JP2002122990A - Photosensitive polyimide precursor composition - Google Patents
Photosensitive polyimide precursor compositionInfo
- Publication number
- JP2002122990A JP2002122990A JP2000313224A JP2000313224A JP2002122990A JP 2002122990 A JP2002122990 A JP 2002122990A JP 2000313224 A JP2000313224 A JP 2000313224A JP 2000313224 A JP2000313224 A JP 2000313224A JP 2002122990 A JP2002122990 A JP 2002122990A
- Authority
- JP
- Japan
- Prior art keywords
- polyimide precursor
- polymer
- bis
- precursor composition
- carbon atoms
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229920001721 polyimide Polymers 0.000 title claims abstract description 47
- 239000004642 Polyimide Substances 0.000 title claims abstract description 41
- 239000000203 mixture Substances 0.000 title claims abstract description 32
- 239000002243 precursor Substances 0.000 title claims abstract description 32
- 229920000642 polymer Polymers 0.000 claims abstract description 27
- -1 acrylate compound Chemical class 0.000 claims abstract description 26
- 125000000962 organic group Chemical group 0.000 claims abstract description 22
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 11
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 claims abstract description 5
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims abstract description 5
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims abstract description 5
- 125000004432 carbon atom Chemical group C* 0.000 claims description 20
- 229910052739 hydrogen Inorganic materials 0.000 claims description 8
- 239000001257 hydrogen Substances 0.000 claims description 8
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims description 8
- 125000001183 hydrocarbyl group Chemical group 0.000 claims description 4
- 239000003513 alkali Substances 0.000 claims description 2
- 229910021645 metal ion Inorganic materials 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 229910001413 alkali metal ion Inorganic materials 0.000 abstract description 4
- 239000002966 varnish Substances 0.000 description 19
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 14
- 239000002904 solvent Substances 0.000 description 14
- 238000011161 development Methods 0.000 description 13
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 12
- BGTOWKSIORTVQH-UHFFFAOYSA-N cyclopentanone Chemical compound O=C1CCCC1 BGTOWKSIORTVQH-UHFFFAOYSA-N 0.000 description 12
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 10
- 239000002253 acid Substances 0.000 description 9
- 239000004094 surface-active agent Substances 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 238000000576 coating method Methods 0.000 description 8
- 238000000034 method Methods 0.000 description 8
- 238000003786 synthesis reaction Methods 0.000 description 8
- 239000011248 coating agent Substances 0.000 description 7
- 238000012545 processing Methods 0.000 description 7
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 6
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 6
- 239000013256 coordination polymer Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 6
- 238000010438 heat treatment Methods 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 5
- 150000001875 compounds Chemical class 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 150000004985 diamines Chemical class 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- CYIDZMCFTVVTJO-UHFFFAOYSA-N pyromellitic acid Chemical compound OC(=O)C1=CC(C(O)=O)=C(C(O)=O)C=C1C(O)=O CYIDZMCFTVVTJO-UHFFFAOYSA-N 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 description 3
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 3
- NPKSPKHJBVJUKB-UHFFFAOYSA-N N-phenylglycine Chemical compound OC(=O)CNC1=CC=CC=C1 NPKSPKHJBVJUKB-UHFFFAOYSA-N 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 3
- 125000003118 aryl group Chemical group 0.000 description 3
- 238000009835 boiling Methods 0.000 description 3
- 229920001577 copolymer Polymers 0.000 description 3
- 238000001723 curing Methods 0.000 description 3
- 238000001035 drying Methods 0.000 description 3
- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 3
- 230000014759 maintenance of location Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- POILWHVDKZOXJZ-ARJAWSKDSA-M (z)-4-oxopent-2-en-2-olate Chemical compound C\C([O-])=C\C(C)=O POILWHVDKZOXJZ-ARJAWSKDSA-M 0.000 description 2
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 2
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 2
- QRIMLDXJAPZHJE-UHFFFAOYSA-N 2,3-dihydroxypropyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC(O)CO QRIMLDXJAPZHJE-UHFFFAOYSA-N 0.000 description 2
- XLLIQLLCWZCATF-UHFFFAOYSA-N 2-methoxyethyl acetate Chemical compound COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- NBAUUNCGSMAPFM-UHFFFAOYSA-N 3-(3,4-dicarboxyphenyl)phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C1=CC=CC(C(O)=O)=C1C(O)=O NBAUUNCGSMAPFM-UHFFFAOYSA-N 0.000 description 2
- GPXCORHXFPYJEH-UHFFFAOYSA-N 3-[[3-aminopropyl(dimethyl)silyl]oxy-dimethylsilyl]propan-1-amine Chemical group NCCC[Si](C)(C)O[Si](C)(C)CCCN GPXCORHXFPYJEH-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- UITKHKNFVCYWNG-UHFFFAOYSA-N 4-(3,4-dicarboxybenzoyl)phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1 UITKHKNFVCYWNG-UHFFFAOYSA-N 0.000 description 2
- LFBALUPVVFCEPA-UHFFFAOYSA-N 4-(3,4-dicarboxyphenyl)phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)C(C(O)=O)=C1 LFBALUPVVFCEPA-UHFFFAOYSA-N 0.000 description 2
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 2
- LDQMZKBIBRAZEA-UHFFFAOYSA-N 4-amino-2-aminobenzoic acid Natural products NC1=CC=C(C(O)=O)C(N)=C1 LDQMZKBIBRAZEA-UHFFFAOYSA-N 0.000 description 2
- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 102100026735 Coagulation factor VIII Human genes 0.000 description 2
- XXRCUYVCPSWGCC-UHFFFAOYSA-N Ethyl pyruvate Chemical compound CCOC(=O)C(C)=O XXRCUYVCPSWGCC-UHFFFAOYSA-N 0.000 description 2
- 101000911390 Homo sapiens Coagulation factor VIII Proteins 0.000 description 2
- ZSXGLVDWWRXATF-UHFFFAOYSA-N N,N-dimethylformamide dimethyl acetal Chemical compound COC(OC)N(C)C ZSXGLVDWWRXATF-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 125000006615 aromatic heterocyclic group Chemical group 0.000 description 2
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 2
- 239000013522 chelant Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- BHXIWUJLHYHGSJ-UHFFFAOYSA-N ethyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OCC BHXIWUJLHYHGSJ-UHFFFAOYSA-N 0.000 description 2
- 229940116333 ethyl lactate Drugs 0.000 description 2
- 229940117360 ethyl pyruvate Drugs 0.000 description 2
- CATSNJVOTSVZJV-UHFFFAOYSA-N heptan-2-one Chemical compound CCCCCC(C)=O CATSNJVOTSVZJV-UHFFFAOYSA-N 0.000 description 2
- 125000005462 imide group Chemical group 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- BDJSOPWXYLFTNW-UHFFFAOYSA-N methyl 3-methoxypropanoate Chemical compound COCCC(=O)OC BDJSOPWXYLFTNW-UHFFFAOYSA-N 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 239000003960 organic solvent Substances 0.000 description 2
- 239000003504 photosensitizing agent Substances 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical class C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- GGAUUQHSCNMCAU-ZXZARUISSA-N (2s,3r)-butane-1,2,3,4-tetracarboxylic acid Chemical compound OC(=O)C[C@H](C(O)=O)[C@H](C(O)=O)CC(O)=O GGAUUQHSCNMCAU-ZXZARUISSA-N 0.000 description 1
- QVIJIEXWEFBCPP-UHFFFAOYSA-N (3-aminophenyl)carbamic acid Chemical compound NC1=CC=CC(NC(O)=O)=C1 QVIJIEXWEFBCPP-UHFFFAOYSA-N 0.000 description 1
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 1
- IQFUADQPSYSDIP-UHFFFAOYSA-N (4-aminophenyl)carbamic acid Chemical compound NC1=CC=C(NC(O)=O)C=C1 IQFUADQPSYSDIP-UHFFFAOYSA-N 0.000 description 1
- YFKBXYGUSOXJGS-UHFFFAOYSA-N 1,3-Diphenyl-2-propanone Chemical compound C=1C=CC=CC=1CC(=O)CC1=CC=CC=C1 YFKBXYGUSOXJGS-UHFFFAOYSA-N 0.000 description 1
- UNYPOFWEGVYMRJ-UHFFFAOYSA-N 1-azidoanthracene-9,10-dione Chemical compound O=C1C2=CC=CC=C2C(=O)C2=C1C=CC=C2N=[N+]=[N-] UNYPOFWEGVYMRJ-UHFFFAOYSA-N 0.000 description 1
- OOIVVPYWLAIGDT-UHFFFAOYSA-N 1-n,3-n,3-n-trimethylbenzene-1,3-diamine Chemical compound CNC1=CC=CC(N(C)C)=C1 OOIVVPYWLAIGDT-UHFFFAOYSA-N 0.000 description 1
- UQBNGMRDYGPUOO-UHFFFAOYSA-N 1-n,3-n-dimethylbenzene-1,3-diamine Chemical compound CNC1=CC=CC(NC)=C1 UQBNGMRDYGPUOO-UHFFFAOYSA-N 0.000 description 1
