JP2002121677A - Method and apparatus for forming cvd film - Google Patents
Method and apparatus for forming cvd filmInfo
- Publication number
- JP2002121677A JP2002121677A JP2000315306A JP2000315306A JP2002121677A JP 2002121677 A JP2002121677 A JP 2002121677A JP 2000315306 A JP2000315306 A JP 2000315306A JP 2000315306 A JP2000315306 A JP 2000315306A JP 2002121677 A JP2002121677 A JP 2002121677A
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- Prior art keywords
- substrate
- electrode
- ladder electrode
- ladder
- film forming
- Prior art date
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Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、プラズマ領域を有
効に利用したプラズマCVD薄膜装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plasma CVD thin film apparatus that effectively utilizes a plasma region.
【0002】[0002]
【従来の技術】従来、プラズマCVD薄膜装置として
は、例えば図7に示すものが知られている。図中の符番
1は反応容器である。この反応容器1内には、ヒータ
(ヒータ源)2とラダー型の放電用電極3が対向して配
置されている。前記ヒータ2には、基板4が放電用電極
3側を向いて支持される。前記放電用電極3は、断面が
例えば円形状の複数の線材をはしご型に接続した平面形
コイル構成となっている。前記放電用電極3は電極カバ
ー5に囲まれている。この電極カバー5には、真空容器
1の外側から反応性ガス導入管6が接続されている。ま
た、前記放電用電極3には、高周波電源7が接続されて
いる。2. Description of the Related Art Conventionally, for example, a plasma CVD thin film apparatus shown in FIG. 7 is known. Reference numeral 1 in the figure is a reaction vessel. In the reaction vessel 1, a heater (heater source) 2 and a ladder-type discharge electrode 3 are arranged to face each other. A substrate 4 is supported by the heater 2 so as to face the discharge electrode 3 side. The discharge electrode 3 has a planar coil configuration in which a plurality of wires having a circular cross section are connected in a ladder shape. The discharge electrode 3 is surrounded by an electrode cover 5. A reactive gas introduction pipe 6 is connected to the electrode cover 5 from outside the vacuum vessel 1. A high-frequency power supply 7 is connected to the discharge electrode 3.
【0003】ところで、上記構成のプラズマCVD薄膜
装置においては、製膜する際、放電用電極3に高周波電
源7より高周波電源を印加した状態で、反応性ガス導入
管6から反応性ガスを矢印Aに示すように導入しなが
ら、放電用電極3と基板4間のプラズマ領域Rに反応性
ガスを供給し、領域Rで生成プラズマにより反応性ガス
を分解反応させて基板4上に製膜を行う。In the plasma CVD thin film apparatus having the above-described structure, when a film is formed, a reactive gas is supplied from a reactive gas introducing pipe 6 to a discharge electrode 3 while a high frequency power is applied from a high frequency power supply 7 to an arrow A. As shown in (1), a reactive gas is supplied to the plasma region R between the discharge electrode 3 and the substrate 4, and the reactive gas is decomposed and reacted by the generated plasma in the region R to form a film on the substrate 4. .
【0004】[0004]
【発明が解決しようとする課題】しかしながら、図7の
プラズマCVD製膜装置においては、放電用電極3の背
面側、即ち放電用電極3と反応容器1の壁面間の領域Q
に、製膜に寄与しない無効なプラズマが発生し、放電電
力をロスしていた。However, in the plasma CVD film forming apparatus shown in FIG. 7, the area Q between the back side of the discharge electrode 3, that is, the wall Q between the discharge electrode 3 and the wall surface of the reaction vessel 1 is formed.
In addition, invalid plasma that does not contribute to film formation was generated, and the discharge power was lost.
【0005】本発明は上記事情を考慮してなされたもの
で、反応容器内の中央部に電極カバーで囲まれたラダー
電極を配置するとともに、前記反応容器内で前記ラダー
電極を介して向かい合う位置に前記ラダー電極側に基板
を支持・加熱するヒータ源を配置して、両サイドのラダ
ー電極と前記基板間に反応性ガスを供給する構成とする
ことにより、製膜に寄与しない無効なプラズマを極力発
生させることなく、放電電力の損失を低減しえるプラズ
マCVD製膜装置を提供することを目的とする。The present invention has been made in view of the above circumstances, and has a ladder electrode surrounded by an electrode cover in the center of a reaction vessel, and a position facing the inside of the reaction vessel via the ladder electrode. A heater source for supporting and heating the substrate is arranged on the ladder electrode side, and a reactive gas is supplied between the ladder electrode on both sides and the substrate, thereby causing invalid plasma not contributing to film formation. It is an object of the present invention to provide a plasma CVD apparatus capable of reducing a loss of discharge power without generating as much as possible.
