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JP2000282240A - Method of forming organic monomolecular film and patterning method thereof - Google Patents

Method of forming organic monomolecular film and patterning method thereof

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Publication number
JP2000282240A
JP2000282240A JP9434999A JP9434999A JP2000282240A JP 2000282240 A JP2000282240 A JP 2000282240A JP 9434999 A JP9434999 A JP 9434999A JP 9434999 A JP9434999 A JP 9434999A JP 2000282240 A JP2000282240 A JP 2000282240A
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JP
Japan
Prior art keywords
monomolecular film
substrate
organic
patterning
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9434999A
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Japanese (ja)
Other versions
JP3879312B2 (en
Inventor
Tatsuya Shimoda
達也 下田
Satoru Miyashita
悟 宮下
Osamu Takai
治 高井
Hiroyuki Sugimura
博之 杉村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
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Seiko Epson Corp
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Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

(57)【要約】 (修正有) 【課題】稠密な単分子膜を簡便な方法で基板上に自己集
積させる方法、更に有機単分子膜を精度良く、簡便な方
法でパターニングする方法を提供する。 【解決手段】基板をあらかじめ何らかの方法で洗浄した
後、該表面を親水化させて、フッ化アルキルシランの単
分子膜を該基板上に化学気相蒸着法で形成することで有
機単分子膜を形成する。また酸素を含む雰囲気下で紫外
線を照射し、フッ化アルキルシランの単分子膜を除去す
ることで有機単分子膜をパターニングする。
(57) [Abstract] (with correction) [PROBLEMS] To provide a method for self-assembling a dense monomolecular film on a substrate by a simple method, and a method for patterning an organic monomolecular film with high accuracy and a simple method. . An organic monomolecular film is formed by preliminarily cleaning a substrate by some method, hydrophilizing the surface, and forming a monomolecular film of fluorinated alkylsilane on the substrate by a chemical vapor deposition method. Form. Further, the organic monomolecular film is patterned by irradiating ultraviolet rays in an atmosphere containing oxygen and removing the monomolecular film of fluorinated alkylsilane.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は親水化処理の可能な
基板上に簡単な方法により、稠密な単分子膜を形成でき
る方法、ならびに形成された単分子膜をパターニングす
る方法に関するものである。さらに詳しく言うと、フッ
化アルキルシランの単分子膜を簡単な方法で形成し、そ
れを簡便な方法でパターニングして基板上に親水性と撥
水性の領域を任意に作り出す方法、あるいは摩擦の大き
な領域と小さな領域を任意に作り出す方法に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a dense monomolecular film on a substrate which can be subjected to a hydrophilic treatment by a simple method, and a method for patterning the formed monomolecular film. More specifically, a method of forming a monolayer of fluorinated alkylsilane by a simple method and patterning it by a simple method to arbitrarily create a hydrophilic and water-repellent region on the substrate, or a method of generating a large friction. It relates to a method of arbitrarily creating a region and a small region.

【0002】[0002]

【従来の技術】有機単分子膜を形成する方法として、従
来からシランカップリング材、チタンカップリング材等
が知られており、工業的に広く用いられている。これら
の分子は基板上に単分子吸着ならびに結合するが、密度
的にはそれほど高くなく基板の原子数百個に対して一つ
の分子が吸着している程度で,ミクロ的にみれば疎であ
る。近年になり、より稠密な単分子膜が分子の自己集積
化技術(SAM: Self Assembling Molecule)という方法で
作製できるようになってきた。
2. Description of the Related Art As a method for forming an organic monomolecular film, a silane coupling material, a titanium coupling material, and the like have been conventionally known, and are widely used industrially. These molecules are adsorbed and bonded to the substrate as single molecules, but the density is not so high and only one molecule is adsorbed per hundred atoms of the substrate, which is sparse from the microscopic point of view. . In recent years, denser monolayers can be produced by a method called SAM (Self Assembling Molecule).

【0003】自己集積分子には長鎖アルキルカルボン酸
化合物(―COOH)、チオール化合物(―SH)等が知られてい
る。前者は、LB(Langmuir-Blodgett)法を用いて単分
子膜を形成できる。すなわち水面上にあらかじめ単分子
膜を形成し、基板表面に垂直引き上げまたは水平転写に
より転写する方法である。しかしながらLB法で形成し
た単分子膜は、基板との密着性が低い、塩を用いるため
高純度化が難しい、生産性が低く均一性が悪い、材料の
制約が多いという欠点を有していおり、工業用途にむか
ない。
[0003] Known self-assembled molecules include long-chain alkyl carboxylic acid compounds (-COOH) and thiol compounds (-SH). In the former, a monomolecular film can be formed by using the LB (Langmuir-Blodgett) method. That is, this is a method in which a monomolecular film is previously formed on the water surface, and is transferred to the substrate surface by vertical pulling or horizontal transfer. However, the monomolecular film formed by the LB method has disadvantages such as low adhesion to a substrate, difficulty in high purity due to use of a salt, low productivity and poor uniformity, and many restrictions on materials. Not suitable for industrial use.

【0004】一方後者のチオール化合物は、その溶液中
に浸漬するだけで金の表面にチオール化合物が自己集積
し、水素が取れて硫黄が金と共有結合的に結びつく。こ
の金チオール単分子膜はきわめて稠密に自己集積するこ
とが確かめられている。ほぼ、金原子一つに対して分子
一つが対応する。また、いろいろな種類のチオール分子
が合成されていて、それらを自己集積させると分子の末
端官能基が表面に出るので、金の表面は種々の性質を持
った表面に変えることができる。例えば、フッ化炭素を
末端に持つチオール分子を用いると、良質な撥水性の表
面を作製することができる。同じようにして完全な親水
性の表面もできる(特開平9−827059等)。しか
しながら、金チオール自己集積化膜は金の表面がなくて
はならない点にある。そのため、あらかじめある程度の
膜厚の金膜を形成する必要がある。また、後に金膜を部
分的に取り除いたりする作業が必要になったり、撥水性
や親水性を利用してデバイス等を作製するとき、金が下
地に残ってしまうという不都合さがある。このため、金
チオール自己集積化膜の適応の範囲は限られるという欠
点がある。
On the other hand, in the latter thiol compound, the thiol compound is self-assembled on the surface of gold only by dipping in the solution, hydrogen is removed, and sulfur is covalently bonded to gold. It has been confirmed that this gold thiol monomolecular film self-assembles very densely. Almost one molecule corresponds to one gold atom. In addition, various types of thiol molecules have been synthesized, and when they are self-assembled, the terminal functional groups of the molecules appear on the surface, so that the gold surface can be changed to a surface having various properties. For example, when a thiol molecule having a terminal of fluorocarbon is used, a high-quality water-repellent surface can be manufactured. In the same manner, a completely hydrophilic surface can be obtained (Japanese Patent Application Laid-Open No. 9-827059). However, the gold thiol self-assembled film must have a gold surface. Therefore, it is necessary to previously form a gold film having a certain thickness. In addition, there is an inconvenience that an operation for partially removing the gold film is required later, and when a device or the like is manufactured using water repellency or hydrophilicity, gold remains on the base. Therefore, there is a disadvantage that the range of application of the gold thiol self-assembled film is limited.

