JP2003214997A - Capturing device for floating particulate matter in atmosphere and measuring method of particulate matter captured thereby - Google Patents
Capturing device for floating particulate matter in atmosphere and measuring method of particulate matter captured therebyInfo
- Publication number
- JP2003214997A JP2003214997A JP2002012322A JP2002012322A JP2003214997A JP 2003214997 A JP2003214997 A JP 2003214997A JP 2002012322 A JP2002012322 A JP 2002012322A JP 2002012322 A JP2002012322 A JP 2002012322A JP 2003214997 A JP2003214997 A JP 2003214997A
- Authority
- JP
- Japan
- Prior art keywords
- particulate matter
- particle size
- suspended particulate
- dust collecting
- atmosphere
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/24—Suction devices
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、大気中に存在する
浮遊粒子状物質の捕集装置と、その捕集装置により捕集
した浮遊粒子状物質の粒度分布を測定する方法に関す
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a device for collecting suspended particulate matter existing in the atmosphere and a method for measuring the particle size distribution of suspended particulate matter collected by the collector.
【0002】[0002]
【従来の技術】大気中に浮遊している粉じんのうち、粒
径が10μm以下のものは浮遊粒子状物質(SPM)と
称される。この浮遊粒子状物質は、巻き上げられた土な
ども含まれるが、ディーゼル車が排出する黒煙や未燃焼
燃料、硫黄化合物などが多くを占め(関東では35%が
ディーゼル車からのもの)、これらは有害性もより高い
と言われている。このディーゼル車からの排気ガスが原
因の粒子状物質は、特にDEPと称される。また、より
粒径の小さい2.5μm以下のものは微小粒子状物質
(PM2.5)と称され、欧米では調査・研究が盛んに
なってきている。このPM2.5の場合、その排出原因
はディーゼル車の排ガスである割合がより高くなると言
われている。2. Description of the Related Art Among dust particles floating in the atmosphere, those having a particle size of 10 μm or less are called suspended particulate matter (SPM). This suspended particulate matter includes rolled up soil, but black smoke, unburned fuel, and sulfur compounds emitted by diesel vehicles account for a large proportion (35% in the Kanto region are from diesel vehicles). Is said to be more harmful. The particulate matter caused by the exhaust gas from this diesel vehicle is especially called DEP. Further, particles having a particle size of 2.5 μm or less, which are smaller, are called fine particulate matter (PM2.5), and investigations and studies have become popular in Europe and America. In the case of PM2.5, it is said that the cause of the emission is a higher proportion of exhaust gas from diesel vehicles.
【0003】以上のような大気中の浮遊粒子状物質(S
PM)や微小粒子状物質(PM2.5)の形状等を調査
したり、あるいはそこに含まれている化学物質を同定す
るには、大気中からこれらの粒子状物質をフィルタによ
り捕集し、顕微鏡で観察したり、あるいは化学分析を行
う。Suspended particulate matter (S
PM) and fine particulate matter (PM2.5) shapes and the like, or to identify the chemical substances contained therein, collect these particulate matter from the atmosphere with a filter, Observe with a microscope or perform chemical analysis.
【0004】また、以上のような大気中の浮遊粒子状物
質(SPM)や微小粒子状物質(PM2.5)の粒度分
布を測定する装置として、従来、カスケードインパクタ
方式に基づく装置が実用化されている。このカスケード
インパクタ方式に基づく測定装置は、流体を捕集板に衝
突させてその流れの方向を急変させることによって粒子
を流体から分離するインパクタ法を利用したものであ
り、50%捕集効率の粒径を順次変化させたインパクタ
を多段に直列接続して、各段における50%捕集効率の
粒径をそれぞれの段の代表径として、それぞれの段にお
ける捕集量の測定結果から、流体中の粒度分布を求める
ものである。As a device for measuring the particle size distribution of suspended particulate matter (SPM) and fine particulate matter (PM2.5) in the atmosphere as described above, a device based on the cascade impactor system has been put into practical use. ing. The measuring device based on this cascade impactor method utilizes an impactor method in which particles are separated from the fluid by colliding the fluid with a collecting plate to suddenly change the direction of the flow, and the particle size is 50%. The impactors whose diameters were sequentially changed were connected in multiple stages in series, and the particle size of 50% collection efficiency in each stage was used as the representative diameter of each stage, and from the measurement result of the collection amount in each stage, This is for obtaining the particle size distribution.
【0005】[0005]
【発明が解決しようとする課題】ところで、SPMやP
M2.5を顕微鏡で観察したり、あるいは各種化学分析
機器に供すべくフィルタにより捕集する方法では、浮遊
粒子状物質を単独で抽出することが極めて困難であるた
め、顕微鏡により観察するに当たってはフィルタに付着
した状態の浮遊粒子状物質を観察することになるが、そ
の場合、背景のフィルタ像で粒子の像が不鮮明となり、
観察しにくいという問題がある。また、捕集した浮遊粒
子状物質を各種化学分析機器に供する場合においても、
フィルタから浮遊粒子状物質を単独で抽出することが困
難であることから、機器によってはフィルタに付着した
状態で分析を行う必要があり、その場合、例えば蛍光X
線分光装置などにおいては粒子のみにX線を照射するこ
とが困難となり、実質的に分析不能となってしまうとい
う問題がある。By the way, SPM and P
In the method of observing M2.5 with a microscope or collecting it with a filter so as to provide it to various chemical analyzers, it is extremely difficult to extract suspended particulate matter alone. The suspended particulate matter adhered to the surface will be observed, but in that case, the image of the particles becomes unclear in the background filter image,
There is a problem that it is difficult to observe. In addition, even when the collected suspended particulate matter is supplied to various chemical analysis instruments,
Since it is difficult to extract the suspended particulate matter from the filter alone, it is necessary to perform the analysis while attached to the filter depending on the device. In that case, for example, fluorescence X
In a line spectroscope or the like, it is difficult to irradiate only particles with X-rays, and there is a problem that analysis becomes substantially impossible.