【0006】また、本発明は、反応容器内の中央部にガ
ス供給機能と電極機能とを備えたラダー電極装置を配置
するとともに、前記反応容器内で前記ラダー電極装置を
介して向かい合う位置に前記ラダー電極装置側に基板を
支持・加熱するヒータ源を配置して、前記ラダー電極装
置に反応性ガスを供給する構成とすることにより、製膜
に寄与しない無効なプラズマを極力発生させることな
く、放電電力の損失を低減しえるプラズマCVD製膜装
置を提供することを目的とする。Further, according to the present invention, a ladder electrode device having a gas supply function and an electrode function is arranged at a central portion in a reaction vessel, and the ladder electrode device is located at a position facing the inside of the reaction vessel via the ladder electrode device. By arranging a heater source for supporting and heating the substrate on the ladder electrode device side and supplying a reactive gas to the ladder electrode device, without generating invalid plasma that does not contribute to film formation as much as possible. An object of the present invention is to provide a plasma CVD film forming apparatus capable of reducing the loss of discharge power.
【0007】さらに、本発明は、基板〜電極間距離を変
化させる機構、または基板電位制御する電源を設置した
構成とする事により、複数基板の製膜速度、膜質を同時
独立に制御する事を目的とする。Further, the present invention provides a mechanism for changing the distance between the substrate and the electrode, or a configuration in which a power supply for controlling the substrate potential is installed, thereby simultaneously and independently controlling the film forming speed and film quality of a plurality of substrates. Aim.
【0008】[0008]
【課題を解決するための手段】本願第1の発明に係るプ
ラズマCVD製膜装置は、生成プラズマにより反応性ガ
スを分解反応させて基板上に製膜するプラズマCVD製
膜装置において、反応容器と、この反応容器内の中央部
に配置された、電極カバーで囲まれたラダー電極と、前
記反応容器内で前記ラダー電極を介して向かい合う位置
に配置された、前記ラダー電極側に基板を支持・加熱す
るヒータ源と、前記ラダー電極と前記基板間に反応性ガ
スを供給するガス供給機構と、前記ラダー電極に電気的
に接続された高周波電源とを具備することを特徴とす
る。According to a first aspect of the present invention, there is provided a plasma CVD apparatus for forming a film on a substrate by decomposing and reacting a reactive gas with generated plasma. A ladder electrode disposed in the center of the reaction vessel, surrounded by an electrode cover, and a substrate supported on the ladder electrode side disposed at a position facing the ladder electrode in the reaction vessel via the ladder electrode. It is characterized by comprising a heater source for heating, a gas supply mechanism for supplying a reactive gas between the ladder electrode and the substrate, and a high frequency power supply electrically connected to the ladder electrode.
【0009】本願第2の発明に係るプラズマCVD製膜
装置は、生成プラズマにより反応性ガスを分解反応させ
て基板上に製膜するプラズマCVD製膜装置において、
反応容器と、この反応容器内の中央部に配置された、ガ
ス供給機能と電極機能とを備えたラダー電極装置と、前
記反応容器内で前記ラダー電極装置を介して向かい合う
位置に配置された、前記ラダー電極装置側に基板を支持
・加熱するヒータ源と、前記ラダー電極装置に反応性ガ
スを供給するガス供給機構と、前記ラダー電極装置に電
気的に接続された高周波電源とを具備することを特徴と
する。A plasma CVD film forming apparatus according to a second aspect of the present invention is a plasma CVD film forming apparatus for forming a film on a substrate by decomposing a reactive gas by generated plasma.
A reaction vessel and a ladder electrode device having a gas supply function and an electrode function, which are disposed at a central portion in the reaction vessel, and are disposed at positions facing each other via the ladder electrode device in the reaction vessel. The ladder electrode device includes a heater source for supporting and heating a substrate, a gas supply mechanism for supplying a reactive gas to the ladder electrode device, and a high-frequency power supply electrically connected to the ladder electrode device. It is characterized by.
【0010】本願第3の発明に係るプラズマCVD製膜
装置は、請求項1又は請求項2に記載のプラズマCVD
製膜装置において、さらに基板〜電極間距離を変化させ
る機構、及び/または基板電位制御機構を具備すること
を特徴とする。According to a third aspect of the present invention, there is provided a plasma CVD film forming apparatus according to the first or second aspect.
