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JP2000292691A - Scanning imaging lens, and optical scanner - Google Patents

Scanning imaging lens, and optical scanner

Info

Publication number
JP2000292691A
JP2000292691A JP10318399A JP10318399A JP2000292691A JP 2000292691 A JP2000292691 A JP 2000292691A JP 10318399 A JP10318399 A JP 10318399A JP 10318399 A JP10318399 A JP 10318399A JP 2000292691 A JP2000292691 A JP 2000292691A
Authority
JP
Japan
Prior art keywords
scanning
group
lens
image forming
scanned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10318399A
Other languages
Japanese (ja)
Other versions
JP4445059B2 (en
Inventor
Yasushi Takahashi
靖 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Optical Industries Co Ltd
Original Assignee
Ricoh Optical Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Optical Industries Co Ltd filed Critical Ricoh Optical Industries Co Ltd
Priority to JP10318399A priority Critical patent/JP4445059B2/en
Publication of JP2000292691A publication Critical patent/JP2000292691A/en
Application granted granted Critical
Publication of JP4445059B2 publication Critical patent/JP4445059B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Lenses (AREA)

Abstract

PROBLEM TO BE SOLVED: To effectively reduce an influence of fluctuation of emission wavelength in a semiconductor laser, in an optical scanner using the semiconductor laser as a light source. SOLUTION: This scanner has an fθ function as to a direction corresponding to main scanning, and a function for forming an imaging position of a line image and a scanned surface 9 into a geometrically conjugated relation as to a direction corresponding to sub-scanning, is constituted to make a light deflector 3 side serve as an incident side, and is arranged with a first - a fourth groups in order toward a scanned surface 9 side. The first - the fourth groups are composed of four groups of four sheets, the first group 5 is a lens with positive refractive power, the second group 6 is an anamorphic lens with negative refractive power having a cylinder face, the third group 7 is a positive meniscus lens of a spherical single lens with a concaved face directed toward the incident side, and the fourth group 8 is an anamorphic lens having a toric face of positive refractive power. Respective Abbe numbers νd2, νd4 of the second group 6 and the fourth group 8 satisfy the condition: 1.0<νd4/νd2.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、走査結像レンズ
および光走査装置に関する。
The present invention relates to a scanning image forming lens and an optical scanning device.

【0002】[0002]

【従来の技術】半導体レーザからの光束を主走査対応方
向に長い線像に結像させ、該線像の結像位置近傍に偏向
反射面を持つ光偏向器により等角速度的に偏向させ、偏
向光束を走査結像レンズにより被走査面上に光スポット
として集光させ、被走査面の等速的な光走査を行う光走
査装置は、レーザプリンタやデジタル複写装置、製版装
置等に関連して広く知られている。主走査対応方向は、
光源である半導体レーザから被走査面に至る光路上で被
走査面上の主走査方向に対応する方向であり、同様に、
副走査対応方向は、半導体レーザから被走査面に至る光
路上で被走査面上の副走査方向に対応する方向である。
上記の如き光走査装置における走査結像レンズは、等角
速度的に偏向される偏向光束を被走査面上に光スポット
として集光させるとともに、光スポットの光走査速度を
等速化するfθ機能を持ち、光偏向器の偏向反射面位置
と被走査面位置とを副走査対応方向において幾何光学的
な共役関係とすることにより、光偏向器における偏向反
射面の面倒れの影響を補正する面倒れ補正機能を持つ。
上記の如き光走査装置において光源として用いられる半
導体レーザには、周知の如く「温度変化により発光波長
が変動する」という性質がある。このため、走査結像レ
ンズの色収差が上記波長変動に対して補正されていない
と、被走査面上に形成される光スポットのスポット径が
変動したり、軸外色収差の影響で光スポットの像高が主
走査方向で変動したり、あるいは面倒れ補正機能が十全
に機能せず、光スポットの副走査方向の像高が変動した
りして、光走査に悪影響を及ぼす虞れがある。また、近
来、光走査装置では走査密度の高密度化が進み、被走査
面上に形成される光スポットの小径化が求められている
が、小径の良好な光スポットを形成するためには、コマ
収差が良好に補正されていることが必要である。
2. Description of the Related Art A light beam from a semiconductor laser is formed into a long line image in a direction corresponding to the main scanning, and the light beam is deflected at an equal angular velocity by an optical deflector having a deflecting / reflecting surface near an image forming position of the line image. An optical scanning device that condenses a light beam as a light spot on a surface to be scanned by a scanning image forming lens and performs constant-speed optical scanning of the surface to be scanned is related to a laser printer, a digital copying device, a plate making device, and the like. Widely known. The main scanning direction is
A direction corresponding to the main scanning direction on the scanned surface on the optical path from the semiconductor laser as the light source to the scanned surface, and similarly,
The sub-scanning corresponding direction is a direction corresponding to the sub-scanning direction on the scanned surface on the optical path from the semiconductor laser to the scanned surface.
The scanning image forming lens in the optical scanning device as described above has an fθ function of converging a deflected light beam deflected at a constant angular velocity as a light spot on a surface to be scanned and making the light scanning speed of the light spot uniform. Surface deflection that corrects the effect of the tilting of the deflecting / reflecting surface of the optical deflector by making the position of the deflecting / reflecting surface of the optical deflector and the position of the scanned surface geometrically conjugate in the sub-scanning corresponding direction. Has a correction function.
As is well known, a semiconductor laser used as a light source in the above-described optical scanning device has a property that "the emission wavelength fluctuates due to a temperature change". For this reason, if the chromatic aberration of the scanning imaging lens is not corrected for the above-mentioned wavelength variation, the spot diameter of the light spot formed on the surface to be scanned fluctuates, or the image of the light spot is affected by off-axis chromatic aberration. The height may fluctuate in the main scanning direction, or the surface tilt correction function may not function sufficiently, and the image height of the light spot in the sub-scanning direction may fluctuate, which may adversely affect optical scanning. In recent years, in optical scanning devices, the scanning density has been increasing, and the diameter of the light spot formed on the surface to be scanned has been required to be reduced.To form a good light spot having a small diameter, It is necessary that coma is well corrected.

