JP2000338132A - Multilayer contact - Google Patents

Abstract

PROBLEM TO BE SOLVED: To prevent the interference with another contact even when contacts are arranged over a length of a plurality of pitches of the lattice, and to enlarge a space for a material relating to the deflection by mounting a thin contact in a state inclined to a lattice coordinate axis of a circuit terminal of a circuit to be tested. SOLUTION: Contacts 1 are arranged at equal intervals of pitch(p), and a lateral length of a deformed part of its height(h) is approximately(a). An input part and a fixed part at ends of the contact 1 are different in height in the height direction, and the aligned contacts 1 of the same shape are not interfered with one another because of the difference in height. I(i, 1), I(i, 2)...I(i, j) are respectively regarded as the input coordinate numbers of aligned input parts, O(i, 1) O(i, 2)...O(i, j) are respectively regarded as the output coordinate numbers of output parts, and the input part of the input coordinate number I(i, j) and the output part of the output coordinate number O(i, j) are electrically connected. As the lateral length (a) has a remarkably large value in comparison with the pitch(p), the laterally long contact 1 can be provided.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a laminated contact for electrical connection used for circuit inspection of an electronic device having a planar arrangement of circuit terminals, and to an electronic component having circuit terminals arranged in a plane. About the connector.

[0002]

2. Description of the Related Art There has been a method of obtaining a contact pressure between a contact and a circuit terminal by utilizing a deformation of an elastic body which is deformed in a vertical direction and a force generated by the deformation. A coil spring has been used for the elastic body. However, with the development of integrated circuits, circuit networks have become finer, and the pitch required for contacts for testing the circuits has also become very small. As a result, there is a shortage of space occupied by the elastic material allocated to one contact, and it has been difficult to realize a contact having an appropriate spring constant. If the amount of elastic deformation is small, the operating range is narrowed.Therefore, if there is a production error of the contact, a machine stop error during the contact operation of the device incorporating the contact, etc., there is a disadvantage that an appropriate contact pressure cannot be obtained. Was.

[0003]

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems, and an object of the present invention is to provide a method for reducing the distance between circuit terminals, such as an electronic circuit formed in an integrated circuit, when the distance between circuit terminals is reduced. Since there is no space for material placement in the part and it was not possible to secure an appropriate operation stroke and contact pressure, it is possible to secure an appropriate occupied space for deformed parts that can cope with manufacturing errors of contacts and variations in machine stop positions of circuit terminals. An object of the present invention is to provide a mechanism for assembling a surface array contact.

[0004]

In the deformed portion 4 of the thin plate-like contact 1 as shown in FIG. 1, in order to obtain an appropriate contact pressure and an operation stroke, an appropriate length a, width b, and thickness are required. c is required. At a fixed lattice pitch, in a surface-arranged contact assembly, a space allowed for one contact in the z-direction can be ensured to some extent, but the allocation of a space that can be occupied on the xy plane is limited. When arranging a plurality of contacts having the same shape, the occupied space has an obliquely long deformed portion, that is, a deformed portion having a substantially parallelogram cross-section, and utilizes the phase difference in the height direction of each contact to be oblique. The length of the long deformed portion can be secured. That is, length a
And a structure that can secure it.

Further, even if the thin plate-shaped contacts are arranged at a predetermined angle with respect to the grid coordinate axes of the circuit terminals of the circuit under test and arranged so as to extend over a plurality of pitches of the grid, interference with other contacts may occur. In addition, a material having a constant width and thickness in the deformation operation direction and a long material removal in the lateral direction is enabled, and a material removal space which can be involved in bending is increased. That is, a structure in which the width b and the thickness c can be ensured by arranging them at a fixed angle.

[0006]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The invention according to claim 1 of the present invention comprises a contact portion and a fixed portion and an output portion at positions displaced from the contact portion by an appropriate amount in the y and z directions. A plurality of thin plate-like contacts having an obliquely long deformed portion having the same shape and having an obliquely long deformed portion (the contact portion is lower and the fixed portion is upper) connecting the contact portion and the contact portion in the y direction. Place,
A stacked contact stand characterized in that there is no interference due to the phase difference between the heights of the deformed portions and the deformed portions are obliquely longer than the terminal interval of the circuit under test.

According to a second aspect of the present invention, there is provided a surface array type contact assembly in which a plurality of the contact assemblies according to the first aspect are arranged in the x direction. An object of the present invention is to provide a laminated contact that can be used for a circuit terminal under test having a surface arrangement of contacts.

According to a third aspect of the present invention, a plurality of the contact assemblies according to the first aspect are arranged so as to form a fixed angle with the x direction and face the circuit terminals of the circuit under test in the x direction. A surface-arrayed stacked contact that can form an oblique coordinate system to ensure the appropriate length, width, and thickness of the contact.

