JP2001349923A - Insulation coating uniformity tester and tester - Google Patents

Abstract

(57) [Problem] [Problem] To easily identify a defective portion without destroying a normal insulating film portion, take sufficient measures against residual charge effects and absorption phenomena, and prevent electric noise. The present invention provides an insulative film uniformity determination tester and a tester suitable for use as a tester and a tester on a line without causing malfunction. SOLUTION: An insulation transformer for completely cutting off a primary side and a secondary side and performing a special shielding process for noise cut;
A high-voltage generating circuit for applying a test voltage to the enameled wire; a current limiting resistor for limiting the current of the test voltage; A current detection circuit for detecting a defect;
Current detection circuit and input / output circuit I for various signals from outside
/ O; and a counter which counts and adds the number of uniformity failures and outputs the result to the outside as a contact signal; and constitutes an insulating film uniformity determination tester.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an insulation film uniformity judging test capable of detecting and judging a uniformity defect such as a pinhole defect or an insulation defect of an insulation film of an enameled wire as a running electric wire under test. Related to test equipment and test equipment.

[0002]

2. Description of the Related Art As shown schematically in FIG. 2, the production of an enameled wire (however, a test device for judging the uniformity of an insulating film of the present invention is also provided) is performed by applying a paint to a supply side wire 1 by a paint coating device 2. Is applied, and the coating is baked by the baking furnace 3. The coating and baking process is repeated a plurality of times (partly not shown in the drawing) to provide an insulating film having a predetermined thickness. The bobbin (not shown) winds and manufactures the bobbin. The product wound on the bobbin is sampled at a predetermined length at the end of winding as a test piece, and the pinhole characteristic and the insulation characteristic of the insulating film are tested. However, since the enameled wire is a long product, the entire length of the wire cannot be inspected up to the inside of the bobbin, and it is not satisfactory in terms of guaranteeing the entire length. As a method (apparatus) for testing the uniformity of the enameled wire, JISC30
03-6 (b) The high voltage method is known.

[0003]

The JIS uniformity test method described above only tests a 30 m length from a product wound on a bobbin, and cannot inspect the entire length of the inside of the bobbin. However, in terms of guaranteeing the overall length, it was still unsatisfactory. In addition, it was difficult to apply the apparatus to a test apparatus which is actually attached to a production apparatus line. Further, the JIS test apparatus has a problem that, because the detection current is high (for example, 2 mA), a normal insulating film portion may be destroyed depending on a set value particularly in a thin film product. In addition, since the minimum detection unit length is long,
There is a problem that it is difficult to specify a defective portion. Also,
Conventional equipment has insufficient measures against residual voltage effects and absorption phenomena, and may differ from actual test setting conditions.Therefore, it is necessary to use a high-performance amplifier to stabilize the equipment. There was a problem that it became expensive. In addition, there is a problem that a malfunction due to electric noise easily occurs.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned various problems of the prior art, and it is easy to identify a defective portion without destroying a normal insulating film portion. To provide inexpensive insulation film uniformity judgment testers and test equipment that are adequately equipped with measures against absorption phenomena, do not cause malfunctions due to electrical noise, and are suitable as test equipment and test equipment on the line. With the goal.

[0005]

According to a first aspect of the present invention, a uniformity defect such as a pinhole defect or an insulation defect of an insulation film of an enameled wire as a running electric wire under test is detected.
A tester capable of judging, wherein the primary side and the secondary side are completely insulated, and a noise-shielding insulation transformer which has been subjected to a special shield processing so that noise is not transmitted to the secondary side; A high-voltage generating circuit for rectifying the power from the transformer, oscillating and boosting with a pulse transformer, outputting a constant voltage using a constant voltage circuit, and applying a test voltage to an enamel wire; and a current of the test voltage A current limiting resistor for limiting current, a current detecting circuit for amplifying a current flowing in a portion of the enamel wire having a non-uniformity, and detecting the non-uniformity by comparing with a determination level; and An input / output circuit I / O for inputting / outputting various signals; a counter which counts and adds the number of uniformity failures and outputs the same as an external contact signal when a set value is exceeded; Ranaru insulating film uniformity determination tester (hereinafter, abbreviated as uniformity tester) in. In the uniformity tester according to the first aspect, since noise is not transmitted to the secondary side by the noise cut-off insulating transformer, malfunction due to electrical noise does not occur. Further, the high-voltage generating circuit has a maximum DC 2000 V from DC 12 V, for example.
A high voltage of V can be generated, and can be arbitrarily set within a set range. The detection current is, for example, 5 μA to 100 μA.
A, the detection resistance is, for example, operation 1 to 3 MΩ / non-operation 4
９9 MΩ. In addition to the test voltage, there is also a threshold voltage for detection (a reference voltage (sensitivity) for determining how much the applied voltage drops before recognizing a non-uniformity). Can be adjusted. Therefore, with these circuit configurations, the detection of the uniformity failure can be accurately performed on the line.

