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JP2000019201A - Source voltage detection circuit - Google Patents

Source voltage detection circuit

Info

Publication number
JP2000019201A
JP2000019201A JP8277971A JP27797196A JP2000019201A JP 2000019201 A JP2000019201 A JP 2000019201A JP 8277971 A JP8277971 A JP 8277971A JP 27797196 A JP27797196 A JP 27797196A JP 2000019201 A JP2000019201 A JP 2000019201A
Authority
JP
Japan
Prior art keywords
power supply
voltage
nmos
detection
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8277971A
Other languages
Japanese (ja)
Inventor
Jun Onishi
潤 大西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Citizen Watch Co Ltd
Original Assignee
Citizen Watch Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Citizen Watch Co Ltd filed Critical Citizen Watch Co Ltd
Priority to JP8277971A priority Critical patent/JP2000019201A/en
Priority to PCT/JP1997/001007 priority patent/WO1997036181A1/en
Publication of JP2000019201A publication Critical patent/JP2000019201A/en
Pending legal-status Critical Current

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  • Measurement Of Current Or Voltage (AREA)

Abstract

PROBLEM TO BE SOLVED: To make the circuit scale preventable from being enlarged and becom ing complicate by connecting a variable resistance adjustment means and a detection voltage selection means in series between power sources and connecting a waveform-shaping means to a connection point of the variable resistance adjustment means and the detection voltage selection means. SOLUTION: When an L, H control signal 124 is inputted to a gate of a PMOS 121, a detection voltage selection means 12 is selected, or not selected respectively and an L, H output is generated from a waveform-shaping circuit 13 depending on which of a source voltage and a detection voltage is larger. When a control signal 125 is H and an NMOS 123 is on, the PMOS 121 is turned off by the H control signal 124. Detection resistors Rx-Rz do not divide a voltage between the ground and a power source, impressing a signal which is L to a source voltage VSS to a gate of an NMOS 122 and turning off the NMOS, whereby a resistance of the NMOS is infinitely large. The H control signal 2 is impressed to the NMOS 123 to turn on the NMOS to invalidate the resistor Rz. At this time, if the L control signal 124 is input, the PMOS 121 is turned on and the NMOS 122 becomes a resistance body dependent on the source voltage.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、太陽電池に代表さ
れる発電素子を電源とした時計用ICにおいて電源電圧
の変化を検出する電源電圧検出回路の構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a power supply voltage detecting circuit for detecting a change in a power supply voltage in a timepiece IC using a power generating element represented by a solar cell as a power supply.

【0002】[0002]

【従来の技術】従来例では、電源電圧の電圧状態を使用
者に知らせる手段として、電池等の電源電圧の状態を電
源電圧検出回路で検出し、外部の表示素子等に表示する
方法がある。図2は従来例の電源電圧検出回路の構成を
示すブロック図である。
2. Description of the Related Art In a conventional example, as a means for informing a user of a voltage state of a power supply voltage, there is a method of detecting a power supply voltage state of a battery or the like by a power supply voltage detection circuit and displaying the state on an external display element or the like. FIG. 2 is a block diagram showing a configuration of a conventional power supply voltage detection circuit.

【0003】図2に示す従来例の電源電圧検出回路は、
一つの電源の電圧変化を検出する構成であり、従来例の
電源電圧検出回路は可変抵抗調整手段31と検出電圧選
択手段32と波形整形手段33と可変抵抗制御信号出力
手段34で構成している。
The conventional power supply voltage detection circuit shown in FIG.
This is a configuration for detecting a voltage change of one power supply. The conventional power supply voltage detection circuit includes a variable resistance adjustment unit 31, a detection voltage selection unit 32, a waveform shaping unit 33, and a variable resistance control signal output unit 34. .

【0004】図2に示す従来例の電源電圧検出回路を構
成する可変抵抗手段31の内部構成は、基準抵抗R0と
n個の調整抵抗R1〜Rnとn個のP型電解効果トラン
ジスタ(以下PMOSと記載する)311〜31nとで
構成している。
The internal structure of the variable resistance means 31 constituting the power supply voltage detection circuit of the conventional example shown in FIG. 2 is composed of a reference resistance R0, n adjustment resistances R1 to Rn, and n P-type field effect transistors (hereinafter referred to as PMOS). 311 to 31n).

【0005】図3に示す従来例の電源電圧検出回路を構
成する検出電圧選択手段32の内部構成は、第1の検出
電圧抵抗Rxと第2の検出電圧抵抗RyとPMOS32
1とN型電解効果トランジスタ(以下NMOSと記載す
る)322とで構成している。
The internal structure of the detection voltage selection means 32 constituting the power supply voltage detection circuit of the prior art shown in FIG. 3 is composed of a first detection voltage resistance Rx, a second detection voltage resistance Ry, and a PMOS 32.
1 and an N-type field effect transistor (hereinafter referred to as NMOS) 322.

