[go: up one dir, main page]

GB2201791A - Transducer signal conditioner - Google Patents

Transducer signal conditioner Download PDF

Info

Publication number
GB2201791A
GB2201791A GB08803669A GB8803669A GB2201791A GB 2201791 A GB2201791 A GB 2201791A GB 08803669 A GB08803669 A GB 08803669A GB 8803669 A GB8803669 A GB 8803669A GB 2201791 A GB2201791 A GB 2201791A
Authority
GB
United Kingdom
Prior art keywords
transducer
temperature
signal
output
resistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB08803669A
Other versions
GB8803669D0 (en
GB2201791B (en
Inventor
Barry Lascelles Welsh
Clive Robert Pyne
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SECR DEFENCE
UK Secretary of State for Defence
Original Assignee
SECR DEFENCE
UK Secretary of State for Defence
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SECR DEFENCE, UK Secretary of State for Defence filed Critical SECR DEFENCE
Publication of GB8803669D0 publication Critical patent/GB8803669D0/en
Publication of GB2201791A publication Critical patent/GB2201791A/en
Application granted granted Critical
Publication of GB2201791B publication Critical patent/GB2201791B/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/20Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281Arrangements for correcting or for compensating unwanted effects for temperature variations

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)

Abstract

A temperature compensation circuit for use with a resistance-bridge type pressure transducer (1), particularly useful for wind tunnel experiments. In one embodiment, a differential amplifier (7) senses the transducer output and produces an output signal referenced to an intermediate voltage generated by an operational amplifier (8). The voltage across a sense resistor (R1) connected between the transducer and a power supply (2) varies in accordance with transducer temperature. These voltage variations are applied to the output signal by means of a summing amplifier (10) to compensate for thermal offset in the transducer output. Thermally-induced sensitivity variations in the transducer output may be further compensated by incorporating a thermally sensitive resistor (R3) placed in proximity to the transducer and a gain adjustment amplifier (12). In a digital embodiment, the transducer output and sense resistor voltage are digitised and fed into a signal processor (16) which corrects the transducer output to compensate for thermal offset sensitivity variation using calibration data from a digital memory (15).