- AWXUBHMURFEJMY-UHFFFAOYSA-N 1-n,4-n,4-n-trimethylbenzene-1,4-diamine Chemical compound CNC1=CC=C(N(C)C)C=C1 AWXUBHMURFEJMY-UHFFFAOYSA-N 0.000 description 1
- YXAOOTNFFAQIPZ-UHFFFAOYSA-N 1-nitrosonaphthalen-2-ol Chemical compound C1=CC=CC2=C(N=O)C(O)=CC=C21 YXAOOTNFFAQIPZ-UHFFFAOYSA-N 0.000 description 1
- MTEZSDOQASFMDI-UHFFFAOYSA-N 1-trimethoxysilylpropan-1-ol Chemical compound CCC(O)[Si](OC)(OC)OC MTEZSDOQASFMDI-UHFFFAOYSA-N 0.000 description 1
- NKNIZOPLGAJLRV-UHFFFAOYSA-N 2,2-diphenylpropane-1,1-diamine Chemical compound C=1C=CC=CC=1C(C(N)N)(C)C1=CC=CC=C1 NKNIZOPLGAJLRV-UHFFFAOYSA-N 0.000 description 1
- KKTUQAYCCLMNOA-UHFFFAOYSA-N 2,3-diaminobenzoic acid Chemical compound NC1=CC=CC(C(O)=O)=C1N KKTUQAYCCLMNOA-UHFFFAOYSA-N 0.000 description 1
- PCAXITAPTVOLGL-UHFFFAOYSA-N 2,3-diaminophenol Chemical compound NC1=CC=CC(O)=C1N PCAXITAPTVOLGL-UHFFFAOYSA-N 0.000 description 1
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 description 1
- QHDSBTKCTUXBEG-UHFFFAOYSA-N 2-[2-(2-aminophenoxy)phenoxy]aniline Chemical compound NC1=CC=CC=C1OC1=CC=CC=C1OC1=CC=CC=C1N QHDSBTKCTUXBEG-UHFFFAOYSA-N 0.000 description 1
- NXLQPXAUWAWQOB-UHFFFAOYSA-N 2-[2-[2-(2-aminoethyl)phenoxy]phenyl]ethanamine Chemical compound NCCC1=CC=CC=C1OC1=CC=CC=C1CCN NXLQPXAUWAWQOB-UHFFFAOYSA-N 0.000 description 1
- OHIHDCVTVZRSJC-UHFFFAOYSA-N 2-[2-[2-(2-aminoethyl)phenyl]sulfonylphenyl]ethanamine Chemical compound NCCC1=CC=CC=C1S(=O)(=O)C1=CC=CC=C1CCN OHIHDCVTVZRSJC-UHFFFAOYSA-N 0.000 description 1
- NODBCGAUEYHBND-UHFFFAOYSA-N 2-[2-[[2-(2-aminoethyl)phenyl]methyl]phenyl]ethanamine Chemical compound NCCC1=CC=CC=C1CC1=CC=CC=C1CCN NODBCGAUEYHBND-UHFFFAOYSA-N 0.000 description 1
- OJPDDQSCZGTACX-UHFFFAOYSA-N 2-[n-(2-hydroxyethyl)anilino]ethanol Chemical compound OCCN(CCO)C1=CC=CC=C1 OJPDDQSCZGTACX-UHFFFAOYSA-N 0.000 description 1
- MSTZGVRUOMBULC-UHFFFAOYSA-N 2-amino-4-[2-(3-amino-4-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phenol Chemical compound C1=C(O)C(N)=CC(C(C=2C=C(N)C(O)=CC=2)(C(F)(F)F)C(F)(F)F)=C1 MSTZGVRUOMBULC-UHFFFAOYSA-N 0.000 description 1
- XMOJDDYUUPGBIT-UHFFFAOYSA-N 2-amino-6-[2-(3-amino-2-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phenol Chemical compound NC1=CC=CC(C(C=2C(=C(N)C=CC=2)O)(C(F)(F)F)C(F)(F)F)=C1O XMOJDDYUUPGBIT-UHFFFAOYSA-N 0.000 description 1
- HUVMDVMRZUVXIK-UHFFFAOYSA-N 2-azido-1,3-diphenylprop-2-en-1-one Chemical compound C=1C=CC=CC=1C(=O)C(N=[N+]=[N-])=CC1=CC=CC=C1 HUVMDVMRZUVXIK-UHFFFAOYSA-N 0.000 description 1
- MYISVPVWAQRUTL-UHFFFAOYSA-N 2-methylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3SC2=C1 MYISVPVWAQRUTL-UHFFFAOYSA-N 0.000 description 1
- KTALPKYXQZGAEG-UHFFFAOYSA-N 2-propan-2-ylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C(C)C)=CC=C3SC2=C1 KTALPKYXQZGAEG-UHFFFAOYSA-N 0.000 description 1
- XBTHNZXADRSYPR-UHFFFAOYSA-N 3-(1,1,1,3,3,3-hexafluoro-2-phenylpropan-2-yl)benzene-1,2-diamine Chemical compound NC1=CC=CC(C(C=2C=CC=CC=2)(C(F)(F)F)C(F)(F)F)=C1N XBTHNZXADRSYPR-UHFFFAOYSA-N 0.000 description 1
- DOJDHOJUHISJIT-UHFFFAOYSA-N 3-(3-amino-2-phenoxyphenoxy)-2-phenoxyaniline Chemical compound C=1C=CC=CC=1OC=1C(N)=CC=CC=1OC1=CC=CC(N)=C1OC1=CC=CC=C1 DOJDHOJUHISJIT-UHFFFAOYSA-N 0.000 description 1
- NHJNWRVCOATWGF-UHFFFAOYSA-N 3-(3-amino-2-phenoxyphenyl)sulfonyl-2-phenoxyaniline Chemical compound NC1=CC=CC(S(=O)(=O)C=2C(=C(N)C=CC=2)OC=2C=CC=CC=2)=C1OC1=CC=CC=C1 NHJNWRVCOATWGF-UHFFFAOYSA-N 0.000 description 1
- SMBSZJBWYCGCJP-UHFFFAOYSA-N 3-(diethylamino)chromen-2-one Chemical compound C1=CC=C2OC(=O)C(N(CC)CC)=CC2=C1 SMBSZJBWYCGCJP-UHFFFAOYSA-N 0.000 description 1
- JHFFZUDXMFVENY-UHFFFAOYSA-N 3-[(3-amino-2-chlorophenyl)methyl]-2-chloroaniline Chemical compound NC1=CC=CC(CC=2C(=C(N)C=CC=2)Cl)=C1Cl JHFFZUDXMFVENY-UHFFFAOYSA-N 0.000 description 1
- WRYQQAHYGHCEQE-UHFFFAOYSA-N 3-[(3-amino-2-phenoxyphenyl)methyl]-2-phenoxyaniline Chemical compound C=1C=CC=CC=1OC=1C(N)=CC=CC=1CC1=CC=CC(N)=C1OC1=CC=CC=C1 WRYQQAHYGHCEQE-UHFFFAOYSA-N 0.000 description 1
- DIRYWKMUDQKIKC-UHFFFAOYSA-N 3-[2-(3-amino-2-phenoxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-phenoxyaniline Chemical compound NC1=CC=CC(C(C=2C(=C(N)C=CC=2)OC=2C=CC=CC=2)(C(F)(F)F)C(F)(F)F)=C1OC1=CC=CC=C1 DIRYWKMUDQKIKC-UHFFFAOYSA-N 0.000 description 1
- ULPWATNJVBJKGM-UHFFFAOYSA-N 3-[2-(3-amino-2-phenoxyphenyl)propan-2-yl]-2-phenoxyaniline Chemical compound C=1C=CC(N)=C(OC=2C=CC=CC=2)C=1C(C)(C)C1=CC=CC(N)=C1OC1=CC=CC=C1 ULPWATNJVBJKGM-UHFFFAOYSA-N 0.000 description 1
- AYYAHNKZUPFRSL-UHFFFAOYSA-N 3-[2-[3-amino-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-(trifluoromethyl)aniline Chemical compound NC1=CC=CC(C(C=2C(=C(N)C=CC=2)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1C(F)(F)F AYYAHNKZUPFRSL-UHFFFAOYSA-N 0.000 description 1
- OILQCHXXZLKFGZ-UHFFFAOYSA-N 3-[2-[3-amino-2-(trifluoromethyl)phenyl]propan-2-yl]-2-(trifluoromethyl)aniline Chemical compound C=1C=CC(N)=C(C(F)(F)F)C=1C(C)(C)C1=CC=CC(N)=C1C(F)(F)F OILQCHXXZLKFGZ-UHFFFAOYSA-N 0.000 description 1
- ILDLZHYKUHDWOE-UHFFFAOYSA-N 3-[3-amino-2-(trifluoromethyl)phenoxy]-2-(trifluoromethyl)aniline Chemical compound NC1=CC=CC(OC=2C(=C(N)C=CC=2)C(F)(F)F)=C1C(F)(F)F ILDLZHYKUHDWOE-UHFFFAOYSA-N 0.000 description 1
- OHUYOONRBRAWFG-UHFFFAOYSA-N 3-[3-amino-2-(trifluoromethyl)phenyl]sulfonyl-2-(trifluoromethyl)aniline Chemical compound NC1=CC=CC(S(=O)(=O)C=2C(=C(N)C=CC=2)C(F)(F)F)=C1C(F)(F)F OHUYOONRBRAWFG-UHFFFAOYSA-N 0.000 description 1
- FCSBHOKNHNSTOX-UHFFFAOYSA-N 3-[[3-amino-2-(trifluoromethyl)phenyl]methyl]-2-(trifluoromethyl)aniline Chemical compound NC1=CC=CC(CC=2C(=C(N)C=CC=2)C(F)(F)F)=C1C(F)(F)F FCSBHOKNHNSTOX-UHFFFAOYSA-N 0.000 description 1
- AAYMVIUILSVWQK-UHFFFAOYSA-N 3-n-bromobenzene-1,3-diamine Chemical compound NC1=CC=CC(NBr)=C1 AAYMVIUILSVWQK-UHFFFAOYSA-N 0.000 description 1
- XAXXXFOWCPSWLO-UHFFFAOYSA-N 3-n-chlorobenzene-1,3-diamine Chemical compound NC1=CC=CC(NCl)=C1 XAXXXFOWCPSWLO-UHFFFAOYSA-N 0.000 description 1
- FWPNSTBELLMQOW-UHFFFAOYSA-N 3-n-methoxybenzene-1,3-diamine Chemical compound CONC1=CC=CC(N)=C1 FWPNSTBELLMQOW-UHFFFAOYSA-N 0.000 description 1
- DYNWNNKAUGBOOZ-UHFFFAOYSA-N 3-n-methylbenzene-1,3-diamine Chemical compound CNC1=CC=CC(N)=C1 DYNWNNKAUGBOOZ-UHFFFAOYSA-N 0.000 description 1
- JJZNCUHIYJBAMS-UHFFFAOYSA-N 3-phenyl-2h-1,2-oxazol-5-one Chemical compound N1OC(=O)C=C1C1=CC=CC=C1 JJZNCUHIYJBAMS-UHFFFAOYSA-N 0.000 description 1
- XDLMVUHYZWKMMD-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(C)=C XDLMVUHYZWKMMD-UHFFFAOYSA-N 0.000 description 1
- JCZGZRWDWZWOKN-UHFFFAOYSA-N 4-(3,4-dicarboxyphenyl)-3-phenylphthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)C(C(O)=O)=C1C1=CC=CC=C1 JCZGZRWDWZWOKN-UHFFFAOYSA-N 0.000 description 1
- AVCOFPOLGHKJQB-UHFFFAOYSA-N 4-(3,4-dicarboxyphenyl)sulfonylphthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1S(=O)(=O)C1=CC=C(C(O)=O)C(C(O)=O)=C1 AVCOFPOLGHKJQB-UHFFFAOYSA-N 0.000 description 1
- CMUXNSYLMJIRAH-UHFFFAOYSA-N 4-(4-amino-2,3-diethylphenoxy)-2,3-diethylaniline Chemical compound CCC1=C(N)C=CC(OC=2C(=C(CC)C(N)=CC=2)CC)=C1CC CMUXNSYLMJIRAH-UHFFFAOYSA-N 0.000 description 1
- DUVBGRVKPIKDLU-UHFFFAOYSA-N 4-(4-amino-2,3-diethylphenyl)sulfonyl-2,3-diethylaniline Chemical compound CCC1=C(N)C=CC(S(=O)(=O)C=2C(=C(CC)C(N)=CC=2)CC)=C1CC DUVBGRVKPIKDLU-UHFFFAOYSA-N 0.000 description 1
- XRLCJMLUANVBPF-UHFFFAOYSA-N 4-(4-amino-2,3-dimethylphenoxy)-2,3-dimethylaniline Chemical compound C1=C(N)C(C)=C(C)C(OC=2C(=C(C)C(N)=CC=2)C)=C1 XRLCJMLUANVBPF-UHFFFAOYSA-N 0.000 description 1
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- DLEPYXFUDLQGDW-UHFFFAOYSA-N FC(F)(F)NC1=CC=C(C2=CC=C(NC(F)(F)F)C=C2)C=C1 Chemical compound FC(F)(F)NC1=CC=C(C2=CC=C(NC(F)(F)F)C=C2)C=C1 DLEPYXFUDLQGDW-UHFFFAOYSA-N 0.000 description 1
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- OLAPPGSPBNVTRF-UHFFFAOYSA-N naphthalene-1,4,5,8-tetracarboxylic acid Chemical compound C1=CC(C(O)=O)=C2C(C(=O)O)=CC=C(C(O)=O)C2=C1C(O)=O OLAPPGSPBNVTRF-UHFFFAOYSA-N 0.000 description 1
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Landscapes
- Materials For Photolithography (AREA)
- Polymerisation Methods In General (AREA)
- Graft Or Block Polymers (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、半導体デバイス・
多層配線基板などの、電気・電子材料の製造に有用な感
光性ポリイミド前駆体組成物に関するものである。[0001] The present invention relates to a semiconductor device.
