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JP2004022914A - Insulated circuit board and its cooling structure and power semiconductor device and its cooling structure - Google Patents

Insulated circuit board and its cooling structure and power semiconductor device and its cooling structure Download PDF

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Publication number
JP2004022914A
JP2004022914A JP2002177833A JP2002177833A JP2004022914A JP 2004022914 A JP2004022914 A JP 2004022914A JP 2002177833 A JP2002177833 A JP 2002177833A JP 2002177833 A JP2002177833 A JP 2002177833A JP 2004022914 A JP2004022914 A JP 2004022914A
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JP
Japan
Prior art keywords
circuit board
heat sink
insulated circuit
fins
cooling structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002177833A
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Japanese (ja)
Inventor
Kiyomitsu Suzuki
鈴木 清光
Yasutoshi Kurihara
栗原 保敏
Hironori Kodama
児玉 弘則
Toshiyuki Imamura
今村 寿之
Hiroyuki Tejima
手島 博幸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Proterial Ltd
Original Assignee
Hitachi Ltd
Hitachi Metals Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Priority to JP2002177833A priority Critical patent/JP2004022914A/en
Publication of JP2004022914A publication Critical patent/JP2004022914A/en
Pending legal-status Critical Current

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    • H10W72/07351
    • H10W72/30

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
  • Pressure Welding/Diffusion-Bonding (AREA)
  • Cooling Or The Like Of Electrical Apparatus (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an insulated circuit board, a cooling structure therefor, a power semiconductor device and a cooling structure therefor in which a structure which is cooled by a cooling liquid-state medium is bonded by frictional stirring and bonding, heat radiation characteristics are improved and high reliability is provided. <P>SOLUTION: In the insulated circuit board in which a circuit board composed of copper or copper alloy, a ceramics wafer and a radiation shield composed of copper or steel alloy are successively bonded by brazing material, the radiation shield has a plurality of plate-like fins or stick-like fins except for its full peripheral portion, a plate portion thicker than the fins is integrally formed on both outer sides of the arrangement of the plate-like fins, and a plate portion thicker than a diameter of the stick-like fins is integrally formed on both outer sides of one of arrangements of the stick-like fins. Besides, the insulated circuit board is composed of the power semiconductor device in which a semiconductor power element is packaged on the circuit board of the insulated circuit board. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
本発明は、半導体パワー素子を実装したパワーモジュールに用いられる放熱用途の絶縁回路基板とその冷却構造及びパワー半導体装置とその冷却構造に関する。
【0002】
【従来の技術】
従来、半導体パワー素子用放熱基板としては、回路板、セラミックス板及び放熱板の積層体よりなる絶縁回路基板を、Al−SiC複合材よりなるヒートシンク板へAl−Si系のロー材で接合した構造のものなどが特開平10−65075号公報他で知られている。これらの放熱基板は高価なヒートシンク板を使用する必要があった。このようなヒートシンク板を使用しないで、回路板、セラミックス板及び放熱板の積層体よりなる絶縁回路基板単体でパワーモジュールを実装する方法が特開平11−330311号公報で開示されている。本公報のセラミックス板には窒化ケイ素が適用され、絶縁回路基板を機器ケーシングにネジで固定したものである。単純な実装構造であるものの放熱板にはフィン機能がなく、放熱特性が十分でなかった。
【0003】
また、回路板、セラミックス板及び放熱板の積層体を銀ろう材で接合した絶縁回路基板が特開2001−135757号公報に開示されている。本例の場合、放熱板が通常の銅板であるとき、温度サイクルでセラミックス板にクラックが発生すると記載されている。なお、放熱板にはフィン機能がなく、放熱特性にも問題があった。
【0004】
更に、回路板、セラミックス板及び放熱板の積層体よりなる絶縁回路基板が特開2000−183260号公報に開示されている。本公報の放熱板にはフィン機能がなく、絶縁回路基板を水冷式ヒートシンクヘネジで装着したものである。一方、回路板、セラミックス板及び放熱板の積層体をA1−Si系ろう材で接合した絶縁回路基板が特開2001−168256号公報に開示されている。本公報の放熱板はアルミ合金製のフィン付きであるが、セラミックス板の平面サイズが最も大きく、セラミックス板にクラックが生じたとき、水などの冷媒が外部に漏れ出すため、使い勝手が良くないなどの欠点があった。
【0005】
又、回路板、セラミックス板、放熱板、可塑性多孔質金属層及び銅の押し出し成形で加工されたフィン付きヒートシンクの積層体よりなる絶縁回路基板が特開平8−335652号公報に開示されている。本公報は構造が複雑であると共に、可塑性多孔質金属層は例えば0.3mmないし1.0mmと厚く、この多孔質部分にシリコーングリースを充填して使用するもので、この部分の熱抵抗が大きくなり十分な放熱特性が得られにくい。
【0006】
【発明が解決しようとする課題】