【0006】また、浮遊粒子状物質の粒度分布の測定に
供されているカスケードインパクタ方式に基づく従来の
測定装置においては、その原理上、粒径の測定上限値が
10μm程度に限定されてしまうという問題があるとと
もに、粒径の分解能が捕集板の数によって決まってしま
うために、高い分解能で粒度分布を測定することは望め
ないという欠点もある。Further, in the conventional measuring apparatus based on the cascade impactor system used for measuring the particle size distribution of suspended particulate matter, the upper limit of particle size measurement is limited to about 10 μm in principle. In addition to the problem, the particle size resolution is determined by the number of collecting plates, so that it is not possible to measure the particle size distribution with high resolution.
【0007】本発明はこのような実情に鑑みてなされた
もので、大気中の浮遊粒子状物質を捕集する装置であっ
て、捕集した粒子を極めて容易に顕微鏡で観察すること
ができ、かつ、容易に個別の粒子を抽出して各種分析機
器に供することのできる捕集装置と、その捕集装置によ
り捕集した浮遊粒子状物質の粒度分布を、極めて容易
に、かつ、粒径10μm以上を含むより広い粒径範囲に
おいて高い分解能のもとに測定することのできる測定方
法の提供を目的としている。The present invention has been made in view of the above circumstances, and is an apparatus for collecting airborne particulate matter in the atmosphere, and the collected particles can be very easily observed with a microscope. In addition, it is very easy to determine the particle size distribution of the suspended particulate matter collected by the collection device and the collection device that can easily extract individual particles and provide them to various analytical instruments, and the particle size of 10 μm. It is an object of the present invention to provide a measuring method capable of measuring with a high resolution in a wider particle size range including the above.
【0008】[0008]
【課題を解決するための手段】上記の目的を達成するた
め、本発明の大気中の浮遊粒子状物質の捕集装置は、大
気中の浮遊粒子状物質を捕集する装置であって、捕集容
器と、その捕集容器内に大気を吸引するポンプと、捕集
容器内に配置され、単極イオンを発生して当該容器内の
浮遊粒子状物質を帯電させる放電電極と、その放電電極
に対して電位差が与えられることにより捕集容器内で帯
電した浮遊粒子状物質を引き寄せて捕集する集塵電極と
を備え、この集塵電極は、透明板の少なくとも上記放電
電極への対向面に導電性材料からなる透明皮膜が形成さ
れていることによって特徴づけられる(請求項1)。In order to achieve the above object, an airborne particulate matter trapping device of the present invention is a device for trapping airborne particulate matter. A collection container, a pump for sucking air into the collection container, a discharge electrode disposed in the collection container for generating unipolar ions to charge suspended particulate matter in the container, and the discharge electrode A dust collecting electrode that attracts and collects the floating particulate matter charged in the collection container by applying a potential difference to the dust collecting electrode, and the dust collecting electrode is a surface of the transparent plate facing at least the discharge electrode. It is characterized in that a transparent film made of a conductive material is formed on (1).
【0009】また、本発明の大気中の浮遊粒子状物質の
測定方法は、請求項1に記載の捕集装置により捕集した
浮遊粒子状物質の粒度分布を測定する方法であって、上
記集塵電極の表面に大気中の浮遊粒子状物質を捕集した
後、その集塵電極に対してレーザ光を照射し、その表面
に付着している浮遊粒子状物質による回折・散乱光の空
間強度分布を測定し、その測定結果から浮遊粒子状物質
の粒度分布を算出することによって特徴づけられる(請
求項2)。The method for measuring suspended particulate matter in the atmosphere according to the present invention is a method for measuring the particle size distribution of suspended particulate matter collected by the collector according to claim 1. After collecting airborne particulate matter on the surface of the dust electrode, irradiate the dust collecting electrode with laser light, and the spatial intensity of diffracted / scattered light by the airborne particulate matter adhering to the surface. It is characterized by measuring the distribution and calculating the particle size distribution of the suspended particulate matter from the measurement result (claim 2).
【0010】本発明の大気中の浮遊粒子状物質の捕集装
置は、大気中の浮遊粒子状物質を帯電させ、その帯電さ
せた浮遊粒子状物質を、ガラス板や透明なプラスチック
板などの透明板に導電性材料からなる皮膜を施してなる
集塵電極の表面に電位差を利用して捕集することによっ
て、所期の目的を達成するものである。The airborne particulate matter trapping apparatus of the present invention electrically charges the suspended particulate matter in the atmosphere, and charges the charged suspended particulate matter into a transparent material such as a glass plate or a transparent plastic plate. The desired object is achieved by collecting by utilizing the potential difference on the surface of the dust collecting electrode formed by coating the plate with a film made of a conductive material.
