JP2003174008A - Spin processing apparatus and processing method - Google Patents
Spin processing apparatus and processing methodInfo
- Publication number
- JP2003174008A JP2003174008A JP2001374571A JP2001374571A JP2003174008A JP 2003174008 A JP2003174008 A JP 2003174008A JP 2001374571 A JP2001374571 A JP 2001374571A JP 2001374571 A JP2001374571 A JP 2001374571A JP 2003174008 A JP2003174008 A JP 2003174008A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- prevention cover
- turbulent flow
- rotating body
- flow prevention
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Drying Of Solid Materials (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
(57)【要約】
【課題】 この発明は乱流防止カバーに付着残留する処
理液によって基板が汚染されることがないようにしたス
ピン処理装置を提供することにある。
【解決手段】 基板を回転させて処理するスピン処理装
置において、回転駆動されるとともに上記基板Wを着脱
可能に保持する回転体11と上記基板の下面側に対向し
て回転不能に配置されこの基板の下面に処理液を噴射す
るノズル孔33を有するノズルヘッド32と、上記回転
体と一体的に設けられこの回転体に保持された上記基板
の下面に所定の間隔で離間対向する対向壁部を有する乱
流防止カバー41と、この乱流防止カバーを加熱しその
対向壁部の上面に残留する処理液を乾燥させるヒータ5
2とを具備した。
(57) [Problem] To provide a spin processing apparatus in which a substrate is not contaminated by a processing liquid remaining on a turbulence prevention cover. SOLUTION: In a spin processing apparatus for rotating and processing a substrate, a rotating body 11 which is driven to rotate and holds the substrate W in a detachable manner, and which is non-rotatably disposed facing a lower surface side of the substrate. A nozzle head 32 having a nozzle hole 33 for injecting the processing liquid on the lower surface of the substrate, and an opposing wall portion provided integrally with the rotator and opposed to the lower surface of the substrate held by the rotator at a predetermined interval. And a heater 5 for heating the turbulence prevention cover and drying the processing liquid remaining on the upper surface of the opposing wall.
2 was provided.
Description
【0001】[0001]
【発明の属する技術分野】この発明は基板を周方向に回
転させながら処理液で処理した後、乾燥処理するための
スピン処理装置及びスピン処理方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a spin processing apparatus and a spin processing method for treating a substrate with a treatment liquid while rotating the substrate in a circumferential direction and then performing a drying treatment.
【0002】[0002]
【従来の技術】たとえば、液晶表示装置や半導体装置の
製造工程においては、ガラス基板や半導体ウエハなどの
基板に回路パターンを形成するための成膜プロセスやフ
ォトプロセスがある。これらのプロセスでは、上記基板
に対して成膜処理と洗浄処理とが繰り返し行われる。2. Description of the Related Art For example, in a manufacturing process of a liquid crystal display device or a semiconductor device, there is a film forming process or a photo process for forming a circuit pattern on a substrate such as a glass substrate or a semiconductor wafer. In these processes, the film forming process and the cleaning process are repeatedly performed on the substrate.
【0003】上記基板の洗浄処理および洗浄処理後の乾
燥処理を行うためにはスピン処理装置が用いられる。こ
のスピン処理装置はカップ体を有し、このカップ体内に
は回転駆動される回転体が設けられている。この回転体
には保持機構が設けられ、この保持機構には基板が着脱
可能に保持される。A spin processing apparatus is used to perform the cleaning processing of the substrate and the drying processing after the cleaning processing. This spin processing apparatus has a cup body, and a rotary body that is driven to rotate is provided in the cup body. The rotating body is provided with a holding mechanism, and the holding mechanism detachably holds the substrate.
【0004】この保持機構に保持された基板は回転体と
ともに回転しながら洗浄処理および乾燥処理が順次行な
われる。基板の洗浄処理では、回路パターンが形成され
る上面だけでなく、下面の清浄度が要求されることがあ
る。そのような場合には基板を回転させながらこの基板
の下面に向けて処理液を噴射して基板の下面も洗浄処理
するということが行なわれる。The substrate held by the holding mechanism is sequentially washed and dried while rotating together with the rotating body. In the cleaning process of the substrate, not only the upper surface on which the circuit pattern is formed but also the lower surface may be required to be clean. In such a case, while rotating the substrate, the processing liquid is jetted toward the lower surface of the substrate to clean the lower surface of the substrate.
【0005】洗浄処理が終了したならば処理液の供給を
停止し、回転体を高速度で回転させ、その回転により生
じる遠心力を利用して基板に付着した洗浄液を飛散させ
て乾燥処理することになる。When the cleaning process is completed, the supply of the process liquid is stopped, the rotating body is rotated at a high speed, and the centrifugal force generated by the rotation scatters the cleaning liquid adhering to the substrate to perform the drying process. become.
【0006】基板を乾燥処理する際、回転体を高速度で
回転させると、回転体の上面側と基板の下面側との間の
空間部には乱流が発生し易いということがある。一方、
基板の乾燥処理時には基板から飛散した処理液がミスト
状となってカップ体内を浮遊している。When the rotating body is rotated at a high speed when the substrate is dried, turbulent flow is likely to occur in the space between the upper surface side of the rotating body and the lower surface side of the substrate. on the other hand,
When the substrate is dried, the treatment liquid scattered from the substrate becomes a mist and floats in the cup body.
