することで記録マークが形成されることを特徴とする追記型光記録媒体。At least a deformable layer and a light absorbing layer, and an interface between the deformable layer and an adjacent layer on the laser light incident side in contact with the deformable layer is used as a main reflection interface, and the light absorbing layer is deformed by heat generation of the light absorbing layer by irradiation with laser light. A write-once optical recording medium, wherein a recording mark is formed by deforming a layer in an incident direction of a laser beam. 変形層と、該変形層と接するレーザ光入射側の隣接層が、記録によって混合しないことを特徴とする請求項1記載の追記型光記録媒体。2. The write-once optical recording medium according to claim 1, wherein the deformable layer and an adjacent layer on the laser beam incident side that is in contact with the deformable layer are not mixed by recording. 変形層と、レーザ光の入射側から見て変形層の奥側に存在する層との界面近傍に、該奥側に存在する層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする請求項1又は2記載の追記型光記録媒体。In the vicinity of the interface between the deformed layer and the layer located on the back side of the deformed layer as viewed from the laser beam incident side, a reduced refractive index portion or a void portion of the material constituting the layer located on the back side is formed. The write-once optical recording medium according to claim 1, wherein a recording mark is formed. 変形層中に、変形層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする請求項1又は2記載の追記型光記録媒体。3. The write-once optical recording medium according to claim 1, wherein a recording mark is formed by forming a refractive index lowering portion or a void portion of a material constituting the deforming layer in the deforming layer. 光吸収層が有機材料からなることを特徴とする請求項1〜4の何れかに記載の追記型光記録媒体。5. The write-once optical recording medium according to claim 1, wherein the light absorbing layer is made of an organic material. 光吸収層がSi及び/又はGeを含有することを特徴とする請求項1〜4の何れかに記載の追記型光記録媒体。5. The write-once optical recording medium according to claim 1, wherein the light absorbing layer contains Si and / or Ge. 少なくとも記録層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであることを特徴とする追記型光記録媒体。At least a recording layer, wherein the recording layer has both a function of absorbing laser light and a function of causing deformation without being melted or decomposed by irradiation with laser light. Medium. 少なくとも記録層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであり、該記録層と、該記録層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による記録層の発熱によって、記録層自身がレーザ光の入射方向に変形することで記録マークが形成されることを特徴とする追記型光記録媒体。The recording layer has at least a recording layer, and the recording layer has both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by irradiation of the laser light. The interface with the adjacent layer on the laser light incident side that is in contact with the main reflection interface is used as the main reflection interface, and the recording layer itself is deformed in the laser light incident direction due to heat generation of the recording layer by the irradiation of the laser light, thereby forming a recording mark. A write-once optical recording medium characterized by the above-mentioned. 少なくとも記録層と有機材料層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであることを特徴とする追記型光記録媒体。It has at least a recording layer and an organic material layer, and the recording layer has both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by irradiation with laser light. Write-once optical recording medium. 少なくとも記録層と有機材料層を有し、該記録層は、レーザ光に対する光吸収機能と、レーザ光の照射によって溶融又は分解することなく変形を起す変形機能を併せ持つものであり、該記録層と、該記録層と接するレーザ光入射側の隣接層との界面を主反射界面とし、レーザ光の照射による記録層の発熱によって、記録層自身がレーザ光の入射方向に変形することで記録マークが形成されることを特徴とする追記型光記録媒体。Having at least a recording layer and an organic material layer, the recording layer has both a light absorbing function for laser light and a deformation function of causing deformation without being melted or decomposed by irradiation of laser light, and the recording layer and The interface between the recording layer and the adjacent layer on the laser light incident side that is in contact with the recording layer is defined as a main reflection interface, and the recording layer itself is deformed in the laser light incident direction due to heat generation of the recording layer due to irradiation of the laser light, whereby the recording mark is formed. A write-once optical recording medium characterized by being formed. 記録層と、レーザ光の入射側から見て記録層の奥側に存在する層との界面近傍に、該奥側に存在する層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする請求項7〜10の何れかに記載の追記型光記録媒体。In the vicinity of the interface between the recording layer and the layer existing on the back side of the recording layer when viewed from the laser beam incident side, a reduced refractive index portion or a void portion of the material constituting the layer existing on the back side is formed. 11. The write-once optical recording medium according to claim 7, wherein a recording mark is formed. 記録層中に、記録層を構成する材料の屈折率低下部、或いは空隙部を形成することで記録マークが形成されることを特徴とする請求項7〜10の何れかに記載の追記型光記録媒体。The write-once light according to any one of claims 7 to 10, wherein a recording mark is formed by forming a reduced refractive index portion or a void portion of a material forming the recording layer in the recording layer. recoding media. 記録層がSi及び/又はGeを含有すること特徴とする請求項7〜12の何れかに記載の追記型光記録媒体。13. The write-once optical recording medium according to claim 7, wherein the recording layer contains Si and / or Ge. 波長350〜500nmの青色レーザ光により記録マークが形成できることを特徴とする請求項1〜13の何れかに記載の追記型光記録媒体。14. The write-once optical recording medium according to claim 1, wherein a recording mark can be formed by blue laser light having a wavelength of 350 to 500 nm.
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006088218A1 (en) * 2005-02-21 2006-08-24 Ricoh Company, Ltd. Optical recording medium and recording and reproducing method using the same
WO2007086293A1 (en) * 2006-01-30 2007-08-02 Sony Corporation Information recording medium and method for fabricating same
WO2008029856A1 (en) 2006-09-06 2008-03-13 Mitsubishi Kagaku Media Co., Ltd. Optical recording medium
US7778145B2 (en) 2004-07-16 2010-08-17 Mitsubishi Kagaku Media Co., Ltd. Optical recording medium and optical recording method of the same
WO2011045903A1 (en) * 2009-10-14 2011-04-21 ソニー株式会社 Optical recording medium and method for manufacturing optical recording medium
US8114496B2 (en) 2006-01-13 2012-02-14 Mitsubishi Kagaku Media Co., Ltd. Optical recording medium

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7778145B2 (en) 2004-07-16 2010-08-17 Mitsubishi Kagaku Media Co., Ltd. Optical recording medium and optical recording method of the same
WO2006088218A1 (en) * 2005-02-21 2006-08-24 Ricoh Company, Ltd. Optical recording medium and recording and reproducing method using the same
US8139468B2 (en) 2005-02-21 2012-03-20 Ricoh Company, Ltd. Optical recording medium and recording and reproducing method using the same
US8114496B2 (en) 2006-01-13 2012-02-14 Mitsubishi Kagaku Media Co., Ltd. Optical recording medium
WO2007086293A1 (en) * 2006-01-30 2007-08-02 Sony Corporation Information recording medium and method for fabricating same
JPWO2007086293A1 (en) * 2006-01-30 2009-06-18 ソニー株式会社 Information recording medium and manufacturing method thereof
JP4618300B2 (en) * 2006-01-30 2011-01-26 ソニー株式会社 Information recording medium and manufacturing method thereof
WO2008029856A1 (en) 2006-09-06 2008-03-13 Mitsubishi Kagaku Media Co., Ltd. Optical recording medium
WO2011045903A1 (en) * 2009-10-14 2011-04-21 ソニー株式会社 Optical recording medium and method for manufacturing optical recording medium
CN102576556A (en) * 2009-10-14 2012-07-11 索尼公司 Optical recording medium and manufacturing method of optical recording medium

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