Description

TRANSDUCER SIGNAL CONDITIONER This invention relates to signal conditioning circuitry and particularly to such circuits suitable for use in conjunction with pressure and force transducers.
In the case of resistance bridge transducers, such as foil-type or semi-conductor type strain gauges operating on the Wheatstone bridge principle, problems often arise during measurement due to variations in the transducer's temperature.
Temperature variations affect this type of transducer in two ways, namely its zero balance and its sensitivity. In an ideal Wheatstone bridge each resistive element has the same temperature coefficient, thus cancelling the effects of any temperature changes. In practice, however, this is not generally the case and these differences in temperature coefficients coupled with the non-linear expansion of the transducer housing lead to an offset in the output and temperature dependant sensitivity characteristics. These effects are particularly serious for steady pressure measurements.
A known method for compensating for these temperature effects relies on a passive resistor network. Each network has a low temperature coefficient of resistance and is adjusted to correct for both zero balance offset and for sensitivity variations of the transducer. However, these compensated transducer networks still do not have ideal thermal characteristics and are unsuitable for use in, for example, an aerodynamic wind tunnel where the mean air temperature can vary +20C typically within an operating range between 0 C and 50"C.
A further known technique for performing temperature compensation and having better thermal stability than that employing resistor networks is described in UK Patent No 1,591,620. This patent describes a signal conditioning circuit for use in combination with a transducer of the Wheatstone bridge type comprising an amplifier for receiving an output signal from the transducer via a gain control, temperature compensation means adapted to receive an input signal, separate from the transducer signal, which is dependent upon the transducer temperature and to generate from the input signal a gain control signal and a DC offset voltage which is applied to the transducer output signal such that compensation is made for the variations of the transducer output signal with temperature.
Two disadvantages of this particular circuit are that a second power supply separate from the transducer bridge excitation supply is required, and that the setting-up procedure is laborious.
The present invention provides a signal conditioning circuit which can be powered from the bridge excitation supply.
It seeks to provide a conditioning circuit which is easy and quick to set up and which has good thermal stability over a wide temperature range.
According to a first aspect of the present invention, a signal conditioning circuit for use in combination with a transducer of the resistance bridge type comprises means for sensing the transducer output and for producing a transducer voltage level with respect to a reference voltage, means for producing a signal dependant on transducer temperature and means for applying this temperature-dependant signal to the transducer voltage level in order to compensate for variations in the transducer output with temperature.
Preferably, the means for sensing the transducer output and producing the referenced transducer voltage level is a differential amplifier.
Two operational amplifiers may be connected between the transducer outputs and the differential amplifier in order to act as impedance buffers.
The reference voltage may be generated by means of an operational amplifier.
Preferably, the means for applying the temperature-dependant signal to the transducer voltage level comprise a potentiometer and summing amplifier.
Preferably, variations in the transducer temperature are detected by sensing variations in the resistance of the transducer. In the case of a transducer excited by a constant voltage supply, this may be achieved by connecting a sense resistor, preferably a temperature-stable resistance, in series with the constant voltage supplied to the transducer and detecting changes in the voltage drop across the sense resistor resulting from variations in the current drawn by the transducer bridge due to temperature variations thereof. The voltage is then used in accordance with the first aspect of this invention to control a DC offset voltage applied to the transducer voltage level. Hence, the transducer's zero balance offset may be corrected.
According to a further feature of the invention, temperature-induced sensitivity variations in the transducer output may be compensated by the addition of transducervoltage-level gain control means comprising an operational amplifier whose gain is varied by a temperature-sensitive resistor mounted in close proximity to the transducer.
According to a second aspect of the invention, a signal conditioning circuit suitable for use in combination with a transducer of the resistance bridge type comprises a resistor connected in series with a transducer voltage supply, the voltage across the resistor thus varying as a function of the temperature of the transducer, means for converting the output of the transducer and the voltage across the resistor into digital signals to produce a transducer output value and a resistor output value respectively, a digital memory for storing calibration data and a signal processor for receiving the transducer output value, the resistor output value and the calibration data and for computing a temperature-compensated transducer output value by applying correction terms involving the resistor output value and the calibration data to the transducer output value.
If the signal conditioning circuit is to be used close to the transducer, ie in the same thermal environment, then it is preferable for the electronic components which comprise the circuit to have high thermal stability. Otherwise the full capabilities of the conditioning circuitry will not be realised.
If the circuit is to be used in a thermally stable environment, remote from the transducer, then the constraints on thermal stability of the components can be relaxed.
The circuit has the advantage that it may be added to any standard uncompensated transducer bridge without making any alterations to the transducer bridge circuit itself.
The absence of serious thermal hysteresis effects enables the compensated transducer to respond rapidly to thermal shocks without significant loss of accuracy, limited only by the thermal mass of the transducer itself. Furthermore, the frequency response of the circuit is such that it does not limit the dynamic performance of the transducer.
A transducer bridge operating in conjunction with a circuit according to the invention has the advantage of being able to give an output signal which is substantially independent of temperature over a range -1600C to 1000C.
The sense resistor voltage provides an accurate measurement of the transducer temperature and is useful as a thermometer when alternative methods of temperature measurement are unreliable or difficult to install.
The invention will now be described with reference to the drawings, of which Figure 1 shows a first embodiment of the invention, Figure 2 shows a second embodiment of the invention, and Figure 3 shows calibration curves pertinent to the embodiment of Figure 2.
Figure 1 shows a circuit diagram of a signal conditioning circuit for a transducer bridge 1. The transducer bridge comprises a four active arm wheatstone bridge of the miniature semi-conductor type and is excited from a regulated constant voltage source 2. The transducer bridge is configured as a pressure transducer suitable for use in the simultaneous measurement of both steady and unsteady pressures within an aerodynamic wind tunnel. Hence the output signal from the transducer bridge 1 contains DC and AC components representing the steady and unsteady components of pressure respectively.