【0007】そのため、基板の乾燥処理時に基板の下面
側に乱流が生じると、カップ体内を浮遊するミストが基
板の下面側に巻き込まれ、その下面に付着して汚れやウ
オータマークの発生原因となるということがある。Therefore, when a turbulent flow is generated on the lower surface side of the substrate during the drying process of the substrate, mist floating in the cup body is caught on the lower surface side of the substrate and adheres to the lower surface to cause stains and watermarks. There are times when
【0008】そこで、上記回転体に、この回転体に保持
される基板の下面と僅かな間隔を介して対向する対向壁
部を有する乱流防止カバーを設け、回転体を高速度で回
転させたときに、基板の下面側に乱流が発生するのを防
止するということが考えられている。Therefore, the rotating body is provided with a turbulent flow prevention cover having an opposed wall portion which faces the lower surface of the substrate held by the rotating body with a slight gap, and the rotating body is rotated at a high speed. At times, it is considered to prevent turbulence from occurring on the lower surface side of the substrate.
【0009】[0009]
【発明が解決しようとする課題】回転体に乱流防止カバ
ーを設ければ、基板の乾燥処理時にこの基板の下面側に
乱流が発生するのを防止することが可能となる。しかし
ながら、基板の洗浄処理時に、基板の下面に噴射された
処理液が上記乱流防止カバーの上面に付着残留すること
が避けられない。If a turbulent flow prevention cover is provided on the rotating body, it is possible to prevent turbulent flow from being generated on the lower surface side of the substrate during the substrate drying process. However, it is inevitable that the processing liquid sprayed on the lower surface of the substrate adheres to and remains on the upper surface of the turbulent flow prevention cover during the cleaning processing of the substrate.
【0010】そのため、基板の乾燥処理時に、乱流防止
カバーの上面に付着残留した処理液が飛散して基板の下
面に付着し、汚れやウオータマークの発生原因になると
いうことがある。とくに、乱流防止カバーから処理液が
飛散して基板に付着する時期が基板の乾燥処理工程の後
期(とくに終了間際)であると、その処理液がほとんど
乾燥されずに基板の下面に残留することになり、ウオー
タマークの発生が避けられないということがある。Therefore, when the substrate is dried, the treatment liquid remaining on the upper surface of the turbulence prevention cover may be scattered and adhere to the lower surface of the substrate, which may cause stains and watermarks. In particular, if the processing liquid is scattered from the turbulent flow prevention cover and adheres to the substrate in the latter stage of the substrate drying processing step (particularly immediately before the end), the processing liquid is hardly dried and remains on the lower surface of the substrate. In some cases, the generation of watermarks cannot be avoided.
【0011】この発明は、基板の乾燥処理時の、とくに
乾燥処理が終了する間際に、乱流防止カバーの上面に付
着残留した処理液が飛散して基板の下面に再付着するこ
とがないようにしたスピン処理装置及びスピン処理方法
を提供することにある。According to the present invention, the processing liquid remaining on the upper surface of the turbulence prevention cover is prevented from being scattered and redeposited on the lower surface of the substrate during the drying processing of the substrate, particularly when the drying processing is completed. Another object of the present invention is to provide a spin processing apparatus and a spin processing method.
【0012】[0012]
【課題を解決するための手段】請求項1の発明は、基板
を回転させて処理するスピン処理装置において、回転駆
動されるとともに上記基板を着脱可能に保持する回転体
と、上記基板の下面側に対向して回転不能に配置されこ
の基板の下面に処理液を噴射するノズル孔を有するノズ
ルヘッドと、上記回転体と一体的に設けられこの回転体
に保持された上記基板の下面に所定の間隔で離間対向す
る対向壁部を有する乱流防止カバーと、この乱流防止カ
バーを加熱しその対向壁部の上面に残留する処理液を乾
燥させる加熱手段とを具備したことを特徴とするスピン
処理装置にある。According to a first aspect of the present invention, there is provided a spin processing apparatus for rotating and processing a substrate, wherein the rotating body is rotationally driven and detachably holds the substrate, and a lower surface side of the substrate. A non-rotatably arranged nozzle head having a nozzle hole for injecting a processing liquid on the lower surface of the substrate, and a predetermined surface on the lower surface of the substrate held integrally with the rotating body and held by the rotating body. A spin comprising: a turbulent flow prevention cover having opposed wall portions facing each other at intervals; and heating means for heating the turbulent flow prevention cover to dry the treatment liquid remaining on the upper surface of the opposed wall portion. It is in the processing unit.
【0013】請求項2の発明は、上記ノズルヘッドには
上記乱流防止カバーの対向壁部の下面に対向する取付け
部が設けられ、この取付け部に上記加熱手段が設けられ
ていることを特徴とする請求項1記載のスピン処理装置
にある。According to a second aspect of the present invention, the nozzle head is provided with a mounting portion facing the lower surface of the facing wall portion of the turbulent flow prevention cover, and the heating means is provided in the mounting portion. The spin processing apparatus according to claim 1.
【0014】請求項3の発明は、上記加熱手段は、上記
乱流防止カバーの対向壁部の下面に設けられていること
を特徴とする請求項1記載のスピン処理装置にある。A third aspect of the present invention is the spin processing apparatus according to the first aspect, wherein the heating means is provided on the lower surface of the opposing wall portion of the turbulence prevention cover.
【0015】請求項4の発明は、基板を着脱可能に保持
するとともにこの基板の下面側に乱流が発生するのを防
止する乱流防止カバーを有する回転体によって上記基板
を回転させながら処理するスピン処理方法において、上
記基板を低速度で回転させながら下面を処理液によって
処理する工程と、処理液による処理時に比べて上記基板
を高速度で回転させて乾燥処理する工程と、上記基板を
乾燥処理する際に上記乱流防止カバーを加熱してこの乱
流防止カバーの上面に付着残留する処理液を乾燥させる
工程とを具備したことを特徴とするスピン処理方法にあ
る。According to a fourth aspect of the present invention, the substrate is processed while being rotated by a rotating body that holds the substrate detachably and has a turbulent flow prevention cover that prevents turbulent flow from being generated on the lower surface side of the substrate. In the spin processing method, a step of processing the lower surface with a processing solution while rotating the substrate at a low speed, a step of rotating the substrate at a higher speed than when processing with the processing solution and a drying process, and drying the substrate. In the processing, the turbulent flow preventive cover is heated to dry the treatment liquid adhering and remaining on the upper surface of the turbulent flow preventive cover.
