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JP2002016184A - Thermal deformation preventing structure of bga package - Google Patents

Thermal deformation preventing structure of bga package

Info

Publication number
JP2002016184A
JP2002016184A JP2000196207A JP2000196207A JP2002016184A JP 2002016184 A JP2002016184 A JP 2002016184A JP 2000196207 A JP2000196207 A JP 2000196207A JP 2000196207 A JP2000196207 A JP 2000196207A JP 2002016184 A JP2002016184 A JP 2002016184A
Authority
JP
Japan
Prior art keywords
bga
bga package
thermal deformation
printed circuit
main body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2000196207A
Other languages
Japanese (ja)
Inventor
Tokuichi Nishio
徳一 西尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Engineering Ltd
Original Assignee
NEC Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Engineering Ltd filed Critical NEC Engineering Ltd
Priority to JP2000196207A priority Critical patent/JP2002016184A/en
Publication of JP2002016184A publication Critical patent/JP2002016184A/en
Withdrawn legal-status Critical Current

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  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a thermal deformation preventing structure of a BGA package wherein, related to connection between the BGA package and a printed board, cracking at a soldered connection is prevented which is caused by thermal deformation of a BGA main body and the printed board which can occur after passing through a reflow furnace for mounting the BGA package. SOLUTION: The thermal deformation preventing structure of the BGA package is provided which comprises a beam member 3 for covering the entire surface of a BGA main body 1 when the BGA package is mounted on a printed board 5, a pin member 2 which is buried in the BGA main body 1 and protrudes above a bottom surface, and a through hole 6 through which, the pin member 2 of the BGA package penetrates and which is formed at the printed board from a material of melting point about 1000 deg.C or above. The beam member 3 of the BGA package may be arranged in lattice while the through hole 6 of the printed board 5 may be formed by copper plating or gold plating.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、BGA(ボールグ
リッドアレイ)パッケージの熱変形防止構造に関し、特
に、BGAパッケージをプリント基板に半田付けする際
に発生するおそれのある熱変形を防止するための構造に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure for preventing thermal deformation of a BGA (ball grid array) package, and more particularly to a structure for preventing thermal deformation that may occur when soldering a BGA package to a printed circuit board. Regarding the structure.

【0002】[0002]

【従来の技術】従来、例えば、特開平11−19567
8号公報には、製造コストを低減するとともに、装置の
信頼性の向上を図ることを目的とした表面実装モジュー
ル実装構造が開示されている。
2. Description of the Related Art Conventionally, for example, Japanese Unexamined Patent Application Publication No. 11-19567
No. 8 discloses a surface mount module mounting structure for the purpose of reducing the manufacturing cost and improving the reliability of the device.

【0003】この表面実装モジュール実装構造では、半
導体部品が実装された基板の下面のうち周囲に近い領域
に半田バンプを設け、中央よりの部分にプレスフィット
ピン構造のピンを固定している。また、プリント基板
は、表面モジュールが実装される領域のうち、周囲に近
い領域にパッドが形成してあり、内側の領域に複数の貫
通孔が形成されている。さらに、表面モジュールは、半
田バンプがパッドと半田付けされ、プレスフィットピン
が貫通孔内に圧入されて実装されている。
In this surface mounting module mounting structure, solder bumps are provided in a region near the periphery of the lower surface of a substrate on which semiconductor components are mounted, and pins of a press-fit pin structure are fixed to a portion from the center. In the printed circuit board, pads are formed in a region near the periphery of the region where the surface module is mounted, and a plurality of through holes are formed in an inner region. Furthermore, the surface module is mounted with solder bumps soldered to pads and press-fit pins pressed into the through holes.