パワーモジュールに用いられる回路板、セラミックス板及び放熱板の積層体構造よりなる放熱用途の絶縁回路基板には、次のような問題点があった。
(a)放熱板にはフィン機能がなく、放熱特性が十分でなかった。それ故、別途ヒートシンク部材が必要になり、冷却系の実装構造が複雑になった。
(b)フィン付き絶縁回路基板を実現するには、セラミックス板の破壊を防止する必要があった。
(c)プレスや研削ではフィンを低コストで加工することはできなかった。
(d)セラミックス板が破壊したとき、冷却水が外部に漏れるため使い勝手が悪かった。
【0007】
本発明の目的は、液体冷媒によって冷却できる構造を摩擦攪拌接合によって接合可能な構造とし、放熱特性が良く、高信頼度を有する絶縁回路基板とその冷却構造及びパワー半導体装置とその冷却構造を提供することにある。
【0008】
【課題を解決するための手段】
本発明は、金属、好ましくは銅又は銅合金よりなる回路板、セラミックス基板及び金属、好ましくは銅又は銅合金よりなる放熱板が順次ろう材で接合された絶縁回路基板において、前記放熱板はその全外周部を除き複数の平板状フィン又は棒状フィンを有することを特徴とする。
【0009】
又、本発明における絶縁回路基板は、前記放熱板はその全外周部を除き複数の平板状フィン又は棒状フィンを有し、該平板状フィンの並びの両端部に前記フィンの幅より厚肉の肉厚部が一体に形成されていること、又は棒状フィンの並びの一方の両外側に前記フィンの径より厚肉の肉厚部が一体に形成されていることを特徴とする。
【0010】
本発明は、金属、好ましくは銅又は銅合金よりなる回路板、セラミックス基板及び金属、好ましくは銅又は銅合金よりなる放熱板が順次ろう材で接合され、前記放熱板が液体冷媒に接して冷却される絶縁回路基板の冷却構造において、前記放熱板はその全外周部を除き複数の平板状フィンを有し、前記放熱板の全外周部に前記冷媒の通路を形成する部材が接合されていることを特徴とする。
【0011】
又、本発明における絶縁回路基板の冷却構造は、前記放熱板はその全外周部を除き複数の平板状フィンを有し、該平板状フィンの並びの両外側に前記フィンより厚肉の肉厚部が一体に形成されており、前記放熱板の全外周部に前記冷媒の通路を形成する部材が接合されていることを特徴とする。
【0012】
更に、本発明における絶縁回路基板の冷却構造は、前記放熱板はその全外周部を除き棒状フィンを有し、前記放熱板の全外周部に前記冷媒の通路を形成する部材が接合されていることを特徴とする。
【0013】
前記接合が、接合部への回転ツールの挿入による塑性流動による摩擦攪拌接合によって接合されていることが好ましい。又、回路板及び放熱板はアルミ又はアルミ合金でも良い。
【0014】
本発明は、導体パワー素子が絶縁回路基板の回路板に搭載されたパワー半導体装置において、前記絶縁回路基板は前述に記載の絶縁回路基板よりなることを特徴とする。
【0015】
本発明により、以下の効果が予想される。
(a)放熱板にフィンを設け、摩擦攪拌接合できる簡単な構造で十分な放熱特性を得ることができる。
(b)比較的高肉厚の銅や銅合金からなるフィン付き放熱板をセラミックス基板に接合しても、次の対策を施すことによりセラミックス板の破壊を防止することができる。即ち、セラミックス板に高熱伝導で高強度のセラミックス基板を用い、セラミックス基板の端部直下の活性金属ろう材をセラミックス基板と放熱板の接合部より突き出す構造にすることにより、セラミックス基板の端部に発生する最大の残留応力を低減させる。また、セラミックス基板の端部直下における放熱板の厚さを薄くすることにより、セラミックス基板の端部に発生する最大の残留応力を低減させる。セラミックス基板として、窒化珪素、窒化アルミニウム、アルミナ等が好ましい。
(c)回路板のエッチング加工時に、放熱板ヘフィンをエッチングで加工することにより、フィンの加工費を低減できる。
(d)放熱板の平面サイズを窒化珪素基板より大きくすることにより、仮に窒化珪素基板が破壊したとしても、冷却水の外部流出を防止できるので使い勝手を向上できる。
(e)回路板とセラミックス基板、セラミックス基板と放熱板の接合のろう材として、Ag−Cu−Ti系合金の活性金属ろう材が好ましい。
【0016】
本発明は、半導体パワー素子が絶縁回路基板の回路板に搭載されたパワー半導体装置において、前記絶縁回路基板は前述に記載の絶縁回路基板よりなること、又、半導体パワー素子が絶縁回路基板の回路板に搭載され、前記絶縁回路基板が冷却構造を有するパワー半導体装置の冷却構造において、前記絶縁回路基板の冷却構造が前述に記載の絶縁回路基板の冷却構造よりなることが好ましい。これらの構造によって、より信頼性の高いパワー半導体装置を実現できる。
【0017】
【発明の実施の形態】
(実施例1)
図1は、本発明に係わるフィン付き絶縁回路基板の一実施例を示す断面図である。図に示すように、フィン付き絶縁回路基板は回路板1、窒化珪素基板2及びフィン4を有する放熱板3を積層した構造のものである。本図に示す構造は、後述するフィン4を水冷却する構造とするもので、そのためフィン4の並びの両外側がフィン4の幅よりも厚肉とした肉厚部9とし、後述の図3のように接合部に回転ツールを挿入させる摩擦攪拌接合によって接合できるようにしたものである。又、フィン4の長さ方向の両側には冷媒の流出入が可能な構造の板状部材が同様に接合される。
【0018】
これらの積層体は活性金属ろう材5、6を用いて接合される。活性金属ろう材がAg−Cu−Ti系合金であるとき、前記積層体は高真空あるいは不活性雰囲気下で、約850℃の温度で強固に接合される。なお、回路板1及び放熱板3には高い熱伝導性を有し、電気抵抗の小さい銅や銅合金が用いられる。また、窒化珪素基板2には熱伝導率がおよそ80W/m・K、曲げ強度がおよそ700MPaの材料を用いた。
【0019】
次に、各材料の概略の厚さや寸法について述べる。回路板1の厚さは約0.3〜1.0mm、窒化珪素基板2の厚さは約0.3〜0.8mm、活性金属ろう材5、6の厚さは約0.02mm、放熱板3の平坦部の厚さtは約0.6〜1.5mm、放熱板3の全体部の厚さTは約1.0〜4.0mmである。なお、フィン4の幅wは約0.5〜2.0mm、フィン4の高さhは約0.4〜2.5mm、フィン4間の溝7の幅dは約0.5〜2.0mmである。なお、放熱板3の最外部の高肉厚部9の幅寸法をL2、最外部の溝部8の幅寸法をL1とすると、これらの寸法は約1.0〜3.0mmである。
【0020】
このような構造の絶縁回路基板にすることにより、次の効果が得られる。
(a)銅や銅合金からなる放熱板にフィンを設けることにより、簡単な構造で高い放熱特性を得ることができる。
(b)比較的高肉厚の銅や銅合金からなるフィン付き放熱板3と窒化珪素基板2の接合体を過酷なヒートサイクル下で使用しても、窒化珪素基板2自体の破壊を防止することができる。即ち、セラミックス板に高強度の窒化珪素基板2を用いたこと、窒化珪素基板2の端部2Xの直下の活性金属ろう材6を図中、6aで示すように、窒化珪素基板2と放熱板3の接合部より突き出す構造で窒化珪素基板2の端部に発生する最大の残留応力を低減させた効果である。また、窒化珪素基板2の端部2Xの直下を放熱板3の最外部の溝8の上に配置することにより、即ち窒化珪素基板2の端部2Xの直下における放熱板3の厚さを薄くすることにより、窒化珪素基板2の端部に発生する最大の残留応力を低減させた効果である。
【0021】
なお、窒化珪素基板2の回路板1側の破壊を防止するためには、回路板1の端部1Xの直下の活性金属ろう材5を図中、5aで示すように、回路板1と窒化珪素基板2の接合部より突き出す構造が有効であった。
(c)後述するように、回路板1のエッチング加工時に、放熱板3ヘフィン4を同時にエッチングで加工することができ、フィンの加工費を低減することができた。
(d)図に示すように、放熱板3の平面サイズを窒化珪素基板2より大きくすることにより、仮に窒化珪素基板2が破壊したとしても、放熱板3の存在によってフィン4側の冷却水の外部流出(回路板1側への流出)を防止でき、使い勝手が向上した。
【0022】
前図のフィン付き放熱板3の平面図を図2に示す。本図は放熱板3をフィン4側から見た平面図である。図において、点線で示した100部は窒化珪素基板2の端部位置2Xを示す。このように、窒化珪素基板2の接合端部位置は放熱板3の低肉厚部(寸法t)にあり、前述したように窒化珪素基板2の破壊防止に有効であった。また、フィン4間の溝部7を流れる冷却水の水流を矢印で、図中に示した。なお、前図は本図の位置A−Aにおける絶縁回路基板の断面図を示したものである。
【0023】
(実施例2)
図3は、図1及び図2の本発明によるフィン付き絶縁回路基板に半導体パワー素子を搭載したパワー半導体装置の冷却構造へ適用した実施例を示す断面図である。半導体パワー素子10を半田11で回路板1へ接着した後、フィン4を有する放熱板3は部材12と固着される。部材12がアルミ又はアルミ合金で構成されるとき、放熱板3をその肉厚部9で部材12との突き合わせ部に回転ツールを挿入して塑性流動による摩擦攪拌溶接によって部材12へ気密に接合することができる。この摩擦攪拌溶接による接合のために放熱板3のフィン4の並びの両端部に肉厚部9を形成するものである。