【0005】[0005]

【発明が解決しようとする課題】本発明の目的は、稠密
な単分子膜を簡便な方法で基板上に自己集積させる方法
を提供することにある。該基板表面は金のような特殊な
ものではなく、ある程度一般的にみられるような性質を
持つものであることが望ましい。また、撥水性や親水性
を利用してデバイス等を作製するとき、下地に著しい不
純物が残らないような基板表面であることが望ましい
し、工業的に生産性が高いことも勿論必要となる。
An object of the present invention is to provide a method for self-assembling a dense monolayer on a substrate by a simple method. It is desirable that the surface of the substrate is not a special material such as gold, but has a property generally observed to some extent. Further, when manufacturing a device or the like utilizing water repellency or hydrophilicity, it is desirable that the substrate surface has no significant impurities left on the underlayer, and it is of course necessary to have high industrial productivity.

【0006】また有機単分子膜を精度良く、簡便な方法
でパターニングできれば応用分野が拓けてくるが、従来
パターニングの 方法は提言されて来なかった。
[0006] In addition, if an organic monomolecular film can be patterned with high accuracy and a simple method, application fields can be opened up, but no patterning method has been proposed in the past.

【0007】[0007]

【課題を解決するための手段】前記問題点を解決するた
め、本発明の有機単分子膜の形成方法は次のような事を
特徴とする。
In order to solve the above problems, the method of forming an organic monomolecular film according to the present invention has the following features.

【0008】(1)基板をあらかじめ何らかの方法で洗浄
した後、該表面を親水化させて、フッ化アルキルシラン
の単分子膜を該基板上に化学気相蒸着法で形成すること
を特徴とする。
(1) The method is characterized in that after the substrate has been washed by some method in advance, the surface is made hydrophilic, and a monomolecular film of fluorinated alkylsilane is formed on the substrate by chemical vapor deposition. .

【0009】(2)基板を紫外線あるいは酸素プラズマ処
理により洗浄することを特徴とする。
(2) The substrate is cleaned by ultraviolet or oxygen plasma treatment.

【0010】(3)一般式(I)で表されるケイ素化合物
を用いて、基板上に化学気相蒸着法でフッ化アルキルシ
ランの単分子膜を形成することを特徴とする。
(3) A monomolecular film of a fluoroalkylsilane is formed on a substrate by a chemical vapor deposition method using a silicon compound represented by the general formula (I).

【0011】(4)化学気相蒸着法を大気圧下、あるいは1
Torr以下の大気圧に近い減圧雰囲気化で行うことを特徴
とする。
(4) Chemical vapor deposition is performed under atmospheric pressure or
It is characterized in that it is performed in a reduced pressure atmosphere close to the atmospheric pressure of Torr or less.

【0012】(5)化学気相蒸着法を200℃以下の温度で行
うことを特徴とする。
(5) The method is characterized in that the chemical vapor deposition is performed at a temperature of 200 ° C. or less.

【0013】(6)一般式(I)で表されるケイ素化合物
またはその溶媒希釈溶液の適量をインクジェット法であ
らかじめ基板上に微細に散布しておき,それを蒸発させ
て基板全面に化学気相蒸着することを特徴とする。ま
た、前記問題点を解決するため、本発明の有機単分子膜
のパターニング方法は次のような事を特徴とする。
(6) An appropriate amount of the silicon compound represented by the general formula (I) or its solvent diluted solution is finely sprayed on a substrate in advance by an ink-jet method, and is evaporated to form a chemical vapor over the entire surface of the substrate. It is characterized by being deposited. In order to solve the above problems, the method for patterning an organic monomolecular film according to the present invention has the following features.

【0014】(7)酸素を含む雰囲気下で紫外線を照射
し、フッ化アルキルシランの単分子膜を除去することを
特徴とする。
(7) The method is characterized in that a monomolecular film of fluorinated alkylsilane is removed by irradiating ultraviolet rays in an atmosphere containing oxygen.

【0015】(8)マスクを用いて所望の領域のみに紫外
線を照射し、単分子膜を除去することを特徴とする。
(8) Only a desired region is irradiated with ultraviolet rays using a mask to remove the monomolecular film.

【0016】(9)電子ビームを用いて、フッ化アルキル
シランの単分子膜を除去することを特徴とする。
(9) The monomolecular film of fluorinated alkylsilane is removed by using an electron beam.

【0017】(10)単分子膜を除去した後、フッ素原子を
含有しないケイ素化合物を吸着させることを特徴とす
る。また本発明のリソグラフィ方法は次のような事を特
徴とする。
(10) After removing the monomolecular film, a silicon compound containing no fluorine atom is adsorbed. The lithography method of the present invention has the following features.

【0018】(11)パターニングで残したフッ化アルキル
シランの単分子膜を、レジスト膜としてエッチングスト
ッパーに用いることを特徴とする。
(11) The monomolecular film of fluorinated alkylsilane left by patterning is used as an etching stopper as a resist film.