【0004】一方、特開平10−98073号公報に記
載の半導体集積回路は、配線基板に形成された配線のリ
ード部を半導体チップの主面上の外部端子と電気的に接
続させ、かつ前記配線基板に形成された配線のランド部
をバンプ電極と電気的に接続させてなる半導体集積回路
であって、前記半導体チップの外部端子は半導体チップ
の周辺部に配置され、半導体チップの外部端子には、配
線基板に形成された配線を介して接続される。バンプ電
極は、半導体チップの外周より外側領域の周辺に2列に
配置され、かつ配線基板の裏面には半導体チップの外周
近傍から周辺への延在部分に補強部材を配置している。
On the other hand, in a semiconductor integrated circuit disclosed in Japanese Patent Application Laid-Open No. 10-98073, a lead portion of a wiring formed on a wiring board is electrically connected to an external terminal on a main surface of a semiconductor chip. A semiconductor integrated circuit in which a land portion of a wiring formed on a substrate is electrically connected to a bump electrode, wherein external terminals of the semiconductor chip are arranged in a peripheral portion of the semiconductor chip, and external terminals of the semiconductor chip include Are connected via the wiring formed on the wiring board. The bump electrodes are arranged in two rows around the outer region from the outer periphery of the semiconductor chip, and the reinforcing member is arranged on the back surface of the wiring board at a portion extending from the vicinity of the outer periphery to the periphery of the semiconductor chip.

【0005】[0005]

【発明が解決しようとする課題】しかし、上記従来の半
導体集積回路等においては、BGA本体の下面に配列さ
れている半田ボールによる半田接続のみの構造となって
おり、BGA本体及びプリント基板の熱膨張率を考慮し
た熱変形による半田接続部の破壊防止処置がとられてい
ないため、リフロー時のBGA本体の熱変形による半田
ボール部のクラックの発生を防止することができないと
いう問題があった。
However, the above-mentioned conventional semiconductor integrated circuit or the like has a structure in which only the solder connection is performed by the solder balls arranged on the lower surface of the BGA main body, and the heat of the BGA main body and the printed circuit board is reduced. Since no measures have been taken to prevent the solder joints from being broken due to thermal deformation in consideration of the coefficient of expansion, cracks in the solder ball portions due to thermal deformation of the BGA body during reflow cannot be prevented.

【0006】そこで、本発明は、上記従来の半導体集積
回路等における問題点に鑑みてなされたものであって、
BGAパッケージとプリント基板との接続において、B
GAパッケージを実装するためにリフロー炉を通過させ
た後に発生するおそれのあるBGA本体及びプリント基
板の熱変形による半田接続部のクラックを防止すること
のできるBGAパッケージの熱変形防止構造を提供する
ことを目的とする。
Accordingly, the present invention has been made in view of the above-mentioned problems in the conventional semiconductor integrated circuit and the like.
In the connection between the BGA package and the printed circuit board, B
To provide a BGA package thermal deformation prevention structure capable of preventing cracks in a solder connection portion due to thermal deformation of a BGA main body and a printed circuit board which may occur after passing through a reflow furnace for mounting a GA package. With the goal.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の発明は、BGAパッケージをプリン
ト基板に実装する際の熱変形防止構造であって、BGA
本体の表面全体を覆う梁部材と、前記BGA本体に埋設
され、底面より突出するピン部材と、前記BGAパッケ
ージの前記ピン部材が貫通可能で、略々1000℃以上
の融点を有する材料でプリント基板に形成された貫通孔
とで構成されることを特徴とする。
According to one aspect of the present invention, there is provided a structure for preventing thermal deformation when a BGA package is mounted on a printed circuit board.
A beam member covering the entire surface of the main body, a pin member embedded in the BGA main body and protruding from the bottom surface, and a printed board made of a material through which the pin member of the BGA package can penetrate and has a melting point of approximately 1000 ° C. or higher And a through-hole formed in the hole.