The present invention relates to a photosensitive polyimide precursor composition useful for producing electric and electronic materials such as a multilayer wiring board.
【0002】[0002]
【従来の技術】ポリイミドはその優れた耐熱性、電気特
性、機械特性のため、半導体素子や配線の表面保護膜、
多層配線基板の層間絶縁膜、ストレスバッファーコート
などに広く用いられている。さらに、感光性ポリイミド
についてはそれ自身がパターン加工性を有するため、通
常の非感光性ポリイミドをレジスト等を用いてパターン
加工する場合と比べてプロセスの簡略化が可能である。2. Description of the Related Art Polyimide has excellent heat resistance, electrical properties, and mechanical properties.
It is widely used as an interlayer insulating film of a multilayer wiring board, a stress buffer coat, and the like. Further, since photosensitive polyimide itself has pattern processing properties, the process can be simplified as compared with the case where pattern processing is performed on ordinary non-photosensitive polyimide using a resist or the like.
【0003】露光した部分が、現像により残るネガ型の
感光性ポリイミド組成物としては、次のものが知られて
いる。 (イ)ポリアミド酸に、化学線により2量化又は重合可
能な炭素−炭素二重結合、及びアミノ基又はその4級化
塩を炭化した組成物(例えば特公昭59−52822号
公報) (ロ)炭素−炭素二重結合基を有するポリイミド前駆体
と、特定のオキシム化合物と増感剤を含有してなる組成
物(例えば特開昭61−118423号公報、特開昭6
2−184056号公報、特開昭62−273259号
公報)しかしながら、これらの方法について、(イ)で
は、ワニスの安定性が不十分、(ロ)では、製造過程が
複雑になり、また、キュア後の膜物性が劣るといった問
題があった。The following is known as a negative photosensitive polyimide composition in which an exposed portion remains after development. (A) A composition obtained by carbonizing a polyamic acid with a carbon-carbon double bond capable of being dimerized or polymerized by actinic radiation, and an amino group or a quaternized salt thereof (for example, Japanese Patent Publication No. 59-52822). Compositions comprising a polyimide precursor having a carbon-carbon double bond group, a specific oxime compound and a sensitizer (for example, JP-A-61-118423, JP-A-6-118423)
However, in these methods, (a) has insufficient varnish stability, and (b) has a complicated production process and cure. There was a problem that the physical properties of the subsequent film were inferior.
【0004】[0004]
【発明が解決しようとする課題】本発明は、かかる従来
技術の背景に鑑み、安定性に優れ、製造工程が簡略で、
高解像度のパターンが得られ、キュア後に強伸度特性に
優れた物性の膜を提供することができる感光性ポリイミ
ド前駆体組成物を提供せんとするものである。SUMMARY OF THE INVENTION In view of the background of the prior art, the present invention has excellent stability and a simple manufacturing process.
An object of the present invention is to provide a photosensitive polyimide precursor composition capable of providing a high-resolution pattern and providing a film having excellent physical properties after curing.
【0005】[0005]
【課題を解決するための手段】本発明は、かかる課題を
解決するために、次のような手段を採用するものであ
る。すなわち、本発明のポリイミド前駆体組成物は、下
記(a)および(b)を含むことを特徴とするものであ
る。 (a)一般式(1)で表される構造単位を有するポリマ
ー (b)一般式(2)で表される分子内に2つ以上の水酸
基を有する(メタ)アクリレート化合物The present invention employs the following means in order to solve the above-mentioned problems. That is, the polyimide precursor composition of the present invention is characterized by containing the following (a) and (b). (A) Polymer having a structural unit represented by general formula (1) (b) (meth) acrylate compound having two or more hydroxyl groups in a molecule represented by general formula (2)
【0006】[0006]
【化3】 Embedded image
【0007】(R1は少なくとも2個以上の炭素原子を
有する3価または4価の有機基を表し、R2は少なくと
も2個以上の炭素原子を有する2価の有機基を表す。R
3は水素、アルカリ金属イオン、アンモニウムイオン、
または、炭素数1〜30の有機基より選ばれた少なくと
も1種を表す。nは1または2である。)(R 1 represents a trivalent or tetravalent organic group having at least two or more carbon atoms, and R 2 represents a divalent organic group having at least two or more carbon atoms.
3 is hydrogen, alkali metal ion, ammonium ion,
Alternatively, it represents at least one selected from organic groups having 1 to 30 carbon atoms. n is 1 or 2. )
【0008】[0008]
【化4】 Embedded image
【0009】(R4は水素、メチル基、エチル基のいず
れかを表し、R5は炭素数2以上の(m+1)価の有機
基を表す。mは2以上の整数である。)(R 4 represents any one of hydrogen, a methyl group, and an ethyl group, and R 5 represents an (m + 1) -valent organic group having 2 or more carbon atoms, and m is an integer of 2 or more.)
【0010】[0010]
【発明の実施の形態】本発明は、前記課題、つまり、安
定性に優れ、製造工程が簡略で、高解像度のパターンが
得られ、キュア後に強伸度特性に優れた膜を提供するこ
とができるポリイミド前駆体組成物について鋭意検討
し、特定な構造単位を有するポリマーと特定の化合物と
からなるポリイミド前駆体組成物としてみたところ、か
かる課題を一挙に解決することを究明したものである。
すなわち、本発明は、特定なポリイミド前駆体ポリマー
と分子内に2つ以上の水酸基を有する(メタ)アクリレ
ート化合物とを含むポリイミド前駆体組成物である。DESCRIPTION OF THE PREFERRED EMBODIMENTS The object of the present invention is to provide a film which is excellent in stability, has a simple manufacturing process, can obtain a high-resolution pattern, and has excellent elongation characteristics after curing. The present inventors have intensively studied possible polyimide precursor compositions, and as a polyimide precursor composition comprising a polymer having a specific structural unit and a specific compound, they have sought to solve these problems at once.
That is, the present invention is a polyimide precursor composition including a specific polyimide precursor polymer and a (meth) acrylate compound having two or more hydroxyl groups in a molecule.
【0011】本発明のポリイミド前駆体は、下記一般式
(1)で表される構造単位を有し、加熱あるいは適当な
触媒によりイミド環や、その他環状構造を有するポリマ
ー(以後、「ポリイミド系ポリマー」と呼ぶ)となり得
るものを使用することができる。The polyimide precursor of the present invention has a structural unit represented by the following general formula (1), and has a polymer having an imide ring or other cyclic structure by heating or an appropriate catalyst (hereinafter referred to as “polyimide polymer”). ) Can be used.
【0012】[0012]
【化5】 Embedded image
【0013】(R1は少なくとも2個以上の炭素原子を
有する3価または4価の有機基を表し、R2は少なくと
も2個以上の炭素原子を有する2価の有機基を表す。R
3は水素、アルカリ金属イオン、アンモニウムイオン、
または、炭素数1〜30の有機基より選ばれた少なくと
も1種を表す。nは1または2である。) 上記一般式(1)中、R1は少なくとも2個以上の炭素
原子を有する3価または4価の有機基であり、ポリイミ
ド系ポリマーの耐熱性から、芳香族環または芳香族複素
環を含有し、かつ炭素数6〜30の4価の基が好まし
い。nは1または2である。ポリイミド系ポリマーの耐
熱性の点から、nが2であることが好ましい。R1の好
ましい具体的な例としては、3,3’,4,4’−ビフ
ェニルテトラカルボン酸、3,3’,4,4’−ジフェ
ニルエーテルテトラカルボン酸、3,3’,4,4’−
ジフェニルヘキサフルオロプロパンテトラカルボン酸、
3,3’,4,4’−ベンゾフェノンテトラカルボン
酸、3,3’,4,4’−ジフェニルスルホンテトラカ
ルボン酸、ピロメリット酸、ブタンテトラカルボン酸、
シクロペンタンテトラカルボン酸、2,3’,3,4’
−ビフェニルテトラカルボン酸、3,3’,4,4’−
ジフェニルメタンテトラカルボン酸、3,3’,4,
4’−ターフェニルテトラカルボン酸、1,4,5,8
−ナフタレンテトラカルボン酸などの残基が挙げられる
が、これらに限定されない。ポリイミド系ポリマーの耐
熱性の点から、特に好ましい具体例としては、3,
3’,4,4’−ビフェニルテトラカルボン酸、3,
3’,4,4’−ジフェニルエーテルテトラカルボン
酸、3,3’,4,4’−ジフェニルヘキサフルオロプ
ロパンテトラカルボン酸、3,3’,4,4’−ベンゾ
フェノンテトラカルボン酸、3,3’,4,4’−ジフ
ェニルスルホンテトラカルボン酸、ピロメリット酸、
2,3’,3,4’−ビフェニルテトラカルボン酸、
3,3’,4,4’−ジフェニルメタンテトラカルボン
酸、3,3’,4,4’−ターフェニルテトラカルボン
酸、1,4,5,8−ナフタレンテトラカルボン酸など
の残基が挙げられる。本発明におけるポリイミド前駆体
は、R1が1種であっても良いし、2種以上から構成さ
れる共重合体であっても構わない。(R 1 represents a trivalent or tetravalent organic group having at least two or more carbon atoms, and R 2 represents a divalent organic group having at least two or more carbon atoms.