【0011】すなわち、本発明の大気中の浮遊粒子状物
質の捕集装置において、大気をポンプで捕集容器内に注
入し、その捕集容器内に配置された放電電極によって単
極イオンを発生させると、大気中に含まれている浮遊粒
子状物質が帯電する。この帯電した浮遊粒子状物質は、
捕集容器内で放電電極に対して電位差が与えられている
集塵電極へと向かい、集塵電極上に捕集される。この集
塵電極として、ガラス板や透明プラスチック板などの透
明板の少なくとも放電電極の対向面に導電性材料からな
る透明皮膜が形成されてなる集塵電極とすることによ
り、透明板の平坦な表面上に浮遊粒子状物質が載った状
態となり、そのまま顕微鏡で観察して背景像の影響を受
けない鮮明な粒子像の観察が可能となる。また、粒子単
体で抽出することが可能となることから、蛍光X線分析
装置などの各種分析機器を用いた化学分析が容易とな
る。また、集塵電極は透明板の表面に導電性材料からな
る透明皮膜を形成しているので、例えば接地電位に接続
することにより、帯電した浮遊粒子状物質を比較的多量
に捕集しても、その電位を常に一定に保持することがで
きるため、効率的な捕集が可能となる。That is, in the device for collecting suspended particulate matter in the atmosphere of the present invention, the atmosphere is injected into a collection container by a pump, and a single electrode is generated by a discharge electrode arranged in the collection container. Then, the suspended particulate matter contained in the atmosphere is charged. This charged suspended particulate matter
In the collection container, it goes to the dust collecting electrode to which a potential difference is applied with respect to the discharge electrode and is collected on the dust collecting electrode. As the dust collecting electrode, a transparent plate made of a conductive material is formed on at least the surface facing the discharge electrode of a transparent plate such as a glass plate or a transparent plastic plate to form a flat surface of the transparent plate. The suspended particulate matter is placed on the top, and it becomes possible to observe a clear particle image without observing the background image by observing with a microscope as it is. In addition, since it becomes possible to extract particles alone, chemical analysis using various analytical instruments such as a fluorescent X-ray analyzer becomes easy. Further, since the dust collecting electrode has a transparent film made of a conductive material formed on the surface of the transparent plate, it is possible to collect a relatively large amount of charged suspended particulate matter by connecting to a ground potential, for example. Since the electric potential can be always kept constant, efficient collection becomes possible.
【0012】一方、本発明の大気中の浮遊粒子状物質の
測定方法は、上記した請求項1に係る発明の捕集装置に
よる浮遊粒子の捕集状態が、レーザ回折・散乱法に基づ
く粒度分布測定による被測定粒子群に要求される状態を
満足していることを利用してなされたものである。On the other hand, in the method for measuring suspended particulate matter in the air according to the present invention, the trapped state of the suspended particles by the trapper of the invention according to claim 1 is determined by a laser diffraction / scattering method. This is done by using the fact that the condition required for the measured particle group by measurement is satisfied.
【0013】すなわち、レーザ回折・散乱法に基づく粒
度分布測定は、広い粒径範囲において高い分解能のもと
に粒度分布を測定することできることが知られている。
このレーザ回折・散乱法に基づく粒度分布測定において
は、被測定粒子群にレーザ光を照射して得られる回折・
散乱光の空間強度分布を測定し、粒子群の粒度分布を算
出する。この粒度分布測定法における回折・散乱光の測
定に際しては、被測定粒子群が分散状態となっているこ
と、および、十分な強度の回折・散乱光が得られること
が条件である。請求項1に係る発明の捕集装置の集塵電
極上に捕集された浮遊粒子状物質は当該電極上にランダ
ムに分散した状態となり、また、集塵電極はガラス板な
どの透明板の表面に導電性材料からなる透明皮膜を形成
したものであり、その電位を常に一定として効率的に浮
遊粒子状物質を捕集することができることから、この集
塵電極上の浮遊粒子状物質の量(濃度)は、捕集時間等
を適宜に設定することによって任意とすることができ、
しかも集塵電極は透明な板である。That is, it is known that the particle size distribution measurement based on the laser diffraction / scattering method can measure the particle size distribution in a wide particle size range with high resolution.
In particle size distribution measurement based on this laser diffraction / scattering method, diffraction /
The spatial intensity distribution of scattered light is measured, and the particle size distribution of the particle group is calculated. When measuring the diffracted / scattered light in this particle size distribution measuring method, it is a condition that the particles to be measured are in a dispersed state and that diffracted / scattered light with sufficient intensity can be obtained. The suspended particulate matter collected on the dust collecting electrode of the collecting device of the invention according to claim 1 is randomly dispersed on the electrode, and the dust collecting electrode is the surface of a transparent plate such as a glass plate. A transparent film made of a conductive material is formed on the surface of the dust collecting electrode, and the potential can be kept constant to efficiently collect the suspended particulate matter. (Concentration) can be arbitrarily set by appropriately setting the collection time,
Moreover, the dust collecting electrode is a transparent plate.