【0019】[0019]

【発明の実施の形態】酸化物表面にXe2エキシマランプ
(ウシオ社製)を用いて、172nmの紫外光を大気圧下2
分間照射すると、光洗浄が起こり結果的に-OH基が高密
度で形成される。赤外分光、昇温脱離法(TDS)等の分析
結果から水酸基の密度が-OH6個/nm2と、ケイ素化合物単
分子膜を細密に充填するに十分な結合基が、発生してい
たことがわかった。この効果は、用いる紫外光の波長に
依存するものの、同様に認められた。また、酸素プラズ
マ処理でも親水化の効果は認められた。
BEST MODE FOR CARRYING OUT THE INVENTION Using a Xe 2 excimer lamp (manufactured by Ushio) on an oxide surface, ultraviolet light of 172 nm was applied under atmospheric pressure.
After irradiation for 1 minute, light washing occurs, resulting in the formation of -OH groups at a high density. Infrared spectroscopy, and density -OH6 pieces / nm 2 hydroxyl groups from the analysis results, such as Atsushi Nobori spectroscopy (TDS), sufficient bonding group to finely filled with silicon compound monomolecular film had occurred I understand. Although this effect depends on the wavelength of the ultraviolet light used, it was similarly recognized. The effect of hydrophilization was also observed in the oxygen plasma treatment.

【0020】続けてフッ化アルキルシランを蒸発させ、
該基板上に化学気相蒸着させると、非常に緻密な単分子
膜を形成できることが判明した。以下実施例に基づき、
本発明を詳細いに説明する。基板の洗浄方法、用いるフ
ッ化アルキルシラン材料、化学気相蒸着法の条件は、な
んら限定されるものではない。
Subsequently, the fluorinated alkylsilane is evaporated,
It has been found that a very dense monomolecular film can be formed by chemical vapor deposition on the substrate. Based on the following examples,
The present invention will be described in detail. The method for cleaning the substrate, the fluorinated alkylsilane material to be used, and the conditions for the chemical vapor deposition method are not particularly limited.

【0021】(実施例1)有機単分子膜の材料として、
3,3,3-トリフルオロプロピルトリメトキシシラン(以後F
AS-3と記載)、トリデカフルオロ-1,1,2,2-テトラヒドロ
オクチルトリメトキシシラン(以後FAS-13と記載)、ヘプ
タデカフルオロ-1,1,2,2-テトラヒドロデシルトリメト
キシシラン(以後FAS-17と記載)の3種のフッ化アルキル
シランを用意した。表1に用いた材料の化学式、分子
量、沸点/圧力を示した。
(Example 1) As a material of an organic monomolecular film,
3,3,3-trifluoropropyltrimethoxysilane (hereinafter F
AS-3), tridecafluoro-1,1,2,2-tetrahydrooctyltrimethoxysilane (hereinafter referred to as FAS-13), heptadecafluoro-1,1,2,2-tetrahydrodecyltrimethoxysilane (Hereinafter referred to as FAS-17) were prepared. Table 1 shows the chemical formula, molecular weight, and boiling point / pressure of the materials used.

【0022】[0022]

【表1】 [Table 1]

【0023】基板として単結晶シリコンを用いた。該シ
リコン基板表面を、まず紫外光(波長172nm)を用いて基
板洗浄し、有機不純物を除去し清浄表面にした。該基板
表面は自然酸化膜(SiO2)に覆われているので、基板表面
には直ちに大気中の水蒸気が吸着して表面がOH基で覆わ
れ親水性表面になる。次に、図2のような装置を用い、
親水化した該シリコン基板上にフッ化アルキルシラン分
子を化学気相蒸着法により堆積した。まずテフロン製密
閉容器の中に、フッ化アルキルシランを入れたビーカー
とSi基板を入れ、つぎに容器全体を電気炉中に置き、温
度を上げるとフッ化アルキルシランは蒸発して、基板上
に化学気相蒸着した。
Single crystal silicon was used as a substrate. First, the surface of the silicon substrate was washed with ultraviolet light (wavelength: 172 nm) to remove organic impurities to obtain a clean surface. Since the surface of the substrate is covered with a natural oxide film (SiO 2 ), water vapor in the air is immediately adsorbed on the surface of the substrate, and the surface is covered with OH groups to become a hydrophilic surface. Next, using an apparatus as shown in FIG.
Fluoroalkylsilane molecules were deposited on the hydrophilized silicon substrate by a chemical vapor deposition method. First, place the beaker containing the fluoroalkylsilane and the Si substrate in a Teflon sealed container, then place the entire container in an electric furnace, raise the temperature, and the fluoroalkylsilane evaporates, leaving the substrate on the substrate. Chemical vapor deposition.

【0024】密閉容器内の温度は100℃とした。図3に
堆積時間と膜厚との関係を示す。膜厚はエリプソメータ
で測定した。原子力顕微鏡(AFM)、X線を用いた測定(XP
S)により単分子膜の形成が同定された。作製した単分子
膜の吸着後の構造を図1に示す。7時間堆積させた後の
各単分子膜の表面エネルギーを水、ヨウ化メチレン、ヘ
キサデカンとの接触角から算出したところ、 FAS-3は30
mN/m、FAS-13は20mN/m、FAS-17は16mN/mであった。単分
子膜を形成しないSi-OHは80mN/mであった。
The temperature inside the closed vessel was 100 ° C. FIG. 3 shows the relationship between the deposition time and the film thickness. The film thickness was measured with an ellipsometer. Atomic force microscope (AFM), measurement using X-ray (XP
S) identified the formation of a monolayer. FIG. 1 shows the structure of the prepared monomolecular film after adsorption. The surface energy of each monolayer after 7 hours of deposition was calculated from the contact angle with water, methylene iodide and hexadecane.
mN / m, FAS-13 was 20 mN / m, and FAS-17 was 16 mN / m. The Si-OH that did not form a monomolecular film was 80 mN / m.

【0025】次に3種の材料の摩擦力をLEM(Lateral Fo
rce Microscopy)で調べた。この方法は、原子力顕微鏡
を変形した装置で,図4に示すように縦方向のたわみと
横方向のたわみを同時に計測し、試料表面に働く摩擦力
を検出できる。図1に示すように、各々の材料の末端部
分はフッ化炭素鎖なので、もし基板が密にフッ化アルキ
ルシランで覆われていれば、摩擦力は大変低くなり、も
し基板上にSiO2の面が出ていると摩擦力は高くなる。フ
ッ化アルキルシランの被覆度合いにより摩擦力はそれら
の中間値を取る。測定の結果、摩擦力は相対的に、 Si-OH>FAS-3>>FAS-13≧FAS-17 のようになった。この結果から、FAS-3においては被覆
率が低く、十分稠密な単分子膜が形成されていないと推
測される。FAS-13とFAS-17について膜厚と分子長を見て
みると表2に有るような結果になった。
Next, the frictional force of the three materials was determined by LEM (Lateral Foam).
rce Microscopy). According to this method, the longitudinal deflection and the lateral deflection are simultaneously measured as shown in FIG. 4 using an apparatus modified from a nuclear microscope, and the frictional force acting on the sample surface can be detected. As shown in Fig. 1, the end of each material is a fluorocarbon chain, so if the substrate is densely covered with fluorinated alkylsilane, the frictional force will be very low, and if the substrate is covered with SiO2 When it comes out, the frictional force increases. The frictional force takes an intermediate value depending on the coating degree of the fluoroalkylsilane. As a result of the measurement, the frictional force was relatively as follows: Si-OH> FAS-3 >> FAS-13 ≧ FAS-17. From these results, it is inferred that FAS-3 has a low coverage and does not form a sufficiently dense monomolecular film. Looking at the film thickness and molecular length of FAS-13 and FAS-17, the results shown in Table 2 were obtained.