【0016】請求項5の発明は、上記乱流防止カバーを
加熱して行なう乾燥処理を、上記基板の乾燥処理が終了
する前に終了させることを特徴とする請求項4記載のス
ピン処理方法にある。According to a fifth aspect of the present invention, in the spin processing method according to the fourth aspect, the drying process performed by heating the turbulent flow prevention cover is finished before the drying process of the substrate is finished. is there.
【0017】この発明によれば、基板の洗浄処理時に乱
流防止カバーの上面に付着残留した処理液は、乾燥処理
時に加熱乾燥されるため、乾燥処理時の終了間際に、処
理液が乱流防止カバーから飛散して基板の下面に再付着
するのを防止できる。According to the present invention, the treatment liquid remaining on the upper surface of the turbulence prevention cover during the substrate cleaning treatment is heated and dried during the drying treatment, so that the treatment liquid is turbulent near the end of the drying treatment. It is possible to prevent scattering from the prevention cover and reattachment to the lower surface of the substrate.
【0018】[0018]
【発明の実施の形態】以下、図面を参照しながらこの発
明の実施の形態を説明する。BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described below with reference to the drawings.
【0019】図1と図2はこの発明の第1の実施の形態
を示す。1 and 2 show a first embodiment of the present invention.
【0020】図1はスピン処理装置を示し、このスピン
処理装置は同図に鎖線で示すカップ体1を有する。この
カップ体1の底部の径方向中心部には通孔2が穿設さ
れ、周辺部には複数の排出管1aが周方向に所定間隔で
接続されている。FIG. 1 shows a spin processing apparatus, which has a cup body 1 shown by a chain line in the figure. A through hole 2 is formed in the center of the bottom of the cup body 1 in the radial direction, and a plurality of discharge pipes 1a are connected to the peripheral portion at predetermined intervals in the circumferential direction.
【0021】上記通孔2には円筒状の動力伝達体3が設
けられている。この動力伝達体3は駆動源としての制御
モータ4によって回転駆動される。この制御モータ4は
筒状の固定子5と、この固定子5内に回転可能に挿入さ
れた同じく筒状の回転子6とを有する。A cylindrical power transmission body 3 is provided in the through hole 2. The power transmission body 3 is rotationally driven by a control motor 4 as a drive source. The control motor 4 has a cylindrical stator 5 and a cylindrical rotor 6 that is rotatably inserted in the stator 5.
【0022】上記動力伝達体3は下端が上記回転子6の
上端面に接合され、ねじ7によって固定されている。し
たがって、上記動力伝達体3は上記回転子6と一体に回
転するようになっている。The lower end of the power transmission body 3 is joined to the upper end surface of the rotor 6 and fixed by a screw 7. Therefore, the power transmission body 3 is designed to rotate integrally with the rotor 6.
【0023】上記動力伝達体3のカップ体1内に突出し
た上端部には回転体11が取り付けられている。この回
転体11は円板状をなした下板12と上板13とを接合
してなり、これら下板12と上板13との中心部分には
上記動力伝達体3の内部空間に連通する通孔14が形成
されている。A rotating body 11 is attached to an upper end portion of the power transmission body 3 which projects into the cup body 1. The rotating body 11 is formed by joining a disk-shaped lower plate 12 and an upper plate 13, and a central portion of the lower plate 12 and the upper plate 13 communicates with the internal space of the power transmission body 3. A through hole 14 is formed.
【0024】上記回転体11の上板13の周辺部には周
方向に所定間隔、たとえば90度間隔で4つの支持筒部
15が一体形成されている。上記下板12の上記支持筒
部15と対応する部分には通孔16が形成されている。On the peripheral portion of the upper plate 13 of the rotating body 11, four support cylinder portions 15 are integrally formed at predetermined intervals in the circumferential direction, for example, at intervals of 90 degrees. A through hole 16 is formed in a portion of the lower plate 12 corresponding to the supporting cylinder portion 15.
【0025】上記支持筒部15と通孔16には、各々ブ
ッシュ17a、17bが嵌着され、このブッシュ17
a、17bには保持部材18が回転可能に支持されてい
る。この保持部材18は、上記ブッシュ17a、17b
に支持された軸部19と、この軸部19の上端部に一体
形成された上記軸部19よりも大径な頭部20とを有す
る。Bushings 17a and 17b are fitted in the support cylindrical portion 15 and the through hole 16, respectively.
A holding member 18 is rotatably supported by a and 17b. The holding member 18 includes the bushes 17a and 17b.
A shaft portion 19 supported by the shaft portion 19 and a head portion 20 integrally formed on the upper end portion of the shaft portion 19 and having a diameter larger than that of the shaft portion 19.
【0026】上記頭部20の上端面には、保持部材18
の回転中心から偏心した位置にテーパ部材21が設けら
れている。このテーパ部材21のテーパ面21aの傾斜
方向上端部には係合ピン22が突設されている。A holding member 18 is provided on the upper end surface of the head 20.
A taper member 21 is provided at a position eccentric from the rotation center of the. An engagement pin 22 is provided so as to project from the upper end of the taper surface 21a of the taper member 21 in the inclined direction.