【0014】従って、請求項1に係る発明における集塵
電極上に適宜の濃度で大気中の浮遊粒子状物質を捕集す
ることにより、その浮遊粒子状物質が付着した集塵電極
に対して直接レーザ光を照射することによって、その粒
子群の粒度分布を算出するに足りる十分な回折・散乱光
が得られ、容易にサブミクロンオーダーから10μmを
越える広い粒径範囲において、高い分解能のもとに浮遊
粒子状物質の粒度分布を求めることができる。Therefore, by collecting the suspended particulate matter in the air at an appropriate concentration on the dust collecting electrode in the invention according to claim 1, the suspended particulate matter is directly attached to the dust collecting electrode. By irradiating with laser light, sufficient diffracted / scattered light sufficient to calculate the particle size distribution of the particle group can be obtained, and it is easy to obtain high resolution in a wide particle size range from submicron order to over 10 μm. The particle size distribution of suspended particulate matter can be determined.
【0015】[0015]
【発明の実施の形態】以下、図面を参照しつつ本発明の
実施の形態について説明する。図1は本発明の捕集装置
の実施の形態の構成を示す模式図であり、図2はその集
塵電極2の構造を示す模式的断面図である。BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic diagram showing a configuration of an embodiment of a collection device of the present invention, and FIG. 2 is a schematic sectional view showing the structure of the dust collecting electrode 2.
【0016】開閉自在の蓋1aを備えた捕集容器1に
は、大気の流入口1bと、ポンプ(捕集用圧縮機)2の
吸引口への連通口1cが形成されており、蓋1aを閉じ
た状態でポンプ2を駆動することにより、大気が流入口
1bを介して捕集容器1内に吸引される。The collection container 1 provided with a lid 1a that can be opened and closed is provided with an air inlet 1b and a communication port 1c to a suction port of a pump (collection compressor) 2 and the lid 1a. By driving the pump 2 in the closed state, the atmosphere is sucked into the collection container 1 through the inflow port 1b.
【0017】捕集容器1内には、その上部に放電電極3
が設けられているとともに、その放電電極に対向してそ
の下部には集塵電極4が配置されている。放電電極3に
は高圧電源5からの高電圧が印加され、これによって放
電電極3の近傍の空気が電離し、単極イオンが発生す
る。In the collection container 1, a discharge electrode 3 is provided on the upper part thereof.
Is provided, and the dust collecting electrode 4 is arranged below the discharge electrode so as to face the discharge electrode. A high voltage from the high voltage power source 5 is applied to the discharge electrode 3, whereby the air in the vicinity of the discharge electrode 3 is ionized and monopolar ions are generated.
【0018】一方、集塵電極4は、図2に示すように、
透明なガラス板4aの片面に導電性材料からなる透明皮
膜4bが形成されており、この導電性透明皮膜4bが接
地電位6に接続されているとともに、この導電性透明皮
膜4bが放電電極3に対向して上面となるように捕集容
器1内に配置されている。導電性透明皮膜4bの材質と
しては、例えばITOやSnO2などの公知の導電性材
料を用いることができる。また、ガラス板4aの代わり
に透明なプラスチック、例えばアクリル樹脂製の板など
を使用することができる。On the other hand, the dust collecting electrode 4 is, as shown in FIG.
A transparent film 4b made of a conductive material is formed on one surface of a transparent glass plate 4a. The conductive transparent film 4b is connected to the ground potential 6, and the conductive transparent film 4b is applied to the discharge electrode 3. It is arranged in the collection container 1 so as to face the upper surface. As a material of the conductive transparent film 4b, a known conductive material such as ITO or SnO2 can be used. Further, instead of the glass plate 4a, a transparent plastic such as an acrylic resin plate can be used.
【0019】以上の構成において、ポンプ2を駆動しつ
つ放電電極3に高電圧を印加すると、その周囲の空気が
電離して生成された単極イオンは、導電性透明皮膜4b
との電位差により集塵電極4側に向けて移動し、その過
程で捕集容器1内に吸引された大気中の浮遊粒子状物質
Pと接触してこれを帯電させる。帯電した浮遊粒子状物
質Pは、同じく放電電極3と導電性透明皮膜4bとの電
位差によって集塵電極4の上面にランダムに分散した状
態で捕集されていく。このとき、集塵電極4の上面の導
電性透明皮膜4bが接地されているので、比較的多量の
浮遊粒子状物質Pを捕集しても電位が変化することがな
く、高い効率のもとにと浮遊粒子状物質Pを捕集するこ
とができる。In the above structure, when a high voltage is applied to the discharge electrode 3 while driving the pump 2, the unipolar ions generated by the ionization of the surrounding air ionize the conductive transparent film 4b.
Moves toward the dust collecting electrode 4 side due to the potential difference between and and contacts the floating particulate matter P in the atmosphere sucked into the collection container 1 in the process to charge it. The charged suspended particulate matter P is also collected in a state of being randomly dispersed on the upper surface of the dust collecting electrode 4 due to the potential difference between the discharge electrode 3 and the conductive transparent film 4b. At this time, since the conductive transparent film 4b on the upper surface of the dust collecting electrode 4 is grounded, the potential does not change even if a relatively large amount of the suspended particulate matter P is collected, and the efficiency is high. The suspended particulate matter P can be collected.
