HK1247657B - Measuring a spatiotemporal relationship between two of more positions of a vibratory element - Google Patents

Description

Measuring the spatiotemporal relationship between two or more positions of a vibrating element

Technical Field

The embodiments described below relate to measuring the spatiotemporal relationship of two or more positions, and more particularly, to measuring the spatiotemporal relationship between two or more positions of a vibrating element.

Background Art

Vibrating meters, such as Coriolis flow meters, typically include a sensor device with one or more vibrating elements. These elements can be flow tubes, tuning forks, or other devices that carry or suspend the material to be measured. A driver vibrates the one or more vibrating elements, inducing a response from the sensor device. The response from the sensor device is used to determine the material's properties.

To measure the response, the sensor arrangement may include two or more pickoff sensors that can be used to determine the spatiotemporal relationship between two or more locations on the vibrating element. For example, a first pickoff sensor can be at a first position and a second pickoff sensor can be at a second position. Each of the pickoff sensors can measure a spatiotemporal property, such as velocity, displacement, or acceleration. The measurements from the two or more sensors can be combined to determine the spatiotemporal relationship between the two or more locations. For example, the signals from the two or more sensors can be subtracted to determine a phase difference between the two or more locations.

The spatiotemporal relationship between the two or more locations can correspond to a material property. For example, in a Coriolis flowmeter, the phase difference between the first and second locations can be correlated to the flow rate of the fluid flowing through a vibrating tube. By determining the phase difference between the two or more locations on the vibrating tube, the flow rate can be determined. Other properties can also be determined, and other spatiotemporal relationships can be employed.

While the two or more sensors at the two or more locations can be used to determine the spatiotemporal relationship between the two or more locations, it may be advantageous to use alternative designs that do not employ the two or more sensors. For example, it may be advantageous to employ a single sensor that measures the spatiotemporal relationship. Advantages may include a simpler vibration sensor device design and more reliable measurements. Accordingly, there is a need for measuring the spatiotemporal relationship between two or more locations of a vibrating element.

Summary of the Invention

A transmitter-sensor arrangement for measuring a spatiotemporal relationship between two or more positions of a vibrating element is provided. According to an embodiment, the transmitter-sensor arrangement includes a transmitter substantially fixedly coupled to a first position of the vibrating element. The transmitter is configured to transmit electromagnetic radiation toward a second position of the vibrating element. The transmitter-sensor arrangement also includes a sensor substantially fixedly coupled to the first position of the vibrating element. The sensor is configured to receive electromagnetic radiation reflected from the second position of the vibrating element.

A method for measuring a spatiotemporal relationship between two or more positions of a vibrating element is provided. According to an embodiment, the method includes emitting electromagnetic radiation from a first position of the vibrating element, reflecting the electromagnetic radiation from a second position of the vibrating element, and receiving the electromagnetic radiation reflected from the second position. The electromagnetic radiation is received by a sensor securely coupled to the first position.

A system for measuring a spatiotemporal relationship between two or more positions of a vibrating element is provided. According to an embodiment, the system includes an emitter-sensor arrangement securely coupled to a first position of the vibrating element, and a reflective surface disposed at one of a second position of the vibrating element and a reflective surface disposed remotely from the second position of the vibrating element. The emitter-sensor arrangement is configured to emit electromagnetic radiation toward the second position of the vibrating element and receive electromagnetic radiation reflected from the second position.

All aspects

According to one aspect, a transmitter-sensor arrangement (100) for measuring a spatiotemporal relationship between two or more positions of a vibrating element (12) includes a transmitter (110) generally firmly coupled to a first position (12a) of the vibrating element (12), the transmitter (110) being configured to transmit electromagnetic radiation (112) toward a second position (12b) of the vibrating element (12), and a sensor (120) generally firmly coupled to the first position (12a) of the vibrating element (12), the sensor (120) being configured to receive electromagnetic radiation (112) reflected from the second position (12b) of the vibrating element (12).

Preferably, the emitter-sensor arrangement (100) comprises a lens (130) positioned to receive electromagnetic radiation (112) reflected from the second position (12b) of the vibrating element (12) and to direct the electromagnetic radiation (112) towards the sensor (120).

Preferably, at least one of the transmitter (110) and the sensor (120) is disposed at a first position (12a).

Preferably, at least one of the transmitter (110) and the sensor (120) is disposed away from the first location (12a).

Preferably, the emitter (110) is a light emitting diode or a laser.

