JP2003149005A - Light receiving / emitting composite unit and displacement detection device using the same - Google Patents
Light receiving / emitting composite unit and displacement detection device using the sameInfo
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- JP2003149005A JP2003149005A JP2001342860A JP2001342860A JP2003149005A JP 2003149005 A JP2003149005 A JP 2003149005A JP 2001342860 A JP2001342860 A JP 2001342860A JP 2001342860 A JP2001342860 A JP 2001342860A JP 2003149005 A JP2003149005 A JP 2003149005A
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- light
- receiving
- unit
- light receiving
- light emitting
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- Polarising Elements (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Abstract
(57)【要約】
【課題】 低価格で小型、軽量化に適した信頼性の高い
受発光複合ユニット及び当該ユニットを用いた変位検出
装置を提供する。
【解決手段】 受発光複合ユニット1において、発光素
子3aを含む光源3と、ユニットへの戻り光に対する光
分岐部4と、レンズ8_1乃至8_3と、偏光分離用の
回折光学素子5_1、5_2と、回折光を検出するため
の受光素子6_1乃至6_4を含む受光部6とを一体構
造で形成する。そして、このユニット1に対する外部光
学系ETとして、反射型回折格子RGを含む被検部と、
ユニット1から出射された光を反射型回折格子RGに向
けて反射させるための反射部材R1a、R1bと、反射
型回折格子RGによる回折光を受けて偏光状態を変える
ための偏光部材WP1a、WP1bと、各偏光部材を通
った光を反射させて戻すための反射部材R2a、R2b
とを配置して、格子干渉型の変位検出装置を構成する。
(57) [Problem] To provide a low-cost, high-reliability light receiving / emitting composite unit suitable for reduction in size and weight, and a displacement detection device using the unit. SOLUTION: In the composite light receiving and emitting unit 1, a light source 3 including a light emitting element 3a, a light branching unit 4 for returning light to the unit, lenses 8_1 to 8_3, diffraction optical elements 5_1 and 5_2 for polarization separation, The light receiving unit 6 including the light receiving elements 6_1 to 6_4 for detecting the diffracted light is formed as an integral structure. And, as an external optical system ET for the unit 1, a test portion including a reflection type diffraction grating RG,
Reflecting members R1a and R1b for reflecting the light emitted from the unit 1 toward the reflective diffraction grating RG, and polarizing members WP1a and WP1b for receiving the diffracted light from the reflective grating RG and changing the polarization state. Reflection members R2a and R2b for reflecting and returning light passing through each polarizing member
Are arranged to constitute a grating interference type displacement detecting device.
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体レーザーを
光源とし偏光を用いて信号を得る光学ユニットに関する
ものであり、特に、回折光による干渉を用いて変位を検
出する所謂「格子干渉型変位検出装置」の構造に関する
ものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical unit that uses a semiconductor laser as a light source and obtains a signal by using polarized light. In particular, it is a so-called "lattice interference type displacement detection" that detects displacement by using interference of diffracted light. It relates to the structure of the device.
【0002】[0002]
【従来の技術】半導体製造等の分野で使用される変位検
出装置には、例えば、目盛を記録した固体スケールと、
当該スケールの直線的な移動方向における変位量を電気
的に検出する検出手段を備えた装置(所謂リニアエンコ
ーダ)が知られている。2. Description of the Related Art Displacement detecting devices used in the field of semiconductor manufacturing include, for example, a solid scale having a graduation recorded,
There is known a device (so-called linear encoder) including a detection unit that electrically detects a displacement amount of the scale in a linear movement direction.
【0003】高精度、高分解能の検出を可能にするため
の装置として、回折格子により得られた回折光の干渉を
利用して変位を検出する装置(ホログラムエンコーダ
等)が挙げられる。A device (a hologram encoder or the like) for detecting displacement by utilizing interference of diffracted light obtained by a diffraction grating is given as a device for enabling detection with high accuracy and high resolution.
【0004】図4は、従来の変位検出装置の構成につい
て一例aを示したものであり、光照射部b、光路制御及
び被検部c、受光部dの3つの部分から構成されてい
る。FIG. 4 shows an example a of the structure of a conventional displacement detecting device, which is composed of three parts: a light irradiation part b, an optical path control and inspection part c, and a light receiving part d.
【0005】光照射部bでは、光源として半導体レーザ
ーLSが使用され、第1の収束レンズL1、第1の偏光
ビームスプリッターPBS1が配置されている。そし
て、光路制御及び被検部cに関しては、第1の反射ミラ
ーR1a、R1b、反射型回折格子RG、第2の収束レ
ンズL2a、L2b、第1のλ/4波長板(4分の1波
長板)WP1a、WP1b、さらには第2の反射ミラー
R2a、R2bが配置されている。In the light irradiation section b, a semiconductor laser LS is used as a light source, and a first converging lens L1 and a first polarization beam splitter PBS1 are arranged. Regarding the optical path control and the portion to be inspected c, the first reflection mirrors R1a and R1b, the reflection type diffraction grating RG, the second converging lenses L2a and L2b, the first λ / 4 wavelength plate (quarter wavelength). Plates WP1a and WP1b, and second reflecting mirrors R2a and R2b are arranged.
【0006】受光部dについては、半透過ミラーHM、
第2の偏光ビームスプリッターPBS2、第3の偏光ビ
ームスプリッターPBS3、第2のλ/4波長板WP
2、そして、光検出器PD1〜4が配置されている。Regarding the light receiving section d, a semi-transmissive mirror HM,
Second polarization beam splitter PBS2, third polarization beam splitter PBS3, second λ / 4 wave plate WP
2, and photodetectors PD1 to PD4 are arranged.
【0007】半導体レーザーLSから出射した光は第1
の収束レンズL1で収束光になった後、偏光ビームスプ
リッターPBS1により偏光分離されて2つの光(光束
LFa、LFbを参照。)となり、その一方が反射ミラ
ーR1aにより光路変更を受けて反射型回折格子RGに
到達し、他方が反射ミラーR1bにより光路変更を受け
て反射型回折格子RGに到達する。尚、ここで「偏光分
離」とは、入射光束をP偏光成分とS偏光成分に分離す
ることを意味する。The light emitted from the semiconductor laser LS is the first
After being converted into convergent light by the converging lens L1, the light is polarized and separated by the polarization beam splitter PBS1 into two lights (refer to the light beams LFa and LFb), one of which is subjected to the optical path change by the reflection mirror R1a to undergo the reflection-type diffraction. It reaches the grating RG, and the other reaches the reflection type diffraction grating RG after undergoing an optical path change by the reflection mirror R1b. Here, "polarization separation" means to separate the incident light beam into a P polarization component and an S polarization component.