【0026】[0026]

【表2】 [Table 2]

【0027】この結果より、FAS-17においては分子は基
板と垂直に集積化されており、集積率はかなり高いレベ
ルにあると推測される。すなわち,密な単分子膜が形成
されている。一方、FAS-13については、基板に斜めに形
成されているようで、被覆率は多少FAS-17に較べて劣る
と思われる。XPSによってもこの結果は確認された。
From these results, it is presumed that in FAS-17, molecules are integrated vertically to the substrate, and the integration rate is at a considerably high level. That is, a dense monomolecular film is formed. On the other hand, FAS-13 seems to be formed obliquely on the substrate, and the coverage is considered to be somewhat inferior to FAS-17. XPS confirmed this result.

【0028】フッ化アルキルシラン単分子膜は、フッ化
アルキルシラン分子同士および酸化シリコンとの間でシ
ロキサン結合(Si-O-Si)を形成し、シリコン基板表面に
共有結合で強く結合しており、機械的強度が強かった。
また、酸、アルカリ、有機溶剤に浸漬しても、化学的に
大変安定であった。
The fluorinated alkylsilane monomolecular film forms a siloxane bond (Si-O-Si) between the fluorinated alkylsilane molecules and with silicon oxide, and is strongly bonded to the silicon substrate surface by a covalent bond. , Mechanical strength was strong.
Further, it was chemically very stable even when immersed in an acid, alkali or organic solvent.

【0029】(実施例2)実施例1と同様の方法でシリ
コン基板表面を、まず紫外光(波長172nm)を用いて基板
洗浄し、有機不純物を除去し清浄表面にした。該基板表
面は自然酸化膜(SiO2)に覆われているので、基板表面に
は直ちに大気中の水蒸気が吸着して表面がOH基で覆われ
親水性表面になる。次に、親水化した該シリコン基板上
にFAS-17を化学気相蒸着法により100℃で2時間堆積
し、単分子膜を形成した。
(Example 2) In the same manner as in Example 1, the surface of the silicon substrate was first cleaned with ultraviolet light (wavelength 172 nm) to remove organic impurities to obtain a clean surface. Since the surface of the substrate is covered with a natural oxide film (SiO 2 ), water vapor in the air is immediately adsorbed on the surface of the substrate, and the surface is covered with OH groups to become a hydrophilic surface. Next, FAS-17 was deposited on the hydrophilized silicon substrate by chemical vapor deposition at 100 ° C. for 2 hours to form a monomolecular film.

【0030】石英ガラスにクロムの遮光薄膜を、5ミク
ロン幅10ミクロンピッチにパターン形成して、フォト
マスクとした。シリコン基板表面にフォトマスクを密着
させ、マスク越しに紫外光(波長172nm)を照射した。照
射強度は10mW/cm2で照射時間は10分間行った。光照射領
域では紫外光によってC-C結合が切断されるため、フッ
化アルキルシラン単分子膜が分解・除去される。
A light-shielding thin film of chromium was formed on quartz glass at a pitch of 5 μm and a pitch of 10 μm to form a photomask. A photomask was adhered to the surface of the silicon substrate, and ultraviolet light (wavelength: 172 nm) was irradiated through the mask. The irradiation intensity was 10 mW / cm 2 and the irradiation time was 10 minutes. In the light irradiation region, the CC bond is broken by ultraviolet light, so that the fluoroalkylsilane monomolecular film is decomposed and removed.

【0031】光照射領域で単分子膜が除去されたこと
は、AFMおよびLFMで確認された。LFMによる摩擦力の結
果から、単分子膜が除去された基板表面はSi-OHである
ことがわかった。この結果5ミクロン間隔で表面エネル
ギー16mN/mの撥水性領域と、80mN/mの親水性領域を、交
互に形成することができた。
It was confirmed by AFM and LFM that the monomolecular film was removed in the light irradiation area. From the results of the friction force by LFM, it was found that the substrate surface from which the monomolecular film had been removed was Si-OH. As a result, water-repellent regions having a surface energy of 16 mN / m and hydrophilic regions having a surface energy of 80 mN / m could be alternately formed at intervals of 5 μm.

【0032】(実施例3)実施例2でFAS-17パターニン
グしたシリコン基板上に、FAS-3を化学気相蒸着法によ
り100℃で2時間堆積した。 AFMおよびLFMの測定結果か
ら、FAS-17の単分子膜はそのまま残り、除去された領域
のみFAS-3の単分子膜が形成されていることが確認され
た。シリコン基板上に親水性と撥水性の領域、あるいは
摩擦の大きな領域と小さな領域を任意に作り出すことが
できた。
Example 3 FAS-3 was deposited at 100 ° C. for 2 hours by chemical vapor deposition on the FAS-17 patterned silicon substrate in Example 2. From the AFM and LFM measurement results, it was confirmed that the monolayer of FAS-17 was left as it was, and the monolayer of FAS-3 was formed only in the removed region. It was possible to arbitrarily create hydrophilic and water-repellent regions, or regions with large and small friction on the silicon substrate.

