[go: up one dir, main page]

JP2000059081A - Manufacture of electromagnetic wave shielding material - Google Patents

Manufacture of electromagnetic wave shielding material

Info

Publication number
JP2000059081A
JP2000059081A JP10222800A JP22280098A JP2000059081A JP 2000059081 A JP2000059081 A JP 2000059081A JP 10222800 A JP10222800 A JP 10222800A JP 22280098 A JP22280098 A JP 22280098A JP 2000059081 A JP2000059081 A JP 2000059081A
Authority
JP
Japan
Prior art keywords
thin film
electromagnetic wave
metal thin
wave shielding
visible light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10222800A
Other languages
Japanese (ja)
Inventor
Naoshi Minamiguchi
尚士 南口
Masahiro Henmi
昌弘 辺見
Takashi Taniguchi
孝 谷口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toray Industries Inc
Original Assignee
Toray Industries Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toray Industries Inc filed Critical Toray Industries Inc
Priority to JP10222800A priority Critical patent/JP2000059081A/en
Publication of JP2000059081A publication Critical patent/JP2000059081A/en
Pending legal-status Critical Current

Links

Landscapes

  • Surface Treatment Of Optical Elements (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PROBLEM TO BE SOLVED: To increase electromagnetic wave shielding effect, visible light transmittivity, adhesion between a substrate and a metal thin film, and the uniformity of the metal thin film by depositing a metal thin film having a conductivity on at least one face of a substrate and thereafter polishing the metal thin-film layer. SOLUTION: On at least one face of a substrate, a metal thin film having a conductivity is deposited. Silver is preferably used as metal to be deposited. Electroless plating is preferably used as a means for deposition. Next, the thin film is polished, preferably by chemical mechanical polishing, until a desired visible light transmittivity is obtained, that is, the thin film becomes 0.5 μm or below in thickness. The minimum thickness after polishing is 0.01 μm or above. Thereby, an electromagnetic wave shielding effect, a visible light transmittivity, adhesion between a substrate and a metal thin film, and the uniformity of the metal thin film can be increased.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電磁波シールド材
料の製造方法に関し、更に詳しくは、ブラウン管(以下
CRTと略す)、液晶(以下LCDと略す)、プラズマ
ディスプレイ(以下PDPと略す)、エレクトロルミネ
ッサンス(以下ELと略す)、発光ダイオード(以下L
EDと略す)などのディスプレイおよびそれらの前面に
設置されるフィルターに用いられる可視光透過性を有す
る電磁波シールド材料の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing an electromagnetic wave shielding material, and more particularly, to a cathode ray tube (hereinafter abbreviated as CRT), a liquid crystal (hereinafter abbreviated as an LCD), a plasma display (hereinafter abbreviated as a PDP), and an electro-luminescence device. (Hereinafter abbreviated as EL), light emitting diode (hereinafter L)
The present invention relates to a method for producing an electromagnetic wave shielding material having visible light transmittance used for a display such as an ED) and a filter installed on the front surface thereof.

【0002】[0002]

【従来の技術】最近の電気通信情報関連技術の進展に伴
い、電子機器から発せられる電磁波による電子機器の誤
動作や人体への影響などの電磁環境問題がクローズアッ
プされ、その対策が必要となっている。
2. Description of the Related Art With the recent development of telecommunications information-related technology, electromagnetic environment problems such as malfunction of electronic devices and influence on human bodies due to electromagnetic waves emitted from electronic devices have been highlighted, and countermeasures have become necessary. I have.

【0003】従来から、樹脂やガラスのように導電性の
乏しい材料に電磁波シールド効果を持たせる手段とし
て、各種の導電性表面処理が考案され実用化されてい
る。導電性表面処理としては、銅やニッケル、銀などの
無電解メッキ、亜鉛、銅、アルミなどの金属溶射、金属
箔貼付、真空蒸着、スパッタリング、イオンプレーティ
ング、導電性塗料など、プラスチック表面に金属薄膜を
積層する方法があり、パソコンや携帯電話などの電子機
器の筐体などに適用されている。
Conventionally, various conductive surface treatments have been devised and put into practical use as means for imparting an electromagnetic wave shielding effect to a material having poor conductivity such as resin or glass. Examples of conductive surface treatment include electroless plating of copper, nickel, silver, etc., metal spraying of zinc, copper, aluminum, etc., metal foil sticking, vacuum evaporation, sputtering, ion plating, conductive paint, etc. There is a method of laminating thin films, which is applied to housings of electronic devices such as personal computers and mobile phones.