【0008】被検部(リニアスケール等)に付設された
反射型回折格子RGにおいて、同一符号(正負が同じ)
とされる少なくとも1次より高次の回折をしたそれぞれ
の光束については、第2の収束レンズL2a、L2bを
それぞれ経てから、回折角に対応した角度位置に配置さ
れたλ/4波長板WP1a、WP1bと反射ミラーR2
a、R2bによりそれぞれの偏光方向が90度回転され
た後で、往路と同じ光路を逆方向に辿って第1の偏光ビ
ームスプリッターPBS1に達する。In the reflection type diffraction grating RG attached to the portion to be inspected (linear scale, etc.), the same sign (the same sign)
For each light beam diffracted at least higher than the first order, the λ / 4 wave plate WP1a arranged at the angular position corresponding to the diffraction angle after passing through the second converging lenses L2a and L2b, WP1b and reflection mirror R2
After the respective polarization directions are rotated by 90 degrees by a and R2b, they reach the first polarization beam splitter PBS1 by following the same optical path as the forward path in the opposite direction.
【0009】偏光ビームスプリッターPBS1に達した
光は、各々がその偏光方向を元の方向に対して90度回
転した状態となっているため、往路での入射方向とは異
なる方向に出射されて半透過ミラーHMに向かう。そし
て、半透過ミラーHMに達した光束については光量が2
分され、分かれた光の一方が偏光ビームスプリッターP
BS3に達し、他方の光がλ/4波長板WP2を通過し
た後に偏光ビームスプリッターPBS2に達する。Since the light reaching the polarization beam splitter PBS1 is in a state in which its polarization direction is rotated by 90 degrees with respect to the original direction, the light is emitted in a direction different from the incident direction on the outward path and is half emitted. It goes to the transmission mirror HM. The light amount of the light flux reaching the semi-transmissive mirror HM is 2
One of the split and split lights is the polarization beam splitter P
It reaches BS3, and the other light reaches the polarization beam splitter PBS2 after passing through the λ / 4 wave plate WP2.
【0010】尚、偏光ビームスプリッターPBS3の取
付姿勢に関しては、その光軸を中心に、到達した光束の
偏光方向に対し約45度の角度をもって光軸回りに回転
された配置とされている。With respect to the mounting posture of the polarization beam splitter PBS3, the polarization beam splitter PBS3 is arranged so that it is rotated around the optical axis with an angle of about 45 degrees with respect to the polarization direction of the reaching light beam.
【0011】偏光ビームスプリッターPBS2で偏光分
離された光束については、光検出器PD1やPD2にそ
れぞれ到達し、光強度が電気量に変換される。また、偏
光ビームスプリッターPBS3で偏光分離された光束に
ついては光検出器PD3やPD4にそれぞれ到達し、光
強度が電気量に変換される。The light beams polarized and separated by the polarization beam splitter PBS2 reach the photodetectors PD1 and PD2, respectively, and the light intensity is converted into an electric quantity. The light beams polarized and separated by the polarization beam splitter PBS3 reach the photodetectors PD3 and PD4, respectively, and the light intensity is converted into an electric quantity.
【0012】本例の動作原理は、以下の通りである。The operating principle of this example is as follows.
【0013】偏光ビームスプリッターPBS1で分離さ
れた、異なる偏光方向(あるいは偏光状態)をもつ2つ
の光束LFa、LFbについて、反射型回折格子RGで
反射回折することにより同一符号の回折光となるととも
に、λ/4波長板WP1a、WP1b及び反射ミラーR
2a、R2bにより、往路とは偏光方向が略90度回転
した光束として偏光ビームスプリッターPBS1に戻さ
れて混合される。Two light beams LFa and LFb having different polarization directions (or polarization states) separated by the polarization beam splitter PBS1 are reflected and diffracted by the reflection type diffraction grating RG to become diffracted light of the same sign, and λ / 4 wave plates WP1a, WP1b and reflection mirror R
By 2a and R2b, a light beam whose polarization direction is rotated by about 90 degrees from the forward path is returned to the polarization beam splitter PBS1 and mixed.
【0014】その際、混合された2つの光束は、同一の
偏光成分をもつ半導体レーザーLSから2分されたもの
であることから、両者の光は異なる偏光方向であっても
干渉を生じる。At this time, since the two mixed light fluxes are bisected by the semiconductor laser LS having the same polarization component, the two lights interfere with each other even if they have different polarization directions.
【0015】今、反射型回折格子RGを、他の光学系と
相対的に格子の並ぶ方向(例えば、図4に矢印Aで示す
方向)に移動させると、偏光ビームスプリッターPBS
1で混合された光は互いに干渉し、偏光方向ごとに回折
次数に応じたピッチで強度変化が発生する。この干渉に
よる強度変化を複数の偏光成分に分離することにより、
光検出器PD1〜4では互いに位相の異なる光強度分布
として検出できる。つまり、この光強度変化を検波する
ことで、回折格子ピッチに対して回折次数の逆数と回折
回数の逆数に2分の1を乗じた分解能をもって、反射型
回折格子RGの移動量を検出することができる。さらに
光検出器PD1〜4で得られる強度変化は正弦波にきわ
めて近い形状となるため、検出波形を内挿分割する方法
により高い分解能を得ることも可能である。Now, when the reflection type diffraction grating RG is moved in the direction in which the gratings are arranged relatively to other optical systems (for example, the direction indicated by arrow A in FIG. 4), the polarization beam splitter PBS is used.
The lights mixed in 1 interfere with each other, and an intensity change occurs at a pitch according to the diffraction order for each polarization direction. By separating the intensity change due to this interference into multiple polarization components,
The photodetectors PD1 to PD4 can detect light intensity distributions having different phases. That is, by detecting this change in light intensity, the movement amount of the reflection type diffraction grating RG can be detected with a resolution obtained by multiplying the reciprocal number of the diffraction order and the reciprocal number of the diffraction number with respect to the diffraction grating pitch by one half. You can Further, since the intensity changes obtained by the photodetectors PD1 to PD4 have a shape very close to a sine wave, it is possible to obtain high resolution by the method of interpolating the detected waveform.
【0016】このような回折光の干渉を用いた変位検出
装置において、例えば、反射型回折格子をホログラム等
で作成し、さらに得られた正弦波信号を分割することで
nm(ナノメートル)オーダーの分解能を実現すること
も可能である。In such a displacement detecting device using interference of diffracted light, for example, a reflection type diffraction grating is formed by a hologram or the like, and the obtained sine wave signal is divided to obtain nm (nanometer) order. It is also possible to achieve resolution.
【0017】[0017]
【発明が解決しようとする課題】しかしながら、従来の
変位検出装置にあっては、その製造工程において、単独
に製作された発光部品や受光部品、あるいは光学部品を
個々に調整しながら組み立てる必要性から、下記に示す
問題があった。However, in the conventional displacement detecting device, it is necessary to assemble the individually manufactured light emitting components, light receiving components, or optical components while individually adjusting them in the manufacturing process. , There was a problem shown below.
【0018】・装置の組み立てに際し、各部品の仕上が
り精度あるいは特性のバラツキに対して精密な調整を必
要とするため、複雑な工程を余儀なくされ、低価格化が
困難であること。When assembling the apparatus, it is necessary to make a precise adjustment for variations in finishing accuracy or characteristics of each part, which complicates the process and makes it difficult to reduce the cost.
【0019】・各部品の調整や締結及び固定に大きなス
ペースを必要とすること、そのために、機器の形状を小
型化することが困難であること。A large space is required for adjusting, fastening and fixing each component, and it is difficult to reduce the shape of the device.