3 is hydrogen, alkali metal ion, ammonium ion,
Alternatively, it represents at least one selected from organic groups having 1 to 30 carbon atoms. n is 1 or 2. In the general formula (1), R 1 is a trivalent or tetravalent organic group having at least two or more carbon atoms, and contains an aromatic ring or an aromatic heterocyclic ring due to heat resistance of the polyimide polymer. And a tetravalent group having 6 to 30 carbon atoms is preferable. n is 1 or 2. From the viewpoint of the heat resistance of the polyimide polymer, n is preferably 2. Preferred specific examples of R 1 include 3,3 ′, 4,4′-biphenyltetracarboxylic acid, 3,3 ′, 4,4′-diphenylethertetracarboxylic acid, 3,3 ′, 4,4 ′ −
Diphenylhexafluoropropanetetracarboxylic acid,
3,3 ′, 4,4′-benzophenonetetracarboxylic acid, 3,3 ′, 4,4′-diphenylsulfonetetracarboxylic acid, pyromellitic acid, butanetetracarboxylic acid,
Cyclopentanetetracarboxylic acid, 2,3 ', 3,4'
-Biphenyltetracarboxylic acid, 3,3 ', 4,4'-
Diphenylmethanetetracarboxylic acid, 3,3 ′, 4
4'-terphenyltetracarboxylic acid, 1,4,5,8
Residues such as, but not limited to, -naphthalenetetracarboxylic acid. From the viewpoint of the heat resistance of the polyimide-based polymer, a particularly preferred specific example is 3,
3 ', 4,4'-biphenyltetracarboxylic acid, 3,
3 ′, 4,4′-diphenylethertetracarboxylic acid, 3,3 ′, 4,4′-diphenylhexafluoropropanetetracarboxylic acid, 3,3 ′, 4,4′-benzophenonetetracarboxylic acid, 3,3 ′ , 4,4'-diphenylsulfonetetracarboxylic acid, pyromellitic acid,
2,3 ′, 3,4′-biphenyltetracarboxylic acid,
Residues such as 3,3 ', 4,4'-diphenylmethanetetracarboxylic acid, 3,3', 4,4'-terphenyltetracarboxylic acid and 1,4,5,8-naphthalenetetracarboxylic acid are exemplified. . The polyimide precursor in the present invention may have one type of R 1 or a copolymer composed of two or more types.
【0014】上記一般式(1)中、R2は少なくとも2
個以上の炭素原子を有する2価の有機基である。ポリイ
ミド系ポリマーの耐熱性の点から、R2は芳香族環また
は芳香族複素環を含有し、かつ炭素数6〜30の2価の
基が好ましい。R2の好ましい具体的な例としては、パ
ラフェニレンジアミン、メタフェニレンジアミン、メチ
ルパラフェニレンジアミン、メチルメタフェニレンジア
ミン、ジメチルパラフェニレンジアミン、ジメチルメタ
フェニレンジアミン、トリメチルパラフェニレンジアミ
ン、トリメチルメタフェニレンジアミン、テトラメチル
パラフェニレンジアミン、テトラメチルメタフェニレン
ジアミン、トリフルオロメチルパラフェニレンジアミ
ン、トリフルオロメチルメタフェニレンジアミン、ビス
(トリフルオロメチル)パラフェニレンジアミン、ビス
(トリフルオロメチル)メタフェニレンジアミン、メト
キシパラフェニレンジアミン、メトキシメタフェニレン
ジアミン、トリフルオロメトキシパラフェニレンジアミ
ン、トリフルオロメトキシメタフェニレンジアミン、フ
ルオロパラフェニレンジアミン、フルオロメタフェニレ
ンジアミン、クロロパラフェニレンジアミン、クロロメ
タフェニレンジアミン、ブロモパラフェニレンジアミ
ン、ブロモメタフェニレンジアミン、カルボキシパラフ
ェニレンジアミン、カルボキシメタフェニレンジアミ
ン、メトキシカルボニルパラフェニレンジアミン、メト
キシカルボニルメタフェニレンジアミン、ジアミノジフ
ェニルメタン、ビス(アミノメチルフェニル)メタン、
ビス(アミノトリフルオロメチルフェニル)メタン、ビ
ス(アミノエチルフェニル)メタン、ビス(アミノクロ
ロフェニル)メタン、ビス(アミノジメチルフェニル)
メタン、ビス(アミノジエチルフェニル)メタン、ジア
ミノジフェニルプロパン、ビス(アミノメチルフェニ
ル)プロパン、ビス(アミノトリフルオロメチルフェニ
ル)プロパン、ビス(アミノエチルフェニル)プロパ
ン、ビス(アミノクロロフェニル)プロパン、ビス(ア
ミノジメチルフェニル)プロパン、ビス(アミノジエチ
ルフェニル)プロパン、ジアミノジフェニルヘキサフル
オロプロパン、ビス(アミノメチルフェニル)ヘキサフ
ルオロプロパン、ビス(アミノトリフルオロメチルフェ
ニル)ヘキサフルオロプロパン、ビス(アミノエチルフ
ェニル)ヘキサフルオロプロパン、ビス(アミノクロロ
フェニル)ヘキサフルオロプロパン、ビス(アミノジメ
チルフェニル)ヘキサフルオロプロパン、ビス(アミノ
ジエチルフェニル)ヘキサフルオロプロパン、ジアミノ
ジフェニルスルホン、ビス(アミノメチルフェニル)ス
ルホン、ビス(アミノエチルフェニル)スルホン、ビス
(アミノトリフルオロメチルフェニル)スルホン、ビス
(アミノジメチルフェニル)スルホン、ビス(アミノジ
エチルフェニル)スルホン、ジアミノジフェニルエーテ
ル、ビス(アミノメチルフェニル)エーテル、ビス(ア
ミノトリフルオロメチルフェニル)エーテル、ビス(ア
ミノエチルフェニル)エーテル、ビス(アミノジメチル
フェニル)エーテル、ビス(アミノジエチルフェニル)
エーテル、ジメチルベンジジン、ビス(トリフルオロメ
チル)ベンジジン、ジクロロベンジジン、ビス(アミノ
フェノキシ)ベンゼン、ビス(アミノフェノキシフェニ
ル)プロパン、ビス(アミノフェノキシフェニル)ヘキ
サフルオロプロパン、ビス(アミノフェノキシフェニ
ル)エーテル、ビス(アミノフェノキシフェニル)メタ
ン、ビス(アミノフェノキシフェニル)スルホン、3,
5−ジアミノ安息香酸メタクロイルエチルエステル、
3,5−ジアミノ安息香酸アクロイルエチルエステル、
2,4−ジアミノ安息香酸メタクロイルエチルエステ
ル、2,4−ジアミノ安息香酸アクロイルエチルエステ
ル、ジアミノ安息香酸、ジヒドロキシベンジジン、ビス
(アミノ−ヒドロキシ−フェニル)ヘキサフルオロプロ
パン、ジアミノフェノールなどの残基及びその水添化合
物の残基などが挙げられるが、これらに限定されない。
本発明におけるポリイミド前駆体は、R2がこれらのう
ち1種から構成されていても良いし、2種以上から構成
される共重合体であっても構わない。In the above general formula (1), R 2 is at least 2
It is a divalent organic group having at least two carbon atoms. In view of the heat resistance of the polyimide polymer, R 2 is preferably a divalent group containing an aromatic ring or an aromatic heterocyclic ring and having 6 to 30 carbon atoms. Preferred specific examples of R 2 include paraphenylenediamine, metaphenylenediamine, methylparaphenylenediamine, methylmetaphenylenediamine, dimethylparaphenylenediamine, dimethylmetaphenylenediamine, trimethylparaphenylenediamine, trimethylmetaphenylenediamine, and tetramethyldiphenylenediamine. Methyl paraphenylenediamine, tetramethyl metaphenylenediamine, trifluoromethyl paraphenylenediamine, trifluoromethyl metaphenylenediamine, bis (trifluoromethyl) paraphenylenediamine, bis (trifluoromethyl) metaphenylenediamine, methoxyparaphenylenediamine, Methoxymetaphenylenediamine, trifluoromethoxyparaphenylenediamine, trifluoromethoxymetaphe Diamine, fluoroparaphenylenediamine, fluorometaphenylenediamine, chloroparaphenylenediamine, chlorometaphenylenediamine, bromoparaphenylenediamine, bromometaphenylenediamine, carboxyparaphenylenediamine, carboxymetaphenylenediamine, methoxycarbonylparaphenylenediamine, methoxy Carbonyl metaphenylenediamine, diaminodiphenylmethane, bis (aminomethylphenyl) methane,
Bis (aminotrifluoromethylphenyl) methane, bis (aminoethylphenyl) methane, bis (aminochlorophenyl) methane, bis (aminodimethylphenyl)
Methane, bis (aminodiethylphenyl) methane, diaminodiphenylpropane, bis (aminomethylphenyl) propane, bis (aminotrifluoromethylphenyl) propane, bis (aminoethylphenyl) propane, bis (aminochlorophenyl) propane, bis (amino Dimethylphenyl) propane, bis (aminodiethylphenyl) propane, diaminodiphenylhexafluoropropane, bis (aminomethylphenyl) hexafluoropropane, bis (aminotrifluoromethylphenyl) hexafluoropropane, bis (aminoethylphenyl) hexafluoropropane Bis (aminochlorophenyl) hexafluoropropane, bis (aminodimethylphenyl) hexafluoropropane, bis (aminodiethylphenyl) Safluoropropane, diaminodiphenylsulfone, bis (aminomethylphenyl) sulfone, bis (aminoethylphenyl) sulfone, bis (aminotrifluoromethylphenyl) sulfone, bis (aminodimethylphenyl) sulfone, bis (aminodiethylphenyl) sulfone, Diaminodiphenyl ether, bis (aminomethylphenyl) ether, bis (aminotrifluoromethylphenyl) ether, bis (aminoethylphenyl) ether, bis (aminodimethylphenyl) ether, bis (aminodiethylphenyl)
Ether, dimethylbenzidine, bis (trifluoromethyl) benzidine, dichlorobenzidine, bis (aminophenoxy) benzene, bis (aminophenoxyphenyl) propane, bis (aminophenoxyphenyl) hexafluoropropane, bis (aminophenoxyphenyl) ether, bis (Aminophenoxyphenyl) methane, bis (aminophenoxyphenyl) sulfone, 3,
5-diaminobenzoic acid methacryloyl ethyl ester,
3,5-diaminobenzoic acid acroyl ethyl ester,
Residues such as 2,4-diaminobenzoic acid methacryloyl ethyl ester, 2,4-diaminobenzoic acid acroylethyl ester, diaminobenzoic acid, dihydroxybenzidine, bis (amino-hydroxy-phenyl) hexafluoropropane, diaminophenol and the like; Examples include, but are not limited to, the residue of the hydrogenated compound.
In the polyimide precursor of the present invention, R 2 may be composed of one of these, or may be a copolymer composed of two or more.
【0015】さらに、ポリイミド系ポリマーの接着性を
向上させるため、耐熱性を低下させない範囲でR2とし
て、シロキサン結合を有する脂肪族性の基を共重合する
ことも可能である。好ましい具体例としては、ビス(3
−アミノプロピル)テトラメチルジシロキサンなどが挙
げられるが、これに限定されない。Further, in order to improve the adhesiveness of the polyimide-based polymer, it is possible to copolymerize an aliphatic group having a siloxane bond as R 2 as long as the heat resistance is not reduced. A preferred specific example is bis (3
-Aminopropyl) tetramethyldisiloxane and the like, but are not limited thereto.