【0004】一方、CRT、LCD、PDP、ELなど
のディスプレイモニター部分の電磁波シールドには、シ
ールド効果だけでなく、表示画像の透視性を確保するた
め可視光透過性が必要である。樹脂やガラスを基板とす
るディスプレイモニターおよびその前面フィルターの電
磁波シールド材料に関する従来技術としては、金属をコ
ーティングするなどして導電性を付与した繊維からなる
メッシュを基板に積層する方法(例えば、特開平9−1
45918号公報、特開平9−247581号公報、特
開平9−247582号公報、特開平9−247583
号公報、特開平9−247584号公報)、スパッタリ
ングを用いる技術(特開平9−306366号公報)や
導電性塗料を用いる技術(特開平9−330666号公
報、特開平9−330667号公報)で基板上に可視光
域(400〜700nm)よりも薄い金属薄膜を設ける
などしてシールド効果と可視光透過性を両立させる方法
などが開示されている。
On the other hand, an electromagnetic wave shield for a display monitor such as a CRT, an LCD, a PDP, and an EL needs not only a shielding effect but also a visible light transmittance in order to ensure the transparency of a displayed image. As a conventional technique relating to an electromagnetic wave shielding material for a display monitor and a front filter thereof using a resin or glass as a substrate, there is known a method of laminating a mesh made of conductive fibers by coating a metal or the like on a substrate (for example, Japanese Patent Laid-Open Publication No. 9-1
45918, JP-A-9-247581, JP-A-9-247581, JP-A-9-247585
JP-A-9-247584), a technique using sputtering (JP-A-9-306366), and a technique using a conductive paint (JP-A-9-330666 and JP-A-9-330667). A method is disclosed in which a metal thin film thinner than the visible light range (400 to 700 nm) is provided on a substrate to achieve both a shielding effect and visible light transmittance.

【0005】しかしながら、導電性メッシュを用いる方
法では、金属あるいは導電性を付与した繊維部分には可
視光透過性がないため、なるべくその部分の面積を減ら
すようメッシュのピッチ幅を広げるなどして可視光透過
性を上げる工夫がなされているが、そうすると逆に電磁
波シールド効果が低くなるという問題があり、可視光透
過性と電磁波シールド効果の両方を高いレベルで満足さ
せ得るのが難しく、さらに、メッシュのピッチ幅によっ
てはモアレ干渉縞を起こすといった問題がある。
[0005] However, in the method using a conductive mesh, since the metal or the fiber portion provided with conductivity does not have visible light transmittance, the visible pitch is increased by increasing the mesh pitch so as to reduce the area of the portion as much as possible. Although some measures have been taken to increase the light transmission, there is a problem in that the electromagnetic wave shielding effect is lowered, and it is difficult to satisfy both the visible light transmission and the electromagnetic wave shielding effect at a high level. However, there is a problem that moire interference fringes occur depending on the pitch width.

【0006】また、スパッタリングによる金属薄膜形成
技術は、可視光透過性の金属薄膜を得ることが可能であ
り、すぐれた導電性、基板との密着性、膜厚の均一性な
どの優れた特徴を有しているが、PDPのような大面積
に対応した大型成型品には不向きであり、装置が非常に
高価であるという問題がある。
The technique of forming a metal thin film by sputtering is capable of obtaining a metal thin film that transmits visible light, and has excellent features such as excellent conductivity, adhesion to a substrate, and uniformity of film thickness. However, it is not suitable for a large molded product corresponding to a large area such as a PDP, and there is a problem that the apparatus is very expensive.

【0007】さらに、導電性塗料による金属薄膜形成技
術では、可視光透過性を有する薄さの金属薄膜の導電性
が悪く、良好な電磁波シールド効果が得られにくいとい
う問題があり、メッシュ状に塗布することで膜厚を厚く
するなどの工夫がなされているが、可視光透過性と電磁
波シールド性を両立させるのが難しい。
Further, the technique of forming a metal thin film using a conductive paint has a problem that the thin metal thin film having visible light transmittance has poor conductivity, and it is difficult to obtain a good electromagnetic wave shielding effect. However, it is difficult to achieve both visible light transmission and electromagnetic wave shielding.