Preferably, the sensor (120) is a position sensor detector that detects the position of the electromagnetic radiation (112) on a sensing region (122) of a photodiode.

Preferably, the vibrating element (12) is a flow tube in the flow meter (5).

According to one aspect, a method for measuring a spatiotemporal relationship between two or more positions of a vibrating element includes emitting electromagnetic radiation from a first position of the vibrating element, reflecting the electromagnetic radiation from a second position of the vibrating element, and receiving the electromagnetic radiation reflected from the second position, the electromagnetic radiation being received by a sensor securely coupled to the first position.

Preferably, the method further comprises determining movement of the second location along the axis relative to the position of the first location on the axis.

Preferably, the method further comprises vibrating the vibrating element with a driver, wherein the vibrating element comprises a flow tube in the flow meter, and twisting the vibrating element with a Coriolis force such that the second position is displaced relative to the first position.

Preferably, reflecting electromagnetic radiation from the second location comprises reflecting electromagnetic radiation from a surface of the vibrating element at the second location.

Preferably, reflecting the electromagnetic radiation from the second location comprises reflecting the electromagnetic radiation from a surface securely coupled to the second location.

According to one aspect, a system (15) for measuring a spatiotemporal relationship between two or more positions of a vibrating element (12) includes an emitter-sensor arrangement (100) securely coupled to a first position (12a) of the vibrating element (12) and a reflective surface (200) disposed at and away from a second position (12b) of the vibrating element (12), wherein the emitter-sensor arrangement (100) is configured to emit electromagnetic radiation (112) toward the second position (12b) of the vibrating element (12) and receive electromagnetic radiation (112) reflected from the second position (12b).

Preferably, the reflective surface (200) is part of the vibrating element (12) at the second position (12b).

Preferably, the reflective surface (200) is a surface that is firmly coupled to the second location (12b).

Preferably, the emitter-sensor arrangement (100) comprises an emitter (110) substantially firmly coupled to a first location (12a) of the vibrating element (12), the emitter (110) being configured to emit electromagnetic radiation (112) toward a second location (12b) of the vibrating element (12), and a sensor (120) substantially firmly coupled to the first location (12a) of the vibrating element (12), the sensor (120) being configured to receive electromagnetic radiation (112) reflected from the second location (12b) of the vibrating element (12).

Preferably, the electromagnetic radiation (112) is light.

BRIEF DESCRIPTION OF THE DRAWINGS

Like reference numerals represent like elements throughout the drawings. It should be understood that the drawings are not necessarily to scale.

1 and 2 illustrate front and side views, respectively, of a system 15 for measuring a spatiotemporal relationship between two or more positions of a vibrating element 12, according to an embodiment.

3 and 4 show bottom perspective views of the sensor device 10 described above with reference to FIGS. 1 and 2 .

5 , 6 and 7 show cross-sectional views of the system 15 taken from FIG. 1 .

FIG8 shows a perspective view of the emitter-sensor arrangement 100 described above.

FIG9 illustrates a method 900 for measuring a spatiotemporal relationship between two or more positions of a vibrating element according to an embodiment.

DETAILED DESCRIPTION

Figures 1-9 and the following description depict specific examples to teach those skilled in the art how to make and use the best mode of an embodiment of measuring the spatiotemporal relationship between two or more positions of a vibrating element. For the purpose of teaching the principles of the invention, some conventional aspects have been simplified or omitted. Those skilled in the art will appreciate from these examples variations that fall within the scope of this description. Those skilled in the art will appreciate that the features described below can be combined in various ways to form multiple variations of measuring the spatiotemporal relationship between two or more positions of a vibrating element. As a result, the embodiments described below are not limited to the specific examples described below, but are limited only by the claims and their equivalents.

The following specific example includes a system having an emitter-sensor assembly securely coupled to a first location of a vibrating element. A transmitter in the emitter-sensor assembly transmits electromagnetic radiation toward a second location of the vibrating element. A reflective surface located at or remote from the second location reflects the electromagnetic radiation toward the first location. A sensor in the emitter-sensor assembly receives the electromagnetic radiation. The sensor can provide a signal proportional to the location of the electromagnetic radiation received by the sensor. This signal can be provided to electronics, such as meter electronics, which can use the signal to calculate a spatiotemporal relationship between the first and second locations on the vibrating element.