The film forming apparatus further includes a mechanism for changing the distance between the substrate and the electrode, and / or a substrate potential control mechanism.
【0011】本願第4の発明に係るプラズマCVD製膜
方法は、請求項3に記載のプラズマCVD製膜装置にお
いて、さらに電極間距離を変化させる機構、及び/また
は基板電位制御機構を具備したプラズマCVD製膜装置
を用いて複数基板の製膜速度、膜質を同時独立に制御す
ることを特徴とする。According to a fourth aspect of the present invention, there is provided a plasma CVD film forming apparatus according to the third aspect, further comprising a mechanism for changing a distance between electrodes and / or a substrate potential control mechanism. The film forming speed and film quality of a plurality of substrates are simultaneously and independently controlled using a CVD film forming apparatus.
【0012】[0012]
【発明の実施の形態】以下、本発明について更に詳しく
説明する。第1の発明において、基板を支持・加熱する
ヒータ源とは、基板を支持しつつ基板を加熱する機能を
もつヒータ源を意味する。前記ヒータ源は、通常、ヒー
タカバーと、このヒータカバーの内側に配置されて該ヒ
ータカバーとともに移動するヒータとから構成されてい
るが、これに限定されない。BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the present invention will be described in more detail. In the first aspect, the heater source that supports and heats the substrate means a heater source that has a function of heating the substrate while supporting the substrate. The heater source generally includes, but is not limited to, a heater cover and a heater that is disposed inside the heater cover and moves together with the heater cover.
【0013】第1の発明において、前記ガス供給機構
は、通常、電極カバー内に反応性ガスを供給するガス導
入管と、このガス導入管に連結するガスボンベ等から構
成されている。第1の発明においては、基板と相対する
電極カバー面に多数のガス穴が形成されており、このガ
ス穴から反応性ガスがラダー電極と基板間の2つのプラ
ズマ領域に供給される。In the first invention, the gas supply mechanism generally includes a gas introduction pipe for supplying a reactive gas into the electrode cover, and a gas cylinder connected to the gas introduction pipe. In the first invention, a large number of gas holes are formed on the electrode cover surface facing the substrate, and a reactive gas is supplied from these gas holes to two plasma regions between the ladder electrode and the substrate.
【0014】第2の発明において、ガス供給機能と電極
機能とを備えたラダー電極装置とは、該装置の一構成で
あるラダー電極間と基板間に反応性ガスを供給する機能
と、ラダー電極と基板間のプラズマ領域にプラズマ放電
を起こさせる機能の両機能を備えた装置を意味する。こ
のラダー電極装置の具体的な構成は、後述する図4に示
す通りである。In the second invention, a ladder electrode device having a gas supply function and an electrode function is provided with a function of supplying a reactive gas between ladder electrodes and between substrates, which is one configuration of the ladder electrode device. A device having both functions of generating a plasma discharge in a plasma region between the substrate and the substrate. The specific configuration of the ladder electrode device is as shown in FIG. 4 described later.
【0015】第1・第2の発明によれば、従来無駄に使
用していた基板の裏面側の領域にも別な基板を配置して
製膜する構成となっているため、従来のように製膜に寄
与しない無効なプラズマがほとんど発生することがな
く、放電電力の損失を低減することができる。According to the first and second aspects of the present invention, another substrate is disposed also in a region on the back side of the substrate which has been wasted conventionally, and a film is formed. Ineffective plasma that does not contribute to film formation is hardly generated, and loss of discharge power can be reduced.
【0016】また、基板〜電極間距離を変化させる機構
を設置する事により、基板は通常アース電位であるた
め、ラダー電極と2基板間の電界強度を変化させる事が
出来るので、複数基板の製膜速度が同時独立に制御する
事が出来る。例えば片側の基板のみをラダー電極に近接
させる事により該基板のみの製膜速度の増加制御が可能
である。Further, by providing a mechanism for changing the distance between the substrate and the electrode, the electric field strength between the ladder electrode and the two substrates can be changed since the substrate is usually at the ground potential. The film speed can be controlled simultaneously and independently. For example, by bringing only one substrate close to the ladder electrode, it is possible to control the increase in the film forming speed of only the substrate.