【0006】図2に示す従来例の電源電圧検出回路を構
成する可変抵抗制御信号出力手段34の内部構成は、m
個の外部入力端子と、m個の入力端子とn個の制御信号
出力端子O1〜Onをもつデコード回路とで構成してい
る。このときmとnは正の整数でかつmとnの関係はn
=2mである。可変抵抗調整手段31は、基準抵抗R0
とn個の調整抵抗R1〜Rnとは直列に接続し、基準抵
抗R0は調整抵抗Rnの後に接続している。また調整抵
抗R1の解放側の一方の端子と調整抵抗R1〜Rnが直
列に接続する接続点とには、ソース端子を接地電圧に接
続しゲート端子を制御信号1〜nに接続するPMOS3
11〜31nのドレイン端子が接続している。
The internal configuration of the variable resistance control signal output means 34 constituting the power supply voltage detection circuit of the conventional example shown in FIG.
And a decode circuit having m input terminals and n control signal output terminals O1 to On. At this time, m and n are positive integers and the relationship between m and n is n
= 2m. The variable resistance adjusting means 31 includes a reference resistance R0
And n adjustment resistors R1 to Rn are connected in series, and the reference resistor R0 is connected after the adjustment resistor Rn. A PMOS3 that connects the source terminal to the ground voltage and the gate terminal to the control signals 1 to n is connected to one terminal on the release side of the adjustment resistor R1 and the connection point where the adjustment resistors R1 to Rn are connected in series.
Drain terminals 11 to 31n are connected.

【0007】また検出電圧選択手段32は、PMOS3
21のソース端子を接地電圧に接続し、PMOS321
のドレイン端子を第1の検出電圧抵抗Rxの一方の端子
に接続し、第1の検出抵抗Rxの他方の端子を第2の検
出電圧抵抗Ryの一方の端子とソース端子を電源電圧に
接続するNMOS322のゲート端子とに接続し、第2
の検出電圧抵抗Ryの他方の端子を電源電圧に接続して
いる。
The detection voltage selection means 32 is a PMOS3
21 is connected to the ground voltage,
Is connected to one terminal of a first detection voltage resistor Rx, and the other terminal of the first detection resistor Rx is connected to one terminal and a source terminal of a second detection voltage resistor Ry to a power supply voltage. Connected to the gate terminal of the NMOS 322,
The other terminal of the detection voltage resistor Ry is connected to the power supply voltage.

【0008】またPMOS221のゲート端子は選択制
御信号に接続し、可変抵抗調整手段31を構成する基準
抵抗R0の他方の端子は検出電圧選択手段32を構成す
るNMOS322のドレイン端子と波形整形回路33の
入力端子に接続している。
The gate terminal of the PMOS 221 is connected to the selection control signal, and the other terminal of the reference resistor R 0 constituting the variable resistance adjusting means 31 is connected to the drain terminal of the NMOS 322 constituting the detection voltage selecting means 32 and the waveform shaping circuit 33. Connected to input terminal.

【0009】また可変抵抗制御信号出力手段34は、外
部入力端子をデコード回路341の入力端子に接続し、
デコード回路341の出力端子O1〜Onは可変抵抗調
整手段31を構成するPMOS311〜31nのゲート
端子に接続している。
The variable resistance control signal output means 34 connects an external input terminal to an input terminal of a decode circuit 341,
Output terminals O1 to On of the decode circuit 341 are connected to gate terminals of PMOSs 311 to 31n constituting the variable resistance adjusting means 31.

【0010】つぎに図2に示す従来例の電源電圧検出回
路の動作を説明する。従来例の電源電圧検出回路は検出
電圧選択手段32を構成するPMOS321を選択制御
信号により導通し、接地−電源間の電圧を第1の検出抵
抗Rxと第2の検出抵抗Ryとで分割して、その分割電
圧をNMOS322のゲート端子に印加する。
Next, the operation of the conventional power supply voltage detecting circuit shown in FIG. 2 will be described. In the conventional power supply voltage detection circuit, the PMOS 321 constituting the detection voltage selection means 32 is turned on by a selection control signal, and the voltage between the ground and the power supply is divided by the first detection resistor Rx and the second detection resistor Ry. The divided voltage is applied to the gate terminal of the NMOS 322.

【0011】また可変抵抗手段31を構成するPMOS
311〜31nはそれぞれのゲート端子に制御信号1〜
nを入力することで選択的に導通し、調整抵抗R1〜R
nを選択的に接地電圧に接続する。そのことにより可変
抵抗手段31は可変が可能な調整抵抗R1〜Rnと基準
抵抗R0とを直列に接続することで抵抗値を可変するこ
とが可能となる。
The PMOS constituting the variable resistance means 31
311 to 31n are control signals 1 to 3 at their gate terminals.
n is selectively turned on by inputting n.
n is selectively connected to a ground voltage. Thus, the variable resistance means 31 can change the resistance value by connecting the variable resistances R1 to Rn and the reference resistance R0 in series.

【0012】NMOS322はゲート端子に印加する電
圧が小さくなるとNMOS322のオン抵抗が大きくな
る特性を利用し、電源電圧が希望する検出電圧になった
ときに波形整形回路2の出力が反転するように、PMO
S311〜31nそれぞれのゲート端子に入力する制御
信号1〜nを設定する。
The NMOS 322 utilizes the characteristic that the on-resistance of the NMOS 322 increases when the voltage applied to the gate terminal decreases, so that the output of the waveform shaping circuit 2 is inverted when the power supply voltage reaches a desired detection voltage. PMO
The control signals 1 to n input to the respective gate terminals of S311 to S31n are set.

【0013】また可変抵抗制御信号出力手段34を構成
するデコード回路341は外部入力端子から設定信号を
入力することで、設定信号をデコードし、その結果をデ
コード回路出力端子O1〜Onの出力信号を設定する。
A decoding circuit 341 constituting the variable resistance control signal output means 34 receives a setting signal from an external input terminal, decodes the setting signal, and outputs the result to the output signals of the decoding circuit output terminals O1 to On. Set.

【0014】また本電源電圧検出回路は半導体基板上に
形成するため、半導体装置の製造上のバラツキにより検
出電圧が変化するが、可変抵抗手段31で調整すること
で検出電圧の精度を上げることもできる。
Since the power supply voltage detection circuit is formed on a semiconductor substrate, the detection voltage varies due to variations in the manufacture of the semiconductor device. However, the accuracy of the detection voltage can be improved by adjusting the variable resistance means 31. it can.