Figures 1 and 2 show front and side views, respectively, of a system 15 for measuring the spatiotemporal relationship between two or more positions of a vibrating element 12, according to an embodiment. As shown in Figures 1 and 2, system 15 is employed in a flow meter 5, which includes a sensor assembly 10 and meter electronics 20. Sensor assembly 10 includes two flow tubes (one flow tube is shown due to the depicted front view) and a driver 14. Surrounding sensor assembly 10 is a housing 16 extending from an inlet 5a and an outlet 5b. Inlet 5a and outlet 5b are coupled to vibrating element 12 in sensor assembly 10. Also shown in Figure 1 is a cross-sectional line view 5.

Vibrating element 12 is one of the flow tubes shown in Figures 1 and 2. Vibrating element 12 has a first location 12a and a second location 12b. An emitter-sensor assembly 100 is disposed at first location 12a and communicatively coupled to meter electronics 20. Emitter-sensor assembly 100 emits electromagnetic radiation 112 toward second location 12b. Electromagnetic radiation 112 is reflected by reflective surface 220, which is the surface of vibrating element 12 at second location 12b. Emitter-sensor assembly 100 receives the reflected electromagnetic radiation 112. As will be explained in greater detail below with reference to Figures 5, 6, and 7, system 15—which, in the illustrated embodiment, includes emitter-sensor assembly 100 and reflective surface 200—can measure the spatiotemporal relationship between first location 12a and second location 12b.

Still referring to Figures 1 and 2, the flow meter 5 can be a Coriolis flow meter, although any suitable vibrating meter can be used. The flow meter 5 can determine the properties and movement of the material in the vibrating element 12. The flow meter 5 includes a system 15 that measures the spatiotemporal relationship between a first position 12a and a second position 12b of one of the vibrating elements 12. The spatiotemporal relationship between the first position 12a and the second position 12b of one of the vibrating elements 12 is used to determine one or more properties of the material in the vibrating element 12. For example, the spatiotemporal relationship can be a phase difference between the first position 12a and the second position 12b. Additionally or alternatively, the spatiotemporal relationship can be a time delay, a difference in velocity, an acceleration, etc.

As shown, the vibrating element 12 is a U-shaped flow tube, but any suitable shape may be used. For example, curves, arches, lines (such as pencil straight tubes), and other shapes may be used in alternative embodiments. Due to the U-shape, the vibrating element 12 can have generally parallel surfaces. For example, a portion of the surface at the first position 12a can be generally parallel to a portion of the surface at the second position 12b. However, in alternative embodiments, the surfaces may not necessarily be parallel. For example, in the curves and arches described above, the vibrating element may not have parallel surfaces at the first and second positions, but is still used to measure the spatiotemporal relationship between two or more positions on the vibrating element, which can be vibrated by the driver 14.

Driver 14 is configured to vibrate vibrating element 12. In the illustrated embodiment, driver 14 includes a coil and a magnet. The coil can receive a drive signal from meter electronics 20. The drive signal can be a sinusoidal electrical signal, though any suitable signal or combination of signals can be employed. The drive signal causes driver 14 to apply a force to vibrating element 12. The force can have properties corresponding to parameters of the drive signal. For example, the force can oscillate at the same frequency as the drive signal. Additionally or alternatively, the magnitude of the force can be proportional to the magnitude of the drive signal.

Vibration element 12 can respond to a force by bending about a bending axis W shown in FIG1 . Vibration element 12 can bend about bending axis W in the direction of the force applied by driver 14 . The direction of the force can be perpendicular to the plane formed by vibration element 12 . Accordingly, vibration element 12 at the location of driver 14 can be displaced perpendicular to the plane formed by vibration element 12 . In the same or alternative embodiments, the force and bending can be in other directions. Alternative embodiments can employ struts with bending axis W running across the struts, etc.

The vibrating element 12 can also have various vibration modes. For example, the vibrating element 12 can vibrate in an out-of-phase bending mode ("drive mode"), in which the two vibrating elements 12 bend in opposite directions. If the vibrating element 12 vibrates only in the drive mode, the first location 12a and the second location 12b bend without a phase difference. In other words, the phase difference between the two locations 12a and 12b can be zero. The vibrating element 12 can also have flow-induced distortion, carried by the drive mode ("distortion mode"), which is described in more detail below with reference to Figures 3 and 4.

Still referring to Figures 1 and 2, system 15 provides a signal to meter electronics 20. The signal provided by system 15 may include a measurement of the spatiotemporal relationship between the two locations 12a, 12b. Using this signal, meter electronics 20 is configured to determine the properties of the material flowing through vibrating element 12. Exemplary meter electronics, material properties, and how they can be determined from phase differences and other parameters of the vibration response are described in U.S. Patent 8,720,281 to Hays et al., as well as other references. For the sake of brevity, further discussion of meter electronics 20 is omitted.

