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JP2003004671A - Substance identifying method and system - Google Patents

Substance identifying method and system

Info

Publication number
JP2003004671A
JP2003004671A JP2001183529A JP2001183529A JP2003004671A JP 2003004671 A JP2003004671 A JP 2003004671A JP 2001183529 A JP2001183529 A JP 2001183529A JP 2001183529 A JP2001183529 A JP 2001183529A JP 2003004671 A JP2003004671 A JP 2003004671A
Authority
JP
Japan
Prior art keywords
substance
ray diffraction
data
dimensional
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001183529A
Other languages
Japanese (ja)
Other versions
JP4565774B2 (en
Inventor
Yoshiyuki Yamada
義行 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Priority to JP2001183529A priority Critical patent/JP4565774B2/en
Publication of JP2003004671A publication Critical patent/JP2003004671A/en
Application granted granted Critical
Publication of JP4565774B2 publication Critical patent/JP4565774B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a new substance identifying method capable of identifying an orientation sample with high accuracy. SOLUTION: By comparing a reference data base in which two-dimensional X-ray diffraction line data of an equatorial direction (2θdirection) and a Debye ring direction (β direction) on a plurality of substances is stored with two-dimensional X-ray diffraction line data of the equatorial direction and the Debye ring direction on substance to be measured, the substance to be measured is identified.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この出願の発明は、物質同定
方法および物質同定システムに関するものである。さら
に詳しくは、この出願の発明は、無配向試料のみならず
配向試料の同定にも有用な、X線回折の2次元測定によ
って物質を同定する、新しい物質同定方法および物質同
定システムに関するものである。
TECHNICAL FIELD The present invention relates to a substance identification method and a substance identification system. More specifically, the invention of this application relates to a new substance identification method and substance identification system, which is useful for identifying not only non-oriented samples but also oriented samples, by two-dimensional measurement of X-ray diffraction. .

【0002】[0002]

【従来の技術】この出願の発明の発明者等は、粉末X線
回折測定によって物質の同定を行う方法を既に提案して
いる(特許番号第2908530号)。この物質同定方
法は、従来のJCPDSカードを用いた物質同定方法の
問題点を解決するためになされたものであり、X線回折
図形の曲線形状に関する情報を標準データベースとして
作成しておき、被測定物質のX線回折図形とこの標準デ
ータベースとを比較することにより、被測定物質の同定
を行うものである。これにより、複雑な混合物からなる
物質や、不完全な結晶や歪んだ結晶などを含む物質につ
いても、容易、且つ正確な同定を実現している。
The inventors of the invention of this application have already proposed a method for identifying a substance by powder X-ray diffraction measurement (Japanese Patent No. 2908530). This substance identification method was made in order to solve the problem of the substance identification method using the conventional JCPDS card, and the information on the curve shape of the X-ray diffraction pattern was created as a standard database and measured. The substance to be measured is identified by comparing the X-ray diffraction pattern of the substance with this standard database. This makes it possible to easily and accurately identify a substance composed of a complicated mixture, a substance containing an incomplete crystal, a distorted crystal, or the like.

【0003】[0003]

【発明が解決しようとする課題】しかしながら、このよ
うに優れた物質同定方法にあっても、改良すべき点のあ
ることが、この出願の発明の発明者によるさらなる研究
により判明した。
However, further studies by the inventor of the invention of this application have revealed that even such an excellent method for identifying substances has some points to be improved.

【0004】すなわち、従来の物質同定方法では、粉末
回折の図形を対象に同定を行っているため、粉末になっ
ていない高分子材料や金属など、製法によって結晶が特
定の方向に揃う、つまり配向状態となることの多い試料
については、試料の取付け状態で粉末回折図形が異なり
(配向状態が強いほどこの現象は顕著である)、無配向
試料の同定に比べて同定精度が低くなってしまうのであ
る。
That is, in the conventional substance identification method, since the identification is performed by using the powder diffraction pattern as a target, the crystals are aligned in a specific direction, that is, the orientation, such as a polymer material or metal which is not powdered, by the manufacturing method. For samples that are often in a state, the powder diffraction pattern differs depending on the mounting condition of the sample (the stronger the orientation, the more remarkable this phenomenon), and the identification accuracy becomes lower than that of the non-oriented sample. is there.

【0005】そこで、この出願の発明は、以上のとおり
の事情を鑑み、配向試料についても高精度で同定を行う
ことのできる、新しい物質同定方法およびそれを実行す
る物質同定システムを提供することを課題としている。
In view of the circumstances as described above, the invention of this application provides a novel substance identification method and a substance identification system for executing the same, which can identify an oriented sample with high accuracy. It is an issue.