【0015】[0015]

【発明が解決しようとする課題】しかしながら従来例の
電源電圧検出回路の検出電圧選択手段の構成では、可変
抵抗調整手段の抵抗値を固定した後は検出電圧も同様に
1値に固定してしまうため、複数の電圧を検出するに
は、従来例の構成の検出回路をそれぞれ用意しなければ
ならず、回路規模が大きくなるという以下に示すような
問題がある。
However, in the configuration of the detection voltage selection means of the conventional power supply voltage detection circuit, after the resistance value of the variable resistance adjustment means is fixed, the detection voltage is similarly fixed at one value. Therefore, in order to detect a plurality of voltages, it is necessary to prepare a detection circuit having a configuration of the related art, and there is a problem described below that the circuit scale becomes large.

【0016】論理ゲートの消費電力は論理ゲートの入力
信号のスイッチング毎に消費し、論理ゲート数に比例し
て増加する。
The power consumption of a logic gate is consumed every time an input signal of the logic gate is switched, and increases in proportion to the number of logic gates.

【0017】従来の電源電圧検出回路を半導体集積回路
に複数集積すると、回路規模が増大するため半導体集積
回路のチップ面積が大きくなり、ウェハーあたりの半導
体集積回路の取り個数が低下し、また歩留まりの低下を
招く。
When a plurality of conventional power supply voltage detection circuits are integrated in a semiconductor integrated circuit, the circuit scale increases, the chip area of the semiconductor integrated circuit increases, the number of semiconductor integrated circuits per wafer decreases, and the yield decreases. Causes a decline.

【0018】本発明の目的は上記課題を解決して、回路
規模がさほど大きくならず、また回路が複雑にならずに
複数の電圧を検出する電源電圧検出回路を提供すること
である。
An object of the present invention is to solve the above-mentioned problems and to provide a power supply voltage detection circuit for detecting a plurality of voltages without increasing the circuit scale and the circuit complexity.

【0019】また半導体集積回路に集積してもチップ面
積がさほど大きくならず、ウェハーあたりの半導体集積
回路の取り個数が低下し、また歩留まりの低下を招くこ
とのない電源電圧検出回路を提供することである。
Further, it is an object of the present invention to provide a power supply voltage detecting circuit which does not cause a large chip area even when integrated on a semiconductor integrated circuit, reduces the number of semiconductor integrated circuits per wafer, and does not reduce the yield. It is.

【0020】[0020]

【課題を解決するための手段】本電源電圧検出回路の構
成は、電源間に可変抵抗調整手段と検出電圧選択手段を
直列に接続し、可変抵抗調整手段と検出電圧選択手段の
接続点に波形整形手段を接続し、可変抵抗調整手段は電
源VDDと電源電圧選択手段の間に、一端をPMOSの
ドレインを接続した抵抗体を少なくとも1つ以上直列に
接続し、該PMOSソースにVDDに接続し、ゲートに
制御信号を入力し、電圧選択手段はソースをVDDに接
続し、ゲートに電圧選択信号を入力したPMOSと、ド
レインを可変抵抗調整手段に接続し、ソースを電源VS
Sに接続したNMOSと、一端を該NMOSゲートに接
続し他端を該PMOSのドレインに接続した抵抗体と、
一端を該NMOSのゲートに接続し他端とVSSの間
に、ソースをVSSに接続し、ゲートに第2の電圧選択
信号を入力し、ドレインを抵抗の一端に接続したNMO
Sを少なくとも1つ以上直列に接続した抵抗体で構成す
る事を特徴とする。
The configuration of the power supply voltage detection circuit is such that a variable resistance adjustment means and a detection voltage selection means are connected in series between power supplies, and a waveform is provided at a connection point between the variable resistance adjustment means and the detection voltage selection means. The shaping means is connected, and the variable resistance adjusting means connects at least one resistor having one end connected to the drain of the PMOS in series between the power supply VDD and the power supply voltage selecting means, and connects the PMOS source to VDD. , The control signal is input to the gate, the voltage selection means connects the source to VDD, the PMOS having the gate input the voltage selection signal, the drain is connected to the variable resistance adjustment means, and the source is the power supply VS.
An NMOS connected to S, a resistor having one end connected to the NMOS gate and the other end connected to the drain of the PMOS,
An NMO having one end connected to the gate of the NMOS, a source connected to VSS between the other end and VSS, a second voltage selection signal input to the gate, and a drain connected to one end of the resistor
It is characterized in that S is constituted by at least one or more resistors connected in series.

【0021】検出電圧選択手段において抵抗体とNMO
Sを並列に接続し、NMOSを制御信号によりVSSに
短絡することで、抵抗体の抵抗値を無効化することがで
きる。
In the detection voltage selection means, a resistor and an NMO
By connecting S in parallel and short-circuiting the NMOS to VSS by a control signal, the resistance value of the resistor can be nullified.

【0022】[0022]

【発明の実施の形態】電源間に可変抵抗調整手段と検出
電圧選択手段を直列に接続し、可変抵抗調整手段と検出
電圧選択手段の接続点に波形整形手段を接続することを
特徴とした電源電圧検出回路である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A power supply wherein variable resistance adjusting means and detection voltage selecting means are connected in series between power supplies, and a waveform shaping means is connected to a connection point between the variable resistance adjusting means and detection voltage selecting means. It is a voltage detection circuit.

