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GB2506912B - Inductive probe testing apparatus - Google Patents

Inductive probe testing apparatus

Info

Publication number
GB2506912B
GB2506912B GB1218372.9A GB201218372A GB2506912B GB 2506912 B GB2506912 B GB 2506912B GB 201218372 A GB201218372 A GB 201218372A GB 2506912 B GB2506912 B GB 2506912B
Authority
GB
United Kingdom
Prior art keywords
testing apparatus
inductive probe
probe testing
inductive
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB1218372.9A
Other versions
GB201218372D0 (en
GB2506912A (en
Inventor
Pickles Philip
Roy Harrison Martin
Wherritt Peter (Deceased)
Davison Karenowska Alexy
Francis Gregg John
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Salunda Ltd
Original Assignee
Salunda Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Salunda Ltd filed Critical Salunda Ltd
Priority to GB1218372.9A priority Critical patent/GB2506912B/en
Publication of GB201218372D0 publication Critical patent/GB201218372D0/en
Publication of GB2506912A publication Critical patent/GB2506912A/en
Application granted granted Critical
Publication of GB2506912B publication Critical patent/GB2506912B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2676—Probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/72—Testing of electric windings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
GB1218372.9A 2012-10-12 2012-10-12 Inductive probe testing apparatus Expired - Fee Related GB2506912B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1218372.9A GB2506912B (en) 2012-10-12 2012-10-12 Inductive probe testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1218372.9A GB2506912B (en) 2012-10-12 2012-10-12 Inductive probe testing apparatus

Publications (3)

Publication Number Publication Date
GB201218372D0 GB201218372D0 (en) 2012-11-28
GB2506912A GB2506912A (en) 2014-04-16
GB2506912B true GB2506912B (en) 2017-11-29

Family

ID=47324707

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1218372.9A Expired - Fee Related GB2506912B (en) 2012-10-12 2012-10-12 Inductive probe testing apparatus

Country Status (1)

Country Link
GB (1) GB2506912B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG11202110424SA (en) 2019-03-26 2021-10-28 Salunda Ltd Fastener assembly sensor unit
GB202015203D0 (en) 2020-09-25 2020-11-11 Salunda Ltd Integrated fastener assembly sensor unit

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2784375A (en) * 1953-12-17 1957-03-05 Dynamic Electronics New York I Circuit resonance indicator
US3956693A (en) * 1974-12-23 1976-05-11 The Garrett Corporation Method and apparatus for testing magnetic sensors using a saturable core and variable load resistors to simulate actual test conditions
US6111414A (en) * 1997-07-31 2000-08-29 Georgia Tech Research Corporation System, circuit, and method for testing an interconnect in a multi-chip substrate
WO2001084168A1 (en) * 2000-05-04 2001-11-08 Georgia Tech Research Corporation System and method for off-line impulse frequency response analysis test
DE102007036202A1 (en) * 2007-11-02 2009-05-14 Knorr-Bremse Systeme für Nutzfahrzeuge GmbH Magnetic field sensor i.e. speed sensor, testing and simulation circuit for e.g. motor vehicle wheel, has frequency generator activating magnetic coils, where magnetic field produced by coils is phase shifted against each other
EP2163905A1 (en) * 2008-09-10 2010-03-17 William L. Smith Self-testing sensor
US20110144940A1 (en) * 2005-03-03 2011-06-16 Continental Teves Ag & Co. Ohg Sensor and Method for the Detection of Local Displacements and Rotations
WO2012042252A1 (en) * 2010-09-28 2012-04-05 Synatel Instrumentation Limited Sensor arrangement to determine rotational speeds

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2784375A (en) * 1953-12-17 1957-03-05 Dynamic Electronics New York I Circuit resonance indicator
US3956693A (en) * 1974-12-23 1976-05-11 The Garrett Corporation Method and apparatus for testing magnetic sensors using a saturable core and variable load resistors to simulate actual test conditions
US6111414A (en) * 1997-07-31 2000-08-29 Georgia Tech Research Corporation System, circuit, and method for testing an interconnect in a multi-chip substrate
WO2001084168A1 (en) * 2000-05-04 2001-11-08 Georgia Tech Research Corporation System and method for off-line impulse frequency response analysis test
US20110144940A1 (en) * 2005-03-03 2011-06-16 Continental Teves Ag & Co. Ohg Sensor and Method for the Detection of Local Displacements and Rotations
DE102007036202A1 (en) * 2007-11-02 2009-05-14 Knorr-Bremse Systeme für Nutzfahrzeuge GmbH Magnetic field sensor i.e. speed sensor, testing and simulation circuit for e.g. motor vehicle wheel, has frequency generator activating magnetic coils, where magnetic field produced by coils is phase shifted against each other
EP2163905A1 (en) * 2008-09-10 2010-03-17 William L. Smith Self-testing sensor
WO2012042252A1 (en) * 2010-09-28 2012-04-05 Synatel Instrumentation Limited Sensor arrangement to determine rotational speeds

Also Published As

Publication number Publication date
GB201218372D0 (en) 2012-11-28
GB2506912A (en) 2014-04-16

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20241012