GB2115937A - Testing for dielectric faults - Google Patents
Testing for dielectric faults Download PDFInfo
- Publication number
- GB2115937A GB2115937A GB08206030A GB8206030A GB2115937A GB 2115937 A GB2115937 A GB 2115937A GB 08206030 A GB08206030 A GB 08206030A GB 8206030 A GB8206030 A GB 8206030A GB 2115937 A GB2115937 A GB 2115937A
- Authority
- GB
- United Kingdom
- Prior art keywords
- dielectric
- component
- leakage current
- testing
- solvent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000012360 testing method Methods 0.000 title claims description 15
- 239000002904 solvent Substances 0.000 claims abstract description 19
- 239000003985 ceramic capacitor Substances 0.000 claims abstract description 11
- 239000003990 capacitor Substances 0.000 claims description 27
- 238000000034 method Methods 0.000 claims description 20
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 9
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims description 3
- 239000000203 mixture Substances 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 7
- 125000005233 alkylalcohol group Chemical group 0.000 abstract description 2
- 238000007654 immersion Methods 0.000 abstract 1
- 239000000919 ceramic Substances 0.000 description 6
- 239000011230 binding agent Substances 0.000 description 5
- 238000005336 cracking Methods 0.000 description 4
- 238000001035 drying Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000005012 migration Effects 0.000 description 2
- 238000013508 migration Methods 0.000 description 2
- 239000010970 precious metal Substances 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- PPWHTZKZQNXVAE-UHFFFAOYSA-N Tetracaine hydrochloride Chemical compound Cl.CCCCNC1=CC=C(C(=O)OCCN(C)C)C=C1 PPWHTZKZQNXVAE-UHFFFAOYSA-N 0.000 description 1
- 238000010420 art technique Methods 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000011928 denatured alcohol Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000011877 solvent mixture Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/30—Stacked capacitors
- H01G4/306—Stacked capacitors made by thin film techniques
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Ceramic Capacitors (AREA)
Abstract
Ceramic capacitors are tested by measurement of their electrical leakage before and after immersion in a mobile ionising solvent, e.g. a lower alkyl alcohol. A significant increase in leakage is indicative of a fault, e.g. a crack in the dielectric. <IMAGE>
Description
SPECIFICATION
Improvements in testing for dielectric faults
This invention relates to testing dielectric faults such as may occur in ceramic capacitors and to techniques for improving the quality control of such capacitors.
Ceramic dielectric capacitors, and particularly multilayer ceramic capacitors are widely used in the electronics industry as they are relatively inexpensive and have a high capacitance/volume ratio. It is usual to employ a multilayer structure when fabricating ceramic capacitors, so that layers of ceramic are interleaved with layers of metal electrode in such a way that an interdigitated two-electrode component of high capacitance value is produced. Various methods are used to make the ceramic layers as thin 'leaves', usually formed from a mix of the finely powdered ceramic material and an organic binder solvent system. For example, in a typical conventional process, a ceramic/binder/solvent mixture is coated on to polyethylene strip, by a tape-drawing process.After drying, the ceramic/binder film is peeled off and then silk screen printed with electrodes using an ink formed from precious metal powders in an organic binder. A number of such 'leaves' are stacked and pressed together, diced, heated to remove the binder, then fired at a high temperature. End terminations and leads may be attached following normal practice and such processes as described above are well known in the art of multilayer ceramic capacitor manufacture. Following the present industry trend to decrease dielectric thickness the dielectric film integrity has assumed great importance. It is desirable to decrease the capacitor size for several reasons, mainly compatibility with micro-electronic trends and economy of materials.
A problem that has arisen with presently manufactured ceramic multilayer capacitors is that of occasional cracking of the dielectric, during the manufacturing process. This cracking provides an intrinsic breakdown path between the capacitor electrodes or between an electrode and the opposite plurality end termination and can lead to subsequent failure in service. The mechanism of this failure is not fully understood, but it is thought to involve silver migration from the precious metal electrodes or end termination which then provides a low resistive breakdown path. This migration is thought to occur in those cracked regions to which there is access to the atmosphere.
In most instances cracking of the dielectric cannot be detected by visual inspection and the defect only becomes manifest after the capacitor has been in use foray extended period. It is clearly desirable to reduce such long term failures to a minimum.