【0023】[0023]

【実施例】図1は本発明の電源電圧回路の構成を示すブ
ロック図である。まずはじめに図1を用いて電源電圧検
出回路の回路構成について説明する。
FIG. 1 is a block diagram showing a configuration of a power supply voltage circuit according to the present invention. First, the circuit configuration of the power supply voltage detection circuit will be described with reference to FIG.

【0024】図1に示す本発明の電源電圧検出回路は、
2つの電源の電圧変化を検出する構成であり、本発明の
電源電圧検出回路は可変抵抗調整手段11と検出電圧選
択手段12と波形整形手段13と可変抵抗制御信号出力
手段14で構成している。
The power supply voltage detection circuit of the present invention shown in FIG.
The power supply voltage detection circuit according to the present invention includes a variable resistance adjustment unit 11, a detection voltage selection unit 12, a waveform shaping unit 13, and a variable resistance control signal output unit 14. .

【0025】図1に示す本発明の電源電圧検出回路を構
成する可変抵抗手段11の内部構成は、基準抵抗R0と
n個の調整抵抗R1〜Rnとn個のP型電解効果トラン
ジスタ(以下PMOSと記載する)111〜11nとで
構成している。
The internal structure of the variable resistor means 11 constituting the power supply voltage detecting circuit of the present invention shown in FIG. 1 is composed of a reference resistor R0, n adjusting resistors R1 to Rn, and n P-type field effect transistors (hereinafter referred to as PMOS transistors). 111-11n).

【0026】図1に示す本発明の電源電圧検出回路を構
成する検出電圧選択手段12の内部構成は、第1の検出
電圧抵抗Rxと第2の検出電圧抵抗Ryと第3の検出電
圧抵抗RzとPMOS121とN型電解効果トランジス
タ(以下NMOSと記載する)122と第2のNMOS
とで構成している。
The internal configuration of the detection voltage selection means 12 constituting the power supply voltage detection circuit of the present invention shown in FIG. 1 includes a first detection voltage resistor Rx, a second detection voltage resistor Ry, and a third detection voltage resistor Rz. , PMOS 121, N-type field effect transistor (hereinafter referred to as NMOS) 122, and second NMOS
It consists of:

【0027】図1に示す本発明の電源電圧検出回路を構
成する可変抵抗制御信号出力手段14の内部構成は、m
個の外部入力端子と、m個の入力端子とn個の制御信号
出力端子O1〜Onをもつデコード回路とで構成してい
る。このときmとnは正の整数でかつmとnの関係はn
=2mである。可変抵抗調整手段11は、基準抵抗R0
とn個の調整抵抗R1〜Rnとは直列に接続し、基準抵
抗R0は調整抵抗Rnの後に接続している。また調整抵
抗R1の解放側の一方の端子と調整抵抗R1〜Rnが直
列に接続する接続点とには、ソース端子を接地電圧に接
続しゲート端子を制御信号1〜nに接続するPMOS1
11〜11nのドレイン端子が接続している。
The internal configuration of the variable resistance control signal output means 14 constituting the power supply voltage detection circuit of the present invention shown in FIG.
And a decode circuit having m input terminals and n control signal output terminals O1 to On. At this time, m and n are positive integers and the relationship between m and n is n
= 2m. The variable resistance adjusting means 11 includes a reference resistance R0
And n adjustment resistors R1 to Rn are connected in series, and the reference resistor R0 is connected after the adjustment resistor Rn. A PMOS1 that connects the source terminal to the ground voltage and the gate terminal to the control signals 1 to n is connected to one terminal on the release side of the adjustment resistor R1 and the connection point where the adjustment resistors R1 to Rn are connected in series.
Drain terminals 11 to 11n are connected.

【0028】また検出電圧選択手段12は、PMOS1
21のソース端子を接地電圧に接続し、PMOS121
のドレイン端子を第1の検出電圧抵抗Rxの一方の端子
に接続し、第1の検出抵抗Rxの他方の端子を第2の検
出電圧抵抗Ryの一方の端子とソース端子を電源電圧に
接続するNMOS122のゲート端子とに接続し、第2
の検出電圧抵抗Ryの他方の端子を第3の検出電圧抵抗
Rzの一方の端子に接続し、第3の検出電圧抵抗Rzの
他方の端子をVSSに接続し、第2のNMOS123の
ドレイン端子を第2の検出電圧抵抗Ryと第3の検出電
圧抵抗の接続点に接続し、第2のNMOS123のソー
ス端子をVSSに接続し、電源電圧に接続している。
The detection voltage selection means 12 is a PMOS
21 is connected to the ground voltage and the PMOS 121
Is connected to one terminal of the first detection voltage resistor Rx, and the other terminal of the first detection resistor Rx is connected to one terminal and the source terminal of the second detection voltage resistor Ry to the power supply voltage. Connected to the gate terminal of the NMOS 122;
The other terminal of the detection voltage resistor Ry is connected to one terminal of the third detection voltage resistor Rz, the other terminal of the third detection voltage resistor Rz is connected to VSS, and the drain terminal of the second NMOS 123 is connected to The second detection voltage resistor Ry is connected to the connection point of the third detection voltage resistor, the source terminal of the second NMOS 123 is connected to VSS, and is connected to the power supply voltage.

【0029】またPMOS121のゲート端子は第1の
選択制御信号124に接続し、第2のNMOS123の
ゲート端子は第2の選択制御信号125に接続し、可変
抵抗調整手段11を構成する基準抵抗R0の他方の端子
は検出電圧選択手段12を構成する第1のNMOS12
2のドレイン端子と波形整形回路13の入力端子に接続
している。
The gate terminal of the PMOS 121 is connected to the first selection control signal 124, the gate terminal of the second NMOS 123 is connected to the second selection control signal 125, and the reference resistance R0 constituting the variable resistance adjusting means 11 is connected. Is connected to a first NMOS 12 which constitutes the detection voltage selection means 12.
2 and the input terminal of the waveform shaping circuit 13.