【0008】そして、請求項1記載の発明によれば、リ
フロー前にプレスによってBGAパッケージをプリント
基板に実装し、BGAパッケージの表面を覆う梁部材に
よって、リフロー時の熱変形を軽減するとともに、ピン
部材によってプリント基板を摩擦保持し、BGAパッケ
ージの変形にプリント基板の変形を強制的に同期させ、
BGAパッケージとプリント基板の高さ間隔を一定に保
ち、熱変形によるピン部材と貫通孔の接続部の破壊を防
止することにより、半田ボール半田接続部分にかかる熱
応力を軽減することができ、接続部分である半田ボール
部のクラックを防止して、BGAパッケージのプリント
基板との接続信頼性が向上し、製品寿命を延ばすことが
できる。
According to the first aspect of the present invention, the BGA package is mounted on the printed circuit board by pressing before the reflow, and the beam member covering the surface of the BGA package reduces the thermal deformation at the time of the reflow and reduces the pin size. The member holds the printed circuit board by friction, forcibly synchronizes the deformation of the printed circuit board with the deformation of the BGA package,
By keeping the height interval between the BGA package and the printed circuit board constant and preventing the destruction of the connection between the pin member and the through hole due to thermal deformation, it is possible to reduce the thermal stress applied to the solder ball solder connection part, This prevents cracks in the solder ball portion, thereby improving the connection reliability of the BGA package with the printed circuit board and extending the life of the product.

【0009】この際、貫通孔が略々1000℃以上の融
点を有する材料でプリント基板に形成されているため、
従来の半田メッキのようにリフロー時に半田が融解して
ピン部材により固定の効果がなくなってしまうことな
く、ピン部材によってプリント基板を確実に摩擦保持す
ることができる。
At this time, since the through holes are formed on the printed circuit board with a material having a melting point of about 1000 ° C. or more,
Unlike the conventional solder plating, the printed circuit board can be reliably held by the pin member without melting the solder at the time of reflow and losing the fixing effect by the pin member.

【0010】請求項2記載の発明は、請求項1記載のB
GAパッケージの熱変形防止構造の好ましい形態とし
て、前記BGAパッケージの前記梁部材は、格子状に配
置されていることを特徴とする。
[0010] The invention according to claim 2 is a method according to claim 1, wherein
In a preferred embodiment of the thermal deformation preventing structure of the GA package, the beam members of the BGA package are arranged in a lattice.

【0011】請求項3記載の発明は、請求項1または2
記載のBGAパッケージの熱変形防止構造の好ましい形
態として、前記プリント基板の前記貫通孔を、現在使用
されている銅メッキまたは金メッキで形成したことを特
徴とする。
[0011] The invention according to claim 3 is the invention according to claim 1 or 2.
In a preferred embodiment of the thermal deformation preventing structure of the BGA package described above, the through hole of the printed circuit board is formed by copper plating or gold plating which is currently used.

【0012】[0012]

【発明の実施の形態】次に、本発明にかかるBGAパッ
ケージの熱変形防止構造の実施の形態の具体例について
図面を参照しながら説明する。
Next, a specific example of an embodiment of a thermal deformation preventing structure for a BGA package according to the present invention will be described with reference to the drawings.

【0013】本発明は、BGAパッケージをプリント基
板に実装する際の熱変形防止構造であって、図1及び図
2は、この熱変形防止構造を適用したBGAパッケージ
の一実施例を示す。
The present invention relates to a thermal deformation preventing structure for mounting a BGA package on a printed circuit board. FIGS. 1 and 2 show an embodiment of a BGA package to which the thermal deformation preventing structure is applied.

【0014】このBGAパッケージは、BGA本体1の
表面全体を覆う格子状の梁部材3と、BGA本体1に埋
設され、BGA本体1の底面より突出するピン部材2と
を備える。
The BGA package includes a lattice-shaped beam member 3 that covers the entire surface of the BGA main body 1 and a pin member 2 that is embedded in the BGA main body 1 and protrudes from the bottom surface of the BGA main body 1.

【0015】ピン部材2は、BGA本体1に埋め込まれ
た形でBGA本体1に固定されている。このピン部材2
は、BGA本体1の中央よりと、中心からの延長線上に
各々配置されている。また、BGA本体1の底面には電
気的接続を得るために、半田ボール4が設けられてい
る。
The pin member 2 is fixed to the BGA main body 1 so as to be embedded in the BGA main body 1. This pin member 2
Are arranged from the center of the BGA main body 1 and on an extension line from the center. Further, solder balls 4 are provided on the bottom surface of the BGA main body 1 in order to obtain electrical connection.

