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GB2610134B - Scatter X-ray imaging with adaptive scanning beam intensity - Google Patents

Scatter X-ray imaging with adaptive scanning beam intensity Download PDF

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Publication number
GB2610134B
GB2610134B GB2217679.6A GB202217679A GB2610134B GB 2610134 B GB2610134 B GB 2610134B GB 202217679 A GB202217679 A GB 202217679A GB 2610134 B GB2610134 B GB 2610134B
Authority
GB
United Kingdom
Prior art keywords
scatter
ray imaging
beam intensity
scanning beam
adaptive scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB2217679.6A
Other versions
GB2610134A (en
GB202217679D0 (en
Inventor
Rommel Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of GB202217679D0 publication Critical patent/GB202217679D0/en
Publication of GB2610134A publication Critical patent/GB2610134A/en
Application granted granted Critical
Publication of GB2610134B publication Critical patent/GB2610134B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/085—Circuit arrangements particularly adapted for X-ray tubes having a control grid
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB2217679.6A 2020-06-15 2020-06-15 Scatter X-ray imaging with adaptive scanning beam intensity Active GB2610134B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2020/037716 WO2021257049A1 (en) 2020-06-15 2020-06-15 Scatter x-ray imaging with adaptive scanning beam intensity

Publications (3)

Publication Number Publication Date
GB202217679D0 GB202217679D0 (en) 2023-01-11
GB2610134A GB2610134A (en) 2023-02-22
GB2610134B true GB2610134B (en) 2024-09-11

Family

ID=79268179

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2217679.6A Active GB2610134B (en) 2020-06-15 2020-06-15 Scatter X-ray imaging with adaptive scanning beam intensity

Country Status (2)

Country Link
GB (1) GB2610134B (en)
WO (1) WO2021257049A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121038072A (en) * 2025-10-21 2025-11-28 南通海鹰机电集团有限公司 Automated scanning control method and system for X-ray flaw detectors

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4101776A (en) * 1975-11-25 1978-07-18 U.S. Philips Corporation Image intensifier t. v. fluoroscopy system
US5617462A (en) * 1995-08-07 1997-04-01 Oec Medical Systems, Inc. Automatic X-ray exposure control system and method of use
US20070098142A1 (en) * 2005-10-24 2007-05-03 Peter Rothschild X-Ray Inspection Based on Scatter Detection
US20100091947A1 (en) * 2008-10-10 2010-04-15 Niu han-ben Differential Interference Phase Contrast X-ray Imaging System
US20140110592A1 (en) * 2012-05-31 2014-04-24 Robert Sigurd Nelson Compton camera detector systems for novel integrated compton-Pet and CT-compton-Pet radiation imaging
US20150355117A1 (en) * 2005-12-16 2015-12-10 Rapiscan Systems, Inc. Data Collection, Processing and Storage Systems for X-Ray Tomographic Images
US20170200524A1 (en) * 2012-09-05 2017-07-13 SVXR, Inc. Devices Processed Using X-Rays
US20180106735A1 (en) * 2016-10-18 2018-04-19 Kla-Tencor Corporation Full Beam Metrology For X-Ray Scatterometry Systems

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4101776A (en) * 1975-11-25 1978-07-18 U.S. Philips Corporation Image intensifier t. v. fluoroscopy system
US5617462A (en) * 1995-08-07 1997-04-01 Oec Medical Systems, Inc. Automatic X-ray exposure control system and method of use
US20070098142A1 (en) * 2005-10-24 2007-05-03 Peter Rothschild X-Ray Inspection Based on Scatter Detection
US20150355117A1 (en) * 2005-12-16 2015-12-10 Rapiscan Systems, Inc. Data Collection, Processing and Storage Systems for X-Ray Tomographic Images
US20100091947A1 (en) * 2008-10-10 2010-04-15 Niu han-ben Differential Interference Phase Contrast X-ray Imaging System
US20140110592A1 (en) * 2012-05-31 2014-04-24 Robert Sigurd Nelson Compton camera detector systems for novel integrated compton-Pet and CT-compton-Pet radiation imaging
US20170200524A1 (en) * 2012-09-05 2017-07-13 SVXR, Inc. Devices Processed Using X-Rays
US20180106735A1 (en) * 2016-10-18 2018-04-19 Kla-Tencor Corporation Full Beam Metrology For X-Ray Scatterometry Systems

Also Published As

Publication number Publication date
GB2610134A (en) 2023-02-22
WO2021257049A1 (en) 2021-12-23
GB202217679D0 (en) 2023-01-11

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