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GB2602000B - Improvements in and relating to electrical testing - Google Patents

Improvements in and relating to electrical testing Download PDF

Info

Publication number
GB2602000B
GB2602000B GB2019479.1A GB202019479A GB2602000B GB 2602000 B GB2602000 B GB 2602000B GB 202019479 A GB202019479 A GB 202019479A GB 2602000 B GB2602000 B GB 2602000B
Authority
GB
United Kingdom
Prior art keywords
relating
electrical testing
testing
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB2019479.1A
Other versions
GB2602000A (en
GB202019479D0 (en
Inventor
James Cook Austin
Philip Griffiths Alexander
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BAE Systems PLC
Original Assignee
BAE Systems PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BAE Systems PLC filed Critical BAE Systems PLC
Priority to GB2019479.1A priority Critical patent/GB2602000B/en
Publication of GB202019479D0 publication Critical patent/GB202019479D0/en
Publication of GB2602000A publication Critical patent/GB2602000A/en
Application granted granted Critical
Publication of GB2602000B publication Critical patent/GB2602000B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/005—Testing of electric installations on transport means
    • G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/3025—Wireless interface with the DUT
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
GB2019479.1A 2020-12-10 2020-12-10 Improvements in and relating to electrical testing Active GB2602000B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB2019479.1A GB2602000B (en) 2020-12-10 2020-12-10 Improvements in and relating to electrical testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2019479.1A GB2602000B (en) 2020-12-10 2020-12-10 Improvements in and relating to electrical testing

Publications (3)

Publication Number Publication Date
GB202019479D0 GB202019479D0 (en) 2021-01-27
GB2602000A GB2602000A (en) 2022-06-22
GB2602000B true GB2602000B (en) 2023-12-27

Family

ID=74189074

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2019479.1A Active GB2602000B (en) 2020-12-10 2020-12-10 Improvements in and relating to electrical testing

Country Status (1)

Country Link
GB (1) GB2602000B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114154562B (en) * 2021-11-15 2023-04-21 国网河北省电力有限公司电力科学研究院 Device and method for detecting image recognition capability of intelligent monitoring terminal
US20250096508A1 (en) * 2023-09-15 2025-03-20 Lockheed Martin Corporation Systems and Methods for Hot-Swap Connectors of a Wireless Harness Automated Measurement System
US12413098B2 (en) 2023-09-15 2025-09-09 Lockheed Martin Corporation Systems and methods for a charging cart of a wireless harness automated measurement system

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7613963B1 (en) * 2004-12-20 2009-11-03 Williams-Pyro, Pnc. Wireless method and apparatus for testing armament circuits
US20100010758A1 (en) * 2008-07-14 2010-01-14 Kinahan William P Wireless wireharness testing system
US20110282607A1 (en) * 2010-05-14 2011-11-17 Aaron Anderw Tunell Electrical continuity analyzer
US20160084902A1 (en) * 2014-09-24 2016-03-24 Kinney Industries, Inc. Testing Systems and Methods
US20180031629A1 (en) * 2016-07-27 2018-02-01 Samsung Electronics Co., Ltd. Test board for semiconductor package, test system, and method of manufacturing semiconductor package
US20200174058A1 (en) * 2018-11-29 2020-06-04 The Boeing Company Test system and method for a wiring harness

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7613963B1 (en) * 2004-12-20 2009-11-03 Williams-Pyro, Pnc. Wireless method and apparatus for testing armament circuits
US20100010758A1 (en) * 2008-07-14 2010-01-14 Kinahan William P Wireless wireharness testing system
US20110282607A1 (en) * 2010-05-14 2011-11-17 Aaron Anderw Tunell Electrical continuity analyzer
US20160084902A1 (en) * 2014-09-24 2016-03-24 Kinney Industries, Inc. Testing Systems and Methods
US20180031629A1 (en) * 2016-07-27 2018-02-01 Samsung Electronics Co., Ltd. Test board for semiconductor package, test system, and method of manufacturing semiconductor package
US20200174058A1 (en) * 2018-11-29 2020-06-04 The Boeing Company Test system and method for a wiring harness

Also Published As

Publication number Publication date
GB2602000A (en) 2022-06-22
GB202019479D0 (en) 2021-01-27

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