【0003】[0003]

【発明が解決しようとする課題】この発明は、光源とし
て半導体レーザを用いる光走査装置において、半導体レ
ーザにおける発光波長の変動の影響を有効に軽減するこ
とを課題とする。また、小径の良好な光スポットの形成
の実現を課題とする。
SUMMARY OF THE INVENTION It is an object of the present invention to provide an optical scanning device using a semiconductor laser as a light source, in which the effect of fluctuations in the emission wavelength of the semiconductor laser is effectively reduced. It is another object of the present invention to form a good light spot having a small diameter.

【0004】[0004]

【課題を解決するための手段】この発明の走査結像レン
ズは「半導体レーザから放射されて主走査対応方向に長
い線像に結像され、該線像の結像位置の近傍に偏向反射
面を持つ光偏向器により等角速度的に偏向された光束
を、被走査面上に光スポットとして集光させ、被走査面
の等速的な光走査を行うための結像光学系」であって、
主走査対応方向に関してfθ機能を持つと共に、副走査
対応方向に関して上記線像の結像位置と被走査面とを幾
何光学的な共役関係とする機能を持つ。走査結像光学系
は、光偏向器側を入射側とし、被走査面側へ向かって順
次、第1〜第4群を配してなる。
According to the present invention, there is provided a scanning image forming lens which forms a line image which is emitted from a semiconductor laser and is long in a direction corresponding to the main scanning, and has a deflecting reflection surface near the image forming position of the line image. An imaging optical system for converging a light beam deflected at an equal angular velocity by an optical deflector having a light spot on a surface to be scanned as a light spot and performing a constant speed optical scanning of the surface to be scanned. '' ,
In addition to having an fθ function in the main scanning corresponding direction, it has a function of making the image forming position of the line image and the scanned surface geometrically conjugate in the sub-scanning corresponding direction. The scanning image forming optical system is configured by sequentially arranging first to fourth groups toward the surface to be scanned, with the optical deflector side being the incident side.

【0005】第1群は「正の屈折力を持つレンズ」であ
り、第2群は「シリンダ−面を有し、負の屈折力を持つ
アナモフィックレンズ」、第3群は「入射側に凹面を向
けた球面単レンズで正のメニスカスレンズ」、第4群は
「正の屈折力のト−リック面を有するアナモフィックな
レンズ」である。従って、走査結像レンズは全体として
4群4枚構成である。
The first group is a lens having a positive refractive power, the second group is an anamorphic lens having a cylinder surface and a negative refractive power, and the third group is a concave lens on the incident side. And the fourth unit is an anamorphic lens having a toric surface having a positive refractive power. Therefore, the scanning image forming lens has a total of four elements in four groups.

【0006】第2群と第4群のアッべ数をそれぞれ
νd2,νd4とするとき、これらは条件: (1) 1.0<νd4/νd2 を満足する。条件(1)は、光源の半導体レ−ザの発光
波長が温度変化等で変動しても、光スポット位置が変動
しないように、色収差を補正する条件であり、下限を越
えると、波長変動による光スポット位置の変動を十分に
抑制できない。なお、理想的な光走査で、光スポットの
像高が0のときの「走査結像レンズの光軸と偏向反射面
との交点」を「偏向の起点」と称する、上記線像は設計
上は偏向の起点の近傍に結像される。
When the Abbe numbers of the second group and the fourth group are respectively ν d2 and ν d4 , they satisfy the following condition: (1) 1.0 <ν d4 / ν d2 Condition (1) is a condition for correcting chromatic aberration so that the light spot position does not fluctuate even when the emission wavelength of the semiconductor laser of the light source fluctuates due to a temperature change or the like. The fluctuation of the light spot position cannot be sufficiently suppressed. In the ideal optical scanning, the “intersection point between the optical axis of the scanning imaging lens and the deflecting reflection surface” when the image height of the light spot is 0 is referred to as a “start point of deflection”. Is imaged near the origin of the deflection.