【0033】(実施例4)ガラス基板を酸素プラズマに
曝して洗浄し、親水化させた。ステンレス製真空閉容器
の中に、トリデカフルオロ-1,1,2,2-テトラヒドロオク
チルトリエトキシシランを入れたビーカーと親水化させ
たガラス基板を入れ、つぎに容器全体を電気炉中に置い
た。該フッ化アルキルシランの分子量は510.36、1.5mmH
gにおける沸点は86℃である。真空容器内を10Torrに減
圧し、温度を100℃まで上げ10分間保持するとフッ化
アルキルシランは蒸発して、基板上に化学気相蒸着し
た。
Example 4 A glass substrate was exposed to oxygen plasma for cleaning and hydrophilization. Place a beaker containing tridecafluoro-1,1,2,2-tetrahydrooctyltriethoxysilane and a hydrophilic glass substrate in a stainless steel vacuum container, and then place the entire container in an electric furnace. Was. The molecular weight of the fluorinated alkylsilane is 510.36, 1.5 mmH
The boiling point in g is 86 ° C. When the pressure in the vacuum vessel was reduced to 10 Torr, the temperature was raised to 100 ° C., and the temperature was maintained for 10 minutes, the fluorosilane was evaporated, and chemical vapor deposition was performed on the substrate.

【0034】表面エネルギーを水、ヨウ化メチレン、ヘ
キサデカンとの接触角から算出したところ25mN/mであ
り、単分子膜を形成しないSi-OHは75mN/mであった。実
施例1に比べ、単分子膜の密度が低いことが予想される
が、機械的耐久性・耐薬品性も十分に有り、通常の撥水
・撥油処理として工業的に使用できる。
The surface energy calculated from the contact angle with water, methylene iodide and hexadecane was 25 mN / m, and that of Si-OH which did not form a monomolecular film was 75 mN / m. Although it is expected that the density of the monomolecular film is lower than that of Example 1, it has sufficient mechanical durability and chemical resistance, and can be used industrially as ordinary water / oil repellent treatment.

【0035】(実施例5)ポリエチレンフィルムをまず
紫外光(波長172nm)を用いて基板洗浄し、清浄表面にし
た。紫外光は表面付近で吸収され、表面のみ親水化が起
こり、フィルム自体の物性はかわらなかった。フッ化ア
ルキルシランとして(トリデカフルオロ-1,1,2,2-テトラ
ヒドロオクチル)トリクロロシラン、(トリデカフルオロ
-1,1,2,2-テトラヒドロオクチル)メチルジクロロシラ
ン、(トリデカフルオロ-1,1,2,2-テトラヒドロオクチ
ル)ジメチルクロロシランを用意した。分子量はそれぞ
れ481.54、461.12、440.70で1気圧における沸点はそれ
ぞれ192-3℃、189-90℃、189-91℃である。テフロン製
密閉容器の中に、各フッ化アルキルシランを入れたビー
カーと親水化させたポリエチレンフィルムを入れ、つぎ
に容器全体を電気炉中に置いた。温度を80℃まで上げ1
時間間保持するとフッ化アルキルシランは蒸発して、フ
ィルム上に化学気相蒸着した。
Example 5 A polyethylene film was first cleaned with ultraviolet light (wavelength 172 nm) to obtain a clean surface. Ultraviolet light was absorbed near the surface, and only the surface was hydrophilized, and the physical properties of the film itself were not changed. (Tridecafluoro-1,1,2,2-tetrahydrooctyl) trichlorosilane, (tridecafluoro
-1,1,2,2-tetrahydrooctyl) methyldichlorosilane and (tridecafluoro-1,1,2,2-tetrahydrooctyl) dimethylchlorosilane were prepared. The molecular weights are 481.54, 461.12, and 440.70, respectively, and the boiling points at 1 atm are 192-3 ° C, 189-90 ° C, and 189-91 ° C, respectively. A beaker containing each fluorinated alkyl silane and a hydrophilic polyethylene film were placed in a Teflon sealed container, and then the entire container was placed in an electric furnace. Raise the temperature to 80 ° C 1
Upon holding for a period of time, the fluorinated alkylsilane evaporated and was deposited on the film by chemical vapor deposition.

【0036】各フッ化アルキルシランを堆積させたフィ
ルムの表面エネルギーを水、ヨウ化メチレン、ヘキサデ
カンとの接触角から算出したところどれも25mN/mであ
り、差異は認められなかった。単分子膜を形成しないポ
リエチレンフィルム表面(C-OHまたはC-OOH)は60mN/mで
あった。実施例1のSiO2上と比べ単分子膜の密度が低い
ことが予想されるが、機械的耐久性・耐薬品性も十分に
有り、通常の撥水・撥油処理として工業的に使用でき
る。
The surface energy of the film on which each of the fluoroalkylsilanes was deposited was calculated from the contact angles with water, methylene iodide, and hexadecane and found to be 25 mN / m, and no difference was observed. The polyethylene film surface (C-OH or C-OOH) that did not form a monomolecular film was 60 mN / m. Although the density of the monomolecular film is expected to be lower than that on the SiO2 of Example 1, it has sufficient mechanical durability and chemical resistance, and can be used industrially as ordinary water / oil repellent treatment.

【0037】(実施例6)ITO透明電極が成膜されたガ
ラス基板表面に紫外光(波長172nm)を照射して洗浄し、
親水化させた。トリデカフルオロ-1,1,2,2-テトラヒド
ロオクチルトリエトキシシランをインクジェットヘッド
から噴射させ、該ITO付きガラス基板上に10ピコリッ
トルづつ、140ミクロン間隔で散布した。ガラス製密
閉容器の中に該基板を1cmづつ間隔を開け、20枚重ね
て水平に置いた。密閉容器内の温度を180℃まで上げ2
時間保持するとフッ化アルキルシランは全て蒸発して、
各基板上に化学気相蒸着した。
(Example 6) The surface of a glass substrate on which an ITO transparent electrode was formed was irradiated with ultraviolet light (wavelength: 172 nm) for cleaning.
It was made hydrophilic. Tridecafluoro-1,1,2,2-tetrahydrooctyltriethoxysilane was jetted from an ink jet head and sprayed on the glass substrate with ITO in 10 picoliters at 140 micron intervals. The substrates were placed in a glass sealed container at intervals of 1 cm, and 20 substrates were stacked and placed horizontally. Raise the temperature in the sealed container to 180 ° C 2
When held for a while, all of the fluoroalkylsilane evaporates,
Chemical vapor deposition was performed on each substrate.