【0006】[0006]

【課題を解決する手段】この出願の発明は、上記の課題
を解決するものとして、複数の物質に関する赤道方向お
よびデバイリング方向の2次元X線回折線データを記憶
した標準データベースと、被測定物質の赤道方向および
デバイリング方向の2次元X線回折線データとを比較す
ることにより、被測定物質の同定を行うことを特徴とす
る物質同定方法(請求項1)や、複数の物質に関するデ
バイリング方向のX線回折強度平均値を計算した赤道方
向に対するX線回折強度のプロファイルデータを記憶し
た標準データベースと、被測定物質のデバイリング方向
のX線回折強度平均値を計算した赤道方向に対するX線
回折強度のプロファイルデータとを比較することによ
り、被測定物質の同定を行うことを特徴とする物質同定
方法(請求項2)や、複数の物質に関する、赤道方向お
よびデバイリング方向の2次元X線回折線データ、なら
びにデバイリング方向のX線回折強度平均値を計算した
赤道方向に対するX線回折強度のプロファイルデータを
記憶した標準データベースと、被測定物質のデバイリン
グ方向のX線回折強度平均値を計算した赤道方向に対す
るX線回折強度のプロファイルデータとの第1比較およ
び赤道方向およびデバイリング方向の2次元X線回折線
データとの第2比較を行うことにより、被測定物質の同
定を行うことを特徴とする物質同定方法(請求項3)を
提供する。
In order to solve the above-mentioned problems, the invention of this application solves the above-mentioned problems by using a standard database storing two-dimensional X-ray diffraction line data of a plurality of substances in the equatorial direction and the Debye ring direction, and a substance to be measured. Substance identification method (claim 1), characterized in that the substance to be measured is identified by comparing the two-dimensional X-ray diffraction line data in the equatorial direction and the Debye ring direction of Standard database storing profile data of X-ray diffraction intensity for the equatorial direction in which the average value of X-ray diffraction intensity in the X-ray direction is calculated, and X-ray in the equatorial direction for calculating the average value of X-ray diffraction intensity in the Debye ring direction of the measured substance A substance identification method (claim 2) characterized in that the substance to be measured is identified by comparing it with profile data of diffraction intensity. A standard database that stores two-dimensional X-ray diffraction line data in the equatorial direction and the Debye ring direction for a plurality of substances, and profile data of the X-ray diffraction intensity for the equatorial line direction in which the average value of the X-ray diffraction intensity in the Debye ring direction is calculated. First comparison with profile data of X-ray diffraction intensity with respect to the equatorial direction in which the average value of X-ray diffraction intensity in the Debye ring direction of the substance to be measured is calculated, and with two-dimensional X-ray diffraction line data in the equatorial direction and the Debye ring direction A substance identification method (claim 3) characterized in that a substance to be measured is identified by performing a second comparison.

【0007】また、この出願の発明は、上記の物質同定
方法において、2次元X線回折線データ同士の比較は、
2次元X線回折線データを複数の円弧データに切り出
し、各円弧データ毎に行うこと(請求項4)や、標準デ
ータベースの各データと被測定物質の各データとの比較
は相関係数を使って行うこと(請求項5)をも提供す
る。
In the invention of this application, in the above-mentioned substance identification method, two-dimensional X-ray diffraction line data are compared with each other.
The two-dimensional X-ray diffraction line data is cut out into a plurality of circular arc data, which is performed for each circular arc data (Claim 4), and the correlation coefficient is used for comparison between each data in the standard database and each data of the substance to be measured. (Claim 5) is also provided.

【0008】さらにまた、この出願の発明は、2次元デ
ィテクタと、請求項1ないし5のいずれかの物質同定方
法を用いて被測定物質の同定を行う同定装置とを備えて
いることを特徴とする物質同定システム(請求項6)を
も提供する。
Furthermore, the invention of this application is provided with a two-dimensional detector and an identification device for identifying a substance to be measured using the substance identification method according to any one of claims 1 to 5. Also provided is a substance identification system (claim 6) that

【0009】[0009]

【発明の実施の形態】この出願の発明は上記のとおりの
特徴を有するものであるが、以下に、添付した図面に沿
ってその実施の形態について詳しく説明する。
BEST MODE FOR CARRYING OUT THE INVENTION The invention of this application has the characteristics as described above, and the embodiments thereof will be described in detail below with reference to the accompanying drawings.