【0007】上記請求項1記載の走査結像レンズにおい
て、偏向の起点から第1群の入射側面までの光軸上の距
離をD0、第1群の肉厚および材質の屈折率をそれぞれ
1およびN1、第1,第2群の空気間隔をD2 、第2群
の入射側面の曲率半径をR3、第4群の射出側面の主走
査対応方向の曲率半径をR8X、偏向の起点から第4群の
入射側面までの距離をDA1、第1群の焦点距離をf1
すると、これらは条件: (2) −1.7<R3/[{(D0・f1)/(f1-D0)}+(D1/
N1)+D2]<−1.0 (3) −1.5<R8X/DA1<−1.1 を満足することが好ましい(請求項2)。条件(2)お
よび(3)は、光スポット径を小さくするため、コマ収
差を抑制して結像性能を良くするための条件である。コ
マ収差は、条件(2),(3)の下限を越えるとアンダ
−に発生し、上限を越えるとオ−バ−に発生して、とも
に小径の良好な光スポットを形成することが困難にな
る。請求項1または2記載の走査結像レンズにおいて、
第2群は「入射側に凹球面を有し、射出側に副走査対応
方向にのみパワ−を持つ凹シリンダ面を有するアナモフ
ィックなレンズ」であることができる(請求項3)。ま
た、請求項1または2または3記載の走査結像レンズに
おいて、第4群は「射出側に、副走査対応方向の曲率が
主走査対応方向の曲率よりも強い正の屈折力のト−リッ
ク面を有し、副走査対応方向により強い正の屈折力を持
つアナモフィックなレンズ」であることができる(請求
項4)。上記請求項1〜4の任意の1つに記載の走査結
像レンズにおいて、第1群は「入射側が凸球面、射出側
が平面である凸平レンズ」であり、全系内に複雑な非球
面を含まない構成とすることができる(請求項5)。こ
の発明の光走査装置は「半導体レーザからの光束を主走
査対応方向に長い線像に結像させ、該線像の結像位置近
傍に偏向反射面を持つ光偏向器により等角速度的に偏向
させ、偏向光束を走査結像レンズにより被走査面上に光
スポットとして集光させ、被走査面の等速的な光走査を
行う光走査装置」であって、走査結像レンズとして、請
求項1〜5の任意の1つに記載の走査結像レンズを用い
たことを特徴とする(請求項6)。
In the scanning image forming lens according to the first aspect, the distance on the optical axis from the starting point of deflection to the entrance side of the first group is D 0 , and the thickness and the refractive index of the material of the first group are D and D, respectively. 1 and N 1 , the air gap between the first and second groups is D 2 , the radius of curvature of the entrance side of the second group is R 3 , the radius of curvature of the exit side of the fourth group in the main scanning direction is R 8X , and the deflection is Assuming that the distance from the starting point of the fourth group to the entrance side surface of the fourth group is D A1 , and the focal length of the first group is f 1 , these conditions are: (2) -1.7 <R 3 / [{(D 0 · f 1 ) / (f 1 -D 0 )} + (D 1 /
N 1 ) + D 2 ] <− 1.0 (3) It is preferable to satisfy −1.5 <R 8X / D A1 <−1.1 (claim 2). Conditions (2) and (3) are conditions for suppressing coma and improving imaging performance in order to reduce the diameter of the light spot. The coma aberration occurs in the under when the lower limit of the conditions (2) and (3) is exceeded, and the over occurs when the upper limit is exceeded, and it is difficult to form a good light spot having a small diameter. Become. The scanning imaging lens according to claim 1, wherein
The second group may be an "anamorphic lens having a concave spherical surface on the entrance side and a concave cylinder surface on the exit side having power only in the sub-scanning direction" (claim 3). Further, in the scanning image forming lens according to claim 1, the fourth lens group includes a triangular lens having a positive refractive power whose curvature in the sub-scanning direction is stronger than that in the main scanning direction. An anamorphic lens having a surface and having a stronger positive refractive power in the sub-scanning corresponding direction ”(claim 4). The scanning imaging lens according to any one of claims 1 to 4, wherein the first group is a "convex plano lens having a convex spherical surface on the incident side and a flat planar surface on the exit side", and has a complicated aspherical surface in the entire system. (Claim 5). The optical scanning device according to the present invention is configured such that "a light beam from a semiconductor laser is formed into a long line image in the main scanning direction, and the light beam is deflected at an equal angular velocity by an optical deflector having a deflecting / reflecting surface near an image forming position of the line image. An optical scanning device that performs a constant-speed optical scanning of the scanned surface by converging the deflected light beam as a light spot on the scanned surface by the scanning image forming lens. A scanning imaging lens according to any one of 1 to 5 is used (claim 6).