【0027】そして、各保持部材18に設けられたテー
パ部材21には半導体ウエハや液晶装置用のガラス基板
などの基板Wが周辺部の下面をそのテーパ面21aに載
置して設けられる。その状態で、各保持部材18を所定
方向、たとえば時計方向に回転させると、上記テーパ部
材21が偏心回転することで、基板Wの周辺部がテーパ
部材21のテーパ面21aに沿って上昇し、その外周面
が係合ピン22に当接する。それによって、基板Wは4
つの保持部材18によって回転体11に一体的に保持さ
れる。A substrate W such as a semiconductor wafer or a glass substrate for a liquid crystal device is provided on the taper member 21 provided on each holding member 18 with the lower surface of the peripheral portion placed on the taper surface 21a. In that state, when each holding member 18 is rotated in a predetermined direction, for example, clockwise, the taper member 21 is eccentrically rotated, so that the peripheral portion of the substrate W rises along the taper surface 21a of the taper member 21, The outer peripheral surface thereof contacts the engaging pin 22. As a result, the substrate W is 4
It is held integrally with the rotating body 11 by one holding member 18.
【0028】上記保持部材18を先程と逆方向である、
反時計方向に回転させると、係合ピン22が基板Wの外
周面から離れるとともにこの基板Wの周辺部がテーパ部
材21のテーパ面21aに沿って下降する。それによっ
て、基板Wの4つの保持部材18による保持状態が開放
される。The holding member 18 is in the opposite direction to the above.
When it is rotated counterclockwise, the engaging pin 22 separates from the outer peripheral surface of the substrate W, and the peripheral portion of the substrate W descends along the tapered surface 21 a of the taper member 21. As a result, the holding state of the substrate W held by the four holding members 18 is released.
【0029】なお、保持部材18の数は4つの限られ
ず、それ以上であってもよく、また基板Wが半導体ウエ
ハの場合には3であってもよい。The number of holding members 18 is not limited to four and may be more than three, and may be three when the substrate W is a semiconductor wafer.
【0030】上記保持部材18の軸部19は下端が回転
体11の下面側に突出し、その突出端部には子歯車25
が嵌着されている。各保持部材18の軸部19に嵌着さ
れた子歯車25は親歯車26に噛合している。この親歯
車26は上記動力伝達体3に軸受27を介して回転可能
に保持されている。The lower end of the shaft portion 19 of the holding member 18 projects to the lower surface side of the rotating body 11, and the child gear 25 is attached to the projecting end portion.
Is fitted. The child gear 25 fitted to the shaft portion 19 of each holding member 18 meshes with the parent gear 26. The parent gear 26 is rotatably held by the power transmission body 3 via a bearing 27.
【0031】上記親歯車26は、上記動力伝達体3の外
周面に設けられたばね28によって所定の回転方向、た
とえば反時計方向に付勢されている。それによって、子
歯車25が時計方向に回転し、その回転に保持部材18
が連動してテーパ部材21が偏心回転することで、基板
Wは各保持部材18の係合ピン22によって回転体11
に保持される。The master gear 26 is biased in a predetermined rotation direction, for example, counterclockwise by a spring 28 provided on the outer peripheral surface of the power transmission body 3. As a result, the child gear 25 rotates clockwise, and the rotation of the holding member 18
When the taper member 21 is eccentrically rotated in conjunction with, the substrate W is rotated by the engagement pin 22 of each holding member 18.
Held in.
【0032】基板Wの保持状態を解除するには、上記親
歯車26を図示しない解除機構によってばね28の付勢
力に抗して時計方向に回転させる。具体的には、上記解
除機構によって親歯車26が回転するのを阻止し、その
状態で回転体11を制御モータ4によって時計方向に回
転させる。それによって、保持部材18は反時計方向に
回転するから、係合ピン22による基板Wの保持状態が
解除されることになる。To release the holding state of the substrate W, the master gear 26 is rotated in the clockwise direction against the urging force of the spring 28 by a release mechanism (not shown). Specifically, the release mechanism prevents the parent gear 26 from rotating, and in this state, the rotating body 11 is rotated clockwise by the control motor 4. As a result, the holding member 18 rotates counterclockwise, and the holding state of the substrate W by the engagement pin 22 is released.
【0033】上記動力伝達体3の内部には、保持筒31
がこの動力伝達体3の回転の影響を受けることのない状
態で挿通されている。この保持筒31の上端にはノズル
ヘッド32が取着されている。このノズルヘッド32の
上面にはすり鉢状の凹部32aが形成されている。この
凹部32aには、回転体11に保持された基板Wの下面
中心部に向けて所定の角度で処理液を噴射する複数の処
理液ノズル孔33と、窒素ガスやアルゴンガスのような
気体を上記基板Wの中心部の真下からほぼ垂直に噴射す
る気体ノズル孔34とが先端を開口させて形成されてい
る。A holding cylinder 31 is provided inside the power transmission body 3.
Are inserted without being affected by the rotation of the power transmission body 3. A nozzle head 32 is attached to the upper end of the holding cylinder 31. A mortar-shaped recess 32 a is formed on the upper surface of the nozzle head 32. A plurality of processing liquid nozzle holes 33 for injecting the processing liquid at a predetermined angle toward the center of the lower surface of the substrate W held by the rotating body 11 and a gas such as nitrogen gas or argon gas are provided in the recess 32a. A gas nozzle hole 34 for jetting substantially vertically from directly below the center of the substrate W is formed with its tip open.