【0010】[0010]

【実施例】この出願の発明は、予め各種の基準物質に関
する赤道方向(=2θ方向)およびデバイリング方向
(=β方向)の2次元X線回折線(図1参照)を、IP
(=イメージプレート)、CCD(=電荷結合素子)、
2次元PSPC(=位置敏感形比例計数管)、写真など
の2次元ディテクタにより測定し、それを標準データと
して標準データベースに記憶させておき、試料(=被測
定物質)について測定した赤道方向およびデバイリング
方向の2次元X線回折線データと標準データベース内の
2次元X線回折線データとを比較することにより、試料
の同定を行うようにしている。
EXAMPLES The invention of this application is based on the fact that two-dimensional X-ray diffraction lines (see FIG. 1) in the equatorial direction (= 2θ direction) and the Debye ringing direction (= β direction) of various reference substances are preliminarily analyzed.
(= Image plate), CCD (= charge coupled device),
Two-dimensional PSPC (= position-sensitive proportional counter), two-dimensional detectors such as photographs are used for measurement, and these are stored as standard data in a standard database. The sample is identified by comparing the two-dimensional X-ray diffraction line data in the ring direction with the two-dimensional X-ray diffraction line data in the standard database.

【0011】赤道方向およびデバイリング方向の2次元
X線回折線データは、試料の配向状態がそのまま測定さ
れたものであり、この配向状態を比較すれば配向試料の
同定を高精度で実現することができる。すなわち、この
出願の発明は、配向の影響を取り除くのではなく、配向
を積極的に使っているのである。
The two-dimensional X-ray diffraction line data in the equatorial direction and the Debye ring direction is obtained by measuring the orientation state of the sample as it is. By comparing the orientation states, the orientation sample can be identified with high accuracy. You can That is, the invention of this application does not remove the influence of the orientation but positively uses the orientation.

【0012】ところで、2次元データは当然1次元デー
タよりも情報量が多いため、膨大な処理が必要となる。
そこで、この出願の発明では、2次元X線回折線データ
を基に、デバイリング方向のX線回折強度の平均値を指
定した幅で計算した赤道方向に対するX線回折強度のプ
ロファイルデータを作成し、それを標準データベースに
記憶させておき、試料について測定した2次元X線回折
線データを基に作成した同様なプロファイルデータと標
準データベース内のプロファイルデータとを比較するこ
とにより、試料の同定を行うこともできる。図2は、デ
バイリング方向データおよびそれを変換したプロファイ
ルデータを例示した概要図である。
By the way, since two-dimensional data naturally has a larger amount of information than one-dimensional data, enormous processing is required.
Therefore, in the invention of this application, based on the two-dimensional X-ray diffraction line data, the profile data of the X-ray diffraction intensity for the equatorial direction calculated with the specified width of the average value of the X-ray diffraction intensity in the Debye ring direction is created. , The sample is identified by storing it in a standard database and comparing similar profile data created based on the two-dimensional X-ray diffraction line data measured for the sample with the profile data in the standard database. You can also FIG. 2 is a schematic diagram illustrating the Debye ring direction data and profile data obtained by converting the data.

【0013】このプロファイルデータは2次元X線回折
線データを1次元データに変換したものなので、処理量
を抑えて同定スピードを速めることができるのはもちろ
んのこと、配向試料の同定精度も十分に高いものとする
ことができる。
Since the profile data is obtained by converting the two-dimensional X-ray diffraction line data into one-dimensional data, it is of course possible to suppress the processing amount and accelerate the identification speed, and also the identification accuracy of the oriented sample is sufficiently high. Can be expensive.

【0014】またさらに、この出願の発明では、2次元
X線回折線データおよびプロファイルデータの両方を標
準データベースに、たとえば前者を標準データ、後者を
サブ標準データとして記憶させ、まずサブ標準データと
してのプロファイルデータと試料についてのプロファイ
ルデータとの第1比較を行い、それにより検索された標
準物質の2次元X線回折線データと試料の2次元X線回
折線データとの第2比較を行うようにしてもよい。
Furthermore, in the invention of this application, both the two-dimensional X-ray diffraction line data and the profile data are stored in a standard database, for example, the former as standard data and the latter as sub-standard data. A first comparison is made between the profile data and the profile data for the sample, and a second comparison is made between the two-dimensional X-ray diffraction line data of the standard substance and the two-dimensional X-ray diffraction line data of the sample retrieved by the first comparison. May be.

【0015】この二段階比較により、1次元データに基
づく比較同定を行い、それを確実なものとするために2
次元データに基づく比較同定を行えばよいので、処理量
の低減とともに、さらに正確な試料同定が可能となる。
By this two-step comparison, comparative identification based on one-dimensional data is carried out, and in order to make it reliable, 2
Since it is sufficient to perform the comparative identification based on the dimension data, it is possible to reduce the throughput and to identify the sample more accurately.