According to a fourth aspect of the present invention, in the contact assembly according to the third aspect, the triangle I (in,
j) In I (i, j) I (in, j + 1), ∠I (i-Rn, j) I (i, j) I (in, j +
1) is an orthogonal lattice array type characterized by being a right angle.

An embodiment of the present invention will be described below with reference to the drawings. (First Embodiment) FIG. 1 is a side view of a contact 1 according to a first embodiment of the present invention. In FIG. 1, reference numeral 1 denotes a contact, 2 denotes an input unit, 3 denotes a fixed unit, 4 denotes a deformed unit, 5 denotes an output unit, 6 denotes a circuit terminal, 7 denotes a support unit, and 8 denotes a connection circuit.

The contact 1 comprises an input section 2, a fixed section 3 and a deformed section 4.
Consists of The input section 2 faces the circuit terminal 6 and has a sharp tip at its tip. The fixed part 3 is fixed to a support part 7 so as to maintain a constant distance relationship between the circuit terminal 6 of the circuit under test and the thin plate-shaped contact 1.
The deforming portion 4 has a substantially parallelogram shape shown by a solid line and a broken line in FIG. 1, is located between the fixing portion 3 and the input portion 2, and the fixing portion 3 is fixedly connected to the support portion 7. It works in the state of a beam. At the time of the circuit test, when the circuit terminal 6 comes into contact with the input unit 2 to perform a vertical movement operation, the deformation unit 4 deforms under the condition of the cantilever. The output unit 5 is a part of the fixed unit 3 and is connected to a connection circuit such as a test circuit (not shown). The circuit terminal 6 is a connection terminal of a circuit under test or the like, and electrical continuity with the test circuit is achieved through the contact 1. The connection circuit 8 has circuit wiring similar to that of a printed circuit board or the like, and is electrically connected to the output unit 5. In order to generate an appropriate contact pressure and an operating stroke between the output portion 2 of the contact 1 and the circuit terminal 6, an appropriate length and cross section where a moment acts on the deformed portion 4 are required. The first embodiment is particularly effective when the lateral length of the deformed portion 4 is required.

FIG. 2 is a front view of the line array unit according to the first embodiment. FIG. 3 is a plan view of the line array unit. In FIG. 2, the circuit terminal 6, the support portion 7, and the connection circuit 8 are omitted for the sake of simplicity of FIG. 2, but actually exist and have the function as described with reference to FIG. FIG. 2 shows the arrangement in which the contacts 1 described in FIG. 1 are arranged at equal intervals, and the pitch is p. The approximate length in the lateral direction of the deformed portion of the contact 1 is a. The height of the deformed portion is approximately h. The feature of the shape of this contact is that the input portion 2 and the fixed portion 3 which are one end of the contact 1 have a height difference in the height direction (in the case of the first embodiment, the input portion 2 is low and the fixed portion 3 is low). Are high), and the arranged contacts having the same shape are arranged so as not to interfere with each other due to a difference in elevation. I (i, 1), I (i, 2), ..., I (i,
j),..., I (i, l) are input coordinate numbers assigned to the arranged input units 2, and O (i, 1), O (i,
2),..., O (i, j),..., O (i, l) are output coordinate numbers assigned to the output unit 5. Input unit 2 of input coordinate number I (i, j) and output coordinate number O (i, j)
Are electrically conductive. a makes it possible to obtain laterally long contacts by allowing very large values compared to p. This method is effective in the case where the pitch can be somewhat coarse and the height c of the cross section of the deformed portion can be a large value.

(Embodiment 2) In Embodiment 2, the contact portions of the line array unit 11 are matched with linear circuit terminals arranged in the x direction, and a plurality of the same line array units 11 are arranged in the x direction. It is possible to correspond to a surface array type circuit terminal. FIG. 4 is a plan view of the surface array contact assembly according to the second embodiment. FIG. 5 is a projection view of the surface arrangement assembly according to the second embodiment.

(Embodiment 3) Embodiment 3 can cope with a plane arrangement having a lattice pitch of 1 / plurality of the arrangement interval p of the contacts 1 of the line array unit 11, and This is a mechanism that can be achieved while maintaining the shape of the contact. FIG. 6 is a front view of the third embodiment. FIG.
Shows a DD section of FIG. In the third embodiment, k line arrangement units 11 are arranged at equal intervals at a constant angle A ° with respect to the x direction. In FIG. 6, the arrangement interval p is plural times larger than the arrangement pitch s of the arrangement units 11 in the x direction. The arrangement pitch s corresponds to a multiple of the contact thickness t. An XY oblique coordinate system is configured by such an arrangement of the line array units 11. In the input coordinate number I (i, j) and the output coordinate number O (i, j), i indicates a coordinate number in the x direction, and is represented by i = 1, 2,..., I,. j is y
Is the coordinate number of the direction, j = 1, 2,..., J,.
It is represented by l.

