[go: up one dir, main page]

IN2015DE00244A - - Google Patents

Info

Publication number
IN2015DE00244A
IN2015DE00244A IN244DE2015A IN2015DE00244A IN 2015DE00244 A IN2015DE00244 A IN 2015DE00244A IN 244DE2015 A IN244DE2015 A IN 244DE2015A IN 2015DE00244 A IN2015DE00244 A IN 2015DE00244A
Authority
IN
India
Prior art keywords
pressure change
generator
stress
image
pressure
Prior art date
Application number
Inventor
Takaaki Konishi
Tetsuya Matsui
Yoshiaki Nagashima
Hiroyuki Nakano
Hirohisa Mizota
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of IN2015DE00244A publication Critical patent/IN2015DE00244A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/08—Testing mechanical properties
    • G01M11/081—Testing mechanical properties by using a contact-less detection method, i.e. with a camera
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0041—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining deflection or stress
    • G01M5/005—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining deflection or stress by means of external apparatus, e.g. test benches or portable test systems
    • G01M5/0058—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining deflection or stress by means of external apparatus, e.g. test benches or portable test systems of elongated objects, e.g. pipes, masts, towers or railways
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0091—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by using electromagnetic excitation or detection
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B37/00—Panoramic or wide-screen photography; Photographing extended surfaces, e.g. for surveying; Photographing internal surfaces, e.g. of pipe
    • G03B37/005—Photographing internal surfaces, e.g. of pipe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electromagnetism (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)

Abstract

To provide a surface inspection apparatus and surface inspection method for structures, adapted to inspect a surface of a structure more rapidly and improve inspection efficiency. This invention includes a pressure change generator (device) 5 that generates a change in pressure upon that surface of a structure 1 to be inspected that includes a stress-induced luminescent structural member 2 disposed to emit light according to stress, the pressure change generator 5 being configured to generate the pressure change while moving in a direction that the surface of the structure 1 extends, an imaging device 6 that moves integrally with the pressure change generator 5 and images that region on the surface of the structure 1 where the pressure change is occurring, and an image-processing unit 7 that detects defects on the surface of the structure 1 from an image of the structure 1 that the imaging device 6 acquires.
IN244DE2015 2014-03-31 2015-01-28 IN2015DE00244A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014072761A JP6334991B2 (en) 2014-03-31 2014-03-31 Structure surface inspection system and surface inspection method

Publications (1)

Publication Number Publication Date
IN2015DE00244A true IN2015DE00244A (en) 2015-10-02

Family

ID=52468938

Family Applications (1)

Application Number Title Priority Date Filing Date
IN244DE2015 IN2015DE00244A (en) 2014-03-31 2015-01-28

Country Status (4)

Country Link
EP (1) EP2927659B1 (en)
JP (1) JP6334991B2 (en)
CN (1) CN104949985A (en)
IN (1) IN2015DE00244A (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6532104B2 (en) 2015-09-30 2019-06-19 日立オートモティブシステムズ株式会社 Hydraulic control device and brake system
CN106323986B (en) * 2016-09-18 2019-03-12 山西省交通科学研究院 A kind of image collecting device and method for vcehicular tunnel Defect inspection
JP6870849B2 (en) * 2017-04-28 2021-05-12 国立研究開発法人産業技術総合研究所 Structure repair method and repair evaluation device
CN107333046B (en) * 2017-08-14 2019-06-25 成都中信华瑞科技有限公司 Collecting method and Tunnel testing vehicle
WO2019163556A1 (en) * 2018-02-22 2019-08-29 パナソニックＩｐマネジメント株式会社 Inspection device and inspection method
CN108918017B (en) * 2018-03-30 2019-09-13 中国科学院长春应用化学研究所 A method for measuring gas pressure
WO2020003818A1 (en) * 2018-06-28 2020-01-02 パナソニックＩｐマネジメント株式会社 Inspection instrument and inspection method
CN109143233A (en) * 2018-09-10 2019-01-04 清华四川能源互联网研究院 Flood discharging tunnel detection system and method

