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GB2312092B - Liquid crystal display and method of manufacturing the same - Google Patents

Liquid crystal display and method of manufacturing the same

Info

Publication number
GB2312092B
GB2312092B GB9706824A GB9706824A GB2312092B GB 2312092 B GB2312092 B GB 2312092B GB 9706824 A GB9706824 A GB 9706824A GB 9706824 A GB9706824 A GB 9706824A GB 2312092 B GB2312092 B GB 2312092B
Authority
GB
United Kingdom
Prior art keywords
manufacturing
liquid crystal
same
crystal display
display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB9706824A
Other versions
GB2312092A (en
GB9706824D0 (en
Inventor
Ki-Hynn Lyn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LG Electronics Inc
Original Assignee
LG Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by LG Electronics Inc filed Critical LG Electronics Inc
Publication of GB9706824D0 publication Critical patent/GB9706824D0/en
Publication of GB2312092A publication Critical patent/GB2312092A/en
Application granted granted Critical
Publication of GB2312092B publication Critical patent/GB2312092B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/021Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/031Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
    • H10D30/0312Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
    • H10D30/0316Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral bottom-gate TFTs comprising only a single gate
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/1368Active matrix addressed cells in which the switching element is a three-electrode device
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/021Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/031Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
    • H10D30/0321Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6729Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H10D30/6732Bottom-gate only TFTs
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/674Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743Silicon
    • H10D30/6746Amorphous silicon

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Thin Film Transistor (AREA)
GB9706824A 1996-04-09 1997-04-04 Liquid crystal display and method of manufacturing the same Expired - Lifetime GB2312092B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019960010637A KR100202236B1 (en) 1996-04-09 1996-04-09 Active matrix panel and its making method

Publications (3)

Publication Number Publication Date
GB9706824D0 GB9706824D0 (en) 1997-05-21
GB2312092A GB2312092A (en) 1997-10-15
GB2312092B true GB2312092B (en) 1998-06-03

Family

ID=19455336

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9706824A Expired - Lifetime GB2312092B (en) 1996-04-09 1997-04-04 Liquid crystal display and method of manufacturing the same

Country Status (5)

Country Link
JP (2) JP4034376B2 (en)
KR (1) KR100202236B1 (en)
DE (1) DE19714690C2 (en)
FR (1) FR2747237B1 (en)
GB (1) GB2312092B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7459352B2 (en) 2000-12-11 2008-12-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, and manufacturing method thereof
US7629618B2 (en) 2000-12-21 2009-12-08 Semiconductor Energy Laboratory Co., Ltd. Light emitting device and method of manufacturing the same
WO2015180269A1 (en) * 2014-05-28 2015-12-03 京东方科技集团股份有限公司 Array substrate and manufacturing method therefor, and display apparatus

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100538293B1 (en) * 1998-04-03 2006-03-17 삼성전자주식회사 Method of manufacturing flat drive liquid crystal display
KR100980015B1 (en) * 2003-08-19 2010-09-03 삼성전자주식회사 Thin film transistor array panel and manufacturing method thereof
KR102183920B1 (en) 2013-12-16 2020-11-30 삼성디스플레이 주식회사 Thin film transistor array panel and method of manufacturing the same

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0195560A (en) * 1987-10-08 1989-04-13 Casio Comput Co Ltd Manufacturing method of thin film transistor
US5294811A (en) * 1990-11-30 1994-03-15 Hitachi, Ltd. Thin film semiconductor device having inverted stagger structure, and device having such semiconductor device
US5349205A (en) * 1991-12-02 1994-09-20 Matsushita Electric Industrial Co., Ltd. Thin-film transistor array with anodic oxide for use in a liquid crystal display
US5539219A (en) * 1995-05-19 1996-07-23 Ois Optical Imaging Systems, Inc. Thin film transistor with reduced channel length for liquid crystal displays

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5173753A (en) * 1989-08-10 1992-12-22 Industrial Technology Research Institute Inverted coplanar amorphous silicon thin film transistor which provides small contact capacitance and resistance
US5130263A (en) * 1990-04-17 1992-07-14 General Electric Company Method for photolithographically forming a selfaligned mask using back-side exposure and a non-specular reflecting layer
DE69115405T2 (en) * 1990-09-21 1996-06-13 Casio Computer Co Ltd Thin film transistor and a thin film transistor panel using such transistors
DE69116337T2 (en) * 1990-10-05 1996-09-12 Gen Electric THIN FILM TRANSISTOR STRUCTURE WITH IMPROVED SOURCE / DRAIN CONTACTS
EP0566838A3 (en) * 1992-02-21 1996-07-31 Matsushita Electric Industrial Co Ltd Manufacturing method of thin film transistor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0195560A (en) * 1987-10-08 1989-04-13 Casio Comput Co Ltd Manufacturing method of thin film transistor
US5294811A (en) * 1990-11-30 1994-03-15 Hitachi, Ltd. Thin film semiconductor device having inverted stagger structure, and device having such semiconductor device
US5349205A (en) * 1991-12-02 1994-09-20 Matsushita Electric Industrial Co., Ltd. Thin-film transistor array with anodic oxide for use in a liquid crystal display
US5539219A (en) * 1995-05-19 1996-07-23 Ois Optical Imaging Systems, Inc. Thin film transistor with reduced channel length for liquid crystal displays

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Patent Abstracts of Japan, Section E, Section No 794, Vol 13, No 333, Pg 16, 26/7/89 & JP01-095560A *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7459352B2 (en) 2000-12-11 2008-12-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, and manufacturing method thereof
US8421135B2 (en) 2000-12-11 2013-04-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, and manufacturing method thereof
US7629618B2 (en) 2000-12-21 2009-12-08 Semiconductor Energy Laboratory Co., Ltd. Light emitting device and method of manufacturing the same
US8013346B2 (en) 2000-12-21 2011-09-06 Semiconductor Energy Laboratory Co., Ltd. Light emitting device and method of manufacturing the same
US9231044B2 (en) 2000-12-21 2016-01-05 Semiconductor Energy Laboratory Co., Ltd. Light emitting device and method of manufacturing the same
WO2015180269A1 (en) * 2014-05-28 2015-12-03 京东方科技集团股份有限公司 Array substrate and manufacturing method therefor, and display apparatus

Also Published As

Publication number Publication date
FR2747237A1 (en) 1997-10-10
DE19714690A1 (en) 1997-10-30
KR100202236B1 (en) 1999-07-01
FR2747237B1 (en) 1999-04-16
DE19714690C2 (en) 2003-12-11
JP4117369B2 (en) 2008-07-16
GB2312092A (en) 1997-10-15
JP4034376B2 (en) 2008-01-16
KR970072497A (en) 1997-11-07
JPH1039331A (en) 1998-02-13
GB9706824D0 (en) 1997-05-21
JP2007206712A (en) 2007-08-16

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PE20 Patent expired after termination of 20 years

Expiry date: 20170403