【0008】上記以外の導電性表面処理として、銅やニ
ッケル、銀などの無電解メッキ、亜鉛、銅、アルミなど
の金属溶射、金属箔貼付などの方法は、コストが安い反
面、可視光透過性を有する、すなわち可視光の波長より
も薄い均一な薄膜を得ることが困難である。また表面処
理とは別に、樹脂やガラス基板そのものに電磁波シール
ド効果を付与する試みとして、樹脂やガラスに導電性フ
ィラーを混入するなどして成形した導電性透明基板が検
討されているが、これらの方法では未だ十分な電磁波シ
ールド効果を得るレベルには至っていない。
Other conductive surface treatments such as electroless plating of copper, nickel, silver, etc., metal spraying of zinc, copper, aluminum, etc., and metal foil sticking are inexpensive, but have low visible light transmittance. That is, it is difficult to obtain a uniform thin film thinner than the wavelength of visible light. Separately from the surface treatment, conductive transparent substrates molded by mixing conductive filler into resin or glass have been studied as an attempt to impart an electromagnetic wave shielding effect to the resin or glass substrate itself. The method has not yet reached a level to obtain a sufficient electromagnetic wave shielding effect.

【0009】[0009]

【発明が解決しようとする課題】本発明の目的は、CR
T、LCD、PDP、ELなどのディスプレイおよびそ
れらの前面に設置されるフィルターとして適用可能な、
ガラスや樹脂基板に金属薄膜を積層した電磁波シールド
材料において、電磁波シールド効果、可視光透過性、基
板と金属薄膜との密着性、金属薄膜の均一性に優れた電
磁波シールド材料を、安価なコストで製造するための方
法を提供することである。
SUMMARY OF THE INVENTION An object of the present invention is to provide a CR
Applicable as displays such as T, LCD, PDP, EL and filters installed on the front of them.
An electromagnetic shielding material with a metal thin film laminated on a glass or resin substrate, an electromagnetic shielding material that excels in electromagnetic wave shielding effect, visible light transmission, adhesion between the substrate and the metal thin film, and uniformity of the metal thin film at a low cost. It is to provide a method for manufacturing.

【0010】[0010]

【課題を解決するための手段】上記目的を達成するた
め、本発明は基本的に下記の構成を有する。
In order to achieve the above object, the present invention basically has the following arrangement.

【0011】すなわち、「基板の少なくとも片側の面
に、導電性を有する金属の薄膜を積層し、しかる後にそ
の金属薄膜層を研磨することを特徴とする可視光透過性
電磁波シールド材料の製造方法。」である。
That is, a method of manufacturing a visible light transmitting electromagnetic wave shielding material, comprising laminating a conductive metal thin film on at least one surface of a substrate, and then polishing the metal thin film layer. ".

【0012】[0012]

【発明の実施の形態】以下、発明の実施の形態について
説明する。
Embodiments of the present invention will be described below.

【0013】まずはじめに、本発明でいう可視光透過性
とは、表示画像の透視性や色調などを実用レベルで満足
するために必須のものであり、波長が400nmから7
00nmの範囲の可視光の透過率で表され、その波長域
全般にわたって少なくとも40%以上を有することが好
ましい。また、本発明でいう電磁波シールド効果とは、
電磁波のエネルギー(周波数)をシールド材料が吸収ま
たは反射することで、電磁波のエネルギーをどれだけ減
衰できるかをいい、ある測定距離(3mまたは10mま
たは30m)における電界強度の減衰度(デシベル;d
B(μV/m))で表され、30MHzから1000M
Hzの周波数範囲の電界強度減衰度の準尖頭値が少なく
とも30dB以上を有することが好ましい。
First, the visible light transmittance as referred to in the present invention is indispensable for satisfying the visibility and color tone of a displayed image on a practical level.
It is represented by a transmittance of visible light in the range of 00 nm, and preferably has at least 40% or more over the entire wavelength range. In addition, the electromagnetic wave shielding effect referred to in the present invention is:
It refers to how much the electromagnetic wave energy can be attenuated by absorbing or reflecting the energy (frequency) of the electromagnetic wave by the shielding material, and the attenuation of the electric field strength at a certain measurement distance (3 m, 10 m, or 30 m) (decibel; d
B (μV / m)) from 30 MHz to 1000 M
Preferably, the quasi-peak value of the electric field intensity attenuation in the frequency range of Hz has at least 30 dB or more.