【0038】AFM、LEM、XPSにより単分子膜の形成を確
認し、実施例1におけるFAS-13と全く同じ単分子膜であ
ると同定された。表面エネルギーを水、ヨウ化メチレ
ン、ヘキサデカンとの接触角から算出したところ20mN/m
であり、単分子膜を形成しないITO表面(In-OHまたはSn-
OH)は70mN/mであった。
The formation of a monomolecular film was confirmed by AFM, LEM and XPS, and it was identified that the monomolecular film was exactly the same as FAS-13 in Example 1. When the surface energy was calculated from the contact angle with water, methylene iodide, and hexadecane, 20 mN / m
And an ITO surface that does not form a monomolecular film (In-OH or Sn-
OH) was 70 mN / m.

【0039】(実施例7)1ミクロン幅のアルミニウム
電極がパターン成膜された石英ガラス基板表面に紫外光
(波長172nm)を照射して、有機不純物を除去し清浄表面
にした。該アルミニウム電極表面は自然酸化膜(Al2O3)
に覆われているので、基板表面には直ちに大気中の水蒸
気が吸着して表面がOH基で覆われ親水性表面になる。ト
リデカフルオロ-1,1,2,2-テトラヒドロオクチルトリア
ミノシランをテトラリンに5重量部溶解させてインクジ
ェットヘッドから噴射させ、該アルミニウム電極付き石
英ガラス基板上に10ピコリットルづつ、70ミクロン
間隔で散布した。ガラス製密閉容器の中に該基板を1cm
づつ間隔を開け、20枚重ねて水平に置いた。密閉容器
内の温度を180℃まで上げ2時間保持するとフッ化アル
キルシランは全て蒸発して、各基板上に化学気相蒸着し
た。
Example 7 Ultraviolet light was applied to the surface of a quartz glass substrate on which an aluminum electrode having a width of 1 micron was patterned.
(Wavelength: 172 nm) to remove organic impurities to obtain a clean surface. The surface of the aluminum electrode is a natural oxide film (Al 2 O 3 )
Therefore, water vapor in the atmosphere is immediately adsorbed on the substrate surface, and the surface is covered with OH groups to become a hydrophilic surface. 5 parts by weight of tridecafluoro-1,1,2,2-tetrahydrooctyltriaminosilane is dissolved in tetralin and sprayed from an ink jet head, and sprayed on the quartz glass substrate with the aluminum electrode in 10 picoliters at 70 micron intervals. did. Place the substrate in a closed glass container 1cm
At intervals, 20 sheets were stacked and placed horizontally. When the temperature in the closed vessel was raised to 180 ° C. and held for 2 hours, all of the fluoroalkylsilane was evaporated and chemical vapor deposition was performed on each substrate.

【0040】AFM、LEM、XPSによりアルミニウム電極上
も石英ガラス上も単分子膜の形成を確認し、実施例1に
おけるFAS-13と全く同じ単分子膜であると同定された。
表面エネルギーを水、ヨウ化メチレン、ヘキサデカンと
の接触角から算出したところアルミニウム電極上も石英
ガラス上も20mN/mであった。
The formation of a monomolecular film on both the aluminum electrode and the quartz glass was confirmed by AFM, LEM and XPS, and it was identified that the monomolecular film was exactly the same as FAS-13 in Example 1.
The surface energy was calculated from the contact angles with water, methylene iodide, and hexadecane, and found to be 20 mN / m on both the aluminum electrode and the quartz glass.

【0041】該アルミニウム電極がパターン成膜された
石英ガラス基板の裏面から紫外光(波長172nm)を照射し
た。照射強度は10mW/cm2で照射時間は10分間行った。ア
ルミニウム電極上のフッ化アルキルシラン単分子膜はそ
のまま維持され、石英カラス表面のフッ化アルキルシラ
ン単分子膜のみが分解・除去された。
Ultraviolet light (wavelength: 172 nm) was irradiated from the back surface of the quartz glass substrate on which the aluminum electrode was patterned. The irradiation intensity was 10 mW / cm 2 and the irradiation time was 10 minutes. The monofluorinated alkylsilane monolayer on the aluminum electrode was maintained as it was, and only the monofluoroalkylsilane monolayer on the surface of the quartz crow was decomposed and removed.

【0042】3-アミノプロピルトリエトキシシランのエ
タノール溶液に、該パターニング基板を30分浸漬し、
80℃で1時間加熱した。その結果石英ガラス表面だけ
にアミノアルキルシランが形成され、安定的な親水表面
となった。アルミニウム電極上の1ミクロン幅の領域の
み、撥水性が維持された。
The patterning substrate was immersed in an ethanol solution of 3-aminopropyltriethoxysilane for 30 minutes,
Heated at 80 ° C. for 1 hour. As a result, aminoalkylsilane was formed only on the quartz glass surface, and the surface became a stable hydrophilic surface. Water repellency was maintained only in a 1 micron wide area on the aluminum electrode.

【0043】(実施例8)シリコン基板表面を、まず紫
外光(波長172nm)を用いて洗浄し、親水化させた後、ス
テンレス製真空閉容器の中に、パーフルオロオクチルト
リメトキシシランを入れたビーカーと親水化させたガラ
ス基板を入れ、つぎに容器全体を電気炉中に置いた。真
空容器内を100Torrに減圧し、温度を100℃まで上げ5分
間保持するとフッ化アルキルシランは蒸発して、基板上
に化学気相蒸着した。
Example 8 The surface of a silicon substrate was first washed with ultraviolet light (wavelength 172 nm) to make it hydrophilic, and then perfluorooctyltrimethoxysilane was placed in a vacuum container made of stainless steel. A beaker and a hydrophilic glass substrate were placed, and then the entire container was placed in an electric furnace. When the pressure in the vacuum vessel was reduced to 100 Torr, the temperature was raised to 100 ° C., and the temperature was maintained for 5 minutes, whereby the fluorosilane was evaporated, and chemical vapor deposition was performed on the substrate.

【0044】得られたフッ化アルキルシランの単分子膜
に対し、任意の位置に電子ビームを照射して、0.1ミク
ロンの幅で単分子膜の除去を行った。単分子膜は0.6nm
の膜厚であり、大変エッジ形状や 寸法精度良くパター
ニングできた。
An electron beam was applied to an arbitrary position on the obtained monomolecular film of fluorinated alkylsilane to remove the monomolecular film with a width of 0.1 μm. 0.6 nm for monolayer
The patterning was very good with edge shape and dimensional accuracy.

