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GB2462954A - System and method for thermal analysis using variable thermal resistance - Google Patents

System and method for thermal analysis using variable thermal resistance Download PDF

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Publication number
GB2462954A
GB2462954A GB0919874A GB0919874A GB2462954A GB 2462954 A GB2462954 A GB 2462954A GB 0919874 A GB0919874 A GB 0919874A GB 0919874 A GB0919874 A GB 0919874A GB 2462954 A GB2462954 A GB 2462954A
Authority
GB
United Kingdom
Prior art keywords
enclosure
sample
thermal
measurement
variable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB0919874A
Other versions
GB0919874D0 (en
GB2462954B (en
Inventor
Robert L Danley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Waters Investments Ltd
Waters Technologies Corp
Original Assignee
Waters Investments Ltd
Waters Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US12/130,553 external-priority patent/US8066429B2/en
Application filed by Waters Investments Ltd, Waters Technologies Corp filed Critical Waters Investments Ltd
Priority to GB201110397A priority Critical patent/GB2478879B8/en
Publication of GB0919874D0 publication Critical patent/GB0919874D0/en
Publication of GB2462954A publication Critical patent/GB2462954A/en
Application granted granted Critical
Publication of GB2462954B publication Critical patent/GB2462954B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
    • G01N25/4806—Details not adapted to a particular type of sample
    • G01N25/4826—Details not adapted to a particular type of sample concerning the heating or cooling arrangements
    • G01N25/4833—Details not adapted to a particular type of sample concerning the heating or cooling arrangements specially adapted for temperature scanning

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

A thermal measurement apparatus and method for performing heat flux differential scanning calorimetry (DSC) is disclosed. A variable thermal resistor is used to couple a measurement assembly to a heat sink in the thermal measurement apparatus, such that samples can be rapidly heated and rapidly cooled. The apparatus can be configured with a highly conductive sample assembly enclosure. The enclosure can include a high emissivity coating. In one embodiment, the enclosure extends along a longitudinal direction that is about the same as that of an infrared lamp assembly used to heat the enclosure, thereby increasing the efficiency of heating the sample enclosure. In one configuration, the variable thermal resistor comprises a gap whose gas composition can be varied during a sample measurement to independently optimize sample heating and cooling rates.
GB0919874A 2007-06-06 2008-06-05 System and method for thermal analysis using variable thermal resistance Expired - Fee Related GB2462954B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB201110397A GB2478879B8 (en) 2007-06-06 2008-06-05 System and method for thermal analysis using variable thermal resistance.

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US94224507P 2007-06-06 2007-06-06
US94224207P 2007-06-06 2007-06-06
US1573107P 2007-12-21 2007-12-21
US12/130,553 US8066429B2 (en) 2007-06-06 2008-05-30 System and method for thermal analysis using variable thermal resistance
PCT/US2008/007087 WO2008153913A1 (en) 2007-06-06 2008-06-05 System and method for thermal analysis using variable thermal resistance

Publications (3)

Publication Number Publication Date
GB0919874D0 GB0919874D0 (en) 2009-12-30
GB2462954A true GB2462954A (en) 2010-03-03
GB2462954B GB2462954B (en) 2011-08-17

Family

ID=40130046

Family Applications (3)

Application Number Title Priority Date Filing Date
GB0919876A Active GB2462955B (en) 2007-06-06 2008-06-05 Infrared heated differential scanning calorimeter
GB0919874A Expired - Fee Related GB2462954B (en) 2007-06-06 2008-06-05 System and method for thermal analysis using variable thermal resistance
GB201110397A Expired - Fee Related GB2478879B8 (en) 2007-06-06 2008-06-05 System and method for thermal analysis using variable thermal resistance.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB0919876A Active GB2462955B (en) 2007-06-06 2008-06-05 Infrared heated differential scanning calorimeter

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB201110397A Expired - Fee Related GB2478879B8 (en) 2007-06-06 2008-06-05 System and method for thermal analysis using variable thermal resistance.

Country Status (3)

Country Link
DE (2) DE112008001462B4 (en)
GB (3) GB2462955B (en)
WO (2) WO2008153913A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011104435B3 (en) 2011-06-16 2012-08-16 Airbus Operations Gmbh Determining device for non-destructive determination of material characteristics of aircraft component during manufacturing aircraft component, has computing unit determining relation of region to another region
CN106525288B (en) * 2016-10-12 2018-10-09 北京遥测技术研究所 A kind of pure radiant heat flux sensor
AT524363B1 (en) * 2020-10-30 2022-06-15 Anton Paar Gmbh Measuring device with an electrothermal transducer for adjusting a thermal resistance, and method of operation
US20250377322A1 (en) * 2024-06-06 2025-12-11 GM Global Technology Operations LLC Differential scanning calorimeter
DE102024129235B3 (en) * 2024-10-10 2025-07-17 Netzsch - Gerätebau Gesellschaft mit beschränkter Haftung Sample carrier device for measuring devices for thermal sample analysis, measuring device