【0014】本発明に用いる基板とは、CRT、LC
D、PDP、EL、LED等のフラットパネルディスプ
レイおよびそれらの前面に設置されるフィルターに用い
られる透明な基板であって、無アルカリガラス、ソーダ
ライムガラス、ホウケイ酸ガラスなどのガラス基板、ポ
リメチルメタクリエート、ポリカーボネート等の透明性
樹脂基板が例示される。
The substrate used in the present invention includes CRT, LC
A transparent substrate used for flat panel displays such as D, PDP, EL, LED, etc. and a filter installed on the front thereof, including a glass substrate such as non-alkali glass, soda lime glass, borosilicate glass, and polymethyl meta A transparent resin substrate such as create and polycarbonate is exemplified.

【0015】本発明では、まず、上記基板の少なくとも
片側の面に導電性を有する金属薄膜を積層する。積層す
る金属としては導電性の金属であれば特に限定されるも
のではないが、金、白金、パラジウム、銀、銅、黄銅、
コバルト、鉄、すず、ニッケル、亜鉛、アルミニウムか
ら選ばれる少なくとも1種を含む金属または合金が好ま
しく、さらに、体積固有抵抗率(Ω・cm)が低いこと、
安価であること、薄膜形成が容易であることなどを考慮
すると、銀がより好適に用いられる。
In the present invention, first, a metal thin film having conductivity is laminated on at least one surface of the substrate. The metal to be laminated is not particularly limited as long as it is a conductive metal, but gold, platinum, palladium, silver, copper, brass,
A metal or alloy containing at least one selected from cobalt, iron, tin, nickel, zinc, and aluminum is preferable, and the volume specific resistivity (Ω · cm) is low;
Considering that it is inexpensive and easy to form a thin film, silver is more preferably used.

【0016】金属薄膜を積層するための手段は、金属薄
膜の形成が可能な方法であれば特に限定されるものでは
ないが、無電解メッキ、金属溶射、金属箔貼付、真空蒸
着、スパッタリング、イオンプレーティング、導電性塗
料など、従来から、樹脂やガラスのように導電性の乏し
い材料に電磁波シールド効果を持たせる手段として用い
られている各種の導電性表面処理が好適に用いられ、中
でも薄膜の均一性、基板との密着性、薄膜形成が容易、
かつ安価に製造できることを考慮すると、無電解メッキ
がより好適である。
Means for laminating the metal thin film is not particularly limited as long as it is a method capable of forming the metal thin film. Electroless plating, metal spraying, metal foil sticking, vacuum evaporation, sputtering, ion Various conductive surface treatments conventionally used as means for imparting an electromagnetic wave shielding effect to poorly conductive materials such as resin and glass, such as plating and conductive paint, are preferably used. Uniformity, adhesion to substrate, easy thin film formation,
Considering that it can be manufactured at low cost, electroless plating is more preferable.

【0017】樹脂やガラスに無電解メッキする方法は、
脱脂処理−エッチング処理−活性化処理(センシタイジ
ング・アクチベーティング)−無電解メッキのように、
一般に知られている方法が用いられる。銀メッキの場合
には最後の無電解メッキの工程で銀鏡反応が好適に用い
られる。また、最近、ノートパソコンの筐体などに電磁
波シールドを施す方法として主流工法となっている、積
層する面に触媒を含んだプライマーを塗装し、その上に
直接無電解メッキを施すという「片面メッキ」SST
(シングルサイドテクノロジー)法(工業材料Vol.44 N
o.9 p.56に記載)も本発明では好適に用いられる。
The method of electroless plating on resin or glass is as follows.
Degreasing process-Etching process-Activation process (Sensitizing / Activating)-Like electroless plating,
A generally known method is used. In the case of silver plating, a silver mirror reaction is suitably used in the last electroless plating step. In addition, recently, the mainstream method of applying electromagnetic wave shielding to the housing of notebook PCs, etc., is to apply a primer containing a catalyst on the surface to be laminated, and apply electroless plating directly on it. "SST
(Single Side Technology) Method (Industrial Materials Vol.44 N
o.9 p.56) are also preferably used in the present invention.

【0018】さらに、無電解メッキ後に電解メッキを施
してもかまわない。
Furthermore, electrolytic plating may be performed after electroless plating.

【0019】積層する金属薄膜の厚さは特に限定される
ものではないが、その後に行う研磨にかかる時間を短縮
するためにも10μm以下が好ましい。
The thickness of the metal thin film to be laminated is not particularly limited, but is preferably 10 μm or less in order to reduce the time required for the subsequent polishing.