【0045】パターニングした該シリコン基板上に、
トリメチルクロロシランを化学気相蒸着法により、大気
圧下80℃で1時間堆積した。 トリメチルシリル基は除
去された部分にのみ形成され、シリコン基板上に親油性
と撥油性の領域、あるいは摩擦の大きな領域と小さな領
域を任意に作り出すことができた。
On the patterned silicon substrate,
Trimethylchlorosilane was deposited for 1 hour at 80 ° C. under atmospheric pressure by chemical vapor deposition. The trimethylsilyl group was formed only in the removed portion, and a lipophilic and oleophobic region, or a region with large friction and a region with small friction could be arbitrarily created on the silicon substrate.

【0046】(実施例9)シリコン基板表面を、まず紫
外光(波長172nm)を用いて基板洗浄し、有機不純物を除
去し清浄表面にした。該基板表面は自然酸化膜(SiO2)に
覆われているので、基板表面には直ちに大気中の水蒸気
が吸着して表面がOH基で覆われ親水性表面になる。次
に、親水化した該シリコン基板上にFAS-17を化学気相蒸
着法により100℃で2時間堆積し、単分子膜を形成し
た。
Example 9 The surface of a silicon substrate was first cleaned using ultraviolet light (wavelength: 172 nm) to remove organic impurities to obtain a clean surface. Since the surface of the substrate is covered with a natural oxide film (SiO 2 ), water vapor in the air is immediately adsorbed on the surface of the substrate, and the surface is covered with OH groups to become a hydrophilic surface. Next, FAS-17 was deposited on the hydrophilized silicon substrate by chemical vapor deposition at 100 ° C. for 2 hours to form a monomolecular film.

【0047】石英ガラスにクロムの遮光薄膜を、0.3
ミクロン幅1ミクロンピッチにパターン形成して、フォ
トマスクとした。シリコン基板表面にフォトマスクを密
着させ、マスク越しに紫外光(波長172nm)を照射した。
照射強度は10mW/cm2で照射時間は10分間行った。光照射
領域では紫外光によってC-C結合が切断されるため、フ
ッ化アルキルシラン単分子膜が分解・除去される。
A chrome light-shielding thin film of 0.3%
A pattern was formed with a micron width of 1 micron pitch to obtain a photomask. A photomask was adhered to the surface of the silicon substrate, and ultraviolet light (wavelength: 172 nm) was irradiated through the mask.
The irradiation intensity was 10 mW / cm 2 and the irradiation time was 10 minutes. In the light irradiation region, the CC bond is broken by ultraviolet light, so that the fluoroalkylsilane monomolecular film is decomposed and removed.

【0048】光照射領域で単分子膜が除去されたこと
は、AFMおよびLFMで確認された。LFMによる摩擦力の結
果から、単分子膜が除去された基板表面はSi-OHである
ことがわかった。この結果サブミクロンの精度で表面エ
ネルギー16mN/mの撥水性領域と、80mN/mの親水性領域
を、交互に形成することができた。
It was confirmed by AFM and LFM that the monomolecular film was removed in the light irradiation area. From the results of the friction force by LFM, it was found that the substrate surface from which the monomolecular film had been removed was Si-OH. As a result, a water-repellent region having a surface energy of 16 mN / m and a hydrophilic region having a surface energy of 80 mN / m were formed alternately with submicron accuracy.

【0049】(実施例10)実施例9でFAS-17パターニン
グしたシリコン基板上を、0.5%のフッ酸エッチング液
に浸漬した。シリコン表面の自然酸化膜(SiO2)は厚みが
2nmであり、エッチング速度は5nm/minであるので、浸
漬時間は30秒間とした。 FAS-17単分子膜がエッチン
グ液のダメージを受け、下地が露出するまでには10分
以上を要するため、リソグラフィ用レジスト膜として十
分に機能した。
Example 10 The silicon substrate subjected to FAS-17 patterning in Example 9 was immersed in a 0.5% hydrofluoric acid etching solution. Since the native oxide film (SiO 2 ) on the silicon surface has a thickness of 2 nm and an etching rate of 5 nm / min, the immersion time was 30 seconds. The FAS-17 monomolecular film was damaged by the etchant, and it took more than 10 minutes for the underlayer to be exposed, so that it functioned sufficiently as a resist film for lithography.

【0050】エッチングの結果、0.3ミクロン幅1ミ
クロンピッチのパターンで、シリコン表面の自然酸化膜
(SiO2)を除去できた。
As a result of the etching, a natural oxide film on the silicon surface is formed in a pattern of 0.3 micron width and 1 micron pitch.
(SiO 2 ) could be removed.

【0051】[0051]

【発明の効果】以上述べたように本発明により、稠密な
単分子膜を簡便な方法で基板上に自己集積させる方法を
提供できた。該基板表面は金のような特殊なものではな
く、ある程度一般的にみられるような性質を持つものに
対し、有機単分子膜を形成できた。生産性が高く、特に
インクジェット法を用いるとフッ化アルキルシランの使
用量が最小限で済み、大変効率がよかった。また本発明
により有機単分子膜を精度良く、簡便な方法でパターニ
ングする方法を提供できた。それにより基板上に親水性
と撥水性の領域、あるいは摩擦の大きな領域と小さな領
域を任意に作り出すことができた。またパターニングし
たフッ化アルキルシランをリソグラフィ用レジスト膜と
して応用することができた。
As described above, according to the present invention, a method of self-assembling a dense monomolecular film on a substrate by a simple method can be provided. An organic monomolecular film could be formed on the surface of the substrate, which is not a special material such as gold but has a property generally observed to some extent. The productivity was high, and especially when the ink jet method was used, the use amount of the fluoroalkylsilane was minimized, and the efficiency was very good. Further, the present invention has provided a method of patterning an organic monomolecular film with high accuracy and a simple method. As a result, it was possible to arbitrarily create hydrophilic and water-repellent regions, or regions with large and small friction on the substrate. In addition, the patterned fluoroalkylsilane could be applied as a resist film for lithography.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の実施例1におけるフッ化アルキル
シラン単分子表面を模式的に示す断面図である。
FIG. 1 is a cross-sectional view schematically showing a monomolecular surface of a fluorinated alkylsilane in Example 1 of the present invention.

【図2】 本発明の実施例1における化学気相蒸着装
置の概容を示す断面図である。
FIG. 2 is a cross-sectional view illustrating an outline of a chemical vapor deposition apparatus according to Embodiment 1 of the present invention.