【0030】また可変抵抗制御信号出力手段14は、外
部入力端子をデコード回路141の入力端子に接続し、
デコード回路141の出力端子O1〜Onは可変抵抗調
整手段11を構成するPMOS111〜11nのゲート
端子に接続している。
The variable resistance control signal output means 14 connects an external input terminal to an input terminal of the decode circuit 141,
Output terminals O1 to On of the decode circuit 141 are connected to gate terminals of PMOSs 111 to 11n constituting the variable resistance adjusting means 11.

【0031】つぎに図1に示す本発明の電源電圧検出回
路の動作について説明する。まず検出電圧選択手段12
を構成する第2の制御信号125が“ロー”で第2のN
MOS123が絶縁している場合について説明する。
Next, the operation of the power supply voltage detecting circuit of the present invention shown in FIG. 1 will be described. First, the detection voltage selection means 12
Is low and the second control signal 125
The case where the MOS 123 is insulated will be described.

【0032】まず可変抵抗調整手段11の動作について
説明する。可変抵抗手段11を構成するPMOS111
〜11nはそれぞれのゲート端子に外部入力端子から制
御信号1〜nを入力することで選択的に導通し、調整抵
抗の抵抗値を0にする。従って調整抵抗1つの抵抗値を
rとし、R2に抵抗値を2rとし、R3の抵抗値を4r
とし、R4の抵抗値を8rとしたとき、R1〜Rn間の
合成抵抗は組合せによりr〜n*rまでrステップの可
変抵抗となる。
First, the operation of the variable resistance adjusting means 11 will be described. PMOS 111 constituting variable resistance means 11
11n are selectively turned on by inputting control signals 1 to n from their external input terminals to their respective gate terminals, thereby setting the resistance value of the adjustment resistor to 0. Therefore, the resistance value of one adjustment resistor is r, the resistance value of R2 is 2r, and the resistance value of R3 is 4r.
Assuming that the resistance value of R4 is 8r, the combined resistance between R1 and Rn is a variable resistance in r steps from r to n * r depending on the combination.

【0033】以上のことから可変抵抗手段11は選択が
可能な調整抵抗R1〜Rnと基準抵抗R0とを直列に接
続することで抵抗値を可変することができる。
As described above, the variable resistance means 11 can change the resistance value by connecting the selectable adjustment resistors R1 to Rn and the reference resistor R0 in series.

【0034】いま可変抵抗手段11を構成する調整抵抗
R1〜Rnの抵抗値をそれぞれrとし、基準抵抗R0の
抵抗値をr0とし、外部入力端子が入力する選択信号1
〜nの信号レベルをi1〜inとし、ikの信号レベル
は“ロー”とし、他の信号レベルは“ハイ”であると
し、可変抵抗手段11の抵抗値をrdとすると、可変抵
抗手段11の抵抗値rdはrd=r0+k*rとなる。
このときkは1<=k<=nをみたす自然数とする。
Now, assume that the resistance values of the adjustment resistors R1 to Rn constituting the variable resistance means 11 are r, the resistance value of the reference resistor R0 is r0, and the selection signal 1 input to the external input terminal is
To n, i.sub.k signal level is "low", other signal levels are "high", and the resistance value of the variable resistance means 11 is rd. The resistance value rd is rd = r0 + k * r.
At this time, k is a natural number satisfying 1 <= k <= n.

【0035】つぎに図1に示す検出電圧選択手段12の
動作について説明する。検出電圧選択手段11を構成す
るPMOS121のゲート端子に”ハイ”の選択制御信
号123を印可するとPMOS121は”オフ”する。
Next, the operation of the detection voltage selection means 12 shown in FIG. 1 will be described. When the selection control signal 123 of “high” is applied to the gate terminal of the PMOS 121 constituting the detection voltage selection means 11, the PMOS 121 is turned “off”.

【0036】すると第1の検出抵抗Rxと第2の検出抵
抗Ry、第3の検出抵抗Rzは接地−電源間の電圧を分
割せずに電源電圧VSSつまり接地に対して”ロー”の
信号をNMOS122のゲートに印可して、NMOS1
22は”オフ”し、NMOS122のオン抵抗は無限の
抵抗値になる。
Then, the first detection resistor Rx, the second detection resistor Ry, and the third detection resistor Rz do not divide the voltage between the ground and the power supply, and supply a "low" signal with respect to the power supply voltage VSS, that is, the ground. Apply to the gate of the NMOS 122 and set the NMOS 1
22 turns "off", and the on resistance of the NMOS 122 becomes an infinite resistance value.

【0037】反対にPMOS121のゲート端子に”ロ
ー”の選択制御信号123を印可するとPMOS121
は”オン”し、第1の検出抵抗Rxと第2の検出抵抗R
y、第3の検出抵抗Rzは接地−電源間の電圧を分割し
て、その分割電圧をNMOS122のゲートに印可す
る。このときNMOS122はN型トランジスタの特性
に従い電源電圧に依存する抵抗体となる。
On the contrary, when the selection control signal 123 of “low” is applied to the gate terminal of the PMOS 121,
Is turned on, the first detection resistor Rx and the second detection resistor Rx are turned on.
y, the third detection resistor Rz divides the voltage between the ground and the power supply, and applies the divided voltage to the gate of the NMOS 122. At this time, the NMOS 122 becomes a resistor that depends on the power supply voltage according to the characteristics of the N-type transistor.