【0020】金属薄膜を積層したら、次にその薄膜を所
望の可視光透過性が得られるまで、すなわち薄膜の厚み
が0.5μm以下、好ましくは0.4μm以下になるま
で研磨する。また一方、研磨後の膜厚の下の値としては
0.01μm以上であることが好ましい。研磨手段とし
ては、砥粒を用いて研磨する機械研磨、金属を溶解する
などの化学作用を用いる化学研磨、電解研磨などが挙げ
られるが、本発明では、最近、超精密研磨として半導体
製造分野で適用が進んでいる化学機械研磨法(Chem
ical Mechanical Polishin
g;以下CMPと略す)が好適に用いられる。
After laminating the metal thin film, the thin film is polished until a desired visible light transmittance is obtained, that is, until the thickness of the thin film becomes 0.5 μm or less, preferably 0.4 μm or less. On the other hand, the lower value of the film thickness after polishing is preferably 0.01 μm or more. Examples of the polishing means include mechanical polishing for polishing using abrasive grains, chemical polishing using a chemical action such as dissolving metal, electrolytic polishing, and the like.In the present invention, recently, in the semiconductor manufacturing field as ultra-precision polishing, Chemical mechanical polishing method (Chem
Ical Mechanical Polish
g; hereinafter abbreviated as CMP).

【0021】CMPとは、酸化膜や水和膜など表面膜の
生成やエッチングなどの化学的効果を有する加工液に硬
質超微細砥粒を分散したスラリー(研磨剤)を被加工面
と研磨布の間に供給し、被加工面と研磨布を相対運動さ
せることで、被加工面を超精密研磨する方法である。半
導体製造分野ではベアシリコンウエハーのポリッシング
やシリコン上に形成した化合物半導体やメタル配線など
の平坦化技術として適用されている。
CMP is a process in which a slurry (abrasive) in which hard ultrafine abrasive grains are dispersed in a working fluid having a chemical effect such as formation of an oxide film or a hydrated film or etching has a polishing surface. In this method, the workpiece surface is super-precisely polished by moving the polishing surface relative to the workpiece surface. In the field of semiconductor manufacturing, it has been applied as a polishing technique for polishing a bare silicon wafer or a flattening technique for a compound semiconductor or metal wiring formed on silicon.

【0022】本発明で用いられる硬質超微細砥粒として
は、CMP用研磨剤であれば特に限定されるものではな
いが、粒径が1μm以下のものが好ましく、さらには表
面平坦性の向上を考慮すると0.3μm以下のものがよ
り好ましい。砥粒の材質はコロイダルシリカ、酸化鉄
粉、炭酸バリウム粉、酸化ジルコニア粉、アルミナ粉、
酸化セリウム粉、二酸化マンガン粉の少なくとも1種が
好ましく、より好ましくは粒径0.2μm以下のコロイ
ダルシリカまたはアルミナ粉が好適に用いられる。
The hard ultrafine abrasive used in the present invention is not particularly limited as long as it is a polishing agent for CMP, but preferably has a particle size of 1 μm or less, and further improves the surface flatness. Considering this, those having a diameter of 0.3 μm or less are more preferable. The material of the abrasive grains is colloidal silica, iron oxide powder, barium carbonate powder, zirconia oxide powder, alumina powder,
At least one of cerium oxide powder and manganese dioxide powder is preferable, and more preferably, colloidal silica or alumina powder having a particle size of 0.2 μm or less is suitably used.

【0023】本発明で用いられる加工液としては、金属
薄膜の加工表面に酸化膜や水和膜を生成する作用のある
溶液、エッチング作用のある溶液が好適に用いられ、水
酸化カリウムの水溶液や過酸化水素水、アンモニア水な
どが例示される。
As the working fluid used in the present invention, a solution having an action of forming an oxide film or a hydrated film on the worked surface of the metal thin film and a solution having an etching action are preferably used. Examples thereof include aqueous hydrogen peroxide and aqueous ammonia.