According to a second aspect of the present invention, there is provided a uniformity tester in which the test voltage is constantly applied to an enameled wire at a DC level, and the detection of a poor uniformity is performed by measuring a current value actually flowing. In the uniformity tester according to the second aspect, since the detection of the uniformity failure is performed by measuring the current value actually flowing,
It is effective against residual voltage effects and absorption phenomena, and actual test setting conditions can be maintained. Further, since it is not necessary to use a high-performance amplifier for stabilization, the device can be manufactured at low cost.

As a third aspect, the present invention resides in a uniformity tester in which the minimum operation time for detecting a uniformity defect is 10 ms, and the minimum unit length for measuring an enamel wire is 1 m. In the uniformity tester according to the third aspect, the minimum operation time for detecting the uniformity defect is 10 ms, and the minimum unit length for measuring the enamel wire is 1 m.
Therefore, the minimum detection unit length is shortened, and it becomes easy to specify a defective portion.

According to a fourth aspect of the present invention, there is provided an insulating film uniformity judging test apparatus using the uniformity tester as a main body, wherein (+) of a test voltage passing through a current limiting resistor of the uniformity tester. ) The pole is connected to the detection pulley 5, and the enameled wire 1a after burning is brought into contact with the detection pulley 5, and the (-) pole of the test voltage is connected to the supply side element wire 1, and the uniformity is measured. The tester 8 can communicate with a centralized controller 9 that can control various signals and a sequencer 7 that controls various signals, and the centralized controller 9 can communicate with a data processing device 10 that can record or calculate various data. It is provided in a uniformity determination test apparatus (hereinafter, abbreviated as a uniformity test apparatus). In the uniformity test device according to the fourth aspect, by using the uniformity tester according to the first aspect as a main body, the operation and effect of the uniformity tester according to the first aspect can be obtained, and the uniformity failure can be reduced. Detection can be performed accurately on the line. Further, the data is taken into the centralized controller 9 and communicated to a dedicated printer or an upper-level personal computer to be recorded.

According to a fifth aspect of the present invention, the signal of the take-off capstan 4 is taken into the centralized controller 9 through the sequencer 7 to uniformly set the number of defects per unit length of the enamel wire. In the sex test equipment. In the uniformity test apparatus according to the fifth aspect, the number of defects per unit length of the enameled wire is arbitrarily set, which is preferable as a test apparatus on a line.

According to a sixth aspect of the present invention, a centralized controller 9 and a sequencer 7 control a plurality of uniformity testers 8, and test data is recorded in a uniformity test device recorded by a data processing device 10. is there. 6th above
In the uniformity test apparatus according to the aspect described above, a plurality of uniformity testers 8
Is controlled, and the test data is recorded by the data processing device 10, which is preferable as a test device.

[0011]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The contents of the present invention will be described below in more detail with reference to an embodiment shown in the drawings. Note that the present invention is not limited by this. FIG. 1 is a circuit configuration diagram for explaining an example of the circuit configuration of the uniformity tester of the present invention. FIG. 2 is a schematic view showing an example in which the uniformity test device of the present invention is installed in an enameled wire production line. FIG. 3 is a configuration diagram for explaining an example in which a plurality of uniformity determination testers are controlled by a centralized controller and a sequencer. In these figures, 1 is a feeder side element wire,
1a is an enameled wire, 2 is a paint application device, 3 is a baking furnace, 4
Is a take-up capstan, 5 is a detection pulley, 6 is a winder (winding bobbin), 7 is a sequencer, 8 is a uniformity tester, 9 is a centralized controller, 10 is a data processing device, and 20 is
Is a uniformity test apparatus.