【0020】・精密調整後の本固定に接着剤を使用しな
ければならないので、接着状態が周囲の環境変化等に左
右され易く、また、環境変化や経時変化に起因する調整
部のズレが発生する虞があること。Since the adhesive must be used for the main fixing after the precise adjustment, the adhesion state is easily influenced by the surrounding environment change, etc., and the adjustment part is displaced due to the environmental change or the change over time. There is a risk that
【0021】そこで、本発明は、低価格で小型化、軽量
化に適した信頼性の高い受発光複合ユニット及び当該ユ
ニットを搭載するとともに、回折光の干渉を利用した変
位検出装置を提供することを課題とする。Therefore, the present invention provides a highly reliable light emitting and receiving composite unit suitable for low cost, small size and light weight, and a displacement detecting device using the interference of diffracted light while mounting the unit. Is an issue.
【0022】[0022]
【課題を解決するための手段】本発明に係る受発光複合
ユニットは、上記した課題を解決するために、発光素子
と、当該発光素子から出射した出射光が外部光学系を通
ってユニットに戻ってきた戻り光を検出する複数の受光
素子とを、同一の基板又は部材上に配置するとともに、
戻り光に対する光分岐部(あるいはこれを内包する光分
岐部品)と、出射光及び戻り光に対する収束又は発散用
のレンズと、戻り光の偏光状態から任意方向の偏光成分
を分離して異なる方向に回折させるための回折部材を、
一体的に形成した構造を有するものである。In order to solve the above-mentioned problems, a light emitting / receiving composite unit according to the present invention returns a light emitting element and light emitted from the light emitting element to the unit through an external optical system. A plurality of light receiving elements for detecting the returned light are arranged on the same substrate or member,
An optical branching part for the returning light (or an optical branching part including the same), a lens for converging or diverging the outgoing light and the returning light, and a polarization component in an arbitrary direction is separated from the polarization state of the returning light to be directed in different directions. Diffraction member for diffracting,
It has an integrally formed structure.
【0023】また、本発明に係る変位検出装置は、この
ように一体構造をもって製造された受発光複合ユニット
と、当該ユニットに対する外部光学系として、回折格子
を含む被検部と、受発光複合ユニットから出射された後
の回折格子による回折光を受けて偏光状態を変えるため
の偏光部材と、当該偏光部材を通った光を反射させて逆
方向(回折格子に向かう方向)に戻すための反射部材と
を設けたものである。Further, the displacement detecting apparatus according to the present invention is such that the light emitting and receiving composite unit manufactured in such an integrated structure, the test portion including the diffraction grating as an external optical system for the unit, and the light receiving and emitting composite unit. A polarizing member for receiving the diffracted light after being emitted from the diffraction grating and changing the polarization state, and a reflecting member for reflecting the light passing through the polarizing member and returning it in the opposite direction (direction toward the diffraction grating). And are provided.
【0024】従って、本発明によれば、発光素子及び受
光素子、ユニットへの戻り光に対する光分岐部、レン
ズ、回折部材を一体構造にすることにより、各部の位置
調整が簡単になり、低価格化や小型化、軽量化に適した
信頼性の高い受発光複合ユニット及びこれを用いた変位
検出装置を製造することができる。Therefore, according to the present invention, the light emitting element, the light receiving element, the light branching portion for the returning light to the unit, the lens, and the diffractive member are integrally structured, so that the position adjustment of each portion becomes easy and the cost is low. It is possible to manufacture a highly reliable light emitting and receiving combined unit suitable for size reduction, size reduction, and weight reduction, and a displacement detection device using the same.
【0025】[0025]
【発明の実施の形態】図1は、本発明に係る受発光複合
ユニット(あるいは送受光ユニット)を用いた変位検出
装置の構成例を示したものであり、格子干渉型変位検出
装置に適用したものである。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a configuration example of a displacement detecting device using a light emitting and receiving combined unit (or a light transmitting and receiving unit) according to the present invention, which is applied to a grating interference type displacement detecting device. It is a thing.
【0026】図4との構成上の比較から分かるように、
光学系の構成部品の大半部が受発光複合ユニット1内に
収められており、当該ユニット内で偏光分離されてから
外部に出射した2つの光束LFa、LFbについては、
外部光学系ETを構成する第1の反射部材(反射鏡R1
a、R1b)にそれぞれ到達して光路変更を受ける。
尚、これら第1の反射部材は、受発光複合ユニット1か
ら出射された光を反射型回折格子RG、例えば、回折効
率の高いホログラム格子(体積型位相ホログラム等)に
向けて反射させるために必要なものである。As can be seen from the structural comparison with FIG.
Most of the components of the optical system are housed in the light emitting / receiving composite unit 1, and the two light beams LFa and LFb that have been polarized and separated in the unit and then emitted to the outside are as follows.
The first reflecting member (reflecting mirror R1) that constitutes the external optical system ET.
a, R1b) to reach the respective optical paths.
It should be noted that these first reflecting members are necessary for reflecting the light emitted from the combined light emitting and receiving unit 1 toward the reflection type diffraction grating RG, for example, the hologram grating having a high diffraction efficiency (volume phase hologram or the like). It is something.
【0027】リニアスケール等の被検出部に用いられる
反射型回折格子RGに到達する各光は、近い距離で当該
格子に投入され(格子内の光路長の差を小さくして、原
信号の波長に誤差が生じ難くするため。)、ここで1次
以上の次数で回折した後、収束レンズL2a、L2bを
それぞれ介して偏光部材(λ/4波長板WP1a、WP
1b)及び第2の反射部材(反射鏡R2a、R2b)へ
と達する。つまり、光束LFaについては反射型回折格
子RGでの回折の後に、λ/4波長板WP1aを経て反
射鏡R2aに到達し、また、光束LFbについては反射
型回折格子RGでの回折の後に、λ/4波長板WP1b
を経て反射鏡R2bに到達する。尚、これらのλ/4波
長板WP1a、WP1bについては、反射型回折格子R
Gによる回折光を受けて偏光状態を変える役割をもって
おり、前記したように偏光方向を90度回転させるもの
である。また、反射鏡R2a、R2bは、偏光状態を変
えられた光に対して、これを反射させて逆方向に戻す役
割をもっており、反射された各光は、往路を逆に辿って
受発光複合ユニット1にそれぞれ達する(当該ユニット
への戻り光となる。)。Each light that reaches the reflection type diffraction grating RG used for a detected part such as a linear scale is injected into the grating at a short distance (the difference in the optical path length in the grating is reduced to reduce the wavelength of the original signal). Error is less likely to occur.), After being diffracted by the first or higher order, the polarization members (λ / 4 wavelength plates WP1a and WP) are respectively passed through the converging lenses L2a and L2b.
1b) and the second reflecting member (reflecting mirrors R2a, R2b). That is, the light beam LFa reaches the reflecting mirror R2a via the λ / 4 wavelength plate WP1a after being diffracted by the reflection type diffraction grating RG, and the light beam LFb is diffracted by λ after the diffraction by the reflection type diffraction grating RG. / 4 wave plate WP1b
To reach the reflecting mirror R2b. Incidentally, regarding these λ / 4 wave plates WP1a and WP1b, the reflection type diffraction grating R
It has a role of changing the polarization state by receiving the diffracted light by G, and rotates the polarization direction by 90 degrees as described above. Further, the reflecting mirrors R2a and R2b have a role of reflecting the light whose polarization state has been changed and returning it in the opposite direction, and each reflected light follows the forward path in the reverse direction, and the light receiving and emitting composite unit. Reach 1 (return light to the unit).