【0024】本発明で用いられる研磨布としては、精密
研磨用の研磨布であれば特に限定されるものではない
が、金属薄膜層を一様に研磨するため、基板の反りやう
ねりにならうことが必要であり、そのような研磨布とし
て、例えばポリエステル繊維の不織布にポリウレタンを
含浸したタイプ(例えば、商品名:Subaシリーズ、
ロデール・ニッタ(株)製)、独立気泡を有するポリウ
レタン発泡タイプ(例えば、商品名:IC1000、M
Hシリーズ、ロデール・ニッタ(株)製)、スウェード
タイプ(例えば、商品名:Supremeシリーズ、ロ
デール・ニッタ(株)製)、二層タイプ(例えば、IC
1000とSubaを貼り合わせたもの、ロデール・ニ
ッタ(株)製)などが例示される。
The polishing cloth used in the present invention is not particularly limited as long as it is a polishing cloth for precision polishing. However, since the metal thin film layer is uniformly polished, the substrate is warped or undulated. As such a polishing cloth, for example, a type in which a non-woven fabric of polyester fiber is impregnated with polyurethane (for example, trade name: Suba series,
Rodel Nitta Co., Ltd.), polyurethane foam type having closed cells (for example, trade name: IC1000, M
H series, manufactured by Rodale Nitta Co., Ltd., suede type (for example, trade name: Supreme series, manufactured by Rodale Nitta Co., Ltd.), two-layer type (for example, IC
1000 and Suba, Rodale Nitta Co., Ltd.).

【0025】さらに本発明では、研磨により所望する可
視光透過性を得た後、金属薄膜層上に反射防止膜を形成
することが望ましい。反射防止膜としては、シリカ膜が
好ましく、スピンコーティングやスプレーコーティン
グ、スクリーン印刷、塗工などのコーティング方法で積
層される。
Further, in the present invention, it is desirable to form an antireflection film on the metal thin film layer after obtaining desired visible light transmittance by polishing. The antireflection film is preferably a silica film, and is laminated by a coating method such as spin coating, spray coating, screen printing, or coating.

【0026】[0026]

【実施例】以下に実施例によって本発明をさらに詳細に
説明するが、本発明はこれらの実施例によりなんら限定
されるものではない。
EXAMPLES The present invention will be described in more detail with reference to the following examples, but the present invention is not limited to these examples.

【0027】比較例1 240×180mmの大きさで、厚みが0.5mmのポ
リカーボネートを基板に用い、その片面に無電解メッキ
により銀の薄膜層を形成した。無電解メッキはまず、マ
スキングを施した基板を、硫酸540mL/L、クロム
酸25g/Lを含む水溶液に70℃で30分間浸漬して
基板をエッチングし、次に塩化第一すず20g/L、塩
酸5mL/Lの水溶液に25℃で5分間浸漬してセンシ
タイジングを行い、次に塩化パラジウム0.2g/L、
塩酸1mL/Lの水溶液に35℃で5分間浸漬してアク
チベーティングを行った。その後、硝酸銀60g/L、
28%アンモニア60g/L、37%ホルムアルデヒド
40mL/Lの溶液に室温で2分間浸漬して銀の薄膜を
形成した。得られた銀薄膜層の厚みは平均で1.5μm
であり、400〜700nmの範囲の可視光の透過性が
なく、透視性は全く得られなかった。
Comparative Example 1 Polycarbonate having a size of 240 × 180 mm and a thickness of 0.5 mm was used as a substrate, and a silver thin film layer was formed on one surface of the substrate by electroless plating. In the electroless plating, first, the masked substrate is immersed in an aqueous solution containing 540 mL / L of sulfuric acid and 25 g / L of chromic acid at 70 ° C. for 30 minutes to etch the substrate, and then, 20 g / L of stannous tin chloride, Sensitizing is performed by immersing in an aqueous solution of hydrochloric acid 5 mL / L for 5 minutes at 25 ° C., and then 0.2 g / L of palladium chloride,
Activating was performed by immersion in an aqueous solution of hydrochloric acid 1 mL / L at 35 ° C. for 5 minutes. Thereafter, silver nitrate 60 g / L,
It was immersed in a solution of 28% ammonia 60 g / L and 37% formaldehyde 40 mL / L at room temperature for 2 minutes to form a silver thin film. The average thickness of the obtained silver thin film layer is 1.5 μm.
No visible light transmittance in the range of 400 to 700 nm was obtained, and no transparency was obtained.

【0028】比較例2 比較例1において、無電解メッキ液の濃度および温度、
浸漬時間などの処理条件を変更して、銀薄膜層の厚みと
して可視光透過性が得られる0.4μm以下の厚みを得
るよう試みたところ、薄膜層の厚みが薄くなるにつれ、
基板全面にわたって均一な薄膜を安定して得ることが困
難になった。
Comparative Example 2 In Comparative Example 1, the concentration and temperature of the electroless plating solution,
By changing the processing conditions such as immersion time, and trying to obtain a thickness of 0.4μm or less at which visible light transmittance is obtained as the thickness of the silver thin film layer, as the thickness of the thin film layer became thinner,
It has become difficult to stably obtain a uniform thin film over the entire surface of the substrate.