In the illustrated system 15, the transmitter-sensor assembly 100 is attached to the vibrating element 12 at a first location 12a. Accordingly, the transmitter-sensor assembly 100 is substantially securely coupled to the vibrating element 12 at the first location 12a. However, the transmitter-sensor assembly 100 may be substantially securely coupled to the first location 12a rather than being located at the first location 12a. For example, the transmitter-sensor assembly 100 may be substantially securely coupled to the vibrating element 12 using a bracket or the like. Accordingly, the transmitter-sensor assembly 100 may be positioned remote from the first location 12a. Furthermore, the transmitter-sensor assembly 100 may include components, each of which is individually attached to, indirectly coupled to, or the like at the first location 12a.

Due to its generally stable coupling to the first location 12a, the emitter-sensor assembly 100 can move with the first location 12a. Accordingly, the position of the emitter-sensor assembly 100 corresponds to the position of the first location 12a. This allows measurements made by the emitter-sensor assembly 100 to be spatial measurements of the first location 12a. For example, in embodiments where the emitter-sensor assembly 100 is coupled to the first location 12a via a bracket, the position of the emitter-sensor assembly 100 relative to the first location 12a may be known. Accordingly, the position of the emitter-sensor assembly 100 relative to the first location 12a may be included in processing by the meter electronics 20.

Similarly, in an alternative embodiment, the reflective surface shown as part of the surface of the vibrating element 12 at the second position 12b can be attached to or coupled to the second position 12b. Accordingly, in an alternative embodiment, the reflective surface can be positioned away from the second position 12b. For example, the reflective surface can be positioned close to the second position using a bracket. In the illustrated embodiment, the reflective surface 200 is positioned at the second position 12b.

Furthermore, in the illustrated embodiment, the reflective surface 200 has a curve due to being a surface on the vibrating element 12. However, in alternative embodiments, the reflective surface 200 may have a different shape, such as a flat shape. The flat shape may be due to a differently shaped vibrating element or a flat surface that is generally firmly coupled to the vibrating element 12. For example, a flat mirror may be coupled to the second position 12b.

In these and other embodiments, the emitter-sensor arrangement 100 and the reflective surface 200 can be used to measure a spatiotemporal relationship between the first position 12a and the second position 12b. When the vibrating element 12 is vibrating in a twisting mode, an exemplary spatiotemporal relationship is a phase difference between the first position 12a and the second position 12b, as described in more detail below with reference to Figures 3 and 4.

Figures 3 and 4 show bottom perspective views of the sensor device 10 described above with reference to Figures 1 and 2 . Vibrating element 12, first location 12a, second location 12b, and emitter-sensor device 100 are shown. For illustrative purposes, driver 14, housing 16, and meter electronics 20 are not shown. Reflective surface 200 is also not shown, although it will be appreciated that it is provided at second location 12b. Figure 3 shows the undriven mode, and Figure 4 shows the distortion mode caused by the Coriolis force. Figures 3 and 4 thus illustrate the effect of the distortion mode on the spatiotemporal relationship between first location 12a and second location 12b.

As can be appreciated, the spatiotemporal relationship between first position 12a and second position 12b is different in the non-driven mode shown in FIG3 and the twisting mode shown in FIG4 . In FIG3 , vibrating element 12 is in the non-driven mode, where driver 14 is not vibrating vibrating element 12. That is, driver 14 is not applying a force to vibrating element 12. In FIG4 , material is flowing through vibrating element 12 while driver 14 is vibrating vibrating element 12. Due to the Coriolis force caused by the material flow, vibrating element 12 vibrates in the twisting mode. In the twisting mode, first position 12a and second position 12b on each of vibrating elements 12 have a phase difference.

For example, material flowing through the vibrating element 12 can induce a Coriolis force in the vibrating element 12. The Coriolis force can cause the second position 12b to be drawn toward the first position 12a. In other words, the first position 12a is time-delayed relative to the second position 12b. The time delay is proportional to the phase difference between the two positions 12a, 12b, with the proportion being determined by the vibration frequency of the vibrating element 12. The phase difference can be the distance between the two positions 12a, 12b in a direction perpendicular to the plane formed by one of the vibrating elements 12. As will be explained in more detail below with reference to Figures 5, 6, and 7, the phase difference can be measured by the transmitter-sensor device 100, even if the transmitter-sensor device 100 is only at the first position 12a.