【0034】上記処理液ノズル孔33と気体ノズル孔3
4の基端には、それぞれこれらノズル孔に処理液および
気体を供給する処理液供給管36と気体供給管37の一
端が接続されている。これら各供給管36,37は上記
保持筒31内を通されて外部に導出され、他端は図示し
ない処理液供給タンクおよび気体供給タンクに接続され
ている。The treatment liquid nozzle hole 33 and the gas nozzle hole 3
To the base ends of the nozzles 4, one ends of a processing liquid supply pipe 36 and a gas supply pipe 37 for supplying the processing liquid and the gas to the nozzle holes are connected, respectively. These supply pipes 36 and 37 are passed through the inside of the holding cylinder 31 and led out to the outside, and the other ends are connected to a processing liquid supply tank and a gas supply tank (not shown).
【0035】上記回転体11の上面および外周面は、撥
水性と耐熱性を有する合成樹脂、たとえば塩化ビニール
や弗素系の合成樹脂などによって形成された乱流防止カ
バー41によって覆われている。この乱流防止カバー4
1は、回転体11に保持される基板Wの下面に僅かな隙
間を介して対向する対向壁部42と、この対向壁部42
の周縁部に垂設された周壁部43とをする。The upper surface and the outer peripheral surface of the rotating body 11 are covered with a turbulent flow prevention cover 41 formed of a synthetic resin having water repellency and heat resistance, such as vinyl chloride or a fluorine series synthetic resin. This turbulence prevention cover 4
Reference numeral 1 denotes a facing wall portion 42 facing the lower surface of the substrate W held by the rotating body 11 with a slight gap therebetween, and the facing wall portion 42.
And a peripheral wall portion 43 vertically provided on the peripheral edge portion.
【0036】上記対向壁部42には、処理液ノズル孔3
3および気体ノズル孔34から噴射される処理液および
気体を基板Wの下面に到達させるための通孔44が形成
されている。The processing liquid nozzle hole 3 is formed in the facing wall portion 42.
3 and the through hole 44 for allowing the processing liquid and the gas jetted from the gas nozzle hole 34 to reach the lower surface of the substrate W.
【0037】上記回転体11の上面に立設された4本の
保持部材18の上端部は、上記乱流防止カバー41の対
向壁部42に穿設された通孔44aからその上面側に突
出している。The upper ends of the four holding members 18 erected on the upper surface of the rotating body 11 project from the through holes 44a formed in the opposing wall portion 42 of the turbulence prevention cover 41 to the upper surface side thereof. ing.
【0038】また、回転体11の上方には、下面と同
様、基板Wに洗浄液を噴射する上部洗浄液ノズル45お
よび乾燥気体を供給するクリーンユニット(図示せず)
が配置されている。Further, above the rotating body 11, similarly to the lower surface, an upper cleaning liquid nozzle 45 for injecting the cleaning liquid onto the substrate W and a clean unit (not shown) for supplying a dry gas.
Are arranged.
【0039】基板Wを回転体11に保持し、この回転体
11を数十〜数百r.p.mの低速度で回転させなが
ら、基板Wの上面と下面とに上部洗浄ノズル45と処理
液ノズル孔33より洗浄液を供給する。洗浄液を所定時
間供給したならば、その供給を停止し、次いで回転体1
1を1000r.p.m以上の高速度で回転させるとと
もに気体ノズル孔34から基板Wの下面に向けて気体を
噴射する。The substrate W is held on the rotating body 11, and the rotating body 11 is tens to hundreds of r.s.r. p. While rotating at a low speed of m, the cleaning liquid is supplied to the upper surface and the lower surface of the substrate W from the upper cleaning nozzle 45 and the processing liquid nozzle hole 33. After supplying the cleaning liquid for a predetermined time, the supply is stopped, and then the rotating body 1
1 to 1000 r. p. The gas is jetted from the gas nozzle holes 34 toward the lower surface of the substrate W while rotating at a high speed of m or more.
【0040】それによって、基板Wの上下面に付着した
洗浄液は、この基板Wが回転体11によって高速回転さ
せられることで発生する遠心力と気体ノズル孔から噴射
される気体とによって基板Wの径方向外方へ流れ、その
外周縁から飛散するから、基板Wの上下面が乾燥処理さ
れることになる。As a result, the cleaning liquid deposited on the upper and lower surfaces of the substrate W has a diameter of the substrate W that is generated by the centrifugal force generated when the substrate W is rotated at a high speed by the rotating body 11 and the gas ejected from the gas nozzle holes. Since it flows outward in the direction and scatters from the outer peripheral edge, the upper and lower surfaces of the substrate W are dried.
【0041】上記回転体11の上面側は乱流防止カバー
41によって覆われ、その対向壁部42の上面と回転体
11に保持された基板Wの下面との間には所定間隔の隙
間が形成される。そのため、基板Wを乾燥する際、回転
体11を高速回転させると、上記対向壁部42の上面と
基板Wの下面とがなす隙間には気体ノズル孔34から噴
射される気体が基板Wの下面中心部から径方向外方に沿
って層状に流れるため、基板Wの下面側に乱流が生じる
のが抑制されることになる。The upper surface side of the rotating body 11 is covered with a turbulent flow prevention cover 41, and a gap of a predetermined distance is formed between the upper surface of the opposing wall portion 42 and the lower surface of the substrate W held by the rotating body 11. To be done. Therefore, when the rotating body 11 is rotated at a high speed when the substrate W is dried, the gas jetted from the gas nozzle holes 34 is injected into the lower surface of the substrate W in the gap between the upper surface of the facing wall portion 42 and the lower surface of the substrate W. Since it flows in a layered manner from the center portion outward in the radial direction, turbulent flow is suppressed from being generated on the lower surface side of the substrate W.