A number of techniques have been proposed for dielectric crack detection in ceramic capacitors. In one process acoustic emissions from the capacitors are monitored. These acoustic emissions are then computer processed to determine the good and bad capacitors. Such a process is however costly and somewhat uncertain.
the object of the present invention is to minimise or to overcome the disadvantages of the prior art techniques by providing a dielectric crack detection process that is both inexpensive and reliable.
According to one aspect of the invention there is provided a process for testing for a dielectric fault in a component, the process including subjecting the component to a mobile ionising solvent, measuring the electrical leakage current of the component, and comparing the leakage current with a reference value to provide an indication of the presence of a dielectric fault.
According to another aspect of the invention there is provided an apparatus for measuring and testing components, the apparatus including means for applying a mobile ionising solvent to the component so as to penetrate any discontinuity in the dielectric, means for measuring the leakage current of the solvent treated component, and a comparator whereby the leakage current is compared with a reference value corresponding to the leakage current of an untreated component.
We have found that treatment of a ceramic capacitor with a mobile ionising solvent, for example a lower alkyl alcohol, provides an efficient nondestructive means for crack detection. The electrical leakage current of each capacitor is measured prior to treatment with the liquid and is measured again after treatment. The two measurements are then compared. Alternatively a single measurement is made after solvent treatment and compared with a reference value. A significant increase in the leakage is indicative of the presence of one or more potentially active cracks in the dielectric.
A variety of solvents may be used for this process, but we prefer not to use water as this is often undesirable for electronic applications. In general the solvent is of the type that produces an increase in leakage current when applied to a capacitor having a cracked dielectric.
An embodiment of the invention will now be described with reference to the accompanying drawing in which the single Figure is a schematic diagram of a capacitor measurement and test apparatus.
Referring to the drawing, capacitors 11 to be treated are mounted on a conveyor 12 and are carried through a first test station 13 where the electrical leakage of each capacitor 11 is measured and the result stored in a memory 14. The capacitors are then carried via a treatment station 15, where they are immersed in or sprayed with a mobile ionising solvent, to a drying station 16 whereby excess solvent is removed. Typically drying is effected in a current of air at ambient temperature.
The treated capacitors are carried from the drying station 16 to a second test station 17. The electrical leakage current of each capacitor is again measured and is compared, via comparator 18, with the measurement for that capacitor recalled from the memory 14. If the second leakage current measurement is significantly higher than the first, i.e. the measurement differ by a predetermined magnitude, then that capacitor is directed to a reject bin. In this way ceramic capacitors, and particularly multilayer ceramic capacitors, may be screened to remove those whose dielectric is imperfect.
In a further preferred embodiment the first test station 13 is dispensed with and the leakage current of each solvent treated capacitor is compared with a reference value corresponding to the leakage of an untreated good capacitor. Those capacitors whose leakage current is significantly greater than the reference value are rejected.
The test voltage applied to a capacitor to measure electrical leakage is dependent on the voltage rating of the capacitor. Typically this test voltage is in the range 5 to 15 volts.
Avariety of liquids may be employed in the technique. Typically we employ methanol, but ethanol, isopropyl alcohol, industrial methylated spirit or mixtures of any of these solvents may be used. This list of solvents is given by way of example only and is not to be considered as limiting. Preferably the solvent should be mobile, i.e. a low viscosity and surface tension to allow rapid penetration. The solvent should also be polar and of the ionising type.
In a typical test process a batch of 0.1 microfarad multilayer capacitors formed from an X7R dielectric were treated for electrical leakage at 10 volts. In each case the leakage was less than or equal to 10-9 amps. The capacitors were then immersed in methanol for 10 minutes, air dried and remeasured for leakage. The majority maintained a leakage of 10-9 amps but a few showed an increase in leakage to 5 x 10-9 amps or greater. These latter capacitors when subsequently sectioned and microscopically examined were found to exhibit dielectric cracking.
This example demonstrates the feasibility of the techniques described herein for the non destructive treating of ceramic capacitors prior to use.
Claims (6)
1. A process for testing for a dielectric fault in a component, the process including subjecting the component to a mobile ionising solvent, measuring the electrical leakage current of the component, and comparing the leakage current with a reference value to provide an indication of the presence of a dielectric fault.
2. A method as claimed in claim 1,wherein the liquid is methanol, ethanol, isopropyl alcohol or mixtures thereof.
3. A method as claimed in claim 1 or 2, wherein the electrical leakage is measured at an applied voltage of 5 to 15 volts.
4. A method of testing a ceramic capacitor, which method is substantially as described herein with reference to the accompanying drawings.