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2963284B2 (en) * 1992-07-24 1999-10-18 財団法人鉄道総合技術研究所 Tunnel inspection equipment
JP3448593B2 (en) * 2000-01-19 2003-09-22 農工大ティー・エル・オー株式会社 Civil structure flaw detection method
JP2001264302A (en) * 2000-03-17 2001-09-26 Murakami Yukitaka Method and apparatus for inspecting concrete structure in non-contact state
SE518997C2 (en) * 2001-04-02 2002-12-17 Impressonic Ab Method and apparatus for detecting damage in materials or articles
JP2002310920A (en) * 2001-04-19 2002-10-23 Keisoku Kensa Kk Method for detecting crack in concrete wall and device thereof
JP4524357B2 (en) * 2004-07-26 2010-08-18 独立行政法人産業技術総合研究所 Stress-stimulated luminescent composition containing anisotropic stress-stimulated luminescent material and method for producing the same
US7769550B2 (en) * 2005-02-09 2010-08-03 National Institute Of Advanced Industrial Science And Technology Stress analysis method and stress analysis apparatus
JP5007978B2 (en) * 2007-09-21 2012-08-22 独立行政法人産業技術総合研究所 Method and system for detecting structural defects
WO2009037914A1 (en) * 2007-09-21 2009-03-26 National Institute Of Advanced Industrial Science And Technology Method and system for detecting defect of structure
EP2503326A4 (en) * 2009-11-20 2015-04-15 Nat Inst Of Advanced Ind Scien DEFECT STUDY METHOD, WAFER PLATE SUBJECT TO DEFECT STUDY OR SEMICONDUCTOR ELEMENT MADE BY MEANS OF SUCH WAFER, QUALITY CONTROL METHOD FOR WAFERS OR SEMICONDUCTOR ELEMENTS AND DEVICE FOR DETECTING DEFECTS
JP5342987B2 (en) * 2009-12-02 2013-11-13 三井住友建設株式会社 Concrete surface inspection equipment

Also Published As

Publication number Publication date
EP2927659A1 (en) 2015-10-07
JP6334991B2 (en) 2018-05-30
CN104949985A (en) 2015-09-30
EP2927659B1 (en) 2018-01-10
JP2015194418A (en) 2015-11-05

Similar Documents

Publication Publication Date Title
IN2015DE00244A (en)
IL265282B1 (en) Illumination source for an inspection apparatus, inspection apparatus and inspection method
EP3270144A4 (en) Device for capturing image of object to be inspected, method for capturing image of object to be inspected, surface inspecting device and surface inspecting method
IL254078A0 (en) System and method for generating images for inspection
TW201614383A (en) Method of measuring a property of a target structure, inspection apparatus, lithographic system and device manufacturing method
EP3889590A3 (en) Apparatus for inspecting a substrate for a foreign substance
IN2014DN06211A (en)
EP4354162A3 (en) Apparatus, method and computer program product for defect detection in work pieces
EP3043329A3 (en) Image processing apparatus, image processing method, and program
MX2017004962A (en) Oil leakage detection device and method.
IL266515A (en) Illumination source for an inspection apparatus, inspection apparatus and inspection method
WO2016062785A3 (en) Smart photonic imaging method and apparatus
TW201612504A (en) Inspection apparatus and inspection method
EP3120382A4 (en) An image sensor, an inspection system and a method of inspecting an article
MX352270B (en) Apparatus and method for marking edible object.
TW201614586A (en) Repeater detection
EP3699817A3 (en) Liveness testing methods and apparatuses and image processing methods and apparatuses
EP3216212A4 (en) Image sensor apparatus and method for simultaneously capturing flash and ambient illuminated images
MX380196B (en) METHOD, DEVICE AND INSPECTION LINE FOR VISUALIZING THE SURFACE FLATNESS OF A VESSEL RING.
WO2012161874A3 (en) Contour-based defect detection using an inspection apparatus
EP3023942A3 (en) Image processing apparatus and method
BR112018011850A2 (en) method and apparatus for checking a tire
MX394416B (en) INSPECTION METHOD, INSPECTION AND NOTIFICATION METHOD, MANUFACTURING METHOD INCLUDING INSPECTION METHOD, INSPECTION APPARATUS AND MANUFACTURING APPARATUS.
GB2548469B (en) Method and apparatus for generating an image
EP4254330A3 (en) Flaw detection device and flaw detection method