【0024】
部材12は、図2の上下部に対応する部分以外が平板状であり、その上下部に対応する部分に高さがフィンの高さより若干長い側板部を有するキャップ構造を有するものである。側板部には冷却水を供給する供給口とその反対側に排出口が設けられている。両者の接合は、紙面に対して垂直な方向では肉厚部9の左右でそれぞれ行われ、紙面に対して平行な面に対しては図2に示すように放熱板3の上下部でフィン4が形成されていない空間となる突き合わせ部分で外側より前述の回転ツールの挿入による摩擦攪拌溶接によって接合される。尚、側板部の接合部は部分的にフィン4によって支えられる構造を有し、その接合に際して変形を受けないので、薄肉の非接合部より厚肉で、全体的には肉厚部9より薄い構造となっている。以下の実施例においても同様である。
【0025】
フィン4間の溝7へ冷却水を流動させることによって、半導体パワー素子10を簡単な実装構造で効率良く冷却することができる。部材12とフィン4との間隔は摩擦攪拌溶接のため平板の変形を少なくするように小さくなっている。最後に、前述した従来技術の問題点(a)〜(d)項の少なくとも一つを解決するものは、本発明に含まれるのは言うまでもない。
【0026】
(実施例3)
図4は、本発明に係わるフィン付き絶縁回路基板の他の一実施例を示す断面図である。本図は、放熱板3の全体部の厚さTが約1.5mm以下と薄い場合の実施例である。この場合は、窒化珪素基板2の端部位置2Xが放熱板3の高肉厚部9にあっても、窒化珪素基板2の破壊を防止できた。これは、窒化珪素基板2に発生する残留応力は放熱板3の厚さに大きく依存するからである。本実施例においても実施例1と同様に接合部に回転ツールを挿入させる摩擦攪拌接合によって接合できるようにしたものである。又、フィン4の長さ方向の両側には冷媒の流出入が可能な構造の板状部材が同様に接合される。
【0027】
前図のフィン付き放熱板3の平面図を図5に示す。本図は放熱板3をフィン4側から見た平面図である。図において、点線で示した100部は窒化珪素基板2の端部位置2Xを示す。放熱板3の厚さが比較的薄い場合は、窒化珪素基板2の接合端部位置100部は放熱板3の最外部の高肉厚部9やフィン4部の上部に配置されていても、窒化珪素基板2の破壊を防止することができた。
【0028】
本実施例においても、実施例2と同様に半導体パワー素子を搭載したパワー半導体装置の冷却構造を形成できるものである。本実施例のフィン4は放熱板3の両端部に亙って形成されているもので、部材12は図4において紙面に対して平行な面では図3に示すフィン4の並びの両端部でやや厚肉となった平板が用いられ、側面では平板が用いられ、同様に前述の摩擦攪拌溶接によって接合される。
【0029】
(実施例4)
図6は、本発明に係わるフィン付き絶縁回路基板の他の一実施例を示す断面図である。本図は、フィン4部以外の放熱板3の厚さが一様で、且つ放熱板3の平坦部の厚さtが約1.5mm以下と薄い場合の実施例である。本図の場合も、窒化珪素基板2の破壊を防止することができた。
【0030】
前図のフィン付き放熱板3の平面図を図7に示す。本図は放熱板3をフィン4側から見た平面図である。図において、点線で示した100部は窒化珪素基板2の端部位置2Xを示す。図に示すように、窒化珪素基板2の接合端部位置100部は放熱板3の低肉厚部の上部に配置されている。
【0031】
本実施例においても実施例2と同様に半導体パワー素子を搭載したパワー半導体装置の冷却構造を形成できるものである。図7に示すように、全外周部にフィンが形成されていないもので、キャップ状の部材12が実施例2と同様に摩擦攪拌接合によって放熱板3の端部全周で接合される。
【0032】
(実施例5)
図8は、本発明に係わるフィン付き絶縁回路基板の他の一実施例を示す断面図である。本図は放熱板をフィン4側から見た平面図である。フィン4と4a部より構成され、フィン4は放熱板の最外部9と同一の高さである。一方、フィン4aの肉厚はフィン4部の肉厚より薄く、放熱板の最外部9より低い高さを有してい乱図において、点線で示した100部は窒化珪素基板2の端部位置2Xを示す。図に示すように、窒化珪素基板2の接合端部位置100部を放熱板3の低肉厚部及び低肉厚フィン4aの上部に配置した実施例である。
【0033】
本実施例においても実施例2と同様に半導体パワー素子を搭載したパワー半導体装置の冷却構造を形成できるものである。紙面に対して平行な面に対してはその形状に対応した形状を有する平板によって形成されている。
【0034】
(実施例6)
図9は、本発明に係わるフィン付き絶縁回路基板の他の一実施例を示す断面図である。本図は放熱板3をフィン4b側から見た平面図であり、図2とはフィンの形状が異なるものである。即ち、フィン形状は図2では矩形であるのに対して、本図のフィン4bは丸いピン形状であり、剣山のように配置した実施例である1フィン4、4a、4bなどは回路板1をエッチングで加工する時に同時に加工されるため、フィン形状が変わっても容易に製作することが可能である。
【0035】
本実施例においても実施例2と同様に半導体パワー素子を搭載したパワー半導体装置の冷却構造を形成できるものである。紙面に対して平行な面に対しては実施例2と同様である。
【0036】
(実施例7)
図10は、本発明に係わるフィン付き絶縁回路基板の他の一実施例を示す平面図である。本図は放熱板3をフィン4側から見た平面図であり、図2とは次の点が異なる。即ち、放熱板3の最外部の高肉厚部9がフィン4を囲むような構造になっている。冷却水は▲1▼部より紙面に垂直な方向から流入して矢印の方向に進み、▲2▼部から紙面に垂直な方向に流出する実施例である。なお、窒化珪素基板2の接合端部位置を図中へ100部で示した。
【0037】
本実施例においても実施例2と同様に半導体パワー素子を搭載したパワー半導体装置の冷却構造を形成でき、部材12に該当するものは外周の全周が高肉厚部9で同様に接合される。
【0038】
(実施例8)
図11は、本発明に係わるフィン付き絶縁回路基板の他の一実施例を示す平面図である。本図は放熱板3をフィン4b側から見た平面図であり、図10とは次の点が異なる。即ち、フィン形状は図10では矩形であるのに対して、本図のフィン4bは丸いピン形状であり、剣山のように配置した実施例である。
【0039】
本実施例においても実施例2と同様に半導体パワー素子を搭載したパワー半導体装置の冷却構造を形成でき、部材12に該当するものは外周の全周が高肉厚部9で同様に接合される。
【0040】
(実施例9)
図12は、本発明に係わるフィン付き絶縁回路基板のエッチング方法を示す断面図である。回路板1、窒化珪素基板2及び放熱板3の積層体を活性金属ろう材5、6を用いて接合した後、感光性のレジストやフィルム200でこれらの積層体をカバーする。本図は、感光性のレジストやフィルム200に対して不要な部分をホトエッチングで除去した状態を示したものである。この状態の積層体に塩化第二鉄の溶液を吹き付けることにより、銅あるいは銅合金からなる回路板1と放熱板3をエッチング加工することができる。このように、回路板1のエッチング加工時に図1に示すようなフィン4を有する放熱板3を容易に形成することができる。同様に、図4〜11の構造に対してもホトエッチングによって形成できるものである。
【0041】
【発明の効果】
本発明によれば、液体冷媒によって冷却できる構造を摩擦攪拌接合によって接合可能な構造とし、放熱特性が良く、高信頼度を有する絶縁回路基板とその冷却構造及びパワー半導体装置とその冷却構造を提供することができる。
【図面の簡単な説明】
【図1】本発明に係わるフィン付き絶縁回路基板の断面図。
【図2】図1に示したフィン付き絶縁回路基板のフィン側から見た平面図。
【図3】本発明によるフィン付き絶縁回路基板に半導体パワー素子を搭載したパワー半導体装置の冷却装置の断面図。
【図4】本発明に係わるフィン付き絶縁回路基板の他の例を示す断面図。
【図5】前図に示したフィン付き絶縁回路基板のフィン側から見た平面図。
【図6】本発明に係わるフィン付き絶縁回路基板の他の例を示した断面図。
【図7】図6に示したフィン付き絶縁回路基板のフィン側から見た平面図。
【図8】本発明に係わるフィン付き絶縁回路基板の他の例を示す平面図。
【図9】本発明に係わるフィン付き絶縁回路基板の他の例を示す平面図。
【図10】本発明に係わるフィン付き絶縁回路基板の他の例を示す平面図。
【図11】本発明に係わるフィン付き絶縁回路基板の他の例を示す平面図。
【図12】本発明に係わるフィン付き絶縁回路基板をエッチング方法で製造する断面図。
【符号の説明】
1…回路板、2…窒化珪素基板、3…放熱板、4、4a、4b…フィン、5、6…活性金属ろう材、5a、6a…活性金属ろう材の突き出し部、7…溝、8…最外部の溝、9…肉厚部、10…半導体パワー素子、11…半田、12…部材、1X…回路板の端部、2X…窒化珪素基板の端部、100…窒化珪素基板の接合端部の位置、200…感光性レジストやフィルム。