【0028】図2は受発光複合ユニット1の構成例を示
すものであり、内部構造の要部を示している。FIG. 2 shows an example of the structure of the combined light emitting and receiving unit 1 and shows the main part of the internal structure.
【0029】受発光複合ユニット1は、その収容部材
(あるいは封止部材)2に対して、光源3、光分岐部
4、レンズ群8_1乃至8_3、回折部材5(5_1、
5_2)、受光部6(6_1乃至6_4)、λ/4波長
板11を配設することで一体化した構造に形成されてい
る。The light emitting / receiving composite unit 1 has a light source 3, a light branching portion 4, lens groups 8_1 to 8_3, and a diffractive member 5 (5_1, 5) for the housing member (or sealing member) 2 thereof.
5_2), the light receiving portions 6 (6_1 to 6_4), and the λ / 4 wavelength plate 11 are arranged to form an integrated structure.
【0030】光源3は、上記変位検出装置への適用にお
いては測定用光源(あるいは発光部)として用いられ
る。そして、発光素子3a(例えば、半導体レーザーが
用いられる。)は、当該素子の発する光に対して反射面
7aを持つ半導体基板7上に固着されている。つまり、
反射面7aは、発光素子3aから発した光を光源3の設
定光軸に沿う方向(同図の上下方向)に変更する光路変
更手段の役目をもっており、光を図の上方に立ち上げる
働きをする。尚、半導体基板7は収容部材2の内底面に
固定されている。The light source 3 is used as a measuring light source (or a light emitting section) in the application to the above displacement detecting device. The light emitting element 3a (for example, a semiconductor laser is used) is fixed on the semiconductor substrate 7 having a reflection surface 7a for the light emitted by the element. That is,
The reflecting surface 7a serves as an optical path changing means for changing the light emitted from the light emitting element 3a in the direction along the set optical axis of the light source 3 (vertical direction in the same figure), and functions to raise the light upward in the figure. To do. The semiconductor substrate 7 is fixed to the inner bottom surface of the housing member 2.
【0031】収容部材2には受光部6が収められてい
て、回折部材5(5_1、5_2)を経た光を検出する
ために複数の受光素子6_1乃至6_4が半導体基板6
aに形成されている。尚、図には明示していないが、発
光素子3a又は半導体基板6aや7については、例えば
ワイヤーボンディングなどで収容部材2から外部へ通じ
る配線用の電極部材に対して電気的に接続されている。A light receiving portion 6 is housed in the housing member 2, and a plurality of light receiving elements 6_1 to 6_4 are provided in the semiconductor substrate 6 for detecting light passing through the diffractive member 5 (5_1, 5_2).
It is formed in a. Although not shown in the drawing, the light emitting element 3a or the semiconductor substrate 6a or 7 is electrically connected to an electrode member for wiring that leads from the housing member 2 to the outside by, for example, wire bonding. .
【0032】半導体基板6a、7が配置固定された収容
部材2には、その開口を覆って封止するためのカバー部
材8が設けられ、これによって光源3や受光部6、回折
部材5がパッケージ化される。尚、カバー部材8には、
例えば、透明プラスチック材料が使用され、複数のレン
ズ8_1乃至8_3が形成されている。つまり、レンズ
8_1は、光源3の光軸上に配置された収束レンズであ
り、発光素子3aから発した後、反射面7aで反射され
た光がλ/4波長板11を介して当該レンズに入射し、
レンズを透過した光が後述の偏光分離膜を経てユニット
外に出射される。また、レンズ8_2、8_3について
は、図1に示した外部光学系ETからの戻り光を収束
(又は発散)させるために設けられている。The housing member 2 on which the semiconductor substrates 6a and 7 are arranged and fixed is provided with a cover member 8 for covering and sealing the opening, whereby the light source 3, the light receiving portion 6, and the diffractive member 5 are packaged. Be converted. The cover member 8 includes
For example, a transparent plastic material is used and a plurality of lenses 8_1 to 8_3 are formed. That is, the lens 8_1 is a converging lens arranged on the optical axis of the light source 3, and light emitted from the light emitting element 3a and then reflected by the reflecting surface 7a is transmitted to the lens through the λ / 4 wavelength plate 11. Incident,
The light that has passed through the lens is emitted to the outside of the unit via the polarization separation film described below. The lenses 8_2 and 8_3 are provided to converge (or diverge) the return light from the external optical system ET shown in FIG.
【0033】カバー部材8には、レンズ8_1の近辺に
上記λ/4波長板11が配設される。そして、光分岐部
4を構成するとともにλ/4波長板10を含む複合プリ
ズム9、さらには、分岐された戻り光の偏光成分を分離
するためにレンズ8_2、8_3の近くに配置された偏
光分離用回折光学素子5_1、5_2がそれぞれ固定さ
れている。On the cover member 8, the λ / 4 wave plate 11 is arranged near the lens 8_1. Then, the compound prism 9 that constitutes the light branching unit 4 and includes the λ / 4 wavelength plate 10, and further, the polarization splitting arranged near the lenses 8_2 and 8_3 to split the polarization component of the split return light. The diffractive optical elements 5_1 and 5_2 are fixed.
【0034】つまり、カバー部材8の内面側には、λ/
4波長板11と、回折光学素子5_1、5_2が固定さ
れており、回折光学素子5_1、5_2が回折部材5を
構成する。回折光学素子5_1は、レンズ8_2に対し
て設けられ、当該素子による回折光は受光素子6_1及
び6_2により検出される。また、回折光学素子5_2
は、レンズ8_3に対して設けられ、当該素子による回
折光は受光素子6_3及び6_4により検出される。That is, on the inner surface side of the cover member 8, λ /
The four-wave plate 11 and the diffractive optical elements 5_1 and 5_2 are fixed, and the diffractive optical elements 5_1 and 5_2 form the diffractive member 5. The diffractive optical element 5_1 is provided for the lens 8_2, and the light diffracted by the element is detected by the light receiving elements 6_1 and 6_2. In addition, the diffractive optical element 5_2
Is provided for the lens 8_3, and the light diffracted by the element is detected by the light receiving elements 6_3 and 6_4.
【0035】カバー部材8の上面には複合プリズム9が
載置固定されており、偏光分離膜9aと、戻り光束につ
いて分岐させるための光分岐膜9b、全反射面9cを備
えている。つまり、偏光分離膜9aや光分岐膜9bは光
分岐部4を構成するものであり、偏光分離膜9aが上記
レンズ8_1に対応した位置であって光源3の光軸上に
配置され、また、光分岐膜9bが上記レンズ8_2に対
応する位置に配置されている。そして、全反射面9cは
上記レンズ8_3に対応した位置に配置されている。A composite prism 9 is mounted and fixed on the upper surface of the cover member 8, and is provided with a polarization splitting film 9a, a light splitting film 9b for splitting a returning light beam, and a total reflection surface 9c. That is, the polarization splitting film 9a and the light splitting film 9b constitute the light splitting unit 4, and the polarization splitting film 9a is arranged at the position corresponding to the lens 8_1 and on the optical axis of the light source 3, and The light branching film 9b is arranged at a position corresponding to the lens 8_2. The total reflection surface 9c is arranged at a position corresponding to the lens 8_3.