【0020】以上のようにガラス板4aと導電性透明皮
膜4bからなる集塵電極4上に大気中の浮遊粒子状物質
Pを捕集することにより、以下に示すレーザ回折・散乱
式粒度分布測定装置を用いることによって、極めて容易
に広い粒径範囲のもとに高分解能でその粒度分布を測定
することができる。By collecting the suspended particulate matter P in the atmosphere on the dust collecting electrode 4 composed of the glass plate 4a and the conductive transparent film 4b as described above, the laser diffraction / scattering particle size distribution measurement shown below is carried out. By using the device, the particle size distribution can be measured very easily with a high resolution in a wide particle size range.
【0021】図3はその粒度分布測定に際しての装置構
成例を示す図で、光学的構成を表す模式図と電気的構成
を表すブロック図とを併記して示す図である。FIG. 3 is a diagram showing an example of the apparatus configuration for measuring the particle size distribution, and is a diagram showing both a schematic diagram showing the optical configuration and a block diagram showing the electrical configuration.
【0022】レーザ回折・散乱式粒度分布測定装置20
は、被測定粒子群に対して平行なレーザ光を照射する照
射光学系21と、被測定粒子群による回折・散乱光の空
間強度分布を測定する測定光学系22と、その測定光学
系22の出力をサンプリングするデータサンプリング回
路23、およびそのデータサンプリング回路23により
サンプリングされた回折・散乱光の空間強度分布データ
を用いて、被測定粒子群の粒度分布を算出するコンピュ
ータ24を主体として構成されている。Laser diffraction / scattering type particle size distribution measuring device 20
Is an irradiation optical system 21 for irradiating a laser beam parallel to the measured particle group, a measurement optical system 22 for measuring the spatial intensity distribution of the diffracted / scattered light by the measured particle group, and the measurement optical system 22. The data sampling circuit 23 for sampling the output, and the computer 24 for calculating the particle size distribution of the measured particle group using the spatial intensity distribution data of the diffracted / scattered light sampled by the data sampling circuit 23 are mainly configured. There is.
【0023】図1の捕集装置によりその集塵電極4の表
面上に捕集された浮遊粒子状物質Pは、集塵電極4の表
面に付着させたままの状態で、照射光学系21と測定光
学系22の間に、その光軸に直交するように立てて配置
される。The suspended particulate matter P collected on the surface of the dust collection electrode 4 by the collection device of FIG. 1 remains in contact with the irradiation optical system 21 while being attached to the surface of the dust collection electrode 4. The measurement optical systems 22 are arranged upright so as to be orthogonal to the optical axis thereof.
【0024】照射光学系21は、レーザ光源21a,集
光レンズ22b、空間フィルタ22cおよびコリメート
レンズ23dによって構成され、レーザ光源21aから
出力これたレーザ光を平行光束として集塵電極4に付着
している浮遊粒子状物質Pに照射する。この集塵電極4
に対して照射されたレーザ光は、その表面に付着してい
る浮遊粒子状物質Pにより回折・散乱を受ける。この回
折・散乱光の空間強度分布は測定光学系22によって測
定される。The irradiation optical system 21 is composed of a laser light source 21a, a condenser lens 22b, a spatial filter 22c and a collimator lens 23d, and the laser light output from the laser light source 21a is attached to the dust collecting electrode 4 as a parallel light flux. The suspended particulate matter P present is irradiated. This dust collecting electrode 4
The laser light applied to the laser beam is diffracted and scattered by the suspended particulate matter P attached to the surface of the laser beam. The spatial intensity distribution of the diffracted / scattered light is measured by the measurement optical system 22.
【0025】測定光学系22は、集光レンズ22aおよ
びリングディテクタ22bと、その外側に配置された前
方広角度散乱光センサ群22cと、集塵電極4の側方お
よび後方(照射光学系21側)に配置された側方/後方
散乱光センサ群22dによって構成されている。リング
ディテクタ22bは、互いに異なる半径のリング状また
は1/2リング状もしくは1/4リング状の受光面を有
する光センサを同心上に配置した光センサアレイであっ
て、集光レンズ22aにより集光された前方所定角度以
内の回折・散乱光の空間強度分布を検出することができ
る。従って、これらのセンサ群からなる測定光学系22
により、集塵電極4上にランダムに分散して付着してい
る浮遊粒子群Pによる回折・散乱光の空間強度分布が、
前方微小角度から後方に至る広い範囲で測定される。The measuring optical system 22 includes a condenser lens 22a and a ring detector 22b, a front wide-angle scattered light sensor group 22c arranged outside thereof, and side and rear sides of the dust collecting electrode 4 (on the side of the irradiation optical system 21). ) Is arranged by the side / back scattered light sensor group 22d. The ring detector 22b is an optical sensor array in which optical sensors having ring-shaped, ½ ring-shaped, or ¼ ring-shaped light-receiving surfaces having different radii are concentrically arranged, and are condensed by a condenser lens 22a. The spatial intensity distribution of the diffracted / scattered light within the predetermined front angle can be detected. Therefore, the measurement optical system 22 including these sensor groups
Thus, the spatial intensity distribution of the diffracted / scattered light by the suspended particle group P that is randomly dispersed and attached on the dust collecting electrode 4 is
It is measured in a wide range from the front minute angle to the rear.