【0016】なおこの場合において、第1比較での一致
度にある程度の幅を設けて、複数の標準物質が抽出され
るようにし(いわゆるスクリーニングである)、1次ス
クリーニングされた各標準物質に対して第2比較を行え
ば、一致度の高い標準物質をより容易に見つけ出すこと
ができる。
In this case, the degree of agreement in the first comparison is set to have a certain range so that a plurality of standard substances can be extracted (so-called screening). If the second comparison is performed using the second comparison, a standard substance having a high degree of agreement can be more easily found.

【0017】標準データベースとの比較においては、2
次元X線回折線データ同士の比較は、たとえば、図3に
例示したように2次元X線回折線データを複数の円弧デ
ータに切り出し、各円弧データ毎に行うことができる。
この円弧データの切り出しは、等間隔でもランダム間隔
でもよい。
In comparison with the standard database, 2
The two-dimensional X-ray diffraction line data can be compared with each other, for example, by cutting the two-dimensional X-ray diffraction line data into a plurality of arc data as illustrated in FIG.
The arc data may be cut out at regular intervals or at random intervals.

【0018】そして、切り出した円弧データ毎に、たと
えば相関係数を使って比較する。もちろんプロファイル
データ同士の比較にも相関係数を用いることができる。
相関係数の大きい順に並べることで一致する可能性が示
される。
Then, the cut-out circular arc data are compared with each other using, for example, a correlation coefficient. Of course, the correlation coefficient can be used to compare the profile data with each other.
The possibility of agreement is shown by arranging in order of increasing correlation coefficient.

【0019】以上のこの出願の発明の物質同定方法は、
2次元X線回折線データの測定については2次元ディテ
クタにより行われるが、得られた2次元X線回折線デー
タを基にしたプロファイルデータ作成やデータ比較はコ
ンピュータにより実行される。したがって、2次元ディ
テクタと同定装置としてのコンピュータとを備えた物質
同定システムによれば、物質の自動同定が可能となる。
当然、2次元ディテクタからの測定値をコンピュータへ
送信可能に構築することが好ましい。また、標準データ
ベースはコンピュータの記憶手段に構築されていても、
別体のデータベース装置となっていてもよく、後者の場
合ではたとえば図4に例示したようにコンピュータとの
間でのデータ通信が可能に構築されることは言うまでも
ない。
The substance identification method of the invention of the above application is as follows:
The measurement of the two-dimensional X-ray diffraction line data is performed by a two-dimensional detector, but the computer creates the profile data based on the obtained two-dimensional X-ray diffraction line data and compares the data. Therefore, according to the substance identification system including the two-dimensional detector and the computer as the identification device, it is possible to automatically identify the substance.
Of course, it is preferable to construct so that the measurement values from the two-dimensional detector can be transmitted to the computer. Also, even if the standard database is built in the storage means of the computer,
Needless to say, it may be a separate database device, and in the latter case, for example, data communication with a computer is possible as illustrated in FIG.

【0020】なお、2次元ディテクタによる2次元X線
回折測定時には、配向試料の取付け方で方位がずれるこ
とがあるので、この補正を対称性が生じる方向に回転し
ておくことが好ましい。たとえば、繊維試料のような繊
維配向している試料については、対称性がよいので、取
付け位置によっては図5(a)に例示したような測定と
なってしまう。このため、試料をその対称性がでる、つ
まり相関がでる位置に回転することで、図5(b)に例
示したような測定データが得られ、常に正確な比較が可
能となる。
In the two-dimensional X-ray diffraction measurement using the two-dimensional detector, the orientation may be deviated depending on how the orientation sample is attached. Therefore, it is preferable to rotate this correction in a direction in which symmetry occurs. For example, a sample having a fiber orientation such as a fiber sample has good symmetry, so that the measurement as illustrated in FIG. Therefore, when the sample is rotated to a position where its symmetry appears, that is, a correlation appears, the measurement data illustrated in FIG. 5B is obtained, and accurate comparison is always possible.

【0021】もちろん、この出願の発明の細部について
はより様々な態様が可能であることは言うでもない。
Of course, it goes without saying that more details of the invention of this application are possible.

【0022】[0022]

【発明の効果】以上詳しく説明したとおり、この出願の
発明によって、配向試料についても高精度で同定を行う
ことのできる、新しい物質同定方法および物質同定シス
テムが提供される。
As described in detail above, the invention of this application provides a new substance identification method and substance identification system which can identify an oriented sample with high accuracy.