【0008】[0008]

【発明の実施の形態】図1に、この発明の光走査装置の
実施の1形態を示す。光源としての半導体レーザとコリ
メートレンズとを組合わせてなる光源装置1からは実質
的な平行光束が放射され、この平行光束はシリンダレン
ズ2の作用により、副走査対応方向(図面に直交する方
向)にのみ集光され、光偏向器である回転多面鏡3の偏
向反射面4の位置近傍に、主走査対応方向に長い「線
像」として結像する。偏向反射面4により反射された反
射光束は、主走査対応方向に関しては平行光束として、
副走査対応方向に関しては発散性の光束として、走査結
像レンズに入射する。走査結像レンズは、図のように、
第1群5、第2群6、第3群7、第4群8を、偏向反射
面4側から被走査面9側へ上記順序に配してなり、上記
反射光束を被走査面9(実体的には、例えば光導電性の
感光体の感光面等)上に、光スポットとして集光する。
即ち、走査結像レンズは、副走査対応方向に関して、偏
向反射面4の近傍位置と被走査面9の位置とを幾何光学
的な共役関係に結び付ける。従って、副走査対応方向に
関して、光スポットは上記線像を物点として結像される
ので、偏向反射面に面倒れがあっても、光スポットは副
走査方向へは実質的に変動しない。回転多面鏡3が等速
回転すると、被走査面9上の光スポットは主走査方向に
移動して光走査を行う。このとき光スポットの移動速度
は、走査結像レンズのfθ機能により等速度化される。
走査結像レンズは、請求項1〜5の任意の1つに記載の
ものが用いられる。
FIG. 1 shows an embodiment of an optical scanning device according to the present invention. A substantially parallel light beam is emitted from a light source device 1 that is a combination of a semiconductor laser as a light source and a collimator lens, and the parallel light beam is actuated by a cylinder lens 2 in a sub-scanning corresponding direction (a direction orthogonal to the drawing). And is formed as a long "line image" in the direction corresponding to the main scanning near the position of the deflecting reflection surface 4 of the rotary polygon mirror 3, which is an optical deflector. The reflected light beam reflected by the deflecting reflection surface 4 is a parallel light beam with respect to the main scanning corresponding direction.
In the sub-scanning corresponding direction, the light enters the scanning imaging lens as a divergent light beam. The scanning imaging lens, as shown in the figure,
The first group 5, the second group 6, the third group 7, and the fourth group 8 are arranged in this order from the deflecting / reflecting surface 4 side to the scanned surface 9 side. In practice, the light is focused as a light spot on, for example, a photosensitive surface of a photoconductive photoconductor.
That is, the scanning imaging lens connects the position near the deflection reflection surface 4 and the position of the surface 9 to be scanned to a geometric conjugate relationship in the sub-scanning corresponding direction. Accordingly, in the sub-scanning corresponding direction, since the light spot is formed with the line image as an object point, the light spot does not substantially fluctuate in the sub-scanning direction even if the deflecting and reflecting surface is tilted. When the rotary polygon mirror 3 rotates at a constant speed, the light spot on the surface 9 to be scanned moves in the main scanning direction to perform optical scanning. At this time, the moving speed of the light spot is made uniform by the fθ function of the scanning imaging lens.
As the scanning imaging lens, the one described in any one of claims 1 to 5 is used.

【0009】従って、図1に実施の形態を示す光走査装
置は、半導体レーザからの光束を主走査対応方向に長い
線像に結像させ、該線像の結像位置近傍に偏向反射面4
を持つ光偏向器3により等角速度的に偏向させ、偏向光
束を走査結像レンズ5,6,7,8により被走査面9上
に光スポットとして集光させ、被走査面8の等速的な光
走査を行う光走査装置であって、走査結像レンズとし
て、請求項1〜5の任意の1に記載の走査結像レンズを
用いたものである(請求項6)。
Therefore, the optical scanning apparatus shown in FIG. 1 forms the light beam from the semiconductor laser into a long line image in the main scanning direction, and the deflecting surface 4 near the image forming position of the line image.
Is deflected at a constant angular velocity by the optical deflector 3 having the above, and the deflected light beam is condensed as a light spot on the surface 9 to be scanned by the scanning imaging lenses 5, 6, 7, and 8, and An optical scanning device for performing an optical scanning, wherein the scanning imaging lens according to any one of claims 1 to 5 is used as the scanning imaging lens (claim 6).