This signal is fed via lines 3 and 4 into operational amplifiers 5 and 6 respectively, outputs from which are fed into a differential amplifier 7 to which a reference signal from a voltage reference amplifier 8 is also applied. A temperature-stable sense resistor R1 is connected in series between the transducer bridge 1 and the voltage source 2. A change in the temperature of the transducer bridge 1 is reflected by a change in the bridge resistance which produces a corresponding change in the bridge excitation current.
However, the transducer bridge 1 is configured such that changes in pressure at a constant temperature do not change the excitation current. Hence the sense resistor Rl only senses changes in temperature. A typical value for R1 is 10X of the transducer bridge resistance. The sense voltage signal on line 9 is applied to the inputs of a summing amplifier 10 via a potentiometer R2. This voltage is summed with the reference signal from the reference amplifier 8 and with the output of the differential amplifier 7 to give a temperature-compensated output on line 11. This output and the reference signal form a differential pair.
As all the amplifiers in the signal conditioning circuit shown in Figure 1 are powered from the single-sided source 2, it is necessary to employ the voltage reference amplifier 8 to derive an intermediate voltage which can be regarded as a signal zero or reference. All signals within the conditioning circuit are measured with respect to this reference and hence are allowed to assume both positive or negative values. The actual value of this signal zero is arbitrary provided that the output swing of each amplifier is not limited. However, it is important for the voltage reference amplifier 8 to have a stable output of sufficiently low impedance, typically 200S, to render it insensitive to circuit load changes.
The foregoing description with reference to Figure 1 relates to circuitry which is used to compensate for thermally induced zero balance offset. The circuit shown in Figure 1 also provides means for compensating for thermally induced sensitivity variations in the transducer's output.
This is achieved by incorporating an additional operational amplifier 12 whose inputs are fed from the output of the amplifier 8 directly and from the output of the amplifier 10 via a resistor R3.
The resistor R3 is a thermally sensitive semi-conductor resistor and is placed in close proximity to the transducer bridge I such that it experiences the same thermal environment.
The gain of the amplifier 12 is set by a feedback resistor Rk and the thermally sensitive resistor R3, a change (at3) in the value of R3 as a function of temperature being reflected as a change in the gain G of amplifier 12 as follows:
where R4 has a value which is selected so that the amplifier gain compensates for any thermally-induced increase in sensitivity of the transducer bridge 1.
Compensation for sensitivity variations may not be required for all applications, in which case the resistors R3 and R4 and the amplifier 12 would be omitted from the circuit shown in Figure 1.
Temperature compensation for zero balance offset is achieved by performing a two-point calibration procedure under conditions of constant pressure. Firstly, all amplifiers are nulled at a first (datum) temperature. (Subsequent temperature changes are then detected by sensing changes in the transducer's supply current). Secondly, at a second (set) temperature, the sense voltage is scaled and summed with the transducer's output signal to actively correct for thermally-induced shifts in this output signal. To ensure that circuit adjustments made at the set temperature do not affect the circuit conditions at the datum temperature, the voltage reference amplifier 8 is adjusted so that the signal zero is equal to the sense voltage at the datum temperature. This measure obviates the need for additional null circuitry on line 9.The output of the transducer bridge 1 must be conditioned to give a single-ended voltage which must also be made equal to the signal zero at the datum temperature. The differential amplifier 7 fulfils this function. However, adjustment of the gain of this amplifier alters its input impedance. To ensure that this does not adversely affect the transducer bridge, the bridge output is buffered by the amplifiers 5 and 6. The individual bridge arm resistances can vary in such a way as to make the bridge output voltage between lines 3 and 4 either positive or negative with increasing temperature. Hence, the conditioning circuit must have the ability to sum or difference the sense voltage with transducer signal. At the set temperature, the transducer output will, due to thermal offset shift, be different from its value at the datum temperature.
To effect an accurate compensation the sense voltage must be scaled and its polarity must be adjusted to match this difference. Both these requirements are met by the potentiometer R2. By adjusting R2 by the appropriate amount and in the appropriate direction away from its mid-point, it is possible to accurately match the sense voltage with the transducer's thermal drift. Thereafter, the output of the sensing~amplifier 10 is automatically compensated.
In an alternative embodiment, the manually adjustable resistors R2 and R4 are replaced with digitally-addressable resistor ladder networks. In this case, a computer may be programmed to select appropriate network values in order to facilitate the calibration procedure.
Figure 2 shows, schematically, a second embodiment of the invention whereby temperature compensation is achieved by digital rather than analogue means. The output from a transducer bridge 1, which is powered by a constant voltage source 2, is fed into an anti-aliasing filter 13 and subsequently converted into a digital signal by an analogue to digital converter (ADC) 14. The voltage across a temperature-stable sense resistor R1 is also digitised by the ADC 14. Calibration data, which is held in a memory 15, is fed into a signal processor 16 together with the digitised transducer bridge signal and sense resistor signal. The signal processor 16 computes a temperature-compensated value of transducer bridge pressure in accordance with an equation detailed below. This value is converted back to analogue form by a digital to analogue converter 17.
Figure 3 shows, typically, the response of the transducer bridge 1 from which calibration data is deduced. Curves A and B show applied pressure versus measured pressure for two values of transducer bridge temperature T1 and T2 respectively. The relative displacement of the two curves and their different gradients are manifestations of the thermally-induced zero balance offset and sensitivity variations respectively. From the two curves, the following values are deduced and stored in the memory 15: viz x, y, Ex, y1, y2, y3, y4, xl and x2. Ex is the known applied pressure datum for zero transducer output at temperature T1 and all other values are as defined by Figure 3.
The signal processor 16 converts the digitised measured transducer voltage into pressure units to give a value Ym. It also converts the corresponding digitised sense resistor signal to pressure units and applies a further epirically derived correction which compensates for small thermal hysteresis effects to give a value Vs. The signal processor 16 then computes a temperature-compensated value of pressure, Ycomp, in accordance with the following equation:
By employing this digital technique, compensation for zero balance offset and for sensitivity variations is achieved automatically, the only additional quantity requiring measurement being the sense resistor voltage. The signal processor 16 calculates a value of Ycomp for every digitised value of transducer bridge output and sense resistor voltage which is sampled by the ADC 14. Thus, the apparatus shown in Figure 2 provides a real-time correction of analogue data.