【0016】上記一般式(1)中、R3は水素、アルカ
リ金属イオン、アンモニウムイオン、または、炭素数1
〜30の有機基より選ばれた少なくとも1種の構造を表
す。炭素数1〜30の有機基としては脂肪族有機基が好
ましく、含有される有機基としては、炭化水素基、水酸
基、カルボニル基、カルボキシル基、ウレタン基、ウレ
ア基、アミド基などが挙げられるがこれらに限定されな
い。上記R3はそれぞれ単独種であってもよいし、2種
以上の混合であってもよい。In the above general formula (1), R 3 is hydrogen, an alkali metal ion, an ammonium ion, or a compound having 1 carbon atom.
Represents at least one type of structure selected from organic groups of 30 to 30; As the organic group having 1 to 30 carbon atoms, an aliphatic organic group is preferable, and examples of the contained organic group include a hydrocarbon group, a hydroxyl group, a carbonyl group, a carboxyl group, a urethane group, a urea group, and an amide group. It is not limited to these. R 3 may be a single species or a mixture of two or more species.
【0017】また、ワニスの安定性を向上させるため、
一般式(1)においてR3の50%以上が炭素数1〜5
の炭化水素基であることが好ましい。具体的には、メチ
ル基、エチル基、プロピル基、ブチル基、イソプロピル
基などが挙げられるが、これらに限定されない。R3に
おける炭素数1〜5の炭化水素基の割合は、好ましくは
60%以上、さらに好ましくは80%以上である。In order to improve the stability of the varnish,
In the general formula (1), 50% or more of R 3 has 1 to 5 carbon atoms.
Is preferred. Specific examples include, but are not limited to, a methyl group, an ethyl group, a propyl group, a butyl group, and an isopropyl group. The proportion of the hydrocarbon group having 1 to 5 carbon atoms in R 3 is preferably at least 60%, more preferably at least 80%.
【0018】一般式(1)で表される構造単位を有する
ポリマーの数平均分子量は5000〜50000である
ことが好ましい。この範囲より小さいと十分な強度を持
った膜を得ることができず、この範囲より大きいと現像
時に未露光部ポリマーの溶解性が不十分となる。ポリマ
ーの数平均分子量としてより好ましい範囲は10000
〜30000である。The number average molecular weight of the polymer having the structural unit represented by the general formula (1) is preferably 5,000 to 50,000. If it is smaller than this range, a film having sufficient strength cannot be obtained, and if it is larger than this range, the solubility of the unexposed polymer during development becomes insufficient. A more preferred range for the number average molecular weight of the polymer is 10,000.
~ 30000.
【0019】本発明におけるポリイミド前駆体は、一般
式(1)で表される構造単位のみから成るものであって
も良いし、他の構造単位との共重合体あるいはブレンド
体であっても良い。その際、一般式(1)で表される構
造単位を80%以上含有していることが好ましい。共重
合またはブレンドに用いられる構造単位の種類、量は最
終加熱処理によって得られるポリイミド系ポリマーの耐
熱性を著しく損なわない範囲で選択するのが好ましい。The polyimide precursor in the present invention may be composed of only the structural unit represented by the general formula (1), or may be a copolymer or a blend with another structural unit. . At that time, it is preferable that the content of the structural unit represented by the general formula (1) is 80% or more. The type and amount of the structural unit used for copolymerization or blending are preferably selected within a range that does not significantly impair the heat resistance of the polyimide-based polymer obtained by the final heat treatment.
【0020】本発明におけるポリイミド前駆体は種々の
公知の方法によって合成されるが、特にR3が水素であ
る場合は、テトラカルボン酸二無水物とジアミンとの反
応によって合成することが好ましい方法といえる。酸二
無水物とジイソシアナートとの反応でも合成できるが、
ポリマーのイミド化率の上昇を招く恐れがあるので注意
が必要である。またR3が炭化水素基である場合は、テ
トラカルボン酸二無水物とジアミンとの反応によって合
成したポリマーに、ジメチルホルムアミドのジアルキル
アセタールを添加することが好ましい方法である。The polyimide precursor in the present invention is synthesized by various known methods. Particularly, when R 3 is hydrogen, it is preferable to synthesize the polyimide precursor by reacting a tetracarboxylic dianhydride with a diamine. I can say. It can be synthesized by the reaction of acid dianhydride and diisocyanate,
Care must be taken because the imidation rate of the polymer may increase. When R 3 is a hydrocarbon group, a preferred method is to add a dialkyl acetal of dimethylformamide to a polymer synthesized by reacting tetracarboxylic dianhydride with a diamine.
【0021】重合溶剤としては、N−メチル−2−ピロ
リドン、N,N−ジメチルアセトアミド、N,N−ジメ
チルホルムアミド、ジメチルスルホキシド、ヘキサメチ
ルホスホロトリアミドなどを主成分とする溶剤や、γ−
ブチロラクトンを主成分とする溶剤、シクロヘキサノン
やシクロペンタノンといった環状ケトン溶剤などが好ま
しく用いられる。Examples of the polymerization solvent include a solvent containing N-methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, dimethylsulfoxide, hexamethylphosphorotriamide, etc.
Solvents containing butyrolactone as a main component, and cyclic ketone solvents such as cyclohexanone and cyclopentanone are preferably used.
【0022】回転塗布時の面内均一性を向上させるた
め、本発明におけるポリイミド前駆体の溶媒は、シクロ
ペンタノンやシクロヘキサノンなどのポリマー可溶な低
沸点溶剤を主成分とすることが好ましい。この場合、N
−メチル−2−ピロリドン、N,N−ジメチルアセトア
ミド、N,N−ジメチルホルムアミド、ジメチルスルホ
キシド、γ−ブチロラクトンなどを主成分とする溶剤に
て重合したポリマー溶液をアルコールや水に添加してポ
リマーを一度沈殿採取した後、上記低沸点の溶剤を主成
分とする溶剤に再溶解させて作成してもよいし、最初か
ら低沸点の溶剤を主成分とした溶剤中で重合を行っても
よい。In order to improve the in-plane uniformity at the time of spin coating, the solvent of the polyimide precursor in the present invention preferably contains a polymer-soluble low-boiling solvent such as cyclopentanone or cyclohexanone as a main component. In this case, N
-Methyl-2-pyrrolidone, N, N-dimethylacetamide, N, N-dimethylformamide, dimethylsulfoxide, γ-butyrolactone, and the like. Once the precipitate is collected, it may be prepared by re-dissolving in a solvent containing the above-mentioned low-boiling-point solvent as a main component, or may be polymerized in a solvent containing a low-boiling-point solvent as a main component from the beginning.
【0023】さらに、シクロペンタノンやシクロヘキサ
ノンなどの低沸点の溶媒を用いる場合は、ポリイミド前
駆体組成物は界面活性剤を含んでいることが好ましい。
界面活性剤がないと、塗布膜の厚みむらが大きくなる場
合がある。界面活性剤の添加量としてはポリマーに対し
て1〜10000ppmの範囲で添加するのが好まし
く、100〜6000ppmの範囲で添加するのがさら
に好ましい。この量より小さいと界面活性効果が十分で
なく、この量より大きいと硬化後のポリイミドと封止剤
や上層配線との密着性が低下するので注意を要する。界
面活性剤種としては、フッ素系界面活性剤、オキシメチ
レン系界面活性剤、アクリル系界面活性剤を添加するこ
とが好ましい。Furthermore, when a solvent having a low boiling point such as cyclopentanone or cyclohexanone is used, the polyimide precursor composition preferably contains a surfactant.
Without the surfactant, the thickness unevenness of the coating film may increase. The amount of the surfactant to be added is preferably in the range of 1 to 10000 ppm, more preferably in the range of 100 to 6000 ppm, based on the polymer. If the amount is smaller than this amount, the surface active effect is not sufficient. If the amount is larger than this amount, care must be taken because the adhesion between the cured polyimide and the sealant or the upper wiring is reduced. As the type of surfactant, it is preferable to add a fluorine-based surfactant, an oxymethylene-based surfactant, and an acrylic-based surfactant.
【0024】本発明のポリイミド前駆体組成物は、上記
一般式(1)で表される構造単位を有するポリマーに加
えて、下記一般式(2)で表される分子内に2つ以上の
水酸基を有する(メタ)アクリレート化合物を含むこと
を特徴とするものである。The polyimide precursor composition of the present invention comprises, in addition to the polymer having the structural unit represented by the above general formula (1), two or more hydroxyl groups in the molecule represented by the following general formula (2) (Meth) acrylate compounds having the formula:
【0025】[0025]
【化6】 Embedded image
【0026】(R4は水素、メチル基、エチル基のいず
れかを表し、R5は炭素数2以上の(m+1)価の有機
基を表す。mは2以上の整数である。) かかる一般式(2)でいう(メタ)アクリレート化合物
とは、アクリレート化合物あるいはメタクリレート化合
物を総称した名称である。(R 4 represents any one of hydrogen, a methyl group and an ethyl group, and R 5 represents an (m + 1) -valent organic group having 2 or more carbon atoms. M is an integer of 2 or more.) The (meth) acrylate compound referred to in the formula (2) is a generic name of an acrylate compound or a methacrylate compound.
【0027】かかる一般式(2)の具体的な例として、
下記式(3)で表されるグリセロールモノメタクリレー
トが好ましく使用されるが、これに限定されない。As a specific example of the general formula (2),
Glycerol monomethacrylate represented by the following formula (3) is preferably used, but is not limited thereto.
【0028】[0028]
【化7】 Embedded image
【0029】かかる一般式(2)で表される(メタ)ア
クリレート化合物の含有量は、一般式(1)の構造単位
に対して、好ましくは50〜400モル%、さらに好ま
しくは100〜300モル%の範囲であるのがよい。こ
の範囲より小さいと、現像後の膜厚保持率の低下、現像
速度の低下および解像度の低下を招き、また、この範囲
を越えると、解像度の低下、ワニスのゲル化、加熱硬化
後のポリイミド膜の伸度低下を招くので注意を要する。The content of the (meth) acrylate compound represented by the general formula (2) is preferably 50 to 400 mol%, more preferably 100 to 300 mol, based on the structural unit of the general formula (1). %. If it is smaller than this range, the film thickness retention rate after development decreases, the development speed decreases, and the resolution decreases.If it exceeds this range, the resolution decreases, the varnish gels, and the polyimide film after heat curing. Care must be taken since this will cause a decrease in elongation.