【0010】[0010]

【実施例】以下、具体的な実施例を3例挙げる。実施例
1〜3とも、図1の如き光学配置で設計されている。光
源装置1において光源として用いられる半導体レーザ
は、基準の発光波長(光走査装置の使用波長):800
nmのものである。回転多面鏡3は、偏向反射面数:
8、内接円半径:32.335mm、光源装置側1から
偏向反射面4への入射する光束の方向と走査結像レンズ
光軸との成す角:αは65度である。又、図1に示す距
離:h(回転多面鏡4の回転軸と走査結像レンズ光軸と
の距離)は、実施例1において17.52mm、実施例
2において17.53mm、実施例3において17.5
4mmである。図1の図の面は、回転多面鏡3により理
想的に偏向された偏向光束の主光線が描く面と合致して
おり、この面を「偏向面」と呼び、走査結像レンズの光
軸を含み、上記偏向面に直交する面を「偏向直交面」と
呼ぶ。図1において、Rxi(i=1〜8)は偏向反射面
4の側から数えて第i番目のレンズ面の偏向面内の曲率
半径(上記レンズ面の主走査対応方向の曲率半径)、R
yi(i=1〜8)は第i番目のレンズ面の偏向直交面内
における曲率半径(上記レンズ面の副走査対応方向の曲
率半径)を表す。また、Di(i=0,1〜8)におい
て、D0は、光スポットの像高が0のとき、偏向反射面
4から第1群5の入射側レンズ面に到る光軸上の距離、
1〜D7は、偏向反射面4の側から数えて第i番目と第
i+1番目のレンズ面の光軸上面間距離、D8は第4群
8の射出側レンズ面と被走査面9との間の光軸上の距離
を表す。また、Nj(j=1〜4)とνdj(j=1〜
4)は、偏向反射面4の側から数えて第j番目のレンズ
の、波長:800nmの光に対する屈折率とd線での分
散値(アッべ数)を表している。また、fm,fsはそ
れぞれ、走査結像レンズ全系の主走査対応方向及び副走
査対応方向における合成焦点距離を表し、2θは偏向角
を表す。
EXAMPLES Three specific examples will be described below. Embodiments 1 to 3 are designed with the optical arrangement as shown in FIG. The semiconductor laser used as a light source in the light source device 1 has a reference emission wavelength (used wavelength of the optical scanning device): 800
nm. The rotating polygon mirror 3 has a number of deflection reflecting surfaces:
8, the radius of the inscribed circle: 32.335 mm, and the angle α between the direction of the light beam incident on the deflection reflecting surface 4 from the light source device side 1 and the optical axis of the scanning imaging lens: 65 degrees. The distance h shown in FIG. 1 (the distance between the rotation axis of the rotary polygon mirror 4 and the optical axis of the scanning imaging lens) is 17.52 mm in the first embodiment, 17.53 mm in the second embodiment, and 17.53 mm in the third embodiment. 17.5
4 mm. The plane shown in FIG. 1 coincides with the plane drawn by the principal ray of the deflected light beam ideally deflected by the rotary polygon mirror 3, and this plane is called the "deflection plane" and is the optical axis of the scanning imaging lens. And a plane orthogonal to the deflection plane is referred to as a “deflection orthogonal plane”. In FIG. 1, R xi (i = 1 to 8) is a radius of curvature of the i-th lens surface in the deflection surface (the radius of curvature of the lens surface in the main scanning corresponding direction) counted from the side of the deflecting reflection surface 4. R
yi (i = 1 to 8) represents the radius of curvature of the i-th lens surface in the plane orthogonal to the deflection (the radius of curvature of the lens surface in the sub-scanning corresponding direction). In D i (i = 0 , 1 to 8), D 0 is on the optical axis from the deflecting reflecting surface 4 to the entrance lens surface of the first group 5 when the image height of the light spot is 0. distance,
D 1 to D 7 are the distance between the optical axis upper surfaces of the i-th and (i + 1) -th lens surfaces counted from the deflecting / reflecting surface 4 side, and D 8 is the exit-side lens surface of the fourth unit 8 and the scanned surface 9 Represents the distance on the optical axis between Also, N j (j = 1 to 4) and v dj (j = 1 to
4) represents the refractive index and the dispersion value (Abbe number) at the d-line of the j-th lens counted from the side of the deflecting reflection surface 4 with respect to light having a wavelength of 800 nm. Further, fm and fs respectively represent the combined focal lengths of the entire scanning imaging lens system in the main scanning corresponding direction and the sub scanning corresponding direction, and 2θ represents the deflection angle.