Claims (11)

1. A signal conditioning circuit for use in combination with a transducer of the resistance bridge type whose output is offset by an amount dependent on ambient temperature; the circuit comprising means for producing a signal dependent on transducer temperature, means for generating a reference voltage, means for comparing the transducer output with the reference voltage to produce a transducer difference signal, and means for summing the temperature-dependent signal and transducer difference signal in order to compensate for the temperature-dependent offset in the transducer output.
2. A signal conditioning circuit as claimed in Claim 1 in which the means for producing a signal dependent on transducer temperature comprises a resistor connected in series between the transducer and a transducer voltage supply.
3. A signal conditioning circuit as claimed in either preceding claim in which the means for generating a reference voltage is an operational amplifier.
4. A signal conditioning circuit as claimed in any preceding claim in which the means for comparing the transducer output with the reference voltage is a differential amplifier.
5. A signal conditioning circuit as claimed in any preceding claim in which impedance buffers are connected between the transducer and the differential amplifier and are comprised of operational amplifiers.
6. A signal conditioning circuit as claimed in any preceding claim in which the means for summing the temperature-dependent signal and the transducer difference signal comprise a potentiometer and a summing amplifier.
7. A signal conditioning circuit as claimed in any of Claims 1 to 5 in which the means for summing the temperature-dependent signal and the transducer difference signal comprise a digitally-addressable resistor ladder network and a summing amplifier.
8. A signal conditioning circuit as claimed in any preceding claim in which the temperature dependence of the transducer output sensitivity is compensated by transducer output gain control means comprising an operational amplifier whose gain is varied by a temperature-sensitive resistor mounted in close proximity to the transducer.
9. A signal conditioning circuit suitable for use in combination with a transducer of the resistance bridge type, comprising a resistor connected in series with a transducer bridge voltage supply the voltage across the resistor thus varying as a function of the temperature of the transducer, means for converting the output of the transducer and the voltage across the resistor into digital signals to produce a transducer output value and a resistor output value respectively; a digital memory for storing calibration data; and a signal processor for receiving the transducer output value, the resistor output value and the calibration data and for computing a temperature-compensated transducer output value by applying correction terms involving the resistor output value and the calibration data to the transducer output value, the calibration data being deduced from previously measured values of the transducer output when subjected to different values of applied pressure and at different ambient temperatures.
10. A signal conditioning circuit as claimed in Claim 9 in which the temperature-compensated transducer output values Ycomp is computed from an equation of the form:
where Y is the transducer output value, V is a value related m S to the resistor output value, and the calibration data, xl, x2 and y1, y3, the known and measured pressures at the same temperature, Ex, the intercept of the line joining xl and x2, and x and y, the intersection of similar lines at different temperatures derived from measured values y2 and y4 are stored in the digital memory.
11. A signal conditioning circuit substantially as hereinbefore described with reference either to Figure 1 or to Figures 2 and 3.
GB8803669A 1987-03-05 1988-02-17 Transducer signal conditioner Expired - Lifetime GB2201791B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB878705192A GB8705192D0 (en) 1987-03-05 1987-03-05 Transducer signal conditioner