【0026】以上の測定光学系22による各回折・散乱
角度ごとの光強度検出信号は、それぞれのアンプ並びに
A−D変換器を有してなるデータサンプリング回路23
によって増幅された上でデジタル化され、回折・散乱光
の空間強度分布データとしてコンピュータ24に取り込
まれる。The light intensity detection signal for each diffraction / scattering angle by the above measurement optical system 22 is a data sampling circuit 23 having respective amplifiers and AD converters.
Is amplified, digitized, and taken into the computer 24 as spatial intensity distribution data of diffracted / scattered light.
【0027】コンピュータ24では、その回折・散乱光
の空間強度分布を用いて、レーザ回折・散乱式の粒度分
布測定において公知の、ミーの散乱理論およびフラウン
ホーファの回折理論に基づく演算手法により、レーザ光
が回折・散乱した原因粒子である浮遊粒子状物質の粒度
分布を算出する。The computer 24 uses the spatial intensity distribution of the diffracted / scattered light to calculate the laser light by a calculation method based on Mie's scattering theory and Fraunhofer's diffraction theory, which are known in the laser diffraction / scattering particle size distribution measurement. Calculate the particle size distribution of the suspended particulate matter that is the cause of the diffracted and scattered particles.
【0028】このレーザ回折・散乱式粒度分布測定装置
20による粒度分布の測定によれば、サブミクロンオー
ダーから10μmを越える広い粒径範囲において高い分
解能でその粒度分布の測定が可能であり、集塵電極4上
の浮遊粒子状物質Pの量を、十分な回折・散乱光強度が
得られる程度とするだけで、直ちに大気中の浮遊粒子状
物質Pの粒度分布を高い精度で測定することができる。According to the measurement of the particle size distribution by the laser diffraction / scattering type particle size distribution measuring device 20, it is possible to measure the particle size distribution with a high resolution in a wide particle size range from the submicron order to over 10 μm, and the dust collection. The particle size distribution of the suspended particulate matter P in the atmosphere can be immediately measured with high accuracy simply by setting the amount of the suspended particulate matter P on the electrode 4 to such an extent that sufficient diffraction / scattered light intensity can be obtained. .
【0029】また、図1に示した捕集装置により捕集さ
れた浮遊粒子状物質Pは、透明な平板である集塵電極4
上に分散状態で付着した状態となるため、そのまま顕微
鏡観察が可能であり、その場合、背景像の影響を受ける
ことなく鮮明な粒子像が得られる。また、この集塵電極
4の表面上に分散状態で捕集された浮遊粒子状物質P
は、容易に粒子単独で抽出することができ、また、各粒
子が平板状の集塵電極4の表面に露出した状態となって
いるので直接的にX線や光等の電磁波を照射することが
でき、フィルタで捕集する場合に比して、容易に各種分
析機器を用いた化学分析に供することが可能となる。Further, the suspended particulate matter P collected by the collecting device shown in FIG. 1 is a dust collecting electrode 4 which is a transparent flat plate.
Since it adheres to the upper surface in a dispersed state, it can be observed with a microscope as it is. In that case, a clear particle image can be obtained without being affected by the background image. In addition, the suspended particulate matter P collected on the surface of the dust collecting electrode 4 in a dispersed state.
The particles can be easily extracted by themselves, and since each particle is exposed on the surface of the flat plate-shaped dust collecting electrode 4, it is possible to directly irradiate electromagnetic waves such as X-rays and light. Therefore, it becomes possible to easily carry out chemical analysis using various analytical instruments as compared with the case of collecting with a filter.
【0030】なお、図3の装置構成において、集塵電極
4の表面に付着した浮遊粒子状物質Pが落下する恐れの
ある場合には、その付着面に別のガラス板等を重ね合わ
せた状態でレーザ光を照射することもできる。In the apparatus configuration shown in FIG. 3, when the suspended particulate matter P adhering to the surface of the dust collecting electrode 4 may drop, another adhering surface is covered with another glass plate or the like. It is also possible to irradiate with laser light.
【0031】[0031]
【発明の効果】以上のように本発明の大気中の浮遊粒子
状物質の捕集装置によれば、大気中の浮遊粒子状物質を
帯電させて、透明板の表面に導電性の透明皮膜を形成し
てなる透明な平板である集塵電極上に捕集するので、顕
微鏡による観察に際して背景像の影響を受けることなく
鮮明な粒子像が得られ、また、浮遊粒子状物質単体で抽
出することが容易であることから、従来のフィルタによ
る捕集では使用不可能であった各種分析機器を用いた化
学分析が可能となる。しかも、集塵電極の導電性透明皮
膜を例えば接地電位に接続することによって、帯電した
浮遊粒子状物質を比較的多量に捕集しても、集塵電極の
電位が変化することがないので、浮遊粒子状物質を高い
効率のもとに捕集することができる。As described above, according to the airborne particulate matter trapping apparatus of the present invention, the airborne particulate matter is charged to form a conductive transparent film on the surface of the transparent plate. Since it collects on the dust collecting electrode which is a transparent flat plate that is formed, a clear particle image can be obtained without being affected by the background image when observed with a microscope, and it is necessary to extract only suspended particulate matter. Since it is easy to carry out, it becomes possible to carry out chemical analysis using various analytical instruments which cannot be used for collection by a conventional filter. Moreover, by connecting the conductive transparent film of the dust collecting electrode to, for example, the ground potential, the potential of the dust collecting electrode does not change even if a relatively large amount of charged suspended particulate matter is collected. The suspended particulate matter can be collected with high efficiency.