【0011】K1,K2,K3はそれぞれ条件式
(1),(2),(3)の各パラメータを表すものとす
る。なお、主走査対応方向の焦点距離:fmを100に
規格化してある。 実施例1 fm=100,fs=29.443,2θ=50.8度 i Rxiyii j Nj νdj 0 20.447 1 177.819 177.819 2.216 1 1.51032 64.2 2 ∞ ∞ 2.840 3 -39.446 -39.446 1.733 2 1.78439 25.5 4 ∞ 25.035 2.560 5 -187.836 -187.836 5.064 3 1.51032 64.2 6 -41.650 -41.650 0.714 7 ∞ ∞ 6.174 4 1.79171 46.6 8 -56.351 -16.517 113.749 条件式の値:K1= 1.827 K2=−1.515 K3=−1.350 。
K1, K2 and K3 represent the parameters of the conditional expressions (1), (2) and (3), respectively. Note that the focal length: fm in the main scanning corresponding direction is standardized to 100. Example 1 fm = 100, fs = 29.443,2θ = 50.8 ° i R xi R yi D i j N j ν dj 0 20.447 1 177.819 177.819 2.216 1 1.51032 64.2 2 ∞ ∞ 2.840 3 -39.446 -39.446 1.733 2 1.78439 25.5 4 ∞ 25.035 2.560 5 -187.836 -187.836 5.064 3 1.51032 64.2 6 -41.650 -41.650 0.714 7 ∞ 174 6.174 4 1.79171 46.6 8 -56.351 -16.517 113.749 Value of conditional expression: K1 = 1.827 K2 = -1. 515 K3 = -1.350.

【0012】 実施例2 fm=100,fs=30.173,2θ=50.8度 i Rxiyii j Nj νdj 0 20.456 1 182.809 182.809 2.188 1 1.51032 64.2 2 ∞ ∞ 3.035 3 -35.011 -35.011 1.377 2 1.67405 31.2 4 ∞ 21.970 3.401 5 -126.714 -126.714 5.261 3 1.51032 64.2 6 -40.859 -40.859 0.676 7 ∞ ∞ 6.522 4 1.79171 46.6 8 -55.776 -17.354 115.490 条件式の値:K1= 1.494 K2=−1.337 K3=−1.300 。[0012] Example 2 fm = 100, fs = 30.173,2θ = 50.8 ° i R xi R yi D i j N j ν dj 0 20.456 1 182.809 182.809 2.188 1 1.51032 64.2 2 ∞ ∞ 3.035 3 -35.011 -35.011 1.377 2 1.67405 31.2 4 ∞ 21.970 3.401 5 -126.714 -126.714 5.261 3 1.51032 64.2 6 -40.859 -40.859 0.676 7 ∞ ∞ 6.522 4 1.79171 46.6 8 -55.776 -17.354 115.490 Value of the conditional expression: K1 = 1.494 K2 -1.337 K3 = -1.300.

【0013】 実施例3 fm=100,fs=−52.038,2θ=50.8度 i Rxiyii j Nj νdj 0 20.339 1 130.850 130.850 2.264 1 1.51032 64.2 2 ∞ ∞ 2.697 3 -36.438 -36.438 1.196 2 1.82347 23.8 4 ∞ 29.073 2.484 5 -214.282 -214.282 5.727 3 1.51032 64.2 6 -37.009 -37.009 0.351 7 ∞ ∞ 6.310 4 1.71941 54.7 8 -53.458 -15.636 114.166 条件式の値:K1= 2.298 K2=−1.386 K3=−1.292 。[0013] Example 3 fm = 100, fs = -52.038,2θ = 50.8 ° i R xi R yi D i j N j ν dj 0 20.339 1 130.850 130.850 2.264 1 1.51032 64.2 2 ∞ ∞ 2.697 3 - 36.438 -36.438 1.196 2 1.82347 23.8 4 ∞ 29.073 2.484 5 -214.282 -214.282 5.727 3 1.51032 64.2 6 -37.009 -37.009 0.351 7 ∞ ∞ 6.310 4 1.71941 54.7 8 -53.458 -15.636 114.166 Value of the conditional expression: K1 = 2.298 K = -1.386 K3 = -1.292.