Figures 5, 6, and 7 illustrate cross-sectional views of system 15 taken from Figure 1. As can be seen, system 15 includes the vibrating element 12 and emitter-sensor assembly 100 described above. Vibrating element 12 is shown having a first position 12a and a second position 12b. Also shown in Figures 5, 6, and 7 are cross-sectional views of emitter-sensor assembly 100. The cross-sectional views of emitter-sensor assembly 100 show emitter 110, sensor 120, and lens 130 positioned proximate first position 12a. Figures 5, 6, and 7 also include a coordinate system having an X-axis, a Y-axis, and a Z-axis.

Emitter 110, sensor 120, and lens 130 are all shown as being positioned at a first location 12a. However, as previously described, in alternative embodiments, reflector 110, sensor 120, and lens 130 may be positioned away from first location 12a. For example, emitter 110 may be securely coupled to first location 12a using a bracket, and sensor 120 and lens 130 may be attached to vibrating element 12. Emitter 110 is coplanar with and proximate to sensor 120. Emitter 110 is also positioned to emit electromagnetic radiation 112 toward second location 12b. Sensor 120 is positioned parallel to lens 130 and is positioned to receive electromagnetic radiation 112 reflected by reflective surface 200.

Electromagnetic radiation 112 is shown as being emitted at an angle relative to the bending axis W and in a plane formed by the first position 12a and the second position 12b, which is parallel to the plane formed by the X-axis and the Y-axis. However, in alternative embodiments, any angle, including zero, may be employed. Electromagnetic radiation 112 may also be emitted outside the plane formed by the first position 12a and the second position 12b.

In embodiments where the reflective surface is positioned away from the second location, electromagnetic radiation can be emitted toward the second location even if the radiation is emitted toward the reflective surface positioned away from the second location. For example, the reflective surface can be securely coupled to the second location using a bracket. Electromagnetic radiation can be emitted by a transmitter at the first location toward the reflective surface positioned away from the second location. The reflective surface can be configured to reflect the electromagnetic radiation toward the first location.

Similarly, in embodiments where the sensor is positioned remote from the first location, electromagnetic radiation reflected toward the first location can be received. For example, the sensor can be securely coupled to the first location and receive electromagnetic radiation reflected toward the sensor. Accordingly, the sensor can receive electromagnetic radiation reflected toward the first location. The received reflected electromagnetic radiation can be used to measure the spatiotemporal relationship between the first and second locations.

Fig. 5, 6 and 7 illustrate different spatiotemporal relationships between first position 12a and second position 12b in different flow conditions, and described different flow conditions can have different vibration modes.Illustrated flow conditions are resting, without flow and flow conditions.Due to different vibration modes, second position 12b can move relative to first position 12a.Thereby, electromagnetic radiation 112 can be reflected in different directions by reflective surface 200, and this depends on the vibration mode.Correspondingly, where electromagnetic radiation 112 is received by sensor 120 can depend on the vibration mode, as discussed in more detail hereinafter.

In FIG5 , the vibrating element 12 is in a resting condition, wherein the vibrating element 12 is not vibrating and no flow is present. As a result, the center of the vibrating element 12 is approximately above the bending axis W. As can be seen in FIG5 , electromagnetic radiation 112 is received by the sensor 120 at the center of the sensor 120, which may be a reference position for the sensor 120. However, in alternative embodiments, when the vibrating element 12 is in a resting condition, the electromagnetic radiation may be received by the sensor 120 at a different position. As can be appreciated, the position, or reference position, of the electromagnetic radiation 112 may be associated with the resting condition.

In FIG6 , the vibrating element 12 is in a no-flow condition. The no-flow condition can correspond to the drive mode described with reference to FIG1 and FIG2 . As shown in FIG6 , the vibrating element 12 is displaced along the X-axis toward one side of the bending axis W. However, the relative positions of the first position 12a and the second position 12b along the X-axis are different. Accordingly, the position of the electromagnetic radiation 112 on the sensor 120 is different from the position of the electromagnetic radiation 112 when the vibrating element 12 is in a resting condition. It can be appreciated that the positions of the electromagnetic radiation 112 shown in FIG5 and 6 can be associated with both resting and no-flow conditions.