Embodiment 1 An example of a circuit configuration of a uniformity tester of the present invention will be described with reference to FIG. The uniformity tester according to the present invention includes a noise-shielding insulation transformer that completely insulates the primary side and the secondary side and performs a special shielding process so that noise is not transmitted to the secondary side, and a power supply from the transformer. Rectified to DC12V, oscillated and boosted by a pulse transformer, output a constant voltage using a constant voltage circuit, and constantly apply a DC level to the wire under test, and a current of the test voltage. A current limiting resistor for limiting current, a current detecting circuit for amplifying a current flowing in a portion having a uniformity defect, and comparing with a judgment level to detect the uniformity defect, and various signals from the current detecting circuit and an external circuit. An insulated type input / output circuit I / O for input / output, a counter that counts and adds the number of uniformity failures, and outputs a contact signal to the outside if the value exceeds a set value. It made. Since the test voltage is not pulsed, but is always supplied at the DC level, and the detection measures the value of the current actually flowing, it is preferable as a measure against the residual voltage effect (residual voltage processing method).
In addition, the minimum detection operation time of the uniformity determination test is 10 ms,
The minimum measurement unit length of the enameled copper wire is 1 m. The external circuit is, for example, a sequencer or a centralized controller.

Embodiment 2 An example of the uniformity test apparatus of the present invention will be described with reference to FIG. The uniformity test device 20 of the present invention includes a sequencer 7 capable of controlling various signals, a centralized controller 9 and a data processing device 1 in the uniformity tester 8 of the first embodiment.
This is a uniformity test apparatus with a configuration to which 0 is added. The processing method of the sequencer 7 and the centralized controller 9 incorporates an insulated input / output circuit I / O as an interface, and outputs to the sequencer 7 every time a defect is detected. The sequencer 7 that has received the output outputs a completion signal to the centralized controller 9 and ends a series of processing. In addition, by taking the signal of the take-off capstan 4 of the enamel wire manufacturing apparatus into the centralized controller 9 via the sequencer 7, the number of defective pieces per unit length of the enamel wire 1a can be arbitrarily set. The data obtained by the uniformity tester 8 is communicated to the centralized controller 9 and the data processing device 10 and recorded. The data processing device 10 is, for example, a dedicated printer or a host computer.

Embodiment 3 An example in which a uniformity test such as a pinhole defect or an insulation defect of an insulating film of a traveling enamel wire 1a is detected and determined using the uniformity test apparatus 20 of the present invention is shown in FIG. 2 will be described. The (−) pole of the measuring power supplied from the tester main body 8 is connected to the supply side core wire 1 (the actual connection is an iron bobbin portion that is electrically connected to the core wire 1), and the take-up capstan 4 and the winder 6
A detection pulley 5 is provided between them, and the (+) pole of the measurement power supply is connected,
The running enameled wire 1a after burning is brought into contact with the detection pulley 5, and the detection pulley 5 is detected at a portion where the insulating film has poor uniformity.
The current flowing through the tester is amplified by the tester main body 8 and compared with the judgment level to detect the poor uniformity. The detection indicator (not shown) of the LED provided on the tester main body 8 is turned on, and the counter is turned on. (Not shown), the number of defects was counted. The tester main body 8 is provided with a monitor terminal (not shown) so that a detection signal can be confirmed by an oscilloscope.
The sequencer 7 calculates the production speed of the enameled wire from a signal from a sensor (not shown) attached to the take-off capstan 4 and arbitrarily sets the number of defects per unit length of the enameled wire to create a judgment level. ing. The data from the centralized controller 9 is transmitted to the data processing device 10.
And output to a printer. Since a high voltage of up to 2000 V is applied to the detection pulley 5 even though the current is low, a high-voltage wiring member and a high-voltage probe having a sufficient insulation interval are used.

Embodiment 4 An example in which a plurality of (eg, five) uniformity judgment testers are controlled by the sequencer 7 and the centralized controller 9 will be described with reference to the configuration diagram of FIG. The centralized controller 9 is a device that performs centralized control so that the number of defects counted by the five uniformity testers is printed by the printer of the data processing device 10.

Embodiment 5 An example of the operation of the test apparatus of the present invention when a uniformity defect occurs will be described. The test power is always applied to the detection pulley 5, but when a portion with poor uniformity occurs, it is output to the sequencer 7 as an output signal. This signal needs to be restored after the sequencer 7 receives it. Therefore, the minimum speed that the sequencer 7 can follow (10 ms)
Thus, a return signal is output to the centralized controller 9. The centralized controller 9 and the sequencer 7 repeatedly communicate this signal. This output signal is called a latch signal. Next, an example of a communication circuit between the sequencer 7 and the tester main body 8 will be described. A centralized controller 9 is provided between the sequencer 7 and the tester main body 8, and communicates data when a uniformity failure occurs. First, the centralized controller 9 outputs a latch signal from the tester main body 8 to the sequencer 7. The sequencer 7 inputs a signal and outputs a signal restoration command to the centralized controller 9. Further, the number of failure occurrences is fed back to the counter of the tester main body 8. When the above-mentioned mutual communication is repeated and the number of defectives exceeds the set value, the sequencer 7 recognizes that an abnormality has occurred, and issues a winding bobbin switching instruction (alarm). Then, when the bobbin is switched,
The signal is sent to the centralized controller 9 and printed on the printer of the attached data processing device 10. The communication and operation described above are sequentially repeated, and the test is continued.