【0038】図3は本発明の電源電圧検出回路の電源電
圧と分割電圧との関係を示す図である。図3に示すよう
に定抵抗である第1の検出抵抗Rxと第2の検出抵抗R
y、第3の検出抵抗Rz による分割比は一定であるた
め任意の検出電圧Vd1より電源電圧が大きくなると分
割電圧と電源電圧の電位差は大きくなる。
FIG. 3 is a diagram showing the relationship between the power supply voltage and the divided voltage of the power supply voltage detection circuit of the present invention. As shown in FIG. 3, a first detection resistor Rx and a second detection resistor R, which are constant resistors,
Since the division ratio by y and the third detection resistor Rz is constant, when the power supply voltage becomes higher than the arbitrary detection voltage Vd1, the potential difference between the divided voltage and the power supply voltage becomes larger.

【0039】反対に検出電圧より電源電圧が小さくなる
と分割電圧と電源電圧との電圧差は小さくなる。このこ
とによりNMOS122はN型のトランジスタの特性に
従い電源電圧が大きくなるとオン抵抗は小さくなり、電
源電圧が小さくなるとオン抵抗は大きくなることがわか
る。
On the other hand, when the power supply voltage becomes smaller than the detection voltage, the voltage difference between the divided voltage and the power supply voltage becomes smaller. This indicates that the on-resistance of the NMOS 122 decreases as the power supply voltage increases according to the characteristics of the N-type transistor, and the on-resistance increases as the power supply voltage decreases.

【0040】つぎに図1に示す第1の波形整形手段13
の動作について説明する。第1の波形整形手段13はバ
ッファで、しきい値である電源電圧の半分を境に”ハ
イ”側の入力信号を受けたとき”ハイ”を出力し、反対
に”ロー”側の入力信号を受けたとき”ロー”を出力す
る。
Next, the first waveform shaping means 13 shown in FIG.
Will be described. The first waveform shaping means 13 is a buffer, which outputs "high" when receiving a "high" side input signal at the boundary of a half of the power supply voltage which is a threshold, and conversely, outputs a "low" side input signal. Outputs "low" when receiving.

【0041】つぎに本発明の実施例の電源電圧検出回路
全体の動作について説明する。図4は本発明の電源電圧
検出回路の動作タイミングを示す図である。可変抵抗手
段11を構成する外部入力端子PAD1〜PADnに信
号を入力して可変抵抗手段11を抵抗値rdの定抵抗体
とする。
Next, the operation of the entire power supply voltage detecting circuit according to the embodiment of the present invention will be described. FIG. 4 is a diagram showing the operation timing of the power supply voltage detection circuit of the present invention. A signal is input to the external input terminals PAD1 to PADn constituting the variable resistance means 11 to make the variable resistance means 11 a constant resistance having a resistance value rd.

【0042】つぎに検出電圧選択手段12を構成するP
MOS121のゲート端子に図4に示すような選択制御
信号を印可する。
Next, P constituting the detection voltage selection means 12
A selection control signal as shown in FIG. 4 is applied to the gate terminal of the MOS 121.

【0043】図4に示す選択制御信号は”ロー”のとき
に検出電圧選択手段12を選択し、”ハイ”のときには
非選択としている。従って図4の検出信号に示すように
選択期間に電源電圧を検出し、電源電圧が検出電圧より
大きいとき波形背景趣団13は”ロー”を出力し、電源
電圧が検出電圧より小さいとき波形整形回路13は”ハ
イ”を出力している。
The selection control signal shown in FIG. 4 selects the detection voltage selection means 12 when it is "low", and deselects it when it is "high". Accordingly, as shown by the detection signal in FIG. 4, the power supply voltage is detected during the selection period, and when the power supply voltage is higher than the detection voltage, the waveform background board 13 outputs "low", and when the power supply voltage is lower than the detection voltage, the waveform shaping is performed. The circuit 13 outputs "high".

【0044】つぎに検出電圧選択手段12を構成する第
2の制御信号125が“ハイ”で第2のNMOS123
が導通している場合の図1に示す検出電圧選択手段12
の動作について説明する。検出電圧選択手段11を構成
するPMOS121のゲート端子に”ハイ”の選択制御
信号123を印可するとPMOS121は”オフ”す
る。
Next, when the second control signal 125 constituting the detection voltage selection means 12 is "high" and the second NMOS 123
Voltage detecting means 12 shown in FIG.
Will be described. When the selection control signal 123 of “high” is applied to the gate terminal of the PMOS 121 constituting the detection voltage selection means 11, the PMOS 121 is turned “off”.

【0045】すると第1の検出抵抗Rxと第2の検出抵
抗Ry、第3の検出抵抗Rzは接地−電源間の電圧を分
割せずに電源電圧VSSつまり接地に対して”ロー”の
信号をNMOS122のゲートに印可して、NMOS1
22は”オフ”し、NMOS122のオン抵抗は無限の
抵抗値になる。
Then, the first detection resistor Rx, the second detection resistor Ry, and the third detection resistor Rz do not divide the voltage between the ground and the power supply, and supply a low voltage signal to the power supply voltage VSS, that is, the ground. Apply to the gate of the NMOS 122 and set the NMOS 1
22 turns "off", and the on resistance of the NMOS 122 becomes an infinite resistance value.

【0046】第2のNMOS123はに第2の制御信号
2の“ハイ”を印可しているためオンして、ソースとド
レイン間が導通するため第2の検出抵抗Ryと第3の検
出抵抗Rzの接続点が電源レベルとなり、第3の検出抵
抗Rzは無効化する。
The second NMOS 123 is turned on because the "high" level of the second control signal 2 is applied to the second NMOS 123, and the second detection resistor Ry and the third detection resistor Rz are electrically connected between the source and the drain. Becomes the power supply level, and the third detection resistor Rz is invalidated.