【図面の簡単な説明】[Brief description of drawings]

【図1】この出願の発明の物質同定方法を説明するため
の図である。
FIG. 1 is a diagram for explaining a substance identification method of the invention of this application.

【図2】デバイリング方向データおよびそれを変換した
プロファイルデータを説明するための図である。
FIG. 2 is a diagram for explaining Debye ring direction data and profile data obtained by converting the data.

【図3】円弧データの切出しを説明するための図であ
る。
FIG. 3 is a diagram for explaining cutting out of arc data.

【図4】この出願の発明の物質同定システムの一例を示
したブロック図である。
FIG. 4 is a block diagram showing an example of a substance identification system of the invention of this application.

【図5】(a)(b)は配向試料の回転を説明するため
の図である。
5 (a) and 5 (b) are diagrams for explaining rotation of an oriented sample.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 複数の物質に関する赤道方向およびデバ
イリング方向の2次元X線回折線データを記憶した標準
データベースと、被測定物質の赤道方向およびデバイリ
ング方向の2次元X線回折線データとを比較することに
より、被測定物質の同定を行うことを特徴とする物質同
定方法。
1. A standard database in which two-dimensional X-ray diffraction line data in the equatorial direction and debye ringing direction of a plurality of substances are stored and two-dimensional x-ray diffraction line data in the equatorial direction and the debye ringing direction of a substance to be measured are stored. A substance identification method characterized in that a substance to be measured is identified by comparison.
【請求項2】 複数の物質に関するデバイリング方向の
X線回折強度平均値を計算した赤道方向に対するX線回
折強度のプロファイルデータを記憶した標準データベー
スと、被測定物質のデバイリング方向のX線回折強度平
均値を計算した赤道方向に対するX線回折強度のプロフ
ァイルデータとを比較することにより、被測定物質の同
定を行うことを特徴とする物質同定方法。
2. A standard database storing profile data of X-ray diffraction intensities with respect to the equatorial direction, in which average values of X-ray diffraction intensities in the Debye ring direction of a plurality of substances are stored, and X-ray diffraction in the Debye ring direction of a substance to be measured. A substance identification method, characterized in that the substance to be measured is identified by comparing the profile data of the X-ray diffraction intensity with respect to the equatorial direction in which the intensity average value is calculated.
【請求項3】 複数の物質に関する、赤道方向およびデ
バイリング方向の2次元X線回折線データ、ならびにデ
バイリング方向のX線回折強度平均値を計算した赤道方
向に対するX線回折強度のプロファイルデータを記憶し
た標準データベースと、被測定物質のデバイリング方向
のX線回折強度平均値を計算した赤道方向に対するX線
回折強度のプロファイルデータとの第1比較および赤道
方向およびデバイリング方向の2次元X線回折線データ
との第2比較を行うことにより、被測定物質の同定を行
うことを特徴とする物質同定方法。
3. The two-dimensional X-ray diffraction line data in the equatorial direction and the Debye ring direction and the profile data of the X-ray diffraction intensity in the equatorial line direction in which the average value of the X-ray diffraction intensity in the Debye ring direction is calculated for a plurality of substances. First comparison between the stored standard database and profile data of X-ray diffraction intensity with respect to the equatorial direction in which the average value of X-ray diffraction intensity in the Debye ring direction of the measured substance is calculated, and two-dimensional X-rays in the equatorial direction and the Debye ring direction A substance identification method characterized in that a substance to be measured is identified by performing a second comparison with diffraction line data.
【請求項4】 2次元X線回折線データ同士の比較は、
2次元X線回折線データを複数の円弧データに切り出
し、各円弧データ毎に行う請求項1または3の物質同定
方法。
4. Comparison of two-dimensional X-ray diffraction line data with each other
The substance identification method according to claim 1 or 3, wherein the two-dimensional X-ray diffraction line data is cut out into a plurality of pieces of arc data, and each piece of arc data is cut out.
【請求項5】 標準データベースの各データと被測定物
質の各データとの比較は相関係数を用いて行う請求項1
ないし4のいずれかの物質同定方法。
5. The correlation coefficient is used to compare each data in the standard database with each data of the substance to be measured.
5. The substance identification method according to any one of 1 to 4.
【請求項6】 2次元ディテクタと、請求項1ないし5
のいずれかの物質同定方法を用いて被測定物質の同定を
行う同定装置とを備えていることを特徴とする物質同定
システム。
6. A two-dimensional detector, and any one of claims 1 to 5.
2. A substance identification system, comprising: an identification device that identifies a substance to be measured using any one of the substance identification methods described above.
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