Publications (3)

Publication Number Publication Date
GB8803669D0 GB8803669D0 (en) 1988-03-16
GB2201791A true GB2201791A (en) 1988-09-07
GB2201791B GB2201791B (en) 1991-11-27

Family

ID=10613382

Family Applications (2)

Application Number Title Priority Date Filing Date
GB878705192A Pending GB8705192D0 (en) 1987-03-05 1987-03-05 Transducer signal conditioner
GB8803669A Expired - Lifetime GB2201791B (en) 1987-03-05 1988-02-17 Transducer signal conditioner

Family Applications Before (1)

Application Number Title Priority Date Filing Date
GB878705192A Pending GB8705192D0 (en) 1987-03-05 1987-03-05 Transducer signal conditioner

Country Status (2)

Country Link
GB (2) GB8705192D0 (en)
WO (1) WO1988006719A1 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2210695A (en) * 1987-10-05 1989-06-14 Kellett Michael A Temperature correction of transducer outputs
WO1990011500A1 (en) * 1989-03-17 1990-10-04 Robert Bosch Gmbh Process and device for measuring mechanical deformation
GB2251948A (en) * 1991-01-12 1992-07-22 Westland Aerostructures Ltd System for measuring two variable quantities
WO1993004376A1 (en) * 1991-08-19 1993-03-04 Bofors Ab A method and circuit for balancing an error signal
US5460049A (en) * 1994-01-26 1995-10-24 Instrumention Northwest, Inc. Digitally-temperature-compensated strain-gauge pressure measuring apparatus
US5507171A (en) * 1994-04-15 1996-04-16 Ssi Technologies, Inc. Electronic circuit for a transducer
WO2005017478A1 (en) * 2003-08-08 2005-02-24 Siemens Aktiengesellschaft Method for monitoring a measurement using a resistive sensor, monitoring device and industrial scale
WO2006051057A1 (en) * 2004-11-11 2006-05-18 Endress+Hauser Gmbh+Co. Kg Device and method for compensating transducers
WO2009112412A1 (en) * 2008-03-10 2009-09-17 Siemens Aktiengesellschaft Apparatus for measuring a current strength, circuit arrangement and method for measuring a current strength
EP3771895A1 (en) * 2019-07-31 2021-02-03 ABB Schweiz AG Temperature compensated strain gauge measurements

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5050423A (en) * 1989-12-04 1991-09-24 Motorola, Inc. Multi-variable sensor calibration
ES2077489B1 (en) * 1992-10-27 1997-06-16 Univ Pais Vasco QUICK RANGE CONDITIONER FOR ALL-NONE ELECTRICAL SIGNALS.
NO953285L (en) * 1994-10-31 1996-05-02 Motorola Inc Method and apparatus for compensating by sensors
FR2737777B1 (en) * 1995-08-11 1997-10-31 Motorola Semiconducteurs SENSOR MODULE
DE102010043287A1 (en) * 2010-11-03 2012-05-03 Bizerba Gmbh & Co Kg Measuring bridge device, load cell and method for balancing a load cell
CN106289464B (en) * 2016-09-30 2025-03-28 南京林业大学 A two-wire weak strain bridge signal transmitter
WO2019176332A1 (en) 2018-03-14 2019-09-19 富士電機株式会社 Sensor device
CN113951859B (en) * 2021-08-31 2024-03-19 广东迈科鼎医疗科技有限公司 Intracranial pressure sensor signal conditioning method
CN120404672B (en) * 2025-07-03 2025-09-30 南昌富泰力诺检测应用系统有限公司 Pesticide residue detection method and system for pesticide residue detector

