JP2000012247A - Lamp temperature abnormality detection device - Google Patents

Abstract

(57) [Summary] [Problem] Since the temperature of the lamp itself is not measured, Xe
An abnormal temperature rise due to poor contact at the power supply connection of the lamp could not be detected. The temperature of a lamp is measured by a non-contact type measuring temperature means, thereby detecting an abnormal temperature rise due to a poor contact of a lamp cooling device or a power supply connection portion of the lamp, and detecting the abnormal temperature rise of the lamp. The purpose of this is to provide a device to prevent it.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to an apparatus using a lamp.

[0002]

2. Description of the Related Art Conventionally, an abnormal temperature rise of a lamp using a high voltage such as a Xe lamp is measured not by directly measuring the temperature of the lamp but by measuring the temperature of a structure around the lamp with a contact-type temperature sensor and cooling the lamp. A device error was detected.

[0003]

In the above prior art,
Since the temperature of the lamp itself is not measured, there has been a problem that abnormal temperature rise due to poor contact at the power supply connection portion of the lamp cannot be detected.

An object of the present invention is to provide a device for measuring the temperature of a lamp itself and preventing an abnormal rise in the temperature of the lamp.

[0005]

In order to achieve the above object, the temperature of the lamp is measured by a non-contact type measuring temperature means to detect an abnormal temperature rise.

[0006]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 shows an embodiment of the present invention.

FIG. 1 shows the basic configuration of a lamp temperature abnormality detecting device. The heat radiation energy from the metal parts at both ends of the Xe lamp 11 is converted into a measured temperature signal by the temperature detection unit 12 and sent to the comparison unit 14 via the amplification unit 13. Comparison section 1
When the measured temperature is higher than the reference temperature as compared with the signal from the reference temperature signal section 15 according to (4), an abnormal temperature rise display signal is sent to the display section 16. At the same time, a lamp extinguishing signal is sent to the lamp power controller 17 to control the lamp power 18 and extinguish the lamp.

FIG. 2 is an optical system configuration diagram of the temperature detecting section 12 of FIG. The light from the light emitting portion of the Xe lamp is
To shield light. Thermal radiation energy from the metal parts at both ends of the Xe lamp is introduced into the silicon photocell 26 via the protective filter 22, the condenser lens 23, the light quantity adjusting plate 24, and the spectral sensitivity correction filter 25. The introduced thermal radiation energy is converted into an electric signal by the silicon photocell 26.

[0009]

According to the present invention, there is an effect that a device for detecting an abnormal temperature rise due to a contact failure of the lamp cooling device or the power supply connection portion of the lamp and preventing the abnormal temperature rise of the lamp can be supplied.

[Brief description of the drawings]

FIG. 1 is a basic configuration diagram of a temperature abnormality detection device of the present invention.

FIG. 2 is a configuration diagram showing an optical system of a temperature detection unit in FIG. 1;

[Explanation of symbols]

11: Xe lamp, 12: temperature detector, 13: amplifier,
14 ... Comparison unit, 15 ... Reference temperature signal unit, 16 ... Display unit,
17 lamp power control section, 18 lamp power supply, 21 light shielding plate, 22 protection filter, 23 condenser lens, 24
Light amount adjusting plate, 25: spectral sensitivity correction filter, 26: silicon photocell.

 ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Osamu Kato 882, Imo, Oaza, Hitachinaka-shi, Ibaraki F-term in the measuring instrument division of Hitachi, Ltd. (Reference) 3K073 AA21 AA33 AA92 BA31 CF18 CF22 CG02 CJ16

Claims (1)

[Claims] 1. A lamp temperature abnormality detecting device comprising: a non-contact measuring temperature means for measuring a temperature of a lamp; a means for comparing the measured temperature with a specified temperature; and a means for outputting an abnormal temperature.