【0029】実施例1 比較例1と同じ方法で、ポリカーボネート基板の片面に
平均厚み1.5μmの銀薄膜層を形成した。その後、こ
の銀薄膜層をCMPにより研磨した。スラリーには粒子
径230nmのアルミナを過酸化水素水に懸濁したもの
を用い、研磨布にはロデール・ニッタ製のSuba40
0を用いた。回転定盤の回転速度60rpm、加工圧力
200g/cm2で10分間研磨した。
Example 1 In the same manner as in Comparative Example 1, a silver thin film layer having an average thickness of 1.5 μm was formed on one surface of a polycarbonate substrate. Thereafter, the silver thin film layer was polished by CMP. A slurry in which alumina having a particle diameter of 230 nm is suspended in a hydrogen peroxide solution is used as the slurry, and Suba40 manufactured by Rodel Nitta is used as the polishing cloth.
0 was used. Polishing was performed for 10 minutes at a rotation speed of a rotary platen of 60 rpm and a processing pressure of 200 g / cm 2 .

【0030】研磨後の銀薄膜層は、厚みが0.22μ
m、表面粗さが10nm以下であり、基板全面にわたっ
て均一で厚みむらの非常に小さい銀薄膜が得られた。こ
のものの400〜700nmの範囲の可視光の透過率は
平均して80%であり、透視性を十分満足する透過率が
得られた。さらに、こうして得た電磁波シールドパネル
の表面抵抗値は0.3Ω/□であり、測定距離10mで
の電磁波シールド効果は、30MHz〜230MHzの
範囲でおよそ45dB、230MHz〜1000MHz
の範囲でおよそ53dBであり、情報処理装置等電波障
害自主規制協議会(VCCI)の測定距離10mでのク
ラスAの許容値を充分満足するシールド効果を有するも
のであった。
The polished silver thin film layer has a thickness of 0.22 μm.
m, the surface roughness was 10 nm or less, and a silver thin film having a uniform thickness and a very small thickness unevenness over the entire surface of the substrate was obtained. The transmittance of visible light in the range of 400 to 700 nm was 80% on average, and a transmittance sufficiently satisfying the visibility was obtained. Further, the surface resistance value of the electromagnetic wave shielding panel thus obtained is 0.3Ω / □, and the electromagnetic wave shielding effect at a measurement distance of 10 m is approximately 45 dB in the range of 30 MHz to 230 MHz, and 230 MHz to 1000 MHz.
And a shielding effect that sufficiently satisfies the allowable value of Class A at a measuring distance of 10 m measured by the Voluntary Control Council for Interference by Information Technology Equipment (VCCI).

【0031】[0031]

【発明の効果】本発明によれば、CRT、LCD、PD
P、EL、LEDなどのディスプレイおよびそれらの前
面に設置されるフィルターとして適用可能な、ガラスや
樹脂基板に金属薄膜を積層した電磁波シールド材料にお
いて、電磁波シールド効果、可視光透過性、基板と金属
薄膜との密着性、金属薄膜の均一性に優れた電磁波シー
ルド材料を、安価なコストで製造するための方法を提供
することができる。
According to the present invention, CRT, LCD, PD
Electromagnetic wave shielding material, visible light transmission, substrate and metal thin film, which can be applied as a display such as P, EL, LED, etc., and a metal thin film laminated on a glass or resin substrate, which can be applied as a filter installed in front of them A method for manufacturing an electromagnetic wave shielding material having excellent adhesion to a thin film and uniformity of a metal thin film at a low cost can be provided.

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2K009 BB02 BB11 CC14 DD08 DD16 EE00 5E321 AA04 BB23 GG05 GH01 5G435 AA16 AA17 GG11 GG33 HH02 KK07  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2K009 BB02 BB11 CC14 DD08 DD16 EE00 5E321 AA04 BB23 GG05 GH01 5G435 AA16 AA17 GG11 GG33 HH02 KK07