【0032】また、以上のような捕集装置により大気中
の浮遊粒子状物質を捕集することにより、レーザ回折・
散乱式粒度分布測定装置を用いて、集塵電極上に捕集さ
れて付着している浮遊粒子状物質に対し直接的にレーザ
光を照射してその回折・散乱光の空間強度分布を測定す
ることが可能となり、このレーザ回折・散乱法に基づく
粒度分布測定によって、サブミクロンオーダーから10
μmを越える広い粒径範囲で高分解能の粒度分布測定が
可能となる。Further, by collecting the suspended particulate matter in the atmosphere by the above-mentioned collecting device, laser diffraction
Using a scattering type particle size distribution measuring device, the spatial intensity distribution of the diffracted / scattered light is measured by directly irradiating the suspended particulate matter collected and attached on the dust collecting electrode with laser light. It becomes possible to measure from sub-micron order to 10 by the particle size distribution measurement based on this laser diffraction / scattering method.
High-resolution particle size distribution measurement is possible in a wide particle size range exceeding μm.
【図1】本発明の大気中の浮遊粒子状物質の捕集装置の
実施の形態の構成を表す模式図である。FIG. 1 is a schematic diagram showing the configuration of an embodiment of a device for collecting airborne particulate matter of the present invention.
【図2】図1の実施の形態における集塵電極4の構造を
示す模式的断面図である。FIG. 2 is a schematic cross-sectional view showing the structure of a dust collection electrode 4 in the embodiment of FIG.
【図3】本発明の大気中の浮遊粒子状物質の測定方法の
実施の形態において用いる装置構成例を示す図で、光学
的構成を表す模式図と電気的構成を表すブロック図とを
併記して示す図である。FIG. 3 is a diagram showing a device configuration example used in the embodiment of the method for measuring airborne particulate matter of the present invention, in which a schematic diagram showing an optical configuration and a block diagram showing an electrical configuration are shown together. FIG.
1 捕集容器 2 ポンプ 3 放電電極 4 集塵電極 4a ガラス板 4b 導電性透明皮膜 5 高圧電源 6 接地電位 20 レーザ回折・散乱式粒度分布測定装置 21 照射光学系 22 測定光学系 23 データサンプリング回路 24 コンピュータ P 浮遊粒子状物質 1 Collection container 2 pumps 3 discharge electrodes 4 Dust collecting electrode 4a glass plate 4b Conductive transparent film 5 high voltage power supply 6 Ground potential 20 Laser diffraction / scattering particle size distribution analyzer 21 Irradiation optical system 22 Measuring optical system 23 Data sampling circuit 24 computer P Suspended particulate matter
Claims (2)
であって、捕集容器と、その捕集容器内に大気を吸引す
るポンプと、捕集容器内に配置され、単極イオンを発生
して当該容器内の浮遊粒子状物質を帯電させる放電電極
と、その放電電極に対して電位差が与えられることによ
り捕集容器内で帯電した浮遊粒子状物質を引き寄せて捕
集する集塵電極とを備え、この集塵電極は、透明板の少
なくとも上記放電電極への対向面に導電性材料からなる
透明皮膜が形成されていることを特徴とする大気中の浮
遊粒子状物質の捕集装置。1. An apparatus for collecting suspended particulate matter in the atmosphere, comprising: a collection container, a pump for sucking the atmosphere into the collection container, and a monopolar ion disposed in the collection container. And a discharge electrode that charges the suspended particulate matter in the container, and a dust collection that attracts and collects the charged suspended particulate matter in the collection vessel by applying a potential difference to the discharge electrode. This dust collecting electrode is characterized in that a transparent film made of a conductive material is formed on at least the surface of the transparent plate facing the discharge electrode to collect airborne particulate matter. apparatus.
た浮遊粒子状物質の粒度分布を測定する方法であって、
上記集塵電極の表面に大気中の浮遊粒子状物質を捕集し
た後、その集塵電極に対してレーザ光を照射し、その表
面に付着している浮遊粒子状物質による回折・散乱光の
空間強度分布を測定し、その測定結果から浮遊粒子状物
質の粒度分布を算出することを特徴とする大気中の浮遊
粒子状物質の測定方法。2. A method for measuring the particle size distribution of suspended particulate matter collected by the collection device according to claim 1.
