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GB816464A - Improvements in or relating to devices for the x-ray analysis of materials - Google Patents

Improvements in or relating to devices for the x-ray analysis of materials

Info

Publication number
GB816464A
GB816464A GB24743/57A GB2474357A GB816464A GB 816464 A GB816464 A GB 816464A GB 24743/57 A GB24743/57 A GB 24743/57A GB 2474357 A GB2474357 A GB 2474357A GB 816464 A GB816464 A GB 816464A
Authority
GB
United Kingdom
Prior art keywords
ray analysis
radiation
base
relating
materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB24743/57A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electrical Industries Ltd
Original Assignee
Philips Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electrical Industries Ltd filed Critical Philips Electrical Industries Ltd
Publication of GB816464A publication Critical patent/GB816464A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

816,464. X-ray analysis. PHILIPS ELECTRICAL INDUSTRIES Ltd. Aug. 6, 1957 [Aug. 9, 1956], No. 24743/57. Class 40 (3). In the analysis of a material or the measurement of the thickness of, for example, a zinc coating 2 on an iron or steel base 1, fluorescent radiation from a copper block 3 falls on the coating 2 and base 1 and the radiation from the base 1 is measured by a proportional counter 5 connected to a linear amplifier 6, a pulseintensity discriminator 7 and a counting-device 8. The radiation from the block 3 is produced by X-rays from a tube 4. A cobalt filter 9 may be arranged in front of the proportional counter 5.
GB24743/57A 1956-08-09 1957-08-06 Improvements in or relating to devices for the x-ray analysis of materials Expired GB816464A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US603006A US2925497A (en) 1956-08-09 1956-08-09 Fluorescence analysis

Publications (1)

Publication Number Publication Date
GB816464A true GB816464A (en) 1959-07-15

Family

ID=24413684

Family Applications (1)

Application Number Title Priority Date Filing Date
GB24743/57A Expired GB816464A (en) 1956-08-09 1957-08-06 Improvements in or relating to devices for the x-ray analysis of materials

Country Status (3)

Country Link
US (1) US2925497A (en)
DE (1) DE1227699B (en)
GB (1) GB816464A (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1017595A (en) * 1962-06-20 1966-01-19 Atomic Energy Authority Uk Improvements in or relating to radiometric analysis techniques
US3375369A (en) * 1965-07-13 1968-03-26 Atomic Energy Commission Usa Matrix corrected x-ray fluorometric analysis method
US3339606A (en) * 1966-06-14 1967-09-05 Kugler Emanuel Slide closure
US3525863A (en) * 1967-12-28 1970-08-25 Minnesota Mining & Mfg Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity
US3688124A (en) * 1969-04-30 1972-08-29 Bell Telephone Labor Inc Spatially periodic nonlinear structures for frequency conversion of electromagnetic energy
US3754138A (en) * 1971-10-07 1973-08-21 Industrial Nucleonics Corp Inner layer position measurement
US4048496A (en) * 1972-05-08 1977-09-13 Albert Richard D Selectable wavelength X-ray source, spectrometer and assay method
US3925660A (en) * 1972-05-08 1975-12-09 Richard D Albert Selectable wavelength X-ray source, spectrometer and assay method
US3801785A (en) * 1972-11-01 1974-04-02 Raytheon Co Spatially modulated imaging system
CA1110996A (en) * 1977-09-09 1981-10-20 Reginald H. Clark Apparatus and method for sorting articles
FI59489C (en) * 1978-11-21 1981-08-10 Enso Gutzeit Oy FOERFARANDE FOER MAETNING AV BELAEGGNINGSMAENGDER
FI68322C (en) * 1983-06-28 1985-08-12 Enso Gutzeit Oy REFRIGERATION FOR THE MAINTENANCE OF THE SILICONE BOTTOM OF THE PAPER ELLER CARTON
CA2034370A1 (en) * 1990-03-30 1991-10-01 Peter W. Mueller Process for identification evaluation and removal of microshrinkage

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE858025C (en) * 1945-01-03 1952-12-04 Boehler & Co Ag Geb Device for rapid x-ray determination of several elements in an alloy
US2511151A (en) * 1947-09-24 1950-06-13 Armour Res Found X-ray apparatus and method
US2648012A (en) * 1949-10-05 1953-08-04 Perforating Guns Atlas Corp Nuclear well logging
US2642537A (en) * 1949-12-22 1953-06-16 United States Steel Corp Apparatus for determining coating thickness
US2629831A (en) * 1950-09-26 1953-02-24 Tracerlab Inc Radiation softening
US2758217A (en) * 1951-05-17 1956-08-07 Perforating Guns Atlas Corp Automatic scintillation counter
US2846589A (en) * 1954-04-01 1958-08-05 United States Steel Corp Apparatus for determining the thickness of zinc coating on a ferrous metal base
US2853618A (en) * 1954-10-27 1958-09-23 Marco John J De Method and apparatus for the use of fluorescent x-rays in powder diffraction

Also Published As

Publication number Publication date
US2925497A (en) 1960-02-16
DE1227699B (en) 1966-10-27

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