In FIG7 , when the vibrating element 12 is vibrating, the vibrating element 12 is in a flow condition in which material flows through the vibrating element 12. As can be seen, the first position 12a and the second position 12b are displaced to the side of the bending axis W. In the exemplary illustration shown in FIG7 , the first position 12a is displaced to the left of the bending axis W, and the second position 12b is displaced to the right of the bending axis W. However, due to the vibration, the first position 12a and the second position 12b may be displaced on either side of the bending axis W. Additionally or alternatively, the first position 12a and the second position 12b may vibrate about an axis offset from the bending axis W.

As can be seen in FIG7 , sensor 120 does not receive electromagnetic radiation 112 at the center of sensor 120. More specifically, electromagnetic radiation 112 is offset from the center of sensor 120. This is due to the phase difference between first location 12a and second location 12b. As can also be appreciated by comparing FIG5 , 6 , and 7 , the location where electromagnetic radiation 112 is received by sensor 120 changes from a resting or no-flow condition to a flowing condition due to the change in the phase difference between first location 12a and second location 12b. In other words, the change in phase difference causes electromagnetic radiation 112 to be reflected in different directions.

More specifically, as shown in Figures 5 and 6, electromagnetic radiation 112 is reflected by reflective surface 200 at the same location, which is to the left of bending axis W and to the left of the center of reflective surface 200 (wherein the projection of bending axis W along the Z axis passes through reflective surface 200 when vibrating element 12 is in a resting condition). Due to the angle of electromagnetic radiation 112 emitted by emitter-sensor arrangement 100 relative to bending axis W, the curve of reflective surface 200, and the curvature of lens 130, electromagnetic radiation 112 is reflected by reflective surface 200 to the center of sensor 120, which may be a reference position for sensor 120.

The twist pattern shown in FIG7 causes electromagnetic radiation 112 to be received by sensor 120 at an offset position that is not the center of sensor 120. More specifically, electromagnetic radiation 112 is reflected from the right side of the center of reflective surface 200. That is, due to the twist pattern, second position 12b is displaced in the negative direction along the X-axis, while first position 12a is displaced in the positive direction along the X-axis. This causes electromagnetic radiation 112 to be directed to the right side of the center of reflective surface 200. Accordingly, electromagnetic radiation 112 is reflected from reflective surface 200 at a different angle. Consequently, electromagnetic radiation 112 is received to the right of the center of sensor 120.

As can be appreciated from Figures 5, 6, and 7, the location at which the sensor 120 receives the electromagnetic radiation 112 will vary during the vibration of the vibrating element 12 during flow. For example, during a single cycle of the flow-induced distortion mode, the electromagnetic radiation 112 may move from a first side of the sensor 120 to a second side of the sensor 120 and then back to the first side. This is due to a change in the phase difference between the first location 12a and the second location 12b, which is the spatial and temporal relationship between the first location 12a and the second location 12b. As will be explained below, the sensor 120 can be used to provide a signal proportional to the location of the electromagnetic radiation 112 on the sensor 120.

FIG8 shows a perspective view of the emitter-sensor assembly 100 described above. For added clarity, the emitter-sensor assembly 100 is shown without the lens 130 described above with reference to FIG5 , 6 , and 7 . As shown in FIG8 , the emitter-sensor assembly 100 includes the emitter 110 and sensor 120 described above. The emitter-sensor assembly 100 is also shown as including a circuit board 140 to which the emitter 110 and sensor 120 are coupled. Also shown in FIG8 are the X-axis and Z-axis described above. Along the X-axis are electromagnetic radiation 112 emitted by the emitter 110 and electromagnetic radiation 112 received by the sensor 120. Also shown is electromagnetic radiation 112′ that may be received at a reference location of the sensor 120, which is within the sensing area 122 of the sensor 120.

Sensor 120 is configured to provide a signal proportional to the location at which electromagnetic radiation 112 is received by sensor 120. Sensor 120 is shown as a dual-axis position sensitive detector (PSD), where the location of electromagnetic radiation 112 can be determined along both the X-axis and the Z-axis. However, in alternative embodiments, any suitable sensor may be employed. For example, sensor 120 may be an array of photosensitive diodes having a gridded coordinate system that measures the location of electromagnetic radiation 112.

In the illustrated embodiment, sensor 120 provides a current proportional to the distance from a reference location in sensing region 122, which is the intersection of the X-axis and the Y-axis. For example, if electromagnetic radiation 112 is received by sensor 120 at a first end of sensing region 122 along the X-axis, the current may be at the full-scale current provided by the leads at the first end for sensor 120. If electromagnetic radiation 112 is received at a second end of sensing region 122 along the X-axis, the current may be at the full-scale current provided by the leads at the second end. If electromagnetic radiation 112 is received by sensor 120 at a reference location illuminated by electromagnetic radiation 112′, a half-scale current may be provided on both leads at the first and second ends. The current provided by the leads may be included in the signal provided by sensor 120.