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to an insulated circuit board for heat dissipation used in a power module on which a semiconductor power element is mounted, a cooling structure thereof, and a power semiconductor device and a cooling structure thereof.
[0002]
[Prior art]
Conventionally, as a heat radiating board for a semiconductor power element, an insulating circuit board composed of a laminate of a circuit board, a ceramics board and a heat radiating board is joined to a heat sink plate made of an Al-SiC composite material by using an Al-Si brazing material. And the like are known from JP-A-10-65075 and the like. These heat dissipation boards had to use expensive heat sink plates. Japanese Patent Application Laid-Open No. H11-330311 discloses a method of mounting a power module on a single insulated circuit board composed of a laminate of a circuit board, a ceramics plate, and a heat sink without using such a heat sink plate. Silicon nitride is applied to the ceramic plate of this publication, and an insulated circuit board is fixed to a device casing with screws. Although it has a simple mounting structure, the radiator plate does not have a fin function, and has insufficient heat radiation characteristics.
[0003]
Japanese Patent Application Laid-Open No. 2001-135557 discloses an insulated circuit board in which a laminate of a circuit board, a ceramics plate, and a heat sink is joined with a silver brazing material. In the case of this example, it is described that when the heat radiating plate is a normal copper plate, cracks occur in the ceramics plate in a temperature cycle. In addition, the radiator plate did not have a fin function, and there was a problem in the heat radiation characteristics.
[0004]
Further, Japanese Patent Application Laid-Open No. 2000-183260 discloses an insulated circuit board composed of a laminate of a circuit board, a ceramic plate, and a heat sink. The radiator plate of this publication does not have a fin function, and the insulating circuit board is mounted on a water-cooled heat sink with screws. On the other hand, Japanese Patent Application Laid-Open No. 2001-168256 discloses an insulated circuit board in which a laminate of a circuit board, a ceramics board, and a heat sink is joined with an A1-Si brazing material. Although the radiator plate of this publication has fins made of aluminum alloy, the plane size of the ceramic plate is the largest, and when cracks occur in the ceramic plate, refrigerant such as water leaks to the outside, which is not convenient. There were drawbacks.
[0005]
Japanese Patent Application Laid-Open No. 8-335652 discloses an insulated circuit board comprising a laminate of a circuit board, a ceramics board, a heat sink, a plastic porous metal layer, and a finned heat sink processed by extrusion of copper. In this publication, the structure is complicated, and the plastic porous metal layer is thick, for example, 0.3 mm to 1.0 mm. The porous portion is filled with silicone grease and used, and the thermal resistance of this portion is large. It is difficult to obtain sufficient heat radiation characteristics.
[0006]
[Problems to be solved by the invention]
The insulated circuit board for heat dissipation having a laminated structure of a circuit board, a ceramics board, and a heat sink used in a power module has the following problems.
(A) The radiator plate had no fin function and did not have sufficient heat radiation characteristics. Therefore, a heat sink member is required separately, and the mounting structure of the cooling system is complicated.
(B) To realize a finned insulated circuit board, it was necessary to prevent the ceramic plate from being broken.
(C) The fin could not be processed at low cost by pressing or grinding.
(D) When the ceramics plate was broken, the cooling water leaked to the outside, so that the usability was poor.