5. An apparatus for measuring and testing components, the apparatus including means for applying a mobile ionising solvent to the component so as to penetrate any discontinuity in the dielectric, means for measuring the leakage current of the solvent treated component and a comparator whereby the leakage current is compared with a reference value corresponding to the leakage current of an untreated component.
6. A capacitor testing apparatus substantially as described herein with reference to the accompanying drawing,
Priority Applications (13)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB08206030A GB2115937A (en) | 1982-03-02 | 1982-03-02 | Testing for dielectric faults |
| GB08217105A GB2116729A (en) | 1982-03-02 | 1982-06-11 | Electrical testing |
| GB08234244A GB2116328B (en) | 1982-03-02 | 1982-12-01 | Electrical testing of capacitors |
| NO830659A NO830659L (en) | 1982-03-02 | 1983-02-25 | PROCEDURE FOR TESTING CONDENSORS |
| DK98483A DK98483A (en) | 1982-03-02 | 1983-02-28 | PROCEDURE FOR DETECTING STRUCTURAL DEFECTS IN ELECTRICAL COMPONENTS |
| US06/471,115 US4583038A (en) | 1982-03-02 | 1983-03-01 | Electrical testing |
| JP58501297A JPS59500288A (en) | 1982-03-02 | 1983-03-02 | electrical inspection |
| BR8306193A BR8306193A (en) | 1982-03-02 | 1983-03-02 | ELECTRIC TEST |
| DE8383301113T DE3363353D1 (en) | 1982-03-02 | 1983-03-02 | Method of investigating electrical components as to structural flaws |
| PCT/GB1983/000063 WO1983003143A1 (en) | 1982-03-02 | 1983-03-02 | Electrical testing |
| AT83301113T ATE19693T1 (en) | 1982-03-02 | 1983-03-02 | METHODS OF INSPECTING ELECTRICAL COMPONENTS FOR STRUCTURAL FAULTS. |
| ES520238A ES8403624A1 (en) | 1982-03-02 | 1983-03-02 | Method of investigating electrical components as to structural flaws. |
| EP83301113A EP0096950B1 (en) | 1982-03-02 | 1983-03-02 | Method of investigating electrical components as to structural flaws |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB08206030A GB2115937A (en) | 1982-03-02 | 1982-03-02 | Testing for dielectric faults |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB2115937A true GB2115937A (en) | 1983-09-14 |
Family
ID=10528716
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB08206030A Withdrawn GB2115937A (en) | 1982-03-02 | 1982-03-02 | Testing for dielectric faults |
| GB08217105A Withdrawn GB2116729A (en) | 1982-03-02 | 1982-06-11 | Electrical testing |
| GB08234244A Expired GB2116328B (en) | 1982-03-02 | 1982-12-01 | Electrical testing of capacitors |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB08217105A Withdrawn GB2116729A (en) | 1982-03-02 | 1982-06-11 | Electrical testing |
| GB08234244A Expired GB2116328B (en) | 1982-03-02 | 1982-12-01 | Electrical testing of capacitors |
Country Status (1)
| Country | Link |
|---|---|
| GB (3) | GB2115937A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102018214719A1 (en) * | 2018-08-30 | 2020-03-05 | AUDI HUNGARIA Zrt. | Method and device for checking and producing a glow plug having a ceramic heating element |
| CN117665650A (en) * | 2023-11-23 | 2024-03-08 | 中国第一汽车股份有限公司 | Chip crack detection circuit of high-temperature tail gas sensor and device thereof |
-
1982
- 1982-03-02 GB GB08206030A patent/GB2115937A/en not_active Withdrawn
- 1982-06-11 GB GB08217105A patent/GB2116729A/en not_active Withdrawn
- 1982-12-01 GB GB08234244A patent/GB2116328B/en not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102018214719A1 (en) * | 2018-08-30 | 2020-03-05 | AUDI HUNGARIA Zrt. | Method and device for checking and producing a glow plug having a ceramic heating element |
| DE102018214719B4 (en) * | 2018-08-30 | 2020-06-18 | AUDI HUNGARIA Zrt. | Method for checking and producing a glow plug having a ceramic heating element |
| CN117665650A (en) * | 2023-11-23 | 2024-03-08 | 中国第一汽车股份有限公司 | Chip crack detection circuit of high-temperature tail gas sensor and device thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| GB2116328A (en) | 1983-09-21 |
| GB2116328B (en) | 1985-04-03 |
| GB2116729A (en) | 1983-09-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |