GB2333900B - Magnetic-field sensitive thin film sensor having a tunnel effect barrier layer - Google Patents
Magnetic-field sensitive thin film sensor having a tunnel effect barrier layerInfo
- Publication number
- GB2333900B GB2333900B GB9907727A GB9907727A GB2333900B GB 2333900 B GB2333900 B GB 2333900B GB 9907727 A GB9907727 A GB 9907727A GB 9907727 A GB9907727 A GB 9907727A GB 2333900 B GB2333900 B GB 2333900B
- Authority
- GB
- United Kingdom
- Prior art keywords
- magnetic
- thin film
- barrier layer
- film sensor
- tunnel effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000004888 barrier function Effects 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/098—Magnetoresistive devices comprising tunnel junctions, e.g. tunnel magnetoresistance sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
- Bipolar Transistors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19640632 | 1996-10-02 | ||
| PCT/DE1997/002236 WO1998014793A1 (en) | 1996-10-02 | 1997-09-29 | Magnetic-field sensitive thin film sensor with a tunnel effect barrier layer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| GB9907727D0 GB9907727D0 (en) | 1999-05-26 |
| GB2333900A GB2333900A (en) | 1999-08-04 |
| GB2333900B true GB2333900B (en) | 2001-07-11 |
Family
ID=7807665
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB9907727A Expired - Fee Related GB2333900B (en) | 1996-10-02 | 1997-09-29 | Magnetic-field sensitive thin film sensor having a tunnel effect barrier layer |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2001501309A (en) |
| DE (1) | DE19781061D2 (en) |
| GB (1) | GB2333900B (en) |
| WO (1) | WO1998014793A1 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0971423A1 (en) * | 1998-07-10 | 2000-01-12 | Interuniversitair Micro-Elektronica Centrum Vzw | Spin-valve structure and method for making same |
| EP0971424A3 (en) * | 1998-07-10 | 2004-08-25 | Interuniversitair Microelektronica Centrum Vzw | Spin-valve structure and method for making spin-valve structures |
| DE10017374B4 (en) * | 1999-05-25 | 2007-05-10 | Siemens Ag | Magnetic coupling device and its use |
| JP2001196661A (en) * | 1999-10-27 | 2001-07-19 | Sony Corp | Magnetization control method, information storage method, magnetic function element, and information storage element |
| DE10009944A1 (en) | 2000-03-02 | 2001-09-13 | Forschungszentrum Juelich Gmbh | Arrangement for measuring magnetic field comprises first layer and second layer having electrically conducting antiferromagnetic layer bordering soft magnetic layer |
| KR100650534B1 (en) | 2000-12-21 | 2006-11-27 | 후지쯔 가부시끼가이샤 | Magnetoresistive element, magnetic head and magnetic regeneration device using the same |
| JP2002305335A (en) * | 2001-04-06 | 2002-10-18 | Toshiba Corp | Spin valve transistor |
| DE10128964B4 (en) * | 2001-06-15 | 2012-02-09 | Qimonda Ag | Digital magnetic memory cell device |
| DE10217598C1 (en) * | 2002-04-19 | 2003-10-16 | Siemens Ag | Circuit device with magnetoresistive circuit elements providing output signals of opposite sign in response to external magnetic field |
| DE10217593C1 (en) * | 2002-04-19 | 2003-10-16 | Siemens Ag | Circuit device with magnetoresistive circuit elements providing output signals of opposite sign in response to external magnetic field |
| DE10222395B4 (en) * | 2002-05-21 | 2010-08-05 | Siemens Ag | Circuit device with a plurality of TMR sensor elements |
| DE10309244A1 (en) * | 2003-03-03 | 2004-09-23 | Siemens Ag | Thin film magnetic memory element has a tunnel barrier layer that is at least partially comprised of Yttrium oxide, arranged between ferromagnetic layers |
| US11500042B2 (en) | 2020-02-28 | 2022-11-15 | Brown University | Magnetic sensing devices based on interlayer exchange-coupled magnetic thin films |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1994015223A1 (en) * | 1992-12-21 | 1994-07-07 | Siemens Aktiengesellschaft | Magneto-resistive sensor with a synthetic anti-ferromagnet, and a method of producing the sensor |
| US5416353A (en) * | 1992-09-11 | 1995-05-16 | Kabushiki Kaisha Toshiba | Netoresistance effect element |
| WO1996007208A1 (en) * | 1994-08-31 | 1996-03-07 | Douwe Johannes Monsma | Current conducting structure with at least one potential barrier and method of manufcturing such |
-
1997
- 1997-09-29 JP JP10516141A patent/JP2001501309A/en active Pending
- 1997-09-29 DE DE19781061T patent/DE19781061D2/en not_active Expired - Fee Related
- 1997-09-29 WO PCT/DE1997/002236 patent/WO1998014793A1/en not_active Ceased
- 1997-09-29 GB GB9907727A patent/GB2333900B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5416353A (en) * | 1992-09-11 | 1995-05-16 | Kabushiki Kaisha Toshiba | Netoresistance effect element |
| WO1994015223A1 (en) * | 1992-12-21 | 1994-07-07 | Siemens Aktiengesellschaft | Magneto-resistive sensor with a synthetic anti-ferromagnet, and a method of producing the sensor |
| WO1996007208A1 (en) * | 1994-08-31 | 1996-03-07 | Douwe Johannes Monsma | Current conducting structure with at least one potential barrier and method of manufcturing such |
Non-Patent Citations (1)
| Title |
|---|
| IEEE Transactions on Magnetics, Vol 32, No 5, 5/9/96, p4624-4626, "GMR Sensor" Berg Van Den et al * |
Also Published As
| Publication number | Publication date |
|---|---|
| DE19781061D2 (en) | 1999-07-01 |
| GB2333900A (en) | 1999-08-04 |
| GB9907727D0 (en) | 1999-05-26 |
| WO1998014793A1 (en) | 1998-04-09 |
| JP2001501309A (en) | 2001-01-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 789A | Request for publication of translation (sect. 89(a)/1977) | ||
| PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20011011 |