【0047】このときPMOS121のゲート端子に”
ロー”の第1の選択制御信号124を印可するとPMO
S121は”オン”し、第1の検出抵抗Rxと第2の検
出抵抗Ryは接地−電源間の電圧を分割して、その分割
電圧をNMOS122のゲートに印可する。このとき第
2のNMOS122はN型トランジスタの特性に従い電
源電圧に依存する抵抗体となる。
At this time, the gate terminal of the PMOS
When the first selection control signal 124 of “low” is applied, the PMO
S121 is turned “ON”, and the first detection resistor Rx and the second detection resistor Ry divide the voltage between the ground and the power supply, and apply the divided voltage to the gate of the NMOS 122. At this time, the second NMOS 122 becomes a resistor that depends on the power supply voltage according to the characteristics of the N-type transistor.

【0048】図5は本発明の電源電圧検出回路の電源電
圧と分割電圧との関係を示す図である。図5に示すよう
に定抵抗である第1の検出抵抗Rxと第2の検出抵抗R
yによる第2の分割比2は一定であるため第2の任意の
検出電圧Vd2より電源電圧が大きくなると分割電圧と
電源電圧の電位差は大きくなる。
FIG. 5 is a diagram showing the relationship between the power supply voltage and the divided voltage of the power supply voltage detection circuit of the present invention. As shown in FIG. 5, a first detection resistor Rx and a second detection resistor R which are constant resistors are provided.
Since the second division ratio 2 based on y is constant, when the power supply voltage becomes larger than the second arbitrary detection voltage Vd2, the potential difference between the divided voltage and the power supply voltage becomes larger.

【0049】反対に第2の検出電圧Vd2より電源電圧
が小さくなると分割電圧と電源電圧との電圧差は小さく
なる。このことによりNMOS122はN型のトランジ
スタの特性に従い電源電圧が大きくなるとオン抵抗は小
さくなり、電源電圧が小さくなるとオン抵抗は大きくな
ることがわかる。
Conversely, when the power supply voltage is lower than the second detection voltage Vd2, the voltage difference between the divided voltage and the power supply voltage becomes smaller. This indicates that the on-resistance of the NMOS 122 decreases as the power supply voltage increases according to the characteristics of the N-type transistor, and the on-resistance increases as the power supply voltage decreases.

【0050】また第2のNMOS123が導通したとき
の第2の分割比2の傾きは第3の検出抵抗Rzの抵抗値
が無効化し、第1の検出抵抗Rxと第2の検出抵抗Ry
のみで分割されるため分割比率が変わり、電源側に傾
く。従って、任意の電源電圧での分割電圧と電源電圧の
電位差は第2のNMOS123がオフしているときに比
べ小さい。従って、第2の検出電圧Vd2は検出電圧が
Vd1のときの分割電圧と電減電圧の電位差と等しくな
る電源電圧となるから、分割電圧と電減電圧の電位差が
大きくなる方向つまり、電源電圧が大きくなる方向とな
る。
When the second NMOS 123 conducts, the slope of the second division ratio 2 is such that the resistance value of the third detection resistor Rz is invalidated, and the first detection resistor Rx and the second detection resistor Ry are invalidated.
Since the division is performed only by the power source, the division ratio changes and the power supply side tilts. Therefore, the potential difference between the divided voltage and the power supply voltage at an arbitrary power supply voltage is smaller than when the second NMOS 123 is off. Accordingly, the second detection voltage Vd2 is a power supply voltage that is equal to the potential difference between the divided voltage and the reduced voltage when the detection voltage is Vd1, so that the potential difference between the divided voltage and the reduced voltage is increased, that is, the power supply voltage is increased. The direction becomes larger.

【0051】上記本発明の実施例では検出電圧選択手段
12を構成する検出抵抗の比を変えることで電源電圧の
検出電圧を調整することを述べたが、NMOS122の
チャネル幅またはチャネル長を調整することでも検出電
圧を調整することができることはあきらかである。
In the above-described embodiment of the present invention, the detection voltage of the power supply voltage is adjusted by changing the ratio of the detection resistors constituting the detection voltage selection means 12, but the channel width or the channel length of the NMOS 122 is adjusted. It is clear that the detection voltage can be adjusted in any way.

【0052】[0052]

【発明の効果】以上の説明で明らかなように、本発明の
電源電圧検出回路によれば、検出電圧選択手段において
抵抗体とNMOSを並列に接続し、NMOSのゲート信
号を制御し、直接抵抗体の抵抗値を無効化することで複
数の電圧を検出することができ、検出電圧数に応じた回
路を必要としないため回路規模を縮小ことが可能とな
る。
As is apparent from the above description, according to the power supply voltage detection circuit of the present invention, the resistor and the NMOS are connected in parallel in the detection voltage selection means, the gate signal of the NMOS is controlled, and the resistance is directly controlled. By invalidating the resistance value of the body, a plurality of voltages can be detected, and a circuit corresponding to the number of detected voltages is not required, so that the circuit scale can be reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明による電源電圧検出回路の構成を示すブ
ロック図である。
FIG. 1 is a block diagram showing a configuration of a power supply voltage detection circuit according to the present invention.

【図2】従来の電源電圧検出回路の構成を示すブロック
図である。
FIG. 2 is a block diagram showing a configuration of a conventional power supply voltage detection circuit.