【0017】さらに、基板電位制御機構を設置する事に
より、ラダー電極に対する相対電位を制御する事が出来
るので、ラダー電極と2基板間の電界強度の変化が可能
となり、複数基板の製膜速度が同時独立に制御する事が
出来る。例えば片側の基板のみに基板をバイアスさせる
ための直流電源を接続する事により該基板のみの製膜速
度の制御が可能である。Further, by installing the substrate potential control mechanism, the relative potential with respect to the ladder electrode can be controlled, so that the electric field intensity between the ladder electrode and the two substrates can be changed, and the film forming speed of a plurality of substrates can be reduced. It can be controlled simultaneously and independently. For example, by connecting a DC power supply for biasing the substrate to only one of the substrates, it is possible to control the film forming speed of only the substrate.
【0018】[0018]
【実施例】以下、本発明の各実施例について図面を参照
して説明する。 (実施例1)図1及び図2を参照する。ここで、図1は
本実施例1に係るプラズマCVD装置の全体図、図2は
図1のCVD装置の一構成要素であるラダー型電極の説
明図を示す。Embodiments of the present invention will be described below with reference to the drawings. (Embodiment 1) Reference is made to FIGS. Here, FIG. 1 is an overall view of a plasma CVD apparatus according to the first embodiment, and FIG. 2 is an explanatory view of a ladder-type electrode which is a component of the CVD apparatus of FIG.
【0019】図中の符番11は反応容器である。この反
応容器11内の中央部には、電極カバー12で囲まれた
ラダー型の放電用電極(以下、ラダー電極と呼ぶ)13
が配置されている。ここで、ラダー電極13の全体的な
構成は、図2に示すように、枠体14と、この枠体14
内にはしご状に連結した,断面が例えば円形状の複数の
線材15とから構成されている。Reference numeral 11 in the figure denotes a reaction vessel. A ladder-type discharge electrode (hereinafter, referred to as a ladder electrode) 13 surrounded by an electrode cover 12 is provided at a central portion in the reaction vessel 11.
Is arranged. Here, the overall configuration of the ladder electrode 13 is, as shown in FIG.
A plurality of wire members 15 having a circular cross section are connected in a ladder shape.
【0020】前記電極カバー12にはガス供給機構の一
構成であるガス供給管16が接続されており、これによ
りラダー電極13と後述する基板間に反応性ガスを供給
するようになっている。前記反応容器11内で前記ラダ
ー電極13の両サイドには、前記ラダー電極13側に基
板17を支持し、該基板17を加熱するヒータ源18
a,18bが夫々配置されている。ここで、ヒータ源1
8a,18bは、夫々ヒータカバー19と該カバー19
内に収用されたヒータ(図示せず)とを備えている。前
記ラダー電極13には、高周波電源20が接続されてい
る。The electrode cover 12 is connected to a gas supply pipe 16 which is a component of a gas supply mechanism, so that a reactive gas is supplied between the ladder electrode 13 and a substrate described later. In both sides of the ladder electrode 13 in the reaction vessel 11, a substrate 17 is supported on the ladder electrode 13 side, and a heater source 18 for heating the substrate 17 is provided.
a and 18b are arranged respectively. Here, heater source 1
8a and 18b are a heater cover 19 and the cover 19, respectively.
And a heater (not shown) housed therein. A high frequency power supply 20 is connected to the ladder electrode 13.
【0021】上記実施例1によれば、反応容器11内の
中央部に電極カバー12で囲まれたラダー電極13を配
置するとともに、前記反応容器11内で前記ラダー電極
13の両サイドに前記ラダー電極13側に基板17を支
持し、加熱するヒータ源18a,18bを夫々配置し、
両サイドのラダー電極13と前記基板17間に反応性ガ
スを供給市、生成プラズマにより反応性ガスを分解反応
させる構成となっている。このように、実施例1では、
従来無駄に使用していた基板の裏面側の領域にも別な基
板を配置して製膜する構成となっているため、従来のよ
うに製膜に寄与しない無効なプラズマがほとんど発生す
ることがないので、放電電力の損失を低減することがで
きる。According to the first embodiment, the ladder electrode 13 surrounded by the electrode cover 12 is disposed at the center of the reaction vessel 11, and the ladder electrode 13 is provided on both sides of the ladder electrode 13 in the reaction vessel 11. Heater sources 18a and 18b for supporting and heating the substrate 17 on the electrode 13 side are arranged respectively.