【0036】このように、複合プリズム9と受光部6と
の間に、レンズや回折光学素子を配置した構造となって
いる。As described above, the lens and the diffractive optical element are arranged between the composite prism 9 and the light receiving portion 6.
【0037】光分岐膜9bの直ぐ背後(全反射面9c
側)には、λ/4波長板10(前記WP2に相当す
る。)が配設されており、戻り光のうち当該波長板を通
った光が全反射面9cに達する。Immediately behind the light branching film 9b (total reflection surface 9c
A λ / 4 wave plate 10 (corresponding to the WP2) is disposed on the side), and the return light, which has passed through the wave plate, reaches the total reflection surface 9c.
【0038】尚、本例では、外部光学系ETを通ってユ
ニット1に戻ってきた戻り光束について、光分岐膜9b
により2つに分けているが、分岐数がこれに限られる訳
ではなく、少なくとも2つ以上に分岐されて偏光分離用
の回折光学素子に導かれるように構成すれば良い。ま
た、回折光学素子の位置についても光分岐膜9b及び全
反射面9cと、受光部6との間であれば任意の位置で良
い。In this example, the return light flux returning to the unit 1 through the external optical system ET is converted into the light branching film 9b.
However, the number of branches is not limited to this, and it may be configured such that at least two branches are introduced to the diffractive optical element for polarization separation. Further, the position of the diffractive optical element may be any position as long as it is between the light branching film 9b and the total reflection surface 9c and the light receiving section 6.
【0039】しかして、本構成の動作は以下の通りであ
る。The operation of this structure is as follows.
【0040】先ず、発光素子3aから発した光は、半導
体基板7の反射面7aで反射されて光路変更を受ける。
そして、その反射光はλ/4波長板11で円偏光とな
り、カバー部材8に配設された収束レンズ8_1により
収束光となって、複合プリズム9の偏光分離膜9aに到
達する。First, the light emitted from the light emitting element 3a is reflected by the reflecting surface 7a of the semiconductor substrate 7 and undergoes an optical path change.
Then, the reflected light becomes circularly polarized light by the λ / 4 wavelength plate 11, becomes convergent light by the converging lens 8_1 arranged in the cover member 8, and reaches the polarization separation film 9a of the composite prism 9.
【0041】偏光分離膜9aによりそれぞれ直線偏光成
分に分離された光束LFa、LFbは、図1で示した外
部光学系ETの反射型回折格子RGで回折されるととも
に、前記したように、それぞれの偏光方向が略90度回
転されて戻り光となってそれぞれ複合プリズム9に入り
(光束LFbの光が図2の上方から入り、光束LFaの
光が図2の左側から入る。)、再び偏光分離膜9aに戻
ってくる。The light beams LFa and LFb separated into linearly polarized light components by the polarization separation film 9a are diffracted by the reflection type diffraction grating RG of the external optical system ET shown in FIG. The polarization direction is rotated by about 90 degrees and becomes return light, which enters the composite prism 9 (the light of the light beam LFb enters from the upper side of FIG. 2 and the light of the light beam LFa enters from the left side of FIG. 2), and the polarized light is separated again. Return to the membrane 9a.
【0042】各戻り光束ついては、光源3から入射し分
離された偏光状態に対してそれぞれ90度の位相差があ
ることから、混合しつつ光分岐膜9b及び全反射面9c
に向かう。また、複合プリズム9に配設されたλ/4波
長板10は、直線偏光を円偏光に変えることで位相情報
をさらに付与する働きを有する。Since the respective return light beams have a phase difference of 90 degrees with respect to the polarization states which are incident from the light source 3 and are separated, the light branching film 9b and the total reflection surface 9c while mixing.
Head to. Further, the λ / 4 wave plate 10 arranged in the compound prism 9 has a function of further adding phase information by changing linearly polarized light into circularly polarized light.
【0043】光分岐膜9b及び全反射面9cで分岐され
た光束については、カバー部材8の収束レンズ8_2、
8_3により収束光となった後、それぞれに対応する回
折光学素子5_1、5_2で偏光成分に分離されて異な
る角度をもって回折される。そして、その回折光がそれ
ぞれに対応する受光素子6_1乃至6_4に到達する。With respect to the light beam split by the light branching film 9b and the total reflection surface 9c, the converging lens 8_2 of the cover member 8,
After it becomes convergent light by 8_3, it is separated into polarization components by the corresponding diffractive optical elements 5_1 and 5_2 and diffracted at different angles. Then, the diffracted light reaches the corresponding light receiving elements 6_1 to 6_4.
【0044】尚、偏光分離用の回折光学素子5_1、5
_2については、例えば、光源3の発光波長よりも短い
格子周期をもつ、回折型の光学素子として半導体リソグ
ラフィー技術等を用いて製作することができ、本例では
分岐数が4であることから、例えば、偏光方向が0度、
45度、90度、135度(45度間隔)に設定されて
分離された光束について受光素子6_1乃至6_4にそ
れぞれ到達される構成となっている。Incidentally, the diffractive optical elements 5_1 and 5 for separating polarized light
_2 can be manufactured by using, for example, a semiconductor lithography technique as a diffractive optical element having a grating period shorter than the emission wavelength of the light source 3, and in this example, the number of branches is 4, For example, the polarization direction is 0 degree,
The light fluxes set at 45 degrees, 90 degrees, and 135 degrees (intervals of 45 degrees) are separated and reach the light receiving elements 6_1 to 6_4, respectively.
【0045】各受光素子6_1乃至6_4に入射される
それぞれの光束に関しては、高次回折光の干渉により反
射型回折格子RGに係る移動量の情報を、受光量の変化
として内包していることから、各受光素子で受光されて
電気信号に変換された検出信号に対して、既知の演算処
理を適宜に施すことで当該回折格子RGの移動量を得る
ことができる。With respect to the respective light fluxes incident on the respective light receiving elements 6_1 to 6_4, since the information on the movement amount relating to the reflection type diffraction grating RG due to the interference of the higher order diffracted light is included as the change in the light receiving amount, The amount of movement of the diffraction grating RG can be obtained by appropriately performing known arithmetic processing on the detection signal received by each light receiving element and converted into an electric signal.
【0046】尚、本例において、発光素子3aとして半
導体レーザーを使用する場合に、その出射光が取付面に
対して平行な直線偏光であることに起因して、複合プリ
ズム9に配設された偏光分離膜9aで適切な光量をもっ
て偏光分離ができるように、λ/4波長板11を用いて
いるが、これに限らず、図3に示す構成形態(発光素子
3aを実装した半導体基板7の姿勢を、収容部材2への
取付面内においてほぼ45度の角度θで回転させた配
置)が可能である。In this example, when a semiconductor laser is used as the light emitting element 3a, the light emitted from the semiconductor laser is linearly polarized light parallel to the mounting surface. The λ / 4 wavelength plate 11 is used so that the polarization separation film 9a can perform polarization separation with an appropriate amount of light, but the present invention is not limited to this, and the configuration shown in FIG. 3 (the semiconductor substrate 7 on which the light emitting element 3a is mounted is shown. The posture can be rotated by an angle θ of approximately 45 degrees in the mounting surface of the housing member 2).