【図3】本発明の実施例における電源電圧検出回路の電
源電圧と分割電圧との関係を示す図である。
FIG. 3 is a diagram illustrating a relationship between a power supply voltage and a divided voltage of a power supply voltage detection circuit according to an embodiment of the present invention.

【図4】本発明の実施例における電源電圧検出回路の動
作タイミングを示す図である。
FIG. 4 is a diagram showing operation timings of the power supply voltage detection circuit in the embodiment of the present invention.

【符号の説明】[Explanation of symbols]

11 可変抵抗手段 111 P型電解効果型トランジスタ 112 P型電解効果型トランジスタ 113 P型電解効果型トランジスタ 114 P型電解効果型トランジスタ 12 検出電圧選択手段 121 P型電解効果型トランジスタ 122 N型電解効果型トランジスタ 13 波形整形手段 Rx 第1の検出電圧抵抗 Ry 第2の検出電圧抵抗 DESCRIPTION OF SYMBOLS 11 Variable resistance means 111 P-type field-effect transistor 112 P-type field-effect transistor 113 P-type field-effect transistor 114 P-type field-effect transistor 12 Detection voltage selection means 121 P-type field-effect transistor 122 N-type field-effect type Transistor 13 Waveform shaping means Rx First detection voltage resistance Ry Second detection voltage resistance

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 電源間に可変抵抗調整手段と検出電圧選
択手段を直列に接続し、可変抵抗調整手段と検出電圧選
択手段の接続点に波形整形手段を接続することを特徴と
する電源電圧検出回路。
1. A power supply voltage detection method comprising: connecting a variable resistance adjustment means and a detection voltage selection means in series between power supplies; and connecting a waveform shaping means to a connection point between the variable resistance adjustment means and the detection voltage selection means. circuit.
【請求項2】 可変抵抗調整手段はVDDと電源電圧選
択手段の間に、一端をPMOSのドレインを接続した抵
抗体を少なくとも1つ以上直列に接続し、該PMOSソ
ースにVDDに接続し、ゲートに制御信号が入力されて
いることを特徴とする請求項1に記載の電源電圧検出回
路。
2. The variable resistance adjusting means connects at least one resistor having one end connected to a drain of a PMOS in series between VDD and a power supply voltage selecting means, connects the PMOS source to VDD, and connects a gate to the PMOS source. The power supply voltage detection circuit according to claim 1, wherein a control signal is input to the power supply voltage detection circuit.
【請求項3】 前記検出電圧選択手段はソースをVDD
に接続し、ゲートに電圧選択信号を入力したPMOS
と、ドレインを可変抵抗調整手段に接続し、ソースをV
SSに接続したNMOSと、一端を該NMOSゲートに
接続し他端を該PMOSのドレインに接続した抵抗体
と、一端を該NMOSのゲートに接続し他端とVSSの
間に、ソースをVSSに接続し、ゲートに第2の電圧選
択信号を入力し、ドレインを抵抗の一端に接続したNM
OSを少なくとも1つ以上直列に接続した抵抗体で構成
する事を特徴とする請求項1に記載の電源電圧検出回
路。
3. The detecting voltage selecting means sets the source to VDD.
Connected to the gate and a voltage selection signal input to the gate
And the drain connected to the variable resistance adjusting means, and the source connected to V
An NMOS connected to SS, a resistor having one end connected to the NMOS gate and the other end connected to the drain of the PMOS, and one end connected to the gate of the NMOS and the other end connected to VSS, and a source connected to VSS. NM with a second voltage selection signal input to the gate and a drain connected to one end of the resistor
2. The power supply voltage detection circuit according to claim 1, wherein the OS is constituted by at least one resistor connected in series.
JP8277971A 1996-03-26 1996-10-21 Source voltage detection circuit Pending JP2000019201A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP8277971A JP2000019201A (en) 1996-10-21 1996-10-21 Source voltage detection circuit
PCT/JP1997/001007 WO1997036181A1 (en) 1996-03-26 1997-03-26 Power supply voltage detecting circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8277971A JP2000019201A (en) 1996-10-21 1996-10-21 Source voltage detection circuit

Publications (1)

Publication Number Publication Date
JP2000019201A true JP2000019201A (en) 2000-01-21

Family

ID=17590827

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8277971A Pending JP2000019201A (en) 1996-03-26 1996-10-21 Source voltage detection circuit

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147389A (en) * 2005-11-25 2007-06-14 Fujitsu Ltd Supply voltage detection circuit
WO2017145011A1 (en) * 2016-02-26 2017-08-31 Semiconductor Energy Laboratory Co., Ltd. Connecting member, power supply device, electronic device, and system

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147389A (en) * 2005-11-25 2007-06-14 Fujitsu Ltd Supply voltage detection circuit
WO2017145011A1 (en) * 2016-02-26 2017-08-31 Semiconductor Energy Laboratory Co., Ltd. Connecting member, power supply device, electronic device, and system
CN108701950A (en) * 2016-02-26 2018-10-23 株式会社半导体能源研究所 Connection components, power supply units, electronic equipment and systems
US10770910B2 (en) 2016-02-26 2020-09-08 Semiconductor Energy Laboratory Co., Ltd. Connecting member, power supply device, electronic device, and system
CN108701950B (en) * 2016-02-26 2021-06-01 株式会社半导体能源研究所 Connecting components, power supply units, electronic equipment and systems
US11714385B2 (en) 2016-02-26 2023-08-01 Semiconductor Energy Laboratory Co., Ltd. Connecting member, power supply device, electronic device, and system
US12222683B2 (en) 2016-02-26 2025-02-11 Semiconductor Energy Laboratory Co., Ltd. Connecting member, power supply device, electronic device, and system

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