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GB2218816B - Improvements in and relating to methods of testing integrated circuits - Google Patents

Improvements in and relating to methods of testing integrated circuits

Info

Publication number
GB2218816B
GB2218816B GB8811863A GB8811863A GB2218816B GB 2218816 B GB2218816 B GB 2218816B GB 8811863 A GB8811863 A GB 8811863A GB 8811863 A GB8811863 A GB 8811863A GB 2218816 B GB2218816 B GB 2218816B
Authority
GB
United Kingdom
Prior art keywords
relating
methods
integrated circuits
testing integrated
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
GB8811863A
Other versions
GB8811863D0 (en
GB2218816A (en
Inventor
Jonathan Bradford
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Roke Manor Research Ltd
GE Healthcare UK Ltd
Plessey Co Ltd
Original Assignee
Roke Manor Research Ltd
GE Healthcare UK Ltd
Plessey Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Roke Manor Research Ltd, GE Healthcare UK Ltd, Plessey Co Ltd filed Critical Roke Manor Research Ltd
Priority to GB8811863A priority Critical patent/GB2218816B/en
Publication of GB8811863D0 publication Critical patent/GB8811863D0/en
Publication of GB2218816A publication Critical patent/GB2218816A/en
Application granted granted Critical
Publication of GB2218816B publication Critical patent/GB2218816B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G01R31/318547—Data generators or compressors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB8811863A 1988-05-19 1988-05-19 Improvements in and relating to methods of testing integrated circuits Expired - Lifetime GB2218816B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8811863A GB2218816B (en) 1988-05-19 1988-05-19 Improvements in and relating to methods of testing integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB8811863A GB2218816B (en) 1988-05-19 1988-05-19 Improvements in and relating to methods of testing integrated circuits

Publications (3)

Publication Number Publication Date
GB8811863D0 GB8811863D0 (en) 1988-06-22
GB2218816A GB2218816A (en) 1989-11-22
GB2218816B true GB2218816B (en) 1992-07-29

Family

ID=10637171

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8811863A Expired - Lifetime GB2218816B (en) 1988-05-19 1988-05-19 Improvements in and relating to methods of testing integrated circuits

Country Status (1)

Country Link
GB (1) GB2218816B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0599993A (en) * 1991-04-15 1993-04-23 Internatl Business Mach Corp <Ibm> Logic circuit with testable scanning string
US5230000A (en) * 1991-04-25 1993-07-20 At&T Bell Laboratories Built-in self-test (bist) circuit
US5406216A (en) * 1993-11-29 1995-04-11 Motorola, Inc. Technique and method for asynchronous scan design
JP2000513815A (en) * 1997-04-24 2000-10-17 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ A method for making digital circuits scan testable.
DE19929546C1 (en) * 1999-06-23 2000-09-07 Michael Goessel Multi-mode memory element has combination circuit that implements Boolean function for first state of control signal and connects its second input logically to output for second state
US6947884B2 (en) 2000-03-02 2005-09-20 Texas Instruments Incorporated Scan interface with TDM feature for permitting signal overlay
EP1130501B1 (en) * 2000-03-02 2009-07-15 Texas Instruments Incorporated Dynamically configurable debug port for concurrent support of debug functions from multiple data processing cores
DE10041137A1 (en) * 2000-08-21 2002-03-21 Philips Corp Intellectual Pty Arrangement for testing integrated circuits

Also Published As

Publication number Publication date
GB8811863D0 (en) 1988-06-22
GB2218816A (en) 1989-11-22

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Legal Events

Date Code Title Description
732 Registration of transactions, instruments or events in the register (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19960519