【0016】一方、図3に示すように、プリント基板5
には、ピン部材2が圧入される貫通孔6が設けられ、貫
通孔6を形成するための材料として、半田メッキ以外の
メッキ、すなわち銅メッキまたは金メッキが使用され
る。貫通孔6を形成する材料を半田メッキ以外のメッキ
とする理由は、従来の貫通孔に使用されている半田メッ
キ仕上げでは、リフロー時に半田メッキが融解し、圧入
構造であるピン部材2を固定できなくなり、ピン部材2
による機械的変形防止構造とすることができなくするた
めである。
On the other hand, as shown in FIG.
Is provided with a through hole 6 into which the pin member 2 is press-fitted. As a material for forming the through hole 6, plating other than solder plating, that is, copper plating or gold plating is used. The reason why the material forming the through hole 6 is a plating other than the solder plating is that in the solder plating finish used in the conventional through hole, the solder plating is melted at the time of reflow, and the pin member 2 having the press-fit structure can be fixed. Gone, pin member 2
This is to prevent the mechanical deformation preventing structure from being used.

【0017】次に、上記構成を有するBGAパッケージ
の熱変形防止構造の動作について、図3を参照しながら
説明する。
Next, the operation of the structure for preventing thermal deformation of the BGA package having the above configuration will be described with reference to FIG.

【0018】BGA本体1は、プリント基板5にプレス
によりピン部材2が貫通孔6に圧入されて機械的に固定
される。機械的に固定されたBGA本体1は、この時に
プリント基板5のフットパターン7と位置合わせされ
る。その後、固定したBGA本体1とプリント基板5と
をリフロー炉に通すことにより、半田ボール4が融解
し、フットパターン7と半田接続されて電気的接続が得
られる。
The BGA main body 1 is mechanically fixed by pressing a pin member 2 into a through hole 6 by pressing a printed circuit board 5. At this time, the BGA body 1 mechanically fixed is aligned with the foot pattern 7 of the printed circuit board 5. Thereafter, by passing the fixed BGA main body 1 and the printed board 5 through a reflow furnace, the solder balls 4 are melted and solder-connected to the foot patterns 7 to obtain electrical connection.

【0019】ここで、機械的接続構造となったBGA本
体1とプリント基板5とは、リフロー時に熱変形を生じ
るが、ピン部材2とプリント基板5との接続により、強
制的にBGA本体1またはプリント基板5のどちらか一
方の変形の度合いが強い側に変形の同期を取ることがで
きる。この時、BGA本体1の変形度合いを軽減する機
能として、格子状の梁部材3をBGA表面全体に付加
し、変形方向に対する変形量を小さくしたとしたことも
本発明の特徴であり、ピン部材2を用いた機械的接続と
ともに、二重の熱変形による接続部破壊防止構造を形成
することが特徴である。
Here, the BGA body 1 and the printed board 5 having a mechanical connection structure undergo thermal deformation during reflow. However, the connection between the pin member 2 and the printed board 5 forces the BGA body 1 or the printed board 5. The deformation can be synchronized to the one of the printed circuit boards 5 on the side where the degree of deformation is strong. At this time, as a function of reducing the degree of deformation of the BGA main body 1, a lattice-shaped beam member 3 is added to the entire surface of the BGA to reduce the amount of deformation in the deformation direction. In addition to the mechanical connection using No. 2, it is characterized in that a structure for preventing connection portion breakage due to double thermal deformation is formed.

【0020】尚、上記実施例においては、BGA本体1
の表面全体を覆う梁部材3を格子状としたが、格子状で
なくとも、1枚の金属板にパンチ穴を穿設した場合のよ
うに、梁部材として機能すれば足りる。
In the above embodiment, the BGA body 1
Although the beam member 3 that covers the entire surface is formed in a lattice shape, it is sufficient if the beam member 3 functions as a beam member as in the case where a punched hole is formed in one metal plate, even if it is not lattice-shaped.

【0021】また、上記実施例においては、プリント基
板5の貫通孔6を銅メッキまたは金メッキで形成した
が、リフロー時に融解しない略々1000℃以上の融点
を有する他の材料で形成することもできる。
In the above embodiment, the through-hole 6 of the printed circuit board 5 is formed by copper plating or gold plating. However, the through-hole 6 may be formed of another material having a melting point of about 1000 ° C. or higher which does not melt during reflow. .