[0017]

The uniformity tester and test apparatus of the present invention have a method in which the applied voltage and the detected current value can be set arbitrarily in a wide range, so that even a thin film product can destroy a normal insulating film portion. Is gone. Further, the tester of the present invention,
The test apparatus has a minimum detection operation time of 10 for the uniformity determination test.
Since the minimum unit length for measurement of ms and enamel wire is 1 m, it is easy to specify a defective portion. In addition, measures against the residual charge effect and the absorption phenomenon became sufficient, and the conditions could be set to the actual test setting conditions. In addition, malfunction does not occur with respect to electrical noise, and measurement accuracy is improved. Therefore, the present invention is preferable as a line tester and a test apparatus, and the present invention has an extremely large effect of contributing to industry.

[Brief description of the drawings]

FIG. 1 is a circuit configuration diagram illustrating an example of a circuit configuration of a uniformity tester according to the present invention.

FIG. 2 is a schematic view showing an example in which the uniformity test device of the present invention is installed in an enameled wire production line.

FIG. 3 is a configuration diagram for explaining an example in which a plurality of uniformity determination testers are controlled by a centralized controller and a sequencer.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Supply side element wire 1a Enamel wire 2 Paint application tank 3 Baking furnace 4 Take-up capstan 5 Detection pulley 6 Winding machine (winding bobbin) 7 Sequencer 8 Uniformity tester 9 Centralized controller 10 Data processing device 20 Uniformity test apparatus

 ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Takashi Ami 2-8-4 Sakaiminamicho, Musashino-shi, Tokyo F-term in Shin Nihon Kagaku Seisakusho Co., Ltd. (Reference) 2G015 AA27 BA04 CA05 2G060 AA09 AA10 AD04 AE01 AE03 AF02 AF07 AG07 EA02 EA07 EB01 GA01 HA01 HC07 HC08 HC15 HC21 HC22 HD01 HE03 KA12

Claims (6)

[Claims] 1. A tester capable of detecting and judging a uniformity defect such as a pinhole defect and an insulation defect of an insulating film of an enameled wire as a traveling electric wire under test, comprising a primary side and a secondary side. Insulation transformer that completely insulates the side and has a special shielding treatment to prevent noise from being transmitted to the secondary side; and rectifies the power from the transformer, oscillates and boosts the voltage with a pulse transformer, A high-voltage generating circuit for outputting a constant voltage using a voltage circuit and applying a test voltage to the enamel wire; a current limiting resistor for limiting the current of the test voltage; A current detection circuit for amplifying the current and detecting a uniformity defect by comparing the current with a determination level; and an input / output circuit I / O for inputting / outputting the current detection circuit and various signals from outside; Adds counts uniformity defect number, counter outputs as a contact signal to an external time exceeds the value set; and, an insulating film uniformity determination tester, characterized in that it consists of. 2. The uniformity of an insulating film according to claim 1, wherein the test voltage is constantly applied to the enameled wire at a DC level, and the detection of the uniformity failure is performed by measuring a current value actually flowing. Judgment tester. 3. The minimum operation time for detecting a non-uniformity defect is 10.
The insulation film uniformity judging device according to claim 1 or 2, wherein the measured minimum unit length of the enamel wire is 1 m. 4. An insulation film uniformity determination test apparatus using the insulation film uniformity determination tester as a main body, wherein (+) of a test voltage passed through a current limiting resistor of the insulation film uniformity determination tester. The pole is connected to the detection pulley 5, the enameled wire 1a after burning is brought into contact with the detection pulley 5, the (-) pole of the test voltage is connected to the supply side element wire 1, and the insulating film The sex determination tester 8 can communicate with a centralized controller 9 capable of controlling various signals and a sequencer 7 for controlling various signals, and the centralized controller 9 is capable of recording or calculating various data.
A device for judging uniformity of an insulating film characterized by being able to communicate with the device. 5. By taking in the signal of the take-off capstan 4 into the centralized controller 9 through the sequencer 7,
The insulating film uniformity judging test device according to claim 4, wherein the number of defects per unit length of the enamel wire is arbitrarily set. 6. The centralized controller 9 and the sequencer 7
The insulating film uniformity judging apparatus according to claim 4 or 5, wherein the plurality of insulating film uniformity judging testers (8) are controlled, and the test data is recorded by the data processor (10).