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HK1241965B - 用於对分子进行探测、检测和分析的带外部光源的集成装置 - Google Patents

用於对分子进行探测、检测和分析的带外部光源的集成装置 Download PDF

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Publication number
HK1241965B
HK1241965B HK18101019.5A HK18101019A HK1241965B HK 1241965 B HK1241965 B HK 1241965B HK 18101019 A HK18101019 A HK 18101019A HK 1241965 B HK1241965 B HK 1241965B
Authority
HK
Hong Kong
Prior art keywords
sample well
waveguide
excitation
sample
integrated device
Prior art date
Application number
HK18101019.5A
Other languages
German (de)
English (en)
French (fr)
Other versions
HK1241965A1 (zh
Inventor
Jonathan M. Rothberg
Ali KABIRI
Jason W. Sickler
Brett J. Gyarfas
Jeremy Lackey
Gerard Schmid
Lawrence C. West
Benjamin CIPRIANY
Keith G. Fife
Farshid GHASEMI
Original Assignee
Quantum-Si Incorporated
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Quantum-Si Incorporated filed Critical Quantum-Si Incorporated
Publication of HK1241965A1 publication Critical patent/HK1241965A1/zh
Publication of HK1241965B publication Critical patent/HK1241965B/zh

Links

HK18101019.5A 2014-08-08 2015-08-07 用於对分子进行探测、检测和分析的带外部光源的集成装置 HK1241965B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US62/035,258 2014-08-08
US62/164,464 2015-05-20

Publications (2)

Publication Number Publication Date
HK1241965A1 HK1241965A1 (zh) 2018-06-15
HK1241965B true HK1241965B (zh) 2024-09-20

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