【0022】[0022]

【発明の効果】以上説明したように、本発明によれば、
BGAパッケージとプリント基板との接続の際に、リフ
ロー炉を通過させた後に発生するおそれのあるBGA本
体及びプリント基板の熱変形による半田接続部のクラッ
クを防止することが可能なBGAパッケージの熱変形防
止構造を提供することができる。
As described above, according to the present invention,
Thermal deformation of the BGA package that can prevent cracks in the solder connection part due to thermal deformation of the BGA body and the printed circuit board that may occur after passing through the reflow furnace when connecting the BGA package and the printed circuit board A prevention structure can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明にかかるBGAパッケージの熱変形防止
構造の一実施例を示す図であって、(a)は平面図、
(b)は(a)のA−A線断面図である。
FIG. 1 is a view showing one embodiment of a structure for preventing thermal deformation of a BGA package according to the present invention, wherein (a) is a plan view,
(B) is a sectional view taken along line AA of (a).

【図2】図1のBGAパッケージの熱変形防止構造の底
面図である。
FIG. 2 is a bottom view of the thermal deformation preventing structure of the BGA package of FIG. 1;

【図3】図1の熱変形防止構造を備えたBGAパッケー
ジをプリント基板に実装した状態を示す横断面図であ
る。
FIG. 3 is a cross-sectional view showing a state in which the BGA package having the thermal deformation preventing structure of FIG. 1 is mounted on a printed circuit board.

【符号の説明】[Explanation of symbols]

1 BGA本体 2 ピン部材 3 梁部材 4 半田ボール 5 プリント基板 6 貫通孔 7 フットパターン DESCRIPTION OF SYMBOLS 1 BGA main body 2 Pin member 3 Beam member 4 Solder ball 5 Printed circuit board 6 Through hole 7 Foot pattern

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 BGAパッケージをプリント基板に実装
する際の熱変形防止構造であって、 BGA本体の表面全体を覆う梁部材と、前記BGA本体
に埋設され、底面より突出するピン部材と、 前記BGAパッケージの前記ピン部材が貫通可能で、略
々1000℃以上の融点を有する材料でプリント基板に
形成された貫通孔とで構成されることを特徴とするBG
Aパッケージの熱変形防止構造。
1. A structure for preventing thermal deformation when a BGA package is mounted on a printed circuit board, comprising: a beam member covering the entire surface of the BGA body; a pin member embedded in the BGA body and protruding from a bottom surface; A BG through which the pin member of the BGA package is penetrable and which is formed of a material having a melting point of approximately 1000 ° C. or higher on a printed circuit board
A package thermal deformation prevention structure.
【請求項2】 前記BGAパッケージの前記梁部材は、
格子状に配置されていることを特徴とする請求項1記載
のBGAパッケージの熱変形防止構造。
2. The beam member of the BGA package,
2. The structure for preventing thermal deformation of a BGA package according to claim 1, wherein the structure is arranged in a lattice.
【請求項3】 前記プリント基板の前記貫通孔は、銅メ
ッキまたは金メッキで形成されることを特徴とする請求
項1または2記載のBGAパッケージの熱変形防止構
造。
3. The structure for preventing thermal deformation of a BGA package according to claim 1, wherein said through-hole of said printed board is formed by copper plating or gold plating.
JP2000196207A 2000-06-29 2000-06-29 Thermal deformation preventing structure of bga package Withdrawn JP2002016184A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000196207A JP2002016184A (en) 2000-06-29 2000-06-29 Thermal deformation preventing structure of bga package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000196207A JP2002016184A (en) 2000-06-29 2000-06-29 Thermal deformation preventing structure of bga package

Publications (1)

Publication Number Publication Date
JP2002016184A true JP2002016184A (en) 2002-01-18

Family

ID=18694750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000196207A Withdrawn JP2002016184A (en) 2000-06-29 2000-06-29 Thermal deformation preventing structure of bga package

Country Status (1)

Country Link
JP (1) JP2002016184A (en)

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