【0030】かかる(メタ)アクリレート化合物は、分
子内に2つ以上の水酸基を有することが必要である。分
子内に水酸基を2つ以上有する(メタ)アクリレート化
合物は、同等分子量の水酸基を1つ有するか、あるい
は、水酸基を有しない(メタ)アクリレート化合物と比
較して、沸点が高く、プリベーク時の揮散が起こりにく
い。さらに2つ以上の水酸基を有することにより、複数
の部位で、ポリマーとの相互作用が可能である。これら
の特徴により、ポリイミド前駆体と(メタ)アクリレー
ト化合物を混合するという簡便な方法であるにも関わら
ず、感度及び残膜率の高い感光性ポリイミド前駆体組成
物を提供することができるのである。Such a (meth) acrylate compound needs to have two or more hydroxyl groups in the molecule. A (meth) acrylate compound having two or more hydroxyl groups in a molecule has a higher boiling point than a (meth) acrylate compound having no hydroxyl group or one hydroxyl group having the same molecular weight, and is volatilized during prebaking. Is unlikely to occur. Further, by having two or more hydroxyl groups, interaction with the polymer is possible at a plurality of sites. Due to these features, it is possible to provide a photosensitive polyimide precursor composition having a high sensitivity and a high residual film ratio, despite the simple method of mixing the polyimide precursor and the (meth) acrylate compound. .
【0031】現像後のパターンにおいて、さらに高い感
度、高い解像度を得るために、光開始剤、光増感剤を含
有することは好ましいことである。かかる光開始剤およ
び光増感剤は、単独でも、2つ同時に用いることができ
る。In order to obtain higher sensitivity and higher resolution in the pattern after development, it is preferable to include a photoinitiator and a photosensitizer. These photoinitiators and photosensitizers can be used alone or in combination.
【0032】かかる光開始剤としては、N−フェニルジ
エタノールアミン、N−フェニルグリシン、ミヒラーズ
ケトンなどの芳香族アミン、3−フェニル−5−イソオ
キサゾロンに代表される環状オキシム化合物、1−フェ
ニルプロパンジオン−2−(O−エトキシカルボニル)
オキシムに代表される鎖状オキシム化合物、ベンゾフェ
ノン、o−ベンゾイル安息香酸メチル、ジベンジルケト
ン、フルオレノンなどのベンゾフェノン誘導体、チオキ
サントン、2−メチルチオキサントン、2−イソプロピ
ルチオキサントンなどのチオキサントン誘導体などが好
ましく使用される。Examples of the photoinitiator include aromatic amines such as N-phenyldiethanolamine, N-phenylglycine, and Michler's ketone; cyclic oxime compounds represented by 3-phenyl-5-isoxazolone; and 1-phenylpropanedione-2. -(O-ethoxycarbonyl)
A chain oxime compound represented by an oxime, a benzophenone derivative such as benzophenone, methyl o-benzoylbenzoate, dibenzyl ketone and fluorenone, a thioxanthone derivative such as thioxanthone, 2-methylthioxanthone and 2-isopropylthioxanthone are preferably used. .
【0033】また、かかる増感剤としては、アジドアン
トラキノン、アジドベンザルアセトフェノンなどの芳香
族モノアジド、3,3’−カルボニルビス(ジエチルア
ミノクマリン)などのクマリン化合物、ベンズアントロ
ン、フェナントレンキノンなどの芳香族ケトンなど、一
般に光硬化性樹脂に使用されるようなものや、その他電
子写真の電荷移動剤として使用されるものであれば好ま
しく使用することができる。Examples of the sensitizer include aromatic monoazides such as azidoanthraquinone and azidobenzalacetophenone; coumarin compounds such as 3,3'-carbonylbis (diethylaminocoumarin); and aromatic compounds such as benzanthrone and phenanthrenequinone. Preferred are those generally used for photocurable resins, such as ketones, and any other materials used as charge transfer agents for electrophotography.
【0034】かかる光開始剤や増感剤は、ポリマーに対
して、好ましくは0.01〜30重量%、さらに好まし
くは0.1〜20重量%添加するのがよい。この範囲を
外れると、感光性が低下したり、ポリマーの機械特性が
低下したりするので注意を要する。The photoinitiator and the sensitizer are preferably added in an amount of 0.01 to 30% by weight, more preferably 0.1 to 20% by weight, based on the weight of the polymer. If the ratio is out of this range, the photosensitivity is lowered and the mechanical properties of the polymer are lowered.
【0035】本発明の組成物の塗膜または加熱処理後の
ポリイミド被膜と支持体との接着性を向上させるために
適宜接着助剤を用いることもできる。In order to improve the adhesion between the coating film of the composition of the present invention or the polyimide film after the heat treatment and the support, an adhesion aid may be appropriately used.
【0036】接着助剤としては、オキシプロピルトリメ
トキシシラン、γ−グリシドキシプロピルトリメトキシ
シラン、γ−アミノプロピルトリエトキシシラン、γ−
メタクリルオキシプロピルトリメトキシシランなどの有
機珪素化合物、あるいはアルミニウムモノエチルアセト
アセテートジイソプロピレート、アルミニウムトリス
(アセチルアセトネート)などのアルミニウムキレート
化合物あるいはチタニウムビス(アセチルアセトネー
ト)などのチタニウムキレート化合物などが好ましく用
いられる。Examples of the adhesion promoter include oxypropyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane, γ-aminopropyltriethoxysilane, γ-
Organic silicon compounds such as methacryloxypropyltrimethoxysilane, or aluminum chelate compounds such as aluminum monoethylacetoacetate diisopropylate and aluminum tris (acetylacetonate) or titanium chelate compounds such as titanium bis (acetylacetonate) are preferable. Used.
【0037】さらに、他の添加剤が、基板との接着性、
感度、耐熱性が大幅に低下しない範囲で含まれていても
よい。Further, other additives may be used to improve adhesion to the substrate,
Sensitivity and heat resistance may be included in a range that does not significantly decrease.
【0038】次に本発明の組成物の使用方法について説
明をする。本発明の組成物は、化学線を用いた周知の微
細加工技術でパターン加工を行うことができる。Next, the method of using the composition of the present invention will be described. The composition of the present invention can be patterned by a known fine processing technique using actinic radiation.
【0039】まず、本発明の組成物を適当な基板の上に
塗布する。基板の材質としては、例えば金属、ガラス、
半導体、金属酸化絶縁膜、窒化ケイ素などを使用するこ
とができるが、これらに限定されない。First, the composition of the present invention is applied on a suitable substrate. As the material of the substrate, for example, metal, glass,
A semiconductor, a metal oxide insulating film, silicon nitride, or the like can be used, but is not limited thereto.
【0040】塗布方法としては、スピンナーを用いた回
転塗布、スプレーコーターを用いた噴霧塗布、浸漬、印
刷、ロールコーティングなどの手段が可能である。塗布
膜厚は塗布手段、組成物の固形分濃度、粘度によって調
節することができるが、好ましくは0.1〜150μm
の範囲になるように塗布される。As a coating method, means such as spin coating using a spinner, spray coating using a spray coater, dipping, printing, roll coating and the like are possible. The coating thickness can be adjusted by the coating means, the solid content concentration of the composition, and the viscosity, but is preferably 0.1 to 150 μm.
It is applied so as to be within the range.
【0041】次にポリイミド前駆体を塗布した基板を乾
燥して、ポリイミド前駆体組成物被膜を得る。乾燥は、
オーブン、ホットプレート、赤外線などを利用し、15
〜150℃の範囲で行うのが好ましく、40〜100℃
の範囲で行うのがより好ましい。乾燥時間は、10秒〜
数時間行うのが好ましい。また、塗布直後に、膜が既に
乾燥している場合は、乾燥工程を省略することができ
る。Next, the substrate coated with the polyimide precursor is dried to obtain a polyimide precursor composition film. Drying is
Use an oven, hot plate, infrared ray, etc.
It is preferably carried out in the range of ~ 150 ° C, 40 ~ 100 ° C
It is more preferable to carry out within the range. Drying time is 10 seconds ~
Preferably, it is performed for several hours. If the film has already been dried immediately after the application, the drying step can be omitted.
【0042】次に、所望のパターンを有するマスクを用
い、露光を行う。露光量としては、50〜1000mJ
/cm2の範囲が好ましい。特に好ましい範囲は100
〜600mJ/cm2である。適当な増感剤を用いるこ
とによって、i線ステッパー、g線ステッパー、マスク
アライナー、ミラープロジェクションアライナーなどの
露光機を用いて露光することができる。Next, exposure is performed using a mask having a desired pattern. Exposure amount is 50-1000mJ
/ Cm 2 is preferred. A particularly preferred range is 100
600600 mJ / cm 2 . By using an appropriate sensitizer, exposure can be performed using an exposure machine such as an i-line stepper, a g-line stepper, a mask aligner, and a mirror projection aligner.
【0043】現像時のパターンの解像度が向上したり、
現像条件の許容幅が増大する場合には、現像前にベーク
処理をする工程を取り入れても差し支えない。この温度
としては、30〜150℃の範囲が好ましく、40〜1
00℃の範囲がより好ましい。時間は、10秒〜数時間
が好ましい。この範囲を外れると、反応が進行しなかっ
たり、全ての領域が溶解しなくなるなどの恐れがあるの
で注意を要する。The resolution of the pattern at the time of development is improved,
When the allowable range of the developing conditions is increased, a step of performing a baking process before the development may be adopted. The temperature is preferably in the range of 30 to 150 ° C.,
The range of 00 ° C is more preferable. The time is preferably from 10 seconds to several hours. If the ratio is out of this range, the reaction may not proceed or all the regions may not be dissolved.
【0044】ついで未照射部を現像液で溶解除去するこ
とにより、レリーフパターンを得る。現像液は、ポリイ
ミド前駆体の構造に合わせて、適当なものを選択するこ
とができるが、アンモニア、テトラメチルアンモニウム
ハイドロオキサイド、ジエタノールアミンなどのアルカ
リ水溶液などを好ましく使用することができる。また、
本組成物の主溶剤であるシクロペンタノン、シクロヘキ
サノンや、ポリイミド前駆体を溶解する一般的な溶剤で
あるN−メチル−2−ピロリドン、N−アセチル−2−
ピロリドン、N,N−ジメチルホルムアミド、N,N−
ジメチルアセトアミド、ジメチルスルホキシド、ヘキサ
メチルホスホルトリアミド、γ−ブチロラクトン、など
を単独あるいは、メタノール、エタノール、イソプロピ
ルアルコール、水、メチルカルビトール、エチルカルビ
トール、トルエン、キシレン、乳酸エチル、ピルビン酸
エチル、プロピレングリコールモノメチルエーテルアセ
テート、メチル−3−メトキシプロピオネート、エチル
−3−エトキシプロピオネート、酢酸エチルなどとの混
合液も好ましく使用することができる。Subsequently, a relief pattern is obtained by dissolving and removing the unirradiated portion with a developing solution. An appropriate developer can be selected in accordance with the structure of the polyimide precursor, but an aqueous alkali solution such as ammonia, tetramethylammonium hydroxide, or diethanolamine can be preferably used. Also,
Cyclopentanone and cyclohexanone which are main solvents of the present composition, and N-methyl-2-pyrrolidone and N-acetyl-2- which are general solvents for dissolving the polyimide precursor
Pyrrolidone, N, N-dimethylformamide, N, N-
Dimethylacetamide, dimethylsulfoxide, hexamethylphosphortriamide, γ-butyrolactone, or the like alone, or methanol, ethanol, isopropyl alcohol, water, methyl carbitol, ethyl carbitol, toluene, xylene, ethyl lactate, ethyl pyruvate, propylene A mixed solution with glycol monomethyl ether acetate, methyl-3-methoxypropionate, ethyl-3-ethoxypropionate, ethyl acetate and the like can also be preferably used.