A reactive gas is supplied between the ladder electrodes 13 on both sides and the substrate 17, and the reactive gas is decomposed and reacted by generated plasma. Thus, in the first embodiment,
Since another substrate is also arranged in the area on the back side of the substrate that was conventionally used unnecessarily, the film is formed, so that invalid plasma that does not contribute to film formation unlike the conventional case is almost generated. Therefore, the loss of discharge power can be reduced.
【0022】(実施例2)図3及び図4を参照する。こ
こで、図3は本実施例2に係るプラズマCVD製膜装置
の全体図、図4は同製膜装置の一構成要素であるラダー
電極装置の説明図を示す。但し、図1、図2と同部材は
同付番を付して説明を省略する。Embodiment 2 Referring to FIG. 3 and FIG. Here, FIG. 3 is an overall view of a plasma CVD film forming apparatus according to the second embodiment, and FIG. 4 is an explanatory view of a ladder electrode device which is a component of the film forming apparatus. However, the same members as those in FIGS. 1 and 2 are denoted by the same reference numerals, and description thereof will be omitted.
【0023】図中の付番31は、反応容器11の中央部
に配置された,ガス供給機能と電極機能を備えたラダー
電極装置を示す。このラダー電極装置31は、互いに離
間して平行に配置された内部が空洞のガスマニホールド
32,33と、これらガスマニホールド32,33間に
配置されたラダー電極34と、前記ガスマニホールド3
2,33に連結する配管35とを有している。前記ラダ
ー電極34は、ガスマニホールド32,33間に配置さ
れ、基板17側に夫々複数のガス噴出孔36aを有した
パイプ36を複数本はしご状に配置した構成となってい
る。なお、図4中の矢印Aはガス吹出し向きを示す(便
宜上、一部のみを示している)。Reference numeral 31 in the figure indicates a ladder electrode device provided at the center of the reaction vessel 11 and having a gas supply function and an electrode function. The ladder electrode device 31 includes a gas manifold 32, 33, which is spaced apart and parallel to each other and has a hollow inside, a ladder electrode 34 disposed between the gas manifolds 32, 33, and the gas manifold 3.
2 and 33 are connected. The ladder electrode 34 is arranged between the gas manifolds 32 and 33, and has a configuration in which a plurality of pipes 36 each having a plurality of gas ejection holes 36a on the substrate 17 side are arranged in a ladder shape. Note that the arrow A in FIG. 4 indicates the gas blowing direction (only a part is shown for convenience).
【0024】実施例2によれば、反応容器11内の中央
部にガス供給機能と電極機能とを備えたラダー電極装置
31を配置するとともに、前記反応容器11内で前記ラ
ダー電極装置31の両サイドに前記ラダー電極装置31
側に基板17を支持し、加熱するヒータ源18a,18
bを夫々配置した構成となっている。従って、実施例2
によれば、実施例1と同様、従来のように製膜に寄与し
ない無効なプラズマがほとんど発生することがないの
で、放電電力の損失を低減することができる。According to the second embodiment, a ladder electrode device 31 having a gas supply function and an electrode function is arranged at the center of the reaction vessel 11, and both ladder electrode devices 31 are provided in the reaction vessel 11. The ladder electrode device 31 on the side
The heater sources 18a, 18 support and heat the substrate 17 on the side.
b are arranged respectively. Therefore, Example 2
According to the third embodiment, as in the first embodiment, there is almost no generation of ineffective plasma that does not contribute to film formation as in the related art, so that the loss of discharge power can be reduced.
【0025】(実施例3)図5及び図6を参照する。図
5は本実施例3に係るプラズマCVD製膜装置の全体
図、図6は同製膜装置の一構成要素であるラダー電極装
置の説明図を示す。但し、図1、図2と同部材は同付番
を付して説明を省略する。(Embodiment 3) Referring to FIG. 5 and FIG. FIG. 5 is an overall view of a plasma CVD film forming apparatus according to the third embodiment, and FIG. 6 is an explanatory diagram of a ladder electrode device which is one component of the film forming apparatus. However, the same members as those in FIGS. 1 and 2 are denoted by the same reference numerals, and description thereof will be omitted.
