GB2470288B - Sampling cone of mass spectrometer - Google Patents
Sampling cone of mass spectrometerInfo
- Publication number
- GB2470288B GB2470288B GB1008040.6A GB201008040A GB2470288B GB 2470288 B GB2470288 B GB 2470288B GB 201008040 A GB201008040 A GB 201008040A GB 2470288 B GB2470288 B GB 2470288B
- Authority
- GB
- United Kingdom
- Prior art keywords
- cones
- sampling cone
- mass spectrometer
- cone
- transition metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005070 sampling Methods 0.000 title abstract 3
- 229910052723 transition metal Inorganic materials 0.000 abstract 2
- 150000003624 transition metals Chemical class 0.000 abstract 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 abstract 1
- 238000004140 cleaning Methods 0.000 abstract 1
- 238000011109 contamination Methods 0.000 abstract 1
- 239000000284 extract Substances 0.000 abstract 1
- 238000000605 extraction Methods 0.000 abstract 1
- 238000005468 ion implantation Methods 0.000 abstract 1
- 239000011159 matrix material Substances 0.000 abstract 1
- 239000007769 metal material Substances 0.000 abstract 1
- 229910052719 titanium Inorganic materials 0.000 abstract 1
- 239000010936 titanium Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
A sampling cone 3 of a mass spectrometer is disclosed wherein the sampling cone 3 is made. from a transition metal (especially titanium) which has been subjected to ion implantation. Conventional cones, cone-gas cones and extraction cones can suffer from increased surface contamination following regular analysis of complex matrix extracts. An implanted transition metal material used for the cones offers a more robust and less reactive surface and therefore requires less extensive cleaning to maintain high performance.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0908251.2A GB0908251D0 (en) | 2009-05-13 | 2009-05-13 | Sampling cone of mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB201008040D0 GB201008040D0 (en) | 2010-06-30 |
| GB2470288A GB2470288A (en) | 2010-11-17 |
| GB2470288B true GB2470288B (en) | 2013-11-20 |
Family
ID=40833951
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GBGB0908251.2A Ceased GB0908251D0 (en) | 2009-05-13 | 2009-05-13 | Sampling cone of mass spectrometer |
| GB1008040.6A Active GB2470288B (en) | 2009-05-13 | 2010-05-13 | Sampling cone of mass spectrometer |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GBGB0908251.2A Ceased GB0908251D0 (en) | 2009-05-13 | 2009-05-13 | Sampling cone of mass spectrometer |
Country Status (2)
| Country | Link |
|---|---|
| GB (2) | GB0908251D0 (en) |
| WO (1) | WO2010130998A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11667992B2 (en) | 2021-07-19 | 2023-06-06 | Agilent Technologies, Inc. | Tip for interface cones |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030146378A1 (en) * | 2002-02-01 | 2003-08-07 | Alex Mordehai | Skimmer for mass spectrometry |
| US6608318B1 (en) * | 2000-07-31 | 2003-08-19 | Agilent Technologies, Inc. | Ionization chamber for reactive samples |
| JP2004039313A (en) * | 2002-06-28 | 2004-02-05 | Toshiba Microelectronics Corp | ICP mass spectrometer and its analysis method |
| US20050194530A1 (en) * | 2004-03-08 | 2005-09-08 | Rohan Thakur | Titanium ion transfer components for use in mass spectrometry |
-
2009
- 2009-05-13 GB GBGB0908251.2A patent/GB0908251D0/en not_active Ceased
-
2010
- 2010-05-13 GB GB1008040.6A patent/GB2470288B/en active Active
- 2010-05-13 WO PCT/GB2010/000957 patent/WO2010130998A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6608318B1 (en) * | 2000-07-31 | 2003-08-19 | Agilent Technologies, Inc. | Ionization chamber for reactive samples |
| US20030146378A1 (en) * | 2002-02-01 | 2003-08-07 | Alex Mordehai | Skimmer for mass spectrometry |
| JP2004039313A (en) * | 2002-06-28 | 2004-02-05 | Toshiba Microelectronics Corp | ICP mass spectrometer and its analysis method |
| US20050194530A1 (en) * | 2004-03-08 | 2005-09-08 | Rohan Thakur | Titanium ion transfer components for use in mass spectrometry |
Non-Patent Citations (1)
| Title |
|---|
| Surface and Coatings Technology, vo. 83, 1996, SUGIZAKI, YASUNAGA, TOMARI, "Improvement of corrosion resistance of titanium by co-implantation", pages 167-174. * |
Also Published As
| Publication number | Publication date |
|---|---|
| GB2470288A (en) | 2010-11-17 |
| WO2010130998A1 (en) | 2010-11-18 |
| GB0908251D0 (en) | 2009-06-24 |
| GB201008040D0 (en) | 2010-06-30 |
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