【0047】図3は、光源及び受光部の光軸方向から見
た平面図であり、受発光複合ユニット1においてカバー
部材8及び複合プリズム9を取り除いた状態で、発光素
子3a(半導体レーザー)及び反射面7aを搭載した半
導体基板7と、受光部6を構成する半導体基板6aとの
位置関係を示している。FIG. 3 is a plan view seen from the optical axis direction of the light source and the light receiving portion. In the light emitting and receiving composite unit 1, the light emitting element 3a (semiconductor laser) and the cover member 8 and the composite prism 9 are removed. The positional relationship between the semiconductor substrate 7 on which the reflecting surface 7a is mounted and the semiconductor substrate 6a forming the light receiving unit 6 is shown.
【0048】受発光複合ユニット1をその光源3及び受
光部6の光軸方向から見た場合に、直線「LN1」は、
発光素子3aの発光方向(出射方向)を含む直線(発光
軸)を示している(光源の設定光軸は紙面に直交する方
向である。)。また、直線「LN2」は、半導体基板6
aに形成された受光素子6_1乃至6_4(図には破線
の四角で示す。)の各中心(受光中心、つまり、各素子
の光軸と受光面との交点)を通る直線を示しており、半
導体基板6aの長手方向に延びている。そして、角度
「θ」は直線LN1と直線LN2とがなす角度を表して
おり、45度(あるいはほぼ45度)の角度とされてい
る。When the combined light emitting and receiving unit 1 is viewed from the optical axis directions of the light source 3 and the light receiving portion 6, the straight line "LN1" is
A straight line (light emitting axis) including the light emitting direction (emission direction) of the light emitting element 3a is shown (the set optical axis of the light source is a direction orthogonal to the paper surface). The straight line “LN2” is the semiconductor substrate 6
A straight line passing through each center of the light receiving elements 6_1 to 6_4 (indicated by broken line rectangles in the figure) formed in a (light receiving center, that is, the intersection of the optical axis of each element and the light receiving surface) is shown. It extends in the longitudinal direction of the semiconductor substrate 6a. The angle “θ” represents the angle formed by the straight line LN1 and the straight line LN2, and is an angle of 45 degrees (or almost 45 degrees).
【0049】この配置によれば、発光素子3aから反射
面7aで偏向(光路変更による、光源3の光軸方向への
立ち上げ)された出射光が、半導体基板7の取り付け角
度に応じた略45度の偏光角度をもって偏光分離膜9a
に達することになり、ほぼ同じ光量のP偏光成分とS偏
光成分に分離されるので、光束の不均等な分離を防止で
きる。According to this arrangement, the emitted light deflected from the light emitting element 3a on the reflecting surface 7a (raised in the optical axis direction of the light source 3 by changing the optical path) is substantially in accordance with the mounting angle of the semiconductor substrate 7. Polarization separation film 9a with a polarization angle of 45 degrees
Since the light is separated into the P-polarized component and the S-polarized component having almost the same light amount, it is possible to prevent uneven separation of the light flux.
【0050】また、受光素子6_1乃至6_4が形成さ
れた半導体基板6aについては、受光用回路の他に、検
出信号の増幅回路(電流電圧変換増幅回路等)や検出信
号に係る演算回路等を一体的に形成することにより、集
積化の利点、例えば、S/N比(信号対ノイズ比)の向
上による検出精度の向上や、装置全体の小型化、低コス
ト化等が可能になる。In addition to the light receiving circuit, the semiconductor substrate 6a on which the light receiving elements 6_1 to 6_4 are formed is integrated with a detection signal amplification circuit (current-voltage conversion amplification circuit or the like) and an arithmetic circuit related to the detection signal. By forming the same, it is possible to realize the advantages of integration, for example, the detection accuracy is improved by improving the S / N ratio (signal-to-noise ratio), and the size and cost of the entire device can be reduced.
【0051】尚、前記した構成は、あくまで本発明の一
例を示したものであり、例えば、半導体基板6a、7が
収容部材2の内底面に配置されて固定されているが、同
様の機能として本発明の主旨に基づいていればこの構造
に限定されるものではなく、また、カバー部材8に一体
化して形成されている収束レンズ8_1乃至8_3等に
ついても、その機能として同等の光学部品を代用した構
造等、各種の実施態様が挙げられる。Note that the above-described structure is merely an example of the present invention. For example, the semiconductor substrates 6a and 7 are arranged and fixed on the inner bottom surface of the housing member 2, but have the same function. The present invention is not limited to this structure as long as it is based on the gist of the present invention, and the converging lenses 8_1 to 8_3 and the like formed integrally with the cover member 8 may be replaced with equivalent optical components. There are various embodiments such as the structure described above.
【0052】そして、上記した受発光複合ユニット1及
びこれを用いた変位検出装置によれば、下記に示す利点
が得られる。The above-described combined light emitting and receiving unit 1 and the displacement detecting device using the same have the following advantages.
【0053】先ず、従来の変位検出装置では、図4に示
したように、光源LSから偏光ビームスプリッターPB
S1への光路及び当該ビームスプリッターから光検出器
PD1乃至PD4に至るまでの光路において、それぞれ
単独の光学部品を配置した構造となるため、例えば、光
学ベース等の基台部に各部品を固定しておく必要があ
り、各部品の位置関係についての調整が面倒であるが、
本発明によれば、そのような不都合がない。First, in the conventional displacement detecting device, as shown in FIG. 4, from the light source LS to the polarization beam splitter PB.
In the optical path to S1 and the optical path from the beam splitter to the photodetectors PD1 to PD4, individual optical components are arranged. Therefore, for example, each component is fixed to a base portion such as an optical base. It is necessary to keep in mind that it is troublesome to adjust the positional relationship of each part,
According to the present invention, there is no such inconvenience.