For example, when s = 0.
2 mm and p = 0.8 to 1 mm are possible. In addition, since the length a of the deformed portion can be a multiple of p, a value of s = 5 to 8 mm or more can be obtained. Further, it is sufficient that b shown in FIG. 1 is slightly smaller than p. As for c, a sufficient space can be secured in the z direction, so that a value that meets the conditions can be selected.

In the third embodiment, an orthogonal coordinate system can be formed from an oblique coordinate system. If n is the number of coordinate numbers (integer) related to obtaining an orthogonal grid from oblique coordinates and the input coordinate number I (i, j) is the position coordinate as shown in FIG. 7, the triangle I (in, j) ) I (i, j) I (in,
j + 1), the triangle I (in, j) I (i,
j) In I (in, j + 1), when ∠I (in, j) I (i, j) I (in, j + 1) is a right angle, the input coordinate is a contact element n pitches apart. And an orthogonal lattice arrangement having the relationship The coordinate system arranged in the form of an orthogonal lattice in this manner is indicated by an XrYr coordinate system.
In general, the circuit terminals of the circuit-under-test under test are arranged in an orthogonal lattice pattern, and therefore can be handled by using an orthogonal XrYr coordinate system. In the third embodiment, the third embodiment is realized by assembling a plurality of the line array units 11. However, if the contacts 1 are arranged in a relationship as shown in FIG. It need not be realized by assembly.

[0017]

According to the present invention, as is apparent from the above-described embodiment, the space allowed in the z direction with respect to one contact in a surface-arranged contact assembly with a fixed lattice pitch is limited to some extent. If the allocation of the space that can be occupied in the xy plane is restricted, when arranging a plurality of contacts of the same shape, the occupied space has a deformed portion that is obliquely long, that is, a deformed portion having a substantially parallelogram cross section. Then, the length of the obliquely long deformed portion can be ensured by utilizing the phase difference in the height direction of each contact.

When the distance between circuit terminals is reduced as in an electronic circuit formed in an integrated circuit or the like, there is no space for disposing material in the deformed portion, and an appropriate operation stroke and contact pressure cannot be secured. It is possible to provide a surface-arranged contact mechanism that can secure an appropriate occupied space for a deformed portion, which can cope with errors and variations in the machine stop positions of circuit terminals.

[Brief description of the drawings]

FIG. 1 is a side view of a contact 1 according to a first embodiment of the present invention.

FIG. 2 is a front view of the line array unit according to the first embodiment.

FIG. 3 is a plan view of a line array unit.

FIG. 4 is a plan view of a surface array contact assembly according to a second embodiment of the present invention;

FIG. 5 is a projection view of the surface array assembly according to the second embodiment.

FIG. 6 is a front view of the third embodiment.

FIG. 7 is a sectional view taken along the line DD in FIG. 6;

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 Contact 2 Input part 3 Fixed part 4 Deformation part 5 Output part 6 Circuit terminal 7 Support part 8 Connection circuit 11 Wire arrangement unit a Length of contact 1 A Angle formed with X axis of contact 1 b Contact 1 C the thickness of the contact 1 i the coordinate number in the x direction j the coordinate number in the y direction k the number of arrays of the contact 1 in the X direction l the number of array of the contacts 1 in the Y direction n an orthogonal grid from oblique coordinates Number of coordinate numbers related to obtain (integer) p Arrangement pitch of contact 1 s Grid pitch in x direction t Plate thickness of contact 1 I (i, j) Input coordinate number O (i, j) Output coordinate number XY Oblique coordinates XrYr Cartesian coordinates

Claims (4)

[Claims] A fixed part and an output part at a position displaced by an appropriate amount in the y-direction and the z-direction from the contact part;
A thin plate-like contact having an obliquely long deformed portion of the same shape having an obliquely long deformed portion connecting the fixed portion and the contact portion (the contact portion is lower and the fixed portion is upper) is provided in the y direction. A stacked contact, comprising a plurality of arranged contact portions, wherein there is no interference due to a phase difference between the heights of the deformed portions, and the deformed portions are obliquely longer than terminal intervals of the circuit under test. 2. A surface-arranged stacked contact comprising a plurality of the contact assemblies according to claim 1 arranged in the x direction. 3. An oblique coordinate system is formed by arranging a plurality of contact assemblies according to claim 1 at a certain angle with respect to the x direction and facing the circuit terminals of the circuit under test in the x direction. Child length,
A surface-arranged stacked contact that can properly secure the width and thickness. 4. The contact assembly according to claim 3, wherein
Triangle I (in, j) I (i, j) I (in, j +
1) An orthogonal lattice array type contactor according to 1), wherein ∠I (in, j) I (i, j) I (in, j + 1) is a right angle.