After collecting the suspended particulate matter in the atmosphere on the surface of the dust collecting electrode, irradiating the dust collecting electrode with a laser beam, and diffracted / scattered light by the suspended particulate matter adhering to the surface A method for measuring suspended particulate matter in the atmosphere, which comprises measuring a spatial intensity distribution and calculating a particle size distribution of suspended particulate matter from the measurement result.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002012322A JP3758577B2 (en) | 2002-01-22 | 2002-01-22 | Device for collecting suspended particulate matter in the atmosphere and measuring method for collected suspended particulate matter |
| US10/322,677 US6807874B2 (en) | 2002-01-21 | 2002-12-19 | Collecting apparatus of floating dusts in atmosphere |
| US10/882,621 US6923848B2 (en) | 2002-01-21 | 2004-07-02 | Collecting apparatus of floating dusts in atmosphere |
| US11/048,895 US7041153B2 (en) | 2002-01-21 | 2005-02-03 | Method of measuring floating dusts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002012322A JP3758577B2 (en) | 2002-01-22 | 2002-01-22 | Device for collecting suspended particulate matter in the atmosphere and measuring method for collected suspended particulate matter |
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| Publication Number | Publication Date |
|---|---|
| JP2003214997A true JP2003214997A (en) | 2003-07-30 |
| JP3758577B2 JP3758577B2 (en) | 2006-03-22 |
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| JP2002012322A Expired - Lifetime JP3758577B2 (en) | 2002-01-21 | 2002-01-22 | Device for collecting suspended particulate matter in the atmosphere and measuring method for collected suspended particulate matter |
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| JP (1) | JP3758577B2 (en) |
Cited By (12)
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|---|---|---|---|---|
| JP2004170287A (en) * | 2002-11-21 | 2004-06-17 | Shimadzu Corp | Device for collecting suspended particulate matter in the atmosphere |
| JP2004177347A (en) * | 2002-11-28 | 2004-06-24 | Shimadzu Corp | Device for collecting and measuring suspended particulate matter in the atmosphere |
| JP2005283212A (en) * | 2004-03-29 | 2005-10-13 | Shimadzu Corp | Airborne particulate matter collection device |
| JP2007017440A (en) * | 2005-07-07 | 2007-01-25 | Fei Co | Method and apparatus for statistically characterizing nanoparticles |
| JP2007107970A (en) * | 2005-10-12 | 2007-04-26 | Shimadzu Corp | Measuring method for asbestos |
| JP2007523652A (en) * | 2004-02-26 | 2007-08-23 | トムセン バイオサイエンス アクティーゼルスカブ | Method, chip, device and integrated system for detecting bioparticles |
| JP2007524097A (en) * | 2004-02-26 | 2007-08-23 | トムセン バイオサイエンス アクティーゼルスカブ | Method, chip, apparatus and system for collecting biological particles |
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| JP2012518186A (en) * | 2009-02-18 | 2012-08-09 | バッテル メモリアル インスティチュート | Small area electrostatic aerosol collector |
| KR101498273B1 (en) * | 2013-05-28 | 2015-03-05 | 전자부품연구원 | Method and apparatus for analyzing biological material in air |
| CN106226132A (en) * | 2016-08-04 | 2016-12-14 | 环境保护部华南环境科学研究所 | Wide scope multisize particles thing parallel connection harvester |
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Cited By (14)
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|---|---|---|---|---|
| JP2004170287A (en) * | 2002-11-21 | 2004-06-17 | Shimadzu Corp | Device for collecting suspended particulate matter in the atmosphere |
| JP2004177347A (en) * | 2002-11-28 | 2004-06-24 | Shimadzu Corp | Device for collecting and measuring suspended particulate matter in the atmosphere |
| JP2007527237A (en) * | 2004-02-26 | 2007-09-27 | トムセン バイオサイエンス アクティーゼルスカブ | Method, chip, device and system for extracting biological material |
| JP4750781B2 (en) * | 2004-02-26 | 2011-08-17 | デルタ,ダンスク エレクトロニック,リス アンド アクスティック | Method, chip, device and integrated system for detecting bioparticles |
| JP2007523652A (en) * | 2004-02-26 | 2007-08-23 | トムセン バイオサイエンス アクティーゼルスカブ | Method, chip, device and integrated system for detecting bioparticles |
| JP2007524097A (en) * | 2004-02-26 | 2007-08-23 | トムセン バイオサイエンス アクティーゼルスカブ | Method, chip, apparatus and system for collecting biological particles |
| JP2005283212A (en) * | 2004-03-29 | 2005-10-13 | Shimadzu Corp | Airborne particulate matter collection device |
| JP2007017440A (en) * | 2005-07-07 | 2007-01-25 | Fei Co | Method and apparatus for statistically characterizing nanoparticles |
| JP2007107970A (en) * | 2005-10-12 | 2007-04-26 | Shimadzu Corp | Measuring method for asbestos |
| JP2012518186A (en) * | 2009-02-18 | 2012-08-09 | バッテル メモリアル インスティチュート | Small area electrostatic aerosol collector |
| KR101498273B1 (en) * | 2013-05-28 | 2015-03-05 | 전자부품연구원 | Method and apparatus for analyzing biological material in air |
| CN107631962A (en) * | 2016-07-18 | 2018-01-26 | 罗伯特·博世有限公司 | For handling the method and control device and camera system of the image for representing at least one halation |
| CN107631962B (en) * | 2016-07-18 | 2022-03-08 | 罗伯特·博世有限公司 | Method and control device for processing an image representing at least one halo and camera system |
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