【図3】 本発明の実施例1におけるフッ化アルキル
シランの堆積時間と膜厚との関係を示す図である。
FIG. 3 is a diagram showing the relationship between the deposition time of fluorinated alkylsilane and the film thickness in Example 1 of the present invention.

【図4】 本発明の実施例1における LEMの測定原理を
示す図である。
FIG. 4 is a diagram showing a measurement principle of an LEM in the first embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1…テフロン製密閉容器 2…ビーカー 3…フッ化アルキルシラン 4…シリコン基板 5…ヒーター DESCRIPTION OF SYMBOLS 1 ... Teflon closed container 2 ... Beaker 3 ... Fluoroalkylsilane 4 ... Silicon substrate 5 ... Heater

───────────────────────────────────────────────────── フロントページの続き (72)発明者 杉村 博之 愛知県名古屋市北区名城3−1 名城住宅 9−609 Fターム(参考) 2H096 AA30 BA09 BA13 CA01 CA03 CA17 CA20 EA02 FA04 HA23 4K030 AA04 AA06 AA09 CA04 CA07 DA03 EA01 FA10  ────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Hiroyuki Sugimura 3-1 Meijo Housing, Kita-ku, Nagoya-shi, Aichi 9-609 F-term (reference) 2H096 AA30 BA09 BA13 CA01 CA03 CA17 CA20 EA02 FA04 HA23 4K030 AA04 AA06 AA09 CA04 CA07 DA03 EA01 FA10

Claims (11)

【特許請求の範囲】[Claims] 【請求項1】基板をあらかじめ何らかの方法で洗浄した
後、該表面を親水化させて、フッ化アルキルシランの単
分子膜を該基板上に化学気相蒸着法で形成することを特
徴とする有機単分子膜の形成方法。
1. An organic method comprising: washing a substrate in advance by any method; hydrophilizing the surface thereof; and forming a monomolecular film of fluorinated alkylsilane on the substrate by a chemical vapor deposition method. A method for forming a monomolecular film.
【請求項2】基板を紫外線あるいは酸素プラズマ処理に
より洗浄することを特徴とする請求項1に記載の有機単
分子膜の形成方法。
2. The method for forming an organic monomolecular film according to claim 1, wherein the substrate is washed by ultraviolet or oxygen plasma treatment.
【請求項3】下記一般式(I)で表されるケイ素化合物
を用いて、基板上に化学気相蒸着法でフッ化アルキルシ
ランの単分子膜を形成することを特徴とする請求項1に
記載の有機単分子膜の形成方法。 Cn2n+1-Cm2m-Si-X3 (I) (ここでnは1以上の整数を表し、mは0および1以上
の整数を表し、Xはアルコキシ基またはアミノ基または
ハロゲン原子を表す。なおX3は一部水素原子を含むア
ルキル基で置換されていてもよい)
3. The method according to claim 1, wherein a monomolecular film of fluorinated alkylsilane is formed on a substrate by a chemical vapor deposition method using a silicon compound represented by the following general formula (I). The method for forming an organic monomolecular film according to the above. C n F 2n + 1 -C m H 2m -Si-X 3 (I) ( wherein n represents an integer of 1 or more, m represents 0 and an integer of 1 or more, X is an alkoxy group or an amino group, or Represents a halogen atom, wherein X 3 may be partially substituted with an alkyl group containing a hydrogen atom.
【請求項4】化学気相蒸着法を大気圧下、あるいは1Tor
r以下の大気圧に近い減圧雰囲気化で行うことを特徴と
する請求項1に記載の有機単分子膜の形成方法。
4. The method according to claim 1, wherein the chemical vapor deposition is performed under atmospheric pressure or 1 Torr.
The method for forming an organic monomolecular film according to claim 1, wherein the method is performed in a reduced pressure atmosphere close to the atmospheric pressure of r or less.
【請求項5】化学気相蒸着法を200℃以下の温度で行う
ことを特徴とする請求項4に記載の有機単分子膜の形成
方法。
5. The method according to claim 4, wherein the chemical vapor deposition is performed at a temperature of 200 ° C. or less.
【請求項6】一般式(I)で表されるケイ素化合物また
はその溶媒希釈溶液の適量をインクジェット法であらか
じめ基板上に微細に散布しておき,それを蒸発させて基
板全面に化学気相蒸着することを特徴とする請求項1か
ら5いずれか記載の有機単分子膜の形成方法。
6. An appropriate amount of a silicon compound represented by the general formula (I) or a diluted solution of a solvent thereof is finely dispersed on a substrate in advance by an ink-jet method, and is evaporated to be chemically vapor-deposited on the entire surface of the substrate. The method for forming an organic monomolecular film according to any one of claims 1 to 5, wherein:
【請求項7】酸素を含む雰囲気下で紫外線を照射し、フ
ッ化アルキルシランの単分子膜を除去することを特徴と
する有機単分子膜のパターニング方法。
7. A method for patterning an organic monomolecular film, comprising irradiating ultraviolet light in an atmosphere containing oxygen to remove the monomolecular film of fluorinated alkylsilane.
【請求項8】マスクを用いて所望の領域のみに紫外線を
照射し、単分子膜を除去することを特徴とする請求項7
項記載の有機単分子膜のパターニング方法。
8. A monomolecular film is removed by irradiating only a desired region with ultraviolet light using a mask.
The method for patterning an organic monomolecular film according to the above item.
【請求項9】電子ビームを用いて、フッ化アルキルシラ
ンの単分子膜を除去することを特徴とする有機単分子膜
のパターニング方法。
9. A method for patterning an organic monomolecular film, comprising removing a monomolecular film of fluorinated alkylsilane using an electron beam.
【請求項10】単分子膜を除去した後、フッ素原子を含
有しないケイ素化合物を吸着させることを特徴とする請
求項7から9いずれか記載の有機単分子膜のパターニン
グ方法。
10. The method for patterning an organic monomolecular film according to claim 7, wherein after removing the monomolecular film, a silicon compound containing no fluorine atom is adsorbed.
【請求項11】パターニングで残したフッ化アルキルシ
ランの単分子膜を、レジスト膜としてエッチングストッ
パーに用いることを特徴とするリソグラフィ方法。
11. A lithography method characterized in that a monomolecular film of fluorinated alkylsilane left by patterning is used as an etching stopper as a resist film.
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