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3130578A (en) * 1961-08-18 1964-04-28 Fairchild Camera Instr Co Strain gauge bridge calibration
GB1591620A (en) * 1976-12-21 1981-06-24 Nat Res Dev Signal-conditioning circuits
US4192005A (en) * 1977-11-21 1980-03-04 Kulite Semiconductor Products, Inc. Compensated pressure transducer employing digital processing techniques
JPS58114199A (en) * 1981-12-26 1983-07-07 株式会社東芝 2-wire type differential pressure transmitter
US4468968A (en) * 1983-04-21 1984-09-04 The Singer Company Method and arrangement for providing information to define the values of a set of parameters which characterize an element
JP2579143B2 (en) * 1984-02-02 1997-02-05 ハネウエル・インコーポレーテッド Method of digital correction of process variable sensor and process variable transmitter therefor

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2210695A (en) * 1987-10-05 1989-06-14 Kellett Michael A Temperature correction of transducer outputs
GB2210695B (en) * 1987-10-05 1992-07-01 Kellett Michael A An electronic controller unit
WO1990011500A1 (en) * 1989-03-17 1990-10-04 Robert Bosch Gmbh Process and device for measuring mechanical deformation
GB2251948A (en) * 1991-01-12 1992-07-22 Westland Aerostructures Ltd System for measuring two variable quantities
WO1993004376A1 (en) * 1991-08-19 1993-03-04 Bofors Ab A method and circuit for balancing an error signal
US5457393A (en) * 1991-08-19 1995-10-10 Bofors Ab Method and circuit for balancing an error signal
US5460049A (en) * 1994-01-26 1995-10-24 Instrumention Northwest, Inc. Digitally-temperature-compensated strain-gauge pressure measuring apparatus
US5507171A (en) * 1994-04-15 1996-04-16 Ssi Technologies, Inc. Electronic circuit for a transducer
WO2005017478A1 (en) * 2003-08-08 2005-02-24 Siemens Aktiengesellschaft Method for monitoring a measurement using a resistive sensor, monitoring device and industrial scale
WO2006051057A1 (en) * 2004-11-11 2006-05-18 Endress+Hauser Gmbh+Co. Kg Device and method for compensating transducers
WO2009112412A1 (en) * 2008-03-10 2009-09-17 Siemens Aktiengesellschaft Apparatus for measuring a current strength, circuit arrangement and method for measuring a current strength
EP3771895A1 (en) * 2019-07-31 2021-02-03 ABB Schweiz AG Temperature compensated strain gauge measurements
US11287347B2 (en) 2019-07-31 2022-03-29 Abb Schweiz Ag Temperature-compensated strain gauge measurements

Also Published As

Publication number Publication date
GB8803669D0 (en) 1988-03-16
WO1988006719A1 (en) 1988-09-07
GB8705192D0 (en) 1987-04-08
GB2201791B (en) 1991-11-27

Similar Documents

Publication Publication Date Title
JP3399953B2 (en) Pressure sensor
GB2201791A (en) Transducer signal conditioner
US4337665A (en) Semiconductor pressure detector apparatus with zero-point temperature compensation
US4798093A (en) Apparatus for sensor compensation
US3967188A (en) Temperature compensation circuit for sensor of physical variables such as temperature and pressure
US4169243A (en) Remote sensing apparatus
JPH07311100A (en) Transducer circuit
JPH0777266B2 (en) Semiconductor strain detector
US4872339A (en) Mass flow meter
US5616846A (en) Method and apparatus for current regulation and temperature compensation
US5134885A (en) Circuit arrangement for measuring a mechanical deformation, in particular under the influence of a pressure
US5048343A (en) Temperature-compensated strain-gauge amplifier
US4196382A (en) Physical quantities electric transducers temperature compensation circuit
US3510696A (en) Transducer output correction circuitry
US4611163A (en) Temperature compensated resistance bridge circuit
US6107861A (en) Circuit for self compensation of silicon strain gauge pressure transmitters
JP3084579B2 (en) Temperature sensor linearization processing method
Welsh et al. A method to improve the temperature stability of semiconductor strain gauge transducers
US4001669A (en) Compensating bridge circuit
JPH08166297A (en) Load cell type temperature compensation method
RU2165602C2 (en) Semiconductor pressure transducer
JP2536822B2 (en) Temperature compensation circuit for weighing device
JPH0814521B2 (en) Temperature compensation method for semiconductor pressure sensor
KR19980084452A (en) Temperature compensation circuit of pressure sensor
JPH0531729B2 (en)

Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20040217