The signal provided by sensor 120 can be received by meter electronics 20 as previously described with reference to Figures 1 and 2. Meter electronics 20 can use the signal provided by emitter-sensor arrangement 100 to measure the spatiotemporal relationship between first location 12a and second location 12b. An exemplary method is described below with reference to Figure 9.

FIG9 illustrates a method 900 for measuring the spatiotemporal relationship between two or more positions of a vibrating element, according to an embodiment. As shown in FIG9 , method 900 begins by transmitting electromagnetic radiation from a first position of the vibrating element in step 910. The first position may be first position 12 a, and the vibrating element may be vibrating element 12, as described above. In step 920, method 900 reflects electromagnetic radiation from a second position of the vibrating element. The second position may be second position 12 b, as described above. In step 930, method 900 may receive, at the first position, the electromagnetic radiation reflected from the second position.

The step 910 of emitting electromagnetic radiation from the first location can be performed by the transmitter 110 described above. For example, the transmitter 110 can be located at the first location 12a, as shown in Figures 5-7. Alternatively, the step 910 of emitting electromagnetic radiation can be performed by a transmitter located away from the first location. For example, the transmitter can be securely coupled to the first location via a bracket.

Step 920 of reflecting electromagnetic radiation from the second location can be performed by the reflective surface 200 described above. For example, reflective surface 200 can comprise the surface of vibrating element 12. Accordingly, electromagnetic radiation 112 can be reflected by the surface of vibrating element 12 at second location 12b. Alternatively, step 920 of reflecting electromagnetic radiation from the second location can be performed by a reflective surface positioned away from the second location. For example, the reflective surface can be securely coupled to the second location using a bracket.

Step 930 of receiving electromagnetic radiation reflected from the second location can be performed by sensor 120, as described above. Accordingly, sensor 120 can be located at first location 12a. Alternatively, the step of receiving electromagnetic radiation reflected from the second location can be performed by a sensor located remote from the first location. For example, the sensor that receives electromagnetic radiation reflected from the second location can be securely coupled to the first location using a bracket.

As previously described, sensor 120 can provide a signal to meter electronics 20 that is proportional to the position on the sensor at which electromagnetic radiation 112 is received. Meter electronics 20 can use this signal to calculate, for example, the phase difference between first position 12a and second position 12b on vibrating element 12. For example, where the reference position shown in FIG8 is associated with a zero phase difference, the half-scale current can be digitized to a zero value. Signal conditioning can ensure that the full-scale range of sensor 120 corresponds to the full-scale range of the analog-to-digital converter in meter electronics 20. Accordingly, with reference to flow meter 5 described above, the full-scale range of sensor 120 can correspond to the full flow of material through flow meter 5.

The embodiments described above provide for measuring the spatiotemporal relationship between two or more locations 12a, 12b on a vibrating element 12. As explained above, measuring the spatiotemporal relationship between two or more locations 12a, 12b on a vibrating element 12 can be accomplished by a transmitter-sensor device 100 that is securely coupled to the first location 12a. Accordingly, the sensor device 10 including the transmitter-sensor device 100 and the vibrating element 12 can have a simpler design and provide more reliable measurements.

For example, reflector-sensor assembly 100 may have only a single wire arrangement that receives and provides signals from meter electronics 20. Through the single wire arrangement, emitter-sensor assembly 100 may receive a signal from meter electronics 20, causing emitter 110 to emit electromagnetic radiation and provide a signal to meter electronics 20 that is proportional to the location of the electromagnetic radiation received by emitter-sensor assembly 100. Furthermore, emitter-sensor assembly 100 may be coupled to a single location, which results in a less complex vibration sensor assembly design. Measurements may also be more reliable because tolerances of two or more sensors are not combined, and there may be less noise coupling to meter electronics 20.

The detailed descriptions of the above embodiments are not an exhaustive description of all embodiments contemplated by the inventors as being within the scope of the present description. Indeed, those skilled in the art will recognize that certain elements of the above-described embodiments may be variously combined or eliminated to create additional embodiments, and that such additional embodiments fall within the scope and teachings of the present description. It will also be apparent to those skilled in the art that the above-described embodiments may be combined in whole or in part to create additional embodiments within the scope and teachings of the present description.