【0045】現像は、上記の現像液を塗膜面にそのま
ま、あるいは、霧状にして放射する、現像液中に浸漬す
る、あるいは、浸漬しながら超音波をかけるなどの方法
によって行うことができる。The development can be carried out by irradiating the above-mentioned developing solution on the surface of the coating film as it is or in the form of mist, immersing in the developing solution, or applying ultrasonic waves while immersing. .
【0046】ついで水や有機溶剤を用いて、現像によっ
て形成したレリーフパターンを洗浄することが好まし
い。洗浄液としては、有機溶剤を用いて洗浄する場合
は、現像液との混和性の良いメタノール、エタノール、
イソプロピルアルコール、乳酸エチル、ピルビン酸エチ
ル、プロピレングリコールモノメチルエーテルアセテー
ト、メチル−3−メトキシプロピオネート、エチル−3
−エトキシプロピオネート、2−ヘプタノン、酢酸エチ
ルなどが好ましく用いられる。Next, it is preferable to wash the relief pattern formed by development using water or an organic solvent. When washing with an organic solvent as the washing liquid, methanol, ethanol,
Isopropyl alcohol, ethyl lactate, ethyl pyruvate, propylene glycol monomethyl ether acetate, methyl-3-methoxypropionate, ethyl-3
-Ethoxypropionate, 2-heptanone, ethyl acetate and the like are preferably used.
【0047】上記の処理によって得られたレリーフパタ
ーンのポリマーは、耐熱性を有するポリイミド系ポリマ
ーの前駆体であり、加熱処理により、イミド環やその他
の環状構造を有する耐熱性ポリマーとなる。熱処理温度
としては、135〜500℃で行うのが好ましく、25
0〜450℃で行うのがより好ましい。かかる熱処理
は、好ましくは段階的にあるいは連続的に昇温しながら
行われる。The polymer of the relief pattern obtained by the above treatment is a precursor of a polyimide-based polymer having heat resistance, and becomes a heat-resistant polymer having an imide ring or other cyclic structure by heat treatment. The heat treatment is preferably performed at a temperature of 135 to 500 ° C.
More preferably, the reaction is performed at 0 to 450 ° C. Such heat treatment is preferably performed stepwise or continuously while increasing the temperature.
【0048】[0048]
【実施例】以下に実施例を示すが、本発明はこれら実施
例に限定されない。なお、合成例、実施例においてポリ
イミド原料の略号を下記の要領で使用する。EXAMPLES Examples are shown below, but the present invention is not limited to these examples. In the synthesis examples and examples, abbreviations of polyimide raw materials are used in the following manner.
【0049】4,4’−DAE :4,4’−ジアミノ
ジフェニルエーテル p−BAPS:ビス[4−(4−アミノフェノキシ)フ
ェニル]スルホン HFBAPP:ビス[4−(4−アミノフェノキシ)フ
ェニル]ヘキサフルオロプロパン HFHA:2,2−ビス(3−アミノ−4−ヒドロキシ
フェニル)ヘキサフルオロプロパン SiDA:ビス(3−アミノプロピル)テトラメチルジ
シロキサン PMDA:無水ピロメリット酸 BTDA:3,3’,4,4’−ベンゾフェノンテトラ
カルボン酸二無水物 ODPA:3,3’,4,4’−ジフェニルエーテルテ
トラカルボン酸二無水物 DMFDMA:ジメチルホルムアミドジメチルアセター
ル GLM :グリセロールモノメタクリレート HEMA:2−ヒドロキシエチルメタクリレート NPG :N−フェニルグリシン NNAP:1−ニトロソ−2−ナフトール CP :シクロペンタノン NMP :N−メチル−2−ピロリドン 合成例1 乾燥空気気流下、1リットルの4つ口フラスコ内で4,
4’−DAE9.61g(0.048モル)、p−BA
PS17.3g(0.04モル)、SiDA1.24g
(0.005モル)をCP102.5gに40℃で溶解
させた。その後、PMDA6.54g(0.03モ
ル)、BTDA9.67g(0.03モル)、ODPA
12.41g(0.04モル)、CP30gを加え、5
0℃で3時間反応させた。これをワニスAとした。4,4'-DAE: 4,4'-diaminodiphenyl ether p-BAPS: bis [4- (4-aminophenoxy) phenyl] sulfone HFBAPP: bis [4- (4-aminophenoxy) phenyl] hexafluoro Propane HFHA: 2,2-bis (3-amino-4-hydroxyphenyl) hexafluoropropane SiDA: bis (3-aminopropyl) tetramethyldisiloxane PMDA: pyromellitic anhydride BTDA: 3, 3 ', 4, 4 '-Benzophenonetetracarboxylic dianhydride ODPA: 3,3', 4,4'-diphenylethertetracarboxylic dianhydride DMFDMA: dimethylformamide dimethyl acetal GLM: glycerol monomethacrylate HEMA: 2-hydroxyethyl methacrylate NPG: - phenylglycine NNAP: 1- nitroso-2-naphthol CP: cyclopentanone NMP: N-methyl-2-pyrrolidone Synthesis Example 1 Dry air under a stream 4 in four-necked 1 liter flask,
9.61 g (0.048 mol) of 4'-DAE, p-BA
PS 17.3 g (0.04 mol), SiDA 1.24 g
(0.005 mol) was dissolved in 102.5 g of CP at 40 ° C. Thereafter, 6.54 g (0.03 mol) of PMDA, 9.67 g (0.03 mol) of BTDA, and ODPA
12.41 g (0.04 mol) and 30 g of CP were added, and 5
The reaction was performed at 0 ° C. for 3 hours. This was designated as varnish A.
【0050】合成例2〜7 ジアミン及び酸二無水物を表1の分量で行い、合成例1
と同様に組成物を作製した。それぞれのワニスをワニス
B〜ワニスGとした。Synthesis Examples 2 to 7 Diamine and acid dianhydride were used in the amounts shown in Table 1 to obtain Synthesis Examples 1 to 7.
A composition was prepared in the same manner as described above. Each varnish was designated Varnish B to Varnish G.
【0051】[0051]
【表1】 [Table 1]
【0052】合成例8 溶剤としてCPではなくNMPを用いる以外は合成例1
と同様に組成物を作成した。室温まで冷却した後、DM
FDMA29.78gを加えて40℃で2時間撹拌し
た。この溶液を1Lの純水中に投入してポリマーを析出
させ、濾過によってポリマーを集めて、純水で3回洗浄
した後、80℃の真空乾燥機で8時間乾燥した。このよ
うにして得られたポリマー粉体30gをCP70gに溶
解させた。これをワニスHとした。Synthesis Example 8 Synthesis Example 1 except that NMP was used instead of CP as the solvent
A composition was prepared in the same manner as described above. After cooling to room temperature, DM
29.78 g of FDMA was added and the mixture was stirred at 40 ° C. for 2 hours. This solution was put into 1 L of pure water to precipitate a polymer, and the polymer was collected by filtration, washed three times with pure water, and then dried with a vacuum dryer at 80 ° C. for 8 hours. 30 g of the polymer powder thus obtained was dissolved in 70 g of CP. This was designated as varnish H.
【0053】合成例9 溶剤としてCPではなくNMPを用いる以外は合成例2
と同様にワニスBを作成した。ワニスB、DMFDMA
を用い、合成例8と同様に組成物を作成し、これをワニ
スIとした。Synthesis Example 9 Synthesis Example 2 except that NMP was used instead of CP as a solvent
A varnish B was prepared in the same manner as described above. Varnish B, DMFDMA
And a composition was prepared in the same manner as in Synthesis Example 8, and this was designated as varnish I.
【0054】合成例10 溶剤としてCPではなくNMPを用いる以外は合成例3
と同様にワニスCを作成した。ワニスC、DMFDMA
を用い、合成例8と同様に組成物を作成し、これをワニ
スJとした。Synthesis Example 10 Synthesis Example 3 except that NMP was used instead of CP as the solvent
A varnish C was prepared in the same manner as described above. Varnish C, DMFDMA
Was used to prepare a composition in the same manner as in Synthesis Example 8, and this was designated as Varnish J.
【0055】合成例11 溶剤としてCPではなくNMPを用いる以外は合成例4
と同様にワニスDを作成した。ワニスD、DMFDMA
を用い、合成例8と同様に組成物を作成し、これをワニ
スKとした。Synthesis Example 11 Synthesis Example 4 except that NMP was used instead of CP as a solvent
A varnish D was prepared in the same manner as described above. Varnish D, DMFDMA
Was used to prepare a composition in the same manner as in Synthesis Example 8, and this was designated as Varnish K.
【0056】合成例12 溶剤としてCPではなくNMPを用いる以外は合成例5
と同様にワニスEを作成した。ワニスE、DMFDMA
を用い、合成例8と同様に組成物を作成し、これをワニ
スLとした。Synthesis Example 12 Synthesis Example 5 except that NMP was used instead of CP as a solvent
A varnish E was prepared in the same manner as described above. Varnish E, DMFDMA
Was used to prepare a composition in the same manner as in Synthesis Example 8, and this was designated as Varnish L.
【0057】合成例13 溶剤としてCPではなくNMPを用いる以外は合成例6
と同様にワニスFを作成した。ワニスF、DMFDMA
を用い、合成例8と同様に組成物を作成し、これをワニ
スMとした。Synthesis Example 13 Synthesis Example 6 except that NMP was used instead of CP as a solvent
A varnish F was prepared in the same manner as described above. Varnish F, DMFDMA
Was used to prepare a composition in the same manner as in Synthesis Example 8, and this was designated as Varnish M.
【0058】合成例14 溶剤としてCPではなくNMPを用いる以外は合成例7
と同様にワニスGを作成した。ワニスG、DMFDMA
を用い、合成例8と同様に組成物を作成し、これをワニ
スNとした。Synthesis Example 14 Synthesis Example 7 except that NMP was used instead of CP as a solvent
A varnish G was prepared in the same manner as described above. Varnish G, DMFDMA
Was used to prepare a composition in the same manner as in Synthesis Example 8, and this was designated as Varnish N.
【0059】実施例1 ワニスA10gにGLM1.5g、NPG0.09g、
NNAP0.002g、アクリル系界面活性剤(楠本化
成(株)製:"ディスパロン"LC−951)0.02g
を加えて撹拌し、感光性ワニスを得た。Example 1 1.5 g of GLM, 0.09 g of NPG, and 10 g of varnish A
NNAP 0.002 g, acrylic surfactant (manufactured by Kusumoto Kasei Co., Ltd .: "Dispalon" LC-951) 0.02 g
Was added and stirred to obtain a photosensitive varnish.