【0054】つまり、本発明のように、光学部品(光学
素子等)を半導体封止構造内にパッケージ化して一体的
に形成する場合には、戻り光束に係る偏光成分を分離す
るための偏光分離回折光学素子5_1、5_2を光路中
に置き、発光素子3aと受光素子6_1乃至6_4とを
平面的に配置することができるとともに、一体的に形成
した光学部品を移動させ、あるいはその取り付け姿勢を
変えて調整した後で固定することにより容易に製造する
ことができる。特に、半導体素子を、例えば、シリコン
ウエハー上又は位置の基準部を有する、連結された半導
体封止部品において、精密に配置して固定することや、
固定後に電子部品(発光素子や受光素子等)に通電して
動作させ、その後に光学部品を所定の位置に配置して発
光素子から受光素子に達する光束の状態や光量を検知し
てから当該光学部品の位置を微調整した上で固定するこ
とが、既存の技術を用いて容易に実現できる(例えば、
光学式ディスク用のヘッド装置(光学ピックアップ等)
における光学系等で実現されている。)。従って、調整
や組立工程については、半導体製造設備を用いて容易に
行うことができる。That is, as in the present invention, when an optical component (optical element or the like) is packaged and integrally formed in a semiconductor encapsulation structure, a polarization separation for separating a polarization component related to a return light beam is performed. The diffractive optical elements 5_1 and 5_2 can be placed in the optical path, the light emitting element 3a and the light receiving elements 6_1 to 6_4 can be arranged in a plane, and the integrally formed optical parts can be moved or the mounting posture thereof can be changed. It can be easily manufactured by fixing after being adjusted. In particular, a semiconductor element is precisely arranged and fixed in a connected semiconductor encapsulation component, for example, which has a reference part on or on a silicon wafer,
After fixing, the electronic parts (light emitting element, light receiving element, etc.) are energized to operate, and then the optical parts are placed at a predetermined position to detect the state and amount of light flux reaching the light receiving element from the light emitting element before the optical Fine adjustment of the position of parts and then fixing can be easily realized using existing technology (for example,
Head device for optical discs (optical pickup, etc.)
It is realized by the optical system in. ). Therefore, the adjustment and the assembly process can be easily performed using the semiconductor manufacturing equipment.
【0055】このように半導体封止構造内に部品を一体
に形成することで、調整が極めて容易になるとともに、
その形状や質量について小型化、軽量化を図ることが可
能となり、併せて半導体製造で実績のある高信頼性が保
証される。By integrally forming the components in the semiconductor encapsulation structure in this manner, adjustment becomes extremely easy, and
It is possible to reduce the size and weight of the shape and mass, and at the same time, it is possible to guarantee the high reliability that has been proven in semiconductor manufacturing.
【0056】さらには、偏光分離用の回折光学素子を用
いることによって、コンパクトな構成を実現することが
可能となる。Furthermore, by using a diffractive optical element for separating polarized light, a compact structure can be realized.
【0057】[0057]
【発明の効果】以上に記載したところから明らかなよう
に、請求項1や請求項3に係る発明によれば、発光素子
及び受光素子、ユニットへの戻り光に対する光分岐部、
レンズ、回折部材を一体的な構造にすることで精密な位
置調整が容易になり、また、部品の配置スペースを大き
くとる必要がないので小型化に適している。そして、各
部を同一の収容部材内に閉じ込めることで環境変化や経
時変化の影響を受け難くなるので、調整ずれの発生を防
止でき、ユニットの信頼性を高めることができる。As is apparent from the above description, according to the first and third aspects of the invention, the light emitting element and the light receiving element, the optical branching portion for the returning light to the unit,
Since the lens and the diffractive member are integrally structured, precise position adjustment is facilitated, and it is not necessary to take a large space for arranging parts, which is suitable for downsizing. Further, by confining each part in the same housing member, it becomes difficult to be affected by environmental changes and changes over time, so that it is possible to prevent the occurrence of misalignment and improve the reliability of the unit.
【0058】請求項2や請求項4に係る発明によれば、
光分岐部と受光素子との間に回折部材を配置することに
より、コンパクトな構成を実現でき、戻り光の偏光成分
を分離できる。According to the inventions of claims 2 and 4,
By disposing the diffractive member between the light branching portion and the light receiving element, a compact structure can be realized and the polarization component of the return light can be separated.
【0059】請求項5や請求項6に係る発明によれば、
偏光分離(P偏光、S偏光への分離)をほぼ均等な光量
をもって行うことができる。According to the inventions of claims 5 and 6,
Polarization separation (separation into P-polarized light and S-polarized light) can be performed with a substantially uniform light amount.
【図1】本発明に係る受発光複合ユニットを用いた格子
干渉型変位検出装置の構成例を示す図である。FIG. 1 is a diagram showing a configuration example of a grating interference type displacement detection device using a combined light emitting and receiving unit according to the present invention.
【図2】本発明に係る受発光複合ユニットの構成につい
て一例を示す図である。FIG. 2 is a diagram showing an example of a configuration of a combined light emitting and receiving unit according to the present invention.
【図3】受発光複合ユニットにおける光源及び受光部の
配置例について説明するための平面図である。FIG. 3 is a plan view for explaining an arrangement example of a light source and a light receiving section in the combined light emitting and receiving unit.
【図4】従来の格子干渉型変位検出装置の構成例を示す
図である。FIG. 4 is a diagram showing a configuration example of a conventional grating interference type displacement detection device.
1…受発光複合ユニット、1、ET…変位検出装置、3
…光源、3a…発光素子、4…光分岐部、5、5_1、
5_2……回折部材、6…受光部、6_1乃至6_4…
受光素子、8_1乃至8_3…レンズ、9a…偏光分離
膜、ET…外部光学系、RG…回折格子、R2a、R2
b…反射部材、WP1a、WP1b…偏光部材1 ... Receiving and emitting combined unit, 1, ET ... Displacement detection device, 3
... light source, 3a ... light emitting element, 4 ... light branching part, 5, 5_1,
5_2 ... Diffraction member, 6 ... Light receiving part, 6_1 to 6_4 ...
Light receiving element, 8_1 to 8_3 ... Lens, 9a ... Polarization separation film, ET ... External optical system, RG ... Diffraction grating, R2a, R2
b ... Reflecting member, WP1a, WP1b ... Polarizing member
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 31/12 H01L 31/12 G Fターム(参考) 2F065 AA02 AA09 DD02 FF16 FF48 FF49 GG06 HH09 HH12 HH14 JJ01 JJ05 JJ08 JJ23 LL00 LL04 LL12 LL33 LL36 LL42 LL47 LL51 2F103 BA04 BA06 BA37 CA03 CA04 CA08 DA01 DA12 EA03 EA15 EB02 EB12 EB16 EB28 EB32 EB36 EB37 EC01 EC11 EC12 EC13 EC14 EC15 ED01 ED07 FA01 FA11 GA01 GA02 GA15 2H049 AA07 AA34 AA55 BA05 BA07 BB03 BC23 5F089 BA02 BB02 BC07 BC16 BC25 GA03 GA05 GA10 ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI theme code (reference) H01L 31/12 H01L 31/12 GF term (reference) 2F065 AA02 AA09 DD02 FF16 FF48 FF49 GG06 HH09 HH12 HH14 JJ01 JJ05 JJ08 JJ23 LL00 LL04 LL12 LL33 LL36 LL42 LL47 LL51 2F103 BA04 BA06 BA37 CA03 CA04 CA08 DA01 DA12 EA03 EA15 EB02 EB12 EB16 EB28 EB32 EB36 EB37 EC01 EC11 EC12 EC13 EC14 EC15 ED01 ED07 FA01 FA11 GA01 GA02 GA15 2H049 AA07 AA34 AA55 BA05 BA07 BB03 BC23 5F089 BA02 BB02 BC07 BC16 BC25 GA03 GA05 GA10
Claims (6)
出射光が外部光学系を通ってユニットに戻ってきた戻り
光を検出する複数の受光素子が、同一の基板又は部材上
に配設されるとともに、 上記戻り光に対する光分岐部と、上記出射光及び戻り光
に対する収束又は発散用のレンズと、上記戻り光の偏光
状態から任意方向の偏光成分を分離して異なる方向に回
折させるための回折部材とが配置され、かつそれらの部
材が一体的に形成された構造を有することを特徴とする
受発光複合ユニット。1. A light emitting element and a plurality of light receiving elements for detecting return light emitted from the light emitting element and returned to a unit through an external optical system are arranged on the same substrate or member. Along with the optical branching portion for the return light, a lens for converging or diverging the emitted light and the return light, and a diffraction component for separating a polarization component in an arbitrary direction from the polarization state of the return light and diffracting it in different directions. A light emitting and receiving composite unit having a structure in which members are arranged and these members are integrally formed.