【0026】基板ヒータの背面に電極方向に可動するヒ
ータ移動装置41a,41bを設置している。ヒータ移
動装置41a,41bを付設する事により、電極〜基板
間距離を可変とする事が出来る。その結果、例えばヒー
タ移動装置41aを用いて基板ヒータ18aをラダー電
極32に近接させると、基板17に製膜される膜の製膜
速度のみを向上させる事が出来る。また、逆にヒータ移
動装置41aを用いて基板ヒータ18aをラダー電極3
2より遠ざけると、基板17に製膜される膜の製膜速度
のみを低下させる事が出来る。上記制御はヒータ移動装
置41bを用いても可能であるため、複数基板の製膜速
度が同時独立に制御する事が出来る。On the back of the substrate heater, heater moving devices 41a and 41b movable in the electrode direction are provided. By providing the heater moving devices 41a and 41b, the distance between the electrode and the substrate can be made variable. As a result, for example, when the substrate heater 18a is brought close to the ladder electrode 32 using the heater moving device 41a, only the film forming speed of the film formed on the substrate 17 can be improved. Conversely, the substrate heater 18a is connected to the ladder electrode 3 using the heater moving device 41a.
When the distance is more than 2, only the film forming speed of the film formed on the substrate 17 can be reduced. Since the above control can be performed by using the heater moving device 41b, the film forming speed of a plurality of substrates can be controlled simultaneously and independently.
【0027】また、図5中には基板ヒータに接続する直
流電源42a,42bを設置している。直流電源42
a,42bを付設する事により、電極〜基板間電界強度
を可変とする事が出来る。その結果、例えば直流電源4
2aを用いて基板ヒータ18aに正電圧を印加すると、
ラダー電極32は通常負にバイアスされているので、基
板と電極間の平均電位差を大きくする事が出来る。その
結果、電界強度が大きくなり強いプラズマが発生しやす
くなるので基板17に製膜される膜の製膜速度のみを向
上させる事が出来る。上記制御は直流電源42bを用い
ても可能であるため、複数基板の製膜速度が同時独立に
制御する事が出来る。In FIG. 5, DC power supplies 42a and 42b connected to the substrate heater are provided. DC power supply 42
By providing a and 42b, the electric field strength between the electrode and the substrate can be made variable. As a result, for example, the DC power supply 4
When a positive voltage is applied to the substrate heater 18a using 2a,
Since the ladder electrode 32 is normally negatively biased, the average potential difference between the substrate and the electrode can be increased. As a result, the electric field strength increases and strong plasma is easily generated, so that only the film forming speed of the film formed on the substrate 17 can be improved. Since the above control can be performed by using the DC power supply 42b, the film forming speeds of a plurality of substrates can be controlled simultaneously and independently.
【0028】[0028]
【発明の効果】以上詳述した如く本発明によれば、反応
容器内の中央部に電極カバーで囲まれたラダー電極を配
置するとともに、前記反応容器内で前記ラダー電極の両
サイドに前記ラダー電極側に基板を支持・加熱するヒー
タ源を配置して、両サイドのラダー電極と前記基板間に
反応性ガスを供給する構成とすることにより、製膜に寄
与しない無効なプラズマを極力発生させることなく、放
電電力の損失を低減しえるプラズマCVD製膜装置を提
供できる。As described above in detail, according to the present invention, a ladder electrode surrounded by an electrode cover is disposed in the center of the reaction vessel, and the ladder electrode is provided on both sides of the ladder electrode in the reaction vessel. By disposing a heater source for supporting and heating the substrate on the electrode side and supplying a reactive gas between the ladder electrodes on both sides and the substrate, invalid plasma that does not contribute to film formation is generated as much as possible. Thus, a plasma CVD film forming apparatus capable of reducing the loss of discharge power can be provided.
【0029】また、本発明によれば、反応容器内の中央
部にガス供給機能と電極機能とを備えたラダー電極装置
を配置するとともに、前記反応容器内で前記ラダー電極
装置の両サイドに前記ラダー電極装置側に基板を支持・
加熱するヒータ源を配置して、前記ラダー電極装置に反
応性ガスを供給する構成とすることにより、製膜に寄与
しない無効なプラズマを極力発生させることなく、放電
電力の損失を低減しえるプラズマCVD製膜装置を提供
できる。According to the present invention, a ladder electrode device having a gas supply function and an electrode function is arranged at a central portion in the reaction vessel, and the ladder electrode device is provided on both sides of the ladder electrode device in the reaction vessel. Supports the substrate on the ladder electrode device side
By arranging a heater source for heating and supplying a reactive gas to the ladder electrode device, a plasma capable of reducing a loss of discharge power without generating an ineffective plasma that does not contribute to film formation as much as possible. A CVD film forming apparatus can be provided.