Therefore, although specific embodiments are described herein for illustrative purposes, various equivalent modifications are possible within the scope of this description, as will be recognized by those skilled in the relevant art. The teachings provided herein can be applied to other measurements of the spatiotemporal relationship between two or more positions on a vibrating element, and not just to the embodiments described above and shown in the accompanying figures. Accordingly, the scope of the embodiments described above should be determined from the appended claims.

Claims (17)

1. A transmitter-sensor device (100) for measuring the spatiotemporal relationship between two or more locations of a vibrating element (12), comprising: A transmitter (110) is substantially and stably coupled to a first position (12a) of the vibrating element (12), the transmitter (110) being configured to emit electromagnetic radiation (112) toward a second position (12b) of the vibrating element (12); and A sensor (120) is substantially firmly coupled to a first position (12a) of the vibrating element (12), and the sensor (120) is configured to receive electromagnetic radiation (112) reflected from a second position (12b) of the vibrating element (12) to measure the torsion pattern of the vibrating element (12). 2. The transmitter-sensor device (100) of claim 1 further includes a lens (130) positioned to receive electromagnetic radiation (112) reflected from a second position (12b) of the vibrating element (12) and to direct the electromagnetic radiation (112) toward the sensor (120). 3. The transmitter-sensor device (100) according to any one of claims 1 or 2, wherein at least one of the transmitter (110) and the sensor (120) is disposed at a first position (12a). 4. The transmitter-sensor device (100) of claim 1 or claim 2, wherein at least one of the transmitter (110) and the sensor (120) is positioned away from the first position (12a). 5. The transmitter-sensor device (100) of claim 1 or claim 2, wherein the transmitter (110) is a light-emitting diode or a laser. 6. The transmitter-sensor device (100) of claim 1 or claim 2, wherein the sensor (120) is a position sensor detector that detects the position of electromagnetic radiation (112) on the sensing area (122) of the photodiode. 7. The transmitter-sensor device (100) of claim 1 or claim 2, wherein the vibrating element (12) is a flow tube in the flow meter (5). 8. A method for measuring the spatiotemporal relationship between two or more locations of a vibrating element, the method comprising: Electromagnetic radiation is emitted from the first position of the vibrating element; Electromagnetic radiation is reflected from the second position of the vibrating element; and Electromagnetic radiation reflected from the second position is received by a sensor that is stably coupled to the first position to measure the torsion mode of the vibrating element. 9. The method of claim 8, further comprising determining the movement of the second position along the axis relative to the first position on the axis. 10. The method of claim 8 or claim 9, further comprising: A driver is used to vibrate a vibrating element, wherein the vibrating element includes a flow tube in a flow meter; and The Coriolis force is used to torsion the vibrating element, causing the second position to shift relative to the first position. 11. The method of claim 8 or claim 9, wherein reflecting electromagnetic radiation from the second position comprises reflecting electromagnetic radiation from the surface of the vibrating element at the second position. 12. The method of claim 8 or claim 9, wherein reflecting electromagnetic radiation from the second position comprises reflecting electromagnetic radiation from a surface stably coupled to the second position. 13. A system (15) for measuring the spatiotemporal relationship between two or more locations of a vibrating element (12), said system (15) comprising: A transmitter-sensor device (100) is securely coupled to the first position (12a) of the vibrating element (12); and A reflective surface (200) is provided at a second position (12b) of the vibrating element (12) and is provided at a second position (12b) away from the vibrating element (12). The transmitter-sensor device (100) is configured as follows: Electromagnetic radiation (112) is emitted toward the second position (12b) of the vibrating element (12); and Electromagnetic radiation (112) reflected from the second position (12b) is received to measure the torsion mode of the vibrating element (12). 14. The system (15) of claim 13, wherein the reflective surface (200) is part of the vibrating element (12) at the second position (12b). 15. The system (15) of any one of claims 13 or 14, wherein the reflective surface (200) is a surface securely coupled to the second position (12b). 16. The system (15) of claim 13 or claim 14, wherein the transmitter-sensor device (100) comprises: A transmitter (110) is substantially and stably coupled to a first position (12a) of the vibrating element (12), the transmitter (110) being configured to emit electromagnetic radiation (112) toward a second position (12b) of the vibrating element (12); and A sensor (120) is substantially and stably coupled to a first position (12a) of the vibrating element (12), and the sensor (120) is configured to receive electromagnetic radiation (112) reflected from a second position (12b) of the vibrating element (12). 17. The system (15) of claim 13 or claim 14, wherein the electromagnetic radiation (112) is light.