[0007]
SUMMARY OF THE INVENTION An object of the present invention is to provide an insulated circuit board having a structure that can be cooled by a liquid refrigerant and capable of being joined by friction stir welding and having good heat radiation characteristics and high reliability, a cooling structure thereof, and a power semiconductor device and a cooling structure thereof. Is to do.
[0008]
[Means for Solving the Problems]
The present invention is a metal, preferably a circuit board made of copper or copper alloy, a ceramic substrate and a metal, preferably an insulated circuit board in which a heat sink made of copper or copper alloy is sequentially joined by brazing material, wherein the heat sink is the It has a plurality of flat fins or rod fins except for the entire outer peripheral portion.
[0009]
Further, in the insulated circuit board according to the present invention, the radiator plate has a plurality of flat fins or rod fins except for the entire outer peripheral portion thereof. It is characterized in that the thick portion is formed integrally, or a thick portion thicker than the diameter of the fin is formed integrally on both outer sides of one of the row of the bar-shaped fins.
[0010]
According to the present invention, a metal, preferably a circuit board made of copper or a copper alloy, a ceramic substrate, and a heat sink made of a metal, preferably copper or a copper alloy are sequentially joined with a brazing material, and the heat sink is cooled in contact with a liquid refrigerant. In the cooling structure of the insulated circuit board, the radiator plate has a plurality of flat fins except for the entire outer peripheral portion thereof, and a member that forms the passage of the refrigerant is joined to the entire outer peripheral portion of the radiator plate. It is characterized by the following.
[0011]
Further, in the cooling structure of the insulated circuit board according to the present invention, the heat radiating plate has a plurality of flat fins except for the entire outer peripheral portion thereof, and has a thicker wall thickness than the fins on both outer sides of the row of the flat fins. The member is integrally formed, and a member that forms the passage for the refrigerant is joined to the entire outer peripheral portion of the heat sink.
[0012]
Further, in the cooling structure of the insulated circuit board according to the present invention, the heat sink has bar-shaped fins except for the entire outer peripheral portion thereof, and a member forming the passage of the refrigerant is joined to the entire outer peripheral portion of the heat sink. It is characterized by the following.
[0013]
It is preferable that the joining is performed by friction stir welding by plastic flow due to insertion of a rotating tool into the joining portion. Further, the circuit board and the heat sink may be made of aluminum or aluminum alloy.
[0014]
According to the present invention, in a power semiconductor device in which a conductor power element is mounted on a circuit board of an insulated circuit board, the insulated circuit board is made of the above-described insulated circuit board.
[0015]
According to the present invention, the following effects are expected.
(A) Sufficient heat radiation characteristics can be obtained with a simple structure capable of providing friction stir welding by providing fins on the heat radiation plate.
(B) Even if a finned heat sink made of copper or a copper alloy having a relatively large thickness is joined to the ceramic substrate, the ceramic plate can be prevented from being broken by taking the following measures. In other words, by using a ceramic substrate with high thermal conductivity and high strength as the ceramic plate, the active metal brazing material immediately below the end of the ceramic substrate is made to protrude from the joint between the ceramic substrate and the heat sink, so that the end of the ceramic substrate is Reduce the maximum residual stress generated. Further, by reducing the thickness of the heat radiating plate immediately below the end of the ceramic substrate, the maximum residual stress generated at the end of the ceramic substrate is reduced. As the ceramic substrate, silicon nitride, aluminum nitride, alumina or the like is preferable.
(C) At the time of etching the circuit board, by processing the fins of the heat sink by etching, the processing cost of the fins can be reduced.
(D) By making the plane size of the heat radiating plate larger than that of the silicon nitride substrate, even if the silicon nitride substrate is broken, the cooling water can be prevented from flowing out, so that the usability can be improved.
(E) As a brazing material for joining the circuit board and the ceramic substrate, or the ceramic substrate and the heat sink, an active metal brazing material of an Ag-Cu-Ti alloy is preferable.
[0016]
The present invention provides a power semiconductor device in which a semiconductor power element is mounted on a circuit board of an insulated circuit board, wherein the insulated circuit board comprises the above-described insulated circuit board, and wherein the semiconductor power element is a circuit of an insulated circuit board. In the cooling structure of a power semiconductor device mounted on a board and having the insulating circuit board having a cooling structure, it is preferable that the cooling structure of the insulating circuit board be the cooling structure of the insulating circuit board described above. With these structures, a more reliable power semiconductor device can be realized.
[0017]
BEST MODE FOR CARRYING OUT THE INVENTION
(Example 1)
FIG. 1 is a sectional view showing one embodiment of an insulated circuit board with fins according to the present invention. As shown in the figure, the finned insulating circuit board has a structure in which a circuit board 1, a silicon nitride substrate 2, and a heat sink 3 having fins 4 are laminated. The structure shown in this figure is a structure in which the fins 4 described later are water-cooled. For this reason, both outer sides of the rows of the fins 4 are formed as thick portions 9 having a thickness larger than the width of the fins 4. The joining can be performed by friction stir welding in which a rotary tool is inserted into the joining portion as described above. A plate-like member having a structure capable of flowing in and out of the refrigerant is similarly joined to both sides in the length direction of the fin 4.
[0018]
These laminates are joined using the active metal brazing materials 5 and 6. When the active metal brazing material is an Ag-Cu-Ti alloy, the laminate is firmly joined at a temperature of about 850 ° C under a high vacuum or an inert atmosphere. The circuit board 1 and the heat sink 3 are made of copper or a copper alloy having high thermal conductivity and low electric resistance. For the silicon nitride substrate 2, a material having a thermal conductivity of about 80 W / m · K and a bending strength of about 700 MPa was used.
[0019]
Next, the approximate thickness and dimensions of each material will be described. The thickness of the circuit board 1 is about 0.3 to 1.0 mm, the thickness of the silicon nitride substrate 2 is about 0.3 to 0.8 mm, the thickness of the active metal brazing materials 5 and 6 is about 0.02 mm, and heat radiation. The thickness t of the flat part of the plate 3 is about 0.6 to 1.5 mm, and the thickness T of the entire part of the heat sink 3 is about 1.0 to 4.0 mm. The width w of the fin 4 is about 0.5 to 2.0 mm, the height h of the fin 4 is about 0.4 to 2.5 mm, and the width d of the groove 7 between the fins 4 is about 0.5 to 2.. 0 mm. If the width of the outermost high-thickness portion 9 of the heat sink 3 is L2 and the width of the outermost groove 8 is L1, these dimensions are approximately 1.0 to 3.0 mm.
[0020]
The following effects can be obtained by using an insulated circuit board having such a structure.
(A) By providing fins on a heat radiating plate made of copper or a copper alloy, high heat radiating characteristics can be obtained with a simple structure.