【0030】さらに、本発明は、基板〜電極間距離を変
化させる機構、または基板電位制御する電源を設置した
構成とする事により、複数基板の製膜速度、膜質を同時
独立に制御できる。Further, according to the present invention, the film forming speed and the film quality of a plurality of substrates can be simultaneously and independently controlled by using a mechanism for changing the distance between the substrate and the electrode or a configuration in which a power supply for controlling the substrate potential is provided.
【図1】本発明の実施例1に係るプラズマCVD製膜装
置の全体図。FIG. 1 is an overall view of a plasma CVD film forming apparatus according to a first embodiment of the present invention.
【図2】図1の薄膜装置の一構成要素であるラダー電極
の説明図。FIG. 2 is an explanatory diagram of a ladder electrode which is a component of the thin film device of FIG.
【図3】本発明の実施例2に係るプラズマCVD製膜装
置の全体図。FIG. 3 is an overall view of a plasma CVD film forming apparatus according to a second embodiment of the present invention.
【図4】図3の薄膜装置の一構成要素であるラダー電極
装置の説明図。FIG. 4 is an explanatory diagram of a ladder electrode device which is a component of the thin film device of FIG.
【図5】本発明の実施例3に係るプラズマCVD製膜装
置の全体図。FIG. 5 is an overall view of a plasma CVD film forming apparatus according to a third embodiment of the present invention.
【図6】図5の製膜装置の一構成要素であるラダー電極
装置の説明図。FIG. 6 is an explanatory diagram of a ladder electrode device which is a component of the film forming apparatus of FIG.
【図7】従来のプラズマCVD製膜装置の全体図。FIG. 7 is an overall view of a conventional plasma CVD film forming apparatus.
11…反応容器、 12…電極カバー、 13,34…ラダー電極、 14…枠体、 15…線材、 16…ガス供給管、 17…基板、 18a,18b…ヒータ源、 19…ヒータカバー、 20…高周波電源、 31…ラダー電極装置、 32,33…ガスマニホールド、 35…配管、 36…パイプ、 41a,41b…ヒータ移動装置、 42a,42b…直流電源。 Reference Signs List 11: reaction vessel, 12: electrode cover, 13, 34: ladder electrode, 14: frame, 15: wire, 16: gas supply pipe, 17: substrate, 18a, 18b: heater source, 19: heater cover, 20 ... High frequency power supply, 31: ladder electrode device, 32, 33: gas manifold, 35: pipe, 36: pipe, 41a, 41b: heater moving device, 42a, 42b: DC power supply.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 竹内 良昭 長崎県長崎市深堀町五丁目717番1号 三 菱重工業株式会社長崎研究所内 (72)発明者 山越 英男 神奈川県横浜市金沢区幸浦一丁目8番地1 三菱重工業株式会社基盤技術研究所内 Fターム(参考) 4K030 EA06 FA03 HA13 JA03 JA12 JA17 KA15 KA17 KA23 KA41 5F045 AA08 BB08 DP11 EH04 EH05 EH07 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Yoshiaki Takeuchi 5-717-1, Fukahori-cho, Nagasaki-shi, Nagasaki Sanishi Heavy Industries Co., Ltd. Nagasaki Research Laboratory (72) Inventor Hideo Yamakoshi 1-chome, Sachiura, Kanazawa-ku, Yokohama-shi, Kanagawa 8F-1 Mitsubishi Heavy Industries, Ltd. Basic Technology Research Laboratory F-term (reference) 4K030 EA06 FA03 HA13 JA03 JA12 JA17 KA15 KA17 KA23 KA41 5F045 AA08 BB08 DP11 EH04 EH05 EH07
Claims (4)
応させて基板上に製膜するプラズマCVD製膜装置にお
いて、 反応容器と、この反応容器内の中央部に配置された、電
極カバーで囲まれたラダー電極と、前記反応容器内で前
記ラダー電極を介して向かい合う位置に配置された、前
記ラダー電極側に基板を支持・加熱するヒータ源と、前
記ラダー電極と前記基板間に反応性ガスを供給するガス
供給機構と、前記ラダー電極に電気的に接続された高周
波電源とを具備することを特徴とするプラズマCVD製
膜装置。1. A plasma CVD film forming apparatus for forming a film on a substrate by decomposing a reactive gas by a generated plasma to form a film on a substrate, wherein the reaction container is surrounded by an electrode cover disposed in a central portion of the reaction container. A ladder electrode, a heater source disposed at a position facing the ladder electrode in the reaction vessel via the ladder electrode, and a heater source for supporting and heating a substrate on the ladder electrode side; and supplying a reactive gas between the ladder electrode and the substrate. A plasma CVD film forming apparatus, comprising: a gas supply mechanism for supplying a gas; and a high frequency power supply electrically connected to the ladder electrode.