【0042】つまり、基板Wの乾燥処理時に、基板Wか
ら飛散した処理液がカップ体1内にミストとなって浮遊
していても、基板Wの下面側に入り込んでその下面に付
着するのを防止することができる。That is, during the drying process of the substrate W, even if the processing liquid scattered from the substrate W becomes a mist and floats in the cup body 1, it does not enter the lower surface side of the substrate W and adhere to the lower surface thereof. Can be prevented.
【0043】上記ノズルヘッド32の外周面には、径方
向外方に向かって延出された円盤状の取付け部51が一
体形成されている。この取付け部51の上面は、上記回
転体11に設けられた乱流防止カバー41の対向壁部4
2の下面に対向している。取付け部51の上面には加熱
手段としての面状の電熱ヒータ52が設けられている。On the outer peripheral surface of the nozzle head 32, a disc-shaped mounting portion 51 extending outward in the radial direction is integrally formed. The upper surface of the mounting portion 51 has an opposing wall portion 4 of the turbulent flow prevention cover 41 provided on the rotating body 11.
It faces the lower surface of 2. A planar electric heater 52 as a heating means is provided on the upper surface of the mounting portion 51.
【0044】上記電熱ヒータ52は、たとえばセラミッ
クヒータやラバーヒータなどが用いられている。電熱ヒ
ータ52は、上記取付け部51の全面に設けてもよい
が、周方向に沿って部分的に設けてもよく、その点は限
定されるものでない。As the electric heater 52, for example, a ceramic heater or a rubber heater is used. The electric heater 52 may be provided on the entire surface of the attachment portion 51, but may be provided partially along the circumferential direction, and the point is not limited.
【0045】上記電熱ヒータ52は図示しない制御装置
によって給電が制御される。電熱ヒータ52が給電され
ることで発熱すると、その熱によって上記乱流防止カバ
ー41の対向壁部41が加熱される。それによって、基
板Wを処理液によって処理した後、上記対向壁部41の
上面に付着残留する処理液が加熱乾燥されることにな
る。Power supply to the electric heater 52 is controlled by a controller (not shown). When the electrothermal heater 52 is heated to generate heat, the heat heats the facing wall portion 41 of the turbulent flow prevention cover 41. As a result, after the substrate W is treated with the treatment liquid, the treatment liquid remaining on the upper surface of the opposed wall portion 41 is heated and dried.
【0046】上記電熱ヒータ52による乱流防止カバー
41の加熱乾燥は、回転体11を高速度で回転させて行
なう基板Wの乾燥処理が終了する前に、終了するよう加
熱開始時間や加熱温度などの加熱条件が設定される。The heating and drying of the turbulent flow prevention cover 41 by the electric heater 52 is completed before the drying process of the substrate W performed by rotating the rotating body 11 at a high speed is completed. Heating conditions are set.
【0047】このような構成のスピン処理装置によれ
ば、回転体11に乱流防止カバー41を設け、この回転
体11に保持された基板Wの下面に乱流が生じるのを防
止している。そのため、基板Wを処理液によって処理し
た後、乾燥処理する場合、乱流防止カバー41の上面に
処理液が付着残留し、乾燥処理の終了間際にその処理液
が飛散して基板Wの下面に付着して乾燥されずに残留
し、基板Wの汚れやウオータマークの発生を招く原因に
なる虞がある。According to the spin processing apparatus having such a structure, the turbulent flow prevention cover 41 is provided on the rotating body 11 to prevent the turbulent flow from being generated on the lower surface of the substrate W held by the rotating body 11. . Therefore, when the substrate W is treated with the treatment liquid and then dried, the treatment liquid adheres to and remains on the upper surface of the turbulent flow prevention cover 41, and the treatment liquid scatters near the end of the drying process to the lower surface of the substrate W. There is a risk that the particles will adhere and remain without being dried, causing contamination of the substrate W and generation of watermarks.
【0048】しかしながら、乾燥処理時には基板Wの下
面に対向する乱流防止カバー41の対向壁部42は、ノ
ズルヘッド32の取付け部51に設けられたヒータ52
によって加熱される。それによって、対向壁部42の上
面に付着残留した処理液が乾燥除去される。However, the opposing wall portion 42 of the turbulent flow prevention cover 41 that faces the lower surface of the substrate W during the drying process has the heater 52 provided on the mounting portion 51 of the nozzle head 32.
Heated by. As a result, the processing liquid remaining on the upper surface of the facing wall portion 42 is removed by drying.
【0049】ヒータ52による乱流防止カバー41の加
熱乾燥は、基板Wの乾燥処理よりも速く終了するよう上
記ヒータ52による乱流防止カバー41の加熱条件が設
定されている。The heating condition of the turbulent flow prevention cover 41 by the heater 52 is set so that the heating and drying of the turbulent flow prevention cover 41 by the heater 52 is completed faster than the drying process of the substrate W.
【0050】それによって、基板Wの乾燥処理が終了す
る時点では、乱流防止カバー41に処理液が付着残留す
るということがないから、基板Wの乾燥処理の終了間際
に回転体11とともに回転する乱流防止カバー41から
処理液が飛散して基板Wに再付着し、汚れやウオータマ
ークの発生原因になるのを防止できる。As a result, at the time when the drying process of the substrate W is completed, the processing liquid does not remain attached to the turbulent flow prevention cover 41, so that the substrate W rotates together with the rotating body 11 just before the completion of the drying process. It is possible to prevent the processing liquid from scattering from the turbulent flow prevention cover 41 and reattaching to the substrate W, which may cause stains or watermarks.
【0051】図3はこの発明の第2の実施の形態を示
す。この第2の実施の形態は、ノズルヘッド32に取付
け部51を設けず、乱流防止カバー41の対向壁部42
の下面にヒータ52を設けるようにしている。FIG. 3 shows a second embodiment of the present invention. In the second embodiment, the nozzle head 32 is not provided with the mounting portion 51, and the opposing wall portion 42 of the turbulent flow prevention cover 41 is provided.
A heater 52 is provided on the lower surface of the.
【0052】上記乱流防止カバー41は回転体11とと
もに回転する。そのため、対向壁部42に設けたヒータ
52への給電は、詳細は図示しないが、たとえば制御モ
ータ4の回転子6を介してスリップリングにより行なう
ようにすればよい。The turbulent flow prevention cover 41 rotates together with the rotating body 11. Therefore, although not shown in detail, power supply to the heater 52 provided on the facing wall portion 42 may be performed by a slip ring via the rotor 6 of the control motor 4, for example.
【0053】図4はこの発明の第3の実施の形態を示
す。この第3の実施の形態は、ノズルヘッド32には取
付け部51が設けられ、この取付け部51には電磁石あ
るいは永久磁石などの複数の磁石61が周方向に所定間
隔で、しかも周方向において隣り合う磁石61の極性が
異なるように設けられている。FIG. 4 shows a third embodiment of the present invention. In the third embodiment, a mounting portion 51 is provided on the nozzle head 32, and a plurality of magnets 61 such as electromagnets or permanent magnets are arranged at predetermined intervals in the circumferential direction and are adjacent to each other in the circumferential direction. The matching magnets 61 are provided so as to have different polarities.
【0054】一方、乱流防止カバー41の対向壁部42
の下面には複数のコイル62が周方向に所定間隔で設け
られている。On the other hand, the facing wall portion 42 of the turbulent flow prevention cover 41
A plurality of coils 62 are provided on the lower surface of the coil 62 at predetermined intervals in the circumferential direction.
【0055】したがって、回転体11が回転駆動される
と、乱流防止カバー41に設けられた各コイル62に極
性の異なる磁石61が順次対向し、上記コイル62が電
磁誘導によって発熱するから、このコイル62が設けら
れて乱流防止カバー41の対向壁部42が加熱されるこ
とになる。Therefore, when the rotating body 11 is driven to rotate, the magnets 61 having different polarities sequentially face the coils 62 provided on the turbulent flow prevention cover 41, and the coils 62 generate heat by electromagnetic induction. The coil 62 is provided to heat the opposing wall portion 42 of the turbulent flow prevention cover 41.
【0056】つまり、この第3の実施の形態では、磁石
61とコイル62とによって加熱手段を構成している。That is, in the third embodiment, the heating means is composed of the magnet 61 and the coil 62.
【0057】この第3の実施の形態において、コイル6
2を発熱させる代わりに、コイル62に発熱線を接続
し、コイルに生じる電流で発熱線だけを発熱させるよう
にしてもよい。In the third embodiment, the coil 6
Instead of heating the coil 2, a heating wire may be connected to the coil 62 so that only the heating wire is heated by the current generated in the coil.
【0058】この発明の加熱手段としては、上記各実施
の形態だけに限定されず、他の手段によって乱流防止カ
バー41を加熱するようにしてもよい。たとえば、図示
しないがノズルヘッド32が設けられた保持筒31を通
じて乱流防止カバー41の下面側に温風を噴射させ、こ
の温風によって乱流防止カバー41の対向壁部2を加熱
するようにしてもよい。The heating means of the present invention is not limited to the above-mentioned respective embodiments, but the turbulent flow prevention cover 41 may be heated by other means. For example, although not shown, warm air is jetted to the lower surface side of the turbulence prevention cover 41 through the holding cylinder 31 provided with the nozzle head 32, and the hot air blows the opposing wall portion 2 of the turbulence prevention cover 41. May be.
【0059】[0059]
【発明の効果】以上のようにこの発明によれば、基板を
洗浄処理した後の乾燥処理時に、回転体に設けられた乱
流防止カバーを加熱するようにした。As described above, according to the present invention, the turbulent flow prevention cover provided on the rotor is heated during the drying process after the substrate is washed.
【0060】そのため、基板の洗浄処理を行なうこと
で、乱流防止カバーの上面に処理液が付着残留していて
も、その処理液は上記基板の乾燥処理時に加熱乾燥され
るため、乾燥処理の終了間際に、乱流防止カバーから処
理液が飛散して基板の下面に再付着するのを防止するこ
とができる。Therefore, by performing the cleaning process on the substrate, even if the processing liquid remains on the upper surface of the turbulent flow prevention cover, the processing liquid is heated and dried during the drying process of the substrate. It is possible to prevent the processing liquid from scattering from the turbulence prevention cover and reattaching to the lower surface of the substrate immediately before the end.
【図1】この発明の第1の実施の形態に係るスピン処理
装置の概略的構成を示す断面図。FIG. 1 is a sectional view showing a schematic configuration of a spin processing apparatus according to a first embodiment of the present invention.
【図2】ヒータが設けられた取付け部の平面図。FIG. 2 is a plan view of a mounting portion provided with a heater.
【図3】この発明の第2の実施の形態を示すヒータの取
付け構造の概略的構成を示す断面図。FIG. 3 is a cross-sectional view showing a schematic configuration of a heater mounting structure according to a second embodiment of the present invention.
【図4】この発明の第3の実施の形態を示す加熱手段の
構成図。FIG. 4 is a configuration diagram of heating means showing a third embodiment of the present invention.