(B) Even when a bonded body of the finned heat radiating plate 3 made of copper or copper alloy having a relatively large thickness and the silicon nitride substrate 2 is used under a severe heat cycle, the silicon nitride substrate 2 itself is prevented from being broken. be able to. That is, the high-strength silicon nitride substrate 2 was used for the ceramic plate, and the active metal brazing material 6 immediately below the end 2X of the silicon nitride substrate 2 was connected to the silicon nitride substrate 2 and the heat radiating plate as shown by 6a in the figure. This is an effect of reducing the maximum residual stress generated at the end of the silicon nitride substrate 2 by the structure protruding from the bonding portion 3. Further, by disposing the portion immediately below the end 2X of the silicon nitride substrate 2 on the outermost groove 8 of the heat sink 3, that is, the thickness of the heat sink 3 directly below the end 2X of the silicon nitride substrate 2 is reduced. This has the effect of reducing the maximum residual stress generated at the end of the silicon nitride substrate 2.
[0021]
In order to prevent the silicon nitride substrate 2 from being broken on the circuit board 1 side, the active metal brazing material 5 immediately below the end 1X of the circuit board 1 is connected to the circuit board 1 as shown by 5a in FIG. The structure protruding from the junction of the silicon substrate 2 was effective.
(C) As described later, when the circuit board 1 is etched, the heat sink 3 and the fins 4 can be simultaneously etched and the fin processing cost can be reduced.
(D) As shown in the figure, by setting the plane size of the heat radiating plate 3 larger than that of the silicon nitride substrate 2, even if the silicon nitride substrate 2 is broken, the presence of the heat radiating plate 3 causes the cooling water on the fin 4 side. External leakage (outflow to the circuit board 1 side) can be prevented, and usability has been improved.
[0022]
FIG. 2 is a plan view of the finned heat sink 3 of the previous figure. This figure is a plan view of the heat sink 3 as viewed from the fin 4 side. In the figure, 100 parts indicated by dotted lines indicate end positions 2X of the silicon nitride substrate 2. As described above, the position of the joint end portion of the silicon nitride substrate 2 was at the low thickness portion (dimension t) of the heat sink 3, which was effective in preventing the silicon nitride substrate 2 from being broken as described above. The flow of the cooling water flowing through the groove 7 between the fins 4 is indicated by an arrow in the figure. The previous figure is a sectional view of the insulated circuit board at the position AA in the figure.
[0023]
(Example 2)
FIG. 3 is a sectional view showing an embodiment applied to a cooling structure of a power semiconductor device in which a semiconductor power element is mounted on the finned insulated circuit board according to the present invention of FIGS. 1 and 2. After bonding the semiconductor power element 10 to the circuit board 1 with the solder 11, the heat sink 3 having the fins 4 is fixed to the member 12. When the member 12 is made of aluminum or an aluminum alloy, the heat sink 3 is airtightly joined to the member 12 by friction stir welding by plastic flow by inserting a rotating tool into a butt portion of the heat sink 3 with the member 12 at the thick portion 9. be able to. For joining by the friction stir welding, thick portions 9 are formed at both ends of the radiator plate 3 where the fins 4 are arranged.
[0024]
The member 12 has a cap structure in which the portions other than the portions corresponding to the upper and lower portions in FIG. 2 are flat, and the portions corresponding to the upper and lower portions have side plate portions whose height is slightly longer than the height of the fins. The side plate is provided with a supply port for supplying cooling water and a discharge port on the opposite side. The two are joined on the left and right sides of the thick portion 9 in a direction perpendicular to the plane of the paper, and the fins 4 are formed on the upper and lower portions of the heat sink 3 as shown in FIG. Are joined by friction stir welding by insertion of the above-mentioned rotating tool from the outside at a butt portion where no space is formed. The joint of the side plate has a structure that is partially supported by the fins 4 and is not deformed at the time of joining. Therefore, the joint is thicker than the thin non-joined part and generally thinner than the thick part 9. It has a structure. The same applies to the following embodiments.
[0025]
By flowing the cooling water into the grooves 7 between the fins 4, the semiconductor power element 10 can be efficiently cooled with a simple mounting structure. The distance between the member 12 and the fin 4 is reduced so as to reduce deformation of the flat plate due to friction stir welding. Finally, it is needless to say that a solution to at least one of the problems (a) to (d) of the above-described prior art is included in the present invention.
[0026]
(Example 3)
FIG. 4 is a sectional view showing another embodiment of the finned insulated circuit board according to the present invention. This drawing is an embodiment in the case where the thickness T of the entire heat sink 3 is as thin as about 1.5 mm or less. In this case, even if the end position 2X of the silicon nitride substrate 2 is located at the high thickness portion 9 of the heat sink 3, the silicon nitride substrate 2 could be prevented from being broken. This is because the residual stress generated in the silicon nitride substrate 2 largely depends on the thickness of the heat sink 3. Also in this embodiment, as in the first embodiment, joining can be performed by friction stir welding in which a rotary tool is inserted into the joint. A plate-like member having a structure capable of flowing in and out of the refrigerant is similarly joined to both sides in the length direction of the fin 4.
[0027]
FIG. 5 shows a plan view of the finned heat sink 3 of the preceding figure. This figure is a plan view of the heat sink 3 as viewed from the fin 4 side. In the figure, 100 parts indicated by dotted lines indicate end positions 2X of the silicon nitride substrate 2. When the thickness of the heat sink 3 is relatively thin, even if the bonding end position 100 part of the silicon nitride substrate 2 is arranged above the outermost high-thickness part 9 or the fin 4 part of the heat sink 3, The destruction of the silicon nitride substrate 2 could be prevented.
[0028]
Also in the present embodiment, a cooling structure of a power semiconductor device on which a semiconductor power element is mounted can be formed as in the second embodiment. The fins 4 of this embodiment are formed over both ends of the radiator plate 3, and the members 12 are formed at both ends of the arrangement of the fins 4 shown in FIG. A slightly thicker flat plate is used, and a flat plate is used on the side surface, and similarly joined by the above-mentioned friction stir welding.
[0029]
(Example 4)
FIG. 6 is a sectional view showing another embodiment of the finned insulated circuit board according to the present invention. This drawing is an embodiment in which the thickness of the heat radiating plate 3 other than the fin 4 is uniform and the thickness t of the flat portion of the heat radiating plate 3 is as thin as about 1.5 mm or less. Also in the case of this figure, the destruction of the silicon nitride substrate 2 could be prevented.
[0030]
FIG. 7 shows a plan view of the finned heat sink 3 of the previous figure. This figure is a plan view of the heat sink 3 as viewed from the fin 4 side. In the figure, 100 parts indicated by dotted lines indicate end positions 2X of the silicon nitride substrate 2. As shown in the figure, the junction end position 100 of the silicon nitride substrate 2 is disposed above the low thickness portion of the heat sink 3.
