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IT201700070601A1 - Rilevatore veloce di radiazione elettromagnetica. - Google Patents

Rilevatore veloce di radiazione elettromagnetica.

Info

Publication number
IT201700070601A1
IT201700070601A1 IT102017000070601A IT201700070601A IT201700070601A1 IT 201700070601 A1 IT201700070601 A1 IT 201700070601A1 IT 102017000070601 A IT102017000070601 A IT 102017000070601A IT 201700070601 A IT201700070601 A IT 201700070601A IT 201700070601 A1 IT201700070601 A1 IT 201700070601A1
Authority
IT
Italy
Prior art keywords
electromagnetic radiation
radiation detector
fast electromagnetic
fast
detector
Prior art date
Application number
IT102017000070601A
Other languages
English (en)
Inventor
Davide Scorticati
Sergio Pellegrino
Giacomo Crapella
Original Assignee
Laser Point S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Laser Point S R L filed Critical Laser Point S R L
Priority to IT102017000070601A priority Critical patent/IT201700070601A1/it
Priority to CN201880040816.3A priority patent/CN110770549B/zh
Priority to LTEPPCT/EP2018/066474T priority patent/LT3642574T/lt
Priority to KR1020207002305A priority patent/KR102632141B1/ko
Priority to US16/621,801 priority patent/US11067434B2/en
Priority to EP18733247.3A priority patent/EP3642574B8/en
Priority to ES18733247T priority patent/ES2941513T3/es
Priority to CA3066538A priority patent/CA3066538A1/en
Priority to JP2019570399A priority patent/JP7249963B2/ja
Priority to PCT/EP2018/066474 priority patent/WO2018234406A2/en
Publication of IT201700070601A1 publication Critical patent/IT201700070601A1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/16—Material structures, e.g. crystalline structures, film structures or crystal plane orientations
    • H10F77/162—Non-monocrystalline materials, e.g. semiconductor particles embedded in insulating materials
    • H10F77/164—Polycrystalline semiconductors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
    • H10N10/01—Manufacture or treatment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4295—Photometry, e.g. photographic exposure meter using electric radiation detectors using a physical effect not covered by other subgroups of G01J1/42

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Light Receiving Elements (AREA)
  • Measurement Of Radiation (AREA)
IT102017000070601A 2017-06-23 2017-06-23 Rilevatore veloce di radiazione elettromagnetica. IT201700070601A1 (it)

Priority Applications (10)

Application Number Priority Date Filing Date Title
IT102017000070601A IT201700070601A1 (it) 2017-06-23 2017-06-23 Rilevatore veloce di radiazione elettromagnetica.
CN201880040816.3A CN110770549B (zh) 2017-06-23 2018-06-20 电磁辐射快速探测器
LTEPPCT/EP2018/066474T LT3642574T (lt) 2017-06-23 2018-06-20 Greitas elektromagnetinės spinduliuotės detektorius
KR1020207002305A KR102632141B1 (ko) 2017-06-23 2018-06-20 전자기 방사선의 고속 검출기
US16/621,801 US11067434B2 (en) 2017-06-23 2018-06-20 Fast detector of electromagnetic radiation
EP18733247.3A EP3642574B8 (en) 2017-06-23 2018-06-20 Fast detector of electromagnetic radiation
ES18733247T ES2941513T3 (es) 2017-06-23 2018-06-20 Detector rápido de radiación electromagnética
CA3066538A CA3066538A1 (en) 2017-06-23 2018-06-20 Fast detector of electromagnetic radiation
JP2019570399A JP7249963B2 (ja) 2017-06-23 2018-06-20 電磁放射の高速検出器
PCT/EP2018/066474 WO2018234406A2 (en) 2017-06-23 2018-06-20 Fast detector of electromagnetic radiation.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000070601A IT201700070601A1 (it) 2017-06-23 2017-06-23 Rilevatore veloce di radiazione elettromagnetica.

Publications (1)

Publication Number Publication Date
IT201700070601A1 true IT201700070601A1 (it) 2018-12-23

Family

ID=60081224

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102017000070601A IT201700070601A1 (it) 2017-06-23 2017-06-23 Rilevatore veloce di radiazione elettromagnetica.

Country Status (10)

Country Link
US (1) US11067434B2 (it)
EP (1) EP3642574B8 (it)
JP (1) JP7249963B2 (it)
KR (1) KR102632141B1 (it)
CN (1) CN110770549B (it)
CA (1) CA3066538A1 (it)
ES (1) ES2941513T3 (it)
IT (1) IT201700070601A1 (it)
LT (1) LT3642574T (it)
WO (1) WO2018234406A2 (it)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT201700070606A1 (it) * 2017-06-23 2018-12-23 Laser Point S R L Rilevatore di radiazione elettromagnetica.
CN115666203B (zh) 2022-12-26 2023-06-16 山东大学 热流传感器
TWI854733B (zh) * 2023-07-06 2024-09-01 瑞昱半導體股份有限公司 熱電致冷晶片及其製作方法和封裝結構

Citations (5)

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US20030118076A1 (en) * 2001-09-10 2003-06-26 Perkinelmer Optoelectronics Gmbh Sensor for a contact-free temperature measurement
US20040102051A1 (en) * 2002-06-27 2004-05-27 Harald Bottner Methods for producing a thermoelectric layer structure and components with a thermoelectric layer structure
US20110024604A1 (en) * 2009-02-20 2011-02-03 Panasonic Corporation Radiation detector and radiation detection method
US20110291012A1 (en) * 2010-05-27 2011-12-01 Panasonic Corporation Thermoelectric conversion device, and radiation detector and radiation detection method using the same
US20140091304A1 (en) * 2012-10-02 2014-04-03 Robert Semerad Laser power and energy sensor utilizing anisotropic thermoelectric material