応させて基板上に製膜するプラズマCVD製膜装置にお
いて、 反応容器と、この反応容器内の中央部に配置された、ガ
ス供給機能と電極機能とを備えたラダー電極装置と、前
記反応容器内で前記ラダー電極装置を介して向かい合う
位置に配置された、前記ラダー電極装置側に基板を支持
・加熱するヒータ源と、前記ラダー電極装置に反応性ガ
スを供給するガス供給機構と、前記ラダー電極装置に電
気的に接続された高周波電源とを具備することを特徴と
するプラズマCVD製膜装置。2. A plasma CVD film forming apparatus for forming a film on a substrate by decomposing a reactive gas by a generated plasma to form a film on a substrate, comprising: a reaction container; a gas supply function and an electrode disposed in a central portion of the reaction container; A ladder electrode device having a function, a heater source disposed at a position facing the inside of the reaction vessel via the ladder electrode device, a heater source for supporting and heating a substrate on the ladder electrode device side, and the ladder electrode device. A plasma CVD film forming apparatus, comprising: a gas supply mechanism for supplying a reactive gas; and a high-frequency power supply electrically connected to the ladder electrode device.
D製膜装置において、さらに基板〜電極間距離を変化さ
せる機構、及び/または基板電位制御機構を具備するこ
とを特徴とするプラズマCVD製膜装置。3. The plasma CV according to claim 1, wherein
A plasma CVD film forming apparatus, further comprising a mechanism for changing a distance between a substrate and an electrode and / or a substrate potential control mechanism.
置において、さらに電極間距離を変化させる機構、及び
/または基板電位制御機構を具備したプラズマCVD製
膜装置を用いて複数基板の製膜速度、膜質を同時独立に
制御することを特徴とするプラズマCVD製膜方法。4. A plasma CVD film forming apparatus according to claim 3, wherein a plurality of substrates are formed by using a plasma CVD film forming apparatus further provided with a mechanism for changing a distance between electrodes and / or a substrate potential control mechanism. A plasma CVD film forming method characterized by simultaneously and independently controlling a speed and a film quality.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000315306A JP2002121677A (en) | 2000-10-16 | 2000-10-16 | Method and apparatus for forming cvd film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000315306A JP2002121677A (en) | 2000-10-16 | 2000-10-16 | Method and apparatus for forming cvd film |
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| Publication Number | Publication Date |
|---|---|
| JP2002121677A true JP2002121677A (en) | 2002-04-26 |
Family
ID=18794432
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|---|---|---|---|
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7537662B2 (en) | 2003-04-29 | 2009-05-26 | Asm International N.V. | Method and apparatus for depositing thin films on a surface |
| US7601223B2 (en) * | 2003-04-29 | 2009-10-13 | Asm International N.V. | Showerhead assembly and ALD methods |
| US7754013B2 (en) | 2002-12-05 | 2010-07-13 | Asm International N.V. | Apparatus and method for atomic layer deposition on substrates |
| JP2013072132A (en) * | 2011-09-29 | 2013-04-22 | Ulvac Japan Ltd | Film-forming apparatus |
| KR101514080B1 (en) * | 2009-02-04 | 2015-04-21 | 엘지전자 주식회사 | Plasma chemical vapor deposition apparatus |
-
2000
- 2000-10-16 JP JP2000315306A patent/JP2002121677A/en not_active Withdrawn
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7754013B2 (en) | 2002-12-05 | 2010-07-13 | Asm International N.V. | Apparatus and method for atomic layer deposition on substrates |
| US7537662B2 (en) | 2003-04-29 | 2009-05-26 | Asm International N.V. | Method and apparatus for depositing thin films on a surface |
| US7601223B2 (en) * | 2003-04-29 | 2009-10-13 | Asm International N.V. | Showerhead assembly and ALD methods |
| USRE48871E1 (en) | 2003-04-29 | 2022-01-04 | Asm Ip Holding B.V. | Method and apparatus for depositing thin films on a surface |
| KR101514080B1 (en) * | 2009-02-04 | 2015-04-21 | 엘지전자 주식회사 | Plasma chemical vapor deposition apparatus |
| JP2013072132A (en) * | 2011-09-29 | 2013-04-22 | Ulvac Japan Ltd | Film-forming apparatus |
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