において、 回折部材が光分岐部と受光素子との間に配置されている
ことを特徴とする受発光複合ユニット。2. The light emitting and receiving composite unit according to claim 1, wherein the diffractive member is arranged between the light branching portion and the light receiving element.
出射光が外部光学系を通ってユニットに戻ってきた戻り
光を検出する複数の受光素子が、同一の基板又は部材上
に配設されるとともに、上記戻り光に対する光分岐部
と、上記出射光及び戻り光に対する収束又は発散用のレ
ンズと、上記戻り光の偏光状態から任意方向の偏光成分
を分離して異なる方向に回折させるための回折部材とが
配置され、かつそれらの部材が一体的に形成された構造
を有する受発光複合ユニットと、 回折格子を含む被検部及び上記受発光複合ユニットから
出射された後の回折格子による回折光を受けて偏光状態
を変えるための偏光部材と、偏光部材を通った光を反射
させて逆方向に戻すための反射部材とを含む外部光学系
を設けたことを特徴とする変位検出装置。3. A light-emitting element and a plurality of light-receiving elements for detecting return light emitted from the light-emitting element and returned to the unit through an external optical system are arranged on the same substrate or member. At the same time, an optical branching portion for the return light, a lens for converging or diverging the emitted light and the return light, and diffraction for separating a polarization component in an arbitrary direction from the polarization state of the return light and diffracting it in different directions A light receiving and emitting composite unit having a structure in which members are arranged and the members are integrally formed, a test portion including a diffraction grating, and diffracted light by the diffraction grating after being emitted from the light receiving and emitting composite unit. A displacement detecting device comprising: an external optical system including a polarizing member for receiving the light and changing the polarization state thereof and a reflecting member for reflecting the light passing through the polarizing member and returning the light in the opposite direction.
て、 回折部材が光分岐部と受光素子との間に配置されている
ことを特徴とする変位検出装置。4. The displacement detecting device according to claim 3, wherein the diffractive member is arranged between the light branching portion and the light receiving element.
において、 発光素子から発した光が設定光軸に沿う方向に光路変更
を受けてから、偏光分離膜に到達するように構成され、 上記発光素子を含む光源及び受光素子を含む受光部の光
軸方向から見た場合に、当該発光素子に係る光の出射方
向を含む直線と、受光部を構成する各受光素子の中心を
通る直線とが、ほぼ45゜の角度をなすように配置され
ていることを特徴とする受発光複合ユニット。5. The combined light emitting and receiving unit according to claim 1, wherein the light emitted from the light emitting element reaches the polarization splitting film after the light path is changed in a direction along the set optical axis, When viewed from the optical axis direction of the light receiving section including the light source including the light emitting element and the light receiving element, a straight line including the emission direction of the light related to the light emitting element and a straight line passing through the center of each light receiving element forming the light receiving section Is arranged so as to form an angle of about 45 °.
て、 受発光複合ユニット内の発光素子から発した光が設定光
軸に沿う方向に光路変更を受けてから、偏光分離膜に到
達するように構成され、 上記発光素子を含む光源及び受光素子を含む受光部の光
軸方向から上記受発光複合ユニットを見た場合に、上記
発光素子に係る光の出射方向を含む直線と、受光部を構
成する各受光素子の中心を通る直線とが、ほぼ45゜の
角度をなすように配置されていることを特徴とする変位
検出装置。6. The displacement detecting device according to claim 3, wherein the light emitted from the light emitting element in the light emitting / receiving composite unit is changed in optical path in a direction along the set optical axis before reaching the polarization separation film. When the light receiving and emitting composite unit is viewed from the optical axis direction of the light source including the light emitting element and the light receiving section including the light receiving element, the straight line including the light emitting direction of the light emitting element and the light receiving section are formed. A displacement detecting device characterized in that it is arranged so that a straight line passing through the center of each light-receiving element that constitutes it forms an angle of approximately 45 °.
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|---|---|---|---|
| JP2001342860A JP4110765B2 (en) | 2001-11-08 | 2001-11-08 | Light emitting / receiving composite unit and displacement detection device using the same |
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|---|---|---|---|
| JP2001342860A JP4110765B2 (en) | 2001-11-08 | 2001-11-08 | Light emitting / receiving composite unit and displacement detection device using the same |
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| Publication Number | Publication Date |
|---|---|
| JP2003149005A true JP2003149005A (en) | 2003-05-21 |
| JP4110765B2 JP4110765B2 (en) | 2008-07-02 |
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|---|---|---|---|
| JP2001342860A Expired - Lifetime JP4110765B2 (en) | 2001-11-08 | 2001-11-08 | Light emitting / receiving composite unit and displacement detection device using the same |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005121539A (en) * | 2003-10-17 | 2005-05-12 | Sony Manufacturing Systems Corp | Displacement detection device |
| JP2005127972A (en) * | 2003-10-27 | 2005-05-19 | Olympus Corp | Sensor head of reflection type optical encoder |
| WO2008038752A1 (en) * | 2006-09-29 | 2008-04-03 | Nikon Corporation | Mobile unit system, pattern forming device, exposing device, exposing method, and device manufacturing method |
-
2001
- 2001-11-08 JP JP2001342860A patent/JP4110765B2/en not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005121539A (en) * | 2003-10-17 | 2005-05-12 | Sony Manufacturing Systems Corp | Displacement detection device |
| JP2005127972A (en) * | 2003-10-27 | 2005-05-19 | Olympus Corp | Sensor head of reflection type optical encoder |
| US7342671B2 (en) | 2003-10-27 | 2008-03-11 | Olympus Corporation | Sensor head of reflective optical encoder |
| WO2008038752A1 (en) * | 2006-09-29 | 2008-04-03 | Nikon Corporation | Mobile unit system, pattern forming device, exposing device, exposing method, and device manufacturing method |
| JP2011003927A (en) * | 2006-09-29 | 2011-01-06 | Nikon Corp | Exposure apparatus and method, and device manufacturing method |
| US7999918B2 (en) | 2006-09-29 | 2011-08-16 | Nikon Corporation | Movable body system, pattern formation apparatus, exposure apparatus and exposure method, and device manufacturing method |
| JP5105197B2 (en) * | 2006-09-29 | 2012-12-19 | 株式会社ニコン | MOBILE BODY SYSTEM, EXPOSURE APPARATUS, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD |
| US8514373B2 (en) | 2006-09-29 | 2013-08-20 | Nikon Corporation | Movable body system, pattern formation apparatus, exposure apparatus and exposure method, and device manufacturing method |
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