【0014】図2〜図4に順次、実施例1〜3に関する
像面湾曲(実線は副走査方向、点線は主走査方向)と、
fθ特性と、主走査方向のコマ収差図および球面収差の
図を示す。コマ収差と球面収差の図において、WL1=
800nm,WL2=790nm,WL3=810nm
をWL1に対して表記し、倍率および軸上色収差を表し
ている。各実施例において、100に規格化されたfm
の具体的な値は、全実施例において399.3mmであ
る。
FIGS. 2 to 4 sequentially show field curvatures (solid lines in the sub-scanning direction, dotted lines in the main scanning direction) relating to the first to third embodiments.
FIG. 3 shows fθ characteristics, and a diagram of coma aberration and spherical aberration in a main scanning direction. In the figures of coma and spherical aberration, WL1 =
800 nm, WL2 = 790 nm, WL3 = 810 nm
Is expressed with respect to WL1, and represents magnification and axial chromatic aberration. In each embodiment, fm normalized to 100
Is 399.3 mm in all examples.

【0015】[0015]

【発明の効果】以上のように、この発明によれば、色収
差あるいは色収差とコマ収差とを良好に補正した新規な
走査結像レンズと、これを用いた光走査装置を提供でき
る。この走査結像レンズは、各実施例に示したように高
画角であるにもかかわらず、像面湾曲、fθ特性ともに
良好で、光スポット径の変動が極めて少ない。従って、
この走査結像レンズを用いる光走査装置は高密度光走査
を実現出来る。また、請求項5記載の走査結像レンズ
は、全系内に複雑な「非球面」を含まないので、製造が
容易で安価に実施することができる。
As described above, according to the present invention, it is possible to provide a novel scanning imaging lens in which chromatic aberration or chromatic aberration and coma are well corrected, and an optical scanning device using the same. This scanning imaging lens has good field curvature and fθ characteristics, and has a very small variation in the light spot diameter, despite having a large angle of view as shown in each embodiment. Therefore,
An optical scanning device using this scanning imaging lens can realize high-density optical scanning. Further, since the scanning image forming lens according to the fifth aspect does not include a complicated "aspherical surface" in the entire system, it can be manufactured easily and inexpensively.

【図面の簡単な説明】[Brief description of the drawings]

【図1】この発明の光走査装置の実施の1例を説明する
ための図である。
FIG. 1 is a diagram for explaining an embodiment of an optical scanning device according to the present invention.

【図2】実施例1に関する収差とfθ特性を示す図であ
る。
FIG. 2 is a diagram illustrating aberration and fθ characteristics according to the first embodiment.

【図3】実施例2に関する収差とfθ特性を示す図であ
る。
FIG. 3 is a diagram illustrating aberration and fθ characteristics according to a second embodiment.

【図4】実施例3に関する収差とfθ特性を示す図であ
る。
FIG. 4 is a diagram illustrating aberration and fθ characteristics according to a third embodiment.

【符号の説明】[Explanation of symbols]

1 光源装置 2 シリンダレンズ 3 光偏向器 4 偏向反射面 5 第1群 6 第2群 7 第3群 8 第4群 9 被走査面 DESCRIPTION OF SYMBOLS 1 Light source device 2 Cylinder lens 3 Optical deflector 4 Deflection / reflection surface 5 First group 6 Second group 7 Third group 8 Fourth group 9 Scanned surface