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 ガラスまたは樹脂からなる基板の少なく
とも片側の面に、導電性を有する金属の薄膜を積層し、
しかる後にその金属薄膜層を研磨することを特徴とする
可視光透過性電磁波シールド材料の製造方法。
A thin film of a conductive metal is laminated on at least one surface of a substrate made of glass or resin,
A method for producing a visible light transmitting electromagnetic wave shielding material, which comprises polishing the metal thin film layer thereafter.
【請求項2】 研磨手段に化学機械研磨法を用いること
を特徴とする請求項1記載の可視光透過性電磁波シール
ド材料の製造方法。
2. The method for manufacturing a visible light transmitting electromagnetic wave shielding material according to claim 1, wherein a chemical mechanical polishing method is used for the polishing means.
【請求項3】 導電性を有する金属の薄膜を積層するた
めの手段に、無電解メッキ法を用いることを特徴とする
請求項1または2記載の可視光透過性電磁波シールド材
料の製造方法。
3. The method for manufacturing a visible light transmitting electromagnetic wave shielding material according to claim 1, wherein an electroless plating method is used as a means for laminating a conductive metal thin film.
【請求項4】基板がガラスまたは樹脂からなるものであ
る請求項1〜3いずれかに記載の可視光透過性電磁波シ
ールド材料の製造方法。
4. The method for producing a visible light transmitting electromagnetic wave shielding material according to claim 1, wherein the substrate is made of glass or resin.
JP10222800A 1998-08-06 1998-08-06 Manufacture of electromagnetic wave shielding material Pending JP2000059081A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10222800A JP2000059081A (en) 1998-08-06 1998-08-06 Manufacture of electromagnetic wave shielding material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10222800A JP2000059081A (en) 1998-08-06 1998-08-06 Manufacture of electromagnetic wave shielding material

Publications (1)

Publication Number Publication Date
JP2000059081A true JP2000059081A (en) 2000-02-25

Family

ID=16788104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10222800A Pending JP2000059081A (en) 1998-08-06 1998-08-06 Manufacture of electromagnetic wave shielding material

Country Status (1)

Country Link
JP (1) JP2000059081A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007037545A1 (en) * 2005-09-30 2007-04-05 Fujifilm Corporation Method for producing conductive film and light-sensitive material for conductive film production

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007037545A1 (en) * 2005-09-30 2007-04-05 Fujifilm Corporation Method for producing conductive film and light-sensitive material for conductive film production
US7749686B2 (en) 2005-09-30 2010-07-06 Fujifilm Corporation Method for producing conductive film and light-sensitive material for conductive film production

Similar Documents

Publication Publication Date Title
EP0890136B1 (en) Two-dimensionally balanced positioning device with two object holders, and lithographic device provided with such a positioning device
US6188174B1 (en) Electromagnetic radiation shield panel and method of producing the same
JP6556177B2 (en) Electromagnetic wave transmitting metal film, method of forming electromagnetic wave transmitting metal film, and on-vehicle radar device
JP2013242725A (en) Cover glass for track pad and method of manufacturing the same
JP2007329461A (en) Method for manufacturing electromagnetic wave shielding light transmitting window material, and electromagnetic wave shielding light transmitting window material
KR20080100447A (en) Manufacturing method of light transmitting electromagnetic shielding material, light transmitting electromagnetic shielding material and filter for display
KR101160731B1 (en) Electromagnetic wave shielding film and method for producing same
JP4465740B2 (en) Electrode substrate manufacturing method
JP2009129969A (en) Image forming method, light-transmissive electromagnetic wave shielding material manufacturing method, and light-transmissive electromagnetic wave shielding material
KR100765363B1 (en) Manufacturing method of electroconductive particle
EP1558067A1 (en) Electromagnetic wave shielding light transmitting window material and process for producin the same
JP2000059081A (en) Manufacture of electromagnetic wave shielding material
JP3473272B2 (en) Coating liquid for conductive film formation and conductive film
JP2021103514A (en) Touch panel and formation method thereof
JP3713774B2 (en) Transparent electromagnetic shielding board
JPH01278800A (en) Static electricity and electromagnetic wave shielding material
JP2003051463A (en) Method for manufacturing metal wiring and metal wiring board using the method
JP2000059083A (en) Electromagnetic wave shielding transparent substance
US20030099849A1 (en) Electrochromic material and method for making the same
JP3681280B2 (en) Optical filter for display
JPH10163673A (en) Electromagnetic wave shielding panel and its manufacture
JP2000040896A (en) Electromagnetic wave-shielding material, its manufacturing method, and product with measures for shielding electromagnetic wave
JP2001030409A (en) Production of transparent conductive laminate
JP2002170429A (en) Substrate having high-density catalyst nucleus dispersion layer, conductive article having modified zinc oxide film, and method for producing same
WO2010041675A1 (en) Light transparent electromagnetic wave shielding material and process for producing same