[0031]
Also in the present embodiment, a cooling structure of a power semiconductor device having a semiconductor power element mounted thereon can be formed as in the second embodiment. As shown in FIG. 7, no fins are formed on the entire outer peripheral portion, and the cap-shaped member 12 is joined to the entire end portion of the heat sink 3 by friction stir welding in the same manner as in the second embodiment.
[0032]
(Example 5)
FIG. 8 is a sectional view showing another embodiment of the finned insulated circuit board according to the present invention. This figure is a plan view of the heat sink seen from the fin 4 side. The fins 4 and 4a are formed, and the fins 4 have the same height as the outermost part 9 of the heat sink. On the other hand, the thickness of the fin 4a is smaller than the thickness of the fin 4 part, and is lower than the outermost part 9 of the heat sink. 2X is indicated. As shown in the figure, in this embodiment, a junction end portion 100 of the silicon nitride substrate 2 is disposed above the low-thickness portion and the low-thickness fin 4a of the heat sink 3.
[0033]
Also in the present embodiment, a cooling structure of a power semiconductor device having a semiconductor power element mounted thereon can be formed as in the second embodiment. The plane parallel to the paper is formed by a flat plate having a shape corresponding to the shape.
[0034]
(Example 6)
FIG. 9 is a cross-sectional view showing another embodiment of the finned insulated circuit board according to the present invention. This figure is a plan view of the heat radiating plate 3 as viewed from the fin 4b side, and differs from FIG. 2 in the shape of the fin. That is, while the fin shape is rectangular in FIG. 2, the fin 4b in this figure is a round pin shape, and the fins 4, 4a, 4b, etc., which are arranged like a sword mountain, are Since the fins are processed at the same time when they are processed by etching, they can be easily manufactured even if the fin shape changes.
[0035]
Also in the present embodiment, a cooling structure of a power semiconductor device having a semiconductor power element mounted thereon can be formed as in the second embodiment. A plane parallel to the paper is the same as in the second embodiment.
[0036]
(Example 7)
FIG. 10 is a plan view showing another embodiment of the finned insulated circuit board according to the present invention. This figure is a plan view of the heat sink 3 viewed from the fin 4 side, and differs from FIG. 2 in the following point. That is, the outermost high-thickness portion 9 of the heat sink 3 surrounds the fin 4. In this embodiment, the cooling water flows from the portion (1) in a direction perpendicular to the paper surface, flows in the direction of the arrow, and flows out of the portion (2) in a direction perpendicular to the paper surface. Note that the position of the joint end of the silicon nitride substrate 2 is shown as 100 parts in the figure.
[0037]
Also in this embodiment, a cooling structure of a power semiconductor device having a semiconductor power element mounted thereon can be formed in the same manner as in the second embodiment. .
[0038]
(Example 8)
FIG. 11 is a plan view showing another embodiment of the finned insulated circuit board according to the present invention. This figure is a plan view of the heat sink 3 viewed from the fin 4b side, and differs from FIG. 10 in the following point. That is, while the fin shape is rectangular in FIG. 10, the fin 4b in this figure has a round pin shape, and is an embodiment arranged like a sword mountain.
[0039]
Also in this embodiment, a cooling structure of a power semiconductor device having a semiconductor power element mounted thereon can be formed in the same manner as in the second embodiment. .
[0040]
(Example 9)
FIG. 12 is a cross-sectional view showing a method for etching a finned insulated circuit board according to the present invention. After the laminate of the circuit board 1, the silicon nitride substrate 2, and the heat sink 3 is joined using the active metal brazing materials 5, 6, the laminate is covered with a photosensitive resist or a film 200. This figure shows a state where unnecessary portions of the photosensitive resist and the film 200 are removed by photoetching. By spraying a ferric chloride solution on the laminate in this state, the circuit board 1 made of copper or a copper alloy and the heat radiating plate 3 can be etched. In this way, the heat sink 3 having the fins 4 as shown in FIG. 1 can be easily formed at the time of etching the circuit board 1. Similarly, the structure shown in FIGS. 4 to 11 can be formed by photoetching.
[0041]
【The invention's effect】
ADVANTAGE OF THE INVENTION According to this invention, the structure which can be cooled by a liquid refrigerant is made into the structure which can be joined by friction stir welding, The heat dissipation characteristic is good, and the insulating circuit board which has high reliability, its cooling structure, the power semiconductor device, and its cooling structure are provided. can do.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of a finned insulated circuit board according to the present invention.
FIG. 2 is a plan view of the insulated circuit board with fins shown in FIG. 1 as viewed from the fin side.
FIG. 3 is a cross-sectional view of a cooling device for a power semiconductor device in which a semiconductor power element is mounted on a finned insulated circuit board according to the present invention.
FIG. 4 is a cross-sectional view showing another example of the finned insulated circuit board according to the present invention.
FIG. 5 is a plan view of the insulated circuit board with fins shown in the preceding figure as viewed from the fin side.
FIG. 6 is a sectional view showing another example of the finned insulated circuit board according to the present invention.
7 is a plan view of the insulated circuit board with fins shown in FIG. 6 as viewed from the fin side.
FIG. 8 is a plan view showing another example of the finned insulated circuit board according to the present invention.
FIG. 9 is a plan view showing another example of the finned insulated circuit board according to the present invention.
FIG. 10 is a plan view showing another example of the finned insulated circuit board according to the present invention.
FIG. 11 is a plan view showing another example of the insulated circuit board with fins according to the present invention.
FIG. 12 is a cross-sectional view of manufacturing the finned insulated circuit board according to the present invention by an etching method.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Circuit board, 2 ... Silicon nitride board, 3 ... Heat sink, 4, 4a, 4b ... Fin, 5, 6 ... Active metal brazing material, 5a, 6a ... Projection part of active metal brazing material, 7 ... Groove, 8 ... outermost groove, 9 ... thick part, 10 ... semiconductor power element, 11 ... solder, 12 ... member, 1X ... end of circuit board, 2X ... end of silicon nitride substrate, 100 ... joining of silicon nitride substrate End position, 200: photosensitive resist or film.