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】半導体レーザから放射されて主走査対応方
向に長い線像に結像され、上記線像の結像位置の近傍に
偏向反射面を持つ光偏向器により等角速度的に偏向され
た光束を、被走査面上に光スポットとして集光させ、被
走査面の等速的な光走査を行うための結像光学系であっ
て、 主走査対応方向に関してfθ機能を持つと共に、副走査
対応方向に関して上記線像の結像位置と被走査面とを幾
何光学的な共役関係とする機能を持ち、 上記光偏向器側を入射側とし、被走査面側へ向かって順
次、第1〜第4群を配してなり、 第1群は、正の屈折力を持つレンズ、 第2群は、シリンダ−面を有し、負の屈折力を持つアナ
モフィックレンズ、 第3群は、入射側に凹面を向けた球面単レンズで、正の
メニスカスレンズ、 第4群は、正の屈折力のト−リック面を有するアナモフ
ィックなレンズである4群4枚構成であり、 第2群と第4群のアッべ数をそれぞれνd2,νd4とする
とき、これらが条件: (1) 1.0<νd4/νd2 を満足することを特徴とする走査結像レンズ。
1. A light beam emitted from a semiconductor laser is formed into a long line image in a main scanning corresponding direction, and is deflected at a constant angular velocity by an optical deflector having a deflecting reflection surface near an image forming position of the line image. An image forming optical system for converging a light beam as a light spot on a surface to be scanned and performing uniform speed optical scanning of the surface to be scanned. With respect to the corresponding direction, it has a function of making the image forming position of the line image and the surface to be scanned a geometrically conjugate relationship, the light deflector side as an incident side, and sequentially from the first to the surface to be scanned. A fourth group is arranged, a first group is a lens having a positive refractive power, a second group is an anamorphic lens having a cylinder surface and a negative refractive power, and a third group is an incident side. Is a spherical single lens with a concave surface facing the positive meniscus lens, and the fourth unit has a positive refractive power. - a 4 four-group configuration is anamorphic lens having Rick surface, [nu d2 and a second group the fourth group of Abbe number, respectively, when the [nu d4, these conditions: (1) 1.0 <scanning image forming lens satisfies the ν d4 / ν d2.
【請求項2】請求項1記載の走査結像レンズにおいて、 偏向の起点から第1群の入射側面までの光軸上の距離を
0 、第1群の肉厚および材質の屈折率をそれぞれD1
およびN1、第1,第2群の空気間隔をD2 、第2群の
入射側面の曲率半径をR3 、第4群の射出側面の主走査
対応方向の曲率半径をR8X、偏向の起点から第4群の入
射側面までの距離をDA1、第1群の焦点距離をf1とす
るとき、これらが条件: (2) −1.7<R3/[{(D0・f1)/(f1-D0)}+(D1/
N1)+D2]<−1.0 (3) −1.5<R8X/DA1<−1.1 を満足することを特徴とする走査結像レンズ。
2. The scanning imaging lens according to claim 1, wherein the distance on the optical axis from the starting point of deflection to the incident side of the first group is D 0 , and the thickness and the refractive index of the material of the first group are respectively D 1
And N 1 , the air spacing between the first and second groups is D 2 , the radius of curvature of the entrance side of the second group is R 3 , the radius of curvature of the exit side of the fourth group in the main scanning direction is R 8X , When the distance from the starting point to the entrance side surface of the fourth group is D A1 , and the focal length of the first group is f 1 , these conditions are: (2) −1.7 <R 3 / [{(D 0 · f 1 ) / (f 1 -D 0 )} + (D 1 /
N 1 ) + D 2 ] <− 1.0 (3) A scanning imaging lens satisfying −1.5 <R 8X / D A1 <−1.1.
【請求項3】請求項1または2記載の走査結像レンズに
おいて、 第2群が、入射側に凹球面を有し、射出側に副走査対応
方向にのみパワ−を持つ凹シリンダ面を有するアナモフ
ィックなレンズであることを特徴とする走査結像レン
ズ。
3. The scanning image forming lens according to claim 1, wherein the second group has a concave spherical surface on the entrance side and a concave cylinder surface on the exit side having power only in the sub-scanning corresponding direction. A scanning imaging lens characterized by being an anamorphic lens.
【請求項4】請求項1または2または3記載の走査結像
レンズにおいて、 第4群が、射出側に、副走査対応方向の曲率が主走査対
応方向の曲率よりも強い、正の屈折力のト−リック面を
有し、副走査対応方向により強い正の屈折力を持つアナ
モフィックなレンズであることを特徴とする走査結像レ
ンズ。
4. The scanning image forming lens according to claim 1, wherein the fourth group has a positive refractive power on the exit side, wherein the curvature in the sub-scanning corresponding direction is stronger than the curvature in the main scanning corresponding direction. A anamorphic lens having a toric surface and a stronger positive refractive power in the sub-scanning corresponding direction.
【請求項5】請求項1〜4の任意の1つに記載の走査結
像レンズにおいて、 第1群は、入射側が凸球面、射出側が平面である凸平レ
ンズであり、全系内に複雑な非球面を含まないことを特
徴とする走査結像レンズ。
5. The scanning image forming lens according to claim 1, wherein the first group is a convex and flat lens having a convex spherical surface on an entrance side and a flat surface on an exit side. A scanning imaging lens characterized in that it does not include any aspheric surface.
【請求項6】半導体レーザからの光束を主走査対応方向
に長い線像に結像させ、上記線像の結像位置近傍に偏向
反射面を持つ光偏向器により等角速度的に偏向させ、偏
向光束を走査結像レンズにより被走査面上に光スポット
として集光させ、上記被走査面の等速的な光走査を行う
光走査装置であって、 走査結像レンズとして、請求項1〜5の任意の1つに記
載の走査結像レンズを用いたことを特徴とする光走査装
置。
6. A light beam from a semiconductor laser is formed into a long line image in a direction corresponding to the main scanning, and the light beam is deflected at an equal angular velocity by an optical deflector having a deflecting / reflecting surface near an image forming position of the line image. An optical scanning device for converging a light beam as a light spot on a surface to be scanned by a scanning image forming lens and performing uniform scanning of the surface to be scanned, wherein the scanning image forming lens is used as a scanning image forming lens. An optical scanning device using the scanning imaging lens according to any one of the above.
JP10318399A 1999-04-09 1999-04-09 Scanning imaging lens and optical scanning device Expired - Fee Related JP4445059B2 (en)

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Application Number Priority Date Filing Date Title
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ID=14347408

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