11…回転体 32…ノズルヘッド 33…処理液ノズル孔 34…気体ノズル孔 41…乱流防止カバー 42…対向壁部 51…取付け部 52…ヒータ(加熱手段) 11 ... Rotating body 32 ... Nozzle head 33 ... Treatment liquid nozzle hole 34 ... Gas nozzle hole 41 ... Turbulent flow prevention cover 42 ... Opposing wall 51 ... Mounting part 52 ... Heater (heating means)
Claims (5)
置において、 回転駆動されるとともに上記基板を着脱可能に保持する
回転体と、 上記基板の下面側に対向して回転不能に配置されこの基
板の下面に処理液を噴射するノズル孔を有するノズルヘ
ッドと、 上記回転体と一体的に設けられこの回転体に保持された
上記基板の下面に所定の間隔で離間対向する対向壁部を
有する乱流防止カバーと、 この乱流防止カバーを加熱しその対向壁部の上面に残留
する処理液を乾燥させる加熱手段とを具備したことを特
徴とするスピン処理装置。1. A spin processing apparatus for processing a substrate by rotating the substrate, the rotating body being rotationally driven and detachably holding the substrate, and the non-rotatably arranged facing the lower surface side of the substrate. A nozzle head having a nozzle hole for injecting a processing liquid on the lower surface of the substrate, and a disturbance having an opposing wall portion provided integrally with the rotating body and opposed to the lower surface of the substrate held by the rotating body at a predetermined interval. A spin processing apparatus comprising: a flow prevention cover; and heating means for heating the turbulence prevention cover to dry the processing liquid remaining on the upper surface of the opposing wall portion.
ーの対向壁部の下面に対向する取付け部が設けられ、こ
の取付け部に上記加熱手段が設けられていることを特徴
とする請求項1記載のスピン処理装置。2. The nozzle head is provided with a mounting portion facing the lower surface of the facing wall portion of the turbulent flow prevention cover, and the heating means is provided in the mounting portion. The spin processing apparatus described.
対向壁部の下面に設けられていることを特徴とする請求
項1記載のスピン処理装置。3. The spin processing apparatus according to claim 1, wherein the heating means is provided on a lower surface of a facing wall portion of the turbulent flow prevention cover.
基板の下面側に乱流が発生するのを防止する乱流防止カ
バーを有する回転体によって上記基板を回転させながら
処理するスピン処理方法において、 上記基板を低速度で回転させながら下面を処理液によっ
て処理する工程と、 処理液による処理時に比べて上記基板を高速度で回転さ
せて乾燥処理する工程と、 上記基板を乾燥処理する際に上記乱流防止カバーを加熱
してこの乱流防止カバーの上面に付着残留する処理液を
乾燥させる工程とを具備したことを特徴とするスピン処
理方法。4. A spin processing method in which a substrate is detachably held and is processed while rotating the substrate by a rotating body having a turbulent flow prevention cover for preventing turbulent flow from being generated on the lower surface side of the substrate, A step of treating the lower surface with the treatment liquid while rotating the substrate at a low speed; a step of rotating the substrate at a higher speed than the treatment with the treatment liquid to perform a drying treatment; and a step of performing a drying treatment on the substrate. And a step of heating the turbulent flow prevention cover to dry the treatment liquid adhering to and remaining on the upper surface of the turbulent flow prevention cover.
燥処理を、上記基板の乾燥処理が終了する前に終了させ
ることを特徴とする請求項4記載のスピン処理方法。5. The spin processing method according to claim 4, wherein the drying process performed by heating the turbulent flow prevention cover is finished before the drying process of the substrate is finished.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001374571A JP4050505B2 (en) | 2001-12-07 | 2001-12-07 | Spin processing apparatus and processing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001374571A JP4050505B2 (en) | 2001-12-07 | 2001-12-07 | Spin processing apparatus and processing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003174008A true JP2003174008A (en) | 2003-06-20 |
| JP4050505B2 JP4050505B2 (en) | 2008-02-20 |
Family
ID=19183116
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001374571A Expired - Fee Related JP4050505B2 (en) | 2001-12-07 | 2001-12-07 | Spin processing apparatus and processing method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007049921A1 (en) * | 2005-10-26 | 2007-05-03 | Semes Co., Ltd. | Spin chuck |
| JP2011086659A (en) * | 2009-10-13 | 2011-04-28 | Sumco Corp | Spin cleaner |
| KR20140026307A (en) * | 2012-08-23 | 2014-03-05 | 램 리서치 아게 | Method and appratus for liquid treatment of wafer shaped articles |
| CN109791885A (en) * | 2016-09-23 | 2019-05-21 | 株式会社斯库林集团 | Substrate processing equipment |
-
2001
- 2001-12-07 JP JP2001374571A patent/JP4050505B2/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007049921A1 (en) * | 2005-10-26 | 2007-05-03 | Semes Co., Ltd. | Spin chuck |
| JP2011086659A (en) * | 2009-10-13 | 2011-04-28 | Sumco Corp | Spin cleaner |
| TWI460764B (en) * | 2009-10-13 | 2014-11-11 | Sumco Corp | Rotary cleaning device |
| KR20140026307A (en) * | 2012-08-23 | 2014-03-05 | 램 리서치 아게 | Method and appratus for liquid treatment of wafer shaped articles |
| JP2014042027A (en) * | 2012-08-23 | 2014-03-06 | Lam Research Ag | Method and apparatus for liquid treatment of wafer shaped articles |
| KR102096672B1 (en) * | 2012-08-23 | 2020-04-03 | 램 리서치 아게 | Method and appratus for liquid treatment of wafer shaped articles |
| CN109791885A (en) * | 2016-09-23 | 2019-05-21 | 株式会社斯库林集团 | Substrate processing equipment |
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