Claims (13)

金属よりなる回路板、セラミックス基板及び金属よりなる放熱板が順次ろう材で接合された絶縁回路基板において、前記放熱板はその全外周部を除き複数の平板状フィン又は棒状フィンを有することを特徴とする絶縁回路基板。In an insulated circuit board in which a circuit board made of metal, a ceramic substrate, and a heat sink made of metal are sequentially joined with a brazing material, the heat sink has a plurality of flat fins or rod fins except for the entire outer peripheral portion thereof. And an insulated circuit board. 金属よりなる回路板、セラミックス基板及び金属よりなる放熱板が順次ろう材で接合された絶縁回路基板において、前記放熱板はその全外周部を除き複数の平板状フィンを有し、該平板状フィンの形成側並びの両端部に前記フィンの幅より厚肉の肉厚部が一体に形成されていることを特徴とする絶縁回路基板。In an insulated circuit board in which a circuit board made of metal, a ceramic substrate, and a heat sink made of metal are sequentially joined with a brazing material, the heat sink has a plurality of flat fins except for the entire outer peripheral portion thereof. Characterized in that thick portions thicker than the width of the fins are integrally formed at both ends arranged on the forming side. 金属よりなる回路板、セラミックス基板及び金属よりなる放熱板が順次ろう材で接合された絶縁回路基板において、前記放熱板はその全外周部を除き複数の棒状フィンを有し、該棒状フィンの形成側の一方の両端部に前記フィンの径より厚肉の肉厚部が一体に形成されていることを特徴とする絶縁回路基板。In an insulated circuit board in which a circuit board made of metal, a ceramic substrate, and a heat sink made of metal are sequentially joined by a brazing material, the heat sink has a plurality of rod-shaped fins except for the entire outer peripheral portion thereof, and the rod-shaped fins are formed. Characterized in that a thick portion thicker than the diameter of the fin is integrally formed at one end of the side. 請求項1〜3のいずれかにおいて、前記回路板はエッチングによって形成され、該エッチングと同時に前記フィンがエッチングによって形成されていることを特徴とする絶縁回路基板。4. The insulated circuit board according to claim 1, wherein the circuit board is formed by etching, and the fins are formed by etching simultaneously with the etching. 請求項1〜4のいずれかにおいて、前記フィン間の幅は、前記セラミックス基板の端部直下の幅より小さいことを特徴とする絶縁回路基板。5. The insulated circuit board according to claim 1, wherein a width between the fins is smaller than a width immediately below an end of the ceramic substrate. 請求項1〜5のいずれかにおいて、前記フィンの高さは前記外周部と同等以下であることを特徴とする絶縁回路基板。The insulated circuit board according to any one of claims 1 to 5, wherein a height of the fin is equal to or less than that of the outer peripheral portion. 請求項1〜6のいずれかにおいて、前記回路板と前記セラミックス基板との間のろう材及び前記セラミックス基板と放熱板との間のろう材が活性金属ろう材であり、該ろう材が前記回路板の端部及び前記セラミックス基板の端部の少なくとも一方より外側に突き出た構造であることを特徴とする絶縁回路基板。7. The brazing material according to claim 1, wherein the brazing material between the circuit board and the ceramic substrate and the brazing material between the ceramic substrate and the heat sink are active metal brazing materials, and the brazing material is the circuit material. An insulated circuit board having a structure protruding outward from at least one of an end of a plate and an end of the ceramic substrate. 金属よりなる回路板、セラミックス基板及び金属よりなる放熱板が順次ろう材で接合され、前記放熱板が液体冷媒に接して冷却される絶縁回路基板の冷却構造において、前記放熱板はその全外周部を除き複数の平板状フィンを有し、前記放熱板の全外周部に前記冷媒の通路を形成する部材が接合されていることを特徴とする絶縁回路基板の冷却構造。In a cooling structure of an insulated circuit board in which a circuit board made of metal, a ceramics substrate, and a heat sink made of metal are sequentially joined by a brazing material, and the heat sink is cooled in contact with a liquid refrigerant, the heat sink has an outer peripheral portion. A cooling structure for an insulated circuit board, comprising: a plurality of flat fins except for the above, wherein a member forming the passage of the refrigerant is joined to the entire outer peripheral portion of the heat sink. 金属よりなる回路板、セラミックス基板及び金属よりなる放熱板が順次ろう材で接合され、前記放熱板が液体冷媒に接して冷却される絶縁回路基板の冷却構造において、前記放熱板はその全外周部を除き複数の平板状フィンを有し、該平板状フィンの並びの両端部に前記フィンの幅より厚肉の肉厚部が一体に形成されており、前記放熱板の外周部に前記冷媒の通路を形成する部材が接合されていることを特徴とする絶縁回路基板の冷却構造。In a cooling structure of an insulated circuit board in which a circuit board made of metal, a ceramics substrate, and a heat sink made of metal are sequentially joined by a brazing material, and the heat sink is cooled in contact with a liquid refrigerant, the heat sink has an outer peripheral portion. Except for a plurality of flat fins, thick portions thicker than the width of the fins are integrally formed at both ends of the row of the flat fins, A cooling structure for an insulated circuit board, wherein a member forming a passage is joined. 金属よりなる回路板、セラミックス基板及び金属よりなる放熱板が順次ろう材で接合され、前記放熱板が液体冷媒に接して冷却される絶縁回路基板の冷却構造において、前記放熱板はその全外周部を除き棒状フィンを有し、前記放熱板の全外周部に前記冷媒の通路を形成する部材が接合されていることを特徴とする絶縁回路基板の冷却構造。In a cooling structure of an insulated circuit board in which a circuit board made of metal, a ceramics substrate, and a heat sink made of metal are sequentially joined by a brazing material, and the heat sink is cooled in contact with a liquid refrigerant, the heat sink has an outer peripheral portion. A cooling structure for an insulated circuit board, comprising: a bar-shaped fin except for the above, and a member that forms the passage for the refrigerant joined to the entire outer peripheral portion of the heat sink. 請求項8〜10のいずれかにおいて、前記接合が、接合部への回転ツールの挿入による摩擦攪拌接合によって接合されていることを特徴とする絶縁回路基板の冷却構造。The cooling structure for an insulated circuit board according to any one of claims 8 to 10, wherein the joining is performed by friction stir welding by inserting a rotary tool into the joining portion. 半導体パワー素子が絶縁回路基板の回路板に搭載されたパワー半導体装置において、前記絶縁回路基板は請求項1〜7のいずれかに記載の絶縁回路基板よりなることを特徴とするパワー半導体装置。A power semiconductor device in which a semiconductor power element is mounted on a circuit board of an insulated circuit board, wherein the insulated circuit board comprises the insulated circuit board according to any one of claims 1 to 7. 半導体パワー素子が絶縁回路基板の回路板に搭載され、前記絶縁回路基板が冷却構造を有するパワー半導体装置の冷却構造において、前記絶縁回路基板の冷却構造は請求項8〜11のいずれかに記載の絶縁回路基板の冷却構造よりなることを特徴とするパワー半導体装置の冷却構造。The cooling structure for a power semiconductor device, wherein the semiconductor power element is mounted on a circuit board of an insulated circuit board and the insulated circuit board has a cooling structure, wherein the cooling structure for the insulated circuit board is according to any one of claims 8 to 11. A cooling structure for a power semiconductor device, comprising a cooling structure for an insulated circuit board.
JP2002177833A 2002-06-19 2002-06-19 Insulated circuit board and its cooling structure and power semiconductor device and its cooling structure Pending JP2004022914A (en)

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