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US5295218A (en) * 1992-09-29 1994-03-15 Eastman Kodak Company Frequency conversion in inorganic thin film waveguides by quasi-phase-matching
JPH07283429A (ja) * 1994-04-04 1995-10-27 Hitachi Ltd 薄膜太陽電池の製造方法
US5678924A (en) 1995-09-25 1997-10-21 Coherent Inc. Power meter head for laser power measurement apparatus
WO1998024944A1 (de) * 1996-12-06 1998-06-11 THEVA DüNNSCHICHTTECHNIK GMBH Schichtmaterial sowie vorrichtung und verfahren zum herstellen von schichtmaterial
JP2001135868A (ja) * 1999-11-08 2001-05-18 Sumitomo Special Metals Co Ltd 熱電変換素子
DE10045419B4 (de) * 2000-09-14 2007-12-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Herstellung eines thermoelektrischen Bauelements, thermoelektrisches Bauelement sowie Vorrichtung zur Durchführung des Verfahrens
JP2003130727A (ja) 2001-10-22 2003-05-08 Canon Inc 光強度測定装置、光強度測定方法、光検出装置およびデータ処理装置
JP3550390B2 (ja) * 2002-04-24 2004-08-04 京セラ株式会社 熱電変換素子及び熱電モジュール
JPWO2006114999A1 (ja) * 2005-04-18 2008-12-18 国立大学法人京都大学 化合物半導体装置及び化合物半導体製造方法
CN101356657B (zh) 2006-11-10 2010-04-21 松下电器产业株式会社 使用热发电元件的发电方法、热发电元件及其制造方法、热发电器件
JP5019964B2 (ja) 2007-06-15 2012-09-05 株式会社リコー 偏光変換素子及び積層型偏光変換素子
DE102008011809A1 (de) * 2007-12-20 2009-06-25 Osram Opto Semiconductors Gmbh Optoelektronisches Bauelement
KR101249292B1 (ko) * 2008-11-26 2013-04-01 한국전자통신연구원 열전소자, 열전소자 모듈, 및 그 열전 소자의 형성 방법
US20120090657A1 (en) * 2009-06-15 2012-04-19 Soonil Lee Reduced low symmetry ferroelectric thermoelectric systems, methods and materials
JP5406082B2 (ja) 2010-03-15 2014-02-05 セイコーインスツル株式会社 サーモパイル型赤外線センサおよびその製造方法
PT105039A (pt) * 2010-04-06 2011-10-06 Univ Nova De Lisboa Ligas de óxidos tipo p baseados em óxidos de cobre, óxidos estanho, óxidos de ligas de estanho-cobre e respectiva liga metálica, e óxido de níquel, com os respectivos metais embebidos, respectivo processo de fabrico e utilização
JP2011243824A (ja) * 2010-05-20 2011-12-01 Panasonic Corp 異方的熱電材料とこれを用いた放射検出器および発電デバイス
US9059346B2 (en) 2012-10-02 2015-06-16 Coherent, Inc. Laser power and energy sensor utilizing anisotropic thermoelectric material
US20140332048A1 (en) * 2013-05-08 2014-11-13 Vern Green Power Solutions, Llc Thermoelectric device
JP6247771B2 (ja) 2014-09-08 2017-12-13 富士フイルム株式会社 熱電変換素子および熱電変換モジュール
CH710704A1 (de) 2015-02-09 2016-08-15 Greenteg Ag Thermoelektrischer Sensor und Herstellungsverfahren.
IT201700070606A1 (it) 2017-06-23 2018-12-23 Laser Point S R L Rilevatore di radiazione elettromagnetica.

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030118076A1 (en) * 2001-09-10 2003-06-26 Perkinelmer Optoelectronics Gmbh Sensor for a contact-free temperature measurement
US20040102051A1 (en) * 2002-06-27 2004-05-27 Harald Bottner Methods for producing a thermoelectric layer structure and components with a thermoelectric layer structure
US20110024604A1 (en) * 2009-02-20 2011-02-03 Panasonic Corporation Radiation detector and radiation detection method
US20110291012A1 (en) * 2010-05-27 2011-12-01 Panasonic Corporation Thermoelectric conversion device, and radiation detector and radiation detection method using the same
US20140091304A1 (en) * 2012-10-02 2014-04-03 Robert Semerad Laser power and energy sensor utilizing anisotropic thermoelectric material

Also Published As

Publication number Publication date
CA3066538A1 (en) 2018-12-27
WO2018234406A2 (en) 2018-12-27
EP3642574B1 (en) 2023-02-15
JP2020524791A (ja) 2020-08-20
EP3642574B8 (en) 2023-03-08
ES2941513T3 (es) 2023-05-23
US20210156737A1 (en) 2021-05-27
CN110770549B (zh) 2023-04-14
EP3642574A2 (en) 2020-04-29
KR102632141B1 (ko) 2024-01-31
CN110770549A (zh) 2020-02-07
WO2018234406A3 (en) 2019-02-21
US11067434B2 (en) 2021-07-20
LT3642574T (lt) 2023-05-10
JP7249963B2 (ja) 2023-03-31
KR20200018692A (ko) 2020-02-19

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