【0060】4インチのシリコンウエハ上にワニスを回
転塗布し、次いで、70℃のホットプレートで3分間ベ
ーク(装置:大日本スクリーン製造(株)製SKW−6
36)した。この時、ベーク後の膜厚が約8μmとなる
よう塗布回転は調節した。A varnish is spin-coated on a 4-inch silicon wafer, and then baked on a hot plate at 70 ° C. for 3 minutes (apparatus: SKW-6 manufactured by Dainippon Screen Mfg. Co., Ltd.).
36) At this time, the coating rotation was adjusted so that the film thickness after baking was about 8 μm.
【0061】次いで、マスクアライナー(キヤノン製P
LA−501F)を用いて露光した。i線にて測定した
露光量は300mJ/cm2であった。露光後、シクロ
ヘキサノン/シクロペンタノン=1/1(重量比)の現
像液で現像、次いでプロピレングリコールモノメチルエ
ーテルアセテートでリンスして乾燥させた。Next, a mask aligner (Canon P
(LA-501F). The exposure dose measured by i-line was 300 mJ / cm 2 . After exposure, the film was developed with a developing solution of cyclohexanone / cyclopentanone = 1/1 (weight ratio), then rinsed with propylene glycol monomethyl ether acetate, and dried.
【0062】現像後のパターンを観察した結果、露光部
の膜厚保持率は92%であり、10μmのパターンが解
像していた。またパターン形状も問題なかった。As a result of observing the pattern after development, the film thickness retention ratio of the exposed portion was 92%, and a 10 μm pattern was resolved. There was no problem with the pattern shape.
【0063】実施例2 ワニスAを用いる代わりにワニスBを用いる以外は実施
例1と同様に感光性ワニスを作成した。4インチシリコ
ンウェハを用いて実施例1と同様にパターン加工を行っ
た。現像後のパターンを観察した結果、露光部の膜厚保
持率は87%であり、10μmのパターンが解像してい
た。また、パターン形状も問題なかった。Example 2 A photosensitive varnish was prepared in the same manner as in Example 1 except that varnish B was used instead of varnish A. Pattern processing was performed in the same manner as in Example 1 using a 4-inch silicon wafer. As a result of observing the pattern after development, the film thickness retention ratio of the exposed portion was 87%, and a 10 μm pattern was resolved. There was no problem with the pattern shape.
【0064】実施例3〜14 用いるワニスを表2にようにC〜Nに変え、それ以外は
実施例1と同様に感光性ワニスを作成した。4インチシ
リコンウェハを用いて実施例1と同様にパターン加工を
行った。評価結果を表2に示すが、いずれも高解像のパ
ターンが得られ、パターン形状も問題なかった。Examples 3 to 14 Photosensitive varnishes were prepared in the same manner as in Example 1 except that the varnishes used were changed from C to N as shown in Table 2. Pattern processing was performed in the same manner as in Example 1 using a 4-inch silicon wafer. Table 2 shows the evaluation results. In each case, a high-resolution pattern was obtained, and there was no problem in the pattern shape.
【0065】比較例1 ワニスA10gに、NPG0.09g、NNAP0.0
01g、アクリル系界面活性剤(楠本化成(株)製:"
ディスパロン"LC−951)0.02gを加えて撹拌
し、感光性ワニスを得た。COMPARATIVE EXAMPLE 1 0.09 g of NPG and 0.09 g of NNAP were added to 10 g of varnish A.
01 g, acrylic surfactant (manufactured by Kusumoto Kasei Co., Ltd .: "
0.02 g of Dispalon "LC-951) was added and stirred to obtain a photosensitive varnish.
【0066】このワニスについて、実施例1と同様にパ
ターン加工を行ったが、現像後に膜の全てが溶解し、パ
ターンを形成することができなかった。The varnish was subjected to pattern processing in the same manner as in Example 1. However, after development, the entire film was dissolved, and a pattern could not be formed.
【0067】比較例2 ワニスA10gに、HEMA1.50g、NPG0.0
9g、NNAP0.002g、アクリル系界面活性剤
(楠本化成(株)製:"ディスパロン"LC−951)
0.02gを加えて撹拌し、感光性ワニスを得た。Comparative Example 2 To 10 g of varnish A, 1.50 g of HEMA and 0.0
9 g, NNAP 0.002 g, acrylic surfactant (manufactured by Kusumoto Chemicals, Ltd .: "Dispalon" LC-951)
0.02 g was added and stirred to obtain a photosensitive varnish.
【0068】このワニスについて、実施例1と同様にパ
ターン加工を行ったが、未露光部の溶解が非常遅く、ま
た現像後にクラックの発生が認められた。さらにベーク
条件を80℃にしたところ、パターンは全く形成されな
かった。The varnish was subjected to pattern processing in the same manner as in Example 1. However, dissolution of the unexposed portion was extremely slow, and cracks were observed after development. Further, when the baking condition was set to 80 ° C., no pattern was formed at all.
【0069】[0069]
【表2】 [Table 2]
【0070】[0070]
【発明の効果】本発明によれば、安定性に優れ、製造工
程が簡略で、高解像度のパターンが得られ、キュア後に
強伸度特性に優れた膜を得ることができる感光性ポリイ
ミド前駆体組成物を提供することができる。According to the present invention, a photosensitive polyimide precursor having excellent stability, a simple manufacturing process, a high resolution pattern, and a film having excellent elongation characteristics after curing can be obtained. A composition can be provided.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 21/312 H01L 21/312 B D Fターム(参考) 2H025 AA10 AA13 AB15 AB16 AC01 AD01 BC34 CB25 CB55 FA29 4J011 AC04 QA03 QA34 RA06 RA10 RA12 RA17 SA07 SA17 SA21 SA22 SA31 SA34 SA41 SA42 SA63 SA64 SA65 SA78 SA80 SA82 TA04 UA01 VA01 WA01 4J026 AB34 AC33 BA30 BB01 DB06 DB24 DB36 EA06 FA05 GA07 5F058 AA10 AC02 AC07 AF04 AG01 AG09 AH02 AH03 ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01L 21/312 H01L 21/312 BD DF term (Reference) 2H025 AA10 AA13 AB15 AB16 AC01 AD01 BC34 CB25 CB55 FA29 4J011 AC04 QA03 QA34 RA06 RA10 RA12 RA17 SA07 SA17 SA21 SA22 SA31 SA34 SA41 SA42 SA63 SA64 SA65 SA78 SA80 SA82 TA04 UA01 VA01 WA01 4J026 AB34 AC33 BA30 BB01 DB06 DB24 DB36 EA06 FA05 GA07 5F058 AA10 AC02 AC07 AF04 AG01 AG09 A09H09
Claims (4)
とする感光性ポリイミド前駆体組成物。 (a)一般式(1)で表される構造単位を有するポリマ
ー (b)一般式(2)で表される分子内に2つ以上の水酸
基を有する(メタ)アクリレート化合物 【化1】 (R1は少なくとも2個以上の炭素原子を有する3価ま
たは4価の有機基を表し、R2は少なくとも2個以上の
炭素原子を有する2価の有機基を表す。R3は水素、ア
ルカリ金属イオン、アンモニウムイオン、または、炭素
数1〜30の有機基より選ばれた少なくとも1種を表
す。nは1または2である。) 【化2】 (R4は水素、メチル基、エチル基のいずれかを表し、
R5は炭素数2以上の(m+1)価の有機基を表す。m
は2以上の整数である。)1. A photosensitive polyimide precursor composition comprising the following (a) and (b): (A) Polymer having a structural unit represented by general formula (1) (b) (meth) acrylate compound having two or more hydroxyl groups in a molecule represented by general formula (2) (R 1 represents a trivalent or tetravalent organic group having at least 2 or more carbon atoms, R 2 represents a divalent organic group having at least 2 or more carbon atoms. R 3 represents hydrogen, alkali Represents at least one selected from a metal ion, an ammonium ion, or an organic group having 1 to 30 carbon atoms, and n is 1 or 2. (R 4 represents any of hydrogen, a methyl group and an ethyl group,
R 5 represents a (m + 1) -valent organic group having 2 or more carbon atoms. m
Is an integer of 2 or more. )
リマーの数平均分子量が5000〜50000であるこ
とを特徴とする請求項1記載の感光性ポリイミド前駆体
組成物。2. The photosensitive polyimide precursor composition according to claim 1, wherein the polymer having the structural unit represented by the general formula (1) has a number average molecular weight of 5,000 to 50,000.
が炭素数1〜5の炭化水素基であることを特徴とする請
求項2記載のポリイミド前駆体組成物。3. The polyimide precursor composition according to claim 2, wherein in formula (1), at least 50% of R 3 is a hydrocarbon group having 1 to 5 carbon atoms.
リマーに対して、一般式(2)で表される(メタ)アク
リル化合物を50〜400モル%含有することを特徴と
する請求項1記載のポリイミド前駆体組成物。4. A polymer having a structural unit represented by the general formula (1), wherein the (meth) acrylic compound represented by the general formula (2) is contained in an amount of 50 to 400 mol%. The polyimide precursor composition according to claim 1.
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| JP2000313224A JP2002122990A (en) | 2000-10-13 | 2000-10-13 | Photosensitive polyimide precursor composition |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000313224A JP2002122990A (en) | 2000-10-13 | 2000-10-13 | Photosensitive polyimide precursor composition |
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| Publication Number | Publication Date |
|---|---|
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ID=18792675
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|---|---|---|---|
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| Country | Link |
|---|---|
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004128437A (en) * | 2002-08-01 | 2004-04-22 | National Institute Of Advanced Industrial & Technology | Superconducting integrated circuit and manufacturing method thereof |
| WO2011013547A1 (en) * | 2009-07-27 | 2011-02-03 | 住友電気工業株式会社 | Negative photosensitive resin composition, polyimide resin film using same, and flexible printed circuit board |
| JP2020064148A (en) * | 2018-10-16 | 2020-04-23 | 太陽ホールディングス株式会社 | Photosensitive resin composition, dry film, cured product and electronic component |
-
2000
- 2000-10-13 JP JP2000313224A patent/JP2002122990A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004128437A (en) * | 2002-08-01 | 2004-04-22 | National Institute Of Advanced Industrial & Technology | Superconducting integrated circuit and manufacturing method thereof |
| WO2011013547A1 (en) * | 2009-07-27 | 2011-02-03 | 住友電気工業株式会社 | Negative photosensitive resin composition, polyimide resin film using same, and flexible printed circuit board |
| JP2011048329A (en) * | 2009-07-27 | 2011-03-10 | Sumitomo Electric Ind Ltd | Negative photosensitive resin composition, polyimide resin film using the same, and flexible printed wiring board |
| JP2020064148A (en) * | 2018-10-16 | 2020-04-23 | 太陽ホールディングス株式会社 | Photosensitive resin composition, dry film, cured product and electronic component |
| JP7224844B2 (en) | 2018-10-16 | 2023-02-20 | 太陽ホールディングス株式会社 | Photosensitive resin composition, dry film, cured product and electronic parts |
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