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3491581A (en) * 1968-02-07 1970-01-27 Frank E Roberts Thermocouple and sample holder apparatus for use in differential thermal analysis
US4429684A (en) * 1978-11-07 1984-02-07 Leonard Greiner Chemical heat pump
US5363391A (en) * 1992-04-24 1994-11-08 Hughes Aircraft Company Conductive face-cooled laser crystal
US5484204A (en) * 1994-09-21 1996-01-16 Ta Instruments, Inc. Mechanical cooling system
US5509733A (en) * 1993-12-21 1996-04-23 Ta Instruments, Inc. Infrared heated differential thermal analyzer
US5655681A (en) * 1995-09-07 1997-08-12 The Perkin-Elmer Corporation Thermal insulating container for liquified gas
US6403925B1 (en) * 1995-07-10 2002-06-11 Mattson Technology, Inc. System and method for thermal processing of a semiconductor substrate
US6431747B1 (en) * 2000-03-23 2002-08-13 Ta Instruments, Inc. Heat flux differential scanning calorimeter sensor
US6491425B1 (en) * 1996-04-22 2002-12-10 Ta Instruments, Inc. Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
US20030026319A1 (en) * 2001-08-03 2003-02-06 Ryoichi Kinoshita Differential scanning calorimeter
US6523998B1 (en) * 2001-01-26 2003-02-25 Ta Instruments, Inc. Thermal analysis assembly with distributed resistance and integral flange for mounting various cooling devices
US20030101612A1 (en) * 1999-12-29 2003-06-05 Granneman Ernst Hendrik August Apparatus, method and system for the treatment of a wafer
US20030165179A1 (en) * 2002-03-01 2003-09-04 Danley Robert L. System and method for calibrating contact thermal resistances in differential scanning calorimeters
US7025497B2 (en) * 2001-01-26 2006-04-11 Waters Investment Limited Differential scanning calorimeter accounting for heat leakage

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US509733A (en) 1893-11-28 Island
US2769334A (en) * 1954-11-15 1956-11-06 Soehngen Erich Simulator for transient convective heat transfer phenomena
DE2545134C3 (en) * 1975-10-08 1981-01-08 Gildemeister Corpoplast Gmbh, 2000 Hamburg Method and device for heating a preform made of thermoplastic material
US4095453A (en) 1977-02-25 1978-06-20 E. I. Du Pont De Nemours And Company Differential thermal analysis cell
FR2598803B1 (en) * 1986-05-16 1988-09-02 Anvar DEVICE FOR MEASURING THE INTENSITY OF A RADIATIVE FLOW
US5876118A (en) * 1995-12-08 1999-03-02 The Perkin-Elmer Corporation Calorimeter having rapid cooling of a heating vessel therein
US6221441B1 (en) * 1999-05-26 2001-04-24 Ppg Industries Ohio, Inc. Multi-stage processes for coating substrates with liquid basecoat and powder topcoat
US6488406B2 (en) 2000-03-23 2002-12-03 Ta Instruments-Waters, Llc Differential scanning calorimeter
US6561692B2 (en) 2000-03-23 2003-05-13 Ta Instruments-Waters Llc Differential scanning calorimeter
US6488408B1 (en) 2000-10-06 2002-12-03 Gecko Electronique, Inc. Temperature probe mounting device for hot tub spa
US6578367B1 (en) 2001-03-02 2003-06-17 Ta Instruments-Waters Llc Liquid nitrogen cooling system
US6578376B2 (en) 2001-11-02 2003-06-17 Matt Alvin Thurman Refrigeration apparatus and associated methods
US6821015B2 (en) * 2002-01-25 2004-11-23 Robert Hammer Conducted heat vector sensor
US7470057B2 (en) * 2006-08-24 2008-12-30 Waters Investments Limited Differential scanning calorimeter sensor and method

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3491581A (en) * 1968-02-07 1970-01-27 Frank E Roberts Thermocouple and sample holder apparatus for use in differential thermal analysis
US4429684A (en) * 1978-11-07 1984-02-07 Leonard Greiner Chemical heat pump
US5363391A (en) * 1992-04-24 1994-11-08 Hughes Aircraft Company Conductive face-cooled laser crystal
US5509733A (en) * 1993-12-21 1996-04-23 Ta Instruments, Inc. Infrared heated differential thermal analyzer
US5484204A (en) * 1994-09-21 1996-01-16 Ta Instruments, Inc. Mechanical cooling system
US6403925B1 (en) * 1995-07-10 2002-06-11 Mattson Technology, Inc. System and method for thermal processing of a semiconductor substrate
US5655681A (en) * 1995-09-07 1997-08-12 The Perkin-Elmer Corporation Thermal insulating container for liquified gas
US6491425B1 (en) * 1996-04-22 2002-12-10 Ta Instruments, Inc. Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy
US20030101612A1 (en) * 1999-12-29 2003-06-05 Granneman Ernst Hendrik August Apparatus, method and system for the treatment of a wafer
US6431747B1 (en) * 2000-03-23 2002-08-13 Ta Instruments, Inc. Heat flux differential scanning calorimeter sensor
US6523998B1 (en) * 2001-01-26 2003-02-25 Ta Instruments, Inc. Thermal analysis assembly with distributed resistance and integral flange for mounting various cooling devices
US7025497B2 (en) * 2001-01-26 2006-04-11 Waters Investment Limited Differential scanning calorimeter accounting for heat leakage
US20030026319A1 (en) * 2001-08-03 2003-02-06 Ryoichi Kinoshita Differential scanning calorimeter
US20030165179A1 (en) * 2002-03-01 2003-09-04 Danley Robert L. System and method for calibrating contact thermal resistances in differential scanning calorimeters

Also Published As

Publication number Publication date
GB2462955B (en) 2011-10-12
DE112008001385T5 (en) 2010-04-15
DE112008001462T5 (en) 2010-05-06
GB2478879A8 (en) 2012-10-03
WO2008153913A1 (en) 2008-12-18
GB201110397D0 (en) 2011-08-03
GB2478879B8 (en) 2012-10-03
DE112008001462B4 (en) 2015-06-03
DE112008001385B4 (en) 2014-10-09
GB2478879A (en) 2011-09-21
GB0919874D0 (en) 2009-12-30
GB2462954B (en) 2011-08-17
GB2462955A (en) 2010-03-03
GB0919876D0 (en) 2009-12-30
WO2008153910A1 (en) 2008-12-18
GB2478879B (en) 2011-11-16

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20230605